WO2005083758A1 - ステ−ジ装置及び投影露光装置 - Google Patents
ステ−ジ装置及び投影露光装置 Download PDFInfo
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- WO2005083758A1 WO2005083758A1 PCT/JP2005/003395 JP2005003395W WO2005083758A1 WO 2005083758 A1 WO2005083758 A1 WO 2005083758A1 JP 2005003395 W JP2005003395 W JP 2005003395W WO 2005083758 A1 WO2005083758 A1 WO 2005083758A1
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- WIPO (PCT)
- Prior art keywords
- stage
- stage device
- support
- exposure apparatus
- cowl
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- G—PHYSICS
- G12—INSTRUMENT DETAILS
- G12B—CONSTRUCTIONAL DETAILS OF INSTRUMENTS, OR COMPARABLE DETAILS OF OTHER APPARATUS, NOT OTHERWISE PROVIDED FOR
- G12B5/00—Adjusting position or attitude, e.g. level, of instruments or other apparatus, or of parts thereof; Compensating for the effects of tilting or acceleration, e.g. for optical apparatus
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/50—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for positioning, orientation or alignment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P76/00—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography
Definitions
- the present invention relates to a stage device that requires precise position measurement, such as a wafer stage of a projection exposure apparatus, and particularly to a stage device to which optical position measurement is applied.
- the present invention also relates to a projection exposure apparatus provided with the stage device.
- a stage (support table) on which a wafer is mounted is precisely measured by a length measuring interferometer (Patent Document 1, Patent Document 2, etc.).
- the movable mirror of the length measuring interferometer is fixed to the stage.
- the movable mirror reflects a laser beam (a beam for position measurement) emitted from the length measuring interferometer.
- the length measuring interferometer measures the position of the stage based on the reflected light beam.
- Patent document 1 JP-A-5-6850
- Patent Document 2 JP-A-5-283313
- an object of the present invention is to provide a stage device that can suppress the influence of a heat source of a stage on optical position measurement.
- Another object of the present invention is to provide a projection exposure apparatus having high exposure accuracy.
- a stage device of the present invention supports an object and is capable of moving in at least one predetermined direction, and is fixed to the support, and projects light from behind when the support moves in the predetermined direction.
- a cowl portion a cowl portion.
- the stage device further includes an air guide pipe for introducing a temperature-controlled gas and blowing the gas along the surface of the cowl portion at least when the support base moves in the predetermined direction. Is also good.
- the air guide tube may have a function of jetting the gas at least when the support base moves in the predetermined direction.
- the air guide tube may have an inlet and an outlet near the surface of the cowl portion, and the size of the outlet may be set smaller than the size of the inlet.
- the air guide tube may have an inlet connected to a blower that blows the temperature-controlled gas, and an outlet may be provided near a surface of the cowl portion.
- a projection exposure apparatus includes a projection optical system and any one of the stage devices according to the present invention.
- a scan method of performing exposure while moving the support base of the stage device in the predetermined direction may be applied.
- stage device of the present invention is a stage device provided with a support that supports an object and is movable in a predetermined plane, wherein the support extends in parallel with the predetermined plane, and It is characterized by comprising a reflecting portion having a reflecting surface substantially perpendicular to a plane, and a curved portion formed along the reflecting portion so as to be more convex than the reflecting portion.
- the curved surface portion may include a part of a cylindrical surface whose central axis is an axis parallel to the predetermined plane and the reflecting surface.
- the support base may have a support surface for supporting the object, and the curved surface portion may have a curved surface substantially continuous with the support surface.
- the reflection part and the curved surface part are formed on the same reflection member.
- stage device of the present invention there is provided a movable portion mounted on the predetermined plane and movable while holding the support table, and the support table is mounted so as to protrude from the movable unit. It can be assumed that.
- the exposure apparatus of the present invention is an exposure apparatus that forms a pattern on an object by exposure light, and uses any one of the stage apparatuses of the present invention as a stage apparatus that supports and moves the object.
- the exposure apparatus supplies a gas whose temperature has been adjusted toward the predetermined plane from a direction substantially orthogonal to the predetermined plane on which the stage apparatus moves. ,.
