WO1982001418A1 - Procede permettant de tester electriquement un emballage scelle - Google Patents

Procede permettant de tester electriquement un emballage scelle Download PDF

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Publication number
WO1982001418A1
WO1982001418A1 PCT/JP1980/000246 JP8000246W WO8201418A1 WO 1982001418 A1 WO1982001418 A1 WO 1982001418A1 JP 8000246 W JP8000246 W JP 8000246W WO 8201418 A1 WO8201418 A1 WO 8201418A1
Authority
WO
WIPO (PCT)
Prior art keywords
package
pinhole
electrodes
crack
frequency component
Prior art date
Application number
PCT/JP1980/000246
Other languages
English (en)
Japanese (ja)
Inventor
Pharma Co Ltd Hokuriku
Original Assignee
Sawabe Yoshimi
Kasamatsu Masaichi
Tanaka Takumi
Kurotsuchi Noritaka
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sawabe Yoshimi, Kasamatsu Masaichi, Tanaka Takumi, Kurotsuchi Noritaka filed Critical Sawabe Yoshimi
Priority to PCT/JP1980/000246 priority Critical patent/WO1982001418A1/fr
Priority to DE19803050415 priority patent/DE3050415A1/de
Publication of WO1982001418A1 publication Critical patent/WO1982001418A1/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
    • G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/92—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating breakdown voltage

Definitions

  • the present invention uses pinholes, cracks, etc. in hermetically sealed packages as high-frequency components.
  • a pin hoe in a package in which the conductive contents are sealed with an electrically insulating film is sealed with an electrically insulating film.
  • a pair of electrodes for a sealed package such as sausage.
  • High frequency voltage must be applied in order to make the capacitance smaller than the other.
  • one end of the package must be attached to the electrode.
  • the present inventors can directly detect the flashover that occurs when there is a pinhole or a crack, by the change in the high frequency component. It was found that the present invention was perfected and the discovery of ⁇
  • an encapsulating body in which a conductive content is sealed with an electrically insulative material is arranged between a pair of electrodes, a voltage is applied between both electrodes, and when there is a bin hole in the packaging container, the pin is formed.
  • This is an electrical test method for hermetically sealed envelopes, which is characterized by causing a flashover between the electrode and the encapsulation contents through the hole, and detecting the change in the high frequency component that occurs.
  • the method of the present invention employs a method of indirectly catching a flash due to a binhole or a crack as a current change, the capacitance or impedance phase between both electrodes and the contents can be changed. It is not necessary to provide a counter control, and therefore it is not necessary to keep one end of the package in close contact with the electrode. That is, in the present invention, the envelope to be inspected is simply a pair of electrodes. disposed between, or o the ⁇ that when a voltage is applied, the station ⁇ of the voltage applied is limited 3 ⁇ 4 Iga, correct desired to set below about 1 KH z for improving SZN ratio o 'frequency The signal can be found by measuring the voltage across the resistor inserted in the circuit.
  • FIG. 1 is a schematic view illustrating one embodiment of the present invention for inspecting pinholes in a hermetically sealed package
  • FIG. 2 is a schematic view illustrating another embodiment for inspecting bottleholes
  • FIGS. 3 (a) and 3 (b). ) Is an explanatory diagram showing the electrical equivalent circuit of Fig. 1 or 2, and Fig. 4 to Fig. 6 are schematic diagrams showing observed current waveforms. O The best mode for carrying out the invention.
  • Figure 1 shows, for example, a hermetically-sealed package 1 such as an amble in which a conductive liquid is enclosed in a fusiform material placed at the electrodes of a pair of counter electrodes 2 and 3.
  • O 4 is a power source o
  • the sample is separated from each electrode. Place a quick gap o Detection 3 ⁇ 4 [Performance is better than both gaps. Apply a voltage that satisfies the condition that the sum is less than 150 and is 100 o. That is, each sample does not have to be in intimate contact with the electrode at a part of it.
  • the product After printing on, the product can be stored in a fixed container in a distribution unit (so-called a london), and then sent to the detector for each london o
  • Figure 2' shows such a mode.
  • 1 to 4 have the same meanings as in Figure 1, and 6 is an electrical sterilization container (for example, a lon drain) o
  • the mode shown in Figure 2 since the product is ready to be shipped as a final product immediately after the inspection is completed, it is handled as in the conventional method (for example, assemble the assemble after the inspection, surface printing if necessary, box packaging, etc.). There is no risk of new pinholes cracking inside
  • Fig. O The electrical equalizing circuit of the form shown in Figs. 1 and 2 is shown in Fig. O.
  • (b) Flash circuit i. Is dark current at normal time, i s is dark current at flashover, 5 is protection, detection resistor, 1 to 4 and 6 are the above o Local wave number corresponding to presence of pinhole or crack The components are actually observed as shown in Fig. 4 o
  • (a) shows a normal state and (b) shows a flashover state (the same applies below).
  • O Filters are applied to the relevant local band for detection. when, reading of the frequency components]?
  • the test method of the present invention is not limited to food packaging, but can be suitable for enclosing injection liquid etc. containing a hard electrically insulating material ⁇ such as glass etc. Confidence as a method Is extremely high, especially in the case of a rigid package such as the latter.o Furthermore, since the known method requires a plurality of tests as described above, the sample is actually moved and rotated. On the other hand, if it is designed so that one of the electrodes moves due to this, it was difficult to obtain a large device scale. It is sufficient that the detector used has a size of about 1 to 2 in the case of the known method o Needless to say, the method of the present invention can use both DC and AC voltages.

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Electrochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Examining Or Testing Airtightness (AREA)

Abstract

Afin de detecter electriquement la presence ou l'absence d'un trou d'epingle ou d'une fissure dans un emballage (1) a l'interieur duquel un contenu conducteur est renferme hermetiquement par un materiau isolant, l'emballage (1) est dispose entre une paire d'electrodes (2, 3) a une distance convenable de celles-ci. On applique ensuite aux electrodes (2, 3) une tension d'un potentiel tel qu'une decharge par effet de couronne se produise lorsque l'emballage (1) ne presente aucun trou d'epingle ou aucune fissure et qu'un eclair ait lieu lorsque l'emballage (1) presente un trou d'epingle ou une fissure. Un courant electrique contenant une composante de haute frequence circule dans les deux cas. La bande de frequence de la composante de haute frequence est de l'ordre de plusieurs dizaines de kHz lorsque la decharge par effet de couronne se produit (voir Fig. 4 (a)), alors qu'elle est de l'ordre de plusieurs kHz lorsque l'eclair a lieu (voir Fig. 4 (b)). Il est donc possible de detecter la presence ou l'absence d'un trou d'epingle ou d'une fissure en observant la composante de haute frequence du courant.
PCT/JP1980/000246 1980-10-14 1980-10-14 Procede permettant de tester electriquement un emballage scelle WO1982001418A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
PCT/JP1980/000246 WO1982001418A1 (fr) 1980-10-14 1980-10-14 Procede permettant de tester electriquement un emballage scelle
DE19803050415 DE3050415A1 (de) 1980-10-14 1980-10-14 Method of electrically testing sealed package

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
PCT/JP1980/000246 WO1982001418A1 (fr) 1980-10-14 1980-10-14 Procede permettant de tester electriquement un emballage scelle
WOJP80/00246801014 1980-10-14

Publications (1)

Publication Number Publication Date
WO1982001418A1 true WO1982001418A1 (fr) 1982-04-29

Family

ID=13706100

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP1980/000246 WO1982001418A1 (fr) 1980-10-14 1980-10-14 Procede permettant de tester electriquement un emballage scelle

Country Status (2)

Country Link
DE (1) DE3050415A1 (fr)
WO (1) WO1982001418A1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3905530A1 (de) * 1989-02-23 1990-08-30 Texpa Arbter Maschbau Gmbh Verfahren zur detektierung von fehlstellen in behaeltern aus elektrisch nicht leitendem material und einrichtung zur durchfuehrung des verfahrens
DE102007051036A1 (de) 2007-10-25 2009-05-07 A & D Verpackungsmaschinenbau Gmbh Verfahren und Vorrichtung zur Dichtheitsprüfung von Tiefziehverpackungen

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4845250A (fr) * 1971-06-18 1973-06-28
JPS4868296A (fr) * 1971-12-20 1973-09-18
JPS506998B1 (fr) * 1970-01-09 1975-03-19
JPS51130286A (en) * 1975-05-07 1976-11-12 Rikuo Kakumoto Automatic pinhole detecter by variable electric discharge lamp
JPS52110084A (en) * 1976-03-12 1977-09-14 Takeda Chemical Industries Ltd Method of checking pinhole* crack* etc* of glasssmade enclosed container in terms of continuity
JPS5332084A (en) * 1976-09-06 1978-03-25 Densoku Kougiyou Kk Method of and apparatus for detecting pinholes of packaged object
JPS5386294A (en) * 1976-12-18 1978-07-29 Takeda Chemical Industries Ltd Inspecting method and apparatus for defect in insulation vessels
JPS5476284A (en) * 1977-11-30 1979-06-18 Otsuka Pharma Co Ltd Method of checking whether or not there is pinhole in enclosed package

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS506998B1 (fr) * 1970-01-09 1975-03-19
JPS4845250A (fr) * 1971-06-18 1973-06-28
JPS4868296A (fr) * 1971-12-20 1973-09-18
JPS51130286A (en) * 1975-05-07 1976-11-12 Rikuo Kakumoto Automatic pinhole detecter by variable electric discharge lamp
JPS52110084A (en) * 1976-03-12 1977-09-14 Takeda Chemical Industries Ltd Method of checking pinhole* crack* etc* of glasssmade enclosed container in terms of continuity
JPS5332084A (en) * 1976-09-06 1978-03-25 Densoku Kougiyou Kk Method of and apparatus for detecting pinholes of packaged object
JPS5386294A (en) * 1976-12-18 1978-07-29 Takeda Chemical Industries Ltd Inspecting method and apparatus for defect in insulation vessels
JPS5476284A (en) * 1977-11-30 1979-06-18 Otsuka Pharma Co Ltd Method of checking whether or not there is pinhole in enclosed package

Also Published As

Publication number Publication date
DE3050415A1 (de) 1982-11-18

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