TWI791270B - Correction apparatus, correction method, and handler using the same - Google Patents

Correction apparatus, correction method, and handler using the same Download PDF

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TWI791270B
TWI791270B TW110131117A TW110131117A TWI791270B TW I791270 B TWI791270 B TW I791270B TW 110131117 A TW110131117 A TW 110131117A TW 110131117 A TW110131117 A TW 110131117A TW I791270 B TWI791270 B TW I791270B
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detection
operating
program
corrector
operator
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TW110131117A
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TW202309689A (en
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陳麒宏
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鴻勁精密股份有限公司
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Abstract

The present invention reveals a correction apparatus for correcting positions of plural operators, including a base, a first position corrector, and a second position corrector. The base is arranged fixedly with a detection area defined thereabove. The first position corrector is disposed on a first detection position of the base, picturing along a first direction toward the operator located on the detection area to determine the position of the operator under a second direction. The second position corrector is disposed on a second detection position of the base, picturing along the second direction toward the operator located on the detection area to determine the position of the operator under the first direction. Therefore, positions and deviations of the operators are obtained, and compensations for actual position fitting can be processed precisely.

Description

校正裝置、校正方法及其應用之作業機Calibration device, calibration method and operating machine for its application

本發明有關一種以取像式檢知複數個作業器於複數個方向上之位置,利於補償校正複數個作業器之實際作業位置,而提高作業精準性之校正裝置及校正方法。 The present invention relates to a calibration device and a calibration method for detecting the positions of a plurality of operating devices in multiple directions by means of imaging, which is beneficial for compensating and correcting the actual operating positions of the plurality of operating devices and improving the accuracy of the operation.

在現今,作業機以作業機構(如移料機構或打印機構等)之作業器(如移料器或打印器等)於不同承置器(如料盤、載台、測試器或預溫盤等)對電子元件執行預設作業(如取放料作業或打印作業等)。舉一為移料機構之作業機構為例,移料機構具有複數個移料器,並位移至預設作業位置而執行複數個電子元件之取放料作業,由於電子元件日趨精密微小,因此,對於複數個移料器同步將複數個電子元件移入載台之複數個容置槽的作業位置精準度要求相當高;然移料機構於更換一批次複數個移料器、複數個移料器取放精度有異或移料器撞機等因素下,移料器之作業位置易發生異常;例如移料器因傾斜組裝,而導致複數個移料器之間距發生異常;例如移料器因裝配高度不足,導致取放料高度作業位置異常;前述異常狀態均使移料器無法精準取放電子元件,業者必須對移料機構之複數個移料器的作業位置精準度作一檢知校正。 Nowadays, the operating machine uses an operating device (such as a material transfer device or a printer, etc.) of an operating mechanism (such as a material transfer mechanism or a printing mechanism, etc.) etc.) Execute preset operations on electronic components (such as pick-and-place operations or print operations, etc.). Take the operating mechanism of the material shifting mechanism as an example. The material moving mechanism has a plurality of material shifters, and moves to the preset operating position to perform the pick-and-place operation of a plurality of electronic components. Since the electronic components are becoming more and more sophisticated, therefore, For multiple material shifters to simultaneously move multiple electronic components into the multiple accommodating slots of the carrier, the accuracy of the operation position is quite high; however, the material transfer mechanism is used to replace a batch of multiple material shifters and multiple material shifters. Due to factors such as differences in pick-and-place accuracy or collision of the material shifter, the working position of the material shifter is likely to be abnormal; Insufficient assembly height leads to abnormal working position of pick-and-place materials; the above-mentioned abnormal conditions make the material shifter unable to accurately pick and place electronic components, and the industry must check and correct the accuracy of the working positions of multiple material shifters in the material shifting mechanism .

本發明之目的一,提供一種校正裝置,以供校正複數個作業器之位置,校正裝置包含承具、第一位置校正器及第二位置校正器,承具為固定式配置,並於上方構成檢知區域,第一位置校正器裝配於承具之第一檢知位置,以供朝第一方向作側向取像位於檢知區域之作業器,而檢知作業器於第二方向上的位置,第二位置校正器裝配於承具之第二檢知位置,以供朝第二方向作側向取像位於檢知區域之作業器,而檢知作業器於第一方向上的位置;藉以取得複數個作業器之位置偏差值,進而利於補償校正複數個作業器之實際作業位置,進而提高作業精準性。 The first object of the present invention is to provide a calibration device for correcting the positions of a plurality of operating devices. The calibration device includes a support, a first position corrector and a second position corrector. The support is fixed and configured on the top. In the detection area, the first position corrector is installed at the first detection position of the support for lateral imaging of the operating device in the detection area in the first direction, and the detection of the operating device in the second direction Position, the second position corrector is assembled at the second detection position of the support, for taking lateral images of the operating device located in the detection area in the second direction, and detecting the position of the operating device in the first direction; In order to obtain the position deviation value of a plurality of operating devices, it is beneficial to compensate and correct the actual operating positions of a plurality of operating devices, thereby improving the operating accuracy.

本發明之目的二,提供一種校正裝置,更包含至少一高度校正器,高度校正器檢知位於承具之檢知區域的作業器於第三方向上的位置(作業高度位置),以取得高度位置偏差值,利於補償校正複數個作業器之實際作業高度位置,進而提高作業精準性。 The second object of the present invention is to provide a calibration device, which further includes at least one height calibrator. The height calibrator detects the position (working height position) of the operating device located in the detection area of the support in the third direction, so as to obtain the height position The deviation value is beneficial to compensate and correct the actual working height positions of multiple working devices, thereby improving the working accuracy.

本發明之目的三,提供一種校正裝置,更包含第一調整器及第二調整器,第一調整器及第二調整器裝配於承具,並各別承裝第一位置校正器及第二位置校正器,第一調整器及第二調整器依作業需求而分別調整第一位置校正器及第二位置校正器之裝配位置,進而提高校正作業精準性。 The third object of the present invention is to provide a calibration device, which further includes a first adjuster and a second adjuster. The position corrector, the first adjuster and the second adjuster respectively adjust the assembly positions of the first position corrector and the second position corrector according to the operation requirements, thereby improving the accuracy of the calibration operation.

