WO2005084015A1 - 欠陥画素検出装置と方法および撮像装置 - Google Patents
欠陥画素検出装置と方法および撮像装置 Download PDFInfo
- Publication number
- WO2005084015A1 WO2005084015A1 PCT/JP2005/003542 JP2005003542W WO2005084015A1 WO 2005084015 A1 WO2005084015 A1 WO 2005084015A1 JP 2005003542 W JP2005003542 W JP 2005003542W WO 2005084015 A1 WO2005084015 A1 WO 2005084015A1
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- pixel
- normal
- level difference
- defective
- threshold
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/60—Control of cameras or camera modules
- H04N23/65—Control of camera operation in relation to power supply
- H04N23/651—Control of camera operation in relation to power supply for reducing power consumption by affecting camera operations, e.g. sleep mode, hibernation mode or power off of selective parts of the camera
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
Definitions
- the present invention relates to a defective pixel detecting device and method, and an imaging device capable of detecting a defective pixel included in a pixel signal output from a solid-state image sensor such as a CCD image sensor during photographing.
- a solid-state image sensor such as a CCD image sensor during photographing.
- Japanese Unexamined Patent Publication No. 7-162 757 discloses a method in which a defective pixel position is checked in advance at the time of factory shipment, and the result is stored in a memory to specify the defective pixel position. I have. JP-A-6-205530, JP-A-6-292010, JP-2002-1024, JP-A-6-204, hold a defective pixel position in a memory.
- a method of detecting a defective pixel in real time from an output signal of a solid-state imaging device without performing the method is disclosed. According to these methods, as described in Japanese Patent Application Laid-Open No. 7-162757, there is no need to investigate the position of defective pixels at the time of shipment from the factory. Is also detectable.
- FIG. 1 is a block diagram illustrating a method for detecting a defective pixel in real time, which is described in Japanese Patent Application Laid-Open No. 6-292901.
- the output signal of the solid-state imaging device 901, such as a CCD is converted into a digital signal by the AZD converter 902 and stored in the latch 903.
- the latch 903 includes a delay unit, a line memory, and the like, and holds pixel data required by the defective pixel detection algorithm.
- the defective pixel detection section 9 It is determined whether or not it is defective, and the result of the determination is sent to the defective pixel correction unit 905.
- the defective pixel correction unit 905 outputs, as a correction output 906, a result of correcting a pixel determined to be a defective pixel using peripheral pixels.
- a synchronized clock signal CLK is input to the latch 903, the defective pixel detecting section 904, and the defective pixel correcting section 905.
- the clock signal input to the AZD converter 902 is not shown.
- the present invention has been made in view of such problems of the related art, and has an object to detect a defective pixel in real time with a small amount of computation and low power consumption, a defective pixel detection apparatus and method, and an imaging method. It is to provide a device. Disclosure of the invention
- a defective pixel detection device is a defective pixel detection device that detects a defective pixel included in pixel data output from a solid-state imaging device. And a defective pixel detecting means for detecting a defective pixel from among the pixels which are not excluded by the normal pixel detecting means.
- a defective pixel detection device of the present invention pixels having a very low possibility of a defect in the normal pixel detection unit are excluded from the inspection target, and only the pixels having the possibility of the defect are detected in the defect pixel detection unit. Perform pixel detection. For this reason, the operation rate of the defective pixel detection unit can be reduced by excluding pixels with extremely low possibility of defects from the inspection target. Thus, the effects of reducing the amount of calculation and reducing power consumption can be obtained.
- the normal pixel detection means includes: a level difference calculation unit configured to calculate a level difference between an inspection pixel and a peripheral pixel; and the level difference and a first threshold value. Comparing means for comparing, and when the level difference is smaller than the first threshold value, it is determined that the pixel is a normal pixel.
- a level difference between the inspection target pixel and one surrounding pixel is compared with a threshold value. For this reason, the normal pixel detection unit having a simple configuration makes it possible to exclude a pixel having a very low possibility of a defect from the inspection target, thereby achieving an effect of reducing the amount of calculation and reducing power consumption. .
- the normal pixel detection means includes a level difference calculation unit that calculates a level difference between the inspection pixel and a plurality of peripheral pixels, and a level difference calculation unit. Comparing means for comparing each of the calculated plurality of level differences with a first threshold value; and, based on the comparison result of the comparing means, the number of peripheral pixels in which the level difference is smaller than the first threshold value. A determination unit that calculates the number and compares the calculated number with a second threshold, and determines that the pixel is a normal pixel when the number is equal to or greater than the second threshold.
