TWI769847B - Operating mechanism having stacking sensing unit, operating apparatus, and operating machine using the same - Google Patents

Operating mechanism having stacking sensing unit, operating apparatus, and operating machine using the same Download PDF

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TWI769847B
TWI769847B TW110120255A TW110120255A TWI769847B TW I769847 B TWI769847 B TW I769847B TW 110120255 A TW110120255 A TW 110120255A TW 110120255 A TW110120255 A TW 110120255A TW I769847 B TWI769847 B TW I769847B
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detection unit
carrier
working
stacking detection
channel
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TW110120255A
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Chinese (zh)
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TW202248104A (en
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蔡志欣
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鴻勁精密股份有限公司
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Abstract

The present invention reveals an operating mechanism having stacking sensing unit, including a carrier, an operator, and a stacking sensing unit. The carrier is movable along a first direction, having a receiving portion. The operator has a pole extending passing through the receiving portion and an operating portion for processing a predetermined operation on an electronic component. The stacking sensing unit has a detector disposed on the carrier, and a passage formed on the carrier or the operator. The detector and the passage are located correspondingly, such that the detector is capable of beaming through the passage. When stacking occurs, the operating portion is abutted and pressed to an overhead portion, cutting off the beam of the detector. Thus, the stacking sensing unit can report stacking timely, improving yield rate and efficiency of electronic component operation.

Description

具疊料檢知單元之工作機構及其應用之作業裝置、作業機Working mechanism with stack detection unit and working device and working machine for its application

本發明提供一種即時檢知承置器是否異常疊料之疊料檢知單元。The present invention provides a stacking detection unit for instantly detecting whether a holder is abnormally stacked.

在現今,電子元件測試裝置以壓接器將電子元件移入測試器而執行測試作業,若測試器內殘留上一電子元件,當壓接器將下一電子元件移入測試器時,勢必壓損下一電子元件;因此,測試裝置設置取像器以取像測試器是否異常疊料。In today's electronic component testing device, the crimper moves the electronic component into the tester to perform the test operation. If there is an electronic component left in the tester, when the crimper moves the next electronic component into the tester, the pressure loss is bound to drop. An electronic component; therefore, the test device is provided with an imager to take the image of whether the tester is abnormally stacked.

請參閱圖1,測試裝置於機台11設置一具探針之測試座12,以供承置及測試電子元件,另於測試座12之上方設置壓接器13,壓接器13作Y-Z方向位移,並具有吸嘴131,利用吸嘴131於載台14與測試座12間移載電子元件,另於測試座12上方之機架15裝配一取像器16,於初始執行測試作業或重新開機時 ,取像器16取像測試座12內是否殘留電子元件。 Please refer to FIG. 1 , the test device is provided with a test seat 12 with probes on the machine table 11 for holding and testing electronic components, and a crimper 13 is arranged above the test seat 12 , and the crimper 13 is in the Y-Z direction Displacement, and has a suction nozzle 131, and the suction nozzle 131 is used to transfer electronic components between the stage 14 and the test seat 12, and an imager 16 is installed on the frame 15 above the test seat 12. when booting , and the imager 16 captures whether there are any remaining electronic components in the test seat 12 .

惟,取像器16固設於機架15,於取像檢查時,必須控制壓接器13離開測試座12之正上方,方可供取像器16取像測試座12,取像完畢後,再控制壓接器13將下一電子元件移入測試座12,由於此一檢知作動時序繁瑣耗時,工作人員僅於初始執行測試作業或重新開機時,方才以取像器16取像測試座12內是否殘留電子元件,以致測試作業過程中,若測試座12殘留有上一電子元件,工作人員因無法立即得知測試座12發生異常疊料狀況,當壓接器13將下一電子元件移入測試座12時,即會壓損下一電子元件,並降低電子元件之良率。However, the imager 16 is fixed on the frame 15. When the imager is inspected, the crimper 13 must be controlled to leave directly above the test seat 12 so that the imager 16 can take the image of the test seat 12. , and then control the crimper 13 to move the next electronic component into the test seat 12. Since this detection operation sequence is cumbersome and time-consuming, the staff only uses the imager 16 to take the image test when the test operation is initially performed or when the machine is restarted. Whether there are any remaining electronic components in the seat 12, so that during the test operation, if there is a previous electronic component remaining in the test seat 12, the staff cannot immediately know the abnormal stacking condition of the test seat 12. When the component is moved into the test seat 12, the next electronic component will be damaged by pressure, and the yield of the electronic component will be reduced.

本發明之目的一,提供一種具疊料檢知單元之工作機構,包含承載具、作動具及疊料檢知單元,承載具作至少一方向位移,並設有至少一容置部,作動具之桿體穿置於承載具之容置部,並以作業部件對電子元件執行預設作業,疊料檢知單元於承載具設有至少一可投射光束之檢知器,並於承載具或作動具相對應檢知器之位置設有至少一通道,以供通過檢知器投射之光束;藉以作動具於承置器執行預設作業時而由預設位置反向位移至過當位置,檢知器於投射至通道之光束呈遮斷狀態而可迅速檢知承置器異常疊料,以利即時排除異常,並提高電子元件良率。The first object of the present invention is to provide a working mechanism with a stacking detection unit, including a carrier, an actuating tool, and a stacking detection unit. The carrier is displaced in at least one direction, and is provided with at least one accommodating portion for the actuating tool. The rod body is passed through the accommodating part of the carrier, and the operation parts are used to perform preset operations on the electronic components. The position of the actuator corresponding to the detector is provided with at least one channel for the light beam projected by the detector, so that the actuator is reversely displaced from the preset position to the excessive position when the receiver performs the preset operation, and the detection is performed. When the light beam projected to the channel is blocked, the detector can quickly detect the abnormal stacking of the holder, so as to eliminate the abnormality immediately and improve the yield of electronic components.

