WO2004081966A1 - ビーム電流測定装置およびこれを用いたビーム電流測定方法 - Google Patents
ビーム電流測定装置およびこれを用いたビーム電流測定方法 Download PDFInfo
- Publication number
- WO2004081966A1 WO2004081966A1 PCT/JP2004/003319 JP2004003319W WO2004081966A1 WO 2004081966 A1 WO2004081966 A1 WO 2004081966A1 JP 2004003319 W JP2004003319 W JP 2004003319W WO 2004081966 A1 WO2004081966 A1 WO 2004081966A1
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- WIPO (PCT)
- Prior art keywords
- beam current
- magnetic field
- magnetic
- measuring device
- current measuring
- Prior art date
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
- G01R19/0061—Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents; Measuring in plasmas
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/035—Measuring direction or magnitude of magnetic fields or magnetic flux using superconductive devices
- G01R33/0354—SQUIDS
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/30—Electron or ion beam tubes for processing objects
- H01J2237/304—Controlling tubes
- H01J2237/30472—Controlling the beam
Definitions
- the present invention relates to a beam current measuring apparatus and a beam current measuring method using the same, and particularly to an apparatus for measuring a beam current value with high accuracy without interrupting an ion beam.
- Non-Patent Document 1 One of the methods for measuring the current value of an ion beam with high accuracy without interrupting the beam is the following research report (see Non-Patent Document 1).
- This method measures the beam current value by detecting the magnetic field generated by the beam current using a sensor called a squid (SQUID) using a Josephson junction element, which is an extremely sensitive magnetic field sensor.
- SQUID has a superconducting ring structure in which two Josephson junctions are arranged in parallel, and measures the magnetic flux penetrating this superconducting ring using the flux quantum (2.07 X 10-15 Wb) as a measure.
- the beam current measuring device includes a detecting unit that detects a magnetic field corresponding to the beam current, a magnetic flux transmitting unit that transmits a magnetic flux to the measuring unit, a superconducting element that is sensitive to the transmitted magnetic flux, and a superconducting element. It consists of a measuring part with a feedback coil that flows a return current so as to cancel the change in the penetrating magnetic flux, and a superconductor that magnetically shields the detecting part, magnetic flux transmitting part, and measuring part from the external space including the space where the ion beam flows.
- the main part is constituted by a magnetic shielding part having a gap.
- the detecting section is a coil in which a superconducting wire is wound around a soft magnetic core, and the magnetic field generated by the beam current is collected by a soft magnetic core to induce a superconducting current in the coil.
- the superconducting current induced in this coil is transmitted to the coil located adjacent to SQUID.
- Superconducting current flowing through this coil in response to changes in beam current Changes the amount of magnetic flux that passes through SQUID. Therefore, in this detection unit, the feedback current flows through the feedback coil so that the amount of magnetic flux passing through the SQUID does not change and the change is canceled.
- This feedback current is proportional to the change in the beam current value, and the amount of change in the beam current value can be determined by measuring the feedback current.
- Non-Patent Document 2 a method of measuring a beam current value using a high-temperature superconductor has been studied (see Non-Patent Document 2).
- a cylinder whose surface is coated with a high-temperature superconductor is used as a detection unit.
- the beam current penetrating the center of the cylinder induces a surface shielding current on the surface of the cylinder.
- the surface shielding current concentrates on the bridge.
- the magnetic flux generated by the concentrated surface shielding current is measured by SQUID.
- the SQUID used in this method uses a high-temperature superconductor and can be operated above liquid nitrogen temperature.
- the former beam current measurement device using low-temperature superconducting SQUID can measure beam current with a noise width of about several nA.
- the latter using SQUID of high-temperature superconductivity has the advantage that it can be operated only with liquid nitrogen or a refrigerator, but the noise width is said to be as large as several A (see Non-Patent Document 3).
- the drift of the zero point is large, so that there is a problem that a practical measurement of several tens of seconds or more can measure only a beam current of about 10 A or more.
- Another non-destructive measurement method is a DC current transformer.
- the noise width is equivalent to several / A, and it is actually difficult to measure below 10 A considering the drift of the zero point.
- the beam current measurement device using SQUID of low-temperature superconductivity has high sensitivity but is very sensitive to noise. Since external electromagnetic fields and mechanical vibrations cause noise, various attempts have been made to strengthen the shield. Many studies have been made to strengthen the shields and completely block external electromagnetic fields and mechanical vibrations. The current situation is that people are conducting intensive research.
- the beam current measurement device using SQUID with high temperature superconductivity has low sensitivity and large drift at the zero point, so it was actually able to measure only a beam current of about 101 A or more. Even in a short time measurement where the drift of the zero point can be ignored, the noise width is only a few; it is difficult to measure a beam current smaller than that.
- a beam current measuring device and a measuring method that can measure a beam in a non-bursting manner and that can perform highly accurate measurement.
- the noise immunity is improved, and the continuity of the measurement is not lost.
- a non-bursting type measuring method and a measuring device capable of stably measuring a small beam current with a noise width of about several or less.
- the present invention has been made in view of the above circumstances, and has as its object to provide a high-sensitivity beam current measuring device having good noise resistance characteristics.
- a magnetic shielding unit for shielding an external magnetic field, and a magnetic field sensor disposed in a shielding space generated by the magnetic shielding unit, and a magnetic field generated by a beam current to be measured.
- a beam current measuring device that measures the magnetic flux with a feedback current conversion coefficient of 8 ⁇ 10-15 Wb / A or more.
- the present inventors found that using a sensor with a different sensitivity from the Has been found to improve dramatically.
- the present invention has been made focusing on this point.
- the use of a magnetic field sensor having a magnetic flux-to-feedback current conversion coefficient of 8 ⁇ 10-15 Wb / A or more greatly improves noise resistance.
- a beam current measuring device that has high noise resistance and can measure a beam current with a noise width of several tens of nA to about ⁇ or less.
- the magnetic flux one feedback current transform coefficients by less 2 X 10- 12 Wb / A, a good ⁇ No I's characteristics, and is a region that can measure the noise width is small.
- the magnetic field sensor has a magnetic flux-to-feedback current conversion coefficient of IX 10 to 12 Wb / A or less. The reason is that a measurement with a smaller noise width can be performed.
- the beam current measuring device of the present invention includes a magnetic shielding unit for shielding an external magnetic field, and a magnetic field sensor disposed in a shielding space generated by the magnetic shielding unit, and generates a beam current to be measured.
- the magnetic field sensor measures a magnetic field generated by the magnetic field sensor, and the magnetic field sensor has a magnetic flux sensitivity of 2 ⁇ 10 to 18 Wb / V or more.
- the magnetic field sensor has a magnetic sensitivity of 5 ⁇ 10 to 15 Wb / V or less.
- the magnetic field sensor has a magnetic flux sensitivity of 2 ⁇ 10 15 Wb / V or less.
- the magnetic field sensor has a superconducting ring structure in which two Josephson junctions are arranged in parallel.
- This magnetic field sensor is called SQUID.
- the ratio of the return current flowing through the feedback coil to the change in the amount of magnetic flux passing through the SQUID is defined as the flux-feedback current conversion coefficient.
- the ratio of the output to the change in the amount of magnetic flux passing through the SQUID is defined as the magnetic flux sensitivity.
- flux one feedback current conversion coefficient is 2.
- 95 X 10- 13 Wb / A the magnetic flux sensitivity is SQUID about 5.
- 9 X 10- 16 Wb / V is manufactured using a high-temperature superconductor.
- the high-temperature superconductor refers to an object that exhibits superconductivity at 10 k or more, and preferably a substance that causes superconductivity at 30 k or more.
- a magnetic shield made of a superconductor that magnetically shields the SQUID from the external space including the space where the ion beam flows, because it can shield the external magnetic field and reduce noise.
- the magnetic shield made of a superconductor has a structure with a gap because the external magnetic field can be reduced and only the magnetic field generated by the beam can be selectively passed.
- an electric field shielding part and an electromagnetic field shielding part because the external electric field and the electromagnetic field which fluctuate in a pulse shape or fluctuate at a high frequency can be shielded to improve the stability of the measurement.
- the magnetic sensor has a mechanism for collecting a magnetic field generated by a beam current to be measured.
- the mechanism for collecting the magnetic field is a coil in which a superconducting wire is wound around a soft magnetic core, Alternatively, it is desirable that the surface is coated with a high-temperature superconductor, and the outer peripheral surface is a cylinder having only a part of the high-temperature superconductor bridge portion.
- the electric field shielding portion and the electromagnetic field shielding portion are made of a material containing at least one selected from the group consisting of copper and aluminum, since an eddy current is easily generated and the electric field and the electromagnetic field can be canceled efficiently.
- the beam current of several ⁇ A to several mA is required to measure the beam current of several ⁇ A to several mA with high accuracy.By applying it to the ion implantation device, it is possible to irradiate a semiconductor wafer with an ion beam and simultaneously measure the beam current in a non-broken state. .
- the beam current measuring method of the present invention uses the beam current measuring device, and arranges a magnetic field sensor of the beam current measuring device on a beam line irradiated from the ion source or the electron beam source onto the surface of the workpiece; A beam current value of the beam line is measured from an output of the magnetic field sensor.
- the beam irradiation method of the present invention includes a measurement step of measuring a beam current using the beam current measurement method for a beam generated using an ion source or an electron beam source, and a measurement step obtained by the measurement step. Controlling the beam current value to a control parameter of the ion source or the electron beam source, and irradiating the object with the beam current controlled using the control parameter obtained in the control step. And an irradiation step.
- the beam irradiation device using the above-described beam current measurement device, it is possible to perform beam irradiation while controlling the beam current with high accuracy, and it is possible to perform high-precision processing.
- ion implanters equipped with the above beam current measuring devices, electron beam exposure devices, active devices such as semiconductors, liquid crystals, and biochips manufactured or tested using an accelerator, and passive devices such as resistors, coils, and capacitors are also included. It is valid. Brief description of the drawing>
- FIG. 1 is a diagram showing a beam current measuring device according to an embodiment of the present invention
- Figure 2 is a diagram showing the relationship between the magnetic flux sensitivity and the beam current-to-voltage conversion coefficient.
- FIG. 3 is a diagram showing the relationship between the magnetic flux-feedback current conversion coefficient and the beam current-voltage conversion coefficient.
- 1 is a detection coil
- 2 is a SQUID
- 3 is a feedback coil
- 4 is a feedback resistor
- 5 is a SQUID input coil
- 6 is a washer coil
- 7 is an output.
- FIG. 1 is an explanatory diagram showing a beam current measuring device according to an embodiment of the present invention.
- this beam current measuring device includes a detection coil 1 arranged on a path of a beam to be measured, a magnetic field sensor SQUID 2 for detecting a magnetic field corresponding to a beam current, and the detection coil 1
- a washer coil 6 as a magnetic flux transmission unit that transmits the magnetic flux detected in step 4 to the measurement unit, a superconducting element that responds to the transmitted magnetic flux, and a feedback that flows a feedback current so as to cancel the change in magnetic flux that passes through the superconducting element.
- a measuring section having a coil 3, a SQUID input coil 5, and a SQUID 2 is provided.
- the output of the SQUID 2 is led to an output terminal 7 via a preamplifier and an integrator, and is fed back to a feedback coil 3 via a feedback resistor 4. Is configured.
- the main part of this device is constituted by a magnetic shielding part having a gap made of a superconductor that magnetically shields from a space including the magnetic field sensor 2 and a space in which the ion beam flows.
- the detection coil 1 is a coil in which a superconducting wire is wound around a soft magnetic material core.
- the magnetic field generated by the beam current is collected by a soft magnetic material core to induce a superconducting current in the coil.
- the superconducting current induced in this coil is transmitted to the coil placed adjacent to SQUID 2.
- the amount of magnetic flux passing through the SQUID tries to change by changing the superconducting current flowing through this coil in response to the change in the beam current.
- a feedback current is applied to the return coil so that the amount of magnetic flux passing through the SQUID does not change and the change is canceled.
- This feedback current is proportional to the change in the beam current value, and the amount of change in the beam current value can be determined by measuring the feedback current.
- 8 is a magnetic shielding part
- 9 is a gap. Due to the existence of the gap, the magnetic field sensor can be output in a desired direction. Then, the voltage generated by the feedback current across the feedback resistor 4 is monitored as an output 7 on an oscilloscope.
- the magnetic shield has a gap made of lead. A superconducting magnetic shield is used. The gap is nested in seven steps. Then, the detection coil 1 and SQUID 2 were inserted into the magnetic shield. The magnetic field generated by the beam current to be measured reaches the detection coil 1 through the gap.
- a shield having an electric shielding function in addition to the magnetic shielding section 8 is used.
- experiment was performed by passing a simulated current through a one-turn coil wound in place of the ion beam.
- the magnetic flux one feedback current conversion factor 2 95 X 10- 13 Wb / A N flux sensitivity using the SQUID 5. 9 X 10- 16 Wb / V as a magnetic field sensor 2, using the driving circuit
- the beam current measurement device will be used.
- the magnetic flux-to-feedback current conversion coefficient and the magnetic flux sensitivity are two orders of magnitude higher than those using the high-temperature superconductor described in Non-Patent Document 2 which was conventionally used (described later as Comparative Example 1).
- Other conditions are the same as those used conventionally (Comparative Example 1).
- Mis is the mutual inductance between the SQUID input coil 5 and SQUID 2
- Ip is the superconducting current flowing through the superconducting closed circuit that consists of the sensing coil 1, the dish coil 6, and the SQUID input coil 5
- fs is the feedback coil 3 and the SQUID 2
- the mutual inductance, If, is the feedback current flowing through the feedback coil 3.
- the value of feedback resistor 4 is Rf.
- the first term is the magnetic flux input to SQUID 2
- If ⁇ Rf is the voltage of output 7. Therefore, the magnetic flux sensitivity is determined by Mis ⁇ Ip / If ⁇ Rf.
- the flux-to-feedback current conversion coefficient is found by Mis ⁇ Ip / If.
- Beam current - voltage conversion coefficient at this time can be molar 1. 5 X 10 one 4 A / V and estimated from the magnetic flux sensitivity. That is, the output for the simulated current can be estimated to be about 0.67 mV / 100 nA. It is considered that the noise width can be reduced to about 2 mV from Comparative Example 1. You. This corresponds to a simulated current of about 300 nA.
- the beam current can be measured with a noise width of about 300 nA.
- the mechanism for collecting the magnetic field used a cylindrical structure with a surface coated with a high-temperature superconductor and a bridge part around the periphery composed only of a high-temperature superconductor.
- the outer wall surface of the tubular structure has a high temperature superconducting ridge portion, and the other forms a slit portion S without a high temperature superconductor.
- the magnetic field generated by the concentrated surface shielding current at the bridge is detected by the detection coil and measured by SQUID.
- the SQUID used in this method uses a high-temperature superconductor and can be operated above liquid nitrogen temperature.
- the SQUID is placed as close as possible to the bridge to minimize the leakage of the magnetic field created by the surface shielding current concentrated at the bridge.
- the magnetic flux one feedback current transform coefficients 2 2.
- the magnetic flux sensitivity is high temperature SQUID of 5.
- 9 X 10- 16 Wb / V as a magnetic field sensor, using the driving circuit Beam current measurement device. That is, the same flux-feedback current conversion coefficient and A magnetic field sensor having a degree.
- the output with respect to the simulated current at this time can be estimated to be about 0.67 mV / 100 nA as in the first embodiment. It is considered that the noise width can be reduced to about 2 mV from Comparative Example 1. This corresponds to a simulated current of about 300 nA.
- a beam current motor with high sensitivity and good noise immunity even in a temperature range closer to room temperature can be obtained by using only high-temperature superconductors without using low-temperature superconductors such as lead as members. Can be provided. Next, a comparative example will be described.
- the experiment was conducted by passing a simulated current through a one-turn coil wound in place of the ion beam.
- the simulated current was created by passing a current through a one-turn coil wound so as to pass near the axis of the beam passage hole of the beam current measurement device. At this time, the output was 40 mV for a simulated current of 1 ⁇ .
- the beam current-to-voltage conversion coefficient is 2.5 X 10-2 A / V.
- the noise width was about 2 mV. This corresponds to about 50 ⁇ .
- the beam current cannot be measured with a noise width of several ⁇ ⁇ or less.
- the SQUID is not unlocked due to noise, and stable measurement is possible.
- the device has the same configuration as that of the embodiment of the present invention shown in FIG. 1, and only the magnetic field sensor is different.
- the magnetic flux sensitivity is 1. 8 X 10- 18 Wb / V , was used is 2 orders of magnitude higher sensitivity than Example.
- the magnetic flux-to-feedback current conversion coefficient was 8.46 X 10-15 Wb / A, and the one with two orders of magnitude higher sensitivity than the example was used.
- the output 7 was 40 mV for a simulated current of 10 nA.
- the output 7 was 70 mV for a simulated current of 10 nA.
- the beam current - voltage conversion coefficient is 1. 4 ⁇ 2. 5 X 10_ 7 A / V.
- the noise width was almost the same in both cases, about 10 mV.
- the noise width is equivalent to about 1.4 to 2.5 nA, and the beam current can be measured with a noise width of about several nA.
- it is sensitive to noise and SQUID 2 may become unlocked.
- the frequency with which the hook is released can be reduced by shutting off the external electric field and mechanical vibration, but the measurement must be stable for use in the environment of a general manufacturing process. Sex was an issue.
- the external noise that causes the SQUID to come off in Comparative Example 2 is a pulse-like noise having a large magnetic flux fluctuation per unit time. If the fluctuation of magnetic flux per unit time exceeds the limit of the followability of the drive circuit, the lock will come off. Therefore, in the embodiment, a drive circuit and a SQUID having two orders of magnitude lower magnetic flux sensitivity than Comparative Example 2 are used. As a result, the lock is released only when external noise with a two-digit increase in magnetic flux fluctuation per unit time occurs. By the way, it is considered that the frequency of external noise, whose magnetic flux variation per unit time is two orders of magnitude larger, is extremely low, and the frequency of occurrence of more than two orders of magnitude is reduced.
- the external noise in the form of pulses whose magnetic flux per unit time is so small that the lock does not come off can be excluded from the output signal by using a low-pass filter with an appropriate cutoff frequency. It does not become. From the above, noise Therefore, it is thought that stable measurement can be performed without unlocking the SQUID.
- Table 1 below shows the relationship between the above embodiment and Comparative Examples 1 and 2.
- Fig. 2 shows the relationship curve between the magnetic flux sensitivity and the beam current-to-voltage conversion coefficient. From this result, it is considered that the magnetic flux sensitivity is proportional to the beam current-to-voltage conversion coefficient. It is considered that the noise width can be reduced to about 2 mV from Comparative Example 1 compared to the general noise width of electronic equipment. Noise width of 2 mV it is clear that to correspond to 10 mu A is necessary bicycloalkyl over beam current - voltage conversion coefficient of 5 X 10 one 3 A / V.
- the conditions under which the beam current can be measured in a non-bursting type with a noise width equivalent to 10 ⁇ A can be estimated when the magnetic flux sensitivity is 5 ⁇ 10-1 15 Wb / V or less. These conditions are necessary to solve the problem.
- the magnetic flux sensitivity desirable because better than 2 X 10_ 18 Wb / V allows stable measurement.
- the magnetic flux sensitivity is 2 X 10- 18 Wb / V or more and 5 X 10_ 15 Wb It is desirable to be less than / V.
- FIG. 3 is a diagram showing the relationship between the magnetic flux-feedback current conversion coefficient and the beam current-voltage conversion coefficient. It is considered that the flux-feedback current conversion coefficient and the beam current-voltage conversion coefficient are in a proportional relationship.
- the magnetic flux-to-feedback current conversion coefficient in order to maintain measurement stability and reduce the noise width to 10 ⁇ A or less, the magnetic flux-to-feedback current conversion coefficient must be 8 X 10-15 Wb / A or more. Further, it is desirable that the value be 2 ⁇ 10 ′′ 12 Wb / A or less.
- conditions are flux one feedback current conversion coefficient is 1 X 10- 12 Wb / A or less
- the magnetic flux sensitivity is 2 X 10- 15 for a considerable noise width of several mu Alpha can measure the beam current non-destructive It can be estimated that it is less than Wb / V.
- the present invention it is possible to provide a beam current measuring device having high noise resistance performance, high sensitivity, and good workability, and therefore, a beam current control device is provided.
- the present invention is applicable to an exposure apparatus using the same.
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Superconductor Devices And Manufacturing Methods Thereof (AREA)
- Measurement Of Radiation (AREA)
- Measuring Magnetic Variables (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Particle Accelerators (AREA)
- Electron Sources, Ion Sources (AREA)
- Electron Beam Exposure (AREA)
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Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
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US10/549,251 US7619223B2 (en) | 2003-03-14 | 2004-03-12 | Beam current measuring instrument and beam current measuring method using same |
JP2005503608A JPWO2004081966A1 (ja) | 2003-03-14 | 2004-03-12 | ビーム電流測定装置およびこれを用いたビーム電流測定方法 |
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JP2003-071028 | 2003-03-14 | ||
JP2003071028 | 2003-03-14 |
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US (1) | US7619223B2 (ja) |
JP (1) | JPWO2004081966A1 (ja) |
TW (1) | TW200428454A (ja) |
WO (1) | WO2004081966A1 (ja) |
Cited By (1)
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CN105444913A (zh) * | 2015-11-30 | 2016-03-30 | 武汉钢铁(集团)公司 | 一种测温设备 |
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FR2987897A1 (fr) * | 2012-03-06 | 2013-09-13 | Julien Bergoz | Dispositif de mesure d'un courant electrique circulant dans un milieu |
US9383460B2 (en) | 2012-05-14 | 2016-07-05 | Bwxt Nuclear Operations Group, Inc. | Beam imaging sensor |
US9535100B2 (en) | 2012-05-14 | 2017-01-03 | Bwxt Nuclear Operations Group, Inc. | Beam imaging sensor and method for using same |
CN103913609B (zh) * | 2012-12-31 | 2018-02-16 | 深圳赫美集团股份有限公司 | 不受交变外磁场影响的测量仪表及其实现方法 |
CN104569867B (zh) * | 2013-10-28 | 2018-07-20 | 中国科学院上海微系统与信息技术研究所 | 超导量子干涉传感组件及所适用的超导量子干涉传感器 |
WO2017193129A1 (en) | 2016-05-06 | 2017-11-09 | The Florida State University Research Foundation, Inc. | Feedback control for no-insulation high-temperature superconducting magnet |
WO2018025786A1 (ja) * | 2016-08-03 | 2018-02-08 | 国立研究開発法人理化学研究所 | 荷電粒子ビームの電流測定装置 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001091611A (ja) * | 1999-09-20 | 2001-04-06 | Hitachi Ltd | 高磁場分解能磁束計 |
JP2003021670A (ja) * | 2001-07-08 | 2003-01-24 | Yuichiro Sasaki | 非接触型イオンビーム電流強度測定装置 |
JP2003031176A (ja) * | 2001-07-14 | 2003-01-31 | Yuichiro Sasaki | イオンビーム照射装置 |
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JPH0816692B2 (ja) * | 1990-09-30 | 1996-02-21 | ダイキン工業株式会社 | 磁束ロック方法およびその装置 |
US5113074A (en) * | 1991-01-29 | 1992-05-12 | Eaton Corporation | Ion beam potential detection probe |
JP3655753B2 (ja) * | 1998-10-07 | 2005-06-02 | 日本電気株式会社 | 超伝導電流計測回路とそれを用いた電流計測装置 |
-
2004
- 2004-03-12 US US10/549,251 patent/US7619223B2/en not_active Expired - Fee Related
- 2004-03-12 JP JP2005503608A patent/JPWO2004081966A1/ja active Pending
- 2004-03-12 WO PCT/JP2004/003319 patent/WO2004081966A1/ja active Application Filing
- 2004-03-12 TW TW093106870A patent/TW200428454A/zh not_active IP Right Cessation
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001091611A (ja) * | 1999-09-20 | 2001-04-06 | Hitachi Ltd | 高磁場分解能磁束計 |
JP2003021670A (ja) * | 2001-07-08 | 2003-01-24 | Yuichiro Sasaki | 非接触型イオンビーム電流強度測定装置 |
JP2003031176A (ja) * | 2001-07-14 | 2003-01-31 | Yuichiro Sasaki | イオンビーム照射装置 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105444913A (zh) * | 2015-11-30 | 2016-03-30 | 武汉钢铁(集团)公司 | 一种测温设备 |
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TW200428454A (en) | 2004-12-16 |
JPWO2004081966A1 (ja) | 2006-06-15 |
US7619223B2 (en) | 2009-11-17 |
TWI329883B (ja) | 2010-09-01 |
US20060237660A1 (en) | 2006-10-26 |
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