TWI767181B - Coating sheet for metal mask and metal mask - Google Patents

Coating sheet for metal mask and metal mask Download PDF

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TWI767181B
TWI767181B TW109101587A TW109101587A TWI767181B TW I767181 B TWI767181 B TW I767181B TW 109101587 A TW109101587 A TW 109101587A TW 109101587 A TW109101587 A TW 109101587A TW I767181 B TWI767181 B TW I767181B
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layer
metal mask
base material
carrier layer
etching
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TW109101587A
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TW202103928A (en
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堀部孝広
横山紳一郎
石尾雅昭
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日商日立金屬股份有限公司
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/18Layered products comprising a layer of metal comprising iron or steel
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/01Layered products comprising a layer of metal all layers being exclusively metallic
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41NPRINTING PLATES OR FOILS; MATERIALS FOR SURFACES USED IN PRINTING MACHINES FOR PRINTING, INKING, DAMPING, OR THE LIKE; PREPARING SUCH SURFACES FOR USE AND CONSERVING THEM
    • B41N1/00Printing plates or foils; Materials therefor
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C38/00Ferrous alloys, e.g. steel alloys
    • C22C38/10Ferrous alloys, e.g. steel alloys containing cobalt
    • C22C38/105Ferrous alloys, e.g. steel alloys containing cobalt containing Co and Ni
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04Coating on selected surface areas, e.g. using masks
    • C23C14/042Coating on selected surface areas, e.g. using masks using masks
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23FNON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
    • C23F1/00Etching metallic material by chemical means
    • C23F1/44Compositions for etching metallic material from a metallic material substrate of different composition

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Organic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Electroluminescent Light Sources (AREA)
  • Laminated Bodies (AREA)
  • ing And Chemical Polishing (AREA)
  • Physical Vapour Deposition (AREA)
  • Printing Plates And Materials Therefor (AREA)
  • Materials For Photolithography (AREA)

Abstract

本發明提供一種操作容易且可實現金屬掩模的薄壁化,理想的是可提高金屬掩模的生產性的金屬掩模用板材,且本發明提供一種使用所述金屬掩模用板材的金屬掩模。本發明的金屬掩模用披覆板材在沿厚度方向切斷的截面視時,包括:基材層,包含以30質量%以上且50質量%以下的範圍含有Ni及Co中的一種以上的鐵基合金;以及第一載體層,壓接於基材層的其中一側,基材層及第一載體層可由同質的蝕刻液進行蝕刻,且基材層相較於第一載體層而對蝕刻液更為高耐蝕。本發明的金屬掩模使用所述金屬掩模用披覆板材。The present invention provides a metal mask sheet material that is easy to handle, can achieve thinning of the metal mask, and ideally can improve the productivity of the metal mask, and provides a metal mask using the metal mask sheet material. mask. The coating material for a metal mask of the present invention includes a base material layer containing iron containing at least one of Ni and Co in a range of 30 mass % or more and 50 mass % or less, in a cross-sectional view taken along the thickness direction. a base alloy; and a first carrier layer, which is crimped on one side of the base material layer, the base material layer and the first carrier layer can be etched by a homogeneous etchant, and the base material layer is etched compared to the first carrier layer Liquid is more resistant to corrosion. The metal mask of the present invention uses the above-mentioned coating material for a metal mask.

Description

金屬掩模用披覆板材以及金屬掩模Coating sheet for metal mask and metal mask

本發明是有關於一種金屬掩模(metal mask)用披覆板材以及金屬掩模。 詳細來說,本發明是有關於一種具有可形成對蝕刻液的耐蝕性保護膜的金屬表面的金屬掩模用披覆板材、以及使用所述金屬掩模用披覆板材的金屬掩模,例如,本發明是有關於一種用於製造有機電致發光(Electro Luminesence,EL)元件用金屬掩模的金屬掩模用披覆板材以及有機EL元件用金屬掩模。The present invention relates to a cladding sheet for a metal mask and a metal mask. In detail, the present invention relates to a clad sheet for a metal mask having a metal surface capable of forming a corrosion-resistant protective film against an etching solution, and a metal mask using the clad sheet for a metal mask, such as The present invention relates to a metal mask cladding plate for manufacturing a metal mask for an organic electroluminescence (Electro Luminesence, EL) element and a metal mask for an organic EL element.

例如,專利文獻1中公開了一種用於製造有機EL元件的、包含單一種類金屬的遮蔽治具(金屬掩模)的製造方法。所述金屬掩模是通過圖1所示那樣的步驟製造。圖1中,步驟(a)為原材料準備步驟。此原材料準備步驟中,準備成為金屬掩模的、包含單一種類金屬的厚度T100 的單層結構的金屬板材100a。所述金屬板材100a例如包含Fe(鐵)-Ni(鎳)合金,此Fe-Ni合金含有約36質量%的Ni及約64質量%的Fe。所述Fe-Ni合金為周知的36合金,線膨脹係數小而為約1.2×10-6 /℃。金屬板材100a的厚度T100 例如為10 μm以上且50 μm以下。步驟(b)為第一被覆步驟。此第一被覆步驟中,在金屬板材100a的第一表面100b形成用於形成規定的蝕刻圖案的保護膜101,在金屬板材100a的第二表面100c形成用於防止蝕刻的保護膜102。步驟(c)為第一蝕刻步驟。此第一蝕刻步驟中,使用適於所述Fe-Ni合金的蝕刻液對金屬板材100a進行蝕刻。通過所述第一蝕刻而將包含Fe-Ni合金的第一表面100b的不具有保護膜101的部分蝕刻,形成例如蝕刻孔100d。步驟(d)為第二被覆步驟。此第二被覆步驟中,在金屬板材100a的第二表面100c形成用於形成規定的蝕刻圖案的保護膜103,在金屬板材100a的第一表面100b及蝕刻孔100d形成用於防止蝕刻的保護膜104。步驟(e)為第二蝕刻步驟。此第二蝕刻步驟中,使用與第一蝕刻步驟中所用的蝕刻液同質的蝕刻液對金屬板材100a進行蝕刻。通過所述第二蝕刻而將包含Fe-Ni合金的第二表面100c的不具有保護膜103的部分蝕刻,形成例如蝕刻孔100e。步驟(f)為整飾步驟。此整飾步驟中,將保護膜103及保護膜104除去,對金屬板材100a的整個表面進行清洗處理,整飾成金屬掩模100。經過這種步驟,使用金屬板材100a而獲得例如具有掩模圖案100f且厚度T100 與金屬板材100a大致同等的、包含Fe-Ni合金的單層結構的金屬掩模100。For example, Patent Document 1 discloses a method of manufacturing a shielding jig (metal mask) containing a single type of metal for manufacturing an organic EL element. The metal mask is manufactured through the steps shown in FIG. 1 . In Fig. 1, step (a) is a raw material preparation step. In this raw material preparation step, a metal plate 100a of a single-layer structure containing a single type of metal and having a thickness T100 to be a metal mask is prepared. The metal plate 100a includes, for example, an Fe (iron)-Ni (nickel) alloy, and the Fe-Ni alloy contains about 36 mass % of Ni and about 64 mass % of Fe. The Fe-Ni alloy is a well-known 36 alloy, and the coefficient of linear expansion is as small as about 1.2×10 −6 /°C. The thickness T 100 of the metal plate 100a is, for example, 10 μm or more and 50 μm or less. Step (b) is the first coating step. In this first coating step, a protective film 101 for forming a predetermined etching pattern is formed on the first surface 100b of the metal plate 100a, and a protective film 102 for preventing etching is formed on the second surface 100c of the metal plate 100a. Step (c) is the first etching step. In this first etching step, the metal plate 100a is etched using an etching solution suitable for the Fe-Ni alloy. The portion of the first surface 100b including the Fe—Ni alloy that does not have the protective film 101 is etched by the first etching to form, for example, an etching hole 100d. Step (d) is the second coating step. In this second coating step, a protective film 103 for forming a predetermined etching pattern is formed on the second surface 100c of the metal plate 100a, and a protective film for preventing etching is formed on the first surface 100b and the etching hole 100d of the metal plate 100a 104. Step (e) is the second etching step. In this second etching step, the metal plate 100a is etched using an etching solution of the same quality as the etching solution used in the first etching step. The portion of the second surface 100 c including the Fe—Ni alloy that does not have the protective film 103 is etched by the second etching to form, for example, an etching hole 100 e. Step (f) is a finishing step. In this finishing step, the protective film 103 and the protective film 104 are removed, the entire surface of the metal plate 100 a is cleaned, and the metal mask 100 is finished. Through such a process, the metal mask 100 having, for example, a single-layer structure containing an Fe—Ni alloy having a mask pattern 100f and a thickness T100 approximately equal to that of the metal plate 100a is obtained using the metal plate 100a.

另外,例如專利文獻2中公開了一種用於絲網印刷的金屬製的厚膜用金屬掩模的製造方法。所述金屬掩模是通過圖2所示那樣的步驟製造。圖2中,步驟(a)為原材料準備步驟。此原材料準備步驟中,準備成為金屬掩模的、兩種金屬接合而成的二層結構的披覆板材200a。在專利文獻2中並未記載披覆板材200a的厚度,但可認為,披覆板材200a具有與厚膜用金屬掩模相應的厚度T200 。所述披覆板材200a包含:包含例如銅的第一層201、及包含與第一層201為不同種類的例如不銹鋼的第二層202。此外,適於銅的蝕刻液與適於不銹鋼的蝕刻液為異質,因此包含銅的第一層201不被適於包含不銹鋼的第二層的蝕刻液蝕刻,包含不銹鋼的第二層202不被適於包含銅的第一層201的蝕刻液蝕刻。步驟(b)為被覆步驟。此被覆步驟中,在第一層201的表面201a形成用於形成規定的蝕刻圖案的保護膜203,在第二層202的表面202a形成用於形成規定的蝕刻圖案的保護膜204。步驟(c)為第一蝕刻步驟。此第一蝕刻步驟中,使用適於銅的蝕刻液對第一層201的表面201a進行蝕刻。通過所述第一蝕刻而將包含銅的第一層201的不具有保護膜203的表面201a部分蝕刻,形成例如蝕刻孔201b。此時,包含不銹鋼的第二層202的不具有保護膜204的表面202a部分未被蝕刻。步驟(d)為第二蝕刻步驟。此第二蝕刻步驟中,使用與第一蝕刻步驟不同的、適於不銹鋼的蝕刻液對第二層202的表面202a進行蝕刻。通過所述第二蝕刻而將包含不銹鋼的第二層202的不具有保護膜204的表面202a部分蝕刻,形成例如蝕刻孔202b。此時,包含銅的第一層201的不具有保護膜203的蝕刻孔201b未被蝕刻。步驟(e)為整飾步驟。此整飾步驟中,將保護膜203及保護膜204除去,對披覆板材200a的整個表面進行清洗處理,整飾成金屬掩模200。經過這種步驟,使用披覆板材200a而獲得例如具有掩模圖案200f且厚度T200 與披覆板材200a大致同等的、包含銅及不銹鋼的二層結構的金屬掩模200。 In addition, for example, Patent Document 2 discloses a method for producing a metal thick film metal mask for screen printing. The metal mask is manufactured through the steps shown in FIG. 2 . In Fig. 2, step (a) is a raw material preparation step. In this raw material preparation step, a cladding plate 200a having a two-layer structure formed by bonding two metals to be a metal mask is prepared. The thickness of the coating material 200a is not described in Patent Document 2, but it is considered that the coating material 200a has a thickness T 200 corresponding to the thick film metal mask. The cladding sheet 200a includes a first layer 201 including, for example, copper, and a second layer 202 including a different type from the first layer 201, such as stainless steel. In addition, the etching solution suitable for copper and the etching solution suitable for stainless steel are heterogeneous, so the first layer 201 containing copper is not etched by the etching solution suitable for the second layer containing stainless steel, and the second layer 202 containing stainless steel is not etched by An etchant suitable for etching of the first layer 201 containing copper. Step (b) is a coating step. In this coating step, a protective film 203 for forming a predetermined etching pattern is formed on the surface 201 a of the first layer 201 , and a protective film 204 for forming a predetermined etching pattern is formed on the surface 202 a of the second layer 202 . Step (c) is the first etching step. In this first etching step, the surface 201a of the first layer 201 is etched using an etchant suitable for copper. By the first etching, the surface 201a of the first layer 201 containing copper, which does not have the protective film 203, is partially etched to form, for example, an etching hole 201b. At this time, the portion of the surface 202a that does not have the protective film 204 of the second layer 202 containing stainless steel is not etched. Step (d) is the second etching step. In this second etching step, the surface 202a of the second layer 202 is etched using an etching solution suitable for stainless steel, which is different from that in the first etching step. By the second etching, the surface 202a of the second layer 202 made of stainless steel, which does not have the protective film 204, is partially etched to form, for example, etching holes 202b. At this time, the etching hole 201b of the first layer 201 containing copper without the protective film 203 is not etched. Step (e) is a finishing step. In this finishing step, the protective film 203 and the protective film 204 are removed, and the entire surface of the covering plate 200 a is cleaned to form a metal mask 200 . Through such a process, the cladding plate 200a is used to obtain, for example, a metal mask 200 having a mask pattern 200f and a thickness T200 approximately equal to that of the cladding plate 200a, and a two-layered metal mask 200 including copper and stainless steel.

[現有技術文獻] [Prior Art Literature]

[專利文獻] [Patent Literature]

[專利文獻1]日本專利第6432072號公報 [Patent Document 1] Japanese Patent No. 6432072

[專利文獻2]日本專利特公昭62-21629號公報 [Patent Document 2] Japanese Patent Publication No. 62-21629

近年來,期望掩模圖案的進一步高精細化。因此,需要使金屬掩模的厚度進一步薄壁化。作為目標的金屬掩模的厚度例如為20μm以下,理想的是15μm以下。上文所述的單層結構的金屬板材100a的厚度T100例如為10μm以上且50μm以下,但這種薄壁的金屬板材容易產生皺褶或彎折等不良狀況。例如,將厚度20μm的金屬板材進一步薄壁化雖然在技術上可實現,但簡單地經薄壁化的金屬板材因機械強度降低而操作變困難。可認為,上文所述的二層結構的披覆板材200a具有與厚膜用金屬掩模相應的厚度。若簡單地進行這種二層結構的披覆板材的進一步薄壁化,則厚度方向(圖2所示的Z方向)的層結構的非對稱性使披覆板材產生大的翹曲。因此,獲得例如厚度20μm以下的披覆板材在技術上並不容易。具有大的翹曲的披覆板材操作困難,而且也不易製造金屬掩模。根據這種情況,需要開發出可實現金屬掩模的進一步薄壁化的金屬掩模用板材。 In recent years, further refinement of the mask pattern has been desired. Therefore, it is necessary to further reduce the thickness of the metal mask. The thickness of the target metal mask is, for example, 20 μm or less, preferably 15 μm or less. The thickness T 100 of the single-layer structure metal plate 100a is, for example, 10 μm or more and 50 μm or less, but such a thin metal plate is prone to defects such as wrinkles and bending. For example, although it is technically possible to further reduce the thickness of a metal plate with a thickness of 20 μm, it is difficult to handle a metal plate that is simply reduced in thickness due to a decrease in mechanical strength. It can be considered that the cladding sheet 200a of the above-mentioned two-layer structure has a thickness corresponding to that of the thick film metal mask. If the thickness of the coated sheet with such a two-layer structure is further reduced simply, the asymmetry of the layer structure in the thickness direction (Z direction shown in FIG. 2 ) causes the coated sheet to have large warpage. Therefore, it is technically difficult to obtain a clad sheet with a thickness of 20 μm or less. Coated sheets with large warpage are difficult to handle and also difficult to manufacture metal masks. Under such circumstances, it is necessary to develop a metal mask sheet material that can further reduce the thickness of the metal mask.

在開發金屬掩模用板材時,期待除了薄壁化及操作的容易化以外,理想的是確保金屬掩模的生產性與以前同等,更理想的是金屬掩模的生產性提高。上文所述的使用單一種類的金屬板材100a的金屬掩模的製造方法中,至少需要兩次被覆步驟及兩次蝕刻步驟。另外,上文所述的使用不同種類的金屬接合而成的二層結構的披覆板材200a的金屬掩模的製造方法中,與使用單一種類的金屬板材100a的方法相比,可減少被覆步驟。但是,即便是使用二層結構的披覆板材200a的方法,形成掩模圖案200f也需要至少兩次蝕刻步驟,而且無法將各個蝕刻步驟中所用的蝕刻液共用。因此,金屬掩模用板材的優選變化使金屬掩模的製造過程優選地變化,有可能帶來金屬掩模的生產性提高。When developing the sheet metal for a metal mask, it is desirable to ensure that the productivity of the metal mask is equal to that in the past, and it is more desirable to improve the productivity of the metal mask, in addition to the reduction in thickness and the facilitation of handling. In the above-described manufacturing method of a metal mask using a single type of metal plate 100a, at least two coating steps and two etching steps are required. In addition, in the above-mentioned method of manufacturing a metal mask using a two-layer structure covering the sheet 200a formed by bonding different kinds of metals, compared with the method of using a single type of metal sheet 100a, the number of coating steps can be reduced . However, even in the method of using the coating plate 200a with a two-layer structure, at least two etching steps are required to form the mask pattern 200f, and the etching solution used in each etching step cannot be shared. Therefore, the preferable change of the sheet material for a metal mask can change the manufacturing process of a metal mask preferably, and there exists a possibility that the productivity of a metal mask may be improved.

本發明的目的在於提供一種操作容易且可實現金屬掩模的薄壁化,理想的是可提高金屬掩模的生產性的金屬掩模用板材,且提供一種使用所述金屬掩模用板材的金屬掩模。An object of the present invention is to provide a metal mask sheet material which is easy to handle, can achieve thinning of the metal mask, and ideally improves the productivity of the metal mask, and provides a metal mask sheet material using the metal mask sheet material. metal mask.

本發明者等人等發現,通過在兩種金屬接合而成的二層結構的披覆板材中,將可由同質的蝕刻液進行蝕刻的兩種金屬接合,從而能夠解決所述問題,而想到了金屬掩模用披覆板材的發明的構成。The inventors of the present invention found that the above problem can be solved by joining two metals that can be etched by a homogeneous etchant in a clad sheet of a two-layer structure formed by joining two metals, and came up with the idea of The structure of the invention of the coating sheet for metal masks.

金屬掩模用披覆板材的一個發明在沿厚度方向切斷的截面視時,包括:基材層,包含以30質量%以上且50質量%以下的範圍含有Ni及Co中的一種以上的鐵基合金;以及第一載體層,壓接於所述基材層的其中一側,且所述基材層及所述第一載體層可由同質的蝕刻液進行蝕刻,並且所述基材層相較於所述第一載體層而對所述蝕刻液更為高耐蝕。所述發明中,優選在同等的環境下使用同質的蝕刻液進行蝕刻,將所述基材層的腐蝕減量設為Mb ,將所述第一載體層的腐蝕減量設為Mc1 時,所述基材層與所述第一載體層滿足Mb /Mc1 ≦0.9的關係。One invention of the coating material for a metal mask, in a cross-sectional view taken along the thickness direction, includes a base material layer containing iron containing at least one of Ni and Co in a range of 30 mass % or more and 50 mass % or less. base alloy; and a first carrier layer, which is crimped on one side of the base material layer, and the base material layer and the first carrier layer can be etched by a homogeneous etchant, and the base material layer is Compared with the first carrier layer, it has higher corrosion resistance to the etching solution. In the above invention, it is preferable to perform etching using a homogeneous etching solution under the same environment, and when the etching loss of the base material layer is M b , and the etching loss of the first carrier layer is M c1 , the The base material layer and the first carrier layer satisfy the relationship of M b /M c1 ≦0.9.

另外,金屬掩模用披覆板材的一個發明在沿厚度方向切斷的截面視時,包括:基材層,包含以30質量%以上且50質量%以下的範圍含有Ni及Co中的一種以上的鐵基合金;第一載體層,壓接於所述基材層的其中一側;以及第二載體層,壓接於所述基材層的另一側,且所述基材層、所述第一載體層及所述第二載體層可由同質的蝕刻液進行蝕刻,並且所述基材層相較於所述第一載體層及所述第二載體層而對所述蝕刻液更為高耐蝕。所述發明中,優選在同等的環境下使用同質的蝕刻液進行蝕刻,將所述基材層的腐蝕減量設為Mb ,將所述第一載體層的腐蝕減量設為Mc1 ,將所述第二載體層的腐蝕減量設為Mc2 時,所述基材層、所述第一載體層及所述第二載體層滿足Mb /Mc1 ≦0.9及Mb /Mc2 ≦0.9的關係。In addition, one invention of the coating material for a metal mask, when viewed in a cross-sectional view along the thickness direction, includes a base material layer containing at least one of Ni and Co in a range of 30 mass % or more and 50 mass % or less. an iron-based alloy; a first carrier layer, crimped on one side of the base material layer; and a second carrier layer, crimped on the other side of the base material layer, and the base material layer, all The first carrier layer and the second carrier layer can be etched by a homogeneous etchant, and the base material layer is more resistant to the etchant than the first carrier layer and the second carrier layer. High corrosion resistance. In the above invention, it is preferable to perform etching using a homogeneous etching solution under the same environment, and let the corrosion loss of the base material layer be M b , the corrosion loss of the first carrier layer is M c1 , and When the etching loss of the second carrier layer is set as M c2 , the base material layer, the first carrier layer and the second carrier layer satisfy M b /M c1 ≦0.9 and M b /M c2 ≦0.9 relation.

使用所述任一金屬掩模用披覆板材而想到金屬掩模的發明的構成。即,金屬掩模的一個發明是使用包括所述基材層及所述第一載體層的所述任一金屬掩模用披覆板材或包括所述基材層、所述第一載體層及所述第二載體層的所述任一金屬掩模用披覆板材而形成,並且包含構成所述基材層的所述鐵基合金。The structure of the invention of a metal mask was conceived using any of the said coating materials for metal masks. That is, one invention of a metal mask is to use any one of the metal mask cladding materials including the base material layer and the first carrier layer, or the base material layer, the first support layer and the The one of the metal masks of the second carrier layer is formed with a cladding plate, and includes the iron-based alloy constituting the base material layer.

另外,金屬掩模的一個發明是使用包括所述基材層及所述第一載體層的所述任一金屬掩模用披覆板材或包括所述基材層、所述第一載體層及所述第二載體層的所述任一金屬掩模用披覆板材而形成,並且包括:第一金屬層,包含構成所述基材層的所述鐵基合金;以及第二金屬層,包含構成所述第一載體層的金屬,且所述金屬掩模是所述第一金屬層與所述第二金屬層接合而成。In addition, one invention of a metal mask is to use any one of the metal mask cladding materials including the base material layer and the first carrier layer, or the base material layer, the first support layer and the The one of the metal masks of the second carrier layer is formed by covering a plate, and includes: a first metal layer including the iron-based alloy constituting the base material layer; and a second metal layer including The metal constituting the first carrier layer, and the metal mask is formed by bonding the first metal layer and the second metal layer.

另外,金屬掩模的一個發明是使用包括所述基材層、所述第一載體層及所述第二載體層的所述任一金屬掩模用披覆板材而形成,並且包括:第一金屬層,包含構成所述基材層的所述鐵基合金;第二金屬層,包含構成所述第一載體層的金屬;以及第三金屬層,包含構成所述第二載體層的金屬,且所述金屬掩模是所述第二金屬層、所述第一金屬層及所述第三金屬層依次接合而成。In addition, one invention of a metal mask is formed using any one of the cladding materials for a metal mask including the base material layer, the first carrier layer, and the second carrier layer, and includes: a first a metal layer including the iron-based alloy constituting the substrate layer; a second metal layer including the metal constituting the first carrier layer; and a third metal layer including the metal constituting the second support layer, And the metal mask is formed by joining the second metal layer, the first metal layer and the third metal layer in sequence.

根據本發明,可獲得一種操作容易且可實現金屬掩模的薄壁化的金屬掩模用披覆板材。若使用所述金屬掩模用披覆板材,則可獲得操作容易且比以前更為薄壁的金屬掩模。另外,若使用所述金屬掩模用披覆板材,則能夠期待金屬掩模的生產性提高。ADVANTAGE OF THE INVENTION According to this invention, the cladding material for metal masks which is easy to handle and can achieve thinning of a metal mask can be obtained. By using the above-mentioned coating material for a metal mask, a metal mask which is easy to handle and thinner than before can be obtained. In addition, when the above-mentioned coating material for a metal mask is used, the productivity of the metal mask can be expected to be improved.

