TWI730763B - Suction plate, cutting apparatus, and cutting method - Google Patents
Suction plate, cutting apparatus, and cutting method Download PDFInfo
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- TWI730763B TWI730763B TW109115979A TW109115979A TWI730763B TW I730763 B TWI730763 B TW I730763B TW 109115979 A TW109115979 A TW 109115979A TW 109115979 A TW109115979 A TW 109115979A TW I730763 B TWI730763 B TW I730763B
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23D—PLANING; SLOTTING; SHEARING; BROACHING; SAWING; FILING; SCRAPING; LIKE OPERATIONS FOR WORKING METAL BY REMOVING MATERIAL, NOT OTHERWISE PROVIDED FOR
- B23D79/00—Methods, machines, or devices not covered elsewhere, for working metal by removal of material
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q11/00—Accessories fitted to machine tools for keeping tools or parts of the machine in good working condition or for cooling work; Safety devices specially combined with or arranged in, or specially adapted for use in connection with, machine tools
- B23Q11/0042—Devices for removing chips
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q3/00—Devices holding, supporting, or positioning work or tools, of a kind normally removable from the machine
- B23Q3/02—Devices holding, supporting, or positioning work or tools, of a kind normally removable from the machine for mounting on a work-table, tool-slide, or analogous part
- B23Q3/06—Work-clamping means
- B23Q3/08—Work-clamping means other than mechanically-actuated
- B23Q3/088—Work-clamping means other than mechanically-actuated using vacuum means
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B26—HAND CUTTING TOOLS; CUTTING; SEVERING
- B26D—CUTTING; DETAILS COMMON TO MACHINES FOR PERFORATING, PUNCHING, CUTTING-OUT, STAMPING-OUT OR SEVERING
- B26D1/00—Cutting through work characterised by the nature or movement of the cutting member or particular materials not otherwise provided for; Apparatus or machines therefor; Cutting members therefor
- B26D1/01—Cutting through work characterised by the nature or movement of the cutting member or particular materials not otherwise provided for; Apparatus or machines therefor; Cutting members therefor involving a cutting member which does not travel with the work
- B26D1/12—Cutting through work characterised by the nature or movement of the cutting member or particular materials not otherwise provided for; Apparatus or machines therefor; Cutting members therefor involving a cutting member which does not travel with the work having a cutting member moving about an axis
- B26D1/14—Cutting through work characterised by the nature or movement of the cutting member or particular materials not otherwise provided for; Apparatus or machines therefor; Cutting members therefor involving a cutting member which does not travel with the work having a cutting member moving about an axis with a circular cutting member, e.g. disc cutter
- B26D1/157—Cutting through work characterised by the nature or movement of the cutting member or particular materials not otherwise provided for; Apparatus or machines therefor; Cutting members therefor involving a cutting member which does not travel with the work having a cutting member moving about an axis with a circular cutting member, e.g. disc cutter rotating about a movable axis
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B26—HAND CUTTING TOOLS; CUTTING; SEVERING
- B26D—CUTTING; DETAILS COMMON TO MACHINES FOR PERFORATING, PUNCHING, CUTTING-OUT, STAMPING-OUT OR SEVERING
- B26D7/00—Details of apparatus for cutting, cutting-out, stamping-out, punching, perforating, or severing by means other than cutting
- B26D7/01—Means for holding or positioning work
- B26D7/018—Holding the work by suction
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68785—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
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- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
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- Optics & Photonics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
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- Jigs For Machine Tools (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
Abstract
吸附板(10)包括:底座部(15),具有框部(16)及多個凸肋部(17A、17B);以及載置部(12),以重合於多個凸肋部(17A、17B)的方式而配置且形成有多個吸附孔(12H),多個凸肋部(17A、17B)彼此交叉的部分的一部分朝向基台(21)所配置的一側突出。The suction plate (10) includes: a base portion (15) with a frame portion (16) and a plurality of ribs (17A, 17B); and a placement portion (12) to overlap the plurality of ribs (17A, 17B) 17B), a plurality of suction holes (12H) are formed, and a part of the intersecting portion of the plurality of ribs (17A, 17B) protrudes toward the side where the base (21) is arranged.