本發明之目的二,提供一種作業裝置,包含至少一承置器及本發明工作機構,至少一承置器以供承置電子元件,本發明工作機構包含承載具、作動具及疊料檢知單元,承載具載送作動具及疊料檢知單元作至少一方向位移 ,作動具於承載具上作Z方向位移,並於承置器執行預設作業,疊料檢知單元以供檢知承置器是否異常疊料,以利即時排除異常,並提高電子元件良率。 The second objective of the present invention is to provide a working device, which includes at least one holder and a working mechanism of the present invention, at least one holder for holding electronic components, and the working mechanism of the present invention includes a carrier, an actuating tool, and a stacking detector. The unit, the carrier carrying actuating tool and the stacking detection unit are displaced in at least one direction , the actuator is displaced in the Z direction on the carrier, and the preset operation is performed on the holder, and the stacking detection unit is used to detect whether the holder is abnormally stacked, so as to facilitate immediate elimination of abnormalities and improve the quality of electronic components. Rate.

本發明之目的三,提供一種作業機,包含機台、至少一作業裝置及中央控制裝置,至少一作業裝置配置於機台,並設有至少一承置器及本發明工作機構,至少一承置器以供承置電子元件,本發明工作機構包含承載具、作動具及疊料檢知單元,以於承置器執行預設作業,並檢知承置器是否異常疊料 ,以利即時排除異常,而提高電子元件良率;中央控制裝置以控制及整合各裝置作動而執行自動化作業。 The third object of the present invention is to provide a working machine, comprising a machine base, at least one working device and a central control device, at least one working device is arranged on the machine base, and is provided with at least one holder and the working mechanism of the present invention, at least one support The setter is used for holding electronic components. The working mechanism of the present invention includes a supporter, an actuating tool and a stacking detection unit, so as to perform a preset operation on the setter and detect whether the setter is abnormally stacked. , in order to eliminate abnormalities in real time and improve the yield of electronic components; the central control device controls and integrates the actions of each device to perform automatic operations.

為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:In order to make your examiners further understand the present invention, hereby give a preferred embodiment and cooperate with the drawings, the details are as follows:

請參閱圖2、3,本發明工作機構20之第一實施例包含承載具21、作動具22及疊料檢知單元。Please refer to FIGS. 2 and 3 , the first embodiment of the working mechanism 20 of the present invention includes a carrier 21 , an actuating tool 22 and a stacking detection unit.

承載具21作至少一方向位移,並設有至少一容置部;更進一步,容置部平行作業軸線L或沿作業軸線L設置,承載具21可為移料器之承載具、浮動器之承載具或打印器之承載具等,承載具21包含至少一板件,並於至少一板件設有容置部,於本實施例,承載具21為移料器之承載具,包含第一板件211及第二板件212,承載具21之至少一容置部包含於第一板件211設有至少一第一容置部,至少一第一容置部包含複數個平行於作業軸線L之第一容置部2111,第一容置部2111呈Z方向配置,其兩端相通第一板件211之頂面及底面,第二板件212裝配於第一板件211之頂面,並連接一移動臂213,移動臂213帶動承載具21作至少一方向位移,即帶動第一板件211及第二板件212作X-Y-Z方向位移。The carrier 21 is displaced in at least one direction, and is provided with at least one accommodating portion; further, the accommodating portion is arranged parallel to the operation axis L or along the operating axis L, and the carrier 21 can be a carrier for a feeder or a carrier for the floater. A carrier or a carrier of a printer, etc., the carrier 21 includes at least one board, and a accommodating portion is provided on the at least one board. In this embodiment, the carrier 21 is a carrier of a feeder, including a first The plate member 211 and the second plate member 212, at least one accommodating portion of the carrier 21 is included in the first plate member 211 with at least one first accommodating portion, and the at least one first accommodating portion includes a plurality of parallel to the working axis The first accommodating portion 2111 of L is arranged in the Z direction, and the two ends of the first accommodating portion 2111 communicate with the top surface and the bottom surface of the first board member 211 , and the second board member 212 is assembled on the top surface of the first board member 211 , and is connected with a moving arm 213. The moving arm 213 drives the carrier 21 to move in at least one direction, that is, drives the first plate 211 and the second plate 212 to move in the X-Y-Z direction.

作動具22設有桿體221及作業部件,桿體221裝配於承載具21之容置部,作業部件設於桿體221,以供對電子元件執行預設作業;更進一步,作動具22可為移料具或壓接具等,作業部件可為吸嘴或壓接治具等;於本實施例,作動具22為移料具,其桿體221穿置於承載具21之第一容置部2111,以供於第一容置部2111內作Z方向位移,桿體221以靠近第一板件211頂面之一端作為第一端2211,並以靠近第一板件211底面之另一端作為第二端2212,桿體221之第一端2211位於第一容置部2111內,並未凸伸出第一容置部2111,桿體221之第二端2212則凸伸出第一容置部2111,並設有一為吸嘴222之作業部件,吸嘴222以供取放電子元件。The actuating tool 22 is provided with a rod body 221 and a working part, the rod body 221 is assembled in the accommodating part of the carrier 21, and the working part is arranged on the rod body 221 for performing preset operations on the electronic components; further, the actuating tool 22 can In this embodiment, the actuating tool 22 is a material moving tool, and its rod body 221 is inserted into the first container of the carrier 21 . The accommodating portion 2111 is used for displacement in the Z direction in the first accommodating portion 2111. One end of the rod body 221 close to the top surface of the first plate member 211 is used as the first end 2211, and the other end close to the bottom surface of the first plate member 211 is used as the first end 2211. One end is used as the second end 2212. The first end 2211 of the rod body 221 is located in the first accommodating portion 2111 and does not protrude out of the first accommodating portion 2111. The second end 2212 of the rod body 221 protrudes out of the first accommodating portion 2111. The accommodating part 2111 is also provided with a working part which is a suction nozzle 222, and the suction nozzle 222 is used for picking and placing electronic components.

疊料檢知單元於承載具21設有至少一可投射光束之檢知器,並於承載具21或作動具22相對應檢知器之位置設有至少一通道,以供通過檢知器投射之光束,作動具22於承置器(圖未示出)執行預設作業時而由預設位置反向位移至過當位置,檢知器於投射至通道之光束呈遮斷狀態而可迅速檢知承置器異常疊料,以利即時排除異常,並提高電子元件良率。The stack detection unit is provided with at least one detector capable of projecting light beams on the carrier 21, and at least one channel is provided at the position of the carrier 21 or the actuating tool 22 corresponding to the detector for projecting through the detector The light beam, the actuator 22 is reversely displaced from the preset position to the excessive position when the holder (not shown in the figure) performs the preset operation, and the detector can quickly detect when the beam projected to the channel is in an interrupted state. Know the abnormal stacking of the holder, so that the abnormality can be eliminated immediately and the yield of electronic components can be improved.