本發明之目的四,提供一種校正方法,以供校正複數個作業器之位置,包含第一移載作業器程序、第一檢知程序、第二檢知程序及比對程序;第一移載作業器程序以移載複數個作業器於承具上方之檢知區域沿第一方向位移預設間距值;第一檢知程序以第一位置校正器於承具之第一檢知位置朝第一方向作取像式檢知複數個作業器於第二方向上之位置;第二檢知程序以第二位置校正器於承具之第二檢知位置朝第二方向作取像式檢知複數個作業器於第一 方向上之位置;比對程序以處理器接收第一檢知程序及第二檢知程序傳輸之複數個作業器位置資料,以分析複數個作業器於第一方向及第二方向上之位置,而取得複數個作業器之位置偏差值,並補償校正複數個作業器之實際作業位置,進而提高作業精準性。 The fourth object of the present invention is to provide a calibration method for correcting the positions of a plurality of operators, including the first transfer operator program, the first detection program, the second detection program and the comparison program; the first transfer The operator program is to move a plurality of operators to the detection area above the bearing and move the preset distance value along the first direction; the first detection program uses the first position corrector to move toward the first detection position of the bearing The position of a plurality of operating devices in the second direction is detected by imaging in one direction; the second detection program uses the second position corrector to perform image detection in the second direction at the second detection position of the support multiple operators in the first The position in the direction; the comparison program uses the processor to receive the position data of multiple operators transmitted by the first detection program and the second detection program, so as to analyze the positions of multiple operators in the first direction and the second direction, To obtain the position deviation value of multiple operating devices, and compensate and correct the actual operating positions of multiple operating devices, thereby improving the operating accuracy.

本發明之目的五,提供一種校正方法,更包含前置程序,前置程序係預設一位於檢知區域之作業器的中心位置作為校正初始位置,以供其他作業器以校正初始位置為基準位移預設間距值。 The fifth object of the present invention is to provide a calibration method, which further includes a pre-program. The pre-program presets the center position of an operator located in the detection area as the calibration initial position, so that other operators can use the calibration initial position as a reference Shift preset spacing value.

本發明之目的六,提供一種校正方法,更包含第二移載作業器程序及第三檢知程序,第二移載作業器程序以移載複數個作業器於承具之檢知區域沿第三方向位移預設高度值;第三檢知程序以高度校正器檢知複數個作業器於第三方向上之位置;比對程序以處理器接收第三檢知程序傳輸之複數個作業器位置資料,藉以取得複數個作業器之高度位置偏差值,並補償校正作業器之實際高度作業位置,進而提高作業精準性。 The sixth object of the present invention is to provide a calibration method, which further includes a second transfer operation device program and a third detection program, the second transfer operation device program is used to transfer a plurality of operation devices along the detection area of the bearing The preset height value is displaced in three directions; the third detection program uses the height corrector to detect the position of multiple operators in the third direction; the comparison program uses the processor to receive the position data of multiple operators transmitted by the third detection program , so as to obtain the height position deviation value of a plurality of operators, and compensate and correct the actual height and working position of the operators, thereby improving the operation accuracy.

本發明之目的七,提供一種作業機,包含機台、至少一作業裝置、本發明校正裝置及中央控制裝置,至少一作業裝置配置於機台,並設有至少一承置器及至少一作業機構,至少一承置器供承置複數個電子元件,作業機構設有複數個作業器,以供對複數個電子元件執行預設作業;本發明校正裝置配置於機台,以供校正複數個作業器之位置;中央控制裝置以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。 The seventh object of the present invention is to provide an operating machine, which includes a machine platform, at least one operating device, a calibration device of the present invention, and a central control device. Mechanism, at least one holder is used to support a plurality of electronic components, and the operating mechanism is provided with a plurality of operating devices for performing preset operations on a plurality of electronic components; The position of the operating device; the central control device controls and integrates the actions of each device to perform automated operations and achieve the practical benefit of improving operating efficiency.

10:機台 10: machine

20:作業裝置 20: Operating device

21:供料器 21: Feeder

22:收料器 22: Receiver

23:第一移料機構 23: The first material transfer mechanism

231:移動臂 231: mobile arm

232:變距單元 232: Variable pitch unit

2331:第一移料器 2331: The first shifter

2332:第二移料器 2332: Second shifter

2333:第三移料器 2333: The third shifter

2334:第四移料器 2334: The fourth shifter

2341:第一升降器 2341: First Lifter

2342:第二升降器 2342:Second lifter

2343:第三升降器 2343: Third lifter

2344:第四升降器 2344: Fourth lifter

24:測試器 24: Tester

25:第一載台 25: The first platform

26:壓接器 26: crimping device

27:第二載台 27: The second platform

28:第二移料機構 28: The second material transfer mechanism

29:測試室 29: Testing Room

30:校正裝置 30: Calibration device

31:承具 31: bearing

311:通孔 311: through hole

32:第一位置校正器 32: First position corrector

321:第一光源 321: The first light source

L1:第一檢知軸線 L1: the first detection axis

33:第二位置校正器 33: Second position corrector

331:第二光源 331: second light source

L2:第二檢知軸線 L2: The second detection axis

341:第一調整器 341: first adjuster

342:第二調整器 342: second adjuster

35:高度校正器 35: Altitude corrector

36:第三調整器 36: The third adjuster

圖1:本發明作業機之配置圖。 Fig. 1: Configuration diagram of the working machine of the present invention.

圖2:本發明移料機構之示意圖。 Figure 2: A schematic diagram of the material transfer mechanism of the present invention.

圖3:本發明校正裝置之俯視圖。 Figure 3: A top view of the calibration device of the present invention.

圖4:本發明校正裝置之側視圖。 Figure 4: Side view of the calibration device of the present invention.

圖5:本發明校正方法之流程圖。 Fig. 5: Flowchart of the calibration method of the present invention.

圖6:移料器位於檢知區域之校正初始位置的示意圖。 Figure 6: Schematic diagram of the corrected initial position of the material shifter in the detection area.

圖7:校正移料器於第一方向上的位置之示意圖。 Fig. 7: A schematic diagram of correcting the position of the material shifter in the first direction.

圖8:校正移料器於第二方向上的位置之示意圖。 Fig. 8: A schematic diagram of correcting the position of the material shifter in the second direction.

圖9:校正移料器於第三方向上的位置之示意圖。 Figure 9: Schematic diagram of correcting the position of the material shifter in the third direction.

為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:請參閱圖1~4,本發明作業機包含機台10、至少一作業裝置20、至少一本發明校正裝置30及中央控制裝置(圖未示出)。至少一作業裝置20配置於機台10,並設有至少一承置器及至少一作業機構,至少一承置器以供承置複數個電子元件,至少一作業機構設有複數個作業器,以供對複數個電子元件執行預設作業;本發明校正裝置30配置於機台10,以供校正作業機構之複數個作業器於複數個方向的位置;中央控制裝置以供控制及整合各裝置作動,以執行自動化作業。依作業需求,作業裝置20之承置器可為供料器、收料器、載台、測試器或預溫盤等,以供盛裝複數個電子元件;作業裝置20之作業機構可為移料機構、壓接機構或打印機構等,作業器可為移料器、壓接器或打印器等,不受限於本實施例。 In order to make your examiners have a better understanding of the present invention, hereby cite a preferred embodiment and cooperate with the drawings, and the details are as follows: Please refer to Figures 1 to 4, the operating machine of the present invention includes a machine platform 10 and at least one operating device 20. At least one calibration device 30 of the present invention and a central control device (not shown). At least one working device 20 is arranged on the machine platform 10, and is provided with at least one holder and at least one working mechanism, at least one holder is used to hold a plurality of electronic components, at least one working mechanism is provided with a plurality of working devices, It is used to perform preset operations on a plurality of electronic components; the calibration device 30 of the present invention is arranged on the machine platform 10, and is used to correct the positions of multiple operators of the operating mechanism in multiple directions; the central control device is used to control and integrate various devices Actions to execute automated jobs. According to the operation requirements, the holder of the operation device 20 can be a feeder, a receiver, a carrier, a tester or a pre-heating tray, etc., to hold a plurality of electronic components; the operation mechanism of the operation device 20 can be a material transfer Mechanism, crimping mechanism or printing mechanism, etc., the operating device can be a material transfer device, crimping device or printer, etc., and is not limited to this embodiment.

