TW201018636A - An apparatus for correcting position of a user tray and a test handler - Google Patents

An apparatus for correcting position of a user tray and a test handler Download PDF

Info

Publication number
TW201018636A
TW201018636A TW97143220A TW97143220A TW201018636A TW 201018636 A TW201018636 A TW 201018636A TW 97143220 A TW97143220 A TW 97143220A TW 97143220 A TW97143220 A TW 97143220A TW 201018636 A TW201018636 A TW 201018636A
Authority
TW
Taiwan
Prior art keywords
unit
user tray
moving
tray
user
Prior art date
Application number
TW97143220A
Other languages
Chinese (zh)
Other versions
TWI363734B (en
Inventor
Hee-Rak Beom
Kyeong-Tae Kim
Original Assignee
Mirae Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mirae Corp filed Critical Mirae Corp
Priority to TW97143220A priority Critical patent/TWI363734B/en
Publication of TW201018636A publication Critical patent/TW201018636A/en
Application granted granted Critical
Publication of TWI363734B publication Critical patent/TWI363734B/en

Links

Landscapes

  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

The present invention relates to an apparatus for correcting position of a user tray including at least one first position member and at least one second position member that determine position of a user tray, a plate where the user tray is received, a first correcting unit that moves the user tray in a direction where the first position member is installed, a second correcting unit that moves the user tray in a direction where the second position member is installed, and an operating unit that operates the first correcting unit and the second correcting unit, which has a simple configuration, and moves a user tray to the accurate position, thereby reducing manufacturing costs and maintenance costs.

Description

201018636 九、發明說明: 【發明所屬之技術領域】 運機用於將封裳 晶片進行分類。 本發明係關於一種測試搬運機,該測試搬 a曰 片供應至測試機並透過分級將測試後的封裝 【先前技術】 試。測試搬運機可用於在封裝製程結束時對封裝晶片進行電測 封驗職麵⑴職域输讀妓、峨製程及 裝托銳含複數做容單元_容納封裝 測試搬運機將封裝晶片從用戶托 測試。這一過程被稱似托盤糟以進行 於取器^程。觀搬運機透過使用複數個 2=爾她嘱卿術伽噴嘴^ φ 一過=辟财封料㈣峨托触絲測試機。這 度定位板。位試機包含具有複數個插座的高精 晶片上進行電測試。 _裝晶片可與插座接觸藉以在封裝 在 溫 低、、^^的才。 室,以使得測試機可 的極端環境下對封裝晶片進行電測試。 傳輪至用戶托 201018636 過程被稱為、载製程'封裝晶片將依據·果被分 =且搬運機會基於所分級別將分級後的封叫 傳輸至相應的用戶鋪。職搬運贿做 來執行卸載製程。 魏個拾取器系統 卸載製 程中===r_烟於物程與 ❹ 厂第!圖」表示了—個位於測試搬運機中的儲存有複數個 戶托盤之堆疊機。並且「第2 ® * - 正後的狀態。 帛2圖」表不了用戶托盤之位置經過校 C,並且~人=圖」所7’堆疊機⑽可儲存複數_戶托盤 並且L3裝载堆疊機1(n、卸載 及傳輸單元104。 卩載堆且機1〇2、'_隹疊機103 粵堆:r運Γ的主框架(圖中未示出)中可安裝有複數個裝載 :板^。〜且裝載堆疊㈣包含她疊元件舰及裝载 托 卿㈣,卿 裝載板 搞 G12健補程概行處支#起肖戶減,並且裝載 板1012係以能夠上斗 衣戰 升和下降的方式安裝於測試搬運機的主框¥ 7 201018636 測試搬運機的主框架中還可安裝有複數個卸載堆疊機1〇2, 以使知谷納有測试後的封裝晶片之複數個用戶托盤可以依據測試 結果藉由分級被儲存於不同的位置。 . 裝卸載堆疊機1G2包含卸載堆疊元件1021及卸載板1022。 ; 卸載堆疊元件刪中可儲存有複數铜戶托盤C,該用戶托 * 盤c中容納有測試後的封裝晶片。 ❿、域板1022在卸載製程被執行處支擇起用戶托盤c,並且卸 載板1022係以能夠上升和下降的方式安裝於測試搬運機的主框 架中。 於緩衝堆疊機103中可儲存有複數個空的用戶托盤C。 傳輸單元1〇4能夠持有用戶托盤C,並且傳輸單元1〇4係以 能夠移動的方式安裝於職搬運機社框料。輸單元104201018636 IX. Description of the invention: [Technical field to which the invention pertains] The aircraft is used to classify the wafers. The present invention relates to a test handler which is supplied to a test machine and which is tested by grading the package after testing [Prior Art]. The test handler can be used to perform electrical test sealing on the package wafer at the end of the packaging process. (1) Field input, 峨 process, and loading of the capacitors. Included package test handlers package the package from the user test . This process is called a tray to carry out the process. Viewing the transporter through the use of a plurality of 2 = er 嘱 术 术 术 喷嘴 ^ φ φ = = 辟 辟 辟 辟 辟 辟 辟 辟 辟 辟 辟 辟 辟 辟 辟 辟 辟 辟 辟This is the positioning board. The bit tester consists of a high precision wafer with a plurality of sockets for electrical testing. _The wafer can be placed in contact with the socket to be packaged in a low temperature, ^^. The chamber is electrically tested to allow the package to be electrically tested in extreme environments. The transfer to the user support 201018636 process is called, the process of packaging 'packaged wafers will be divided according to the fruit and fruit = and the handling opportunity will transfer the classified seals to the corresponding user shop based on the graded level. The job is to carry out the unloading process. Wei picker system Unloading process ===r_Smoke in the material path and ❹ Factory first! The figure shows a stacker in a test handler that stores a plurality of pallets. And "The second ® * - the state after the back. 帛 2 map" does not indicate the position of the user tray passes the school C, and the ~ person = map" 7' stacker (10) can store the plural_house pallet and the L3 load stacker 1 (n, unloading and transmission unit 104. 卩 且 且 机 机 ' ' ' ' 103 103 103 103 粤 粤 粤 粤 粤 粤 粤 粤 粤 粤 粤 粤 粤 粤 粤 粤 粤 粤 r r r r r r r r r r r r r r ^. and the loading stack (four) contains her stack of component ships and loading caregiver (four), the Qing loading board engages G12 health replenishment general branch office #起肖户减, and the loading board 1012 is able to rise and fall on the trench The main frame of the test handler is installed. ¥ 7 201018636 The main frame of the test handler can also be installed with a plurality of unloading stackers 1〇2, so that the plurality of user trays of the packaged wafer after the test can be The loading and unloading stacker 1G2 includes the unloading stacking element 1021 and the unloading board 1022 according to the test result. The unloading stacking component is deleted and can store a plurality of copper trays C, the user trays c The packaged wafer after the test is accommodated. ❿, the domain board 1022 is The unloading process is controlled by the user tray c, and the unloading plate 1022 is installed in the main frame of the test handler in a manner that can be raised and lowered. A plurality of empty user trays C can be stored in the buffer stacker 103. The transport unit 1〇4 can hold the user tray C, and the transport unit 1〇4 is movably mounted to the carrier machine frame.