- the rectified airflow prevents the high-temperature gas present at the lower part of the support from being caught in the optical path.
- an effect can be expected by preventing entrainment of high-temperature gas existing in other places into the optical path.
- a stage device that can suppress the influence of the heat source of the stage on the optical position measurement is realized.
- the projection exposure apparatus of the present invention employs the stage device.
- FIG. 1 is a configuration diagram of a projection exposure apparatus according to a first embodiment.
- FIG. 2 is a perspective view of a stage device 17 of the first embodiment.
- FIG. 3 is a cross-sectional view (cross-sectional view cut along the ZX plane) of a rear end portion of the X stage 17X of the first embodiment.
- FIG. 4 (a) is a cross-sectional view (a cross-sectional view cut along a ZX plane) illustrating an airflow around a rear end portion of a conventional X stage 17X.
- (B) is a cross-sectional view (a cross-sectional view cut along the ZX plane) explaining the airflow around the rear end of the X stage 17X of the first embodiment.
- FIG. 6 is a cross-sectional view (cross-sectional view cut along a ZX plane) showing an X stage 17X in which a cowl portion 19 ′ is formed of a transparent material.
- FIG. 7 is a cross-sectional view (cross-sectional view cut along a ZX plane) of a rear end of an X stage 17X according to a second embodiment.
- FIG. 8 is a perspective view of a rear end of an X stage 17X of a second embodiment.
- FIG. 9 is a cross-sectional view (a cross-sectional view cut along a ZX plane) illustrating an airflow around a rear end of an X stage 17X of a second embodiment.
- FIG. 10 is a schematic sectional view (a sectional view cut along a ZX plane) of a rear end portion of an X stage 17X of a third embodiment.
- FIG. 11 (a) is a perspective view of a rear end of an X stage 17X of a third embodiment. (b) is a perspective view showing a rear end of the X stage 17X in which the cowl section 19 is provided with a plurality of minute outlets 30a '.
- FIG. 12 Schematic cross-sectional view (cross-sectional view cut along the ZX plane) showing the rear end of the X stage 17X in which two blowout ports 40a-1, 40a-2 are provided on the rounded surface portion of the cowl portion 19 " It is.
- FIG. 13 is a diagram illustrating a stage device 17 according to a fourth embodiment.
- FIG. 14 is a perspective view of an X-stage 57X provided with a cowl portion 59 having a smooth surface continuous with left and right surfaces.
- FIG. 15 (a) is a perspective view illustrating an airflow around an X stage 57X.
- (b) is a perspective view for explaining the outer shape of the X stage 67X and the airflow around it.
- (C) is a perspective view for explaining the outer shape of the X stage 77X and the airflow around it.
- FIG. 16 (a) is a perspective view of an X stage (cylindrical stage) provided with the cowl portion 59 shown in FIG. 14 (a) on both front and rear sides.
- (B) is a perspective view of a stage (a kyatumble type stage) in which the cowl section 69 shown in FIG. 14 (b) is provided on both front and rear sides.
- FIG. 14C is a perspective view of an X stage (capsule type stage) provided with the cowl portion 79 shown in FIG. 14C on both the front and rear sides.
- FIG. 1 a first embodiment of the present invention will be described with reference to FIG. 1, FIG. 2, FIG. 3, FIG. 4, FIG.
- This embodiment is an embodiment of a projection exposure apparatus.
- the projection exposure apparatus includes a light source 11, a fly-eye lens 12, a dichroic mirror 13, a condenser lens 14, and the like. These optical systems are illumination optical systems.
- the projection exposure apparatus includes a reticle 15, a projection optical system 16, and a stage device 17.
- the wafer W is placed on the stage device 17.
- the entire atmosphere (air) of the projection exposure apparatus is temperature-controlled.
- the space for accommodating the stage device 17 is designed to suppress air fluctuations that cause the measurement accuracy of the length measuring interferometers 20X and 20Y (20Y is not shown in FIG. 1; see FIG. 2 and detailed later). Therefore, the temperature is precisely controlled (air-conditioned) by the gas supply device AC.
