WO2003021657A1 - Dispositif et procede de traitement de substrat - Google Patents
Dispositif et procede de traitement de substrat Download PDFInfo
- Publication number
- WO2003021657A1 WO2003021657A1 PCT/JP2002/008685 JP0208685W WO03021657A1 WO 2003021657 A1 WO2003021657 A1 WO 2003021657A1 JP 0208685 W JP0208685 W JP 0208685W WO 03021657 A1 WO03021657 A1 WO 03021657A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- substrate
- substrate treating
- temperature
- regulating
- treating device
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67248—Temperature monitoring
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67075—Apparatus for fluid treatment for etching for wet etching
- H01L21/6708—Apparatus for fluid treatment for etching for wet etching using mainly spraying means, e.g. nozzles
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Weting (AREA)
- Formation Of Insulating Films (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003525898A JP4083682B2 (ja) | 2001-09-03 | 2002-08-28 | 基板処理装置及び基板処理方法 |
US10/488,406 US7416632B2 (en) | 2001-09-03 | 2002-08-28 | Substrate processing apparatus and substrate processing method |
KR1020047001485A KR100915645B1 (ko) | 2001-09-03 | 2002-08-28 | 기판 처리 장치 및 기판 처리 방법 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001265648 | 2001-09-03 | ||
JP2001-265648 | 2001-09-03 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2003021657A1 true WO2003021657A1 (fr) | 2003-03-13 |
Family
ID=19092082
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2002/008685 WO2003021657A1 (fr) | 2001-09-03 | 2002-08-28 | Dispositif et procede de traitement de substrat |
Country Status (5)
Country | Link |
---|---|
US (2) | US7416632B2 (ja) |
JP (1) | JP4083682B2 (ja) |
KR (1) | KR100915645B1 (ja) |
CN (1) | CN100367473C (ja) |
WO (1) | WO2003021657A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2021157353A1 (ja) * | 2020-02-03 | 2021-08-12 | 東京エレクトロン株式会社 | 基板処理方法および基板処理装置 |
WO2024105945A1 (ja) * | 2022-11-15 | 2024-05-23 | 株式会社Sumco | シリコンウェーハの洗浄方法、シリコンウェーハの製造方法、及びシリコンウェーハ |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100915645B1 (ko) * | 2001-09-03 | 2009-09-04 | 도쿄엘렉트론가부시키가이샤 | 기판 처리 장치 및 기판 처리 방법 |
US20060157095A1 (en) * | 2005-01-19 | 2006-07-20 | Pham Xuyen N | Systems and methods for spinning semiconductor wafers |
US7435692B2 (en) | 2005-10-19 | 2008-10-14 | Tokyo Electron Limited | Gas jet reduction of iso-dense field thickness bias for gapfill process |
JP4306721B2 (ja) * | 2006-11-22 | 2009-08-05 | コニカミノルタビジネステクノロジーズ株式会社 | 画像形成システム、画像形成装置、ジョブ管理方法及びジョブ管理プログラム |
JP5122426B2 (ja) * | 2008-12-08 | 2013-01-16 | 東京エレクトロン株式会社 | 液処理方法、液処理装置および記憶媒体 |
US9799537B2 (en) | 2010-12-03 | 2017-10-24 | Applied Materials, Inc. | Processing assembly for semiconductor workpiece and methods of processing same |
US8541309B2 (en) * | 2010-12-03 | 2013-09-24 | Applied Materials, Inc. | Processing assembly for semiconductor workpiece and methods of processing same |
US9805946B2 (en) * | 2013-08-30 | 2017-10-31 | Taiwan Semiconductor Manufacturing Company Limited | Photoresist removal |
US9490138B2 (en) | 2013-12-10 | 2016-11-08 | Tel Fsi, Inc. | Method of substrate temperature control during high temperature wet processing |
JP6383152B2 (ja) * | 2014-01-10 | 2018-08-29 | 平田機工株式会社 | 移載方法、保持装置及び移載システム |
JP6338904B2 (ja) * | 2014-03-24 | 2018-06-06 | 株式会社Screenホールディングス | 基板処理装置 |
JP6770886B2 (ja) * | 2016-12-28 | 2020-10-21 | 株式会社Screenホールディングス | 基板処理装置及び基板処理方法 |
US11935766B2 (en) * | 2018-03-06 | 2024-03-19 | Tokyo Electron Limited | Liquid processing apparatus and liquid processing method |
JP7213624B2 (ja) * | 2018-05-01 | 2023-01-27 | 東京エレクトロン株式会社 | 基板処理装置、基板処理システムおよび基板処理方法 |
JP7093693B2 (ja) * | 2018-07-13 | 2022-06-30 | 東京エレクトロン株式会社 | 熱処理装置及び基板滑り検出方法 |
CN109411391A (zh) * | 2018-09-29 | 2019-03-01 | 蚌埠市龙子湖区金力传感器厂 | 一种具有冷却功能的传感器单晶硅刻蚀装置 |
KR20200092530A (ko) * | 2019-01-24 | 2020-08-04 | 삼성전자주식회사 | 포토레지스트 제거장치 및 이를 이용한 반도체 소자 제조방법 |
JP2023023230A (ja) * | 2021-08-04 | 2023-02-16 | 株式会社荏原製作所 | 基板処理方法および基板処理装置 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06163393A (ja) * | 1992-11-25 | 1994-06-10 | Toshiba Corp | 半導体基板の現像方法及び現像装置 |
JPH0774140A (ja) * | 1993-09-02 | 1995-03-17 | Toshiba Corp | 半導体装置の製造装置 |
JPH11307485A (ja) * | 1998-04-21 | 1999-11-05 | Super Silicon Kenkyusho:Kk | 半導体ウエハ研磨方法、半導体ウエハ研磨装置、及び研磨ウエハ |
US6096233A (en) * | 1996-09-24 | 2000-08-01 | Tokyo Electron Limited | Method for wet etching of thin film |
US6197150B1 (en) * | 1998-12-29 | 2001-03-06 | Samsung Electronics Co., Ltd. | Apparatus for wafer treatment for the manufacture of semiconductor devices |
JP2001085383A (ja) * | 1999-09-13 | 2001-03-30 | Shimada Phys & Chem Ind Co Ltd | 基板処理装置 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6163393A (ja) * | 1984-09-05 | 1986-04-01 | Nippon Kokan Kk <Nkk> | 棒部材の溶接方法 |
JP3326656B2 (ja) | 1994-10-31 | 2002-09-24 | ソニー株式会社 | 回転式半導体基板処理装置及び回転式半導体基板処理方法 |
JP3194037B2 (ja) | 1996-09-24 | 2001-07-30 | 東京エレクトロン株式会社 | 枚葉回転処理方法及びその装置 |
JP4240424B2 (ja) * | 1998-10-23 | 2009-03-18 | エルジー ディスプレイ カンパニー リミテッド | エッチング剤及びこれを用いた電子機器用基板の製造方法 |
JP2000334397A (ja) * | 1999-05-31 | 2000-12-05 | Kokusai Electric Co Ltd | 板状試料の流体処理装置及び板状試料の流体処理方法 |
US6299697B1 (en) * | 1999-08-25 | 2001-10-09 | Shibaura Mechatronics Corporation | Method and apparatus for processing substrate |
US6467297B1 (en) * | 2000-10-12 | 2002-10-22 | Jetek, Inc. | Wafer holder for rotating and translating wafers |
TW471010B (en) * | 2000-09-28 | 2002-01-01 | Applied Materials Inc | Wafer cleaning equipment |
WO2003003428A2 (en) * | 2000-12-08 | 2003-01-09 | Deflex Llc | Apparatus, process and method for mounting and treating a substrate |
US6605176B2 (en) * | 2001-07-13 | 2003-08-12 | Taiwan Semiconductor Manufacturing Co., Ltd. | Aperture for linear control of vacuum chamber pressure |
KR100915645B1 (ko) * | 2001-09-03 | 2009-09-04 | 도쿄엘렉트론가부시키가이샤 | 기판 처리 장치 및 기판 처리 방법 |
US6702202B1 (en) * | 2002-06-28 | 2004-03-09 | Lam Research Corporation | Method and apparatus for fluid delivery to a backside of a substrate |
US7323058B2 (en) * | 2004-01-26 | 2008-01-29 | Applied Materials, Inc. | Apparatus for electroless deposition of metals onto semiconductor substrates |
US7827930B2 (en) * | 2004-01-26 | 2010-11-09 | Applied Materials, Inc. | Apparatus for electroless deposition of metals onto semiconductor substrates |
-
2002
- 2002-08-28 KR KR1020047001485A patent/KR100915645B1/ko active IP Right Grant
- 2002-08-28 US US10/488,406 patent/US7416632B2/en not_active Expired - Fee Related
- 2002-08-28 WO PCT/JP2002/008685 patent/WO2003021657A1/ja active Application Filing
- 2002-08-28 CN CNB028220528A patent/CN100367473C/zh not_active Expired - Lifetime
- 2002-08-28 JP JP2003525898A patent/JP4083682B2/ja not_active Expired - Lifetime
-
2006
- 2006-01-09 US US11/327,310 patent/US7329616B2/en not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06163393A (ja) * | 1992-11-25 | 1994-06-10 | Toshiba Corp | 半導体基板の現像方法及び現像装置 |
JPH0774140A (ja) * | 1993-09-02 | 1995-03-17 | Toshiba Corp | 半導体装置の製造装置 |
US6096233A (en) * | 1996-09-24 | 2000-08-01 | Tokyo Electron Limited | Method for wet etching of thin film |
JPH11307485A (ja) * | 1998-04-21 | 1999-11-05 | Super Silicon Kenkyusho:Kk | 半導体ウエハ研磨方法、半導体ウエハ研磨装置、及び研磨ウエハ |
US6197150B1 (en) * | 1998-12-29 | 2001-03-06 | Samsung Electronics Co., Ltd. | Apparatus for wafer treatment for the manufacture of semiconductor devices |
JP2001085383A (ja) * | 1999-09-13 | 2001-03-30 | Shimada Phys & Chem Ind Co Ltd | 基板処理装置 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2021157353A1 (ja) * | 2020-02-03 | 2021-08-12 | 東京エレクトロン株式会社 | 基板処理方法および基板処理装置 |
JPWO2021157353A1 (ja) * | 2020-02-03 | 2021-08-12 | ||
JP7267470B2 (ja) | 2020-02-03 | 2023-05-01 | 東京エレクトロン株式会社 | 基板処理方法および基板処理装置 |
WO2024105945A1 (ja) * | 2022-11-15 | 2024-05-23 | 株式会社Sumco | シリコンウェーハの洗浄方法、シリコンウェーハの製造方法、及びシリコンウェーハ |
Also Published As
Publication number | Publication date |
---|---|
CN1582489A (zh) | 2005-02-16 |
JP4083682B2 (ja) | 2008-04-30 |
US20060160368A1 (en) | 2006-07-20 |
CN100367473C (zh) | 2008-02-06 |
US7416632B2 (en) | 2008-08-26 |
US7329616B2 (en) | 2008-02-12 |
KR20040028964A (ko) | 2004-04-03 |
JPWO2003021657A1 (ja) | 2004-12-24 |
KR100915645B1 (ko) | 2009-09-04 |
US20040253833A1 (en) | 2004-12-16 |
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