Description
本發明是有關於一種吸附板(plate)、切斷裝置以及切斷方法。The invention relates to an adsorption plate, a cutting device and a cutting method.
如下述日本專利特開2016-040060號公報所公開的那樣,已知有一種切斷裝置,其將已密封基板在吸附於吸附夾具上的狀態下予以切斷。已密封基板例如是包含印刷基板或引線框架(lead frame)等的基板,呈格子狀地假想地劃分有與各個電子零件對應的多個區域。通過切斷裝置將已密封基板切斷成各個區域單位而單片化的部分成為電子零件。As disclosed in the following Japanese Patent Laid-Open No. 2016-040060, there is known a cutting device that cuts a sealed substrate while being sucked on a suction jig. The sealed substrate is, for example, a substrate including a printed circuit board, a lead frame, or the like, and a plurality of regions corresponding to each electronic component are virtually divided in a grid shape. The sealed substrate is cut into individual area units by the cutting device and the singulated part becomes an electronic component.
近年來,電子零件的尺寸存在逐漸變小的傾向。吸附電子零件的吸附板(相當於日本專利特開2016-040060號公報的吸附夾具及蜂窩(honeycomb)板(支撐部))與電子零件的接觸面積也變小,伴隨於此,吸附電子零件的吸附孔的大小也變小,從而難以使吸附力作用於各個電子零件。為了獲得更大的吸附力,考慮擴大吸附板內所設的抽吸通路,但擴大抽吸通路會導致吸附板的剛性下降。In recent years, the size of electronic components has a tendency to gradually become smaller. The contact area between the suction plate (equivalent to the suction jig and honeycomb plate (supporting part) of Japanese Patent Laid-Open No. 2016-040060) and the electronic parts is also reduced. Accompanying this, the suction of electronic parts The size of the suction hole also becomes smaller, making it difficult for the suction force to act on each electronic component. In order to obtain a greater suction force, it is considered to expand the suction passage provided in the suction plate, but expanding the suction passage will cause the rigidity of the suction plate to decrease.
若吸附板的剛性下降,則在切斷加工時,吸附板容易受到伴隨切斷的應力而發生撓曲等變形。若吸附板發生撓曲等變形,則難以將切斷對象物以高精度予以切斷,從而經產品化的電子零件難以獲得高品質。If the rigidity of the suction plate decreases, the suction plate is likely to be deformed such as bending due to the stress accompanying the cutting during the cutting process. If the suction plate is deformed such as deflection, it is difficult to cut the object to be cut with high precision, and it is difficult to obtain high-quality electronic components that are commercialized.
本說明書的目的在於公開一種具備即使受到應力也難以發生撓曲等變形的結構的吸附板、具備此種吸附板的切斷裝置、以及使用此種吸附板來進行切斷的切斷方法。The purpose of this specification is to disclose an adsorption plate provided with a structure that is difficult to deform such as bending even when subjected to stress, a cutting device provided with such an adsorption plate, and a cutting method for cutting using such an adsorption plate.
本說明書所公開的吸附板包括:底座部,具有框部及多個凸肋部,且以多個所述凸肋部彼此交叉的方式而配置成格子狀,所述框部配置在設有抽吸機構的切斷裝置的基台上,所述多個凸肋部設在所述框部的內側;以及載置部,以重合於所述多個凸肋部的方式而配置,且形成有從表面側貫穿至背面側的多個吸附孔,通過所述多個凸肋部,在所述框部的所述內側形成有使所述抽吸機構與所述多個吸附孔連通的多個進氣路徑,在所述載置部的所述背面以覆蓋所述多個進氣路徑的方式而配置的狀態下,載置於所述表面上的切斷對象物通過所述吸附孔中產生的負壓而被吸附在所述表面上,多個所述凸肋部彼此交叉的部分的一部分朝向所述基台所配置的一側突出。The suction plate disclosed in this specification includes a base portion having a frame portion and a plurality of ribs, and is arranged in a lattice shape such that the plurality of ribs intersect each other, and the frame portion is arranged where the pump is provided. On the base of the cutting device of the suction mechanism, the plurality of ribs are provided on the inner side of the frame; and the placement portion is arranged so as to overlap the plurality of ribs, and is formed with A plurality of suction holes penetrating from the front side to the back side, through the plurality of ribs, are formed on the inner side of the frame portion to connect the suction mechanism with the plurality of suction holes In the air intake path, in a state where the back surface of the mounting portion is arranged so as to cover the plurality of air intake paths, the object to be cut placed on the surface is generated through the suction hole The negative pressure is adsorbed on the surface, and a part of the portion where the plurality of ribs intersect each other protrudes toward the side where the base is arranged.