舉出將根據本發明的金屬掩模用披覆板材具體化的實施方式來對本發明進行說明。The present invention will be described with reference to an embodiment in which the coating material for a metal mask according to the present invention is embodied.

<第一實施方式> 將根據本發明的金屬掩模用披覆板材的第一實施方式示於圖3。圖3為沿厚度方向(Z方向)切斷的金屬掩模用披覆板材1S(以下稱為「披覆板材1S」)的截面視。<First Embodiment> FIG. 3 shows the first embodiment of the coating material for a metal mask according to the present invention. FIG. 3 is a cross-sectional view of a covering sheet 1S for a metal mask (hereinafter referred to as “covering sheet 1S”) cut along the thickness direction (Z direction).

披覆板材1S在沿厚度方向切斷的截面視時,為二層結構。披覆板材1S(厚度T1S )包括基材層10(厚度t0)、及壓接於基材層10的其中一側(Z1側)的第一載體層11(厚度t1)。基材層10與第一載體層11的壓接形態例如通過下述方式獲得,即:將用於構成基材層10的板材、與用於構成第一載體層11的板材以經重合的狀態軋壓(披覆軋壓),視需要進行擴散退火。此外,披覆板材1S為申請專利範圍的「金屬掩模用披覆板材」的一例,基材層10為申請專利範圍的「基材層」的一例,第一載體層11為申請專利範圍的「第一載體層」的一例。The cladding sheet 1S has a two-layer structure in a cross-sectional view cut along the thickness direction. The cladding sheet 1S (thickness T 1S ) includes a base material layer 10 (thickness t0 ), and a first carrier layer 11 (thickness t1 ) crimped to one side ( Z1 side ) of the base material layer 10 . The crimping form of the base material layer 10 and the first carrier layer 11 is obtained, for example, by superimposing the sheet material for constituting the base material layer 10 and the sheet material for constituting the first support layer 11 in a superimposed state. Roll pressing (clad rolling), diffusion annealing if necessary. In addition, the covering sheet 1S is an example of the "covering sheet for metal mask" within the scope of the patent application, the base material layer 10 is an example of the "substrate layer" within the scope of the patent application, and the first carrier layer 11 is the scope of the patent application. An example of a "first carrier layer".

構成披覆板材1S的基材層10能夠作為金屬掩模的主體。在此情況下,既可獲得包含基材層10部分的單層結構的金屬掩模,也可獲得包含基材層10部分與第一載體層11部分的二層結構的金屬掩模。如上文所述,作為目標的金屬掩模的厚度例如為20 μm以下,理想的是15 μm以下。對照所述目標,從薄壁化的觀點來看,披覆板材1S的厚度T1S 的上限值或以基材層10部分作為金屬掩模的主體時的基材層10的厚度t0的上限值優選20 μm以下,更優選15 μm以下,進一步優選10 μm以下。另外,從操作的容易化的觀點來看,披覆板材1S的厚度T1S 的下限值或以基材層10部分作為金屬掩模的主體時的基材層10的厚度t0的下限值優選1 μm以上,更優選3 μm以上,進一步優選5 μm以上。披覆板材1S的厚度T1S 越薄,或基材層10成為金屬掩模的主體時基材層10的厚度t0越薄,則越抑制蝕刻的側蝕(side etching)的量,因此通過蝕刻所形成的蝕刻孔等掩模圖案的尺寸精度得到改善,可獲得具有更高精細的掩模圖案的金屬掩模。The base material layer 10 constituting the cladding sheet 1S can serve as the main body of the metal mask. In this case, either a single-layer structure metal mask including the base material layer 10 part, or a two-layer structure metal mask including the base material layer 10 part and the first carrier layer 11 part can be obtained. As described above, the target thickness of the metal mask is, for example, 20 μm or less, and desirably 15 μm or less. In contrast to the above target, from the viewpoint of thinning, the upper limit of the thickness T 1S of the cladding sheet 1S or the upper limit of the thickness t0 of the base material layer 10 when the base material layer 10 part is used as the main body of the metal mask The limit value is preferably 20 μm or less, more preferably 15 μm or less, and further preferably 10 μm or less. In addition, from the viewpoint of ease of handling, the lower limit value of the thickness T 1S of the coating sheet 1S or the lower limit value of the thickness t0 of the base material layer 10 when the base material layer 10 part is used as the main body of the metal mask It is preferably 1 μm or more, more preferably 3 μm or more, and further preferably 5 μm or more. The thinner the thickness T 1S of the cladding sheet 1S, or the thinner the thickness t0 of the base material layer 10 when the base material layer 10 is the main body of the metal mask, the more the amount of side etching of the etching is suppressed. Therefore, by etching The dimensional accuracy of the mask pattern such as the formed etching hole is improved, and a metal mask having a higher finer mask pattern can be obtained.

構成披覆板材1S的基材層10包含鐵基合金。此鐵基合金以30質量%以上且50質量%以下的範圍含有Ni(鎳)及Co(鈷)中的一種以上。除了Ni及Co以外的剩餘部分既可為Fe(鐵)及不可避免的雜質,也可還包含一種以上的添加元素。此外,含有Ni及Co的鐵基合金優選Co為10質量%以下(也就是Ni為20質量%以上且40質量%以下)。相對於Fe以30質量%以上且50質量%以下的範圍含有Ni及Co中的一種以上的鐵基合金大多情況下,例如對於在有機EL元件用金屬掩模的使用時抑制蒸鍍時的加熱變形(應變)而言有效的線膨脹係數小,適於構成金屬掩模用板材。所述鐵基合金有時以10質量%以下的範圍含有Ni及Co以外的元素(添加元素)。添加元素例如為Mn(錳)、Mo(鉬)、Nb(鈮)及Cr(鉻)等。以0質量%以上且10質量%以下的範圍含有這些添加元素的鐵基合金有可能具有0.2%耐力、拉伸強度、伸長率、楊氏模數、硬度、線膨脹係數等作為構成金屬掩模用板材的金屬材料而優選的機械強度及各種特性。包含所述鐵基合金的基材層10可由適於所述鐵基合金的通常的蝕刻液(例如氯化鐵液等)進行蝕刻。The base material layer 10 constituting the cladding sheet 1S includes an iron-based alloy. This iron-based alloy contains at least one of Ni (nickel) and Co (cobalt) in a range of 30 mass % or more and 50 mass % or less. The remainder other than Ni and Co may be Fe (iron) and inevitable impurities, or may further contain one or more additional elements. Further, in the iron-based alloy containing Ni and Co, it is preferable that Co is 10 mass % or less (that is, Ni is 20 mass % or more and 40 mass % or less). An iron-based alloy containing at least one of Ni and Co in a range of 30 mass % or more and 50 mass % or less with respect to Fe is often used to suppress heating during vapor deposition, for example, when a metal mask for an organic EL element is used. The effective coefficient of linear expansion in terms of deformation (strain) is small, and it is suitable for forming a sheet metal for a metal mask. The iron-based alloy may contain elements (additional elements) other than Ni and Co in a range of 10 mass % or less. The additive elements are, for example, Mn (manganese), Mo (molybdenum), Nb (niobium), Cr (chromium), and the like. Iron-based alloys containing these additive elements in the range of 0 mass % or more and 10 mass % or less may have 0.2% endurance, tensile strength, elongation, Young's modulus, hardness, coefficient of linear expansion, etc. as a constituent metal mask The mechanical strength and various properties are preferred by the metal material of the sheet. The base material layer 10 containing the iron-based alloy can be etched by a common etching solution (eg, ferric chloride solution, etc.) suitable for the iron-based alloy.

構成披覆板材1S的第一載體層11壓接於基材層10的其中一側(Z1側)。第一載體層11對於成為金屬掩模的主體的、經薄壁化的基材層10的補強有效,對於提高薄壁的披覆板材1S的機械強度而言有效。第一載體層11成為經薄壁化的基材層10的載體,使經薄壁化的基材層10的操作變得容易,抑制包含基材層10的披覆板材1S的大的翹曲而有助於蝕刻的穩定化。另外,第一載體層11能夠與基材層10同樣地作為金屬掩模的主體。在此情況下,既可獲得包含第一載體層11部分的單層結構的金屬掩模,也可獲得包含第一載體層11部分與基材層10部分的二層結構的金屬掩模。第一載體層11的厚度t1只要除了基材層10的各種特性以外,考慮披覆板材1S整體的各種特性而設定便可。例如,從操作的容易化的觀點來看,當以基材層10的補強為目的時,第一載體層11的厚度t1優選5 μm以上且100 μm以下,更優選20 μm以上且100 μm以下。例如,當以第一載體層11部分作為金屬掩模的主體時,第一載體層11的厚度t1的上限值優選20 μm以下,更優選15 μm以下,進一步優選10 μm以下。The first carrier layer 11 constituting the cladding sheet 1S is crimped to one side (the Z1 side) of the base material layer 10 . The first carrier layer 11 is effective for reinforcing the thinned base material layer 10 serving as the main body of the metal mask, and is effective for improving the mechanical strength of the thin coating sheet 1S. The first carrier layer 11 serves as a carrier for the thinned base material layer 10 , facilitates handling of the thinned base material layer 10 , and suppresses large warpage of the coating sheet 1S including the base material layer 10 . And contribute to the stabilization of etching. In addition, the first carrier layer 11 can serve as the main body of the metal mask similarly to the base material layer 10 . In this case, either a single-layer structure metal mask including the first carrier layer 11 part, or a two-layer structure metal mask including the first support layer 11 part and the base layer 10 part can be obtained. The thickness t1 of the first carrier layer 11 may be set in consideration of various properties of the entire coating sheet 1S in addition to various properties of the base material layer 10 . For example, from the viewpoint of ease of handling, when the purpose of reinforcement of the base material layer 10 is made, the thickness t1 of the first carrier layer 11 is preferably 5 μm or more and 100 μm or less, and more preferably 20 μm or more and 100 μm or less. . For example, when the first carrier layer 11 is used as the main body of the metal mask, the upper limit of the thickness t1 of the first carrier layer 11 is preferably 20 μm or less, more preferably 15 μm or less, and further preferably 10 μm or less.

第一載體層11可由可蝕刻基材層10的蝕刻液進行蝕刻。即,基材層10及第一載體層11可由同質的蝕刻液(例如氯化鐵液等)同時蝕刻。本發明中,當可同時蝕刻基材層10與第一載體層11時,只要基材層10相較於第一載體層11而對所述蝕刻液更為高耐蝕便可。由此,當利用所述蝕刻液同時開始基材層10及第一載體層11的蝕刻時,基材層10相較於第一載體層11而更不易被蝕刻,因此能夠使基材層10的蝕刻速度比第一載體層11的蝕刻速度更慢。因此,例如在對基材層10及第一載體層11同時形成蝕刻孔時,從基材層10的表面(Z2側)向Z1側形成的蝕刻孔的深度比從第一載體層11的表面(Z1側)向Z2側形成的蝕刻孔的深度更淺。若使用可獲得這種蝕刻孔的深度差的金屬掩模用板材(披覆板材1S),則可構成具有掩模圖案的金屬掩模,所述掩模圖案中配置在其中一個面側的孔的深度與配置在另一面側的孔的深度不同。The first carrier layer 11 can be etched by an etchant that can etch the base material layer 10 . That is, the base material layer 10 and the first carrier layer 11 can be simultaneously etched by a homogeneous etching solution (eg, ferric chloride solution, etc.). In the present invention, when the base material layer 10 and the first carrier layer 11 can be etched at the same time, as long as the base material layer 10 has higher corrosion resistance to the etchant than the first carrier layer 11 . Therefore, when the etching of the base material layer 10 and the first carrier layer 11 is started simultaneously with the etchant, the base material layer 10 is less easily etched than the first carrier layer 11 , so that the base material layer 10 can be The etch rate of the first carrier layer 11 is slower than that of the first carrier layer 11 . Therefore, for example, when etching holes are simultaneously formed in the base material layer 10 and the first carrier layer 11 , the depth of the etching holes formed from the surface (Z2 side) of the base material layer 10 to the Z1 side is higher than that from the surface of the first carrier layer 11 . (Z1 side) The depth of the etching hole formed toward Z2 side is shallower. If a metal mask sheet (clad sheet 1S) that can obtain such a difference in the depth of the etched holes is used, a metal mask having a mask pattern in which holes are arranged on one of the surfaces can be formed is different from the depth of the hole arranged on the other side.

另外,優選在同等的環境下使用同質的蝕刻液進行披覆板材1S的蝕刻,將基材層10的腐蝕減量設為Mb ,將第一載體層11的腐蝕減量設為Mc1 時,基材層10與第一載體層11滿足Mb /Mc1 ≦0.9的關係。滿足所述關係的披覆板材1S在同時蝕刻基材層10及第一載體層11時,能夠可靠地使基材層10的蝕刻速度比第一載體層11的蝕刻速度更慢。由此,例如在欲同時形成蝕刻孔時,能夠可靠地使從基材層10的表面(Z2側)向Z1側形成的蝕刻孔的深度比從第一載體層11的表面(Z1側)向Z2側形成的蝕刻孔的深度更淺。此外,經同時蝕刻的基材層10與第一載體層11滿足Mb /Mc1 >0(Mb >0,Mc1 >0)的關係。In addition, it is preferable to use a homogeneous etchant to etch the coating plate 1S under the same environment, and let the corrosion loss of the base layer 10 be M b , and the corrosion loss of the first carrier layer 11 to be M c1 , the basic The material layer 10 and the first carrier layer 11 satisfy the relationship of M b /M c1 ≦0.9. When the cladding sheet 1S satisfying the above relationship is simultaneously etching the base material layer 10 and the first carrier layer 11 , the etching rate of the base material layer 10 can be reliably made slower than the etching rate of the first carrier layer 11 . Thus, for example, when etching holes are to be formed at the same time, the depth of the etching holes formed from the surface (Z2 side) of the base layer 10 to the Z1 side can be reliably increased from the depth of the etching holes formed from the surface (Z1 side) of the first carrier layer 11 to the Z1 side. The depth of the etching hole formed on the Z2 side is shallower. In addition, the simultaneously etched base material layer 10 and the first carrier layer 11 satisfy the relationship of M b /M c1 >0 (M b >0, M c1 >0).

舉出一例,能夠確認,當分別以濃度為40質量%的氯化鐵液(水溶液)對板材A與板材B進行蝕刻時,板材A的腐蝕減量(MA )與板材B的腐蝕減量(MB )之比(MA /MB )成為約0.89,其中所述板材A包含含有約32質量%的Ni及約5.5質量%的Co的鐵基合金,所述板材B包含含有約36質量%的Ni的鐵基合金。當將具有所述關係的板材A用於基材層10(厚度t0),將板材B用於第一載體層11(厚度t1=t0)而構成披覆板材1S時,所述Mb /Mc1 成為約0.89。因此,基材層10與第一載體層11滿足Mb /Mc1 ≦0.9的關係。As an example, it can be confirmed that when the plate A and the plate B are etched with a ferric chloride solution (aqueous solution) having a concentration of 40% by mass, respectively, the corrosion loss (M A ) of the plate A and the corrosion loss (M ) of the plate B are confirmed. B ) ratio (M A /M B ) becomes about 0.89, wherein the sheet A contains an iron-based alloy containing about 32 mass % Ni and about 5.5 mass % Co, and the sheet B contains about 36 mass % Ni iron-based alloys. When the sheet material A having the above relationship is used for the base material layer 10 (thickness t0 ) and the sheet material B is used for the first carrier layer 11 (thickness t1 = t0 ) to form the cladding sheet material 1S, the M b /M c1 becomes about 0.89. Therefore, the base material layer 10 and the first carrier layer 11 satisfy the relationship of M b /M c1 ≦0.9.

披覆板材1S優選具有0.2%耐力、拉伸強度、伸長率、楊氏模數、硬度、線膨脹係數等適於金屬掩模的機械強度及各種特性。例如,從使操作變得容易的觀點來看,優選拉伸強度大且楊氏模數大的披覆板材1S。在此情況下,披覆板材1S特別優選成為金屬掩模的主體的基材層10的拉伸強度為700 MPa以上,且楊氏模數為100 GPa以上。另外,例如從在有機EL元件用金屬掩模的使用時抑制蒸鍍時的加熱變形(應變)的觀點來看,優選因加熱而產生的翹曲小的披覆板材1S,優選構成披覆板材1S的基材層10的線膨脹係數與第一載體層11的線膨脹係數之差小。在此情況下,優選基材層10的線膨脹係數為5 ppm/℃以下,且第一載體層11的線膨脹係數相對於基材層10的線膨脹係數而為±2 ppm/℃以內。The cladding sheet 1S preferably has mechanical strength and various properties suitable for metal masks, such as 0.2% proof strength, tensile strength, elongation, Young's modulus, hardness, and coefficient of linear expansion. For example, from the viewpoint of facilitating handling, the cladding sheet 1S having a large tensile strength and a large Young's modulus is preferable. In this case, it is particularly preferable that the cladding sheet 1S has a tensile strength of 700 MPa or more and a Young's modulus of 100 GPa or more of the base material layer 10 serving as the main body of the metal mask. In addition, for example, from the viewpoint of suppressing thermal deformation (strain) during vapor deposition when a metal mask for organic EL elements is used, it is preferable that the cladding sheet 1S has less warpage due to heating, and it is preferable to constitute the cladding sheet. The difference between the linear expansion coefficient of the base material layer 10 of 1S and the linear expansion coefficient of the first carrier layer 11 is small. In this case, the linear expansion coefficient of the base material layer 10 is preferably 5 ppm/°C or less, and the linear expansion coefficient of the first carrier layer 11 is preferably within ±2 ppm/°C relative to the linear expansion coefficient of the base material layer 10 .

<第二實施方式> 將根據本發明的金屬掩模用披覆板材的第二實施方式示於圖4。此外,圖4中為方便起見而引用圖3所示的符號。圖4為沿厚度方向(Z方向)切斷的金屬掩模用披覆板材2S(以下稱為「披覆板材2S」)的截面視。圖4所示的披覆板材2S與圖3所示的披覆板材1S的層數不同。披覆板材2S所具備的基材層10及第一載體層11與披覆板材1S所具備的基材層10及第一載體層11既可為同等構成,也可不為同等構成。<Second Embodiment> A second embodiment of the covering sheet for a metal mask according to the present invention is shown in FIG. 4 . In addition, the symbols shown in FIG. 3 are referred to in FIG. 4 for convenience. FIG. 4 is a cross-sectional view of a covering sheet 2S for a metal mask (hereinafter referred to as “covering sheet 2S”) cut along the thickness direction (Z direction). The cladding sheet 2S shown in FIG. 4 is different from the cladding sheet 1S shown in FIG. 3 in the number of layers. The base material layer 10 and the first carrier layer 11 provided in the coating sheet 2S and the base material layer 10 and the first carrier layer 11 provided in the coating sheet 1S may or may not have the same structure.

披覆板材2S在沿厚度方向切斷的截面視時,為三層結構。披覆板材2S(厚度T2S )包括基材層10(厚度t0)、壓接於基材層10的其中一側(Z1側)的第一載體層11(厚度t1)、及壓接於基材層10的另一側(Z2側)的第二載體層12(厚度t2)。圖4所示的第一載體層11與第二載體層12的厚度大致同等(t1=t2)。基材層10、第一載體層11及第二載體層12的壓接形態例如通過下述方式獲得,即:將用於構成基材層10的板材、用於構成第一載體層11的板材及用於構成第二載體層12的板材以經重合的狀態軋壓(披覆軋壓),視需要進行擴散退火。此外,披覆板材2S為申請專利範圍的「金屬掩模用披覆板材」的一例,基材層10為申請專利範圍的「基材層」的一例,第一載體層11為申請專利範圍的「第一載體層」的一例,第二載體層12為申請專利範圍的「第二載體層」的一例。The cladding sheet 2S has a three-layer structure in a cross-sectional view cut along the thickness direction. The cladding sheet 2S (thickness T 2S ) includes a base material layer 10 (thickness t0 ), a first carrier layer 11 (thickness t1 ) crimped on one side (Z1 side) of the base material layer 10 , and a base material The second carrier layer 12 (thickness t2 ) on the other side (Z2 side) of the material layer 10 . The thicknesses of the first carrier layer 11 and the second carrier layer 12 shown in FIG. 4 are approximately the same (t1=t2). The crimping form of the base material layer 10 , the first carrier layer 11 , and the second carrier layer 12 is obtained, for example, by combining the sheet material for constituting the base material layer 10 and the sheet material for constituting the first support layer 11 And the sheet material used to constitute the second carrier layer 12 is rolled in a superimposed state (clad rolling), and diffusion annealing is carried out if necessary. In addition, the covering sheet 2S is an example of the "covering sheet for metal mask" within the scope of the patent application, the base material layer 10 is an example of the "substrate layer" within the scope of the patent application, and the first carrier layer 11 is the scope of the patent application. An example of the "first carrier layer", and the second carrier layer 12 is an example of the "second carrier layer" within the scope of the patent application.

構成披覆板材2S的基材層10能夠作為金屬掩模的主體。在此情況下,既可獲得包含基材層10部分的單層結構的金屬掩模,也可獲得包含基材層10部分與第一載體層11部分的二層結構的金屬掩模,也可獲得包含基材層10部分與第二載體層12部分的二層結構的金屬掩模,也可獲得包含第一載體層11部分、基材層10部分及第二載體層12部分的三層結構的金屬掩模。如上文所述,作為目標的金屬掩模的厚度例如為20 μm以下,理想的是15 μm以下。對照所述目標,從薄壁化的觀點來看,披覆板材2S的厚度T2S 的上限值或以基材層10部分作為金屬掩模的主體時的基材層10的厚度t0的上限值優選20 μm以下,更優選15 μm以下,進一步優選10 μm以下。另外,從操作的容易化的觀點來看,披覆板材2S的厚度T2S 的下限值或以基材層10部分作為金屬掩模的主體時的基材層10的厚度t0的下限值優選1 μm以上,更優選3 μm以上,進一步優選5 μm以上。披覆板材2S的厚度T2S 越薄,或以基材層10部分作為金屬掩模的主體時基材層10的厚度t0越薄,則越抑制蝕刻的側蝕的量,因此通過蝕刻所形成的蝕刻孔等掩模圖案的尺寸精度得到改善,可獲得具有更高精細的掩模圖案的金屬掩模。The base material layer 10 constituting the cladding sheet 2S can serve as the main body of the metal mask. In this case, a metal mask with a single-layer structure including a portion of the base material layer 10 can be obtained, a metal mask with a two-layer structure including a portion of the base material layer 10 and a portion of the first carrier layer 11 can be obtained, or A metal mask with a two-layer structure including a base material layer 10 part and a second carrier layer 12 part is obtained, and a three-layer structure including a first support layer 11 part, a base material layer 10 part and a second support layer 12 part can also be obtained. metal mask. As described above, the target thickness of the metal mask is, for example, 20 μm or less, and desirably 15 μm or less. In contrast to the above target, from the viewpoint of thinning, the upper limit value of the thickness T 2S of the cladding sheet 2S or the upper limit of the thickness t0 of the base material layer 10 when the base material layer 10 part is used as the main body of the metal mask The limit value is preferably 20 μm or less, more preferably 15 μm or less, and further preferably 10 μm or less. In addition, from the viewpoint of ease of handling, the lower limit value of the thickness T 2S of the covering plate 2S or the lower limit value of the thickness t0 of the base material layer 10 when the base material layer 10 part is used as the main body of the metal mask It is preferably 1 μm or more, more preferably 3 μm or more, and further preferably 5 μm or more. The thinner the thickness T 2S of the cladding plate 2S, or the thinner the thickness t0 of the base material layer 10 when the base material layer 10 is used as the main body of the metal mask, the more the amount of side etching of the etching is suppressed. The dimensional accuracy of mask patterns such as etched holes is improved, and a metal mask with a higher finer mask pattern can be obtained.

