TWI363734B - An apparatus for correcting position of a user tray and a test handler - Google Patents

An apparatus for correcting position of a user tray and a test handler Download PDF

Info

Publication number
TWI363734B
TWI363734B TW97143220A TW97143220A TWI363734B TW I363734 B TWI363734 B TW I363734B TW 97143220 A TW97143220 A TW 97143220A TW 97143220 A TW97143220 A TW 97143220A TW I363734 B TWI363734 B TW I363734B
Authority
TW
Taiwan
Prior art keywords
unit
tray
user
bottom plate
test
Prior art date
Application number
TW97143220A
Other languages
Chinese (zh)
Other versions
TW201018636A (en
Inventor
Hee Rak Beom
Kyeong Tae Kim
Original Assignee
Mirae Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mirae Corp filed Critical Mirae Corp
Priority to TW97143220A priority Critical patent/TWI363734B/en
Publication of TW201018636A publication Critical patent/TW201018636A/en
Application granted granted Critical
Publication of TWI363734B publication Critical patent/TWI363734B/en

Links

Description

1363734 九、發明說明: 【發明所屬之技術領域】 本發明係關於一種測試搬運機 該蜊成搬遷機用 片供應至測試機並透過分級將測試後的封襞晶片 、村可攻 【先前技術】 曰曰 進行分類 測試搬運機可用於在封裝製程結束時對 試 封裝晶片進行電測 、測試製程及卸載 晶片。 封裝搬運機係使用測試托盤執行裝载製程 製程’測試滅包含複數魏容單元Μ容納封裝 測試賴姆峨明爾㈣軸藉 =哭rm裝載㈣。戦搬運機透過使用複數個 吸拾封裝^。 取㈣、·純含複數個喷嘴用以 細啦如㈣供應至測試機。這 产試製程、該測試機包含具有複數個插座的高精 ===離射_如卿雜_在封裝 在二::運機還包含複數個氣密腔室,以使得測試機可 在、或低4極端環境謂封裝晶片進行電測試。 測試搬運機將測試後的封裝晶片從測試托盤傳輸至用戶托 6 叫734 盤。這一過程被稱為,,卸載製程"。封裝晶片將依據測試結果被分 級,並且搬運機會基於所分級別將分級後的封裝晶片從測試托盤 傳輪至相應的用戶城。測馳運機透過使用複數個拾取器系統 來執行卸載製程。 … :職搬職觀含魏_存減侧概載製程與卸載製 .- 程中的用戶托盤的堆疊機。 衣 「弟1圖」表示了 一 戶托盤之堆疊機。並且「 正後的狀態。 個位於測试搬運機中的儲存有複數個用 第2圖」表示了用戶托盤之位置經過校 、月々考第1圖」所不’堆疊機1〇〇可儲存複數個用戶托盤 c並且包含裝載堆疊機應、卸載堆疊機1〇2、缓衝堆叠機刚 及傳輸單元104。 鲁 搬職的主框架(财未1出)巾可安裝有複數個裝載 1機101 ’並且裝載堆疊機1〇1 &含复載堆疊元件1⑽ -板 1012。 - 1 讀堆$7°件1011巾可齡有概細戶減C,該用戶托 盤C中容納有待測試的封裝晶片。 、载板1G12在$載製程被執行處支撐戶托盤,並且裝載 12細㈣上升和下降的方式絲㈣馳運機的主框架 1363734 、測識運機的主框架中還可安裳有複數個卸載堆疊機⑴2, 乂使^谷、,歧K後的封裝晶片之複數個用戶托盤可以依據測試 結果藉由分級被儲存於不同的位置。 裝卸載堆機ι〇2包含喊堆4元件咖及卸載板觀。 卸載堆宜讀1G21巾可儲財複數铜彳托盤C,該用戶托 .- 盤c中容納有測試後的封農晶片。 • ㈣板1G22在卸賴程被執行處支撐起肝托盤C,並且卸 載板K)22細㈣上朴下_枝絲於職搬運機的主框 架中。 於緩衝堆疊機103中可儲存有複數個空的用戶托盤C。 傳輸單元104能夠持有用戶托盤C,並且傳輸單元则以 能夠移動的方式安裝於測試搬運機的主框架中。該傳輸里元辦 - 框架中。並且該傳輸單元104還能夠上升和下降。 : 在堆疊機⑽中,用戶域C係按如下方式傳輸。 .=’傳輸單元則容纟啦測試的_片之用戶托盤 c攸裝载堆疊元件1011傳輸至裝载板1〇12。 接著,裝驗10__轉元件咖傳輪過來的用戶 托盤C提升至位置谢a ’在此位置拾取器系統(圖中未示出)能 8 1363734 夠拾取起用戶托盤c中的待測試之封裝晶片。 -接著,當用戶托盤C由於裝載製程的完成而變空時,傳輪單 满將用戶托盤C從裝載板1G12傳輸至緩衝堆疊機期 板1022 。 -】戰· 接著,傳輸單元104將空的用戶托盤C從緩衝堆疊機103或 裝載板1012傳輸至卸載板1022。 接著,卸載板贈將從緩衝轉機ιω或裝載板順傳輪 過來的肝滅C提升錄請a,在此位置拾取料統(圖中 未示出)能夠將測試後的封裳晶片放置到用戶托盤c中。 接下來,當用戶托盤C由於卸健程的完成而容納有測試後 的封裝晶片時,傳輸單元顺將容納有測試後的封裝晶片之用户 托盤C從卸載板1022傳輸至卸載堆疊元件1〇21。 測試搬運機可透過快速執行上述步驟並透過分級對封裝晶片 進行分類。 Βθ 請參考「第i圖」及「第2圖」所示,堆倾⑽將始終對 裝載板1G12及卸他腿中_戶托盤c進行定位,以使得於 取器系統(射未利)能夠穩定地執行裝载製程與卸载製= 因此,堆4機100需包含-侧於校正用戶托盤位置的設備 (圖中未示出),此校正設備能夠將用戶托盤C移動至裴载板 及卸載板1022十的準確位置。 9 工363734 此用戶托細位置校正設備能夠令用戶托紅^轴方向及 y轴方向移動,藉以透·戶托盤c與第—定位元彳“及第二定 位兀件B相接觸,而將用戶托盤c定位到準確的位置。 然而’習知_戶減位置校正設備齡別包含用於沿錄 ·.方向移_戶缝C的第-作鮮元_於沿丫軸方向移動用戶 • _托盤c的第-作業單S,由此’使其結構複雜並且增加了製造成 本0 ·' 並且上述問題會由於安裝複數個用戶托盤位置校正設備而變 得更加明顯。 【發明内容】 鑑於以上問題,本發明之目的在於提供一種用戶紐位置校 正設備以及-種結構簡單並且能夠將用戶托盤移動至準確位置的 測試搬運機。 > 本發明並不健於具社㈣技術目的。本賴之技術人員 •可以透過如下的詳細說明清楚地理解此處未經描述的本發明之其 • 它目的。 本發明之-貫施例係提供了一種用戶托盤位置校正設備,此 用戶托盤位置校正設備包含:至少一個第一定位元件及至少一個 第二定位it件’制以確定用戶托盤之位置;驗接收用戶托盤 的底板·’第-校正單元’係用以將用戶托盤沿著第一定位元件被 1 女衣的方向移動;第二校正單元,_簡用戶托盤沿著第二定 ^兀件破安裝財向移動;以及作鮮元,操作第-校正 早兀與第二校正單元。 本發狄-實施例顧供卜_馳賴,此測試搬運機 裝载堆4機’係具麵數烟戶托盤,用戶托盤t容納有 m Γ封裝4,裝解元,侧以將制試的雜晶片放入 :=腔室系統,在腔室系統中封裝晶片與高精度定位板 六載H ’係用以依照測試結果透過分級將測試托盤中 I卩载權,顧存有複數 =盤’用戶托盤中容納有測試後的_片;以及用戶托 崎彻權與繼疊機之中。 較::r分一戶一糊 透視圖第「3==Γ:㈣侧戶托盤之 弟3圖」之下側面的透視圖。 請參考「第3圖」及「第 備1包含差二定位元件2、第二定位」丁 ,托盤㈣权正設 元5、第二校正單元6物單元7 Γ、絲4、第一校正單 第疋位讀2用以確定用戶托盤c之位置,並能夠安震於 ^〇J734 上 底板4或測試搬運機之主框架(圖中未示出) 第-义位7〇件2以—定長度突出於底板4之上側面以使 -定位7L件2能夠支撐用戶托盤c之第—側面C1。 當用戶托盤C之第一側面C1藉由第一定位元件2被支撐時, 用戶托盤C钱置將m粒树2被钱的 向)得以校正。 胃 第二定位元件3心確定用戶域c之位置,魏夠安裝於 底板4或測試搬運機之主框架上。 、 弟一疋位兀件3以一定長度突出於底板4之上側面以使得第 疋位几件3成夠支標用戶把盤C之第二側面C2。 當用戶托盤c之第二側面C2藉由第二定位元们被支撐時, 用戶托盤C之位置將沿著第二定位元件3被安裝 方 向)得峨正。 崎 _弟一德轉3與第—^位元件2可被安裝成使得第二定位 凡件3與第—粒元件2能夠支撐相互垂直的第-側面α盘笫_ 侧面C2。 示一 一 匕用戶托盤位置校正設備1能夠透過以用戶牦盤C被第 二定位播3與第1位元件2支撐的方式顧戶托盤C移動至 個準確的位1。移_戶托盤C鲜確位置是指將肝托盤c 七取益系統(圖中未示出)能夠穩定地執行裝載製裎與卸 12 ^63734 載製程的位置。 用戶托盤位置校正設備1可包含複數個第二定位元件3及複 數個第一定位元件2。因而,用戶托盤c可被移動至更加準確的 位置。 用戶托盤C可被接收於底板4之中,且第一定位元件2與第 —定位元件3也可安裴於底板4之中。底板4可被成形為四方板 形狀。 第一校正單元5係以沿著第一定位元件2被安裝的方向(Χ 轴方向)移動用戶托盤C之方式進行作業。第一校正單元5包含 第一移動元件51與第一彈性元件52。 第一移動元件51係連接於底板4,並可在底板4上轉動。第 才父正單元5至少包含一個第一移動元件51。 第—移動元件51可連接於底板4中收容有用戶托盤c的底板 上側面之相反—側,即,底板4的下側面之中。 -口此拾取杰系統(圖中未示出)之工作區域不會與第一移 動疋件51相重疊,由此拾取器系統(圖中未示出)能夠穩定地執 行裝裁製裎與卸裁製程。 第移動元件51包含第一移動框架511、第一接觸元件512 及轉動元件513。 13 1363734 第一移動框架511係連接於庙始4 n结 ,一 ± ^ 餅底板4。且弟-移動框架511可環 、-見弟一軸511a轉動。此第一移動框牟 ㈣框架511可整體上成形為9 形狀,並且可與底板4之下側面相連接。1363734 IX. Description of the Invention: [Technical Field] The present invention relates to a test handler for supplying a sheet for a relocation machine to a test machine and for testing the sealed wafer by grading, and the village can attack [previous technique]分类Classification test The carrier can be used to electrically test, test, and unload the test package wafer at the end of the packaging process. The package handler uses the test tray to perform the loading process. The test destroys the complex Weirong unit Μ accommodating the package. The test Rim 峨 尔 ( 四 (4) axis borrowing = cry rm loading (four). The pick-up machine uses a plurality of pick-up packages ^. Take (four), · purely contains a plurality of nozzles for thinning as (4) to the test machine. The test process, the test machine comprises a high-precision with a plurality of sockets ===off-range _ _ _ _ _ in the package two:: the aircraft also contains a plurality of airtight chambers, so that the test machine can be, Or a low 4 extreme environment is a packaged wafer for electrical testing. The test handler transfers the tested package wafer from the test tray to the user tray 6 called 734. This process is called, unloading process ". The packaged wafers will be graded according to the test results, and the handling opportunity will route the graded packaged wafers from the test tray to the corresponding customer city based on the graded level. The measuring machine performs the unloading process by using a plurality of picker systems. ... : The position of the job transfer contains the Wei _ deposit and subtraction side of the general load process and the unloading system. - The stacking machine of the user tray in the process. Clothing "Different 1" shows a stacking machine for one tray. And "the state of the back. The number of stored in the test handler is stored in the second figure". The position of the user tray is indicated by the school and the monthly reference. Figure 1 "Do not stacker 1" can store the plural The user trays c include the load stacker, the unload stacker 1, the buffer stacker, and the transfer unit 104. The main frame of the relocation of the company can be installed with a plurality of loading machines 101' and loading the stacking machine 1〇1 & including the floating stacking component 1(10)-plate 1012. - 1 Read stack $7° piece 1011 towel ageable household size minus C, the user tray C contains the packaged wafer to be tested. The carrier board 1G12 supports the household tray at the execution of the loading process, and loads 12 fine (four) ascending and descending methods. The main frame 1363734 of the four-dimensional speeding machine and the main frame of the measuring and transporting machine can also be loaded with a plurality of The stacker (1) 2 is unloaded, and a plurality of user trays of the packaged wafers after the 谷K, 歧K can be stored in different locations according to the test results. Loading and unloading stacker ι〇2 contains shouting 4 component coffee and unloading board view. The unloading stack should read 1G21 towel to store a plurality of copper enamel trays C, and the user tray _. • (4) The plate 1G22 supports the liver tray C at the place where the unloading process is performed, and the unloading plate K) 22 is fine (4) in the main frame of the shovel. A plurality of empty user trays C can be stored in the buffer stacker 103. The transport unit 104 is capable of holding the user tray C, and the transport unit is movably mounted in the main frame of the test handler. The transfer is done in the meta-frame. And the transmission unit 104 can also rise and fall. : In the stacker (10), the user domain C is transmitted as follows. .