WO2004068534A2 - Organisches speicherbauelement und ansteuerungsschaltung dazu - Google Patents
Organisches speicherbauelement und ansteuerungsschaltung dazu Download PDFInfo
- Publication number
- WO2004068534A2 WO2004068534A2 PCT/EP2004/000221 EP2004000221W WO2004068534A2 WO 2004068534 A2 WO2004068534 A2 WO 2004068534A2 EP 2004000221 W EP2004000221 W EP 2004000221W WO 2004068534 A2 WO2004068534 A2 WO 2004068534A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- organic
- ofet
- capacitor
- memory
- adjustable
- Prior art date
Links
- 239000003990 capacitor Substances 0.000 claims abstract description 17
- 230000015654 memory Effects 0.000 claims description 30
- 239000010410 layer Substances 0.000 claims description 19
- 239000012212 insulator Substances 0.000 claims description 8
- 239000002346 layers by function Substances 0.000 claims description 6
- 230000035699 permeability Effects 0.000 claims description 4
- 230000005669 field effect Effects 0.000 claims description 3
- 239000000463 material Substances 0.000 abstract description 13
- 238000007599 discharging Methods 0.000 abstract 1
- 229920001328 Polyvinylidene chloride Polymers 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 229920002981 polyvinylidene fluoride Polymers 0.000 description 2
- 238000007639 printing Methods 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 229920006267 polyester film Polymers 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 239000011232 storage material Substances 0.000 description 1
- 238000010345 tape casting Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K19/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic element specially adapted for rectifying, amplifying, oscillating or switching, covered by group H10K10/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/10—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
- H01L27/105—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration including field-effect components
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0009—RRAM elements whose operation depends upon chemical change
- G11C13/0014—RRAM elements whose operation depends upon chemical change comprising cells based on organic memory material
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/468—Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K19/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic element specially adapted for rectifying, amplifying, oscillating or switching, covered by group H10K10/00
- H10K19/80—Interconnections, e.g. terminals
Definitions
- the invention relates to an organic memory component and a drive circuit therefor.
- Storage elements on an organic basis are known, for example from DE 10045192.6.
- organic, rewritable or rewritable memories are required (e.g. with RFID tags or with simple electronic games).
- Non-volatile memories in particular are indispensable for e.g. electronic barcodes or watermarks.
- Passive organic memory elements are known which are based on ferroelectric material (Electronic Design, August 20,2001, page 56) (in this article, inter alia, "polymeric ferroelectric RAM” is presented). Although these are memory matrix structures which are not volatile, they are also those which are controlled by external circuits, preferably conventional silicon circuits.
- the disadvantage here is the control of the memory elements, which works through an external circuit.
- the present invention relates to an organic-based storage element which comprises at least one organic functional layer in which a property (such as the Dielectric constant, electrical conductivity, magnetic permeability) can be changed bistably.
- the invention also relates to an organic capacitance memory which is implemented by a circuit configuration with a capacitor, two OFETs being connected in series and a capacitor connected in parallel with one of the OFETs, this OFET being the discharge OFET.
- An organic storage device comprises at least the following functional layers: lower electrode (s), insulator, possibly with integrated storage material, upper electrode.
- the memory element is simply written by increasing the voltage at the upper electrode.
- the memory element is integrated in an organic field-effect transistor (OFET).
- OFET organic field-effect transistor
- a capacitor structure serves as a memory.
- a material is required for the storage device in which a certain property (e.g. electrical conductivity, dielectric constant or magnetic permeability) can be changed bistably by external influences, i.e. at least 2 states can be actively set and these states remain stable over time.
- the organic storage element also includes a further component by means of which the status of the bistable material can be read and changed. It is preferred that the reading does not change the state of the bistable material.
- FIG. 1 shows a memory which is integrated in an OFET.
