TWI777427B - 連接器 - Google Patents
連接器 Download PDFInfo
- Publication number
- TWI777427B TWI777427B TW110106572A TW110106572A TWI777427B TW I777427 B TWI777427 B TW I777427B TW 110106572 A TW110106572 A TW 110106572A TW 110106572 A TW110106572 A TW 110106572A TW I777427 B TWI777427 B TW I777427B
- Authority
- TW
- Taiwan
- Prior art keywords
- conductive
- elastic conductive
- connector
- elastic
- insulating
- Prior art date
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
- H01R13/2414—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means conductive elastomers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/03—Contact members characterised by the material, e.g. plating, or coating materials
Landscapes
- Coupling Device And Connection With Printed Circuit (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Mechanical Coupling Of Light Guides (AREA)
- Surgical Instruments (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR20200023896 | 2020-02-26 | ||
KR10-2020-0023896 | 2020-02-26 | ||
KR10-2020-0051420 | 2020-04-28 | ||
KR1020200051420A KR102346779B1 (ko) | 2020-02-26 | 2020-04-28 | 전기접속용 커넥터 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW202133500A TW202133500A (zh) | 2021-09-01 |
TWI777427B true TWI777427B (zh) | 2022-09-11 |
Family
ID=77785146
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW110106572A TWI777427B (zh) | 2020-02-26 | 2021-02-24 | 連接器 |
Country Status (2)
Country | Link |
---|---|
KR (1) | KR102346779B1 (ko) |
TW (1) | TWI777427B (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102696538B1 (ko) * | 2022-03-28 | 2024-08-21 | 주식회사 아이에스시 | 검사용 커넥터 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20110085788A (ko) * | 2010-01-21 | 2011-07-27 | 이재학 | 테스트 소켓 및 그 테스트 소켓의 제조방법 |
KR20150008264A (ko) * | 2013-07-11 | 2015-01-22 | (주)이니큐브 | 반도체 테스트 장치의 컨택터 |
KR101526536B1 (ko) * | 2013-12-27 | 2015-06-10 | 주식회사 아이에스시 | 전도성 탄성부재, 전도성 탄성부재의 제조방법 및 전기적 검사소켓 |
TWM505728U (zh) * | 2014-10-07 | 2015-07-21 | Advanced Connetek Inc | 連接器結構 |
TWI584531B (zh) * | 2014-04-23 | 2017-05-21 | 第一精工股份有限公司 | 電連接器 |
CN207116749U (zh) * | 2017-07-05 | 2018-03-16 | 泰科电子(上海)有限公司 | 连接器 |
KR101930866B1 (ko) * | 2018-08-08 | 2018-12-20 | 황동원 | 반도체 디바이스 테스트용 콘택트 및 소켓장치 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20090077991A (ko) | 2008-01-14 | 2009-07-17 | (주)마이크로컨텍솔루션 | 전도성 러버 핀을 이용한 소켓 |
KR102063761B1 (ko) * | 2018-10-19 | 2020-01-08 | (주)티에스이 | 신호 전송 커넥터 및 그 제조방법 |
-
2020
- 2020-04-28 KR KR1020200051420A patent/KR102346779B1/ko active IP Right Grant
-
2021
- 2021-02-24 TW TW110106572A patent/TWI777427B/zh active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20110085788A (ko) * | 2010-01-21 | 2011-07-27 | 이재학 | 테스트 소켓 및 그 테스트 소켓의 제조방법 |
KR20150008264A (ko) * | 2013-07-11 | 2015-01-22 | (주)이니큐브 | 반도체 테스트 장치의 컨택터 |
KR101526536B1 (ko) * | 2013-12-27 | 2015-06-10 | 주식회사 아이에스시 | 전도성 탄성부재, 전도성 탄성부재의 제조방법 및 전기적 검사소켓 |
TWI584531B (zh) * | 2014-04-23 | 2017-05-21 | 第一精工股份有限公司 | 電連接器 |
TWM505728U (zh) * | 2014-10-07 | 2015-07-21 | Advanced Connetek Inc | 連接器結構 |
CN207116749U (zh) * | 2017-07-05 | 2018-03-16 | 泰科电子(上海)有限公司 | 连接器 |
KR101930866B1 (ko) * | 2018-08-08 | 2018-12-20 | 황동원 | 반도체 디바이스 테스트용 콘택트 및 소켓장치 |
Also Published As
Publication number | Publication date |
---|---|
KR20210108852A (ko) | 2021-09-03 |
TW202133500A (zh) | 2021-09-01 |
KR102346779B1 (ko) | 2022-01-05 |
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