沿著X軸和γ軸方向移動的方式安裝於職搬運機的主 齡中。並且該傳鮮A1G4還_上升和下降。 在堆疊機100中,用戶托盤c係按如下方式傳輸。 百先,傳輸單元1〇4將容納有待測試 c從裝载堆疊元件觀傳輸至裝她1G12。 用戶托盤 8 201018636 夠拾取起用戶嫩中的待測試之封裝晶片。 _接著《用戶托盤c由於裝载製程的完成而變空時,傳輪單 疋104將用戶托盤c從裝載板1G12傳輸至缓衝堆疊機脱或卸载 板 1022 〇 接著’傳輸單凡104將空的用戶托盤C從缓衝堆疊機103或 裝載板1012傳輪至卸載板1022。 接著’卸載板1〇22將從緩衝堆疊冑1〇3或裝載板順傳輸 過來的用戶托盤C提升至位置1〇2a,在此位置拾取器系統(圖中 未不出)能夠將測試後的職晶片放置_戶托盤C中。 接下來’當好托盤C由於卸賴㈣絲而容納有測試後 的封裳晶片時,傳輸單元104將容納有測試後的封裝晶片之用戶 托盤C從卸載板1022傳輸至卸载堆疊元件刪。 測試搬運機可透過快速執行上述步驟並透過分級對封裝晶片 進行分類。 請參考「第1圖」及「第2圖」所示,堆疊機⑽將始炊對 裝載板㈣及卸做觀中_戶_ c進行粒,以使得拾 取器系統(财未示出)能夠穩定地執行裝麵程與卸載製程。° 因此,堆疊機需包含-細於校正用戶托盤位置的执備 (圖中未示出>此校正設備能夠·戶托盤c移動至 = 及卸载板1022中的準確位置。 9 201018636 此用戶托盤的位置校正設備能夠令用戶域〇沿料方向及 y轴方向移動,藉赠戶托盤c與第—定位元件錢第二定 位70件B相接觸,而將用戶托盤(:定位到準確的位置。 然而’習知_戶托盤位置校正設備係分別包含職沿又轴 方向移_戶減C的第-健單元與胁沿W方向移動用戶 托盤C的第二作鮮元,由此’使其結構並且增加了製造成 〇 並且上述問題會由於安裝複數細戶托盤位置校正設備而變 得更加明顯。 【發明内容】 鑑於以上問題,本發明之目的在於提供一種用戶托盤位置校 正設備以及一種結構簡單並且能夠將用戶托盤移動至準確位置的 測試搬運機。 本發明並不僅限於具有上述的技術目的。本領域之技術人員 可以透過如下的詳細說明清楚地理解此處未經描述的本發明之其 它目的。 本發明之一實施例係提供了一種用戶托盤位置校正設備,此 用戶托盤位置校正設備包含:至少一個第一定位元件及至少一個 第二定位元件,係用以確定用戶托盤之位置;用於接收用戶托盤 的底板;第一校正單元,係用以將用戶托盤沿著第一定位元件被 201018636 +裝&方向移動;第二校正單元,係用以將用戶托盤沿著第二定 ,凡件被安裝的方向移動;以及作鮮元,_以操作第一校正 單元與第二校正單元。 勺人本發明之—實施例還提供了-制試搬賴,此測試搬運機 、裝载堆疊機,係具有複數個用戶托盤,用戶托射容納有 待測°式的封裝晶片;輯單元,伽以將制試的雜晶片放入It is mounted in the main age of the carrier in such a manner as to move in the X-axis and γ-axis directions. And the fresh A1G4 also _ rises and falls. In the stacker 100, the user tray c is transported as follows. Hundreds of first, the transmission unit 1〇4 will accommodate the test to be tested c from the loading stack component to the loading 1G12. User tray 8 201018636 is enough to pick up the packaged wafer to be tested in the user's tender. Then, when the user tray c becomes empty due to the completion of the loading process, the transfer unit 104 transfers the user tray c from the loading plate 1G12 to the buffer stacker to remove or unload the plate 1022. Then the transmission single 104 is empty. The user tray C is transferred from the buffer stacker 103 or the loading plate 1012 to the unloading plate 1022. Then the 'unloading plate 1〇22' raises the user tray C that has been transported from the buffer stack 胄1〇3 or the loading plate to the position 1〇2a, where the picker system (not shown) can be tested. The job wafer is placed in the home tray C. Next, when the tray C accommodates the tested wafer wafer due to the unloading (four) filament, the transport unit 104 transfers the user tray C containing the tested package wafer from the unloading panel 1022 to the unloading stacking component. The test handler can quickly sort the packaged wafers by grading by performing the above steps quickly. Please refer to "Figure 1" and "Figure 2". The stacker (10) will initially load the loading plate (4) and the unloading view_house_c so that the picker system (not shown) can Stable surface loading and unloading processes are performed stably. ° Therefore, the stacker needs to include an item that is finer than the position of the correcting user tray (not shown in the figure). This correcting device can move the home tray c to the exact position in the unloading plate 1022. 9 201018636 This user tray The position correction device can move the user domain in the material direction and the y-axis direction, and the lending tray c contacts the first positioning component money second positioning 70 pieces B, and the user tray (: is positioned to the exact position. However, the 'practical_house pallet position correction device system respectively includes the first-order unit of the user-side axis shift _ household minus C and the second-hand element of the user tray C moving in the W direction, thereby making the structure Moreover, the manufacturing process is increased and the above problems become more apparent due to the installation of a plurality of fine tray position correcting devices. SUMMARY OF THE INVENTION In view of the above problems, an object of the present invention is to provide a user tray position correcting device and a simple structure and The test handler capable of moving the user tray to an accurate position. The present invention is not limited to the above technical purpose. Those skilled in the art can The following detailed description clearly understands other objects of the present invention that are not described herein. One embodiment of the present invention provides a user tray position correction apparatus including: at least one first positioning component and At least one second positioning element for determining a position of the user tray; a bottom plate for receiving the user tray; and a first correcting unit for moving the user tray along the first positioning element by the 201018636+ mounting direction; a second correcting unit is configured to move the user tray along a second direction, where the pieces are mounted; and to operate the first correcting unit and the second correcting unit. The example also provides a test drive, the test handler, the load stacker, has a plurality of user trays, the user supports the packaged wafers to be tested, and the units are commensurate with the test. Wafer placement

測試托盤巾,腔室魏’在腔室祕_封裝“與高精度定位板 ^接觸’卸载單元,制以依照顺結果透過分級剌試托盤中 谷、摘測錢的封裝晶片進行分類;卸載堆疊機,係儲存有複數 個用戶托盤,用戶托盤巾容納有測試後的封裝晶片,·以及用戶托 盤位置校錢備,齡赃職堆疊機與卸載堆疊機之中。 【實施方式】 以下’將結合圖示部分對本發明之用戶托盤位置校正設備的 φ 較佳實施例作詳細說明。 ,·…「第3圖」為本發明之用戶托触置校正設備及用戶托盤之 透視圖。第4圖」為「第3圖」之下側面的透視圖。 月參考第3圖」及「第4圖」所示,用戶托盤位置校正設 肴1 13帛歧耕2、第二定位元件3、底板4、第一校正單 凡5、第二校正單元6及作業單元7。 第一定位元件2狀較用戶托盤c之位置,並能夠安裝於 11 201018636 底板4或測試搬運機之主框架(圖中未示出)上。 件2以—定長度突出於底板4之上侧面以使得第 一疋位轉2能夠切用戶托盤c之第—側面α。 用戶托盤C之第一側面C1藉由第一定位元件2被支撐時, 向)得以校Γ置將沿著第—定位元件2被安裝的方向轴方 ❹ ❹ 第二定位元件3㈣確定用戶托盤c之位置,並 底板4或測試搬運機之主框架上。 、; 第二定位元件3以一定長度突出於底板4之上側面以使得第 二定位元件3能夠切用戶減c之第二側面c2。 當用戶面C2#由第二定位树 用戶托盤C之位置將.、儿荃諠_ — / f 向)得以校正。者弟一讀讀3被絲的方向以軸方 弟-讀讀3鱗—粒元件2可被安裝錢得第二定位 W 3與第"^位轉2能夠支撐相互垂直的第-側面α與第二 侧面C2。 、 因此’用戶托盤位正設備丨論透過叫戶托盤c被第 :定位兀件3與第-定位元件2支伽方式制戶托盤C移動至 個準確的位置。移動用戶托盤匸至準確位置是指將用戶托盤〇 移動至^取為系統(圖中未示出)能夠穩定地執行裝載製程與卸 12Test the tray towel, the chamber Wei 'in the chamber secret _ package "contact with the high-precision positioning plate ^ unloading unit, according to the results of the classification through the grading test tray valley, picking the packaged wafers for sorting; unloading stacking machine The utility model stores a plurality of user trays, the user tray towel accommodates the packaged wafer after the test, and the user tray position and the money preparation, the age-old stacking machine and the unloading stacker. [Embodiment] The following will be combined The preferred embodiment of the user tray position correcting device of the present invention will be described in detail. [3] is a perspective view of the user's touch correction device and the user tray of the present invention. Figure 4 is a perspective view of the underside of Figure 3. Referring to Figures 3 and 4, the user tray position correction setting 1 13帛2, 2nd positioning element 3, bottom plate 4, first calibration unit 5, second correction unit 6 and Work unit 7. The first positioning member 2 is positioned closer to the user tray c and can be mounted on the base plate 4 of the 11 201018636 or the main frame (not shown) of the test handler. The piece 2 protrudes from the upper side of the bottom plate 4 by a predetermined length so that the first turn 2 can cut the first side α of the user tray c. When the first side surface C1 of the user tray C is supported by the first positioning member 2, the direction of the second positioning member 3 (4) is determined along the direction in which the first positioning member 2 is mounted. Position and bottom plate 4 or test the main frame of the handler. The second positioning member 3 protrudes from the upper side of the bottom plate 4 by a certain length so that the second positioning member 3 can cut the second side c2 of the user minus c. When the user plane C2# is corrected by the position of the second positioning tree user tray C, the childcare __ / f direction). The younger brother reads the direction of the 3 silks to the axis of the axis - read the 3 scales - the granular element 2 can be installed with the money to obtain the second position W 3 and the "^ position turn 2 can support the mutually perpendicular first side α With the second side C2. Therefore, the 'user tray position device' paradox is moved to the exact position by the location tray c and the first positioning element 3 and the first positioning element 2 gamma mode tray C. Moving the user tray to the exact position means moving the user tray 至 to the system (not shown) to stably perform the loading process and unloading 12

201018636 載製程的位置。 用戶托盤位置校正設備丨可包含複數個第二定位元件3及複 數個弟疋位元件2。因而,用戶托盤c可被移動至更加準確的 位置。 用戶托盤C可被接收於底板4之中,且第一定位元件2與第 定位7G件3也可安裝於底板4之中。底板4可被成形為四方板 形狀。201018636 The location of the process. The user tray position correcting device 丨 may include a plurality of second positioning members 3 and a plurality of sister position members 2. Thus, the user tray c can be moved to a more accurate position. The user tray C can be received in the bottom plate 4, and the first positioning member 2 and the first positioning member 7G can also be mounted in the bottom plate 4. The bottom plate 4 can be shaped into a square plate shape.