='Transmission unit is the user tray of the _ piece tested. The load stacking component 1011 is transferred to the loading plate 1〇12. Then, the user tray C from the 10__revolutionary component is lifted to the position thank a 'in this position the picker system (not shown) can pick up the package to be tested in the user tray c 8 1363734 Wafer. - Next, when the user tray C becomes empty due to the completion of the loading process, the transfer wheel is full to transfer the user tray C from the loading plate 1G12 to the buffer stacker plate 1022. -] Next, the transport unit 104 transfers the empty user tray C from the buffer stacker 103 or the loading board 1012 to the unloading board 1022. Next, the unloading board will send the liver extinguishing C from the buffer transfer ιω or the loading plate to the recruitment record a. At this position, the picking system (not shown) can place the tested wafers on the user to the user. In the tray c. Next, when the user tray C accommodates the tested package wafer due to the completion of the unloading process, the transfer unit transfers the user tray C containing the tested package wafer from the unloading plate 1022 to the unloading stacking member 1〇21 . The test handler can quickly sort the packaged wafers by grading by performing the above steps quickly. Βθ Please refer to “i-figure” and “figure 2”. The stacking tilt (10) will always position the loading plate 1G12 and the unloading leg _ household tray c so that the pick-up system (shooting unprofitable) can The loading process and the unloading system are stably performed. Therefore, the stacking machine 100 needs to include a device (not shown) that corrects the position of the user tray, which is capable of moving the user tray C to the carrier board and unloading The exact position of the board 1022. 9 363734 This user's towed position correction device can move the user in the red axis direction and the y-axis direction, so that the user tray c and the first positioning element "and the second positioning element B are in contact with each other, and the user is The tray c is positioned to the exact position. However, the 'study_house reduction position correction device age includes the first-for-six element for moving along the direction of the direction_user C to move the user along the x-axis direction. The first-job sheet S of c, thereby 'making its structure complicated and increasing the manufacturing cost 0 ·' and the above problem becomes more apparent due to the installation of a plurality of user tray position correcting devices. [Invention] In view of the above problems, SUMMARY OF THE INVENTION It is an object of the present invention to provide a user position correction device and a test handler which is simple in structure and capable of moving a user tray to an accurate position. The present invention is not robust to the technical purpose of the company (4). The present invention, which is not described herein, can be clearly understood from the following detailed description. The present invention provides a user tray position correcting device. The user tray position correcting device comprises: at least one first positioning component and at least one second positioning component 'determined to determine the position of the user tray; the bottom plate of the receiving user tray · 'the first correction unit' is used to carry the user tray along The first positioning component is moved by the direction of the female garment; the second correcting unit, the simple user tray is moved along the second fixing member; and the fresh-keeping, operating the first-correction early and second Correction unit. The hair of the hairpin-example is for the _ _ _, this test handler loading stack 4 machine 'system with a number of smokers tray, the user tray t contains m Γ package 4, the assembly element, side to Put the test wafer into: = chamber system, package the wafer in the chamber system and high-precision positioning board. The six-load H' system is used to test the load in the test tray according to the test result. The plural = disk 'user tray contains the tested _ film; and the user Tosaki and the relay machine. Comparison:: r points one household and a paste perspective "3 == Γ: (four) side tray A perspective view of the lower side of the 3D. Please refer to "3rd picture" and "1st part contains the difference positioning element 2, the second positioning" D, the tray (4) right positive element 5, the second correction unit 6 object unit 7 Γ, the wire 4, the first calibration list The third reading is used to determine the position of the user tray c, and can be shocked on the bottom plate 4 of the J734 or the main frame of the test handler (not shown). The length protrudes from the upper side of the bottom plate 4 so that the - positioning 7L member 2 can support the first side C1 of the user tray c. When the first side C1 of the user tray C is supported by the first positioning member 2, the user tray C is set to correct the m-tree 2 by the money. The second positioning element 3 of the stomach determines the position of the user field c, which is mounted on the base frame 4 or the main frame of the test handler. The first member 3 protrudes from the upper side of the bottom plate 4 by a certain length so that the third member of the third position is enough to support the second side C2 of the user C. When the second side C2 of the user tray c is supported by the second positioning member, the position of the user tray C will be aligned along the second positioning member 3 to be mounted. The _ 弟 弟 德 德 3 and the first position element 2 can be mounted such that the second positioning member 3 and the first granule element 2 can support the mutually opposite first side α disk 笫 side C2. The user tray position correcting device 1 can be moved to the accurate bit 1 by the user tray C being supported by the second positioning cassette 3 and the first position element 2. The position of the shifting tray C is a position where the liver tray c-seven benefit system (not shown) can stably perform the loading and unloading process and the unloading process 12^63734. The user tray position correcting device 1 may include a plurality of second positioning members 3 and a plurality of first positioning members 2. Thus, the user tray c can be moved to a more accurate position. The user tray C can be received in the bottom plate 4, and the first positioning member 2 and the first positioning member 3 can also be mounted in the bottom plate 4. The bottom plate 4 can be shaped into a square plate shape. The first correcting unit 5 operates by moving the user tray C in the direction in which the first positioning member 2 is mounted (the axis direction). The first correcting unit 5 includes a first moving member 51 and a first elastic member 52. The first moving member 51 is coupled to the bottom plate 4 and is rotatable on the bottom plate 4. The first parent unit 5 includes at least one first moving element 51. The first moving member 51 is connectable to the opposite side of the upper side of the bottom plate in which the user tray c is housed, i.e., in the lower side of the bottom plate 4. - The work area of the pickup system (not shown) does not overlap with the first movement member 51, whereby the pickup system (not shown) can stably perform the loading and unloading Cutting process. The first moving member 51 includes a first moving frame 511, a first contact member 512, and a rotating member 513. 13 1363734 The first moving frame 511 is connected to the temple 4 n junction, a ± ^ cake bottom plate 4. And the brother-moving frame 511 can be rotated, and the brother 511a rotates. The first moving frame 四 (4) frame 511 may be integrally formed into a 9 shape and may be coupled to the lower side of the bottom plate 4.

