TWI777740B - Correction apparatus, correction method, and handler using the same - Google Patents
Correction apparatus, correction method, and handler using the same Download PDFInfo
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本發明有關一種以接觸式檢知複數個作業器於複數個方向上之位置,利於補償校正複數個作業器之實際作業位置,而提高作業精準性之校正裝置及校正方法。 The present invention relates to a calibration device and a calibration method for detecting the positions of a plurality of working devices in a plurality of directions by a contact type, which is beneficial to compensate and correct the actual working positions of the plurality of working devices and improve the accuracy of operation.
在現今,作業機以作業機構(如移料機構或打印機構等)之作業器(如移料器或打印器等)於不同承置器(如料盤、載台、測試器或預溫盤等)對電子元件執行預設作業(如取放料作業或打印作業等)。舉一為移料機構之作業機構為例,移料機構具有複數個移料器,並位移至預設作業位置而執行複數個電子元件之取放料作業,由於電子元件日趨精密微小,因此,對於複數個移料器同步將複數個電子元件移入載台之複數個容置槽的作業位置精準度要求相當高;然移料機構於更換一批次複數個移料器、複數個移料器取放精度有異或移料器撞機等因素下,移料器之作業位置易發生異常;例如移料器因傾斜組裝,而導致複數個移料器之間距發生異常;例如移料器因裝配高度不足,導致取放料高度作業位置異常;前述異常狀態均使移料器無法精準取放電子元件,業者必須對移料機構之複數個移料器的作業位置精準度作一檢知校正。 At present, the working machine uses the working device (such as a feeder or a printer) of the working mechanism (such as a feeding mechanism or a printing mechanism) on different holders (such as a tray, a carrier, a tester or a pre-warming tray). etc.) perform preset jobs (such as pick-and-place jobs or print jobs, etc.) on electronic components. Take an operation mechanism of a material-moving mechanism as an example. The material-moving mechanism has a plurality of material movers, and moves to a preset operation position to perform picking and unloading operations of a plurality of electronic components. The accuracy of the operation position of the plurality of feeders to simultaneously move the plurality of electronic components into the plurality of accommodating slots of the carrier is quite high; however, the feeding mechanism is required to replace the plurality of feeders and the plurality of feeders in one batch. When the pick-and-place accuracy is different or the feeder collides with the machine, the working position of the feeder is prone to abnormal; The assembly height is insufficient, resulting in abnormal working position of the pick-and-place height; the aforementioned abnormal conditions make the feeder unable to accurately pick and place electronic components, and the operator must make a detection and correction of the working position accuracy of the multiple feeders of the feeding mechanism .
本發明之目的一,提供一種校正裝置,以供校正複數個作業器之位置,校正裝置包含承具、第一位置校正器及第二位置校正器,承具為固定式配置,並於上方構成檢知區域,第一位置校正器裝配於承具之第一檢知位置,並設有可供壓接之第一承壓件,第二位置校正器裝配於承具之第二檢知位置,並設有可供壓接之第二承壓件;複數個作業器於承具之檢知區域沿第一方向位移以壓接第一位置校正器之第一承壓件,使第一位置校正器以接觸式檢知複數個作業器於第一方向上的位置,複數個作業器於承具之檢知區域沿第二方向位移以壓接第二位置校正器之第二承壓件,使第二位置校正器檢知複數個作業器於第二方向上之位置,藉以取得複數個作業器之位置偏差值,利於補償校正複數個作業器之實際作業位置,進而提高作業精準性。 The first objective of the present invention is to provide a calibration device for calibrating the positions of a plurality of operating tools. The calibration device includes a holder, a first position corrector and a second position corrector. The holder is fixedly arranged and is formed above In the detection area, the first position corrector is assembled at the first detection position of the holder, and is provided with a first pressure-receiving piece for crimping, and the second position corrector is assembled at the second detection position of the holder, There is also a second pressure-bearing member for crimping; a plurality of operating devices are displaced along the first direction in the detection area of the bearing to crimp the first pressure-bearing member of the first position corrector to correct the first position The device detects the positions of the plurality of operators in the first direction by contact, and the plurality of operators are displaced along the second direction in the detection area of the bearing to press the second pressure-bearing member of the second position corrector, so that the The second position corrector detects the positions of the plurality of working devices in the second direction, thereby obtaining the position deviation values of the plurality of working devices, which is beneficial to compensate and correct the actual working positions of the plurality of working devices, thereby improving the operation accuracy.
