US20180138356A1 - Light emitting diode - Google Patents
Light emitting diode Download PDFInfo
- Publication number
- US20180138356A1 US20180138356A1 US15/868,649 US201815868649A US2018138356A1 US 20180138356 A1 US20180138356 A1 US 20180138356A1 US 201815868649 A US201815868649 A US 201815868649A US 2018138356 A1 US2018138356 A1 US 2018138356A1
- Authority
- US
- United States
- Prior art keywords
- layer
- light emitting
- compound semiconductor
- emitting diode
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 239000004065 semiconductor Substances 0.000 claims abstract description 96
- 239000000758 substrate Substances 0.000 claims abstract description 64
- 239000000463 material Substances 0.000 claims abstract description 41
- 230000001902 propagating effect Effects 0.000 claims abstract description 12
- 150000001875 compounds Chemical class 0.000 claims description 70
- 150000004767 nitrides Chemical class 0.000 claims description 8
- -1 nitride compound Chemical class 0.000 claims description 5
- 230000008774 maternal effect Effects 0.000 claims description 2
- 238000006243 chemical reaction Methods 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 13
- 239000010410 layer Substances 0.000 description 191
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 14
- 238000005253 cladding Methods 0.000 description 9
- 238000005530 etching Methods 0.000 description 8
- 230000002093 peripheral effect Effects 0.000 description 7
- 229910002704 AlGaN Inorganic materials 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 6
- 229910052594 sapphire Inorganic materials 0.000 description 4
- 239000010980 sapphire Substances 0.000 description 4
- 238000004528 spin coating Methods 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 3
- JNDMLEXHDPKVFC-UHFFFAOYSA-N aluminum;oxygen(2-);yttrium(3+) Chemical compound [O-2].[O-2].[O-2].[Al+3].[Y+3] JNDMLEXHDPKVFC-UHFFFAOYSA-N 0.000 description 3
- 229910052733 gallium Inorganic materials 0.000 description 3
- 239000002223 garnet Substances 0.000 description 3
- 229910052738 indium Inorganic materials 0.000 description 3
- 229910019901 yttrium aluminum garnet Inorganic materials 0.000 description 3
- 229910052684 Cerium Inorganic materials 0.000 description 2
- 229910052688 Gadolinium Inorganic materials 0.000 description 2
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 2
- 229910052765 Lutetium Inorganic materials 0.000 description 2
- 229910052772 Samarium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- GWXLDORMOJMVQZ-UHFFFAOYSA-N cerium Chemical compound [Ce] GWXLDORMOJMVQZ-UHFFFAOYSA-N 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- UIWYJDYFSGRHKR-UHFFFAOYSA-N gadolinium atom Chemical compound [Gd] UIWYJDYFSGRHKR-UHFFFAOYSA-N 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 2
- 229910052746 lanthanum Inorganic materials 0.000 description 2
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical compound [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 description 2
- OHSVLFRHMCKCQY-UHFFFAOYSA-N lutetium atom Chemical compound [Lu] OHSVLFRHMCKCQY-UHFFFAOYSA-N 0.000 description 2
- 238000000206 photolithography Methods 0.000 description 2
- KZUNJOHGWZRPMI-UHFFFAOYSA-N samarium atom Chemical compound [Sm] KZUNJOHGWZRPMI-UHFFFAOYSA-N 0.000 description 2
- 229910052706 scandium Inorganic materials 0.000 description 2
- SIXSYDAISGFNSX-UHFFFAOYSA-N scandium atom Chemical compound [Sc] SIXSYDAISGFNSX-UHFFFAOYSA-N 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- 239000012780 transparent material Substances 0.000 description 2
- 229910052727 yttrium Inorganic materials 0.000 description 2
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 2
- 229910015844 BCl3 Inorganic materials 0.000 description 1
- 229910009372 YVO4 Inorganic materials 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 239000002355 dual-layer Substances 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- FAQYAMRNWDIXMY-UHFFFAOYSA-N trichloroborane Chemical compound ClB(Cl)Cl FAQYAMRNWDIXMY-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0062—Processes for devices with an active region comprising only III-V compounds
- H01L33/0066—Processes for devices with an active region comprising only III-V compounds with a substrate not being a III-V compound
- H01L33/007—Processes for devices with an active region comprising only III-V compounds with a substrate not being a III-V compound comprising nitride compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/50—Wavelength conversion elements
- H01L33/508—Wavelength conversion elements having a non-uniform spatial arrangement or non-uniform concentration, e.g. patterned wavelength conversion layer, wavelength conversion layer with a concentration gradient of the wavelength conversion material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48257—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a die pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/85909—Post-treatment of the connector or wire bonding area
- H01L2224/8592—Applying permanent coating, e.g. protective coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00012—Relevant to the scope of the group, the symbol of which is combined with the symbol of this group
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2933/00—Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
- H01L2933/0008—Processes
- H01L2933/0033—Processes relating to semiconductor body packages
- H01L2933/0041—Processes relating to semiconductor body packages relating to wavelength conversion elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0095—Post-treatment of devices, e.g. annealing, recrystallisation or short-circuit elimination
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/20—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate
Definitions
- the present invention relates to a light emitting diode and a method for fabricating the same, and more particularly, to a light emitting diode capable of emitting light with a homogeneous color profile and a method for fabricating the same.
- FIG. 1 is a sectional view of a conventional light emitting diode emitting white light.
- a blue-light emitting diode 2 is located inside a lead frame 1 , with wires 3 connected to the top surface thereof via ohmic contact and to the lead frame 1 to supply electricity.
- the inner space of the lead frame 1 is filled with a phosphor 6 so that blue light emitted from the blue-light emitting diode 2 is converted to red or green light or and then to white light by being mixed up with the red or green light.
- a light emitting diode 11 is provided in a cup-shaped header 12 .
- a mirror 13 is formed on the inner wall of the header 12 to reflect light emitted from the light emitting diode 11 .
- the inner space of the header 12 is filled with a transparent material 15 containing phosphor grains 14 dispersed around the light emitting diode 11 .
- a glass plate 16 is placed on the top of the header 12 to prevent light which is not absorbed by the phosphor grains 14 from being emitted into the air.
- a low-wave pass (LWP) filter is further placed on the front side of the light emitting diode 11 to pass short-wavelength light more efficiently than long-wavelength light.
- LWP low-wave pass
- EP O 855 751 A2 discloses an organic/inorganic semiconductor light emitting diode emitting red light and blue light that is manufactured by appropriately doping a green phosphor layer. However, it is difficult to uniformly dope the phosphor layer to an appropriate ion concentration to obtain light of a uniform color profile.
- the present invention provides a light emitting diode with a fluorescent layer having controlled varied thicknesses, wherein the thickness of the fluorescent layer can be appropriately adjusted to enable the light emitting diode to emit light of a desired wavelength band, and a simple method for fabricating the same.
- a light emitting diode comprising: a substrate which transmits light; a semiconductor material layer formed on the top surface of a substrate with an active layer generating light; and a fluorescent layer formed on the back surface of the substrate with controlled varied thicknesses.
- the substrate may have at least one etched hole formed by etching the back surface of the substrate to controlled varied thicknesses.
- the fluorescent layer may be formed as dual layers with controlled varied thicknesses. It is preferable that the substrate is a sapphire substrate.
- the semiconductor material layer may comprise: a first compound semiconductor layer deposited on the top surface of the substrate; the active layer deposited on the top surface of the first compound semiconductor layer; and a second compound semiconductor layer deposited on the top surface of the active layer.
- the first compound semiconductor layer may be an n-type doped or undoped GaN-based III-V nitride compound semiconductor layer.
- the second compound semiconductor layer may be a p-type doped GaN-based III-V nitride compound semiconductor layer.
- the active layer may be an n-type doped or undoped In x Al y Ga 1 ⁇ x ⁇ y N compound semiconductor layer where 0 ⁇ x ⁇ 1, 0 ⁇ y ⁇ 1, and x+y ⁇ 1.
- the active layer generates blue light
- the fluorescent layer converts a portion of the blue light to yellow light to emit white light from the light emitting diode.
- the fluorescent layer may be formed of a fluorescent material including a garnet fluorescent material activated with cerium containing at least one element selected from the group consisting of yttrium, lutetium, scandium, lanthanum, gadolinium, and samarium, and at least one element selected from the group consisting of aluminum, gallium, and indium.
- the active layer may generate UV light
- the fluorescent layer may convert the UV light to red, green, and blue light by absorbing the UV light, to emit white light from the light emitting diode.
- the fluorescent layer may be formed of a fluorescent material containing a red phosphor selected from the group consisting of Y 2 O 3 Eu 3+ Bi 3 and Y 2 O 2 S, a green phosphor selected from the group consisting of (Ba 1 ⁇ x ⁇ y ⁇ z Ca x Sr y Eu z )(Mg 1 ⁇ w Zn w )Si 2 O 7 and ZnS:Cu, and a blue phosphor selected from the group consisting of (Sr, Ba,Ca) 5 (PO 4 ) 3 Cl:Eu 2+ ) (SECA), BaMg 2 Al 16 O 27 :Eu 2+ (BAM), and BaMgAl 10 O 17 :Eu 3+ .
- the present invention provides a light emitting diode with a fluorescent layer having controlled varied thicknesses that can be implemented by etching the back surface of a substrate or by depositing a fluorescent material on the back surface to controlled varied thicknesses.
- the emission ratio of original blue light generated in an active layer and light absorbed by the fluorescent layer and converted to yellow light from the blue light can be controlled by appropriately adjusting the thickness of the fluorescent layer, to emit homogeneous white light from the light emitting diode.
- the active layer generates UV light
- the emission ratio of the original UV light and light absorbed by the fluorescent layer and converted to red, green, and blue light from the UV light can be controlled to emit homogeneous white light from the light emitting diode.
- FIG. 1 is a sectional view of a conventional white-light emitting diode
- FIG. 2 is a sectional view of a light emitting diode disclosed in U.S. Pat. No. 5,813,753;
- FIG. 3 is a sectional view of a light emitting diode according to a first embodiment of the present invention
- FIG. 4 is a sectional view of a light emitting diode according to a second embodiment of the present invention.
- FIG. 5 is a sectional view of a light emitting diode according to a third embodiment of the present invention.
- FIG. 6 is a sectional view of a light emitting diode according to a fourth embodiment of the present invention.
- FIGS. 7A through 7D are sectional views illustrating a first embodiment of a method for manufacturing light emitting diodes according to the present invention.
- FIGS. 8A through 8E are sectional views illustrating a second embodiment of the method for manufacturing light emitting diodes according to the present invention.
- FIGS. 9A and 9B are photographs showing etched substrates of light emitting diodes according to the first embodiment of the present invention.
- FIGS. 10A and 10B are photographs showing the back surface of the substrates of FIGS. 9A and 9B , respectively, with fluorescent layers.
- a light emitting diode 50 includes a substrate 51 , and a first compound semiconductor layer 53 , an active layer 57 , and a second compound semiconductor layer 55 , which are sequentially deposited on the top surface of the substrate 51 .
- An n-type electrode 54 is placed in a stepped region of the first compound semiconductor layer 53
- a p-type electrode 52 is placed on the top surface of the second compound semiconductor layer 55 , to supply electrons and holes into the active layer 57 .
- the substrate 51 is made of a durable substance, mostly such as sapphire.
- the back surface of the substrate 51 is etched to reduce the thickness of the substrate 51 in certain areas.
- the thickness of the substrate 51 is larger at a peripheral region 56 b than at the etched hole 56 a.
- the different thicknesses of the substrate 51 enable a fluorescent layer 59 to be deposited to controlled varied thicknesses onto the back surface of the substrate 51 by spin coating.
- the first compound semiconductor layer 53 is a GaN-based III-V nitride semiconductor layer, and preferably, is a direct transition type. In the case of doping the first compound semiconductor with conductive impurities, a GaN layer is preferable for the first compound semiconductor layer 53 . In either case, it is preferable that the first compound semiconductor layer 53 is formed of the same maternal as the second compound semiconductor layer 55 .
- a first cladding layer (not shown) may be further formed on the top surface of the first compound semiconductor layer 53 .
- the first cladding layer may be formed of an n-AlGaN/GaN layer having a predetermined refractive index.
- the first cladding layer may be formed of a compound semiconductor layer different from the n-AlGaN/GaN layer.
- the second compound semiconductor layer 55 is a GaN-based III-V nitride semiconductor layer, and preferably, is a direct transition type doped with p-type conductive impurities, and most preferably, is a p-GaN layer. In the case of undoping the second compound semiconductor layer 55 , a GaN layer or a AlGaN layer or InGaN layer containing Al or In, respectively, in a predetermined ratio may be used for the second compound semiconductor layer 55 .
- the active layer 57 is formed on the top surface of the first compound semiconductor layer 53 .
- the active layer 57 is a material layer where light is generated by the recombination of electrons and carrier holes.
- the active layer 57 is a GaN-based III-V nitride semiconductor layer with a multiple quantum-well (MQW) structure. More preferably, the active layer 57 is formed of a In x Al y Ga 1 ⁇ x ⁇ y N, where 0 ⁇ x ⁇ 1, 0 ⁇ y ⁇ 1 and x+y ⁇ 1, with a MQW structure.
- First and second waveguide layers may be further formed on and underneath the active layer 57 , respectively, to amplify light emitted from the active layer 57 and emit light from the LED with enhanced intensity.
- the first and second waveguide layers are formed of a smaller refractive index material than the active layer 57 , and preferably, for example, a GaN-based III-V compound semiconductor layer.
- the first waveguide layer may be formed of a n-GaN layer, and the second waveguide layer may be formed of a p-GaN layer.
- the active layer 57 may be formed of any material having a small threshold current value and stable transverse mode properties.
- the active layer 57 is formed of an AlGaN layer containing Al in a predetermined ratio.
- the second compound semiconductor layer 55 is formed on the top surface of the active layer 57 .
- a second cladding layer (not shown) having a smaller refractive index than the second waveguide layer may be additionally formed between the second compound semiconductor layer 55 and the active layer 57 .
- This second cladding layer is formed of a p-type compound semiconductor layer when the first cladding layer is formed of a n-type compound semiconductor layer, and is formed of a p-type compound semiconductor layer when the first cladding layer is formed of a p-type compound semiconductor layer.
- the first cladding layer is formed of a n-AlGaN/GaN layer
- the second cladding layer is formed of a p-AlGaN/GaN layer.
- a pair of n-type electrodes 54 are laid on the two stepped regions of the first compound semiconductor layer 53 , and the p-type electrode 52 is laid on the top surface of the second compound semiconductor layer 55 , via which electrons and holes are injected into the first compound semiconductor layer 53 and the second compound semiconductor layer 55 , respectively.
- the injected electrons and holes combine together and disappear in the active layer 57 to oscillate light of a short-wavelength band.
- the color of emitted light varies depending on the wavelength band.
- the wavelength band of light is determined by the energy width between the conduction band and valence band of the material used to form the light emitting diode 50 .
- III-V nitrides are commonly used to form semiconductor material layers emitting blue, green, and UV light.
- GaN-based semiconductor materials among III-V nitrides are used to enable the active layer 57 to generate blue light of a wavelength of 420-470 nm or UV light and the generated blue light to be transmitted through a fluorescent layer 59 deposited on the back surface of the substrate 51 .
- a portion of the generated blue light is absorbed in the fluorescent layer 59 and emitted as light of a different wavelength band from the original blue light, for example, yellow light, and the non-absorbed blue light is emitted as blue light having the original wavelength.
- a fluorescent material capable of converting the blue light to yellow light
- a garnet fluorescent material activated with cerium (Ce) including at least one element selected from the group consisting of yttrium (Y), lutetium (Lu), scandium (Sc), lanthanum (La), gadolinium (Gd), and samarium (Sm), and at least one element selected from the group consisting of aluminum (Al), gallium (Ga), and indium (In) may be used.
- two kinds of fluorescent materials selected from the Y group may be used together in non-equal amounts.
- a portion of Y may be substituted by Gd.
- suitable fluorescent materials capable of converting the blue light to red light of a wavelength of 610-625 nm include Y 2 O 2 S:Eu 3+ ,Bi 3+ ; YVO 4 :Eu 3+ ,Bi 3+ ; SrS:Eu 2+ ; SrY 2 S 4 :Eu 2+ ; CaLa 2 S 4 :Ce 3+ ; (Ca, Sr)S:Eu 2+ and the like.
- Suitable fluorescent materials capable of converting the blue light to green light of a wavelength of 530-555 nm include YBO 3 :Ce 3+ ,Tb 3+ ; BaMgAl 10 O 17 :Eu 2+ ,Mn 2+ ; (Sr,Ca,Ba)(Al,Ga) 2 S 4 :Eu 2+ and the like. Any fluorescent material emitting red light or green light may be used.
- UV light generated in the active layer 57 is converted to red, green, and blue light while propagating through the fluorescent layer 59 and finally emitted from the light emitting
- the thickness of the fluorescent layer 59 is larger at the etched hole 56 a than at the peripheral region 56 b.
- light generated in the active layer 57 is absorbed more by the fluorescent material while propagating through the thicker region of the fluorescent layer 59 a than through the thinner region corresponding to the peripheral region 56 b so that a larger amount of light whose wavelength band is shifted compared to the original light is emitted.
- the thickness of the fluorescent layer 57 is appropriately varied in the present invention in order to emit light of a desired wavelength band.
- luminescence can be enhanced by changing the shape of the etched hole 56 a of the substrate 51 .
- the sloping angle and the bottom curvature of the etched hole 56 a may be varied in order to control the amount of light incident on the fluorescent layer 59 through the substrate.