依作業需求,疊料檢知單元之通道可為槽道、一空間區域或通孔 ;舉例通道可為槽道,並設於承載具21之第一板件211頂面或第二板件212之底面;舉例通道可為一空間區域,檢知器配置於承載具21之頂面,承載具21頂面相對於檢知器之光束路徑的空間區域即構成通道,亦無不可。疊料檢知單元之通道可設於作動具22,舉例於作動具22相對應檢知器之位置開設一為通孔之通道,亦無不可。 According to the operation requirements, the channel of the stack detection unit can be a channel, a space area or a through hole For example, the channel can be a channel, and is arranged on the top surface of the first plate 211 of the carrier 21 or the bottom surface of the second plate 212; for example, the channel can be a space area, and the detector is arranged on the top surface of the carrier 21 , the space area of the top surface of the carrier 21 relative to the beam path of the detector constitutes a channel, and it is also possible. The channel of the stacking detection unit can be provided in the actuating tool 22, for example, a channel as a through hole can be provided at the position of the actuating tool 22 corresponding to the detector.

依作業需求,檢知器可為對照式感測器或反射式感測器,檢知器可裝配於承載具21之外周面或內部,或者裝配於通道內;舉例承載具21開設呈槽道之通道,通道相交容置部,檢知器可裝配於承載具21之外周面或通道內,均可對通道投射光束,以感測作動具22是否過當位移,而檢知承置器是否殘留電子元件,亦無不可。According to operational requirements, the detector can be a contrast sensor or a reflective sensor. The detector can be mounted on the outer surface or inside of the carrier 21, or mounted in a channel; for example, the carrier 21 is provided with a channel. The channel, the channel intersects the accommodating portion, the detector can be assembled on the outer peripheral surface of the carrier 21 or in the channel, and can project light beams on the channel to sense whether the actuator 22 is displaced excessively, and detect whether the carrier remains. Electronic components, too.

依作業需求,疊料檢知單元可設置至少一架體裝配於承載具21,以供架置檢知器,更佳者,架體可裝配於一調整器(圖未示出)而作至少一方向位移,以供調整檢知器之位置。According to operational requirements, the stacking detection unit can be provided with at least one frame mounted on the carrier 21 for mounting the detector. Displacement in one direction for adjusting the position of the detector.

於本實施例,疊料檢知單元於承載具21之第一板件211頂面設有通道2112,通道2112為呈X方向配置之槽道,並相交於第一容置部2111;檢知器為對照式感測器,包含投光元件231及受光元件232,更佳者,疊料檢知單元於承載具21之第一板件211兩側分別裝配第一架體233及第二架體234,第一架體233供裝配投光元件231,第二架體234供裝配受光元件232,投光元件231及受光元件232作相對應配置於通道2112之二側,投光元件231對承載具21上之通道2112投射光束,受光元件232接收投光元件21121所投射之光束,若光束被遮斷 ,受光元件232無法接收到光束,表示承置器異常疊料,反之,若光束未遮斷,受光元件232接收到光束,表示承置器正常空置。 In this embodiment, the stack detection unit is provided with a channel 2112 on the top surface of the first plate 211 of the carrier 21. The channel 2112 is a channel arranged in the X direction and intersects the first accommodating portion 2111; detection The device is a contrast sensor, including a light-projecting element 231 and a light-receiving element 232 . More preferably, the stack detection unit is equipped with a first frame body 233 and a second frame on both sides of the first plate 211 of the carrier 21 , respectively. body 234, the first frame body 233 is used for assembling the light-projecting element 231, the second frame body 234 is used for assembling the light-receiving element 232, the light-emitting element 231 and the light-receiving element 232 are arranged correspondingly on two sides of the channel 2112, and the light-emitting element 231 is opposite to The channel 2112 on the carrier 21 projects the light beam, and the light receiving element 232 receives the light beam projected by the light projecting element 21121, if the light beam is blocked , the light-receiving element 232 cannot receive the light beam, indicating that the holder is abnormally stacked. On the contrary, if the light beam is not interrupted, the light-receiving element 232 receives the light beam, indicating that the holder is normally vacant.

請參閱圖4、5,本發明工作機構20應用於作業裝置,作業裝置包含至少一承置器及本發明工作機構20,至少一承置器以供承置電子元件,本發明工作機構20包含承載具21、作動具22及疊料檢知單元,承載具21載送作動具22及疊料檢知單元作至少一方向位移,作動具22於承置器執行預設作業,疊料檢知單元以供檢知承置器是否異常疊料,以利即時排除異常,並提高電子元件良率。Please refer to FIGS. 4 and 5 , the working mechanism 20 of the present invention is applied to a working device. The working device includes at least one holder and the working mechanism 20 of the present invention. At least one holder is used for holding electronic components. The carrier 21, the actuating tool 22 and the stacking detection unit, the carrier 21 carries the actuating tool 22 and the stacking detecting unit to move in at least one direction, and the actuating tool 22 performs a preset operation on the holder, and the stacking detection unit The unit is used to detect whether the holder is abnormally stacked, so as to eliminate the abnormality immediately and improve the yield of electronic components.

更進一步,作業裝置可為測試裝置、供料裝置、收料裝置、預溫裝置或輸送裝置,承置器可為測試座、供料承置器、收料承置器、預溫承置器或載台等,均可承置電子元件。Further, the working device can be a testing device, a feeding device, a receiving device, a pre-heating device or a conveying device, and the holder can be a test seat, a feeding device, a receiving device, and a pre-warming device. Or a stage, etc., can hold electronic components.

於本實施例,作業裝置為輸送裝置,輸送裝置設有一為載台31之承置器,載台31具有二承槽311供承置二電子元件;工作機構20以作動具22之吸嘴222吸附下一電子元件32,並以移動臂213帶動承載具21、疊料檢知單元及下一電子元件32作X-Y方向位移至載台31之上方,且依預設作業高度帶動下一電子元件32作Z方向向下位移,若載台31之一承槽311內殘留上一電子元件33,作動具22會受到二個電子元件32、33的過大反作用力頂推而於承載具21之第一容置部2111內作Z方向反向過當位移,由於此一過當位移量已超出預設位移量,使得作動具22之桿體221的第一端2211由預設位置向上位移至過當位置,由於第一容置部2111相交於通道2112,使得桿體221之第一端2211位於通道2112,並遮斷檢知器之投光元件231朝通道2112投射之光束,檢知器之受光元件232因光束被遮斷而未接收到光束,檢知器於光束呈遮斷狀態而可迅速檢知載台31異常疊料,即會發出一訊號至處理器(圖未示出),處理器會判斷作動具22之吸嘴222過壓下一電子元件32,以告知工作人員即時排除異常,以避免後續電子元件受損。In this embodiment, the working device is a conveying device, and the conveying device is provided with a holder which is a carrier 31 , and the carrier 31 has two receiving grooves 311 for holding two electronic components; the working mechanism 20 operates the suction nozzle 222 of the actuator 22 Adsorb the next electronic component 32, and use the moving arm 213 to drive the carrier 21, the stacking detection unit and the next electronic component 32 to move to the top of the carrier 31 in the X-Y direction, and drive the next electronic component according to the preset working height 32 moves downward in the Z direction. If there is an electronic component 33 left in one of the receiving grooves 311 of the carrier 31, the actuator 22 will be pushed by the excessive reaction force of the two electronic components 32 and 33 and will be pushed on the first side of the carrier 21. In the accommodating portion 2111, an excessive displacement is performed in the reverse direction of the Z direction. Since the excessive displacement has exceeded the preset displacement, the first end 2211 of the rod body 221 of the actuator 22 is displaced upward from the preset position to the excessive position. Since the first accommodating portion 2111 intersects the channel 2112, the first end 2211 of the rod body 221 is located in the channel 2112, and blocks the light beam projected by the light projecting element 231 of the detector toward the channel 2112, and the light receiving element 232 of the detector Because the light beam is blocked and the light beam is not received, the detector can quickly detect the abnormal stacking of the carrier 31 when the light beam is blocked, and will send a signal to the processor (not shown in the figure), and the processor will It is judged that the suction nozzle 222 of the actuator 22 over-presses the next electronic component 32, so as to inform the staff to remove the abnormality immediately, so as to avoid damage to the subsequent electronic component.

請參閱圖6、7,本發明工作機構20之第二實施例與第一實施例差異在於承載具24為浮動器之承載具,包含第一板件241及第二板件242,承載具24之至少一容置部包含第一容置部及第二容置部,即第一板件241設有一沿作業軸線L之第一容置部2411,第一容置部2411呈Z方向配置,其兩端相通第一板件241之頂面及底面,第二板件242裝配於第一板件241之頂面,並設有一相通第一容置部2411的第二容置部2421,第二板件242之頂面連接一移動臂243,移動臂243帶動第一板件241及第二板件242作Y-Z方向位移。Please refer to FIGS. 6 and 7 , the difference between the second embodiment of the working mechanism 20 of the present invention and the first embodiment is that the carrier 24 is a carrier of a float, including a first plate 241 and a second plate 242 , and the carrier 24 The at least one accommodating portion includes a first accommodating portion and a second accommodating portion, that is, the first plate 241 is provided with a first accommodating portion 2411 along the working axis L, and the first accommodating portion 2411 is arranged in the Z direction, Its two ends communicate with the top surface and the bottom surface of the first board member 241 , the second board member 242 is assembled on the top surface of the first board member 241 , and has a second accommodating portion 2421 communicating with the first accommodating portion 2411 . The top surfaces of the two plates 242 are connected to a moving arm 243, and the moving arm 243 drives the first plate 241 and the second plate 242 to move in the Y-Z direction.

作動具25為壓接具,並設有桿體251及作業部件,其桿體251穿置於承載具24之第一容置部2411及第二板件242之第二容置部2421,並可作Z方向位移,桿體251以靠近第二板件242頂面之一端作為第一端2511,並以靠近第一板件241底面之另一端作為第二端2512,桿體251之第二端2512供裝配一為下壓治具252之作業部件,下壓治具252以供壓接及取放電子元件。The actuating tool 25 is a crimping tool, and is provided with a rod body 251 and a working part. The rod body 251 is passed through the first accommodating part 2411 of the carrier 24 and the second accommodating part 2421 of the second plate 242 , and The rod body 251 can be displaced in the Z direction. One end of the rod body 251 close to the top surface of the second plate member 242 is used as the first end 2511, and the other end close to the bottom surface of the first plate member 241 is used as the second end 2512. The second end of the rod body 251 The end 2512 is used for assembling a working part which is the pressing jig 252, and the pressing jig 252 is used for crimping and picking and placing electronic components.

疊料檢知單元於承載具24之第二板件242的底面設有至少一相交於第二容置部2421之通道2422,通道2422為呈X方向配置之槽道,疊料檢知單元另於作動具25之桿體251相對於通道2422的位置設有至少一讓位部2513,讓位部2513可為環槽或通孔,以供通過光束;於本實施例,作動具25之桿體251於相對通道2422的位置凹設有一為環槽之讓位部2513,檢知器為對照式感測器,包含投光元件231及受光元件232,投光元件231及受光元件232分別裝配於承載具24之第二板件242的通道2422兩端,投光元件231對通道2422投射光束,光束通過桿體251之讓位部2513,以供受光元件232接收投光元件231所投射之光束,表示承置器正常空置,反之,若光束被作動具25之桿體251遮斷,受光元件232無法接收到光束,表示承置器異常疊料。The stacking detection unit is provided with at least one channel 2422 intersecting with the second accommodating portion 2421 on the bottom surface of the second plate 242 of the carrier 24. The channel 2422 is a channel arranged in the X direction, and the stacking detection unit has another channel. The position of the rod body 251 of the actuator 25 relative to the channel 2422 is provided with at least one escape portion 2513, and the escape portion 2513 can be a ring groove or a through hole for passing the light beam; in this embodiment, the rod of the actuator 25 is The body 251 has a recessed part 2513 which is a ring groove at the position relative to the channel 2422. The detector is a contrast sensor, including a light-emitting element 231 and a light-receiving element 232. The light-emitting element 231 and the light-receiving element 232 are assembled respectively. At both ends of the channel 2422 of the second plate 242 of the carrier 24, the light projecting element 231 projects a light beam to the channel 2422, and the light beam passes through the space 2513 of the rod body 251 for the light receiving element 232 to receive the light projected by the light projecting element 231. The light beam means that the holder is normally vacant. On the contrary, if the light beam is blocked by the rod body 251 of the actuator 25, the light receiving element 232 cannot receive the light beam, which means that the holder is abnormally stacked.