本發明之目的二,提供一種校正裝置,更包含至少一高度校正器,高度校正器檢知位於承具之檢知區域的複數個作業器於第三方向上的位置(作業高度位置),以取得高度位置偏差值,利於補償校正複數個作業器之實際作業高度位置,進而提高作業精準性。 The second object of the present invention is to provide a calibration device, further comprising at least one height calibrator, and the height calibrator detects the positions (working height positions) of a plurality of operators located in the detection area of the support in the third direction to obtain The height position deviation value is helpful for compensating and correcting the actual working height position of multiple working tools, thereby improving the working accuracy.
本發明之目的三,提供一種校正裝置,更包含第一調整器及第二調整器,第一調整器及第二調整器裝配於承具,並各別承裝第一位置校正器及第二位置校正器,第一調整器及第二調整器依作業需求而分別調整第一位置校正器及第二位置校正器之裝配位置,進而提高校正作業精準性。 The third object of the present invention is to provide a calibration device, further comprising a first adjuster and a second adjuster, the first adjuster and the second adjuster are assembled on a support, and respectively support the first position adjuster and the second adjuster The position corrector, the first adjuster and the second adjuster adjust the assembling positions of the first position corrector and the second position corrector respectively according to the operation requirements, thereby improving the accuracy of the correcting operation.
本發明之目的四,提供一種校正方法,以供校正複數個作業器之位置,包含第一移載作業器程序、第二移載作業器程序、第一檢知程序、第二檢知程序及比對程序;第一移載作業器程序以移載複數個作業器於承具上方之檢知區域沿第一方向位移;第一檢知程序以第一位置校正器於承具之第一檢知 位置以第一承壓件承受作業器之壓接,而作接觸式檢知複數個作業器於第一方向上之位置;第二移載作業器程序以移載複數個作業器於承具上方之檢知區域沿第二方向位移;第二檢知程序以第二位置校正器於承具之第二檢知位置以第二承壓件承受作業器之壓接,而作接觸式檢知複數個作業器於第二方向上之位置;比對程序以處理器接收第一檢知程序及第二檢知程序傳輸之複數個作業器位置資料,以分析複數個作業器於第一方向及第二方向上之位置,而取得複數個作業器之位置偏差值,並補償校正複數個作業器之實際作業位置,進而提高作業精準性。 The fourth object of the present invention is to provide a calibration method for calibrating the positions of a plurality of operators, including a first transfer operator program, a second transfer operator program, a first detection process, a second detection process and The comparison procedure; the first transfer operation procedure is used to transfer a plurality of operational instruments to the detection area above the carrier, and the detection area is displaced along the first direction; Know The position is that the first pressure-receiving part is used to receive the crimping of the operator, and the position of the plurality of operators in the first direction is detected by contact; the second transfer operator program is used to transfer the plurality of operators above the carrier The detection area is displaced along the second direction; in the second detection process, the second position corrector is placed at the second detection position of the holder, and the second pressure-bearing member is subjected to the pressing of the operating tool, and the multiple contact detection is performed. The positions of the plurality of operators in the second direction; the comparison program uses the processor to receive a plurality of operator position data transmitted by the first detection process and the second detection process, so as to analyze the plurality of operators in the first direction and the second detection process. The position in the two directions can obtain the position deviation value of a plurality of operating devices, and compensate and correct the actual operating positions of the plurality of operating devices, thereby improving the operation accuracy.
本發明之目的五,提供一種校正方法,更包含至少一前置程序,前置程序係預設一位於檢知區域之作業器的中心位置作為校正初始位置,以供其他作業器以校正初始位置為基準作至少一方向位移。 The fifth object of the present invention is to provide a calibration method, further comprising at least one pre-program, the pre-program is to preset a central position of a working device in the detection area as the calibration initial position for other operators to calibrate the initial position Make at least one direction displacement as the reference.