- FIG. 4 is a sectional view of a light emitting diode according to a second embodiment of the present invention with a plurality of etched holes.
- the back surface of the substrate 61 is etched to form a plurality of etched holes 66 a, and a fluorescent layer 69 is formed to fill over the etched holes 66 a in the substrate 61 , so that the structure of a light emitting diode as shown in FIG. 4 is obtained.
- Blue light or UV light generated in an active layer 67 of a semiconductor material layer 65 is transmitted through the substrate 62 and enters the fluorescent layer 69 . Since the fluorescent layer 69 has a larger thickness at the etched holes 66 a than at peripheral regions 66 b , light incident on the etched holes 66 a and propagating through the thicker region of the fluorescent layer 69 is likely to excite and absorb more fluorescent grains present in the fluorescent layer 69 , compared with light propagating through the peripheral regions 66 b.
- the blue light or UV light generated in the active layer 67 is highly likely to be converted to yellow light, or red, green and blue light having a different wavelength from the original blue or UV light while propagating through the thicker region of the fluorescent layer 69 , where the etched holes 66 a are formed. Also, light propagating through the thinner region of the fluorescent layer 69 , where the peripheral regions 66 b are formed, is highly likely to be emitted as the original blue or UV light, without shifting in wavelength band.
- the thickness of the fluorescent layer 69 can be adjusted to different levels by appropriately varying the number and the depth of etched holes 66 a. As a result, light generated in the active region 67 of the semiconductor material layer 65 is converted to light of wavelength bands different from the original light while propagating through the fluorescent layer 69 , so that homogeneous white light can be emitted from the light emitting diode.
- reference numeral 62 denotes a p-type electrode
- reference numeral 64 denotes an n-type electrode.
- the material, properties, and function of the compound semiconductor layers constituting the light emitting diode of FIG. 4 are the same as those of the light emitting diode according to the first embodiment described above.
- FIG. 5 is a sectional view showing the structure of a light emitting diode according to a third embodiment of the present invention.
- a substrate 71 has a uniform thickness: A first fluorescent layer 79 a is deposited on the back surface of the substrate 71 , and a second fluorescent layer 79 b is formed on a region of the first fluorescent layer 79 a . Accordingly, the entire fluorescent layer, including the first and second fluorescent layers 79 a and 79 b, has controlled varied thicknesses.
- Reference numeral 72 denotes a p-type electrode
- reference numeral 74 denotes an n-type electrode
- reference numeral 75 denotes a semiconductor material layer.
- FIG. 6 is a sectional view showing the structure of a light emitting diode according to a fourth embodiment of the present invention.
- a substrate 81 has a uniform thickness.
- a first fluorescent layer 89 a is deposited on the back surface of the substrate 81 , and a plurality of second fluorescent layers 89 b are formed on the first fluorescent layer 89 a as stripes. Accordingly, the entire fluorescent layer, including the first and second fluorescent layers 89 a and 89 b, has controlled varied thicknesses.
- Reference numeral 82 denotes a p-type electrode
- reference numeral 84 denotes an n-type electrode
- reference numeral 85 denotes a semiconductor material layer.
- a plurality of second fluorescent layers 89 a may be formed as dots.
- the material, properties, and function of the compound semiconductor layer constituting each of the light emitting diodes are the same as those of the light emitting diode according to the first embodiment of the present invention.
- the principles of emitting white light using the fluorescent layers 79 a ( 89 a ) and 79 b ( 89 b ) having controlled varied thicknesses are similar to those as in the first embodiment.
- the fluorescent layer having controlled varied thicknesses is implemented by etching the substrate in the light emitting diodes according to the first and second embodiments of the present invention
- the fluorescent layer having controlled varied thicknesses is implemented using two separate fluorescent layers 79 a ( 89 a ) and 79 b ( 89 b ).
- the blue or UV light generated in the active layer 77 ( 87 ) of the semiconductor material layer 75 ( 85 ) propagates through both of the first and second fluorescent layers 79 a ( 89 a ) and 79 b ( 89 b )
- the blue or UV light is highly likely to be shifted in wavelength band and emitted as yellow light or red, green, and blue light, compared with blue or UV light propagating only through the first fluorescent layer 79 a ( 89 a ).
- the light emitting diodes according to the first through fourth embodiments of the present invention described above are for illustrative purposes and, therefore, the shape and number of etched holes and the thickness and the shape of the fluorescent layer may be variously changed.
- FIGS. 7A through 7D are sectional views illustrating a first embodiment of a method for fabricating light emitting diodes according to the present invention.
- a first compound semiconductor layer 53 , an active layer 57 , and a second compound semiconductor layer 55 are deposited in sequence on the top surface of a substrate 51 , and the first compound semiconductor layer 53 is patterned by photolithography to form a step in the first compound semiconductor layer 53 .
- N-type electrodes 54 are laid on the patterned surface of the first compound semiconductor layer 53 as stripes, and p-type electrodes 52 are laid on the top surface of the second compound semiconductor layer 55 .
- etched holes 56 b which are filled with a fluorescent layer 59 later, are formed in the back surface of the substrate 51 by dry etching.
- the back surface of the substrate 51 Prior to etching the substrate 51 , the back surface of the substrate 51 is processed by grinding, lapping, or polishing.
- a mask layer (not shown) is formed on the back surface of the substrate 51 and patterned into a mask pattern corresponding to the etched holes 56 a.
- the back surface of the substrate 51 is etched using at least one gas selected from the group consisting of Cl 2 , BCl 3 , Ar, O 2 , and HBr, with the mask pattern serving as an etch mask, so that the etched holes 56 are formed as shown in FIG. 7B .
- FIGS. 9A and 9B show etched holes formed in sapphire substrates by etching.
- Etched holes 56 c of FIG. 9A are relatively wide and shallow, and etched holes 56 d of FIG. 9B are relatively narrow and deep.
- the depth and width of the etched holes 56 c ( 56 d ) are determined in consideration of the thickness of the fluorescent layer deposited therein. For example, the back surface of a sapphire substrate is etched such that the resulting etched holes 56 c ( 56 d ) have a depth of about 50 ⁇ m and a width of 250-500 ⁇ m.
- a fluorescent material is applied to the etched holes 56 a and the peripheral regions 56 b by disposing or spin coating to form the fluorescent layer 59 , as shown in FIG. 7C .
- a light emitting diode structure 58 is formed.
- the fluorescent layer 59 can be uniformly deposited over the entire substrate 51 through a single process. Therefore, the overall process for fabricating light emitting layer diodes is simple.
- FIGS. 10A and 10B are photographs of light emitting diodes with yttrium-aluminum-garnet (YAG) fluorescent layers 59 c and 59 d formed by applying a fluorescent material to fill the etched holes 56 c and 56 d in the back surface of the substrates of FIGS. 9A and 9B , respectively.
- YAG fluorescent layers 59 c and 59 d in the etched holes appear white.
- the light emitting diode structure is cut, at connection regions with two adjacent n-type electrodes 54 , into a plurality of light emitting diodes 50 .
- FIGS. 8A through 8E are sectional views illustrating a second embodiment of the method for fabricating light emitting diodes according to an embodiment of the present invention.
- a first compound semiconductor layer 73 , an active layer 77 , and a second compound semiconductor layer 75 are deposited in sequence on the top surface of a substrate 71 , and the first compound semiconductor layer 73 is patterned by photolithography to form a step in the first compound semiconductor layer 73 .
- N-type electrodes 74 are laid on the patterned surface of the first compound semiconductor layer 73 as stripes, and p-type electrodes 72 are laid on the top surface of the second compound semiconductor layer 75 .
- a fluorescent material is applied to the back surface of the substrate 71 by disposing or spin coating to form a first fluorescent layer 79 a.
- a mask 76 having a predetermined pattern is placed on the first fluorescent layer 79 a, and the fluorescent material is applied to form a second fluorescent layer 79 b on the first fluorescent layer 79 a.
- a light emitting diode structure with a fluorescent layer, including the first and second fluorescent layers 79 a and 79 b, having controlled varied thicknesses is formed, as shown in FIG. 8D .
- the light emitting diode structure is cut into a plurality of light emitting diodes 50 , thereby completing the fabrication of desired light emitting diodes 50 .
- a light emitting diode according to the present invention is fabricated with a fluorescent layer having controlled varied thicknesses, wherein the fluorescent layer having controlled varied thicknesses may be formed by etching a substrate to controlled varied thicknesses and applying a fluorescent material to the etched surface of the substrate. Alternatively, the fluorescent layer having controlled varied thicknesses may be formed by depositing a fluorescent material to controlled varied thicknesses on a substrate having a uniform thickness. In the light emitting diode according to the present invention, light generated in an active layer is shifted in wavelength while passing through the fluorescent layer having controlled varied thicknesses.
- the ratio of light whose wavelength band is shifted while propagating through the fluorescent layer and the original light generated in the active layer can be controlled by varying the thickness of the fluorescent layer so that desired homogeneous white light can be emitted from the light emitting diode according to the present invention.
- a method for fabricating light emitting diodes according to the present invention which involves simple processes, for example, etching the back surface of a substrate or applying a fluorescent material over the substrate by disposing or spin coating, is suitable for mass production.
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Led Devices (AREA)
- Led Device Packages (AREA)
- Luminescent Compositions (AREA)
Abstract
Description
- This application is a continuation of U.S. patent application Ser. No. 14/597,951, filed Jan. 15, 2015, which is a continuation of U.S. patent application Ser. No. 13/471,154, filed May 14, 2012, now U.S. Pat. No. 8,952,389, which is a continuation of U.S. patent application Ser. No. 10/445,992, filed May 28, 2003, now U.S. Pat. No. 8,399,944, which claims priority from Korean Patent Application No. 10-2002-0052462, filed on Sep. 2, 2002, the disclosures of which are incorporated herein by reference in their entirety.
- The present invention relates to a light emitting diode and a method for fabricating the same, and more particularly, to a light emitting diode capable of emitting light with a homogeneous color profile and a method for fabricating the same.
-
FIG. 1 is a sectional view of a conventional light emitting diode emitting white light. Referring toFIG. 1 , a blue-light emitting diode 2 is located inside a lead frame 1, with wires 3 connected to the top surface thereof via ohmic contact and to the lead frame 1 to supply electricity. The inner space of the lead frame 1 is filled with a phosphor 6 so that blue light emitted from the blue-light emitting diode 2 is converted to red or green light or and then to white light by being mixed up with the red or green light. - However, such a conventional blue-
light emitting diode 2 cannot emit homogeneous white light profile and tends to emit light of wavelengths different from the wavelength of white light or conical light with a yellow or blue light ring. - Various solutions to this problem have been suggested. For example, according to a light emitting diode disposed in U.S. Pat. No. 5,813,753, as shown in FIG. 2, a light emitting diode 11 is provided in a cup-
shaped header 12. Amirror 13 is formed on the inner wall of theheader 12 to reflect light emitted from the light emitting diode 11. The inner space of theheader 12 is filled with atransparent material 15 containingphosphor grains 14 dispersed around the light emitting diode 11. Aglass plate 16 is placed on the top of theheader 12 to prevent light which is not absorbed by thephosphor grains 14 from being emitted into the air. A low-wave pass (LWP) filter is further placed on the front side of the light emitting diode 11 to pass short-wavelength light more efficiently than long-wavelength light. - However, in manufacturing such conventional light emitting diodes, it is difficult to control the amount of phosphor grains that is necessary to emit light of desired wavelength bands. A transparent material containing phosphor grains should be deposited for individual light emitting diodes. Accordingly, a great chromatic difference between the separate light emitting diodes occurs, and the manufacturing time increases.
- EP O 855 751 A2 discloses an organic/inorganic semiconductor light emitting diode emitting red light and blue light that is manufactured by appropriately doping a green phosphor layer. However, it is difficult to uniformly dope the phosphor layer to an appropriate ion concentration to obtain light of a uniform color profile.
- The present invention provides a light emitting diode with a fluorescent layer having controlled varied thicknesses, wherein the thickness of the fluorescent layer can be appropriately adjusted to enable the light emitting diode to emit light of a desired wavelength band, and a simple method for fabricating the same.
- According to an aspect of the present invention, there is provided a light emitting diode comprising: a substrate which transmits light; a semiconductor material layer formed on the top surface of a substrate with an active layer generating light; and a fluorescent layer formed on the back surface of the substrate with controlled varied thicknesses. The substrate may have at least one etched hole formed by etching the back surface of the substrate to controlled varied thicknesses. The fluorescent layer may be formed as dual layers with controlled varied thicknesses. It is preferable that the substrate is a sapphire substrate.
- In an embodiment of the light emitting diode according to the present invention, the semiconductor material layer may comprise: a first compound semiconductor layer deposited on the top surface of the substrate; the active layer deposited on the top surface of the first compound semiconductor layer; and a second compound semiconductor layer deposited on the top surface of the active layer. In this case, the first compound semiconductor layer may be an n-type doped or undoped GaN-based III-V nitride compound semiconductor layer. The second compound semiconductor layer may be a p-type doped GaN-based III-V nitride compound semiconductor layer. The active layer may be an n-type doped or undoped InxAlyGa1−x−yN compound semiconductor layer where 0≤x≤1, 0≤y≤1, and x+y≤1.
- In a light emitting diode according to the present invention, the active layer generates blue light, and the fluorescent layer converts a portion of the blue light to yellow light to emit white light from the light emitting diode. In this case, the fluorescent layer may be formed of a fluorescent material including a garnet fluorescent material activated with cerium containing at least one element selected from the group consisting of yttrium, lutetium, scandium, lanthanum, gadolinium, and samarium, and at least one element selected from the group consisting of aluminum, gallium, and indium.
- Alternatively, the active layer may generate UV light, and the fluorescent layer may convert the UV light to red, green, and blue light by absorbing the UV light, to emit white light from the light emitting diode. In this case, the fluorescent layer may be formed of a fluorescent material containing a red phosphor selected from the group consisting of Y2O3Eu3+Bi3 and Y2O2S, a green phosphor selected from the group consisting of (Ba1−x−y−zCaxSryEuz)(Mg1−wZnw)Si2O7 and ZnS:Cu, and a blue phosphor selected from the group consisting of (Sr, Ba,Ca)5(PO4)3Cl:Eu2+) (SECA), BaMg2Al16O27:Eu2+ (BAM), and BaMgAl10O17:Eu3+.
- The present invention provides a light emitting diode with a fluorescent layer having controlled varied thicknesses that can be implemented by etching the back surface of a substrate or by depositing a fluorescent material on the back surface to controlled varied thicknesses. According to the present invention, the emission ratio of original blue light generated in an active layer and light absorbed by the fluorescent layer and converted to yellow light from the blue light can be controlled by appropriately adjusting the thickness of the fluorescent layer, to emit homogeneous white light from the light emitting diode. When the active layer generates UV light, the emission ratio of the original UV light and light absorbed by the fluorescent layer and converted to red, green, and blue light from the UV light can be controlled to emit homogeneous white light from the light emitting diode.
- The above and other features and advantages of the present invention will become more apparent by describing in detail exemplary embodiments thereof with reference to the attached drawings in which:
-
FIG. 1 is a sectional view of a conventional white-light emitting diode; -
FIG. 2 is a sectional view of a light emitting diode disclosed in U.S. Pat. No. 5,813,753; -
FIG. 3 is a sectional view of a light emitting diode according to a first embodiment of the present invention; -
FIG. 4 is a sectional view of a light emitting diode according to a second embodiment of the present invention; -
FIG. 5 is a sectional view of a light emitting diode according to a third embodiment of the present invention; -
FIG. 6 is a sectional view of a light emitting diode according to a fourth embodiment of the present invention; -
FIGS. 7A through 7D are sectional views illustrating a first embodiment of a method for manufacturing light emitting diodes according to the present invention; -
FIGS. 8A through 8E are sectional views illustrating a second embodiment of the method for manufacturing light emitting diodes according to the present invention; -
FIGS. 9A and 9B are photographs showing etched substrates of light emitting diodes according to the first embodiment of the present invention; and -
FIGS. 10A and 10B are photographs showing the back surface of the substrates ofFIGS. 9A and 9B , respectively, with fluorescent layers. - Embodiments of a light emitting diode and a method for fabricating the same will be described in detail.