請參閱圖8、9,本發明作業機構20之第二實施例應用於一為測試裝置之作業裝置,測試裝置設有一為測試座34之承置器,測試座34具有探針,以供承置及測試電子元件;工作機構20以作動具25之下壓治具252吸附下一電子元件32,並以承載具24之移動臂243帶動疊料檢知單元及下一電子元件32作Y方向位移至測試座34之上方,且依預設作業高度帶動下一電子元件32作Z方向位移,若測試座34內殘留上一電子元件33,作動具25之下壓治具252會受到二個電子元件32、33的過大反作用力頂推而於承載具24之第一容置部2411及第二容置部2421內作Z方向反向過當位移,由於此一過當位移量已超出預設位移量,使得作動具25之桿體251的讓位部2513由預設位置向上位移至過當位置,即桿體251的讓位部2513偏離通道2422,並以其他部位之桿身相對於通道2422,由於其他桿身之直徑尺寸大於讓位部2513之直徑尺寸,使得其他桿身遮斷檢知器之投光元件231朝通道2422投射之光束,檢知器之受光元件232因光束被遮斷而未接收到光束,檢知器於光束呈遮斷狀態而可迅速檢知測試座34異常疊料,即會發出一訊號至處理器(圖未示出),處理器會判別作動具25之下壓治具252過壓下一電子元件32,以告知工作人員即時排除異常,以避免後續電子元件受損。Referring to FIGS. 8 and 9 , the second embodiment of the operating mechanism 20 of the present invention is applied to a working device that is a test device. The test device is provided with a holder for a test seat 34 , and the test seat 34 has a probe for supporting Place and test electronic components; the working mechanism 20 uses the actuating tool 25 to lower the pressing fixture 252 to adsorb the next electronic component 32, and uses the moving arm 243 of the carrier 24 to drive the stacking detection unit and the next electronic component 32 in the Y direction It moves to the top of the test seat 34, and drives the next electronic component 32 to move in the Z direction according to the preset working height. If there is an electronic component 33 left in the test seat 34, the lower pressing fixture 252 of the actuator 25 will be subjected to two The excessive reaction force of the electronic components 32 and 33 pushes the first accommodating portion 2411 and the second accommodating portion 2421 of the carrier 24 to make an excessive displacement in the reverse direction of the Z direction, because the excessive displacement exceeds the preset displacement. amount, so that the leaving portion 2513 of the rod body 251 of the actuating tool 25 is displaced upward from the preset position to the excessive position, that is, the leaving portion 2513 of the rod body 251 deviates from the channel 2422, and the shaft of other parts is relative to the channel 2422, Since the diameter of the other shafts is larger than the diameter of the spaced portion 2513, the other shafts block the light beam projected by the light-emitting element 231 of the detector toward the channel 2422, and the light-receiving element 232 of the detector is blocked by the light beam. If the light beam is not received, the detector can quickly detect the abnormal stacking of the test seat 34 when the light beam is interrupted, and will send a signal to the processor (not shown in the figure), and the processor will identify the underside of the actuator 25 The pressing jig 252 over-presses the next electronic component 32, so as to inform the staff to remove the abnormality immediately, so as to avoid damage to the subsequent electronic component.

請參閱圖6~10,本發明作業機包含機台30、具至少一本發明工作機構20之作業裝置及中央控制裝置(圖未示出);至少一作業裝置配置於機台30 ,並設有至少一承置器及本發明之工作機構20,至少一承置器以供承置電子元件,本發明工作機構20包含承載具、作動具及疊料檢知單元,以供於承置器執行預設作業,並檢知承置器是否異常疊料,以利即時排除異常,並提高電子元件良率;中央控制裝置以控制及整合各裝置作動而執行自動化作業。 Please refer to FIGS. 6-10 , the working machine of the present invention includes a machine table 30 , a working device having at least one working mechanism 20 of the present invention, and a central control device (not shown); at least one working device is disposed on the machine table 30 . , and is provided with at least one holder and the working mechanism 20 of the present invention, at least one holder for holding electronic components, and the working mechanism 20 of the present invention includes a carrier, an actuating tool and a stacking detection unit for use in The setter performs a preset operation, and detects whether the setter is abnormally stacked, so as to eliminate the abnormality immediately and improve the yield of electronic components; the central control device controls and integrates the actions of each device to perform automatic operations.

於本實施例,作業機為電子元件測試作業機,包含機台30、供料裝置40、收料裝置50、具本發明工作機構20之測試裝置60、輸送裝置70及中央控制裝置(圖未示出);然依作業需求,測試作業機可配置預溫盤(圖未示出),以供預溫待測之電子元件。供料裝置40配置於機台30,並設有至少一供料承置器41,以供容置複數個待測之電子元件;收料裝置50配置於機台30,並設有至少一收料承置器51,以供容置複數個已測之電子元件。In this embodiment, the working machine is an electronic component testing machine, including a machine table 30, a feeding device 40, a receiving device 50, a testing device 60 with the working mechanism 20 of the present invention, a conveying device 70, and a central control device (not shown in the figure). However, according to the operation requirements, the test machine can be equipped with a pre-warming plate (not shown in the figure) for pre-warming the electronic components to be tested. The feeding device 40 is arranged on the machine table 30 and is provided with at least one feeding holder 41 for accommodating a plurality of electronic components to be tested; the receiving device 50 is arranged on the machine table 30 and is provided with at least one receiving device 41 . The material holder 51 is used for accommodating a plurality of tested electronic components.

測試裝置60配置於機台30,包含至少一承置器及至少一本發明工作機構20,承置器為具探針之測試座61,測試座61電性連接一電路板62,並供承置及測試電子元件;本發明工作機構20(請參閱圖6~10),包含承載具24、作動具25及疊料檢知單元。更佳者,測試裝置60設有測試室63,以供測試座61於測試室63執行測試作業;更進一步,測試室63設置至少一輸送管(圖未示出),以供輸送乾燥空氣。The test device 60 is disposed on the machine table 30 and includes at least one holder and at least one working mechanism 20 of the present invention. The holder is a test seat 61 with probes, and the test seat 61 is electrically connected to a circuit board 62 for supporting Place and test electronic components; the working mechanism 20 (refer to FIGS. 6-10 ) of the present invention includes a carrier 24 , an actuating tool 25 and a stacking detection unit. Preferably, the test device 60 is provided with a test chamber 63 for the test seat 61 to perform testing operations in the test chamber 63 ; further, the test chamber 63 is provided with at least one conveying pipe (not shown) for conveying dry air.

另於工作機構20之作動具25或承載具24設有溫控機構(圖未示出) ,溫控機構設有至少一溫控件,以供溫控電子元件,使電子元件於模擬日後使用環境溫度下執行測試作業;更進一步,溫控件可為加熱件、致冷晶片或具流體之座體。然依作業需求,於熱測作業時,測試室63內可配置鼓風機,以供吹送熱風,使測試室63之內部升溫,亦無不可。 In addition, a temperature control mechanism (not shown) is provided on the actuating tool 25 or the carrier 24 of the working mechanism 20 . , the temperature control mechanism is provided with at least one temperature control for temperature-controlled electronic components, so that the electronic components can perform test operations under the simulated environment temperature in the future; further, the temperature control can be a heating element, a cooling chip or a fluid body of the seat. However, according to the operation requirements, during the thermal measurement operation, a blower can be arranged in the test chamber 63 for blowing hot air to heat up the interior of the test chamber 63 .

輸送裝置70配置於機台30,設有至少一移料器,於本實施例,輸送裝置70以第一移料器71作X-Y-Z方向位移,於供料裝置40之供料承置器41取出待測之電子元件,並移入第一載台72,第一載台72承載待測之電子元件位移至測試裝置60之測試座61側方,測試裝置60之工作機構20以移動臂243帶動承載具24、下壓治具252及疊料檢知單元等作Y-Z方向位移,令下壓治具252於第一載台72取出待測之電子元件,並移入測試座61,若測試座61殘留上一電子元件,下壓治具252受到二個電子元件之過當反作用力頂推而向上位移,令桿體251之讓位部2513偏離承載具24之通道2422,以其他桿身遮斷檢知器之投光元件231朝通道2422投射之光束,受光元件232因光束被遮斷而未接收到光束,檢知器於光束呈遮斷狀態而可迅速檢知測試座61異常疊料,即會發出一訊號至處理器(圖未示出),處理器會判別作動具25之下壓治具252過壓下一電子元件,以告知工作人員即時排除異常,以避免後續電子元件受損;反之,若測試座61並無殘留電子元件,作動具25之讓位部2513保持相對於承載具24之通道2422,以供投光元件231朝通道2422投射之光束,受光元件232接收光束,檢知器可迅速檢知測試座61正常空置;當測試座61正常空置,下壓治具252將待測之電子元件移入測試座61而執行測試作業;於測試完畢,下壓治具252將已測之電子元件由測試座61移載至第二載台73,第二載台73載出已測之電子元件,輸送裝置70以第二移料器74作X-Y-Z方向位移,於第二載台73取出已測之電子元件,依據測試結果,將複數個已測之電子元件輸送至收料裝置50之收料承置器51而分類收置;中央控制裝置(圖未示出)用以控制及整合各裝置作動,以執行自動化作業,進而提升作業效能。The conveying device 70 is disposed on the machine table 30 and is provided with at least one feeder. In this embodiment, the conveying device 70 moves in the X-Y-Z direction with the first feeder 71 and is taken out from the feeder 41 of the feeder 40 The electronic component to be tested is moved into the first stage 72 . The first stage 72 carries the electronic component to be tested and is displaced to the side of the test seat 61 of the testing device 60 , and the working mechanism 20 of the testing device 60 drives the bearing by the moving arm 243 The tool 24, the pressing jig 252 and the stacking detection unit are displaced in the Y-Z direction, so that the pressing jig 252 takes out the electronic components to be tested on the first carrier 72 and moves them into the test seat 61. If the test seat 61 remains On the previous electronic component, the pressing fixture 252 is pushed upward by the excessive reaction force of the two electronic components, so that the abdicating portion 2513 of the rod body 251 deviates from the channel 2422 of the carrier 24, and the detection is blocked by other rod bodies. The light-emitting element 231 of the detector projects the light beam toward the channel 2422. The light-receiving element 232 does not receive the light beam because the light beam is blocked. The detector can quickly detect the abnormal stacking of the test seat 61 when the light beam is blocked. Send a signal to the processor (not shown in the figure), the processor will determine that the pressing fixture 252 of the actuating tool 25 is over-pressing the next electronic component, so as to inform the staff to remove the abnormality immediately, so as to avoid damage to the subsequent electronic components; otherwise , If the test seat 61 does not have any remaining electronic components, the abdication portion 2513 of the actuator 25 remains relative to the channel 2422 of the carrier 24 for the light beam projected by the light projecting element 231 toward the channel 2422, and the light receiving element 232 receives the light beam and detects The tester can quickly detect that the test seat 61 is normally vacant; when the test seat 61 is normally vacant, the pressing jig 252 moves the electronic component to be tested into the test seat 61 to perform the test operation; after the test is completed, the pressing jig 252 will The electronic components are transferred from the test seat 61 to the second stage 73 , the second stage 73 carries out the electronic components that have been tested, and the conveying device 70 is displaced in the X-Y-Z direction by the second feeder 74 , on the second stage 73 Take out the tested electronic components, and according to the test results, transport a plurality of tested electronic components to the receiving device 51 of the receiving device 50 for classification and storage; the central control device (not shown in the figure) is used to control and Integrate the actions of various devices to perform automated operations, thereby improving operational efficiency.

輸送裝置依作業需求,可僅配置單一載台以供載送待測電子元件及已測電子元件,亦無不可。又依作業需求,載台可位移至測試座之側方或上方。According to the operation requirements, the conveying device can only be configured with a single carrier for carrying the electronic components to be tested and the electronic components that have been tested. In addition, the stage can be moved to the side or the top of the test seat according to the needs of the operation.

