US5990768A - Millimeter waveguide and a circuit apparatus using the same - Google Patents

Millimeter waveguide and a circuit apparatus using the same Download PDF

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Publication number
US5990768A
US5990768A US08/978,617 US97861797A US5990768A US 5990768 A US5990768 A US 5990768A US 97861797 A US97861797 A US 97861797A US 5990768 A US5990768 A US 5990768A
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Prior art keywords
crystal substrate
single crystal
microstrip line
groove
layer
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US08/978,617
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Kazuaki Takahashi
Mitsuo Makimoto
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Panasonic Holdings Corp
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Matsushita Electric Industrial Co Ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01PWAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P3/00Waveguides; Transmission lines of the waveguide type
    • H01P3/02Waveguides; Transmission lines of the waveguide type with two longitudinal conductors
    • H01P3/08Microstrips; Strip lines
    • H01P3/081Microstriplines
    • H01P3/084Suspended microstriplines

Definitions

  • This invention relates to a millimeter waveguide for transmitting millimeter waves and a circuit apparatus using the same.
  • a millimeter waveguide for transmitting millimeter waves is known.
  • a shielded membrane microstrip is disclosed in 1996 IEEE MTT-S Digest at pages 797 to 800.
  • FIG. 10 is a cross-sectional side view of this prior art millimeter waveguide.
  • Silicon dioxide 802 is formed on a silicon substrate 801 and a microstrip line 803 is formed on the silicon dioxide 802.
  • the silicon substrate 801 is sandwiched by a carrier substrate 804 on which a metal is formed and a silicon substrate 805 subjected to micromachining processing, so that the microstrip line 803 is shielded.
  • the aim of the present invention is to provide an improved millimeter waveguide and an improved circuit apparatus using the same.
  • a first millimeter waveguide which comprises: a first single crystal substrate having a groove therein; a conductor film to be grounded on a surface of the groove and a surface of the first single crystal substrate connecting to the surface of groove; a second single crystal substrate covering the conductor film; and a microstrip line on a surface of the second single crystal substrate, exposed to a cavity defined by the conductor film and the second crystal substrate.
  • the first and second single crystal substrates comprise silicon substrates.
  • the conductor film comprises: a first conductor layer on the first crystal substrate, covering the groove; a conductive connecting layer on the first conductor layer; a second conductor film on the conductive connecting layer extending from one edge of the groove; and a third conductor film on the conductive connecting layer extending from another edge of the groove.
  • first and second conducting layers comprise nickel chromium and the conductive connecting layer comprises gold.
  • the first single crystal substrate may further comprise a protruding portion on a bottom surface of the groove at a middle of the bottom surface, extending along the groove to confront the microstrip line, the first conducting film covering a surface of the protruding portion.
  • the second single crystal substrate has a via hole and the first millimeter waveguide further comprises a second microstrip line on an opposite surface of the second single crystal substrate, connecting to the microstrip line via the via hole for coupling the microstrip line to an external circuit.
  • the microstrip line comprises a foundation layer on the surface of the second signal crystal substrate and a conductive layer on the foundation layer.
  • the foundation layer comprises nickel chromium and the conductive layer comprises gold.
  • a second millimeter waveguide which comprises: a first single crystal substrate; a conductor film on the first single crystal substrate; a second single crystal substrate on the second conductor film, having a groove on side of the first crystal substrate; and a microstrip line on a bottom surface of the groove.
  • the first and second single crystal substrates comprise silicon substrates.
  • the conductor film comprises: a first conductor layer on the first crystal substrate; a conductive connecting layer on the first conductor layer; and a second conductor film on the conductive connecting layer extending from one edge of the groove; a third conductor film on the conductive connecting layer extending from another edge of the groove.
  • the first and second conducting layers comprise nickel chromium and the conductive connecting layer comprises gold.
  • the microstrip line comprises a foundation layer on the bottom surface of the groove and a conductive layer on the foundation layer.
  • the foundation layer comprises nickel chromium and the conductive layer comprises gold.
  • a third millimeter waveguide which comprises: a first single crystal substrate having a groove therein; a conductor film to be grounded on a surface of the groove and a surface of the first single crystal substrate connected to the surface of the groove; a second single crystal substrate covering the second conductor film and having a protrusion toward the groove; and a microstrip line on a surface of the protrusion, exposed to a cavity defined by the conductor film and the second crystal substrate, a height of the protrusion being less than a depth of the groove.
  • the first and second single crystal substrates comprise silicon substrates.
  • the conductor film comprises: a first conductor layer on the first crystal substrate, covering the groove; a conductive connecting layer on the first conductor layer; a second conductor film on the conductive connecting layer extending from one edge of the groove; and a third conductor film on the conductive connecting layer extending from another edge of the groove.
  • the first and second conducting layers comprise nickel chromium and the conductive connecting layer comprises gold.
  • the microstrip line comprises a foundation layer on the surface of the protrusion and a conductive layer on the foundation layer.
  • the foundation layer comprises nickel chromium and the conductive layer comprises gold.
  • a fourth millimeter waveguide which comprises: a first single crystal substrate having a hollow portion therein; a first conductor film to be grounded on a surface of the hollow portion and a surface of the first single crystal substrate connecting to the surface of the hollow portion; a second conductor film covering the hollow portion and the surface of the first single crystal substrate, having a first through hole above the hollow portion; a second single crystal substrate on the second conductor film, having a second through hole connecting to the first hole; and a microstrip line on a surface of the second single crystal substrate opposite to the first crystal substrate; and a probe extending from the microstrip line through the first and second through holes, exposed to a cavity defined by the first and second conductor films.
  • the microstrip line comprises a foundation layer on the surface of the second single crystal substrate and a conductive layer on the foundation layer.
  • the foundation layer comprises nickel chromium and the conductive layer comprises gold.
  • a fifth millimeter waveguide which comprises: a first single crystal substrate having a groove therein; a first single crystal substrate having a hollow portion therein; a first conductor film to be grounded on a surface of the hollow portion and a surface of the first single crystal substrate connecting to the surface of the hollow portion; a second conductor film covering the hollow portion and the surface of the first single crystal substrate, having a slot above the hollow portion; a second single crystal substrate on the second conductor film; and a microstrip line on a surface of the second single crystal substrate opposite to the first crystal substrate, confronting a cavity defined by the first and second conductor films through the slot and the second single crystal substrate to electromagnetically couple to the cavity.
  • the microstrip line comprises a foundation layer on the surface of the second signal crystal substrate and a conductive layer on the foundation layer.
  • the foundation layer comprises nickel chromium and the conductive layer comprises gold.