第一接觸元件512係連接於第-移動框架5Π之-端部 皿’並且可依據第-移動框架511之轉動來移動用戶托盤c。。 第一接觸元件512可接觸於用戶托盤C之第三側面C3之上, 用戶托虹可__戶域c之第三側面c3向著第一定位 元件2被女裝的方向(X轴方向)移動。 第-接觸元件512可形成為突出於第一移動框架5ιι,以使 得第一接転# 512可無容於雜4之上_上_戶托盤C 之第三側面C3相接觸。 第一接觸元件512係以能夠轉動之方式連接於第-移動框架 511之一端部511b。 因此’當移動用戶托盤c時,第一接觸元件M2可環繞第二 轴512a轉動,進而防止第一接觸元件512與用戶托盤^目互接觸 之部份由於摩擦而發生損壞。 轉動元件513與健單元7接觸,並且能夠接收從作業單元 7傳來的用以轉動第一移動框架511之應力。 另一端部511c。 轉動元件513以能夠轉動之方式連接於第一移動框架如之 14 1363734 -第—移動框架511轉動時,轉動元件513可環繞第 二軸轉動,進而防止轉動元件513與作 部份由於摩擦而發生損壞^ 相互接觸之 第一彈性元件52_於彈性連接第—鶴元件&至底板4。 量相=㈣—雜元件52之_猶,元料之數 相連之—端可與第—移動框架511之一端部⑽ 第—彈性元件52之另-端可與底板4相連接。 第彈性轉52牽引第一移動框架5 至底板切使得第—移動元件5 方戶托盤cw件2被絲的 轴方單元6係以沿著第二定位元件3被絲的方向(γ 二::用戶托盤C之方式進行作業。第二校( 第一私動辑61與第二職树62。 方向====定位元件3被絲的方向(M 向)移動用戶托盤 爾3被細方向⑺由方 果作移動元件61能夠以可移動之方式連接於如^ 業早心X可軸之方式連接於底板4之 件61可以連接至作業單Μ。 知勢凡 15 丄如/34 第二移動元件61包含第二移動框架二接觸元件6】2。 …第二移動框架611可在形成於底板4中的孔触中移動。且 移動框架611可藉由第二彈狀件62被彈性支 動框架611係整體上成形為四方板形狀。 私 第二接觸元件612係形成為突出於第二移動框架611。且第 j觸元輪能夠移_戶托盤c t移航件61可包含至 v個或者多個第二接觸元件612。 =觸元件612可與_盤之第四側面叫 =戶托盤C可透過推動此用戶托盤C之第四側面C4 疋位元件3被钱的方向軸。 卓- 第二_元件612可在形成於额4之上的 :::::;i:rr^iLs42^^4-- 尸代螌c之第四側面€4相接觸。 第彈Γ件62 _以彈性切第二鶴元件61。由此, 弟-彈性轉62可推動第二鑛元件 可沿著第二定位元件3被安裝的:=動元件《 C。 釉方向)移動用户托盤 ’而另—端能夠支 二彈性元件62。 1二彈性元件62之―端係支撐於底板之上 撐第二移動框架611。 第二校正單元6可包含至少一個或者多個第 16 ’則第二彈性元 而使第二移動元 如杲第二校正單元6包含複數轉二彈性元件泣 2可遠過向第二移動框架6U施加怪定的壓力 件61作為一個整體移動相同的長度。 料第二雜元件62及第-_元件52可岐具有狀彈力的 :. 第—校正單元5及第二校正單元6可在她垂直的方向上分 # 戶_卜也就是說,第—校正單元5與第二校正單元6 可刀獅動用戶滅C的相互垂直的第王側犯與第四側面⑶ # —作轉元7可操作第—校正單元5及第二校正單元6。因此, 2 k正早% 5及第二校正單元6可制戶托盤c移動至準確的 立置 由此,用戶托盤位置校正設備丨可透過一個作業單元7來操 • !!帛k正早70 5及第二校正單元6,因而,此校正設備係由簡 • 單的結構製成,且能夠移動用戶托盤 C至準確位置。 此外,用戶托盤位置校正設備1可僅使用一個電源將用戶托 •盤C移動至準確的位置,因此減少了製造成本與維護費用。 作業單元7係連接至底板4,並可在底板4上移動。當作業 單凡7在底板4上移動時’第一校正單元5及第二校正單元6可 以被操作。 作業單元7可連接至底板4之下側面。此作業單元7可包含 17 導塊與導執中的—個,而底板4可包含導塊解執中的另—個。 作業單元7可連接至汽缸δ的桿體如,且作業單元7可 = =83的運動在底板4上移動。此汽缸8可為氣動二 ' 健單元7可包含第—健單及第二作業單元72。 ..〃 S —作業較71可連接至底板4,並可在底板4上移動,且 修-帛-作業單元71可用來操作第—校正單元^。 ¥體單元71可操作第—校正單元5以使得第二作業單元 72可操作第二校正單元6。 γ乍業單元71可連接至底板4之下側面。此第一作業單元 71包含導塊與導執中的—個,而底板4可包含導塊與導執中的另 一個。 〃第一作業單元71包含至少-個或多個突出元件711用以轉動 第一移動元件51。 作突出元件7U係突出於第一作業單元力之作業板仏中。此 大出凡件711可沿著第一移動元件51被定位的方向突出。 因此’當轉動元件513被突出元件711支撐時,帛一移動元 件51可沿著第一接觸元件512遠離底板4之方向轉動。 動元件513被大出元件未形成於作業板中的部 18 盤cIt #移動辑511可沿著第一接觸元件512與用戶托 之第三側面c”目接觸的方向轉動。 第—=移動树51可透過第—彈蝴52彈性連接至底板4。 拉伸,而係於轉動元件513被支撐於突出元㈣上時被 7 \疋件513被支撐於突出元件711未形成於作業板 a、部份之上時’第一彈性元件52係被壓縮。由此, 動兀件51可被轉動。 因此’弟一移動元件51可移動用戶托盤c以使得用戶托盤之 第一側面C1係藉由坌—2« & _ , 雜兀件52之彈力被支撐於第-定位元 ,進而可防止由於施加至用戶托盤C之 用戶托盤C損壞。 八叩等致 元6 第二作業單it 72可連接至底板 72可包含導塊與導執中的一 另一個。 第t作業單元72係連接至底板4,並能在編上移動。第 二作業料72可與第—作料元71減娜爾第二校 元6。 干 4之下側面。此第二作業單元 個,而底板4可包含導塊與導執中的 弟一作業皁元72係盥第一作费留_上 一 /、弟作業早疋71相互聯鎖的移動第二 移動元件61。 一 第二作業單元72可沿_第二定位元件3之方向(γ轴的 19 1363734 反方向)移動第二移動元件61。且第 定位元件Μ皮安裳的方向(γ轴方向動早可沿著第二 外 多動弟一矛夕動元件61。 =動元件72可透過推動第二移動元件 Γ轉3之方向(γ軸的反方向)移動第y [作業單元72可透過移除施加於第二移動元件夕70 61。且 著第二定位元件3被安裝的方 之推力而沿 61 〇 D(Y軸方向)移動第二移動元件 時被壓縮,而⑽力被移應力施加至第:移動元件61 用下被拉^ 彈性树62將在彈力的作 被拉伸。由此’第二軸树61可被移動。 因^第二移動元件61可移_戶_ C以使得用戶把盤C 件藉由第二彈性元件62之彈力蝴於第二定位元 用戶托盤止由於施加至用戶托盤C之應力過大而導致 第:作業單元71與第二作業單元72可整體地形成,以使得 /業早71隨著汽缸8之桿體83的移動而移動時,第二 作業單元72也能隨之一起移動。 、然而’用戶托盤0能以與第二定位元件3及第—定位元们 分別間隔相應距離之方式被收容於底板4之上。 20 ^63734 此處為了更加尚效地將用戶托盤c移動至準確的位置,當 第-作業單元71與第二作業單元72在底板4上移動時,第—作 業單元71與第二作業單元72可彼此分隔開。 备第-作業單元71在底板4上移動時,第二作業單元乃可 - 操作弟二校正單元6。 帛乍業單元71可透過於底板4上移動時向第二作業單元 # - 72施加應力崎第二健單元72雜,也可透除上述摩力 而使第二作業單元72移動。 特別是,當第一作業單元71沿著第二作業單元72被定位的 方向移動時,第-作業單元71可推動第二作業料π進行移動。 士田第作業早7L 71沿著第二作業單元72被定位的反方向移 動時’第二作f單元72可藉由第二彈性元件62進行移動。The first contact member 512 is coupled to the end piece of the first moving frame 5 and can move the user tray c in accordance with the rotation of the first moving frame 511. . The first contact element 512 can be in contact with the third side C3 of the user tray C, and the third side c3 of the user tray can be moved toward the first positioning element 2 by the direction of the woman (X-axis direction) . The first contact member 512 may be formed to protrude from the first moving frame 5 ι so that the first interface # 512 may not be in contact with the third side C3 of the upper/upper tray C. The first contact member 512 is rotatably coupled to one end portion 511b of the first moving frame 511. Therefore, when the user tray c is moved, the first contact member M2 is rotatable around the second shaft 512a, thereby preventing the portion of the first contact member 512 from coming into contact with the user tray from being damaged by friction. The rotary member 513 is in contact with the health unit 7, and is capable of receiving the stress transmitted from the work unit 7 for rotating the first moving frame 511. The other end portion 511c. The rotating member 513 is rotatably coupled to the first moving frame, such as 14 1363734 - when the moving frame 511 is rotated, the rotating member 513 is rotatable around the second axis, thereby preventing the rotating member 513 from being partially caused by friction The first elastic member 52_ that is in contact with each other is elastically connected to the first arm member & to the bottom plate 4. The phase phase = (4) - the number of elements of the miscellaneous component 52. The number of the junctions can be connected to one end of the first moving frame 511 (10). The other end of the elastic element 52 can be connected to the bottom plate 4. The first elastic turn 52 pulls the first moving frame 5 to the bottom plate so that the first moving element 5 of the square tray cw 2 is tied by the axial unit 6 of the wire in the direction of the wire along the second positioning element 3 (γ 2:: The work is performed in the manner of the user tray C. The second school (first private series 61 and second job tree 62. Direction ==== positioning element 3 is moved by the direction of the wire (M direction), the user tray 3 is thinned (7) The member 61 which can be movably connected to the bottom plate 4 in a movable manner such as the X-axis can be connected to the work order Μ. Knowing the situation 15 such as /34 Second movement The element 61 comprises a second moving frame two contact element 6] 2. The second moving frame 611 is movable in a hole contact formed in the bottom plate 4. The moving frame 611 can be elastically supported by the second spring 62 The frame 611 is integrally formed into a square plate shape. The private second contact member 612 is formed to protrude from the second moving frame 611. And the jth contact wheel can be moved to the home tray ct, the movement member 61 can be included to v or a plurality of second contact elements 612. = contact elements 612 can be called with the fourth side of the _ disk = household tray C By pushing the fourth side C4 of the user tray C, the clamping element 3 is tilted by the direction axis of the money. The Zhuo-second element 612 can be formed on the front of the 4:::::;i:rr^iLs42^^ 4-- The fourth side of the corpse c is in contact with the fourth side. The first elastic member 62 _ elastically cuts the second crane element 61. Thus, the elastic-elastic 62 can push the second ore component to follow the second The positioning element 3 is mounted: the moving element "C. glaze direction" moves the user tray' and the other end can support the two elastic elements 62. The two ends of the two elastic elements 62 are supported on the bottom plate to support the second moving frame 611. The second correcting unit 6 may include at least one or more 16th 'th second elastic elements such that the second moving element, such as the second correcting unit 6, includes a plurality of two elastic elements, and the second moving unit can move farther than the second moving The frame 6U applies the strange pressure member 61 as a whole to move the same length. The second miscellaneous element 62 and the first-element 52 can be elastically shaped: the first correction unit 5 and the second correction unit 6 can be In the vertical direction, she divides the user's head, and the first correcting unit 5 and the second correcting unit 6 can be used by the user. The mutually perpendicular king side of the C is eliminated and the fourth side (3) #—the unit 7 can operate the first correction unit 5 and the second correction unit 6. Therefore, 2 k is early % 5 and the second correction unit 6 can The user tray c is moved to an accurate standing position, whereby the user tray position correcting device 操 can operate through a work unit 7 to control the front right 70 5 and the second correcting unit 6, and thus, the correcting device is The single structure is made and can move the user tray C to the exact position. In addition, the user tray position correction device 1 can move the user tray C to an accurate position using only one power source, thereby reducing manufacturing cost and maintenance. cost. The work unit 7 is connected to the bottom plate 4 and is movable on the bottom plate 4. When the job sheet 7 moves on the bottom plate 4, the first correcting unit 5 and the second correcting unit 6 can be operated. The work unit 7 can be connected to the lower side of the bottom plate 4. This work unit 7 may contain one of 17 guide blocks and guides, while the bottom plate 4 may contain another one of the guide blocks. The working unit 7 can be connected to the rod of the cylinder δ, for example, and the movement of the working unit 7 can be ==83 on the bottom plate 4. The cylinder 8 can be a pneumatic two-unit 7 which can include a first-order and a second working unit 72. .. 〃 S - The job 71 can be connected to the bottom plate 4 and can be moved on the bottom plate 4, and the repair-work unit 71 can be used to operate the first correction unit. The body unit 71 can operate the first correction unit 5 so that the second work unit 72 can operate the second correction unit 6. The gamma industry unit 71 can be connected to the lower side of the bottom plate 4. This first work unit 71 contains one of the guide blocks and the guide, and the bottom plate 4 may contain the other of the guide block and the guide. The first working unit 71 includes at least one or more protruding members 711 for rotating the first moving member 51. The projecting member 7U protrudes from the work panel of the first work unit. This large portion 711 can protrude in the direction in which the first moving member 51 is positioned. Therefore, when the rotating member 513 is supported by the protruding member 711, the first moving member 51 can be rotated in the direction in which the first contact member 512 is away from the bottom plate 4. The movable member 513 is not formed in the working portion of the working plate. The disk cIt #moving 511 is rotatable in a direction in which the first contact member 512 is in contact with the third side c" of the user's holder. 51 is elastically coupled to the bottom plate 4 through the first elastic butterfly 52. Stretching, and being supported by the protruding member (4) when the rotating member 513 is supported by the protruding member 513, the protruding member 711 is not formed on the working plate a, Above the portion, the first elastic member 52 is compressed. Thereby, the movable member 51 can be rotated. Therefore, the younger moving member 51 can move the user tray c such that the first side C1 of the user tray is used by坌—2« & _ , the elastic force of the miscellaneous member 52 is supported by the first positioning element, thereby preventing damage to the user tray C applied to the user tray C. The gossip etc. The connection to the bottom plate 72 may include one of the guide block and the guide. The t-th working unit 72 is coupled to the bottom plate 4 and is movable on the knitting. The second working material 72 may be subtracted from the first working element 71. The second school element 6. The lower side of the dry 4. This second working unit, while the bottom plate 4 can be packaged The second moving element 61 is movable along the guiding unit and the guiding member in the guide. The first working unit 72 can be moved along the first moving unit. The direction of the second positioning element 3 (the opposite direction of the γ axis 19 1363734) moves the second moving element 61. And the direction of the positioning element is the same as the direction of the γ axis (the γ axis direction can move along the second outer multi-moving brother one) The spear element 61. The moving element 72 can move the first y by pushing the direction of the second moving element twirling 3 (the opposite direction of the γ-axis). [The working unit 72 can be applied to the second moving element 70 61 by the removal. And when the second positioning member 3 is mounted with the thrust of the square to move the second moving element along the 61 〇D (Y-axis direction), the force is applied to the first: the moving element 61 is pulled. The elastic tree 62 will be stretched in the elastic force. Thus the 'second axis tree 61 can be moved. The second moving element 61 can be moved to allow the user to place the disk C piece by the second elastic element. The elastic force of 62 is the second positioning element user tray, which is caused by the excessive stress applied to the user tray C: The industrial unit 71 and the second working unit 72 may be integrally formed such that when the movement 71 moves with the movement of the rod 83 of the cylinder 8, the second working unit 72 can also move with it. The tray 0 can be received on the bottom plate 4 at a corresponding distance from the second positioning element 3 and the first positioning element. 20 ^63734 Here, in order to more effectively move the user tray c to an accurate position, When the first working unit 71 and the second working unit 72 move on the bottom plate 4, the first working unit 71 and the second working unit 72 may be spaced apart from each other. When the preparation-working unit 71 moves on the bottom plate 4, the second working unit can operate the second correction unit 6. The labor unit 71 can apply the stress second mechanical unit 72 to the second working unit #-72 while moving on the bottom plate 4, and can also move the second working unit 72 by the above-mentioned friction. In particular, when the first working unit 71 moves in the direction in which the second working unit 72 is positioned, the first working unit 71 can push the second working material π to move. When the Shida first operation 7L 71 moves in the opposite direction in which the second working unit 72 is positioned, the second f unit 72 can be moved by the second elastic member 62.

