WO2004021760A1 - Electronic cicuit part mounting machine and mounting position accuracy inspection method for the mounting machine - Google Patents

Electronic cicuit part mounting machine and mounting position accuracy inspection method for the mounting machine Download PDF

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Publication number
WO2004021760A1
WO2004021760A1 PCT/JP2003/010803 JP0310803W WO2004021760A1 WO 2004021760 A1 WO2004021760 A1 WO 2004021760A1 JP 0310803 W JP0310803 W JP 0310803W WO 2004021760 A1 WO2004021760 A1 WO 2004021760A1
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WO
WIPO (PCT)
Prior art keywords
inspection
mounting
test
mounting position
chip
Prior art date
Application number
PCT/JP2003/010803
Other languages
French (fr)
Japanese (ja)
Inventor
Tosuke Kawada
Original Assignee
Fuji Machine Mfg. Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Machine Mfg. Co., Ltd. filed Critical Fuji Machine Mfg. Co., Ltd.
Publication of WO2004021760A1 publication Critical patent/WO2004021760A1/en

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Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages
    • H05K13/081Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0815Controlling of component placement on the substrate during or after manufacturing
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0266Marks, test patterns or identification means
    • H05K1/0269Marks, test patterns or identification means for visual or optical inspection

Definitions

  • the present invention relates to an electronic circuit component mounting machine that holds an electronic circuit component (hereinafter, abbreviated as a component unless otherwise required) by a holding head and mounts the component on a circuit board.
  • the present invention relates to an inspection of the accuracy of the mounting position.
  • the electronic circuit component placement machine receives a component from the component supply device using a component supply device that supplies components, a board holding device that holds a circuit board, and a holding head, and mounts the component on the circuit board held by the circuit board holding device. It is configured to include a component mounting device.
  • a component mounting device In order to inspect the mounting position accuracy of the electronic circuit component mounting machine, that is, the accuracy of the mounting position of the component on the circuit board, it is described in, for example, JP-A-2001-1360000.
  • an inspection board provided with a plurality of mounting position reference marks is used. Usually, a plurality of mounting positions are set on the inspection board, and a plurality of mounting position reference marks are provided near each mounting position. The accuracy of the mounting position of the test chip on the test board is detected based on the relative positions of the mounted test chips with respect to the plurality of mounting position reference marks.
  • the surface of the test chip mounted on the test board is imaged by an imaging device, and the relative position of the image of the test chip obtained as a result with respect to the mounting position reference mark has been detected.
  • the side surface of the test chip is exactly perpendicular to the surface of the test substrate, this may be acceptable, but in practice, it does not always form a right angle.
  • the side surface of the inspection chip and the surface of the inspection substrate form an acute angle or an obtuse angle.
  • the outline of the front surface and the outline of the back surface of the inspection chip may be shifted from each other in a direction parallel to the surface of the inspection substrate. This is particularly likely when actual components are used as test chips. In such a case, it is desirable to detect the relative position of the surface image of the inspection chip with respect to the mounting position reference mark. Often not.
  • a position error of the test chip held by the holding head is often corrected.
  • the back surface of the test chip is imaged by the imaging device, and based on the image of the back surface, an error in the holding position of the test chip by the holding head is detected.
  • the error is corrected and mounted on the circuit board.
  • the outline of the front surface and the outline of the back surface of the inspection chip are displaced from each other, the position of the image on the back surface is accurate, but the mounting position accuracy based on the position of the image on the front surface is detected. In ⁇ , the accuracy is determined to be poor, or the accuracy is determined to be good despite the poor accuracy. Disclosure of the invention
  • the present invention has been made in view of the above circumstances as an object to improve the accuracy of mounting position accuracy inspection of an electronic circuit component mounting machine.
  • a mounting position accuracy inspection method, mounting position accuracy inspection device, and electronic circuit component mounting machine can be obtained. Similar to the claims, each mode is divided into sections, each section is numbered, and the number of another section is quoted as necessary. This is for the purpose of facilitating the understanding of the present invention and should be construed as limiting the technical features and combinations thereof described in this specification to those described in the following sections. is not.
  • the items need not always be adopted together. It is also possible to select and adopt only some of the items.
  • a mounting position accuracy detection method for an electronic circuit component mounting machine comprising: detecting a mounting position of the test chip on the test substrate at a position on a back surface of the test chip.
  • Detecting the mounting position of the test chip on the test board at the position on the back side of the test chip mounts the electronic circuit component mounting machine. In many cases, the position accuracy can be properly evaluated.
  • test chip is held by a holding head, an error of the holding position of the test chip by the holding head is obtained by imaging the test chip, and the obtained holding position error is corrected and applied to the test board.
  • Attachment The mounting position accuracy inspection method described in (1) or (2).
  • the holding head is to accurately position and hold the component, but if the position error of the test chip is acquired, corrected and mounted on the test board, the mounting position can be detected. Accuracy can be improved.
  • the holding position error is obtained by imaging the back surface of the inspection chip to obtain the corrected holding position error and mounted on the inspection substrate
  • the mounting position is detected by imaging the back surface of the mounted inspection chip according to the present invention.
  • the precision inspection of the electronic circuit component mounting machine can be performed particularly well.
  • the position of the back surface can be particularly accurately detected.
  • a plurality of mounting position reference marks are provided near the mounting position of the test chip on the test board, and the positions of the test chips are detected based on the mounting position reference marks (1) to (5).
  • Item 5 The mounting position accuracy inspection method according to any one of the above items. It is also possible to detect the position of the inspection chip based on the reference point on the imaging surface of the imaging device Noh. However, in this case, it is inevitable that the detection result is affected by a feed error of a relative movement device that relatively moves the imaging device and the inspection board in a direction parallel to the surface of the inspection board. On the other hand, if the position of the test chip is detected with reference to the mounting position reference mark, the influence of the feed error of the relative moving device can be eliminated. It is relatively easy to form a plurality of mounting position reference marks on the inspection board at accurate relative positions, and the mounting position can be accurately detected.
  • the planned mounting positions are set in a state where they are regularly arranged in two directions orthogonal to each other on the surface of the detection substrate, and the plurality of mounting position reference marks are provided for the plurality of planned mounting positions.
  • the mounting position may be set at one location, but setting multiple locations can increase the reliability of the inspection.
  • the setting is made in such a way as to be regularly arranged in two directions orthogonal to each other on the surface of the inspection board, it is possible to inspect the mounting position accuracy over the entire electronic circuit component mounting machine. it can. It is desirable that the inspection substrate has a small thermal expansion, such as a glass substrate.
  • the position of the substrate reference mark provided on the inspection substrate was detected to detect the position of the entire inspection substrate, and the position error of the inspection substrate was acquired based on the detected position.
  • the mounting position accuracy inspection method according to any one of (1) to (7), wherein the inspection chip is mounted while correcting a position error of the inspection substrate.
  • the position of the inspection board can be accurately defined, or when the mounting position accuracy is detected by comparing positional errors of the test chips at a plurality of planned mounting positions. If the position error of the inspection substrate is corrected based on the position of the substrate reference mark, the effect of improving the inspection accuracy or facilitating the inspection can be obtained.
  • the test substrate is made of a light-transmitting material, a test chip is mounted on the front surface of the test substrate, and the test chip is imaged from the back side of the test substrate to reduce the position of the rear surface of the test chip. Detecting The mounting position accuracy detecting method according to any one of (1) to (8).
  • the test substrate is made of a light transmitting material and the test chip is imaged from the back surface side of the test substrate, the relative position of the test chip with respect to the test substrate can be easily detected based on the position of the rear surface of the test chip.
  • the light transmitting material includes not only a transparent material but also a translucent material. Inspection ⁇ It is sufficient if the material has a light transmittance enough to image the test chip through the substrate.
  • a double-sided pressure-sensitive adhesive sheet is pasted on the test substrate, and the test chip is fixed to the test substrate by the double-sided pressure-sensitive adhesive sheet.
  • the mounting position accuracy test method according to any one of the above modes (1) to (9) .
  • the test chip When the test chip is mounted on the test board, the test chip can be simply placed on the test board or temporarily fixed with a temporary fixing agent such as an adhesive or creamy solder.
  • a temporary fixing agent such as an adhesive or creamy solder.
  • the double-sided adhesive sheet it is possible to prevent the inspection chip once mounted on the inspection substrate from being displaced satisfactorily, or the temporary fixing agent protrudes from the gap between the inspection chip and the inspection substrate. Thus, it is possible to prevent the detection of the exact position of the test chip from being hindered.
  • the double-sided adhesive sheet can be made larger than the back surface of the component tape, and the work of attaching the double-sided adhesive sheet to the inspection substrate becomes easy.
  • a double-sided pressure-sensitive adhesive sheet can be stuck all at once on the entire area where the inspection substrate mounting position is set. It is desirable that the double-sided pressure-sensitive adhesive sheet is also transparent. It is desirable that both the sheet and the adhesive applied to both sides of the sheet have as high a transparency as possible.However, a material having light transmittance enough to image the test chip through the test substrate and the double-sided pressure-sensitive adhesive sheet Should be fine.
  • test chip is mounted on the test board with the front side of the test board facing up, and then the test board is turned upside down to pass the test board from above through the rear face of the test chip.
  • the mounting position accuracy inspection method according to the above mode (10) or (11), wherein an image is taken.
  • a plurality of mounting position reference marks are provided near the mounting position of the test chip on the test board, and the inspection is performed at a mounting position relatively determined with respect to the plurality of mounting position reference marks.
  • the imaging device is positioned at a position directly facing each of the plurality of mounting position reference marks, and each mounting position reference mark is imaged to acquire the position of each mounting position reference mark.
  • the mounting position accuracy according to any one of paragraphs (9) to (12), wherein the imaging device is positioned at a position directly opposite to the mounting position determined based on the position of the mounting position reference mark, and the inspection chip is imaged. Inspection methods.
  • the aspect is also one embodiment of the present invention.
  • the inspection chip is positioned at the center of the screen, the plurality of mounting position reference marks will be located at the periphery of the screen, and the image will be taken from an oblique direction.
  • the detection accuracy of the position of the mounting position reference mark decreases due to the influence of the lens aberration.
  • each of the plurality of mounting position reference marks and the inspection chip can be imaged in a state where they are almost at the center of the screen.
  • the plurality of mounting position reference marks can be taken. The detection accuracy of the relative position between the inspection chip and the inspection chip can be improved.
  • the mounting position reference mark When the mounting position reference mark is acquired as a bright image, such as when the mounting position reference mark can be regarded as a mirror surface, if it is imaged by epi-illumination, the mounting position reference mark is acquired as an image with sufficient contrast And its position can be detected with high accuracy.
  • the mounting position reference mark can be regarded as a mirror surface, if the illumination is performed from a direction inclined with respect to the surface of the inspection board, the reflected light from the mounting position reference mark hardly enters the imaging device, and the mounting position reference mark The image becomes darker, while the image The diffusely reflected light enters the imaging device, and the image on the back surface of the inspection chip is obtained as a bright image.
  • detecting the position of the inspection chip it is possible to prevent the presence of the reflected light itself from the mounting position reference mark or the presence of the image of the mounting position reference mark from disturbing.
  • test board is held by the board holding device with the front side down, and the image is picked up from above (17). Inspection methods.
  • the same imaging device can be used for both imaging of the substrate reference mark and imaging of the back surface of the inspection chip, which can reduce the cost of the device and increase the accuracy of the mounting position inspection.
  • Item (18) is a device which holds the inspection substrate so that the focal point of the device is located on the surface of the inspection substrate both when imaging the substrate reference mark and when imaging the inspection chip. Inspection position accuracy inspection method.
  • the focus of the imaging device can be accurately adjusted both when imaging the substrate reference mark provided on the front side of the inspection substrate and when imaging the inspection chip from the back side of the inspection substrate.
  • the image can be adjusted to the target to be imaged, and good images can be obtained together.
  • the focus of the imaging device is located on the front surface of the inspection board when imaging the substrate reference mark, and is located on the back surface of the inspection chip when imaging the back surface of the inspection chip. It is desirable to do so.
  • the back side of the test chip is in close contact with the front side of the test board, they match, but when the test chip is fixed to the test board by the double-sided pressure-sensitive adhesive sheet, it differs by the thickness of the double-sided pressure-sensitive adhesive sheet .
  • the thickness of the double-sided adhesive sheet is ignored, and in the latter case, the focus of the imaging device may be located on the surface of the inspection substrate both when imaging the substrate reference mark and when imaging the inspection chip. Shall be assumed.
  • An inspection board which is a flat plate made of a light-transmitting material, on which a plurality of mounting positions are set on the surface and a plurality of mounting position reference marks are provided for each of the mounting positions;
  • An imaging device capable of imaging the back surface of the inspection chip mounted at the mounting position on the front surface of the inspection substrate and the plurality of mounting position reference marks from the back surface side of the inspection substrate;
  • a mounting position accuracy acquisition unit for causing the imaging device to image the mounting position reference mark and imaging the inspection chip, and acquiring the mounting position accuracy of the electronic circuit component mounting machine based on the imaging result;
  • a mounting position accuracy inspection device for electronic circuit component mounting machines including:
  • the mounting position accuracy detecting device described in this section is suitable for implementing the method invention of the above (1).
  • Each feature described in each of the above paragraphs (2) to (5) and (7) to (19) is also applicable to the mounting position accuracy inspection apparatus of this paragraph.
  • a component mounting device that receives an electronic circuit component from the component supply device by a holding head and mounts the electronic circuit component on a circuit board held by the circuit board holding device;
  • An electronic circuit component mounting machine comprising:
  • It has a flat shape, and a plurality of mounting positions are set. A plurality of mounting position reference marks are provided for each position, and a detection board held by the circuit board holding device;
  • An inspection chip mounting control unit for holding the inspection chip on the holding head, and mounting the inspection chip at each of the mounting expected positions;
  • the mounting position reference mark is placed on the imaging device through the inspection substrate from the back side of the inspection substrate.
  • a mounting position accuracy obtaining unit for obtaining an image of the back surface of the test chip mounted on the test board and obtaining a mounting position accuracy of the electronic circuit component mounting machine based on a result of the imaging.
  • FIG. 1 is a plan view showing an electronic circuit component mounting machine according to an embodiment of the present invention.
  • FIG. 2 is a side view showing the electronic circuit component mounting machine.
  • FIG. 3 is an enlarged side view (partial cross section) showing a main part of the electronic circuit component mounting machine.
  • FIG. 4 is a side view showing an epi-illumination device of the electronic circuit component mounting machine.
  • FIG. 5 is a block diagram showing a control device for controlling the electronic circuit component mounting machine.
  • FIG. 6 is (a) a plan view and (b) a front view showing an inspection board for performing a component mounting accuracy inspection.
  • FIG. 7 is a plan view showing a state where components are mounted on the inspection board.
  • FIG. 8 is a front view showing a state in which a circle mark on the inspection substrate is imaged.
  • FIG. 9 is a plan view showing a substrate jig for holding the inspection substrate.
  • FIG. 10 is a front view showing the substrate jig.
  • FIG. 11 is a front view showing a state in which the back surface of the component mounted on the inspection board is imaged.
  • FIG. 12 is a diagram showing an image obtained by capturing an image of an inspection board by epi-illumination.
  • FIG. 13 is a diagram showing an image obtained by capturing an image of an inspection board by illumination from an oblique direction.
  • FIG. 14 is a diagram for explaining image processing.
  • FIG. 15 is a graph showing the detection result of the mounting accuracy, which is a graph in the case where an image is taken from the back side of the test board and detected.
  • FIG. 16 is a graph showing a detection result of the mounting accuracy, which is a graph in a case where an image is detected from the component mounting surface side of the inspection board and detected.
  • the electronic circuit component mounting machine 10 is already known in, for example, Japanese Patent No. 2824378, and will be briefly described.
  • reference numeral 12 denotes a base as a machine main body of the electronic circuit component mounting machine 10.
  • a printed circuit board conveyor 16 for transporting a printed circuit board 14, which is a type of circuit board, in the X-axis direction (left and right in FIG. 1), and a board holding device for holding the printed circuit board 14 Parts are mounted on the component 18 and the component mounting device 22 for mounting electronic circuit components 20 (see FIG. 3; hereinafter, abbreviated as components 20) on the printed wiring board holding device 18 and the printed wiring board 14.
  • a component supply device 24 for supplying 20 is provided.
  • the printed wiring board 14 is placed horizontally on a pair of conveyor belts, and is conveyed while being guided by a pair of guide rails 26 and 28 by rotating the conveyor belt.
  • One guide rail 26 is a fixed guide rail provided to fix the position
  • the other guide rail 28 is a movable guide rail provided to be able to approach and separate from the fixed guide rail.
  • the guide rail 26 is referred to as a fixed guide rail 26
  • the guide rail 28 is referred to as a movable guide rail 28.
  • the movable guide rail 28 is provided with an access / separation device or It is moved in the Y-axis direction (the direction perpendicular to the transport direction) by the width changing device, and the distance between the fixed guide rail 26 and the printed wiring board 12 is adjusted.
  • the printed wiring board 14 is stopped at a predetermined work position, and is held by a printed wiring board holding device 18 provided at a portion corresponding to the work position of the base 12.
  • a component supply device 24 is provided stationary.
  • the component supply device 24 is a feeder-type component supply device.
  • the component supply device 24 includes a component supply table 3 in which a number of feeders 30 are arranged on a feeder support table 32, and component supply units are arranged in a line, for example, in a line parallel to the X-axis direction. With 4. Each feeder 30 holds the component 20 on a carrier tape and supplies the component 20 from the taped electronic circuit component.
  • the component mounting device 22 transports the component 20 by moving the component holding head 60 shown in FIG. 3 in a direction having components in the X-axis direction and the ⁇ -axis direction which are orthogonal to each other, and conveys the component 20. It is supposed to be mounted on the upper surface of the plate 14. Therefore, as shown in FIG.
  • the component mounting device 22 includes an X-axis slide 66 and an X-axis slide moving device 68 for moving the X-axis slide 66, and the X-axis slide 66. Is moved to any position in the direction parallel to the X axis.
  • the X-axis slide moving device 68 includes an X-axis slide drive motor 70 as a drive source, and the rotation of the X-axis slide drive motor 70 rotates the pole screw 64 to rotate the X-axis slide. 6 6 is moved.
  • the X-axis slide 66 has a length exceeding the wiring board conveyor 16 from the component supply device 24 as shown in FIG.
  • a ⁇ -axis slide 82 is provided on the X-axis slide 66 so as to be relatively movable in the ⁇ -axis direction.
  • the ⁇ -axis slide moving device 84 is capable of moving to an arbitrary position in the ⁇ -axis direction. I have.
  • the ⁇ -axis slide moving device 84 includes a ⁇ -axis slide driving motor 86 as a drive source, and the rotation of the motor 86 is transmitted to the ball screw 92 via gears 88, 90. ⁇ to move the axis slide 82.