第一校正單元5係以沿著第—定位元件2被絲的方向(X 财向)移動用戶托盤C之方式進行作業。第一校正單元5包含 第一移動元件51與第一彈性元件52。 一第:移動元件51係連接於底板4,並可在底板4上轉動。第 一校正單元5至少包含一個第-移動元件51。 第一移航件51可連接於底板4中收容有用戶城c的底板 上侧面之相反—側,即,底板4的下側面之中。 因此,拾取器系統(圖中未示出)之卫作區域不會與第一移 2件51相重# ’由此拾取器系統(圖中未示出)能夠穩定地執 仃裝載製程與卸載製程。 第一移動元件51包含第一移動框架 及轉動元件513。 511、第一接觸元件512 13 201018636 第-移動框架511係連接於底板4。且第一移動框架5ιι可環 繞第-軸511a轉動。此第一移動框架511可整體上成形為/ 形狀,並且可與底板4之下側面相連接。 • 第一接觸元件512係連接於第-移動框架511之一端部 511b ’並且可依據第一移動框架511之轉動來移動用戶托盤 ‘ 第一接觸元件512可接觸於用戶托盤c之第三側面C3之上, ❹-Μ戶托盤c可透過推_戶㈣c之第三側面c3向著第一定位 元件2被安襞的方向(χ軸方向)移動。 第-接觸元件512可形成為突出於第一移動框架5ιι,以使 得^接觸元件512可無容於絲4之上細上_戶托盤c 之弟三側面C3相接觸。 能夠轉動之方式連接於第一移動框架 第一接觸元件512係以 511之一端部511b。The first correcting unit 5 operates to move the user tray C along the direction in which the first positioning member 2 is wound by the wire (X financial direction). The first correcting unit 5 includes a first moving member 51 and a first elastic member 52. First, the moving member 51 is coupled to the bottom plate 4 and is rotatable on the bottom plate 4. The first correcting unit 5 includes at least one first moving member 51. The first transfer member 51 is connectable to the opposite side of the upper side of the bottom plate of the bottom plate 4 in which the user's city c is housed, i.e., in the lower side of the bottom plate 4. Therefore, the guard area of the pickup system (not shown) does not overlap with the first shifting member 51. Thus, the pickup system (not shown) can stably perform the loading process and the unloading. Process. The first moving member 51 includes a first moving frame and a rotating member 513. 511. First contact element 512 13 201018636 The first moving frame 511 is connected to the bottom plate 4. And the first moving frame 5 ι can be rotated around the first axis 511a. This first moving frame 511 can be integrally formed into a shape and can be connected to the lower side of the bottom plate 4. • The first contact element 512 is coupled to one end 511b′ of the first moving frame 511 and can move the user tray according to the rotation of the first moving frame 511. The first contact element 512 can contact the third side C3 of the user tray c. Above, the ❹-Μ tray c can be moved in the direction in which the first positioning member 2 is mounted (the x-axis direction) through the third side c3 of the pusher (four) c. The first contact member 512 may be formed to protrude from the first moving frame 5, so that the contact member 512 is not in contact with the third side C3 of the fine tray 4 on the wire 4. The first moving member 512 is rotatably connected to the first contact member 512 by one end portion 511b of the 511.

=,當移_戶托盤C時’第—接觸元件512可環繞第二 之部二動’進而防止第一接觸元件512與用戶托盤C相互接觸 之°卩伤由於摩擦而發生損壞。 轉動元件513 另一端部511c。 以能夠轉動之方式連接於第—移動框架5ΐι之 14 201018636 因此,當第-移動框架& 三抽灿轉動,進而防止轉=叫,轉動元件5〗3可環繞第 部份由於摩擦而發生損壞。 13與作業單元7相互接觸之 第一彈性元件52_於·連料—移動 所安裝的第一彈性开枝。 庖板 •量相同。 疋件52之數量係與第—移動元料之數 ❹ 第一彈性元件52之一端可盘 相連接,且第-彈性元件52之另弟^^511之-端部⑽ 力鳊可與底板4相連接。 由此,第一彈性元件52 至底板4以使得第-移動元件;;_511之-端部⑽ 方向(料方向)移動用戶托盤cr者弟—疋蝴2被安裝的 第一权正單元6係以沿 _ ❹ 轴方向)移動用戶托盤C之方被安裝的方向(γ ^_件61 與第· 方向^ΓΓ61可啤第二粒树3齡細方向(μ 向)移卿^觸:咖件3蝴財向(γ軸方 =二軸元件61能細可㈣之对連接於歧4之上。如 ^ 了以可移動之方式連接於底板4之上,則第二移動元 件61可以連接至作業單元7。 15 201018636 第二移動元件61包含第二移動框架6Π與第二接觸元_。 第二移動轉611可在軸於雜忖的· 41中移動。且 =動框架611可藉由第二彈性元件㈤被彈性支撐。此第二移 動框架611係整體上成形為四方板形狀。 .元件612係形成為突出於第二移動框架奶。且第 -接觸7L件612能夠移動用戶托盤c ❹ 少—個或者多個第二接觸元件612。弟—移動轉61可包含至 =觸元件612可與用戶托盤之第四侧 , 定===r仏細細而向著第二 第二接觸树612可麵狀 ❹ 且第二接転件612可透^^孔㈣中移動。 上的用戶域C之第四編C4相接觸。/、谷於底板4之上侧面 第—職元件62__財料 ,性元件《可推動第二移動元==由此, 可沿著第二定位元件3 使仵第-移動元件61 C。 女、的方向(Y轴方向)移動用戶托盤 第二雜元件62之—端敏撐 镎第二移動框架611。 、_ 上,而另一端能夠支 第二校正單元6 可包含至少一個或者多個第二彈性元件 62 16 201018636 如果第二校正單^ 6包含複數個第二彈性耕62,則第二彈性元 件62可透過向第二移動框架611施加怪定的麼力而使第二移動元 件61作為一個整體移動相同的長度。 1第一·元件62及第―彈性元件52可以是具有預定彈力的 彈簧。 • 第—校正單元5及第二校正單元6可在相互垂直的方向上分 -別移_戶_ C。也就是說,第—校正單元5與第二校正單元6 可分別推動用戶缝C的相互垂直的第三側面〇與第四側面μ —作業單元7可操作第一校正單元5及第二校正單元6。因此, 第-校正單元5及第二校正單元6可將用戶托盤c移動至準確 位置。 由此,用戶滅位置校正設備!可透過一個作業單元7來操 作第校正單元5及第二校正單元6,因*,此校正設備係由簡 單的結構製成,且能夠移動用戶托盤c至準確位置。 此外,用戶托盤位置校正設備i可僅使用一個電源將用戶托 盤C移動至料的位置’因此減少了製造成本與維護費用。 作業單70 7係連接至底板4,並可在底板4上移動。當作業 單元7在底板4上移動時,第一校正單元5及第二校正單元6可 以被操作。 作業单το 7可連接至底板4之下側面。此作業單元7可包含 201018636 導塊與導軌中的-個,而底板4可包含導塊與導執中的另—個。 作業單兀7可連接至汽缸8的;^旱體如,且作業單元7可隨著 汽紅8之桿體8a的運動在底板4上移動。此汽缸8可為氣動汽紅 或液壓汽缸。 作業單元7可包含第一作業單元71及第二作業單元72。 .· I作業料71可連接至底板4,並可在底板4上移動,且 ❹ 第-作業單元71可用來操作第一校正單元5。 第一作業單元71可操作第一校正單元5以使得第二作業單元 72可操作第二校正單元6。 第-作業單元7i可連接至底板4之下侧面。此第一作業單元 71包含導塊與導執中的—個,而底板4可包含導塊與導執中的另 一個。 ❹ 帛作業早疋71包含至少-個或多個突出元件711用以轉動 . 第—移動元件51。 .作出-:碰711係大出於第一作業單元71之作業板71a中。此 大凡7U可沿著第—移動元件51被定位的方向突出。 件、、”田轉動几件513被突出元件711支擇時,第一移動元 。可&著第一接觸元件512遠離底板4之方向轉動。 件513被犬出70件711未形成於作業板71a中的部 18 201018636 份支撐時,第—移 、 盤牛1可沿著第一接觸元件512與用戶托 盤c之第三側面C3相接觸的方向轉動。 移動4 51可透過第—彈性元件52彈性連接至底板4。 /牛52係於轉動元件513被支禮於突出元件711上時被 轉動疋件513被支撐於突出元件711未形成於作業板=, when the shift tray_C is moved, the first contact member 512 can be moved around the second portion to prevent the first contact member 512 from coming into contact with the user tray C, and the damage is caused by friction. The other end portion 511c of the rotating member 513. It is rotatably connected to the first moving frame 5ΐ14 14 201018636 Therefore, when the first-moving frame & three rotations, thereby preventing the rotation, the rotating element 5 〗 3 can be damaged around the first part due to friction . 13 The first elastic member 52_ in contact with the working unit 7 is connected to the first elastic branch. Seesaw • The same amount. The number of the jaws 52 is the same as the number of the first moving elements. The one end of the first elastic member 52 can be connected to the disk, and the other end of the first elastic member 52 can be connected to the bottom plate 4 Connected. Thereby, the first elastic member 52 to the bottom plate 4 moves the user tray cr in the direction of the end portion (10) of the first moving member; _511 (the material direction), and the first right unit 6 is installed. The direction in which the user tray C is moved along the _ ❹ axis direction is installed (γ ^_61 and the direction ΓΓ61 can be beer second tree 3 years thin direction (μ direction) shifting ^ touch: coffee 3 财 财 γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ γ Working unit 7. 15 201018636 The second moving element 61 comprises a second moving frame 6 Π and a second contact element _. The second moving turn 611 is movable in the axis 41 of the choke, and the = moving frame 611 can be The second elastic member (5) is elastically supported. The second moving frame 611 is integrally formed into a square plate shape. The member 612 is formed to protrude from the second moving frame milk, and the first contact 7L member 612 is capable of moving the user tray c ❹ Less than one or more second contact elements 612. The younger-moving turn 61 can include to the touch element 612 With the fourth side of the user tray, the predetermined ===r仏 is thin and can be planar toward the second second contact tree 612, and the second interface 612 can be moved through the hole (4). User domain C on The fourth series C4 is in contact. /, Valley on the upper side of the bottom plate 4 - the first component 62__ material, the sexual element "can push the second mobile element == thus, can be made along the second positioning element 3 The first moving element 61 C. The direction of the female (Y-axis direction) moves the second miscellaneous element 62 of the user tray to the end of the second moving frame 611. _, and the other end can support the second correcting unit 6 At least one or more second elastic members 62 16 201018636 may be included. If the second correction unit 6 includes a plurality of second elastic cultivators 62, the second elastic member 62 may transmit a strange force to the second moving frame 611. The second moving element 61 is moved by the same length as a whole. 1 The first element 62 and the first elastic element 52 may be springs having a predetermined elastic force. • The first correcting unit 5 and the second correcting unit 6 may be in mutual In the vertical direction - do not move _ household _ C. That is, the first - correction sheet The element 5 and the second correcting unit 6 can respectively push the mutually perpendicular third side 〇 and the fourth side μ of the user slit C. The working unit 7 can operate the first correcting unit 5 and the second correcting unit 6. Therefore, the first correction The unit 5 and the second correcting unit 6 can move the user tray c to the exact position. Thus, the user can cancel the position correcting device! The first correcting unit 5 and the second correcting unit 6 can be operated through one working unit 7, because * The calibration device is made of a simple structure and is capable of moving the user tray c to an accurate position. Further, the user tray position correction device i can move the user tray C to the position of the material using only one power source' thus reducing manufacturing costs and maintenance cost. The worksheet 70 7 is attached to the bottom plate 4 and is movable on the bottom plate 4. When the work unit 7 moves on the bottom plate 4, the first correction unit 5 and the second correction unit 6 can be operated. The work order το 7 can be connected to the lower side of the bottom plate 4. This work unit 7 may contain one of the 201018636 guide blocks and the guide rails, while the bottom plate 4 may contain the other of the guide blocks and the guides. The work sheet 7 can be connected to the cylinder 8; the dry body is, and the working unit 7 can move on the bottom plate 4 in accordance with the movement of the rod 8a of the steam red 8. This cylinder 8 can be a pneumatic steam red or hydraulic cylinder. The work unit 7 may include a first work unit 71 and a second work unit 72. The I material 71 can be attached to the bottom plate 4 and can be moved on the bottom plate 4, and the first working unit 71 can be used to operate the first correcting unit 5. The first working unit 71 can operate the first correcting unit 5 such that the second working unit 72 can operate the second correcting unit 6. The first-working unit 7i can be connected to the lower side of the bottom plate 4. This first work unit 71 contains one of the guide blocks and the guide, and the bottom plate 4 may contain the other of the guide block and the guide. The first operation 71 includes at least one or more protruding members 711 for rotating. The first moving member 51. The make-: touch 711 is largely out of the work board 71a of the first work unit 71. This large 7U can protrude in the direction in which the first moving member 51 is positioned. When the field rotates several pieces 513 by the protruding element 711, the first moving element can rotate with the first contact element 512 away from the bottom plate 4. The piece 513 is out of the dog 70 pieces 711 is not formed in the operation When the portion 18 of the plate 71a is supported by 201018636, the first shifting, the ox 1 can be rotated in the direction in which the first contact member 512 contacts the third side C3 of the user tray c. The movement 4 51 can transmit the first elastic member 52 is elastically coupled to the bottom plate 4. The cow 52 is supported by the rotating member 513 when the rotating member 513 is engaged on the protruding member 711. The protruding member 711 is not formed on the working plate.