- Referring to
FIG. 3 , which is a sectional view showing the structure of a light emitting diode according to an embodiment of the present invention, alight emitting diode 50 includes asubstrate 51, and a firstcompound semiconductor layer 53, anactive layer 57, and a secondcompound semiconductor layer 55, which are sequentially deposited on the top surface of thesubstrate 51. An n-type electrode 54 is placed in a stepped region of the firstcompound semiconductor layer 53, and a p-type electrode 52 is placed on the top surface of the secondcompound semiconductor layer 55, to supply electrons and holes into theactive layer 57. - The
substrate 51 is made of a durable substance, mostly such as sapphire. The back surface of thesubstrate 51 is etched to reduce the thickness of thesubstrate 51 in certain areas. Here, it is preferable to form an etchedhole 56 a in the back surface of thesubstrate 51 by etching. In this case, the thickness of thesubstrate 51 is larger at aperipheral region 56 b than at the etchedhole 56 a. The different thicknesses of thesubstrate 51 enable afluorescent layer 59 to be deposited to controlled varied thicknesses onto the back surface of thesubstrate 51 by spin coating. - The first
compound semiconductor layer 53 is a GaN-based III-V nitride semiconductor layer, and preferably, is a direct transition type. In the case of doping the first compound semiconductor with conductive impurities, a GaN layer is preferable for the firstcompound semiconductor layer 53. In either case, it is preferable that the firstcompound semiconductor layer 53 is formed of the same maternal as the secondcompound semiconductor layer 55. A first cladding layer (not shown) may be further formed on the top surface of the firstcompound semiconductor layer 53. Preferably, the first cladding layer may be formed of an n-AlGaN/GaN layer having a predetermined refractive index. However, the first cladding layer may be formed of a compound semiconductor layer different from the n-AlGaN/GaN layer. - The second
compound semiconductor layer 55 is a GaN-based III-V nitride semiconductor layer, and preferably, is a direct transition type doped with p-type conductive impurities, and most preferably, is a p-GaN layer. In the case of undoping the secondcompound semiconductor layer 55, a GaN layer or a AlGaN layer or InGaN layer containing Al or In, respectively, in a predetermined ratio may be used for the secondcompound semiconductor layer 55. - The
active layer 57 is formed on the top surface of the firstcompound semiconductor layer 53. Theactive layer 57 is a material layer where light is generated by the recombination of electrons and carrier holes. Preferably, theactive layer 57 is a GaN-based III-V nitride semiconductor layer with a multiple quantum-well (MQW) structure. More preferably, theactive layer 57 is formed of a InxAlyGa1−x−yN, where 0≤x≤1, 0≤y≤1 and x+y≤1, with a MQW structure. - First and second waveguide layers (not shown) may be further formed on and underneath the
active layer 57, respectively, to amplify light emitted from theactive layer 57 and emit light from the LED with enhanced intensity. The first and second waveguide layers are formed of a smaller refractive index material than theactive layer 57, and preferably, for example, a GaN-based III-V compound semiconductor layer. The first waveguide layer may be formed of a n-GaN layer, and the second waveguide layer may be formed of a p-GaN layer. Theactive layer 57 may be formed of any material having a small threshold current value and stable transverse mode properties. Preferably, theactive layer 57 is formed of an AlGaN layer containing Al in a predetermined ratio. - The second
compound semiconductor layer 55 is formed on the top surface of theactive layer 57. A second cladding layer (not shown) having a smaller refractive index than the second waveguide layer may be additionally formed between the secondcompound semiconductor layer 55 and theactive layer 57. This second cladding layer is formed of a p-type compound semiconductor layer when the first cladding layer is formed of a n-type compound semiconductor layer, and is formed of a p-type compound semiconductor layer when the first cladding layer is formed of a p-type compound semiconductor layer. For example, when the first cladding layer is formed of a n-AlGaN/GaN layer, the second cladding layer is formed of a p-AlGaN/GaN layer. - A pair of n-
type electrodes 54 are laid on the two stepped regions of the firstcompound semiconductor layer 53, and the p-type electrode 52 is laid on the top surface of the secondcompound semiconductor layer 55, via which electrons and holes are injected into the firstcompound semiconductor layer 53 and the secondcompound semiconductor layer 55, respectively. The injected electrons and holes combine together and disappear in theactive layer 57 to oscillate light of a short-wavelength band. The color of emitted light varies depending on the wavelength band. The wavelength band of light is determined by the energy width between the conduction band and valence band of the material used to form thelight emitting diode 50. - III-V nitrides are commonly used to form semiconductor material layers emitting blue, green, and UV light. In the present invention, specifically, GaN-based semiconductor materials among III-V nitrides are used to enable the
active layer 57 to generate blue light of a wavelength of 420-470 nm or UV light and the generated blue light to be transmitted through afluorescent layer 59 deposited on the back surface of thesubstrate 51. A portion of the generated blue light is absorbed in thefluorescent layer 59 and emitted as light of a different wavelength band from the original blue light, for example, yellow light, and the non-absorbed blue light is emitted as blue light having the original wavelength. - Various kinds of fluorescent materials may be selectively used depending on the wavelength band of desired light to emit. When a light emitting diode is formed of a nitride semiconductor material emitting blue light, as a fluorescent material capable of converting the blue light to yellow light, a garnet fluorescent material activated with cerium (Ce) including at least one element selected from the group consisting of yttrium (Y), lutetium (Lu), scandium (Sc), lanthanum (La), gadolinium (Gd), and samarium (Sm), and at least one element selected from the group consisting of aluminum (Al), gallium (Ga), and indium (In) may be used. To control the wavelength of emitted light, in a mixture of Y group, Al group, and garnet fluorescent materials, two kinds of fluorescent materials selected from the Y group may be used together in non-equal amounts. For example, a portion of Y may be substituted by Gd.
- In a light emitting diode with an active layer emitting blue light of a wavelength of 420-470 nm, suitable fluorescent materials capable of converting the blue light to red light of a wavelength of 610-625 nm include Y2O2S:Eu3+,Bi3+; YVO4:Eu3+,Bi3+; SrS:Eu2+; SrY2S4:Eu2+; CaLa2S4:Ce3+; (Ca, Sr)S:Eu2+ and the like. Suitable fluorescent materials capable of converting the blue light to green light of a wavelength of 530-555 nm include YBO3:Ce3+,Tb3+; BaMgAl10O17:Eu2+,Mn2+; (Sr,Ca,Ba)(Al,Ga)2S4:Eu2+ and the like. Any fluorescent material emitting red light or green light may be used.
- When a light emitting diode is formed of a nitride semiconductor material emitting UV light, a fluorescent material containing a red phosphor, such as Y2O3Eu3+Bi3+ and Y2O2S, a green phosphor, such as (Ba1−x−y−zCaxSryEuz)(Mg1−wZnw)Si2O7 and ZnS:Cu, and a blue phosphor, such as (Sr,Ba,Ca)5(PO4)3Cl:Eu2+) (SECA), BaMg2Al16O27:Eu2+ (BAM), and BaMgAl10O17:Eu3+, is used for the
fluorescent layer 59 formed on the etched back surface of the substrate having controlled varied thicknesses. In this case, UV light generated in theactive layer 57 is converted to red, green, and blue light while propagating through thefluorescent layer 59 and finally emitted from the light emitting diode as white light. - In the present invention, as shown in
FIG. 3 , since the back surface of thesubstrate 51 has the etchedhole 56 a, which is filled with the fluorescent layer 56, the thickness of thefluorescent layer 59 is larger at the etchedhole 56 a than at theperipheral region 56 b. As a result, light generated in theactive layer 57 is absorbed more by the fluorescent material while propagating through the thicker region of the fluorescent layer 59 a than through the thinner region corresponding to theperipheral region 56 b so that a larger amount of light whose wavelength band is shifted compared to the original light is emitted. - While the wavelength of emitted light is controlled using fluorescent materials in conventional light emitting diodes, the thickness of the
fluorescent layer 57 is appropriately varied in the present invention in order to emit light of a desired wavelength band. Alternatively, luminescence can be enhanced by changing the shape of the etchedhole 56 a of thesubstrate 51. For example, the sloping angle and the bottom curvature of the etchedhole 56 a may be varied in order to control the amount of light incident on thefluorescent layer 59 through the substrate. -
FIG. 4 is a sectional view of a light emitting diode according to a second embodiment of the present invention with a plurality of etched holes. - Referring to
FIG. 4 , the back surface of thesubstrate 61 is etched to form a plurality of etchedholes 66 a, and afluorescent layer 69 is formed to fill over the etchedholes 66 a in thesubstrate 61, so that the structure of a light emitting diode as shown inFIG. 4 is obtained. - Blue light or UV light generated in an
active layer 67 of asemiconductor material layer 65 is transmitted through thesubstrate 62 and enters thefluorescent layer 69. Since thefluorescent layer 69 has a larger thickness at the etchedholes 66 a than atperipheral regions 66 b, light incident on the etchedholes 66 a and propagating through the thicker region of thefluorescent layer 69 is likely to excite and absorb more fluorescent grains present in thefluorescent layer 69, compared with light propagating through theperipheral regions 66 b. In other words, the blue light or UV light generated in theactive layer 67 is highly likely to be converted to yellow light, or red, green and blue light having a different wavelength from the original blue or UV light while propagating through the thicker region of thefluorescent layer 69, where the etchedholes 66 a are formed. Also, light propagating through the thinner region of thefluorescent layer 69, where theperipheral regions 66 b are formed, is highly likely to be emitted as the original blue or UV light, without shifting in wavelength band. - The thickness of the
fluorescent layer 69 can be adjusted to different levels by appropriately varying the number and the depth of etchedholes 66 a. As a result, light generated in theactive region 67 of thesemiconductor material layer 65 is converted to light of wavelength bands different from the original light while propagating through thefluorescent layer 69, so that homogeneous white light can be emitted from the light emitting diode. - In
FIG. 4 ,reference numeral 62 denotes a p-type electrode, andreference numeral 64 denotes an n-type electrode. The material, properties, and function of the compound semiconductor layers constituting the light emitting diode ofFIG. 4 are the same as those of the light emitting diode according to the first embodiment described above. -
FIG. 5 is a sectional view showing the structure of a light emitting diode according to a third embodiment of the present invention. Referring toFIG. 5 , asubstrate 71 has a uniform thickness: Afirst fluorescent layer 79 a is deposited on the back surface of thesubstrate 71, and asecond fluorescent layer 79 b is formed on a region of thefirst fluorescent layer 79 a. Accordingly, the entire fluorescent layer, including the first and second fluorescent layers 79 a and 79 b, has controlled varied thicknesses.Reference numeral 72 denotes a p-type electrode,reference numeral 74 denotes an n-type electrode, andreference numeral 75 denotes a semiconductor material layer. -
FIG. 6 is a sectional view showing the structure of a light emitting diode according to a fourth embodiment of the present invention. Referring toFIG. 6 , asubstrate 81 has a uniform thickness. Afirst fluorescent layer 89 a is deposited on the back surface of thesubstrate 81, and a plurality of second fluorescent layers 89 b are formed on thefirst fluorescent layer 89 a as stripes. Accordingly, the entire fluorescent layer, including the first and second fluorescent layers 89 a and 89 b, has controlled varied thicknesses.Reference numeral 82 denotes a p-type electrode,reference numeral 84 denotes an n-type electrode, andreference numeral 85 denotes a semiconductor material layer. Alternatively, a plurality of second fluorescent layers 89 a may be formed as dots. - In the above-described third and fourth embodiments, the material, properties, and function of the compound semiconductor layer constituting each of the light emitting diodes are the same as those of the light emitting diode according to the first embodiment of the present invention. The principles of emitting white light using the fluorescent layers 79 a (89 a) and 79 b (89 b) having controlled varied thicknesses are similar to those as in the first embodiment. Although the fluorescent layer having controlled varied thicknesses is implemented by etching the substrate in the light emitting diodes according to the first and second embodiments of the present invention, in the light emitting diodes according to the third and fourth embodiments of the present invention, the fluorescent layer having controlled varied thicknesses is implemented using two separate fluorescent layers 79 a (89 a) and 79 b (89 b).
- In the light emitting diodes according to the third and fourth embodiments of the present invention, when blue or UV light generated in the active layer 77 (87) of the semiconductor material layer 75 (85) propagates through both of the first and second fluorescent layers 79 a (89 a) and 79 b (89 b), the blue or UV light is highly likely to be shifted in wavelength band and emitted as yellow light or red, green, and blue light, compared with blue or UV light propagating only through the
first fluorescent layer 79 a (89 a). In other words, it is possible to generate homogeneous white light by appropriately varying the thickness and the number of patterns constituting thesecond fluorescent layer 79 b (89 b). - The light emitting diodes according to the first through fourth embodiments of the present invention described above are for illustrative purposes and, therefore, the shape and number of etched holes and the thickness and the shape of the fluorescent layer may be variously changed.
-
FIGS. 7A through 7D are sectional views illustrating a first embodiment of a method for fabricating light emitting diodes according to the present invention. Referring toFIG. 7A , a firstcompound semiconductor layer 53, anactive layer 57, and a secondcompound semiconductor layer 55 are deposited in sequence on the top surface of asubstrate 51, and the firstcompound semiconductor layer 53 is patterned by photolithography to form a step in the firstcompound semiconductor layer 53. N-type electrodes 54 are laid on the patterned surface of the firstcompound semiconductor layer 53 as stripes, and p-type electrodes 52 are laid on the top surface of the secondcompound semiconductor layer 55. - Referring to
FIG. 7B , etchedholes 56 b, which are filled with afluorescent layer 59 later, are formed in the back surface of thesubstrate 51 by dry etching. Prior to etching thesubstrate 51, the back surface of thesubstrate 51 is processed by grinding, lapping, or polishing. A mask layer (not shown) is formed on the back surface of thesubstrate 51 and patterned into a mask pattern corresponding to the etchedholes 56 a. The back surface of thesubstrate 51 is etched using at least one gas selected from the group consisting of Cl2, BCl3, Ar, O2, and HBr, with the mask pattern serving as an etch mask, so that the etched holes 56 are formed as shown inFIG. 7B . -
FIGS. 9A and 9B show etched holes formed in sapphire substrates by etching.Etched holes 56 c ofFIG. 9A are relatively wide and shallow, and etchedholes 56 d ofFIG. 9B are relatively narrow and deep. The depth and width of the etchedholes 56 c (56 d) are determined in consideration of the thickness of the fluorescent layer deposited therein. For example, the back surface of a sapphire substrate is etched such that the resulting etchedholes 56 c (56 d) have a depth of about 50 μm and a width of 250-500 μm. - Referring to
FIG. 7C , after the etchedholes 56 a have been formed, a fluorescent material is applied to the etchedholes 56 a and theperipheral regions 56 b by disposing or spin coating to form thefluorescent layer 59, as shown inFIG. 7C . As a result, a light emitting diode structure 58 is formed. According to the present invention, thefluorescent layer 59 can be uniformly deposited over theentire substrate 51 through a single process. Therefore, the overall process for fabricating light emitting layer diodes is simple. -
FIGS. 10A and 10B are photographs of light emitting diodes with yttrium-aluminum-garnet (YAG) fluorescent layers 59 c and 59 d formed by applying a fluorescent material to fill the etchedholes FIGS. 9A and 9B , respectively. InFIGS. 10A and 10B , the YAG fluorescent layers 59 c and 59 d in the etched holes appear white. - Finally, as shown in
FIG. 7D , the light emitting diode structure is cut, at connection regions with two adjacent n-type electrodes 54, into a plurality oflight emitting diodes 50. -
FIGS. 8A through 8E are sectional views illustrating a second embodiment of the method for fabricating light emitting diodes according to an embodiment of the present invention. Referring toFIG. 8A , a firstcompound semiconductor layer 73, anactive layer 77, and a secondcompound semiconductor layer 75 are deposited in sequence on the top surface of asubstrate 71, and the firstcompound semiconductor layer 73 is patterned by photolithography to form a step in the firstcompound semiconductor layer 73. N-type electrodes 74 are laid on the patterned surface of the firstcompound semiconductor layer 73 as stripes, and p-type electrodes 72 are laid on the top surface of the secondcompound semiconductor layer 75. - Referring to
FIG. 8B , a fluorescent material is applied to the back surface of thesubstrate 71 by disposing or spin coating to form afirst fluorescent layer 79 a. Next, as shown inFIG. 8C , amask 76 having a predetermined pattern is placed on thefirst fluorescent layer 79 a, and the fluorescent material is applied to form asecond fluorescent layer 79 b on thefirst fluorescent layer 79 a. As a result, a light emitting diode structure with a fluorescent layer, including the first and second fluorescent layers 79 a and 79 b, having controlled varied thicknesses is formed, as shown inFIG. 8D . Finally, as shown inFIG. 8E , the light emitting diode structure is cut into a plurality oflight emitting diodes 50, thereby completing the fabrication of desiredlight emitting diodes 50. - A light emitting diode according to the present invention is fabricated with a fluorescent layer having controlled varied thicknesses, wherein the fluorescent layer having controlled varied thicknesses may be formed by etching a substrate to controlled varied thicknesses and applying a fluorescent material to the etched surface of the substrate. Alternatively, the fluorescent layer having controlled varied thicknesses may be formed by depositing a fluorescent material to controlled varied thicknesses on a substrate having a uniform thickness. In the light emitting diode according to the present invention, light generated in an active layer is shifted in wavelength while passing through the fluorescent layer having controlled varied thicknesses. The ratio of light whose wavelength band is shifted while propagating through the fluorescent layer and the original light generated in the active layer can be controlled by varying the thickness of the fluorescent layer so that desired homogeneous white light can be emitted from the light emitting diode according to the present invention. A method for fabricating light emitting diodes according to the present invention, which involves simple processes, for example, etching the back surface of a substrate or applying a fluorescent material over the substrate by disposing or spin coating, is suitable for mass production.
- While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it will be understood by those of ordinary skill in the art that various changes in form and details may be made therein without departing from the spirit and scope of the present invention as defined by the following claims.