構成披覆板材2S的基材層10包含鐵基合金。此鐵基合金以30質量%以上且50質量%以下的範圍含有Ni及Co中的一種以上。除了Ni及Co以外的剩餘部分既可為Fe及不可避免的雜質,也可還包含一種以上的添加元素。此外,含有Ni及Co的鐵基合金優選Co為10質量%以下(也就是Ni為20質量%以上且40質量%以下)。相對於Fe以30質量%以上且50質量%以下的範圍含有Ni及Co中的一種以上的鐵基合金大多情況下,例如對於在有機EL元件用金屬掩模的使用時抑制蒸鍍時的加熱變形(應變)而言有效的線膨脹係數小,適於構成金屬掩模用板材。所述鐵基合金有時以10質量%以下的範圍含有Ni及Co以外的元素(添加元素)。添加元素例如為Mn、Mo、Nb及Cr等。以0質量%以上且10質量%以下的範圍含有這些添加元素的鐵基合金有可能具有0.2%耐力、拉伸強度、伸長率、楊氏模數、硬度、線膨脹係數等作為構成金屬掩模用板材的金屬材料而優選的機械強度及各種特性。包含所述鐵基合金的基材層10可由適於所述鐵基合金的通常的蝕刻液(例如氯化鐵液等)進行蝕刻。The base material layer 10 constituting the cladding sheet 2S contains an iron-based alloy. This iron-based alloy contains at least one of Ni and Co in a range of 30 mass % or more and 50 mass % or less. The remainder other than Ni and Co may be Fe and inevitable impurities, or may contain one or more additional elements. Further, in the iron-based alloy containing Ni and Co, it is preferable that Co is 10 mass % or less (that is, Ni is 20 mass % or more and 40 mass % or less). An iron-based alloy containing at least one of Ni and Co in a range of 30 mass % or more and 50 mass % or less with respect to Fe is often used to suppress heating during vapor deposition, for example, when a metal mask for an organic EL element is used. The effective coefficient of linear expansion in terms of deformation (strain) is small, and it is suitable for forming a sheet metal for a metal mask. The iron-based alloy may contain elements (additional elements) other than Ni and Co in a range of 10 mass % or less. The additive elements are, for example, Mn, Mo, Nb, Cr, and the like. Iron-based alloys containing these additive elements in the range of 0 mass % or more and 10 mass % or less may have 0.2% endurance, tensile strength, elongation, Young's modulus, hardness, coefficient of linear expansion, etc. as a constituent metal mask The mechanical strength and various properties are preferred by the metal material of the sheet. The base material layer 10 containing the iron-based alloy can be etched by a common etching solution (eg, ferric chloride solution, etc.) suitable for the iron-based alloy.

構成披覆板材2S的第一載體層11壓接於基材層10的其中一側(Z1側)。另外,構成披覆板材2S的第二載體層12壓接於基材層10的另一側(Z2側)。第一載體層11及第二載體層12對於成為金屬掩模的主體的經薄壁化的基材層10的補強有效,對於提高薄壁的披覆板材2S的機械強度而言有效。第一載體層11及第二載體層12成為經薄壁化的基材層10的載體,使經薄壁化的基材層10的操作變得容易,有助於包含基材層10的披覆板材2S的蝕刻的穩定化。另外,第一載體層11及第二載體層12能夠與基材層10同樣地作為金屬掩模的主體。在此情況下,既可獲得包含第一載體層11部分的單層結構的金屬掩模,也可獲得包含第二載體層12部分的單層結構的金屬掩模,也可獲得包含第一載體層11部分與基材層10部分的二層結構的金屬掩模,也可獲得包含第二載體層12部分與基材層10部分的二層結構的金屬掩模,也可獲得包含第一載體層11部分、基材層10部分及第二載體層12部分的三層結構的金屬掩模。從操作的容易化的觀點來看,當以基材層10的補強為目的時,第一載體層11的厚度t1及第二載體層12的厚度t2分別優選5 μm以上且100 μm以下,更優選20 μm以上且100 μm以下。當以第一載體層11部分或第二載體層12部分作為金屬掩模的主體時,第一載體層11的厚度t1的上限值及第二載體層12的厚度t2的上限值分別優選20 μm以下,更優選15 μm以下,進一步優選10 μm以下。The first carrier layer 11 constituting the cladding sheet 2S is crimped to one side (the Z1 side) of the base material layer 10 . In addition, the second carrier layer 12 constituting the cladding sheet 2S is press-bonded to the other side (Z2 side) of the base material layer 10 . The first carrier layer 11 and the second carrier layer 12 are effective for reinforcing the thinned base material layer 10 serving as the main body of the metal mask, and are effective for improving the mechanical strength of the thin-walled cladding sheet 2S. The first carrier layer 11 and the second carrier layer 12 serve as the carrier of the thinned base material layer 10 , which facilitates the handling of the thinned base material layer 10 and facilitates the covering of the base material layer 10 . Stabilization of etching of the cladding sheet 2S. In addition, the 1st carrier layer 11 and the 2nd carrier layer 12 can serve as the main body of a metal mask similarly to the base material layer 10. In this case, a metal mask with a single-layer structure including a portion of the first carrier layer 11 can be obtained, a metal mask with a single-layer structure including a portion of the second carrier layer 12 can be obtained, and a first carrier can also be obtained. A metal mask with a two-layer structure including a part of the layer 11 and a part of the base material layer 10 can also be obtained as a metal mask with a two-layer structure including a part of the second carrier layer 12 and a part of the base material layer 10, and a metal mask with a two-layer structure including a part of the first carrier can also be obtained The metal mask of the three-layer structure of the layer 11 part, the base material layer 10 part and the second carrier layer 12 part. From the viewpoint of ease of handling, when the purpose of reinforcing the base layer 10 is to be, the thickness t1 of the first carrier layer 11 and the thickness t2 of the second carrier layer 12 are preferably 5 μm or more and 100 μm or less, respectively, and more preferably It is preferably 20 μm or more and 100 μm or less. When the first carrier layer 11 part or the second carrier layer 12 part is used as the main body of the metal mask, the upper limit value of the thickness t1 of the first carrier layer 11 and the upper limit value of the thickness t2 of the second carrier layer 12 are respectively preferable 20 μm or less, more preferably 15 μm or less, further preferably 10 μm or less.

第一載體層11及第二載體層12均可由可蝕刻基材層10的蝕刻液進行蝕刻。即,基材層10與第一載體層11、基材層10與第二載體層12、及第一載體層11與第二載體層12各個組合可由同質的蝕刻液(例如氯化鐵液等)同時蝕刻。本發明中,在可同時蝕刻基材層10與第一載體層11時、可同時蝕刻基材層10與第二載體層12時、及可同時蝕刻第一載體層11與第二載體層12時各自,只要基材層10相較於第一載體層11及第二載體層12而對所述蝕刻液更為高耐蝕便可。此外,第一載體層11可相較於第二載體層12而對相同的蝕刻液更為高耐蝕,或者第二載體層12可相較於第一載體層11而對相同的蝕刻液更為高耐蝕。由此,例如若以相同材質且厚度同等(t1=t2)的方式構成第一載體層11及第二載體層12,則通過將第一載體層11與第二載體層12同時半蝕刻,從而能夠將第一載體層11及第二載體層12同時除去而使基材層10的其中一側(Z1側)的表面及另一側(Z2側)的表面同時露出,獲得包含基材層10的單層結構的金屬板材。在此情況下,通過調整半蝕刻的條件,從而能夠獲得第一載體層11及第二載體層12各自具有規定的厚度且具備在基材層10的兩面的、三層結構的披覆板材。另外,若使第一載體層11與第二載體層12的材質不同而構成,則也可僅使相較於蝕刻液而更為高耐蝕的第一載體層11或第二載體層12的任一者以規定的厚度殘留。在此情況下,可獲得僅第一載體層11或第二載體層12的任一者具有規定的厚度且具備在基材層10的、二層結構的披覆板材。Both the first carrier layer 11 and the second carrier layer 12 can be etched with an etchant that can etch the base material layer 10 . That is, the base material layer 10 and the first carrier layer 11 , the base material layer 10 and the second support layer 12 , and the first support layer 11 and the second support layer 12 can be combined by a homogeneous etching solution (eg, ferric chloride solution, etc.) ) simultaneously etched. In the present invention, when the base material layer 10 and the first carrier layer 11 can be etched simultaneously, when the base material layer 10 and the second carrier layer 12 can be etched simultaneously, and the first carrier layer 11 and the second carrier layer 12 can be etched simultaneously As long as the base material layer 10 has higher corrosion resistance to the etching solution than the first carrier layer 11 and the second carrier layer 12 , respectively. In addition, the first carrier layer 11 may have higher corrosion resistance to the same etchant than the second carrier layer 12 , or the second carrier layer 12 may be more resistant to the same etchant than the first carrier layer 11 . High corrosion resistance. Thus, for example, if the first carrier layer 11 and the second carrier layer 12 are made of the same material and have the same thickness (t1=t2), the first carrier layer 11 and the second carrier layer 12 are half-etched at the same time, so that the The first carrier layer 11 and the second carrier layer 12 can be simultaneously removed to expose the surface of one side (Z1 side) and the surface of the other side (Z2 side) of the base material layer 10 at the same time, thereby obtaining the base material layer 10 single-layer structure of sheet metal. In this case, by adjusting the half-etching conditions, the first carrier layer 11 and the second carrier layer 12 can each have a predetermined thickness and have a three-layer structure covering the substrate layer 10 on both sides. In addition, if the first carrier layer 11 and the second carrier layer 12 are made of different materials, it is also possible to use only the first carrier layer 11 or the second carrier layer 12 which has higher corrosion resistance than the etching solution. One remains with a predetermined thickness. In this case, only one of the first carrier layer 11 or the second carrier layer 12 has a predetermined thickness and is provided with the base material layer 10 and a clad sheet with a two-layer structure can be obtained.

基材層10相較於第一載體層11及第二載體層12而對所述蝕刻液更為高耐蝕。由此,當利用所述蝕刻液開始所述二層結構的披覆板材的蝕刻時,基材層10相較於第一載體層11(或第二載體層12)而更不易被蝕刻,因此能夠使基材層10的蝕刻速度比第一載體層11(或第二載體層12)的蝕刻速度更慢。因此,例如在對包括基材層10及第一載體層11的二層結構的披覆板材同時形成蝕刻孔時,從基材層10的表面(Z2側)向Z1側形成的蝕刻孔的深度比從第一載體層11的表面(Z1側)向Z2側形成的蝕刻孔的深度更淺。或者,在對包括基材層10及第二載體層12的二層結構的披覆板材同時形成蝕刻孔時,從基材層10的表面(Z1側)向Z2側形成的蝕刻孔的深度比從第二載體層12的表面(Z2側)向Z1側形成的蝕刻孔的深度更淺。若使用可獲得這種蝕刻孔的深度差的金屬掩模用板材(披覆板材2S),則可構成具有掩模圖案的金屬掩模,所述掩模圖案中配置在其中一個面側的孔的深度與配置在另一面側的孔的深度不同。Compared with the first carrier layer 11 and the second carrier layer 12 , the base material layer 10 has higher corrosion resistance to the etching solution. Therefore, when using the etchant to start the etching of the clad sheet with the two-layer structure, the base material layer 10 is more difficult to be etched than the first carrier layer 11 (or the second carrier layer 12 ), so The etching rate of the base material layer 10 can be made slower than the etching rate of the first carrier layer 11 (or the second carrier layer 12 ). Therefore, for example, when etching holes are simultaneously formed in a cladding sheet with a two-layer structure including the base material layer 10 and the first carrier layer 11 , the depth of the etching holes formed from the surface (Z2 side) of the base material layer 10 to the Z1 side It is shallower than the depth of the etching hole formed from the surface (Z1 side) of the first carrier layer 11 to the Z2 side. Alternatively, when etching holes are simultaneously formed on a cladding sheet with a two-layer structure including the base material layer 10 and the second carrier layer 12 , the depth ratio of the etching holes formed from the surface (Z1 side) of the base material layer 10 to the Z2 side The depth of the etching hole formed from the surface (Z2 side) of the second carrier layer 12 to the Z1 side is shallower. If a metal mask sheet (clad sheet 2S) that can obtain such a difference in the depth of the etched holes is used, a metal mask having a mask pattern in which holes are arranged on one of the surfaces can be formed is different from the depth of the hole arranged on the other side.

另外,優選在同等的環境下使用同質的蝕刻液進行披覆板材2S的蝕刻,將基材層10的腐蝕減量設為Mb ,將第一載體層11的腐蝕減量設為Mc1 ,將第二載體層12的腐蝕減量設為Mc2 時,基材層10、第一載體層11及第二載體層12滿足Mb /Mc1 ≦0.9及Mb /Mc2 ≦0.9的關係。滿足所述關係的披覆板材2S能夠在同時蝕刻基材層10及第一載體層11時,可靠地使基材層10的蝕刻速度比第一載體層11的蝕刻速度更慢,或者能夠在同時蝕刻基材層10及第二載體層12時,可靠地使基材層10的蝕刻速度比第二載體層12的蝕刻速度更慢。由此,例如在欲同時形成蝕刻孔時,能夠可靠地使從基材層10的表面(Z2側)向Z1側形成的蝕刻孔的深度比從第一載體層11的表面(Z1側)向Z2側形成的蝕刻孔的深度更淺,或者能夠可靠地使從基材層10的表面(Z1側)向Z2側形成的蝕刻孔的深度比從第二載體層12的表面(Z2側)向Z1側形成的蝕刻孔的深度更淺。此外,經同時蝕刻的基材層10與第一載體層11滿足Mb /Mc1 >0(Mb >0,Mc1 >0)的關係,或者經同時蝕刻的基材層10與第二載體層12滿足Mb /Mc2 >0(Mb >0,Mc2 >0)的關係。此外,第一載體層11與第二載體層12可滿足Mc1 /Mc2 ≦0.9的關係,或可滿足Mc2 /Mc1 ≦0.9的關係。In addition, it is preferable to perform the etching of the cladding plate 2S using a homogeneous etching solution under the same environment, and let the corrosion loss of the base layer 10 be M b , the corrosion loss of the first carrier layer 11 be M c1 , and the first When the etching loss of the two carrier layers 12 is set to M c2 , the base layer 10 , the first carrier layer 11 and the second carrier layer 12 satisfy the relationship of M b /M c1 ≦0.9 and M b /M c2 ≦0.9. The cladding sheet 2S satisfying the above relationship can reliably make the etching rate of the base material layer 10 slower than the etching rate of the first carrier layer 11 when the base material layer 10 and the first carrier layer 11 are etched at the same time, or can be etched at the same time. When the base material layer 10 and the second carrier layer 12 are simultaneously etched, the etching rate of the base material layer 10 is reliably made slower than the etching rate of the second carrier layer 12 . Thus, for example, when etching holes are to be formed at the same time, the depth of the etching holes formed from the surface (Z2 side) of the base layer 10 to the Z1 side can be reliably increased from the depth of the etching holes formed from the surface (Z1 side) of the first carrier layer 11 to the Z1 side. The depth of the etching hole formed on the Z2 side is shallower, or the depth of the etching hole formed from the surface (Z1 side) of the base layer 10 to the Z2 side can be reliably made deeper than the depth of the etching hole formed from the surface (Z2 side) of the second carrier layer 12 The depth of the etching hole formed on the Z1 side is shallower. In addition, the simultaneously etched base material layer 10 and the first carrier layer 11 satisfy the relationship of M b /M c1 >0 (M b >0, M c1 >0), or the simultaneously etched base material layer 10 and the second The carrier layer 12 satisfies the relationship of M b /M c2 >0 (M b >0, M c2 >0). In addition, the first carrier layer 11 and the second carrier layer 12 may satisfy the relationship of M c1 /M c2 ≦0.9, or may satisfy the relationship of M c2 /M c1 ≦0.9.

披覆板材2S優選具有0.2%耐力、拉伸強度、伸長率、楊氏模數、硬度、線膨脹係數等適於金屬掩模的機械強度及各種特性。例如,從使操作變得容易的觀點來看,優選拉伸強度大且楊氏模數大的披覆板材2S。在此情況下,披覆板材2S特別優選成為金屬掩模的主體的基材層10的拉伸強度為700 MPa以上,且楊氏模數為100 GPa以上。另外,例如從在有機EL元件用金屬掩模的使用時抑制蒸鍍時的加熱變形(應變)的觀點來看,優選因加熱而產生的翹曲小的披覆板材2S,優選構成披覆板材2S的基材層10的線膨脹係數、第一載體層11的線膨脹係數及第二載體層12的線膨脹係數相互之差小。在此情況下,優選基材層10的線膨脹係數為5 ppm/℃以下,且第一載體層11的線膨脹係數及第二載體層12的線膨脹係數分別相對於基材層10的線膨脹係數而為±2 ppm/℃以內。The cladding sheet 2S preferably has mechanical strength and various properties suitable for metal masks, such as 0.2% strength, tensile strength, elongation, Young's modulus, hardness, and coefficient of linear expansion. For example, from the viewpoint of facilitating handling, the cladding sheet 2S having a large tensile strength and a large Young's modulus is preferable. In this case, it is particularly preferable that the cladding sheet 2S has a tensile strength of 700 MPa or more and a Young's modulus of 100 GPa or more of the base material layer 10 serving as the main body of the metal mask. In addition, for example, from the viewpoint of suppressing thermal deformation (strain) during vapor deposition when using a metal mask for organic EL elements, it is preferable that the cladding sheet 2S has less warpage due to heating, and it is preferable to constitute the cladding sheet. The difference between the linear expansion coefficient of the base material layer 10, the linear expansion coefficient of the first carrier layer 11, and the linear expansion coefficient of the second carrier layer 12 of 2S is small. In this case, the linear expansion coefficient of the base material layer 10 is preferably 5 ppm/°C or less, and the linear expansion coefficient of the first carrier layer 11 and the linear expansion coefficient of the second carrier layer 12 are preferably relative to the linear expansion coefficient of the base material layer 10 , respectively. The expansion coefficient is within ±2 ppm/°C.

<第三實施方式> 將根據本發明的金屬掩模用披覆板材的第三實施方式示於圖5。此外,圖5中為方便起見而引用圖3及圖4所示的符號。圖5為沿厚度方向(Z方向)切斷的金屬掩模用披覆板材3S(以下稱為「披覆板材3S」)的截面視。圖5所示的披覆板材3S與圖4所示的披覆板材2S的第二載體層12的厚度不同(為方便起見,厚度的符號均表述為t2)。構成披覆板材3S的基材層10、第一載體層11及第二載體層12除了第一載體層11的厚度t1與第二載體層12的厚度t2不同(t1>t2)以外,與構成所述披覆板材2S的基材層10、第一載體層11及第二載體層12既可為同等構成,也可不為同等構成。<Third Embodiment> A third embodiment of the cladding sheet for a metal mask according to the present invention is shown in FIG. 5 . In addition, in FIG. 5, the symbols shown in FIG. 3 and FIG. 4 are used for convenience. FIG. 5 is a cross-sectional view of a covering sheet 3S for a metal mask (hereinafter referred to as “covering sheet 3S”) cut along the thickness direction (Z direction). The thickness of the second carrier layer 12 of the cladding plate 3S shown in FIG. 5 is different from that of the cladding plate 2S shown in FIG. 4 (for convenience, the symbols of thickness are all expressed as t2 ). Except that the thickness t1 of the first carrier layer 11 and the thickness t2 of the second carrier layer 12 are different (t1>t2), the base material layer 10, the first carrier layer 11 and the second carrier layer 12 constituting the cladding sheet 3S are different from the structure. The base material layer 10 , the first carrier layer 11 and the second carrier layer 12 of the cladding sheet 2S may or may not have the same structure.

披覆板材3S在沿厚度方向切斷的截面視時,為三層結構。披覆板材3S(厚度T3S )包括基材層10(厚度t0)、壓接於基材層10的其中一側(Z1側)的第一載體層11(厚度t1)、及壓接於基材層10的另一側(Z2側)的第二載體層12(厚度t2)。圖5所示的第一載體層11與第二載體層12的厚度不同(t1>t2)。此外,披覆板材3S例如可使第二載體層12的厚度t2比第一載體層11的厚度t1更厚(t1<t2)。基材層10、第一載體層11及第二載體層12的壓接形態例如通過下述方式獲得,即:將用於構成基材層10的板材、用於構成第一載體層11的板材及用於構成第二載體層12的板材以經重合的狀態軋壓(披覆軋壓),視需要進行擴散退火。此外,披覆板材3S為申請專利範圍的「金屬掩模用披覆板材」的一例,基材層10為申請專利範圍的「基材層」的一例,第一載體層11為申請專利範圍的「第一載體層」的一例,第二載體層12為申請專利範圍的「第二載體層」的一例。The cladding plate 3S has a three-layer structure in a cross-sectional view cut along the thickness direction. The cladding plate 3S (thickness T 3S ) includes a base material layer 10 (thickness t0 ), a first carrier layer 11 (thickness t1 ) crimped to one side (Z1 side) of the base material layer 10 , and a base material The second carrier layer 12 (thickness t2 ) on the other side (Z2 side) of the material layer 10 . The thicknesses of the first carrier layer 11 and the second carrier layer 12 shown in FIG. 5 are different (t1>t2). In addition, the cladding plate 3S can, for example, make the thickness t2 of the second carrier layer 12 thicker than the thickness t1 of the first carrier layer 11 (t1<t2). The crimping form of the base material layer 10 , the first carrier layer 11 , and the second carrier layer 12 is obtained, for example, by combining the sheet material for constituting the base material layer 10 and the sheet material for constituting the first support layer 11 And the sheet material used to constitute the second carrier layer 12 is rolled in a superimposed state (clad rolling), and diffusion annealing is carried out if necessary. In addition, the cladding sheet 3S is an example of the "cladding sheet for metal mask" within the scope of the patent application, the base material layer 10 is an example of the "substrate layer" within the scope of the patent application, and the first carrier layer 11 is the scope of the patent application. An example of the "first carrier layer", and the second carrier layer 12 is an example of the "second carrier layer" within the scope of the patent application.

構成披覆板材3S的基材層10能夠作為金屬掩模的主體。在此情況下,既可獲得包含基材層10部分的單層結構的金屬掩模,也可獲得包含基材層10部分與第一載體層11部分的二層結構的金屬掩模,也可獲得基材層10部分與第二載體層12部分的二層結構的金屬掩模,也可獲得包含第一載體層11部分、基材層10部分及第二載體層12部分的三層結構的金屬掩模。如上文所述,作為目標的金屬掩模的厚度例如為20 μm以下,理想的是15 μm以下。對照所述目標,從薄壁化的觀點來看,披覆板材3S的厚度T3S 的上限值或以基材層10部分作為金屬掩模的主體時的基材層10的厚度t0的上限值優選20 μm以下,更優選15 μm以下、進一步優選10 μm以下。另外,從操作的容易化的觀點來看,披覆板材3S的厚度T3S 的下限值或以基材層10部分作為金屬掩模的主體時的基材層10的厚度t0的下限值優選1 μm以上,更優選3 μm以上,進一步優選5 μm以上。披覆板材3S的厚度T3S 越薄,或以基材層10部分作為金屬掩模的主體時基材層10的厚度t0越薄,則越抑制蝕刻的側蝕的量,因此通過蝕刻所形成的蝕刻孔等掩模圖案的尺寸精度得到改善,可獲得具有更高精細的掩模圖案的金屬掩模。The base material layer 10 constituting the cladding sheet 3S can serve as the main body of the metal mask. In this case, a metal mask with a single-layer structure including a portion of the base material layer 10 can be obtained, a metal mask with a two-layer structure including a portion of the base material layer 10 and a portion of the first carrier layer 11 can be obtained, or A metal mask with a two-layer structure of the base material layer 10 part and the second carrier layer 12 part can be obtained, and a three-layer structure including the first support layer 11 part, the base material layer 10 part and the second support layer 12 part can also be obtained. metal mask. As described above, the target thickness of the metal mask is, for example, 20 μm or less, and desirably 15 μm or less. In contrast to the above target, from the viewpoint of thinning, the upper limit of the thickness T 3S of the clad sheet 3S or the upper limit of the thickness t0 of the base material layer 10 when the base material layer 10 part is used as the main body of the metal mask The limit value is preferably 20 μm or less, more preferably 15 μm or less, and further preferably 10 μm or less. In addition, from the viewpoint of easiness of handling, the lower limit value of the thickness T 3S of the covering plate 3S or the lower limit value of the thickness t0 of the base material layer 10 when the base material layer 10 part is used as the main body of the metal mask It is preferably 1 μm or more, more preferably 3 μm or more, and further preferably 5 μm or more. The thinner the thickness T 3S of the cladding sheet 3S, or the thinner the thickness t0 of the base material layer 10 when the base material layer 10 is used as the main body of the metal mask, the more the amount of side etching of the etching is suppressed. The dimensional accuracy of mask patterns such as etched holes is improved, and a metal mask with a higher finer mask pattern can be obtained.