本說明書所公開的切斷裝置包括:基台,設有抽吸機構;以及本說明書所公開的所述吸附板,被配置在所述基台上。The cutting device disclosed in this specification includes: a base provided with a suction mechanism; and the suction plate disclosed in this specification is arranged on the base.
本說明書所公開的切斷方法包括下述步驟:使切斷對象物吸附在本說明書所公開的所述吸附板上;以及將所述切斷對象物在被吸附於所述吸附板上的狀態下予以切斷。The cutting method disclosed in this specification includes the following steps: adsorbing a cutting object on the suction plate disclosed in this specification; and holding the cutting object in a state of being adsorbed on the suction plate To be cut off.
本發明的所述及其他目的、特徵、方面及優點,當根據與附圖關聯地理解的跟本發明相關的接下來的詳細說明而明確。The above and other objects, features, aspects and advantages of the present invention will be clarified from the following detailed description of the present invention understood in conjunction with the accompanying drawings.
以下,一邊參照附圖,一邊說明實施方式。在以下的說明中,對於相同的零件及相當的零件標注相同的參照編號,且有時不再重複其說明。Hereinafter, the embodiments will be described with reference to the drawings. In the following description, the same reference numbers are assigned to the same parts and equivalent parts, and the descriptions may not be repeated in some cases.
[切斷裝置50(切斷方法)]
圖1是示意性地表示實施方式中的切斷裝置50的圖。切斷裝置50包括供給單元A、切斷單元B、檢查單元C及收容單元D。供給單元A具備閘盒(magazine),收容有多個已密封基板1。供給單元A具有供給機構30,作為切斷對象物的已密封基板1從供給機構30被搬送至切斷單元B。[Cutting device 50 (cutting method)]
FIG. 1 is a diagram schematically showing a
在切斷單元B設有切斷用平臺2。切斷用平臺2包括移動機構31、旋轉機構32及吸附板10。吸附板10在吸附保持有已密封基板1的基板面的狀態下,能夠通過移動機構31及旋轉機構32來移動及轉動。切斷單元B具有搬送部33與切斷部34。在搬送部33設有攝像機35,基於攝像機35的拍攝結果,在已密封基板1上呈格子狀地設定多條切斷線L(參照圖2)。吸附板10上的已密封基板1被移送至切斷部34。吸附板10上的已密封基板1在經切斷部34切斷後,經由第一清潔器(cleaner)36而返回切斷前的原本位置。另外,圖1的切斷用平臺2圖示了移送前的位置與移送後的切斷位置這兩者。吸附板10在切斷前的位置有圖示,但在切斷部34的切斷位置未圖示。The cutting unit B is provided with a