- the illumination light emitted from the light source 11 illuminates the reticle 15 via a fly-eye lens 12, a dichroic mirror 13, and a condenser lens 14 with Koehler illumination.
- the projection optical system 16 forms an image of the reticle 15 on the wafer W.
- a partial area E on the surface of the wafer W is exposed.
- the stage device 17 moves the wafer W in a plane perpendicular to the optical axis AX of the projection optical system 16 (hereinafter, illustrated).
- the explanation will be given using an XYZ orthogonal coordinate system in which the direction of the optical axis AX is the Z direction and this plane is the XY plane.)
- the gas supply device AC supplies gas whose temperature is controlled along the Z direction from the top in the Z direction toward the stage device 17. The force that allows the wafer W to move in the Z direction is not described here.
- the stage device 17 includes a Y stage 17Y, an X stage 17 ⁇ , a length measuring interferometer 20 ⁇ , 20 ⁇ , a moving mirror 18X, 18Y, and the like. Also, as shown in Fig. Also equipped with guide rails GY and GX.
- the guide rail GY is provided on a stand (not shown).
- the Y stage 17Y is movable on a guide rail GY in a predetermined direction (hereinafter, referred to as a Y direction) in an XY plane.
- the guide rail GX is provided on the Y stage 17Y.
- the X stage 17X is movable on the guide rail GX in a predetermined direction (hereinafter, referred to as X direction) orthogonal to the Y direction in the XY plane.
- Such a stage 17X can move in the Y direction together with the Y stage 17Y, and can move in the X direction independently of the Y stage 17Y.
- This stage corresponds to the support base in the 17X power claim.
- wafer holder WH On X stage 17X, wafer holder WH is fixed. The wafer holder WH holds the wafer W.
- a coil (not shown) constituting a linear motor is disposed inside the guide rails GY and GX, and a linear motor is provided inside the Y stage 17Y and the X stage 17X (on the guide rails GY and GX side). Are arranged.
- the position of the X stage 17X in the Y direction and the position in the X direction are measured by length measuring interferometers 20Y and 20 °, respectively, which are arranged on a stand (not shown).
- the length measuring interferometer 20 emits a light beam (laser beam) LY for position measurement toward an end in the ⁇ direction of the X stage 17X (hereinafter, referred to as an end on the + ⁇ side).
- a light beam laser beam
- a movable mirror 18Y that reflects the light beam LY is provided at an end on the + ⁇ side of the X stage 17X.
- the length measuring interferometer 20 ⁇ measures the position based on the light beam LY reflected by the moving mirror 18Y, and generates a signal indicating the position of the X stage 17 ⁇ in the ⁇ direction.
- the length measuring interferometer 20 ⁇ emits a position measurement light beam (laser beam) LX toward the end of the X stage 17X in the X direction (hereinafter referred to as the + ⁇ end).
- a movable mirror 18X that reflects the light beam LX is provided.
- the length measuring interferometer 20X measures the position based on the light beam LX reflected by the moving mirror 18X, and generates a signal indicating the position of the X stage 17X in the X direction.
- the length of the movable mirror 18Y in the X direction is secured by the stroke of the X stage 17X in the X direction, and the length of the movable mirror 18X in the Y direction is the Y direction of the stage 17X. Of the stroke.
- the scanning exposure method is applied to the projection exposure apparatus of the present embodiment, and the movement direction of the exposure area E during the exposure time of one shot S is the + X direction or the X direction.
- the X stage 17X moves (hereinafter, this movement is referred to as “stage scan”).
- the direction of the stage scan is the X direction or the + X direction.
- the direction of movement of the X stage 17X during the exposure is, for example, as shown by the arrow in FIG.
- the position where the movable mirror 18X is provided corresponds to the rear end of the X stage 17X during the stage scan in the X direction.
- the optical path of the light beam LX is located behind the movable mirror 18X at this time.
- the X direction is forward
- the + X direction is backward
- the + Y direction is right
- the Y direction is left
- the + Z direction is up
- the Z direction is down.
- a cowl portion 19 is provided on the rear side of the X stage 17X.
