WO2004082018A3 - Elektronisches bauteil mit halbleiterchip und kunststoffgehäuse und verfahren zur herstellung desselben - Google Patents

Elektronisches bauteil mit halbleiterchip und kunststoffgehäuse und verfahren zur herstellung desselben Download PDF

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Publication number
WO2004082018A3
WO2004082018A3 PCT/DE2004/000461 DE2004000461W WO2004082018A3 WO 2004082018 A3 WO2004082018 A3 WO 2004082018A3 DE 2004000461 W DE2004000461 W DE 2004000461W WO 2004082018 A3 WO2004082018 A3 WO 2004082018A3
Authority
WO
WIPO (PCT)
Prior art keywords
semiconductor chip
producing
electronic component
plastic housing
same
Prior art date
Application number
PCT/DE2004/000461
Other languages
English (en)
French (fr)
Other versions
WO2004082018A2 (de
Inventor
Robert-Christian Hagen
Simon Jerebic
Original Assignee
Infineon Technologies Ag
Robert-Christian Hagen
Simon Jerebic
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Infineon Technologies Ag, Robert-Christian Hagen, Simon Jerebic filed Critical Infineon Technologies Ag
Priority to US10/548,854 priority Critical patent/US7508083B2/en
Priority to EP04718612A priority patent/EP1606841A2/de
Publication of WO2004082018A2 publication Critical patent/WO2004082018A2/de
Publication of WO2004082018A3 publication Critical patent/WO2004082018A3/de

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
    • H01L23/3142—Sealing arrangements between parts, e.g. adhesion promotors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/0657—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape of the body
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181—Encapsulation
    • H01L2924/183—Connection portion, e.g. seal
    • H01L2924/18301—Connection portion, e.g. seal being an anchoring portion, i.e. mechanical interlocking between the encapsulation resin and another package part

Abstract

Die Erfindung betrifft ein elektronisches Bauteil, das einen Halbleiterchip (1). Dieser Halbleiterchip (1) ist in einem Kunststoffgehäuse (6) derart eingebettet, dass seine Rückseite (3) und seine Randseiten (4, 5) in einer Kunststoffmasse (7) eingebettet sind. Die Randseiten (4, 5) und/oder die Rückseite (3) des Halbleiterchips (2) weisen einen Verankerungsbereich (10) auf, über den der Halbleiterchip (1) mit der umgebenden Kunststoffmasse (7) formschlüssig in Eingriff steht. Ferner betrifft die Erfindung ein Verfahren zur Herstellung des Bauteils.
PCT/DE2004/000461 2003-03-11 2004-03-09 Elektronisches bauteil mit halbleiterchip und kunststoffgehäuse und verfahren zur herstellung desselben WO2004082018A2 (de)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US10/548,854 US7508083B2 (en) 2003-03-11 2004-03-09 Electronic component comprising a semiconductor chip and a plastic housing, and method for producing the same
EP04718612A EP1606841A2 (de) 2003-03-11 2004-03-09 Elektronisches bauteil mit halbleiterchip und kunststoffgehäuse und verfahren zur herstellung desselben

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10310842A DE10310842B4 (de) 2003-03-11 2003-03-11 Elektronisches Bauteil mit Halbleiterchip und Kunststoffgehäuse
DE10310842.4 2003-03-11

Publications (2)

Publication Number Publication Date
WO2004082018A2 WO2004082018A2 (de) 2004-09-23
WO2004082018A3 true WO2004082018A3 (de) 2004-11-11

Family

ID=32920753

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/DE2004/000461 WO2004082018A2 (de) 2003-03-11 2004-03-09 Elektronisches bauteil mit halbleiterchip und kunststoffgehäuse und verfahren zur herstellung desselben

Country Status (4)