¥用戶托盤c的第二觸C2被支撐於第二定位元们之』 日:’第二作業單元72的移動停止。第—作業單元71將繼_ 至用戶絲C的第-側面α被支撐於第—定位树2之上, 因此’第—作敗71料鮮二作鮮元抑互分隔開之後 仍可繼續移動。 的距^就是說,Γ作糾71與第:健單元72可移細 般 α此’第一移動疋件51與第二移動元件61可使用戶和 c移動不_雜伽高效地移_戶滅c至準確的位置 21 1363734 因此,儘管用戶托盤c與第一定位元件2及第二定位元件3 間隔不同的距離,但當用戶托盤c被接收於底板4之上時,用戶 托盤位置校正設備i均可將用戶托盤C移動至準確的位置。 此外’儘管肝鋪C的尺柯隨著職晶#_之改變在 -定範圍内變化,但好托盤位置校正設備丨仍可將尺寸變化的 用戶托盤C移動至準確的位置而不必進行重複操作。 在下文中,將結合關對第—賴單元71 72連接至錢4且域板4上移鱗可相互分_之情料I 業流程進行描述。 「第5圖」為本發明之#托舰置校正設備於校正用户乾 瓜則的狀態平面圖。「第6圖」表示了「第5圖」之下側面。 「第7圖」為本發明之用戶域位置校正設傷於校 置之後的狀態平面圖。「第8圖」表 €皿位 弟7圖」之下側面。 請參考「第5圖」及「第6圖」所示’當第一 著第二作業單元72被定位之方向移動時, 業早U沿 著當轉動元件513被支撐於第—物元71之1件51係沿 第一接觸元件512遠離底板4之方向_。‘ c 52被拉伸。 了弟一彈性元件 第-作業單元7】推動第二作業單元乃, 沿著第二接觸元件612遠離筮_弟—作業單元72 讀元件3之方向(M反方向) 22 1363734 移動第二移動元件61。此時’第二彈性元件62被壓縮。 _在此狀態下’用戶托盤c可不受第一移動元件51及第二移動 元件61之干擾而被收容於底板4之上。 請參考「第7圖」及「第8圖」所示,在用戶托紅被收容 於底板4之上植態下,#第—作#單元7ι沿著第二作掌單元The second touch C2 of the user tray c is supported by the second positioning unit. Day: The movement of the second working unit 72 is stopped. The first-working unit 71 is supported on the first side surface α of the user wire C on the first positioning tree 2, so that the 'first-deficient 71' is fresh and the two are separated from each other and can continue. mobile. The distance ^ is said to be the same as the first: the health unit 72 can be moved as follows. The first moving element 51 and the second moving element 61 can move the user and the c. Off c to the exact position 21 1363734 Therefore, although the user tray c is spaced apart from the first positioning element 2 and the second positioning element 3 by a different distance, when the user tray c is received over the bottom plate 4, the user tray position correcting device i can move the user tray C to the exact position. In addition, although the change of the liver of the liver C varies with the range of the job, the good tray position correction device can still move the user tray C of the dimensional change to the exact position without repeating the operation. . In the following, the description will be made in connection with the connection of the first-to-one unit 71 72 to the money 4 and the shifting of the scale on the domain board 4 to each other. Fig. 5 is a plan view showing the state of the #托船置校正设备 of the present invention for correcting the user's melon. "Picture 6" shows the lower side of "Picture 5". Fig. 7 is a plan view showing the state of the user domain position correction after the correction of the present invention. "Picture 8" table, the lower side of the "Bamboo 7". Please refer to "Fig. 5" and "Fig. 6". When the first working unit 72 is moved in the direction in which it is positioned, the early U is supported by the rotating element 513 in the first object 71. One piece 51 is along the direction _ of the first contact element 512 away from the bottom plate 4. ‘c 52 is stretched. The second elastic operating unit 7 pushes the second working unit to move the second moving unit along the second contact element 612 away from the direction in which the working unit 72 reads the element 3 (the reverse direction) 22 1363734 61. At this time, the second elastic member 62 is compressed. In this state, the user tray c can be accommodated on the bottom plate 4 without being disturbed by the first moving member 51 and the second moving member 61. Please refer to "Figure 7" and "Figure 8". In the state where the user's red is contained on the bottom plate 4, #第为作#unit 7ι along the second palm unit