Claims (21)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US15/868,649 US20180138356A1 (en) | 2002-09-02 | 2018-01-11 | Light emitting diode |
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2002-0052462A KR100499129B1 (en) | 2002-09-02 | 2002-09-02 | Light emitting laser diode and fabricatin method thereof |
KR10-2002-0052462 | 2002-09-02 | ||
US10/445,992 US8399944B2 (en) | 2002-09-02 | 2003-05-28 | Light emitting diode and method for fabricating the same |
US13/471,154 US8952389B2 (en) | 2002-09-02 | 2012-05-14 | Light emitting diode and method for fabricating the same |
US14/597,951 US9887315B2 (en) | 2002-09-02 | 2015-01-15 | Light emitting diode and method for fabricating the same |
US15/868,649 US20180138356A1 (en) | 2002-09-02 | 2018-01-11 | Light emitting diode |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US14/597,951 Continuation US9887315B2 (en) | 2002-09-02 | 2015-01-15 | Light emitting diode and method for fabricating the same |
Publications (1)
Publication Number | Publication Date |
---|---|
US20180138356A1 true US20180138356A1 (en) | 2018-05-17 |
Family
ID=31492929
Family Applications (5)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US10/445,992 Expired - Lifetime US8399944B2 (en) | 2002-09-02 | 2003-05-28 | Light emitting diode and method for fabricating the same |
US13/188,297 Expired - Lifetime US8536604B2 (en) | 2002-09-02 | 2011-07-21 | Light emitting diode and method for fabricating the same |
US13/471,154 Expired - Lifetime US8952389B2 (en) | 2002-09-02 | 2012-05-14 | Light emitting diode and method for fabricating the same |
US14/597,951 Expired - Lifetime US9887315B2 (en) | 2002-09-02 | 2015-01-15 | Light emitting diode and method for fabricating the same |
US15/868,649 Abandoned US20180138356A1 (en) | 2002-09-02 | 2018-01-11 | Light emitting diode |
Family Applications Before (4)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US10/445,992 Expired - Lifetime US8399944B2 (en) | 2002-09-02 | 2003-05-28 | Light emitting diode and method for fabricating the same |
US13/188,297 Expired - Lifetime US8536604B2 (en) | 2002-09-02 | 2011-07-21 | Light emitting diode and method for fabricating the same |
US13/471,154 Expired - Lifetime US8952389B2 (en) | 2002-09-02 | 2012-05-14 | Light emitting diode and method for fabricating the same |
US14/597,951 Expired - Lifetime US9887315B2 (en) | 2002-09-02 | 2015-01-15 | Light emitting diode and method for fabricating the same |
Country Status (5)
Country | Link |
---|---|
US (5) | US8399944B2 (en) |
EP (2) | EP3511989B1 (en) |
JP (3) | JP4856845B2 (en) |
KR (1) | KR100499129B1 (en) |
CN (1) | CN100541835C (en) |
Families Citing this family (451)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100499129B1 (en) | 2002-09-02 | 2005-07-04 | 삼성전기주식회사 | Light emitting laser diode and fabricatin method thereof |
TWI292961B (en) * | 2002-09-05 | 2008-01-21 | Nichia Corp | Semiconductor device and an optical device using the semiconductor device |
US7268370B2 (en) | 2003-06-05 | 2007-09-11 | Matsushita Electric Industrial Co., Ltd. | Phosphor, semiconductor light emitting device, and fabrication method thereof |
US7045223B2 (en) | 2003-09-23 | 2006-05-16 | Saint-Gobain Ceramics & Plastics, Inc. | Spinel articles and methods for forming same |
US7326477B2 (en) | 2003-09-23 | 2008-02-05 | Saint-Gobain Ceramics & Plastics, Inc. | Spinel boules, wafers, and methods for fabricating same |
WO2005037956A1 (en) * | 2003-10-21 | 2005-04-28 | Sumitomo Chemical Company, Limited | Fluorescent material and fluorescent material paste |
JP2005150675A (en) * | 2003-11-18 | 2005-06-09 | Itswell Co Ltd | Semiconductor light-emitting diode and its manufacturing method |
JP2005268770A (en) * | 2004-02-19 | 2005-09-29 | Matsushita Electric Ind Co Ltd | White light emitting element and white light source |
JP4864940B2 (en) * | 2004-02-19 | 2012-02-01 | パナソニック株式会社 | White light source |
KR100587020B1 (en) | 2004-09-01 | 2006-06-08 | 삼성전기주식회사 | High power light emitting diode package |
DE102004047727B4 (en) * | 2004-09-30 | 2018-01-18 | Osram Opto Semiconductors Gmbh | Luminescence diode chip with a converter layer and method for producing a luminescence diode chip with a converter layer |
US7462502B2 (en) * | 2004-11-12 | 2008-12-09 | Philips Lumileds Lighting Company, Llc | Color control by alteration of wavelength converting element |
JP4845370B2 (en) * | 2004-11-26 | 2011-12-28 | 京セラ株式会社 | Light emitting device and lighting device |
JP4614773B2 (en) * | 2005-01-11 | 2011-01-19 | パナソニック株式会社 | Semiconductor light emitting device |
US7919815B1 (en) | 2005-02-24 | 2011-04-05 | Saint-Gobain Ceramics & Plastics, Inc. | Spinel wafers and methods of preparation |
US20060231847A1 (en) * | 2005-04-15 | 2006-10-19 | Taiwan Oasis Technology Co., Ltd. | Multiple-wavelength light emitting diode and its light emitting chip structure |
TWI389337B (en) * | 2005-05-12 | 2013-03-11 | Panasonic Corp | Light-emitting device, display unit and lighting unit using the same, and method for manufacturing the same |
KR100665214B1 (en) * | 2005-06-14 | 2007-01-09 | 삼성전기주식회사 | Method of fabricating phosphor film, method of fbricating light emitting device using the same and light emitting device |
KR100646634B1 (en) * | 2005-06-24 | 2006-11-23 | 서울옵토디바이스주식회사 | Light emitting diode |
KR100612962B1 (en) * | 2005-06-29 | 2006-08-16 | 한국화학연구원 | White light emitting diode based on the mixing of the tri-color phosphors |
JP2007019099A (en) * | 2005-07-05 | 2007-01-25 | Sumitomo Electric Ind Ltd | Light-emitting device and its manufacturing method |
JP2007180111A (en) * | 2005-12-27 | 2007-07-12 | Showa Denko Kk | Light-emitting device |
US8441179B2 (en) * | 2006-01-20 | 2013-05-14 | Cree, Inc. | Lighting devices having remote lumiphors that are excited by lumiphor-converted semiconductor excitation sources |
KR100764386B1 (en) | 2006-03-20 | 2007-10-08 | 삼성전기주식회사 | Insulation structure for high thermal condition and its manufacturing method |
KR101229830B1 (en) * | 2006-04-14 | 2013-02-04 | 서울옵토디바이스주식회사 | Light emitting diode for an alternating current and method for fabricating the same |
WO2007122543A2 (en) * | 2006-04-26 | 2007-11-01 | Philips Intellectual Property & Standards Gmbh | Light delivery device with improved conversion element |
JP4228012B2 (en) | 2006-12-20 | 2009-02-25 | Necライティング株式会社 | Red light emitting nitride phosphor and white light emitting device using the same |
DE102007003785A1 (en) * | 2007-01-19 | 2008-07-24 | Merck Patent Gmbh | Emitter converter chip |
DE102007010244A1 (en) * | 2007-02-02 | 2008-08-07 | Osram Opto Semiconductors Gmbh | Arrangement and method for generating mixed light |
KR100862532B1 (en) * | 2007-03-13 | 2008-10-09 | 삼성전기주식회사 | Method of manufacturing light emitting diode package |
KR20090002835A (en) | 2007-07-04 | 2009-01-09 | 엘지전자 주식회사 | Nitride light emitting device and method of making the same |
US7905618B2 (en) | 2007-07-19 | 2011-03-15 | Samsung Led Co., Ltd. | Backlight unit |
WO2009016585A2 (en) * | 2007-08-02 | 2009-02-05 | Koninklijke Philips Electronics N.V. | Color conversion device |
CN101378103A (en) * | 2007-08-28 | 2009-03-04 | 富士迈半导体精密工业(上海)有限公司 | White light light-emitting device and manufacturing method thereof |
KR100891761B1 (en) | 2007-10-19 | 2009-04-07 | 삼성전기주식회사 | Semiconductor light emitting device, manufacturing method thereof and semiconductor light emitting device package using the same |
WO2009066206A1 (en) * | 2007-11-19 | 2009-05-28 | Koninklijke Philips Electronics N.V. | Light source and illumination system having a predefined external appearance |
WO2010002221A2 (en) | 2008-07-03 | 2010-01-07 | 삼성엘이디 주식회사 | A wavelength-converting light emitting diode (led) chip and led device equipped with chip |
CN102144307B (en) | 2008-07-03 | 2013-05-22 | 三星电子株式会社 | An LED package and a backlight unit comprising said LED package |
US8354665B2 (en) * | 2008-08-19 | 2013-01-15 | Lattice Power (Jiangxi) Corporation | Semiconductor light-emitting devices for generating arbitrary color |
KR20110053376A (en) * | 2008-09-04 | 2011-05-20 | 쓰리엠 이노베이티브 프로퍼티즈 컴파니 | Ii-vi mqw vcsel on a heat sink optically pumped by a gan ld |
CN102197499A (en) * | 2008-09-04 | 2011-09-21 | 3M创新有限公司 | Light source with improved monochromaticity |
EP2335331A1 (en) * | 2008-09-04 | 2011-06-22 | 3M Innovative Properties Company | Monochromatic light source |
KR20110048580A (en) * | 2008-09-04 | 2011-05-11 | 쓰리엠 이노베이티브 프로퍼티즈 컴파니 | Light sources with light blocking components |
WO2010027649A1 (en) * | 2008-09-04 | 2010-03-11 | 3M Innovative Properties Company | Monochromatic light source with high aspect ratio |
JP2010087292A (en) * | 2008-09-30 | 2010-04-15 | Toyoda Gosei Co Ltd | Light emitting element |
US8008683B2 (en) | 2008-10-22 | 2011-08-30 | Samsung Led Co., Ltd. | Semiconductor light emitting device |
WO2010056083A2 (en) | 2008-11-14 | 2010-05-20 | 삼성엘이디 주식회사 | Vertical/horizontal light-emitting diode for semiconductor |
JP5342867B2 (en) * | 2008-12-19 | 2013-11-13 | スタンレー電気株式会社 | Semiconductor light emitting device and driving method |
TWI449221B (en) * | 2009-01-16 | 2014-08-11 | Everlight Electronics Co Ltd | Led packging structure and fabricating method thereof |
KR101607306B1 (en) | 2009-08-21 | 2016-03-29 | 삼성전자주식회사 | Light emitting diode integrated with lens, line printer head, and method of fabricating the light emitting diode |
KR101650840B1 (en) | 2009-08-26 | 2016-08-24 | 삼성전자주식회사 | Light emitting device and method of manufacturing the same |
US20110062468A1 (en) * | 2009-09-11 | 2011-03-17 | Koninklijke Philips Electronics N.V. | Phosphor-converted light emitting diode device |
US8104908B2 (en) | 2010-03-04 | 2012-01-31 | Xicato, Inc. | Efficient LED-based illumination module with high color rendering index |
CN102208514A (en) * | 2010-03-29 | 2011-10-05 | 海洋王照明科技股份有限公司 | Integrated illuminating part and preparation method thereof |
KR101051326B1 (en) * | 2010-04-23 | 2011-07-22 | 주식회사 세미콘라이트 | Compound semiconductor light emitting device |
KR20110130851A (en) | 2010-05-28 | 2011-12-06 | 삼성전자주식회사 | Light emitting device, light emitting system comprising the same, and method of fabricating thereof |
KR101252032B1 (en) | 2010-07-08 | 2013-04-10 | 삼성전자주식회사 | Semiconductor light emitting device and method of manufacturing the same |
KR101313262B1 (en) | 2010-07-12 | 2013-09-30 | 삼성전자주식회사 | Chemical Vapor Deposition Apparatus and Method of Forming Semiconductor Thin Film Using The Same |
KR101692410B1 (en) | 2010-07-26 | 2017-01-03 | 삼성전자 주식회사 | Light emitting device and method of manufacturing the same |
DE112011102800T8 (en) | 2010-08-25 | 2013-08-14 | Samsung Electronics Co., Ltd. | Phosphor film, method for producing the same, coating method for a phosphor layer, method of manufacturing an LED package and LED package manufactured thereby |
KR20120027987A (en) | 2010-09-14 | 2012-03-22 | 삼성엘이디 주식회사 | Gallium nitride based semiconductor device and method of manufacturing the same |
KR101710159B1 (en) | 2010-09-14 | 2017-03-08 | 삼성전자주식회사 | Group III nitride nanorod light emitting device and Manufacturing method for the same |
KR20120032329A (en) | 2010-09-28 | 2012-04-05 | 삼성전자주식회사 | Semiconductor device |
CN102044624B (en) * | 2010-09-30 | 2012-03-21 | 比亚迪股份有限公司 | Light-emitting device (LED) capable of emitting compound light, light-emitting element and manufacturing methods of LED and light-emitting element |
KR20120042500A (en) | 2010-10-25 | 2012-05-03 | 삼성엘이디 주식회사 | Semiconductor light emitting diode |
KR101726807B1 (en) * | 2010-11-01 | 2017-04-14 | 삼성전자주식회사 | Light Emitting Device |
KR20120050282A (en) | 2010-11-10 | 2012-05-18 | 삼성엘이디 주식회사 | Light emitting device package and method of manufacturing the same |
KR101182584B1 (en) * | 2010-11-16 | 2012-09-18 | 삼성전자주식회사 | Manufacturing appratus and manufacturing method of led package |
KR101591991B1 (en) | 2010-12-02 | 2016-02-05 | 삼성전자주식회사 | Light emitting device package and method thereof |
KR20120067153A (en) | 2010-12-15 | 2012-06-25 | 삼성엘이디 주식회사 | Light emitting device, light emitting device package, manufacturing method of light emitting device, and packaging method of light emitting device |
KR101748334B1 (en) | 2011-01-17 | 2017-06-16 | 삼성전자 주식회사 | Apparatus and method of fabricating white light emitting device |
KR20120088130A (en) * | 2011-01-31 | 2012-08-08 | 서울반도체 주식회사 | Light emitting device having wavelength converting layer and method of fabricating the same |
EP2503606B1 (en) | 2011-03-25 | 2020-02-26 | Samsung Electronics Co., Ltd. | Light Emitting Diode, Manufacturing Method Thereof, Light Emitting Diode Module, and Manufacturing Method Thereof |
KR101798884B1 (en) | 2011-05-18 | 2017-11-17 | 삼성전자주식회사 | Light emitting device assembly and head light including the same |
JP5772293B2 (en) * | 2011-06-28 | 2015-09-02 | 日亜化学工業株式会社 | Light emitting device and manufacturing method thereof |
CN102903705B (en) * | 2011-07-27 | 2015-02-04 | 展晶科技(深圳)有限公司 | Light emitting diode packaging structure and manufacturing method thereof |
US8785952B2 (en) * | 2011-10-10 | 2014-07-22 | Lg Innotek Co., Ltd. | Light emitting device and light emitting device package including the same |
US9455307B2 (en) | 2011-10-14 | 2016-09-27 | Diftek Lasers, Inc. | Active matrix electro-optical device and method of making thereof |
US9209019B2 (en) | 2013-09-05 | 2015-12-08 | Diftek Lasers, Inc. | Method and system for manufacturing a semi-conducting backplane |
JP6084226B2 (en) * | 2011-10-14 | 2017-02-22 | ディフテック レーザーズ インコーポレイテッド | Planarized semiconductor particles positioned on a substrate |
JP5902908B2 (en) * | 2011-10-19 | 2016-04-13 | スタンレー電気株式会社 | Semiconductor light emitting device and vehicle lamp |
KR101969334B1 (en) | 2011-11-16 | 2019-04-17 | 엘지이노텍 주식회사 | Light emitting device and light emitting apparatus having the same |
US9239159B2 (en) | 2011-12-16 | 2016-01-19 | Samsung Electronics Co., Ltd. | Heat-dissipating structure for lighting apparatus and lighting apparatus |
US8748847B2 (en) | 2011-12-23 | 2014-06-10 | Samsung Electronics Co., Ltd. | Method of manufacturing white light emitting device (LED) and apparatus measuring phosphor film |
KR101903361B1 (en) | 2012-03-07 | 2018-10-04 | 삼성전자주식회사 | Nitride semiconductor light emitting device and manufacturing method thereof |
JP5684751B2 (en) | 2012-03-23 | 2015-03-18 | 株式会社東芝 | Semiconductor light emitting device and manufacturing method thereof |
KR20130109319A (en) | 2012-03-27 | 2013-10-08 | 삼성전자주식회사 | Semiconductor light emitting device, light emitting module and illumination apparatus |
JP2013211399A (en) | 2012-03-30 | 2013-10-10 | Toshiba Corp | Semiconductor light-emitting element |
