TWI801643B - 電極、放電裝置、電極的製造方法、及電極的檢查方法 - Google Patents

電極、放電裝置、電極的製造方法、及電極的檢查方法 Download PDF

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Publication number
TWI801643B
TWI801643B TW108127900A TW108127900A TWI801643B TW I801643 B TWI801643 B TW I801643B TW 108127900 A TW108127900 A TW 108127900A TW 108127900 A TW108127900 A TW 108127900A TW I801643 B TWI801643 B TW I801643B
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TW
Taiwan
Prior art keywords
electrode
discharge
light
accentuated
inspection
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TW108127900A
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English (en)
Chinese (zh)
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TW202032876A (zh
Inventor
青野哲典
大森崇史
中田隆行
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日商松下知識產權經營股份有限公司
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Publication of TW202032876A publication Critical patent/TW202032876A/zh
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05BSPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES
    • B05B5/00Electrostatic spraying apparatus; Spraying apparatus with means for charging the spray electrically; Apparatus for spraying liquids or other fluent materials by other electric means
    • B05B5/025Discharge apparatus, e.g. electrostatic spray guns
    • B05B5/057Arrangements for discharging liquids or other fluent material without using a gun or nozzle
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01TSPARK GAPS; OVERVOLTAGE ARRESTERS USING SPARK GAPS; SPARKING PLUGS; CORONA DEVICES; GENERATING IONS TO BE INTRODUCED INTO NON-ENCLOSED GASES
    • H01T19/00Devices providing for corona discharge
    • H01T19/04Devices providing for corona discharge having pointed electrodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01TSPARK GAPS; OVERVOLTAGE ARRESTERS USING SPARK GAPS; SPARKING PLUGS; CORONA DEVICES; GENERATING IONS TO BE INTRODUCED INTO NON-ENCLOSED GASES
    • H01T23/00Apparatus for generating ions to be introduced into non-enclosed gases, e.g. into the atmosphere

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  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Plasma & Fusion (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Electrostatic Spraying Apparatus (AREA)
  • Apparatuses And Processes For Manufacturing Resistors (AREA)
  • Particle Formation And Scattering Control In Inkjet Printers (AREA)
  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
TW108127900A 2018-08-29 2019-08-06 電極、放電裝置、電極的製造方法、及電極的檢查方法 TWI801643B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018-160759 2018-08-29
JP2018160759A JP7012255B2 (ja) 2018-08-29 2018-08-29 電極、放電装置、電極の製造方法、及び電極の検査方法

Publications (2)

Publication Number Publication Date
TW202032876A TW202032876A (zh) 2020-09-01
TWI801643B true TWI801643B (zh) 2023-05-11

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ID=69643246

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Application Number Title Priority Date Filing Date
TW108127900A TWI801643B (zh) 2018-08-29 2019-08-06 電極、放電裝置、電極的製造方法、及電極的檢查方法

Country Status (3)

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JP (1) JP7012255B2 (ja)
TW (1) TWI801643B (ja)
WO (1) WO2020044855A1 (ja)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000329529A (ja) * 1999-05-21 2000-11-30 Ngk Spark Plug Co Ltd スパークプラグ検査方法、スパークプラグ検査装置及びスパークプラグ製造方法
JP2018022574A (ja) * 2016-08-01 2018-02-08 パナソニックIpマネジメント株式会社 放電装置およびこれの製造方法
TW201813226A (zh) * 2016-08-31 2018-04-01 賽伏瑞格公司 用於操作一高電壓脈衝系統之方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5336769B2 (ja) * 2008-05-27 2013-11-06 パナソニック株式会社 静電霧化装置の検査方法およびその装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000329529A (ja) * 1999-05-21 2000-11-30 Ngk Spark Plug Co Ltd スパークプラグ検査方法、スパークプラグ検査装置及びスパークプラグ製造方法
JP2018022574A (ja) * 2016-08-01 2018-02-08 パナソニックIpマネジメント株式会社 放電装置およびこれの製造方法
TW201813226A (zh) * 2016-08-31 2018-04-01 賽伏瑞格公司 用於操作一高電壓脈衝系統之方法

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Publication number Publication date
JP2020035623A (ja) 2020-03-05
TW202032876A (zh) 2020-09-01
JP7012255B2 (ja) 2022-01-28
WO2020044855A1 (ja) 2020-03-05

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