- the outer shape of the cowl portion 19 has a columnar shape with a substantially fan-shaped bottom at an angle of 90 °.
- the position and posture of the cowl portion 19 are such that the longitudinal direction (the direction corresponding to the height of the column) is oriented in the Y direction, and the smooth surface of the round shape (substantially cylindrical side surface shape) is It is set to be continuous.
- Such a cowl portion 19 smoothens the edge formed by the rear surface and the upper surface of the movable mirror 18X.
- the region where the optical path EL of the light beam LX is to be A gap is provided in a region facing the reflecting surface M of the movable mirror 18X, into which the light beam LX can enter.
- the shape of the opening 19a of such a gap is a slit shape that is long in the Y direction as shown in Fig. 2.
- the material of the cowl portion 19 has a rigidity that does not deform at least during the movement of the X stage 17X. It is a material that is lightweight enough to have no limitation on the moving speed and moving amount of the X stage 17X. Also, it is a material suitable for forming the outer shape of the cowl portion 19 into an appropriate shape (a resin material or the like).
- FIG. 4 (a) shows the vicinity of the rear end of the X stage 17X of the conventional projection exposure apparatus for comparison.
- FIG. 4B is a diagram showing the vicinity of the rear end of the X stage 17X of the projection exposure apparatus of the present embodiment.
- the only difference between the conventional projection exposure apparatus and the projection exposure apparatus of the present embodiment is the presence or absence of the cowl section 19 (the point where the scanning method is applied and the stage scanning direction are the same).
- the coils of the linear motor are arranged as described above. Although the temperature of the entire atmosphere of the stage device 17 is controlled, each time the stage device 17 is driven, heat is generated in the coil. Therefore, the temperature of the gas in this region EH is equal to the temperature of the gas in other regions. (At least higher than the temperature of the optical path EL of the light beam LX.) 0
- the gas in the high-temperature region EH is prevented from being swirled up and taken into the optical path EL. Therefore, the temperature fluctuation of the optical path EL of the light beam LX is reduced, and the accuracy of position measurement by the length measuring interferometer 20X (see FIGS. 1 and 2) is maintained.
- the accuracy of the position measurement of the length measuring interferometer 20X is maintained in this way, the accuracy of the position measurement in the X direction during the stage scan in the X direction is maintained, and the exposure accuracy of the projection exposure apparatus is also maintained.
- the width of the gap in the Z direction is set to be sufficiently narrow to about the width of the optical path EL of the light beam LX. It is assumed that no gas flows into the gap during the stage scan in the X direction. Therefore, it can be considered that the regular airflow is not disturbed.
- the stage device 17 of the present embodiment is provided with the cowl portion 19, the influence of the heat source (here, the coil of the linear motor) on the length measuring interferometer 20X can be suppressed. Further, since the projection exposure apparatus of the present embodiment includes such a stage device 17, the exposure accuracy can be kept high.
- the opening 19a of the gap may be sealed with a window member 19b transparent to the light beam LX.
- the shape of the surface of the window material 19b is smoothly adjusted so as to be continuous with the shape of the surface of the cowl portion 19.
- the material of the window material 19b prevents the inflow of gas such as a protective film, glass, resin, and the like used for general optical elements (at least the gas of various types used as the atmosphere of the stage device 17).
- a material that prevents inflow and transmits the light beam LX is applied.
- the material is
- the X stage 17X has a rigidity at least not to be deformed during the movement of the X stage 17X, and is light enough not to limit the moving speed and the moving amount of the X stage 17X.
- the refractive index and thickness of the window material 19b are parameters that determine the characteristics of the optical path EL.
- the gap is sealed by such a window member 19b, the regular turbulence of the airflow is reliably prevented even if the width of the gap (the width of the opening 19a) is somewhat wide.
- the length measuring interferometer 20X Since the characteristics of the optical path EL are changed by inserting the window material 19b, the length measuring interferometer 20X needs to be separately calibrated.
- the entire gap may be filled with the same material as the window material 19b.
- the entire cowl portion may be formed of a material transparent to the light beam LX, and the gap may be eliminated (the cowl may be provided). Part 19,).