  • the X-axis slide 66, the X-axis slide moving device 68, the ⁇ -axis slide 82, and the ⁇ -axis slide moving device 84 constitute a ⁇ ⁇ moving device 96, and the component holding head 60 Is moved by the ⁇ ⁇ moving device 96 to an arbitrary position in a horizontal plane which is a plane parallel to the ⁇ ⁇ coordinate plane. Can be done.
  • the support portion 102 provided on the Y-axis slide 82 has a head axial movement for raising and lowering the component holding head 60 and the component holding head 60.
  • the apparatus is provided with a head elevating device 104, a head rotating device 106 for rotating the component holding head 60 around its axis, and these component holding heads 60, etc.
  • the component mounting unit 108 is configured.
  • the component mounting unit 108 of the present embodiment has the same configuration as the component mounting unit described in Japanese Patent No. 3093339, and will be briefly described.
  • a shaft 110 is provided on the supporting portion 102 so as to be movable in a direction parallel to the axial direction and rotatable around the axis, and a suction nozzle 111 is provided by a holder 112 provided at a lower end thereof. 4 is detachably held.
  • the shaft 110 and the holder 111 constitute a component holding head 60.
  • the suction nozzles 1 14 suction the component 20 by negative pressure and mount it on the printed wiring board 14. Therefore, the suction nozzles 114 are connected to a negative pressure source (not shown), a positive pressure source (not shown), and the atmosphere, and are switched by an electromagnetic directional switching valve device (not shown). It is alternatively connected to the atmosphere.
  • the fiducial mark camera 152 (see FIG. 1), which is an image pickup device for imaging a plurality of fiducial marks 150 provided on the printed wiring board 14, is fixed to the ⁇ -axis slide 82.
  • the fiducial mark camera 152 is constituted by a CCD camera which is a type of a surface imaging device.
  • a ring-shaped illumination device 154 is provided around the fiducial mark camera 152 as shown in FIG. 4, and illuminates the fiducial mark 150 and its periphery.
  • an epi-illumination device 158 that illuminates the imaging target object with illumination light substantially parallel to the optical axis of the fiducial mark camera 152 is provided.
  • a half mirror 160 is provided below the reference mark camera 152 at an angle of 45 degrees with respect to the optical axis of the reference mark camera 152.
  • the half mirror 160 is irradiated with light from a horizontally arranged halogen lamp 162.
  • a concave mirror 16 6 is provided on the opposite side of the half mirror 16 0 of the halogen lamp 20, and light emitted from the halogen lamp 16 2 to the opposite side of the half mirror 16 0 is a half mirror. The light is reflected toward 160.
  • Halogen lamp 1 6 2 and concave mirror 1 6 6 cooperates to emit light that is substantially uniform from the entire surface of the concave mirror 16 6 facing the half mirror 16 0 and is substantially perpendicular to the optical axis of the reference mark camera 15 2. It is composed.
  • Non-reflective paper 1 74 is black paper with a particularly low surface reflectivity.
  • the fiducial mark camera 15 2, the illumination device 15 5 and the epi-illumination device 15 8 constitute an imaging system, and when imaging the printed wiring board 14 and the mounted components 20, etc. Either the illumination device 154 or the epi-illumination device 158 is selectively turned on to perform an imaging operation.
  • the X-axis slide 66 is located between the component supply device 24 and the printed wiring board 14 and at a position corresponding to the ball screw 64 that just moves the X-axis slide 66. 80 is immovably mounted.
  • the component imaging device 180 includes a component camera 182 for capturing an image of the component 20 and a light guiding device 18 4, and the light guiding device 18 4 serves as a reflecting device. It has reflecting mirrors 186 and 188.
  • the component camera 18 2 is a CCD camera, like the fiducial mark camera 15 2.
  • An illumination device 198 is provided just below the movement path of the suction nozzles 114 in the Y-axis direction and near the light guide device 184.
  • the lighting device 198 is equipped with a strobe 200 for irradiating ultraviolet rays and a luminous plate 200 for absorbing visible light and emitting visible light.
  • the component camera 18 2 projects the component 20 Capture an image.
  • the illuminating device 198 further includes another strobe 204 that emits visible light, and the reflected light from the bottom of the component 20 causes the component power lens 18 2 to form a front view of the component 20. Take an image.
  • the imaging device 180, the light guide device 184, and the lighting device 198 constitute an imaging system.
  • the electronic circuit component mounting machine 10 includes a control device 250 shown in FIG.
  • the control device 250 is mainly composed of a CPU 25 2, a ROM 25 4, a RAM 25 6, and a computer 260 having a bus connecting them.
  • the bus is further connected to an input / output interface 266, and a drive circuit 264 drives the X-axis slide drive motor 70, the Y-axis slide drive motor 86, and the head lifting / lowering device. 104, a head rotating device 106 and the like are connected.
  • the control device 250 is connected with an image processing computer 26 6, a reference mark camera 15 2, and a component camera 18 2.
  • the control device 250 is further connected to an input device 268 such as a keypad, and also connected to a display device 274 as a display device via a control circuit 272.
  • the motors as drive sources of the X-axis slide drive motor 70, the Y-axis slide drive motor 86, the head lifting / lowering device 104, and the head rotation device 106 are all provided. Each of them is also constituted by a servomotor, and its rotation angle is detected by the encoder 276 and inputted to the computer 260.
  • FIG. 5 representatively shows an encoder 276 provided on the X-axis slide drive motor 70.
  • the ROM 254 and the RAM 256 of the controller 250 store various programs such as a main routine, an electronic circuit component mounting routine, and data necessary for executing the programs. It is remembered.
  • the computer 260 is connected to a parts data generator (PDG) 278 which is a database storing various data of the parts 20 (abbreviated as part information).
  • PDG parts data generator
  • the mounting operation for mounting the component 20 on the printed wiring board 14 is described briefly in the aforementioned Japanese Patent No. 2824378, etc., and will be briefly described. Will be described.
  • the electronic circuit component mounting routine data of a component receiving position where the component holding head 60 should receive the component 20 from the feeder 30 and the component 20 are mounted on the printed wiring board 14.
  • the data of the component mounting position which is the power position, and the component information of each component 20 supplied from the part data generator (PDG) 278 are included.
  • the printed wiring board 14 is transported to a work position (or mounting space) where the component 20 is mounted by the wiring board conveyor 16, and is positioned and held by the printed wiring board holding device 18.
  • Component mounting unit 1 08 with XY moving device 96 In both cases, the fiducial mark camera 152 is positioned at the fiducial mark imaging position where the fiducial mark 150 provided on the printed wiring board 14 is imaged, and the two fiducial marks 150 are respectively imaged. As a result, the position error of the printed wiring board 14 is obtained by image processing of the obtained reference mark 150.
  • the component holding head 60 is moved by the XY moving device 96 to a component receiving position for receiving the component 20 from the feeder 30.
  • the component holding head 60 is moved up and down by the head elevating device 104, and negative pressure is supplied to the suction nozzles 114. As a result, the component 20 is sucked.
  • the component holding head 60 holding the component 20 is moved from the component receiving position to a component mounting position facing a component mounting point preset on the printed wiring board 14.
  • the X-axis slide 66 passes over the light guide device 184 fixed at a position between the component receiving position and the component mounting position. Regardless of whether the component receiving position and the component mounting position are on the component supply device 24 or the printed wiring board 14, the component holding head 60 must be moved from the component receiving position to the component mounting position without fail. It moves on the X-axis slide 66 in the Y-axis direction and passes through a portion between the component supply device 24 and the printed wiring board 14.
  • the component holding head 60 always passes over the light guide device 18 4 fixed to the portion of the X-axis slide 66 located between the component receiving position and the component mounting position, and A part 20 is imaged by the camera 18.
  • the position at which the component holding head 60 is located on the light guide device 184 and is imaged by the component camera 182 is referred to as a component holding position detection position or an imaging position.
  • the component holding head 60 is moved from the suction to the position of the component holding position detection position by the head rotating device 10 6 And the component 20 is rotated and changed to the rotational position at the time of mounting. Then, when the component holding head 60 reaches the component holding position detection position, the component 20 is imaged. Since the imaging device 180 and the strobes 200 and 204 are provided on the X-axis slide 66, the movement of the component holding head 60 is stopped in the Y-axis direction. The component 20 is imaged while being moved in the axial direction. The data of the captured image is stored in the image processing computer 266. The data is compared with the data of the normal image without the holding position error, and the holding position error, that is, the translational position error (often the center position error) and the rotational position error of the predetermined reference point are calculated.
  • the component holding head 60 Before the component holding head 60 moves to the component mounting position, the component holding head 60 is rotated by the head rotating device 106 to cancel the rotational position error, and The coordinates of the component mounting position are corrected so that the position error of the printed wiring board 14 and the translational position error of the component 20 (including the translational position error generated due to the cancellation of the rotational position error) are cancelled.
  • the component 20 is mounted at the correct mounting point on the printed wiring board 14 at the correct rotation position. This completes one cycle of mounting work. Next, the mounting position accuracy inspection work will be described. A dedicated inspection board is used for the inspection work.
  • the inspection substrate 300 is made of colorless and transparent glass and is formed in almost the same shape as the printed wiring board 14, and circle marks 3002 are formed on a large number of grid points on the component mounting surface on the front side. Are accurately formed in shape and position.
  • the component 20 is mounted in the same manner as the mounting operation described above. The front and back are reversed, and the back surface of the component 20 is imaged through the detection board 300, and the mounting position accuracy of the component 20 is detected. The details will be described below.
  • the inspection board 300 is transported to a mounting space by the wiring board conveyor 16 and positioned and held by the printed wiring board holding device 18.
  • the reference mark camera 152 captures a part of the circle mark 302 so that the position of the inspection board 300 is obtained. Since the inspection substrate 300 does not have a dedicated mark corresponding to the reference mark 150, two circular marks 3 02 at two corners located on two diagonal lines are provided. Each image is taken, the position of the mark center, which is the center of the image of each circle mark 302, is acquired, and the holding position of the inspection substrate 300 is acquired, considering the center of the four mark centers as a reference point. You.
  • the circle mark 302 is a mirror surface obtained by etching the surface of the inspection substrate 300 and applying a very thin metal plating. Therefore, as shown in FIG. 8, the reference mark camera 15 2 is positioned directly above the circle mark 302, and If the illumination device 158 illuminates from directly above, the portion of the circle mark 302 is totally reflected and an image brighter than the surrounding area can be captured.
  • the fiducial mark cameras 15 2 capture images of the four circle marks 302 from directly above by epi-illumination, and obtain the position of the reference point, which is the center of each circle mark, based on the positions of these reference points.
  • the position of the inspection board 300 is obtained. Note that a reference mark may be provided separately from the circle mark 302 in a margin of the inspection board 300 or the like.
  • the component 20 is mounted on the inspection board 300.
  • the inspection work is performed by mounting a component 20 which is a commercially available electronic circuit component.
  • the component holding head 60 receives the component 20 from the feeder 30 at the component supply position, and is moved toward the component mounting position by the XY moving device 96.
  • the back surface of the component 20 is imaged by the component camera 182.
  • the strobe light 204 that emits visible light is turned on, and a reflected image of the back surface of the component 20 is captured.
  • the component holding head 60 By the time the component holding head 60 reaches the component mounting position, image processing is executed to acquire the component holding position, and the holding position error of the inspection board 300 and the holding position error of the component 20 are eliminated.
  • the mounting position is corrected so that the component 20 is mounted on the inspection board 300.
  • a colorless and transparent double-sided adhesive tape (not shown) is previously attached to the entire component mounting surface of the inspection substrate 300, and the component 20 held by the suction nozzles 114 is attached to the inspection substrate 300. If placed on top, it will be fixed by the adhesive tape. In the following description, the thickness of the double-sided adhesive tape is assumed to be negligible.
  • the component 20 is preset at each position equidistant from four adjacent circle marks 302 of a large number of circle marks 302 of the inspection board 300, as shown in FIG.
  • the components 20 are mounted on the large number of mounting positions in the same manner as in the mounting operation described above.
  • the component 20 is mounted on the mounting area of the detection board 300, that is, the entire area where the circle mark 302 is provided.
  • FIG. 7 shows a state in which all of the components 20 are mounted at the rotational position where they are supplied from the feeder 30. However, even if they are mounted alternately at a rotation position rotated 90 degrees from the rotation position, 2003/010803
  • the mounting position can be set at various rotation positions, such as at a rotation position rotated 90 degrees, and a plurality of additional mounting positions of the inspection board 300 can be set at rotation positions further rotated 90 degrees. It is also possible to do so.
  • the operator turns the inspection board 300 over and sets it on the wiring board holding device 18, and the reference mark camera 15 2 passes the inspection board 300 through the inspection board 300.
  • the back surface of the component 20 is imaged, and the mounting position of the component 20 is detected.
  • the completion of the mounting work of the component 20 is notified to the operator, and the holding of the test board 300 by the wiring board holding device 18 is released.
  • the operator takes out the inspection board 300 based on the work completion information, turns the board upside down, and mounts the board on the board jig 304.
  • the substrate jig 304 has a generally flat plate shape, supports the inspection substrate 300 from below, and contacts or approaches both side surfaces of the inspection substrate 300. To define the horizontal position.
  • the board jig 304 supports the inspection board 300 with the component mounting surface of the inspection board 300 facing down, so that it does not interfere with the component 20 already mounted on the component mounting surface.
  • the portion opposing the area where the circle mark 302 is formed has a constant depth (for example, 5 mm) except for the support surface 303 that contacts and supports the edge of the lower surface of the inspection substrate 300. mm) Depressed.
  • the inspection board 300 is held by the wiring board holding device 18 via the board jig 304.
  • the board jig 304 has a height of the component mounting surface, that is, the back surface of the component 20, in a state where the inspection board 300 is held by the wiring board holding device 18 via the board jig 304. Is designed to hold the inspection board 300 at a height that matches the focus of the fiducial mark camera 152. Specifically, for example, assuming that the thickness of the inspection substrate 300 is t and the refractive index of the glass is 1.5, the focal length inside the glass increases by 1.5 times. As shown in Fig. 10, the inspection board 300 is mounted so that the component mounting surface is located at a position that is one-third the thickness t lower than the component mounting surface height h at the time of component mounting. It is made to hold.
  • the inspection board 300 has a height-adjusted component mounting surface when the component 20 is mounted. Since the upper surface of the substrate jig 304 is pressed against the fixed surface 308 and held, the component mounting surface of the inspection substrate 300 is raised when the upper surface of the substrate jig 430 is pressed and held against the surface 308. The thickness is set to be lower by one third of the thickness t of the inspection substrate 300 from the specified surface 308.
  • the width of the wiring board conveyor 16 is adjusted according to the board jig 304. That is, the movable guide rail 28 is moved in a direction away from the fixed guide rail 26 until the distance between the movable guide rail 28 and the fixed guide rail 26 matches the width of the board jig 304.
  • the circuit board holding device 18 (FIGS. 1 and 2) (not shown) is brought into a state in which the substrate jig 304 can be held. Thereafter, if the operator places the inspection board 300 on the wiring board holding device 18 via the inspection jig 304, the operator notifies the control device via the input device 268. It is transmitted to 250. Based on this information, the control device 250 sets the wiring board holding device 18 in a state in which the test jig 304 is fixedly held, and as a result, the test board 300 is detected and fixed. It is fixedly held through the tool 304.
  • the mounting position of the component 20 is detected by imaging the back surface of the component 20.
  • the positions of four surrounding circular marks 302 are acquired, and the mounting position is determined based on the relative positions of the circular marks 302 and the component 20. A shift is detected.
  • circle marks 302 around the component 20 are sequentially imaged.
  • the fiducial mark camera 15 2 is positioned at a position that should be located directly above the circle mark 30 2 to be imaged this time, and the epi-illumination device 15 8 8 is coaxial with the fiducial mark camera 15 2.
  • An example of an image obtained by being illuminated by the epi-illumination device 158 is shown in FIG. 12. ing. This is to make it easier to compare with FIG. 13 which is an image obtained by being illuminated from an oblique direction by the illumination device 154.
  • the circle mark 302 is usually located at the center of the image pickup. The image is taken to be located.
  • the circle mark 302 is almost totally reflected and a relatively bright image is formed, whereas the back surface of the part 210 disturbs the illumination light. Reflection results in a relatively dark image. Further, portions other than the circle mark 302 and the component 20 (referred to as background) are darker images. Therefore, if the image of the circle mark 302 is binarized by a threshold value set so that the image of the circle mark 302 is bright and the part 20 and the background are dark, only the image of the circle mark 302 is acquired as a bright image. And the position of the circle mark 302 can be easily detected.
  • the fiducial mark camera 15 2 is imaged while being directly opposed to each of the circle marks 302, and the planned position of the center of the circle mark 302 (in this embodiment, the fiducial mark The direction and distance from the center of the imaging surface of the camera 152 are detected as misregistration.
  • a plurality of seek lines 310 are preset in the vicinity of the position where the image of the circle mark 302 should exist, and The boundary position between the light part and the dark part is obtained for the seek line 310.
  • the boundary position is the position of the outline of the circle mark 302, and the center of a plurality of boundary positions on the seek line 310 is calculated as the mark center position which is the center of the circle mark 302.
  • the reference mark camera 152 is positioned at the center of the four mark center positions, that is, at a position equidistant from the four mark center positions.
  • the fiducial mark camera 152 is positioned just above the mounting position and imaging is performed. It is done.
  • the epi-illumination device 244 is turned off and the illumination device 154 is turned on, and the imaging is performed. By illuminating the back surface of the component 20 from an oblique direction, the component 20 is obtained as a relatively bright image, but the reflected light of the substantially circular mirror mark 302 is not reflected.
  • the circle mark 302 becomes relatively long as shown in FIG. Therefore, if the image is binarized by an appropriately set threshold value, only the image on the back surface of the component 20 is obtained as a bright image. Image processing is performed on this image data, and the horizontal displacement of the component 20 is obtained based on the displacement in the imaging plane. Further, the inclination of the inspection board 300 is also calculated based on the four mark center positions, and the rotational displacement of the component 20 in the rotation direction is also calculated based on the inclination of the inspection board 300 and the inclination of the component 20. Is obtained. That is all The work of inspecting the accuracy of the mounting position of the ital is completed.
  • the inclination of the inspection substrate 300 is such that after the inspection substrate 300 is held by the wiring board holding device 18 via the inspection jig 304, of the many circle marks 402, The positions of the circle marks 302 at the two corners or the four corners of the inspection board 300 may be detected, and the positions may be calculated based on the detection results.
  • Fig. 15 and Fig. 16 show the detection results (Fig. 15 (a), (b)) when the same test board 300 is imaged from the back side, and the image from the front side (component mounting surface) side.