仏皮定位之反方向移動時,轉動元件513被支擇於突出元件爪 未形成於第一作業單元71中的部份 由此,第一移動元件 係將沿著第一接觸元件512與用戶&般 臨从+人 盤c L面C3相接 觸的方向轉動。此時,第一彈性元丰 Μ乐·凡件52係在彈力的作用下被麼縮 而恢復到其初始形態。 定位-杜 一接觸元件512的推動係將沿著第 疋位讀2被安裝的方向移動。如戶托盤 位耕2之上時哪嫩确停止。第疋 ^作業單元72將隨著施加於第—作業單 除而移除已施加至第二移動元件61的應力。 應力被移 向移係將㈣第"定位元件3被安裝的方 Μ而制= C 之第四側面 時,第二树62係件3被絲財向移動。此 態。 ㈣的作用下被拉伸而恢復到其初始形 23 ^63734 當用戶托盤c透過第二接觸元 . ^ Wo* 12之推動而被支撐於第二 件之上%,用戶托盤C之移動將停止。 當用戶托紅被切於第二定位树化 ㈣及第二健單元72之移動將停止。並且,第—作 :繼=,直至用戶托盤C被支撐於第一定位元件2之上,如此, 作業早兀71與第二作業單元72可彼此分隔開。 用戶托盤c之苐-側面C1、第二側面c2、第三側面ο及第 2側面C4係被分别支撐於第一定位元件2、第二定位元们、第 ^多動树51及第:槪⑭之上,如此,用戶托盤C之位 被板正到拾取器系統能夠穩定執行裝載製程與卸载製程的位 罝。 以下’縣合_對包含上朗戶滅位置校正設備的本發 月之測試崎機的—較佳實_進行詳細描述。 「第9圖」為本發明之測試搬運機的結構方塊圖。 明參考「第1圖」至「第9圖」所示’本發明之測試搬運機 〇包含腔室系統1卜裝載堆疊機12、卸載堆疊機13、裝載單元 14、卸载單元15及緩衝單元16。 乂 腔至系統11包含第一腔室m、第二腔室112及第三腔室113。 /在第一腔室111中,容納於測試托盤τ中的待測試的封裝晶 :、:被加熱或冷卻至一測試溫度,此測試溫度係根據用戶的品 24 1363734 質需求預先確定。隨著加熱或冷卻發生,戦托盤了將在第一腔 室111内向前移動-定距離。t封裝晶片被加熱或冷卻至測試溫 度以後’職1托盤T將從第移至第二腔室出中。When the suture positioning is moved in the opposite direction, the rotating member 513 is selected to be a portion of the protruding member claw that is not formed in the first working unit 71. Thus, the first moving member will be along the first contact member 512 and the user &; the general direction of rotation from the + human disk c L face C3 contact direction. At this time, the first elastic element Feng Xie·Fan 52 is contracted by the elastic force to return to its original shape. The push-pull of the positioning-du-contact element 512 will move in the direction in which the first clamp read 2 is mounted. If the household tray is above 2, it will stop. The first operation unit 72 will remove the stress that has been applied to the second moving member 61 as applied to the first job ticket. When the stress is shifted toward the shifting system, the second tree 62 is moved by the wire. When the fourth side of the frame member 3 is mounted = C, the second tree 62 is moved by the wire. This state. (4) Stretched and restored to its original shape 23 ^63734 When the user tray c is supported by the second contact element. ^ Wo* 12 is supported on the second piece, the movement of the user tray C will stop. . When the user red is cut to the second positioning tree (4) and the movement of the second health unit 72 will stop. And, the first operation is continued until the user tray C is supported on the first positioning member 2, so that the work early 71 and the second working unit 72 can be separated from each other. The side surface C1, the second side surface c2, the third side surface ο and the second side surface C4 of the user tray c are respectively supported by the first positioning member 2, the second positioning unit, the second moving tree 51, and the first: Above 14, so, the position of the user tray C is stabilized by the board to the pick-up system to perform the loading process and the unloading process. The following 'County Union' is described in detail for the test of the Rizhao machine of the previous month, which contains the position correction device. Fig. 9 is a block diagram showing the structure of the test handler of the present invention. Referring to the "Fig. 1" to "Fig. 9", the test carrier of the present invention includes a chamber system 1 loading stacker 12, an unloading stacker 13, a loading unit 14, an unloading unit 15, and a buffer unit 16. . The cavity to system 11 includes a first chamber m, a second chamber 112, and a third chamber 113. / In the first chamber 111, the package crystal to be tested accommodated in the test tray τ:, is heated or cooled to a test temperature, which is predetermined according to the quality requirement of the user's product 24 1363734. As heating or cooling occurs, the stack of trays will move forward within the first chamber 111 by a fixed distance. After the packaged wafer is heated or cooled to the test temperature, the job 1 tray T will move from the first to the second chamber.