KR101891257B1 (en) | 2012-04-02 | 2018-08-24 | 삼성전자주식회사 | Light Emitting Device and Manufacturing Method thereof |
KR101907390B1 (en) | 2012-04-23 | 2018-10-12 | 삼성전자주식회사 | White light emitting device and display apparatus |
KR101891777B1 (en) | 2012-06-25 | 2018-08-24 | 삼성전자주식회사 | Light emitting device having dielectric reflector and method of manufacturing the same |
KR101978968B1 (en) | 2012-08-14 | 2019-05-16 | 삼성전자주식회사 | Semiconductor light emitting device and light emitting apparatus |
KR20140032691A (en) * | 2012-09-07 | 2014-03-17 | 일진엘이디(주) | Light emitting device and method of manufacturing the same |
KR101898680B1 (en) | 2012-11-05 | 2018-09-13 | 삼성전자주식회사 | Nano-structured light emitting device |
KR101898679B1 (en) | 2012-12-14 | 2018-10-04 | 삼성전자주식회사 | Nano-structured light emitting devices |
KR101967836B1 (en) | 2012-12-14 | 2019-04-10 | 삼성전자주식회사 | 3-Dimesional Light Emitting device and fabrication thereof |
KR102011101B1 (en) | 2012-12-26 | 2019-08-14 | 삼성전자주식회사 | Light emitting device package |
KR102018615B1 (en) | 2013-01-18 | 2019-09-05 | 삼성전자주식회사 | Semiconductor light emitting device and manufacturing method of the same |
KR101554032B1 (en) | 2013-01-29 | 2015-09-18 | 삼성전자주식회사 | Nano sturucture semiconductor light emitting device |
KR102022266B1 (en) | 2013-01-29 | 2019-09-18 | 삼성전자주식회사 | Method of manufacturing nano sturucture semiconductor light emitting device |
KR101603207B1 (en) | 2013-01-29 | 2016-03-14 | 삼성전자주식회사 | Manufacturing methdo of nano sturucture semiconductor light emitting device |
KR102036347B1 (en) | 2013-02-12 | 2019-10-24 | 삼성전자 주식회사 | LED array unit and LED module comprising the same |
KR101958418B1 (en) | 2013-02-22 | 2019-03-14 | 삼성전자 주식회사 | Light emitting device package |
US9676047B2 (en) | 2013-03-15 | 2017-06-13 | Samsung Electronics Co., Ltd. | Method of forming metal bonding layer and method of manufacturing semiconductor light emitting device using the same |
WO2014171277A1 (en) * | 2013-04-17 | 2014-10-23 | 日亜化学工業株式会社 | Light emitting device |
KR102038885B1 (en) | 2013-05-27 | 2019-10-31 | 삼성전자주식회사 | Semiconductor light emitting device |
US9190270B2 (en) | 2013-06-04 | 2015-11-17 | Samsung Electronics Co., Ltd. | Low-defect semiconductor device and method of manufacturing the same |
KR102122366B1 (en) | 2013-06-14 | 2020-06-12 | 삼성전자주식회사 | Production method of nitride semiconductor thin film and production method of nitride semiconductor device using the same |
KR102070088B1 (en) | 2013-06-17 | 2020-01-29 | 삼성전자주식회사 | Semiconductor light emitting device |
KR102075983B1 (en) | 2013-06-18 | 2020-02-11 | 삼성전자주식회사 | Semiconductor light emitting device |
KR20150002361A (en) | 2013-06-28 | 2015-01-07 | 삼성전자주식회사 | Semiconductor light emitting device and method for manufacturing method for light source module |
JP6136649B2 (en) | 2013-06-28 | 2017-05-31 | 日亜化学工業株式会社 | Light emitting element and light emitting device |
KR102061563B1 (en) | 2013-08-06 | 2020-01-02 | 삼성전자주식회사 | Semiconductor light emitting device |
KR102074950B1 (en) | 2013-08-13 | 2020-03-02 | 삼성전자 주식회사 | Lighting device, lighting device control system and lighting device control method |
KR20150021814A (en) | 2013-08-21 | 2015-03-03 | 삼성전자주식회사 | Led driving apparatus and lighting apparatus |
KR20150025264A (en) | 2013-08-28 | 2015-03-10 | 삼성전자주식회사 | Semiconductor light emitting device including hole injection layer |
KR102075988B1 (en) | 2013-09-25 | 2020-03-02 | 삼성전자주식회사 | Manufacturing method of semiconductor light emitting device |
KR102094471B1 (en) | 2013-10-07 | 2020-03-27 | 삼성전자주식회사 | Method for growing nitride semiconductor layer and Nitride semiconductor formed therefrom |
KR102075985B1 (en) | 2013-10-14 | 2020-02-11 | 삼성전자주식회사 | Nano sturucture semiconductor light emitting device |
KR102122360B1 (en) | 2013-10-16 | 2020-06-12 | 삼성전자주식회사 | Light emitting module test apparatus |
KR102075992B1 (en) | 2013-10-17 | 2020-02-11 | 삼성전자주식회사 | Semiconductor Light Emitting Device |
KR102098250B1 (en) | 2013-10-21 | 2020-04-08 | 삼성전자 주식회사 | Semiconductor buffer structure, semiconductor device employing the same and method of manufacturing semiconductor device using the semiconductor buffer structure |
KR20150046554A (en) | 2013-10-22 | 2015-04-30 | 삼성전자주식회사 | Led driving device, lighting device and control circuit for led driving device |
KR102070089B1 (en) | 2013-10-23 | 2020-01-29 | 삼성전자주식회사 | Semiconductor light emitting diode package and lighting device using the same |
US9099573B2 (en) | 2013-10-31 | 2015-08-04 | Samsung Electronics Co., Ltd. | Nano-structure semiconductor light emitting device |
KR102061696B1 (en) | 2013-11-05 | 2020-01-03 | 삼성전자주식회사 | Semipolar nitride semiconductor structure and method of fabricating the same |
KR102099877B1 (en) | 2013-11-05 | 2020-04-10 | 삼성전자 주식회사 | Method for fabricating nitride semiconductor device |
KR102086360B1 (en) | 2013-11-07 | 2020-03-09 | 삼성전자주식회사 | Method for forming an electrode on n-type nitride semiconductor, nitride semiconductor device and method for manufacutring the same |
KR102223034B1 (en) | 2013-11-14 | 2021-03-04 | 삼성전자주식회사 | Lighting device and signal converting device therefor |
US9190563B2 (en) | 2013-11-25 | 2015-11-17 | Samsung Electronics Co., Ltd. | Nanostructure semiconductor light emitting device |
KR102132651B1 (en) | 2013-12-03 | 2020-07-10 | 삼성전자주식회사 | Nano structure semiconductor light emitting device |
KR102075984B1 (en) | 2013-12-06 | 2020-02-11 | 삼성전자주식회사 | Semiconductor light emitting device and semiconductor light emitting apparatus having the same |
US9725648B2 (en) | 2013-12-10 | 2017-08-08 | Samsung Electronics Co., Ltd. | Phosphor and light-emitting device including the same |
KR102122359B1 (en) | 2013-12-10 | 2020-06-12 | 삼성전자주식회사 | Method for manufacturing light emitting device |
US9196812B2 (en) | 2013-12-17 | 2015-11-24 | Samsung Electronics Co., Ltd. | Semiconductor light emitting device and semiconductor light emitting apparatus having the same |
KR102122363B1 (en) | 2014-01-08 | 2020-06-12 | 삼성전자주식회사 | Light emitting device and light source driving apparatus |
KR102070092B1 (en) | 2014-01-09 | 2020-01-29 | 삼성전자주식회사 | Semiconductor light emitting device |
KR20150084311A (en) | 2014-01-13 | 2015-07-22 | 삼성전자주식회사 | Light emitting module |
KR101584201B1 (en) | 2014-01-13 | 2016-01-13 | 삼성전자주식회사 | Semiconductor light emitting device |
KR102070093B1 (en) | 2014-01-14 | 2020-01-29 | 삼성전자주식회사 | Lighting system for vehicle |
KR102198693B1 (en) | 2014-01-15 | 2021-01-06 | 삼성전자주식회사 | Semiconductor light emitting device |
KR102098591B1 (en) | 2014-01-16 | 2020-04-08 | 삼성전자주식회사 | Semiconductor light emitting device |
KR102122358B1 (en) | 2014-01-20 | 2020-06-15 | 삼성전자주식회사 | Semiconductor light emitting device |
KR102285786B1 (en) | 2014-01-20 | 2021-08-04 | 삼성전자 주식회사 | Semiconductor light-emitting device |
KR102188495B1 (en) | 2014-01-21 | 2020-12-08 | 삼성전자주식회사 | Manufacturing Method of Semiconductor Light Emitting Devices |
KR102075986B1 (en) | 2014-02-03 | 2020-02-11 | 삼성전자주식회사 | Emiconductor light emitting device |
KR102075987B1 (en) | 2014-02-04 | 2020-02-12 | 삼성전자주식회사 | Nitride semiconductor light emitting device |
KR20150092674A (en) | 2014-02-05 | 2015-08-13 | 삼성전자주식회사 | Light emitting device and light emitting device package |
KR102098245B1 (en) | 2014-02-11 | 2020-04-07 | 삼성전자 주식회사 | Light source package and a display device including the same |
KR102145209B1 (en) | 2014-02-12 | 2020-08-18 | 삼성전자주식회사 | Flash device, apparatur and method for photographing image |
KR102116986B1 (en) | 2014-02-17 | 2020-05-29 | 삼성전자 주식회사 | LED package |
KR102140789B1 (en) | 2014-02-17 | 2020-08-03 | 삼성전자주식회사 | Evaluating apparatus for quality of crystal, and Apparatus and method for manufacturing semiconductor light emitting device which include the same |
KR102122362B1 (en) | 2014-02-18 | 2020-06-12 | 삼성전자주식회사 | Nano-sturucture semiconductor light emitting device |
KR102075981B1 (en) | 2014-02-21 | 2020-02-11 | 삼성전자주식회사 | Method for manufacturing light emitting diode package |
KR102175723B1 (en) | 2014-02-25 | 2020-11-09 | 삼성전자주식회사 | Semiconductor package |
KR102204392B1 (en) | 2014-03-06 | 2021-01-18 | 삼성전자주식회사 | LED driving Apparatus, Apparatus and method for LED light |
KR102075994B1 (en) | 2014-03-25 | 2020-02-12 | 삼성전자주식회사 | Substrate separation device and substrate separation system |
KR102188497B1 (en) | 2014-03-27 | 2020-12-09 | 삼성전자주식회사 | Nano-sturucture semiconductor light emitting device |
KR102145207B1 (en) | 2014-04-17 | 2020-08-19 | 삼성전자주식회사 | Light emitting device, backlight unit and display apparatus |
KR102188493B1 (en) | 2014-04-25 | 2020-12-09 | 삼성전자주식회사 | Method of growing nitride single crystal and method of manufacturing nitride semiconductor device |
KR102145205B1 (en) | 2014-04-25 | 2020-08-19 | 삼성전자주식회사 | Method of manufaucturing semiconductor device and method of maintaining deposition apparatus |
KR101562928B1 (en) | 2014-05-08 | 2015-10-23 | 한국광기술원 | Light Emitting Diode and manufacturing method of the same |
KR20150138479A (en) | 2014-05-29 | 2015-12-10 | 삼성전자주식회사 | A method of manufacturing light emitting device package |
KR102277125B1 (en) | 2014-06-09 | 2021-07-15 | 삼성전자주식회사 | Light source module, lighting device and lighting system |
KR102192572B1 (en) | 2014-06-09 | 2020-12-18 | 삼성전자주식회사 | Method of manufacturing light source module |
KR102145208B1 (en) | 2014-06-10 | 2020-08-19 | 삼성전자주식회사 | Manufacturing method of light emitting device package |
KR102171024B1 (en) * | 2014-06-16 | 2020-10-29 | 삼성전자주식회사 | Method for manufacturing semiconductor light emitting device package |
KR102277126B1 (en) | 2014-06-24 | 2021-07-15 | 삼성전자주식회사 | DRIVING DEVICE FOR LEDs AND LIGHTING DEVICE |
KR102203461B1 (en) | 2014-07-10 | 2021-01-18 | 삼성전자주식회사 | Nano-sturucture semiconductor light emitting device |
KR102188499B1 (en) | 2014-07-11 | 2020-12-09 | 삼성전자주식회사 | Nano structure semiconductor light emitting device |
KR102203460B1 (en) | 2014-07-11 | 2021-01-18 | 삼성전자주식회사 | Method of manufacturing nano-structure semiconductor light emitting device |
KR102198694B1 (en) | 2014-07-11 | 2021-01-06 | 삼성전자주식회사 | Semiconductor light emitting device and manufacturing method of the same |
KR102188494B1 (en) | 2014-07-21 | 2020-12-09 | 삼성전자주식회사 | Semiconductor light emitting device, manufacturing method of the semiconductor light emitting device and manufacturing method of semiconductor light emitting device package |
KR102188500B1 (en) | 2014-07-28 | 2020-12-09 | 삼성전자주식회사 | Light emitting diode package and lighting device using the same |
KR102379164B1 (en) | 2014-07-29 | 2022-03-25 | 삼성전자주식회사 | Method of automatic inspection to gas internal leak and method of LED chip manufacture |
KR20160015447A (en) | 2014-07-30 | 2016-02-15 | 삼성전자주식회사 | Lens, light source module, lighting device and lighting system |
KR102212561B1 (en) | 2014-08-11 | 2021-02-08 | 삼성전자주식회사 | Semiconductor light emitting device and semiconductor light emitting device package |
KR102223036B1 (en) | 2014-08-18 | 2021-03-05 | 삼성전자주식회사 | Nano sturucture semiconductor light emitting device |
KR102227772B1 (en) | 2014-08-19 | 2021-03-16 | 삼성전자주식회사 | Semiconductor light emitting device |
KR102212559B1 (en) | 2014-08-20 | 2021-02-08 | 삼성전자주식회사 | Semiconductor light emitting diode and semiconductor light emitting diode package using the same |
KR102227771B1 (en) | 2014-08-25 | 2021-03-16 | 삼성전자주식회사 | Nano-sturucture semiconductor light emitting device |
KR20160024170A (en) | 2014-08-25 | 2016-03-04 | 삼성전자주식회사 | Semiconductor light emitting device |
KR102164796B1 (en) | 2014-08-28 | 2020-10-14 | 삼성전자주식회사 | Nano-sturucture semiconductor light emitting device |
KR102227770B1 (en) | 2014-08-29 | 2021-03-16 | 삼성전자주식회사 | Nano sturucture semiconductor light emitting device |
KR102282141B1 (en) | 2014-09-02 | 2021-07-28 | 삼성전자주식회사 | Semiconductor light emitting device |
KR20160028014A (en) | 2014-09-02 | 2016-03-11 | 삼성전자주식회사 | Method of manufacturing a semiconductor device package |
KR102198695B1 (en) | 2014-09-03 | 2021-01-06 | 삼성전자주식회사 | Light source module and backlight unit having the same |
KR102337405B1 (en) | 2014-09-05 | 2021-12-13 | 삼성전자주식회사 | Nano-sturucture semiconductor light emitting device |
KR20160033815A (en) | 2014-09-18 | 2016-03-29 | 삼성전자주식회사 | Semiconductor light emitting device |
KR20160034534A (en) | 2014-09-19 | 2016-03-30 | 삼성전자주식회사 | Semiconductor light emitting device |
JP6511757B2 (en) | 2014-09-30 | 2019-05-15 | 日亜化学工業株式会社 | Light emitting device |
KR102244218B1 (en) | 2014-10-01 | 2021-04-27 | 삼성전자주식회사 | Method of manufacturing nano-sturucture semiconductor light emitting device |
KR102223037B1 (en) | 2014-10-01 | 2021-03-05 | 삼성전자주식회사 | Method of fabricating semiconductor light emitting device |
KR102224848B1 (en) | 2014-10-06 | 2021-03-08 | 삼성전자주식회사 | Method for fabricating light emitting device package |
KR102244220B1 (en) | 2014-10-15 | 2021-04-27 | 삼성전자주식회사 | Semiconductor light emitting device |
KR102277127B1 (en) | 2014-10-17 | 2021-07-15 | 삼성전자주식회사 | Light emitting device package |
KR102227773B1 (en) | 2014-10-21 | 2021-03-16 | 삼성전자주식회사 | Light emitting device |
KR102227774B1 (en) | 2014-10-23 | 2021-03-16 | 삼성전자주식회사 | Method for manufacturing light emitting diode package |
KR102240023B1 (en) | 2014-11-03 | 2021-04-15 | 삼성전자주식회사 | Ultraviolet light emitting apparatus |
KR102212557B1 (en) | 2014-11-03 | 2021-02-08 | 삼성전자주식회사 | Nano-sturucture semiconductor light emitting device |
KR102252993B1 (en) | 2014-11-03 | 2021-05-20 | 삼성전자주식회사 | Semiconductor light emitting device and manufacturing method of the same |
KR20160054073A (en) | 2014-11-05 | 2016-05-16 | 삼성전자주식회사 | Display device and display panel |
KR102227769B1 (en) | 2014-11-06 | 2021-03-16 | 삼성전자주식회사 | Semiconductor light emitting diode and semiconductor light emitting diode package using the same |
KR102307062B1 (en) | 2014-11-10 | 2021-10-05 | 삼성전자주식회사 | Semiconductor device, semiconductor device package and lighting apparatus |
KR102369932B1 (en) | 2014-11-10 | 2022-03-04 | 삼성전자주식회사 | Fluoride phosphor, light emitting device and manufacturing methods thereof |
KR20160056167A (en) | 2014-11-11 | 2016-05-19 | 삼성전자주식회사 | Method of manufacturing a light emitting device, apparatus for inspection of a light emitting module, and method of making a decision on whether a light emitting module meets a quality requirement |
KR102255214B1 (en) | 2014-11-13 | 2021-05-24 | 삼성전자주식회사 | Light emitting diode |
KR102335105B1 (en) | 2014-11-14 | 2021-12-06 | 삼성전자 주식회사 | Light emitting device and method of fabricating the same |
KR102282137B1 (en) | 2014-11-25 | 2021-07-28 | 삼성전자주식회사 | Semiconductor light emitting device and semiconductor light emitting apparatus having the same |
KR102240022B1 (en) | 2014-11-26 | 2021-04-15 | 삼성전자주식회사 | Semicondcutor device and manufacturing method for the same |
KR102372893B1 (en) | 2014-12-04 | 2022-03-10 | 삼성전자주식회사 | Chemical vapor deposition apparatus for fabricating light emitting diode(LED) |
KR102337406B1 (en) | 2014-12-09 | 2021-12-13 | 삼성전자주식회사 | Fluoride phosphor, method of manufacturing the same, light emitting device, display apparatus and illumination apparatus |
KR102252992B1 (en) | 2014-12-12 | 2021-05-20 | 삼성전자주식회사 | Method for manufacturing semiconductor light emitting device package |
KR102357584B1 (en) | 2014-12-17 | 2022-02-04 | 삼성전자주식회사 | Nitride phosphor, light emitting device, display apparatus and illumination apparatus |
KR20160074861A (en) | 2014-12-18 | 2016-06-29 | 삼성전자주식회사 | Light measuring system |
KR102252994B1 (en) | 2014-12-18 | 2021-05-20 | 삼성전자주식회사 | Light emitting device package and fluorescent film for the same |
KR102353443B1 (en) | 2014-12-22 | 2022-01-21 | 삼성전자주식회사 | Oxynitride-based phosphor and white light emitting device including the same |
KR102355081B1 (en) | 2014-12-26 | 2022-01-26 | 삼성전자주식회사 | Method of manufacturing fluoride phosphor, light emitting device, display apparatus and illumination apparatus |
KR102300558B1 (en) | 2014-12-26 | 2021-09-14 | 삼성전자주식회사 | Light source module |
KR20160083408A (en) | 2014-12-31 | 2016-07-12 | 삼성전자주식회사 | Fuse package and light emitting device module using the same |
KR102345751B1 (en) | 2015-01-05 | 2022-01-03 | 삼성전자주식회사 | Semiconductor light emitting device package and method for manufacturing the same |
KR102346798B1 (en) | 2015-02-13 | 2022-01-05 | 삼성전자주식회사 | Semiconductor light emitting device |
JP2016163015A (en) * | 2015-03-05 | 2016-09-05 | 旭化成株式会社 | Ultraviolet light-emitting element and manufacturing method of same |
KR102292640B1 (en) | 2015-03-06 | 2021-08-23 | 삼성전자주식회사 | Light Emitting Device Package and electronic device including light emitting device |
KR102378822B1 (en) | 2015-04-30 | 2022-03-30 | 삼성전자주식회사 | Led driving apparatus |
KR102323250B1 (en) | 2015-05-27 | 2021-11-09 | 삼성전자주식회사 | Fabrication method of semiconductor light emitting device |
US9666754B2 (en) | 2015-05-27 | 2017-05-30 | Samsung Electronics Co., Ltd. | Method of manufacturing semiconductor substrate and substrate for semiconductor growth |
US10217914B2 (en) | 2015-05-27 | 2019-02-26 | Samsung Electronics Co., Ltd. | Semiconductor light emitting device |
KR20160141301A (en) | 2015-05-29 | 2016-12-08 | 삼성전자주식회사 | Semiconductor light emitting device package |
KR102380825B1 (en) | 2015-05-29 | 2022-04-01 | 삼성전자주식회사 | Semiconductor light emitting diode chip and light emitting device having the same |
KR102471271B1 (en) | 2015-06-05 | 2022-11-29 | 삼성전자주식회사 | Optical device and light source module having the same |
KR102409965B1 (en) | 2015-06-08 | 2022-06-16 | 삼성전자주식회사 | Light emitting device package, wavelength conversion film and manufacturing method of the same |
KR102306671B1 (en) | 2015-06-16 | 2021-09-29 | 삼성전자주식회사 | Light emitting diode package |
KR20160149363A (en) | 2015-06-17 | 2016-12-28 | 삼성전자주식회사 | Semiconductor light emitting device |
KR102335106B1 (en) | 2015-06-19 | 2021-12-03 | 삼성전자 주식회사 | Light Emitting Diode package and Method of manufacturing the same |
KR102382440B1 (en) | 2015-06-22 | 2022-04-05 | 삼성전자주식회사 | Semiconductor Light Emitting Device |
KR102409961B1 (en) | 2015-06-26 | 2022-06-16 | 삼성전자주식회사 | Optical device and light emitting device package having the same |
KR102300560B1 (en) | 2015-06-26 | 2021-09-14 | 삼성전자주식회사 | Led driving apparatus and lighting apparatus including the same |
KR102374267B1 (en) | 2015-06-26 | 2022-03-15 | 삼성전자주식회사 | Led driving apparatus and lighting apparatus including the same |
KR102397910B1 (en) | 2015-07-06 | 2022-05-16 | 삼성전자주식회사 | Fluoride phosphor, manufacturing method of the same, and light emitting device |
KR102432859B1 (en) | 2015-07-10 | 2022-08-16 | 삼성전자주식회사 | Light emitting device and Light emitting module including the same |
KR102414187B1 (en) | 2015-07-24 | 2022-06-28 | 삼성전자주식회사 | Light Emitting Diode module |
KR102422246B1 (en) | 2015-07-30 | 2022-07-19 | 삼성전자주식회사 | Light emitting diode(LED) package |
KR102369933B1 (en) | 2015-08-03 | 2022-03-04 | 삼성전자주식회사 | Semiconductor light emitting device and method for manufacturing the same |
KR102477353B1 (en) | 2015-08-06 | 2022-12-16 | 삼성전자주식회사 | Red phosphor, light emitting device and lighting apparatus |
KR102397907B1 (en) | 2015-08-12 | 2022-05-16 | 삼성전자주식회사 | Light source module and lighting device having the same |
KR102342546B1 (en) | 2015-08-12 | 2021-12-30 | 삼성전자주식회사 | Led driving apparatus, lighting apparatus and current control circuit |
KR102357585B1 (en) | 2015-08-18 | 2022-02-04 | 삼성전자주식회사 | Semiconductor ultraviolet light emitting device |
KR102476138B1 (en) | 2015-08-19 | 2022-12-14 | 삼성전자주식회사 | Connector, light source module and light source module array using the same |
KR102415331B1 (en) | 2015-08-26 | 2022-06-30 | 삼성전자주식회사 | light emitting diode(LED) package and apparatus including the same |
KR102397909B1 (en) | 2015-08-27 | 2022-05-16 | 삼성전자주식회사 | Board and light source module having the same |
KR20170026801A (en) | 2015-08-28 | 2017-03-09 | 삼성전자주식회사 | Semiconductor light emitting device package and light source module using the same |
KR102443035B1 (en) | 2015-09-02 | 2022-09-16 | 삼성전자주식회사 | Led driving apparatus and light apparatus including the same |
KR102374268B1 (en) | 2015-09-04 | 2022-03-17 | 삼성전자주식회사 | Light emitting device package |
KR102378823B1 (en) | 2015-09-07 | 2022-03-28 | 삼성전자주식회사 | Methods of manufacturing semiconductor substrates and semiconductor light emitting device thereof |
KR101666844B1 (en) | 2015-09-10 | 2016-10-19 | 삼성전자주식회사 | Optical device and light source module having the same |
KR102460072B1 (en) | 2015-09-10 | 2022-10-31 | 삼성전자주식회사 | Semiconductor light emitting device |
KR102427641B1 (en) | 2015-09-16 | 2022-08-02 | 삼성전자주식회사 | Semiconductor light emitting device |
KR102409966B1 (en) | 2015-09-17 | 2022-06-16 | 삼성전자주식회사 | Method of manufacturing light source module |
KR20170033947A (en) | 2015-09-17 | 2017-03-28 | 삼성전자주식회사 | Light source module and lighting device having the same |
KR102430499B1 (en) | 2015-09-22 | 2022-08-11 | 삼성전자주식회사 | Devicd and method for testing led lighting device |
CN106558597B (en) | 2015-09-30 | 2020-03-06 | 三星电子株式会社 | Light emitting device package |
KR102374266B1 (en) | 2015-10-02 | 2022-03-18 | 삼성전자주식회사 | White light emitting module and led lighting apparatus |
KR102391513B1 (en) | 2015-10-05 | 2022-04-27 | 삼성전자주식회사 | Material layer stack, light emitting device, light emitting package, and method of fabricating the light emitting device |
KR102443033B1 (en) | 2015-10-12 | 2022-09-16 | 삼성전자주식회사 | Light emitting device package and lighting apparatus having the same |
JP6661330B2 (en) * | 2015-10-27 | 2020-03-11 | 株式会社ディスコ | Method of forming LED substrate |
KR102419890B1 (en) | 2015-11-05 | 2022-07-13 | 삼성전자주식회사 | Light emitting apparatus and method of manufacturing the same |
CN105445854B (en) * | 2015-11-06 | 2018-09-25 | 南京邮电大学 | Hanging LED light waveguide integrated photonic device of silicon substrate and preparation method thereof |
KR102417181B1 (en) | 2015-11-09 | 2022-07-05 | 삼성전자주식회사 | Light emitting package, semiconductor light emitting device, light emitting module, and fabrication method of light emitting package |
KR102481646B1 (en) | 2015-11-12 | 2022-12-29 | 삼성전자주식회사 | Semiconductor light emitting device package |
KR102427644B1 (en) | 2015-11-16 | 2022-08-02 | 삼성전자주식회사 | Light source, method of manufacturing the same, and display apparatus having the same |
KR20170058515A (en) | 2015-11-18 | 2017-05-29 | 삼성전자주식회사 | Lighting control system and controling method for the same |
KR102450574B1 (en) | 2015-11-19 | 2022-10-11 | 삼성전자주식회사 | Bonding wire for semiconductor package and semiconductor package including the same |
KR20170059068A (en) | 2015-11-19 | 2017-05-30 | 삼성전자주식회사 | Lighting source module, display panel and display apparatus |
US9793450B2 (en) | 2015-11-24 | 2017-10-17 | Samsung Electronics Co., Ltd. | Light emitting apparatus having one or more ridge structures defining at least one circle around a common center |
KR102546307B1 (en) | 2015-12-02 | 2023-06-21 | 삼성전자주식회사 | Light emitting device and display device including the same |
KR102546654B1 (en) | 2015-12-11 | 2023-06-23 | 삼성전자주식회사 | Lighting system, lighting device and a control method of the same |
KR102601579B1 (en) | 2015-12-16 | 2023-11-13 | 삼성전자주식회사 | Substrate and light emitting device package using the same |
US10199542B2 (en) | 2015-12-22 | 2019-02-05 | Epistar Corporation | Light-emitting device |
US9530934B1 (en) * | 2015-12-22 | 2016-12-27 | Epistar Corporation | Light-emitting device |
KR20170075897A (en) | 2015-12-23 | 2017-07-04 | 삼성전자주식회사 | Light emitting diode package |
KR102530756B1 (en) | 2016-01-13 | 2023-05-10 | 삼성전자주식회사 | Fluoride phosphor, manufacturing method of the same, and light emitting device |
KR102550413B1 (en) | 2016-01-13 | 2023-07-05 | 삼성전자주식회사 | Led driving apparatus and lighting apparatus |
US10312310B2 (en) | 2016-01-19 | 2019-06-04 | Diftek Lasers, Inc. | OLED display and method of fabrication thereof |
KR20170089053A (en) | 2016-01-25 | 2017-08-03 | 삼성전자주식회사 | Resin coating apparatus and method of manufacturing light emitting device package using the same |
KR102408721B1 (en) | 2016-01-27 | 2022-06-15 | 삼성전자주식회사 | Method of fabricating semiconductor light emitting device |
KR102524805B1 (en) | 2016-02-12 | 2023-04-25 | 삼성전자주식회사 | Lighting source module, display panel and display apparatus |
KR102527387B1 (en) | 2016-02-24 | 2023-04-28 | 삼성전자주식회사 | Light emitting device package and method of manufacturing the same |
KR102476137B1 (en) | 2016-02-25 | 2022-12-12 | 삼성전자주식회사 | Method of manufacturing light emitting device package |
KR102263041B1 (en) | 2016-02-26 | 2021-06-09 | 삼성전자주식회사 | Light emitting diode(LED) device for implementing multi-colors |
US10106666B2 (en) | 2016-03-02 | 2018-10-23 | Samsung Electronics Co., Ltd. | Curable silicone resin composition containing inorganic oxide and optical member using same |
KR20170104031A (en) | 2016-03-03 | 2017-09-14 | 삼성전자주식회사 | Package substrate and semiconductor light emitting device package |
KR102435523B1 (en) | 2016-03-10 | 2022-08-23 | 삼성전자주식회사 | Light emitting device and method of manufacturing the same |
KR102553628B1 (en) | 2016-03-11 | 2023-07-11 | 삼성전자주식회사 | Test apparatus and manufacturing apparatus of light emitting device package |
KR102443694B1 (en) | 2016-03-11 | 2022-09-15 | 삼성전자주식회사 | Light emitting diode(LED) device for improving current spread characteristics and light extraction efficiency |
KR20170106575A (en) | 2016-03-11 | 2017-09-21 | 삼성전자주식회사 | Light source module and lighting apparatus having the same |
KR102365686B1 (en) | 2016-03-16 | 2022-02-21 | 삼성전자주식회사 | Light Emitting Diode(LED) Driving Apparatus and Lighting Device |
KR102503215B1 (en) | 2016-03-28 | 2023-02-24 | 삼성전자 주식회사 | Light emitting device package |
KR102517336B1 (en) | 2016-03-29 | 2023-04-04 | 삼성전자주식회사 | Display panel and multi-vision apparatus |
KR102513080B1 (en) | 2016-04-04 | 2023-03-24 | 삼성전자주식회사 | Led lighting source module and display apparatus |
KR102518368B1 (en) | 2016-04-06 | 2023-04-13 | 삼성전자주식회사 | Lighting apparatus |
KR102480220B1 (en) | 2016-04-08 | 2022-12-26 | 삼성전자주식회사 | Lighting emitting diode module and display panel |
KR20170121777A (en) | 2016-04-25 | 2017-11-03 | 삼성전자주식회사 | Semiconductor light emitting device |
KR102534245B1 (en) | 2016-05-04 | 2023-05-18 | 삼성전자주식회사 | light emitting device comprising a chip-scale lens |
KR20170129983A (en) | 2016-05-17 | 2017-11-28 | 삼성전자주식회사 | Led lighting device package, display apparatus using the same and method of manufacuring process the same |
US10749070B2 (en) * | 2016-05-20 | 2020-08-18 | Lumileds Llc | Method of forming a P-type layer for a light emitting device |
KR102608902B1 (en) | 2016-06-14 | 2023-12-04 | 삼성전자주식회사 | Method for manufacturing nitride semiconductor substrate |
KR102530759B1 (en) | 2016-06-14 | 2023-05-11 | 삼성전자주식회사 | Light emitting device package and method of manufacturing the same |
KR102519668B1 (en) | 2016-06-21 | 2023-04-07 | 삼성전자주식회사 | Semiconductor light-emitting device and method for manufacturing the same |
KR102530758B1 (en) | 2016-06-21 | 2023-05-11 | 삼성전자주식회사 | Semiconductor light emitting device package |
KR102530760B1 (en) | 2016-07-18 | 2023-05-11 | 삼성전자주식회사 | Semiconductor light emitting device |
KR102528559B1 (en) | 2016-07-26 | 2023-05-04 | 삼성전자주식회사 | Apparatus for manufacturing a large size substrate |
JP6724634B2 (en) * | 2016-07-28 | 2020-07-15 | 日亜化学工業株式会社 | Method for manufacturing light emitting device |
KR20180015496A (en) | 2016-08-03 | 2018-02-13 | 삼성전자주식회사 | Test apparatus and manufacturing apparatus of light emitting device package |
KR102476139B1 (en) | 2016-08-03 | 2022-12-09 | 삼성전자주식회사 | Semiconductor light emitting device |
KR102605585B1 (en) | 2016-08-11 | 2023-11-24 | 삼성전자주식회사 | Method of fabricating light emitting device package |
KR102553630B1 (en) | 2016-08-11 | 2023-07-10 | 삼성전자주식회사 | Led lighting device package and display apparatus using the same |
KR102116988B1 (en) | 2016-08-11 | 2020-06-01 | 삼성전자 주식회사 | Light source module, method of manufacturing the same, and backlight unit including the same |
KR20180021348A (en) | 2016-08-19 | 2018-03-02 | 삼성전자주식회사 | Light emitting device array and lighting device using the same |
KR102551353B1 (en) | 2016-08-22 | 2023-07-04 | 삼성전자 주식회사 | Light source module and backlight unit having the same |
KR102543179B1 (en) | 2016-08-22 | 2023-06-14 | 삼성전자주식회사 | Method of fabricating light emitting didoe module |
US10844303B1 (en) | 2016-08-29 | 2020-11-24 | Gale Campbell | Method for the production of fuel oil |
KR102623546B1 (en) | 2016-09-23 | 2024-01-10 | 삼성전자주식회사 | Lens for lighting, lens array for lighting and lighting apparatus comprising the same |
KR102650341B1 (en) * | 2016-11-25 | 2024-03-22 | 엘지전자 주식회사 | Display device using semiconductor light emitting device and method for manufacturing |
KR20180065700A (en) | 2016-12-08 | 2018-06-18 | 삼성전자주식회사 | Light emitting device |
KR102611980B1 (en) | 2016-12-14 | 2023-12-08 | 삼성전자주식회사 | Light emitting diode(LED) device for implementing multi-colors |
KR102680862B1 (en) | 2016-12-16 | 2024-07-03 | 삼성전자주식회사 | Semiconductor light emitting device |
KR102652087B1 (en) | 2016-12-16 | 2024-03-28 | 삼성전자주식회사 | Semiconductor light emitting device |
US10164159B2 (en) | 2016-12-20 | 2018-12-25 | Samsung Electronics Co., Ltd. | Light-emitting diode package and method of manufacturing the same |
KR20180076066A (en) | 2016-12-27 | 2018-07-05 | 삼성전자주식회사 | Light emitting device package |
