M414586 五、新型說明： 【新型所屬之技術領域】 本創作係一種對位校正檢知 ,c ^ Λ 知裝置，尤指—種於觸控面 板接受探針卡檢測時，可檢知 μ上 j钿知觸控面板的檢測區是否盥摄 針卡的探針對應的對位校正檢知裝置。 、 【先前技術】 目前市佔率較高的觸控面板為電容式與電阻式兩種，M414586 V. New description: [New technical field] This creation is a kind of alignment correction detection, c ^ Λ knowing device, especially when the touch panel is tested by probe card, it can detect μ It is known whether the detection area of the touch panel corresponds to the alignment correction detecting device corresponding to the probe of the needle card. [Prior Art] At present, the touch panel with high market share is capacitive and resistive.
皆以導電玻璃作為感應單元，A /、中電谷式觸控面板係利用 使用者手指觸控時’電容式觸控面板的感應單元會產生電 容變化…卜電阻式觸控面板係於使用者手指觸控 阻式觸控面板的感應單元會產生電壓變化，觸控產生的辦 :訊號透過導線輸出至一運算單元，#由該運算單元可二 算出使用者手指觸控的位置。 ° 前述之觸控面板係利用探針式的測試儀器測試導電玻 璃與導線之間是否導通，其中，待測試的觸控面板放置於 測試儀器的測試區巾’測試儀器的升降裝置帶動探針卡移 動，使探針卡的探針接觸觸控面板上的導線，並電連接产 測觸控面板的導電玻璃是否與導線導通。 双 然上述中，測試儀器若對位校正不精確’造成探針I 法與觸控面板的導線接觸’檢測誤差A，造成檢測所得： 觸控面板不良率高，因此如何得知探針是否與觸控面板 導線對位以便於後續檢測，為業界急於解決的問題。 【新型内容】 本創作之主要目的在於提供一種對位校正檢知裝置， M414586 希藉此設計’改善目前觸控面板於探針檢測時》無法判別 探針與導線是否對位，造成檢測所得之不良率高的問題。 為達成前揭目的，本創作所設計之對位校正檢知裝i ，其係設於檢測觸控面板的測試儀器上，該對位校正檢知 裝置包含一載板，該載板具有相對的第一側面與第二側面 ’第一側面係鄰近待測試觸控面板，以及該載板上貫設才八 知孔’並於第二側面外設置對應檢知孔的影像感測件，影 像感測件係用於檢知測試儀器上的探針與待測試觸控面板 之導線的對位狀態。 丄丫 — 黑儿 位於該載板的第一側面外，以及測試儀器的探針與觸控面 板上配合探針的導線落於載板的檢知孔’影像感測件於探 針下壓接觸觸控面板的導線前，可檢知探針與導線是否對 位，檢知訊號傳送至電性連接的一控制單元，讓該=制單 元驅動一升降裝置使觸控面板上移接觸探針，或者=動I 平移裝置調整觸控面板的位置使其與探針對位，該對位护 正檢知裝置於探針接觸觸控面板的導線前，可檢知探針^ 導線的對位關係'’進而提高對位的精確性，確保探針可接 觸導線並進行後續檢測，降低對位錯誤所產生的不良率。 【實施方式】 〃請參閱圖1，為本創作對位校正檢知裝置之一較 把例，其係設於檢測觸控面板4〇的 知觸控面…的導線與測試儀器上：探儀:二用於檢 。 叼刼針23是否對位 該载板10具有 該對位校正檢知裝置包含一載板1〇 M414586 相對的第一側面 .'”叫η係鄰 I待測試觸控面板40，該載板1 〇上貫設檢知 ^ 1 3，並於 弟二側面12外設置對應檢知孔13的影像感測件14，與 像感測件14可透過檢知孔13 ’檢知測試儀器上的探針23 與待測試觸控面板40之導線的對位狀態。 上述中，該對位校正檢知裝置包含有一載座15，1 _ ’遠載 座15内設有一裝配室16，並於該载座15上形成—開口 ，該載板1〇跨設於該載座15上並位於開口處，所述二 感測件14位於該載座15的裝配室16中， L衫 王10 丫，益可拍攝取得 檢知孔1 3處導線與探針23的對位影像。 請參閱® 2所示之測試儀器，其係、包括有一機二 該機台2〇上設有一探針+ 21，以及該機台20 — ^有 一對位校正鏡頭22 ,且同側外設有一 χγζ工 又> γ \/ *y ' Q O U 5 …3〇的台面上提供對位校正檢知裝置設置，， xyz工作台3〇可受控於— 1叹置，邊The conductive glass is used as the sensing unit, and the A /, the Zhongdian Valley touch panel is touched by the user's finger. The sensing unit of the capacitive touch panel generates a capacitance change... The resistive touch panel is attached to the user. The sensing unit of the finger touch resistive touch panel generates a voltage change, and the touch generation process: the signal is output to an arithmetic unit through the wire, and the computing unit can calculate the position touched by the user's finger. ° The aforementioned touch panel tests whether the conductive glass and the wire are electrically connected by using a probe type test instrument, wherein the touch panel to be tested is placed in the test area of the test instrument, and the lifting device of the test instrument drives the probe card. Moving, the probe of the probe card contacts the wire on the touch panel, and is electrically connected to the conductive glass of the touch panel to be electrically connected to the wire. In the above case, if the calibration of the test instrument is inaccurate, causing the probe I method to contact the wire of the touch panel, the detection error A causes the detection result: the touch panel has a high defect rate, so how to know whether the probe is The alignment of the touch panel wires for subsequent detection is an urgent problem for the industry. [New content] The main purpose of this creation is to provide a registration correction detection device. The M414586 is designed to improve the current touch panel when the probe is detected. It is impossible to determine whether the probe and the wire are aligned, resulting in detection. The problem of high defect rate. In order to achieve the foregoing, the alignment correction detection device i designed by the present invention is disposed on a test instrument for detecting a touch panel, and the alignment correction detecting device comprises a carrier plate having opposite sides. The first side and the second side of the first side are adjacent to the touch panel to be tested, and the image sensor is disposed on the carrier and the image sensing member corresponding to the detecting hole is disposed outside the second side. The test piece is used to detect the alignment state of the probe on the test instrument and the wire of the touch panel to be tested.丄丫—The black child is located outside the first side of the carrier, and the probe of the test instrument and the wire of the touch panel with the probe are dropped on the detection hole of the carrier. Before the wire of the touch panel, it can be detected whether the probe and the wire are aligned, and the detection signal is transmitted to a control unit electrically connected, so that the = unit drives a lifting device to move the touch panel up and contact the probe. Or = the I translation device adjusts the position of the touch panel to align with the probe, and the alignment protection detecting device can detect the alignment relationship of the probe ^ wire before the probe contacts the wire of the touch panel. 'In turn, the accuracy of the alignment is improved, and the probe can be contacted with the wire for subsequent detection, thereby reducing the defect rate caused by the alignment error. [Embodiment] Please refer to FIG. 1 , which is a comparative example of a matching alignment detecting device, which is disposed on a wire and a test instrument for detecting a touch surface of the touch panel 4: a probe : Two for inspection. Whether the cymbal 23 is aligned or not, the carrier 10 has the alignment correction detecting device including a first side opposite to the carrier 1 〇 M 414 586. The η-based I-to-test touch panel 40 is called the carrier 1 The image detecting member 14 corresponding to the detecting hole 13 is disposed on the side of the second side 12 of the second side, and the image sensing member 14 is permeable to the detecting hole 13 to detect the detecting on the test instrument. In the above, the alignment correction detecting device includes a carrier 15 , 1 _ ' The seat 15 is formed with an opening, the carrier plate 1 is spanned on the carrier 15 and located at the opening, and the two sensing members 14 are located in the assembly chamber 16 of the carrier 15, and the L-shirt king is 10 The image of the alignment of the lead wire and the probe 23 can be photographed. Please refer to the test instrument shown in the ® 2, which includes a machine 2, a probe + 21 on the machine 2, and The machine 20 - ^ has a pair of bit correction lens 22, and the same side peripheral has a χ ζ 又 又 γ γ / / / Q Q Q 提供 提供 提供 提供 提供 提供 提供 提供 提供 提供 提供 提供 提供Detecting device settings, xyz table 3 〇 can be controlled by - 1 sigh, side
+移裝置與-升降裝置，可做 検向及上下移動，且進一步 TU 主肩機台20之探針卡21 方’其中’升降裝置、對位校正鏡頭2 pV .0 » . . * 移裝> 置 Si -¾ 感測件14皆電性連接—控制單元。 /、〜像 其中，該測試儀器先進行對位 3,放置於對位校正檢知裝置的載板iq上業’先將-樣板 正鏡頭22移動至中央位置，χ 以及該對位校+ Shift device and - lifting device, can be moved up and down, and further TU main shoulder machine 20 probe card 21 side 'where' lifting device, alignment correction lens 2 pV .0 » . . * Mobile > The Si -3⁄4 sensing member 14 is electrically connected - the control unit. /, ~, where the test instrument is first aligned 3, placed on the carrier iq of the alignment correction detection device, first moving the template positive lens 22 to the central position, χ and the alignment
31上的第-校正點Α I 罚主對位权正鐘海9 9 ώΑ nr + ,. 測偏移距離並讓對位校正鏡頭==，檢 行校正，讓樣接著針對W工作台3〇進 的第—校正點A與第二校正點B分別 5 至 得之第—位校正鏡頭22的下方，利用對位校正鏡頭22取 校正點A與第二校正點B的偏移距離對χγ7 作台30進行校正調整。 月參閱圖3所示，於對位校正鏡頭22肖χγ 上配八的利用導引柱插入探針卡21 # ΧΥΖ工作台30 於機位孔，使探針卡21對位後便將探針卡d鎖固 工作:上’完成探針卡21的對位作業後，再將χγζ :#多動出來’使樣板31上的第一校正點Α再 動至對位校正镑頭Μ +丄 位置，… 置’紀錄第一校正點八的 作業。彳偏移則進行補償’即完成測試儀器的對位校正 π參閱圖4所示，待測試 置於該ΧΥΖ工作二30的^ 板40係對位地被 移裝置帶動而二 ，XYZ工作台30受到平 罝帶動而移動至探針卡21下 科 30的對位校正檢 又； Ζ工作台 待測試之觸控面板4:广步利用影像感測件14檢知 對位，並將檢h Μ 與探针卡21的探針23是否 位，控制單元雖#工 冤性連接的控制單元，若未對 帝J早兀軀動平移裝置調整χγζ工 探針23對位，炷旦/你# 作D 3〇使導線與 對位，待影像感測件14檢 制單元後，_ f 的對位訊號傳送至控 控制早疋驅動升降裝置帶動χγζ 移，使探針23盥對ys 0 g ^ 工作台30上 ”對應的導線壓觸，並 綜上所述’該對位校正檢知裝置檢測。 可執行再次確切、的叙你 。又置於踯試儀器中， 崎w的動作’以彌補對位校正 。 對位杈正誤差’對位校正檢知裝置 、’則5式儀益的 的'5V像感娜件1 4可直 呢 4586 接檢知探針與觸控面板4。上的導線是否對位，待確認對 位後才使探針23下難觸導線，藉由提高探針23與導線 的對位精確性，使探針23確實接觸導線而利於後續檢測 ’以降低觸控面板以往因對位誤差所產生的不良率。 【圖式簡單說明】 T ^ 仅正檢知裝置配合觸動面板與探針 卡之一較佳實施例之側視示意圖。The first correction point on 31 Α I penalty main alignment right Zhong Hai 9 9 ώΑ nr + ,. Measure the offset distance and let the alignment correction lens ==, check the correction, let the sample then target the W workbench 3〇 The first correction point A and the second correction point B are respectively 5 to the lower of the position correction lens 22, and the offset distance of the correction point A and the second correction point B is taken by the alignment correction lens 22 to χγ7. The stage 30 performs correction adjustment. Referring to FIG. 3, the probe is inserted into the probe hole 21 by using the guide post on the alignment correcting lens 22, and the probe is inserted into the position hole, so that the probe card 21 is aligned and the probe is placed. Card d locking work: After completing the alignment operation of the probe card 21, the χγζ : #多动出' will move the first correction point 样 on the template 31 to the alignment correction Μ Μ 丄 丄 position ,... Set the job of recording the first correction point eight.彳 offset is compensated 'that is, the alignment correction of the test instrument is completed π. As shown in FIG. 4, the board 40 to be tested placed in the ΧΥΖ work 2 is driven by the shifting device, and the XYZ table 30 is used. The alignment correction of the probe 30 is performed by the flat button, and the touch panel 4 to be tested is: the step sensor 4 detects the alignment using the image sensing component 14 and checks the h Whether the probe 23 of the probe card 21 is in position or not, the control unit is not connected to the control unit of the industrial connection, and if the adjustment of the χ ζ ζ 探针 探针 探针 探针 探针 探针 炷 炷 炷 炷 炷 炷 炷 炷 炷 炷 炷D 3 〇 导线 导线 导线 导线 导线 导线 导线 导线 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像On the table 30, the corresponding wire is pressed, and in summary, the 'alignment correction detection device detects. You can execute the exact one again. You are placed in the test instrument, and the action of the k-s Bit correction. Alignment correction error 'alignment correction detection device, '5 type yiyi's 5V image sense 1 4 can be straight 4586 connected to the detection probe and touch panel 4. Whether the wire on the alignment is aligned, after the alignment is confirmed, the probe 23 is difficult to touch the wire, by improving the alignment of the probe 23 and the wire. Accuracy, so that the probe 23 does contact the wire for subsequent detection' to reduce the defect rate caused by the past error of the touch panel. [Simple diagram] T ^ Only the detection device cooperates with the touch panel and the probe A side view of a preferred embodiment of the card.
體电^為本創作對位校正檢知裝置設置於測試儀器之立 肋^丑5不意圖。 圖 位操作俯視為本創作對位校正檢知裳置設置於測試儀器之對 示意圖 圖 測側視示意:本創作對位校正檢知裝置設置於測試儀器之檢The body power is the original alignment correction detection device set in the test instrument. The image bit operation is a view of the creation of the alignment correction detection set on the test instrument. The schematic view shows the side view: the creation of the alignment correction detection device is set in the test instrument
【主要元件符號說明】 1Q栽板 1 2第二側面 1 4景> 像感測件 16裝配室 21探針卡 23探針 31樣板 A第一校正點 11第一側面 13檢知孔 1 5載座 20機台 2 2對位校正鏡頭 30 XYZ工作台 40觸控面板 B第二校正點 7[Description of main component symbols] 1Q planting board 1 2 second side 1 4 scenes> Image sensing unit 16 Assembly chamber 21 Probe card 23 Probe 31 Template A First correction point 11 First side 13 Detection hole 1 5 Carrier 20 machine 2 2 alignment correction lens 30 XYZ table 40 touch panel B second calibration point 7