構成披覆板材3S的基材層10包含鐵基合金。此鐵基合金以30質量%以上且50質量%以下的範圍含有Ni及Co中的一種以上。除了Ni及Co以外的剩餘部分既可為Fe及不可避免的雜質,也可還含有一種以上的添加元素。此外,含有Ni及Co的鐵基合金優選Co為10質量%以下(也就是Ni為20質量%以上且40質量%以下)。相對於Fe以30質量%以上且50質量%以下的範圍含有Ni及Co中的一種以上的鐵基合金大多情況下,例如對於在有機EL元件用金屬掩模的使用時抑制蒸鍍時的加熱變形(應變)而言有效的線膨脹係數小,適於構成金屬掩模用板材。所述鐵基合金有時以10質量%以下的範圍含有Ni及Co以外的元素(添加元素)。添加元素例如為Mn、Mo、Nb及Cr等。以0質量%以上且10質量%以下的範圍含有這些添加元素的鐵基合金有可能具有0.2%耐力、拉伸強度、伸長率、楊氏模數、硬度、線膨脹係數等作為構成金屬掩模用板材的金屬材料而優選的機械強度及各種特性。包含所述鐵基合金的基材層10可由適於所述鐵基合金的通常的蝕刻液(例如氯化鐵液等)進行蝕刻。The base material layer 10 constituting the cladding sheet 3S contains an iron-based alloy. This iron-based alloy contains at least one of Ni and Co in a range of 30 mass % or more and 50 mass % or less. The remainder other than Ni and Co may be Fe and unavoidable impurities, or may further contain one or more additional elements. Further, in the iron-based alloy containing Ni and Co, it is preferable that Co is 10 mass % or less (that is, Ni is 20 mass % or more and 40 mass % or less). An iron-based alloy containing at least one of Ni and Co in a range of 30 mass % or more and 50 mass % or less with respect to Fe is often used to suppress heating during vapor deposition, for example, when a metal mask for an organic EL element is used. The effective coefficient of linear expansion in terms of deformation (strain) is small, and it is suitable for forming a sheet metal for a metal mask. The iron-based alloy may contain elements (additional elements) other than Ni and Co in a range of 10 mass % or less. The additive elements are, for example, Mn, Mo, Nb, Cr, and the like. Iron-based alloys containing these additive elements in the range of 0 mass % or more and 10 mass % or less may have 0.2% endurance, tensile strength, elongation, Young's modulus, hardness, coefficient of linear expansion, etc. as a constituent metal mask The mechanical strength and various properties are preferred by the metal material of the sheet. The base material layer 10 containing the iron-based alloy can be etched by a common etching solution (eg, ferric chloride solution, etc.) suitable for the iron-based alloy.

構成披覆板材3S的第一載體層11壓接於基材層10的其中一側(Z1側)。另外,構成披覆板材3S的第二載體層12壓接於基材層10的另一側(Z2側)。第一載體層11及第二載體層12對於成為金屬掩模的主體的經薄壁化的基材層10的補強有效,對於提高薄壁的披覆板材3S的機械強度而言有效。第一載體層11及第二載體層12成為經薄壁化的基材層10的載體,使經薄壁化的基材層10的操作變得容易,有助於包含基材層10的披覆板材3S的蝕刻的穩定化。另外,第一載體層11及第二載體層12能夠與基材層10同樣地作為金屬掩模的主體。在此情況下,既可獲得包含第一載體層11部分的單層結構的金屬掩模,也可獲得包含第二載體層12部分的單層結構的金屬掩模,也可獲得包含第一載體層11部分與基材層10部分的二層結構的金屬掩模,也可獲得包含第二載體層12部分與基材層10部分的二層結構的金屬掩模,也可獲得包含第一載體層11部分、基材層10部分及第二載體層12部分的三層結構的金屬掩模。從操作的容易化的觀點來看,當以基材層10的補強為目的時,第一載體層11的厚度t1及第二載體層12的厚度t2分別優選5 μm以上且100 μm以下,更優選20 μm以上且100 μm以下。當以第一載體層11部分或第二載體層12部分作為金屬掩模的主體時,第一載體層11的厚度t1的上限值及第二載體層12的厚度t2的上限值分別優選20 μm以下,更優選15 μm以下,進一步優選10 μm以下。The first carrier layer 11 constituting the cladding sheet 3S is crimped to one side (the Z1 side) of the base material layer 10 . In addition, the second carrier layer 12 constituting the cladding sheet 3S is press-bonded to the other side (Z2 side) of the base material layer 10 . The first carrier layer 11 and the second carrier layer 12 are effective for reinforcing the thinned base material layer 10 serving as the main body of the metal mask, and are effective for improving the mechanical strength of the thin coating sheet 3S. The first carrier layer 11 and the second carrier layer 12 serve as the carrier of the thinned base material layer 10 , which facilitates the handling of the thinned base material layer 10 and facilitates the covering of the base material layer 10 . Stabilization of etching of the cladding sheet 3S. In addition, the 1st carrier layer 11 and the 2nd carrier layer 12 can serve as the main body of a metal mask similarly to the base material layer 10. In this case, a metal mask with a single-layer structure including a portion of the first carrier layer 11 can be obtained, a metal mask with a single-layer structure including a portion of the second carrier layer 12 can be obtained, and a first carrier can also be obtained. A metal mask with a two-layer structure including a part of the layer 11 and a part of the base material layer 10 can also be obtained as a metal mask with a two-layer structure including a part of the second carrier layer 12 and a part of the base material layer 10, and a metal mask with a two-layer structure including a part of the first carrier can also be obtained The metal mask of the three-layer structure of the layer 11 part, the base material layer 10 part and the second carrier layer 12 part. From the viewpoint of ease of handling, when the purpose of reinforcing the base layer 10 is to be, the thickness t1 of the first carrier layer 11 and the thickness t2 of the second carrier layer 12 are preferably 5 μm or more and 100 μm or less, respectively, and more preferably It is preferably 20 μm or more and 100 μm or less. When the first carrier layer 11 part or the second carrier layer 12 part is used as the main body of the metal mask, the upper limit value of the thickness t1 of the first carrier layer 11 and the upper limit value of the thickness t2 of the second carrier layer 12 are respectively preferable 20 μm or less, more preferably 15 μm or less, further preferably 10 μm or less.

第一載體層11及第二載體層12均可由可蝕刻基材層10的蝕刻液進行蝕刻。即,基材層10與第一載體層11、基材層10與第二載體層12、及第一載體層11與第二載體層12各個組合可由同質的蝕刻液(例如氯化鐵液等)同時蝕刻。本發明中,在可同時蝕刻基材層10與第一載體層11時、可同時蝕刻基材層10與第二載體層12時、及可同時蝕刻第一載體層11與第二載體層12各自,只要基材層10相較於第一載體層11及第二載體層12而對所述蝕刻液更為高耐蝕便可。此外,第一載體層11可相較於第二載體層12而對相同的蝕刻液更為高耐蝕,或第二載體層12可相較於第一載體層11而對相同的蝕刻液更為高耐蝕。由此,例如通過將厚度不同(例如t1>t2)的第一載體層11及第二載體層12同時半蝕刻,而能夠將第一載體層11的一部分及第二載體層12全部同時除去而僅使基材層10的其中一側(Z2側)的表面露出,獲得第一載體層11具有規定的厚度且具備在基材層10的另一側(Z1側)的、二層結構的披覆板材。另外,這種二層結構的披覆板材例如也可通過下述方式獲得,即:使第一載體層11與第二載體層12的材質不同而構成,僅使對蝕刻液更為高耐蝕的第一載體層11或第二載體層12的任一者以規定的厚度殘留。在此情況下,通過調整半蝕刻的條件,而也可獲得第一載體層11及第二載體層12分別具有規定的厚度且具備在基材層10的兩面的、三層結構的披覆板材。Both the first carrier layer 11 and the second carrier layer 12 can be etched with an etchant that can etch the base material layer 10 . That is, the base material layer 10 and the first carrier layer 11 , the base material layer 10 and the second support layer 12 , and the first support layer 11 and the second support layer 12 can be combined by a homogeneous etching solution (eg, ferric chloride solution, etc.) ) simultaneously etched. In the present invention, when the base material layer 10 and the first carrier layer 11 can be etched simultaneously, when the base material layer 10 and the second carrier layer 12 can be etched simultaneously, and the first carrier layer 11 and the second carrier layer 12 can be etched simultaneously Each, as long as the base material layer 10 has higher corrosion resistance to the etchant than the first carrier layer 11 and the second carrier layer 12 . In addition, the first carrier layer 11 may have higher corrosion resistance to the same etchant than the second carrier layer 12 , or the second carrier layer 12 may be more resistant to the same etchant than the first carrier layer 11 . High corrosion resistance. Thus, for example, by simultaneously half-etching the first carrier layer 11 and the second carrier layer 12 having different thicknesses (eg, t1 > t2 ), part of the first carrier layer 11 and all of the second carrier layer 12 can be removed at the same time. Only the surface of one side (Z2 side) of the base material layer 10 is exposed, and the first carrier layer 11 having a predetermined thickness and having a two-layer structure on the other side (Z1 side) of the base material layer 10 is obtained. cladding sheet. In addition, such a two-layer structure cladding plate can also be obtained, for example, by the following method, that is, the first carrier layer 11 and the second carrier layer 12 are made of different materials, and only the materials with higher corrosion resistance to the etching solution are made. Either the first carrier layer 11 or the second carrier layer 12 remains with a predetermined thickness. In this case, by adjusting the half-etching conditions, it is also possible to obtain a cladding plate with a three-layer structure in which the first carrier layer 11 and the second carrier layer 12 have predetermined thicknesses and are provided on both sides of the base material layer 10 . .

基材層10相較於第一載體層11及第二載體層12而對所述蝕刻液更為高耐蝕。由此,當利用所述蝕刻液開始所述二層結構的披覆板材的蝕刻時,基材層10相較於第一載體層11(或第二載體層12)而更不易被蝕刻,因此能夠使基材層10的蝕刻速度比第一載體層11(或第二載體層12)的蝕刻速度更慢。因此,例如在對包括基材層10及第一載體層11的二層結構的披覆板材同時形成蝕刻孔時,從基材層10的表面(Z2側)向Z1側形成的蝕刻孔的深度比從第一載體層11的表面(Z1側)向Z2側形成的蝕刻孔的深度更淺。或者,在對包括基材層10及第二載體層12的二層結構的披覆板材同時形成蝕刻孔時,從基材層10的表面(Z1側)向Z2側形成的蝕刻孔的深度比從第二載體層12的表面(Z2側)向Z1側形成的蝕刻孔的深度更淺。若使用可獲得這種蝕刻孔的深度差的金屬掩模用板材(披覆板材3S),則可構成具有掩模圖案的金屬掩模,所述掩模圖案中配置在其中一個面側的孔的深度與配置在另一面側的孔的深度不同。Compared with the first carrier layer 11 and the second carrier layer 12 , the base material layer 10 has higher corrosion resistance to the etching solution. Therefore, when using the etchant to start the etching of the clad sheet with the two-layer structure, the base material layer 10 is more difficult to be etched than the first carrier layer 11 (or the second carrier layer 12 ), so The etching rate of the base material layer 10 can be made slower than the etching rate of the first carrier layer 11 (or the second carrier layer 12 ). Therefore, for example, when etching holes are simultaneously formed in a cladding sheet with a two-layer structure including the base material layer 10 and the first carrier layer 11 , the depth of the etching holes formed from the surface (Z2 side) of the base material layer 10 to the Z1 side It is shallower than the depth of the etching hole formed from the surface (Z1 side) of the first carrier layer 11 to the Z2 side. Alternatively, when etching holes are simultaneously formed on a cladding sheet with a two-layer structure including the base material layer 10 and the second carrier layer 12 , the depth ratio of the etching holes formed from the surface (Z1 side) of the base material layer 10 to the Z2 side The depth of the etching hole formed from the surface (Z2 side) of the second carrier layer 12 to the Z1 side is shallower. If a metal mask sheet (coated sheet 3S) that can obtain such a difference in the depth of the etched holes is used, a metal mask having a mask pattern in which holes are arranged on one surface side can be formed is different from the depth of the hole arranged on the other side.

另外,優選在同等的環境下使用同質的蝕刻液進行披覆板材3S的蝕刻,將基材層10的腐蝕減量設為Mb ,將第一載體層11的腐蝕減量設為Mc1 ,將第二載體層12的腐蝕減量設為Mc2 時,基材層10、第一載體層11及第二載體層12滿足Mb /Mc1 ≦0.9及Mb /Mc2 ≦0.9的關係。滿足所述關係的披覆板材3S能夠在同時蝕刻基材層10及第一載體層11時,可靠地使基材層10的蝕刻速度比第一載體層11的蝕刻速度更慢,或者能夠在同時蝕刻基材層10及第二載體層12時,可靠地使基材層10的蝕刻速度比第二載體層12的蝕刻速度更慢。由此,例如在欲同時形成蝕刻孔時,能夠可靠地使從基材層10的表面(Z2側)向Z1側形成的蝕刻孔的深度比從第一載體層11的表面(Z1側)向Z2側形成的蝕刻孔的深度更淺,或者能夠可靠地使從基材層10的表面(Z1側)向Z2側形成的蝕刻孔的深度比從第二載體層12的表面(Z2側)向Z1側形成的蝕刻孔的深度更淺。此外,經同時蝕刻的基材層10與第一載體層11滿足Mb /Mc1 >0(Mb >0,Mc1 >0)的關係,或者經同時蝕刻的基材層10與第二載體層12滿足Mb /Mc2 >0(Mb >0,Mc2 >0)的關係。此外,第一載體層11與第二載體層12可滿足Mc1 /Mc2 ≦0.9的關係,或可滿足Mc2 /Mc1 ≦0.9的關係。In addition, it is preferable to perform the etching of the cladding plate 3S using a homogeneous etching solution under the same environment, and let the corrosion loss of the base layer 10 be M b , the corrosion loss of the first carrier layer 11 be M c1 , and the first When the etching loss of the two carrier layers 12 is set to M c2 , the base layer 10 , the first carrier layer 11 and the second carrier layer 12 satisfy the relationship of M b /M c1 ≦0.9 and M b /M c2 ≦0.9. The cladding sheet 3S satisfying the above relationship can reliably make the etching rate of the base material layer 10 slower than the etching rate of the first carrier layer 11 when the base material layer 10 and the first carrier layer 11 are etched at the same time, or can be etched at the same time. When the base material layer 10 and the second carrier layer 12 are simultaneously etched, the etching rate of the base material layer 10 is reliably made slower than the etching rate of the second carrier layer 12 . Thus, for example, when etching holes are to be formed at the same time, the depth of the etching holes formed from the surface (Z2 side) of the base layer 10 to the Z1 side can be reliably increased from the depth of the etching holes formed from the surface (Z1 side) of the first carrier layer 11 to the Z1 side. The depth of the etching hole formed on the Z2 side is shallower, or the depth of the etching hole formed from the surface (Z1 side) of the base layer 10 to the Z2 side can be reliably made deeper than the depth of the etching hole formed from the surface (Z2 side) of the second carrier layer 12 The depth of the etching hole formed on the Z1 side is shallower. In addition, the simultaneously etched base material layer 10 and the first carrier layer 11 satisfy the relationship of M b /M c1 >0 (M b >0, M c1 >0), or the simultaneously etched base material layer 10 and the second The carrier layer 12 satisfies the relationship of M b /M c2 >0 (M b >0, M c2 >0). In addition, the first carrier layer 11 and the second carrier layer 12 may satisfy the relationship of M c1 /M c2 ≦0.9, or may satisfy the relationship of M c2 /M c1 ≦0.9.

披覆板材3S優選具有0.2%耐力、拉伸強度、伸長率、楊氏模數、硬度、線膨脹係數等適於金屬掩模的機械強度及各種特性。例如,從使操作變得容易的觀點來看,優選拉伸強度大且楊氏模數大的披覆板材3S。在此情況下,披覆板材3S特別優選成為金屬掩模的主體的基材層10的拉伸強度為700 MPa以上,且楊氏模數為100 GPa以上。另外,例如從在有機EL元件用金屬掩模的使用時抑制蒸鍍時的加熱變形(應變)的觀點來看,優選因加熱而產生的翹曲小的披覆板材3S,優選構成披覆板材3S的基材層10的線膨脹係數、第一載體層11的線膨脹係數及第二載體層12的線膨脹係數相互之差小。在此情況下,優選基材層10的線膨脹係數為5 ppm/℃以下,且第一載體層11的線膨脹係數及第二載體層12的線膨脹係數分別相對於基材層10的線膨脹係數而為±2 ppm/℃以內。The cladding sheet 3S preferably has mechanical strength and various properties suitable for metal masks, such as 0.2% strength, tensile strength, elongation, Young's modulus, hardness, and coefficient of linear expansion. For example, the cladding sheet 3S having a large tensile strength and a large Young's modulus is preferable from the viewpoint of easy handling. In this case, it is particularly preferable that the coating material 3S has a tensile strength of 700 MPa or more and a Young's modulus of 100 GPa or more of the base material layer 10 serving as the main body of the metal mask. In addition, for example, from the viewpoint of suppressing thermal deformation (strain) during vapor deposition when a metal mask for organic EL elements is used, the cladding sheet 3S having less warpage due to heating is preferable, and it is preferable to constitute the cladding sheet The difference between the linear expansion coefficient of the base material layer 10 of 3S, the linear expansion coefficient of the first carrier layer 11 , and the linear expansion coefficient of the second carrier layer 12 is small. In this case, the linear expansion coefficient of the base material layer 10 is preferably 5 ppm/°C or less, and the linear expansion coefficient of the first carrier layer 11 and the linear expansion coefficient of the second carrier layer 12 are preferably relative to the linear expansion coefficient of the base material layer 10 , respectively. The expansion coefficient is within ±2 ppm/°C.

舉出將能夠使用所述金屬掩模用披覆板材(第一實施方式、第二實施方式及第三實施方式)製造的、根據本發明的金屬掩模具體化的實施方式(製品例)來進行說明。The embodiment (product example) in which the metal mask according to the present invention can be manufactured by using the above-mentioned coating sheet for metal mask (the first embodiment, the second embodiment and the third embodiment) will be exemplified. Be explained.

<第一製品例> 將根據本發明的金屬掩模的第一製品例示於圖6。圖6為沿厚度方向(Z方向)切斷的金屬掩模1M的截面視。金屬掩模1M具有例如蝕刻孔1f作為掩模圖案。在沿厚度方向切斷的截面視時,金屬掩模1M為單層結構。金屬掩模1M的主體為基材部10M。基材部10M例如包含構成圖3所示的披覆板材1S的基材層10部分、構成圖4所示的披覆板材2S的基材層10部分、或構成圖5所示的披覆板材3S的基材層10部分。金屬掩模1M經薄壁化,其厚度T1M 為20 μm以下(優選15 μm以下)。這樣經薄壁化的金屬掩模1M的通過蝕刻所形成的蝕刻孔1f等掩模圖案的尺寸精度高,具有更高精細的掩模圖案。金屬掩模1M的厚度T1M 例如可與構成披覆板材1S的基材層10的厚度、構成披覆板材2S的基材層10的厚度、或構成披覆板材3S的基材層10的厚度同等(T1M =t0),也可通過半蝕刻等而減薄至同等以下(T1M <t0)。<The first product example> The first product example of the metal mask according to the present invention is shown in FIG. 6 . FIG. 6 is a cross-sectional view of the metal mask 1M cut along the thickness direction (Z direction). The metal mask 1M has, for example, etching holes 1f as a mask pattern. The metal mask 1M has a single-layer structure in a cross-sectional view cut along the thickness direction. The main body of the metal mask 1M is the base material portion 10M. The base material portion 10M includes, for example, a portion of the base material layer 10 constituting the covering sheet 1S shown in FIG. 3 , a portion of the base material layer 10 constituting the covering sheet 2S shown in FIG. 4 , or the covering sheet shown in FIG. 5 . Substrate layer 10 part of 3S. The thickness T 1M of the metal mask 1M is reduced in thickness to be 20 μm or less (preferably 15 μm or less). The metal mask 1M thinned in this way has a high dimensional accuracy of mask patterns such as etching holes 1f formed by etching, and has a more precise mask pattern. The thickness T 1M of the metal mask 1M can be, for example, the same as the thickness of the base material layer 10 constituting the cladding sheet 1S, the thickness of the base material layer 10 constituting the cladding sheet 2S, or the thickness of the base material layer 10 constituting the cladding sheet 3S It is equivalent (T 1M = t0 ), and it can also be thinned to the equivalent or less (T 1M < t0 ) by half etching or the like.

<第一製品例的變形例> 將根據本發明的金屬掩模的第一製品例的變形例示於圖7。圖7為沿厚度方向(Z方向)切斷的金屬掩模1Ma的截面視。金屬掩模1Ma具有例如蝕刻孔1f作為掩模圖案。在沿厚度方向切斷的截面視時,金屬掩模1Ma包含單層結構部分與二層結構部分。單層結構部分為金屬掩模1Ma的主體,且包含基材部10M。二層結構部分包含基材部10M、及用於補強金屬掩模1Ma的主體的框部11f。基材部10M例如包含構成圖3所示的披覆板材1S的基材層10部分、構成圖4所示的披覆板材2S的基材層10部分、或構成圖5所示的披覆板材3S的基材層10部分。框部11f例如包含構成圖3所示的披覆板材1S的第一載體層11部分、構成圖4所示的披覆板材2S的第一載體層11部分、或構成圖5所示的披覆板材3S的第一載體層11部分。框部11f以環狀配置在基材層10的邊緣部分。包括這種框部11的金屬掩模1Ma與圖6所示的金屬掩模1M相比,當金屬掩模的主體的厚度大致同等時機械強度提高,因此成為操作容易的金屬掩模。框部11f以環狀配置在基材部10M的邊緣部分,但也可不以環狀配置在基材部10M的邊緣部分,或也可配置在基材部10M的相反面側。此外,框部11f的構成不限定於所述構成。例如,框部11f也可由圖3所示的披覆板材1S的基材層10部分、圖4所示的披覆板材2S的基材層10部分、或圖5所示的披覆板材3S的基材層10部分的任一者構成。當框部11f由基材層10部分構成時,所述金屬掩模成為單層結構。另外,框部11f也可由圖4所示的披覆板材2S的第二載體層12部分、或圖5所示的披覆板材3S的第二載體層12部分的任一者構成。<Variation of the first product example> A modification of the first product example of the metal mask according to the present invention is shown in FIG. 7 . FIG. 7 is a cross-sectional view of the metal mask 1Ma cut along the thickness direction (Z direction). The metal mask 1Ma has, for example, etching holes 1f as a mask pattern. The metal mask 1Ma includes a single-layer structure portion and a two-layer structure portion in a cross-sectional view cut along the thickness direction. The single-layer structure portion is the main body of the metal mask 1Ma, and includes the base portion 10M. The two-layer structure portion includes a base material portion 10M and a frame portion 11f for reinforcing the main body of the metal mask 1Ma. The base material portion 10M includes, for example, a portion of the base material layer 10 constituting the covering sheet 1S shown in FIG. 3 , a portion of the base material layer 10 constituting the covering sheet 2S shown in FIG. 4 , or the covering sheet shown in FIG. 5 . Substrate layer 10 part of 3S. The frame portion 11f includes, for example, a portion of the first carrier layer 11 constituting the cladding sheet 1S shown in FIG. 3 , a portion of the first carrier layer 11 constituting the cladding sheet 2S shown in FIG. Part of the first carrier layer 11 of the sheet 3S. The frame portion 11f is arranged in an annular shape at the edge portion of the base material layer 10 . Compared with the metal mask 1M shown in FIG. 6 , the metal mask 1Ma including the frame portion 11 has improved mechanical strength when the thickness of the main body of the metal mask is substantially the same, and thus becomes an easy-to-handle metal mask. The frame portion 11f is disposed annularly at the edge portion of the base portion 10M, but may not be disposed annularly at the edge portion of the base portion 10M, or may be disposed on the opposite side of the base portion 10M. In addition, the structure of the frame part 11f is not limited to the said structure. For example, the frame portion 11f may also be formed from the part of the base material layer 10 of the covering sheet 1S shown in FIG. 3 , the part of the base material layer 10 of the covering sheet 2S shown in FIG. 4 , or the part of the covering sheet 3S shown in FIG. 5 . Any of the parts of the base material layer 10 is constituted. When the frame portion 11f is partially constituted by the base material layer 10, the metal mask has a single-layer structure. In addition, the frame portion 11f may be composed of either the second carrier layer 12 portion of the covering sheet 2S shown in FIG. 4 or the second carrier layer 12 portion of the covering sheet 3S shown in FIG. 5 .