  • a first circuit apparatus which comprises: a millimeter waveguide including a first single crystal substrate having a groove therein, a conductor film to be grounded on a surface of the groove and a surface of the first single crystal substrate connecting to the surface of groove, a second single crystal substrate covering the conductor film and having a via hole, a first microstrip line on a surface of the second single crystal substrate, exposed to a cavity defined by the conductor film and the second crystal substrate, a second microstrip line on an opposite surface of the second single crystal substrate, connecting to the first microstrip line via the via hole, and a third microstrip line on the opposite surface apart from the second microstrip line; an active circuit chip for performing a predetermined circuit operation; and a connecting portion for mechanically and electrically connecting the active circuit to the third microstrip line and to the second microstrip line, wherein there is a responsive relation between the first and third microstrip lines through the active circuit, the second microstrip line, and the via hole.
  • the connecting portion comprises
  • the first microstrip line comprises a foundation layer on the surface of the second signal crystal substrate and a conductive layer on the foundation layer.
  • the foundation layer comprises nickel chromium and the conductive layer comprises gold.
  • a second circuit apparatus which comprises: a millimeter waveguide including a first single crystal substrate, a conductor film to be grounded on a surface of the first single crystal substrate, a second single crystal substrate on the second conductor film, having a groove on side of the first crystal substrate and a via hole, and a first microstrip line on a bottom surface of the groove, a second microstrip line on a surface of the second single crystal substrate opposite to the groove, connecting to the first microstrip line via the via hole; and a third microstrip line on the surface of the second signal crystal substrate apart from the second microstrip line, an active circuit chip for performing a predetermined circuit operation; and a connecting portion for mechanically and electrically connecting the active circuit to the third microstrip line and to the second microstrip line, wherein there is a responsive relation between the first and third microstrip lines through the active circuit, the second microstrip line, and the via hole.
  • the connecting portion comprises micro-bumps through a flip-chip bonding.
  • the first microstrip line comprises a foundation layer on the bottom surface of the groove and a conductive layer on the foundation layer.
  • the foundation layer comprises nickel chromium and the conductive layer comprises gold.
  • a third circuit apparatus which comprises: a millimeter waveguide including a first single crystal substrate having a groove therein, a conductor film to be grounded on a surface of the groove and a surface of the first single crystal substrate connecting to the surface of the groove, a second single crystal substrate covering the second conductor film and having a protrusion toward the groove and a via hole therein, and a first microstrip line on a surface of the protrusion, exposed to a cavity defined by the conductor film and the second crystal substrate, a height of the protrusion being less than a depth of the groove, a second microstrip line on a surface of the second single crystal substrate opposite to the protrusion, connecting to the first microstrip line via the via hole, and a third microstrip line on the surface of the second single crystal substrate apart from the second microstrip line; an active circuit chip for performing a predetermined circuit operation; and a connecting portion for mechanically and electrically connecting the active circuit to the third microstrip line and to the second micro
  • the first microstrip line comprises a foundation layer on the surface of the protrusion and a conductive layer on the foundation layer.
  • the foundation layer comprises nickel chromium and the conductive layer comprises gold.
  • FIG. 1A is a cross-sectional side view of a millimeter waveguide of a first embodiment in a condition before connection;
  • FIG. 1B is a cross-sectional side view of the millimeter waveguide of the first embodiment in a connected condition
  • FIG. 2 is a cross-sectional side view of a millimeter waveguide of a second embodiment
  • FIG. 3 is a cross-sectional side view of a millimeter waveguide of a third embodiment
  • FIG. 4A is a cross-sectional side view of a millimeter waveguide of a fourth embodiment in a condition before connection;
  • FIG. 4B is a cross-sectional side view of the millimeter waveguide of the fourth embodiment in a connected condition
  • FIG. 5 is a cross-sectional side view of a circuit apparatus of a fourth embodiment using the millimeter waveguide of the first embodiment
  • FIG. 6 is a cross-sectional side view of a circuit apparatus of a sixth embodiment using the millimeter waveguide of the third embodiment
  • FIG. 7 is a cross-sectional side view of a circuit apparatus of a seventh embodiment using the millimeter waveguide of the fourth embodiment
  • FIG. 8A is a cross-sectional side view of a millimeter waveguide apparatus of an eighth embodiment
  • FIG. 8B is a plan view of the millimeter waveguide apparatus of the eighth embodiment.
  • FIG. 9A is a cross-sectional side view of a millimeter waveguide apparatus of a ninth embodiment.
  • FIG. 9B is a plan view of the millimeter waveguide apparatus of the ninth embodiment.
  • FIG. 10 is a cross-sectional side view of a prior art millimeter waveguide.
  • FIG. 1A is a cross-sectional side view of a millimeter waveguide of the first embodiment in a condition before connection.
  • FIG. 1B is a cross-sectional side view of the millimeter waveguide of the first embodiment in a connected condition.
  • a millimeter waveguide 100 of the first embodiment comprises a single crystal substrate 101 having a groove 109 therein, a ground conductor film 110 on a surface of the groove 109 and a surface of the single crystal substrate 101 connecting to the surface of the groove 109, a single crystal substrate 104 covering the conductor film 110, and a microstrip line 108 on a surface of the single crystal substrate 104, exposed to a cavity 111 defined by the conductor film 110, the microstrip line 108, and the crystal substrate 104.
  • the single crystal substrate 101 comprises a silicon substrate.
  • the single crystal substrate 104 comprises a silicon substrate also.
  • the ground conductor film 110 comprises: a conductor layer 102 on a surface of the crystal substrate 101 and a surface of the groove 109, a conductive connecting layer 112 on the conductor layer 102, a conductor film 105a on the conductive connecting layer 112 extending from an edge of the groove 109, and a conductor film 105b on the conductive connecting layer 112 extending from another edge of the groove 109.
  • the conductor layers 102, 105a and 105b comprise nickel chromium.
  • the microstrip line 108 comprises a foundation layer 105c on the surface of the second signal crystal substrate 104 and a conductive layer 106c on the foundation layer 105c.
  • the foundation layer 105c comprises nickel chromium and the conductive layer 106c comprises gold.
  • the conductive connecting layer 112 comprises gold.
  • the groove 109 is formed in the single crystal substrate 101 made of a silicon by anisotropic etching.
  • the conductor layer 102 made of nickel chromium is formed on the surface of the single crystal substrate 101 and a surface of the groove 109.
  • the conductive connecting layer 103 is formed on the conductor layer 102 with gold.
  • the conductor layers 105a, 105b, 105c are formed on the surface of the single crystal substrate 104 with nickel chromium. Conductive connecting layers 106a and 106b are formed with gold. Then, both substrates 1 and 2 are connected by thermo-compression bonding.
  • This structure extends in the depth direction of the drawing as required.
  • This structure provides a microstrip line with shielding.
  • the shield structure can reduce a loss due to radiation in the millimeter band.
  • FIG. 2 is a cross-sectional side view of a millimeter waveguide of the second embodiment.
  • the millimeter waveguide of the second embodiment has substantially the same structure as that of the first embodiment. The difference is that a protruding portion 209 is formed on a bottom surface of the groove 219 at a middle of the bottom surface, extending along edges of the groove 219 in the depth direction of the drawing of FIG. 2.
  • the conductor film 202 and the conductive connecting layer 203 cover a surface of the protruding portion 209.
  • the current concentrates on both sides of the microstrip line 108.
  • the current tends to flow through the middle portion of the microstrip line 108, so that a current density can be dispersed. Then, a loss in the microstrip line 108 can be further reduced.
  • FIG. 3 is a cross-sectional side view of a millimeter waveguide of the third embodiment.
  • the millimeter waveguide of the third embodiment comprises: a single crystal substrate 404, a conductor film 410 on a surface of the single crystal substrate 404, a single crystal substrate 401 on the conductor film 410, having a groove 409 on the side of the crystal substrate 404, and a microstrip line 408 on a bottom surface 409a of the groove 409.
  • the difference from the first embodiment is that the microstrip line 408 is formed on the bottom surface of the groove 409 instead of the crystal substrate 101. Therefore, the operation is similar to the first embodiment. However, the extent that the grounded conductor film surrounds the microstrip line is different between the first and third embodiments.
  • FIG. 4A is a cross-sectional side view of a millimeter waveguide of the fourth embodiment in a condition before connection.
  • FIG. 4B is a cross-sectional side view of the millimeter waveguide of the fourth embodiment in a connected condition.
  • the millimeter waveguide of the third embodiment comprises a single crystal substrate 504 having a groove 509 therein, a conductor film 510 on a surface of the groove 509 and a surface of the single crystal substrate 504 connecting to the surface of the groove 509, a second crystal substrate 501 covering the conductor film 510 and the groove 509 and having a protrusion 511 toward the groove 509, and a microstrip line 508 on a surface of the protrusion 511, exposed to a cavity 513 defined by the conductor film 503 and the crystal substrate 501.
  • a height H of the protrusion 511 is less than a depth D of the groove 509. In this embodiment, the height H is about a half of the depth D. Therefore, the protrusion 511 is formed such that the protrusion fits into the groove 509, wherein the cavity 513 is formed.
  • the basic operation is similar to the first embodiment.
  • the difference is that a shielding effect is higher than that of the first embodiment because the microstrip line 508 is surrounded by the conductor film 510, so that a loss due to radiation at millimeter band can be reduced.
  • FIG. 5 is a cross-sectional side view of a circuit apparatus of the fourth embodiment using the structure of the millimeter waveguide 100 of the first embodiment.
  • the crystal substrate 104' is processed to form a via hole 312 therein and then, microstrip lines 309 and 313 are formed in addition to forming the microstrip line 108 and the conductor films 105a to 105c and the conductive connecting films 106a and 106b similarly to the first embodiment. Then, the substrates 1' and 2 are connected by the thermo compression bonding. Then, the active circuit 310 is connected to the microstrip lines 309 and 313 with micro-bumps 311 by flip chip bonding.
  • the microstrip line 309 on the second single crystal substrate 104' is connected to the microstrip line 108 via the via hole 312.
  • the active circuit chip 310 performs a predetermined circuit operation, such as amplifying.
  • the micro-bumps 311 mechanically and electrically connect the active circuit 310 to the microstrip line 313 and to the microstrip line 309.
  • the microstrip line 313 is used for inputting an external signal to the active circuit or outputting a signal from the active circuit 310. Therefore, there is a responsive relation between the microstrip lines 108 and 313 through the active circuit 310, the via hole 312 and microstrip line 309.
  • the microstrip line 108 comprises the foundation layer 105c on the surface of the second single crystal substrate 104' and the conductive layer 106c on the foundation layer 105c.
  • the foundation layer 105c comprises nickel chromium and the conductive layer 106c comprises gold.
  • FIG. 6 is a cross-sectional side view of a circuit apparatus of the sixth embodiment using the millimeter waveguide of the third embodiment.
  • the structure of the sixth embodiment is similar to that of the fifth embodiment. The difference is that the structure of the millimeter waveguide of the third embodiment is used instead of that of the first embodiment.
  • FIG. 7 is a cross-sectional side view of a circuit apparatus of the seventh embodiment using the millimeter waveguide of the fourth embodiment.
  • the structure of the seventh embodiment is similar to that of the fifth embodiment. The difference is that the structure of the millimeter waveguide of the fourth embodiment is used instead of that of the first embodiment.
  • FIG. 8A is a cross-sectional side view of a millimeter waveguide apparatus of the eighth embodiment.
  • FIG. 8B is a plan view of the millimeter waveguide apparatus of the eighth embodiment.
  • a millimeter waveguide of the eighth embodiment comprises a single crystal substrate 601 having a hollow portion 611 therein, a conductor film 612 on a surface of the hollow portion 611 and a surface of the single crystal substrate 601 connecting to the surface of the hollow portion 611, a conductor film 613 covering the hollow portion 611 and the conductor film 612, having a through hole 614 above the hollow portion 611, a single crystal substrate 604 on the conductor film 613, having a through hole 615 connected to the first hole 614, and a microstrip line 609 on a surface of the second single crystal substrate 604 opposite to the crystal substrate 601, and a probe 610 extending from the microstrip line 609 through the through holes 614 and 615, exposed to a cavity (611) defined by the conductor films 612 and 613.
  • the probe 610 is connected to the microstrip line 609 as follows:
  • the probe 610 has a dielectric substance 616 surrounding the probe 610. A tip of the dielectric substance 616 is stripped and is pierced through a through hole formed in the microstrip line 609. Then, the probe 610 is soldered.
  • the microstrip line 609 comprises a foundation layer 609a on the surface of the second single crystal substrate 604 and a conductive layer 609b on the foundation layer.
  • the foundation layer 609a comprises nickel chromium and the conductive layer 609b comprises gold.
  • FIG. 9A is a cross-sectional side view of a millimeter waveguide apparatus of the ninth embodiment.
  • FIG. 9B is a plan view of the millimeter waveguide apparatus of the ninth embodiment.
  • a millimeter waveguide of the ninth embodiment is substantially similar to the eighth embodiment. The difference is that the through hole 615 is not formed and a slot 710 having a rectangular shape in the drawing of FIG. 9B instead the through hole 614.