為清楚說明本案,本案所稱之第一方向或第二方向可為X方向或Y方向,本案實施例所述之第一方向為X方向,第二方向為Y方向,第三方向為Z方向;檢知軸線之方向相同於作業器之移動方向。 In order to clearly illustrate this case, the first direction or the second direction referred to in this case may be the X direction or the Y direction, the first direction described in the embodiment of this case is the X direction, the second direction is the Y direction, and the third direction is the Z direction ; The direction of the detection axis is the same as the moving direction of the operating device.

於本實施例,作業裝置20包含供料器21、收料器22、一為第一移料機構23之作業機構、測試器24、第一載台25、壓接器26、第二載台27及另一為第二移料機構28之作業機構、溫控機構(圖未示出)及測試室29。供料器21供盛裝複數個待測之電子元件;收料器22供盛裝複數個已測之電子元件;第一移料機構23與第二移料機構28之設計相同,茲舉第一移料機構23為例,第一移料機構23設有移動臂231、變距單元232及複數個為移料器之作業器,移動臂231帶動變距單元232及複數個移料器作X-Y方向位移及較大行程之Z方向位移,複數個移料器包含第一移料器2331、第二移料器2332、第三移料器2333及第四移料器2334,並以固定配置之第二移料器2332作為變距基準,第一移料器2331、第三移料器2333及第四移料器2334連接變距單元232,依作業需求,變距單元232驅動第一移料器2331、第三移料器2333及第四移料器2334以第二移料器2332為基準作X方向位移預設間距值而改變間距;又第一移料器2331、第二移料器2332、第三移料器2333及第四移料器2334分別連接第一升降器2341、第二升降器2342、第三升降器2343及第四升降器2344,以供作Z方向位移至預設高度作業位置而取放電子元件;因此,第一移料機構23以移動臂231帶動第一移料器2331、第二移料器2332、第三移料器2333及第四移料器2334於供料器21取出複數個待測之電子元件。 In this embodiment, the operating device 20 includes a feeder 21, a material receiver 22, an operating mechanism that is a first material transfer mechanism 23, a tester 24, a first carrier 25, a crimping device 26, and a second carrier 27 and the other are the operating mechanism of the second material transfer mechanism 28, a temperature control mechanism (not shown) and a test chamber 29. The feeder 21 is for containing a plurality of electronic components to be tested; the material receiver 22 is for containing a plurality of electronic components that have been tested; the design of the first material transfer mechanism 23 and the second material transfer mechanism 28 is the same. Take the material transfer mechanism 23 as an example. The first material transfer mechanism 23 is equipped with a moving arm 231, a distance-changing unit 232 and a plurality of operating devices that are material shifters. Displacement and displacement in the Z direction of the larger stroke, a plurality of shifters include the first shifter 2331, the second shifter 2332, the third shifter 2333 and the fourth shifter 2334, and the second shifter with a fixed configuration The second material shifter 2332 is used as the reference for distance change. The first material shifter 2331, the third material shifter 2333 and the fourth material shifter 2334 are connected to the distance change unit 232. According to the operation requirements, the distance change unit 232 drives the first material shifter. 2331, the third material shifter 2333 and the fourth material shifter 2334 are based on the second material shifter 2332 for the X-direction displacement preset spacing value to change the spacing; and the first material shifter 2331, the second material shifter 2332 , the third lifter 2333 and the fourth lifter 2334 are respectively connected to the first lifter 2341, the second lifter 2342, the third lifter 2343 and the fourth lifter 2344 for displacement in the Z direction to a preset height The electronic components are picked and placed at the operating position; therefore, the first material transfer mechanism 23 drives the first material transfer device 2331, the second material transfer device 2332, the third material transfer device 2333 and the fourth material transfer device 2334 with the moving arm 231 to supply The feeder 21 takes out a plurality of electronic components to be tested.

測試器24包含電性連接之電路板及具探針之測試座,以供測試電子元件,第一載台25以供載送待測之電子元件作至少一方向位移,舉例第一載 台25可載送待測電子元件至測試器24之側方,舉例第一載台25可載送待測電子元件至測試器24之下方;於本實施例,第一載台25以供第一移料機構23之第一移料器2331、第二移料器2332、第三移料器2333及第四移料器2334移入複數個待測電子元件,並將複數個待測電子元件移載至測試器24之側方;壓接器26於第一載台25取出複數個待測之電子元件,以移載且下壓複數個待測電子元件於測試器24執行測試作業,測試室29罩置於測試器24之外部,於冷測作業時,以流體輸送管(圖未示出)輸送乾燥空氣至測試室29,溫控機構(圖未示出)於壓接器26設有溫控件,以供溫控電子元件,使電子元件於模擬日後使用環境溫度下執行測試作業;於完測後,壓接器26將複數個已測電子元件由測試器24移載至第二載台27;第二載台27載出複數個已測之電子元件,第二移料機構28於第二載台27取出複數個已測之電子元件,並依據測試結果,將複數個已測之電子元件輸送至收料器22而分類收置;中央控制裝置(圖未示出)用以控制及整合各裝置作動,以執行自動化作業,進而提升作業效能。 The tester 24 includes an electrically connected circuit board and a test socket with probes for testing electronic components. The first stage 25 is used for carrying the electronic components to be tested for at least one direction of displacement. The table 25 can carry the electronic components to be tested to the side of the tester 24. For example, the first carrier 25 can carry the electronic components to be tested to the bottom of the tester 24; in this embodiment, the first carrier 25 is used for the second The first material transfer device 2331, the second material transfer device 2332, the third material transfer device 2333 and the fourth material transfer device 2334 of a material transfer mechanism 23 move into a plurality of electronic components to be tested, and move the plurality of electronic components to be tested. Loaded to the side of the tester 24; the crimping device 26 takes out a plurality of electronic components to be tested on the first stage 25, and transfers and presses down a plurality of electronic components to be tested in the tester 24 to perform the test operation, the test room The 29 cover is placed outside the tester 24. During the cold test operation, the dry air is delivered to the test chamber 29 by a fluid delivery pipe (not shown), and the temperature control mechanism (not shown) is provided on the crimping device 26. The temperature control is used to control the temperature of the electronic components, so that the electronic components can perform the test operation under the simulated ambient temperature in the future; after the test is completed, the crimping device 26 transfers a plurality of tested electronic components from the tester 24 to the second Carrier 27; the second carrier 27 carries a plurality of electronic components that have been tested, and the second material transfer mechanism 28 takes out a plurality of electronic components that have been tested on the second carrier 27, and according to the test results, the plurality of tested electronic components The electronic components are transported to the receiver 22 and sorted and stored; the central control device (not shown in the figure) is used to control and integrate the actions of each device to perform automated operations, thereby improving operating efficiency.