金屬掩模1Ma經薄壁化,其厚度T1Ma 為20 μm以下(優選15 μm以下)。這樣經薄壁化的金屬掩模1Ma的通過蝕刻所形成的蝕刻孔1f等掩模圖案的尺寸精度高,具有更高精細的掩模圖案。金屬掩模1Ma的厚度T1Ma 例如可與構成披覆板材1S的基材層10的厚度、構成披覆板材2S的基材層10的厚度、或構成披覆板材3S的基材層10的厚度同等(T1Ma =t0),也可通過半蝕刻等而減薄至同等以下(T1Ma <t0)。框部11f的厚度TX 例如可與構成披覆板材1S的第一載體層11的厚度、構成披覆板材2S的第一載體層11的厚度、或構成披覆板材3S的第一載體層11的厚度同等(TX =t1),也可通過半蝕刻等而減薄至同等以下(TX <t1)。此外,也能夠將所述厚度T1Ma 與厚度TX 的合計的厚度(T1Ma +TX )視為金屬掩模1Ma的厚度。The metal mask 1Ma is thinned, and its thickness T 1Ma is 20 μm or less (preferably 15 μm or less). The metal mask 1Ma thus thinned has a high dimensional accuracy of mask patterns such as etching holes 1f formed by etching, and has a higher finer mask pattern. The thickness T 1Ma of the metal mask 1Ma can be, for example, the same as the thickness of the base material layer 10 constituting the coating sheet 1S, the thickness of the base material layer 10 constituting the coating sheet 2S, or the thickness of the base material layer 10 constituting the coating sheet 3S It is equivalent (T 1Ma = t0 ), and it can also be thinned to the equivalent or less (T 1Ma < t0 ) by half etching or the like. The thickness T X of the frame portion 11f can be, for example, the same as the thickness of the first carrier layer 11 constituting the coating sheet 1S, the thickness of the first carrier layer 11 constituting the coating sheet 2S, or the first carrier layer 11 constituting the coating sheet 3S. The thickness is the same (T X = t1 ), and can be reduced to the same or less (T X < t1 ) by half etching or the like. In addition, the total thickness (T 1Ma + T X ) of the thickness T 1Ma and the thickness T X can also be regarded as the thickness of the metal mask 1Ma.

<第二製品例> 將根據本發明的金屬掩模的第二製品例示於圖8。圖8為沿厚度方向(Z方向)切斷的金屬掩模2M的截面視。金屬掩模2M具有例如蝕刻孔2f作為掩模圖案。在沿厚度方向切斷的截面視時,金屬掩模2M為二層結構。金屬掩模2M的主體包含基材部10M與載體部12M。基材部10M例如包含構成圖4所示的披覆板材2S的基材層10部分、或構成圖5所示的披覆板材3S的基材層10部分。載體部12M例如包含構成圖4所示的披覆板材2S的第二載體層12部分、或構成圖5所示的披覆板材3S的第二載體層12部分。此外,載體部12M的構成不限定於所述構成。例如,載體部12M也可由圖3所示的披覆板材1S的第一載體層11部分、圖4所示的披覆板材2S的第一載體層11部分、或圖5所示的披覆板材3S的第一載體層11的任一者構成。當由圖3所示的披覆板材1S的第一載體層11部分構成載體部12M時,基材部10M可由圖3所示的披覆板材1S的基材層10部分構成。<Second product example> A second product of the metal mask according to the present invention is illustrated in FIG. 8 . FIG. 8 is a cross-sectional view of the metal mask 2M cut along the thickness direction (Z direction). The metal mask 2M has, for example, etching holes 2f as a mask pattern. The metal mask 2M has a two-layer structure in a cross-sectional view cut along the thickness direction. The main body of the metal mask 2M includes a base material portion 10M and a carrier portion 12M. The base material portion 10M includes, for example, a portion of the base material layer 10 constituting the covering sheet 2S shown in FIG. 4 , or a portion of the base material layer 10 constituting the covering sheet 3S shown in FIG. 5 . The carrier portion 12M includes, for example, a portion of the second carrier layer 12 constituting the cladding sheet 2S shown in FIG. 4 , or a portion of the second carrier layer 12 constituting the cladding sheet 3S shown in FIG. 5 . In addition, the structure of the carrier part 12M is not limited to the said structure. For example, the carrier portion 12M can also be the first carrier layer 11 portion of the cladding sheet 1S shown in FIG. 3 , the first carrier layer 11 portion of the cladding sheet 2S shown in FIG. 4 , or the cladding sheet shown in FIG. 5 . Any one of the first carrier layers 11 of 3S is formed. When the carrier portion 12M is formed by the first carrier layer 11 portion of the covering sheet 1S shown in FIG. 3 , the base material portion 10M may be formed by the base material layer 10 portion of the covering sheet 1S shown in FIG. 3 .

金屬掩模2M經薄壁化,其厚度T2M 為20 μm以下(優選15 μm以下)。這樣經薄壁化的金屬掩模2M的通過蝕刻所形成的蝕刻孔2f等掩模圖案的尺寸精度高,具有更高精細的掩模圖案。金屬掩模2M的厚度T2M 例如可與構成披覆板材2S的基材層10和第二載體層12的合計厚度、或構成披覆板材3S的基材層10和第二載體層12的合計厚度同等(T2M =t0+t2),也可通過半蝕刻等而減薄至同等以下(T2M <t0+t2)。載體部12M的厚度TY 例如可與構成披覆板材2S的第二載體層12的厚度、或構成披覆板材3S的第二載體層12的厚度同等(TY =t2),也可通過半蝕刻等而減薄至同等以下(TY <t2)。The metal mask 2M is thinned, and its thickness T 2M is 20 μm or less (preferably 15 μm or less). The metal mask 2M thinned in this way has a high dimensional accuracy of mask patterns such as etching holes 2f formed by etching, and has a higher-definition mask pattern. The thickness T 2M of the metal mask 2M can be, for example, the total thickness of the base material layer 10 and the second carrier layer 12 constituting the cladding sheet 2S, or the total thickness of the base material layer 10 and the second carrier layer 12 constituting the cladding sheet 3S The thickness is the same (T 2M = t0 + t2 ), and can be reduced to the same or less by half etching or the like (T 2M <t0 + t2 ). The thickness T Y of the carrier portion 12M may be equal to, for example, the thickness of the second carrier layer 12 constituting the covering sheet 2S or the thickness of the second carrier layer 12 constituting the covering sheet 3S (T Y = t2 ), or it may be formed by a half thickness. It is thinned to equal or less (T Y < t2 ) by etching or the like.

<第二製品例的變形例> 將根據本發明的金屬掩模的第二製品例的變形例示於圖9。圖9為沿厚度方向(Z方向)切斷的金屬掩模2Ma的截面視。金屬掩模2Ma具有例如蝕刻孔2f作為掩模圖案。在沿厚度方向切斷的截面視時,金屬掩模2Ma包含二層結構部分與三層結構部分。二層結構部分成為金屬掩模2Ma的主體,包含基材部10M與載體部12M。三層結構部分包含基材部10M及載體部12M、與用於補強金屬掩模2Ma的主體的框部11f。基材部10M例如包含構成圖4所示的披覆板材2S的基材層10部分、或構成圖5所示的披覆板材3S的基材層10部分。載體部12M例如包含構成圖4所示的披覆板材2S的第二載體層12部分、或構成圖5所示的披覆板材3S的第二載體層12部分。框部11f例如包含構成圖4所示的披覆板材2S的第一載體層11部分、或構成圖5所示的披覆板材3S的第一載體層11部分。框部11f以環狀配置在基材層10的邊緣部分。包括這種框部11的金屬掩模2Ma與圖8所示的金屬掩模2M相比,在金屬掩模的主體的厚度大致同等時機械強度提高,因此成為操作容易的金屬掩模。框部11f以環狀配置在基材部10M的邊緣部分,但也可不以環狀配置在基材部10M的邊緣部分,或也可配置在基材部10M的相反面側。此外,框部11f的構成不限定於所述構成。例如,框部11f可由圖4所示的披覆板材2S的基材層10部分、或圖5所示的披覆板材3S的基材層10部分的任一者構成。當框部11f由基材層10部分構成時,所述金屬掩模成為基材層10及載體部12M的二層結構。另外,載體部12M的構成不限定於所述構成。例如,載體部12M也可由構成圖4所示的披覆板材2S的第一載體層11部分、或構成圖5所示的披覆板材3S的第一載體層11部分的任一者構成。<Variation of the second product example> A modified example of the second product example of the metal mask according to the present invention is shown in FIG. 9 . FIG. 9 is a cross-sectional view of the metal mask 2Ma cut along the thickness direction (Z direction). The metal mask 2Ma has, for example, etching holes 2f as a mask pattern. The metal mask 2Ma includes a two-layer structure portion and a three-layer structure portion in a cross-sectional view taken along the thickness direction. The two-layer structure portion becomes the main body of the metal mask 2Ma, and includes the base material portion 10M and the carrier portion 12M. The three-layer structure portion includes a base material portion 10M, a carrier portion 12M, and a frame portion 11f for reinforcing the main body of the metal mask 2Ma. The base material portion 10M includes, for example, a portion of the base material layer 10 constituting the covering sheet 2S shown in FIG. 4 , or a portion of the base material layer 10 constituting the covering sheet 3S shown in FIG. 5 . The carrier portion 12M includes, for example, a portion of the second carrier layer 12 constituting the cladding sheet 2S shown in FIG. 4 , or a portion of the second carrier layer 12 constituting the cladding sheet 3S shown in FIG. 5 . The frame portion 11f includes, for example, a portion of the first carrier layer 11 constituting the cladding sheet 2S shown in FIG. 4 , or a portion of the first carrier layer 11 constituting the cladding sheet 3S shown in FIG. 5 . The frame portion 11f is arranged in an annular shape at the edge portion of the base material layer 10 . Compared with the metal mask 2M shown in FIG. 8 , the metal mask 2Ma including the frame portion 11 has improved mechanical strength when the thickness of the main body of the metal mask is substantially equal, and thus becomes an easy-to-handle metal mask. The frame portion 11f is disposed annularly at the edge portion of the base portion 10M, but may not be disposed annularly at the edge portion of the base portion 10M, or may be disposed on the opposite side of the base portion 10M. In addition, the structure of the frame part 11f is not limited to the said structure. For example, the frame portion 11f may be constituted by either the portion of the base material layer 10 of the covering sheet 2S shown in FIG. 4 or the portion of the base material layer 10 of the covering sheet 3S shown in FIG. 5 . When the frame portion 11f is partially constituted by the base material layer 10, the metal mask has a two-layer structure of the base material layer 10 and the carrier portion 12M. In addition, the structure of the carrier part 12M is not limited to the said structure. For example, the carrier portion 12M may be composed of either the first carrier layer 11 part constituting the cladding sheet 2S shown in FIG. 4 , or the first carrier layer 11 part constituting the cladding sheet 3S shown in FIG. 5 .

金屬掩模2Ma經薄壁化,其厚度T2Ma 為20 μm以下(優選15 μm以下)。這樣經薄壁化的金屬掩模2Ma的通過蝕刻所形成的蝕刻孔2f等掩模圖案的尺寸精度高,具有更高精細的掩模圖案。金屬掩模2Ma的厚度T2Ma 例如可與構成披覆板材2S的基材層10和第二載體層12的合計厚度、或構成披覆板材3S的基材層10和第二載體層12的合計厚度同等(T2Ma =t0+t2),也可通過半蝕刻等而減薄至同等以下(T2Ma <t0+t2)。載體部12M的厚度TY 例如可與構成披覆板材2S的第二載體層12的厚度、或構成披覆板材3S的第二載體層12的厚度同等(TY =t2),也可通過半蝕刻等而減薄至同等以下(TY <t2)。框部11f的厚度TX 例如可與構成披覆板材2S的第一載體層11的厚度、或構成披覆板材3S的第一載體層11的厚度同等(TX =t1),也可通過半蝕刻等而減薄至同等以下(TX <t1)。此外,也能夠將所述厚度T2Ma 與厚度TX 的合計厚度(T2Ma +TX )視為金屬掩模2Ma的厚度。The metal mask 2Ma is thinned, and its thickness T 2Ma is 20 μm or less (preferably 15 μm or less). The metal mask 2Ma thinned in this way has high dimensional accuracy of mask patterns such as etching holes 2f formed by etching, and has a more precise mask pattern. The thickness T 2Ma of the metal mask 2Ma can be, for example, the total thickness of the base material layer 10 and the second carrier layer 12 constituting the cladding sheet 2S, or the total thickness of the base material layer 10 and the second carrier layer 12 constituting the cladding sheet 3S The thickness is the same (T 2Ma = t0 + t2 ), and can be reduced to the same or less (T 2Ma <t0 + t2 ) by half etching or the like. The thickness T Y of the carrier portion 12M may be equal to, for example, the thickness of the second carrier layer 12 constituting the covering sheet 2S or the thickness of the second carrier layer 12 constituting the covering sheet 3S (T Y = t2 ), or it may be formed by a half thickness. It is thinned to equal or less (T Y < t2 ) by etching or the like. The thickness T X of the frame portion 11 f may be equal to, for example, the thickness of the first carrier layer 11 constituting the covering sheet 2S or the thickness of the first carrier layer 11 constituting the covering sheet 3S (T X = t1 ), or it may be formed by a half thickness. It is thinned to equal or less (T X < t1 ) by etching or the like. In addition, the total thickness (T 2Ma + T X ) of the thickness T 2Ma and the thickness T X can also be regarded as the thickness of the metal mask 2Ma.

<第三製品例> 將根據本發明的金屬掩模的第三製品例示於圖10。圖10為沿厚度方向(Z方向)切斷的金屬掩模3M的截面視。金屬掩模3M具有例如蝕刻孔3f作為掩模圖案。在沿厚度方向切斷的截面視時,金屬掩模3M為三層結構。金屬掩模3M的主體包含基材部10M與第一載體部11M及第二載體部12M。基材部10M例如包含構成圖4所示的披覆板材2S的基材層10部分、或構成圖5所示的披覆板材3S的基材層10部分。第一載體部11M例如包含構成圖4所示的披覆板材2S的第一載體層11部分、或構成圖5所示的披覆板材3S的第一載體層11部分。第二載體部12M例如包含構成圖4所示的披覆板材2S的第二載體層12部分、或構成圖5所示的披覆板材3S的第二載體層12部分。此外,第一載體部11M及第二載體部12M的構成不限定於所述構成。例如,可由圖4所示的披覆板材2S的第二載體層12部分構成第一載體部11M,由圖4所示的披覆板材2S的第一載體層11部分構成第二載體部12M。另外,可由圖5所示的披覆板材3S的第二載體層12部分構成第一載體部11M,由圖5所示的披覆板材3S的第一載體層11部分構成第二載體部12M。<The third product example> A third product of the metal mask according to the present invention is illustrated in FIG. 10 . FIG. 10 is a cross-sectional view of the metal mask 3M cut along the thickness direction (Z direction). The metal mask 3M has, for example, etching holes 3f as a mask pattern. The metal mask 3M has a three-layer structure in a cross-sectional view cut along the thickness direction. The main body of the metal mask 3M includes a base material portion 10M, a first carrier portion 11M and a second carrier portion 12M. The base material portion 10M includes, for example, a portion of the base material layer 10 constituting the covering sheet 2S shown in FIG. 4 , or a portion of the base material layer 10 constituting the covering sheet 3S shown in FIG. 5 . The first carrier portion 11M includes, for example, the portion of the first carrier layer 11 that constitutes the cladding sheet 2S shown in FIG. 4 , or the portion of the first carrier layer 11 that constitutes the cladding sheet 3S shown in FIG. 5 . The second carrier portion 12M includes, for example, a portion of the second carrier layer 12 constituting the cladding sheet 2S shown in FIG. 4 , or a portion of the second carrier layer 12 constituting the cladding sheet 3S shown in FIG. 5 . In addition, the structure of the 1st carrier part 11M and the 2nd carrier part 12M is not limited to the said structure. For example, the first carrier part 11M may be formed by the second carrier layer 12 of the covering sheet 2S shown in FIG. 4 , and the second carrier part 12M may be formed by the first carrier layer 11 part of the covering sheet 2S shown in FIG. 4 . In addition, the first carrier portion 11M may be constituted by the second carrier layer 12 of the cladding plate 3S shown in FIG. 5 , and the second carrier portion 12M may be constituted by the first carrier layer 11 of the cladding plate 3S shown in FIG. 5 .

金屬掩模3M經薄壁化,其厚度T3M 為20 μm以下(優選15 μm以下)。這樣經薄壁化的金屬掩模3M的通過蝕刻所形成的蝕刻孔3f等掩模圖案的尺寸精度高,具有更高精細的掩模圖案。金屬掩模3M的厚度T3M 例如可與構成披覆板材2S的基材層10及第一載體層11以及第二載體層12的合計厚度、或構成披覆板材3S的基材層10及第一載體層11以及第二載體層12的合計厚度同等(T3M =t0+t1+t2),也可通過半蝕刻等而減薄至同等以下(T3M <t0+t1+t2)。第一載體部11M的厚度TY1 例如可與構成披覆板材2S的第一載體層11的厚度、或構成披覆板材3S的第一載體層11的厚度同等(TY1 =t1),也可通過半蝕刻等而減薄至同等以下(TY1 <t1)。第二載體部12M的厚度TY2 例如可與構成披覆板材2S的第二載體層12的厚度、或構成披覆板材3S的第二載體層12的厚度同等(TY2 =t2),也可通過半蝕刻等而減薄至同等以下(TY2 <t2)。The metal mask 3M is thinned, and its thickness T 3M is 20 μm or less (preferably 15 μm or less). The metal mask 3M thinned in this way has a high dimensional accuracy of mask patterns such as etching holes 3f formed by etching, and has a higher-definition mask pattern. The thickness T 3M of the metal mask 3M can be, for example, the same as the total thickness of the base material layer 10 , the first carrier layer 11 and the second carrier layer 12 constituting the covering sheet 2S, or the base material layer 10 and the first carrier layer 12 constituting the covering sheet 3S. The total thickness of the first carrier layer 11 and the second carrier layer 12 is the same (T 3M = t0 + t1 + t2 ), and can be reduced to the same or less by half etching (T 3M <t0 + t1 + t2 ). The thickness T Y1 of the first carrier portion 11M may be equal to, for example, the thickness of the first carrier layer 11 constituting the covering sheet 2S or the thickness of the first carrier layer 11 constituting the covering sheet 3S (T Y1 = t1 ), or may be It is thinned to equal or less by half etching or the like (T Y1 < t1 ). The thickness T Y2 of the second carrier portion 12M may be equal to, for example, the thickness of the second carrier layer 12 constituting the cover sheet 2S or the thickness of the second carrier layer 12 constituting the cover sheet 3S (T Y2 = t2 ), or may be It is thinned to equal or less by half etching or the like (T Y2 < t2 ).

<第三製品例的變形例> 將根據本發明的金屬掩模的第三製品例的變形例示於圖11。圖11為沿厚度方向(Z方向)切斷的金屬掩模3Ma的截面視。金屬掩模3Ma具有例如蝕刻孔3f作為掩模圖案。在沿厚度方向切斷的截面視時,金屬掩模3Ma為三層結構。金屬掩模3Ma的主體包含基材部10M與第一載體部11M及第二載體部12M。第一載體部11M具有用於補強金屬掩模3Ma的框部11f。基材部10M例如包含構成圖4所示的披覆板材2S的基材層10部分、或構成圖5所示的披覆板材3S的基材層10部分。第一載體部11M及框部11f例如包含構成圖4所示的披覆板材2S的第一載體層11部分、或構成圖5所示的披覆板材3S的第一載體層11部分。第二載體部12M例如包含構成圖4所示的披覆板材2S的第二載體層12部分、或構成圖5所示的披覆板材3S的第二載體層12部分。框部11f能夠在形成第一載體部11M時形成。框部11f以環狀配置在基材層10的邊緣部分。包括這種框部11的金屬掩模3Ma與圖10所示的金屬掩模3M相比,當金屬掩模的主體的厚度大致同等時機械強度提高,因此成為操作容易的金屬掩模。框部11f以環狀配置在第一載體部11M的邊緣部分,但也可不以環狀配置在第一載體部11M的邊緣部分,也可配置在第一載體部11M的相反面側的第二載體部12M。此外,框部11f的構成不限定於所述構成。例如,框部11f也可由圖4所示的披覆板材2S的第二載體層12部分、或圖5所示的披覆板材3S的第二載體層12部分的任一者構成。<Variation of the third product example> A modification of the third product example of the metal mask according to the present invention is shown in FIG. 11 . FIG. 11 is a cross-sectional view of the metal mask 3Ma cut along the thickness direction (Z direction). The metal mask 3Ma has, for example, etching holes 3f as a mask pattern. The metal mask 3Ma has a three-layer structure in a cross-sectional view cut along the thickness direction. The main body of the metal mask 3Ma includes the base material portion 10M, the first carrier portion 11M, and the second carrier portion 12M. The first carrier portion 11M has a frame portion 11f for reinforcing the metal mask 3Ma. The base material portion 10M includes, for example, a portion of the base material layer 10 constituting the covering sheet 2S shown in FIG. 4 , or a portion of the base material layer 10 constituting the covering sheet 3S shown in FIG. 5 . The first carrier portion 11M and the frame portion 11f include, for example, the first carrier layer 11 part constituting the cladding sheet 2S shown in FIG. 4 , or the first carrier layer 11 part constituting the cladding sheet 3S shown in FIG. 5 . The second carrier portion 12M includes, for example, a portion of the second carrier layer 12 constituting the cladding sheet 2S shown in FIG. 4 , or a portion of the second carrier layer 12 constituting the cladding sheet 3S shown in FIG. 5 . The frame portion 11f can be formed when the first carrier portion 11M is formed. The frame portion 11f is arranged in an annular shape at the edge portion of the base material layer 10 . Compared with the metal mask 3M shown in FIG. 10 , the metal mask 3Ma including the frame portion 11 has improved mechanical strength when the thickness of the main body of the metal mask is substantially the same, and thus becomes a metal mask that is easy to handle. The frame portion 11f is arranged annularly at the edge portion of the first carrier portion 11M, but may not be arranged annularly at the edge portion of the first carrier portion 11M, and may be arranged on the second side on the opposite side of the first carrier portion 11M. carrier portion 12M. In addition, the structure of the frame part 11f is not limited to the said structure. For example, the frame portion 11f may be constituted by either the second carrier layer 12 portion of the cladding sheet 2S shown in FIG. 4 or the second carrier layer 12 portion of the cladding sheet 3S shown in FIG. 5 .