本發明之目的六,提供一種校正方法,更包含第三移載作業器程序及第三檢知程序,第三移載作業器程序以移載複數個作業器於承具之檢知區域沿第三方向位移預設高度值;第三檢知程序以高度校正器檢知複數個作業器於第三方向上之位置;比對程序以處理器接收第三檢知程序傳輸之複數個作業器位置資料,藉以取得複數個作業器之高度位置偏差值,並補償校正作業器之實際高度作業位置,進而提高作業精準性。 The sixth object of the present invention is to provide a calibration method, further comprising a third transfer operator program and a third detection program, wherein the third transfer operator program is used to transfer a plurality of operators to the detection area of the carrier along the first The three-direction displacement preset height value; the third detection program uses the height corrector to detect the positions of the plurality of operators in the third direction; the comparison process uses the processor to receive the position data of the plurality of operators transmitted by the third detection program , so as to obtain the height position deviation value of a plurality of operating machines, and compensate and correct the actual height working position of the operating machines, thereby improving the operation accuracy.
本發明之目的七,提供一種作業機,包含機台、至少一作業裝置、本發明校正裝置及中央控制裝置,至少一作業裝置配置於機台,並設有至少一承置器及至少一作業機構,至少一承置器供承置複數個電子元件,作業機構設有複數個作業器,以供對複數個電子元件執行預設作業;本發明校正裝置配 置於機台,以供校正複數個作業器之位置;中央控制裝置以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。 The seventh object of the present invention is to provide a working machine, which includes a machine base, at least one working device, a calibration device of the present invention, and a central control device. At least one working device is arranged on the machine base and is provided with at least one holder and at least one working device Mechanism, at least one holder is used to accommodate a plurality of electronic components, and the operating mechanism is provided with a plurality of operators for performing preset operations on a plurality of electronic components; the calibration device of the present invention is equipped with It is placed on the machine for correcting the positions of multiple operators; the central control device controls and integrates the actions of each device to perform automated operations and achieve practical benefits of improving operational efficiency.
10:機台 10: Machine
20:作業裝置 20: Working device
21:供料器 21: Feeder
22:收料器 22: Receiver
23:第一移料機構 23: The first moving mechanism
231:移動臂 231: Moving Arm
232:變距單元 232: Variable pitch unit
2331:第一移料器 2331: First mover
2332:第二移料器 2332: Second mover
2333:第三移料器 2333: Third mover
2334:第四移料器 2334: Fourth mover
2341:第一升降器 2341: First Lifter
2342:第二升降器 2342: Second lifter
2343:第三升降器 2343: Third Lifter
2344:第四升降器 2344: Fourth Lifter
24:測試器 24: Tester
25:第一載台 25: The first stage
26:壓接器 26: Crimper
27:第二載台 27: Second stage
28:第二移料機構 28: The second moving mechanism
29:測試室 29: Test Room
30:校正裝置 30: Correction device
31:承具 31: Bearing
311:通孔 311: Through hole
32:第一位置校正器 32: First position corrector
321:第一承壓件 321: The first pressure-bearing part
322:第一感知件 322: First Perception Piece
323:第一絕緣件 323: First insulation
324:第一空間 324: First Space
L1:第一檢知軸線 L1: The first detection axis
33:第二位置校正器 33: Second position corrector
331:第二承壓件 331: The second pressure-bearing part
332:第二感知件 332: Second Perception Piece
333:第二絕緣件 333: Second insulation
334:第二空間 334: Second Space
L2:第二檢知軸線 L2: Second detection axis
341:第一調整器 341: First Adjuster
342:第二調整器 342: Second Adjuster
35:高度校正器 35: Altitude Corrector
36:第三調整器 36: Third Adjuster
圖1:本發明作業機之配置圖。 Figure 1: The configuration diagram of the working machine of the present invention.
圖2:本發明移料機構之示意圖。 Figure 2: Schematic diagram of the material-moving mechanism of the present invention.
圖3:本發明校正裝置之俯視圖。 Figure 3: A top view of the calibration device of the present invention.
圖4:本發明校正裝置之側視圖。 Figure 4: A side view of the correction device of the present invention.
圖5:本發明校正方法之流程圖。 FIG. 5 is a flow chart of the calibration method of the present invention.
圖6:移料器位於檢知區域之校正初始位置的示意圖。 Figure 6: Schematic diagram of the corrected initial position of the feeder in the detection area.