- a material that prevents gas from flowing in and transmits the light beam LX such as glass and resin used in general optical elements, is applied.
- the length measuring interferometer 20X needs to be separately calibrated.
- the measured value may be corrected based on at least one of the position and orientation of the stage device 17 in the Z direction (around the X axis and rotation around the Z or Y axis).
- a cavity may be provided inside the cowl portions 19, 19 'for lightweight dagger.
- FIG. 7 a second embodiment of the present invention will be described with reference to FIGS. 7, 8, and 9.
- FIG. 8 a second embodiment of the present invention will be described with reference to FIGS. 7, 8, and 9.
- the present embodiment is an embodiment of a stage device applicable to a projection exposure apparatus instead of the stage device 17 of the first embodiment. Here, only the differences from the stage device 17 of the first embodiment will be described.
- stage 17X As shown in FIG. 7, the X-stage 17X of the present embodiment is provided with an air guide tube 21 in addition to the cowl 19.
- the introduction port 21b of the air guide tube 21 is provided at the front end of the X-stage 17X, and the outlet (nozzle) 21a of the air guide tube 21 is provided near the surface of the cowl portion 19 (an R-shaped surface). (In Fig. 7, it is provided on the upper surface of the moving mirror 18X.) O
- the blowing direction of the outlet 21a coincides with the tangential direction of the surface of the cowl portion 19 (an R-shaped surface) or the upper surface of the movable mirror 18X. It matches the direction.)
- the introduction direction of the introduction port 21b is the front-back direction of the X-tage 17X.
- the size of the outlet 21a is smaller than the size of the inlet 21b! / ,.
- the shape of the outlet 21a is a slit that is long in the Y direction.
- the length of the outlet 21a in the Y direction is at least as long as the length of the opening 19a of the cowl portion 19 in the Y direction.
- gas in front of the X stage 17X is introduced into the air guide tube 21 from the inlet 21b.
- the gas introduced into the air guide pipe 21 flows toward the rear inside the air guide pipe 21 (see the arrow), and is then blown out from the outlet 21a in a tangential direction on the upper surface of the movable mirror 18X.
- the air guide tube 21 has a function to jet the introduced gas (to increase the flow velocity).
- a jet flows from the outlet 21a.
- the jet produces the Coanda effect, and as shown by the arrow in FIG. 9, a high-speed airflow is drawn to the upper surface of the moving mirror 18X and the surface of the cowl portion 19 (an arc-shaped surface), and the temperature rises. It is ensured that the gas in the high-area region EH and the entrainment in the optical path EL are prevented. Therefore, the temperature fluctuation of the optical path EL of the light beam LX is reliably reduced, and the length measurement interferometer 20X (see FIGS. 1 and 2) is used. Therefore, the accuracy of the position measurement is surely maintained.
- stage device 17 of the present embodiment is provided with the cowl portion 19 and the air guide tube 21, the influence of the heat source (here, the coil of the linear motor) on the length measuring interferometer 20X can be definitely confirmed. Can be suppressed.
- the gap between the cowl portions 19 of the present embodiment can be modified as shown in Figs.
- FIG. 10 is an embodiment of a stage device applicable to a projection exposure apparatus instead of the stage device of the second embodiment.
- stage device of the second embodiment is an embodiment of a stage device applicable to a projection exposure apparatus instead of the stage device of the second embodiment.
- the X stage 17X of the present embodiment is provided with an air guide tube 30 and a blower (blower) 31 instead of the air guide tube 21.
- An inlet 30b of the air guide tube 30 is connected to the blower 31, and an air outlet (nozzle) 30a of the air guide tube 30 is provided near the surface (the R-shaped surface) of the cowl portion 19 (Fig. 10). Is provided on the upper surface of the movable mirror 18X.)
- the blowing direction of the air outlet 30a coincides with the tangential direction of the surface of the cowl portion 19 (an R-shaped surface) or the upper surface of the movable mirror 18X. O)
- the shape of the air outlet 30a is a slit shape long in the Y direction.
- the length of the outlet 30a in the Y direction is at least the same as the length of the opening 19a of the cowl portion 19 in the Y direction. Is secured.
- the blower 31 may be fixed to any of the X stage 17X, the Y stage 17Y, and a mount (not shown).
- the air guide tube 30 is flexible (at least a part of the tube is freely bendable) and has at least a stroke in the X direction of the X stage 17X. It is set to a length with a margin.
- the air guide tube 30 is flexible and has a length that allows at least the stroke of the X stage 17X in the X and ⁇ directions. Is set to
- the blower 31 is driven at least during stage scanning in the X direction. At this time, the blower 31 flows a gas of the same type as the gas used as the atmosphere of the stage 17X and the temperature of which is controlled to the same temperature as the gas at a constant flow rate into the inlet 30b of the air guide tube 30.
- a jet flows from the outlet 30a of the air guide tube 30. The jet generates a Coanda effect, and an air flow is generated at such a speed as to be sucked and brought close to the upper surface of the movable mirror 18X and the surface of the cowl portion 19 (an R-shaped surface).
- the stage device 17 of the present embodiment is provided with the cowl portion 19, the air guide tube 30, and the blower 31, so that the influence of the heat source (here, the coil of the linear motor) on the length measuring interferometer 20X is limited. Can be reliably suppressed.
- FIG. 11 (b) instead of the air guide tube 30 having the slit-shaped outlet 30a (FIG. 11 (a)), as shown in FIG. 11 (b), a plurality of minute outlets arranged at regular intervals in the Y direction.
- An air guide tube 30 'having 30a' may be used. Since the jet flows out from each outlet 30a ', the same effect as when the air guide tube 30 (FIG. 11 (a)) is used can be obtained.
- Note that such a plurality of minute air outlets can be similarly applied to the air guide tube 21 (see FIGS. 7 and 8) of the second embodiment.
- the position where the air outlet is provided may be, for example, as shown by reference numerals 40a-1 and 40a-2 in Fig. 12, even on the round surface portion of the cowl portion (reference numeral 19 "in Fig. 12). Good.
- FIG. 12 shows two air guide tubes 40-1 and 40-2 and two air outlets 40a-1 and 40a-2 provided on the Arnole-shaped surface of Kaunore 19 ". .
- two outlets 40a-1 and 40a-2 are arranged in order from the upstream side so as to sandwich the opening 19a of the gap of the cowl portion 19 ".
- the jet from the outlet 40a-1 located on the upstream side is dragged by the jet of the force of the outlet 40a-2 located on the downstream side, so that the airflow due to the Coanda effect as shown by the arrow in the figure is near the opening 19a. It is expected to be continuous without any disturbance.
- This embodiment is an embodiment of a stage device applicable to a projection exposure apparatus instead of the stage device 17 of each of the above embodiments.
- the same components as those in the above embodiments are denoted by the same reference numerals, and description thereof is omitted.
- the stage device 17 of the present embodiment mainly includes a support 17a and an XY stage 17b as a movable portion.
- the support 17a includes a wafer holder WH having a support surface on which the wafer W is mounted, and the support surface of the wafer holder WH is formed substantially the same as the upper surface of the support 17a.
- a cowl (curved surface) 19 is provided, and the outer surface is almost continuous from the support surface of the wafer holder WH to the upper portion of the support 17a and the cowl 19. ing.
- a reflection surface (moving mirror) is provided on a surface of the support 17a facing the length measuring interferometers 20X and 20Y (a position for receiving light from the length measuring interferometers 20X and 20Y).
- the cowl section 19 the various forms described above can be applied.
- FIG. 13 shows an example in which the movable mirror is formed of the same member as the support 17a.
- the XY stage 17b is mounted on a reference plane BP parallel to the XY plane so as to be two-dimensionally movable through an air bearing (not shown) in a non-contact manner, and extends along the reference plane BP. It can be moved by a linear motor (not shown).
- the outer shape of the XY stage 17b as viewed in the XY plane is formed in a cylindrical shape. Since the XY stage 17b is formed smaller than the support 17a, when the support 17a is placed, the support 17a protrudes along the XY plane.