- Figure 2 shows a capacitor as a memory and
- Figure 3 shows a circuit structure with a capacitor as a memory
- the substrate 1 can be seen, for example a polyester film, on which the source / drain electrodes 2 are applied in a structured manner. This can be done, for example, by printing or by means of photolithography.
- the lower electrodes 2 (source / drain) are in the semiconducting layer
- the memory can be identical to the insulator layer 4.
- layer 5 is omitted in the OFET construction and the gate electrode is located directly after the insulator layer 4.
- an additional, possibly very thin layer 5 can also be present, which is made of the bistably adjustable material and which is below or above the insulator layer
- bistably adjustable layer 5 can be read off by applying a voltage to the source / drain electrodes.
- the state is programmed into layer 5 by applying a voltage to gate electrode 6.
- FIG. 2 shows how a capacitor structure can be used as a memory: on the lower electrode 2 there is the dielectric layer 5 with a variable dielectric constant, on this layer the upper electrode 6. Material with the adjustable dielectric constant of the layer 5 is accordingly between two conductive layers, the lower electrode 2 and the upper electrode 6 on a substrate 1. Due to high voltages. the dielectric constant can be set. The storage state can then be determined by the charging current of the capacitor, which is high or low depending on the dielectric constant.
- PVDC Polyvinylidene dichloride
- PVDF polyvinylidene difluoride
- FIG. 3 shows a circuit structure with capacitor as
- This organic memory element or this organic capacitance memory can be implemented without special material using the following circuit: two OFETs 9, 10 are connected in series and a capacitor, more precisely the storage capacitor 11, is connected in parallel with the discharge OFET 10.
- the charge OFET is 9 and the discharge OFET is 10.
- the supply voltage is present at 7 and 8.
- the supply voltage "low ⁇ to 7 and the supply voltage" high is applied to the 8th, the capacitor 11 can be charged for a short pulse at the input 13 and are discharged over a short pulse at the input of the twelfth input 12 leads to the discharge OFET 10 , Input 13 leads to the loading OFET 9.
- the status of the memory can be queried at output 14 of the memory element, for example via another OFET.
- the invention relates to organic memory components and control circuits therefor.
- the organic memory components have a layer of bistably adjustable material or comprise a circuit in which two OFETs are connected in series, one OFET being connected in parallel with a capacitor, specifically on the side with a low supply voltage, so that the capacitor with the unloading OFET is connected in parallel and is loaded by the second OFET.
- the main advantage of the organic memory elements described here is that they can be easily integrated into organic or polymer-electronic circuits because their simple structure means that they can easily be inserted into the manufacturing processes.
- the manufacturing processes can be easily combined.
- Another advantage lies in the simple control of the memory components, with another decisive advantage being that the memory elements are not volatile.
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Mathematical Physics (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Semiconductor Memories (AREA)
- Thin Film Transistor (AREA)