  • the detection results (Figs. 16 (a) and (b)) are shown in comparison.
  • FIG. 15 (a) and FIG. 16 (a) the detection results of the horizontal displacement of the mounting position of the component 20 are shown for each mounting direction.
  • the bar graphs in FIG. 15 (b) and FIG. 16 (b) show 3 ⁇ , which is the variation in the mounting position, in the X-axis direction and the Y-axis direction.
  • the component holding position is acquired based on the reflection image of the back surface of the component 20, and after mounting, the back surface of the reproduced component 20 is imaged and the mounting position is detected. Therefore, mounting accuracy can be more properly evaluated when imaging from the back side than when imaging from the front side.
  • the operation of turning over the inspection board 300 may be performed on the inspection board 300 discharged from the electronic circuit component mounting machine 10. Specifically, for example, if all the components 20 are mounted on the inspection board 300, they are conveyed downstream from the wiring board conveyor 16 in the same manner as the printed wiring board 14, and once the electronic circuit component mounting machine is mounted. Emitted from 10 If the inspection board 300 is mounted on a board jig 304 by an operator and the width of the wiring board conveyor 16 is adjusted, the board is set upstream of the electronic circuit component mounting machine 10. It is positioned by being fed transportable to the attachment space by the wiring board Konpeya 1 6 again. The use of the substrate jig 304 is not essential.
  • the jig is ejected from the wiring board conveyer 16 from the electronic circuit component mounting machine 10 and then turned over by the upside down device. Then, the electronic circuit component mounting machine 10 can be transported again to the work position, and the mounting position inspection can be fully automated.
  • the component mounting machine is of the XY robot type.
  • the component mounting machine may have another mode. For example, a plurality of component holding heads may be held by an intermittent rotating body. It may be a so-called index table type component mounting machine that mounts components.

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  • Length Measuring Devices By Optical Means (AREA)

Abstract

An electronic circuit part mounting machine capable of accurately inspecting a part mounting accuracy, wherein a large number of parts (20) are mounted on the upward part mounting surface of an inspected substrate (300), the inspected substrate (300) is made of a transparent material, a pressure sensitive adhesive double coated tape made of a transparent material is stuck on the part mounting surface, and the parts are pressingly fixed to the adhesive double coated tape, circular marks (302) are formed on a large number of lattice points on the inspected substrate (300) and the parts (20) are mounted on the inspected substrate (300) at predicted mounting positions apart equal distances from four circular marks (302) adjacent to each other, the inspected substrate (300) is inversed upside down and held on a wiring board holding device (18) through an inspection jig (304), and the parts (20) and the circular marks (302) around the periphery thereof are imaged by a reference mark camera (152) from the rear side of the parts through the inspected substrate (300) and the pressure sensitive adhesive double coated tape to detect the mounting positions of the parts (20) based on the relative position of the parts (20) to the circular marks (302).

Description

明 細 書 電子回路部品装着機およびそれの装着位置精度検査方法 技術分野  Description Electronic circuit component mounting machine and its mounting position accuracy inspection method
本発明は、 保持ヘッドにより電子回路部品 (以下、 特に必要がない限り、 部品 と略称する) を保持して回路基板に装着する電子回路部品装着機に関するもので あり、 特に、 部品の回路基板への装着位置の精度検査に関するものである。 背景技術  BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electronic circuit component mounting machine that holds an electronic circuit component (hereinafter, abbreviated as a component unless otherwise required) by a holding head and mounts the component on a circuit board. The present invention relates to an inspection of the accuracy of the mounting position. Background art
電子回路部品装着機は、 部品を供給する部品供給装置と、 回路基板を保持する 基板保持装置と、 保持ヘッドにより部品供給装置から部品を受け取り、 回路基板 保持装置に保持された回路基板に装着する部品装着装置とを含むように構成され る。 こめ電子回路部品装着機の装着位置精度、 すなわち、 部品の回路基板への装 着位置の精度を検査するために、 例えば、 特開 2 0 0 1— 1 3 6 0 0 0号公報に 記載されているように、 複数の装着位置基準マークを設けた検査基板が用いられ ている。 通常、 検査基板には複数の装着位置が設定され、 各装着位置の近傍には 複数ずつの装着位置基準マークが設けられる。 検查基板への検査チップの装着位 置の精度は、 装着された検査チップの、 複数ずつの装着位置基準マークに対する 相対的な位置に基づいて検出される。  The electronic circuit component placement machine receives a component from the component supply device using a component supply device that supplies components, a board holding device that holds a circuit board, and a holding head, and mounts the component on the circuit board held by the circuit board holding device. It is configured to include a component mounting device. In order to inspect the mounting position accuracy of the electronic circuit component mounting machine, that is, the accuracy of the mounting position of the component on the circuit board, it is described in, for example, JP-A-2001-1360000. As described above, an inspection board provided with a plurality of mounting position reference marks is used. Usually, a plurality of mounting positions are set on the inspection board, and a plurality of mounting position reference marks are provided near each mounting position. The accuracy of the mounting position of the test chip on the test board is detected based on the relative positions of the mounted test chips with respect to the plurality of mounting position reference marks.
その際、 従来は、 検査基板に装着された検査チップの表面を撮像装置により撮 像し、 その結果得られた検查チップの像の装着位置基準マークに対する相対位置 が検出されていた。 検査チップの側面が、 検查基板の表面に対して正確に直角で ある場合には、 それで差し支えないのであるが、 実際には、 正確に直角を成すと は限らない。 検查チップの側面と検査基板の表面とが、 鋭角を成したり鈍角を成 したりするのである。その結果、検査チップの表面の外形線と裏面の外形線とが、 検查基板の表面に平行な方向に互いにずれる場合がある。 検査チップとして、 実 際の部品が使用される場合に特にその可能性が高い。 このような場合には、 検査 チップの表面像の装着位置基準マークに対する相対位置が検出されることは望ま しくない場合が多い。 At that time, conventionally, the surface of the test chip mounted on the test board is imaged by an imaging device, and the relative position of the image of the test chip obtained as a result with respect to the mounting position reference mark has been detected. If the side surface of the test chip is exactly perpendicular to the surface of the test substrate, this may be acceptable, but in practice, it does not always form a right angle. The side surface of the inspection chip and the surface of the inspection substrate form an acute angle or an obtuse angle. As a result, the outline of the front surface and the outline of the back surface of the inspection chip may be shifted from each other in a direction parallel to the surface of the inspection substrate. This is particularly likely when actual components are used as test chips. In such a case, it is desirable to detect the relative position of the surface image of the inspection chip with respect to the mounting position reference mark. Often not.
例えば、 検查チップが検査基板に装着される際には、 保持ヘッドに保持された 検査チップの位置誤差が補正されることが多い。 検査チップが保持へッドに保持 された状態で、 その検査チップの裏面が撮像装置により撮像され、 その裏面の像 に基づいて検査チップの保持ヘッドによる保持位置の誤差が検出され、 その保持 位置誤差が捕正されて回路基板に装着されるのである。 この場合に、 検査チップ の表面の外形線と裏面の外形線とが互いにずれていれば、 裏面の像の位置は正確 であるにもかかわらず、 表面の像の位置に基づく装着位置精度の検查では精度が 不良であると判定され、 あるいは精度が不良であるにもかかわらず、 良好である と判定されたりすることとなってしまう。 発明の開示  For example, when a test chip is mounted on a test substrate, a position error of the test chip held by the holding head is often corrected. With the test chip held by the holding head, the back surface of the test chip is imaged by the imaging device, and based on the image of the back surface, an error in the holding position of the test chip by the holding head is detected. The error is corrected and mounted on the circuit board. In this case, if the outline of the front surface and the outline of the back surface of the inspection chip are displaced from each other, the position of the image on the back surface is accurate, but the mounting position accuracy based on the position of the image on the front surface is detected. In 查, the accuracy is determined to be poor, or the accuracy is determined to be good despite the poor accuracy. Disclosure of the invention
本発明は、 以上の事情を背景とし、 電子回路部品装着機の装着位置精度検査の 精度を向上させることを課題としてなされたものであり、 本発明によって、 下記 各態様の電子回路部品装着機の装着位置精度検査方法, 装着位置精度検査装置お よび電子回路部品装着機が得られる。 各態様は請求項と同様に、 項に区分し、 各 項に番号を付し、必要に応じて他の項の番号を引用する形式で記載する。 これは、 あくまでも本発日 の理解を容易にするためであり、 本明細書に記載の技術的特徴 およびそれらの組合わせが以下の各項に記載のものに限定されると解釈されるべ きではない。 また、 一つの項に複数の事項が記載されている場合、 それら複数の 事項を常に一緒に採用しなければならないわけではない。 一部の事項のみを選択 して採用することも可能なのである.。  The present invention has been made in view of the above circumstances as an object to improve the accuracy of mounting position accuracy inspection of an electronic circuit component mounting machine. A mounting position accuracy inspection method, mounting position accuracy inspection device, and electronic circuit component mounting machine can be obtained. Similar to the claims, each mode is divided into sections, each section is numbered, and the number of another section is quoted as necessary. This is for the purpose of facilitating the understanding of the present invention and should be construed as limiting the technical features and combinations thereof described in this specification to those described in the following sections. is not. In addition, when two or more items are described in one section, the items need not always be adopted together. It is also possible to select and adopt only some of the items.
( 1 ) 電子回路部品装着機によって検査チップを検査基板に装着し、 その装着位 置を検出することによって、 電子回路部品装着機の装着位置精度を検査する方法 であって、  (1) A method of mounting a test chip on a test board using an electronic circuit component mounting machine and detecting the mounting position, thereby inspecting the mounting position accuracy of the electronic circuit component mounting machine.
前記検査チップの前記検査基板への装着位置を、 検査チップの裏面の位置で検 出することを特徴とする電子回路部品装着機の装着位置精度検查方法。  A mounting position accuracy detection method for an electronic circuit component mounting machine, comprising: detecting a mounting position of the test chip on the test substrate at a position on a back surface of the test chip.
検査チップの検査基板への装着位置を、検査チップの裏面の位置で検出すれば、 従来のように表面の位置で検出する場合に比較して、 電子回路部品装着機の装着 位置精度を正当に評価できる場合が多い。 Detecting the mounting position of the test chip on the test board at the position on the back side of the test chip, compared to the conventional case of detecting the position on the front surface, mounts the electronic circuit component mounting machine. In many cases, the position accuracy can be properly evaluated.
( 2 ) 前記検査チップとして市販の電子回路部品を使用する (1)項に記載の装着 位置精度検査方法。  (2) A commercially available electronic circuit component is used as the inspection chip. The mounting position accuracy inspection method according to (1).
電子回路部品装着機の装着位置精度を検査するために、 市販の部品を検査チッ プとして利用すれば、 専用の検査チップを準備する必要がなく、 検査コストを低 減し得る。 しかし、 市販の部品は、 表面の外形線と裏面の外形線とが、 検査基板 の表面に平行な方向に互いにずれる形状を有することが多い。 そのため、 本発明 を適用することの効果が特に大きい。  If a commercially available component is used as the inspection chip to inspect the mounting position accuracy of the electronic circuit component mounting machine, there is no need to prepare a dedicated inspection chip, and the inspection cost can be reduced. However, commercially available components often have a shape in which the front outline and the rear outline are shifted from each other in a direction parallel to the front surface of the inspection board. Therefore, the effect of applying the present invention is particularly large.
( 3 ) 前記検査チップを保持ヘッドに保持させ、 その検査チップを撮像すること によって検查チップの前記保持ヘッドによる保持位置の誤差を取得し、 取得した 保持位置誤差を補正して前記検査基板に装着する (1)項または (2)項に記載の装 着位置精度検査方法。  (3) The test chip is held by a holding head, an error of the holding position of the test chip by the holding head is obtained by imaging the test chip, and the obtained holding position error is corrected and applied to the test board. Attachment The mounting position accuracy inspection method described in (1) or (2).
保持へッドが部品を正確に位置決めして保持するものである場合には不可欠で はないが、 検查チップの位置誤差を取得し、 補正して検査基板に装着すれば、 装 着位置検出の精度を高めることができる。  It is not indispensable if the holding head is to accurately position and hold the component, but if the position error of the test chip is acquired, corrected and mounted on the test board, the mounting position can be detected. Accuracy can be improved.
( 4 ) 前記保持位置誤差取得のための前記検査チップの撮像を、 検査チップの裏 面について行う (3)項に記載の装着位置精度検査方法。  (4) The mounting position accuracy inspection method according to (3), wherein the imaging of the inspection chip for acquiring the holding position error is performed on a back surface of the inspection chip.
検查チップの裏面を撮像して保持位置誤差が取得され、 補正して検査基板に装 着される場合に、 本発明に従って、 装着された検査チップの裏面の撮像により装 着位置を検出すれば、 電子回路部品装着機の精度検査を特に良好に行うことがで さる。  According to the present invention, when the holding position error is obtained by imaging the back surface of the inspection chip to obtain the corrected holding position error and mounted on the inspection substrate, the mounting position is detected by imaging the back surface of the mounted inspection chip according to the present invention. In addition, the precision inspection of the electronic circuit component mounting machine can be performed particularly well.
( 5 ) 前記保持位置誤差取得のための前記検査チップの裏面の撮像を、 その裏面 を照明装置により照明しつつ行う (4)項に記載の装着位置精度検査方法。  (5) The mounting position accuracy inspection method according to (4), wherein the imaging of the back surface of the test chip for acquiring the holding position error is performed while illuminating the back surface with an illumination device.
検查チップの裏面を照明してその裏面を撮像すれば、 裏面の位置を特に正確に 検出することができる。  By illuminating the back surface of the inspection chip and imaging the back surface, the position of the back surface can be particularly accurately detected.
( 6 ) 前記検査基板における前記検査チップの装着予定位置の近傍に複数の装着 位置基準マークを設け、 それら装着位置基準マークを基準として検査チップの位 置を検出する (1)項ないし (5)項のいずれかに記載の装着位置精度検査方法。 撮像装置の撮像面の基準点を基準として検査チップの位置を検出することも可 能である。 しかし、 その場合には、 検出結果が、 撮像装置と検査基板とを検査基 板の表面に平行な方向に相対移動させる相対移動装置の送り誤差の影響を受ける ことを避け得ない。 それに対して、 装着位置基準マークを基準として検査チップ の位置を検出すれば、 相対移動装置の送り誤差の影響を排除することができる。 検査基板に複数の装着位置基準マークを正確な相対位置に形成することは比較的 容易であり、 装着位置を正確に検出することできるのである。 (6) A plurality of mounting position reference marks are provided near the mounting position of the test chip on the test board, and the positions of the test chips are detected based on the mounting position reference marks (1) to (5). Item 5. The mounting position accuracy inspection method according to any one of the above items. It is also possible to detect the position of the inspection chip based on the reference point on the imaging surface of the imaging device Noh. However, in this case, it is inevitable that the detection result is affected by a feed error of a relative movement device that relatively moves the imaging device and the inspection board in a direction parallel to the surface of the inspection board. On the other hand, if the position of the test chip is detected with reference to the mounting position reference mark, the influence of the feed error of the relative moving device can be eliminated. It is relatively easy to form a plurality of mounting position reference marks on the inspection board at accurate relative positions, and the mounting position can be accurately detected.
( 7 ) 前記装着予定位置を、 前記検查基板の表面上において互いに直交する 2方 向に規則的に並ぶ状態で設定し、 それら複数の装着予定位置に対して前記装着位 置基準マークを複数ずつ設ける (6)項に記載の装着位置精度検査方法。  (7) The planned mounting positions are set in a state where they are regularly arranged in two directions orthogonal to each other on the surface of the detection substrate, and the plurality of mounting position reference marks are provided for the plurality of planned mounting positions. The mounting position accuracy inspection method described in (6).
装着予定位置の設定は 1個所でもよいが、 複数設定する方が検査の信頼性を高 めることができる。 特に、 本項におけるように、 検查基板の表面上において互い に直交する 2方向に規則的に並ぶ状態で設定すれば、 電子回路部品装着機の全体 にわたつて装着位置精度を検査することができる。 検査基板は、 ガラス基板とす る等、 熱膨張の小さいものとすることが望ましい。  The mounting position may be set at one location, but setting multiple locations can increase the reliability of the inspection. In particular, as described in this section, if the setting is made in such a way as to be regularly arranged in two directions orthogonal to each other on the surface of the inspection board, it is possible to inspect the mounting position accuracy over the entire electronic circuit component mounting machine. it can. It is desirable that the inspection substrate has a small thermal expansion, such as a glass substrate.
( 8 ) 装着時には、 検查基板全体の位置を検出するために検查基板に設けた基板 基準マークの位置を検出し、 その検出した位置に基づいて検査基板の位置誤差を 取得し、 取得した検查基板の位置誤差を補正しつつ前記検査チップを装着する (1)項ないし (7)項のいずれかに記載の装着位置精度検査方法。  (8) At the time of mounting, the position of the substrate reference mark provided on the inspection substrate was detected to detect the position of the entire inspection substrate, and the position error of the inspection substrate was acquired based on the detected position. The mounting position accuracy inspection method according to any one of (1) to (7), wherein the inspection chip is mounted while correcting a position error of the inspection substrate.
例えば、 検查基板の位置を正確に規定し得る場合や、 複数の装着予定位置にお ける検査チップの位置誤差同士の比較により装着位置精度が検查される場合等に は不可欠ではないが、 基板基準マークの位置に基づく検査基板の位置誤差の捕正 を行えば、 検查精度が向上し、 あるいは、 検査が容易となる効果が得られる。 For example, it is not indispensable when the position of the inspection board can be accurately defined, or when the mounting position accuracy is detected by comparing positional errors of the test chips at a plurality of planned mounting positions. If the position error of the inspection substrate is corrected based on the position of the substrate reference mark, the effect of improving the inspection accuracy or facilitating the inspection can be obtained.
( 9 ) 前記検査基板を光透過材料製とし、 その検査基板の表面に検査チップを装 着し、 その検査チップを検查基板の裏面側から撮像することにより、 検査チップ の裏面の位釁を検出する (1)項ないし (8)項のいずれかに記載の装着位置精度検 查方法。 (9) The test substrate is made of a light-transmitting material, a test chip is mounted on the front surface of the test substrate, and the test chip is imaged from the back side of the test substrate to reduce the position of the rear surface of the test chip. Detecting The mounting position accuracy detecting method according to any one of (1) to (8).
検査基板を光透過材料製とし、 その検查基板の裏面側から検査チップを撮像す れば、 検査チップの検查基板に対する相対位置を検査チップの裏面の位置で検出 することが容易となる。 光透過材料は、 透明材料は勿論、 半透明材料も含む。 検 查基板を通して検査チップを撮像し得る程度の光透過性を有する材料であればよ いのである。 If the test substrate is made of a light transmitting material and the test chip is imaged from the back surface side of the test substrate, the relative position of the test chip with respect to the test substrate can be easily detected based on the position of the rear surface of the test chip. The light transmitting material includes not only a transparent material but also a translucent material. Inspection 材料 It is sufficient if the material has a light transmittance enough to image the test chip through the substrate.