a、份之上時’第—彈性元件52係被壓縮。由此,第 動儿件51可被轉動。 因此,第—移動元件51可移動用戶托盤C以使得用戶托盤之 第一侧面α係藉由第—彈性树%之彈力被切於第—定位元 件2之上’進而可防止由於施加至用戶托紅之應力過大而 用戶托盤C損壞。 4 ’並能在底板4上移動。第 相互聯鎖的操作第二校正單 第二作業單元72錢接至底板 二作業單元72可與第一作業單元71 元6 〇 另一個。 第二作業單元72可連触絲4之下細。此第二作業單元 72可包含導塊與導轨中的—個,而底板何包含導塊與導轨中的 第一作業早元72係鱼第一作堂里分71 tc _ w φ作菜早7G 71相互聯鎖的移動第二 移動元件61。 ~ 第二作業單元72可沿著遠離第二定位元件3之方向(γ轴的 19 201018636 反方向)&鱗二移動元件6ι。 - 定位元件3被物⑽竭第: 二:=(1透:推動第二移動元件-來沿著_ 著第2 Γ移除施加於第二移動元件61之推力而沿 .Γ—德轉3被钱财杨)軸第二移動元件 第二移動元件61可藉由第二彈性元件⑷ 彈性元件62係於第二作辈嚴牙79眩處丄 支择第二 業 應力施加至第二移動元件61 田_’而當此應力被移除時’第二彈性元件_ 用下被拉伸。由此,第二_元件61可被義。When the upper portion is a part, the first elastic member 52 is compressed. Thereby, the first moving member 51 can be rotated. Therefore, the first moving member 51 can move the user tray C such that the first side α of the user tray is cut on the first positioning member 2 by the elastic force of the first elastic tree %, thereby preventing the application to the user support The red stress is too large and the user tray C is damaged. 4 ' and can move on the bottom plate 4. The first interlocking operation second correction unit The second working unit 72 is connected to the bottom plate. The second working unit 72 is connectable to the first working unit 71. The second working unit 72 can be thinned under the contact wire 4. The second working unit 72 can include one of the guide block and the guide rail, and the bottom plate includes the first work in the guide block and the guide rail. The first work in the first line of the 72-fish is divided into 71 tc _ w φ The early 7G 71 moves the second moving element 61 interlocked with each other. ~ The second working unit 72 can move the element 6ι along the direction away from the second positioning element 3 (the opposite direction of the γ axis 19 201018636) & scale. - the positioning element 3 is exhausted by the object (10): two: = (1: pushes the second moving element - to remove the thrust applied to the second moving element 61 along the second side) The second moving element 61 of the shaft can be applied to the second moving element 61 by the second elastic element (4). The elastic element 62 is attached to the second generation of the teeth 79. Field_' and when this stress is removed, the 'second elastic element _ is stretched underneath. Thus, the second_element 61 can be sensed.

