FR3004582B1 - SYSTEM AND METHOD FOR OPTICALLY INSPECTING ELECTRONIC CIRCUITS - Google Patents

SYSTEM AND METHOD FOR OPTICALLY INSPECTING ELECTRONIC CIRCUITS

Info

Publication number
FR3004582B1
FR3004582B1 FR1353275A FR1353275A FR3004582B1 FR 3004582 B1 FR3004582 B1 FR 3004582B1 FR 1353275 A FR1353275 A FR 1353275A FR 1353275 A FR1353275 A FR 1353275A FR 3004582 B1 FR3004582 B1 FR 3004582B1
Authority
FR
France
Prior art keywords
electronic circuits
optically inspecting
inspecting electronic
optically
circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1353275A
Other languages
French (fr)
Other versions
FR3004582A1 (en
Inventor
Remi Gerbelot
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
VIT SAS
Original Assignee
VIT SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by VIT SAS filed Critical VIT SAS
Priority to FR1353275A priority Critical patent/FR3004582B1/en
Publication of FR3004582A1 publication Critical patent/FR3004582A1/en
Application granted granted Critical
Publication of FR3004582B1 publication Critical patent/FR3004582B1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95684Patterns showing highly reflecting parts, e.g. metallic elements
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages
    • H05K13/081Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0815Controlling of component placement on the substrate during or after manufacturing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N2021/95638Inspecting patterns on the surface of objects for PCB's
FR1353275A 2013-04-11 2013-04-11 SYSTEM AND METHOD FOR OPTICALLY INSPECTING ELECTRONIC CIRCUITS Active FR3004582B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR1353275A FR3004582B1 (en) 2013-04-11 2013-04-11 SYSTEM AND METHOD FOR OPTICALLY INSPECTING ELECTRONIC CIRCUITS

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
FR1353275A FR3004582B1 (en) 2013-04-11 2013-04-11 SYSTEM AND METHOD FOR OPTICALLY INSPECTING ELECTRONIC CIRCUITS
KR1020157030835A KR20150140704A (en) 2013-04-11 2014-04-09 System and method for optical inspection of electronic circuits
PCT/FR2014/050853 WO2014167248A1 (en) 2013-04-11 2014-04-09 System and method for optical inspection of electronic circuits
US14/783,491 US20160054237A1 (en) 2013-04-11 2014-04-09 System and method for optical inspection of electronic circuits
EP14720669.2A EP2984913A1 (en) 2013-04-11 2014-04-09 System and method for optical inspection of electronic circuits

Publications (2)

Publication Number Publication Date
FR3004582A1 FR3004582A1 (en) 2014-10-17
FR3004582B1 true FR3004582B1 (en) 2015-04-10

Family

ID=48856819

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1353275A Active FR3004582B1 (en) 2013-04-11 2013-04-11 SYSTEM AND METHOD FOR OPTICALLY INSPECTING ELECTRONIC CIRCUITS

Country Status (5)

Country Link
US (1) US20160054237A1 (en)
EP (1) EP2984913A1 (en)
KR (1) KR20150140704A (en)
FR (1) FR3004582B1 (en)
WO (1) WO2014167248A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3041111B1 (en) * 2015-09-15 2017-09-15 Vit CALIBRATION OR TEST MIRROR
CN105509663B (en) * 2016-02-17 2019-12-27 京东方光科技有限公司 Backlight flatness detection system and detection method
FR3059423B1 (en) 2016-11-29 2020-05-29 Vit SYSTEM AND METHOD FOR OPTICAL POSITIONING AND INSPECTION OF AN OBJECT
WO2022074720A1 (en) * 2020-10-05 2022-04-14 ヤマハ発動機株式会社 Substrate work apparatus

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1353275A (en) 1963-04-01 1964-02-21 Nuclear Power Plant Co Ltd Watertight concrete box
JP2001153640A (en) * 1999-11-29 2001-06-08 Anritsu Corp Printed circuit board inspection device
JP3729156B2 (en) * 2002-06-07 2005-12-21 株式会社日立製作所 Pattern defect detection method and apparatus
JP4224268B2 (en) * 2002-08-29 2009-02-12 富士機械製造株式会社 Electronic circuit component mounting machine, and mounting position accuracy inspection method and apparatus for the same
JP4516567B2 (en) * 2004-04-30 2010-08-04 富士機械製造株式会社 Printed circuit board support device
JP4654022B2 (en) * 2004-12-24 2011-03-16 株式会社サキコーポレーション Substrate visual inspection device
JP2007311711A (en) * 2006-05-22 2007-11-29 Anritsu Corp Substrate backup device, printing solder inspection apparatus provided therewith, and method
US20100027873A1 (en) * 2006-08-28 2010-02-04 I-Pulse Kabushiki Kaisha Board appearance inspection method and device
FR2963144B1 (en) * 2010-07-26 2012-12-07 Vit OPTICAL INSPECTION INSTALLATION OF ELECTRONIC CIRCUITS

Also Published As

Publication number Publication date
KR20150140704A (en) 2015-12-16
US20160054237A1 (en) 2016-02-25
EP2984913A1 (en) 2016-02-17
WO2014167248A1 (en) 2014-10-16
FR3004582A1 (en) 2014-10-17

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