在第二腔室m中’測試托盤τ中的封裝“將與高精度定 位㈣上的插餘接觸私接輕職。高精度粒板Η係與第 至12相連接w王部封裳晶片均經過測試機測試之後,測 試托盤τ將從第二腔室112被轉移至第三腔室⑴中。 、 隹弟三腔室113中 μ 合奶於測試托盤Τ中的測試後的封裝晶 將被知或加熱至常溫。隨著加熱或冷卻的發生,測試托盤Τ =三腔室⑴_移動,離。當封裝晶片被冷卻或加 i W錢’測試減了赌第三腔室113被赫至卸載單元 i 5 〇 弟—腔請、第二腔室職第三腔請可沿水平方向依 行,心列。在上述排列中,複數個第二腔室112可配置成一縱 、句話說’ 一個第二腔室112可位於另一個第二腔室112之 上方0 依序2腔至U1、第二腔室112及第三腔室113也可沿垂直方向 成一縱行,其中第二腔室112係位於中間。 用裝載堆疊機12用於儲存複數個容納有待測試之封裝晶片的 讀C。用戶托盤位置校正設備〗係安裝於裝載堆疊機之 25 1363734 ο 卸载堆疊機13用於儲存複數個容納有測試後的封裝晶片之 用戶托盤。卸載堆疊機13令也安裝有用戶托盤位置校正設備】。 測試後的封裝晶片係被收容於透過分級而被定位於不同位置的用 戶托盤C之中。 ' 裝解元Μ ·謂制_縣晶狀置_試托盤中,並 且裝載單元14包含裝載拾取器 14卜 ^载拾取器⑷可沿χ轴及γ轴方向移動。且裝载拾取器 梦曰^可上升和下降。此裝载拾取器⑷包含複數個能夠吸拾封 裝日日片之嘴嘴。In the second chamber m, the 'package in the test tray τ' will be in contact with the plug-in on the high-precision positioning (4). The high-precision grain plate system is connected with the 12th phase. After the test machine is tested, the test tray τ will be transferred from the second chamber 112 to the third chamber (1). The test package crystal in the third chamber 113 of the third chamber 113 in the test tray will be Know or heat to normal temperature. As heating or cooling occurs, test tray Τ = three chambers (1) _ move, away. When the package wafer is cooled or add i w money 'test minus gambling third chamber 113 is hoisted Unloading unit i 5 〇 — 腔 腔 腔 腔 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二The second chamber 112 may be located above the other second chamber 112. The second chamber to the U1, the second chamber 112, and the third chamber 113 may also be vertically traversed in a vertical direction, wherein the second chamber 112 The load stacker 12 is used to store a plurality of read Cs containing the packaged wafers to be tested. The household tray position correction device is installed on the load stacker 25 1363734. The unload stacker 13 is used to store a plurality of user trays containing the tested package wafers. The unload stacker 13 is also equipped with a user tray position correction device. The packaged wafer after the test is housed in the user tray C that is positioned at different positions through the classification. The assembly is in the test tray, and the loading unit 14 includes the loading and unloading. The pick-up device (4) is movable along the x-axis and the γ-axis direction, and the loading picker can be raised and lowered. The loading picker (4) includes a plurality of mouths capable of picking up the packaged day sheets. .

中^載拾取器141可從定位於轉_ U中_戶托盤CThe middle load picker 141 can be positioned from the turn_U in the home tray C

Ha中傻晶片’並將封裝晶片放置到定位於裝載位置 的似她之t,魏是所謂的裝载製程。 ⑽得在裝載製 腔室^程完成後的測試耗盤_載位置⑷被轉移至第一 的測試後的封裝晶結果藉由分級對容納於測試托盤中 151。 ”類此卸载單元15包含#卩載拾取器 26 1363734 卸載拾取器151可沿X軸及γ軸方向移動。且卸載拾取器 151也可上升和下降。此卸載拾取器151包含複數個能夠吸拾封 裝晶片之噴嘴。The silo wafer in Ha' and the package wafer is placed in a position similar to her, and Wei is the so-called loading process. (10) The result of the test tray after the completion of the loading chamber _ loading position (4) is transferred to the first test, and the result of the package crystal is accommodated in the test tray 151 by the grading pair. The unloading unit 15 includes a # pick-up picker 26 1363734. The unloading picker 151 is movable in the X-axis and γ-axis directions, and the unloading picker 151 can also be raised and lowered. This unloading picker 151 includes a plurality of pick-up pickers 151 A nozzle that encapsulates a wafer.

卸载拾取器151可將測試後的封裳晶片從定位於卸載位置 15a中的測試滅巾分離’並將分離後的封裝以放置到定位於 卸載堆疊機13中_戶托盤c之中,這就是所謂的卸载製程。 卸载取器⑸可依如測5式結果藉由分級將測試後的封裝晶 片放置到定位於不同位置的用戶托盤c之中。 151以使得在卸载製 測試搬運機1〇可包含複數個卸載拾取器 程中所耗費的時間可以減少。 15aThe unloading picker 151 can separate the tested wafers from the test wipes positioned in the unloading position 15a and place the separated packages into the unloading stacker 13 in the home tray c, which is The so-called unloading process. The unloader (5) can place the tested package wafers into the user trays c positioned at different positions by grading according to the results of the test. 151 so that the time taken in the unloading test handler 1 can include a plurality of unloading pickers can be reduced. 15a

緩衝單元16 緩衝單元16 中〇 可暫時容納封裝晶片。 可絲並烟槪少—姆餘觀卸載製程 ^纖使_術巾,_拾取器 裝晶片,並能夠夢由二::2::用戶托盤C上拾取待測試的封 於裝载位置中=r:16將待峨的封㈣放置到定位 27 丄的3734 如果_單元16被安裝並使祕卸麵財, ^可從定位於卸載位置試托盤上分_試後的= :片’絲夠藉由緩衝單元16將測試後的封裝晶片放置到定跡 卸载堆豐機13中的用戶托盤c内。 ; 以下 另^^將對具有上·構的本發明之職搬運機的 另—實施例進行詳細描述。 此處’本發明另—實施例之測試搬運機係具有與上述的測試 運機相似的結構,因此,下面將僅縣構巾㈣異進行描述。 「第1〇圖」為本發明之另一實施例的測試搬運機之平面圖。 二:第9圖」及「第1〇圖」所示,本發明之另-實施例的測 f運機1G係包含交換單元17,此交解元Π並未包含於「第 圖」所示之測試搬運機10中。 此交換^元17 _以將容納有待測試的封裝晶片之測試托 =以及谷納有K後的封裝晶片之測試托盤τ與腔室系統11 進行交換。 令納有剌試的封裝晶狀職托盤Τ係將從交換單元口 1轉紅:室系統11 ’而容納有測試後的封裝晶片之測試托盤Τ 、i將從腔室系統11被轉移至交鮮元17。 在交換單元Π中’係進行將待測試的封裳晶片放入測試托盤 之々驟以及將測武後的封裝晶片從測試托盤丁上分離之步驟。 28 U03734 此處’將待測試的封裝晶片放入測試托盤τ之步驟係為裳載製程 之-部份,而將測試後的封襄晶片從測試托盤丁上分離之步驟係 為卸載製程之-雜。此交鮮元π包含裝触置W與卸載位 置15a ’並且可在-個位置中實現裝載位置…與卸載位置以。 -- 此交換單元Η還可包含轉動單元171。 • •‘ 轉動單元171用以將容納有制試的封裝晶片之測試托盤τ φ-從-個水平位置轉動至—個垂直或直立位置。此峨托盤丁在其 於腔室系統11内轉移期間係保持直立位置。 /、 轉動單元171射將容納有職後的縣晶片的處於直立位 置的測試托盤Τ從-個垂直位置轉_—個水平位置。此測試托 现Τ在Κ翻封裝晶諸其上分軸及隨後新的制試的封裝 晶片被收容於其巾時,係鱗水平位置。 "The buffer unit 16 buffer unit 16 can temporarily accommodate the package wafer. Can be silk and smoke less - M Yu Guan unloading process ^ fiber to make _ surgery towel, _ picker loaded wafer, and can dream two:: 2:: user tray C pick up the seal to be tested in the loading position = r:16 put the seal (four) to be smashed to the 3734 of the positioning 27 如果 If _ unit 16 is installed and make the secret unloading, ^ can be divided from the test tray positioned at the unloading position _ after the test = : piece 'silk enough The tested package wafer is placed by the buffer unit 16 into the user tray c in the track unloading stacker 13. In the following, another embodiment of the carrier of the present invention having the above configuration will be described in detail. Here, the test handler of the other embodiment of the present invention has a structure similar to that of the above-described test aircraft, and therefore, only the county fabric (four) will be described below. 1A is a plan view of a test handler according to another embodiment of the present invention. 2: FIG. 9 and FIG. 1 show that the measuring device 1G of another embodiment of the present invention includes an exchange unit 17, and the intersection element is not included in the "figure". In the test carrier 10. This switching element 17 exchanges the test tray τ containing the package wafer to be tested and the package wafer τ of the package wafer after the Kna with the chamber system 11. The packaged wafer trays will be transferred from the exchange unit port 1 to the red: chamber system 11' and the test trays containing the tested package wafers, i will be transferred from the chamber system 11 to the fresh-keeping Yuan 17. In the exchange unit, the step of placing the wafer to be tested into the test tray and the step of separating the test package wafer from the test tray are performed. 28 U03734 Here's the step of placing the packaged wafer to be tested into the test tray τ as part of the process, and the step of separating the tested packaged wafer from the test tray is the unloading process - miscellaneous. This fresh element π contains the mounting contact W and the unloading position 15a' and the loading position... and the unloading position can be realized in one position. -- This exchange unit Η can also include a rotation unit 171. • • The rotating unit 171 is used to rotate the test tray τ φ of the packaged wafer containing the test from a horizontal position to a vertical or upright position. This crucible tray remains in an upright position during its transfer within the chamber system 11. /, The rotating unit 171 shoots the test tray 处于 in the upright position of the county wafer that holds the post-employment, from a vertical position to a horizontal position. This test enables the scaly to be horizontally positioned when the packaged wafers are turned over and the subsequently packaged wafers are received in their towels. "