圖7:校正移料器於第一方向上的位置之示意圖。 Figure 7: A schematic diagram of correcting the position of the feeder in the first direction.
圖8:校正移料器復位之示意圖。 Figure 8: Schematic diagram of the calibration shifter reset.
圖9:校正移料器於第二方向上的位置之示意圖。 Figure 9: Schematic diagram of correcting the position of the feeder in the second direction.
圖10:校正移料器於第三方向上的位置之示意圖。 Figure 10: Schematic diagram of correcting the position of the feeder in the third direction.
為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:請參閱圖1~4,本發明作業機包含機台10、至少一作業裝置20、至少一本發明校正裝置30及中央控制裝置(圖未示出)。至少一作業裝置20配置於機台10,並設有至少一承置器及至少一作業機構,至少一承置器以供承置複數個電子元件,至少一作業機構設有複數個作業器,以供對複數個電子元件執行預設作業;本發明校正裝置30配置於機台10,以供校正作業機構之複數個作
業器於複數個方向的位置;中央控制裝置以供控制及整合各裝置作動,以執行自動化作業。依作業需求,作業裝置20之承置器可為供料器、收料器、載台、測試器或預溫盤等,以供盛裝複數個電子元件;作業裝置20之作業機構可為移料機構、壓接機構或打印機構等,作業器可為移料器、壓接器或打印器等,不受限於本實施例。
In order to make your examiners have a further understanding of the present invention, a preferred embodiment is hereby exemplified in conjunction with the drawings. The detailed description is as follows: Please refer to FIGS. 1-4. The working machine of the present invention includes a
為清楚說明本案,本案所稱之第一方向或第二方向可為X方向或Y方向,本案實施例所述之第一方向為X方向,第二方向為Y方向,第三方向為Z方向;檢知軸線之方向相同於作業器之移動方向。 In order to clearly illustrate this case, the first direction or the second direction referred to in this case may be the X direction or the Y direction, the first direction described in the embodiments of this case is the X direction, the second direction is the Y direction, and the third direction is the Z direction. ; The direction of the detection axis is the same as the moving direction of the working tool.
於本實施例,作業裝置20包含供料器21、收料器22、一為第一移料機構23之作業機構、測試器24、第一載台25、壓接器26、第二載台27及另一為第二移料機構28之作業機構、溫控機構(圖未示出)及測試室29。供料器21供盛裝複數個待測之電子元件;收料器22供盛裝複數個已測之電子元件;第一移料機構23與第二移料機構28之設計相同,茲舉第一移料機構23為例,第一移料機構23設有移動臂231、變距單元232及複數個為移料器之作業器,移動臂231帶動變距單元232及複數個移料器作X-Y方向位移及較大行程之Z方向位移,複數個移料器包含第一移料器2331、第二移料器2332、第三移料器2333及第四移料器2334,並以固定配置之第二移料器2332作為變距基準,第一移料器2331、第三移料器2333及第四移料器2334連接變距單元232,依作業需求,變距單元232驅動第一移料器2331、第三移料器2333及第四移料器2334以第二移料器2332為基準作X方向位移預設間距值而改變間距;又第一移料器2331、第二移料器2332、第三移料器2333及第四移料器2334分別連接第一升降器2341、第二升降器2342、第三升降器2343及第四升降器2344,以供作Z方向位移至預設高度作業
位置而取放電子元件;因此,第一移料機構23以移動臂231帶動第一移料器2331、第二移料器2332、第三移料器2333及第四移料器2334於供料器21取出複數個待測之電子元件。