在切斷部34,設有安裝有旋轉刀片37的主軸(spindle)3。作為切斷對象物的已密封基板1的密封面被吸附在吸附板10上,在此狀態下,一邊使吸附板10與主軸相對地移動,一邊通過旋轉刀片37來切斷已密封基板1。通過切斷,已密封基板1被單片化為多個電子零件P,通過第一清潔器36,使用水來進行清洗,並使用空氣進行乾燥。多個電子零件P從吸附板10上被統一交接給卸載器(unloader)38,在被卸載器38吸附而提起的狀態下,通過第二清潔器39來對密封面進行清洗及乾燥。The
在檢查單元C,設有檢查攝像機40及檢查用載台41。多個電子零件P從卸載器38被統一交接給檢查用載台41,由檢查攝像機40來進行外觀檢查。多個電子零件P被篩分為良品與不良品,隨後,被統一移送至索引平臺(index table)42。多個電子零件P由移送機構43分別收容至收容單元D的良品用托盤45及不良品用托盤46,並被移送至收容部47。從托盤供給部48供給新的托盤來作為良品用托盤45及不良品用托盤46。In the inspection unit C, an
(切斷裝置50的基台21)
圖2是表示已密封基板1、吸附板10與切斷裝置50的基台21的立體圖。如上所述,吸附板10在此作為切斷用平臺發揮功能。切斷裝置50包含設有抽吸機構20的基台21與吸附板10來作為其構成元件。(
切斷裝置50的基台21包括:框狀支撐部21A,從下方側支撐吸附板10的框部16(參照圖3);以及多個凸狀支撐部22,設在框狀支撐部21A的內側。在框狀支撐部21A的內側形成有凹狀的抽吸空間23,多個凸狀支撐部22是以從基台21中的位於抽吸空間23下方的底面21B豎立的方式而設。抽吸空間23通過設在基台21的底面21B的開口部24而連接於抽吸機構20。The
[吸附板10]
圖3是表示從上表面側觀察吸附板10的分解狀態的樣子的立體圖,圖4是表示從底面側觀察吸附板10的分解狀態的樣子的立體圖。圖5是表示在切斷裝置50的基台21上配置有吸附板10的狀態的剖面圖。[Adsorption board 10]
3 is a perspective view showing how the disassembled state of the
如圖3~圖5所示,吸附板10包括:罩11;載置部12,在其表面上載置已密封基板1;以及底座部15,用於將吸附板10固定至切斷裝置50的基台21上。吸附板10被配置在設有抽吸機構20(圖2、圖5)的切斷裝置50的基台21上。As shown in FIGS. 3 to 5, the
(底座部15)
主要參照圖3,底座部15具有框部16與多個凸肋部17A、17B。框部16具有大致相同的厚度,且具有矩形狀。框部16的底面形狀對應於設在基台21的框狀支撐部21A(圖2)的形狀,框部16是由框狀支撐部21A予以支撐。(Base part 15)
Referring mainly to FIG. 3, the
多個凸肋部17A、17B被設在框部16的內側。多個凸肋部17A是以沿第一方向延伸且彼此平行的方式而配置,多個凸肋部17B是以沿與第一方向交叉的第二方向彼此平行的方式而配置。在框部16配置在框狀支撐部21A上的狀態下,多個凸肋部17A、17B接觸至凸狀支撐部22(圖2)的頂面22A,多個凸肋部17A、17B由凸狀支撐部22予以支撐。A plurality of
在框部16的內側,多個凸肋部17A與多個凸肋部17B交叉,即,多個凸肋部以彼此交叉的方式配置成格子狀,通過多個凸肋部17A、17B,在框部16的內側形成有多個進氣路徑18。多個凸肋部17A、17B的上端(載置部12所配置的一側的端部)以無階差(所謂的齊平)的方式而形成(參照圖3)。On the inner side of the
另一方面,如圖4所示,在多個凸肋部17A、17B的下端(基台21所處的一側的端部)側,多個凸肋部17A、17B交叉的部分的一部分朝向基台21所配置的一側突出。換言之,當將多個凸肋部17A、17B交叉的部分作為交叉部分時,多個中的一部分交叉部分相對於與此交叉部分鄰接的凸肋部17A、凸肋部17B而朝向基台21所配置的一側(此處為下方側)突出。On the other hand, as shown in FIG. 4, on the lower end (end of the side where the
本實施方式中,在多個凸肋部17A、17B交叉的部分,形成有後退部17C及突出部17D。多個凸肋部17A、17B交叉的部分(交叉部分)的若干個構成後退部17C,多個凸肋部17A、17B交叉的部分(交叉部分)的另外若干個構成突出部17D。後退部17C形成在與設有突出部17D的交叉部分鄰接的凸肋部17A、凸肋部17B。In the present embodiment, a
