WO2001057471B1 - Capteur visuel a deplacement - Google Patents

Capteur visuel a deplacement

Info

Publication number
WO2001057471B1
WO2001057471B1 PCT/JP2001/000656 JP0100656W WO0157471B1 WO 2001057471 B1 WO2001057471 B1 WO 2001057471B1 JP 0100656 W JP0100656 W JP 0100656W WO 0157471 B1 WO0157471 B1 WO 0157471B1
Authority
WO
WIPO (PCT)
Prior art keywords
measurement
displacement
moved
visual
displacement sensor
Prior art date
Application number
PCT/JP2001/000656
Other languages
English (en)
French (fr)
Other versions
WO2001057471A1 (fr
Inventor
Tatsuya Matsunaga
Masahiro Kawachi
Original Assignee
Omron Tateisi Electronics Co
Tatsuya Matsunaga
Masahiro Kawachi
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Tateisi Electronics Co, Tatsuya Matsunaga, Masahiro Kawachi filed Critical Omron Tateisi Electronics Co
Priority to EP01902697A priority Critical patent/EP1167918B1/en
Priority to DE60139047T priority patent/DE60139047D1/de
Priority to US09/937,480 priority patent/US6724491B2/en
Priority to JP2001556274A priority patent/JP3797422B2/ja
Publication of WO2001057471A1 publication Critical patent/WO2001057471A1/ja
Publication of WO2001057471B1 publication Critical patent/WO2001057471B1/ja

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0608Height gauges

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Claims

55
補正書の請求の範囲
[ 2 0 0 1年 7月 11日 (1 1.07. 0 1 ) 国際事務局受理:
出願当初の請求の範囲 66及び 67は取り下げられた;他の請求の範囲は変更なし。 ]
をなす面に対応する計測対象領域を、 基準面の移動に追従させて変位測 定方向へと移動させる、 請求の範囲第 6 0項に記載のビジュアル式変位 センサ。
6 2 . 基準面が移動したか否かの判定は、 基準面に対応して予め設定さ れた計測対象領域を使用して計測された変位が変動したことに基づいて 行われる、 請求の範囲第 6 1項に記載のビジュアル式変位センサ。
6 3 . 設定領域移動手段が、 二次元撮像素子で撮影された画像に基づい て、 計測対象物体上の段差境界線が移動したと判定されたとき、 段差境 界線を挟んでその両脇に段差測定のために設定された一対の計測対象領 域を、 段差境界線の移動に追従させて、 変位測 方向と直交する方向へ と移動させる、 請求の範囲第 6 0項に記載のビジュアル式変位センサ。 6 4 . 段差境界線が移動したか否かの判定は、 ラインビームに沿う計測 変位と規定の変位しきい値との交差点が変位測定方^と直交する方向へ と移動したことに基づいて行われる、 請求の範囲第 6 2項に記載のビジ ユアル式変位センサ。
6 5 . 変位しきい値が、 段差を構成する基準段面の計測値に追従して設 定される、 請求の範囲第 6 4項に記載のビジュアル式変位センサ。
6 6 . (削除)
6 7 . (削除)
補正された用紙 (条約第 19条)
PCT/JP2001/000656 2000-01-31 2001-01-31 Capteur visuel a deplacement WO2001057471A1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP01902697A EP1167918B1 (en) 2000-01-31 2001-01-31 Optical displacement sensor
DE60139047T DE60139047D1 (de) 2000-01-31 2001-01-31 Optischer verschiebungssensor
US09/937,480 US6724491B2 (en) 2000-01-31 2001-01-31 Visual displacement sensor
JP2001556274A JP3797422B2 (ja) 2000-01-31 2001-01-31 ビジュアル式変位センサ

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2000-27429 2000-01-31
JP2000027429 2000-01-31
JP2000393787 2000-11-19
JP2000-393787 2000-11-19

Publications (2)

Publication Number Publication Date
WO2001057471A1 WO2001057471A1 (fr) 2001-08-09
WO2001057471B1 true WO2001057471B1 (fr) 2004-03-11

Family

ID=26584858

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2001/000656 WO2001057471A1 (fr) 2000-01-31 2001-01-31 Capteur visuel a deplacement

Country Status (5)

Country Link
US (1) US6724491B2 (ja)
EP (1) EP1167918B1 (ja)
JP (1) JP3797422B2 (ja)
DE (1) DE60139047D1 (ja)
WO (1) WO2001057471A1 (ja)

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JP7024285B2 (ja) 2017-09-26 2022-02-24 オムロン株式会社 変位計測装置、システム、および変位計測方法

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JP4548595B2 (ja) * 2004-03-15 2010-09-22 オムロン株式会社 センサ装置
DE102005011344B4 (de) * 2004-03-15 2014-02-13 Omron Corporation Sensorvorrichtung
JP4728609B2 (ja) * 2004-07-20 2011-07-20 株式会社キーエンス 光学式変位計
JP4648665B2 (ja) * 2004-07-26 2011-03-09 株式会社キーエンス 光学式変位計
HUE033705T2 (en) * 2004-08-20 2017-12-28 Bridgestone Corp A method for measuring the length of a strip-shaped member and an apparatus therefor
US20060054843A1 (en) * 2004-09-13 2006-03-16 Electronic Design To Market, Inc. Method and apparatus of improving optical reflection images of a laser on a changing surface location
US7400415B2 (en) * 2005-03-15 2008-07-15 Mitutoyo Corporation Operator interface apparatus and method for displacement transducer with selectable detector area
KR100728482B1 (ko) * 2005-03-15 2007-06-13 오므론 가부시키가이샤 계측 영역의 자동 설정 수단을 구비한 변위 센서
JP4532324B2 (ja) * 2005-03-31 2010-08-25 京セラキンセキ株式会社 被加工物の製造方法
JP5082314B2 (ja) * 2006-07-14 2012-11-28 オムロン株式会社 変位センサ
JP2008045928A (ja) * 2006-08-11 2008-02-28 Omron Corp 光学式計測装置および光学式計測装置の制御方法
US7986356B2 (en) * 2007-07-25 2011-07-26 Hewlett-Packard Development Company, L.P. System and method for determining a gamma curve of a display device
JP5202012B2 (ja) * 2008-02-06 2013-06-05 株式会社キーエンス 光学式変位計
CN101780649B (zh) * 2009-01-16 2012-10-10 鸿富锦精密工业(深圳)有限公司 刀具检测系统及方法
CN101819024B (zh) * 2010-03-22 2011-06-15 中南大学 一种基于机器视觉的二维位移检测方法
US9234770B2 (en) * 2010-04-19 2016-01-12 Qualcomm Incorporated Dynamic sensor range
US20120127487A1 (en) * 2010-11-18 2012-05-24 Sergey Potapenko Methods and apparatuses for measuring the thickness of glass substrates
JP4821934B1 (ja) * 2011-04-14 2011-11-24 株式会社安川電機 3次元形状計測装置およびロボットシステム
US9234843B2 (en) * 2011-08-25 2016-01-12 Alliance For Sustainable Energy, Llc On-line, continuous monitoring in solar cell and fuel cell manufacturing using spectral reflectance imaging
JP6248510B2 (ja) * 2013-09-27 2017-12-20 株式会社ニコン 形状測定装置、構造物製造システム、形状測定方法、構造物製造方法、形状測定プログラム、及び記録媒体
WO2015189985A1 (ja) * 2014-06-13 2015-12-17 株式会社ニコン 形状測定装置、構造物製造システム、形状測定方法、構造物製造方法、形状測定プログラム、及び記録媒体
JP6728842B2 (ja) * 2016-03-24 2020-07-22 オムロン株式会社 光学計測装置
US20190122389A1 (en) * 2016-05-30 2019-04-25 Sony Corporation Information processing apparatus, information processing method, program, and imaging system
CN106441138B (zh) * 2016-10-12 2019-02-26 中南大学 基于视觉测量的变形监测方法
US10480935B2 (en) 2016-12-02 2019-11-19 Alliance For Sustainable Energy, Llc Thickness mapping using multispectral imaging
JP2022132827A (ja) * 2021-03-01 2022-09-13 オムロン株式会社 変位センサ及び状態監視方法

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Publication number Priority date Publication date Assignee Title
JP7024285B2 (ja) 2017-09-26 2022-02-24 オムロン株式会社 変位計測装置、システム、および変位計測方法

Also Published As

Publication number Publication date
US20020154318A1 (en) 2002-10-24
EP1167918A4 (en) 2006-11-22
JPWO2001057471A1 (ja) 2004-08-26
WO2001057471A1 (fr) 2001-08-09
US6724491B2 (en) 2004-04-20
EP1167918A1 (en) 2002-01-02
JP3797422B2 (ja) 2006-07-19
EP1167918B1 (en) 2009-06-24
DE60139047D1 (de) 2009-08-06

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