然,作業裝置20依作業需求,可僅配置第一移料機構23,以第一移料機構23於供料器21及收料器22移載待測電子元件及已測電子元件,亦無不可。作業裝置20依作業需求,可僅配置第一載台25,以第一載台25載送待測電子元件及已測電子元件,亦無不可。作業裝置20依作業需求,壓接器26可作單一方向或複數個方向位移,舉例壓接器26可搭配移料機構作動,移料機構將待測電子元件移入測試器24,壓接器26作單一方向位移僅執行下壓動作,亦無不可。作業裝置20依作業需求,於熱測作業時,測試室29內可配置鼓風機,以供吹送熱風,使測試室29之內部升溫,亦無不可。作業裝置20依作業需求,而配置預溫盤,以供預溫待測之電子元件。 However, the operating device 20 can only be equipped with the first material transfer mechanism 23 according to the operation requirements, and the electronic components to be tested and the electronic components to be tested can be transferred to the feeder 21 and the material receiver 22 with the first material transfer mechanism 23, and there is no No. The operation device 20 can only be equipped with the first carrier 25 according to the operation requirements, and it is also possible to use the first carrier 25 to carry the electronic components to be tested and the electronic components to be tested. The operating device 20 can be moved in one direction or multiple directions according to the operation requirements. For example, the crimping device 26 can be operated with a material transfer mechanism. The material transfer mechanism moves the electronic components to be tested into the tester 24, and the crimping device 26 It is also okay to perform a single-directional displacement and only perform a pressing action. The operating device 20 can be equipped with a blower in the test room 29 according to the operation requirements, so as to blow hot air to heat up the temperature of the test room 29 during the thermal measurement operation. The operating device 20 is equipped with a pre-heating tray according to the operating requirements for pre-heating the electronic components to be tested.

校正裝置30以供校正作業機構之複數個作業器於複數個方向上的位置;校正裝置30包含承具31、第一位置校正器32及第二位置校正器33。 The calibration device 30 is used for calibrating the positions of a plurality of working tools of the operating mechanism in multiple directions; the calibration device 30 includes a bearing 31 , a first position corrector 32 and a second position corrector 33 .

承具31為固定式配置,並於上方構成檢知區域;更進一步,承具31可為座體、板體或機台板;於本實施例,承具31為板體,其頂面為平面,並於上方構成一檢知區域;另於承具31開設至少一通孔311,通孔311由承具31之底面貫通至頂面,且相通至檢知區域。 The supporting device 31 is a fixed configuration, and constitutes a detection area above; further, the supporting device 31 can be a seat body, a board body or a machine platform; in this embodiment, the supporting device 31 is a board body, and its top surface is Plane, and form a detection area above; In addition, at least one through hole 311 is opened in the bearing 31, the through hole 311 runs through from the bottom surface of the bearing 31 to the top surface, and communicates with the detection area.

第一位置校正器32沿第一檢知軸線L1裝配於承具31之第一檢知位置,以供朝第一方向作側向取像位於檢知區域之作業器,而檢知作業器於第二方向上的位置;更進一步,第一位置校正器32裝配至少一第一光源,第一光源朝向作業器投射光束。於本實施例,第一位置校正器32為CCD,並沿第一檢知軸線L1裝配於承具31第一側之第一檢知位置,第一位置校正器32之中心位置對位於承具31之中心位置;第一位置校正器32於取像端裝配第一光源321,第一光源321以供朝第一方向投射光束,第一位置校正器32朝第一方向作側向取像作業器。 The first position corrector 32 is installed at the first detection position of the support 31 along the first detection axis L1, so as to take a lateral image of the operating device located in the detection area in the first direction, and the detection of the operating device is in the detection area. The position in the second direction; further, the first position corrector 32 is equipped with at least one first light source, and the first light source projects a light beam toward the working device. In this embodiment, the first position corrector 32 is a CCD, and is assembled at the first detection position on the first side of the support 31 along the first detection axis L1, and the center position of the first position corrector 32 is aligned with the support. The center position of 31; the first position corrector 32 is equipped with a first light source 321 at the image-taking end, and the first light source 321 is used for projecting light beams toward the first direction, and the first position corrector 32 performs lateral imaging operations toward the first direction device.

第二位置校正器33沿第二檢知軸線L2裝配於承具31之第二檢知位置,以供朝第二方向作側向取像位於檢知區域之作業器,而檢知作業器於第一方向上的位置;更進一步,第二位置校正器33裝配至少一第二光源,第二光源朝向作業器投射光束。於本實施例,第二位置校正器33為CCD,並沿第二檢知軸線L2裝配於承具31第二側之第二檢知位置,第二側相鄰第一側,第二位置校正器33之中心位置對位於承具31之中心位置;第二位置校正器33於取像端裝配第二光源331,第二光源331以供朝第二方向投射光束,第二位置校正器33朝第二方向取像作業器。 The second position corrector 33 is installed at the second detection position of the support 31 along the second detection axis L2, so as to take a lateral image of the operation device in the detection area in the second direction, and the detection operation device is in the detection area. The position in the first direction; further, the second position corrector 33 is equipped with at least one second light source, and the second light source projects a light beam toward the working device. In this embodiment, the second position corrector 33 is a CCD, and is installed at the second detection position on the second side of the bearing 31 along the second detection axis L2, the second side is adjacent to the first side, and the second position correction The center position of the device 33 is aligned with the center position of the bearing 31; the second position corrector 33 is equipped with a second light source 331 at the image-taking end, and the second light source 331 is used for projecting light beams in a second direction, and the second position corrector 33 is directed toward The second-direction imaging operator.