金屬掩模3Ma經薄壁化,其厚度T3Ma 為20 μm以下(優選15 μm以下)。這樣經薄壁化的金屬掩模3Ma的通過蝕刻所形成的蝕刻孔3f等掩模圖案的尺寸精度高,具有更高精細的掩模圖案。金屬掩模3Ma的厚度T3Ma 例如可與構成披覆板材2S的基材層10及第一載體層11以及第二載體層12的合計厚度、或構成披覆板材3S的基材層10及第一載體層11以及第二載體層12的合計厚度同等(T3Ma =t0+t1+t2),也可通過半蝕刻等而減薄至同等以下(T3Ma <t0+t1+t2)。第一載體部11M的厚度TY1 例如可與構成披覆板材2S的第一載體層11的厚度、或構成披覆板材3S的第一載體層11的厚度同等(TY1 =t1),也可通過半蝕刻等而減薄至同等以下(TY1 <t1)。第二載體部12M的厚度TY2 例如可與構成披覆板材2S的第二載體層12的厚度、或構成披覆板材3S的第二載體層12的厚度同等(TY2 =t2),也可通過半蝕刻等而減薄至同等以下(TY2 <t2)。框部11f的厚度TX 例如可與由構成披覆板材2S的第一載體層11的厚度減去第一載體部11M的厚度所得的厚度、或由構成披覆板材3S的第一載體層11的厚度減去第一載體部11M的厚度的所得的厚度同等(TX =t1-TY1 ),也可通過半蝕刻等而減薄至同等以下(TX <t1-TY1 )。此外,也能夠將所述厚度T3Ma 與厚度TX 的合計厚度(T3Ma +TX )視為金屬掩模3Ma的厚度。The metal mask 3Ma is thinned, and its thickness T 3Ma is 20 μm or less (preferably 15 μm or less). The metal mask 3Ma thinned in this way has high dimensional accuracy of mask patterns such as etching holes 3f formed by etching, and has a more precise mask pattern. The thickness T 3Ma of the metal mask 3Ma can be, for example, the same as the total thickness of the base material layer 10 , the first carrier layer 11 and the second carrier layer 12 constituting the covering sheet 2S, or the base material layer 10 and the first carrier layer 12 constituting the covering sheet 3S. The total thickness of the first carrier layer 11 and the second carrier layer 12 is the same (T 3Ma = t0 + t1 + t2 ), and may be reduced to the same or less by half etching (T 3Ma <t0 + t1 + t2 ). The thickness T Y1 of the first carrier portion 11M may be equal to, for example, the thickness of the first carrier layer 11 constituting the covering sheet 2S or the thickness of the first carrier layer 11 constituting the covering sheet 3S (T Y1 = t1 ), or may be It is thinned to equal or less by half etching or the like (T Y1 < t1 ). The thickness T Y2 of the second carrier portion 12M may be equal to, for example, the thickness of the second carrier layer 12 constituting the cover sheet 2S or the thickness of the second carrier layer 12 constituting the cover sheet 3S (T Y2 = t2 ), or may be It is thinned to equal or less by half etching or the like (T Y2 < t2 ). The thickness T X of the frame portion 11f may be, for example, the thickness obtained by subtracting the thickness of the first carrier portion 11M from the thickness of the first carrier layer 11 constituting the covering sheet 2S, or the thickness of the first carrier layer 11 constituting the covering sheet 3S. The thickness obtained by subtracting the thickness of the first carrier portion 11M from the thickness of the first carrier portion 11M is the same (T X =t1-T Y1 ), and may be reduced to the same or less (T X <t1-T Y1 ) by half etching or the like. In addition, the total thickness (T 3Ma + T X ) of the thickness T 3Ma and the thickness T X can also be regarded as the thickness of the metal mask 3Ma.

以下,基於圖12至圖20,對使用本發明的金屬掩模用披覆板材(第一實施例、第二實施例及第三實施例)來製造將本發明的金屬掩模具體化的實施方式(製品例)的方法進行說明。此外,基於圖12至圖16對使用圖3所示的披覆板材1S(第一實施方式)的金屬掩模的製造方法的一例進行說明,基於圖17至圖20對使用圖4所示的披覆板材2S(第二實施方式)及圖5所示的披覆板材3S(第三實施方式)的金屬掩模的製造方法的一例進行說明。Hereinafter, based on FIGS. 12 to 20 , an implementation of manufacturing and embodying the metal mask of the present invention will be described using the cladding sheet for a metal mask of the present invention (the first embodiment, the second embodiment, and the third embodiment). The method of the method (product example) will be described. 12 to 16 , an example of a method of manufacturing a metal mask using the cladding sheet 1S (first embodiment) shown in FIG. 3 will be described, based on FIGS. 17 to 20 . An example of the manufacturing method of the metal mask of the coating material 2S (2nd Embodiment) and the coating material 3S (3rd Embodiment) shown in FIG. 5 is demonstrated.

<第一製品例><第二製品例> 根據圖12及圖13所示的金屬掩模的製造方法,能夠製造圖6所示的金屬掩模1M(第一製品例)及圖8所示的金屬掩模2M(第二製品例)。<First Product Example> <Second Product Example> According to the manufacturing method of the metal mask shown in FIGS. 12 and 13 , the metal mask 1M (first product example) shown in FIG. 6 and the metal mask 2M (second product example) shown in FIG. 8 can be manufactured.

圖12中,步驟(a)為原材料準備步驟。此原材料準備步驟中,例如準備圖3所示的披覆板材1S。披覆板材1S(厚度T1S )包括基材層10(厚度t0)及第一載體層11(厚度t1)。基材層10的厚度為1 μm以上且20 μm以下(優選5 μm以上且15 μm以下)。基材層10與第一載體層11經壓接。基材層10例如包含含有約32質量%的Ni及約5.5質量%的Co的鐵基合金A。第一載體層11例如包含含有約36質量%的Ni的鐵基合金B。包含鐵基合金A的基材層10及包含鐵基合金B的第一載體層11可由同質的蝕刻液(例如濃度為40質量%的氯化鐵液等)進行蝕刻。此外,包含鐵基合金A的基材層10相較於包含鐵基合金B的第一載體層11而對所述蝕刻液更為高耐蝕。In Fig. 12, step (a) is a raw material preparation step. In this raw material preparation step, for example, the cladding sheet 1S shown in FIG. 3 is prepared. The cladding sheet 1S (thickness T 1S ) includes a base material layer 10 (thickness t0 ) and a first carrier layer 11 (thickness t1 ). The thickness of the base material layer 10 is 1 μm or more and 20 μm or less (preferably 5 μm or more and 15 μm or less). The base material layer 10 and the first carrier layer 11 are crimped. The base material layer 10 includes, for example, an iron-based alloy A containing about 32 mass % of Ni and about 5.5 mass % of Co. The first carrier layer 11 contains, for example, an iron-based alloy B containing about 36 mass % of Ni. The base material layer 10 including the iron-based alloy A and the first carrier layer 11 including the iron-based alloy B can be etched with a homogeneous etching solution (eg, a ferric chloride solution with a concentration of 40% by mass). In addition, the base material layer 10 including the iron-based alloy A has higher corrosion resistance to the etching solution than the first carrier layer 11 including the iron-based alloy B.

圖12中,步驟(b)為被覆步驟。此被覆步驟中,為了形成規定的蝕刻圖案,在基材層10的表面10a形成保護膜13,在第一載體層11的表面11a形成保護膜14。In Fig. 12, step (b) is a coating step. In this coating step, in order to form a predetermined etching pattern, the protective film 13 is formed on the surface 10 a of the base material layer 10 , and the protective film 14 is formed on the surface 11 a of the first carrier layer 11 .

圖12中,步驟(c)為蝕刻步驟。此蝕刻步驟中,使用適於構成基材層10的鐵基合金A及構成第一載體層11的鐵基合金B兩者的蝕刻液,對披覆板材1S進行蝕刻。蝕刻液例如使用濃度為40質量%的氯化鐵液(水溶液)。通過所述蝕刻而將不具有保護膜13的基材層10的表面10a及不具有保護膜14的第一載體層11的表面11a同時蝕刻,大致同時形成例如蝕刻孔10b及蝕刻孔11b。此時,包含鐵基合金A的基材層10相較於包含鐵基合金B的第一載體層11而對蝕刻液更為高耐蝕,由此第一載體層11側的蝕刻速度變得大於基材層10側的蝕刻速度。因此,相較於基材層10側而第一載體層11側的腐蝕減量變大,能夠使第一載體層11側的蝕刻孔11b的尺寸(距表面的深度、向表面的開口徑、孔內的體積等)比基材層10側的蝕刻孔10b更大。此外,關於蝕刻孔10b及蝕刻孔11b的尺寸等的調整,只要適當選擇基材層10及第一載體層11的厚度、材質等便可實現。In FIG. 12, step (c) is an etching step. In this etching step, the cladding plate 1S is etched using an etchant suitable for both the iron-based alloy A constituting the base layer 10 and the iron-based alloy B constituting the first carrier layer 11 . As an etching liquid, the ferric chloride liquid (aqueous solution) whose density|concentration is 40 mass % is used, for example. By the etching, the surface 10a of the base layer 10 without the protective film 13 and the surface 11a of the first carrier layer 11 without the protective film 14 are simultaneously etched, for example, the etching hole 10b and the etching hole 11b are formed substantially simultaneously. At this time, the base material layer 10 containing the iron-based alloy A has higher corrosion resistance to the etchant than the first carrier layer 11 containing the iron-based alloy B, so that the etching rate on the first carrier layer 11 side becomes larger than that of the first carrier layer 11 . The etching rate on the base layer 10 side. Therefore, the etching loss on the first carrier layer 11 side becomes larger than on the base layer 10 side, and the size of the etching hole 11b on the first carrier layer 11 side (depth from the surface, opening to the surface, hole size) can be increased. The volume inside, etc.) is larger than the etching hole 10b on the base material layer 10 side. In addition, the adjustment of the size of the etching hole 10b and the etching hole 11b, etc. can be realized by appropriately selecting the thicknesses, materials, and the like of the base material layer 10 and the first carrier layer 11.

圖12中,步驟(d)為整飾步驟。此整飾步驟中,從披覆板材1S除去保護膜13及保護膜14,對整個表面進行清洗處理。由此能夠製造金屬掩模。此金屬掩模包括包含鐵基合金A的基材部10M、及包含鐵基合金B的載體部11M。此金屬掩模例如為圖8所示那樣的金屬掩模2M,且例如為具有掩模圖案2f的厚度T2M 的二層結構的金屬掩模2M(第二製品例)。In Fig. 12, step (d) is a finishing step. In this finishing step, the protective film 13 and the protective film 14 are removed from the covering plate 1S, and the entire surface is cleaned. Thereby, a metal mask can be produced. This metal mask includes a base material portion 10M including an iron-based alloy A, and a carrier portion 11M including an iron-based alloy B. This metal mask is, for example, a metal mask 2M as shown in FIG. 8 , and is, for example, a metal mask 2M (second product example) having a two-layer structure with a thickness T 2M of the mask pattern 2 f .

接著,對使用圖13所示的製造過程的金屬掩模的製造方法進行說明。圖13所示的製造過程為繼圖12所示的步驟(a)至步驟(c)之後的過程。繼圖12所示的步驟(a)至步驟(c)之後,經過圖13所示的步驟(c1)及步驟(d1),由此能夠製造例如圖6所示那樣的金屬掩模1M(第一製品例)。Next, the manufacturing method of the metal mask using the manufacturing process shown in FIG. 13 is demonstrated. The manufacturing process shown in FIG. 13 is a process following steps (a) to (c) shown in FIG. 12 . After steps (a) to (c) shown in FIG. 12 , steps ( c1 ) and ( d1 ) shown in FIG. 13 are performed, whereby, for example, the metal mask 1M shown in FIG. 6 (No. a product example).

圖13中,步驟(c1)為半蝕刻步驟。此半蝕刻步驟中,從披覆板材1S除去保護膜13後進行半蝕刻。半蝕刻是使用適於構成基材層10的鐵基合金A的蝕刻液,從基材層10的表面10a側(Z2側)向第一載體層11側(Z1側)大致均勻地進行。蝕刻液例如使用濃度為40質量%的氯化鐵液(水溶液)。通過所述半蝕刻而將基材層10大致全部除去。此外,也可通過調整半蝕刻條件,而對除去基材層10後的第一載體層11進行朝向Z1側的半蝕刻。由此,可實現金屬掩模的薄壁化。In FIG. 13, step (c1) is a half etching step. In this half-etching step, half-etching is performed after removing the protective film 13 from the cladding sheet 1S. Half-etching is performed substantially uniformly from the surface 10a side (Z2 side) of the base material layer 10 to the first carrier layer 11 side (Z1 side) using an etchant suitable for the iron-based alloy A constituting the base material layer 10 . As an etching liquid, the ferric chloride liquid (aqueous solution) whose density|concentration is 40 mass % is used, for example. Substantially all of the base material layer 10 is removed by the half-etching. Further, by adjusting the half-etching conditions, the first carrier layer 11 from which the base material layer 10 has been removed may be half-etched toward the Z1 side. Thereby, the thickness reduction of the metal mask can be achieved.

圖13中,步驟(d1)為整飾步驟。此整飾步驟中,能夠從披覆板材1S除去保護膜14,對披覆板材1S的整個表面進行清洗處理,製造金屬掩模。所述金屬掩模包括包含鐵基合金B的載體部11M。所述金屬掩模例如為圖6所示那樣的金屬掩模1M,且例如為具有掩模圖案1f的厚度T1M 的單層結構的金屬掩模1M(第一製品例)。In Fig. 13, step (d1) is a finishing step. In this finishing step, the protective film 14 can be removed from the covering plate 1S, and the entire surface of the covering plate 1S can be cleaned to produce a metal mask. The metal mask includes a carrier portion 11M containing an iron-based alloy B. The metal mask is, for example, a metal mask 1M as shown in FIG. 6 , and is, for example, a metal mask 1M (a first product example) having a single-layer structure with a thickness T 1M of the mask pattern 1f.

<第一製品例的第一變形例> 根據圖12及圖14、或圖12及圖15所示的金屬掩模的製造方法,能夠製造具有與圖7所示的金屬掩模(第一製品例的變形例)類似的構成的、圖14或圖15所示的金屬掩模1Ma(第一製品例的第一變形例)。<The first modification of the first product example> According to the manufacturing method of the metal mask shown in FIGS. 12 and 14 , or FIGS. 12 and 15 , it is possible to manufacture the metal mask shown in FIG. 14 or the metal mask 1Ma shown in FIG. 15 (a first modification of the first product example).

圖14或圖15所示的金屬掩模1Ma(第一製品例的第一變形例)能夠在繼圖12所示的步驟(a)至步驟(c)之後,通過圖13或圖14所示的製造過程而製造。此外,與圖12所示的步驟(a)對應的原材料準備步驟中,例如準備圖3所示的披覆板材1S。此披覆板材1S可與所述金屬掩模1M的情況相同。與圖12所示的步驟(b)對應的被覆步驟及與步驟(c)對應的蝕刻步驟也可與所述金屬掩模1M的情況同樣地進行。The metal mask 1Ma shown in FIG. 14 or FIG. 15 (the first modification of the first product example) can be passed through the process shown in FIG. 13 or FIG. 14 after the steps (a) to (c) shown in FIG. 12 . manufacturing process. In addition, in the raw material preparation step corresponding to the step (a) shown in FIG. 12 , for example, the cladding sheet 1S shown in FIG. 3 is prepared. This cladding sheet 1S may be the same as the case of the metal mask 1M. The coating step corresponding to the step (b) shown in FIG. 12 and the etching step corresponding to the step (c) can also be performed in the same manner as in the case of the metal mask 1M.

對使用圖14所示的製造過程的金屬掩模的製造方法進行說明。圖14所示的製造過程為繼圖12所示的步驟(a)至步驟(c)之後的過程。圖14中,步驟(e)為被覆步驟。此被覆步驟中,為了在Z1側形成規定形狀的框部11f(參照步驟(h)),而在第一載體層11的表面11a形成保護膜15,在蝕刻孔11b(參照圖12)形成保護膜16,在基材層10的表面10a及蝕刻孔10b形成保護膜17。The manufacturing method of the metal mask using the manufacturing process shown in FIG. 14 is demonstrated. The manufacturing process shown in FIG. 14 is a process following steps (a) to (c) shown in FIG. 12 . In FIG. 14 , step (e) is a covering step. In this coating step, in order to form the frame portion 11f of a predetermined shape on the Z1 side (see step (h)), the protective film 15 is formed on the surface 11a of the first carrier layer 11, and the etching hole 11b (see FIG. 12 ) is formed to protect In the film 16, a protective film 17 is formed on the surface 10a of the base material layer 10 and the etching hole 10b.

圖14中,步驟(f)為蝕刻步驟。此蝕刻步驟中,使用適於構成第一載體層11的鐵基合金B的蝕刻液,對第一載體層11進行蝕刻。蝕刻液例如使用濃度為40質量%的氯化鐵液(水溶液)。通過所述蝕刻而將不具有保護膜15及保護膜16的第一載體層11的表面11a蝕刻,形成例如蝕刻孔11c。所述蝕刻孔11的深度(蝕刻量)的調整可通過調整蝕刻條件等從而實現。In FIG. 14, step (f) is an etching step. In this etching step, the first carrier layer 11 is etched using an etchant suitable for the iron-based alloy B constituting the first carrier layer 11 . As an etching liquid, the ferric chloride liquid (aqueous solution) whose density|concentration is 40 mass % is used, for example. By the etching, the surface 11a of the first carrier layer 11 which does not have the protective film 15 and the protective film 16 is etched to form, for example, an etching hole 11c. The adjustment of the depth (etching amount) of the etching hole 11 can be realized by adjusting the etching conditions and the like.

圖14中,步驟(g)為半蝕刻步驟。此半蝕刻步驟中,首先從基材層10除去保護膜17。接著,在包含蝕刻孔11b及蝕刻孔11c的第一載體層11的表面11a形成保護膜18,在蝕刻孔10b(參照圖12)形成保護膜19。然後進行半蝕刻。半蝕刻是從基材層10的表面10a側(Z2側)向第一載體層11側(Z1側)大致均勻地進行。通過所述半蝕刻而將基材層10大致全部除去。此外,也可通過調整半蝕刻條件,而對除去基材層10後的第一載體層11進行朝向Z1側的半蝕刻。由此,可實現金屬掩模的薄壁化。In FIG. 14, step (g) is a half etching step. In this half-etching step, the protective film 17 is first removed from the base material layer 10 . Next, the protective film 18 is formed on the surface 11 a of the first carrier layer 11 including the etching hole 11 b and the etching hole 11 c, and the protective film 19 is formed in the etching hole 10 b (see FIG. 12 ). Then do half etching. The half-etching is performed substantially uniformly from the surface 10a side (Z2 side) of the base material layer 10 to the first carrier layer 11 side (Z1 side). Substantially all of the base material layer 10 is removed by the half-etching. Further, by adjusting the half-etching conditions, the first carrier layer 11 from which the base material layer 10 has been removed may be half-etched toward the Z1 side. Thereby, the thickness reduction of the metal mask can be achieved.

圖14中,步驟(h)為整飾步驟。此整飾步驟中,從披覆板材1S除去保護膜18及保護膜19,對整個表面進行清洗處理。由此能夠製造金屬掩模。所述金屬掩模包括包含鐵基合金B的載體部11M,在載體部11M的Z1側的邊緣部分以環狀配置著框部11f。所述框部11f包含第一載體層11部分。所述金屬掩模例如具有與圖7所示的金屬掩模類似的構成,且例如為具有掩模圖案1fa的厚度T1Ma 的單層結構的金屬掩模1Ma(第一製品例的第一變形例)。In Fig. 14, step (h) is a finishing step. In this finishing step, the protective film 18 and the protective film 19 are removed from the covering plate 1S, and the entire surface is cleaned. Thereby, a metal mask can be produced. The metal mask includes a carrier portion 11M made of an iron-based alloy B, and a frame portion 11f is arranged in a ring shape at an edge portion on the Z1 side of the carrier portion 11M. The frame portion 11f includes a portion of the first carrier layer 11 . The metal mask has, for example, a structure similar to that of the metal mask shown in FIG. 7 , and is, for example, a metal mask 1Ma having a single-layer structure with a thickness T 1Ma of the mask pattern 1fa (a first modification of the first product example). example).

接下來,對使用圖15所示的製造過程的金屬掩模的製造方法進行說明。圖15所示的製造過程為繼圖12所示的步驟(a)至步驟(c)之後的過程。圖15中,步驟(e1)為被覆步驟。此被覆步驟中,為了在Z1側形成規定形狀的框部11f(參照步驟(h1)),而在第一載體層11的表面11a形成保護膜15,在蝕刻孔11b(參照圖12)形成保護膜16,在蝕刻孔10b(參照圖12)形成保護膜19。此外,在基材層10的表面10a不形成保護膜。Next, the manufacturing method of the metal mask using the manufacturing process shown in FIG. 15 is demonstrated. The manufacturing process shown in FIG. 15 is a process following steps (a) to (c) shown in FIG. 12 . In FIG. 15, step (e1) is a covering step. In this coating step, in order to form a frame portion 11f of a predetermined shape on the Z1 side (see step (h1)), a protective film 15 is formed on the surface 11a of the first carrier layer 11, and a protective film is formed on the etching hole 11b (see FIG. 12 ). For the film 16, a protective film 19 is formed in the etching hole 10b (see FIG. 12). In addition, the protective film is not formed on the surface 10 a of the base material layer 10 .

圖15中,步驟(f1)為蝕刻及半蝕刻步驟。此蝕刻及半蝕刻步驟中,使用適於構成基材層10的鐵基合金A及構成第一載體層11的鐵基合金B兩者的蝕刻液,將第一載體層11側(Z1側)及基材層10側(Z2側)同時蝕刻。蝕刻液例如使用濃度為40質量%的氯化鐵液(水溶液)。通過所述蝕刻而將不具有保護膜15及保護膜16的第一載體層11的表面11a蝕刻,形成例如蝕刻孔11c。所述蝕刻孔11c的深度(蝕刻量)的調整可通過調整蝕刻條件等從而實現。另外,同時將不具有保護膜19的基材層10的表面10a朝向第一載體層11側(Z1側)大致均勻地半蝕刻,將基材層10大致全部除去。此外,也可通過調整半蝕刻條件,而對除去基材層10後的第一載體層11進行朝向Z1側的半蝕刻。由此,可實現金屬掩模的薄壁化。In FIG. 15, step (f1) is an etching and half-etching step. In this etching and half-etching step, an etching solution suitable for both the iron-based alloy A constituting the base layer 10 and the iron-based alloy B constituting the first carrier layer 11 is used to etch the first carrier layer 11 side (Z1 side) and the base layer 10 side (Z2 side) are etched simultaneously. As an etching liquid, the ferric chloride liquid (aqueous solution) whose density|concentration is 40 mass % is used, for example. By the etching, the surface 11a of the first carrier layer 11 which does not have the protective film 15 and the protective film 16 is etched to form, for example, an etching hole 11c. Adjustment of the depth (etching amount) of the etching hole 11c can be achieved by adjusting etching conditions and the like. At the same time, the surface 10 a of the base material layer 10 without the protective film 19 is substantially uniformly half-etched toward the first carrier layer 11 side (Z1 side) to remove substantially all of the base material layer 10 . Further, by adjusting the half-etching conditions, the first carrier layer 11 from which the base material layer 10 has been removed may be half-etched toward the Z1 side. Thereby, the thickness reduction of the metal mask can be achieved.

圖15中,步驟(h1)為整飾步驟。此整飾步驟中,從披覆板材1S除去保護膜15、保護膜16及保護膜19,對整個表面進行清洗處理。由此能夠製造金屬掩模。所述金屬掩模包括包含鐵基合金B的載體部11M,在載體部11M的Z1側的邊緣部分以環狀配置著框部11f。所述框部11f包含第一載體層11部分。所述金屬掩模例如具有與圖7所示的金屬掩模類似的構成,且例如為具有掩模圖案1fa的厚度T1Ma 的單層結構的金屬掩模1Ma(第一製品例的第一變形例)。In Fig. 15, step (h1) is a finishing step. In this finishing step, the protective film 15 , the protective film 16 and the protective film 19 are removed from the covering plate 1S, and the entire surface is cleaned. Thereby, a metal mask can be produced. The metal mask includes a carrier portion 11M made of an iron-based alloy B, and a frame portion 11f is arranged in a ring shape at an edge portion on the Z1 side of the carrier portion 11M. The frame portion 11f includes a portion of the first carrier layer 11 . The metal mask has, for example, a structure similar to that of the metal mask shown in FIG. 7 , and is, for example, a metal mask 1Ma having a single-layer structure with a thickness T 1Ma of the mask pattern 1fa (a first modification of the first product example). example).

<第一製品例的第二變形例> 根據圖12及圖16所示的金屬掩模的製造方法,能夠製造與圖7所示的金屬掩模(第一製品例的變形例)為類似的構成且在Z2側配置著框部10f的、圖16所示的金屬掩模1Mb(第一製品例的第二變形例)。<Second modification of the first product example> According to the manufacturing method of the metal mask shown in FIGS. 12 and 16 , it is possible to manufacture the metal mask shown in FIG. 7 (modification of the first product example) having a similar structure and having the frame portion 10 f arranged on the Z2 side. , the metal mask 1Mb shown in FIG. 16 (the second modification of the first product example).

圖16所示的金屬掩模1Mb(第一製品例的第二變形例)能夠在繼圖12所示的步驟(a)至步驟(c)之後,通過圖16所示的製造過程而製造。此外,與圖12所示的步驟(a)對應的原材料準備步驟中,例如準備圖3所示的披覆板材1S。此披覆板材1S可與所述金屬掩模1M的情況相同。與圖12所示的步驟(b)對應的被覆步驟及與步驟(c)對應的蝕刻步驟可與所述金屬掩模1M的情況同樣地進行。The metal mask 1Mb shown in FIG. 16 (a second modification of the first product example) can be manufactured through the manufacturing process shown in FIG. 16 following the steps (a) to (c) shown in FIG. 12 . In addition, in the raw material preparation step corresponding to the step (a) shown in FIG. 12 , for example, the cladding sheet 1S shown in FIG. 3 is prepared. This cladding sheet 1S may be the same as the case of the metal mask 1M. The coating step corresponding to the step (b) shown in FIG. 12 and the etching step corresponding to the step (c) can be performed in the same manner as in the case of the aforementioned metal mask 1M.