多個突出部17D中,各個突出部17D在突出方向上的端面17DS(圖5)與框部16的底面16S(圖5)齊平。多個後退部17C中,各個後退部17C的端面17CS(圖5)位於從框部16的底面16S朝向載置部12所配置的一側後退(偏移(offset))的位置。Among the plurality of
在底座部15的框部16設有環狀槽15G(圖3、圖5)。環狀槽15G包圍底座部15中的設有多個凸肋部17A、17B的區域。在環狀槽15G中,收容有作為後述的密封構件的一例的O型環11S(圖4、圖5)。作為密封構件的另一例,也可採用襯墊或墊片(gasket)。在使用襯墊或墊片的情況下,環狀槽15G為可適當省略的結構。The
包括具有如上所述的結構的框部16及多個凸肋部17A、17B的底座部15例如能夠由樹脂所形成。可較佳地利用射出成型法。底座部15也可為鋁或不銹鋼等金屬製。The
(罩11)
參照圖2~圖4,罩11具有框狀的形狀。罩11既可為樹脂製,也可為鋁或不銹鋼等金屬製。罩11具有與底座部15的框部16對應的形狀,在罩11的內側設有開口部11H。罩11是使用未圖示的緊固構件或黏合構件等而固定於底座部15。也可在罩11與底座部15之間設置嵌合結構,通過此嵌合結構來將罩11固定至底座部15。而且,也可通過超聲波熔接來將罩11固定至底座部15。(Hood 11)
2 to 4, the
(載置部12)
如圖3、圖4所示,載置部12整體上形成為薄板狀,具有表面12A、及位於表面12A的相反側的背面12B。載置部12的背面12B以重合於多個凸肋部17A、17B的上端的方式而配置。載置部12形成有從表面12A側貫穿至背面12B側的多個吸附孔12H。所述吸附孔吸附經單片化的各個電子零件。(Placement part 12)
As shown in FIGS. 3 and 4, the
本實施方式的載置部12包含橡膠部13及金屬製板狀部14以作為其構成元件。橡膠部13是載置部12的表面12A側的構成元件,金屬製板狀部14是載置部12的背面12B側的構成元件。金屬製板狀部14可包含鋁或不銹鋼等金屬製的薄板。The mounting
橡膠部13中的與金屬製板狀部14為相反側的表面構成「載置部12的表面12A」。橡膠部13的背面接合於金屬製板狀部14的表面。金屬製板狀部14的背面構成「載置部12的背面12B」。橡膠部13可通過黏合劑等而接合於金屬製板狀部14。The surface of the
金屬製板狀部14在平面方向上大於橡膠部13。在金屬製板狀部14與橡膠部13經接合的狀態下,產生從橡膠部13的外緣突出至外側的、金屬製板狀部14的周圍部分(圖3)。所述周圍部分由具有環狀形狀的罩11予以覆蓋(圖2)。罩11將載置部12的所述周圍部分固定至底座部15。The
在罩11與框部16之間,設有密封構件,所述密封構件包圍底座部15中的設有多個凸肋部17A、17B的區域。本實施方式中,在設於底座部15(框部16)的環狀槽15G內配置有O型環11S(圖4、圖5),O型環11S包圍底座部15中的設有多個凸肋部17A、17B的區域。O型環11S可被包夾在罩11與框部16之間(圖5)。在採用襯墊或墊片來作為密封構件的情況下,襯墊等也包圍底座部15中的設有多個凸肋部17A、17B的區域。襯墊等可被包夾在罩11與框部16之間。此時,環狀槽15G為可適當省略的結構。Between the
在橡膠部13形成有多個貫穿孔13H,在金屬製板狀部14也形成有多個貫穿孔14H。貫穿孔13H、貫穿孔14H以彼此大致一致的方式形成為同軸狀,在橡膠部13接合於金屬製板狀部14的狀態下,由貫穿孔13H、貫穿孔14H構成從表面12A側貫穿至背面12B側的吸附孔12H。即,本實施方式中,吸附孔12H是由貫穿孔13H與貫穿孔14H所形成(圖5)。A plurality of through
如圖5所示,載置部12的背面12B以覆蓋多個進氣路徑18的方式而配置。多個進氣路徑18連通於抽吸空間23,並且使設於基台21的抽吸機構20與多個吸附孔12H連通。在此狀態下,載置於載置部12的表面12A上的已密封基板1通過吸附孔12H中產生的負壓而被吸附在表面12A上。As shown in FIG. 5, the