- Static Random-Access Memory (AREA)
Abstract
Description
Claims
Priority Applications (9)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP04701938A EP1588375B1 (de) | 2003-01-29 | 2004-01-14 | Organisches speicherbauelement |
AT04701938T ATE476739T1 (de) | 2003-01-29 | 2004-01-14 | Organisches speicherbauelement |
CN2004800027653A CN1742343B (zh) | 2003-01-29 | 2004-01-14 | 有机存储单元及其驱动电路 |
CA002515614A CA2515614A1 (en) | 2003-01-29 | 2004-01-14 | Organic storage component and corresponding triggering circuit |
KR1020057013807A KR100749126B1 (ko) | 2003-01-29 | 2004-01-14 | 유기 메모리 장치 및 이를 위한 구동회로 |
US10/543,561 US20070051940A1 (en) | 2003-01-29 | 2004-01-14 | Device and method for determining the physical condition of an animal |
JP2006501546A JP2006519483A (ja) | 2003-01-29 | 2004-01-14 | 有機メモリ装置及びそのためのドライバ回路 |
MXPA05007878A MXPA05007878A (es) | 2003-01-29 | 2004-01-14 | Unidad de memoria organica y circuito impulsor para la misma. |
DE502004011477T DE502004011477D1 (de) | 2003-01-29 | 2004-01-14 | Organisches speicherbauelement |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10303445 | 2003-01-29 | ||
DE10303445.5 | 2003-01-29 |
Publications (3)
Publication Number | Publication Date |
---|---|
WO2004068534A2 true WO2004068534A2 (de) | 2004-08-12 |
WO2004068534A3 WO2004068534A3 (de) | 2004-12-09 |
WO2004068534A8 WO2004068534A8 (de) | 2005-02-03 |
Family
ID=32797281
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2004/000221 WO2004068534A2 (de) | 2003-01-29 | 2004-01-14 | Organisches speicherbauelement und ansteuerungsschaltung dazu |
Country Status (10)
Country | Link |
---|---|
US (1) | US20070051940A1 (de) |
EP (1) | EP1588375B1 (de) |
JP (1) | JP2006519483A (de) |
KR (1) | KR100749126B1 (de) |
CN (1) | CN1742343B (de) |
AT (1) | ATE476739T1 (de) |
CA (1) | CA2515614A1 (de) |
DE (1) | DE502004011477D1 (de) |
MX (1) | MXPA05007878A (de) |
WO (1) | WO2004068534A2 (de) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005311336A (ja) * | 2004-03-25 | 2005-11-04 | National Institute Of Advanced Industrial & Technology | 情報記録素子 |
WO2007003247A1 (de) | 2005-06-30 | 2007-01-11 | Bundesdruckerei Gmbh | Sicherheits-/wertdokument mit kontaktlosem interface und bistabilem display |
JP2007073557A (ja) * | 2005-09-02 | 2007-03-22 | National Institute Of Advanced Industrial & Technology | 情報記録素子 |
JP2007201435A (ja) * | 2005-12-27 | 2007-08-09 | Semiconductor Energy Lab Co Ltd | 半導体装置、及び半導体装置の作製方法 |
DE102008039473A1 (de) | 2008-08-25 | 2010-03-18 | Polyic Gmbh & Co. Kg | Mehrschichtiges Folienelement |
Families Citing this family (9)
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NO20041733L (no) * | 2004-04-28 | 2005-10-31 | Thin Film Electronics Asa | Organisk elektronisk krets med funksjonelt mellomsjikt og fremgangsmate til dens fremstilling. |
CN100546035C (zh) | 2005-03-25 | 2009-09-30 | 株式会社半导体能源研究所 | 存储元件和半导体装置 |
WO2006118294A1 (en) * | 2005-04-27 | 2006-11-09 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method of manufacturing the same |
WO2007105575A1 (en) * | 2006-03-10 | 2007-09-20 | Semiconductor Energy Laboratory Co., Ltd. | Memory element and semiconductor device |
US7719001B2 (en) * | 2006-06-28 | 2010-05-18 | Semiconductor Energy Laboratory Co., Ltd | Semiconductor device with metal oxides and an organic compound |
EP1883109B1 (de) * | 2006-07-28 | 2013-05-15 | Semiconductor Energy Laboratory Co., Ltd. | Speicherelement und Verfahren zu dessen Hertsellung |