校正裝置30更包含第一調整器341及第二調整器342,第一調整器341及第二調整器342裝配於承具31,並各別承裝第一位置校正器32及第二位置校正器33,第一調整器341及第二調整器342依作業需求而分別調整第一位置校正器32及第二位置校正器33之裝配位置(如裝配高度位置),以提高校正作業準確性。於本實施例,第一調整器341裝配於承具31之第一側,以供架置及調整第一位置校正器32之裝配位置及高度;第二調整器342裝配於承具31之第二側,以供架置及調整第二位置校正器33之裝配位置及高度。 The correction device 30 further includes a first adjuster 341 and a second adjuster 342, the first adjuster 341 and the second adjuster 342 are assembled on the support 31, and respectively hold the first position corrector 32 and the second position corrector The device 33, the first adjuster 341 and the second adjuster 342 respectively adjust the assembly position (such as the assembly height position) of the first position corrector 32 and the second position corrector 33 according to the operation requirements, so as to improve the accuracy of the calibration operation. In this embodiment, the first adjuster 341 is assembled on the first side of the support 31 for mounting and adjusting the assembly position and height of the first position corrector 32; the second adjuster 342 is assembled on the second side of the support 31. The two sides are used for mounting and adjusting the assembly position and height of the second position corrector 33 .

校正裝置30更包含至少一高度校正器35,高度校正器35檢知位於承具31之檢知區域的作業器於第三方向上的位置;高度校正器35可作接觸式或非接觸式檢知作業器於第三方向上的位置,舉例高度校正器35為反射型感測器,並裝配於承具31之通孔311下方,而作非接觸式檢知作業器於第三方向上的位置;舉例高度校正器35為導電型感測器,並裝配於承具31之頂面,而作接觸式檢知作業器於第三方向上的位置;於本實施例,高度校正器35為反射型感測器,並配置承具31之通孔311下方,高度校正器35可經通孔311由下向上朝檢知區域投射光束,並接收反射之光束。 The calibration device 30 further includes at least one height corrector 35, the height corrector 35 detects the position of the operator located in the detection area of the support 31 in the third direction; the height corrector 35 can be used for contact or non-contact detection The position of the operating device in the third direction, for example, the height corrector 35 is a reflective sensor, and it is installed under the through hole 311 of the support 31, so as to detect the position of the operating device in the third direction in a non-contact manner; for example The height corrector 35 is a conductive sensor, and is assembled on the top surface of the support 31, and is used as a contact type to detect the position of the operator in the third direction; in this embodiment, the height corrector 35 is a reflective sensor The device is arranged under the through hole 311 of the support 31. The height corrector 35 can project a light beam from bottom to top toward the detection area through the through hole 311 and receive the reflected light beam.

校正裝置30更包含至少一第三調整器36,以供架置及調整高度校正器35之裝配位置及高度。 The calibration device 30 further includes at least one third adjuster 36 for mounting and adjusting the assembly position and height of the height corrector 35 .

承上述,承具31可於頂面設有凹槽,並於凹槽之第一側面及第二側面分別裝配第一位置校正器32及第二位置校正器33,亦無不可;更進一步,於凹槽之底面開設通孔311,以供高度校正器35檢知作業器於第三方向上之位置(作業高度位置)。 In view of the above, the support 31 can be provided with a groove on the top surface, and the first position corrector 32 and the second position corrector 33 are respectively installed on the first side and the second side of the groove, and it is not impossible; further, A through hole 311 is provided on the bottom surface of the groove for the height corrector 35 to detect the position of the operating tool in the third direction (working height position).

請參閱圖2、5~9,本發明之校正方法包含第一移載作業器程序、第一檢知程序、第二檢知程序及比對程序。第一移載作業器程序以移載複數個作業器於承具31上方之檢知區域沿第一方向位移預設間距值;第一檢知程序以第一位置校正器32於承具31之第一檢知位置朝第一方向作側向取像式檢知作業器於第二方向上之位置;第二檢知程序以第二位置校正器33於承具31之第二檢知位置朝第二方向作側向取像式檢知作業器於第一方向上之位置;比對程序以處理器接收第一檢知程序及第二檢知程序傳輸之複數個作業器位置資料,以分析複數個作業器於第一方向及第二方向上之位置,而取得複數個作業器之位置偏差值,並補償校正複數個作業器之實際作業位置。 Please refer to Figures 2, 5-9, the calibration method of the present invention includes a first transfer operator program, a first detection program, a second detection program and a comparison program. The first transfer operation program is to transfer a plurality of operation devices to the detection area above the carrier 31 and move the preset distance value along the first direction; the first detection program is to use the first position corrector 32 on the carrier 31 The first detection position faces the first direction to perform side-viewing detection of the position of the operator in the second direction; the second detection procedure uses the second position corrector 33 at the second detection position of the support 31 toward the The second direction is used to detect the position of the operator in the first direction by sideways imaging; the comparison program uses the processor to receive a plurality of operator position data transmitted by the first detection program and the second detection program to analyze The positions of the plurality of operating devices in the first direction and the second direction are obtained to obtain the position deviation values of the plurality of operating devices, and the actual operating positions of the plurality of operating devices are compensated.

本發明校正方法更包含第二移載作業器程序及第三檢知程序,第二移載作業器程序位於比對程序之前,並以移載複數個作業器於承具31上方之檢知區域沿第三方向位移預設高度值;接續第三檢知程序以高度校正器35檢知作業器於第三方向上之位置,比對程序以處理器接收第三檢知程序傳輸之複數個作業器位置資料,以取得複數個作業器之高度位置偏差值,並補償校正作業器之實際高度作業位置。然依作業需求及位置校正器之型式,第一移載作業器程序更包含第一微動手段,第一微動手段以作業器再沿第一方向作微動位移,以供第二檢知程序檢知作業器微動後之位置,以及供比對程序分析微動後之位置資料,亦可取得作業器於第一方向上之位置偏差值;第二移載作業器程序更包含第二微動手段,第二微動手段以作業器再沿第三方向作微動位移,以供第三檢知程序檢知作業器微動後之位置,以及供比對程序分析微動後之位置資料,亦可取得作業器於第三方向上之高度位置偏差值。 The calibration method of the present invention further includes a second transfer operator program and a third detection program, the second transfer operator program is located before the comparison program, and transfers a plurality of operators to the detection area above the carrier 31 Displace the preset height value along the third direction; continue with the third detection program and use the height corrector 35 to detect the position of the operator in the third direction, and compare the process with the processor receiving the multiple operators transmitted by the third detection program Position data to obtain the height position deviation value of a plurality of operators, and compensate and correct the actual height and working position of the operators. However, according to the operation requirements and the type of the position corrector, the first transfer operator program further includes the first micro-movement means, and the first micro-motion means uses the operator to make a micro-motion displacement along the first direction for detection by the second detection program The position of the operator after inching and the position data after the inching are analyzed by the comparison program, and the position deviation value of the operator in the first direction can also be obtained; the second transfer operator program also includes the second inching means, the second The micro-movement method uses the operator to make a micro-displacement along the third direction for the third detection program to detect the position of the operator after the micro-motion, and for the comparison program to analyze the position data after the micro-motion, and can also obtain the operator in the third party. Upward height position deviation value.

校正方法更包含前置程序,前置程序位於第一移載作業器程序之前,並預設一位於檢知區域之作業器的中心位置作為校正初始位置,以供其他作業器以校正初始位置為基準而位移預設間距值;例如以固定式作業器或第一支作業器作為預設之一作業器,校正初始位置可相同或相異承具31之中心位置;舉例預設之一作業器為固定式作業器,由於原點至承具31中心的距離為已知,並已知作業器之直徑,可將預設之固定式作業器由原點移動至承具31之中心,令固定式作業器之中心位置對位承具31之中心位置,即可以固定式作業器之中心位置(即承具31之中心)作為校正初始位置,以供其他作業器以固定式作業器之中心位置(即承具31之中心)為基準而位移預設間距值。 The calibration method further includes a pre-program. The pre-program is located before the first transfer operator program, and the center position of an operator located in the detection area is preset as the calibration initial position for other operators to calibrate the initial position as The reference is displaced by the preset spacing value; for example, the fixed operator or the first operator is used as a preset operator, and the initial position of the correction can be the same as or different from the center position of the bearing 31; for example, a preset operator It is a fixed operating device, since the distance from the origin to the center of the support 31 is known, and the diameter of the operating device is known, the preset fixed operating device can be moved from the origin to the center of the support 31, so that the fixed The center position of the alignment support 31 of the center position of the type operation tool can be used as the initial position of the calibration for the center position of the fixed type operation tool (that is, the center of the support tool 31), so that other operators can use the center position of the fixed type operation tool (that is, the center of the bearing 31) is used as a reference to displace the preset distance value.

請參閱圖2、6,於本實施例,檢知第一移料器2331、第二移料器2332、第三移料器2333及第四移料器2334之實際作業位置;由於原點至承具31中心的距離為已知,並已知各移料器之直徑,前置程序以固定式之第二移料器2332作為預設基準之移料器,將第二移料器2332由原點移動至承具31之中心位置,且位於檢知區域,令第二移料器2332之中心對位承具31之中心位置,處理器分析判斷以第二移料器2332之中心位置(即承具31之中心位置)作為校正初始位置,而供第一移料器2331、第三移料器2333及第四移料器2334以校正初始位置為基準而位移預設間距值。 Please refer to Fig. 2, 6, in this embodiment, detect the actual operation position of the first material shifter 2331, the second material shifter 2332, the third material shifter 2333 and the fourth material shifter 2334; The distance between the center of the support 31 is known, and the diameter of each material shifter is known. The pre-program uses the fixed second material shifter 2332 as the default standard material shifter, and the second material shifter 2332 is moved by The origin moves to the center position of the support 31 and is located in the detection area, so that the center of the second material shifter 2332 is aligned with the center position of the support 31, and the processor analyzes and judges the center position of the second material shifter 2332 ( That is, the center position of the support 31) is used as the calibration initial position, and the first material shifter 2331, the third material shifter 2333 and the fourth material shifter 2334 are displaced by a preset distance based on the calibration initial position.

請參閱圖2、7,以檢知第一移料器2331於第二方向(Y方向)上之位置為例,第一移載作業器程序以移動臂231帶動第一移料器2331於承具31上方之檢知區域沿第一方向(X方向)位移一預設間距值,由於第一移料器2331已作Z方向向下位移,使得第一移料器2331位於第一位置校正器32及第二位置校正器33的取像範圍,第一檢知程序以第一位置校正器32於承具31之第一檢知位置朝 第一方向取像第一移料器2331,亦即第一位置校正器32可由第一移料器2331之側方作取像,而取得具有第一移料器2331二邊緣距離之第一移料器Y方向取像資料,並將第一移料器Y方向取像資料傳輸至處理器(圖未示出),由於第一位置校正器32之中心位置對位於承具31之中心位置,比對程序之處理器接收第一檢知程序傳輸之第一移料器Y方向取像資料,可將第一位置校正器32之中心位置與第一移料器Y方向取像資料之中心位置作比對分析,以判別第一移料器2331於第二方向(Y方向)上之Y座標位置是否正確,若處理器分析第一移料器2331之Y座標位置異常,且為傾斜配置,處理器可經由運算取得第一移料器2331之Y方向偏差值,以利補償校正第一移料器2331之實際作業位置;因此,以上述方法,可依序取得第三移料器2333及第四移料器2334於第二方向(Y方向)上之位置(Y座標值)。 Please refer to Figures 2 and 7, taking the detection of the position of the first material shifter 2331 in the second direction (Y direction) as an example, the first transfer operator program uses the moving arm 231 to drive the first material shifter 2331 on the carrier The detection area above the tool 31 is displaced along the first direction (X direction) by a preset distance value. Since the first material shifter 2331 has been displaced downward in the Z direction, the first material shifter 2331 is located at the first position corrector 32 and the imaging range of the second position corrector 33, the first detection program uses the first position corrector 32 at the first detection position of the support 31 to The first direction to take the image of the first material shifter 2331, that is, the first position corrector 32 can take an image from the side of the first material shifter 2331, and obtain the first displacement with the distance between the two edges of the first material shifter 2331. Take the image data in the Y direction of the feeder, and transmit the image data in the Y direction of the first material shifter to the processor (not shown in the figure). Since the center position of the first position corrector 32 is located at the center position of the support 31, The processor of the comparison program receives the Y-direction imaging data of the first material shifter transmitted by the first detection program, and can compare the center position of the first position corrector 32 with the center position of the Y-direction imaging data of the first material shifter Perform comparative analysis to determine whether the Y-coordinate position of the first material shifter 2331 in the second direction (Y direction) is correct. If the processor analyzes that the Y-coordinate position of the first material shifter 2331 is abnormal, and it is an inclined configuration, The processor can obtain the Y-direction deviation value of the first material shifter 2331 through calculation, so as to compensate and correct the actual working position of the first material shifter 2331; therefore, the third material shifter 2333 and The position (Y coordinate value) of the fourth material shifter 2334 in the second direction (Y direction).

請參閱圖2、8,檢知第一移料器2331於第一方向(X方向)上的位置為例,由於第一移料器2331位於第一位置校正器32及第二位置校正器33的取像範圍,第二檢知程序以第二位置校正器33於承具31之第二檢知位置朝第二方向取像第一移料器2331,亦即第二位置校正器33可由第一移料器2331之另一側方作取像,而取得具有第一移料器2331另二邊緣距離之第一移料器X方向取像資料,並將第一移料器X方向取像資料傳輸至處理器(圖未示出),由於第二位置校正器33之中心位置對位於承具31之中心位置,比對程序之處理器接收第二檢知程序傳輸之第一移料器X方向取像資料,可將第二位置校正器33之中心位置與第一移料器X方向取像資料之中心位置作比對分析,以判別第一移料器2331於第一方向(X方向)上之X座標位置是否正確,若處理器分析第一移料器2331之X座標位置異常,且為傾斜配置,處理器可經由運算取得第一移料器2331之X方 向偏差值,以利補償校正第一移料器2331之實際作業位置;因此,以上述方法,可依序取得第三移料器2333及第四移料器2334於第一方向(X方向)上之位置(X座標值)。 Please refer to FIGS. 2 and 8 , the detection of the position of the first material shifter 2331 in the first direction (X direction) is taken as an example, since the first material shifter 2331 is located at the first position corrector 32 and the second position corrector 33 In the second detection program, the second position corrector 33 is used to capture the image of the first material shifter 2331 at the second detection position of the carrier 31 in the second direction, that is, the second position corrector 33 can be controlled by the second position corrector 33 Take an image from the other side of a material shifter 2331, and obtain the X-direction imaging data of the first material shifter 2331 with the distance from the other two edges of the first material shifter 2331, and take the X-direction image of the first material shifter The data is transmitted to the processor (not shown in the figure). Since the center position of the second position corrector 33 is aligned with the center position of the holder 31, the processor of the comparison program receives the first material shifter transmitted by the second detection program. The X-direction imaging data can compare and analyze the center position of the second position corrector 33 and the center position of the X-direction imaging data of the first material shifter to determine whether the first material shifter 2331 is in the first direction (X Whether the X coordinate position on the direction) is correct, if the processor analyzes that the X coordinate position of the first material shifter 2331 is abnormal, and it is an inclined configuration, the processor can obtain the X direction of the first material shifter 2331 through calculation In order to compensate and correct the actual working position of the first material shifter 2331; therefore, with the above method, the third material shifter 2333 and the fourth material shifter 2334 can be sequentially obtained in the first direction (X direction) The upper position (X coordinate value).

因此,於取得第一移料器2331、第三移料器2333及第四移料器2334之X-Y方向位置偏差值,並以第二移料器2332為基準,而分別調整補償第一移料器2331、第三移料器2333及第四移料器2334之實際作業位置。 Therefore, after obtaining the X-Y position deviation values of the first material shifter 2331, the third material shifter 2333, and the fourth material shifter 2334, and using the second material shifter 2332 as a benchmark, respectively adjust and compensate the first material shifter The actual working positions of the device 2331, the third material transfer device 2333 and the fourth material transfer device 2334.

請參閱圖9,校正移料器於第三方向(Z方向)上的位置,以校正第一移料器2331之實際高度作業位置為例,第二移載作業器程序以移動臂231帶動第一移料器2331位移至承具31之檢知區域且位於通孔311之上方,並以第一升降器2341帶動第一移料器2331沿第三方向(Z方向)向下位移一預設高度值;由於高度校正器35為反射型感測器,並位於承具31之通孔311下方,且朝通孔311投射光束;第三檢知程序之高度校正器35對第一移料器2331作非接觸式投射光束,並接收第一移料器2331所反射之光束,且傳輸一訊號至處理器;比對程序以處理器分析高度校正器35所接收光束之反射距離值,加以判斷第一移料器2331於第三方向(Z方向)上之高度位置是否正確,並取得第一移料器2331於第三方向上之高度位置偏差值,以補償校正第一移料器2331之實際高度作業位置;因此,以上述方法,可依序取得第二移料器2332、第三移料器2333及第四移料器2334於第三方向(Z方向)上之高度位置偏差值,並補償校正實際高度作業位置,進而提高作業精準性。 Please refer to Fig. 9, to correct the position of the material shifter in the third direction (Z direction), take the actual height operation position of the first material shifter 2331 as an example, the second transfer operator program uses the moving arm 231 to drive the first A material shifter 2331 is displaced to the detection area of the support 31 and is located above the through hole 311, and the first lifter 2341 drives the first material shifter 2331 to move downwards along the third direction (Z direction) by a preset value. Height value; because the height corrector 35 is a reflective sensor, and is located below the through hole 311 of the bearing 31, and projects a light beam toward the through hole 311; 2331 is used as a non-contact projection beam, and receives the beam reflected by the first material shifter 2331, and transmits a signal to the processor; the comparison program uses the processor to analyze the reflection distance value of the beam received by the height corrector 35, and judge Whether the height position of the first material shifter 2331 in the third direction (Z direction) is correct, and obtain the height position deviation value of the first material shifter 2331 in the third direction to compensate and correct the actual situation of the first material shifter 2331 Height operation position; therefore, with the above method, the height position deviation value of the second material shifter 2332, the third material shifter 2333 and the fourth material shifter 2334 in the third direction (Z direction) can be obtained in sequence, and Compensation corrects the actual height of the operating position, thereby improving the accuracy of the operation.

231:移動臂 231: mobile arm

2331:第一移料器 2331: The first shifter

2332:第二移料器 2332: Second shifter

31:承具 31: bearing

32:第一位置校正器 32: First position corrector

33:第二位置校正器 33: Second position corrector

Claims (14)

一種校正裝置,以供校正複數個作業器之位置,該校正裝置包含:承具:為固定式配置,並於上方構成檢知區域;第一位置校正器:沿第一檢知軸線裝配於該承具之第一檢知位置,該第一位置校正器於該第一檢知位置以供朝第一方向作側向取像檢知位於該檢知區域之該作業器於第二方向的位置;第二位置校正器:沿第二檢知軸線裝配於該承具之第二檢知位置,該第二位置校正器於該第二檢知位置以供朝該第二方向作側向取像檢知位於該檢知區域之該作業器於該第一方向的位置。 A calibration device for calibrating the positions of a plurality of operating devices, the calibration device includes: a bearing: a fixed configuration, and forms a detection area on the top; a first position corrector: assembled on the first detection axis The first detection position of the support, the first position corrector is at the first detection position for lateral imaging in the first direction to detect the position of the operating tool in the detection area in the second direction ; Second position corrector: assembled at the second detection position of the bearing along the second detection axis, the second position corrector is at the second detection position for lateral imaging in the second direction Detecting the position of the operating device located in the detection area in the first direction. 如請求項1所述之校正裝置,更包含至少一高度校正器,該高度校正器以供檢知該作業器於第三方向上的位置。 The calibrating device as described in claim 1 further includes at least one height calibrator for detecting the position of the working tool in the third direction. 如請求項2所述之校正裝置,其該承具設有至少一通孔,該通孔相通至該檢知區域,該高度校正器配置於該通孔之下方。 As the calibration device described in claim 2, the support is provided with at least one through hole, the through hole communicates with the detection area, and the height calibrator is disposed below the through hole. 如請求項2所述之校正裝置,更包含至少一第三調整器,以供調整該高度校正器之裝配高度及位置。 The calibration device as described in Claim 2 further includes at least one third adjuster for adjusting the assembly height and position of the height corrector. 如請求項1所述之校正裝置,其該第一位置校正器為CCD,更包含第一光源,該第一光源朝向該第一方向投射光束,該第二位置校正器為CCD,更包含第二光源,該第二光源朝向該第二方向投射光束。 The correction device as described in Claim 1, wherein the first position corrector is a CCD, further comprising a first light source, the first light source projects a light beam towards the first direction, and the second position corrector is a CCD, further comprising a second position corrector Two light sources, the second light source projects light beams towards the second direction. 如請求項1至5中任一項所述之校正裝置,更包含第一調整器及第二調整器,該第一調整器供架置及調整該第一位置校正器,該第二調整器供架置及調整該第二位置校正器。 The calibration device as described in any one of claims 1 to 5, further comprising a first adjuster and a second adjuster, the first adjuster is used for mounting and adjusting the first position corrector, and the second adjuster For mounting and adjusting the second position corrector. 一種校正方法,以供校正複數個作業器於第一方向上及第二方向上之位置,該校正方法包含:第一移載作業器程序:以移載複數個該作業器於承具上方之檢知區域沿該第一方向位移預設間距值;第一檢知程序:以第一位置校正器於該承具之第一檢知位置朝該第一方向作側向取像位於該檢知區域之該作業器,而檢知該作業器於該第二方向上之位置;第二檢知程序:以第二位置校正器於該承具之第二檢知位置朝該第二方向作側向取像位於該檢知區域之該作業器,而檢知該作業器於該第一方向上之位置;比對程序:以處理器接收該第一檢知程序及該第二檢知程序傳輸之該複數個作業器位置資料,以分析該複數個作業器於該第一方向及該第二方向上之位置,而取得該複數個作業器之位置偏差值,並補償校正該複數個作業器之實際作業位置。 A calibration method for calibrating the positions of a plurality of operating devices in the first direction and the second direction, the calibration method comprising: the first procedure for transferring the operating devices: to transfer the plurality of operating devices above the carrier The detection area is displaced along the first direction by a preset distance value; the first detection procedure: use the first position corrector at the first detection position of the bearing to take a lateral image in the first direction and locate at the detection position The operating device in the area, and detect the position of the operating device in the second direction; the second detection procedure: use the second position corrector to face the second direction at the second detection position of the support Take an image of the operator located in the detection area, and detect the position of the operator in the first direction; comparison program: use the processor to receive the transmission of the first detection program and the second detection program The position data of the plurality of operating devices is used to analyze the positions of the plurality of operating devices in the first direction and the second direction, obtain the position deviation value of the plurality of operating devices, and compensate and correct the plurality of operating devices the actual working position. 如請求項7所述之校正方法,更包含前置程序,該前置程序位於該第一移載作業器程序之前,並預設一位於該檢知區域之該作業器的中心位置作為校正初始位置,以供其他該作業器以該校正初始位置為基準而位移預設間距值。 The correction method as described in claim 7 further includes a pre-program, which is located before the first transfer operator program, and a center position of the operator located in the detection area is preset as the initial calibration The position is used for the other workers to move the preset spacing value based on the corrected initial position. 如請求項8所述之校正方法,該第一移載作業器程序更包含第一微動手段,該第一微動手段以該作業器再沿該第一方向作微動位移,以供該第二檢知程序檢知該作業器微動後之位置及該比對程序分析微動後之位置資料,以取得該作業器於該第一方向上之該位置偏差值。 As in the correction method described in claim 8, the first transfer operator program further includes a first micro-movement means, and the first micro-motion means uses the operator to make a micro-motion displacement along the first direction for the second inspection The knowing program detects the position of the operating device after inching, and the comparison program analyzes the position data after inching to obtain the position deviation value of the operating device in the first direction. 如請求項7至9中任一項所述之校正方法,更包含第二移載作業器程序及第三檢知程序,該第二移載作業器程序位於該比對程序之前,該第二移載作業器程序以移載複數個該作業器於該承具之該檢知區域沿第三方向位移預設高度值,該第三檢知程序以高度校正器檢知該作業器於該第三方向上之位置,該比對程序以該處理器接收該第三檢知程序傳輸之該作業器位置資料,以取得該作業器之高度位置偏差值,並補償校正該作業器之實際作業位置。 The correction method described in any one of claims 7 to 9 further includes a second transfer operator program and a third detection program, the second transfer operator program is located before the comparison program, the second The program of moving the operating device is used to transfer a plurality of the operating devices in the detection area of the carrier to the preset height value along the third direction, and the third detection program detects the position of the operating device in the first For the position in three directions, the comparison program uses the processor to receive the position data of the working device transmitted by the third detection program, so as to obtain the height position deviation value of the working device, and compensate and correct the actual working position of the working device. 如請求項10所述之校正方法,其該第二移載作業器程序更包含第二微動手段,該第二微動手段以該作業器再沿該第三方向作微動位移,以供該第三檢知程序檢知該作業器微動後之位置,並供該比對程序分析微動後之位置資料,以取得該作業器於該第三方向上之該高度位置偏差值。 In the correction method described in claim 10, the second transfer operator program further includes a second micro-movement means, and the second micro-motion means uses the operator to make a micro-motion displacement along the third direction for the third The detection program detects the position of the operating device after inching, and provides the comparison program to analyze the position data after inching, so as to obtain the height position deviation value of the operating device in the third direction. 一種作業機,包含:機台;至少一作業裝置:配置於該機台,並設有至少一承置器及至少一作業機構,該至少一承置器以供承置複數個電子元件,該至少一作業機構設有複數個作業器,以供對該複數個電子元件執行預設作業;至少一如請求項1所述之校正裝置:裝配於該機台,以供校正該複數個作業器於該第一方向上及該第二方向上之位置;中央控制裝置:以控制及整合各裝置作動,以執行自動化作業。 An operating machine, comprising: a machine platform; at least one operating device: configured on the machine platform, and provided with at least one holder and at least one operating mechanism, the at least one holder is used to hold a plurality of electronic components, the At least one operating mechanism is provided with a plurality of operating devices for performing preset operations on the plurality of electronic components; at least one calibration device as described in claim 1: installed on the machine table for calibrating the plurality of operating devices Positions in the first direction and the second direction; central control device: to control and integrate the actions of various devices to perform automated operations. 如請求項12所述之作業機,其該作業裝置更包含溫控機構,該溫控機構於該作業器設置至少一溫控件。 In the working machine as described in claim 12, the working device further includes a temperature control mechanism, and the temperature control mechanism is provided with at least one temperature control on the working machine. 如請求項12所述之作業機,其該作業裝置更包含測試室,該測試室罩置於測試器之外部。 In the operating machine as described in claim 12, the operating device further includes a test chamber, and the test chamber cover is placed outside the tester.
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