(作用及效果)
參照圖5,在底座部15被配置在基台21上的狀態下,多個凸肋部17A、17B各自的突出部17D在突出方向上的端面17DS(圖5)接觸至凸狀支撐部22的頂面22A,由此,多個凸肋部17A、17B由凸狀支撐部22予以支撐。因此,在切斷加工時,即使吸附板10受到伴隨切斷的應力,也能有效地抑制吸附板10產生撓曲等變形的現象。另一方面,後退部17C的端面17CS離開凸狀支撐部22的頂面22A,空氣能夠通過後退部17C的端面17CS與凸狀支撐部22的頂面22A之間的間隙而流通。(Function and effect)
5, in the state in which the
假設多個凸肋部17A、17B全部以基台21側的端面與後退部17C的端面17CS在同一高度變得齊平的方式而形成。此時,儘管能通過多個凸肋部17A、17B與凸狀支撐部22的頂面22A之間的間隙而獲得空氣的流通,但與所述實施方式的情況相比,多個凸肋部17A、17B的高度低,多個凸肋部17A、17B其自身的剛性也低。It is assumed that all the plurality of
假設多個凸肋部17A、17B全部以基台21側的端面與突出部17D的端面17DS在同一高度齊平的方式而形成。此時,與所述實施方式的情況相比,儘管多個凸肋部17A、17B其自身的剛性變高,但難以在多個凸肋部17A、17B與凸狀支撐部22的頂面22A之間形成充分的間隙,從而難以獲得空氣的流通即充分的抽吸力。It is assumed that all of the plurality of
與所述兩個假設的結構相比,根據實施方式的吸附板10,若將多個凸肋部17A、17B交叉的部分設為交叉部分,則多個中的一部分交叉部分相對於與所述交叉部分鄰接的凸肋部17A、凸肋部17B而朝向基台21所配置的一側突出。通過採用此種結構,能夠獲得作為吸附板10整體的高剛性與對已密封基板1的高抽吸力。Compared with the two hypothetical structures, according to the
在底座部15由樹脂形成的情況下,通過射出成型,能夠以高生產性來容易地製作底座部15。也能夠實現作為吸附板10整體的輕量化,與底座部15為金屬的情況相比,吸附板10的生產性及處理性也提高,也能獲得成本優勢。在底座部15由樹脂所形成的情況下,更優選採用考慮到吸附板10的剛性的如上所述的結構。根據具備所述結構的吸附板10,每當製作吸附板10時,根據作為吸附對象物的電子零件的規格來設計載置部12,而對於底座部15,能夠使具有各種結構的載置部12共同地通用。When the
所述吸附板10中,使用將載置部12的周圍部分固定至底座部15的罩11。通過罩11,能夠將載置部12穩定地固定至底座部15,也能夠實現吸附板10的設計性的提高。In the
所述吸附板10中,O型環11S包圍底座部15中的設有多個凸肋部17A、17B的區域,且被包夾在罩11與框部16之間(圖5)。O型環11S的存在抑制空氣從罩11與底座部15之間的間隙泄漏而導致抽吸力下降。In the
如圖5所示,也可在底座部15的框部16與基台21的框狀支撐部21A之間實現與O型環11S同樣的結構。圖5所示的示例中,在框狀支撐部21A設有環狀槽25G,在環狀槽25G的內側配置有O型環25S。O型環25S包圍抽吸空間23,且被包夾在底座部15的框部16與基台21的框狀支撐部21A之間。O型環25S的存在抑制空氣從底座部15的框部16與基台21的框狀支撐部21A之間的間隙泄漏而導致抽吸力下降。As shown in FIG. 5, the same structure as the O-
(其他結構1)
參照圖2,吸附板10還包括貫穿載置部12及底座部15的導通構件19。圖2所示的示例中,形成有沿厚度方向貫穿載置部12及底座部15的貫穿孔12J,在貫穿孔12J中收容有導通構件19。導通構件19例如包含可沿軸方向彈性伸縮的球柱塞(ball plunger)。(Other structure 1)
2, the