In this embodiment, the working
測試器24包含電性連接之電路板及具探針之測試座,以供測試電子元件,第一載台25以供載送待測之電子元件作至少一方向位移,舉例第一載台25可載送待測電子元件至測試器24之側方,舉例第一載台25可載送待測電子元件至測試器24之下方;於本實施例,第一載台25以供第一移料機構23之第一移料器2331、第二移料器2332、第三移料器2333及第四移料器2334移入複數個待測電子元件,並將複數個待測電子元件移載至測試器24之側方;壓接器26於第一載台25取出複數個待測之電子元件,以移載且下壓複數個待測電子元件於測試器24執行測試作業,測試室29罩置於測試器24之外部,於冷測作業時,以流體輸送管(圖未示出)輸送乾燥空氣至測試室29,溫控機構(圖未示出)於壓接器26設有溫控件,以供溫控電子元件,使電子元件於模擬日後使用環境溫度下執行測試作業;於完測後,壓接器26將複數個已測電子元件由測試器24移載至第二載台27;第二載台27載出複數個已測之電子元件,第二移料機構28於第二載台27取出複數個已測之電子元件,並依據測試結果,將複數個已測之電子元件輸送至收料器22而分類收置;中央控制裝置(圖未示出)用以控制及整合各裝置作動,以執行自動化作業,進而提升作業效能。
The
然,作業裝置20依作業需求,可僅配置第一移料機構23,以第一移料機構23於供料器21及收料器22移載待測電子元件及已測電子元件,亦無不可。作業裝置20依作業需求,可僅配置第一載台25,以第一載台25載送待測電子元件及已測電子元件,亦無不可。作業裝置20依作業需求,壓接器26可作單
一方向或複數個方向位移,舉例壓接器26可搭配移料機構作動,移料機構將待測電子元件移入測試器24,壓接器26作單一方向位移僅執行下壓動作,亦無不可。作業裝置20依作業需求,於熱測作業時,測試室29內可配置鼓風機,以供吹送熱風,使測試室29之內部升溫,亦無不可。作業裝置20依作業需求,而配置預溫盤,以供預溫待測之電子元件。
However, the
校正裝置30以供校正作業機構之複數個作業器於複數個方向上的位置;校正裝置30包含承具31、第一位置校正器32及第二位置校正器33。
The
承具31為固定式配置,並於上方構成檢知區域;更進一步,承具31可為座體、板體或機台板;於本實施例,承具31為板體,其頂面為平面,並於上方構成一檢知區域;另於承具31開設至少一通孔311,通孔311由承具31之底面貫通至頂面,且相通至檢知區域。
The
第一位置校正器32沿呈第一方向之第一檢知軸線L1裝配於承具31之第一檢知位置,並設有至少一可供壓接之第一承壓件321,作業器於承具31之檢知區域沿第一方向位移,第一位置校正器32以第一承壓件321於第一檢知位置作接觸式檢知該作業器於第一方向上的位置;更進一步,第一位置校正器32可為壓力型感測器或導電型感測器;第一承壓件321可為塊體、片體或面部;該第一位置校正器32包含第一承壓件321及第一感知件322,第一感知件322裝配於承具31之第一檢知位置,第一承壓件321於受壓時接觸或連動第一感知件322;於本實施例,第一位置校正器32為導電型感測器,包含第一承壓件321、第一感知件322及第一絕緣件323,第一感知件322連接一處理器(圖未示出),並沿呈X方向之第一檢知軸線L1裝配於承具31第一側之第一檢知位置,第一感知件322之第一面於兩側設有第一絕緣件323,二第一絕緣件323供架置第一承壓件321,第一
承壓件321為金屬彈片而可受壓彈性彎曲變形,第一承壓件321與第一感知件322間具有第一空間324,第一空間324以供作為第一承壓件321受壓彎曲變形之退位空間;於第一承壓件321未受壓時,第一承壓件321與第一感知件322間呈斷電狀態,於第一承壓件321受壓時,第一承壓件321與第一感知件322間呈導通狀態,第一位置校正器32可於承具31之第一檢知位置,藉由第一承壓件321受壓以導通第一感知件322,而作接觸式檢知該作業器於第一方向上的位置。
The
第二位置校正器33沿呈第二方向之第二檢知軸線L2裝配於承具31之第二檢知位置,並設有至少一可供壓接之第二承壓件331,作業器於承具31之檢知區域沿第二方向位移,第二位置校正器33以第二承壓件331於第二檢知位置作接觸式檢知該作業器於第二方向上的位置;更進一步,第二位置校正器33可為壓力型感測器或導電型感測器,第二承壓件331可為塊體、片體或面部;該第二位置校正器33包含第二承壓件331及第二感知件332,第二感知件332裝配於承具31之第二檢知位置,第二承壓件331於受壓時接觸或連動第二感知件332;於本實施例,第二位置校正器33為導電型感測器,包含第二承壓件331、第二感知件332及第二絕緣件333,第二感知件332連接處理器(圖未示出),並沿呈Y方向之第二檢知軸線L2裝配於承具31第二側之第二檢知位置,第二側相鄰第一側,第二感知件332之第一面於兩側設有第二絕緣件333,二第二絕緣件333供架置第二承壓件331,第二承壓件331為金屬彈片而可受壓彈性彎曲變形,第二承壓件331與第二感知件332間具有第二空間334,第二空間334以供作為第二承壓件331受壓彎曲變形之退位空間;於第二承壓件331未受壓時,第二承壓件331與第二感知件332間呈斷電狀態,於第二承壓件331受壓時,第二承壓件331與第二感知件332間呈導通狀態,第二位置校正器33可於承具31之第二檢知位置,藉由第二