圖16所示的製造過程為繼圖12所示的步驟(a)至步驟(c)之後的過程。圖16中,步驟(e2)為被覆步驟。此被覆步驟中,為了在Z2側形成規定形狀的框部10f(參照步驟(h2)),而在基材層10的表面10a形成保護膜17,在蝕刻孔10b形成保護膜19,在第一載體層11的表面11a及蝕刻孔11b(參照圖12)形成保護膜20。The manufacturing process shown in FIG. 16 is a process following steps (a) to (c) shown in FIG. 12 . In FIG. 16, step (e2) is a covering step. In this coating step, in order to form the frame portion 10f of a predetermined shape on the Z2 side (refer to step (h2)), the protective film 17 is formed on the surface 10a of the base layer 10, the protective film 19 is formed on the etching hole 10b, and the first The protective film 20 is formed on the surface 11 a of the carrier layer 11 and the etching hole 11 b (see FIG. 12 ).

圖16中,步驟(f2)為蝕刻步驟。此蝕刻步驟中,使用適於構成基材層10的鐵基合金A的蝕刻液,對基材層10進行蝕刻。蝕刻液例如使用濃度為40質量%的氯化鐵液(水溶液)。通過所述蝕刻而將不具有保護膜17及保護膜19的基材層10的表面10a蝕刻,將基材層10大致全部去除,形成例如蝕刻孔10c。所述蝕刻孔10c的深度(蝕刻量)的調整可通過調整蝕刻條件等從而實現。此外,也可通過調整蝕刻條件,而對除去基材層10後的第一載體層11進行朝向Z1側的蝕刻。由此,可實現金屬掩模的薄壁化。In FIG. 16, step (f2) is an etching step. In this etching step, the base material layer 10 is etched using an etchant suitable for the iron-based alloy A constituting the base material layer 10 . As an etching liquid, the ferric chloride liquid (aqueous solution) whose density|concentration is 40 mass % is used, for example. By the etching, the surface 10a of the base material layer 10 which does not have the protective film 17 and the protective film 19 is etched, and substantially all of the base material layer 10 is removed, for example, an etching hole 10c is formed. The adjustment of the depth (etching amount) of the etching hole 10c can be realized by adjusting the etching conditions and the like. Further, by adjusting the etching conditions, the first carrier layer 11 from which the base material layer 10 has been removed may be etched toward the Z1 side. Thereby, the thickness reduction of the metal mask can be achieved.

圖16中,步驟(h2)為整飾步驟。此整飾步驟中,將保護膜17、保護膜19及保護膜20除去,對整個表面進行清洗處理。由此能夠製造金屬掩模。所述金屬掩模包括包含鐵基合金B的載體部11M,在載體部11M的Z2側的邊緣部分以環狀配置著框部10f。此框部10f包含基材層10部分。所述金屬掩模例如具有與圖7所示的金屬掩模類似的構成,且在Z2側配置著框部10f。所述金屬掩模例如為具有掩模圖案1f的厚度T1Mb 的金屬掩模1Mb(第一製品例的第二變形例)。所述金屬掩模1Mb的主體為單層結構。In Fig. 16, step (h2) is a finishing step. In this finishing step, the protective film 17, the protective film 19, and the protective film 20 are removed, and the entire surface is cleaned. Thereby, a metal mask can be produced. The metal mask includes a carrier portion 11M made of an iron-based alloy B, and a frame portion 10f is arranged in a ring shape at an edge portion of the carrier portion 11M on the Z2 side. The frame portion 10f includes the base material layer 10 portion. The metal mask has, for example, a structure similar to that of the metal mask shown in FIG. 7 , and the frame portion 10f is arranged on the Z2 side. The metal mask is, for example, a metal mask 1Mb having a thickness T 1Mb of a mask pattern 1f (a second modification of the first product example). The main body of the metal mask 1Mb is a single-layer structure.

<第三製品例> 根據圖17所示的金屬掩模的製造方法,能夠製造圖10所示的金屬掩模3M(第三製品例)。<The third product example> According to the manufacturing method of the metal mask shown in FIG. 17, the metal mask 3M (third product example) shown in FIG. 10 can be manufactured.

圖17中,步驟(i)為原材料準備步驟。此原材料準備步驟中,例如準備圖4所示的披覆板材2S或圖5所示的披覆板材3S。圖16中,具代表性地舉出圖4所示的披覆板材2S。披覆板材2S(厚度T2S )包括基材層10(厚度t0)、第一載體層11(厚度t1)及第二載體層12(厚度t2)。基材層10的厚度為1 μm以上且20 μm以下(優選5 μm以上且15 μm以下)。基材層10與第一載體層11經壓接。基材層10與第二載體層12經壓接。基材層10例如包含含有約32質量%的Ni及約5.5質量%的Co的鐵基合金A。第一載體層11例如包含含有約36質量%的Ni的鐵基合金B。第二載體層12包含鐵基合金C,可由與鐵基合金B同質的蝕刻液進行蝕刻,且相較於鐵基合金B而對所述蝕刻液更為高耐蝕。包含鐵基合金A的基材層10、包含鐵基合金B的第一載體層11及包含鐵基合金C的第二載體層12均可由同質的蝕刻液(例如濃度為40質量%的氯化鐵液等)進行蝕刻。此外,包含鐵基合金A的基材層10相較於包含鐵基合金B的第一載體層11而對所述蝕刻液更為高耐蝕,且相較於包含鐵基合金C的第二載體層12而對所述蝕刻液更為高耐蝕。In Fig. 17, step (i) is a raw material preparation step. In this raw material preparation step, for example, the cladding sheet 2S shown in FIG. 4 or the cladding sheet 3S shown in FIG. 5 is prepared. In FIG. 16 , the cladding plate 2S shown in FIG. 4 is typically shown. The cladding sheet 2S (thickness T 2S ) includes a base material layer 10 (thickness t0 ), a first carrier layer 11 (thickness t1 ) and a second carrier layer 12 (thickness t2 ). The thickness of the base material layer 10 is 1 μm or more and 20 μm or less (preferably 5 μm or more and 15 μm or less). The base material layer 10 and the first carrier layer 11 are crimped. The base material layer 10 and the second carrier layer 12 are crimped. The base material layer 10 includes, for example, an iron-based alloy A containing about 32 mass % of Ni and about 5.5 mass % of Co. The first carrier layer 11 contains, for example, an iron-based alloy B containing about 36 mass % of Ni. The second carrier layer 12 includes the iron-based alloy C, which can be etched by an etching solution of the same quality as the iron-based alloy B, and has higher corrosion resistance to the etching solution than the iron-based alloy B. The base material layer 10 containing the iron-based alloy A, the first carrier layer 11 containing the iron-based alloy B, and the second carrier layer 12 containing the iron-based alloy C can all be made of a homogeneous etching solution (for example, a chlorinated solution with a concentration of 40% by mass). molten iron, etc.) for etching. In addition, the base material layer 10 comprising the iron-based alloy A has higher corrosion resistance to the etching solution than the first carrier layer 11 comprising the iron-based alloy B, and is more resistant to the etching solution than the second carrier comprising the iron-based alloy C The layer 12 is more resistant to the etching solution.

圖17中,步驟(j)為被覆步驟。此被覆步驟中,為了形成規定的蝕刻圖案,而在第一載體層11的表面11a形成保護膜13,在第二載體層12的表面12a形成保護膜14。In FIG. 17 , step (j) is a covering step. In this coating step, in order to form a predetermined etching pattern, the protective film 13 is formed on the surface 11 a of the first carrier layer 11 , and the protective film 14 is formed on the surface 12 a of the second carrier layer 12 .

圖17中,步驟(k)為蝕刻步驟。此蝕刻步驟中,使用適於構成第一載體層11的鐵基合金B及構成第二載體層12的鐵基合金C兩者的蝕刻液,對披覆板材2S進行蝕刻。蝕刻液例如使用濃度為40質量%的氯化鐵液(水溶液)。通過所述蝕刻而將不具有保護膜13的第一載體層11的表面11a、與不具有保護膜14的第二載體層12的表面12a同時蝕刻,大致同時形成例如蝕刻孔11b及蝕刻孔12b。此時,包含鐵基合金C的第二載體層12相較於包含鐵基合金B的第一載體層11而對蝕刻液更為高耐蝕,由此第一載體層11側的蝕刻速度變得大於第二載體層12側的蝕刻速度。因此,相較於基材層10側而第一載體層11側的腐蝕減量變大,從Z1側向Z2側的蝕刻孔的形成更快地進行。其結果為,基材層10的蝕刻從Z1側開始進行,因此能夠使第一載體層11側(Z1側)的蝕刻孔11b的尺寸(距表面的深度、向表面的開口徑、孔內的體積等)比第二載體層12側(Z2側)的蝕刻孔12b更大。此外,關於蝕刻孔11b及蝕刻孔12b的尺寸等的調整,只要適當選擇第一載體層11及第二載體層12的厚度、材質等便可實現。In FIG. 17, step (k) is an etching step. In this etching step, the cladding plate 2S is etched using an etchant suitable for both the iron-based alloy B constituting the first carrier layer 11 and the iron-based alloy C constituting the second carrier layer 12 . As an etching liquid, the ferric chloride liquid (aqueous solution) whose density|concentration is 40 mass % is used, for example. By the etching, the surface 11a of the first carrier layer 11 without the protective film 13 and the surface 12a of the second carrier layer 12 without the protective film 14 are etched at the same time, for example, the etching hole 11b and the etching hole 12b are formed substantially simultaneously. . At this time, the second carrier layer 12 containing the iron-based alloy C has higher corrosion resistance to the etching solution than the first carrier layer 11 containing the iron-based alloy B, whereby the etching rate on the side of the first carrier layer 11 becomes Greater than the etching rate on the second carrier layer 12 side. Therefore, the etching loss on the first carrier layer 11 side becomes larger than that on the base layer 10 side, and the formation of the etching hole from the Z1 side to the Z2 side proceeds faster. As a result, since the etching of the base material layer 10 proceeds from the Z1 side, the size of the etching hole 11b on the first carrier layer 11 side (Z1 side) (the depth from the surface, the opening size to the surface, the size of the hole in the hole) can be adjusted. volume, etc.) is larger than the etching hole 12b on the second carrier layer 12 side (Z2 side). In addition, the adjustment of the size of the etching hole 11b and the etching hole 12b, etc. can be realized by appropriately selecting the thicknesses, materials, and the like of the first carrier layer 11 and the second carrier layer 12.

圖17中,步驟(m)為整飾步驟。此整飾步驟中,從披覆板材2S除去保護膜13及保護膜14,對整個表面進行清洗處理。由此能夠製造金屬掩模。所述金屬掩模包括包含鐵基合金A的基材部10M、包含鐵基合金B的第一載體部11M及包含鐵基合金C的第二載體部12M。所述金屬掩模例如為圖10所示那樣的金屬掩模3M,例如為具有掩模圖案3f的厚度T3M 的三層結構的金屬掩模3M(第三製品例)。In Fig. 17, step (m) is a finishing step. In this finishing step, the protective film 13 and the protective film 14 are removed from the covering plate 2S, and the entire surface is cleaned. Thereby, a metal mask can be produced. The metal mask includes a base material portion 10M including iron-based alloy A, a first carrier portion 11M including iron-based alloy B, and a second carrier portion 12M including iron-based alloy C. The metal mask is, for example, a metal mask 3M as shown in FIG. 10 , and is, for example, a metal mask 3M (third product example) having a three-layer structure with a thickness T 3M of the mask pattern 3 f .

<第三製品例的變形例> 根據圖17及圖18所示的製造過程,能夠製造圖11所示的金屬掩模3Ma(第三製品例的變形例)。<Variation of the third product example> According to the manufacturing process shown in FIGS. 17 and 18 , the metal mask 3Ma shown in FIG. 11 (a modification of the third product example) can be manufactured.

圖11所示的金屬掩模3Ma(第三製品例的變形例)能夠在繼圖17所示的步驟(i)至步驟(k)之後,通過圖18所示的製造過程而製造。此外,與圖17所示的步驟(i)對應的原材料準備步驟中,例如準備圖5所示的披覆板材3S。披覆板材3S(厚度T3S )包括基材層10(厚度t0)、第一載體層11(厚度t1)及第二載體層12(厚度t2,t1>t2)。基材層10的厚度為1 μm以上且20 μm以下(優選5 μm以上且15 μm以下)。關於第一載體層11的厚度t1,為了使用第一載體層11部分設置框部11f(參照圖18),而比第二載體層12的厚度t2更厚(參照圖5,t1>t2)。基材層10與第一載體層11經壓接。基材層10與第二載體層12經壓接。基材層10例如包含含有約32質量%的Ni及約5.5質量%的Co的鐵基合金A。第一載體層11例如包含含有約36質量%的Ni的鐵基合金B。第二載體層12包含鐵基合金C,可由與鐵基合金B同質的蝕刻液進行蝕刻,且相較於鐵基合金B而對所述蝕刻液更為高耐蝕。包含鐵基合金A的基材層10、包含鐵基合金B的第一載體層11及包含鐵基合金C的第二載體層12均可由同質的蝕刻液(例如濃度為40質量%的氯化鐵液等)進行蝕刻。此外,包含鐵基合金A的基材層10相較於包含鐵基合金B的第一載體層11而對所述蝕刻液更為高耐蝕,且相較於包含鐵基合金C的第二載體層12而對所述蝕刻液更為高耐蝕。與圖17所示的步驟(j)對應的被覆步驟及與步驟(k)對應的蝕刻步驟可與所述金屬掩模3M的情況同樣地進行。The metal mask 3Ma shown in FIG. 11 (a modification of the third product example) can be manufactured by the manufacturing process shown in FIG. 18 following the steps (i) to (k) shown in FIG. 17 . In addition, in the raw material preparation step corresponding to the step (i) shown in FIG. 17 , for example, the cladding plate 3S shown in FIG. 5 is prepared. The cladding sheet 3S (thickness T 3S ) includes a base material layer 10 (thickness t0 ), a first carrier layer 11 (thickness t1 ) and a second carrier layer 12 (thickness t2 , t1>t2 ). The thickness of the base material layer 10 is 1 μm or more and 20 μm or less (preferably 5 μm or more and 15 μm or less). The thickness t1 of the first carrier layer 11 is thicker than the thickness t2 of the second carrier layer 12 (refer to FIG. 5 , t1 > t2 ) in order to use the first carrier layer 11 to partially provide the frame portion 11 f (see FIG. 18 ). The base material layer 10 and the first carrier layer 11 are crimped. The base material layer 10 and the second carrier layer 12 are crimped. The base material layer 10 includes, for example, an iron-based alloy A containing about 32 mass % of Ni and about 5.5 mass % of Co. The first carrier layer 11 contains, for example, an iron-based alloy B containing about 36 mass % of Ni. The second carrier layer 12 includes an iron-based alloy C, which can be etched by an etchant of the same quality as the iron-based alloy B, and has higher corrosion resistance to the etchant than that of the iron-based alloy B. The base material layer 10 containing the iron-based alloy A, the first carrier layer 11 containing the iron-based alloy B, and the second carrier layer 12 containing the iron-based alloy C can all be made of a homogeneous etching solution (for example, a chlorinated solution with a concentration of 40% by mass). molten iron, etc.) for etching. In addition, the base material layer 10 comprising the iron-based alloy A has higher corrosion resistance to the etching solution than the first carrier layer 11 comprising the iron-based alloy B, and is more resistant to the etching solution than the second carrier comprising the iron-based alloy C The layer 12 is more resistant to the etching solution. The coating step corresponding to the step (j) shown in FIG. 17 and the etching step corresponding to the step (k) can be performed in the same manner as in the case of the aforementioned metal mask 3M.

圖18所示的製造過程為繼圖17所示的步驟(i)至步驟(k)之後的過程。圖18中,步驟(n)為被覆步驟。此被覆步驟中,為了在Z1側形成規定形狀的框部11f(參照步驟(q)),而在第一載體層11的表面11a形成保護膜15,在蝕刻孔11b(參照圖17)形成保護膜16,在第二載體層12的表面12a及蝕刻孔12b(參照圖17)形成保護膜17。The manufacturing process shown in FIG. 18 is a process following steps (i) to (k) shown in FIG. 17 . In FIG. 18, step (n) is a coating step. In this coating step, in order to form a frame portion 11f of a predetermined shape on the Z1 side (see step (q)), a protective film 15 is formed on the surface 11a of the first carrier layer 11, and a protective film is formed on the etching hole 11b (see FIG. 17 ). For the film 16 , a protective film 17 is formed on the surface 12 a of the second carrier layer 12 and the etching hole 12 b (see FIG. 17 ).

圖18中,步驟(p)為蝕刻步驟。此蝕刻步驟中,使用適於構成第一載體層11的鐵基合金B的蝕刻液,對第一載體層11進行蝕刻。蝕刻液例如使用濃度為40質量%的氯化鐵液(水溶液)。通過所述蝕刻而將不具有保護膜15的第一載體層11的表面11a蝕刻,形成例如蝕刻孔11c。此外,通過調整蝕刻時間等條件,而可調整蝕刻孔11c的深度。In FIG. 18, step (p) is an etching step. In this etching step, the first carrier layer 11 is etched using an etchant suitable for the iron-based alloy B constituting the first carrier layer 11 . As an etching liquid, the ferric chloride liquid (aqueous solution) whose density|concentration is 40 mass % is used, for example. By the etching, the surface 11a of the first carrier layer 11 without the protective film 15 is etched to form, for example, an etching hole 11c. In addition, by adjusting conditions such as etching time, the depth of the etching hole 11c can be adjusted.

圖18中,步驟(q)為整飾步驟。此整飾步驟中,從披覆板材3S除去保護膜15、保護膜16及保護膜17,對整個表面進行清洗處理。由此能夠製造金屬掩模。所述金屬掩模包括包含鐵基合金A的基材部10M、包含鐵基合金B的第一載體部11M及包含鐵基合金C的第二載體部12M,在第一載體部11M的Z1側的邊緣部分以環狀配置著框部11f。此框部11f包含第一載體層11部分。所述金屬掩模例如為圖11所示那樣的金屬掩模3Ma,且例如為具有掩模圖案3f的厚度T3Ma 的三層結構的金屬掩模3Ma(第三製品例)。In Fig. 18, step (q) is a finishing step. In this finishing step, the protective film 15, the protective film 16, and the protective film 17 are removed from the covering plate 3S, and the entire surface is cleaned. Thereby, a metal mask can be produced. The metal mask includes a base material portion 10M comprising iron-based alloy A, a first carrier portion 11M comprising iron-based alloy B, and a second carrier portion 12M comprising iron-based alloy C, on the Z1 side of the first carrier portion 11M The edge portion of the frame portion 11f is arranged in a ring shape. This frame portion 11f includes a portion of the first carrier layer 11 . The metal mask is, for example, a metal mask 3Ma as shown in FIG. 11 , and is, for example, a metal mask 3Ma (third product example) having a three-layer structure with a thickness T 3Ma of the mask pattern 3f.

<第二製品例的變形例> 根據圖17及圖19所示的製造過程,能夠製造圖9所示的金屬掩模2Ma(第二製品例的變形例)。<Variation of the second product example> According to the manufacturing process shown in FIGS. 17 and 19 , the metal mask 2Ma shown in FIG. 9 (a modification of the second product example) can be manufactured.

圖9所示的金屬掩模2Ma(第二製品例的變形例)能夠在繼圖17所示的步驟(i)至步驟(k)之後,通過圖19所示的製造過程而製造。此外,與圖17所示的步驟(i)對應的原材料準備步驟中,例如準備圖4所示的披覆板材2S或圖5所示的披覆板材3S。圖19中,具代表性地舉出圖4所示的披覆板材2S。所述披覆板材2S可與所述金屬掩模3M的情況相同。關於第一載體層11的厚度t1,為了對第一載體層11部分進行蝕刻而設置框部11f(參照圖19),可與第二載體層12的厚度t2大致同等(參照圖4,t1=t2)。與圖17所示的步驟(j)對應的被覆步驟及與步驟(k)對應的蝕刻步驟可與所述金屬掩模3M的情況同樣地進行。The metal mask 2Ma shown in FIG. 9 (a modification of the second product example) can be manufactured by the manufacturing process shown in FIG. 19 following the steps (i) to (k) shown in FIG. 17 . In addition, in the raw material preparation step corresponding to the step (i) shown in FIG. 17 , for example, the covering plate 2S shown in FIG. 4 or the covering plate 3S shown in FIG. 5 is prepared. In FIG. 19 , the cladding plate 2S shown in FIG. 4 is typically shown. The cladding sheet 2S may be the same as the case of the metal mask 3M. The thickness t1 of the first carrier layer 11 may be approximately equal to the thickness t2 of the second carrier layer 12 (refer to FIG. 4 , t1= t2). The coating step corresponding to the step (j) shown in FIG. 17 and the etching step corresponding to the step (k) can be performed in the same manner as in the case of the aforementioned metal mask 3M.

圖19所示的製造過程為繼圖17所示的步驟(i)至步驟(k)之後的過程。圖19中,步驟(n1)為被覆步驟。此被覆步驟中,為了在Z1側形成規定形狀的框部11f(參照步驟(q1)),而在第一載體層11的表面11a形成保護膜15,在蝕刻孔11b(參照圖17)形成保護膜16,在第二載體層12的表面12a及蝕刻孔12b(參照圖17)形成保護膜17。The manufacturing process shown in FIG. 19 is a process following steps (i) to (k) shown in FIG. 17 . In FIG. 19, step (n1) is a covering step. In this coating step, in order to form a frame portion 11f of a predetermined shape on the Z1 side (see step (q1)), a protective film 15 is formed on the surface 11a of the first carrier layer 11, and a protective film 15 is formed on the etching hole 11b (see FIG. 17 ). For the film 16 , a protective film 17 is formed on the surface 12 a of the second carrier layer 12 and the etching hole 12 b (see FIG. 17 ).

圖19中,步驟(p1)為蝕刻步驟。此蝕刻步驟中,使用適於構成第一載體層11的鐵基合金B的蝕刻液,對第一載體層11進行蝕刻。蝕刻液例如使用濃度為40質量%的氯化鐵液(水溶液)。通過所述蝕刻而將不具有保護膜15的第一載體層11的表面11a蝕刻,將第一載體層11大致全部除去,形成例如蝕刻孔11c。此外,通過調整蝕刻時間等條件,而可調整蝕刻孔11c的深度。另外,也可通過調整蝕刻條件,而對除去第一載體層11後的基材層10進行朝向Z2側的蝕刻。由此,可實現金屬掩模的薄壁化。In FIG. 19, step (p1) is an etching step. In this etching step, the first carrier layer 11 is etched using an etchant suitable for the iron-based alloy B constituting the first carrier layer 11 . As an etching liquid, the ferric chloride liquid (aqueous solution) whose density|concentration is 40 mass % is used, for example. By the etching, the surface 11a of the first carrier layer 11 without the protective film 15 is etched, and substantially all the first carrier layer 11 is removed to form, for example, an etching hole 11c. In addition, by adjusting conditions such as etching time, the depth of the etching hole 11c can be adjusted. In addition, by adjusting the etching conditions, the base material layer 10 from which the first carrier layer 11 has been removed may be etched toward the Z2 side. Thereby, the thickness reduction of the metal mask can be achieved.

圖19中,步驟(q1)為整飾步驟。此整飾步驟中,從披覆板材2S除去保護膜15、保護膜16及保護膜17,對整個表面進行清洗處理。由此能夠製造金屬掩模。所述金屬掩模的主體包括包含鐵基合金A的基材部10M及包含鐵基合金C的第二載體部12M。所述金屬掩模在包含鐵基合金B的第一載體部11M的Z1側的邊緣部分以環狀配置著框部11f。此框部11f包含第一載體層11部分。所述金屬掩模例如為圖9所示那樣的金屬掩模2Ma,且例如為具有掩模圖案2f的厚度T2Ma 的金屬掩模2Ma(第二製品例的變形例)。所述金屬掩模2Ma的主體為二層結構。In FIG. 19, step (q1) is a finishing step. In this finishing step, the protective film 15 , the protective film 16 , and the protective film 17 are removed from the covering plate 2S, and the entire surface is cleaned. Thereby, a metal mask can be produced. The main body of the metal mask includes a base material portion 10M comprising iron-based alloy A and a second carrier portion 12M comprising iron-based alloy C. In the metal mask, a frame portion 11f is arranged in a ring shape at the edge portion on the Z1 side of the first carrier portion 11M including the iron-based alloy B. This frame portion 11f includes a portion of the first carrier layer 11 . The metal mask is, for example, a metal mask 2Ma as shown in FIG. 9 , and is, for example, a metal mask 2Ma having a thickness T 2Ma of the mask pattern 2f (a modification of the second product example). The main body of the metal mask 2Ma is a two-layer structure.

<第一製品例的第三變形例> 根據圖17及圖20所示的製造過程,能夠製造圖7所示的金屬掩模1Ma(第一製品例的變形例)。此外,為方便起見,將由所述製造過程所得的圖20所示的金屬掩模1Ma稱為第一製品例的第三變形例。<The third modification of the first product example> According to the manufacturing process shown in FIGS. 17 and 20 , the metal mask 1Ma shown in FIG. 7 (a modification of the first product example) can be manufactured. In addition, for convenience, the metal mask 1Ma shown in FIG. 20 obtained by the said manufacturing process is called the 3rd modification of the 1st product example.

圖7所示的金屬掩模1Ma(第一製品例的第三變形例)能夠在繼圖17所示的步驟(i)至步驟(k)之後,通過圖20所示的製造過程而製造。此外,與圖17所示的步驟(i)對應的原材料準備步驟中,例如準備與圖4所示的披覆板材2S或圖5所示的披覆板材3S類似的披覆板材。所述披覆板材3S可與所述金屬掩模3Ma(參照圖18)的情況相同,也可不與所述金屬掩模3Ma(參照圖18)的情況相同。關於披覆板材3S,例如第二載體層12的厚度t2可比第一載體層11的厚度t1更厚(t1<t2)。圖20中,具代表性地舉出與圖5所示的披覆板材3S類似的三層結構的披覆板材(以下稱為披覆板材3S)。基材層10例如包含所述鐵基合金A。第一載體層11包含相較於所述鐵基合金A而更容易由同質的蝕刻液蝕刻的例如所述鐵基合金C。第二載體層12包含相較於所述鐵基合金C而更容易由同質的蝕刻液蝕刻的例如所述鐵基合金B。因此,基材層10與第一載體層11及第二載體層12可同時蝕刻。另外,基材層10相較於第一載體層11及第二載體層12而對所述蝕刻液更為高耐蝕,且第一載體層11相較於第二載體層12而對所述蝕刻液更為高耐蝕。與圖17所示的步驟(j)對應的被覆步驟可與所述金屬掩模3M的情況同樣地進行。另外,與步驟(k)對應的蝕刻步驟中,第一載體層11相較於第二載體層12而更為高耐蝕,由此第二載體層12的蝕刻速度變得大於第一載體層11的蝕刻速度。因此,只要考慮到從第二載體層12側(Z2側)向Z1側的蝕刻量(深度)大於從第一載體層11側(Z1側)向Z2側的蝕刻量(深度)而調整便可。The metal mask 1Ma shown in FIG. 7 (the third modification of the first product example) can be manufactured through the manufacturing process shown in FIG. 20 following the steps (i) to (k) shown in FIG. 17 . In addition, in the raw material preparation step corresponding to the step (i) shown in FIG. 17 , for example, a cladding plate similar to the cladding plate 2S shown in FIG. 4 or the cladding plate 3S shown in FIG. 5 is prepared. The cladding plate 3S may be the same as the case of the metal mask 3Ma (refer to FIG. 18 ), or may not be the same as the case of the metal mask 3Ma (refer to FIG. 18 ). Regarding the cladding sheet 3S, for example, the thickness t2 of the second carrier layer 12 may be thicker than the thickness t1 of the first carrier layer 11 (t1<t2). In FIG. 20 , a cladding sheet having a three-layer structure similar to the cladding sheet 3S shown in FIG. 5 (hereinafter referred to as a cladding sheet 3S) is typically shown. The base material layer 10 includes the iron-based alloy A described above, for example. The first carrier layer 11 includes the iron-based alloy C, which is easier to be etched by a homogeneous etching solution than the iron-based alloy A, for example. The second carrier layer 12 includes, for example, the iron-based alloy B, which is easier to be etched by a homogeneous etching solution than the iron-based alloy C. Therefore, the base material layer 10 and the first carrier layer 11 and the second carrier layer 12 can be etched simultaneously. In addition, the base material layer 10 is more resistant to the etching solution than the first carrier layer 11 and the second carrier layer 12 , and the first carrier layer 11 is more resistant to the etching than the second carrier layer 12 Liquid is more resistant to corrosion. The coating step corresponding to the step (j) shown in FIG. 17 can be performed in the same manner as in the case of the above-described metal mask 3M. In addition, in the etching step corresponding to step (k), the first carrier layer 11 has higher corrosion resistance than the second carrier layer 12 , so that the etching speed of the second carrier layer 12 becomes higher than that of the first carrier layer 11 etching rate. Therefore, it may be adjusted by considering that the etching amount (depth) from the second carrier layer 12 side (Z2 side) to the Z1 side is larger than the etching amount (depth) from the first carrier layer 11 side (Z1 side) to the Z2 side .

圖20所示的製造過程為繼圖17所示的步驟(i)至步驟(k)之後的過程。圖20中,步驟(n2)為被覆步驟。此被覆步驟中,為了在Z1側形成規定形狀的框部11f(參照步驟(q2)),而在第一載體層11的表面11a形成保護膜15,在蝕刻孔11b(參照圖17)形成保護膜16,在蝕刻孔12b(參照圖17)形成保護膜19。此外,在第二載體層11的表面11a不形成保護膜。The manufacturing process shown in FIG. 20 is a process following steps (i) to (k) shown in FIG. 17 . In FIG. 20, step (n2) is a covering step. In this coating step, in order to form a frame portion 11f of a predetermined shape on the Z1 side (see step (q2)), a protective film 15 is formed on the surface 11a of the first carrier layer 11, and a protective film 15 is formed on the etching hole 11b (see FIG. 17 ). For the film 16, a protective film 19 is formed in the etching hole 12b (see FIG. 17). In addition, a protective film is not formed on the surface 11 a of the second carrier layer 11 .

圖20中,步驟(p2)為蝕刻及半蝕刻步驟。此蝕刻及半蝕刻步驟中,使用適於構成第一載體層11的鐵基合金C及構成第二載體層12的鐵基合金B的蝕刻液,將第一載體層11及第二載體層12同時蝕刻。蝕刻液例如使用濃度為40質量%的氯化鐵液(水溶液)。通過所述蝕刻而將不具有保護膜15的第一載體層11的表面11a蝕刻,將第一載體層11大致全部除去,形成例如蝕刻孔11c。另外,同時將不具有保護膜19的第二載體層12的表面12a朝向基材層10側(Z1側)大致均勻地半蝕刻,將第二載體層11大致全部除去。在此情況下,與相較於第二載體層12更為高耐蝕的第一載體層11的蝕刻速度相比,第二載體層12的蝕刻速度變大。因此,相較於從第一載體層11側(Z1側)向Z2側的蝕刻量(深度),從第二載體層12側(Z2側)向Z1側的蝕刻量(深度)變大。因此,若考慮第一載體層11與第二載體層12的厚度及耐蝕性之差,則可進行與蝕刻孔11c的形成大致同時地將第二載體層12大致除去的調整。此外,通過調整蝕刻條件,而可調整蝕刻孔11c的深度。另外,也可通過調整蝕刻條件,而對除去第二載體層12後的基材層10進行朝向Z1側的半蝕刻。由此,可實現金屬掩模的薄壁化。In FIG. 20, step (p2) is an etching and half-etching step. In this etching and half-etching step, the first carrier layer 11 and the second carrier layer 12 are etched with an etchant suitable for the iron-based alloy C constituting the first carrier layer 11 and the iron-based alloy B constituting the second carrier layer 12 . Simultaneous etching. As an etching liquid, the ferric chloride liquid (aqueous solution) whose density|concentration is 40 mass % is used, for example. By the etching, the surface 11a of the first carrier layer 11 without the protective film 15 is etched, and substantially all the first carrier layer 11 is removed to form, for example, an etching hole 11c. At the same time, the surface 12 a of the second carrier layer 12 without the protective film 19 is substantially uniformly half-etched toward the base layer 10 side (Z1 side) to remove substantially all of the second carrier layer 11 . In this case, the etching rate of the second carrier layer 12 becomes greater than the etching rate of the first carrier layer 11 which is more highly resistant to corrosion than the second carrier layer 12 . Therefore, the etching amount (depth) from the second carrier layer 12 side (Z2 side) to the Z1 side becomes larger than the etching amount (depth) from the first carrier layer 11 side (Z1 side) to the Z2 side. Therefore, when the difference in thickness and corrosion resistance of the first carrier layer 11 and the second carrier layer 12 is considered, the adjustment to remove the second carrier layer 12 substantially simultaneously with the formation of the etching hole 11c can be performed. In addition, by adjusting the etching conditions, the depth of the etching hole 11c can be adjusted. In addition, by adjusting the etching conditions, the base material layer 10 from which the second carrier layer 12 has been removed may be half-etched toward the Z1 side. Thereby, the thickness reduction of the metal mask can be achieved.

圖20中,步驟(q2)為整飾步驟。此整飾步驟中,從披覆板材2S除去保護膜15、保護膜16及保護膜19,對整個表面進行清洗處理。由此能夠製造金屬掩模。所述金屬掩模的主體包括包含鐵基合金A的基材部10M。所述金屬掩模在基材部10M的Z1側的邊緣部分以環狀配置著框部11f。此框部11f包含第一載體層11部分。所述金屬掩模例如為圖7所示那樣的金屬掩模1Ma,且例如為具有掩模圖案1f的厚度T1Ma 的金屬掩模1Ma(第一製品例的第三變形例)。所述金屬掩模1Ma的主體為單層結構。所述披覆板材3S那樣的金屬掩模用披覆板材的操作充分容易,可實現金屬掩模的充分薄壁化的可能性高。另外,根據使用所述披覆板材3S的圖17及圖20所示那樣的金屬掩模的製造方法,操作充分容易,可製造充分經薄壁化的金屬掩模,可期待充分的生產性提高。In Fig. 20, step (q2) is a finishing step. In this finishing step, the protective film 15, the protective film 16, and the protective film 19 are removed from the covering plate 2S, and the entire surface is cleaned. Thereby, a metal mask can be produced. The main body of the metal mask includes a base material portion 10M containing an iron-based alloy A. In the metal mask, the frame portion 11f is annularly arranged at the edge portion on the Z1 side of the base material portion 10M. This frame portion 11f includes a portion of the first carrier layer 11 . The metal mask is, for example, a metal mask 1Ma as shown in FIG. 7 , and is, for example, a metal mask 1Ma having a thickness T 1Ma of the mask pattern 1f (a third modification of the first product example). The main body of the metal mask 1Ma is a single-layer structure. The handling of the covering sheet for a metal mask such as the covering sheet 3S is sufficiently easy, and there is a high possibility that a sufficient thickness reduction of the metal mask can be achieved. In addition, according to the method of manufacturing a metal mask as shown in FIGS. 17 and 20 using the cladding sheet 3S, the operation is sufficiently easy, and a sufficiently thinned metal mask can be manufactured, and a sufficient improvement in productivity can be expected. .

1f、1fa、2f、3f、100f、200f:掩模圖案(蝕刻孔) 1M:金屬掩模(第一製品例) 1Ma:金屬掩模(第一製品例的變形例) 1Mb:金屬掩模(第一製品例的第二變形例) 1S:披覆板材(第一實施方式、金屬掩模用披覆板材) 2M:金屬掩模(第二製品例) 2Ma:金屬掩模(第二製品例的變形例) 2S:披覆板材(第二實施方式) 3M:金屬掩模(第三製品例) 3Ma:金屬掩模(第三製品例的變形例) 3S:披覆板材(第三實施方式) 10:基材層 10a、11a、12a、201a、202a:表面 10b、10c、11b、11c、12b、100d、100e、201b、202b:蝕刻孔 10f、11f:框部 10M:基材部 11:第一載體層 11M:載體部(第一載體部) 12:第二載體層 12M:載體部(第二載體部) 13~20、101~104、203、204:保護膜 100、200:金屬掩模 100a:金屬板材 100b:第一表面 100c:第二表面 200a:披覆板材 201:第一層 202:第二層 T1M 、T1Ma 、T1Mb 、T1S 、T2M 、T2Ma 、T2S 、T3M 、T3Ma 、T3S 、T100 、T200 、TX 、TY 、TY1 、TY2 、t0、t1、t2:厚度 Z:方向 Z1、Z2:側1f, 1fa, 2f, 3f, 100f, 200f: mask pattern (etched hole) 1M: metal mask (first product example) 1Ma: metal mask (modification of the first product example) 1Mb: metal mask ( Second modification of the first product example) 1S: Coating sheet (first embodiment, coating sheet for metal mask) 2M: Metal mask (second product example) 2Ma: Metal mask (second product example) 2S: Coated sheet (Second Embodiment) 3M: Metal Mask (Third Product Example) 3Ma: Metal Mask (Modified Example of Third Product Example) 3S: Coated Sheet (Third Embodiment) ) 10: base material layer 10a, 11a, 12a, 201a, 202a: surface 10b, 10c, 11b, 11c, 12b, 100d, 100e, 201b, 202b: etching hole 10f, 11f: frame portion 10M: base material portion 11: First carrier layer 11M: carrier part (first carrier part) 12: second carrier layer 12M: carrier part (second carrier part) 13-20, 101-104, 203, 204: protective film 100, 200: metal mask Mold 100a: metal sheet 100b: first surface 100c: second surface 200a: cladding sheet 201: first layer 202: second layer T 1M , T 1Ma , T 1Mb , T 1S , T 2M , T 2Ma , T 2S , T 3M , T 3Ma , T 3S , T 100 , T 200 , T X , T Y , T Y1 , T Y2 , t0, t1, t2: Thickness Z: Direction Z1, Z2: Side

圖1是作為現有技術,用於對使用包含單一種類金屬的單層結構的金屬板材的、金屬掩模的製造方法進行說明而表示的圖。 圖2是作為現有技術,用於對使用兩種金屬接合而成的二層結構的披覆板材的、金屬掩模的製造方法進行說明而表示的圖。 圖3是作為本發明的一實施方式,表示二層結構的金屬掩模用披覆板材的一例的圖。 圖4是作為本發明的一實施方式,表示三層結構的金屬掩模用披覆板材的一例的圖。 圖5是作為本發明的一實施方式,表示三層結構的金屬掩模用披覆板材的另一例的圖。 圖6是作為本發明的一實施方式,表示單層結構的金屬掩模的一例的圖。 圖7是作為本發明的一實施方式,表示單層結構的金屬掩模的另一例的圖。 圖8是作為本發明的一實施方式,表示二層結構的金屬掩模的一例的圖。 圖9是作為本發明的一實施方式,表示二層結構的金屬掩模的另一例的圖。 圖10是作為本發明的一實施方式,表示三層結構的金屬掩模的一例的圖。 圖11是作為本發明的一實施方式,表示三層結構的金屬掩模的另一例的圖。 圖12是用於對使用二層結構的金屬掩模用披覆板材的、金屬掩模的製造方法進行說明而表示的圖。 圖13是用於對使用二層結構的金屬掩模用披覆板材的、金屬掩模的製造方法進行說明而表示的圖。 圖14是用於對使用二層結構的金屬掩模用披覆板材的、金屬掩模的製造方法進行說明而表示的圖。 圖15是用於對使用二層結構的金屬掩模用披覆板材的、金屬掩模的製造方法進行說明而表示的圖。 圖16是用於對使用二層結構的金屬掩模用披覆板材的、金屬掩模的製造方法進行說明而表示的圖。 圖17是用於對使用三層結構的金屬掩模用披覆板材的、金屬掩模的製造方法進行說明而表示的圖。 圖18是用於對使用三層結構的金屬掩模用披覆板材的、金屬掩模的製造方法進行說明而表示的圖。 圖19是用於對使用三層結構的金屬掩模用披覆板材的、金屬掩模的製造方法進行說明而表示的圖。 圖20是用於對使用三層結構的金屬掩模用披覆板材的、金屬掩模的製造方法進行說明而表示的圖。FIG. 1 is a diagram illustrating a method of manufacturing a metal mask using a metal plate material having a single-layer structure including a single type of metal as a conventional technique. FIG. 2 is a diagram illustrating a method for producing a metal mask using a two-layer structure cladding sheet in which two metals are joined together, as a prior art. FIG. 3 is a diagram showing an example of a cover sheet for a metal mask having a two-layer structure as an embodiment of the present invention. FIG. 4 is a diagram showing an example of a three-layer structure of a covering plate for a metal mask as an embodiment of the present invention. FIG. 5 is a view showing another example of a three-layer structure of the covering plate for a metal mask as an embodiment of the present invention. FIG. 6 is a diagram showing an example of a metal mask having a single-layer structure as an embodiment of the present invention. 7 is a diagram showing another example of a metal mask having a single-layer structure as an embodiment of the present invention. 8 is a diagram showing an example of a metal mask having a two-layer structure as an embodiment of the present invention. 9 is a diagram showing another example of a metal mask having a two-layer structure as an embodiment of the present invention. FIG. 10 is a diagram showing an example of a metal mask having a three-layer structure as an embodiment of the present invention. FIG. 11 is a diagram showing another example of a metal mask having a three-layer structure as an embodiment of the present invention. FIG. 12 is a diagram for illustrating a method for manufacturing a metal mask using a cladding sheet for a metal mask having a two-layer structure. FIG. 13 is a diagram illustrating a method of manufacturing a metal mask using a cladding sheet for a metal mask having a two-layer structure. FIG. 14 is a diagram for illustrating a method for manufacturing a metal mask using a cladding sheet for a metal mask having a two-layer structure. FIG. 15 is a diagram illustrating a method of manufacturing a metal mask using a cladding sheet for a metal mask of a two-layer structure. FIG. 16 is a diagram illustrating a method of manufacturing a metal mask using a cladding sheet for a metal mask having a two-layer structure. FIG. 17 is a diagram illustrating a method of manufacturing a metal mask using a cladding sheet for a metal mask having a three-layer structure. FIG. 18 is a diagram illustrating a method of manufacturing a metal mask using a three-layer structure of the covering plate for a metal mask. FIG. 19 is a diagram illustrating a method of manufacturing a metal mask using a cladding sheet for a metal mask having a three-layer structure. FIG. 20 is a diagram illustrating a method of manufacturing a metal mask using a cladding sheet for a metal mask having a three-layer structure.

1S:披覆板材(第一實施方式、金屬掩模用披覆板材) 1S: Coating sheet (first embodiment, coating sheet for metal mask)

10:基材層 10: Substrate layer

11:第一載體層 11: The first carrier layer

T1S、t0、t1:厚度 T 1S , t0, t1: Thickness

Z:方向 Z: direction

Z1、Z2:側 Z1, Z2: side

Claims (7)

一種金屬掩模用披覆板材,在沿厚度方向切斷的截面視時,包括:基材層,包含以30質量%以上且50質量%以下的範圍含有鎳及鈷中的一種以上的鐵基合金;以及第一載體層,直接壓接於所述基材層的其中一側,所述基材層及所述第一載體層能夠由同質的蝕刻液進行蝕刻,且所述基材層相較於所述第一載體層而對所述蝕刻液更為高耐蝕。 A cladding sheet for a metal mask, when viewed in a cross-sectional view along a thickness direction, comprising: a base material layer containing an iron-based iron base containing at least one of nickel and cobalt in a range of 30 mass % or more and 50 mass % or less alloy; and a first carrier layer, directly crimped to one side of the base material layer, the base material layer and the first carrier layer can be etched by a homogeneous etching solution, and the base material layer is homogeneous Compared with the first carrier layer, it has higher corrosion resistance to the etching solution. 如申請專利範圍第1項所述的金屬掩模用披覆板材,其中在同等的環境下使用同質的蝕刻液進行蝕刻,將所述基材層的腐蝕減量設為Mb,將所述第一載體層的腐蝕減量設為Mc1時,所述基材層與所述第一載體層滿足Mb/Mc1≦0.9的關係。 The coating material for a metal mask according to claim 1, wherein etching is performed using a homogeneous etchant under the same environment, the corrosion loss of the base material layer is M b , and the first When the corrosion loss of a carrier layer is set as M c1 , the base material layer and the first carrier layer satisfy the relationship of M b /M c1 ≦0.9. 一種金屬掩模用披覆板材,在沿厚度方向切斷的截面視時,包括:基材層,包含以30質量%以上且50質量%以下的範圍含有鎳及鈷中的一種以上的鐵基合金;第一載體層,直接壓接於所述基材層的其中一側;以及第二載體層,直接壓接於所述基材層的另一側,所述基材層、所述第一載體層及所述第二載體層能夠由同質的蝕刻液進行蝕刻,且所述基材層相較於所述第一載體層及所述第二載體層而對所述蝕刻液更為高耐蝕。 A cladding sheet for a metal mask, when viewed in a cross-sectional view along a thickness direction, comprising: a base material layer containing an iron-based iron base containing at least one of nickel and cobalt in a range of 30 mass % or more and 50 mass % or less alloy; a first carrier layer, directly crimped to one side of the base material layer; and a second carrier layer, directly crimped to the other side of the base material layer, the base material layer, the first A carrier layer and the second carrier layer can be etched by a homogeneous etchant, and the substrate layer has a higher resistance to the etchant than the first carrier layer and the second carrier layer. Corrosion resistant. 如申請專利範圍第3項所述的金屬掩模用披覆板材,其中在同等的環境下使用同質的蝕刻液進行蝕刻,將所述基材層的 腐蝕減量設為Mb,將所述第一載體層的腐蝕減量設為Mc1,將所述第二載體層的腐蝕減量設為Mc2時,所述基材層、所述第一載體層及所述第二載體層滿足Mb/Mc1≦0.9及Mb/Mc2≦0.9的關係。 The coating material for a metal mask according to claim 3, wherein etching is performed using a homogeneous etchant under the same environment, the corrosion loss of the base material layer is M b , and the first When the corrosion loss of a carrier layer is set as M c1 , and the corrosion loss of the second carrier layer is set as M c2 , the substrate layer, the first carrier layer and the second carrier layer satisfy M b / The relationship between M c1 ≦0.9 and M b /M c2 ≦0.9. 一種金屬掩模,是使用如申請專利範圍第1項至第4項中任一項所述的金屬掩模用披覆板材而形成,且包含構成所述基材層的所述鐵基合金。 A metal mask is formed using the coating material for a metal mask according to any one of claims 1 to 4 of the scope of application, and includes the iron-based alloy constituting the base material layer. 一種金屬掩模,是使用如申請專利範圍第1項至第4項中任一項所述的金屬掩模用披覆板材而形成,且包括:第一金屬層,包含構成所述基材層的所述鐵基合金;以及第二金屬層,包含構成所述第一載體層的金屬,並且所述金屬掩模是所述第一金屬層與所述第二金屬層接合而成。 A metal mask is formed by using the coating material for a metal mask according to any one of items 1 to 4 of the patent application scope, and includes: a first metal layer, including a base material layer constituting the the iron-based alloy; and a second metal layer, comprising the metal constituting the first carrier layer, and the metal mask is formed by bonding the first metal layer and the second metal layer. 一種金屬掩模,是使用根據如申請專利範圍第3項或第4項所述的金屬掩模用披覆板材而形成,且包括:第一金屬層,包含構成所述基材層的所述鐵基合金;第二金屬層,包含構成所述第一載體層的金屬;以及第三金屬層,包含構成所述第二載體層的金屬,並且所述金屬掩模是所述第二金屬層、所述第一金屬層及所述第三金屬層依次接合而成。 A metal mask is formed using the covering plate for a metal mask according to item 3 or item 4 of the scope of application, and includes: a first metal layer including the an iron-based alloy; a second metal layer comprising the metal comprising the first carrier layer; and a third metal layer comprising the metal comprising the second carrier layer, and the metal mask is the second metal layer , the first metal layer and the third metal layer are sequentially joined together.
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