導通構件19將載置於載置部12上的已密封基板1與基台21予以電連接。在底座部15由樹脂形成的情況下,載置部12上的已密封基板1容易帶電。根据導通構件19,能夠防止此種帶電。根據球柱塞,通過受到按壓而沿軸方向收縮,因此幾乎不會在已密封基板1與基台21之間產生不必要的應力,在切斷加工時,也幾乎不會使已密封基板1產生位置偏離。另外,作為球柱塞,僅在一端側配置有球的球柱塞、在兩端側分別配置有球的雙球柱塞皆可使用,但優選可在兩端側收縮的雙球柱塞。The
(其他結構2)
參照圖4、圖5,優選的是,在金屬製板狀部14的載置部12側的面(此處為載置部12的背面12B)形成有槽部14G。槽部14G使形成在金屬製板狀部14的多個中的相鄰的貫穿孔14H連通。槽部14G並非整體上貫穿金屬製板狀部14,而是包括貫穿孔14H在內,在貫穿孔14H的形成位置貫穿金屬製板狀部14,在未形成貫穿孔14H的位置並不貫穿金屬製板狀部14。(Other structure 2)
Referring to FIGS. 4 and 5, it is preferable that a
參照圖5,假設在未形成槽部14G的情況下,隨著吸附孔12H被凸肋部17A、凸肋部17B堵塞的面積變大,進氣路徑18更難與吸附孔12H連通。若形成有槽部14G,則即使吸附孔12H被凸肋部17A、凸肋部17B堵塞,進氣路徑18也能夠經由槽部14G而連通於吸附孔12H,從而能夠獲得抽吸力。5, assuming that the
另外,作為具有槽部14G的金屬製板狀部14,能夠使用將多個金屬製板狀構件接合而成的積層體。所述積層體例如能夠通過下述方式而製作,即:在一片金屬製板狀構件,通過蝕刻加工或衝壓加工而形成與槽部的形狀對應的貫穿孔,在另一片金屬製板狀構件,通過蝕刻加工或衝壓加工而形成與吸附孔12H的形狀對應的貫穿孔,將這些金屬製板狀構件予以重合,並使用導電性黏合劑等加以接合。若是此種積層體,則即便使用厚度相對較薄的金屬製薄板也能夠容易地製作。In addition, as the metal plate-shaped
(其他結構3)
參照圖3~圖5,也可在多個凸肋部17A、17B交叉的部分形成有貫穿孔17H。貫穿孔17H能夠使抽吸機構20與多個吸附孔12H連通,從而能夠獲得更大的抽吸力。通過將貫穿孔17H的結構與所述其他結構2中的槽部14G加以組合來實施,從而能夠獲得更大的抽吸力。(Other structure 3)
3 to 5, a through
(其他結構4)
所述吸附板10中,多個凸肋部17A、17B被設在框部16的內側。多個凸肋部17A以沿第一方向延伸且彼此平行的方式而配置,多個凸肋部17B以沿與第一方向交叉的第二方向彼此平行的方式而配置。由此,在框部16的內側形成具有大致四邊形狀的進氣路徑18。多個凸肋部只要以彼此交叉的方式形成為格子狀,則例如也可構成為,進氣路徑18在俯視時具有三角形或六邊形等多邊形狀,還可為圓形狀等。(Other structure 4)
In the
(其他結構5)
所述實施方式中,基於吸附板10被用作切斷單元B的切斷用平臺的示例進行了說明。與吸附板10具有相同結構的吸附板也可被用作切斷單元B中的卸載器38,還可被用作檢查單元C中的檢查用載台41及/或索引平臺42。(Other structure 5)
In the above-mentioned embodiment, the description is based on an example in which the
對實施方式進行了說明,但應認為,本次公開的實施方式在所有方面僅為例示而非限制者。本發明的範圍是由權利要求書所示,且意圖包含與權利要求書均等的含義及範圍內的所有變更。Although the embodiment has been described, it should be considered that the embodiment disclosed this time is merely illustrative in all points and not restrictive. The scope of the present invention is shown by the claims, and is intended to include the meanings equivalent to the claims and all changes within the scope.
1:已密封基板
2:切斷用平臺
3:主軸
10:吸附板
11:罩
11H、24:開口部
11S、25S:O型環
12:載置部
12A:表面
12B:背面
12H:吸附孔
12J、13H、14H、17H:貫穿孔
13:橡膠部
14:金屬製板狀部
14G:槽部
15:底座部
15G、25G:環狀槽
16:框部
16S、21B:底面
17A、17B:凸肋部
17C:後退部
17CS、17DS:端面
17D:突出部
18:進氣路徑
19:導通構件
20:抽吸機構
21:基台
21A:框狀支撐部
22:凸狀支撐部
22A:頂面
23:空間
30:供給機構
31:移動機構
32:旋轉機構
33:搬送部
34:切斷部
35:攝像機
36:第一清潔器
37:旋轉刀片
38:卸載器
39:第二清潔器
40:檢查攝像機
41:檢查用載台
42:索引平臺
43:移送機構
45:良品用托盤
46:不良品用托盤
47:收容部
48:托盤供給部
50:切斷裝置
A:供給單元
B:切斷單元
C:檢查單元
D:收容單元
L:切斷線
P:電子零件1: Sealed substrate
2: Cut off the platform
3: Spindle
10: Adsorption board
11:
圖1是示意性地表示實施方式中的切斷裝置50的圖。
圖2是表示已密封基板1、吸附板10與切斷裝置50的基台21的立體圖。
圖3是表示從上表面側觀察吸附板10的分解狀態的樣子的立體圖。
圖4是表示從底面側觀察吸附板10的分解狀態的樣子的立體圖。
圖5是表示在切斷裝置50的基台21上配置有吸附板10的狀態的剖面圖。FIG. 1 is a diagram schematically showing a
1:已密封基板 1: Sealed substrate
11:罩 11: Hood
11S、25S:O型環 11S, 25S: O-ring
11H:開口部 11H: Opening
12:載置部 12: Placement Department
12A:表面 12A: Surface
12B:背面 12B: Back
12H:吸附孔 12H: adsorption hole
13H、14H、17H:貫穿孔 13H, 14H, 17H: through hole
13:橡膠部 13: Rubber Department
14:金屬製板狀部 14: Metal plate part
14G:槽部 14G: Groove
15:底座部 15: Base
15G、25G:環狀槽 15G, 25G: ring groove
16:框部 16: Frame
16S、21B:底面 16S, 21B: bottom surface
17C:後退部 17C: Retreat
17CS、17DS:端面 17CS, 17DS: end face
17D:突出部 17D: protrusion
18:進氣路徑 18: intake path
20:抽吸機構 20: Suction mechanism
21:基台 21: Abutment
21A:框狀支撐部 21A: Frame-shaped support
22:凸狀支撐部 22: Convex support
22A:頂面 22A: Top surface
23:空間 23: space
50:切斷裝置 50: cutting device
Claims (10)
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JP2019-097980 | 2019-05-24 |
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TW202042971A (en) | 2020-12-01 |
KR102327814B1 (en) | 2021-11-17 |
CN111975114B (en) | 2023-05-05 |
KR20200135182A (en) | 2020-12-02 |
JP6746756B1 (en) | 2020-08-26 |
CN111975114A (en) | 2020-11-24 |
JP2020194823A (en) | 2020-12-03 |
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