  • the microstrip line 709 is electromagnetically coupled to the cavity through the slot 710.
  • This structure eliminates the necessity of fixing the probe 610 to the crystal.

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JP31736296A JP3218996B2 (ja) 1996-11-28 1996-11-28 ミリ波導波路
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Cited By (54)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6225878B1 (en) * 1998-06-02 2001-05-01 Matsushita Electric Industrial Co., Ltd. Millimeter wave module and radio apparatus
US6411182B1 (en) * 1999-03-31 2002-06-25 Samsung Electronics Co., Ltd. Cavity resonator for reducing phase noise of voltage controlled oscillator and method for fabricating the same
US6466112B1 (en) * 1998-12-28 2002-10-15 Dynamic Solutions International, Inc. Coaxial type signal line and manufacturing method thereof
US6483406B1 (en) * 1998-07-31 2002-11-19 Kyocera Corporation High-frequency module using slot coupling
US6512431B2 (en) 2001-02-28 2003-01-28 Lockheed Martin Corporation Millimeterwave module compact interconnect
US6549105B2 (en) 1998-06-02 2003-04-15 Matsushita Electric Industrial Co., Ltd. Millimeter wave module and radio apparatus
US20030201851A1 (en) * 2002-04-25 2003-10-30 Mitsubishi Denki Kabushiki Kaisha High frequency apparatus for transmitting or processing high frequency signal, and method for manufactruing the high frequency apparatus
US20030206083A1 (en) * 1998-06-02 2003-11-06 Kazuaki Takahashi Millimeter wave module and radio apparatus
US6714104B1 (en) * 1999-03-31 2004-03-30 Nokia Networks Oy Inverted microtrip transmission line integrated in a multilayer structure
DE10304835A1 (de) * 2003-02-06 2004-08-05 Robert Bosch Gmbh Mikroelektromechanisches Bauelement
US20050056944A1 (en) * 2001-02-27 2005-03-17 Chippac, Inc. Super-thin high speed flip chip package
US20050057327A1 (en) * 2003-09-15 2005-03-17 Korea Advanced Institute Of Science And Technology Transmission line of coaxial-type using dielectric film and manufacturing method and packaging method thereof
US20050237137A1 (en) * 2003-11-25 2005-10-27 Banpil Photonics, Inc. High speed electrical interconnects and method of manufacturing
US20050248421A1 (en) * 2004-05-05 2005-11-10 Atmel Germany Gmbh Method for producing a coplanar waveguide system on a substrate, and a component for the transmission of electromagnetic waves fabricated in accordance with such a method
US20060270178A1 (en) * 2005-02-09 2006-11-30 Sony Corporation Method for manufacturing high-frequency signal transmission circuit and high-frequency signal transmission circuit device
CN1293667C (zh) * 2003-12-19 2007-01-03 上海交通大学 基于微机电系统的倒置微带传输线及其制造方法
US20080240656A1 (en) * 2007-03-20 2008-10-02 Rohm And Haas Electronic Materials Llc Integrated electronic components and methods of formation thereof
US20080246562A1 (en) * 2007-03-20 2008-10-09 Rohm And Haas Electronic Materials Llc Coaxial transmission line microstructures and methods of formation thereof
CN1596485B (zh) * 2001-09-27 2010-12-01 英特尔公司 在印刷电路板中形成波导的方法
US20110074028A1 (en) * 2004-10-07 2011-03-31 Stats Chippac, Ltd. Semiconductor Device and Method of Dissipating Heat From Thin Package-on-Package Mounted to Substrate
US20110115580A1 (en) * 2009-03-03 2011-05-19 Bae Systems Information And Electronic Systems Integration Inc. Two level matrix for embodying disparate micro-machined coaxial components
US20110187614A1 (en) * 2008-10-29 2011-08-04 Hideki Kirino High-frequency waveguide and phase shifter using same, radiator, electronic device which uses this phase shifter and radiator, antenna device, and electronic device equipped with same
US20120308177A1 (en) * 2011-06-01 2012-12-06 Stmicroelectronics S.A. Process for fabricating an integrated circuit comprising at least one coplanar waveguide
US20120322206A1 (en) * 2007-11-30 2012-12-20 Skyworks Solutions, Inc. Method for wafer level packaging of electronic devices
WO2013091259A1 (zh) * 2011-12-23 2013-06-27 成都泰格微波技术股份有限公司 微小型毫米波波导器件的制造方法
USRE44438E1 (en) 2001-02-27 2013-08-13 Stats Chippac, Ltd. Semiconductor device and method of dissipating heat from thin package-on-package mounted to substrate
US8717124B2 (en) 2010-01-22 2014-05-06 Nuvotronics, Llc Thermal management
US8742874B2 (en) 2003-03-04 2014-06-03 Nuvotronics, Llc Coaxial waveguide microstructures having an active device and methods of formation thereof
US8814601B1 (en) 2011-06-06 2014-08-26 Nuvotronics, Llc Batch fabricated microconnectors
US8866300B1 (en) 2011-06-05 2014-10-21 Nuvotronics, Llc Devices and methods for solder flow control in three-dimensional microstructures
US8917150B2 (en) 2010-01-22 2014-12-23 Nuvotronics, Llc Waveguide balun having waveguide structures disposed over a ground plane and having probes located in channels
US8933769B2 (en) 2006-12-30 2015-01-13 Nuvotronics, Llc Three-dimensional microstructures having a re-entrant shape aperture and methods of formation
US9219298B2 (en) 2013-03-15 2015-12-22 International Business Machines Corporation Removal of spurious microwave modes via flip-chip crossover
US9306255B1 (en) 2013-03-15 2016-04-05 Nuvotronics, Inc. Microstructure including microstructural waveguide elements and/or IC chips that are mechanically interconnected to each other
US9306254B1 (en) 2013-03-15 2016-04-05 Nuvotronics, Inc. Substrate-free mechanical interconnection of electronic sub-systems using a spring configuration
US9325044B2 (en) 2013-01-26 2016-04-26 Nuvotronics, Inc. Multi-layer digital elliptic filter and method
US20160181681A1 (en) * 2014-12-22 2016-06-23 The Regents Of The University Of Michigan Non-Contact On-Wafer S-Parameter Measurements of Devices at Millimeter-Wave to Terahertz Frequencies
US9397283B2 (en) 2013-03-15 2016-07-19 International Business Machines Corporation Chip mode isolation and cross-talk reduction through buried metal layers and through-vias
WO2018038707A1 (en) * 2016-08-23 2018-03-01 Intel Corporation Inverted microstrip transmission lines for qubits
US9971970B1 (en) * 2015-04-27 2018-05-15 Rigetti & Co, Inc. Microwave integrated quantum circuits with VIAS and methods for making the same
US9993982B2 (en) 2011-07-13 2018-06-12 Nuvotronics, Inc. Methods of fabricating electronic and mechanical structures
US10310009B2 (en) 2014-01-17 2019-06-04 Nuvotronics, Inc Wafer scale test interface unit and contactors
US10319654B1 (en) 2017-12-01 2019-06-11 Cubic Corporation Integrated chip scale packages
US10497511B2 (en) 2009-11-23 2019-12-03 Cubic Corporation Multilayer build processes and devices thereof
US10511073B2 (en) 2014-12-03 2019-12-17 Cubic Corporation Systems and methods for manufacturing stacked circuits and transmission lines
JP2020141406A (ja) * 2016-01-27 2020-09-03 株式会社村田製作所 電子機器
US10847469B2 (en) 2016-04-26 2020-11-24 Cubic Corporation CTE compensation for wafer-level and chip-scale packages and assemblies
US10992055B2 (en) 2016-04-28 2021-04-27 At&S Austria Technologie & Systemtechnik Aktiengesellschaft Component carrier with integrated antenna arrangement, electronic apparatus, radio communication method
US10998638B2 (en) 2019-01-31 2021-05-04 Toyota Motor Engineering & Manufacturing North America, Inc. Nickel-chromium particles and multilayer structures comprising nickel chromium core layers
US11121301B1 (en) 2017-06-19 2021-09-14 Rigetti & Co, Inc. Microwave integrated quantum circuits with cap wafers and their methods of manufacture
US11264708B2 (en) * 2015-01-27 2022-03-01 At&S Austria Technologie & Systemtechnik Aktiengesellschaft Component carrier with integrated antenna structure
US11276727B1 (en) 2017-06-19 2022-03-15 Rigetti & Co, Llc Superconducting vias for routing electrical signals through substrates and their methods of manufacture
US11339495B2 (en) 2020-05-20 2022-05-24 Toyota Motor Engineering & Manufacturing North America, Inc. Coated discrete metallic particles and multilayer structures comprising reflective core layers
US20230056318A1 (en) * 2017-10-05 2023-02-23 Google Llc Low footprint resonator in flip chip geometry

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3282608B2 (ja) * 1999-03-23 2002-05-20 日本電気株式会社 多層基板
KR20010077106A (ko) * 2000-01-31 2001-08-17 김용권 코플래나 웨이브 가이드
KR100379440B1 (ko) * 2000-02-16 2003-04-10 엘지전자 주식회사 마이크로웨이브 공진기 제조방법
KR100382765B1 (ko) * 2001-06-15 2003-05-09 삼성전자주식회사 송수신용 수동소자와 그 집적모듈 및 그 제조방법
JP2004207625A (ja) * 2002-12-26 2004-07-22 Sony Corp 多層構造体およびその製造方法ならびに機能構造体およびその製造方法ならびに電子線露光用マスクおよびその製造方法
JP3938147B2 (ja) * 2003-04-08 2007-06-27 住友金属鉱山株式会社 タンタル酸リチウム基板およびその製造方法
DE102004022178B4 (de) 2004-05-05 2008-03-20 Atmel Germany Gmbh Verfahren zur Herstellung einer Leiterbahn auf einem Substrat und Bauelement mit einer derart hergestellten Leiterbahn
JP4823541B2 (ja) * 2005-03-18 2011-11-24 富士通セミコンダクター株式会社 高周波伝送線路
FR2885735B1 (fr) 2005-05-10 2007-08-03 St Microelectronics Sa Circuit integre guide d'ondes
FI20055511A (fi) * 2005-09-27 2007-03-28 Filtronic Comtek Oy Siirtojohtorakenne
CN101274736A (zh) 2006-12-30 2008-10-01 罗门哈斯电子材料有限公司 三维微结构及其形成方法
CN104377415A (zh) * 2014-10-08 2015-02-25 石以瑄 用于微波传输的共面波导及其制作方法
CN108601204A (zh) * 2018-05-25 2018-09-28 上海安费诺永亿通讯电子有限公司 一种低损耗扁平传输线
US11963911B2 (en) 2020-02-13 2024-04-23 Bone Foam, Inc. Anterior cervical positioning system

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5012319A (en) * 1990-05-14 1991-04-30 At&T Bell Laboratories Integrated electronic assembly comprising a transmission line
US5138436A (en) * 1990-11-16 1992-08-11 Ball Corporation Interconnect package having means for waveguide transmission of rf signals
US5280253A (en) * 1990-08-31 1994-01-18 Matsushita Electric Industrial Co. Ltd. Cylindrical waveguide-to-microstrip line converter
JPH0677709A (ja) * 1992-08-28 1994-03-18 Nissan Motor Co Ltd 半導体ミリ波装置
US5303419A (en) * 1992-05-29 1994-04-12 Her Majesty The Queen In Right Of Canada As Represented By The Minister Of Communications Aperture-coupled line Magic-Tee and mixer formed therefrom
US5471181A (en) * 1994-03-08 1995-11-28 Hughes Missile Systems Company Interconnection between layers of striplines or microstrip through cavity backed slot
US5796321A (en) * 1995-08-31 1998-08-18 Commissariat A L'energie Atomique Self-supported apparatus for the propagation of ultrahigh frequency waves

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5012319A (en) * 1990-05-14 1991-04-30 At&T Bell Laboratories Integrated electronic assembly comprising a transmission line
US5280253A (en) * 1990-08-31 1994-01-18 Matsushita Electric Industrial Co. Ltd. Cylindrical waveguide-to-microstrip line converter
US5138436A (en) * 1990-11-16 1992-08-11 Ball Corporation Interconnect package having means for waveguide transmission of rf signals
US5303419A (en) * 1992-05-29 1994-04-12 Her Majesty The Queen In Right Of Canada As Represented By The Minister Of Communications Aperture-coupled line Magic-Tee and mixer formed therefrom
JPH0677709A (ja) * 1992-08-28 1994-03-18 Nissan Motor Co Ltd 半導体ミリ波装置
US5471181A (en) * 1994-03-08 1995-11-28 Hughes Missile Systems Company Interconnection between layers of striplines or microstrip through cavity backed slot
US5796321A (en) * 1995-08-31 1998-08-18 Commissariat A L'energie Atomique Self-supported apparatus for the propagation of ultrahigh frequency waves

Non-Patent Citations (16)

* Cited by examiner, † Cited by third party
Title
"A 10-15 GHz Micromachined Directional Coupler" by Robertson et al; 1996 IEEE MTT-S Digest; pp. 797-800.
A 10 15 GHz Micromachined Directional Coupler by Robertson et al; 1996 IEEE MTT S Digest; pp. 797 800. *
Drayton R F et al: "Design of Micromachined High Frequency Circuit Components" International Journal of Microcircuits and Electronic Packaging vol. 18, No. 1, Jan. 1, 1995, pp. 19-28, XP000517150.
Drayton R F et al: Design of Micromachined High Frequency Circuit Components International Journal of Microcircuits and Electronic Packaging vol. 18, No. 1, Jan. 1, 1995, pp. 19 28, XP000517150. *
Drayton, R.F. et al.; "Development of Self-Packaged High Frequency Circuits Using Micromachining Techniques"; IEEE Transactions On Microwave Theory and Techniques, vol. 43, No. 9, Sep. 1995; pp. 2073-2080.
Drayton, R.F. et al.; "Micromachined Conformal Packages for Microwave and Millimeter-Wave Applications"; IEEE MTT-S Digest, 1995; pp. 1387-1390.
Drayton, R.F. et al.; Development of Self Packaged High Frequency Circuits Using Micromachining Techniques ; IEEE Transactions On Microwave Theory and Techniques , vol. 43, No. 9, Sep. 1995; pp. 2073 2080. *
Drayton, R.F. et al.; Micromachined Conformal Packages for Microwave and Millimeter Wave Applications ; IEEE MTT S Digest , 1995; pp. 1387 1390. *
Katehi L P B et al: "Novel Micromachined Approaches to MMICS Using Low-Parasitic, High-Performance Transmission Media and Enviroments" 1996 IEEE MTT-S International Microwave Symposium Digest, San Francisco, Jun. 17-21, 1996, vol. 2, Jun. 17, 1996, pp. 1145-1148, XP000732545 Ranson R G (ED).
Katehi L P B et al: Novel Micromachined Approaches to MMICS Using Low Parasitic, High Performance Transmission Media and Enviroments 1996 IEEE MTT S International Microwave Symposium Digest, San Francisco, Jun. 17 21, 1996, vol. 2, Jun. 17, 1996, pp. 1145 1148, XP000732545 Ranson R G (ED). *
Katehi, L.P.B. et al.; "Micromachined Circuits for Millimeter-and Sub-Millimeter-Wave Applications"; IEEE Antennas and Propagation Magazine, vol. 35, No. 5, Oct. 1993; pp. 9-17.
Katehi, L.P.B. et al.; "Si-Micromachining In MM-Wave Circuits"; IEEE 1997 Topical Symposium on Millimeter Waves, published by IEEE in 1998.
Katehi, L.P.B. et al.; Micromachined Circuits for Millimeter and Sub Millimeter Wave Applications ; IEEE Antennas and Propagation Magazine , vol. 35, No. 5, Oct. 1993; pp. 9 17. *
Katehi, L.P.B. et al.; Si Micromachining In MM Wave Circuits ; IEEE 1997 Topical Symposium on Millimeter Waves , published by IEEE in 1998. *
Katehi, L.P.B.; Novel Transmission Lines for the Submillimeter Wave Region; Proceedings of the IEEE , vol. 80, No. 11, Nov. 1992; pp. 1771 1787. *
Katehi, L.P.B.; Novel Transmission Lines for the Submillimeter-Wave Region; Proceedings of the IEEE, vol. 80, No. 11, Nov. 1992; pp. 1771-1787.

Cited By (103)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6307450B2 (en) 1998-06-02 2001-10-23 Matsushita Electric Industrial Co., Ltd. Millimeter wave module and radio apparatus
US6225878B1 (en) * 1998-06-02 2001-05-01 Matsushita Electric Industrial Co., Ltd. Millimeter wave module and radio apparatus
US6549105B2 (en) 1998-06-02 2003-04-15 Matsushita Electric Industrial Co., Ltd. Millimeter wave module and radio apparatus
US6778041B2 (en) 1998-06-02 2004-08-17 Matsushita Electric Industrial Co., Ltd. Millimeter wave module and radio apparatus
US20030206083A1 (en) * 1998-06-02 2003-11-06 Kazuaki Takahashi Millimeter wave module and radio apparatus
US6483406B1 (en) * 1998-07-31 2002-11-19 Kyocera Corporation High-frequency module using slot coupling
US6466112B1 (en) * 1998-12-28 2002-10-15 Dynamic Solutions International, Inc. Coaxial type signal line and manufacturing method thereof
US6714104B1 (en) * 1999-03-31 2004-03-30 Nokia Networks Oy Inverted microtrip transmission line integrated in a multilayer structure
US6411182B1 (en) * 1999-03-31 2002-06-25 Samsung Electronics Co., Ltd. Cavity resonator for reducing phase noise of voltage controlled oscillator and method for fabricating the same
US20050056944A1 (en) * 2001-02-27 2005-03-17 Chippac, Inc. Super-thin high speed flip chip package
US8941235B2 (en) 2001-02-27 2015-01-27 Stats Chippac, Ltd. Semiconductor device and method of dissipating heat from thin package-on-package mounted to substrate
USRE44438E1 (en) 2001-02-27 2013-08-13 Stats Chippac, Ltd. Semiconductor device and method of dissipating heat from thin package-on-package mounted to substrate
US6512431B2 (en) 2001-02-28 2003-01-28 Lockheed Martin Corporation Millimeterwave module compact interconnect
CN1596485B (zh) * 2001-09-27 2010-12-01 英特尔公司 在印刷电路板中形成波导的方法
US20030201851A1 (en) * 2002-04-25 2003-10-30 Mitsubishi Denki Kabushiki Kaisha High frequency apparatus for transmitting or processing high frequency signal, and method for manufactruing the high frequency apparatus
US7285841B2 (en) 2002-04-25 2007-10-23 Mitsubishi Denki Kabushiki Kaisha Method of manufacturing signal processing apparatus
US7030721B2 (en) * 2002-04-25 2006-04-18 Mitsubishi Denki Kabushiki Kaisha High frequency apparatus for transmitting or processing high frequency signal
US20060145789A1 (en) * 2002-04-25 2006-07-06 Mitsubishi Denki Kabushiki Kaisha Method of manufacturing signal processing apparatus
DE10304835A1 (de) * 2003-02-06 2004-08-05 Robert Bosch Gmbh Mikroelektromechanisches Bauelement
US9312589B2 (en) 2003-03-04 2016-04-12 Nuvotronics, Inc. Coaxial waveguide microstructure having center and outer conductors configured in a rectangular cross-section
US8742874B2 (en) 2003-03-04 2014-06-03 Nuvotronics, Llc Coaxial waveguide microstructures having an active device and methods of formation thereof
US10074885B2 (en) 2003-03-04 2018-09-11 Nuvotronics, Inc Coaxial waveguide microstructures having conductors formed by plural conductive layers
US20050057327A1 (en) * 2003-09-15 2005-03-17 Korea Advanced Institute Of Science And Technology Transmission line of coaxial-type using dielectric film and manufacturing method and packaging method thereof
US7400222B2 (en) * 2003-09-15 2008-07-15 Korea Advanced Institute Of Science & Technology Grooved coaxial-type transmission line, manufacturing method and packaging method thereof
US20050237137A1 (en) * 2003-11-25 2005-10-27 Banpil Photonics, Inc. High speed electrical interconnects and method of manufacturing
US7298234B2 (en) * 2003-11-25 2007-11-20 Banpil Photonics, Inc. High speed electrical interconnects and method of manufacturing
CN1293667C (zh) * 2003-12-19 2007-01-03 上海交通大学 基于微机电系统的倒置微带传输线及其制造方法
US7307497B2 (en) * 2004-05-05 2007-12-11 Atmel Germany Gmbh Method for producing a coplanar waveguide system on a substrate, and a component for the transmission of electromagnetic waves fabricated in accordance with such a method
US20050248421A1 (en) * 2004-05-05 2005-11-10 Atmel Germany Gmbh Method for producing a coplanar waveguide system on a substrate, and a component for the transmission of electromagnetic waves fabricated in accordance with such a method
US8143108B2 (en) 2004-10-07 2012-03-27 Stats Chippac, Ltd. Semiconductor device and method of dissipating heat from thin package-on-package mounted to substrate
US20110074028A1 (en) * 2004-10-07 2011-03-31 Stats Chippac, Ltd. Semiconductor Device and Method of Dissipating Heat From Thin Package-on-Package Mounted to Substrate
US20060270178A1 (en) * 2005-02-09 2006-11-30 Sony Corporation Method for manufacturing high-frequency signal transmission circuit and high-frequency signal transmission circuit device
US7777307B2 (en) * 2005-02-09 2010-08-17 Sony Corporation High-frequency signal transmission circuit device
US20100190273A1 (en) * 2005-02-09 2010-07-29 Sony Corporation Method for manufacturing high-frequency signal transmission circuit and high-frequency signal transmission circuit device
US8933769B2 (en) 2006-12-30 2015-01-13 Nuvotronics, Llc Three-dimensional microstructures having a re-entrant shape aperture and methods of formation
US9515364B1 (en) 2006-12-30 2016-12-06 Nuvotronics, Inc. Three-dimensional microstructure having a first dielectric element and a second multi-layer metal element configured to define a non-solid volume
US20080246562A1 (en) * 2007-03-20 2008-10-09 Rohm And Haas Electronic Materials Llc Coaxial transmission line microstructures and methods of formation thereof
KR101472134B1 (ko) * 2007-03-20 2014-12-15 누보트로닉스, 엘.엘.씨 동축 전송선 마이크로구조물 및 그의 형성방법
US9024417B2 (en) 2007-03-20 2015-05-05 Nuvotronics, Llc Integrated electronic components and methods of formation thereof
US10431521B2 (en) 2007-03-20 2019-10-01 Cubic Corporation Integrated electronic components and methods of formation thereof
US8542079B2 (en) 2007-03-20 2013-09-24 Nuvotronics, Llc Coaxial transmission line microstructure including an enlarged coaxial structure for transitioning to an electrical connector
US9000863B2 (en) 2007-03-20 2015-04-07 Nuvotronics, Llc. Coaxial transmission line microstructure with a portion of increased transverse dimension and method of formation thereof
US20080240656A1 (en) * 2007-03-20 2008-10-02 Rohm And Haas Electronic Materials Llc Integrated electronic components and methods of formation thereof
US7898356B2 (en) 2007-03-20 2011-03-01 Nuvotronics, Llc Coaxial transmission line microstructures and methods of formation thereof
US7755174B2 (en) 2007-03-20 2010-07-13 Nuvotonics, LLC Integrated electronic components and methods of formation thereof
US20100296252A1 (en) * 2007-03-20 2010-11-25 Rollin Jean-Marc Integrated electronic components and methods of formation thereof
US10002818B2 (en) 2007-03-20 2018-06-19 Nuvotronics, Inc. Integrated electronic components and methods of formation thereof
US9570789B2 (en) 2007-03-20 2017-02-14 Nuvotronics, Inc Transition structure between a rectangular coaxial microstructure and a cylindrical coaxial cable using step changes in center conductors thereof
US8809116B2 (en) * 2007-11-30 2014-08-19 Skyworks Solutions, Inc. Method for wafer level packaging of electronic devices
US20120322206A1 (en) * 2007-11-30 2012-12-20 Skyworks Solutions, Inc. Method for wafer level packaging of electronic devices
US8779995B2 (en) * 2008-10-29 2014-07-15 Panasonic Corporation High-frequency waveguide and phase shifter using same, radiator, electronic device which uses this phase shifter and radiator, antenna device, and electronic device equipped with same
US20110187614A1 (en) * 2008-10-29 2011-08-04 Hideki Kirino High-frequency waveguide and phase shifter using same, radiator, electronic device which uses this phase shifter and radiator, antenna device, and electronic device equipped with same
US20110115580A1 (en) * 2009-03-03 2011-05-19 Bae Systems Information And Electronic Systems Integration Inc. Two level matrix for embodying disparate micro-machined coaxial components
US8659371B2 (en) 2009-03-03 2014-02-25 Bae Systems Information And Electronic Systems Integration Inc. Three-dimensional matrix structure for defining a coaxial transmission line channel
US10497511B2 (en) 2009-11-23 2019-12-03 Cubic Corporation Multilayer build processes and devices thereof
US8917150B2 (en) 2010-01-22 2014-12-23 Nuvotronics, Llc Waveguide balun having waveguide structures disposed over a ground plane and having probes located in channels
US8717124B2 (en) 2010-01-22 2014-05-06 Nuvotronics, Llc Thermal management
US20120308177A1 (en) * 2011-06-01 2012-12-06 Stmicroelectronics S.A. Process for fabricating an integrated circuit comprising at least one coplanar waveguide
US9818646B2 (en) 2011-06-01 2017-11-14 Stmicroelectronics Sa Process for fabricating an integrated circuit comprising at least one coplanar waveguide
US9673088B2 (en) 2011-06-01 2017-06-06 Stmicroelectronics Sa Process for fabricating an integrated circuit comprising at least one coplanar waveguide
US9240624B2 (en) * 2011-06-01 2016-01-19 Stmicroelectronics Sa Process for fabricating an integrated circuit comprising at least one coplanar waveguide
US8866300B1 (en) 2011-06-05 2014-10-21 Nuvotronics, Llc Devices and methods for solder flow control in three-dimensional microstructures
US9505613B2 (en) 2011-06-05 2016-11-29 Nuvotronics, Inc. Devices and methods for solder flow control in three-dimensional microstructures
US8814601B1 (en) 2011-06-06 2014-08-26 Nuvotronics, Llc Batch fabricated microconnectors
US9583856B2 (en) 2011-06-06 2017-02-28 Nuvotronics, Inc. Batch fabricated microconnectors
US9993982B2 (en) 2011-07-13 2018-06-12 Nuvotronics, Inc. Methods of fabricating electronic and mechanical structures
WO2013091259A1 (zh) * 2011-12-23 2013-06-27 成都泰格微波技术股份有限公司 微小型毫米波波导器件的制造方法
US9608303B2 (en) 2013-01-26 2017-03-28 Nuvotronics, Inc. Multi-layer digital elliptic filter and method
US9325044B2 (en) 2013-01-26 2016-04-26 Nuvotronics, Inc. Multi-layer digital elliptic filter and method
US9531055B2 (en) * 2013-03-15 2016-12-27 International Business Machines Corporation Removal of spurious microwave modes via flip-chip crossover
US10193203B2 (en) 2013-03-15 2019-01-29 Nuvotronics, Inc Structures and methods for interconnects and associated alignment and assembly mechanisms for and between chips, components, and 3D systems
US9219298B2 (en) 2013-03-15 2015-12-22 International Business Machines Corporation Removal of spurious microwave modes via flip-chip crossover
US9888600B2 (en) 2013-03-15 2018-02-06 Nuvotronics, Inc Substrate-free interconnected electronic mechanical structural systems
US9306255B1 (en) 2013-03-15 2016-04-05 Nuvotronics, Inc. Microstructure including microstructural waveguide elements and/or IC chips that are mechanically interconnected to each other
US10361471B2 (en) 2013-03-15 2019-07-23 Nuvotronics, Inc Structures and methods for interconnects and associated alignment and assembly mechanisms for and between chips, components, and 3D systems
US9455392B2 (en) 2013-03-15 2016-09-27 International Business Machines Corporation Method of fabricating a coplanar waveguide device including removal of spurious microwave modes via flip-chip crossover
US9520547B2 (en) 2013-03-15 2016-12-13 International Business Machines Corporation Chip mode isolation and cross-talk reduction through buried metal layers and through-vias
US9397283B2 (en) 2013-03-15 2016-07-19 International Business Machines Corporation Chip mode isolation and cross-talk reduction through buried metal layers and through-vias
US10257951B2 (en) 2013-03-15 2019-04-09 Nuvotronics, Inc Substrate-free interconnected electronic mechanical structural systems
US9306254B1 (en) 2013-03-15 2016-04-05 Nuvotronics, Inc. Substrate-free mechanical interconnection of electronic sub-systems using a spring configuration
US10310009B2 (en) 2014-01-17 2019-06-04 Nuvotronics, Inc Wafer scale test interface unit and contactors
US10511073B2 (en) 2014-12-03 2019-12-17 Cubic Corporation Systems and methods for manufacturing stacked circuits and transmission lines
US9941560B2 (en) * 2014-12-22 2018-04-10 The Regents Of The University Of Michigan Non-contact on-wafer S-parameter measurements of devices at millimeter-wave to terahertz frequencies
US20160181681A1 (en) * 2014-12-22 2016-06-23 The Regents Of The University Of Michigan Non-Contact On-Wafer S-Parameter Measurements of Devices at Millimeter-Wave to Terahertz Frequencies
US11264708B2 (en) * 2015-01-27 2022-03-01 At&S Austria Technologie & Systemtechnik Aktiengesellschaft Component carrier with integrated antenna structure
US10068181B1 (en) 2015-04-27 2018-09-04 Rigetti & Co, Inc. Microwave integrated quantum circuits with cap wafer and methods for making the same
US11574230B1 (en) 2015-04-27 2023-02-07 Rigetti & Co, Llc Microwave integrated quantum circuits with vias and methods for making the same
US9971970B1 (en) * 2015-04-27 2018-05-15 Rigetti & Co, Inc. Microwave integrated quantum circuits with VIAS and methods for making the same
US10769546B1 (en) 2015-04-27 2020-09-08 Rigetti & Co, Inc. Microwave integrated quantum circuits with cap wafer and methods for making the same
JP2020141406A (ja) * 2016-01-27 2020-09-03 株式会社村田製作所 電子機器
US10847469B2 (en) 2016-04-26 2020-11-24 Cubic Corporation CTE compensation for wafer-level and chip-scale packages and assemblies
US10992055B2 (en) 2016-04-28 2021-04-27 At&S Austria Technologie & Systemtechnik Aktiengesellschaft Component carrier with integrated antenna arrangement, electronic apparatus, radio communication method
WO2018038707A1 (en) * 2016-08-23 2018-03-01 Intel Corporation Inverted microstrip transmission lines for qubits
US11276727B1 (en) 2017-06-19 2022-03-15 Rigetti & Co, Llc Superconducting vias for routing electrical signals through substrates and their methods of manufacture
US11121301B1 (en) 2017-06-19 2021-09-14 Rigetti & Co, Inc. Microwave integrated quantum circuits with cap wafers and their methods of manufacture
US11770982B1 (en) 2017-06-19 2023-09-26 Rigetti & Co, Llc Microwave integrated quantum circuits with cap wafers and their methods of manufacture
US20230056318A1 (en) * 2017-10-05 2023-02-23 Google Llc Low footprint resonator in flip chip geometry
US10553511B2 (en) 2017-12-01 2020-02-04 Cubic Corporation Integrated chip scale packages
US10319654B1 (en) 2017-12-01 2019-06-11 Cubic Corporation Integrated chip scale packages
US10998639B2 (en) 2019-01-31 2021-05-04 Toyota Motor Engineering & Manufacturing North America, Inc. Discrete metallic particles and multilayer structures comprising reflective core layers
US10998638B2 (en) 2019-01-31 2021-05-04 Toyota Motor Engineering & Manufacturing North America, Inc. Nickel-chromium particles and multilayer structures comprising nickel chromium core layers
US11749899B2 (en) 2019-01-31 2023-09-05 Toyota Motor Engineering & Manufacturing North America, Inc. Multilayer structures comprising reflective core layers
US11339495B2 (en) 2020-05-20 2022-05-24 Toyota Motor Engineering & Manufacturing North America, Inc. Coated discrete metallic particles and multilayer structures comprising reflective core layers

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