Country Link
US (1) US7508083B2 (de)
EP (1) EP1606841A2 (de)
DE (1) DE10310842B4 (de)
WO (1) WO2004082018A2 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005023949B4 (de) 2005-05-20 2019-07-18 Infineon Technologies Ag Verfahren zur Herstellung eines Nutzens aus einer Verbundplatte mit Halbleiterchips und einer Kunststoffgehäusemasse und ein Verfahren zur Herstellung von Halbleiterbauteilen mittels eines Nutzens
US20070111399A1 (en) * 2005-11-14 2007-05-17 Goida Thomas M Method of fabricating an exposed die package
DE102006060629A1 (de) * 2006-12-21 2008-06-26 Robert Bosch Gmbh Elektrisches Bauelement
JP4525786B2 (ja) * 2008-03-31 2010-08-18 Ｔｄｋ株式会社 電子部品及び電子部品モジュール
JP2012199420A (ja) * 2011-03-22 2012-10-18 Fujitsu Ltd 半導体装置
JP2014192347A (ja) * 2013-03-27 2014-10-06 Murata Mfg Co Ltd 樹脂封止型電子機器およびそれを備えた電子装置
GB2514547A (en) * 2013-05-23 2014-12-03 Melexis Technologies Nv Packaging of semiconductor devices
KR101933424B1 (ko) * 2017-11-29 2018-12-28 삼성전기 주식회사 팬-아웃 반도체 패키지
JP7247124B2 (ja) * 2020-01-07 2023-03-28 三菱電機株式会社 半導体モジュール
JP2022043997A (ja) 2020-09-04 2022-03-16 エスティーマイクロエレクトロニクス エス．アール．エル． 信頼性を改善した電子装置の要素の製造方法、及び関連要素、電子装置、及び電子機器

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63143851A (ja) * 1986-12-08 1988-06-16 Nec Corp 半導体装置
JPH02144946A (ja) * 1988-11-26 1990-06-04 Mitsubishi Electric Corp 半導体装置
DE19509262A1 (de) * 1995-03-15 1996-09-19 Siemens Ag Halbleiterbauelement mit Kunststoffumhüllung
US6184064B1 (en) * 2000-01-12 2001-02-06 Micron Technology, Inc. Semiconductor die back side surface and method of fabrication
DE10206661A1 (de) * 2001-02-20 2002-09-26 Infineon Technologies Ag Elektronisches Bauteil mit einem Halbleiterchip

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0563112A (ja) 1991-09-03 1993-03-12 Sony Corp 半導体装置
DE4401588C2 (de) * 1994-01-20 2003-02-20 Gemplus Gmbh Verfahren zum Verkappen eines Chipkarten-Moduls und Chipkarten-Modul
DE19940564C2 (de) 1999-08-26 2002-03-21 Infineon Technologies Ag Chipkartenmodul und diesen umfassende Chipkarte, sowie Verfahren zur Herstellung des Chipkartenmoduls
US6869894B2 (en) * 2002-12-20 2005-03-22 General Chemical Corporation Spin-on adhesive for temporary wafer coating and mounting to support wafer thinning and backside processing

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63143851A (ja) * 1986-12-08 1988-06-16 Nec Corp 半導体装置
JPH02144946A (ja) * 1988-11-26 1990-06-04 Mitsubishi Electric Corp 半導体装置
DE19509262A1 (de) * 1995-03-15 1996-09-19 Siemens Ag Halbleiterbauelement mit Kunststoffumhüllung
US6184064B1 (en) * 2000-01-12 2001-02-06 Micron Technology, Inc. Semiconductor die back side surface and method of fabrication
DE10206661A1 (de) * 2001-02-20 2002-09-26 Infineon Technologies Ag Elektronisches Bauteil mit einem Halbleiterchip

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
PATENT ABSTRACTS OF JAPAN vol. 012, no. 403 (E - 674) 26 October 1988 (1988-10-26) *
PATENT ABSTRACTS OF JAPAN vol. 014, no. 391 (E - 0968) 23 August 1990 (1990-08-23) *

Also Published As

Publication number Publication date
US20060255478A1 (en) 2006-11-16
EP1606841A2 (de) 2005-12-21
DE10310842A1 (de) 2004-09-30
US7508083B2 (en) 2009-03-24
WO2004082018A2 (de) 2004-09-23
DE10310842B4 (de) 2007-04-05

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