- the stage device 17 of the present embodiment since the outer surface of the support 17a is a substantially continuous surface, when the stage device 17 moves, the turbulence of the air flow on the support 17a is suppressed. can do. In particular, at the time of scan exposure, it is necessary to constantly measure the position of the stage device 17 with high accuracy even during the scanning operation. However, according to the stage device 17 of the present embodiment, even when the stage device 17 is moving, Since the fluctuation can be suppressed, the measurement accuracy of the length measuring interferometers 20X and 20Y can be kept high. In particular, when down-flow air conditioning is performed by the gas supply device AC (not shown in FIG. 13; see FIG. 1), the air flows along the surface of the support 17a, so that the Coanda effect is further improved. It is promoted and air fluctuation can be suppressed.
- stage 17 of the present embodiment is configured such that the support base 17a protrudes from the XY stage 17b, the high temperature on the reference plane BP and the winding of air in the region EH Less susceptible to interference. Furthermore, since the XY stage 17b has a cylindrical outer shape, the turbulence of the air in the region EH during the movement of the XY stage 17b can be suppressed.
- the cowl portion having a smooth surface continuous with the upper surface of the movable mirror 18X is shown.
- the cowl portion has a smooth surface continuous with the left and right surfaces of the stage.
- a cowl portion 59 may be used.
- the entire X stage provided with the movable mirror and the cowl section 59 is indicated by reference numeral 57X.
- reference numeral M denotes a reflecting surface of the movable mirror
- reference numeral 59a denotes an opening through which the light flux LX passes.
- a cowl portion 69 having a smooth surface continuous with the upper and lower surfaces of the stage may be used.
- the entire X stage provided with the movable mirror and the cowl section 69 is indicated by reference numeral 67X.
- the reflecting surface and aperture of the movable mirror are not shown.
- a cowl portion 79 having a smooth surface continuous with the upper surface and the lateral surface of the X stage may be used.
- the entire X stage provided with the movable mirror and the cowl section 79 is indicated by reference numeral 77X.
- the reflecting surface and aperture of the movable mirror are not shown.
- each cowl portion may be a separate member from the X stage or the same member as long as the above conditions (conditions such as rigidity and weight) are satisfied!
- cowl portion is formed only at the rear end of the X stage.
- the front end of the X stage may be added. Good.
- FIG. 16 (a) shows a stage (a cylindrical stage) in which the cowl portion 59 shown in FIG. 15 (a) is provided at both the front end and the rear end.
- FIG. 16 (b) shows an X stage (Katabira type stage) in which the cowl portion 69 shown in FIG. 15 (b) is provided at both the front end and the rear end.
- FIG. 16 (c) shows a stage (capsule type stage) in which the cowl portion 79 shown in FIG. 15 (c) is provided at both the front end and the rear end.
- a similar cowl portion may be provided on the optical path side of the movable mirror 18Y.
- the heat source here, the ) On the length measuring interferometer 20Y.
- measuring length interferometer 20X measures the position in the stage scan direction (here, X direction). Therefore, it is necessary to provide a cowl section on the optical path side of the moving mirror 18X.
- the shape of the cowl portion and the air guide tube (shape and size of the curved surface, etc.), the driving conditions of the blower, and the like are determined by the viscosity of the gas (determined by the type of the gas, the temperature of the gas, and the like), and the stage device. It is desirable to select as appropriate according to the size of each part of 17 and the characteristics of X-tage 17X (characteristics related to movement). The selection is made by experiment or calculation.