承壓件331受壓以導通第二感知件332,而作接觸式檢知該作業器於第二方向上的位置。
The
校正裝置30更包含第一調整器341及第二調整器342,第一調整器341及第二調整器342裝配於承具31,並各別承裝第一位置校正器32及第二位置校正器33,第一調整器341及第二調整器342依作業需求而分別調整第一位置校正器32及第二位置校正器33之裝配位置(如裝配高度位置),以提高校正作業準確性。於本實施例,第一調整器341裝配於承具31之第一側,以供架置第一位置校正器32,並可調整第一位置校正器32之裝配位置及高度;第二調整器342裝配於承具31之第二側,以供架置第二位置校正器33,並可調整第二位置校正器33之裝配位置及高度。
The
校正裝置30更包含至少一高度校正器35,高度校正器35檢知位於承具31之檢知區域的作業器於第三方向上的位置;高度校正器35可作接觸式或非接觸式檢知作業器於第三方向上的位置,舉例高度校正器35為反射型感測器,並裝配於承具31之通孔311下方,而作非接觸式檢知作業器於第三方向上的位置;舉例高度校正器35為導電型感測器,並裝配於承具31之頂面,而作接觸式檢知作業器於第三方向上的位置;於本實施例,高度校正器35為反射型感測器,並配置承具31之通孔311下方,高度校正器35可經通孔311由下向上朝檢知區域投射光束,並接收反射之光束。
The
校正裝置30更包含至少一第三調整器36,以供裝配高度校正器35,並調整高度校正器35之裝配高度。
The
承上述,承具31可於頂面設有凹槽,並於凹槽之第一側面及第二側面分別裝配第一位置校正器32及第二位置校正器33,亦無不可;更進一步,
於凹槽之底面開設通孔311,以供高度校正器35檢知作業器於第三方向上之位置(作業高度位置)。
In view of the above, the
請參閱圖2、5~10,本發明之校正方法包含第一移載作業器程序、第一檢知程序、第二移載作業器程序、第二檢知程序及比對程序。第一移載作業器程序以移載複數個作業器於承具31上方之檢知區域沿第一方向位移;第一檢知程序以第一位置校正器32於承具31之第一檢知位置以第一承壓件321承受作業器之壓接,而作接觸式檢知複數個作業器於第一方向上之位置;第二移載作業器程序以移載複數個作業器於承具31上方之檢知區域沿第二方向位移;第二檢知程序以第二位置校正器33於承具31之第二檢知位置以第二承壓件331承受作業器之壓接,而作接觸式檢知複數個作業器於第二方向上之位置;比對程序以處理器接收第一檢知程序及第二檢知程序傳輸之複數個作業器位置資料,以分析複數個作業器於第一方向及第二方向上之位置,而取得複數個作業器之位置偏差值,並補償校正複數個作業器之實際作業位置,進而提高作業精準性。
2, 5-10, the calibration method of the present invention includes a first transfer operator program, a first detection process, a second transfer operator program, a second detection process, and a comparison process. The first transfer operation process is to transfer a plurality of operators to the detection area above the
本發明校正方法更包含第三移載作業器程序及第三檢知程序,第三移載作業器程序位於該比對程序之前,並以移載複數個作業器於承具31上方之檢知區域沿第三方向位移預設高度值;第三檢知程序以高度校正器35檢知複數個作業器於第三方向上之位置,比對程序以處理器接收第三檢知程序傳輸之複數個作業器位置資料,藉以取得複數個作業器之高度位置偏差值,並補償校正作業器之實際高度作業位置。然依作業需求及位置校正器之型式,第一移載作業器程序更包含第一微動手段,第一微動手段以作業器再沿第一方向作微動位移,以供第一檢知程序檢知作業器微動後之位置,以及供比對程序分析微動後之位置資料,亦可取得作業器於第一方向上之位置偏差值;第二移載作業器
程序更包含第二微動手段,第二微動手段以作業器再沿第二方向作微動位移,以供第二檢知程序檢知作業器微動後之位置,以及供比對程序分析微動後之位置資料,亦可取得作業器於第二方向上之位置偏差值;第三移載作業器程序更包含第三微動手段,第三微動手段以作業器再沿第三方向作微動位移,以供第三檢知程序檢知作業器微動後之位置,以及供比對程序分析微動後之位置資料,亦可取得作業器於第三方向上之高度位置偏差值。
The calibration method of the present invention further includes a third transfer operator program and a third detection process. The third transfer operator program is located before the comparison process, and is used for detecting by transferring a plurality of operators above the