[習知] 11:機台 12:測試座 13:壓接器 131:吸嘴 14:載台 15:機架 16:取像器 [本發明] 20:工作機構 21:承載具 211:第一板件 2111:第一容置部 2112:通道 212:第二板件 213:移動臂 22:作動具 221:桿體 2211:第一端 2212:第二端 222:吸嘴 231:投光元件 232:受光元件 233:第一架體 234:第二架體 24:承載具 241:第一板件 2411:第一容置部 242:第二板件 2421:第二容置部 2422:通道 243:移動臂 25:作動具 251:桿體 2511:第一端 2512:第二端 2513:讓位部 252:下壓治具 L:作業軸線 30:機台 31:載台 311:承槽 32、33:電子元件 34:測試座 40:供料裝置 41:供料承置器 50:收料裝置 51:收料承置器 60:測試裝置 61:測試座 62:電路板 63:測試室 70:輸送裝置 71:第一移料器 72:第一載台 73:第二載台 74:第二移料器 [acquaintance] 11: Machine 12: Test seat 13: Crimper 131: Nozzle 14: Carrier 15: Rack 16: Imagefinder [this invention] 20: Work Organization 21: Carrier 211: The first board 2111: The first container 2112: Channel 212: Second board 213: Moving Arm 22: Actuator 221: Rod body 2211: First End 2212: Second End 222: nozzle 231: light-emitting element 232: light receiving element 233: The first frame 234: Second Frame 24: Carrier 241: The first board 2411: The first container 242: Second plate 2421: Second Receptacle 2422: channel 243: Moving Arm 25: Actuator 251: Rod body 2511: First End 2512: Second end 2513: Give way 252: Press down jig L: Working axis 30: Machine 31: Carrier 311: Socket 32, 33: Electronic components 34: Test seat 40: Feeding device 41: Feed holder 50: Receiving device 51: Receiving holder 60: Test device 61: Test seat 62: circuit board 63: Test Room 70: Conveyor 71: First mover 72: The first stage 73: Second stage 74: Second mover

圖1:習知取像器之使用示意圖。 圖2:本發明工作機構第一實施例之前視剖面圖。 圖3:本發明工作機構第一實施例之局部俯視圖。 圖4:本發明工作機構第一實施例應用於作業裝置之使用示意圖。 圖5:係圖4之局部放大示意圖。 圖6:本發明工作機構第二實施例之前視剖面圖。 圖7:本發明工作機構第二實施例之局部俯視圖。 圖8:本發明工作機構第二實施例應用於作業裝置之使用示意圖。 圖9:係圖8之局部放大示意圖。 圖10:本發明作業機之配置圖。 Figure 1: Schematic diagram of the use of a conventional imagefinder. Figure 2: A front sectional view of the first embodiment of the working mechanism of the present invention. Figure 3: A partial top view of the first embodiment of the working mechanism of the present invention. FIG. 4 is a schematic diagram of the use of the first embodiment of the working mechanism of the present invention applied to a working device. FIG. 5 is a partial enlarged schematic view of FIG. 4 . Figure 6: A front sectional view of the second embodiment of the working mechanism of the present invention. Figure 7: A partial top view of the second embodiment of the working mechanism of the present invention. FIG. 8 is a schematic diagram of the use of the second embodiment of the working mechanism of the present invention applied to a working device. FIG. 9 is a partial enlarged schematic view of FIG. 8 . Figure 10: The configuration diagram of the working machine of the present invention.

21:承載具 21: Carrier

2111:第一容置部 2111: The first container

2112:通道 2112: Channel

221:桿體 221: Rod body

2211:第一端 2211: First End

231:投光元件 231: light-emitting element

Claims (17)

一種具疊料檢知單元之工作機構,包含:承載具:作至少一方向位移,並設有至少一板件,該至少一板件之內部設有至少一容置部;作動具:設有桿體及至少一作業部件,該桿體可位移地穿置裝配於該承載具之該容置部,該作業部件設於該桿體,以供對電子元件執行預設作業;疊料檢知單元:於該承載具設有至少一可投射光束之檢知器,並於該承載具之內部或該作動具之該桿體相對應該檢知器之位置設有至少一通道,以供通過該檢知器投射之光束,於該作動具之該桿體執行預設作業而由預設位置位移至過當位置時,該檢知器投射至該通道之光束呈遮斷狀態,以供迅速檢知承置器異常疊料。 A working mechanism with a stack detection unit, comprising: a carrier: displaced in at least one direction, and provided with at least one plate, at least one accommodating part is provided inside the at least one plate; an actuating tool: provided with A rod body and at least one working part, the rod body can be displaceably passed through the accommodating part of the carrier, and the working part is arranged on the rod body for performing preset operations on electronic components; stacking detection Unit: at least one detector capable of projecting light beams is arranged on the carrier, and at least one channel is arranged inside the carrier or the position of the rod body of the actuating tool relative to the detector for passing through the detector The light beam projected by the detector, when the rod body of the actuator performs a preset operation and moves from the preset position to the over-current position, the beam projected by the detector to the channel is in an interrupted state for rapid detection The holder is abnormally stacked. 如請求項1所述之具疊料檢知單元之工作機構,其該承載具之該至少一板件包含第一板件及第二板件,該至少一容置部包含於該第一板件設有至少一第一容置部,該第一容置部以供穿置該作動具之該桿體。 The working mechanism with the stacking detection unit according to claim 1, wherein the at least one plate of the carrier includes a first plate and a second plate, and the at least one accommodating portion is included in the first plate The element is provided with at least one first accommodating portion, and the first accommodating portion is used for penetrating the rod body of the actuating tool. 如請求項2所述之具疊料檢知單元之工作機構,其該疊料檢知單元於該承載具之該第一板件頂面設有該通道,該通道相交於該第一容置部。 According to the working mechanism with a stacking detection unit according to claim 2, the stacking detection unit is provided with the channel on the top surface of the first plate of the carrier, and the channel intersects the first accommodation department. 如請求項2所述之具疊料檢知單元之工作機構,其該承載具之該至少一容置部包含該第一容置部及第二容置部,該第二容置部設於 該第二板件,並相通該第一容置部,以供該作動具之該桿體穿置該第一容置部及該第二容置部。 According to the working mechanism with the stacking detection unit as claimed in claim 2, the at least one accommodating portion of the carrier comprises the first accommodating portion and the second accommodating portion, and the second accommodating portion is provided in the The second plate is communicated with the first accommodating portion, so that the rod body of the actuating tool can pass through the first accommodating portion and the second accommodating portion. 如請求項4所述之具疊料檢知單元之工作機構,其該疊料檢知單元於該承載具之該第二板件底面設有該通道,該通道相交於該第二容置部。 According to the working mechanism with a stacking detection unit according to claim 4, the stacking detection unit is provided with the channel on the bottom surface of the second plate of the carrier, and the channel intersects the second accommodating portion . 如請求項5所述之具疊料檢知單元之工作機構,其該疊料檢知單元於該作動具之該桿體相對該通道的位置設有至少一讓位部,以供通過光束。 According to the working mechanism with a stacking detection unit as described in claim 5, the stacking detection unit is provided with at least one give-away portion at the position of the rod body of the actuator relative to the passage for the beam to pass through. 如請求項6所述之具疊料檢知單元之工作機構,其該疊料檢知單元之該讓位部為環槽或通孔。 According to the working mechanism with the stacking detection unit as described in claim 6, the abdication portion of the stacking detection unit is a ring groove or a through hole. 如請求項1所述之具疊料檢知單元之工作機構,其該疊料檢知單元於該作動具之該桿體開設為通孔之該通道。 According to the working mechanism with a stacking detection unit as described in claim 1, the stacking detection unit defines the channel of the through hole in the rod body of the actuator. 如請求項1至8中任一項所述之具疊料檢知單元之工作機構,其該疊料檢知單元之該檢知器包含投光元件及受光元件,該投光元件及該受光元件作相對應配置於該通道之二側,該投光元件以供對該通道投射光束,該受光元件以供接收該投光元件所投射之光束。 According to the working mechanism with a stacking detection unit according to any one of claims 1 to 8, the detector of the stacking detection unit includes a light-emitting element and a light-receiving element, and the light-emitting element and the light-receiving element The elements are correspondingly arranged on two sides of the channel, the light-projecting element is used for projecting a light beam to the channel, and the light-receiving element is used for receiving the light beam projected by the light-projecting element. 如請求項1所述之具疊料檢知單元之工作機構,其該疊料檢知單元之該檢知器裝配於該承載具之外周面或內部,或者裝配於該通道內。 According to the working mechanism with a stacking detection unit according to claim 1, the detector of the stacking detection unit is assembled on the outer peripheral surface or inside of the carrier, or is assembled in the channel. 如請求項1所述之具疊料檢知單元之工作機構,其該疊料檢知單元設置至少一架體,該至少一架體裝配於該承載具,以供架置該檢知器。 The working mechanism with a stacking detection unit as claimed in claim 1, wherein the stacking detection unit is provided with at least one frame, and the at least one frame is assembled on the carrier for mounting the detector. 如請求項11所述之具疊料檢知單元之工作機構,其該疊料檢知單元之該架體裝配於一調整器,以供作至少一方向位移調整該檢知器之位置。 As claimed in claim 11, the working mechanism with the stacking detection unit, wherein the frame body of the stacking detection unit is mounted on an adjuster for adjusting the position of the detector by displacement in at least one direction. 一種作業裝置,包含:至少一承置器:以供承置電子元件;至少一如請求項1所述之具疊料檢知單元之工作機構,以供對該承置器執行預設作業,並檢知該承置器是否異常疊料。 A working device, comprising: at least one holder: for holding electronic components; at least one working mechanism with a stacking detection unit as described in claim 1, for performing preset operations on the holder, And check whether the holder is abnormally stacked. 一種作業機,包含:機台;至少一如請求項13所述之作業裝置;中央控制裝置:以控制及整合各裝置作動而執行自動化作業。 A working machine, comprising: a machine; at least one working device as described in claim 13; 如請求項14所述之作業機,更包含:供料裝置:配置於該機台,並設有至少一供料承置器,以供容置至少一待作業電子元件;收料裝置:配置於該機台,並設有至少一收料承置器,以供容置至少一已作業電子元件;輸送裝置:配置於該機台,並設有至少一移料器,以供輸送電子元件。 The working machine according to claim 14, further comprising: a feeding device: disposed on the machine table, and provided with at least one feeding holder for accommodating at least one electronic component to be operated; a receiving device: disposed The machine is provided with at least one receptacle for accommodating at least one electronic component that has been processed; conveying device: disposed on the machine, and provided with at least one feeder for conveying electronic components . 如請求項14或15所述之作業機,其該作業裝置更包含測試室,以供該承置器於該測試室內執行測試作業。 The working machine as claimed in claim 14 or 15, wherein the working device further comprises a test room for the holder to perform the test operation in the test room. 如請求項16所述之作業機,其該作業裝置更包含溫控單元,該溫控單元於該工作機構設置至少一溫控件,以供溫控電子元件。 The working machine according to claim 16, wherein the working device further comprises a temperature control unit, and the temperature control unit is provided with at least one temperature control unit on the working mechanism for temperature control electronic components.
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TW201634939A (en) * 2015-03-26 2016-10-01 Seiko Epson Corp Electronic component transfer device, electronic component inspection device, positioning device for electronic component transfer device and positioning method for electronic component transfer device
CN110850273A (en) * 2019-11-15 2020-02-28 广东利扬芯片测试股份有限公司 Material overlapping prevention IC test equipment and test method thereof
TW202106593A (en) * 2019-08-02 2021-02-16 鴻勁精密股份有限公司 Electronic component transfer mechanism and operation classification apparatus applying the same with which the working staff can be aware of the transfer status in real time thereby improving the efficiency of the transfer operation

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201634939A (en) * 2015-03-26 2016-10-01 Seiko Epson Corp Electronic component transfer device, electronic component inspection device, positioning device for electronic component transfer device and positioning method for electronic component transfer device
TW202106593A (en) * 2019-08-02 2021-02-16 鴻勁精密股份有限公司 Electronic component transfer mechanism and operation classification apparatus applying the same with which the working staff can be aware of the transfer status in real time thereby improving the efficiency of the transfer operation
CN110850273A (en) * 2019-11-15 2020-02-28 广东利扬芯片测试股份有限公司 Material overlapping prevention IC test equipment and test method thereof

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