KR102604739B1 (en) | 2017-01-05 | 2023-11-22 | 삼성전자주식회사 | Semiconductor Light Emitting Device |
KR102600002B1 (en) | 2017-01-11 | 2023-11-08 | 삼성전자주식회사 | Semiconductor light emitting device |
KR102598043B1 (en) | 2017-01-12 | 2023-11-06 | 삼성전자주식회사 | Semiconductor light emitting device including a floating conductive pattern |
KR20180089117A (en) | 2017-01-31 | 2018-08-08 | 삼성전자주식회사 | Led device and led lamp using the same |
KR20180095397A (en) | 2017-02-17 | 2018-08-27 | 삼성전자주식회사 | Led driving apparatus, lightening apparatus including the same and method for driving led |
KR20180098904A (en) | 2017-02-27 | 2018-09-05 | 삼성전자주식회사 | Computing device and method for allocating power to the plurality of cores in the computing device |
KR102385571B1 (en) | 2017-03-31 | 2022-04-12 | 삼성전자주식회사 | Semiconductor light emitting device |
US11677059B2 (en) | 2017-04-26 | 2023-06-13 | Samsung Electronics Co., Ltd. | Light-emitting device package including a lead frame |
KR102335216B1 (en) | 2017-04-26 | 2021-12-03 | 삼성전자 주식회사 | Light emitting device package |
KR102373817B1 (en) | 2017-05-02 | 2022-03-14 | 삼성전자주식회사 | White light emitting device and lighting apparatus |
KR102430500B1 (en) | 2017-05-30 | 2022-08-08 | 삼성전자주식회사 | Semiconductor light emitting device and led module using the same |
KR102450579B1 (en) | 2017-06-05 | 2022-10-07 | 삼성전자주식회사 | Led lamp |
KR102389815B1 (en) | 2017-06-05 | 2022-04-22 | 삼성전자주식회사 | Quantum dot glass cell and light emitting device package comprising the same |
JP6536859B2 (en) * | 2017-06-22 | 2019-07-03 | サンケン電気株式会社 | Light emitting device |
KR102369934B1 (en) | 2017-06-23 | 2022-03-03 | 삼성전자주식회사 | Chip mounting apparatus and method using the same |
US10256218B2 (en) | 2017-07-11 | 2019-04-09 | Samsung Electronics Co., Ltd. | Light emitting device package |
KR102549171B1 (en) | 2017-07-12 | 2023-06-30 | 삼성전자주식회사 | Led lighting device package and display apparatus using the same |
KR102302593B1 (en) | 2017-07-13 | 2021-09-15 | 삼성전자주식회사 | Light emitting device, package having the same, and method for manufacturing the same |
KR102302592B1 (en) | 2017-07-18 | 2021-09-15 | 삼성전자주식회사 | Semiconductor light-emitting device |
KR102476136B1 (en) | 2017-09-05 | 2022-12-09 | 삼성전자주식회사 | Display device using light emitting diode |
KR102539962B1 (en) | 2017-09-05 | 2023-06-05 | 삼성전자주식회사 | Led driving apparatus and lighting apparatus |
US10362654B2 (en) | 2017-09-08 | 2019-07-23 | Samsung Electronics Co., Ltd. | Lighting apparatus |
KR102609560B1 (en) | 2017-09-08 | 2023-12-04 | 삼성전자주식회사 | Semiconductor manufacturing apparatus |
US10123386B1 (en) | 2017-09-08 | 2018-11-06 | Samsung Electronics Co., Ltd. | Lighting apparatus |
US10446722B2 (en) | 2017-09-29 | 2019-10-15 | Samsung Electronics Co., Ltd. | White light emitting device |
KR102427637B1 (en) | 2017-09-29 | 2022-08-01 | 삼성전자주식회사 | Semiconductor light emitting device |
KR20190038976A (en) | 2017-10-02 | 2019-04-10 | 삼성전자주식회사 | Imprint apparatus |
KR102611981B1 (en) | 2017-10-19 | 2023-12-11 | 삼성전자주식회사 | Light emitting device and manufacturing method the same |
KR102460074B1 (en) | 2017-10-30 | 2022-10-28 | 삼성전자주식회사 | Seperate apparatus for semiconductor package |
KR102476140B1 (en) | 2017-11-20 | 2022-12-09 | 삼성전자주식회사 | Optical device and light source module having the same |
KR102430497B1 (en) | 2017-12-07 | 2022-08-08 | 삼성전자주식회사 | Manufacturing method of light emitting device |
KR102509639B1 (en) | 2017-12-12 | 2023-03-15 | 삼성전자주식회사 | Method of fabricating light emitting device package |
KR102666539B1 (en) | 2017-12-13 | 2024-05-17 | 삼성전자주식회사 | Ultraviolet semiconductor light emitting device |
KR102477357B1 (en) | 2017-12-14 | 2022-12-15 | 삼성전자주식회사 | Light emmiting device package |
KR102582424B1 (en) | 2017-12-14 | 2023-09-25 | 삼성전자주식회사 | Led lighting device package and display apparatus using the same |
KR102421729B1 (en) | 2017-12-14 | 2022-07-15 | 삼성전자주식회사 | Led lighting device package and display apparatus using the same |
KR102427640B1 (en) | 2017-12-19 | 2022-08-01 | 삼성전자주식회사 | Ultraviolet semiconductor light emitting device |
KR102524809B1 (en) | 2017-12-19 | 2023-04-24 | 삼성전자주식회사 | Ultraviolet semiconductor light emitting devices |
KR102513082B1 (en) | 2017-12-19 | 2023-03-23 | 삼성전자주식회사 | Light emitting device |
KR102518369B1 (en) | 2017-12-19 | 2023-04-05 | 삼성전자주식회사 | Light emitting device |
KR102601580B1 (en) | 2017-12-20 | 2023-11-13 | 삼성전자주식회사 | Lighting system, lighting device and lighting control method using ultra wide band sensor |
KR102542426B1 (en) | 2017-12-20 | 2023-06-12 | 삼성전자주식회사 | Wavelength-converting film and semiconductor light emitting apparatus having the same |
KR102427642B1 (en) | 2018-01-25 | 2022-08-01 | 삼성전자주식회사 | Semiconductor light emitting device |
KR102543183B1 (en) | 2018-01-26 | 2023-06-14 | 삼성전자주식회사 | Semiconductor light emitting device |
KR102481647B1 (en) | 2018-01-31 | 2022-12-28 | 삼성전자주식회사 | Led module and lighting apparatus |
KR102443027B1 (en) | 2018-03-02 | 2022-09-14 | 삼성전자주식회사 | Semiconductor light emitting device |
KR102450150B1 (en) | 2018-03-02 | 2022-10-04 | 삼성전자주식회사 | Semiconductor light emitting device |
US10862015B2 (en) | 2018-03-08 | 2020-12-08 | Samsung Electronics., Ltd. | Semiconductor light emitting device package |
KR102527384B1 (en) | 2018-03-09 | 2023-04-28 | 삼성전자주식회사 | Light emitting diode package and method for manufacturing the same |
US10499471B2 (en) | 2018-04-13 | 2019-12-03 | Samsung Electronics Co., Ltd. | Light-emitting diode lighting module and lighting apparatus including the same |
KR102551354B1 (en) | 2018-04-20 | 2023-07-04 | 삼성전자 주식회사 | Semiconductor light emitting devices and methods of manufacturing the same |
US10964852B2 (en) | 2018-04-24 | 2021-03-30 | Samsung Electronics Co., Ltd. | LED module and LED lamp including the same |
KR102573271B1 (en) | 2018-04-27 | 2023-08-31 | 삼성전자주식회사 | Semiconductor light emitting device |
KR102550415B1 (en) | 2018-05-09 | 2023-07-05 | 삼성전자주식회사 | Led device and led lamp using the same |
KR102607596B1 (en) | 2018-05-11 | 2023-11-29 | 삼성전자주식회사 | Semiconductor light emitting device and semiconductor light emitting device package using the same |
KR20190137458A (en) | 2018-06-01 | 2019-12-11 | 삼성전자주식회사 | Method of display module using light emitting diode |
KR102613239B1 (en) | 2018-06-04 | 2023-12-14 | 삼성전자주식회사 | White light emitting diode module and lighting apparatus |
KR102551746B1 (en) | 2018-06-05 | 2023-07-07 | 삼성전자주식회사 | Light emitting module |
KR102530068B1 (en) | 2018-06-26 | 2023-05-08 | 삼성전자주식회사 | Light emitting device packages, display device including the same, and methods of manufacturing the same |
KR102619665B1 (en) | 2018-06-29 | 2023-12-29 | 삼성전자주식회사 | Light emitting device |
KR102553265B1 (en) | 2018-07-09 | 2023-07-07 | 삼성전자 주식회사 | Light emitting diode(led) device, and light source modulehaving the same |
KR102534248B1 (en) | 2018-07-17 | 2023-05-18 | 삼성전자주식회사 | Lighting device package |
KR102653015B1 (en) | 2018-07-18 | 2024-03-29 | 삼성전자주식회사 | Light emitting device, head lamp for vehicle, and vehicle comprising the same |
DE102018119438A1 (en) * | 2018-08-09 | 2020-02-13 | Osram Opto Semiconductors Gmbh | OPTOELECTRONIC SEMICONDUCTOR CHIP, OPTOELECTRONIC COMPONENT AND METHOD FOR PRODUCING AN OPTOELECTRONIC COMPONENT |
KR102593264B1 (en) | 2018-08-14 | 2023-10-26 | 삼성전자주식회사 | Device for compensating for degradation and organic light emitting display comprising the device |
KR102617962B1 (en) | 2018-10-02 | 2023-12-27 | 삼성전자주식회사 | Semiconductor light emitting device |
KR102617089B1 (en) | 2018-11-05 | 2023-12-27 | 삼성전자주식회사 | Led lighting device package and display apparatus using the same |
CN109802029A (en) * | 2018-12-29 | 2019-05-24 | 珠海亮码科技有限公司 | A kind of fluorescent powder packaging technique of LED light |
KR20200111323A (en) | 2019-03-18 | 2020-09-29 | 삼성전자주식회사 | Semiconductor light emitting device and Manufacturing method of the same |
KR20200112369A (en) | 2019-03-22 | 2020-10-05 | 삼성전자주식회사 | Light emitting device package |
KR20200118333A (en) | 2019-04-05 | 2020-10-15 | 삼성전자주식회사 | Lighting system and lighting apparatus |
KR20200139307A (en) | 2019-06-03 | 2020-12-14 | 삼성전자주식회사 | Light emitting device, backlight unit and display apparatus |
KR20210000351A (en) | 2019-06-24 | 2021-01-05 | 삼성전자주식회사 | Semiconductor light emitting diode and display apparatus |
KR102684977B1 (en) | 2019-07-08 | 2024-07-17 | 삼성전자주식회사 | Manufacturing method of light emitting device |
KR20210006567A (en) | 2019-07-08 | 2021-01-19 | 삼성전자주식회사 | Led lighting device package and display panel using the same |
KR20210019335A (en) | 2019-08-12 | 2021-02-22 | 삼성전자주식회사 | Organic light emitting diode and methods of manufacturing organic light emitting diode |
JP7086902B2 (en) * | 2019-08-30 | 2022-06-20 | アオイ電子株式会社 | Light emitting device |
JP7086903B2 (en) * | 2019-08-30 | 2022-06-20 | アオイ電子株式会社 | Light emitting device |
US11374202B2 (en) | 2019-09-11 | 2022-06-28 | Samsung Electronics Co., Ltd. | Light emitting device and method of manufacturing the same |
KR20210034726A (en) | 2019-09-20 | 2021-03-31 | 삼성전자주식회사 | Memory module, error correcting method in memory controllor for controlling the same and computing system having the same |
KR20210048621A (en) | 2019-10-23 | 2021-05-04 | 삼성전자주식회사 | Light emitting device and light apparatus for plant growth |
KR20210052626A (en) | 2019-10-29 | 2021-05-11 | 삼성전자주식회사 | Led module and method of fabricating the led module |
KR20210063518A (en) | 2019-11-22 | 2021-06-02 | 삼성전자주식회사 | Light emitting diode package |
KR20210064855A (en) | 2019-11-26 | 2021-06-03 | 삼성전자주식회사 | Semiconductor light emitting device and method of fabricating the same |
KR20210078200A (en) | 2019-12-18 | 2021-06-28 | 삼성전자주식회사 | CCT changeable lighting apparatus |
KR20210097855A (en) | 2020-01-30 | 2021-08-10 | 삼성전자주식회사 | Metal based wiring board and electirc device module |
KR20210099681A (en) | 2020-02-04 | 2021-08-13 | 삼성전자주식회사 | Three dimension stuructured semiconductor light emitting diode and display apparatus |
KR20210102741A (en) * | 2020-02-12 | 2021-08-20 | 삼성전자주식회사 | Semiconductor light emitting device and method of manufacturing the same |
KR20210116828A (en) | 2020-03-17 | 2021-09-28 | 삼성전자주식회사 | Light source module and display panel using the same |
GB2593698B (en) * | 2020-03-30 | 2022-12-07 | Plessey Semiconductors Ltd | Monolithic electronic device |
KR20210141036A (en) | 2020-05-15 | 2021-11-23 | 삼성전자주식회사 | Flash led package and mobile device including the same |
KR20210143452A (en) | 2020-05-20 | 2021-11-29 | 삼성전자주식회사 | Semiconductor light emitting device and light emitting device package having the same |
KR20210144483A (en) | 2020-05-22 | 2021-11-30 | 삼성전자주식회사 | Light emitting device and head lamp for vehicle comprising the same |
KR20210144485A (en) | 2020-05-22 | 2021-11-30 | 삼성전자주식회사 | Semiconductor light emitting devices and methods of manufacturing the same |
KR20210145587A (en) | 2020-05-25 | 2021-12-02 | 삼성전자주식회사 | Semiconductor light emitting device comprising buffer structure |
KR20210145590A (en) | 2020-05-25 | 2021-12-02 | 삼성전자주식회사 | Light source module including light emitting diode |
KR20210145553A (en) | 2020-05-25 | 2021-12-02 | 삼성전자주식회사 | Light emitting device, light source module and method for manufacturing light emitting device |
CN111477734A (en) * | 2020-05-29 | 2020-07-31 | 江西乾照光电有限公司 | White light L ED chip with all-directional spectrums and synchronous light attenuation and manufacturing method thereof |
KR20210158254A (en) | 2020-06-23 | 2021-12-30 | 삼성전자주식회사 | Light emitting diode package and display apparatus including the same |
KR20220034972A (en) | 2020-09-11 | 2022-03-21 | 삼성전자주식회사 | Semiconductor light emitting device |
KR20220036176A (en) | 2020-09-15 | 2022-03-22 | 삼성전자주식회사 | Semiconductor light emitting device and light emitting device package having the same |
KR20220045832A (en) | 2020-10-06 | 2022-04-13 | 삼성전자주식회사 | Led package and electronic device including the same |
KR20220065153A (en) | 2020-11-12 | 2022-05-20 | 삼성전자주식회사 | Light source module and mobile device including the same |
KR20220068558A (en) | 2020-11-19 | 2022-05-26 | 삼성전자주식회사 | Led lighting apparatus and operating method thereof |
KR20220070757A (en) | 2020-11-23 | 2022-05-31 | 삼성전자주식회사 | Led device and lighting device including the same |
KR20220073301A (en) | 2020-11-26 | 2022-06-03 | 삼성전자주식회사 | Led package and electronic device including the same |
KR20220094291A (en) | 2020-12-28 | 2022-07-06 | 삼성전자주식회사 | Light emitting diode module and lighting apparatus |
KR20220094290A (en) | 2020-12-28 | 2022-07-06 | 삼성전자주식회사 | White light emitting device and lighting apparatus |
KR20220094991A (en) | 2020-12-29 | 2022-07-06 | 삼성전자주식회사 | Light emitting device and head lamp for vehicle comprising the same |
KR20220095289A (en) | 2020-12-29 | 2022-07-07 | 삼성전자주식회사 | Light emitting device packages |
KR20220097816A (en) | 2020-12-31 | 2022-07-08 | 삼성전자주식회사 | Led lighting apparatus |
KR20220107485A (en) | 2021-01-25 | 2022-08-02 | 삼성전자주식회사 | Led control device and lighting device including the same |
CN113097367A (en) * | 2021-03-24 | 2021-07-09 | 深圳市华星光电半导体显示技术有限公司 | QD-miniLED display panel and preparation method thereof |
KR20220133634A (en) | 2021-03-25 | 2022-10-05 | 삼성전자주식회사 | Light emitting device and method of manufacturing the same |
KR20220151076A (en) | 2021-05-04 | 2022-11-14 | 삼성전자주식회사 | Light emitting device and light apparatus for plant growth |
KR20220169286A (en) | 2021-06-18 | 2022-12-27 | 삼성전자주식회사 | A display device including a cell matrix |
KR20230079869A (en) | 2021-11-29 | 2023-06-07 | 삼성전자주식회사 | Led driving device and lighting device including the same |
KR20230099316A (en) | 2021-12-27 | 2023-07-04 | 삼성전자주식회사 | Led control device and lighting device including the same |
KR20230134363A (en) | 2022-03-14 | 2023-09-21 | 삼성전자주식회사 | Light emitting cell array, headlamp driving device, and headlamp control system |
US12027107B2 (en) | 2022-07-15 | 2024-07-02 | Samsung Electronics Co., Ltd. | Display apparatus |
KR20240031788A (en) | 2022-09-01 | 2024-03-08 | 삼성전자주식회사 | Light emmitting device for display and backlight unit including the same |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5739554A (en) * | 1995-05-08 | 1998-04-14 | Cree Research, Inc. | Double heterojunction light emitting diode with gallium nitride active layer |
US6417019B1 (en) * | 2001-04-04 | 2002-07-09 | Lumileds Lighting, U.S., Llc | Phosphor converted light emitting diode |
US20020093023A1 (en) * | 1997-06-03 | 2002-07-18 | Camras Michael D. | III-Phosphide and III-Arsenide flip chip light-emitting devices |