校正方法更包含前置程序,前置程序位於第一移載作業器程序之前,並預設一位於檢知區域之作業器的中心位置作為校正初始位置,以供其他作業器以校正初始位置為基準而位移;更進一步,該預設之一作業器可為複數個作業器之其中一個作業器,例如固定式作業器或第一支作業器,校正初始位置可相同或相異承具31之中心位置;舉例預設之一作業器為固定式作業器,由於原點至承具31中心的距離為已知,並已知作業器之直徑,可將預設之固定式作業器由原點移動至承具31之中心,令固定式作業器之中心位置對位承具31之中心位置,即可以固定式作業器之中心位置(即承具31之中心位置)作為校正初始位置,以供其他作業器以固定式作業器之中心位置(即承具31之中心)為基準而位移預設間距值。
The calibration method further includes a pre-procedure, the pre-procedure is located before the procedure of the first transfer operator, and a central position of the operator in the detection area is preset as the calibration initial position, so that other operators can use the calibration initial position as Further, the preset one of the working devices can be one of a plurality of working devices, such as a fixed working device or a first working device, and the calibration initial position can be the same or different from that of the
請參閱圖6,於本實施例,檢知第一移料器2331、第二移料器2332、第三移料器2333及第四移料器2334之實際作業位置;由於原點至承具31中心的距離為已知,並已知各移料器之直徑,前置程序以固定式之第二移料器2332作為預設基準之作業器,將第二移料器2332由原點移動至承具31之中心位置,且位於檢知區域,令第二移料器2332之中心對位承具31之中心位置,處理器分析判斷以第二移料器2332之中心位置(即承具31之中心位置)作為校正初始
位置,而供第一移料器2331、第三移料器2333及第四移料器2334以校正初始位置為基準而位移預設間距值;以檢知第一移料器2331之實際作業位置為例,移動臂231帶動第一移料器2331於承具31之檢知區域沿第一方向(X方向)位移一預設之間距值至預設作業位置。
Please refer to FIG. 6 , in this embodiment, the actual operating positions of the
請參閱圖6、7,以檢知第一移料器2331於第一方向(X方向)上之位置為例,第一移載作業器程序以移動臂231帶動第一移料器2331於承具31上方之檢知區域沿第一方向(X方向)位移,令第一移料器2331壓接位於第一檢知位置之第一位置校正器32的第一承壓件321,第一承壓件321受壓後朝第一空間324彎曲變形,並接觸第一感知件322,第一承壓件321與第一感知件322呈導通狀態,第一感知件322並發出一訊號至處理器(圖未示出),由於第一移料器2331之直徑尺寸為已知,比對程序以處理器分析第一位置校正器32偵測到第一移料器2331之距離值,而判別第一移料器2331於第一方向(X方向)上之X座標位置是否正確,若處理器分析第一移料器2331之X座標位置異常,且為傾斜配置,由於第一移料器2331之直徑尺寸為已知,處理器可由距離值加以運算而取得第一移料器2331之X方向偏差值,以利補償校正第一移料器2331之實際作業位置;因此,以上述方法,可依序取得第三移料器2333及第四移料器2334於第一方向(X方向)上之位置(X座標值)。
Please refer to FIGS. 6 and 7 , for example, to detect the position of the
請參閱圖6、8、9,檢知第一移料器2331於第二方向(Y方向)上的位置之前,移動臂231帶動第一移料器2331於承具31上方之檢知區域沿第一方向(X方向)反向位移復位,第一位置校正器32之第一承壓件321彈性回復原狀,第一承壓件321與第一感知件322因未接觸而呈斷電狀態。以檢知第一移料器2331於第二方向(Y方向)上之位置為例,第二移載作業器程序以移動臂231帶動第一
移料器2331於承具31上方之檢知區域沿第二方向(Y方向)位移,令第一移料器2331壓接位於第二檢知位置之第二位置校正器33的第二承壓件331,第二承壓件331受壓後朝第二空間334彎曲變形,並接觸第二感知件332,第二承壓件331與第二感知件332呈導通狀態,第二感知件332並發出一訊號至處理器(圖未示出),由於第一移料器2331之直徑尺寸為已知,比對程序以處理器分析第二位置校正器33偵測到第一移料器2331之距離值,而判別第一移料器2331於第二方向(Y方向)上之Y座標位置是否正確,若處理器分析第一移料器2331之Y座標位置異常,且為傾斜配置,由於第一移料器2331之直徑尺寸為已知,處理器可由距離值加以運算而取得第一移料器2331之Y方向偏差值,以利補償校正第一移料器2331之實際作業位置;因此,以上述方法,可依序取得第三移料器2333及第四移料器2334於第二方向(Y方向)上之位置(Y座標值)。
Please refer to FIGS. 6 , 8 and 9 , before detecting the position of the
因此,於取得第一移料器2331、第三移料器2333及第四移料器2334之X-Y方向位置偏差值,並以第二移料器2332為基準,而分別調整補償第一移料器2331、第三移料器2333及第四移料器2334之實際作業位置。
Therefore, after obtaining the positional deviation values of the
請參閱圖10,校正移料器於第三方向(Z方向)上的位置,以校正第一移料器2331之實際高度作業位置為例,第三移載作業器程序以移動臂231帶動第一移料器2331位移至承具31之檢知區域且位於通孔311之上方,並以第一升降器2341帶動第一移料器2331沿第三方向(Z方向)向下位移一預設高度值;由於高度校正器35為反射型感測器,並位於承具31之通孔311下方,且朝通孔311投射光束;第三檢知程序之高度校正器35對第一移料器2331作非接觸式投射光束,並接收第一移料器2331所反射之光束,且傳輸一訊號至處理器;比對程序以處理器分析高度校正器35所接收光束之反射距離值,加以分析第一移料器2331
於第三方向(Z方向)上之高度位置是否正確,並取得第一移料器2331於第三方向上之高度位置偏差值,以補償校正第一移料器2331之實際高度作業位置;因此,以上述方法,可依序取得第二移料器2332、第三移料器2333及第四移料器2334於第三方向(Z方向)上之高度位置偏差值,並補償校正實際高度作業位置,進而提高作業精準性。
Please refer to FIG. 10 to correct the position of the feeder in the third direction (Z direction). Taking the calibration of the actual height working position of the
231:移動臂 231: Moving Arm
2331:第一移料器 2331: First mover
31:承具 31: Bearing
32:第一位置校正器 32: First position corrector
321:第一承壓件 321: The first pressure-bearing part
322:第一感知件 322: First Perception Piece
324:第一空間 324: First Space
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TW201710689A (en) * | 2015-09-10 | 2017-03-16 | Hon Tech Inc | Electronic part transportation correction method that enhances accuracy of parts transportation and testing quality |
TW201742809A (en) * | 2016-06-01 | 2017-12-16 | Seiko Epson Corp | Electronic component conveying apparatus and electronic component inspection apparatus capable of changing a holding operation according to the distance between the respective holding units |
TW202043126A (en) * | 2019-05-29 | 2020-12-01 | 日商精工愛普生股份有限公司 | Electronic component handler and electronic component tester |
TWM613580U (en) * | 2021-02-05 | 2021-06-21 | 興誠科技股份有限公司 | Laser processing system capable of quickly positioning robotic arm to three-dimensional coordinate system |
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