( 1 0 ) 前記検査基板に両面粘着シートを貼っておき、 その両面粘着シートによ り前記検査チップを検査基板に固定する (1)項ないし (9)項に記載の装着位置精 度検査方法。  (10) A double-sided pressure-sensitive adhesive sheet is pasted on the test substrate, and the test chip is fixed to the test substrate by the double-sided pressure-sensitive adhesive sheet. The mounting position accuracy test method according to any one of the above modes (1) to (9) .
検査基板に検查チップを装着する際、 検查チップを単に検査基板上に载置した り、 接着剤, クリーム状半田等の仮止め剤で仮り止めしたりすることも可能であ る。 しかし、 両面粘着シートを利用すれば、 一旦検査基板に装着された検查チッ プがずれることを良好に回避することができ、 あるいは、 仮止め剤が検查チップ と検査基板との隙間からはみ出して、 検査チップの正確な位置の検出が妨げられ ることを回避し得る。  When the test chip is mounted on the test board, the test chip can be simply placed on the test board or temporarily fixed with a temporary fixing agent such as an adhesive or creamy solder. However, if the double-sided adhesive sheet is used, it is possible to prevent the inspection chip once mounted on the inspection substrate from being displaced satisfactorily, or the temporary fixing agent protrudes from the gap between the inspection chip and the inspection substrate. Thus, it is possible to prevent the detection of the exact position of the test chip from being hindered.
( 1 1 ) 前記両面粘着シートとして光透過性を有するものを使用する(10)項に記 載の装着位置精度検査方法。  (11) The mounting position accuracy inspection method according to the item (10), wherein a light transmissive sheet is used as the double-sided pressure-sensitive adhesive sheet.
部品の裏面より小さい両面粘着シートを使用する場合には、 両面粘着シートを 光透過性を有するものとする必要はない。 しかし、 光透過性を有するものとすれ ば、両面粘着シートを部品テープの裏面より大きなものとすることが可能となり、 両面粘着シートを検査基板に貼る作業が容易となる。 例えば、 両面粘着シートを 検查基板の装着予定位置が設定されている領域全体に一挙に貼り付けることもで きるのである。 両面粘着シートも透明であることが望ましい。 シートもその両面 に塗布される粘着剤も共にできる限り透明度の高いものであることが望ましいの であるが、 検査基板および両面粘着シートを通して検查チップを撮像し得る程度 の光透過性を有する材料であればよい。  If a double-sided PSA sheet smaller than the back side of the part is used, it is not necessary to make the double-sided PSA sheet light-transmitting. However, if it has a light transmitting property, the double-sided adhesive sheet can be made larger than the back surface of the component tape, and the work of attaching the double-sided adhesive sheet to the inspection substrate becomes easy. For example, a double-sided pressure-sensitive adhesive sheet can be stuck all at once on the entire area where the inspection substrate mounting position is set. It is desirable that the double-sided pressure-sensitive adhesive sheet is also transparent. It is desirable that both the sheet and the adhesive applied to both sides of the sheet have as high a transparency as possible.However, a material having light transmittance enough to image the test chip through the test substrate and the double-sided pressure-sensitive adhesive sheet Should be fine.
( 1 2 ) 前記検査基板に対する前記検查チップの装着を検査基板の表面を上にし た状態で行い、 その後、 検査基板を表裏反転させることにより、 上方から検査基 板を通して前記検查チップの裏面を撮像する(10)項または(11)項に記載の装着位 置精度検査方法。  (12) The test chip is mounted on the test board with the front side of the test board facing up, and then the test board is turned upside down to pass the test board from above through the rear face of the test chip. The mounting position accuracy inspection method according to the above mode (10) or (11), wherein an image is taken.
検查基板への検査チップの装着は、 検査基板の表面を上にして行うのが便利で あり、 検査チップの裏面の撮像も上方から行うことが便利な場合が多い。 後述の (18)項の態様がその一例である。 ( 1 3 ) 前記検査基板における前記検査チップの装着予定位置の近傍に複数の装 着位置基準マークを設け、 それら複数の装着位置基準マークに対して相対的に定 められた装着位置に前記検査チップを装着し、 その後、 前記複数の装着位置基準 マークの各々に正対する位置に撮像装置を位置決めして各装着位置基準マークを 撮像することにより各装着位置基準マークの位置を取得し、 それら複数の装着位 置基準マークの位置に基づいて決まる装着位置に正対する位置に撮像装置を位置 決めして前記検査チップを撮像する (9)項ないし(12)項のいずれかに記載の装着 位置精度検査方法。 It is convenient to mount the test chip on the test board with the front side of the test board facing up, and it is often convenient to image the back surface of the test chip from above. An embodiment described in the section (18) described below is one example. (13) A plurality of mounting position reference marks are provided near the mounting position of the test chip on the test board, and the inspection is performed at a mounting position relatively determined with respect to the plurality of mounting position reference marks. After mounting the chip, the imaging device is positioned at a position directly facing each of the plurality of mounting position reference marks, and each mounting position reference mark is imaged to acquire the position of each mounting position reference mark. The mounting position accuracy according to any one of paragraphs (9) to (12), wherein the imaging device is positioned at a position directly opposite to the mounting position determined based on the position of the mounting position reference mark, and the inspection chip is imaged. Inspection methods.
複数の装着基準マークと検査チップとを撮像装置により同時に撮像し、 画面上 におけるそれらの相対位置に基づいて複数の装着位置基準マークと検査チップと の相対位置を検出することも可能であり、その態様も本発明の一実施形態である。 しかし、 その場合に、 検查チップが画面上の中央に位置するようにすれば、 複数 の装着位置基準マークは画面の周辺部に位置することとなり、 斜めの方向から撮 像されることになるとともに、 レンズの収差の影響を受け、 装着位置基準マーク の位置の検出精度が低下することを避け得ない。 それに対して、 本項の方法を採 用すれば、 複数の装着位置基準マークの各々と検査チップとをいずれも画面のほ ぼ中央に位置する状態で撮像し得るため、 複数の装着位置基準マークと検査チッ プとの相対位置の検出精度を高めることができる。  It is also possible to simultaneously image a plurality of mounting reference marks and an inspection chip with an imaging device and detect the relative positions of the plurality of mounting position reference marks and the inspection chips based on their relative positions on the screen. The aspect is also one embodiment of the present invention. However, in this case, if the inspection chip is positioned at the center of the screen, the plurality of mounting position reference marks will be located at the periphery of the screen, and the image will be taken from an oblique direction. At the same time, it is unavoidable that the detection accuracy of the position of the mounting position reference mark decreases due to the influence of the lens aberration. On the other hand, if the method of this section is adopted, since each of the plurality of mounting position reference marks and the inspection chip can be imaged in a state where they are almost at the center of the screen, the plurality of mounting position reference marks can be taken. The detection accuracy of the relative position between the inspection chip and the inspection chip can be improved.
( 1 4 ) 前記各装着位置基準マークの撮像時には落射照明により各装着位置基準 マークを照明する(13)項に記載の装着位置精度検査方法。  (14) The mounting position accuracy inspection method according to the above mode (13), wherein each mounting position reference mark is illuminated by epi-illumination when the mounting position reference mark is imaged.
装着位置基準マークが鏡面とみなし得る場合等、 装着位置基準マークが明るい 像として取得される場合に、 それを落射照明により撮像すれば、 装着位置基準マ ークを十分なコントラストを有する像として取得でき、 それの位置を精度良く検 出することができる。  When the mounting position reference mark is acquired as a bright image, such as when the mounting position reference mark can be regarded as a mirror surface, if it is imaged by epi-illumination, the mounting position reference mark is acquired as an image with sufficient contrast And its position can be detected with high accuracy.
( 1 5 ) 前記検査チップの撮像には前記検査基板の表面に対して傾斜した方向か ら検查チップを照明する(14)項に記載の装着位置精度検査方法。  (15) The mounting position accuracy inspection method according to the above mode (14), wherein the imaging of the inspection chip is performed by illuminating the inspection chip from a direction inclined with respect to the surface of the inspection substrate.
装着位置基準マークが鏡面とみなし得る場合に、 検査基板の表面に対して傾斜 した方向から照明すれば、 装着位置基準マークによる反射光は殆ど撮像装置には 入光せず、 装着位置基準マークの像は暗くなるのに対し、 検査チップの裏面によ り乱反射された光は撮像装置に入光し、 検査チップの裏面の像が明るい像として 取得される。 検査チップの位置を検出する際に、 装着位置基準マークからの反射 光自体の存在、 あるいは装着位置基準マークの像の存在が邪魔になることを回避 できるのである。 When the mounting position reference mark can be regarded as a mirror surface, if the illumination is performed from a direction inclined with respect to the surface of the inspection board, the reflected light from the mounting position reference mark hardly enters the imaging device, and the mounting position reference mark The image becomes darker, while the image The diffusely reflected light enters the imaging device, and the image on the back surface of the inspection chip is obtained as a bright image. When detecting the position of the inspection chip, it is possible to prevent the presence of the reflected light itself from the mounting position reference mark or the presence of the image of the mounting position reference mark from disturbing.
( 1 6 ) 前記検査基板の表面に前記検查チップを装着する際に、 検查基板をその 検査基板の表面が上になる状態で基板保持装置に保持させる (9)項ないし(15)項 のいずれかに記載の装着位置精度検査方法。 3 (16) When mounting the inspection chip on the surface of the inspection board, the inspection board is held by the substrate holding device with the surface of the inspection board facing up. (9) to (15) The mounting position accuracy inspection method according to any one of the above. Three
( 1 7 ) 前記検査チップを裏面側から撮像する際に、 前記検査基板を前記基板保 持装置に前記表面が下になる状態で保持させて上方から撮像する(16)項に記載 装着位置精度検査方法。 (17) When the test chip is imaged from the back side, the test board is held by the board holding device with the front side down, and the image is picked up from above (17). Inspection methods.
( 1 8 ) 前記検査基板の表面に前記検査チップを装着する際に、 前記検査基板に 設けた少なくとも 1つの基板基準マークを撮像装置により上方から撮像して検査 基板の位置誤差を取得し、 その位置誤差を補正して前記検査チップを検查基板に 装着し、 その検查基板を表裏反転させた状態で前記基板保持装置に保持させ、 前 記撮像装置により前記検査チップの裏面を前記検査基板を通して撮像することに より検査チップの位置を検出する(17)項に記載の装着位置精度検査方法。  (18) When mounting the test chip on the surface of the test board, at least one board reference mark provided on the test board is imaged from above by an image pickup device to acquire a position error of the test board, The position error is corrected, the test chip is mounted on the test board, and the test board is held by the board holding device in a state where the test board is turned upside down. The mounting position accuracy inspection method according to the above mode (17), wherein the position of the inspection chip is detected by imaging through the camera.
同じ撮像装置を、 基板基準マ クの撮像と検査チップの裏面の撮像との両方に 使用することができ、 装置コストを低減し得るとともに装着位置検査の精度を高 めることが容易となる。  The same imaging device can be used for both imaging of the substrate reference mark and imaging of the back surface of the inspection chip, which can reduce the cost of the device and increase the accuracy of the mounting position inspection.
( 1 9 )前記検査基板を表裏反転させた状態で前記基板保持装置に保持させる際、 検查基板と基板保持部材との間に保持治具を介在させ、 その保持治具として、 前 記撮像装置の焦点が、 前記基板基準マークの撮像時にも前記検查チップの撮像時 にも前記検査基板の表面上に位置する状態に前記検查基板を保持するものを使用 する(18)項に記載の装着位置精度検査方法。  (19) When the inspection substrate is held by the substrate holding device in a state where the inspection substrate is turned upside down, a holding jig is interposed between the inspection substrate and the substrate holding member, and the imaging jig is used as the holding jig. Item (18) is a device which holds the inspection substrate so that the focal point of the device is located on the surface of the inspection substrate both when imaging the substrate reference mark and when imaging the inspection chip. Inspection position accuracy inspection method.
保持治具の使用により、 検查基板の表面側に設けられている基板基準マークの 撮像時と、 検査基板の裏面側からの検査チップの撮像時との両方において、 撮像 装置の焦点を正確に撮像目標物に合わせることができ、 共に良好な像を得ること ができる。 撮像装置の焦点は、 厳密には、 基板基準マ クの撮像時には検査基板 の表面上に位置し、 検査チップの裏面の撮像時には検查チップの裏面上に位置す るようにすることが望ましい。 検査チップの裏面が検査基板の表面に密着してい る場合には両者は一致するが、 検査チップが両面粘着シートにより検査基板に固 定される場合には、 両面粘着シートの厚さ分だけ異なる。 しかし、 ここでは両面 粘着シートの厚さは無視して、 後者の場合でも、 撮像装置の焦点が基板基準マー クの撮像時にも検查チップの撮像時にも検査基板の表面上に位置すればよいもの とする。 By using the holding jig, the focus of the imaging device can be accurately adjusted both when imaging the substrate reference mark provided on the front side of the inspection substrate and when imaging the inspection chip from the back side of the inspection substrate. The image can be adjusted to the target to be imaged, and good images can be obtained together. Strictly speaking, the focus of the imaging device is located on the front surface of the inspection board when imaging the substrate reference mark, and is located on the back surface of the inspection chip when imaging the back surface of the inspection chip. It is desirable to do so. When the back side of the test chip is in close contact with the front side of the test board, they match, but when the test chip is fixed to the test board by the double-sided pressure-sensitive adhesive sheet, it differs by the thickness of the double-sided pressure-sensitive adhesive sheet . However, here, the thickness of the double-sided adhesive sheet is ignored, and in the latter case, the focus of the imaging device may be located on the surface of the inspection substrate both when imaging the substrate reference mark and when imaging the inspection chip. Shall be assumed.
( 2 0 ) 電子回路部品装着機によって検査チップを検査基板に装着し、 その装着 位置を検出することによって、 電子回路部品装着機の装着位置精度を検査するた めの装置であって、  (20) An apparatus for testing the mounting position accuracy of an electronic circuit component mounting machine by mounting a test chip on a test board by an electronic circuit component mounting machine and detecting the mounting position,
光透過材料製の平板であって、 表面に複数の装着予定位置が設定されるととも に、 それら装着予定位置毎に複数ずつの装着位置基準マークが設けられた検査基 板と、  An inspection board, which is a flat plate made of a light-transmitting material, on which a plurality of mounting positions are set on the surface and a plurality of mounting position reference marks are provided for each of the mounting positions;
その検査基板の表面の前記装着予定位置に装着された検查チップの裏面と前記 複数ずつの装着位置基準マークとを、 前記検査基板の裏面側から撮像可能な撮像 装置と、  An imaging device capable of imaging the back surface of the inspection chip mounted at the mounting position on the front surface of the inspection substrate and the plurality of mounting position reference marks from the back surface side of the inspection substrate;
その撮像装置に前記装着位置基準マークを撮像させるととともに、 前記検査チ ップを撮像させ、 その撮像の結果に基づいて前記電子回路部品装着機の装着位置 精度を取得する装着位置精度取得部と  A mounting position accuracy acquisition unit for causing the imaging device to image the mounting position reference mark and imaging the inspection chip, and acquiring the mounting position accuracy of the electronic circuit component mounting machine based on the imaging result;
を含む電子回路部品装着機の装着位置精度検査装置。 A mounting position accuracy inspection device for electronic circuit component mounting machines, including:
本項に記載の装着位置精度検查装置は、 前記 (1)項の方法発明の実施に好適な ものである。 前記 (2)項ないし (5)項, (7)項ないし(19)項の各々に記載された 各特徴は、 本項の装着位置精度検査装置にも適用可能である。  The mounting position accuracy detecting device described in this section is suitable for implementing the method invention of the above (1). Each feature described in each of the above paragraphs (2) to (5) and (7) to (19) is also applicable to the mounting position accuracy inspection apparatus of this paragraph.
( 2 1 ) 電子回路部品を供給する部品供給装置と、  (2 1) a component supply device for supplying electronic circuit components;
回路基板を保持する基板保持装置と、  A board holding device for holding a circuit board,
保持ヘッドにより前記部品供給装置から電子回路部品を受け取り、 前記回路基 板保持装置に保持された回路基板に装着する部品装着装置と、  A component mounting device that receives an electronic circuit component from the component supply device by a holding head and mounts the electronic circuit component on a circuit board held by the circuit board holding device;
前記回路基板に設けられた基板基準マークを撮像する撮像装置と  An imaging device for imaging a substrate fiducial mark provided on the circuit board;
を含む電子回路部品装着機であって、  An electronic circuit component mounting machine comprising:
平板状をなし、 複数の装着予定位置が設定されるとともに、 それら装着予定位 置毎に複数ずつの装着位置基準マークが設けられ、 前記回路基板保持装置に保持 される検查基板と、 It has a flat shape, and a plurality of mounting positions are set. A plurality of mounting position reference marks are provided for each position, and a detection board held by the circuit board holding device;
前記保持へッドに検査チップを保持させ、 前記装着予定位置の各々に装着させ る検査チップ装着制御部と、  An inspection chip mounting control unit for holding the inspection chip on the holding head, and mounting the inspection chip at each of the mounting expected positions;
その検查チップが装着された検査基板が表裏反転して前記回路基板保持装置に 保持された状態で、 その検查基板の裏面側からその検査基板を通して前記撮像装 置に前記装着位置基準マークを撮像させるととともに、 その検査基板に装着され た前記検査チップの裏面を撮像させ、 その撮像の結果に基づいて当該電子回路部 品装着機の装着位置精度を取得する装着位置精度取得部と  In a state where the inspection board on which the inspection chip is mounted is turned upside down and held by the circuit board holding device, the mounting position reference mark is placed on the imaging device through the inspection substrate from the back side of the inspection substrate. A mounting position accuracy obtaining unit for obtaining an image of the back surface of the test chip mounted on the test board and obtaining a mounting position accuracy of the electronic circuit component mounting machine based on a result of the imaging.
を含む電子回路部品装着機。 Electronic circuit component mounting machine.
本項の電子回路部品装着機においては、 回路基板に設けられた基板基準マーク を撮像するための撮像装置が、 検査基板の装着位置基準マークおよび検查チップ 裏面の撮像にも利用されるため、 その分、 装置の構成が単純で済み、 装置コスト を低減させることができる。前記 (2)項ないし (5)項, (7)項ないし(11)項, (13) 項ないし(15)項, (19)項の各々に記載された各特徴は、 本項の電子回路部品装着 機にも適用可能である。 図面の簡単な説明  In the electronic circuit component mounting machine of this section, since the imaging device for imaging the substrate reference mark provided on the circuit board is also used for imaging the mounting position reference mark of the inspection substrate and the back surface of the inspection chip, To that extent, the configuration of the device is simple, and the cost of the device can be reduced. The features described in each of the above paragraphs (2) to (5), (7) to (11), (13) to (15), and (19) are described in the electronic circuit of this section. It is also applicable to component mounting machines. BRIEF DESCRIPTION OF THE FIGURES
図 1は、 本発明の一実施形態である電子回路部品装着機を示す平面図である。 図 2は、 上記電子回路部品装着機を示す側面図である。  FIG. 1 is a plan view showing an electronic circuit component mounting machine according to an embodiment of the present invention. FIG. 2 is a side view showing the electronic circuit component mounting machine.
図 3は、 上記電子回路部品装着機の要部を拡大して示す側面図 (一部断面) で ある。  FIG. 3 is an enlarged side view (partial cross section) showing a main part of the electronic circuit component mounting machine.
図 4は、 上記電子回路部品装着機の落射照明装置を示す側面図である。  FIG. 4 is a side view showing an epi-illumination device of the electronic circuit component mounting machine.
図 5は、上記電子回路部品装着機を制御する制御装置を示すプロック図である。 図 6は、 部品装着精度検査を実施するための検査基板を示す(a)平面図および (b)正面図である。  FIG. 5 is a block diagram showing a control device for controlling the electronic circuit component mounting machine. FIG. 6 is (a) a plan view and (b) a front view showing an inspection board for performing a component mounting accuracy inspection.
図 7は、 上記検査基板に部品を装着した様子を示す平面図である。  FIG. 7 is a plan view showing a state where components are mounted on the inspection board.
図 8は、 上記検查基板の円マークを撮像する様子を示す正面図である。  FIG. 8 is a front view showing a state in which a circle mark on the inspection substrate is imaged.
図 9は、 上記検査基板を保持する基板治具を示す平面図である。 図 1 0は、 上記基板治具を示す正面図である。 FIG. 9 is a plan view showing a substrate jig for holding the inspection substrate. FIG. 10 is a front view showing the substrate jig.
図 1 1は、 上記検査基板に装着された部品の裏面を撮像する様子を示す正面図 である。  FIG. 11 is a front view showing a state in which the back surface of the component mounted on the inspection board is imaged.
図 1 2は、 落射照明により検査基板を撮像した画像を示す図である。  FIG. 12 is a diagram showing an image obtained by capturing an image of an inspection board by epi-illumination.
図 1 3は、斜め方向からの照明により検査基板を撮像した画像を示す図である。 図 1 4は、 画像処理を説明するための図である。  FIG. 13 is a diagram showing an image obtained by capturing an image of an inspection board by illumination from an oblique direction. FIG. 14 is a diagram for explaining image processing.
図 1 5は、 装着精度の検出結果を示すグラフであって、 検査基板の裏面側から 撮像して検出した場合のグラフである。  FIG. 15 is a graph showing the detection result of the mounting accuracy, which is a graph in the case where an image is taken from the back side of the test board and detected.
図 1 6は、 装着精度の検出結果を示すグラフであって、 検査基板の部品装着面 側から撮像して検出した場合のグラフである。 発明を実施するための最良の形態  FIG. 16 is a graph showing a detection result of the mounting accuracy, which is a graph in a case where an image is detected from the component mounting surface side of the inspection board and detected. BEST MODE FOR CARRYING OUT THE INVENTION
本発明の一実施形態である電子回路部品装着機 1 0を図 1ないし図 5に示す。 この電子回路部品装着機 1 0は、 例えば、 特許第 2 8 2 4 3 7 8号公報等におい て既に知られており、 簡単に説明する。  An electronic circuit component mounting machine 10 according to one embodiment of the present invention is shown in FIGS. The electronic circuit component mounting machine 10 is already known in, for example, Japanese Patent No. 2824378, and will be briefly described.
図 1において 1 2は電子回路部品装着機 1 0の機械本体としてのベースであ る。ベース 1 2上には、回路基板の一種であるプリント配線板 1 4を X軸方向(図 1においては左右方向) に搬送する配線板コンペャ 1 6 , プリント配線板 1 4を 保持する基板保持装置たるプリント配線板保持装置 1 8, プリント配線板 1 4に 電子回路部品 2 0 (図 3参照。 以下、 部品 2 0と略称する) を装着する部品装着 装置 2 2および部品装着装置 2 2に部品 2 0を供給する部品供給装置 2 4等が設 けられている。  In FIG. 1, reference numeral 12 denotes a base as a machine main body of the electronic circuit component mounting machine 10. On the base 12, a printed circuit board conveyor 16 for transporting a printed circuit board 14, which is a type of circuit board, in the X-axis direction (left and right in FIG. 1), and a board holding device for holding the printed circuit board 14 Parts are mounted on the component 18 and the component mounting device 22 for mounting electronic circuit components 20 (see FIG. 3; hereinafter, abbreviated as components 20) on the printed wiring board holding device 18 and the printed wiring board 14. A component supply device 24 for supplying 20 is provided.
プリント配線板 1 4は一対のコンペャベルト上に水平に載置され、 コンペャべ ルトが周回させられることにより、 一対のガイ ドレール 2 6 , 2 8により案内さ れつつ搬送される。 一方のガイドレール 2 6は、 位置固定に設けられた固定ガイ ドレールとされ、 他方のガイドレール 2 8は、 固定ガイドレールに対して接近, 離間可能に設けられた可動ガイ ドレールとされている。 以後、 ガイドレール 2 6 を固定ガイドレール 2 6と称し、 ガイドレール 2 8を可動ガイ ドレール 2 8と称 する。 可動ガイ ドレール 2 8は、 図示を省略する接近 '離間装置ないしコンペャ 幅変更装置により Y軸方向 (搬送方向に直角な方向) に移動させられ、 固定ガイ ドレール 2 6との間の間隔がプリント配線板 1 2の幅に合わせて調節される。 プリント配線板 1 4は、 予め定められた作業位置において停止させられるとと もに、 ベース 1 2の作業位置に対応する部分に設けられたプリント配線板保持装 置 1 8により保持される。 配線板コンペャ 1 6に隣接する位置に、 部品供給装置 2 4が静止して設けられている。 本実施形態においては、 部品供給装置 2 4は、 フィーダ型部品供給装置とされている。 The printed wiring board 14 is placed horizontally on a pair of conveyor belts, and is conveyed while being guided by a pair of guide rails 26 and 28 by rotating the conveyor belt. One guide rail 26 is a fixed guide rail provided to fix the position, and the other guide rail 28 is a movable guide rail provided to be able to approach and separate from the fixed guide rail. Hereinafter, the guide rail 26 is referred to as a fixed guide rail 26, and the guide rail 28 is referred to as a movable guide rail 28. The movable guide rail 28 is provided with an access / separation device or It is moved in the Y-axis direction (the direction perpendicular to the transport direction) by the width changing device, and the distance between the fixed guide rail 26 and the printed wiring board 12 is adjusted. The printed wiring board 14 is stopped at a predetermined work position, and is held by a printed wiring board holding device 18 provided at a portion corresponding to the work position of the base 12. At a position adjacent to the wiring board conveyor 16, a component supply device 24 is provided stationary. In the present embodiment, the component supply device 24 is a feeder-type component supply device.
部品供給装置 2 4は、 多数のフィーダ 3 0がフィーダ支持テーブル 3 2上に、 各部品供給部が一線上、 例えば X軸方向に平行な一直線上に並ぶ状態で配列され て成る部品供給テーブル 3 4を有する。 各フィーダ 3 0は、 部品 2 0をキヤリャ テープに保持させ、 テープ化電子回路部品としたものから部品 2 0を供給する。 部品装着装置 2 2は、 図 3に示す部品保持へッド 6 0が互いに直交する X軸方 向および Υ軸方向の成分を有する方向に平行移動して部品 2 0を搬送し、 プリン ト配線板 1 4の上面に装着するものとされている。そのため、図 1に示すように、 部品装着装置 2 2は、 X軸スライ ド 6 6とその X軸スライ ド 6 6を移動させる X 軸スライ ド移動装置 6 8とを備え、 X軸スライド 6 6が X軸に平行な方向の任意 の位置へ移動させられる。 X軸スライ ド移動装置 6 8は駆動源としての X軸スラ ィ ド駆動用モータ 7 0を備え、 その X軸スライド駆動用モータ 7 0の回転により ポールねじ 6 4が回転させられて X軸スライド 6 6が移動させられる。 X軸スラ イ ド 6 6は、 図 1に示すように、 部品供給装置 2 4から配線板コンべャ 1 6を越 える長さを有する。  The component supply device 24 includes a component supply table 3 in which a number of feeders 30 are arranged on a feeder support table 32, and component supply units are arranged in a line, for example, in a line parallel to the X-axis direction. With 4. Each feeder 30 holds the component 20 on a carrier tape and supplies the component 20 from the taped electronic circuit component. The component mounting device 22 transports the component 20 by moving the component holding head 60 shown in FIG. 3 in a direction having components in the X-axis direction and the Υ-axis direction which are orthogonal to each other, and conveys the component 20. It is supposed to be mounted on the upper surface of the plate 14. Therefore, as shown in FIG. 1, the component mounting device 22 includes an X-axis slide 66 and an X-axis slide moving device 68 for moving the X-axis slide 66, and the X-axis slide 66. Is moved to any position in the direction parallel to the X axis. The X-axis slide moving device 68 includes an X-axis slide drive motor 70 as a drive source, and the rotation of the X-axis slide drive motor 70 rotates the pole screw 64 to rotate the X-axis slide. 6 6 is moved. The X-axis slide 66 has a length exceeding the wiring board conveyor 16 from the component supply device 24 as shown in FIG.
X軸スライド 6 6上には、 Υ軸スライド 8 2が Υ軸方向に相対移動可能に設け られており、 Υ軸スライ ド移動装置 8 4により Υ軸方向の任意の位置に移動可能 とされている。 Υ軸スライ ド移動装置 8 4は、 駆動源たる Υ軸スライ ド駆動用モ ータ 8 6を備え、 そのモータ 8 6の回転がギヤ 8 8, 9 0を介してボールねじ 9 2に伝達されることにより、 Υ軸スライド 8 2を移動させる。 これら X軸スライ ド 6 6, X軸スライ ド移動装置 6 8, Υ軸スライ ド 8 2および Υ軸スライ ド移動 装置 8 4が Χ Υ移動装置 9 6を構成しており、 部品保持ヘッド 6 0は、 Χ Υ移動 装置 9 6により、 Χ Υ座標面に平行な平面である水平面内の任意の位置へ移動さ せられる。 A Υ-axis slide 82 is provided on the X-axis slide 66 so as to be relatively movable in the Υ-axis direction. The Υ-axis slide moving device 84 is capable of moving to an arbitrary position in the Υ-axis direction. I have. The Υ-axis slide moving device 84 includes a Υ-axis slide driving motor 86 as a drive source, and the rotation of the motor 86 is transmitted to the ball screw 92 via gears 88, 90. Υ to move the axis slide 82. The X-axis slide 66, the X-axis slide moving device 68, the Υ-axis slide 82, and the Υ-axis slide moving device 84 constitute a Χ Υ moving device 96, and the component holding head 60 Is moved by the 位置 Υ moving device 96 to an arbitrary position in a horizontal plane which is a plane parallel to the Υ Υ coordinate plane. Can be done.
Y軸スライ ド 8 2に設けられた支持部 1 0 2には、 図 3に示すように、 部品保 持へッド 6 0, 部品保持へッド 6 0を昇降させるへッド軸方向移動装置たるへッ ド昇降装置 1 0 4 , 部品保持へッド 6 0をその軸線まわりに回転させるへッド回 転装置 1 0 6が設けられており、 これら部品保持へッド 6 0等が部品装着ュニッ ト 1 0 8を構成している。 本実施形態の部品装着ユニット 1 0 8は、 特許第 3 0 9 3 3 3 9号公報に記載の部品装着ュニットと同様に構成されており、 簡単に説 明する。 支持部 1 0 2には、 軸 1 1 0が Ζ軸方向に平行な方向に移動可能かつ軸 線まわりに回転可能に設けられ、 その下端部に設けられたホルダ 1 1 2によって 吸着ノズル 1 1 4が着脱可能に保持される。 本実施形態においては、 軸 1 1 0お ょぴホルダ 1 1 2が部品保持へッド 6 0を構成している。  As shown in FIG. 3, the support portion 102 provided on the Y-axis slide 82 has a head axial movement for raising and lowering the component holding head 60 and the component holding head 60. The apparatus is provided with a head elevating device 104, a head rotating device 106 for rotating the component holding head 60 around its axis, and these component holding heads 60, etc. The component mounting unit 108 is configured. The component mounting unit 108 of the present embodiment has the same configuration as the component mounting unit described in Japanese Patent No. 3093339, and will be briefly described. A shaft 110 is provided on the supporting portion 102 so as to be movable in a direction parallel to the axial direction and rotatable around the axis, and a suction nozzle 111 is provided by a holder 112 provided at a lower end thereof. 4 is detachably held. In the present embodiment, the shaft 110 and the holder 111 constitute a component holding head 60.
吸着ノズル 1 1 4は部品 2 0を負圧により吸着し、 プリント配線板 1 4に装着 する。 そのため、 吸着ノズル 1 1 4は、 図示を省略する負圧源, 正圧源および大 気に接続されており、 電磁方向切換弁装置(図示省略) の切換えにより、負圧源, 正圧源および大気に択一的に連通させられる。  The suction nozzles 1 14 suction the component 20 by negative pressure and mount it on the printed wiring board 14. Therefore, the suction nozzles 114 are connected to a negative pressure source (not shown), a positive pressure source (not shown), and the atmosphere, and are switched by an electromagnetic directional switching valve device (not shown). It is alternatively connected to the atmosphere.
Υ軸スライド 8 2にはまた、 プリント配線板 1 4に設けられた複数の基準マー ク 1 5 0を撮像する撮像装置たる基準マークカメラ 1 5 2 (図 1参照) が固定さ れている。 基準マークカメラ 1 5 2は、 本実施形態においては、 面撮像装置の一 種である C C Dカメラにより構成されている。基準マークカメラ 1 5 2の周囲に、 図 4に示すようにリング状の照明装置 1 5 4が設けられており、 基準マーク 1 5 0およびその周辺を照明する。  The fiducial mark camera 152 (see FIG. 1), which is an image pickup device for imaging a plurality of fiducial marks 150 provided on the printed wiring board 14, is fixed to the 固定 -axis slide 82. In the present embodiment, the fiducial mark camera 152 is constituted by a CCD camera which is a type of a surface imaging device. A ring-shaped illumination device 154 is provided around the fiducial mark camera 152 as shown in FIG. 4, and illuminates the fiducial mark 150 and its periphery.
本実施形態においては、 さらに、 基準マークカメラ 1 5 2の光軸とほぼ平行な 照明光で撮像対象物を照明する落射照明装置 1 5 8が設けられている。 基準マー クカメラ 1 5 2の下方には、 ハーフミラー 1 6 0が基準マークカメラ 1 5 2の光 軸に対して 4 5度傾斜して設けられている。 ハーフミラー 1 6 0には水平に配設 されたハロゲンランプ 1 6 2から光が照射される。 ハロゲンランプ 2 0のハーフ ミラー 1 6 0とは反対側には凹面鏡 1 6 6が配設されており、 ハロゲンランプ 1 6 2からハーフミラー 1 6 0とは反対側へ放射された光がハーフミラー 1 6 0に 向かって反射されるようになっている。 ハロゲンランプ 1 6 2および凹面鏡 1 6 6が共同して、 凹面鏡 1 6 6のハーフミラー 1 6 0に対向する面全体からほぼ均 一でかつ基準マークカメラ 1 5 2の光軸にほぼ直角な光を放射する光源.1 7 0を 構成しているのである。 In the present embodiment, an epi-illumination device 158 that illuminates the imaging target object with illumination light substantially parallel to the optical axis of the fiducial mark camera 152 is provided. Below the reference mark camera 152, a half mirror 160 is provided at an angle of 45 degrees with respect to the optical axis of the reference mark camera 152. The half mirror 160 is irradiated with light from a horizontally arranged halogen lamp 162. A concave mirror 16 6 is provided on the opposite side of the half mirror 16 0 of the halogen lamp 20, and light emitted from the halogen lamp 16 2 to the opposite side of the half mirror 16 0 is a half mirror. The light is reflected toward 160. Halogen lamp 1 6 2 and concave mirror 1 6 6 cooperates to emit light that is substantially uniform from the entire surface of the concave mirror 16 6 facing the half mirror 16 0 and is substantially perpendicular to the optical axis of the reference mark camera 15 2. It is composed.
光源 1 7 0からハーフミラー 1 6 0へ照射された光の一部は入射方向とは軸対 称の方向、 すなわち垂直に下方へ反射されるが、 残りはハーフミラー 1 6 0を透 過する。 ハーフミラー 1 6 0に対してハロゲンランプ 1 6 2とは反対側には透過 光吸収部材としての無反射紙 1 7 4が垂直に設けられており、 ハーフミラー 1 6 0を透過した光を吸収する。 無反射紙 1 7 4は表面の反射率が特に低くされた黒 色の紙であり、 これらハーフミラー 1 6 0, 光源 1 7 0およぴ無反射紙 1 7 4が 落射照明装置 1 5 8を構成している。  Part of the light emitted from the light source 170 to the half mirror 160 is reflected downward in the direction of the axis of incidence, that is, vertically downward, but the rest passes through the half mirror 160 . On the opposite side of the half mirror 16 0 from the halogen lamp 16 2, a non-reflective paper 1 7 4 as a transmitted light absorbing member is provided vertically to absorb the light transmitted through the half mirror 1 6 0. I do. Non-reflective paper 1 74 is black paper with a particularly low surface reflectivity. These half mirrors 1 60, light source 1 70 and anti-reflective paper 1 74 are epi-illumination devices 1 5 8 Is composed.
上記基準マークカメラ 1 5 2 , 照明装置 1 5 4および落射照明装置 1 5 8が撮 像システムを構成しており、 プリント配線板 1 4や装着された部品 2 0等を撮像 する際には、 照明装置 1 5 4と落射照明装置 1 5 8とのいずれかが選択的に点灯 されて撮像作業を実施する。  The fiducial mark camera 15 2, the illumination device 15 5 and the epi-illumination device 15 8 constitute an imaging system, and when imaging the printed wiring board 14 and the mounted components 20, etc. Either the illumination device 154 or the epi-illumination device 158 is selectively turned on to perform an imaging operation.
X軸スライド 6 6には、 部品供給装置 2 4とプリント配線板 1 4との間であつ て、 ちょうど X軸スライ ド 6 6を移動させるボールねじ 6 4に対応する位置に、 部品撮像装置 1 8 0が移動不能に取り付けられている。 部品撮像装置 1 8 0は、 図 3に示すように、 部品 2 0を撮像する部品カメラ 1 8 2およぴ導光装置 1 8 4 を備え、 導光装置 1 8 4は、 反射装置としての反射鏡 1 8 6, 1 8 8を有してい る。 本実施形態においては、 部品カメラ 1 8 2は、 前記基準マークカメラ 1 5 2 と同様に C C Dカメラとされている。  The X-axis slide 66 is located between the component supply device 24 and the printed wiring board 14 and at a position corresponding to the ball screw 64 that just moves the X-axis slide 66. 80 is immovably mounted. As shown in FIG. 3, the component imaging device 180 includes a component camera 182 for capturing an image of the component 20 and a light guiding device 18 4, and the light guiding device 18 4 serves as a reflecting device. It has reflecting mirrors 186 and 188. In the present embodiment, the component camera 18 2 is a CCD camera, like the fiducial mark camera 15 2.
吸着ノズル 1 1 4の Y軸方向の移動経路の真下であって、 導光装置 1 8 4の近 傍には、 照明装置 1 9 8が設けられている。 照明装置 1 9 8は、 紫外線を照射す るストロボ 2 0 0と、 紫外線を吸収して可視光線を放射する発光板 2 0 2とを備 え、 部品カメラ 1 8 2は、 部品 2 0の投影像を撮像する。 照明装置 1 9 8は、 さ らに、 可視光線を照射する別のストロボ 2 0 4を備え、 部品 2 0の底面からの反 射光により、 部品力メラ 1 8 2は部品 2 0の正面像を撮像する。 上記撮像装置 1 8 0 , 導光装置 1 8 4および照明装置 1 9 8が撮像システムを構成している。 本電子回路部品装着機 1 0は、 制御手段として、 図 5に示す制御装置 2 5 0を 備えている。 制御装置 2 5 0は、 C P U 2 5 2 , R O M 2 5 4 , R AM 2 5 6お ょぴそれらを接続するバスを備えるコンピュータ 2 6 0を主体として構成されて いる。 バスには、 さらに、 入出力インターフェース 2 6 2が接続されており、 駆 動回路 2 6 4を介して X軸スライ ド駆動用モータ 7 0 , Y軸スライド駆動用モー タ 8 6, ヘッド昇降装置 1 0 4 , ヘッド回転装置 1 0 6などが接続されている。 制御装置 2 5 0には、 画像処理コンピュータ 2 6 6 , 基準マークカメラ 1 5 2お ょぴ部品カメラ 1 8 2が接続されている。 制御装置 2 5 0には、 さらに、 キーポ 一ド等の入力装置 2 6 8が接続されるとともに、 制御回路 2 7 2を介して表示装 置たるディスプレイ 2 7 4も接続されている。 An illumination device 198 is provided just below the movement path of the suction nozzles 114 in the Y-axis direction and near the light guide device 184. The lighting device 198 is equipped with a strobe 200 for irradiating ultraviolet rays and a luminous plate 200 for absorbing visible light and emitting visible light.The component camera 18 2 projects the component 20 Capture an image. The illuminating device 198 further includes another strobe 204 that emits visible light, and the reflected light from the bottom of the component 20 causes the component power lens 18 2 to form a front view of the component 20. Take an image. The imaging device 180, the light guide device 184, and the lighting device 198 constitute an imaging system. The electronic circuit component mounting machine 10 includes a control device 250 shown in FIG. 5 as control means. Have. The control device 250 is mainly composed of a CPU 25 2, a ROM 25 4, a RAM 25 6, and a computer 260 having a bus connecting them. The bus is further connected to an input / output interface 266, and a drive circuit 264 drives the X-axis slide drive motor 70, the Y-axis slide drive motor 86, and the head lifting / lowering device. 104, a head rotating device 106 and the like are connected. The control device 250 is connected with an image processing computer 26 6, a reference mark camera 15 2, and a component camera 18 2. The control device 250 is further connected to an input device 268 such as a keypad, and also connected to a display device 274 as a display device via a control circuit 272.
なお、 X軸スライ ド駆動用モータ 7 0 , Y軸スライ ド駆動用モータ 8 6 , へッ ド昇降装置 1 0 4およびへッド回転装置 1 0 6の各駆動源たるモータ等は、 いず れもサーポモータにより構成され、 その回転角度がエンコーダ 2 7 6により検出 されてコンピュータ 2 6 0に入力される。 図 5には、 X軸スライ ド駆動用モータ 7 0に設けられたエンコーダ 2 7 6を代表的に示す。 また、 制御装置 2 5 0の R O M 2 5 4および R AM 2 5 6には、 メインルーチン, 電子回路部品装着ルーチ ン等を始めとする種々のプログラムと、 それらプロダラムの実行に必要なデータ 等が記憶させられている。 さらに、 コンピュータ 2 6 0には部品 2 0の各種デー タ (部品情報と略称する) が格納されたデータベースであるパーツデータジエネ レータ (P D G ) 2 7 8が接続されている。  The motors as drive sources of the X-axis slide drive motor 70, the Y-axis slide drive motor 86, the head lifting / lowering device 104, and the head rotation device 106 are all provided. Each of them is also constituted by a servomotor, and its rotation angle is detected by the encoder 276 and inputted to the computer 260. FIG. 5 representatively shows an encoder 276 provided on the X-axis slide drive motor 70. The ROM 254 and the RAM 256 of the controller 250 store various programs such as a main routine, an electronic circuit component mounting routine, and data necessary for executing the programs. It is remembered. Further, the computer 260 is connected to a parts data generator (PDG) 278 which is a database storing various data of the parts 20 (abbreviated as part information).
次に作動を説明する。 部品 2 0をプリント配線板 1 4に装着する装着作業は、 前記特許第 2 8 2 4 3 7 8号公報等に記載されているため、 簡単に説明し、 その 後に装着位置精度検査作業について詳細に説明する。 前記電子回路部品装着ルー チンには、 部品保持へッド 6 0がフィーダ 3 0から部品 2 0を受け取るべき位置 である部品受取り位置のデータと、 部品 2 0をプリント配線板 1 4に装着すべき 位置である部品装着位置のデータと、 パーツデータジェネレータ (P D G ) 2 7 8から供給された各部品 2 0の部品情報とが含まれている。  Next, the operation will be described. The mounting operation for mounting the component 20 on the printed wiring board 14 is described briefly in the aforementioned Japanese Patent No. 2824378, etc., and will be briefly described. Will be described. In the electronic circuit component mounting routine, data of a component receiving position where the component holding head 60 should receive the component 20 from the feeder 30 and the component 20 are mounted on the printed wiring board 14. The data of the component mounting position, which is the power position, and the component information of each component 20 supplied from the part data generator (PDG) 278 are included.
まず、 プリント配線板 1 4が配線板コンペャ 1 6により部品 2 0が装着される 作業位置 (ないし装着スペース) まで搬送されて、 プリント配線板保持装置 1 8 により位置決め保持される。 X Y移動装置 9 6により部品装着ュニット 1 0 8と ともに基準マークカメラ 1 5 2が、 プリント配線板 1 4に設けられた基準マーク 1 5 0を撮像する基準マーク撮像位置に位置決めされ、 2個の基準マーク 1 5 0 がそれぞれ撮像される。その結果取得された基準マーク 1 5 0の画像処理により、 プリント配線板 1 4の位置誤差が取得される。 , First, the printed wiring board 14 is transported to a work position (or mounting space) where the component 20 is mounted by the wiring board conveyor 16, and is positioned and held by the printed wiring board holding device 18. Component mounting unit 1 08 with XY moving device 96 In both cases, the fiducial mark camera 152 is positioned at the fiducial mark imaging position where the fiducial mark 150 provided on the printed wiring board 14 is imaged, and the two fiducial marks 150 are respectively imaged. As a result, the position error of the printed wiring board 14 is obtained by image processing of the obtained reference mark 150. ,
次に、 部品保持ヘッド 6 0は、 X Y移動装置 9 6によりフィーダ 3 0から部品 2 0を受け取る部品受取り位置へ移動させられる。 部品保持へッド 6 0が部品受 取り位置に到達すれば、 部品保持へッド 6 0がへッド昇降装置 1 0 4により昇降 させられ、 吸着ノズル 1 1 4に負圧が供給されることにより部品 2 0が吸着され る。  Next, the component holding head 60 is moved by the XY moving device 96 to a component receiving position for receiving the component 20 from the feeder 30. When the component holding head 60 reaches the component receiving position, the component holding head 60 is moved up and down by the head elevating device 104, and negative pressure is supplied to the suction nozzles 114. As a result, the component 20 is sucked.
部品 2 0を保持した部品保持ヘッド 6 0は、 部品受取り位置から、 プリント配 線板 1 4上に予め設定されている部品装着点に対向する部品装着位置へ移動させ られるのであるが、 この際、 X軸スライ ド 6 6の部品受取り位置と部品装着位置 との間の位置に固定されている導光装置 1 8 4上を通過する。 部品受取り位置お よび部品装着位置が部品供給装置 2 4およびプリント配線板 1 4のいずれの位置 にあっても、 部品保持ヘッド 6 0が部品受取り位置から部品装着位置へ移動する ためには必ず、 X軸スライ ド 6 6上を Y軸方向へ移動して部品供給装置 2 4とプ リント配線板 1 4との間の部分を通る。 したがって、 部品保持へッド 6 0は、 X 軸スライ ド 6 6の部品受取り位置と部品装着位置との間に位置する部分に固定さ れている導光装置 1 8 4上を必ず通り、 部品カメラ 1 8 2により部品 2 0が撮像 される。 部品保持へッド 6 0が導光装置 1 8 4上に位置し、 部品カメラ 1 8 2に よって撮像される位置を部品保持位置検出位置ないし撮像位置と称する。  The component holding head 60 holding the component 20 is moved from the component receiving position to a component mounting position facing a component mounting point preset on the printed wiring board 14. The X-axis slide 66 passes over the light guide device 184 fixed at a position between the component receiving position and the component mounting position. Regardless of whether the component receiving position and the component mounting position are on the component supply device 24 or the printed wiring board 14, the component holding head 60 must be moved from the component receiving position to the component mounting position without fail. It moves on the X-axis slide 66 in the Y-axis direction and passes through a portion between the component supply device 24 and the printed wiring board 14. Therefore, the component holding head 60 always passes over the light guide device 18 4 fixed to the portion of the X-axis slide 66 located between the component receiving position and the component mounting position, and A part 20 is imaged by the camera 18. The position at which the component holding head 60 is located on the light guide device 184 and is imaged by the component camera 182 is referred to as a component holding position detection position or an imaging position.
部品 2 0の回転位置が吸着時と装着時とで異なる場合には、 吸着後、 部品保持 位置検出位置に到達するまでの間に部品保持へッド 6 0がへッド回転装置 1 0 6 により回転させられ、部品 2 0が回転させられて装着時の回転位置に変更される。 そして、 部品保持へッド 6 0が部品保持位置検出位置に到達すれば、 部品 2 0が 撮像される。 撮像装置 1 8 0およびストロボ 2 0 0, 2 0 4は X軸スライ ド 6 6 上に設けられているため、 部品保持ヘッド 6 0は、 Y軸方向においてはその移動 を停止させられるが、 X軸方向においては移動させられたままの状態で部品 2 0 が撮像される。 撮像された像のデータは画像処理コンピュータ 2 6 6において保 持位置誤差のない正規の像のデータと比較され、 保持位置誤差、 すなわち予め定 められた基準点の平行移動位置誤差 (多くの場合中心位置誤差) および回転位置 誤差が算出される。 If the rotation position of the component 20 differs between the time of suction and the time of mounting, the component holding head 60 is moved from the suction to the position of the component holding position detection position by the head rotating device 10 6 And the component 20 is rotated and changed to the rotational position at the time of mounting. Then, when the component holding head 60 reaches the component holding position detection position, the component 20 is imaged. Since the imaging device 180 and the strobes 200 and 204 are provided on the X-axis slide 66, the movement of the component holding head 60 is stopped in the Y-axis direction. The component 20 is imaged while being moved in the axial direction. The data of the captured image is stored in the image processing computer 266. The data is compared with the data of the normal image without the holding position error, and the holding position error, that is, the translational position error (often the center position error) and the rotational position error of the predetermined reference point are calculated.
部品保持へッド 6 0が部品装着位置へ移動するまでの間に、 部品保持へッド 6 0がへッド回転装置 1 0 6により回転させられて回転位置誤差が打ち消されると ともに、 前記プリント配線板 1 4の位置誤差と部品 2 0の平行移動位置誤差 (回 転位置誤差の打消しに伴って生じる平行移動位置誤差を含む) が打ち消されるよ うに、 部品装着位置の座標が補正され、 部品 2 0はプリント配線板 1 4の正確な 装着点に正しい回転位置で装着される。以上で 1サイクルの装着作業が終了する。 次に装着位置精度検査作業について説明する。 検査作業には専用の検査基板が 用いられる。  Before the component holding head 60 moves to the component mounting position, the component holding head 60 is rotated by the head rotating device 106 to cancel the rotational position error, and The coordinates of the component mounting position are corrected so that the position error of the printed wiring board 14 and the translational position error of the component 20 (including the translational position error generated due to the cancellation of the rotational position error) are cancelled. The component 20 is mounted at the correct mounting point on the printed wiring board 14 at the correct rotation position. This completes one cycle of mounting work. Next, the mounting position accuracy inspection work will be described. A dedicated inspection board is used for the inspection work.
図 6に示すように、 検查基板 3 0 0は無色透明のガラス製でプリント配線板 1 4とほぼ同じ形状に形成され、 表側の部品装着面の多数の格子点上に円マーク 3 0 2が形状および位置が精度よく形成されている。 この検查基板 3 0 0の互いに 隣接する 4個の円マーク 3 0 2に囲まれた位置に、 上述の装着作業と同様にして 部品 2 0が装着され、 その後、 検查基板 3 0 0の裏表が反転させられて検查基板 3 0 0を通して部品 2 0の裏面が撮像され、 部品 2 0の装着位置精度が検出され る。 以下、 詳細に説明する。  As shown in FIG. 6, the inspection substrate 300 is made of colorless and transparent glass and is formed in almost the same shape as the printed wiring board 14, and circle marks 3002 are formed on a large number of grid points on the component mounting surface on the front side. Are accurately formed in shape and position. At the position surrounded by four adjacent circle marks 302 of the inspection substrate 300, the component 20 is mounted in the same manner as the mounting operation described above. The front and back are reversed, and the back surface of the component 20 is imaged through the detection board 300, and the mounting position accuracy of the component 20 is detected. The details will be described below.
まず、 検査基板 3 0 0が配線板コンペャ 1 6により装着スペースまで搬送され て、 プリント配線板保持装置 1 8により位置決め保持される。 次に、 基準マーク カメラ 1 5 2により、 一部の円マーク 3 0 2が撮像されることにより検查基板 3 0 0の位置が取得される。 検查基板 3 0 0には、 前記基準マーク 1 5 0に対応す る専用のマークが設けられていないので、 2つの対角線上にそれぞれ 2個ずつ位 置する 4隅の円マーク 3 0 2がそれぞれ撮像され、 各円マーク 3 0 2の像の中心 たるマーク中心の位置が取得されて、 それら 4つのマーク中心の中心を基準点と みなして、 検查基板 3 0 0の保持位置が取得される。  First, the inspection board 300 is transported to a mounting space by the wiring board conveyor 16 and positioned and held by the printed wiring board holding device 18. Next, the reference mark camera 152 captures a part of the circle mark 302 so that the position of the inspection board 300 is obtained. Since the inspection substrate 300 does not have a dedicated mark corresponding to the reference mark 150, two circular marks 3 02 at two corners located on two diagonal lines are provided. Each image is taken, the position of the mark center, which is the center of the image of each circle mark 302, is acquired, and the holding position of the inspection substrate 300 is acquired, considering the center of the four mark centers as a reference point. You.
円マーク 3 0 2は、 検査基板 3 0 0の表面がエッチングされるとともに、 ごく 薄い金属メツキが施されて鏡面とされたものである。 そのため、 図 8に示すよう に、 基準マークカメラ 1 5 2が円マーク 3 0 2の真上に位置する状態で、 落射照 明装置 1 5 8により真上から照明すれば、 円マーク 3 0 2の部分が全反射して周 囲より明るい像として撮像することができる。 基準マークカメラ 1 5 2により 4 つの円マーク 3 0 2がそれぞれ真上から落射照明により撮像されて、 各円マーク の中心である基準点の位置が取得され、 それら基準点の位置に基づいて、 検査基 板 3 0 0の位置が取得される。 なお、 検査基板 3 0 0の余白などに、 円マーク 3 0 2とは別に基準マークを設けてもよい。 The circle mark 302 is a mirror surface obtained by etching the surface of the inspection substrate 300 and applying a very thin metal plating. Therefore, as shown in FIG. 8, the reference mark camera 15 2 is positioned directly above the circle mark 302, and If the illumination device 158 illuminates from directly above, the portion of the circle mark 302 is totally reflected and an image brighter than the surrounding area can be captured. The fiducial mark cameras 15 2 capture images of the four circle marks 302 from directly above by epi-illumination, and obtain the position of the reference point, which is the center of each circle mark, based on the positions of these reference points. The position of the inspection board 300 is obtained. Note that a reference mark may be provided separately from the circle mark 302 in a margin of the inspection board 300 or the like.
次に検査基板 3 0 0上に部品 2 0が装着される。 検査作業専用の検査チップを 用いてもよいが、 本実施形態においては、 市販の電子回路部品である部品 2 0を 装着して検査作業が実施される。 装着作業と同様にして、 部品保持ヘッド 6 0が 部品供給位置においてフィーダ 3 0から部品 2 0を受け取り、 X Y移動装置 9 6 により部品装着位置に向かって移動させられる。 その途中で導光装置 1 8 4上を 通過する際に、 部品 2 0の裏面が部品カメラ 1 8 2により撮像される。 可視光線 を放射するストロボ 2 0 4が点灯させられて、 部品 2 0の裏面の反射像が撮像さ れるのである。 部品保持ヘッド 6 0が部品装着位置に到達するまでに、 画像処理 が実行されて部品保持位置が取得され、 検查基板 3 0 0の保持位置誤差と部品 2 0の保持位置誤差等とが解消されるように装着位置が補正されて、 検査基板 3 0 0上に部品 2 0が装着される。 以上で 1サイクルの装着作業が終了する。 なお、 検査基板 3 0 0の部品装着面全体に、予め無色透明の両面粘着テープ(図示省略) が貼り付けられており、 吸着ノズル 1 1 4により保持された部品 2 0が検査基板 3 0 0上に载置されれば、 その粘着テープにより固定される。 以下の説明におい ては、 両面粘着テープの厚さは無視できるものとする。  Next, the component 20 is mounted on the inspection board 300. Although an inspection chip dedicated to the inspection work may be used, in the present embodiment, the inspection work is performed by mounting a component 20 which is a commercially available electronic circuit component. Similarly to the mounting operation, the component holding head 60 receives the component 20 from the feeder 30 at the component supply position, and is moved toward the component mounting position by the XY moving device 96. While passing over the light guide device 184 on the way, the back surface of the component 20 is imaged by the component camera 182. The strobe light 204 that emits visible light is turned on, and a reflected image of the back surface of the component 20 is captured. By the time the component holding head 60 reaches the component mounting position, image processing is executed to acquire the component holding position, and the holding position error of the inspection board 300 and the holding position error of the component 20 are eliminated. The mounting position is corrected so that the component 20 is mounted on the inspection board 300. This completes one cycle of mounting work. Note that a colorless and transparent double-sided adhesive tape (not shown) is previously attached to the entire component mounting surface of the inspection substrate 300, and the component 20 held by the suction nozzles 114 is attached to the inspection substrate 300. If placed on top, it will be fixed by the adhesive tape. In the following description, the thickness of the double-sided adhesive tape is assumed to be negligible.
部品 2 0は、 図 7に示すように、 検査基板 3 0 0の多数の円マーク 3 0 2のう ち互いに隣接する 4個ずつの円マーク 3 0 2から等距離の各位置に予め設定され た多数の装着予定位置に、上述の装着作業時と同様にして部品 2 0が装着される。 部品 2 0は、 検查基板 3 0 0の装着領域、 すなわち円マーク 3 0 2が設けられた 領域全体に装着される。 図 7においては、 部品 2 0が全てフィーダ 3 0から供給 されたままの回転位置で装着された状態が記載されているが、 部品 2 0がフィー ダ 3 0から供給されたままの回転位置と、 その回転位置から 9 0度回転させられ た回転位置とで交互に装着されるようにしても、 また、 9 0度ずつ回転させられ 2003/010803 As shown in FIG. 7, the component 20 is preset at each position equidistant from four adjacent circle marks 302 of a large number of circle marks 302 of the inspection board 300, as shown in FIG. The components 20 are mounted on the large number of mounting positions in the same manner as in the mounting operation described above. The component 20 is mounted on the mounting area of the detection board 300, that is, the entire area where the circle mark 302 is provided. FIG. 7 shows a state in which all of the components 20 are mounted at the rotational position where they are supplied from the feeder 30. However, even if they are mounted alternately at a rotation position rotated 90 degrees from the rotation position, 2003/010803
18  18
た 4つの回転位置に繰り返し位置させられて装着されるようにしてもよい。 さら に、 検査基板 3 0 0の複数の装着予定位置にフィーダ 3 0から供給されたままの 回転位置で全ての部品 2 0が装着され、 別の検査基板 3 0 0の複 の装着予定位 置に 9 0度回転させられた回転位置で、 さらに別の検査基板 3 0 0の複数の装着 予定位置にはさらに 9 0度回転させられた回転位置でというように、 種々の回転 位置で装着が行われるようにすることも可能である。 Alternatively, it may be mounted repeatedly at four rotational positions. In addition, all the components 20 are mounted at the rotational positions as supplied from the feeder 30 at a plurality of mounting positions of the inspection board 300, and a plurality of mounting positions of another inspection board 300 are mounted. The mounting position can be set at various rotation positions, such as at a rotation position rotated 90 degrees, and a plurality of additional mounting positions of the inspection board 300 can be set at rotation positions further rotated 90 degrees. It is also possible to do so.
全ての部品 2 0が装着されれば、 作業者により検査基板 3 0 0の裏表が反転さ せられて配線板保持装置 1 8にセットされ、 基準マークカメラ 1 5 2により検査 基板 3 0 0を通して部品 2 0の裏面が撮像され、 部品 2 0の装着位置の検出が行 われる。まず、部品 2 0の装着作業が終了した旨が作業者に報知されるとともに、 配線板保持装置 1 8による検査基板 3 0 0の保持が解放される。 作業者は作業終 了情報に基づいて、 検査基板 3 0 0を取り出して裏表を反転させるとともに、 基 板治具 3 0 4に取り付ける。  When all the components 20 are mounted, the operator turns the inspection board 300 over and sets it on the wiring board holding device 18, and the reference mark camera 15 2 passes the inspection board 300 through the inspection board 300. The back surface of the component 20 is imaged, and the mounting position of the component 20 is detected. First, the completion of the mounting work of the component 20 is notified to the operator, and the holding of the test board 300 by the wiring board holding device 18 is released. The operator takes out the inspection board 300 based on the work completion information, turns the board upside down, and mounts the board on the board jig 304.
基板治具 3 0 4は、 図 9および図 1 0に示すように、 概して平板状を成すもの であって、 検査基板 3 0 0を下方から支持するとともにそれの両側面に接触また は近接して水平方向位置を規定する。 基板治具 3 0 4は、 検查基板 3 0 0の部品 装着面を下側にして検査基板 3 0 0を支持するので、 その部品装着面に既に装着 された部品 2 0と干渉しないように、 検査基板 3 0 0の下面の縁辺部に接触して 支持する支持面 3 0 6を残して、 円マーク 3 0 2が形成された領域に対向する部 分が一定の深さで (例えば 5 mm) くぼまされている。 検查基板 3 0 0は、 この 基板治具 3 0 4を介して配線板保持装置 1 8に保持される。 なお、 基板治具 3 0 4は、 検査基板 3 0 0が基板治具 3 0 4を介して配線板保持装置 1 8に保持され た状態において、 部品装着面すなわち部品 2 0の裏面の高さが基準マークカメラ 1 5 2の焦点に一致する高さに検査基板 3 0 0を保持するようにされている。 具 体的には、 例えば、 検査基板 3 0 0の厚さが tであってガラスの屈折率が 1 . 5 であると仮定すると、 ガラス内部では焦点距離が 1 . 5倍に伸ぴるので、 図 1 0 に示すように、 部品装着時の部品装着面の高さ hに対して、 厚さ tの 3分の 1倍 だけ低い位置に部品装着面が位置するように検查基板 3 0 0を保持するようにさ れているのである。 検查基板 3 0 0は部品 2 0の装着時に、 部品装着面が高さ規 定面 3 0 8に押し付けられて保持されるため、 基板治具 3 0 4の上面が高さ規定 面 3 0 8に押し付けられて保持された際、 検査基板 3 0 0の部品装着面が高さ規 定面 3 0 8から、 検查基板 3 0 0の厚さ tの 3分の 1倍だけ低くなるようにされ る。 As shown in FIGS. 9 and 10, the substrate jig 304 has a generally flat plate shape, supports the inspection substrate 300 from below, and contacts or approaches both side surfaces of the inspection substrate 300. To define the horizontal position. The board jig 304 supports the inspection board 300 with the component mounting surface of the inspection board 300 facing down, so that it does not interfere with the component 20 already mounted on the component mounting surface. The portion opposing the area where the circle mark 302 is formed has a constant depth (for example, 5 mm) except for the support surface 303 that contacts and supports the edge of the lower surface of the inspection substrate 300. mm) Depressed. The inspection board 300 is held by the wiring board holding device 18 via the board jig 304. The board jig 304 has a height of the component mounting surface, that is, the back surface of the component 20, in a state where the inspection board 300 is held by the wiring board holding device 18 via the board jig 304. Is designed to hold the inspection board 300 at a height that matches the focus of the fiducial mark camera 152. Specifically, for example, assuming that the thickness of the inspection substrate 300 is t and the refractive index of the glass is 1.5, the focal length inside the glass increases by 1.5 times. As shown in Fig. 10, the inspection board 300 is mounted so that the component mounting surface is located at a position that is one-third the thickness t lower than the component mounting surface height h at the time of component mounting. It is made to hold. The inspection board 300 has a height-adjusted component mounting surface when the component 20 is mounted. Since the upper surface of the substrate jig 304 is pressed against the fixed surface 308 and held, the component mounting surface of the inspection substrate 300 is raised when the upper surface of the substrate jig 430 is pressed and held against the surface 308. The thickness is set to be lower by one third of the thickness t of the inspection substrate 300 from the specified surface 308.
基板治具 3 0 4は、 検査基板 3 0 0より幅が広いため、 配線板コンペャ 1 6の 幅が基板治具 3 0 4に合わせて調節される。 すなわち、 可動ガイドレール 2 8と 固定ガイ ドレール 2 6との間隔が基板治具 3 0 4の幅に合うまで、 可動ガイドレ ール 2 8が固定ガイドレール 2 6から離間する向きに移動させられ、 ここには図 示しない配線板保持装置 1 8 (図 1 , 2 ) によって基板治具 3 0 4が保持可能な 状態にされる。 その後、 作業者により、 検査基板 3 0 0が検査治具 3 0 4を介し て配線板保持装置 1 8に载置されれば、 その旨が作業者により入力装置 2 6 8を 介して制御装置 2 5 0に伝達される。 この情報に基づいて、 制御装置 2 5 0によ り配線板保持装置 1 8が検査治具 3 0 4を固定的に保持した状態とされ、 その結 果、 検査基板 3 0 0が検查治具 3 0 4を介して固定的に保持される。  Since the board jig 304 is wider than the inspection board 300, the width of the wiring board conveyor 16 is adjusted according to the board jig 304. That is, the movable guide rail 28 is moved in a direction away from the fixed guide rail 26 until the distance between the movable guide rail 28 and the fixed guide rail 26 matches the width of the board jig 304. Here, the circuit board holding device 18 (FIGS. 1 and 2) (not shown) is brought into a state in which the substrate jig 304 can be held. Thereafter, if the operator places the inspection board 300 on the wiring board holding device 18 via the inspection jig 304, the operator notifies the control device via the input device 268. It is transmitted to 250. Based on this information, the control device 250 sets the wiring board holding device 18 in a state in which the test jig 304 is fixedly held, and as a result, the test board 300 is detected and fixed. It is fixedly held through the tool 304.
次に、 部品 2 0の裏面が撮像されることにより、 部品 2 0の装着位置が検出さ れる。 本実施形態においては、 部品 2 0の各装着位置について、 周囲の 4個の円 マーク 3 0 2の位置が取得され、 それら円マーク 3 0 2と部品 2 0との相対位置 に基づいて装着位置ずれが検出される。  Next, the mounting position of the component 20 is detected by imaging the back surface of the component 20. In the present embodiment, for each mounting position of the component 20, the positions of four surrounding circular marks 302 are acquired, and the mounting position is determined based on the relative positions of the circular marks 302 and the component 20. A shift is detected.
以下、 1つの部品 2 0の装着位置精度検查作業について説明する。  Hereinafter, the work of detecting the mounting position accuracy of one component 20 will be described.
まず、 その部品 2 0の周囲の 4つの円マーク 3 0 2が順に撮像される。 具体的 には、 基準マークカメラ 1 5 2が今回撮像すべき円マーク 3 0 2の真上に位置す るはずの位置に位置決めされ、 基準マークカメラ 1 5 2と同軸の落射照明装置 1 5 8により円マーク 3 0 2が照明されて、 反射像が撮像される。 落射照明装置 1 5 8により照明されて取得される画像を図 1 2に例示するが、 この画像は通常と は異なり撮像中心に円マーク 3 0 2ではなく部品 2 0が位置するように撮像され ている。 これは、 照明装置 1 5 4により斜め方向から照明されて取得された画像 である図 1 3と比較しやすくするためであり、 本実施形態においては、 通常、 円 マーク 3 0 2が撮像中心に位置するように撮像される。 円マーク 3 0 2の部分は ほぼ全反射して比較的明るい像となるのに対して、 部品 2 0の裏面は照明光を乱 反射して比較的暗い像となる。 また、 円マーク 3 0 2および部品 2 0以外の部分 (背景と称する) はさらに暗い像となる。 したがって、 円マーク 3 0 2の像は明、 部品 2 0および背景は暗となるように設定したしきい値により二値化すれば、 円 マーク 3 0 2の像のみを明るい像として取得することができ、 円マーク 3 0 2の 位置検出を容易に行うことができる。 本実施形態においては、 基準マークカメラ 1 5 2が各円マーク 3 0 2と順に正対させられて撮像が行われ、 円マーク 3 0 2 の中心の予定位置 (本実施形態においては、 基準マークカメラ 1 5 2の撮像面の 中心) からの外れの方向および距離が位置ずれとして検出される。 First, four circle marks 302 around the component 20 are sequentially imaged. Specifically, the fiducial mark camera 15 2 is positioned at a position that should be located directly above the circle mark 30 2 to be imaged this time, and the epi-illumination device 15 8 8 is coaxial with the fiducial mark camera 15 2. Illuminates the circle mark 302, and a reflected image is captured. An example of an image obtained by being illuminated by the epi-illumination device 158 is shown in FIG. 12. ing. This is to make it easier to compare with FIG. 13 which is an image obtained by being illuminated from an oblique direction by the illumination device 154. In the present embodiment, the circle mark 302 is usually located at the center of the image pickup. The image is taken to be located. The circle mark 302 is almost totally reflected and a relatively bright image is formed, whereas the back surface of the part 210 disturbs the illumination light. Reflection results in a relatively dark image. Further, portions other than the circle mark 302 and the component 20 (referred to as background) are darker images. Therefore, if the image of the circle mark 302 is binarized by a threshold value set so that the image of the circle mark 302 is bright and the part 20 and the background are dark, only the image of the circle mark 302 is acquired as a bright image. And the position of the circle mark 302 can be easily detected. In the present embodiment, the fiducial mark camera 15 2 is imaged while being directly opposed to each of the circle marks 302, and the planned position of the center of the circle mark 302 (in this embodiment, the fiducial mark The direction and distance from the center of the imaging surface of the camera 152 are detected as misregistration.
図 1 4に示すように、 撮像により得られた画像において、 円マーク 3 0 2の像 が存在すべき位置の近傍に複数のシークライン 3 1 0が予め設定されており、 そ れぞれのシークライン 3 1 0について明部と暗部との境界位置が取得される。 そ の境界位置が円マーク 3 0 2の外形線の位置なのであり、 それらシークライン 3 1 0上の複数の境界位置の中心が円マーク 3 0 2の中心たるマーク中心位置とし て算出される。  As shown in FIG. 14, in the image obtained by imaging, a plurality of seek lines 310 are preset in the vicinity of the position where the image of the circle mark 302 should exist, and The boundary position between the light part and the dark part is obtained for the seek line 310. The boundary position is the position of the outline of the circle mark 302, and the center of a plurality of boundary positions on the seek line 310 is calculated as the mark center position which is the center of the circle mark 302.
次に、基準マークカメラ 1 5 2が上記 4つのマーク中心位置の中心、すなわち、 4つのマーク中心位置から等距離の位置に位置決めされる。 前述のように、 部品 2 0の装着予定位置が 4つのマーク中心から等距離の位置に設定されているの で、 基準マークカメラ 1 5 2がその装着予定位置の真上に位置決めされて撮像が 行われるのである。 部品 2 0が撮像される場合には、 図 1 1に示すように、 落射 照明装置 2 4 4が消灯されて照明装置 1 5 4が点灯させられ、撮像が実施される。 部品 2 0の裏面に対して斜め方向から照明することにより、 部品 2 0が比較的明 るい像として取得されるが、 実質的に鏡面となっている円マーク 3 0 2の部分の 反射光は基準マークカメラ 1 5 2にほとんど入光しないので、 図 1 3に示すよう に、 円マーク 3 0 2の部分が比較的喑くなる。 したがって、 適切に設定されたし きい値により二値化されれば、 部品 2 0の裏面の像のみが明るい像として取得さ れる。 この画像データに画像処理が実施され、 撮像面内における位置ずれに基づ いて部品 2 0の水平方向位置ずれが取得される。 また、 上記 4つのマーク中心位 置に基づいて検査基板 3 0 0の傾きも算出され、 検查基板 3 0 0の傾きと部品 2 0の傾きとに基づいて部品 2 0の回転方向位置ずれも取得される。 以上で、 1サ イタルの装着位置精度検査作業が終了する。 なお、 検査基板 3 0 0の傾きは、 検 查基板 3 0 0が検査治具 3 0 4を介して配線板保持装置 1 8に保持された後、 多 数の円マーク 4 0 2のうち、 検査基板 3 0 0の二隅あるいは四隅の円マーク 3 0 2の位置が検出され、 その検出結果に基づいて算出されてもよい。 Next, the reference mark camera 152 is positioned at the center of the four mark center positions, that is, at a position equidistant from the four mark center positions. As described above, since the mounting position of the component 20 is set at a position equidistant from the center of the four marks, the fiducial mark camera 152 is positioned just above the mounting position and imaging is performed. It is done. When the component 20 is imaged, as shown in FIG. 11, the epi-illumination device 244 is turned off and the illumination device 154 is turned on, and the imaging is performed. By illuminating the back surface of the component 20 from an oblique direction, the component 20 is obtained as a relatively bright image, but the reflected light of the substantially circular mirror mark 302 is not reflected. Since almost no light enters the fiducial mark camera 15 2, the circle mark 302 becomes relatively long as shown in FIG. Therefore, if the image is binarized by an appropriately set threshold value, only the image on the back surface of the component 20 is obtained as a bright image. Image processing is performed on this image data, and the horizontal displacement of the component 20 is obtained based on the displacement in the imaging plane. Further, the inclination of the inspection board 300 is also calculated based on the four mark center positions, and the rotational displacement of the component 20 in the rotation direction is also calculated based on the inclination of the inspection board 300 and the inclination of the component 20. Is obtained. That is all The work of inspecting the accuracy of the mounting position of the ital is completed. Note that the inclination of the inspection substrate 300 is such that after the inspection substrate 300 is held by the wiring board holding device 18 via the inspection jig 304, of the many circle marks 402, The positions of the circle marks 302 at the two corners or the four corners of the inspection board 300 may be detected, and the positions may be calculated based on the detection results.
図 1 5および図 1 6に、 同一の検査基板 3 0 0を裏面側から撮像した場合の検 出結果 (図 1 5 (a) , (b) ) と、 表面 (部品装着面) 側から撮像した場合の検出結 果 (図 1 6 (a) , (b) ) とを比較して示す。 図 1 5 (a)およぴ図 1 6 (a)において、 部品 2 0の装着位置の水平方向位置ずれの検出結果を装着方向ごとに分けて示 す。 図 1 5 (b)およぴ図 1 6 (b)の棒グラフは、 それら装着位置のばらつきである 3 σを X軸方向と Y軸方向とに分けて示している。  Fig. 15 and Fig. 16 show the detection results (Fig. 15 (a), (b)) when the same test board 300 is imaged from the back side, and the image from the front side (component mounting surface) side. The detection results (Figs. 16 (a) and (b)) are shown in comparison. In FIG. 15 (a) and FIG. 16 (a), the detection results of the horizontal displacement of the mounting position of the component 20 are shown for each mounting direction. The bar graphs in FIG. 15 (b) and FIG. 16 (b) show 3σ, which is the variation in the mounting position, in the X-axis direction and the Y-axis direction.
この図から明らかなように、同じ検査基板 3 0 0の装着精度を検出する場合に、 裏面側から撮像する方が表面 (部品装着面) から撮像する場合に比較してばらつ きが小さく、 検出精度が高いことが解る。  As is clear from this figure, when detecting the mounting accuracy of the same inspection board 300, the variation is smaller when imaging from the back side than when imaging from the front side (component mounting surface). It turns out that the detection accuracy is high.
本実施形態においては、 部品 2 0の装着時に、 部品 2 0の裏面の反射像に基づ いて部品保持位置が取得され、 装着後に再ぴ部品 2 0の裏面が撮像されて装着位 置が検出されるので、 裏面側から撮像する方が表面から撮像する場合に比較して 装着精度をより正当に評価することができる。  In the present embodiment, when the component 20 is mounted, the component holding position is acquired based on the reflection image of the back surface of the component 20, and after mounting, the back surface of the reproduced component 20 is imaged and the mounting position is detected. Therefore, mounting accuracy can be more properly evaluated when imaging from the back side than when imaging from the front side.
なお、 検査基板 3 0 0の裏表を反転させる作業が、 電子回路部品装着機 1 0か ら排出された検査基板 3 0 0に対して行われるようにしてもよい。 具体的には、 例えば、 検査基板 3 0 0に全ての部品 2 0が装着されれば、 プリント配線板 1 4 と同様にして配線板コンペャ 1 6より下流へ搬送され、 一旦電子回路部品装着機 1 0から排出される。 その検查基板 3 0 0が作業者により基板治具 3 0 4に取り 付けられて、 配線板コンペャ 1 6の幅が調節された後に電子回路部品装着機 1 0 の上流側にセットされれば、 再び配線板コンペャ 1 6により装着スペースまで搬 送されて位置決めされる。 また、 基板治具 3 0 4の使用も不可欠ではなく、 使用 されない場合には、 電子回路部品装着機 1 0から配線板コンペャ 1 6よりー且排 出された後、 表裏反転装置により表裏反転させられ、 再び電子回路部品装着機 1 0の作業位置へ搬入されるようにすることも可能であって、 装着位置検査の完全 自動化も可能となる。 また、前記実施形態においては、部品装着機が X Yロボット型とされていたが、 部品装着機は他の態様であってもよく、 例えば、 複数の部品保持ヘッドを間欠回 転体に保持させて部品を装着するいわゆるインデックステーブル型の部品装着機 であってもよレヽ。 The operation of turning over the inspection board 300 may be performed on the inspection board 300 discharged from the electronic circuit component mounting machine 10. Specifically, for example, if all the components 20 are mounted on the inspection board 300, they are conveyed downstream from the wiring board conveyor 16 in the same manner as the printed wiring board 14, and once the electronic circuit component mounting machine is mounted. Emitted from 10 If the inspection board 300 is mounted on a board jig 304 by an operator and the width of the wiring board conveyor 16 is adjusted, the board is set upstream of the electronic circuit component mounting machine 10. It is positioned by being fed transportable to the attachment space by the wiring board Konpeya 1 6 again. The use of the substrate jig 304 is not essential. If not used, the jig is ejected from the wiring board conveyer 16 from the electronic circuit component mounting machine 10 and then turned over by the upside down device. Then, the electronic circuit component mounting machine 10 can be transported again to the work position, and the mounting position inspection can be fully automated. Further, in the above embodiment, the component mounting machine is of the XY robot type. However, the component mounting machine may have another mode. For example, a plurality of component holding heads may be held by an intermittent rotating body. It may be a so-called index table type component mounting machine that mounts components.
以上、 本発明のいくつかの実施形態を説明したが、 これらは例示に過ぎず、 本 発明は、 前記 〔発明が解決しょうとする課題, 課題解決手段および効果〕 の項に 記載された態様を始めとして、 当業者の知識に基づいて種々の変更、 改良を施し た形態で実施することができる。  As described above, some embodiments of the present invention have been described. However, these are merely examples, and the present invention is directed to the aspects described in the section [Problems to be Solved by the Invention, Problem Solving Means and Effects]. Initially, the present invention can be implemented in various modified and improved forms based on the knowledge of those skilled in the art.

Claims

請 求 の 範 囲 The scope of the claims
1 . 電子回路部品装着機によって検査チクプを検査基板に装着し、 その装着位 置を検出することによって、 電子回路部品装着機の装着位置精度を検査する方法 であって、 1. A method for inspecting the mounting position accuracy of an electronic circuit component mounting machine by mounting an inspection chip on an inspection board using an electronic circuit component mounting machine and detecting the mounting position.
前記検査チップの前記検查基板への装着位置を、 検查チップの裏面の位置で検 出する電子回路部品装着機の装着位置精度検査方法。  A method for inspecting the mounting position accuracy of an electronic circuit component mounting machine, wherein a mounting position of the inspection chip on the inspection substrate is detected at a position on a back surface of the inspection chip.
2 . 前記検査チップとして市販の電子回路部品を使用する請求の範囲第 1項に 記載の装着位置精度検査方法。  2. The mounting position accuracy inspection method according to claim 1, wherein a commercially available electronic circuit component is used as the inspection chip.
3 . 前記検査チップを保持ヘッドに保持させ、 その検査チップを撮像すること によって検査チップの前記保持へッドによる保持位置の誤差を取得し、 取得した 保持位置誤差を補正して前記検査基板に装着する請求の範囲第 1項または第 2項 に記載の装着位置精度検査方法。 3. The test chip is held by a holding head, and an image of the test chip is taken to obtain an error of a holding position of the test chip by the holding head, and the obtained holding position error is corrected to be applied to the test substrate. The mounting position accuracy inspection method according to claim 1 or 2, wherein the mounting position is mounted.
4 . 前記保持位置誤差取得のための前記検査チップの撮像を、 検査チップの裏 面について行う請求の範囲第 3項に記載の装着位置精度検查方法。  4. The mounting position accuracy inspection method according to claim 3, wherein the imaging of the inspection chip for acquiring the holding position error is performed on a back surface of the inspection chip.
5 . 前記保持位置誤差取得のための前記検查チップの裏面の撮像を、 その裏面 を照明装置により照明しつつ行う請求の範囲第 4項に記載の装着位置精度検査方 法。  5. The mounting position accuracy inspection method according to claim 4, wherein the imaging of the back surface of the inspection chip for acquiring the holding position error is performed while illuminating the back surface with an illumination device.
6 . 前記検査基板における前記検査チップの装着予定位置の近傍に複数の装着 位置基準マークを設け、 それら装着位置基準マークを基準として検査チップの位 置を検出する請求の範囲第 1項ないし第 5項のいずれかに記載の装着位置精度検 查方法。  6. A plurality of mounting position reference marks near the mounting position of the test chip on the test board, and detecting the position of the test chip based on the mounting position reference marks. The mounting position accuracy detection method according to any of the above items.
7 . 前記装着予定位置を、 前記検查基板の表面上において互いに直交する 2方 向に規則的に並ぶ状態で設定し、 それら複数の装着予定位置に対して前記装着位 置基準マークを複数ずつ設ける請求の範囲第 6項に記載の装着位置精度検查方 法。  7. The planned mounting positions are set in a state where they are regularly arranged in two directions orthogonal to each other on the surface of the inspection substrate, and the plurality of mounting position reference marks are provided for each of the plurality of planned mounting positions. The mounting position accuracy detection method according to claim 6, wherein the method is provided.
8 . 装着時には、 検査基板全体の位置を検出するために検査基板に設けた基板 基準マークの位置を検出し、 その検出した位置に基づいて検查基板の位置誤差を 取得し、 取得した検査基板の位置誤差を補正しつつ前記検查チップを装着する請 求の範囲第 1項ないし第 7項のいずれかに記載の装着位置精度検査方法。 8. At the time of mounting, the position of the board reference mark provided on the test board is detected to detect the position of the entire test board, the position error of the test board is acquired based on the detected position, and the acquired test board is acquired. Contraction for mounting the inspection tip while correcting the position error of the 9. The mounting position accuracy inspection method according to any one of claims 1 to 7.
9 . 前記検査基板を光透過材料製とし、 その検査基板の表面に検査チップを装 着し、 その検査チップを検査基板の裏面側から撮像することにより、 検查チップ の裏面の位置を検出する請求の範囲第 1項ないし第 8項のいずれかに記載の装着 位置精度検査方法。  9. The test substrate is made of a light-transmitting material, a test chip is mounted on the front surface of the test substrate, and the position of the rear surface of the test chip is detected by imaging the test chip from the rear surface side of the test substrate. The mounting position accuracy inspection method according to any one of claims 1 to 8.
' 1 0 . 前記検查基板に両面粘着シートを貼っておき、 その両面粘着シートにより 前記検査チップを検査基板に固定する請求の範囲第 1項ないし第 9項のいずれか に記載の装着位置精度検査方法。  10. The mounting position accuracy according to any one of claims 1 to 9, wherein a double-sided adhesive sheet is pasted on the inspection substrate, and the inspection chip is fixed to the inspection substrate by the double-sided adhesive sheet. Inspection methods.
1 1 . 前記両面粘着シートとして光透過性を有するものを使用する請求の範囲第 1 0項に記載の装着位置精度検査方法。  11. The mounting position accuracy inspection method according to claim 10, wherein a light transmissive sheet is used as said double-sided pressure-sensitive adhesive sheet.
1 2 . 前記検査基板に対する前記検査チップの装着を検査基板の表面を上にした 状態で行い、 その後、 検查基板を表裏反転させることにより、 上方から検査基板 を通して前記検査チップの裏面を撮像する請求の範囲第 1 0項または第 1 1項に 記載の装着位置精度検査方法。  1 2. Mounting the test chip on the test board with the front side of the test board facing up, and then flipping the test board upside down to image the back surface of the test chip from above through the test board 12. The mounting position accuracy inspection method according to claim 10 or 11.
1 3 . 前記検査基板における前記検査チップの装着予定位置の近傍に複数の装着 位置基準マークを設 iナ、 それら複数の装着位置基準マークに対して相対的に定め られた装着位置に前記検查チップを装着し、 その後、 前記複数の装着位置基準マ ークの各々に正対する位置に撮像装置を位置決めして各装着位置基準マークを撮 像することにより各装着位置基準マークの位置を取得し、 それら複数の装着位置 基準マークの位置に基づいて決まる装着位置に正対する位置に撮像装置を位置決 めして前記検査チップを撮像する請求の範囲第 9項ないし第 1 2項のいずれかに 記載の装着位置精度検査方法。  13. A plurality of mounting position reference marks are set in the inspection board near the mounting position of the test chip, and the inspection is performed at mounting positions relatively determined with respect to the plurality of mounting position reference marks. After mounting the chip, the imaging device is positioned at a position directly facing each of the plurality of mounting position reference marks, and the position of each mounting position reference mark is obtained by imaging each mounting position reference mark. 13. The imaging device according to claim 9, wherein the imaging device is positioned at a position directly opposite to the mounting position determined based on the positions of the plurality of mounting positions and the reference marks, and the test chip is imaged. Inspection position accuracy inspection method.
1 4 . 前記各装着位置基準マークの撮像時には落射照明により各装着位置基準マ ークを照明する請求の範囲第 1 3項に記載の装着位置精度検査方法。  14. The mounting position accuracy inspection method according to claim 13, wherein each mounting position reference mark is illuminated by epi-illumination when the mounting position reference mark is imaged.
1 5 . 前記検査チップの撮像には前記検査基板の表面に対して傾斜した方向から 検查チップを照明する請求の範囲第 1 4項に記載の装着位置精度検査方法。 15. The mounting position accuracy inspection method according to claim 14, wherein the imaging of the inspection chip is performed by illuminating the inspection chip from a direction inclined with respect to the surface of the inspection substrate.
1 6 . 前記検査基板の表面に前記検査チップを装着する際に、 検査基板をその検 查基板の表面が上になる状態で基板保持装置に保持させる請求の範囲第 9項ない し第 1 5項のいずれかに記載の装着位置精度検査方法。 16. The mounting method according to claim 9, wherein when mounting the inspection chip on the surface of the inspection substrate, the inspection substrate is held by the substrate holding device with the inspection substrate facing upward. Item 5. The mounting position accuracy inspection method according to any one of the above items.
1 7 . 前記検査チップを裏面側から撮像する際に、 前記検査基板を前記基板保持 装置に前記表面が下になる状態で保持させて上方から撮像する請求の範囲第 1 6 項に記載の装着位置精度検査方法。 17. The mounting according to claim 16, wherein, when imaging the inspection chip from the back side, the inspection substrate is held by the substrate holding device with the front side down, and imaging is performed from above. Position accuracy inspection method.
1 8 . 前記検査基板の表面に前記検査チップを装着する際に、 前記検査基板に設 けた少なくとも 1つの基板基準マークを撮像装置により上方から撮像して検査基 板の位置誤差を取得し、 その位置誤差を補正して前記検査チップを検査基板に装 着し、 その検査基板を表裏反転させた状態で前記基板保持装置に保持させ、 前記 撮像装置により前記検查チップの裏面を前記検査基板を通して撮像することによ り検査チップの位置を検出する請求の範囲第 1 7項に記載の装着位置精度検査方 法。  18. At the time of mounting the test chip on the surface of the test substrate, at least one substrate fiducial mark provided on the test substrate is imaged from above by an imaging device to obtain a position error of the test substrate, and A position error is corrected, the test chip is mounted on a test board, and the test board is held by the board holding device in a state where the test board is turned upside down, and the back surface of the test chip is passed through the test board by the imaging device. 18. The mounting position accuracy inspection method according to claim 17, wherein the position of the inspection chip is detected by imaging.
1 9 . 前記検査基板を表裏反転させた状態で前記基板保持装置に保持させる際、 検査基板と基板保持部材との間に保持治具を介在させ、 その保持治具として、 前 記撮像装置の焦点が、 前記基板基準マークの撮像時にも前記検査チップの撮像時 にも前記検査基板の表面上に位置する状態に前記検查基板を保持するものを使用 する請求の範囲第 1 8項に記載の装着位置精度検査方法。  1 9. When holding the inspection substrate in the substrate holding device in a state where the inspection substrate is turned upside down, a holding jig is interposed between the inspection substrate and the substrate holding member. 19. The apparatus according to claim 18, wherein a focus is used to hold the inspection substrate so that the focal point is located on the surface of the inspection substrate both when imaging the substrate reference mark and when imaging the inspection chip. Inspection position accuracy inspection method.
2 0 . 電子回路部品装着機によって検査チップを検查基板に装着し、 その装着位 置を検出することによって、 電子回路部品装着機の装着位置精度を検査するため の装置であって、  20. An apparatus for inspecting the mounting position accuracy of an electronic circuit component mounting machine by mounting an inspection chip on a test board by an electronic circuit component mounting machine and detecting the mounting position.
光透過材料製の平板であって、 表面に複数の装着予定位置が設定されるととも に、 それら装着予定位置毎に複数ずつの装着位置基準マークが設けられた検查基 板と、  A test board, which is a flat plate made of a light transmitting material, on which a plurality of mounting positions are set on the surface and a plurality of mounting position reference marks are provided for each of the mounting positions;
その検査基板の表面の前記装着予定位置に装着された検査チップの裏面と前記 複数ずつの装着位置基準マークとを、 前記検査基板の裏面側から撮像可能な撮像 装置と、  An imaging device capable of imaging the back surface of the test chip mounted on the mounting position on the front surface of the test board and the plurality of mounting position reference marks from the back side of the test board;
その撮像装置に前記装着位置基準マークを撮像させるととともに、 前記検查チ ップを撮像させ、 その撮像の結果に基づいて前記電子回路部品装着機の装着位置 精度を取得する装着位置精度取得部と  A mounting position accuracy acquisition section for causing the imaging device to image the mounting position reference mark and imaging the inspection chip, and acquiring the mounting position accuracy of the electronic circuit component mounting machine based on a result of the imaging; When
を含む電子回路部品装着機の装着位置精度検査装置。 A mounting position accuracy inspection device for electronic circuit component mounting machines, including:
2 1 . 電子回路部品を供給する部品供給装置と、 回路基板を保持する基板保持装置と、 2 1. A component supply device that supplies electronic circuit components, A board holding device for holding a circuit board,
保持へッドにより前記部品供給装置から電子回路部品を受け取り、 前記回路基 板保持装置に保持された回路基板に装着する部品装着装置と、  A component mounting device that receives an electronic circuit component from the component supply device by a holding head, and mounts the electronic circuit component on a circuit board held by the circuit board holding device;
前記回路基板に設けられた基板基準マークを撮像する撮像装置と  An imaging device for imaging a substrate fiducial mark provided on the circuit board;
を含む電子回路部品装着機であって、 An electronic circuit component mounting machine comprising:
平板状をなし、 複数の装着予定位置が設定されるとともに、 それら装着予定位 置毎に複数ずつの装着位置基準マークが設けられ、 前記回路基板保持装置に保持 される検査基板と、  An inspection board, which has a flat plate shape, is provided with a plurality of planned mounting positions, is provided with a plurality of mounting position reference marks for each of the planned mounting positions, and is held by the circuit board holding device;
前記保持へッドに検査チップを保持させ、 前記装着予定位置の各々に装着させ る検查チップ装着制御部と、  A test chip mounting controller for holding the test chip on the holding head and mounting the test chip at each of the mounting positions;
その検査チップが装着された検査基板が表裏反転して前記回路基板保持装置に 保持された状態で、 その検査基板の裏面側からその検查基板を通して前記撮像装 置に前記装着位置基準マークを撮像させるととともに、 その検查基板に装着され た前記検査チップの裏面を撮像させ、 その撮像の結果に基づいて当該電子回路部 品装着機の装着位置精度を取得する装着位置精度取得部と  In a state where the test board on which the test chip is mounted is turned upside down and held by the circuit board holding device, the mounting position reference mark is imaged on the image pickup device through the test board from the back side of the test board. And a mounting position accuracy obtaining unit for obtaining the mounting position accuracy of the electronic circuit component mounting machine based on a result of the imaging by imaging the back surface of the test chip mounted on the inspection board.
を含む電子回路部品装着機。 Electronic circuit component mounting machine.
PCT/JP2003/010803 2002-08-29 2003-08-26 Electronic cicuit part mounting machine and mounting position accuracy inspection method for the mounting machine WO2004021760A1 (en)

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CN108279034A (en) * 2018-02-13 2018-07-13 上海微世半导体有限公司 It is a kind of two-sided to bit platform
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TWI777740B (en) * 2021-08-23 2022-09-11 鴻勁精密股份有限公司 Correction apparatus, correction method, and handler using the same

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