WO2003007578A1 - Instrument de mesure de la resistance a la gigue et procede permettant une mesure efficace et une evaluation adequate de la caracteristique de resistance a la gigue. - Google Patents
Instrument de mesure de la resistance a la gigue et procede permettant une mesure efficace et une evaluation adequate de la caracteristique de resistance a la gigue. Download PDFInfo
- Publication number
- WO2003007578A1 WO2003007578A1 PCT/JP2002/007055 JP0207055W WO03007578A1 WO 2003007578 A1 WO2003007578 A1 WO 2003007578A1 JP 0207055 W JP0207055 W JP 0207055W WO 03007578 A1 WO03007578 A1 WO 03007578A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- frequency
- signal
- amplitude
- modulation signal
- jitter
- Prior art date
Links
- 238000005259 measurement Methods 0.000 title claims description 88
- 238000000034 method Methods 0.000 title claims description 13
- 238000011156 evaluation Methods 0.000 title description 4
- 238000012360 testing method Methods 0.000 claims description 44
- 238000000691 measurement method Methods 0.000 claims description 4
- 108010076504 Protein Sorting Signals Proteins 0.000 claims description 3
- 238000001514 detection method Methods 0.000 abstract 2
- 101100444142 Neurospora crassa (strain ATCC 24698 / 74-OR23-1A / CBS 708.71 / DSM 1257 / FGSC 987) dut-1 gene Proteins 0.000 description 12
- 238000010586 diagram Methods 0.000 description 3
- 239000003550 marker Substances 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L1/00—Arrangements for detecting or preventing errors in the information received
- H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
- H04L1/205—Arrangements for detecting or preventing errors in the information received using signal quality detector jitter monitoring
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP02745967A EP1408672B1 (en) | 2001-07-13 | 2002-07-11 | Jitter resistance measuring instrument and method for enabling efficient measurement of jitter resistance characteristic and adequate evaluation |
JP2003513216A JP3779714B2 (ja) | 2001-07-13 | 2002-07-11 | ジッタ耐力特性の効率的な測定と的確な評価を可能としたジッタ耐力測定装置及び方法 |
US10/362,352 US7245657B2 (en) | 2001-07-13 | 2002-07-11 | Jitter resistance measuring instrument and method for enabling efficient measurement of jitter resistance characteristic and adequate evaluation |
DE60238326T DE60238326D1 (de) | 2001-07-13 | 2002-07-11 | Jitterwiderstandsmessinstrument und verfahren zur ermöglichung einer effizienten messung der jitterwiderstandskenngrösse und zur adäquaten bewertung |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001213723 | 2001-07-13 | ||
JP2001-213723 | 2001-07-13 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2003007578A1 true WO2003007578A1 (fr) | 2003-01-23 |
Family
ID=19048657
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2002/007055 WO2003007578A1 (fr) | 2001-07-13 | 2002-07-11 | Instrument de mesure de la resistance a la gigue et procede permettant une mesure efficace et une evaluation adequate de la caracteristique de resistance a la gigue. |
Country Status (5)
Country | Link |
---|---|
US (1) | US7245657B2 (ja) |
EP (1) | EP1408672B1 (ja) |
JP (1) | JP3779714B2 (ja) |
DE (1) | DE60238326D1 (ja) |
WO (1) | WO2003007578A1 (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005030867A (ja) * | 2003-07-10 | 2005-02-03 | Anritsu Corp | ジッタ測定装置 |
JP2005181325A (ja) * | 2003-12-16 | 2005-07-07 | Advantest Corp | 試験装置、及び試験方法 |
JP2007093333A (ja) * | 2005-09-28 | 2007-04-12 | Anritsu Corp | 電界強度測定装置 |
WO2009041516A1 (ja) * | 2007-09-28 | 2009-04-02 | Anritsu Corporation | ジッタ発生装置およびそれを用いるデバイス試験システムならびにジッタ発生方法 |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040017848A1 (en) * | 2002-07-25 | 2004-01-29 | Adc Dsl Systems, Inc. | High-speed digital subscriber line (HDSL) wander reduction |
US20040017822A1 (en) * | 2002-07-25 | 2004-01-29 | Adc Dsl Systems, Inc. | High-speed digital subscriber line (HDSL) wander reduction utilizing minimums |
JP2004093345A (ja) * | 2002-08-30 | 2004-03-25 | Renesas Technology Corp | ジッタ測定回路 |
JP3886941B2 (ja) * | 2003-07-10 | 2007-02-28 | アンリツ株式会社 | ジッタ耐力測定装置 |
JP4528659B2 (ja) * | 2005-03-30 | 2010-08-18 | パナソニック株式会社 | クロックジッタ算出装置、クロックジッタ算出方法、およびクロックジッタ算出プログラム |
KR100712519B1 (ko) * | 2005-07-25 | 2007-04-27 | 삼성전자주식회사 | 아이 마스크를 이용하여 회로의 특성을 검출하는 테스트장비 및 테스트 방법 |
US7936809B2 (en) * | 2006-07-11 | 2011-05-03 | Altera Corporation | Economical, scalable transceiver jitter test |
JP4858615B2 (ja) * | 2007-08-03 | 2012-01-18 | 富士通株式会社 | 通信装置、通信システム、及び通信方法 |
US8199149B2 (en) * | 2007-12-13 | 2012-06-12 | Tektronix, Inc. | Automatic generation of frequency domain mask |
EP2175569B1 (de) * | 2008-10-07 | 2013-09-25 | Universität Ulm | Sendevorrichtung zur Erzeugung eines analog modulierten Impulszuges und zur Aussendung desselben sowie Empfangsvorrichtung zum Empfang eines entsprechenden Signals |
JP6199420B2 (ja) * | 2016-02-02 | 2017-09-20 | アンリツ株式会社 | ジッタ耐力測定装置およびジッタ耐力測定方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61182348A (ja) * | 1985-02-08 | 1986-08-15 | Hitachi Ltd | 余裕度試験方式 |
JPS62104342A (ja) * | 1985-10-31 | 1987-05-14 | Nec Corp | デイジタル中継器の動作余裕度監視装置 |
JPH0391430A (ja) * | 1989-09-01 | 1991-04-17 | Ishikawa Giken Rubber Kk | 釣り餌 |
US5793822A (en) * | 1995-10-16 | 1998-08-11 | Symbios, Inc. | Bist jitter tolerance measurement technique |
US5835501A (en) * | 1996-03-04 | 1998-11-10 | Pmc-Sierra Ltd. | Built-in test scheme for a jitter tolerance test of a clock and data recovery unit |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0391340A (ja) | 1989-09-04 | 1991-04-16 | Funai Denki Kenkyusho:Kk | ディジタルデータ通信機器の定量的評価方法 |
JP2873494B2 (ja) | 1990-08-13 | 1999-03-24 | アンリツ株式会社 | 符号誤り測定装置 |
US6661836B1 (en) * | 1998-10-21 | 2003-12-09 | Nptest, Llp | Measuring jitter of high-speed data channels |
JP2001213723A (ja) * | 2000-01-31 | 2001-08-07 | Tokiwa Corp | 棒状化粧料 |
US7142623B2 (en) * | 2002-05-31 | 2006-11-28 | International Business Machines Corporation | On-chip system and method for measuring jitter tolerance of a clock and data recovery circuit |
-
2002
- 2002-07-11 DE DE60238326T patent/DE60238326D1/de not_active Expired - Lifetime
- 2002-07-11 JP JP2003513216A patent/JP3779714B2/ja not_active Expired - Fee Related
- 2002-07-11 EP EP02745967A patent/EP1408672B1/en not_active Expired - Fee Related
- 2002-07-11 US US10/362,352 patent/US7245657B2/en not_active Expired - Fee Related
- 2002-07-11 WO PCT/JP2002/007055 patent/WO2003007578A1/ja active Application Filing
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61182348A (ja) * | 1985-02-08 | 1986-08-15 | Hitachi Ltd | 余裕度試験方式 |
JPS62104342A (ja) * | 1985-10-31 | 1987-05-14 | Nec Corp | デイジタル中継器の動作余裕度監視装置 |
JPH0391430A (ja) * | 1989-09-01 | 1991-04-17 | Ishikawa Giken Rubber Kk | 釣り餌 |
US5793822A (en) * | 1995-10-16 | 1998-08-11 | Symbios, Inc. | Bist jitter tolerance measurement technique |
US5835501A (en) * | 1996-03-04 | 1998-11-10 | Pmc-Sierra Ltd. | Built-in test scheme for a jitter tolerance test of a clock and data recovery unit |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005030867A (ja) * | 2003-07-10 | 2005-02-03 | Anritsu Corp | ジッタ測定装置 |
JP2005181325A (ja) * | 2003-12-16 | 2005-07-07 | Advantest Corp | 試験装置、及び試験方法 |
JP2007093333A (ja) * | 2005-09-28 | 2007-04-12 | Anritsu Corp | 電界強度測定装置 |
WO2009041516A1 (ja) * | 2007-09-28 | 2009-04-02 | Anritsu Corporation | ジッタ発生装置およびそれを用いるデバイス試験システムならびにジッタ発生方法 |
JPWO2009041516A1 (ja) * | 2007-09-28 | 2011-01-27 | アンリツ株式会社 | ジッタ発生装置およびそれを用いるデバイス試験システムならびにジッタ発生方法 |
JP4686637B2 (ja) * | 2007-09-28 | 2011-05-25 | アンリツ株式会社 | ジッタ発生装置およびそれを用いるデバイス試験システムならびにジッタ発生方法 |
US8143959B2 (en) | 2007-09-28 | 2012-03-27 | Anritsu Corporation | Jitter generation apparatus, device test system using the same, and jitter generation method |
Also Published As
Publication number | Publication date |
---|---|
DE60238326D1 (de) | 2010-12-30 |
US7245657B2 (en) | 2007-07-17 |
EP1408672A1 (en) | 2004-04-14 |
US20030156673A1 (en) | 2003-08-21 |
EP1408672B1 (en) | 2010-11-17 |
EP1408672A4 (en) | 2006-12-20 |
JPWO2003007578A1 (ja) | 2004-11-04 |
JP3779714B2 (ja) | 2006-05-31 |
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