US20040027062A1 (en) * | 2001-01-16 | 2004-02-12 | General Electric Company | Organic electroluminescent device with a ceramic output coupler and method of making the same |
US20040178417A1 (en) * | 2003-03-10 | 2004-09-16 | Andrews Peter S. | Light emitting devices for light conversion and methods and semiconductor chips for fabricating the same |
Family Cites Families (76)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5026433B1 (en) * | 1970-12-21 | 1975-09-01 | ||
JP3163566B2 (en) * | 1990-05-07 | 2001-05-08 | 松下電器産業株式会社 | Second harmonic generation device |
EP0856202A2 (en) | 1996-06-11 | 1998-08-05 | Koninklijke Philips Electronics N.V. | Visible light emitting devices including uv-light emitting diode and uv-excitable, visible light emitting phosphor, and method of producing such devices |
TW383508B (en) * | 1996-07-29 | 2000-03-01 | Nichia Kagaku Kogyo Kk | Light emitting device and display |
US6608332B2 (en) * | 1996-07-29 | 2003-08-19 | Nichia Kagaku Kogyo Kabushiki Kaisha | Light emitting device and display |
DE69737086T2 (en) | 1996-08-27 | 2007-05-16 | Seiko Epson Corp. | DISCONNECTING METHOD, METHOD FOR TRANSMITTING A THIN FILM COMPONENT, AND LIQUID CRYSTAL DISPLAY ELEMENT PRODUCED BY USING THE TRANSMISSION METHOD |
USRE38466E1 (en) | 1996-11-12 | 2004-03-16 | Seiko Epson Corporation | Manufacturing method of active matrix substrate, active matrix substrate and liquid crystal display device |
US5895932A (en) | 1997-01-24 | 1999-04-20 | International Business Machines Corporation | Hybrid organic-inorganic semiconductor light emitting diodes |
US5898185A (en) * | 1997-01-24 | 1999-04-27 | International Business Machines Corporation | Hybrid organic-inorganic semiconductor light emitting diodes |
US6057561A (en) * | 1997-03-07 | 2000-05-02 | Japan Science And Technology Corporation | Optical semiconductor element |
US6069394A (en) * | 1997-04-09 | 2000-05-30 | Matsushita Electronics Corporation | Semiconductor substrate, semiconductor device and method of manufacturing the same |
US5813753A (en) * | 1997-05-27 | 1998-09-29 | Philips Electronics North America Corporation | UV/blue led-phosphor device with efficient conversion of UV/blues light to visible light |
JP3257455B2 (en) | 1997-07-17 | 2002-02-18 | 松下電器産業株式会社 | Light emitting device |
JPH1145512A (en) | 1997-07-25 | 1999-02-16 | Hitachi Ltd | Digital disk recorder |
US6437507B2 (en) * | 1997-11-07 | 2002-08-20 | Lg Electronics Inc. | Hollow cathode type color PDP |
JPH11145512A (en) | 1997-11-14 | 1999-05-28 | Sharp Corp | Semiconductor light-emitting device |
US8587020B2 (en) * | 1997-11-19 | 2013-11-19 | Epistar Corporation | LED lamps |
US5952681A (en) * | 1997-11-24 | 1999-09-14 | Chen; Hsing | Light emitting diode emitting red, green and blue light |
US6580097B1 (en) * | 1998-02-06 | 2003-06-17 | General Electric Company | Light emitting device with phosphor composition |
KR100683234B1 (en) * | 1998-03-12 | 2007-02-15 | 니치아 카가쿠 고교 가부시키가이샤 | Nitride semiconductor device |
JP3486345B2 (en) | 1998-07-14 | 2004-01-13 | 東芝電子エンジニアリング株式会社 | Semiconductor light emitting device |
JP3442294B2 (en) * | 1998-09-29 | 2003-09-02 | 三菱電機株式会社 | Flat panel |
US6366018B1 (en) * | 1998-10-21 | 2002-04-02 | Sarnoff Corporation | Apparatus for performing wavelength-conversion using phosphors with light emitting diodes |
US6404125B1 (en) * | 1998-10-21 | 2002-06-11 | Sarnoff Corporation | Method and apparatus for performing wavelength-conversion using phosphors with light emitting diodes |
US7208725B2 (en) | 1998-11-25 | 2007-04-24 | Rohm And Haas Electronic Materials Llc | Optoelectronic component with encapsulant |
JP2000208822A (en) | 1999-01-11 | 2000-07-28 | Matsushita Electronics Industry Corp | Semiconductor light-emitting device |
JP3400958B2 (en) | 1999-07-07 | 2003-04-28 | 株式会社シチズン電子 | Multicolor light emitting diode |
JP4418057B2 (en) | 1999-09-14 | 2010-02-17 | 星和電機株式会社 | LED chip |
WO2001041225A2 (en) | 1999-12-03 | 2001-06-07 | Cree Lighting Company | Enhanced light extraction in leds through the use of internal and external optical elements |
JP2001177157A (en) * | 1999-12-15 | 2001-06-29 | Matsushita Electronics Industry Corp | Semiconductor light emitting device |
JP2001177145A (en) | 1999-12-21 | 2001-06-29 | Toshiba Electronic Engineering Corp | Semiconductor light emitting device and method of manufacturing the same |
TW465123B (en) * | 2000-02-02 | 2001-11-21 | Ind Tech Res Inst | High power white light LED |
JP3806301B2 (en) | 2000-11-15 | 2006-08-09 | 日本ライツ株式会社 | Light source device |
JP2001226698A (en) | 2000-02-18 | 2001-08-21 | Pola Chem Ind Inc | Soap and soap set |
TW497277B (en) | 2000-03-10 | 2002-08-01 | Toshiba Corp | Semiconductor light emitting device and method for manufacturing the same |
TW480744B (en) | 2000-03-14 | 2002-03-21 | Lumileds Lighting Bv | Light-emitting diode, lighting device and method of manufacturing same |
US6570186B1 (en) * | 2000-05-10 | 2003-05-27 | Toyoda Gosei Co., Ltd. | Light emitting device using group III nitride compound semiconductor |
JP2001352098A (en) * | 2000-06-07 | 2001-12-21 | Sanyo Electric Co Ltd | Semiconductor light-emitting element and its manufacture |
JP4817534B2 (en) | 2000-06-09 | 2011-11-16 | 星和電機株式会社 | Light emitting diode lamp |
JP2002033521A (en) * | 2000-07-14 | 2002-01-31 | Showa Denko Kk | White light-emitting element and manufacturing method thereof |
JP3906654B2 (en) | 2000-07-18 | 2007-04-18 | ソニー株式会社 | Semiconductor light emitting device and semiconductor light emitting device |
JP2002076434A (en) * | 2000-08-28 | 2002-03-15 | Toyoda Gosei Co Ltd | Light emitting device |
JP3556916B2 (en) | 2000-09-18 | 2004-08-25 | 三菱電線工業株式会社 | Manufacturing method of semiconductor substrate |
JP2002111072A (en) * | 2000-09-29 | 2002-04-12 | Toyoda Gosei Co Ltd | Light-emitting device |
US6650044B1 (en) * | 2000-10-13 | 2003-11-18 | Lumileds Lighting U.S., Llc | Stenciling phosphor layers on light emitting diodes |
DE10051242A1 (en) | 2000-10-17 | 2002-04-25 | Philips Corp Intellectual Pty | Light-emitting device with coated phosphor |
JP2002141559A (en) | 2000-10-31 | 2002-05-17 | Sanken Electric Co Ltd | Light emitting semiconductor chip assembly and light emitting semiconductor lead frame |
AU2002217845A1 (en) * | 2000-11-16 | 2002-05-27 | Emcore Corporation | Microelectronic package having improved light extraction |
US20020063520A1 (en) * | 2000-11-29 | 2002-05-30 | Huei-Che Yu | Pre-formed fluorescent plate - LED device |
JP2002170989A (en) * | 2000-12-04 | 2002-06-14 | Sharp Corp | Nitride based compound semiconductor light emitting element |
US6723165B2 (en) * | 2001-04-13 | 2004-04-20 | Matsushita Electric Industrial Co., Ltd. | Method for fabricating Group III nitride semiconductor substrate |
JP4822482B2 (en) * | 2001-05-23 | 2011-11-24 | シチズン電子株式会社 | Light emitting diode and manufacturing method thereof |
JP4122739B2 (en) * | 2001-07-26 | 2008-07-23 | 松下電工株式会社 | Light emitting device and manufacturing method thereof |
KR20040029301A (en) | 2001-08-22 | 2004-04-06 | 소니 가부시끼 가이샤 | Nitride semiconductor element and production method for nitride semiconductor element |
JP2003124129A (en) | 2001-10-15 | 2003-04-25 | Hitachi Cable Ltd | Compound semiconductor substrate |
US20030117794A1 (en) * | 2001-12-20 | 2003-06-26 | Tien-Rong Lu | Flat color-shift medium |
JP2003218034A (en) | 2002-01-17 | 2003-07-31 | Sony Corp | Method for selective growth, semiconductor light- emitting element, and its manufacturing method |
JP3815335B2 (en) | 2002-01-18 | 2006-08-30 | ソニー株式会社 | Semiconductor light emitting device and manufacturing method thereof |
KR100499129B1 (en) | 2002-09-02 | 2005-07-04 | 삼성전기주식회사 | Light emitting laser diode and fabricatin method thereof |
US7002182B2 (en) | 2002-09-06 | 2006-02-21 | Sony Corporation | Semiconductor light emitting device integral type semiconductor light emitting unit image display unit and illuminating unit |
KR100714639B1 (en) | 2003-10-21 | 2007-05-07 | 삼성전기주식회사 | light emitting device |
KR100506740B1 (en) | 2003-12-23 | 2005-08-08 | 삼성전기주식회사 | Nitride semiconductor light emitting device and method of manufacturing the same |
KR100664985B1 (en) | 2004-10-26 | 2007-01-09 | 삼성전기주식회사 | Nitride based semiconductor device |
KR100665222B1 (en) | 2005-07-26 | 2007-01-09 | 삼성전기주식회사 | Led package with diffusing material and method of manufacturing the same |
KR100661614B1 (en) | 2005-10-07 | 2006-12-26 | 삼성전기주식회사 | Nitride semiconductor light emitting device and method of manufacturing the same |
KR100723247B1 (en) | 2006-01-10 | 2007-05-29 | 삼성전기주식회사 | Chip coating type light emitting diode package and fabrication method thereof |
KR100735325B1 (en) | 2006-04-17 | 2007-07-04 | 삼성전기주식회사 | Light emitting diode package and fabrication method thereof |
KR100930171B1 (en) | 2006-12-05 | 2009-12-07 | 삼성전기주식회사 | White light emitting device and white light source module using same |
KR100855065B1 (en) | 2007-04-24 | 2008-08-29 | 삼성전기주식회사 | Light emitting diode package |
KR100982980B1 (en) | 2007-05-15 | 2010-09-17 | 삼성엘이디 주식회사 | Plane light source and lcd backlight unit comprising the same |
KR101164026B1 (en) | 2007-07-12 | 2012-07-18 | 삼성전자주식회사 | Nitride semiconductor light emitting device and fabrication method thereof |
KR100891761B1 (en) | 2007-10-19 | 2009-04-07 | 삼성전기주식회사 | Semiconductor light emitting device, manufacturing method thereof and semiconductor light emitting device package using the same |
KR101332794B1 (en) | 2008-08-05 | 2013-11-25 | 삼성전자주식회사 | Light emitting device, light emitting system comprising the same, and fabricating method of the light emitting device and the light emitting system |
KR20100030470A (en) | 2008-09-10 | 2010-03-18 | 삼성전자주식회사 | Light emitting device and system providing white light with various color temperatures |
KR101530876B1 (en) | 2008-09-16 | 2015-06-23 | 삼성전자 주식회사 | Light emitting element with increased light emitting amount, light emitting device comprising the same, and fabricating method of the light emitting element and the light emitting device |
US8008683B2 (en) | 2008-10-22 | 2011-08-30 | Samsung Led Co., Ltd. | Semiconductor light emitting device |
-
2002
- 2002-09-02 KR KR10-2002-0052462A patent/KR100499129B1/en active IP Right Grant
-
2003
- 2003-05-28 US US10/445,992 patent/US8399944B2/en not_active Expired - Lifetime
- 2003-06-12 EP EP19159423.3A patent/EP3511989B1/en not_active Expired - Lifetime
- 2003-06-12 EP EP03253717.7A patent/EP1394867B1/en not_active Expired - Lifetime
- 2003-06-16 CN CNB031492541A patent/CN100541835C/en not_active Expired - Lifetime
- 2003-08-29 JP JP2003308044A patent/JP4856845B2/en not_active Expired - Fee Related
-
2011
- 2011-07-14 JP JP2011155881A patent/JP5311422B2/en not_active Expired - Fee Related
- 2011-07-21 US US13/188,297 patent/US8536604B2/en not_active Expired - Lifetime
-
2012
- 2012-04-06 JP JP2012087251A patent/JP5518927B2/en not_active Expired - Fee Related
- 2012-05-14 US US13/471,154 patent/US8952389B2/en not_active Expired - Lifetime
-
2015
- 2015-01-15 US US14/597,951 patent/US9887315B2/en not_active Expired - Lifetime
-
2018
- 2018-01-11 US US15/868,649 patent/US20180138356A1/en not_active Abandoned
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5739554A (en) * | 1995-05-08 | 1998-04-14 | Cree Research, Inc. | Double heterojunction light emitting diode with gallium nitride active layer |
US20020093023A1 (en) * | 1997-06-03 | 2002-07-18 | Camras Michael D. | III-Phosphide and III-Arsenide flip chip light-emitting devices |
US20040027062A1 (en) * | 2001-01-16 | 2004-02-12 | General Electric Company | Organic electroluminescent device with a ceramic output coupler and method of making the same |
US6417019B1 (en) * | 2001-04-04 | 2002-07-09 | Lumileds Lighting, U.S., Llc | Phosphor converted light emitting diode |
US20040178417A1 (en) * | 2003-03-10 | 2004-09-16 | Andrews Peter S. | Light emitting devices for light conversion and methods and semiconductor chips for fabricating the same |
Also Published As
Publication number | Publication date |
---|---|
US20150125979A1 (en) | 2015-05-07 |
US8399944B2 (en) | 2013-03-19 |
EP3511989A1 (en) | 2019-07-17 |
US8952389B2 (en) | 2015-02-10 |
US20120223326A1 (en) | 2012-09-06 |
EP1394867A3 (en) | 2006-08-09 |
EP1394867B1 (en) | 2019-03-06 |
JP2004096113A (en) | 2004-03-25 |
CN100541835C (en) | 2009-09-16 |
KR100499129B1 (en) | 2005-07-04 |
JP4856845B2 (en) | 2012-01-18 |
KR20040021028A (en) | 2004-03-10 |
US9887315B2 (en) | 2018-02-06 |
US20040041220A1 (en) | 2004-03-04 |
CN1481032A (en) | 2004-03-10 |
JP5311422B2 (en) | 2013-10-09 |
US20110272706A1 (en) | 2011-11-10 |
JP2011216907A (en) | 2011-10-27 |
EP3511989B1 (en) | 2020-08-26 |
JP2012142614A (en) | 2012-07-26 |
JP5518927B2 (en) | 2014-06-11 |
EP1394867A2 (en) | 2004-03-03 |
US8536604B2 (en) | 2013-09-17 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US20180138356A1 (en) | Light emitting diode | |
CN100541836C (en) | Light emitting semiconductor device | |
KR101101135B1 (en) | Light Emitting Diode Package Using Liquid Crystal Polymer | |
JP4653671B2 (en) | Light emitting device | |
JP4507636B2 (en) | Semiconductor light emitting device | |
US20020074558A1 (en) | Nitride type compound semiconductor light emitting element | |
US7098482B2 (en) | Monolithic white light emitting device | |
JP2001028458A (en) | Light emitting device | |
EP2249404A1 (en) | Light emitting device | |
JP2003101081A (en) | Light-emitting diode | |
JP4008656B2 (en) | Semiconductor light emitting device | |
KR20050077247A (en) | Manufacturing method and device for white light emitting | |
KR100847847B1 (en) | White light emitting device and method of manufacturing the same | |
KR100594419B1 (en) | White Light Emitting Devices | |
JP3503551B2 (en) | Light emitting diode | |
JP2004053945A (en) | Light source unit |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
STPP | Information on status: patent application and granting procedure in general |
Free format text: NON FINAL ACTION MAILED |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: RESPONSE TO NON-FINAL OFFICE ACTION ENTERED AND FORWARDED TO EXAMINER |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: NON FINAL ACTION MAILED |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: RESPONSE TO NON-FINAL OFFICE ACTION ENTERED AND FORWARDED TO EXAMINER |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: NON FINAL ACTION MAILED |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: RESPONSE TO NON-FINAL OFFICE ACTION ENTERED AND FORWARDED TO EXAMINER |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: FINAL REJECTION MAILED |
|
STCB | Information on status: application discontinuation |
Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION |