TWI801498B - Processing device - Google Patents

Processing device Download PDF

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Publication number
TWI801498B
TWI801498B TW108104693A TW108104693A TWI801498B TW I801498 B TWI801498 B TW I801498B TW 108104693 A TW108104693 A TW 108104693A TW 108104693 A TW108104693 A TW 108104693A TW I801498 B TWI801498 B TW I801498B
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processing
waste liquid
acid
cutting
workpiece
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TW108104693A
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Chinese (zh)
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TW201934252A (en
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竹之內研二
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日商迪思科股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q11/00Accessories fitted to machine tools for keeping tools or parts of the machine in good working condition or for cooling work; Safety devices specially combined with or arranged in, or specially adapted for use in connection with, machine tools
    • B23Q11/10Arrangements for cooling or lubricating tools or work
    • B23Q11/1015Arrangements for cooling or lubricating tools or work by supplying a cutting liquid through the spindle
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23BTURNING; BORING
    • B23B27/00Tools for turning or boring machines; Tools of a similar kind in general; Accessories therefor
    • B23B27/06Profile cutting tools, i.e. forming-tools
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q11/00Accessories fitted to machine tools for keeping tools or parts of the machine in good working condition or for cooling work; Safety devices specially combined with or arranged in, or specially adapted for use in connection with, machine tools
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q11/00Accessories fitted to machine tools for keeping tools or parts of the machine in good working condition or for cooling work; Safety devices specially combined with or arranged in, or specially adapted for use in connection with, machine tools
    • B23Q11/10Arrangements for cooling or lubricating tools or work
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q11/00Accessories fitted to machine tools for keeping tools or parts of the machine in good working condition or for cooling work; Safety devices specially combined with or arranged in, or specially adapted for use in connection with, machine tools
    • B23Q11/10Arrangements for cooling or lubricating tools or work
    • B23Q11/1069Filtration systems specially adapted for cutting liquids
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/10Greenhouse gas [GHG] capture, material saving, heat recovery or other energy efficient measures, e.g. motor control, characterised by manufacturing processes, e.g. for rolling metal or metal working

Abstract

提供一種可減低將未符合排水基準的加工廢液 進行排水之虞的加工裝置。 Provides a solution to reduce process effluents that will not meet drainage standards Processing equipment that may cause drainage.

本發明之加工裝置係具備有:保持被加工 物的保持手段、及將被保持在該保持手段的被加工物進行加工的加工手段,該加工裝置之特徵為:另外具備有:加工液供給手段,其係當將被保持在該保持手段的被加工物以該加工手段進行加工時,至少對被加工物供給含有氧化劑的加工液;加工廢液回收部,其係回收包含由該加工液供給手段被供給至被加工物的該加工液的加工廢液;排出路,其係由該加工廢液回收部,將該加工廢液排出至該加工裝置外;及處理槽,其係被配設在該排出路的途中且貯留在該加工廢液回收部被回收的加工廢液,且具有將該加工廢液所包含的加工液進行分解的廢液處理手段。 The processing device of the present invention is provided with: keep the processed A holding means for an object, and a processing means for processing a workpiece held in the holding means. When a workpiece is processed by the processing means, at least a processing fluid containing an oxidizing agent is supplied to the workpiece; a processing waste liquid recovery unit recovers the processing fluid containing the processing fluid supplied to the workpiece by the processing fluid supply means processing waste liquid; a discharge path that discharges the processing waste liquid out of the processing device from the processing waste liquid recovery unit; and a treatment tank that is arranged in the middle of the discharge path and stores the processing waste liquid The liquid recovery unit collects the processing waste liquid and has waste liquid treatment means for decomposing the processing liquid contained in the processing waste liquid.

Description

加工裝置 Processing device

本發明係關於將被加工物加工時一邊供給加工液一邊實施加工的切削裝置、研削裝置、切削刀具(bite)切削裝置等加工裝置。 The present invention relates to processing devices such as a cutting device, a grinding device, and a cutting device (bite) cutting device, which perform processing while supplying a processing fluid when processing a workpiece.

若以切削刀切削具有金屬的被加工物,在切削刀會發生阻塞,並且在金屬部分會發生毛邊。因所發生的毛邊,形成在被加工物的元件的端子間會短路、或在被加工物處理中,毛邊落下在接合墊上等而會發生接合不良等問題發生。 If a metal workpiece is cut with a cutting blade, the cutting blade will be clogged and burrs will occur on the metal part. Due to the generated burrs, problems such as short-circuiting between terminals of components formed on the workpiece, and bonding failure due to burrs falling on the bonding pads during processing of the workpiece occur.

為解決該問題,在日本特開2015-177089號公報中係提案出一種一邊供給含有有機酸與氧化劑的切削液一邊切削被加工物的方法。藉由該切削方法,藉由切削液所含有的有機酸,金屬被改質而延性受到抑制。結果,毛邊的發生受到抑制,因切削液含有氧化劑,因切削液而形成在金屬表面的膜質改變,金屬係失去延性而容易被去除,以促進加工性。 In order to solve this problem, Japanese Patent Laid-Open No. 2015-177089 proposes a method of cutting a workpiece while supplying a cutting fluid containing an organic acid and an oxidizing agent. According to this cutting method, the metal is modified by the organic acid contained in the cutting fluid and the ductility is suppressed. As a result, the occurrence of burrs is suppressed, and since the cutting fluid contains an oxidizing agent, the quality of the film formed on the metal surface due to the cutting fluid changes, and the metal system loses ductility and is easily removed to promote machinability.

[先前技術文獻] [Prior Art Literature] [專利文獻] [Patent Document]

[專利文獻1]日本特開2015-177089號公報 [Patent Document 1] Japanese Patent Laid-Open No. 2015-177089

但是,依切削裝置的使用地域的排水基準,並無法將含有切削液的切削廢液直接排水,而藉由使用微生物的生物處理,將切削廢液中的有機物進行分解之後再排水。 However, according to the drainage standard of the area where the cutting device is used, the cutting waste fluid containing the cutting fluid cannot be directly drained, and the organic matter in the cutting waste fluid is decomposed before being drained by biological treatment using microorganisms.

但是,若在切削液中含有氧化劑,因氧化劑,在生物處理中所使用的微生物會死滅,無法分解切削廢液中的有機物而有排出未符合排水基準的切削廢液之虞。如上所示之問題並非侷限於切削裝置,在使用加工液的研削裝置、切削刀具切削裝置等其他加工裝置亦會發生者。 However, if the cutting fluid contains an oxidizing agent, the microorganisms used in the biological treatment will die due to the oxidizing agent, and the organic matter in the cutting waste liquid will not be decomposed, and the cutting waste liquid that does not meet the drainage standards may be discharged. The problems shown above are not limited to cutting devices, but also occur in other processing devices such as grinding devices using machining fluids, cutting tools and cutting devices.

本發明係鑑於如上所示之情形而完成者,其目的在提供可減低將未符合排水基準的加工廢液進行排水之虞的加工裝置。 The present invention was made in view of the circumstances as described above, and an object of the present invention is to provide a processing device capable of reducing the possibility of discharging processing waste liquid that does not meet the discharge standards.

藉由本發明,提供一種加工裝置,其係具備有:保持被加工物的保持手段、及將被保持在該保持手段的被加工物進行加工的加工手段,該加工裝置之特徵為:另外具備有:加工液供給手段,其係當將被保持在該保持 手段的被加工物以該加工手段進行加工時,至少對被加工物供給含有氧化劑的加工液;加工廢液回收部,其係回收包含由該加工液供給手段被供給至被加工物的該加工液的加工廢液;排出路,其係由該加工廢液回收部,將該加工廢液排出至該加工裝置外;及處理槽,其係被配設在該排出路的途中且貯留在該加工廢液回收部被回收的加工廢液,且具有將該加工廢液所包含的加工液進行分解的廢液處理手段。 According to the present invention, a processing device is provided, which is provided with: a holding means for holding a workpiece, and a processing means for processing the workpiece held by the holding means, and the processing device is characterized in that: : The machining fluid supply means, which system will be kept in the hold When the processed object of the means is processed by the processing means, at least the processing liquid containing an oxidizing agent is supplied to the processed object; liquid processing waste liquid; discharge path, which is used to discharge the processing waste liquid from the processing waste liquid recovery unit to the outside of the processing device; and treatment tank, which is arranged on the way of the discharge path and stored in the The processing waste liquid recovery unit collects the processing waste liquid and has waste liquid treatment means for decomposing the processing liquid contained in the processing waste liquid.

較佳為氧化劑係過氧化氫,廢液處理手段係包含:對加工廢液照射紫外線的紫外線照射手段。 Preferably, the oxidizing agent is hydrogen peroxide, and the waste liquid treatment means includes ultraviolet irradiation means for irradiating ultraviolet rays to the processing waste liquid.

本發明之加工裝置係具備貯留在加工廢液回收部被回收的加工廢液,且具有將加工廢液所包含的加工液進行分解的廢液處理手段的處理槽,因此可減低將未符合排水基準的加工廢液進行排水之虞。 The processing device of the present invention is equipped with processing waste liquid stored in the processing waste liquid recovery part and is recovered, and has a treatment tank with a waste liquid treatment means for decomposing the processing liquid contained in the processing waste liquid, so it can reduce the amount of unsuitable drainage. There is a risk that the standard processing waste liquid will be drained.

2:封裝體基板 2: Package substrate

4:金屬框體(引線框架) 4: Metal frame (lead frame)

5:外周剩餘區域 5: The remaining area of the outer periphery

5a:非元件區域 5a: Non-component area

6a、6b、6c:元件區域 6a, 6b, 6c: component area

8:分割預定線 8: Split schedule line

10:元件晶片裝載部 10: Component wafer loading part

12:電極 12: Electrode

14:壓模樹脂層 14: Compression molding resin layer

20:切削裝置 20: Cutting device

22:基座 22: base

24:水蓋 24: water cover

24a:上板 24a: upper plate

24b:側板 24b: side panel

26:平台基座 26: Platform base

28:吸引口 28: suction port

30:蛇腹 30: snake belly

32:支柱 32: Pillar

34:導軌 34: guide rail

36:Y軸移動區塊 36: Y-axis moving block

38:滾珠螺桿 38: Ball screw

40:Y軸移動機構(分級進給機構) 40: Y-axis moving mechanism (gradual feeding mechanism)

42:導軌 42: guide rail

44:Z軸移動區塊 44: Z-axis moving block

46:滾珠螺桿 46: Ball screw

48:脈衝馬達 48: Pulse motor

50:Z軸移動機構 50: Z-axis moving mechanism

52:切削單元 52: Cutting unit

54:切削刀 54: Cutter

56:切削液供給噴嘴 56: Cutting fluid supply nozzle

58:攝像單元 58: Camera unit

60:水箱 60: water tank

62:底板 62: Bottom plate

63:開口部 63: Opening

64:內周壁 64: inner peripheral wall

66:外周壁 66:Peripheral wall

68:導水管部 68: Aqueduct department

70:排液口 70: drain port

72:切削進給機構 72: Cutting feed mechanism

74:滾珠螺桿 74: Ball screw

76:導軌 76: guide rail

78:可動板 78: Movable plate

80:馬達 80: motor

81:圓筒構件 81: Cylindrical member

82:排液管 82: drain pipe

84:廢液處理槽 84: waste liquid treatment tank

86:LED 86:LED

88:透明板 88:Transparent board

圖1(A)係封裝體基板的平面圖,圖1(B)係封裝體基板的背面圖,圖1(C)係封裝體基板的側面圖。 1(A) is a plan view of a package substrate, FIG. 1(B) is a rear view of the package substrate, and FIG. 1(C) is a side view of the package substrate.

圖2係適於切削圖1所示之封裝體基板的切削裝置的斜視圖。 FIG. 2 is a perspective view of a cutting device suitable for cutting the package substrate shown in FIG. 1 .

圖3係切削裝置的切削進給手段及水箱部分的斜視 圖。 Figure 3 is the oblique view of the cutting feed means and the water tank of the cutting device picture.

圖4係具有廢液處理手段的處理槽的剖面圖。 Fig. 4 is a cross-sectional view of a treatment tank with waste liquid treatment means.

以下參照圖示,詳加說明本發明之實施形態。若參照圖1(A),顯示適於藉由本發明實施形態之切削裝置進行加工的封裝體基板2之一例的平面圖。圖1(B)係封裝體基板2的背面圖,圖1(C)係封裝體基板2的側面圖。 Embodiments of the present invention will be described in detail below with reference to the drawings. Referring to FIG. 1(A), there is shown a plan view of an example of a package substrate 2 suitable for processing by a cutting device according to an embodiment of the present invention. FIG. 1(B) is a rear view of the package substrate 2 , and FIG. 1(C) is a side view of the package substrate 2 .

封裝體基板2係具有矩形狀的金屬框體(引線框架)4,在金屬框體4之藉由外周剩餘區域5及非元件區域5a所圍繞的區域,在圖示之例中係存在3個元件區域6a、6b、6c。 The package substrate 2 has a rectangular metal frame (lead frame) 4, and in the area surrounded by the remaining peripheral area 5 and the non-component area 5a of the metal frame 4, there are three in the illustrated example. Element regions 6a, 6b, 6c.

在各元件區域6a、6b、6c中,在藉由以彼此呈正交的方式作縱橫設置的分割預定線8所區劃的複數區域區劃形成有元件晶片裝載部10,沿著各個元件晶片裝載部10的4邊形成有複數電極12。 In each of the element regions 6a, 6b, and 6c, element wafer mounts 10 are formed in a plurality of regions defined by dividing lines 8 arranged vertically and horizontally perpendicularly to each other, and element wafer mounts 10 are formed along each element wafer mount. Multiple electrodes 12 are formed on four sides of 10 .

各電極12彼此係藉由被壓模在金屬框體4的壓模樹脂層14而予以絕緣。藉由切削以第1方向伸長的分割預定線8及以與第1方向呈正交的第2方向伸長的分割預定線8,在切削溝槽的兩側現出各元件晶片的電極12。 The electrodes 12 are insulated from each other by a molded resin layer 14 molded on the metal frame 4 . By cutting the planned dividing line 8 extending in the first direction and the dividing planned line 8 extending in the second direction perpendicular to the first direction, electrodes 12 of each element chip appear on both sides of the cut trench.

在元件區域6a、6b、6c的各元件晶片裝載部10的背面係裝載有未圖示的元件晶片,各元件晶片所配備的電極與電極12作接合導線連接。 An unillustrated element chip is mounted on the back surface of each element chip mounting portion 10 in the element regions 6a, 6b, 6c, and electrodes provided on each element chip are connected to electrodes 12 by bonding wires.

接著,元件區域6a、6b、6c的各元件晶片係 以藉由樹脂予以密封的方式,在各元件區域6a、6b、6c的背面形成有壓模樹脂層14。 Next, each element wafer in the element regions 6a, 6b, 6c is A stamper resin layer 14 is formed on the back surface of each element region 6a, 6b, 6c so as to be sealed with resin.

若參照圖2,顯示本發明實施形態之切削裝置20的斜視圖。圖2所示之切削裝置20係作業者將應切削的被加工物載置於保持手段上,或由保持手段搬出的手動類型的切削裝置。 Referring to FIG. 2, it shows a perspective view of a cutting device 20 according to an embodiment of the present invention. The cutting device 20 shown in FIG. 2 is a manual type cutting device in which the operator places the workpiece to be cut on the holding means or carries it out from the holding means.

22係切削裝置20的基座,在基座22係以可旋轉而且藉由未圖示的切削進給機構而可以X軸方向往返動作的方式配設有平台基座26。在平台基座26的概略中央部分係形成有連接於吸引源的吸引口28之開口。 22 is a base of the cutting device 20 , and a table base 26 is disposed on the base 22 so as to be rotatable and reciprocating in the X-axis direction by a cutting feed mechanism not shown. An opening connected to a suction port 28 of a suction source is formed in a roughly central portion of the platform base 26 .

在將封裝體基板2加工時,將日本特開2011-040542號公報所揭示之治具平台裝載於平台基座26,透過治具平台,吸引保持封裝體基板2。亦即,在本實施形態之切削裝置中,係以平台基座與治具平台構成保持手段。 When processing the package substrate 2 , the jig platform disclosed in Japanese Patent Application Laid-Open No. 2011-040542 is mounted on the platform base 26 , and the package substrate 2 is attracted and held through the jig platform. That is, in the cutting device of this embodiment, the holding means is constituted by the platform base and the jig platform.

在平台基座26的周圍係配設有水蓋24,在該水蓋24與圖3所示之水箱60的間連結有用以保護切削進給機構的軸的蛇腹30。 A water cover 24 is arranged around the platform base 26, and a bellows 30 for protecting the shaft of the cutting feed mechanism is connected between the water cover 24 and the water tank 60 shown in FIG. 3 .

在基座22的後方係立設有門型形狀的支柱32。在支柱32係固定有以Y軸方向伸長的一對導軌34。在支柱32係可利用由滾珠螺桿38與未圖示的脈衝馬達所成之Y軸移動機構(分級進給機構)40,沿著導軌34以Y軸方向移動地裝載有Y軸移動區塊36。 A door-shaped pillar 32 is erected behind the base 22 . A pair of guide rails 34 extending in the Y-axis direction are fixed to the pillar 32 . The support 32 is equipped with a Y-axis moving block 36 that can move in the Y-axis direction along the guide rail 34 by using a Y-axis moving mechanism (step feeding mechanism) 40 composed of a ball screw 38 and a pulse motor not shown in the figure. .

在Y軸移動區塊36係固定有以Z軸方向伸長的一對導軌42。在Y軸移動區塊36上,利用由滾珠螺桿46 與脈衝馬達48所成之Z軸移動機構50,被導軌42導引而可朝Z軸方向移動地裝載有Z軸移動區塊44。 A pair of guide rails 42 extending in the Z-axis direction are fixed to the Y-axis moving block 36 . On the Y-axis moving block 36, the ball screw 46 is used to The Z-axis moving mechanism 50 constituted by the pulse motor 48 is guided by the guide rail 42 to be movable in the Z-axis direction, and the Z-axis moving block 44 is mounted thereon.

在Z軸移動區塊44係安裝有作為加工手段的切削單元52,在切削單元52的心軸殼體53中係可旋轉地收容有未圖示的心軸,在心軸的前端部係可安裝卸下地安裝有切削刀54。 A cutting unit 52 as a processing means is installed in the Z-axis moving block 44, and an unillustrated spindle is rotatably accommodated in the spindle housing 53 of the cutting unit 52, and can be installed at the front end of the spindle. A cutter 54 is detachably attached.

在切削刀54的兩側係夾著切削刀54配設有作為加工液供給手段的一對切削液供給噴嘴56,在以保持手段所保持的封裝體基板2的切削中,係一邊由切削液供給噴嘴56供給切削液,一邊以切削刀54切削封裝體基板2。 On both sides of the cutting blade 54, a pair of cutting fluid supply nozzles 56 are disposed on both sides of the cutting blade 54 as a machining fluid supply means. During cutting of the package substrate 2 held by the holding means, the cutting fluid is fed The cutting fluid is supplied from the supply nozzle 56 , and the package substrate 2 is cut with the cutting blade 54 .

在Z軸移動區塊44係另外安裝有具有顯微鏡及攝影機的攝像單元58。攝像單元58係具備有對被加工物以可見光線進行攝像的攝像攝影機。 A camera unit 58 having a microscope and a camera is additionally installed on the Z-axis moving block 44 . The imaging unit 58 is provided with an imaging camera for imaging the workpiece with visible light.

若一邊由切削水供給噴嘴56供給包含有機酸與氧化劑的切削液,一邊以切削刀54切削被吸引保持在吸盤平台26的封裝體基板2時,切削液及包含切削屑的切削廢液係由蛇腹30的短邊方向(Y軸方向)的兩端朝向圖3所示之水箱60流下。 When cutting the package substrate 2 sucked and held on the chuck table 26 with the cutting blade 54 while supplying cutting fluid containing an organic acid and an oxidizing agent from the cutting water supply nozzle 56, the cutting fluid and cutting waste fluid containing cutting chips are Both ends of the bellows 30 in the short direction (Y-axis direction) flow down toward the water tank 60 shown in FIG. 3 .

水箱60係配設在平台基座26的移動路徑下,且為了可使平台基座26以X軸方向往返移動,在箱狀構件的底板62的中央部設有矩形狀的開口部63,該水箱60係包含有:藉由底板62、內周壁64及外周壁66所構成且接擋切削液之作為加工廢液回收部的導水管部68;及形成在底板62的排液口70。在排液口70係連接有朝水箱60的外部延伸 之作為排出路的排液管82的一端。 The water tank 60 is arranged under the moving path of the platform base 26, and in order to make the platform base 26 reciprocate in the X-axis direction, a rectangular opening 63 is provided at the center of the bottom plate 62 of the box-shaped member. The water tank 60 includes: a drain pipe 68 formed by a bottom plate 62 , an inner peripheral wall 64 and an outer peripheral wall 66 and receiving the cutting fluid as a processing waste recovery part; and a liquid discharge port 70 formed on the bottom plate 62 . The drain port 70 is connected with a It serves as one end of the discharge pipe 82 of the discharge path.

水蓋24係從形成為平面狀的上板24a的兩端部垂下一對側板24b而構成,上板24a的端部及2個側板24b係可滑動地與構成水箱60的內周壁64相扣合。 The water cover 24 is composed of a pair of side plates 24b suspended from both ends of a planar upper plate 24a, and the ends of the upper plate 24a and the two side plates 24b are slidably engaged with the inner peripheral wall 64 constituting the water tank 60. combine.