—因此’第二移動元件61可移動用戶托盤C以使得用戶托盤C 之第二側面C2藉由第二彈性元件62之彈力被支撐於第二定位元 件3之上,進而可防止由於施加至用戶托盤c之應力過大而導致 用戶托盤C損壞。 “第一作業單元71與第二作業單元72可整體地形成,以使得 當第一作業單元71隨著汽缸8之桿體8a的移動而移動時,第二 作業單元72也能隨之一起移動。 然而,用戶托盤C能以與第二定位元件3及第一定位元件2 分別間隔相應距離之方式被收容於底板4之上。 20 201018636 此處’為了更加尚效地將用戶托盤c移動至準_的位置,+ 第一作業單元71與弟二作業單元72在底板4上移動時,第_作 業單元71與第二作業單元72可彼此分隔開。 當第一作業單元71在底板4上移動時第二作業單元乃可 操作第二校正單元6。 • 第一作業單元71可透過於底板4上移動時向第二作業單元 〇 72施加應力而使第二作業單元72移動,也可透過移除上述應力 而使第二作業單元72移動。 特別是,當第-作業單元71沿著第二作業單元72被定位的 方向移動時,第-作鮮元71可推動第二作業單元72進行移動。 當第-作業單元沿著第二作業單元72被定位的反方向移 動時’第二作業料72可藉由第二彈性元件62進行移動。 〇 當用戶托盤C的第二侧面C2被支撐於第二定位元件3之上 •.時’第二作業單元72的移動停止。第—作業單元71將繼續移動 直至用戶托盤c的第一側面C1被支撐於第一定位元件2之上, •因此,第一作業單元71在其與第二作業單元72相互分隔開之後 仍可繼續移動。 也就是說’第-作業單元71料二作業單元72可移動不同 的距離。因此,第-移動元件51與第二移動元件6ι可使用戶托 盤c移動不同的距離,藉以高效地移動用戶托盤c至準確的位置。 21 201018636 因此’儘管好托盤c與第-定位元件2及第二定位元件3 間隔不同的距離’但當用戶域c被接收於底板4之上時,用戶 托盤位置校正設備1均可·戶托盤c移動至準確的位置。 , 此外’儘管好托盤c的尺寸可隨著封裝晶片_之改變在 .—定細_化’但好托盤位置校正設備丨仍可將尺寸變化的 ·- S戶托盤C移動至準確的位置而不錢行重作。 e 訂文中,將結合關對第—作業單元71與第二作業單元 72連接至底板4且於底板4上移動時可相互分關之情形下的= 業流程進行描述。 0 弟5圖」為本發明之用戶減位置校正設備於校正用戶托 盤位置之前的狀態平面圖。「第6圖」表示了「第5圖」之下側面。 「第7圖」為本發明之用戶滅位置校正設備於校正用戶把盤位 置之後的狀態平面圖。「第8圖」表示了「第7圖」之下側面。 — μ㈣「第5®」及「第6圖」所示’當第—作業單元刀沿 者第二作料元72奴位之柯機時,$ :當轉動元細被支擇於第-作業單-之突出綱 Γ被::元件512遠_之方叫树,第—彈性元件 第-作業單元7U_二作鮮元72 沿著第二接転細侧:—之向; 22 201018636 移動第二移動元件61。此時’第二彈性元件62被壓縮。 在此狀態下,用戶托盤c可不受第一移動元件51及第二移動 元件61之干擾而被收容於底板4之上。 . β參考「第7圖」及「第8圖」所示,在用戶托盤C被收容 •於底之上驗態下,當第—作料元71沿著第二作業單元 72被定位之反方向移動時,轉動元件513被支撐於突出元件711 瘳未形成於第-作業單元中的部份之上。由此,第一移動元件 5i係將沿著第-接觸元件512與用戶托盤c之第三側面ο相接 觸的方向轉動。鱗,第—雜元件52係在彈力的侧下被壓縮 而恢復到其初始形態。 因此用戶托盤c藉由第一接觸元件512的推動係將沿著第 -定位元件2被安裝的方向移動。相戶托盤c被支撐於第一定 位兀件2之上時,用戶托盤c之移動停止。 參 第二作業單元72將隨著施加於第一作業單元71之應力被移 除而移除已施加至第二移動元件61的應力。 此件61雜沿著第二定位元件3被安裝的方 向移動’且弟二接觸元件612將透過推_ C4而使用戶鋪c辟 〈顏側面 時m姓 #第一疋位轉3被安裝的方向移動。此 態。第-雜讀62蝴力的_爾伸爾到其初始形 23 201018636 當用戶托盤c透過第二接觸元件6i2之推 定位元件3之上時,用戶托盤c之移_停止。*於第一 當用戶托盤C被支撐於第二定位元们之上時,第二 件61及第二作業單元72之移動將停止。並且,第-作業單元71 將繼續移動直至肝她C被域於第—定位元件2之上,如此, 第一作業單元71鮮二作料元72可彼齡隔開。 用戶托盤C之第-側面C1、第二側面C2、第三側面C3及第 四側面C4係被分別支胁第—定錢件2、第二粒树3、第 置 置 〜一 π凡,用尸托盤C之位 可被校正到拾取ϋ系職夠敎執锻賴程與喊製程的位 〇 一移動元件51及第二移動元件61之上,如此,肝托盤c之位 以下’將結合附圖對包含上述用戶托盤位置校正設備的本發 明之測試搬運機的一較佳實施例進行詳細描述。 「第9圖」為本發明之測試搬運機的結構方塊圖。 請參考「第i圖」至「第9圖」所示,本發明之測試搬運機 10包含腔室系統η、裝載堆疊機12、域堆疊機13、裝载單元 14、卸載單元15及緩衝單元16。 腔室系統11包含第一腔室m、第二腔室112及第三腔室113。 在第-腔室111中,容納於測試托盤τ中的待測試的封裝晶 片係將被加誠冷卻至—職溫度,脑懷溫度係根翻戶的品 24 201018636 f需求預先較。隨著加熱或冷卻發生,職域τ將在第一腔 室ill内向前移動-定距離。當封裝晶片被加熱或冷卻至測試溫 度以後,測試托盤Τ將從第一腔請被轉移至第二腔室112中。 • 在第二腔室112中,測試托盤τ中的封裝W將與高精度定 •位板Η上的插座相接觸以接受電職。高精度定錢Η係與第 •二腔室112树接。當全部封裝晶片均經過測試機測試之後,測 參·試托盤τ將從第二腔室112被轉移至第三腔室⑴中。 在第三腔室113中,容納於測試托盤Τ中的測試後的封裝晶 片將被冷卻或加熱至常溫。隨著加熱或冷卻的發生,測試托盤Τ 將在第观113 _移㈣轉。料編__ =至常如後,職減τ將從第三腔室113被轉輕卸載單元 第—腔室111、第二腔請及第三腔請可沿水平方向依 ❹辆成—列。在上_1巾,複數個第二腔請可配置成一縱 .行,換句話說,-個第二腔室112可位於另—個第二! 上方。 第一腔室m、第二腔室112及第三腔室113也可沿垂直方向 依序排成-縱行’其中第二腔室112係位於中間。 裝載堆疊機12祕贿餘贿納树戦之封裝晶片的 用戶托盤c。用戶托盤位置校正設備i係安裝於褒載堆疊機12之 25 201018636 中。 ,,ΓΓΓΓ13 用戶托盤。卸载堆疊機中也安裝有用戶托盤位置校正 储娜瓣麵她响位置_ ⑷ΖΓΖΓ沿χ轴及γ轴方向移動。且裝載拾取器 裝晶心降。此裝載拾取器⑷包含複數個能祕封 二:::r:r_,_c ❹ 程:=::,一― 腔室妓絲_試托聽㈣齡置地娜移至第— 卸載單元 的測試後的封 151 〇 ^依…’則試結果藉由分級對容納於須!1試托盤中 、曰曰片進仃分類。此卸鮮元15包含卸載拾取器 26 201018636 卸载拾取器m可沿x軸及γ車由方向移動。且卸載拾取器 151也可上升和下降。此卸载拾取器⑸&含複數個能夠吸拾封 裝晶片之嘴嘴。 • _拾取器151可將測試後的封襞晶片從定位於卸载位置 • 15a中的測試托盤中分離’並將分離後的封裝晶片放置到定位於 ^卸載堆疊機13中的用戶托盤c之中,這就是所謂的卸載製程。、 ❹ ㉟載拾取11 151可依關試結果藉由分級㈣試後的封裝晶 片放置到定位於不同位置的用戶托盤C之中。 測試搬運機10可包含複數個卸载拾取器151以使得在卸載製 程中所耗費的時間可以減少。 、 、因卸载製程的完成而被清空的測試托盤將會從卸載位置^ 被轉移至裝载位置14a。 • 緩衝單元16可暫時容納封裝晶片。 • 緩衝單元16可安裝並使麟至少—個裝健程及卸載製程 如果緩衝單元16被絲錄聽裝賴財,職載拾取器 可從定位雜载堆_2 _戶托盤c上拾取制試的封 裳晶片’亚能夠藉由緩衝單元16將待測試的封裝晶片放置到定位 於裝載位置中的測試托盤内。 27 201018636 如果緩衝單元16被安裝並使舰卸賴財,則卸载拾取器 1 曰51可從定錄卸餘置15a巾關試域上分離職後的封^ 晶片,並能夠藉由緩衝單元16將測試後的封襞晶片放置到定位於 卸載堆疊機13中的用戶托盤C内。 • 以下’將結合關對財上述結構的本發明之職搬運機的 • 另一實施例進行詳細描述。 © 歧,本發明另—實施例之測試搬運機係具有與上述的測試 搬運機相似的結構,因此,下面將僅對結構中的差異進行描述。 「第10圖」為本發明之另一實施例的測試搬運機之平面圖。 如「第9圖」及「第1〇圖」所示,本發明之另一實施例的測 試搬運機ίο聽含交解元17,此交換單元17並未包含於「第 9圖」所示之測試搬運機1〇中。 〇 此交換單元17係用以將容納有待測試的封裝晶片之測試托- Therefore, the second moving member 61 can move the user tray C such that the second side C2 of the user tray C is supported on the second positioning member 3 by the elastic force of the second elastic member 62, thereby preventing application to the user The stress on the tray c is too large to cause damage to the user tray C. "The first work unit 71 and the second work unit 72 may be integrally formed such that when the first work unit 71 moves with the movement of the rod 8a of the cylinder 8, the second work unit 72 can also move together However, the user tray C can be received on the bottom plate 4 at a corresponding distance from the second positioning member 3 and the first positioning member 2, respectively. 20 201018636 Here, in order to more effectively move the user tray c to When the first working unit 71 and the second working unit 72 move on the bottom plate 4, the first working unit 71 and the second working unit 72 can be separated from each other. When the first working unit 71 is on the bottom plate 4 The second working unit can operate the second correcting unit 6 when moving up. • The first working unit 71 can move the second working unit 72 by applying stress to the second working unit 72 when moving on the bottom plate 4, or The second working unit 72 is moved by removing the above stress. In particular, when the first working unit 71 moves in the direction in which the second working unit 72 is positioned, the first fresh unit 71 can push the second working unit 72. Move. When - when the work unit moves in the opposite direction in which the second work unit 72 is positioned, the second work material 72 can be moved by the second elastic member 62. When the second side C2 of the user tray C is supported by the second position Above the element 3, the movement of the second working unit 72 is stopped. The first working unit 71 will continue to move until the first side C1 of the user tray c is supported on the first positioning element 2, and therefore, the first The working unit 71 can continue to move after it is separated from the second working unit 72. That is to say, the 'the first working unit 71 can move the different distances. Therefore, the first moving element 51 and the first The two moving elements 6ι can move the user tray c by different distances, thereby efficiently moving the user tray c to an accurate position. 21 201018636 Therefore, although the good tray c is spaced apart from the first positioning element 2 and the second positioning element 3 by a different distance 'But when the user domain c is received on the bottom plate 4, the user tray position correcting device 1 can move the home tray c to the exact position. Further, although the size of the good tray c can follow the package wafer _ The change is in the ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- - The description of the process flow in the case where the work unit 71 and the second work unit 72 are connected to the bottom plate 4 and can be separated from each other when moving on the bottom plate 4. 