- a pixel having a very low possibility of a defect in the normal pixel detection unit is excluded from the inspection target, and only a pixel having a possibility of a defect is detected in the defect pixel detection unit.
- a method for detecting a normal pixel a level difference between a pixel to be inspected and a plurality of peripheral pixels is compared with a threshold value. For this reason, a normal pixel detection unit having a simple configuration makes it possible to exclude a pixel having a very low possibility of a defect from the inspection target, thereby achieving an effect of reducing the amount of calculation and reducing power consumption. it can.
- the normal pixel detection method is characterized in that the memory for holding the inspection pixel is shared with the memory of the defective pixel detection means.
- the latch used by the normal pixel detector and the latch used by the defective pixel detector are shared. For this reason, a normal pixel detection unit having a simple configuration makes it possible to exclude a pixel having a very low possibility of a defect from the inspection target, thereby achieving an effect of reducing the amount of calculation and reducing power consumption. it can.
- the device size of the normal pixel detection unit can be reduced.
- the defective pixel detection means stops a clock and shifts to a low power consumption state when the normal pixel detection unit determines that the pixel is a normal pixel.
- the defective pixel detecting unit stops the clock and shifts to the low power consumption state.
- the pixels with extremely low possibility of defects are excluded from the inspection target by the normal pixel detection unit, and the defective pixel detection unit is shifted to the low power consumption state during this period, so that the power consumption of the entire device is reduced. Can be.
- a defective pixel detection method includes the steps of: detecting a normal pixel from pixel data output from a solid-state imaging device; removing the detected normal pixel; and excluding the normal pixel. Detecting a defective pixel from the subsequent pixels. In this way, the pixels having a very low possibility of a defect in the normal pixel detecting section are excluded from the inspection target, and the defective pixel detecting section detects the defective pixel only for the pixel having the possibility of the defect. Therefore, compared to the case where defective pixels are detected for all pixels, arithmetic processing can be performed at a higher speed, and processing time can be reduced.
- the step of detecting a normal pixel includes calculating a level difference between an inspection pixel and a peripheral pixel. 2005/003542 The level difference calculated by the calculation is compared with a first threshold, and if the level difference is smaller than the first threshold, the pixel is determined to be a normal pixel. As described above, a simple operation of comparing the level difference with the first threshold value is used to determine a normal pixel, and a defective pixel is not detected for a normal pixel, thereby shortening the processing time as a whole. Can be.
- the step of detecting the normal pixel includes calculating a level difference between an inspection pixel and a plurality of peripheral pixels, and calculating the level difference between the calculated level difference and the plurality of peripheral pixels.
- the number of peripheral pixels in which the level difference is smaller than the first threshold is calculated from each of the comparison results, and the number calculated by the calculation is
- the pixel When the number is equal to or larger than the second threshold value, the pixel is determined to be a normal pixel. As described above, since the level difference is compared with the first threshold value, the number is compared with the second threshold value, and the pixel is determined to be a normal pixel based on the comparison result. The reliability of pixel detection can be improved.
- An imaging device is an imaging device including a defective pixel detection device that detects a defective pixel included in pixel data output from a solid-state imaging device. It is characterized by comprising a normal pixel detecting means for detecting and excluding a pixel, and a defective pixel detecting means for detecting a defective pixel from among the pixels which are not excluded by the normal pixel detecting means.
- the image pickup apparatus of the present invention excludes pixels having a very low possibility of defects from inspection targets. For this reason, it is possible to reduce the operation rate of the defective pixel detection unit, and it is possible to obtain the effects of reducing the amount of calculation and reducing power consumption.
- the normal pixel detecting unit compares a level difference with a first threshold, and a level difference calculating unit that calculates a level difference between a test pixel and a peripheral pixel. Comparing means, When the level difference is smaller than the first threshold, it is determined that the pixel is a normal pixel. In this case, a pixel having a very low possibility of a defect is excluded from the inspection target by a normal pixel detection unit having a simple configuration. For this reason, it is possible to obtain the effects of reducing the calculation amount of the imaging device and reducing the power consumption.
- the normal pixel detecting means includes a plurality of level difference calculating means for calculating a level difference between the inspection pixel and a plurality of peripheral pixels; and the plurality of level difference calculating means.
- Comparing means for respectively comparing the plurality of level differences calculated in the above with a first threshold value; and, based on the comparison result of the comparing means, the peripheral pixels whose level difference is smaller than the first threshold value
- a determination unit that calculates the number of the peripheral pixels and compares the calculated number of the peripheral pixels with a second threshold value, wherein the level difference is smaller than the first threshold value. When the number is equal to or larger than the second threshold, it is determined that the pixel is a normal pixel. In this case, it is possible to detect defective pixels with high accuracy, and the reliability of the imaging device is improved.
- FIG. 1 is a block diagram showing a first embodiment of the present invention.
- FIG. 2 is a block diagram showing a configuration example of the latch.
- FIG. 3 is a block diagram illustrating a configuration example of a normal pixel detection unit.
- FIG. 4 is a block diagram illustrating another configuration example of the normal pixel detection unit.
- FIG. 5 is a block diagram showing a second embodiment of the present invention.
- FIG. 6 is a flowchart showing the third embodiment.
- FIG. 7 is a block diagram showing a conventional example.
- FIG. 1 is a block diagram showing a configuration of a first exemplary embodiment of the present invention.
- the output signal of a solid-state image sensor 101 such as a CCD is output by an AZD converter 1
- the signal is converted into a digital signal by 02 and stored in the latch 103.
- the latch 103 includes a delay unit D, a line memory, and the like, and holds pixel data required by the defective pixel detection algorithm.
- the latch 103 ' also includes a delay unit D, a line memory, and the like, and receives the output digital signal of the AZD converter 102.
- the normal pixel detector 104 receives the output signal of the latch 103 'and simply determines whether the pixel to be inspected is a normal pixel or a defective pixel, and determines the determination result as a defective pixel detector 105. Send to.
- the defective pixel detection unit 105 determines a defective pixel using only the pixel held in the latch 103 only for a pixel not determined as a normal pixel by the normal pixel detection unit 104. The determination result is sent to the defective pixel correction unit 106. When the defective pixel correction unit 106 determines that the pixel is a defective pixel, the defective pixel correction unit 106 performs a correction process to obtain a corrected output 107.
- the synchronized clock signal CLK is input to the latch 103, the latch 103 ′, the normal pixel detector 104, the defective pixel detector 105, and the defective pixel corrector 106.
- FIG. 2 is a block diagram showing a configuration example of the latch 103.
- the latch 103 shown in FIG. 2 is used when the detection algorithm of the defective pixel detection unit 105 and the correction algorithm of the defective pixel correction unit 106 require a 3 ⁇ 3 pixel centered on the inspection target pixel as an input. It is an example. From the output of the AZD converter 201, the delay device D that holds one pixel and the line memories 202 and 203 that hold the pixels for one line, 3X focusing on the inspection target pixel
- the nine delay devices D are arranged 24 a to 24 i.
- the converter output 201 is directly input to the delay units 24a to 24c.
- the A / D converter output 201 is input to the delay units 24 d to 24 # via the line memory 202.
- the pixel to be detected is denoted as X (0,0)
- the pixel on the right is denoted as X (1,0)
- the pixel on the upper right is denoted as X (0, -1), and so on.
- the pixel data is output via the delay units 24a to 24i, if the pixel to be detected is X (0, 0), the positions of the pixels at the top, bottom, left and right are shown inverted.
- the normal pixel detection unit 104 receives the AZD converter output 201 as an input, easily determines whether the inspection target pixel is a normal pixel or a defective pixel, and determines the determination result as defective. It is sent to the pixel detector 105.
- the normal pixel detection unit 104 calculates the level difference between the inspection target pixel and the adjacent pixel, and determines whether the pixel is a normal pixel or a pixel that may be a defective pixel based on the presence of an adjacent pixel whose level difference is smaller than a predetermined threshold. Is determined.
- FIG. 3 is a block diagram showing an embodiment of the present invention.
- FIG. 3 is a configuration example of a normal pixel detection unit that uses a level difference between one pixel adjacent to a pixel to be inspected and a pixel to be determined.
- the operation of the normal pixel detection unit 104 will be described in detail with reference to FIG.
- the latch 103 is constituted by a line memory 302 and a delay device D indicated by 24 j and 24 k.
- Latch 103 'holds pixel X (0, 0) to be inspected and pixel X (1, 0) on the right thereof.
- the difference calculator 303 and the absolute value calculator 304 calculate the absolute value of the difference between these pixel values.
- a threshold comparing unit 305 the absolute value of the difference is compared with a preset threshold, and if the difference is smaller than the threshold, it is determined that the pixel is a normal pixel. If the absolute value of the difference is equal to or larger than the threshold value, it is determined that there is a possibility of a defective pixel, and a normal pixel detection result 306 is set.
- FIG. 4 is a block diagram showing another configuration example of the normal pixel detection unit 104.
- FIG. 4 shows a configuration example in which the level difference between two pixels adjacent to the inspection target pixel is used for determination.
- the latch 103 'includes a line memory 402 and a delay device D indicated by 24p to 24r.
- Latch 103 allows pixel X (0, 0) to be inspected, pixel X (1, 0) on the right, and left The next pixel X (—1, 0) is held.
- the difference calculator 403 and the absolute value calculator 404 calculate the level difference between the pixel to be inspected and the pixel on the right, and the difference between the level difference and the first threshold set in the threshold value comparator 405 is calculated. A comparison is made.
- the difference calculator 406 and the absolute value calculator 407 calculate the level difference between the pixel to be inspected and the pixel on the left, and compare the level difference with the first threshold set in advance by the threshold comparator 408. A comparison is made.
- the judging unit 409 calculates the number of adjacent pixels when the level difference between the detection target pixel and the adjacent pixel is smaller than the threshold value, and when the difference is equal to or larger than the preset second threshold value, the normal pixel And the normal pixel detection result is 410. When 1 is set as the second threshold, if at least one of the left and right adjacent pixels has a level difference smaller than the second threshold, it is determined to be a normal pixel.
- the defective pixel detection unit 105 detects defective pixels using the pixels held in the latch 103 only for pixels that are not determined to be normal pixels by the normal pixel detection unit 104.
- the detection algorithm is a known algorithm that uses 3 ⁇ 3 pixels around the inspection target pixel. It should be noted that an algorithm requiring a pixel in an area larger than 3 ⁇ 3 can also be used by changing the latch 103.
- the defective pixel detector 105 shifts to a low power consumption mode such as stopping the clock CLK without performing a defective pixel detection operation on a pixel determined as a normal pixel by the normal pixel detector 104. I do.
- the clock CLK is generated so as to stop the clock CLK supplied to the latch 103, the normal pixel detector 104, the defective pixel detector 105, and the defective pixel corrector 106. source Turn off the transmitter. For this reason, power consumption can be reduced.
- the detection result of the defective pixel detection unit 105 is sent to the defective pixel correction unit 106.
- the defective pixel correction unit 106 performs a correction process using peripheral pixels on a pixel determined to be a defective pixel to obtain a corrected output 107.
- the correction algorithm is a well-known algorithm that uses pixels in the area stored in the latch 103. It should be noted that an algorithm that requires pixels in an area larger than the area required by the defective pixel detection unit can also be used by changing the latch 103.
- pixels having a very low possibility of a defect are excluded from the inspection target by the normal pixel detection unit 104 having a simple configuration. For this reason, it is possible to reduce the operation rate of the defective pixel detection unit 105, and it is possible to obtain the effect of reducing the amount of calculation and reducing power consumption.
- examples of the pixel to the left of the inspection target pixel and the pixels on both sides are presented as the pixels to be compared in the normal pixel detection unit 104.
- Embodiments of the present invention are not limited to these adjacent pixels. It is also possible to target a pixel diagonally above the pixel to be inspected, or a peripheral pixel including a pixel adjacent to the pixel to be inspected.
- the present embodiment can be easily extended to a single-plate color image pickup device equipped with a CFA (Color Filer Array, a color filter array).
- the pixels to be compared in the normal pixel detection unit 104 may be configured to be peripheral pixels of the same color as the pixel to be inspected.
- the threshold value for comparison may be common to the colors or may be an individual value.
- FIG. 5 is a block diagram showing a configuration of another embodiment of the present invention.
- the normal pixel detection unit 501 detects the detection stored in the latch 103.
- the inspection target pixel and its surrounding pixels are input, and it is simply determined whether the inspection target pixel is a normal pixel or a defective pixel, and the determination result is sent to the defective pixel detection unit 105.
- the latch 103 is shared by the normal pixel detection unit 501 and the defective pixel detection unit 105.