切削進給機構72係由:以X軸方向伸長的滾珠螺桿74;與滾珠螺桿74呈平行配設的一對導軌76;連結在滾珠螺桿74之一端的馬達80;及被收容在內部的螺帽螺合於滾珠螺桿74,且底部滑接於導軌76的可動板78所構成。 The cutting feed mechanism 72 is composed of: a ball screw 74 elongated in the X-axis direction; a pair of guide rails 76 arranged in parallel with the ball screw 74; a motor 80 connected to one end of the ball screw 74; and a screw housed inside. The cap is screwed to the ball screw 74 , and the bottom is slidably connected to the movable plate 78 of the guide rail 76 .

形成為若滾珠螺桿74藉由馬達80而旋轉時,可動板78被一對導軌76導引而以X軸方向往返移動的構成。在可動板78上係安裝有圓筒構件81,在該圓筒構件81的內部係收容有將平台基座26旋轉的旋轉機構。 When the ball screw 74 is rotated by the motor 80 , the movable plate 78 is guided by the pair of guide rails 76 to reciprocate in the X-axis direction. A cylindrical member 81 is attached to the movable plate 78 , and a rotation mechanism for rotating the stage base 26 is accommodated inside the cylindrical member 81 .

如圖2及圖4所示,在連接於水箱60之排液口70的排液管(排液路)82的途中,配設有處理槽84,其係貯留在作為加工廢液回收部的導水管部68被回收的加工廢液且具有將該加工廢液所包含的加工液進行分解的廢液處理手段。 As shown in Figure 2 and Figure 4, in the middle of the drain pipe (drainage path) 82 connected to the drain port 70 of the water tank 60, a treatment tank 84 is arranged, which is stored in the processing waste liquid recovery part. The aqueduct section 68 collects the recovered processing waste liquid and has a waste liquid treatment means for decomposing the processing liquid contained in the processing waste liquid.

在本實施形態中,廢液處理手段係由配設在處理槽84的底壁及側壁的複數LED86所構成。由LED86被照射的紫外光(UV光)的波長係以340nm以下為佳,更佳為300nm以下。 In this embodiment, the waste liquid treatment means is constituted by a plurality of LEDs 86 arranged on the bottom wall and side walls of the treatment tank 84 . The wavelength of the ultraviolet light (UV light) irradiated by LED86 is preferably 340 nm or less, more preferably 300 nm or less.

以被貯留在處理槽84內的加工廢液不接觸LED86的方式,藉由透明板88覆蓋LED86。對被貯留在處 理槽84內的加工廢液,由LED86照射紫外線,加工廢液(切削廢液)中所包含的加工液(切削液)即被分解。 The LED 86 is covered with a transparent plate 88 so that the processing waste liquid stored in the processing tank 84 does not come into contact with the LED 86 . to be stored The processing waste liquid in the processing tank 84 is irradiated with ultraviolet light by the LED 86, and the processing liquid (cutting liquid) contained in the processing waste liquid (cutting waste liquid) is decomposed.

當以本發明實施形態之切削裝置2切削圖1所示之封裝體基板2時,一邊將包含有機酸與氧化劑的切削液供給至切削刀54切入封裝體基板2的加工點,一邊完成切削。 When cutting the package substrate 2 shown in FIG. 1 with the cutting device 2 according to the embodiment of the present invention, the cutting is completed while supplying the cutting fluid containing organic acid and oxidizing agent to the processing point where the cutting blade 54 cuts into the package substrate 2 .

藉由切削液中所包含的有機酸,可一邊將封裝體基板2所包含的金屬改質而抑制延性一邊切削封裝體基板2。因此,並不會有因該切削而由金屬發生毛邊的情形。此外,藉由使用氧化劑,可將金屬的表面氧化而降低金屬的延性,使金屬表面的加工性提升。 The organic acid contained in the cutting fluid can modify the metal contained in the package substrate 2 to suppress ductility while cutting the package substrate 2 . Therefore, no burrs are generated from the metal due to the cutting. In addition, by using an oxidizing agent, the surface of the metal can be oxidized to reduce the ductility of the metal and improve the workability of the metal surface.

以有機酸而言,可使用例如在分子內具有至少1個羧基與至少1個胺基的化合物。此時,胺基之中至少1個係以2級或3級胺基為佳。此外,作為有機酸來使用的化合物亦可具有取代基。 As the organic acid, for example, a compound having at least one carboxyl group and at least one amino group in the molecule can be used. In this case, at least one of the amine groups is preferably a secondary or tertiary amino group. In addition, the compound used as an organic acid may have a substituent.

以可作為有機酸來使用的胺基酸而言,係列舉:甘胺酸、二羥基乙基甘胺酸、甘胺醯基甘胺酸、羥基乙基甘胺酸、N-甲基甘胺酸、β-丙胺酸、L-丙胺酸、L-2-胺基丁酸、L-正纈胺酸、L-纈胺酸、L-白胺酸、L-正白胺酸、L-別-異白胺酸、L-異白胺酸、L-苯基丙胺酸、L-脯胺酸、肌胺酸、L-鳥胺酸、L-離胺酸、牛磺酸、L-絲胺酸、L-蘇胺酸、L-別-蘇胺酸、L-高絲胺酸、L-甲狀腺素、L-酪胺酸、3,5-二碘-L-酪胺酸、β-(3,4-二羥基苯基)-L-丙胺酸、4-羥基-L-脯胺酸、L-半胱胺酸、L-甲硫胺酸、L-乙硫 胺酸、L-羊毛硫胺酸、L-胱硫醚、L-胱胺酸、L-氧化半胱胺酸、L-麩胺酸、L-天冬胺酸、S-(羧基甲基)-L-半胱胺酸、4-胺基丁酸、L-天冬醯胺、L-麩醯胺、吖絲胺酸、L-刀豆胺酸、L-瓜胺酸、L-精胺酸、δ-羥基-L-離胺酸、肌酸、L-犬尿胺酸、L-組胺酸、1-甲基-L-組胺酸、3-甲基-L-組胺酸、L-色胺酸、放線菌黴素C1、麥角硫醇、蜂毒明肽、第一型血管收縮素、第二型血管收縮素、及止痛素(antipain)等。其中,亦以甘胺酸、L-丙胺酸、L-脯胺酸、L-組胺酸、L-離胺酸、二羥基乙基甘胺酸為佳。 In terms of amino acids that can be used as organic acids, the series include: glycine, dihydroxyethylglycine, glycylglycine, hydroxyethylglycine, N-methylglycine Acid, β-alanine, L-alanine, L-2-aminobutyric acid, L-norvaline, L-valine, L-leucine, L-norleucine, L-beta - Isoleucine, L-Isoleucine, L-Phenylalanine, L-Proline, Sarcosine, L-Ornithine, L-Lysine, Taurine, L-Serine acid, L-threonine, L-allo-threonine, L-homoserine, L-thyroxine, L-tyrosine, 3,5-diiodo-L-tyrosine, β-(3 ,4-dihydroxyphenyl)-L-alanine, 4-hydroxy-L-proline, L-cysteine, L-methionine, L-ethylthio amino acid, L-lanthionine, L-cystathionine, L-cystine, L-oxidized cysteine, L-glutamic acid, L-aspartic acid, S-(carboxymethyl) -L-cysteine, 4-aminobutyric acid, L-asparagine, L-glutamine, acriserine, L-canavanine, L-citrulline, L-spermine acid, delta-hydroxy-L-lysine, creatine, L-kynurenine, L-histidine, 1-methyl-L-histidine, 3-methyl-L-histidine, L-tryptophan, actinomycin C1, ergothiol, melittin, type I angiotensin, type II angiotensin, and antipain, etc. Among them, glycine, L-alanine, L-proline, L-histidine, L-lysine, and dihydroxyethylglycine are also preferable.

此外,以可作為有機酸來使用的胺基多酸而言,係列舉:亞胺基二乙酸、腈基三乙酸、二乙烯三胺五乙酸、乙二胺四乙酸、羥基乙基亞胺基二乙酸、腈基三亞甲基膦酸、乙二胺-N,N,N’,N’-四亞甲基磺酸、1,2-二胺基丙烷四乙酸、二醇醚二胺四乙酸、反環己烷二胺四乙酸、乙二胺-鄰-羥基苯基乙酸、乙二胺二琥珀酸(SS異構物)、β-丙胺酸二乙酸、N-(2-羧酸酯乙基)-L-天冬胺酸、N,N’-二(2-羥基苯甲基)乙二胺-N,N’-二乙酸等。 In addition, in terms of amino polyacids that can be used as organic acids, the series include: iminodiacetic acid, cyanotriacetic acid, diethylenetriaminepentaacetic acid, ethylenediaminetetraacetic acid, hydroxyethylimino Diacetic acid, nitrile trimethylene phosphonic acid, ethylenediamine-N,N,N',N'-tetramethylenesulfonic acid, 1,2-diaminopropane tetraacetic acid, glycol ether diamine tetraacetic acid , transcyclohexanediaminetetraacetic acid, ethylenediamine-o-hydroxyphenylacetic acid, ethylenediaminedisuccinic acid (SS isomer), β-alanine diacetic acid, N-(2-carboxylate ethyl base)-L-aspartic acid, N,N'-bis(2-hydroxybenzyl)ethylenediamine-N,N'-diacetic acid, etc.

此外,以可作為有機酸來使用的羧酸而言,係列舉:甲酸、乙醇酸、丙酸、乙酸、丁酸、異戊酸、己烷酸、草酸、丙二酸、戊二酸、己二酸、蘋果酸、琥珀酸、庚二酸、巰基乙酸、乙醛酸、氯化乙酸、丙酮酸、乙醯基乙酸、戊二酸等飽和羧酸;或丙烯酸、甲基丙烯酸、丁烯酸、反丁烯二酸、順丁烯二酸、中康酸、檸康酸、烏頭酸等不飽和羧酸;苯甲酸類、甲基苯甲酸、苯二甲酸 類、萘甲酸類、均苯四甲酸、萘二甲酸等環不飽和羧酸等。 In addition, in terms of carboxylic acids that can be used as organic acids, formic acid, glycolic acid, propionic acid, acetic acid, butyric acid, isovaleric acid, hexane acid, oxalic acid, malonic acid, glutaric acid, hexanoic acid, etc. Saturated carboxylic acids such as diacid, malic acid, succinic acid, pimelic acid, thioglycolic acid, glyoxylic acid, chlorinated acetic acid, pyruvic acid, acetylacetic acid, glutaric acid; or acrylic acid, methacrylic acid, crotonic acid , fumaric acid, maleic acid, mesaconic acid, citraconic acid, aconitic acid and other unsaturated carboxylic acids; benzoic acids, methylbenzoic acid, phthalic acid Cyclic unsaturated carboxylic acids such as naphthoic acids, pyromellitic acid, naphthalene dicarboxylic acid, etc.

以氧化劑而言,可使用例如:過氧化氫、過氧化物、硝酸鹽、碘酸鹽、過碘酸鹽、次亞氯酸鹽、亞氯酸鹽、氯酸鹽、過氯酸鹽、過硫酸鹽、重鉻酸鹽、過錳酸鹽、鈰酸鹽、釩酸鹽、臭氧水及銀(二價)鹽、鐵(三價)鹽;及其有機錯合物鹽等。 As an oxidizing agent, for example: hydrogen peroxide, peroxide, nitrate, iodate, periodate, hypochlorite, chlorite, chlorate, perchlorate, perchlorate, Sulfate, dichromate, permanganate, cerate, vanadate, ozone water, silver (divalent) salt, iron (trivalent) salt; and organic complex salts, etc.

此外,在切削液亦可混合防蝕劑。藉由混合防蝕劑,可防止QFN基板10所含有的金屬腐蝕(熔析)。以防蝕劑而言,以使用例如分子內具有3個以上氮原子而且具有縮合環構造的雜芳環化合物、或分子內具有4個以上氮原子的雜芳環化合物為佳。此外,芳環化合物係以含有:羧基、磺酸基、羥基、烷氧基為佳。具體而言,較佳為四唑衍生物、1,2,3-三唑衍生物、及1,2,4-三唑衍生物。 In addition, anti-corrosion agent can also be mixed in cutting fluid. By mixing the anticorrosion agent, the corrosion (melting out) of the metal contained in the QFN substrate 10 can be prevented. As a corrosion inhibitor, it is preferable to use, for example, a heteroaromatic compound having 3 or more nitrogen atoms in the molecule and having a condensed ring structure, or a heteroaromatic compound having 4 or more nitrogen atoms in the molecule. In addition, the aromatic ring compound preferably contains: carboxyl, sulfonic acid, hydroxyl, and alkoxy. Specifically, tetrazole derivatives, 1,2,3-triazole derivatives, and 1,2,4-triazole derivatives are preferable.

以可作為防蝕劑來使用的四唑衍生物而言,係列舉:在形成四唑環的氮原子上不具取代基,而且在四唑的5位導入以選自由:磺酸基、胺基、胺甲醯基、羧酸醯胺基、胺磺醯基、及磺醯胺基所成群組的取代基,或選自由:羥基、羧基、磺酸基、胺基、胺甲醯基、羧酸醯胺基、胺磺醯基、及磺醯胺基所成群組的至少1個取代基所取代的烷基者。 In terms of tetrazole derivatives that can be used as corrosion inhibitors, the series include: no substituent on the nitrogen atom forming the tetrazole ring, and introduced at the 5-position of the tetrazole to be selected from: sulfonic acid group, amine group, Carboxylic acid amido group, carboxylic acid amido group, sulfamoyl group, and substituent group of sulfonamide group, or selected from: hydroxyl, carboxyl, sulfonic acid group, amino group, carboxyl group, carboxyl group An alkyl group substituted with at least one substituent of the group consisting of an acid amide group, an sulfamoyl group, and a sulfonamide group.

此外,以可作為防蝕劑來使用的1,2,3-三唑衍生物而言,係列舉:在形成1,2,3-三唑環的氮原子上不具取代基,而且在1,2,3-三唑的4位及/或5位導入以選自 由:羥基、羧基、磺酸基、胺基、胺甲醯基、羧酸醯胺基、胺磺醯基、及磺醯胺基所成群組的取代基,或選自由:羥基、羧基、磺酸基、胺基、胺甲醯基、羧酸醯胺基、胺磺醯基、及磺醯胺基所成群組的至少1個取代基所取代的烷基或芳基者。 In addition, for the 1,2,3-triazole derivatives that can be used as corrosion inhibitors, the series include: there is no substituent on the nitrogen atom forming the 1,2,3-triazole ring, and the 1,2 , the 4- and/or 5-position of 3-triazole is introduced to be selected from A substituent group consisting of: hydroxyl, carboxyl, sulfonic acid, amino, carbamoyl, carboxylic acid amido, sulfamoyl, and sulfonamide, or selected from: hydroxyl, carboxyl, An alkyl or aryl group substituted with at least one substituent from the group consisting of a sulfonic acid group, an amino group, a carbamoyl group, a carboxylic acid amido group, an sulfamoyl group, and a sulfonamide group.

此外,以可作為防蝕劑來使用的1,2,4-三唑衍生物而言,係列舉:在形成1,2,4-三唑環的氮原子上不具取代基,而且在1,2,4-三唑的2位及/或5位導入以選自由:磺酸基、胺甲醯基、羧酸醯胺基、胺磺醯基、及磺醯胺基所成群組的取代基,或選自由:羥基、羧基、磺酸基、胺基、胺甲醯基、羧酸醯胺基、胺磺醯基、及磺醯胺基所成群組的至少1個取代基所取代的烷基或芳基者。 In addition, for the 1,2,4-triazole derivatives that can be used as corrosion inhibitors, the series include: there is no substituent on the nitrogen atom forming the 1,2,4-triazole ring, and the 1,2 , the 2-position and/or 5-position of 4-triazole are introduced to be selected from the group consisting of sulfonic acid group, carbamoyl group, carboxylic acid amido group, sulfamoyl group, and sulfonamide group , or substituted by at least one substituent selected from the group consisting of: hydroxyl, carboxyl, sulfonic acid, amino, carbamoyl, carboxylic acid amido, sulfamoyl, and sulfonamide Alkyl or aryl.

如上所述,在由切削液供給噴嘴56被供給的切削液中含有氧化劑,因此因該氧化劑,在習知之使用微生物的生物處理中,微生物會死滅,而有無法分解切削廢液中的有機物而將未符合排液基準的切削廢液進行排液之虞。 As mentioned above, the cutting fluid supplied from the cutting fluid supply nozzle 56 contains an oxidizing agent. Therefore, due to the oxidizing agent, in the conventional biological treatment using microorganisms, the microorganisms will die, and the organic matter in the cutting waste fluid cannot be decomposed. There is a risk of draining cutting waste fluid that does not meet the drainage criteria.

但是,在本實施形態中,由於在排液管82的途中設有具有廢液處理手段的廢液處理槽84,因此由複數LED86對貯留在處理槽84內的切削廢液照射紫外線,而可將切削廢液中的有機物進行分解,因此可防止將未符合排液基準的切削廢液進行排液之虞。 However, in the present embodiment, since the waste liquid treatment tank 84 having a waste liquid treatment means is provided in the middle of the drain pipe 82, the cutting waste liquid stored in the treatment tank 84 is irradiated with ultraviolet rays by a plurality of LEDs 86, so that Organic matter in the cutting waste fluid is decomposed, so the risk of draining the cutting waste fluid that does not meet the drainage standards can be prevented.

在上述之實施形態中,係說明採用封裝體基板2作為被加工物之例,惟被加工物並非為限定於封裝體 基板者,亦可為包含積層有作為背面電極之厚度數μm的導電體膜(由Ti、Ni、Au等所成之多層金屬膜)的晶圓、在表面的切割道(street)上形成有TEG的晶圓等者。 In the above-mentioned embodiment, an example of using the package substrate 2 as the object to be processed was described, but the object to be processed is not limited to the package The substrate can also be a wafer including a conductor film (a multilayer metal film made of Ti, Ni, Au, etc.) laminated with a thickness of several μm as the back electrode, and a dicing line (street) formed on the surface TEG wafers and others.

當以具備有具有作為上述廢液處理手段之LED86的廢液處理槽84的切削裝置20,一邊供給包含有機酸及氧化劑的切削液一邊切削封裝體基板2時,在氧化劑的分解,利用具有分解波長的光能量,而非添加劑,藉此不需要添加劑或溫度管理而可將運轉成本抑制較低。 When the cutting device 20 equipped with the waste liquid treatment tank 84 having the LED 86 as the above-mentioned waste liquid treatment means cuts the package substrate 2 while supplying cutting fluid containing an organic acid and an oxidizing agent, the decomposition of the oxidizing agent utilizes the The light energy of the wavelength is not additive, so that no additive or temperature management is required and the running cost can be kept low.

在上述之實施形態中,係說明將由LED86照射紫外線的廢液處理槽84使用在切削裝置的廢液處理之例,惟廢液處理槽84並非為限定於切削裝置者,亦可同樣地適用在研削裝置、切削刀具切削裝置等其他加工裝置。 In the above-mentioned embodiment, the example in which the waste liquid treatment tank 84 irradiated with ultraviolet rays by the LED 86 is used for the waste liquid treatment of the cutting device is described, but the waste liquid treatment tank 84 is not limited to the cutting device, and can be similarly applied to Grinding device, cutting tool cutting device and other processing devices.

82:排液管 82: drain pipe

84:廢液處理槽 84: waste liquid treatment tank

86:LED 86:LED

88:透明板 88:Transparent board

Claims (1)

一種加工裝置,其係具備有:保持被加工物的保持手段、及將被保持在該保持手段的被加工物進行加工的加工手段,該加工裝置之特徵為:另外具備有:加工液供給手段,其係當將被保持在該保持手段的被加工物以該加工手段進行加工時,至少對被加工物供給含有氧化劑的加工液;加工廢液回收部,其係位於該加工裝置的基座的內部,回收包含由該加工液供給手段被供給至被加工物的該加工液的加工廢液;排出路,其係位於該加工裝置的基座的內部,由該加工廢液回收部,將該加工廢液排出至該加工裝置外;及處理槽,其係被配設在該排出路的途中且貯留在該加工廢液回收部被回收的加工廢液,且具有將該加工廢液所包含的加工液進行分解的廢液處理手段,該氧化劑係過氧化氫,該廢液處理手段係包含:對該加工廢液照射紫外線的紫外線照射手段。 A processing device comprising: a holding means for holding a workpiece, and a processing means for processing the workpiece held by the holding means, the processing device is characterized by further comprising: a processing fluid supply means , which is to supply at least a processing liquid containing an oxidizing agent to the processed object when the processed object held in the holding means is processed by the processing means; the processing waste liquid recovery part is located at the base of the processing device The interior of the processing liquid is used to recover the processing waste liquid containing the processing liquid supplied to the workpiece by the processing liquid supply means; the discharge path is located inside the base of the processing device, and the processing waste liquid recovery part The processing waste liquid is discharged to the outside of the processing device; and a processing tank, which is arranged in the middle of the discharge path and stores the processing waste liquid recovered in the processing waste liquid recovery part, and has a storage tank for the processing waste liquid The waste liquid treatment means for decomposing the included processing liquid, the oxidizing agent is hydrogen peroxide, and the waste liquid treatment means includes: ultraviolet irradiation means for irradiating ultraviolet rays to the processing waste liquid.
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