US7988057B2 (en) * | 2006-11-28 | 2011-08-02 | Semiconductor Energy Laboratory Co., Ltd. | Memory device and semiconductor device |
US7679951B2 (en) * | 2007-12-21 | 2010-03-16 | Palo Alto Research Center Incorporated | Charge mapping memory array formed of materials with mutable electrical characteristics |
KR102089347B1 (ko) | 2013-10-08 | 2020-03-16 | 경북대학교 산학협력단 | 비휘발성 메모리 소자 및 이의 제조 방법 |
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-
2004
- 2004-01-14 CN CN2004800027653A patent/CN1742343B/zh not_active Expired - Fee Related
- 2004-01-14 MX MXPA05007878A patent/MXPA05007878A/es not_active Application Discontinuation
- 2004-01-14 EP EP04701938A patent/EP1588375B1/de not_active Expired - Lifetime
- 2004-01-14 CA CA002515614A patent/CA2515614A1/en not_active Abandoned
- 2004-01-14 KR KR1020057013807A patent/KR100749126B1/ko not_active IP Right Cessation
- 2004-01-14 WO PCT/EP2004/000221 patent/WO2004068534A2/de active Application Filing
- 2004-01-14 JP JP2006501546A patent/JP2006519483A/ja active Pending
- 2004-01-14 AT AT04701938T patent/ATE476739T1/de not_active IP Right Cessation
- 2004-01-14 US US10/543,561 patent/US20070051940A1/en not_active Abandoned
- 2004-01-14 DE DE502004011477T patent/DE502004011477D1/de not_active Expired - Lifetime
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WO2002043071A1 (en) * | 2000-11-27 | 2002-05-30 | Thin Film Electronics Asa | A ferroelectric memory circuit and method for its fabrication |
US20020195644A1 (en) * | 2001-06-08 | 2002-12-26 | Ananth Dodabalapur | Organic polarizable gate transistor apparatus and method |
WO2003046922A2 (de) * | 2001-11-16 | 2003-06-05 | Infineon Technologies Ag | Halbleiteranordnung mit transistoren auf basis organischer halbleiter und nichtflüchtiger schreib-lese-speicherzellen |
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PATENT ABSTRACTS OF JAPAN Bd. 0181, Nr. 88 (E-1532), 31. März 1994 (1994-03-31) & JP 5 347422 A (FUJITSU LTD), 27. Dezember 1993 (1993-12-27) * |
See also references of EP1588375A2 * |
VELU G ET AL: "LOW DRIVING VOLTAGES AND MEMORY EFFECT IN ORGANIC THIN-FILM TRANSISTORS WITH A FERROELECTRIC GATE INSULATOR" APPLIED PHYSICS LETTERS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, Bd. 79, Nr. 5, 30. Juli 2001 (2001-07-30), Seiten 659-661, XP001086870 ISSN: 0003-6951 * |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005311336A (ja) * | 2004-03-25 | 2005-11-04 | National Institute Of Advanced Industrial & Technology | 情報記録素子 |
WO2007003247A1 (de) | 2005-06-30 | 2007-01-11 | Bundesdruckerei Gmbh | Sicherheits-/wertdokument mit kontaktlosem interface und bistabilem display |
JP2007073557A (ja) * | 2005-09-02 | 2007-03-22 | National Institute Of Advanced Industrial & Technology | 情報記録素子 |
JP2007201435A (ja) * | 2005-12-27 | 2007-08-09 | Semiconductor Energy Lab Co Ltd | 半導体装置、及び半導体装置の作製方法 |
DE102008039473A1 (de) | 2008-08-25 | 2010-03-18 | Polyic Gmbh & Co. Kg | Mehrschichtiges Folienelement |
Also Published As
Publication number | Publication date |
---|---|
WO2004068534A3 (de) | 2004-12-09 |
US20070051940A1 (en) | 2007-03-08 |
EP1588375B1 (de) | 2010-08-04 |
CN1742343A (zh) | 2006-03-01 |
KR20050111582A (ko) | 2005-11-25 |
ATE476739T1 (de) | 2010-08-15 |
KR100749126B1 (ko) | 2007-08-13 |
CA2515614A1 (en) | 2004-08-12 |
CN1742343B (zh) | 2011-10-19 |
JP2006519483A (ja) | 2006-08-24 |
MXPA05007878A (es) | 2006-02-08 |
DE502004011477D1 (de) | 2010-09-16 |
EP1588375A2 (de) | 2005-10-26 |
WO2004068534A8 (de) | 2005-02-03 |
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