- the defective pixel detector 105 performs defective pixel determination only on the pixels that are not determined to be normal pixels by the normal pixel detector 501, using the pixels held in the latch 103. The determination result is sent to the defective pixel correction unit 106. When the defective pixel correction unit 106 is determined to be a defective pixel, the defective pixel correction unit 106 performs correction processing to obtain a corrected output 502.
- the normal pixel detection unit 501 determines whether a pixel stored in the latch 103 is a normal pixel or a defective pixel. As described above, the normal pixel detection unit 501 simply determines whether the inspection target pixel is a normal pixel or a possibility of a defective pixel, and sends the determination result to the defective pixel detection unit 105. Send out.
- the configuration of the normal pixel detection unit 501 can be such that the delay unit D and the line memories 302 and 402 are removed from the configuration examples shown in FIGS. In this way, by sharing the latch used by the normal pixel detection unit 501 and the defective pixel detection unit 105, the size of the device can be reduced. In the embodiment of FIG.
- the defective pixel detection unit 105 detects a defective pixel only for a pixel that is not determined to be a normal pixel by the normal pixel detection unit 501. . Then, the defective pixel correction unit 106 performs a correction process using a peripheral pixel on a pixel determined to be a defective pixel, to obtain a corrected output 502.
- the device scale can be reduced by sharing the latch 103 used by the normal pixel detection unit 501 and the defective pixel detection unit 105. In addition, effective use of memory resources can be achieved.
- the detection of the defective pixel is premised on the processing by the hardware X, but the present invention is not limited to such a configuration.
- CC After the output signal of the solid-state image sensor 101 such as D is converted into a digital signal by the AZD converter 102, the pixel data stored in the memory (latch) is sent to a programmable processor such as a CPU or DSP. It is also possible to adopt a configuration in which processing is performed according to the above.
- FIG. 6 is a flowchart showing the software processing according to the present invention.
- the absolute difference value is calculated as the level difference between the inspection target pixel and the adjacent pixel.
- the adjacent pixels may be one pixel or a plurality of pixels.
- a comparison with a preset threshold value is performed.
- STEP 3 it is determined whether there is a possibility of a normal pixel or a defective pixel from the result of the threshold value comparison.
- the adjacent pixel is one pixel, if the level difference is smaller than the threshold value, the pixel is determined as a normal pixel.
- the number of adjacent pixels when the level difference is smaller than the threshold value is equal to or larger than a second threshold value set in advance, it is determined to be a normal pixel.
- a defective pixel is detected in STEP 4. The detection of a defective pixel in STEP 4 is performed by a known algorithm.
- STE P 5 it is determined whether the inspection for all the pixels has been completed. If not completed, the process returns to STE P 1 and the inspection of the next pixel to be inspected is continued, and the inspection for all the pixels has been completed. In this case, the process ends.
- the defective pixel detection device and the imaging device of the present invention a simple configuration By using such a normal pixel detection unit, it is possible to reduce the operation rate of the defective pixel detection unit by excluding pixels with extremely low possibility of defects from the detection targets. For this reason, it is possible to obtain the effect of reducing the amount of calculation and reducing the power consumption of the entire apparatus.
- the device size of the normal pixel detection unit can be reduced.
- arithmetic processing for detecting a defective pixel can be performed at high speed, so that the processing time can be reduced. Further, the calculation accuracy can be improved.
- a defective pixel detection device and method and an imaging device capable of detecting a defective pixel included in a pixel signal output from a solid-state imaging device during photographing. be able to.
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Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/586,699 US20080239112A1 (en) | 2004-02-27 | 2005-02-24 | Defective Pixel Detector, Defective Pixel-Detection Process and Imaging System |
EP05719857A EP1720343A1 (en) | 2004-02-27 | 2005-02-24 | Defective pixel detection device and method, and imaging device |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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JP2004-053044 | 2004-02-27 | ||
JP2004053044A JP4347721B2 (ja) | 2004-02-27 | 2004-02-27 | 画素欠陥検出装置と方法および撮像装置 |
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WO2005084015A1 true WO2005084015A1 (ja) | 2005-09-09 |
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PCT/JP2005/003542 WO2005084015A1 (ja) | 2004-02-27 | 2005-02-24 | 欠陥画素検出装置と方法および撮像装置 |
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US (1) | US20080239112A1 (ja) |
EP (1) | EP1720343A1 (ja) |
JP (1) | JP4347721B2 (ja) |
WO (1) | WO2005084015A1 (ja) |
Families Citing this family (10)
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US7667747B2 (en) * | 2006-03-15 | 2010-02-23 | Qualcomm Incorporated | Processing of sensor values in imaging systems |
JP4895107B2 (ja) * | 2006-09-08 | 2012-03-14 | ソニー株式会社 | 電子機器、情報処理方法、およびプログラム |
JP2009188822A (ja) * | 2008-02-07 | 2009-08-20 | Olympus Corp | 画像処理装置及び画像処理プログラム |
JP5222654B2 (ja) * | 2008-07-31 | 2013-06-26 | 株式会社エルモ社 | 撮像装置の欠陥画素検出装置および撮像装置のマーキング装置 |
US7974805B2 (en) * | 2008-10-14 | 2011-07-05 | ON Semiconductor Trading, Ltd | Image sensor and method |
JP2011114473A (ja) * | 2009-11-25 | 2011-06-09 | Hitachi Kokusai Electric Inc | 画素欠陥補正装置 |
JP5526014B2 (ja) * | 2010-12-21 | 2014-06-18 | 株式会社日立製作所 | 撮像装置 |
US9805458B2 (en) * | 2016-03-23 | 2017-10-31 | Communications Test Design, Inc. | Method and system for detecting defective pixels and screen imperfections of a mobile device |
JP7451857B2 (ja) | 2020-02-13 | 2024-03-19 | 公立大学法人会津大学 | 検査プログラム、検査装置及び検査方法 |
KR20210109775A (ko) | 2020-02-28 | 2021-09-07 | 삼성전자주식회사 | 이미지 센서 및 이의 모니터링 방법 |
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JPH0951479A (ja) * | 1995-08-08 | 1997-02-18 | Fujitsu Ltd | 撮像装置 |
JP2001251636A (ja) * | 2000-03-07 | 2001-09-14 | Fuji Photo Film Co Ltd | 固体撮像装置および画素欠陥検出方法 |
JP2002281386A (ja) * | 2001-03-16 | 2002-09-27 | Olympus Optical Co Ltd | 撮像装置 |
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US6002433A (en) * | 1995-08-29 | 1999-12-14 | Sanyo Electric Co., Ltd. | Defective pixel detecting circuit of a solid state image pick-up device capable of detecting defective pixels with low power consumption and high precision, and image pick-up device having such detecting circuit |
JP3544304B2 (ja) * | 1998-08-04 | 2004-07-21 | 日本ビクター株式会社 | 画素欠陥補正装置及び画素欠陥補正方法 |
US6529622B1 (en) * | 1998-10-30 | 2003-03-04 | General Electric Company | Method and apparatus for identifying defective regions in a discrete pixel detector |
GB9825086D0 (en) * | 1998-11-17 | 1999-01-13 | Vision Group Plc | Defect correction in electronic imaging systems |
JP3773773B2 (ja) * | 1999-10-27 | 2006-05-10 | 三洋電機株式会社 | 画像信号処理装置及び画素欠陥の検出方法 |
US7365783B2 (en) * | 2001-03-16 | 2008-04-29 | Olympus Corporation | Image pickup apparatus which stores initial defect data concerning image pickup device and data on later developed defects |
US6985180B2 (en) * | 2001-06-19 | 2006-01-10 | Ess Technology, Inc. | Intelligent blemish control algorithm and apparatus |
-
2004
- 2004-02-27 JP JP2004053044A patent/JP4347721B2/ja not_active Expired - Fee Related
-
2005
- 2005-02-24 WO PCT/JP2005/003542 patent/WO2005084015A1/ja active Application Filing
- 2005-02-24 US US10/586,699 patent/US20080239112A1/en not_active Abandoned
- 2005-02-24 EP EP05719857A patent/EP1720343A1/en not_active Withdrawn
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH0951479A (ja) * | 1995-08-08 | 1997-02-18 | Fujitsu Ltd | 撮像装置 |
JP2001251636A (ja) * | 2000-03-07 | 2001-09-14 | Fuji Photo Film Co Ltd | 固体撮像装置および画素欠陥検出方法 |
JP2002281386A (ja) * | 2001-03-16 | 2002-09-27 | Olympus Optical Co Ltd | 撮像装置 |
Also Published As
Publication number | Publication date |
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JP4347721B2 (ja) | 2009-10-21 |
EP1720343A1 (en) | 2006-11-08 |
JP2005244700A (ja) | 2005-09-08 |
US20080239112A1 (en) | 2008-10-02 |
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