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| JP2006510523A JPWO2005083758A1 (ja) | 2004-03-02 | 2005-03-01 | ステージ装置及び投影露光装置 |
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| JP2004057669 | 2004-03-02 | ||
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| WO2005083758A1 true WO2005083758A1 (ja) | 2005-09-09 |
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| Application Number | Title | Priority Date | Filing Date |
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| PCT/JP2005/003395 Ceased WO2005083758A1 (ja) | 2004-03-02 | 2005-03-01 | ステ−ジ装置及び投影露光装置 |
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| WO (1) | WO2005083758A1 (ja) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008072100A (ja) * | 2006-08-25 | 2008-03-27 | Asml Netherlands Bv | リソグラフィ装置及びデバイス製造方法 |
| WO2008072647A1 (en) * | 2006-12-13 | 2008-06-19 | Canon Kabushiki Kaisha | Exposure apparatus and device fabrication method |
| JP2010238987A (ja) * | 2009-03-31 | 2010-10-21 | Nikon Corp | 露光装置及びデバイスの製造方法 |
| JP2010263213A (ja) * | 2009-05-08 | 2010-11-18 | Asml Netherlands Bv | 液浸リソグラフィ装置及びデバイス製造方法 |
| WO2016008641A1 (en) * | 2014-07-16 | 2016-01-21 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
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| JPH021505A (ja) * | 1988-06-03 | 1990-01-05 | Nikon Corp | 干渉計付ステージ |
| JPH056850A (ja) * | 1991-02-07 | 1993-01-14 | Nikon Corp | 露光装置 |
| JPH08166207A (ja) * | 1994-12-14 | 1996-06-25 | Nikon Corp | 気流安定装置 |
| JPH10149975A (ja) * | 1996-11-15 | 1998-06-02 | Canon Inc | 露光装置およびデバイス製造方法 |
| JP2001160531A (ja) * | 1999-12-01 | 2001-06-12 | Canon Inc | ステージ装置 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3089802B2 (ja) * | 1992-04-01 | 2000-09-18 | 株式会社ニコン | ステージの位置計測装置、投影露光装置及び投影露光方法 |
-
2005
- 2005-03-01 WO PCT/JP2005/003395 patent/WO2005083758A1/ja not_active Ceased
- 2005-03-01 JP JP2006510523A patent/JPWO2005083758A1/ja active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH021505A (ja) * | 1988-06-03 | 1990-01-05 | Nikon Corp | 干渉計付ステージ |
| JPH056850A (ja) * | 1991-02-07 | 1993-01-14 | Nikon Corp | 露光装置 |
| JPH08166207A (ja) * | 1994-12-14 | 1996-06-25 | Nikon Corp | 気流安定装置 |
| JPH10149975A (ja) * | 1996-11-15 | 1998-06-02 | Canon Inc | 露光装置およびデバイス製造方法 |
| JP2001160531A (ja) * | 1999-12-01 | 2001-06-12 | Canon Inc | ステージ装置 |
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008072100A (ja) * | 2006-08-25 | 2008-03-27 | Asml Netherlands Bv | リソグラフィ装置及びデバイス製造方法 |
| WO2008072647A1 (en) * | 2006-12-13 | 2008-06-19 | Canon Kabushiki Kaisha | Exposure apparatus and device fabrication method |
| JP2010238987A (ja) * | 2009-03-31 | 2010-10-21 | Nikon Corp | 露光装置及びデバイスの製造方法 |
| JP2010263213A (ja) * | 2009-05-08 | 2010-11-18 | Asml Netherlands Bv | 液浸リソグラフィ装置及びデバイス製造方法 |
| US8405819B2 (en) | 2009-05-08 | 2013-03-26 | Asml Netherlands B.V. | Immersion lithographic apparatus and device manufacturing method |
| WO2016008641A1 (en) * | 2014-07-16 | 2016-01-21 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| KR20170032401A (ko) * | 2014-07-16 | 2017-03-22 | 에이에스엠엘 네델란즈 비.브이. | 리소그래피 장치 및 디바이스 제조 방법 |
| CN106537256A (zh) * | 2014-07-16 | 2017-03-22 | Asml荷兰有限公司 | 光刻设备和器件制造方法 |
| JP2017526955A (ja) * | 2014-07-16 | 2017-09-14 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置およびデバイス製造方法 |
| US10133197B2 (en) | 2014-07-16 | 2018-11-20 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| KR101947049B1 (ko) * | 2014-07-16 | 2019-05-16 | 에이에스엠엘 네델란즈 비.브이. | 리소그래피 장치 및 디바이스 제조 방법 |
| CN106537256B (zh) * | 2014-07-16 | 2019-12-27 | Asml荷兰有限公司 | 光刻设备和器件制造方法 |
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| Publication number | Publication date |
|---|---|
| JPWO2005083758A1 (ja) | 2007-11-29 |
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