0 "5" is the user's reduced position correction device of the present invention. A state plan prior to correcting the position of the user tray. "Picture 6" shows the lower side of "Picture 5". Fig. 7 is a plan view showing the state after the user's position correction device of the present invention corrects the position of the user. "Figure 8" shows the side below "Figure 7." — μ(4) “5th®” and “6th” are shown as “when the first-working unit edge cutter is the second machine element 72 slave machine, $: when the rotation element is selected to the first-job sheet - The prominent outline is:: Element 512 is far away from the square called the tree, the first - elastic element - the working unit 7U_ two is the fresh element 72 along the second side of the thin side: - direction; 22 201018636 moving the second Moving element 61. At this time, the second elastic member 62 is compressed. In this state, the user tray c can be accommodated on the bottom plate 4 without being disturbed by the first moving member 51 and the second moving member 61. β refers to "Fig. 7" and "Fig. 8", in the opposite direction of the first working unit 72 when the user tray C is accommodated in the bottom state. When moving, the rotating member 513 is supported on a portion of the protruding member 711 that is not formed in the first working unit. Thereby, the first moving member 5i is rotated in the direction in which the first contact member 512 comes into contact with the third side surface ο of the user tray c. The scale, the first-to-hybrid element 52 is compressed under the side of the elastic force to return to its original form. Therefore, the user tray c is moved in the direction in which the first positioning member 2 is mounted by the pushing mechanism of the first contact member 512. When the cooperating tray c is supported on the first positioning member 2, the movement of the user tray c is stopped. The second working unit 72 removes the stress that has been applied to the second moving member 61 as the stress applied to the first working unit 71 is removed. The piece 61 is moved along the direction in which the second positioning element 3 is mounted, and the second contact element 612 will be pushed through the push_C4 to cause the user to slap the side of the face. Move in direction. This state. The first-missing 62 is forced to its initial shape. 23 201018636 When the user tray c is pushed over the positioning member 3 through the second contact member 6i2, the shifting of the user tray c is stopped. *First When the user tray C is supported on the second positioning unit, the movement of the second member 61 and the second working unit 72 will stop. Moreover, the first-working unit 71 will continue to move until the liver C is above the first positioning element 2, such that the first working unit 71 can be separated from each other. The first side surface C1, the second side surface C2, the third side surface C3, and the fourth side surface C4 of the user tray C are respectively threatened by the first payment piece 2, the second grain tree 3, and the first set to the first side. The position of the tray C can be corrected to be on the moving component 51 and the second moving component 61 of the picking and squatting system, so that the liver tray c is below the position A preferred embodiment of the test handler of the present invention including the above-described user tray position correcting device will be described in detail. Fig. 9 is a block diagram showing the structure of the test handler of the present invention. Referring to "i" to "figure 9", the test handler 10 of the present invention includes a chamber system η, a load stacker 12, a domain stacker 13, a loading unit 14, an unloading unit 15, and a buffer unit. 16. The chamber system 11 includes a first chamber m, a second chamber 112, and a third chamber 113. In the first chamber 111, the package wafer to be tested accommodated in the test tray τ will be cooled to the operating temperature, and the demand for the temperature will be compared. As heating or cooling occurs, the field τ will move forward within the first chamber ill by a fixed distance. After the package wafer is heated or cooled to the test temperature, the test tray Τ will be transferred from the first chamber to the second chamber 112. • In the second chamber 112, the package W in the test tray τ will be in contact with the socket on the high precision fixed plate 以 to accept the electric job. The high-precision fixed money system is connected to the second chamber 112. After all of the packaged wafers have been tested by the tester, the test/test tray τ will be transferred from the second chamber 112 to the third chamber (1). In the third chamber 113, the tested package wafer contained in the test tray 将 will be cooled or heated to normal temperature. As heating or cooling occurs, the test tray Τ will turn at the first 113 _ shift (four). After the __ = as usual, the occupational reduction τ will be transferred from the third chamber 113 to the light-unloading unit, the first chamber, the second chamber, and the third chamber, please be in the horizontal direction. . In the upper towel, the plurality of second chambers may be arranged in a vertical line. In other words, the second chambers 112 may be located above the other second! The first chamber m, the second chamber 112, and the third chamber 113 may also be sequentially arranged in a vertical direction - a wales ' wherein the second chamber 112 is located in the middle. Load the stacker 12 and secretly bribe the user tray c of the packaged wafer of Nashu. The user tray position correction device i is mounted in the stacking machine 12 of 25 201018636. ,,ΓΓΓΓ13 User tray. The user pallet position correction is also installed in the unloading stacker. The cushioning surface of her is _ (4) 移动 moves along the χ axis and the γ axis. And load the picker to install the crystal heart drop. This loading picker (4) contains a plurality of secret seals 2:::r:r_,_c ❹:=::, a - chamber 妓 _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The seal of 151 〇 ^ depends on... 'The test results are sorted by grading on the test trays; This unloading element 15 contains an unloading picker 26 201018636 The unloading picker m is movable along the x-axis and the gamma-wise direction. And the unloading picker 151 can also be raised and lowered. The unloading picker (5) & includes a plurality of nozzles capable of picking up the packaged wafer. • The picker 151 can separate the tested packaged wafer from the test tray positioned in the unloading position • 15a and place the separated packaged wafer into the user tray c positioned in the unloading stacker 13 This is the so-called uninstall process. ❹ 35-load pickup 11 151 The package wafer after the classification (4) test can be placed in the user tray C positioned at different positions according to the test results. The test handler 10 can include a plurality of unloading pickers 151 such that the time spent in the unloading process can be reduced. The test tray that has been emptied due to the completion of the unloading process will be transferred from the unloading position ^ to the loading position 14a. • The buffer unit 16 can temporarily accommodate the packaged wafer. • The buffer unit 16 can be installed and the lining at least one of the training and unloading processes. If the buffer unit 16 is recorded by the silk register, the load pickup device can pick up the test from the positioning miscellaneous stack _2 _ household tray c The wafers of the wafers can be placed by the buffer unit 16 into the test trays positioned in the loading position. 27 201018636 If the buffer unit 16 is installed and the ship is unloaded, the unloading picker 1 曰 51 can separate the sealed wafer from the fixed recording area 15a and can be separated by the buffer unit 16 The tested packaged wafer is placed into a user tray C positioned in the unloading stacker 13. • The following 'will be described in detail in conjunction with another embodiment of the invention of the present invention. The test handler of the other embodiment of the present invention has a structure similar to that of the above-described test handler, and therefore, only the differences in the structure will be described below. Fig. 10 is a plan view showing a test handler according to another embodiment of the present invention. As shown in FIG. 9 and FIG. 1 , a test carrier ίο according to another embodiment of the present invention is provided with a solution element 17, which is not included in FIG. The test handler is in the middle. 〇 This switching unit 17 is used to test the package containing the packaged wafer to be tested.

.盤τ以及容納有測試後的封裝晶片之測試托盤T與腔室系統H * 進行交換。 如内有待測減的封裝晶片之測試托盤τ係將從交換單元η 被轉移至腔室系統11 ’岭触丨職後的封裝晶狀測試托盤Τ 則將從腔室系統η被轉移至交換單元17。 在父換單兀π中,係進行將待測試的封裝晶片放入測試托盤 Τ之步驟以及將測試後的塊晶片從職托盤τ上分離之步驟。 28 201018636 此處將剌^叙峨㈣τ分 之-部份,祕測顺_裝;從測試托射上分離之^= 為卸載製程之-部份。此交換單元 /糸 置以,姐可在-個位置中f 14_卸載位 0 m現裝餘置14a與卸載位置15a。 此交換單元17還可包含轉動單元171。 轉動早7C 171用·容納有翻说的封裝晶片之測試托 ❹ =一個水平位置轉動至―個垂錢直立位置。此測試托盤T在盆 於腔至糸統11哺移期間係储直立位置。 轉動單元m射將容财_後_裝^的處於直立位 置的測試減T從-個垂直位置轉_—個水平位置。此測試托 盤T在測試後的封裝日日日片從其上分離以及隨後新的剌試的封農 晶片被收容於針時,餘持水平缝。 、 雖然本發明以前述之較佳實施例揭露如上,财並非用以限 定本發明,任何„姆技藝者,在不脫離本發明之精神和範圍 内田可作些許之更動與濁飾’因此本發明之專利保護範圍須視 本說明書_之㈣專概_界定者鱗。 、 【圖式簡單說明】 機之前 視圖 第1圏為測試搬運機令儲存有複數個用戶托盤的堆疊 圖; 第2圖為用戶储之位置練正後態之平面 29 201018636 第3圖為本_之用戶托齡置校正設叙用戶托盤之透視 圖; 弟4圖為第3圖之下侧面的透視圖; 第5圖為本發明之用戶托她置校正設備於校邱戶托盤位 置之前的狀態平面圖; 第6圖表示了第5圖之下側面; 第7 @為本個μ戶減錄校正賴練正肝托盤位 置之後的狀態平面圖; 第8圖表示了第7圖之下側面; 第9圖表示了本發明之測試搬運機的結構;以及 第10圖為本發明之另—實施例的測試搬運機之平面圖。 【主要元件符號說明】 用戶托盤位置校正設備 第一定位元件 苐二定位元件 底板 第一校正單元 第二校正單元 作業單元 汽缸 30 8 201018636 8a 桿體 10 測試搬運機 11 腔室系統 12 裝載堆疊機 • 13 卸載堆疊機 • 14 裝載單元 15 卸載單元 〇 16 緩衝單元 17 交換單元 41 孔洞 42 孔洞 51 第一移動元件 52 第一彈性元件 61 第二移動元件 β 62 第二彈性元件 . 71 第一作業單元 . 72 第二作業單元 14a 裝載位置 15a 卸載位置 71a 作業板 100 堆疊機 31 101 201018636 102 103 104 111 • 112 瓤 113 〇 141 151 171 511 512 513 611 ® 612 711 • 101a 102a 511a 511b 511c 裝載堆疊機 卸載堆疊機 緩衝堆疊機 傳輸單元 第一腔室 第二腔室 第三腔室 裝載拾取器 卸載拾取器 轉動單元 第一移動框架 第一接觸元件 轉動元件 第二移動框架 第二接觸元件 突出元件 位置 位置 第一軸 端部 端部 32 201018636The disk τ and the test tray T containing the tested package wafer are exchanged with the chamber system H*. If the test tray τ of the packaged wafer to be measured is transferred from the exchange unit η to the chamber system 11, the packaged crystalline test tray ' will be transferred from the chamber system η to the exchange Unit 17. In the parent change order π, the step of placing the packaged wafer to be tested into the test tray and the step of separating the tested wafer wafer from the job tray τ are performed. 28 201018636 Here will be 峨 ^ 峨 四 (four) τ points - part, secret test shun _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The switching unit / device can be installed in the position - 14 - unloading bit 0 m to install the remaining 14a and the unloading position 15a. This exchange unit 17 can also include a rotating unit 171. Rotating the early 7C 171 with a test tray containing the flip-flop package ❹ = one horizontal position is rotated to a vertical position. This test tray T is stored in an upright position during the period from the chamber to the system 11 feeding. The rotating unit m shoots the test minus T in the upright position of the ____ into the horizontal position. The test tray T was separated from the packaged day and day wafer after the test and the subsequent green wafer was placed in the needle. The present invention has been disclosed in the foregoing preferred embodiments, and the present invention is not intended to limit the invention, and the invention may be modified and shaded without departing from the spirit and scope of the invention. The scope of patent protection shall be in accordance with the provisions of this manual (4) _ define the scales. [Simplified description of the diagram] The front view of the machine is the stacking diagram of the test carrier to store a plurality of user trays; The position of the user's storage position is correct. 29 201018636 The third figure is the perspective view of the user's age setting correction and the user tray; the fourth picture is the perspective view of the lower side of the third figure; The user of the present invention asks her to set the state plan of the calibration equipment before the position of the school's Qiu household tray; Fig. 6 shows the lower side of the fifth figure; the seventh @ is the sub-subtraction correction of the positive liver tray position State plan view; Fig. 8 shows the lower side of Fig. 7; Fig. 9 shows the structure of the test handler of the present invention; and Fig. 10 is a plan view of the test handler of another embodiment of the present invention. Main component No. Description] User tray position correction device First positioning element Second positioning element Base plate First correction unit Second correction unit Working unit Cylinder 30 8 201018636 8a Rod 10 Test carrier 11 Chamber system 12 Loading stacker • 13 Unloading stack Machine • 14 Loading unit 15 Unloading unit 〇 16 Buffer unit 17 Exchange unit 41 Hole 42 Hole 51 First moving element 52 First elastic element 61 Second moving element β 62 Second elastic element. 71 First working unit. 72 Second Work unit 14a Loading position 15a Unloading position 71a Working plate 100 Stacking machine 31 101 201018636 102 103 104 111 • 112 瓤 113 〇 141 151 171 511 512 513 611 ® 612 711 • 101a 102a 511a 511b 511c Loading stacker unloading stacker buffer stack Machine transport unit first chamber second chamber third chamber loading picker unloading picker rotating unit first moving frame first contact element rotating element second moving frame second contact element protruding element position position first shaft end End 32 201018636

512a 第二轴 513a 第三轴 1011 裝載堆疊元件 1012 裝載板 1021 卸载堆疊元件 1022 卸載板 A 第一定位元件 B 第二定位元件 C 用戶托盤 H 高精度定位板 T 測試托盤 Cl 第一側面 C2 第二侧面 C3 第三侧面 C4 第四侧面 33512a second shaft 513a third shaft 1011 loading stacking element 1012 loading plate 1021 unloading stacking element 1022 unloading plate A first positioning element B second positioning element C user tray H high precision positioning plate T test tray Cl first side C2 second Side C3 third side C4 fourth side 33

Claims (1)

201018636 十、申請專利範圍: 1. -種用戶托盤位置校正設備,係包含: 至少一個第一定位元件及至少一個第二定位元件,係用以 確定一用戶托盤之位置; 一底板’係用於接收該用戶托盤; 第校正單元,係用以將該用戶托盤沿著該第一定位元 件被安裝的方向移動; 一第-权正單元,侧以將制戶托盤沿著該第二定位元 件被戈·裝的方向移動;以及 一作業單元,伽以操作該第—校正單元與該第二校正單 元。 5求項1所述之用戶托盤位置校正設備’其中該作業單元係201018636 X. Patent application scope: 1. A user tray position correction device, comprising: at least one first positioning component and at least one second positioning component, used to determine the position of a user tray; Receiving the user tray; the first correcting unit is configured to move the user tray along a direction in which the first positioning component is mounted; a first-right unit, the side is to be along the second positioning component The direction of movement of the device is moved; and a work unit is operated to operate the first correction unit and the second correction unit. The user tray position correcting device of claim 1, wherein the working unit is 一第-作業單元,係連接至該底板,並且其巾 單元係用以操作該第一校正單元;以及 ” 一 H業單元’係連接至該底板,並且射該第二作業 單讀'與該第-作業單元被卿的操作該帛二校正單元。 3.如請求項2所述之用戶托盤位置校正設備,其中該第一作業單 作業單柯在該底板上移動時相互分離,並且其中 1 y作業單元在沿著該第—作業單元移動時操作該第二校正 一校正單 月长項2所述之用戶托盤位置校正設備,其中該第 34 201018636 元係包含: 至少一個第-移動元件,係連接至該底板’並且針至少 個第-移動元件可在該底板上轉動 :以及 板 弟彈性7L件,係將該第一移動元件彈性連接至該底 件4所述之用戶托盤位置校正設備,其中該第一移動元 係連接至該底板’且其中該第一移動柩 接觸元件,係連接·第—移動框架之—端,且其 :·、接觸轉係依據該第—移動框架之轉動來移動該用戶 祀盤,以及 〇 賴Γ轉動元件,係連接至該第—移動框架之另—端,且1中 ==件可在該第-移動框架之另-端上轉動並接觸該第- 件係用戶托盤位置校正設備,其中該第—接觸元 在,第。Λ —移動框架之―端,且其中該第—接觸元件可 在該第—移動框架之—端上轉動。 件7 元包含至少—個突出^ π 又侑中該弟-作業單 δ.如請求轉動該第—移動元件。 ’L用戶托盤位置校正設備,其中該第二校正單 35 201018636 元係包含 動,並且者知—讀讀趣裝的方向移 ” 件係沿著該第二定位 方向移動_戶托盤;以及 械女裝的 件 至少個第二5^性元件,係用以彈性支撐該第二移動元 9 8所权用戶托盤位置校正設備,其中該第二移動元 仵係包含: 及 -第二移動框架’係透過該第二彈性元件被彈性支撐 ;以 至少-個第二接觸元件,係突出於該第二移動框架中,且 其中所述至少-個第二接觸元件係用以移動該用戶托盤。 10.如明求項8所述之用戶托盤位置校正設備,其中該第二作業單 猶'與該第—作業單元相互聯鎖__第二移動元件。 ® η.如請求項!所述之用戶托盤位置校正設備,其中該第一校正單 、 讀該第二校正單元係沿著相互垂直的方向機戶托盤。 12.如„月求項1所述之用戶托盤位置校正設備,其中該作業單元係 連接至該底板,且其中該作業單元係可在該底板上移動;以及 其中料校正單讀該第二校正單聽依據該作業單 元之移動而進行操作。 13· —種測試搬運機,係包含: 36 201018636 裳载堆疊機’係具有魏個 容納有待戰的封裝“;用戶托盤,所述用戶托盤中 中;—裝载軍元,係用以將待測試的封裝晶片放入一測試托盤 ❹ Ο 位板:系統’在該腔室系統中所述封裝晶片與一高精度定 -卸載單元,_贿照封 測試托盤令容納的戦後的封裝晶片進行^;果透過分級將該 一卸載堆麵’係齡有魏匈戶域 中谷納有測試後的封裝晶片;以及 用戶托盤 用戶托盤位置校正設備,俜分 該卸載堆麵之t, ^如裝於該錢堆疊機與 其中,該用戶域位置校正設備係包含: 至少-個第一定位元件及至少—個第二定 確定一用戶托盤之位置; 午係用以 一底板,係用於接收該用戶托盤; 第枚正單凡’係用以將該用戶托盤沿著該第 件被安裝的方向移動; 疋位7L -第-校正單元’係用以將該用戶托盤沿著該第二 件被安裝的方向移動丨以及 一疋位7L 一作業單元’係用以操作該第—校正單元與該第二校正單 37a first-working unit connected to the bottom plate, and a towel unit for operating the first correcting unit; and an "H-unit" connected to the bottom plate, and the second job single reading 'and the The first-job unit is operated by the second correction unit. 3. The user tray position correction device according to claim 2, wherein the first job ticket job sheet is separated from each other when moving on the bottom plate, and wherein 1 The y job unit operates the second correction-correction single-month long item 2 user tray position correction device while moving along the first-work unit, wherein the 34th 201018636 elementary system includes: at least one first-moving element, Attached to the bottom plate 'and at least one of the first moving elements can be rotated on the bottom plate: and the elastic member 7L of the plate, the first moving element is elastically coupled to the user tray position correcting device of the bottom member 4 , wherein the first mobile element is connected to the bottom plate 'and wherein the first moving contact element is connected to the end of the first moving frame, and: - moving the frame to move the user's disk, and depending on the rotating element, is attached to the other end of the first moving frame, and the == member can be on the other end of the first moving frame Rotating and contacting the first piece of the user tray position correcting device, wherein the first contact element is at the end of the moving frame, and wherein the first contact element is at the end of the first moving frame Rotate. The 7-element contains at least one protrusion ^ π and the middle-job sheet δ. If the first moving element is requested to be rotated. 'L user tray position correction device, wherein the second calibration sheet 35 201018636 contains Moving, and knowing - reading the direction of the direction of the fun installation" is moving along the second positioning direction _ household tray; and at least a second component of the mechanical women's clothing, used to elastically support the first a second mobile unit position correction device, wherein the second mobile unit includes: and - the second moving frame 'is elastically supported by the second elastic element; and at least one second contact element, system Projecting in the second moving frame, and wherein the at least one second contact element is for moving the user tray. 10. The user tray position correcting apparatus according to claim 8, wherein the second job ticket is interlocked with the first working unit__the second moving element. ® η. As requested! The user tray position correcting device, wherein the first correction unit reads the second correction unit in a mutually perpendicular direction to the machine tray. 12. The user tray position correcting device of item 1, wherein the working unit is coupled to the bottom plate, and wherein the working unit is movable on the bottom plate; and wherein the material corrects single reading the second correction Single listening operates according to the movement of the working unit. 13·—Testing the carrying machine, including: 36 201018636 The stacking machine “has a package containing Wei”, the user tray, which is in the user tray. Loading military unit to place the packaged wafer to be tested into a test tray Ο Ο : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : The test tray is arranged to carry the packaged wafer after the processing; the unloading stack is subjected to grading, and the packaged wafer having the test in the Wei-Hung household domain is included; and the user tray user tray position correction device is divided into points. The unloading stack surface t, if installed in the money stacker and the user domain position correcting device, includes: at least one first positioning component and at least one second determining The position of the user tray; the afternoon is used for a bottom plate for receiving the user tray; the first positive is used to move the user tray along the direction in which the first piece is mounted; 疋 position 7L -第- The correction unit is configured to move the user tray in a direction in which the second piece is mounted, and a position 7L a work unit is configured to operate the first correction unit and the second correction sheet 37 18.如請求項 201018636 元0 14.U項13所述之峨搬運機,其中該作業單元係包含: 第作業單元,係連接至該底板,並且其中該第一作業 單元係用以操作該第一校正單元;以及 、 第作業單元,係連接至該底板,並且其中該第二作業 早讀、與鱗-作舞元被麵賴作該第二校正單元。 如j項14所述之測試搬運機,其中該第一作業單元與該第二 =業早疋Γ在雜板上軸時相互分離,並且其巾該第二作業 早二在A著該第—作業單元軸畴作娜二校正單元。 6.如明求項13所述之測試搬運機,其中該第—校正單元係包含: 至少一個第-移動元件,係連接麵底板,並且其中至少 -個第-移動元件可在該底板上轉動;以及 帛彈k件’係將該第一移動元件彈性連接至該底 如4項13所述之測試搬運機,其中該第二校正單絲包含: 動,粒谢安裝的方向移 方向移動糾戶托盤;《Γ細綠第二粒元件被安裝的 件。至少~個第二彈性元件,_«彈性支#該第二移動元 17所述之測離職,射該第二作鮮元係與該第 38 201018636 ’F罘早兀邳立%卩頌的移動該第二移一 19.如請求項13所述之測試搬運機,其中談 校正單元靖相互蝴方向移動卿=早元舆該第二 2〇.如請切13所叙戦_機,料該作料 板,且其+雜㈣财蝴㈣H -之孩私4彳A正單元無帛二校正單元雜據該作業單 兀*之移動而進行操作。18. The picking machine of claim 14, wherein the working unit comprises: a working unit connected to the bottom plate, and wherein the first working unit is configured to operate the first a correction unit; and a first operation unit connected to the bottom plate, and wherein the second job is read early, and the scale-dancing element is referred to as the second correction unit. The test transporter of item 14, wherein the first working unit and the second one are separated from each other on the axis of the miscellaneous board, and the second operation of the second operation is performed by the second The working unit axis domain is the Na 2 correction unit. 6. The test handler of claim 13, wherein the first correcting unit comprises: at least one first moving element, a connecting surface bottom plate, and wherein at least one of the first moving elements is rotatable on the bottom plate And the ballistic member k is configured to elastically connect the first moving member to the bottom of the test carrier as described in Item 4, wherein the second correcting monofilament comprises: Household tray; "The second component of the fine green is installed." At least ~ a second elastic element, _ «elastic branch # the second mobile element 17 said to leave the job, shoot the second for the fresh line and the 38th 201018636 'F罘 early 卩颂立卩颂% move The second shifting one 19. The test transporter according to claim 13, wherein the correcting unit moves in the direction of the mutual butterfly, and the second unit is used as the second unit. The material board, and its + miscellaneous (four) financial butterfly (four) H - child private 4 彳 A positive unit no two correction unit miscellaneous according to the movement of the operation sheet 兀 *. 3939
TW97143220A 2008-11-07 2008-11-07 An apparatus for correcting position of a user tray and a test handler TWI363734B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW97143220A TWI363734B (en) 2008-11-07 2008-11-07 An apparatus for correcting position of a user tray and a test handler

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW97143220A TWI363734B (en) 2008-11-07 2008-11-07 An apparatus for correcting position of a user tray and a test handler

Publications (2)

Publication Number Publication Date
TW201018636A true TW201018636A (en) 2010-05-16
TWI363734B TWI363734B (en) 2012-05-11

Family

ID=44831349

Family Applications (1)

Application Number Title Priority Date Filing Date
TW97143220A TWI363734B (en) 2008-11-07 2008-11-07 An apparatus for correcting position of a user tray and a test handler

Country Status (1)

Country Link
TW (1) TWI363734B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI777740B (en) * 2021-08-23 2022-09-11 鴻勁精密股份有限公司 Correction apparatus, correction method, and handler using the same
TWI791270B (en) * 2021-08-23 2023-02-01 鴻勁精密股份有限公司 Correction apparatus, correction method, and handler using the same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI777740B (en) * 2021-08-23 2022-09-11 鴻勁精密股份有限公司 Correction apparatus, correction method, and handler using the same
TWI791270B (en) * 2021-08-23 2023-02-01 鴻勁精密股份有限公司 Correction apparatus, correction method, and handler using the same

Also Published As

Publication number Publication date
TWI363734B (en) 2012-05-11

Similar Documents

Publication Publication Date Title
US6066822A (en) Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatus
JPH11297791A (en) Tray transfer arm, transfer device for tray using the same, id test device and tray transfer method
US5909657A (en) Semiconductor device testing apparatus
JPH0943309A (en) Ic test device
JP7390934B2 (en) Inspection equipment
CN216094907U (en) Sorting device for front-end integrated wafers of semiconductor equipment
TW200909327A (en) Handler and process for testing a semiconductor chips using the handler
TW200823460A (en) Apparatus for rotating a test tray in a handler
WO2009128698A1 (en) Semiconductor die sorter for wafer level packaging
CN112474441A (en) Full-automatic chip aging test and PCB shielding test assembly line equipment
CN112798936A (en) Automatic chip tester
TWI373623B (en) Apparatus for testing system-in-package (sip) devices
TW201018636A (en) An apparatus for correcting position of a user tray and a test handler
CN214669444U (en) Automatic chip tester
JPH09152466A (en) Method and apparatus for testing ic
JP2007024907A (en) Ic testing system
TWI327224B (en)
JPWO2008044305A1 (en) Tray transfer device and electronic component testing apparatus including the same
KR101406184B1 (en) A Semiconductor Tranferring Device and Test handler using thereof
JP5137965B2 (en) Conveying device and electronic component handling device
JPH08233901A (en) Separate type handler system for ic tester
WO2009116165A1 (en) Tray conveying device and electronic part test device with the same
JP4180163B2 (en) Adsorption device for electronic component testing equipment
KR101214808B1 (en) Electronic component transfer apparatus, and electronic component test equipment equipped with the same
TW200902981A (en) Apparatus for testing micro SD devices

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees