CN112798936A - Automatic chip tester - Google Patents
Automatic chip tester Download PDFInfo
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- CN112798936A CN112798936A CN202110150473.XA CN202110150473A CN112798936A CN 112798936 A CN112798936 A CN 112798936A CN 202110150473 A CN202110150473 A CN 202110150473A CN 112798936 A CN112798936 A CN 112798936A
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- 230000007246 mechanism Effects 0.000 claims abstract description 131
- 238000012360 testing method Methods 0.000 claims abstract description 113
- 239000000463 material Substances 0.000 claims abstract description 67
- 239000000969 carrier Substances 0.000 claims abstract description 3
- 230000008520 organization Effects 0.000 claims description 3
- 238000001514 detection method Methods 0.000 abstract description 2
- 238000007599 discharging Methods 0.000 description 5
- 238000013102 re-test Methods 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 238000013522 software testing Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000007480 spreading Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention relates to the technical field of detection equipment, and particularly discloses an automatic chip testing machine which comprises a to-be-tested part storage mechanism, a material taking manipulator, a conveying and testing conveyer belt, a conveying and testing carrier, a conveying and testing manipulator, a testing mechanism and a qualified part storage mechanism; the storage mechanism for the to-be-tested parts is used for storing a to-be-tested material plate loaded with a chip to be tested; the qualified part storage mechanism is used for storing qualified trays; the material taking manipulator is used for placing the chips on the material tray to be tested into the conveying and testing carrier and placing the chips qualified in the test on the conveying and testing carrier into the qualified material tray; the conveying and measuring conveyer belt is used for conveying and measuring carriers between the material taking manipulator and the conveying and measuring manipulator; and the sending and testing manipulator is used for transferring the chip between the sending and testing carrier and the testing mechanism. The invention provides an automatic chip testing machine which can realize the assembly line operation of chip electrical testing and further improve the testing efficiency.
Description
Technical Field
The invention relates to the technical field of detection equipment, in particular to an automatic chip testing machine.
Background
The chip needs to be electrically tested before leaving the factory, and a test system specially used for realizing the electrical test of the chip is not available in the market at present, so that an operator can only send the chip to each station in sequence through tools such as a trolley and the like to execute corresponding operation, and the test efficiency is low.
Therefore, it is necessary to develop a chip testing system for realizing the pipeline operation of the electrical test of the chip, so as to improve the testing efficiency.
Disclosure of Invention
An object of the present invention is to provide an automatic chip testing machine, which can implement the assembly line work of the electrical test of the chip, thereby improving the testing efficiency.
In order to achieve the above purposes, the invention provides an automatic chip testing machine, which comprises a to-be-tested piece storage mechanism, a material taking manipulator, a conveying and testing conveyer belt, a conveying and testing carrier, a conveying and testing manipulator, a testing mechanism and a qualified piece storage mechanism;
the storage mechanism for the to-be-tested parts is used for storing a to-be-tested material plate loaded with a chip to be tested;
the qualified part storage mechanism is used for storing qualified trays;
the material taking manipulator is used for placing the chips on the material tray to be tested into the conveying and testing carrier and placing the chips qualified in the test on the conveying and testing carrier into the qualified material tray;
the conveying and measuring conveyer belt is used for conveying and measuring carriers between the material taking manipulator and the conveying and measuring manipulator;
and the sending and testing manipulator is used for transferring the chip between the sending and testing carrier and the testing mechanism.
Optionally, an NG piece storage mechanism is further included;
and the NG part storage mechanism is used for storing an NG material tray, and the material taking manipulator is also used for placing the chips which are unqualified to be tested on the conveying and testing carrier into the NG material tray.
Optionally, the device further comprises a storage mechanism for the to-be-retested piece;
the storage mechanism for the parts to be retested is used for storing the material discs to be retested, and the material taking manipulator is also used for placing the chips to be retested on the delivery and testing carrier into the material discs to be retested.
Optionally, the system further comprises an empty disk storage mechanism;
the empty tray storage mechanism is used for storing empty trays, and the material taking manipulator is also used for transferring the empty trays on the empty tray storage mechanism to the qualified piece storage mechanism, the NG piece storage mechanism and the to-be-retested piece storage mechanism.
Optionally, the empty disc storage mechanism, the to-be-tested piece storage mechanism, the qualified piece storage mechanism, the NG piece storage mechanism and the to-be-tested piece storage mechanism are arranged in parallel.
Optionally, the empty tray storage mechanism, the to-be-tested piece storage mechanism, the qualified piece storage mechanism, the NG piece storage mechanism and the to-be-tested piece storage mechanism all comprise a lifting platform and a linear driving mechanism for driving the lifting platform to move up and down.
Optionally, the sending and measuring carrier includes a region to be measured and a measured region;
the material taking manipulator is used for transferring the chips on the material tray to be tested to the area to be tested of the conveying and testing carrier;
and the test conveying manipulator is used for transferring the chip at the testing mechanism to the tested area.
Optionally, each material taking manipulator is correspondingly provided with two conveying and measuring conveyor belts;
each conveying and testing conveyer belt is correspondingly provided with one conveying and testing carrier and one conveying and testing manipulator;
each send and survey the manipulator and correspond and set up four and follow the pay-off direction of sending and surveying the conveyer belt arranges the accredited testing organization.
Optionally, the number of the material taking manipulators is two.
The invention has the beneficial effects that: the utility model provides an automatic chip testing machine uses a storage mechanism that awaits measuring, gets the material manipulator, send to survey the conveyer belt, send to survey the carrier, send to survey manipulator, accredited testing organization and qualified spare storage mechanism and realize that the chip sends the last unloading homology setting of time measuring, very big reduction the equipment volume, can also realize the assembly line operation of chip test, and then improve efficiency of software testing.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without inventive exercise.
FIG. 1 is a schematic top view of an exemplary automatic chip tester;
fig. 2 is a schematic top view of a transport carrier according to an embodiment.
In the figure:
101. an empty disk storage mechanism; 102. a storage mechanism for the piece to be tested; 103. a qualified piece storage mechanism; 104. an NG piece storage mechanism; 105. a storage mechanism for the parts to be retested;
201. an idle-load tray; 202. a material tray to be detected; 203. qualified material trays; 204. NG a material tray; 205. a material tray to be tested again;
3. a material taking manipulator;
4. conveying and measuring a conveying belt;
5. conveying and testing the carrier; 501. a region to be tested; 502. a measured region;
6. sending and measuring the mechanical arm;
7. and (5) a testing mechanism.
Detailed Description
In order to make the objects, features and advantages of the present invention more obvious and understandable, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the embodiments described below are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the description of the present invention, it is to be understood that when an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. When a component is referred to as being "disposed on" another component, it can be directly on the other component or intervening components may also be present.
Furthermore, the terms "long", "short", "inner", "outer", and the like indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience of describing the present invention, but do not indicate or imply that the referred devices or elements must have the specific orientations, be configured to operate in the specific orientations, and thus are not to be construed as limitations of the present invention.
The technical scheme of the invention is further explained by the specific implementation mode in combination with the attached drawings.
Referring to fig. 1, the present embodiment provides an automatic chip testing machine, which includes an empty tray storage mechanism 101, a to-be-tested piece storage mechanism 102, a qualified piece storage mechanism 103, an NG piece storage mechanism 104, a to-be-tested piece storage mechanism 105, a material taking manipulator 3, a sending and testing conveyor belt 4, a sending and testing carrier 5, a sending and testing manipulator 6, and a testing mechanism 7.
The empty tray storage mechanism 101 is used for storing empty trays 201, the to-be-tested piece storage mechanism 102 is used for storing trays 202 to be tested, which are loaded with chips to be tested, the qualified piece storage mechanism 103 is used for storing qualified trays 203, the NG piece storage mechanism 104 is used for storing NG trays 204, and the to-be-retested piece storage mechanism 105 is used for storing trays 205 to be retested.
Optionally, the empty tray storage mechanism 101, the to-be-tested piece storage mechanism 102, the qualified piece storage mechanism 103, the NG piece storage mechanism 104, and the to-be-tested piece storage mechanism 105 all include a lifting platform and a linear driving mechanism for driving the lifting platform to move up and down.
Optionally, the linear driving mechanism is an air cylinder, a hydraulic cylinder or a motor screw rod assembly.
Referring to fig. 2, the transfer carrier 5 includes a region to be measured 501 and a measured region 502.
The working process of the automatic chip tester provided by the embodiment is as follows:
(1) the linear driving mechanism of the to-be-tested part storage mechanism 102 drives the lifting platform to descend to the lowest point, the stacked to-be-tested material discs 202 are placed into the lifting platform of the to-be-tested part storage mechanism 102 manually or by using equipment, and then the lifting platform of the to-be-tested part storage mechanism 102 is lifted upwards; meanwhile, the linear driving mechanism of the empty tray storage mechanism 101 drives the lifting platform to descend to the lowest point, the empty trays 201 stacked and placed are placed into the lifting platform of the empty tray storage mechanism 101 manually or by using equipment, and then the lifting platform of the empty tray storage mechanism 101 is lifted upwards;
(2) the material taking manipulator 3 transfers the empty tray 201 on the empty tray storage mechanism 101 to the qualified piece storage mechanism 103, the NG piece storage mechanism 104 and the to-be-tested piece storage mechanism 105; therefore, an operator only needs to put a plurality of empty trays stacked in a batch manner into the empty tray storage mechanism 101 at one time, and the material taking manipulator 3 can automatically send each empty tray to each position, so that the qualified trays 203, the NG trays 204, the trays to be tested 205 and the like are obtained; empty trays do not need to be put into the qualified piece storage mechanism 103, the NG piece storage mechanism 104 and the to-be-tested piece storage mechanism 105 one by one, and therefore testing efficiency is improved;
(3) the material taking manipulator 3 puts the chips on the material tray 202 to be tested into the region 501 to be tested of the sending and testing carrier 5, the sending and testing conveyer belt 4 forwards conveys the sending and testing carrier 5 and the chips to be tested to the sending and testing manipulator 6, and the sending and testing manipulator 6 sends the chips in the region 501 to be tested into the testing mechanism 7 for electrical testing;
(4) after the test is finished, the sending and testing manipulator 6 transfers the tested chip from the testing mechanism 7 to the tested area 502 of the sending and testing carrier 5, and further, the control system automatically records at the background which position in the tested area 502 corresponds to the chip which is qualified to be tested, which position is unqualified to be tested, and which position needs to be retested; for example, the tested area 502 has a total of four discharging slots, the first is that the test is not qualified, the second is that the retest is required, and the third and fourth are that the retest is qualified, and these information are recorded in the control system, so that the material taking manipulator 3 can put the chips in the discharging slots into different storage mechanisms in the subsequent steps; in order to conveniently record the test information, code scanning equipment can be arranged to perform code scanning operation on identification information such as a two-dimensional code on the chip;
(5) the feeding and conveying belt reversely conveys the feeding and testing carrier 5 to the material taking manipulator 3, and the material taking manipulator 3 conveys each chip to a proper material tray according to the background record, for example, the chips which are tested to be qualified in the tested area 502 are put into a qualified material tray 203, the chips which are tested to be unqualified in the tested area 502 are put into an NG material tray 204, and the chips which are required to be retested in the tested area 502 are put into a material tray 205 to be retested; optionally, two trays 205 to be tested again can be arranged, each tray 205 to be tested again is correspondingly provided with a storage mechanism 105 for a part to be tested again, a tray 205 to be tested again is placed in a position where the first test is unqualified, a tray 205 to be tested again is placed in a position where the second test is unqualified, and the tray is sent to the NG tray 204 if the third test is unqualified;
(6) and (3) completing a test cycle, and repeatedly executing the steps (1) to (5) to complete the test of all chips to be tested.
It should be noted that in this embodiment, when the linear driving mechanism of the to-be-tested piece storage mechanism 102 drives the lifting platform to descend to the lowest point, the stacked to-be-tested material trays 202 can be placed in the lifting platform of the to-be-tested piece storage mechanism 102; similarly, when the linear driving mechanism of the empty tray storage mechanism 101 drives the lifting platform to descend to the lowest point, the empty tray 201 stacked and placed in the stack can be placed in the lifting platform of the empty tray storage mechanism 101.
After qualified chips are fully placed on the qualified material tray 203, the qualified piece storage mechanism 103 descends a little, and the material taking manipulator 3 places a new empty material tray 201 on the qualified piece storage mechanism 103, so that qualified test chips can be stored continuously; when the lifting platform of the qualified product storage mechanism 103 descends to the lowest position, the stacked qualified product trays 203 can be taken out in batch. The working principle of the NG piece storage mechanism 104 and the to-be-tested piece storage mechanism 105 is the same as that of the qualified piece storage mechanism 103, and the details are not repeated here.
Optionally, the empty tray storage mechanism 101, the to-be-tested piece storage mechanism 102, the qualified piece storage mechanism 103, the NG piece storage mechanism 104, and the to-be-tested piece storage mechanism 105 are arranged in parallel, so that the feeding stroke of the material taking manipulator 3 is shortened, the testing efficiency is improved, and the equipment volume is reduced.
Optionally, in order to further improve the testing efficiency, each of the material taking manipulators 3 is correspondingly provided with a storage mechanism 102 for a to-be-tested part, a storage mechanism 103 for a qualified part, and two conveying belts 4 for conveying and testing. Each conveying and measuring conveyer belt 4 is correspondingly provided with a conveying and measuring carrier 5 and a conveying and measuring manipulator 6. The conveying and measuring carrier 5 is provided with eight discharging troughs, four discharging troughs are positioned in a region to be measured 501, and the other four discharging troughs are positioned in a measured region 502. Each of the conveying and testing manipulators 6 is correspondingly provided with four testing mechanisms 7 which are arranged along the feeding direction of the conveying and testing conveyor belt 4.
Optionally, the number of the material taking manipulators 3 is two. The two material taking manipulators 3 are correspondingly provided with an empty disk storage mechanism 101, an NG storage mechanism 104 and a storage mechanism 105 for a part to be tested. Of course, in some other embodiments, each of the material taking manipulators 3 may also be provided with other numbers of the sending and measuring conveyor belts 4 and sending and measuring manipulators 6, and the like, which is not limited in this embodiment.
The chip automatic testing machine that this embodiment provided, through the mode of backstage record test result, the realization goes up the homologous setting of unloading, very big reduction the equipment volume, further, two material taking manipulator cooperation four send to survey the conveyer belt and carry out work, further improved the efficiency of software testing of chip, had great spreading value.
The above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (9)
1. An automatic chip testing machine is characterized by comprising a to-be-tested piece storage mechanism, a material taking manipulator, a conveying and testing conveyer belt, a conveying and testing carrier, a conveying and testing manipulator, a testing mechanism and a qualified piece storage mechanism;
the storage mechanism for the to-be-tested parts is used for storing a to-be-tested material plate loaded with a chip to be tested;
the qualified part storage mechanism is used for storing qualified trays;
the material taking manipulator is used for placing the chips on the material tray to be tested into the conveying and testing carrier and placing the chips qualified in the test on the conveying and testing carrier into the qualified material tray;
the conveying and measuring conveyer belt is used for conveying and measuring carriers between the material taking manipulator and the conveying and measuring manipulator;
and the sending and testing manipulator is used for transferring the chip between the sending and testing carrier and the testing mechanism.
2. The automatic chip testing machine according to claim 1, further comprising an NG piece storage mechanism;
and the NG part storage mechanism is used for storing an NG material tray, and the material taking manipulator is also used for placing the chips which are unqualified to be tested on the conveying and testing carrier into the NG material tray.
3. The automatic chip testing machine according to claim 2, further comprising a storage mechanism for the piece to be tested;
the storage mechanism for the parts to be retested is used for storing the material discs to be retested, and the material taking manipulator is also used for placing the chips to be retested on the delivery and testing carrier into the material discs to be retested.
4. The automatic chip testing machine according to claim 3, further comprising an empty disk storage mechanism;
the empty tray storage mechanism is used for storing empty trays, and the material taking manipulator is also used for transferring the empty trays on the empty tray storage mechanism to the qualified piece storage mechanism, the NG piece storage mechanism and the to-be-retested piece storage mechanism.
5. The automatic chip testing machine according to claim 4, wherein the empty tray storage mechanism, the to-be-tested piece storage mechanism, the qualified piece storage mechanism, the NG piece storage mechanism, and the to-be-tested piece storage mechanism are arranged in parallel.
6. The automatic chip testing machine according to claim 4, wherein the empty tray storage mechanism, the storage mechanism for the pieces to be tested, the storage mechanism for the qualified pieces, the storage mechanism for the NG pieces, and the storage mechanism for the pieces to be tested each include a lifting platform and a linear driving mechanism for driving the lifting platform to move up and down.
7. The automatic chip testing machine according to claim 1, wherein the feeding and testing carrier includes a tested region and a tested region;
the material taking manipulator is used for transferring the chips on the material tray to be tested to the area to be tested of the conveying and testing carrier;
and the test conveying manipulator is used for transferring the chip at the testing mechanism to the tested area.
8. The automatic chip testing machine according to claim 1, wherein each of said material-taking manipulators is provided with two said feeding and testing conveyor belts;
each conveying and testing conveyer belt is correspondingly provided with one conveying and testing carrier and one conveying and testing manipulator;
each send and survey the manipulator and correspond and set up four and follow the pay-off direction of sending and surveying the conveyer belt arranges the accredited testing organization.
9. The automatic chip testing machine according to claim 8, wherein the number of said material-taking manipulators is two.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110150473.XA CN112798936A (en) | 2021-02-03 | 2021-02-03 | Automatic chip tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110150473.XA CN112798936A (en) | 2021-02-03 | 2021-02-03 | Automatic chip tester |
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|---|---|
| CN112798936A true CN112798936A (en) | 2021-05-14 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110150473.XA Pending CN112798936A (en) | 2021-02-03 | 2021-02-03 | Automatic chip tester |
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| CN (1) | CN112798936A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114405850A (en) * | 2022-01-24 | 2022-04-29 | 苏州华兴源创科技股份有限公司 | Manipulator coordinate point position compensation method and device and chip detection method and device |
| CN114843215A (en) * | 2022-04-29 | 2022-08-02 | 深圳格芯集成电路装备有限公司 | Chip testing device |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN211385867U (en) * | 2019-11-06 | 2020-09-01 | 南京协辰电子科技有限公司 | Production system |
| CN214669444U (en) * | 2021-02-03 | 2021-11-09 | 深圳市联合东创科技有限公司 | Automatic chip tester |
-
2021
- 2021-02-03 CN CN202110150473.XA patent/CN112798936A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN211385867U (en) * | 2019-11-06 | 2020-09-01 | 南京协辰电子科技有限公司 | Production system |
| CN214669444U (en) * | 2021-02-03 | 2021-11-09 | 深圳市联合东创科技有限公司 | Automatic chip tester |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114405850A (en) * | 2022-01-24 | 2022-04-29 | 苏州华兴源创科技股份有限公司 | Manipulator coordinate point position compensation method and device and chip detection method and device |
| CN114843215A (en) * | 2022-04-29 | 2022-08-02 | 深圳格芯集成电路装备有限公司 | Chip testing device |
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