雖然本發明以前述之較佳實施例揭露如上,然其並非用以限 定本發明,任何熟f相像技藝者,在獨離本發明之精神和範圍 ==許:更動與潤飾,因此本發明之專利保護範圍須視 本說明書_之巾請翻範®所界定者為準。 【圖式簡單說明】 γ Θ為貞!I趣運機帽存有複數細戶托盤的堆疊機之前 圖 第2圖為用戶托盤之位置經校正後陳態之平面 29 1363734 第3圖為本發明之用戶托餘置校正設備及用戶托盤之透視 圖; 第4圖為第3圖之下側面的透視圖; 第5圖為本發明之好域位置校正設備於校簡戶托盤位 置之前的狀態平面圖; 第6圖表示了第5圖之下側面;While the present invention has been described above in terms of the preferred embodiments thereof, it is not intended to limit the invention, and the skilled in the art is in the spirit and scope of the invention. The scope of patent protection shall be subject to the definition of this manual. [Simple description of the diagram] γ Θ is 贞! I interesting machine hat stacking machine with multiple household trays. Figure 2 is the plane of the user tray after correction. 29 1363734 Figure 3 is the user's rest adjustment device and user tray of the present invention. Fig. 4 is a perspective view of the lower side of Fig. 3; Fig. 5 is a plan view showing the state of the good position correcting device of the present invention before the position of the school tray; Fig. 6 is a view of Fig. 5 side;

第7圖為本發明之用戶托餘置校錢備於校正用 置之後的狀態平面圖 | 第8圖表示了第7圖之下側面; 第9圖表示了本發明之測試搬運機的結構;以及 第U)圖為本發明之另—實施例的測試搬運機之平面圖 L主要元件符號說明】 用戶托盤位置校正設備 第一定位元件 第二定位元件 底板 第一校正單元 第二校正單元 作業單元 汽缸 30 1363734 8a 桿體 10 測試搬運機 11 腔室系統 12 裝載堆疊機 13 卸載堆疊機 14 裝載單元 15 卸載單元 16 緩衝單元 17 交換單元 41 孔洞 42 孔洞 51 第一移動元件 52 第一彈性元件 61 第二移動元件 62 第二彈性元件 71 第一作業單元 72 第二作業單元 14a 裝載位置 15a 卸載位置 71a 作業板 100 堆疊機 31 1363734 101 裝載堆疊機 102 卸載堆疊機 103 緩衝堆疊機 104 傳輸單元 111 第一腔室 112 第二腔室 113 第三腔室 141 裝載拾取器 151 卸載拾取器 171 轉動單元 511 第一移動框架 512 第一接觸元件 513 轉動元件 611 第二移動框架 612 第二接觸元件 711 突出元件 101a 位置 102a 位置 511a 第一軸 511b 端部 511c 端部 32Figure 7 is a plan view of the state after the user has placed the money for correction in the present invention | Fig. 8 shows the lower side of Fig. 7; Fig. 9 shows the structure of the test handler of the present invention; Figure U) is a plan view of a test carrier of another embodiment of the present invention. L main component symbol description] user tray position correcting device first positioning member second positioning member bottom plate first correcting unit second correcting unit working unit cylinder 30 1363734 8a Rod 10 Test carrier 11 Chamber system 12 Loading stacker 13 Unloading stacker 14 Loading unit 15 Unloading unit 16 Buffer unit 17 Exchange unit 41 Hole 42 Hole 51 First moving element 52 First elastic element 61 Second movement Element 62 Second elastic element 71 First working unit 72 Second working unit 14a Loading position 15a Unloading position 71a Working plate 100 Stacking machine 31 1363734 101 Loading stacker 102 Unloading stacking machine 103 Buffering stacking machine 104 Transfer unit 111 First chamber 112 second chamber 113 third chamber 141 loading picker 151 unloading picker 171 rotating unit 511 first moving frame 512 first contact element 513 rotating element 611 second moving frame 612 second contact element 711 protruding element 101a position 102a position 511a first axis 511b end 511c end 32

Claims (1)

丄 丄 年12月7日替換頁 十、申請專利範圍: 1·種用戶域位置校正設備,係包含: 以 至4i第-定位元件及至少—個第二定 確定—用戶托盤之位置; 域 —底极’係用於接收該用戶托盤; 定位元 第-权正單元,制以將制戶托盤沿著 一 件被安裝的方向移動; 定位元 '一第二校正單係用以將_戶托盤沿著該第二 件被安裝的方向移動;以及 兀 作業單元,係周以操作該第一校正單元與該 苐二校正單 單塊含:―第—糖元,係用以操作該 炉鎖納Γ ’飞—第二健單元,係無第—作業單元相互 如鎖的刼作該第二校正單元, 動時操作 其中該第二作業單元在沿著作業單元移 該第二校正單元。 2.如請求項1所敎Μ滅位置校正鋪,射該第-作業單 1連接至該底板,射該第二作業單元係連接至該底板。 .如明求項2所奴用戶托盤位置校正额,其中該第一作業單 元與該第二作業單元可在該底板上移動時相互分離。^ -二求2所返之用戶托盤位置校正設備,其中該第一校正單 凡*係包含· 34 至少個第-移動元件,係連接至該底板,並且其中至少 —個t移動元件可在該底板上轉動 ;以及 〜彈11凡件’係將該第一移動元件彈性連接至該底 碎反0 — 二==所述之用戶托盤位置校正設備,其中該第一移動元 架可係連接至該絲,且其中該第—移動框 中% 元件,係連接至該第一移動框架之一端,且其 托盤;以及鱗係依據該第一移動框架之轉動來移動該用戶 —轉動元件’係連接麵第—移動框架 .. =r蝴-移_之㈣上轉動並接二: &amp;如請求項5所述之用戶托盤位置技正設備, =接響賴之―端,謝 在该弟一移動框架之一端上轉動。 7.如請求項4所述之用戶托盤位置校正設備,其中該第一作 兀包含至少—個突出元件,係用以轉動該第-移動元件。. &amp;如請求項2所述之用戶托盤位置校正設備,其中該第二校 元係包含: 平' 35 1363734 曰替換頁 一第二移動元件,係沿著該第二 動,並且其t料二雜元件係沿著鄕二=裝的方向移 方向移動_戶托盤;⑽ 〇讀被安裝的 件 至少一個第二職元件,_以彈性切該第二移動 7L· 其中該第二移動 ::::8所述之用戶托盤位置校正設備, 及 ^移動赠,係透麟第二元件被彈性支標 ;以 並中ST二接_,_贿第二_架中,且 ω如』主^/個弟二接觸元件係用以移動該用戶托盤。 .明本項8所述之用戶托盤位 元係與該第—作章星、 4其中該弟二作業單 u 讀早70相互聯鎖的移動該第二移動元件。 〆員1所述之用戶托盤位置校正 元與該第二校正單元m 街/、中該弟杈正早 12•如^ 早私沿者湘互垂直的方向移動該用戶托盤。 連校正設備’其中該作業單元係 丄且其中該作業單元係可在該底板上移動;以及 -' ^第&amp;正單元與该第二校正單元係依據該作業單 凡之移動而進行操作。 〃 13.一種測試搬運機,係包含: 、載隹且機’係具有複數_戶托盤,所相戶托盤中 36 1363734 容納有待測試的封裝晶片; 100年12月7曰替換頁 中;一裝鮮元,係用以將待測朗封裝晶片放入- 測試托盤 -腔室系統,在該腔室系統中所 位板相接觸; &amp; 晶 片與一高精度定 膝式托盤中谷納的測試後的塊晶片進行分類; 將。亥 卸_$機,顧縣魏_戶城 中容納有_猶的縣W,.叹 灿 一用戶把餘置校正設備,係相安裝於 該卸載堆疊機之中, ㉟&amp;機與 其中,該用戶托盤位置校正設備係包含: ' 至少一個第一定位元件及至少— 被—-田心加 乂個弟一疋位轉,係用以 確疋一用戶托盤之位置; .....一底板,_係用於接收讓甩戶托盤;. 第-校正單元,係用以將該用戶托盤沿著該第 件被安裝的方向移動; ^ 一第二校正單元,係用以將該用戶托盤沿著該 件被安裝的方向移動;以及 ^ 兀, —-作業單元,係用以操作該第—校正單元與該第二校正單 37 丄/ 替換頁 —其中該作業單元係包含:一第一作業單元,係用以操作該 第一校正單元;及—第二作業單元,係與該第-作業單元相互 聯鎖的操作該第二校正單元, 其中該第二作業單元在沿著該第-健單元義時操作 該第二校正單元。 - 如明求項I3所述之測試搬運機,其中該第—作業單元,係連接 : 至該底板,其中該第二作業單元,係連接至該底板。 15. 如請求項u所述之職搬運機,其愧第—作業單元與該第二 作業單元可在該底板上彳乡動喃互分離。 16. 如請求項13所述之測試搬運機,其中該第-校正料係包含:- 至少一個第一移動元件’係連接至該底板,並且其中至少 一個第-移動元件可在該底板上轉動;以及 第一彈性疋件’係將該第一移動元件彈性連接至該底 板。 _ ‘17.如請如3所述之測試搬運機,其十該第二校正革元係包含: '一第二移動元件,係沿著該第二定位元件被安裝的方向移 ,並且其巾轉二糖元件係沿著該第二定位元件被安褒的 方向移動該用戶托盤;以及 至少一個第二彈性7^件’伽以彈性支撐該第二移動元:’ 如明求項Π所逑之測試搬運機,其中該第二作業單元係與該第 38 作業單元相互聯鎖的移動該第 1—所述之測試搬運機:;=件二 校正單元係沿著相互垂直的方向移動單元與該第二 2arf=r所述之測試搬運機,射該作鮮觸、連接至該底 板’且其中該作業單元係可在該底板上移動;以及 - :作業單 其中’該第-校正單元與該第二校正單元係依據該’ 元之移動而進行操作。 39Replacement page on December 7 of the following year. Patent application scope: 1. User domain location correction equipment, including: 4i first-position component and at least one second determination-user tray position; domain-bottom a pole' is used to receive the user tray; a positioning element-right unit is configured to move the maker tray along a direction in which one is installed; a positioning unit 'a second correction sheet is used to The second piece is moved in the direction in which it is mounted; and the 兀 working unit is configured to operate the first correcting unit and the second correcting unit block: “the first sugar element is used to operate the furnace lock Γ ' The fly-second unit is a second correcting unit that is not locked by the first working unit, and the second working unit moves the second correcting unit along the writing unit. 2. If the position correction shop is annihilated in claim 1, the first work order 1 is attached to the bottom plate, and the second work unit is attached to the bottom plate. The user tray position correction amount as claimed in claim 2, wherein the first work unit and the second work unit are separable from each other when moving on the bottom plate. ^ - 2 to return the user tray position correction device, wherein the first calibration unit contains 34 at least the first moving element, is connected to the bottom plate, and wherein at least one t moving element can be Rotating on the bottom plate; and the elastic member is configured to elastically connect the first moving member to the bottom tray, and the first tray member is coupled to the user tray position correcting device. The wire, and wherein the first moving frame % element is connected to one end of the first moving frame, and the tray thereof; and the scale moves the user-rotating element 'connection according to the rotation of the first moving frame Face-moving frame.. =r-float-shift_(4) on the second and the second: &amp; the user's pallet position as described in claim 5, the correct device, = answer the "-", thank you in the brother Rotate on one end of the moving frame. 7. The user tray position correcting device of claim 4, wherein the first action comprises at least one protruding element for rotating the first moving element. The user tray position correcting device of claim 2, wherein the second school element system comprises: a flat '35 1363734 曰 a replacement page a second moving element, along the second movement, and The two miscellaneous components are moved along the direction of the second direction of loading _ household tray; (10) readable at least one second component of the mounted component, _ elastically cutting the second movement 7L · wherein the second movement: The user tray position correction device described in ::8, and the mobile gift, the second component of the system is elastically slid; the ST is connected to the second _, the _ bribe is in the second frame, and the ω is the main ^ / brother two contact elements are used to move the user tray. The user tray position described in the item 8 is moved to the second moving element by interlocking with the first chapter, the chapter 2, and the second job sheet u. The user tray position correction unit described in the employee 1 moves the user tray in a direction perpendicular to the second correcting unit m street/, the middle of the younger brother. And the correcting device' wherein the working unit is 丄 and wherein the working unit is movable on the bottom plate; and - '^ the first positive unit and the second correcting unit operate in accordance with the movement of the work unit. 〃 13. A test handler comprising: a load carrying machine having a plurality of trays, 36 1363734 in the household tray containing the packaged wafer to be tested; a replacement page in December 7th, 100; The fresh element is used to put the test package wafer to be tested into the test tray-chamber system, where the plate in the chamber system is in contact; &amp; wafer and a high precision fixed knee tray after the test in the valley The block wafer is sorted; Hai unloading _$ machine, Guxian Wei _ household city contains _ Jue County W,. Sing Chan a user to install the remaining correction equipment, the phase is installed in the unloading stacker, 35 &amp; and the user The tray position correction device comprises: 'at least one first positioning component and at least----Tianxin plus a younger brother to turn the position to confirm the position of a user tray; ..... a bottom plate, _ Used for receiving a pick-up tray; a first-correcting unit for moving the user tray in a direction in which the first piece is mounted; ^ a second correcting unit for arranging the user tray along the The workpiece is moved in the direction of installation; and ^ 兀, - the work unit is for operating the first correction unit and the second calibration sheet 37 丄 / replacement page - wherein the work unit comprises: a first work unit, For operating the first correction unit; and - the second work unit is interlocking with the first work unit to operate the second correction unit, wherein the second work unit is along the first health unit The second correction unit is operated at the time. - The test handler of claim I, wherein the first working unit is connected to the bottom plate, wherein the second working unit is connected to the bottom plate. 15. The handler according to claim u, wherein the first working unit and the second working unit are separated from each other on the bottom plate. 16. The test handler of claim 13 wherein the first calibration unit comprises: - at least one first moving element 'connected to the bottom plate, and wherein at least one first moving element is rotatable on the bottom plate And the first elastic member 'elastically connects the first moving element to the bottom plate. _ '17. The test transporter of claim 3, wherein the second correcting leather element comprises: 'a second moving element that is moved along the direction in which the second positioning element is mounted, and The disaccharide element moves the user tray in a direction in which the second positioning element is mounted; and the at least one second elastic member </ br> elastically supports the second moving element: ' a test transporter, wherein the second work unit is interlocked with the 38th work unit to move the test transporter of the first type: the = second correction unit moves the unit along a mutually perpendicular direction The test handler of the second 2arf=r, which is made to be fresh touched, connected to the bottom plate 'where the working unit is movable on the bottom plate; and -: the work order in which the first correction unit is The second correcting unit operates in accordance with the movement of the 'yuan'. 39
TW97143220A 2008-11-07 2008-11-07 An apparatus for correcting position of a user tray and a test handler TWI363734B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW97143220A TWI363734B (en) 2008-11-07 2008-11-07 An apparatus for correcting position of a user tray and a test handler

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW97143220A TWI363734B (en) 2008-11-07 2008-11-07 An apparatus for correcting position of a user tray and a test handler

Publications (2)

Publication Number Publication Date
TW201018636A TW201018636A (en) 2010-05-16
TWI363734B true TWI363734B (en) 2012-05-11

Family

ID=44831349

Family Applications (1)

Application Number Title Priority Date Filing Date
TW97143220A TWI363734B (en) 2008-11-07 2008-11-07 An apparatus for correcting position of a user tray and a test handler

Country Status (1)

Country Link
TW (1) TWI363734B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI791270B (en) * 2021-08-23 2023-02-01 鴻勁精密股份有限公司 Correction apparatus, correction method, and handler using the same
TWI777740B (en) * 2021-08-23 2022-09-11 鴻勁精密股份有限公司 Correction apparatus, correction method, and handler using the same

Also Published As

Publication number Publication date
TW201018636A (en) 2010-05-16

Similar Documents

Publication Publication Date Title
US7876089B2 (en) Test handler, method for loading and manufacturing packaged chips, and method for transferring test trays
TWI335062B (en) Handler for sorting packaged chips
TWI380395B (en) Test handler, method for unloading and manufacturing packaged chips and method for transferring test trays
US20050168214A1 (en) Sorting handler for burn-in tester
TW200910503A (en) Handler, test-tray-transferring method used in the handler and packaged-chip-manufacturing process using the handler
CN101191809B (en) Apparatus for rotating a test tray in a handler
TW200909327A (en) Handler and process for testing a semiconductor chips using the handler
JP7390934B2 (en) Inspection equipment
TW201000380A (en) Electronic component handling apparatus, electronic component test apparatus and electronic component holding tray
TW200817261A (en) Electronic component transfer method and electronic component handling device
TW200820366A (en) Handler
TWI363734B (en) An apparatus for correcting position of a user tray and a test handler
US6967475B2 (en) Device transfer mechanism for a test handler
TW201104781A (en) Apparatus for containing packaged chip, test tray including the same, and test handler using the same
TW200901355A (en) Test tray and handler using the test tray
TW201642377A (en) Substrate rotary loader
CN109459577A (en) A kind of display panel testing
TWI466207B (en) Apparatus for inspecting semiconductor chip and method thereof
CN209400553U (en) A kind of display panel testing
TW200925087A (en) Hi-fix board, test tray, test handler, and method for manufacturing packaged chips
TWI344189B (en) Method for transferring test trays in a handler
TW522232B (en) Sorting control method of tested electric device
JP2012192999A (en) Fruit sorting system
TW200828489A (en) Picker for use in a handler and method for enabling the picker to place packaged chips
TWI829874B (en) Article transfer apparatus

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees