TWI743076B - 洗淨裝置 - Google Patents
洗淨裝置 Download PDFInfo
- Publication number
- TWI743076B TWI743076B TW106101030A TW106101030A TWI743076B TW I743076 B TWI743076 B TW I743076B TW 106101030 A TW106101030 A TW 106101030A TW 106101030 A TW106101030 A TW 106101030A TW I743076 B TWI743076 B TW I743076B
- Authority
- TW
- Taiwan
- Prior art keywords
- cleaning
- wafer
- roller
- cleaning roller
- washing
- Prior art date
Links
- 238000005406 washing Methods 0.000 title claims abstract description 94
- 238000004140 cleaning Methods 0.000 claims abstract description 253
- 239000007788 liquid Substances 0.000 claims abstract description 84
- 238000003860 storage Methods 0.000 claims abstract description 35
- 230000002093 peripheral effect Effects 0.000 claims description 4
- 239000013078 crystal Substances 0.000 claims description 2
- 235000012431 wafers Nutrition 0.000 description 121
- 230000000694 effects Effects 0.000 description 4
- 238000011109 contamination Methods 0.000 description 3
- 230000008602 contraction Effects 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 239000003599 detergent Substances 0.000 description 2
- 230000003028 elevating effect Effects 0.000 description 2
- 239000012530 fluid Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 1
- 229920001971 elastomer Polymers 0.000 description 1
- 238000005187 foaming Methods 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H01L21/02052—Wet cleaning only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67023—Apparatus for fluid treatment for general liquid treatment, e.g. etching followed by cleaning
-
- B08B1/20—
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B11/00—Cleaning flexible or delicate articles by methods or apparatus specially adapted thereto
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02057—Cleaning during device manufacture
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02096—Cleaning only mechanical cleaning
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67046—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly scrubbing means, e.g. brushes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/6715—Apparatus for applying a liquid, a resin, an ink or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68764—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating caroussel
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016-034321 | 2016-02-25 | ||
JP2016034321A JP6609197B2 (ja) | 2016-02-25 | 2016-02-25 | 洗浄装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201735148A TW201735148A (zh) | 2017-10-01 |
TWI743076B true TWI743076B (zh) | 2021-10-21 |
Family
ID=59717914
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW106101030A TWI743076B (zh) | 2016-02-25 | 2017-01-12 | 洗淨裝置 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP6609197B2 (ja) |
KR (1) | KR102518002B1 (ja) |
CN (1) | CN107123609B (ja) |
TW (1) | TWI743076B (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6951199B2 (ja) * | 2017-11-09 | 2021-10-20 | 株式会社ディスコ | ウェーハ洗浄装置 |
CN107931179B (zh) * | 2017-11-15 | 2020-10-02 | 宜都同创光电科技有限公司 | 一种光学玻璃镜片洗前半自动擦油机 |
JP7100475B2 (ja) * | 2018-03-30 | 2022-07-13 | 株式会社ディスコ | 加工装置 |
JP7288370B2 (ja) * | 2019-08-20 | 2023-06-07 | 株式会社ディスコ | ウェーハ洗浄機構 |
CN114425492B (zh) * | 2022-02-17 | 2023-01-20 | 江苏正永地面装饰材料有限公司 | 一种pvc板材的生产加工系统 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05347287A (ja) * | 1992-04-14 | 1993-12-27 | Sony Corp | 洗浄装置 |
JP2002307023A (ja) * | 2001-04-13 | 2002-10-22 | Display Technologies Inc | 自己洗浄機能付きのブラシ洗浄装置、及びこれを用いる平面表示装置または半導体素子の製造方法 |
JP2009279536A (ja) * | 2008-05-23 | 2009-12-03 | Hitachi High-Technologies Corp | 基板洗浄装置及び、基板洗浄方法 |
JP2013239498A (ja) * | 2012-05-11 | 2013-11-28 | Disco Abrasive Syst Ltd | 洗浄装置 |
JP2015126033A (ja) * | 2013-12-25 | 2015-07-06 | 株式会社ディスコ | 洗浄装置および加工装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08139062A (ja) * | 1994-11-11 | 1996-05-31 | M Setetsuku Kk | 基板のスクラビング装置 |
JP2930580B1 (ja) * | 1998-03-27 | 1999-08-03 | 株式会社カイジョー | 半導体ウエーハ等用洗浄装置 |
JP2009117765A (ja) | 2007-11-09 | 2009-05-28 | Aion Kk | 洗浄用スポンジローラ |
JP5886224B2 (ja) * | 2012-05-23 | 2016-03-16 | 株式会社荏原製作所 | 基板洗浄方法 |
JP6054805B2 (ja) * | 2013-04-25 | 2016-12-27 | 株式会社荏原製作所 | 基板洗浄装置 |
-
2016
- 2016-02-25 JP JP2016034321A patent/JP6609197B2/ja active Active
-
2017
- 2017-01-12 TW TW106101030A patent/TWI743076B/zh active
- 2017-02-16 KR KR1020170020901A patent/KR102518002B1/ko active IP Right Grant
- 2017-02-22 CN CN201710095215.XA patent/CN107123609B/zh active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05347287A (ja) * | 1992-04-14 | 1993-12-27 | Sony Corp | 洗浄装置 |
JP2002307023A (ja) * | 2001-04-13 | 2002-10-22 | Display Technologies Inc | 自己洗浄機能付きのブラシ洗浄装置、及びこれを用いる平面表示装置または半導体素子の製造方法 |
JP2009279536A (ja) * | 2008-05-23 | 2009-12-03 | Hitachi High-Technologies Corp | 基板洗浄装置及び、基板洗浄方法 |
JP2013239498A (ja) * | 2012-05-11 | 2013-11-28 | Disco Abrasive Syst Ltd | 洗浄装置 |
JP2015126033A (ja) * | 2013-12-25 | 2015-07-06 | 株式会社ディスコ | 洗浄装置および加工装置 |
Also Published As
Publication number | Publication date |
---|---|
JP2017152565A (ja) | 2017-08-31 |
JP6609197B2 (ja) | 2019-11-20 |
CN107123609B (zh) | 2022-02-11 |
KR20170100428A (ko) | 2017-09-04 |
KR102518002B1 (ko) | 2023-04-04 |
CN107123609A (zh) | 2017-09-01 |
TW201735148A (zh) | 2017-10-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI743076B (zh) | 洗淨裝置 | |
KR102326734B1 (ko) | 기판 처리 장치 | |
US11532491B2 (en) | Substrate cleaning apparatus, substrate processing apparatus, and method of cleaning substrate | |
CN101740450B (zh) | 基板支撑单元、使用该单元抛光基板的装置及方法 | |
CN114274041B (zh) | 双面研磨装置和双面研磨方法 | |
TWI644738B (zh) | 基板洗淨裝置及基板處理裝置 | |
KR101965118B1 (ko) | 기판 처리 방법 및 기판 처리 장치 | |
TWI681449B (zh) | 研磨方法及研磨裝置 | |
JP2014082470A (ja) | 基板処理装置 | |
US10170343B1 (en) | Post-CMP cleaning apparatus and method with brush self-cleaning function | |
KR20190070532A (ko) | 로드 컵 및 이를 포함하는 화학기계적 연마 장치 | |
KR20190070874A (ko) | 기판 처리 장치 및 기판 처리 방법 | |
CN114227524A (zh) | 双面研磨装置和双面研磨方法 | |
KR102626035B1 (ko) | 기판 스피닝 장치 및 그 제어방법 | |
US10751761B2 (en) | Self-cleaning device and substrate processing apparatus | |
US20170372893A1 (en) | Cleaning apparatus and substrate processing apparatus | |
JP2018056385A (ja) | 基板洗浄装置および基板洗浄方法ならびに基板洗浄装置用のロールスポンジ | |
KR20160027638A (ko) | 웨이퍼의 세정 장치 | |
JP6549936B2 (ja) | 洗浄装置 | |
JP2000216124A (ja) | 研削装置およびウエハの研削方法 | |
JP2002184732A (ja) | 受け渡し装置 | |
KR20100048407A (ko) | 기판 지지 부재 및 이를 구비하는 기판 처리 장치 | |
JP2017123397A (ja) | 洗浄スポンジ | |
WO2023195340A1 (ja) | 基板処理装置、および基板処理方法 | |
JP2003080454A (ja) | ポリッシング装置 |