TWI724316B - Flat panel display manufacturing device - Google Patents

Flat panel display manufacturing device Download PDF

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TWI724316B
TWI724316B TW107125709A TW107125709A TWI724316B TW I724316 B TWI724316 B TW I724316B TW 107125709 A TW107125709 A TW 107125709A TW 107125709 A TW107125709 A TW 107125709A TW I724316 B TWI724316 B TW I724316B
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plasma
chamber
glass substrate
conveying path
static elimination
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TW201925862A (en
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高橋元喜
永尾友一
立道潤一
井内裕
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日商日新離子機器股份有限公司
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    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1303Apparatus specially adapted to the manufacture of LCDs
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating

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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
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Abstract

This invention provides a flat panel display manufacturing device having an electricity removing device suitable for removing electricity of a glass substrate under high vacuum.
A flat panel display manufacturing device ID of this invention includes: a processing chamber 1 in which a processing is applied to a glass substrate S; and a carrying path 3 forming a carrying in/out passage for carrying the glass substrate S into or out from the processing chamber 1. Wherein, the processing chamber 1 and the carrying path 3 are under vacuum atmosphere, and an outer wall face of a vacuum vessel for forming the carrying path 3 to which an electricity removing device O is provided for releasing electron toward inner side of the vacuum vessel for removing electricity of the glass substrate S.

Description

平面面板顯示器製造裝置 Flat panel display manufacturing device

本發明係關於一種於在真空下對玻璃基板實施預定的處理的平面面板顯示器製造裝置中,具備將玻璃基板所帶電的電荷進行除電的除電功能的裝置。 The present invention relates to a flat panel display manufacturing apparatus that performs a predetermined process on a glass substrate under vacuum, and is provided with a static elimination function that eliminates charges charged on the glass substrate.

液晶顯示器或電漿顯示器、有機EL顯示器等平面面板顯示器的製程係在真空下實施。 The manufacturing process of flat panel displays such as liquid crystal displays, plasma displays, and organic EL displays are implemented under vacuum.

以製程的具體例而言,可舉例用以導入雜質的離子注入步驟或用以將電路圖案予以圖案化(patterning)的曝光步驟、用以使薄膜成膜的成膜步驟等。 As a specific example of the process, an ion implantation step for introducing impurities, an exposure step for patterning a circuit pattern, a film formation step for forming a thin film, and the like can be exemplified.

在各步驟的實施時,係進行使用搬送機器人等之對於處理室搬入搬出玻璃基板,使用基板支持機構進行玻璃基板在處理位置的定位。 In the implementation of each step, the glass substrate is carried in and out of the processing chamber using a transport robot or the like, and the glass substrate is positioned at the processing position using a substrate support mechanism.

在進行玻璃基板的搬送或定位之際,會因為在物體間的摩擦、剝離而使得玻璃基板中帶有電荷。若將帶有的電荷放置不管,就會發生玻璃基板的附著、靜電放電。此外,還會有因為被帶電的玻璃基板所吸引的微粒(particle)而造成基板處理不良之虞。 When the glass substrate is transported or positioned, the glass substrate will be charged due to friction and peeling between objects. If the charge is left alone, adhesion of the glass substrate and electrostatic discharge will occur. In addition, there is a risk of poor substrate processing due to particles attracted by the charged glass substrate.

因此,以往會利用電漿將玻璃基板的電荷進行除電。 Therefore, in the past, plasma was used to neutralize the charge on the glass substrate.

具體而言,有一種在專利文獻1及專利文獻2所述的使用離化器(ionizer)的除電方法。在該除電方法中,係對真空排氣後的室內充填氮或氬等惰性氣體。然後,藉由對該氣體照射紫外線或在惰性氣體的環境內將電漿點亮等,將惰性氣體電離而使其電漿化。最後,使玻璃基板暴露於所產生的惰性氣體的電漿中,藉此進行玻璃基板所帶電的電荷的除電。 Specifically, there is a neutralization method using an ionizer described in Patent Document 1 and Patent Document 2. In this neutralization method, an inert gas such as nitrogen or argon is filled in the vacuum-exhausted chamber. Then, by irradiating the gas with ultraviolet rays or igniting the plasma in an inert gas environment, the inert gas is ionized to make it plasma. Finally, the glass substrate is exposed to the generated plasma of the inert gas, thereby performing the neutralization of the electric charges charged by the glass substrate.

(先前技術文獻) (Prior technical literature) (專利文獻) (Patent Document)

專利文獻1:日本特開2004-241420 Patent Document 1: JP 2004-241420

專利文獻2:日本特開平9-324260 Patent Document 2: Japanese Patent Application Publication No. 9-324260

在專利文獻1及專利文獻2所述的手法中,必須在除電之際先將惰性氣體充填於室內,故不適合在高真空下使用。 In the methods described in Patent Document 1 and Patent Document 2, it is necessary to fill the room with an inert gas before removing electricity, so it is not suitable for use under high vacuum.

本發明中,係提供一種平面面板顯示器製造裝置,其具有適合於在高真空下進行玻璃基板的除電的除電裝置。 In the present invention, there is provided a flat panel display manufacturing apparatus, which has a static elimination device suitable for performing static elimination of a glass substrate under a high vacuum.

一種平面面板顯示器製造裝置,具有:處理室,對於玻璃基板施行加工處理;及搬送路,形成玻璃基板往前述處理室搬入搬出的搬入 搬出路徑;其中前述處理室與前述搬送路處於真空環境下;且在構成前述搬送路的真空容器的外壁面連接有除電裝置,該除電裝置用以朝向前述真空容器的內側放出用於進行前述玻璃基板的除電的電子。 A manufacturing device for a flat panel display, comprising: a processing chamber for performing processing on a glass substrate; and a conveying path to form a glass substrate for carrying in and out of the aforementioned processing chamber The carrying-out path; wherein the processing chamber and the conveying path are in a vacuum environment; and a static elimination device is connected to the outer wall surface of the vacuum container constituting the conveying path, and the static elimination device is used to discharge the glass toward the inside of the vacuum container Eliminating electrons on the substrate.

若使帶有負電的玻璃基板也成為除電對象,則較佳為:前述除電裝置具有藉由將被導入的氣體進行電離而於室內產生電漿的電漿室,並從該電漿室內放出用以進行前述玻璃基板的除電的電漿。 If the negatively charged glass substrate is also used as a neutralization object, it is preferable that the neutralization device has a plasma chamber that generates plasma in the chamber by ionizing the introduced gas, and discharges it from the plasma chamber. Use the plasma to perform the neutralization of the aforementioned glass substrate.

為了改善被導入於電漿室內的氣體的利用效率,則較佳為:前述除電裝置具有用以將電漿從前述電漿室往前述搬送路輸送的電漿輸送路,並且,在與電漿的輸送方向垂直的切斷面中,前述電漿輸送路的切斷面比前述電漿室的切斷面小。 In order to improve the utilization efficiency of the gas introduced into the plasma chamber, it is preferable that the neutralization device has a plasma transport path for transporting the plasma from the plasma chamber to the transport path, and is in contact with the plasma Among the cut surfaces perpendicular to the conveyance direction, the cut surface of the plasma conveying path is smaller than the cut surface of the plasma chamber.

為了容易將在電漿室內產生的電漿導入至搬送路側,則較佳為:在前述電漿輸送路形成有沿著電漿的輸送方向而成的磁場。 In order to easily introduce the plasma generated in the plasma chamber to the conveyance path side, it is preferable that a magnetic field along the conveyance direction of the plasma be formed in the plasma conveyance path.

為了避免電漿在電漿輸送路的內壁面消失,則較佳為:在前述電漿輸送路的外周設有用以於輸送路內產生會切磁場的永久磁鐵。 In order to prevent the plasma from disappearing on the inner wall surface of the plasma conveying path, it is preferable that a permanent magnet for generating a cutting magnetic field in the conveying path is provided on the outer periphery of the plasma conveying path.

為了在平面面板顯示器製造裝置的除電裝置中,一面將搬送路側保持為真空一面進行除電裝置的維護,則較佳為:在前述電漿輸送路設有用以打開、關閉輸送路的閥。 In order to maintain the static elimination device in the static elimination device of the flat panel display manufacturing apparatus while maintaining the conveying path side in a vacuum, it is preferable that the plasma conveying path is provided with a valve for opening and closing the conveying path.

為了對於玻璃基板的兩面有效率地供給電漿,則較佳為:於前述搬送路中,從前述玻璃基板的側方經由前述電漿輸送路進行電漿對於前述玻璃基板的供給。 In order to efficiently supply plasma to both surfaces of the glass substrate, it is preferable to supply the plasma to the glass substrate from the side of the glass substrate via the plasma transportation path in the transportation path.

由於在構成搬送路的真空容器的外壁面連接有除電裝置,並基於從除電裝置供給的電子進行玻璃基板的除電,所以不須將氣體充填於搬送路內。由此,可將搬送路內保持為高真空。 Since a static elimination device is connected to the outer wall surface of the vacuum container that constitutes the transfer path, and the glass substrate is neutralized based on the electrons supplied from the static elimination device, there is no need to fill the transfer path with gas. As a result, the inside of the conveying path can be maintained in a high vacuum.

1‧‧‧處理室 1‧‧‧Processing room

2‧‧‧真空預備室 2‧‧‧Vacuum Preparation Room

3‧‧‧中間室 3‧‧‧Intermediate Room

4‧‧‧基板收納室 4‧‧‧Substrate storage room

5‧‧‧電位計 5‧‧‧Potentiometer

6‧‧‧基板支持機構 6‧‧‧Substrate support mechanism

11‧‧‧絕緣板 11‧‧‧Insulation board

12‧‧‧電漿輸送路 12‧‧‧Plasma Transmission Road

13‧‧‧電漿室 13‧‧‧Plasma Chamber

14‧‧‧永久磁鐵 14‧‧‧Permanent Magnet

15‧‧‧線圈 15‧‧‧Coil

16‧‧‧燈絲 16‧‧‧Filament

B‧‧‧磁場 B‧‧‧Magnetic field

G‧‧‧氣體埠口 G‧‧‧Gas port

ID‧‧‧離子摻雜裝置(平面面板顯示器製造裝置) ID‧‧‧Ion doping device (flat panel display manufacturing device)

O‧‧‧除電裝置 O‧‧‧Static elimination device

P‧‧‧電漿 P‧‧‧Plasma

R1‧‧‧真空機器人 R1‧‧‧Vacuum Robot

R2‧‧‧大氣機器人 R2‧‧‧Atmospheric Robot

S‧‧‧玻璃基板 S‧‧‧Glass substrate

X1、X2‧‧‧虛線(搬送路徑) X1, X2‧‧‧Dotted line (transport path)

V‧‧‧閥 V‧‧‧valve

Va‧‧‧電弧電源 Va‧‧‧Arc power supply

Ve‧‧‧引出電源 Ve‧‧‧Extract power

Vf‧‧‧燈絲電源 Vf‧‧‧Filament power supply

第1圖為顯示平面面板顯示器製造裝置一例的示意俯視圖。 Fig. 1 is a schematic plan view showing an example of a flat panel display manufacturing apparatus.

第2圖為顯示除電裝置一例的示意俯視圖。 Fig. 2 is a schematic plan view showing an example of a static elimination device.

第3圖為與對於玻璃基板的電漿照射方向的說明圖。 Fig. 3 is an explanatory view of the plasma irradiation direction to the glass substrate.

第1圖為離子摻雜(ion doping)裝置ID的示意俯視圖。離子摻雜裝置ID作為平面面板顯示器製造裝置使用於TFT元件的製造中。第1圖中,將與屬於本發明特徵部分的除電裝置O的配置無關係之比處理室1更上游 側處(與離子射束的輸送相關的部位)的圖示省略。 Figure 1 is a schematic top view of the ion doping device ID. The ion doping device ID is used in the manufacture of TFT elements as a flat panel display manufacturing device. In Figure 1, regardless of the arrangement of the static elimination device O, which is a characteristic part of the present invention, it is more upstream than the processing chamber 1 Illustration of the side (a part related to the transport of the ion beam) is omitted.

玻璃基板S收納於大氣側的基板收納室4。進行基板處理之際,玻璃基板S在由虛線X1所示的箭號的搬送路徑中被搬送。 The glass substrate S is stored in the substrate storage chamber 4 on the atmosphere side. When substrate processing is performed, the glass substrate S is transported in the transport path indicated by the arrow indicated by the broken line X1.

具體而言,玻璃基板S藉由大氣機器人R2而從基板收納室4被搬送到真空預備室2。然後,玻璃基板S藉由中間室3的真空機器人R1而從真空預備室2往處理室1的基板支持機構6搬送。 Specifically, the glass substrate S is transferred from the substrate storage chamber 4 to the vacuum preparation chamber 2 by the atmospheric robot R2. Then, the glass substrate S is transferred from the vacuum preparation chamber 2 to the substrate support mechanism 6 of the processing chamber 1 by the vacuum robot R1 of the intermediate chamber 3.

在基板處理之後,玻璃基板S會以由虛線X2所示的箭號的搬送路徑被搬送到收納室4。 After the substrate processing, the glass substrate S is transported to the storage chamber 4 in a transport path indicated by an arrow indicated by a broken line X2.

在利用真空機器人R1及大氣機器人R2進行玻璃基板S的搬送、玻璃基板S對於基板支持機構6的載放或玻璃基板S從基板支持機構6的卸除時,會使玻璃基板S帶有因摩擦或剝離所產生的電荷,且電荷會累積。 When the glass substrate S is transported by the vacuum robot R1 and the atmospheric robot R2, the glass substrate S is placed on the substrate support mechanism 6, or the glass substrate S is removed from the substrate support mechanism 6, the glass substrate S will be affected by friction. Or peel off the generated charge, and the charge will accumulate.

本發明中使用與構成中間室3的真空容器的外壁面連接的除電裝置O將玻璃基板S所帶有的電荷進行除電。 In the present invention, the static elimination device O connected to the outer wall surface of the vacuum container constituting the intermediate chamber 3 is used to neutralize the electric charge carried by the glass substrate S.

在習知技術中,會於除電前將惰性氣體充填於用以進行玻璃基板的除電的室內,然後將充填於室內的惰性氣體電漿化,並使用該電漿將玻璃基板進行除電。 In the conventional technology, an inert gas is filled in a room for removing the electricity of the glass substrate before the electricity is removed, and then the inert gas filled in the room is plasma-formed, and the glass substrate is removed using the plasma.

相對於此,在本發明的除電裝置O中,會基於從除電裝置O所供給的電漿進行玻璃基板S的除電,故不須先將惰性氣體充填於中間室3內。由此,本發明的除電裝置可供在高真空下(例如,大約10-4Pa)的使用。 In contrast, in the neutralization device O of the present invention, the glass substrate S is neutralized based on the plasma supplied from the neutralization device O, so it is not necessary to fill the intermediate chamber 3 with an inert gas first. Thus, the static elimination device of the present invention can be used under high vacuum (for example, about 10 -4 Pa).

從除電裝置O供給電漿的時序(timing),亦 可設為藉由安裝於中間室3頂部的電位計5量測玻璃基板的電位,並在量測結果超過基準值時進行。但是,此種量測並非必須,亦可構成為恆常供給電漿。 The timing of supplying plasma from the static elimination device O is also It can be set to measure the potential of the glass substrate by the potentiometer 5 installed on the top of the intermediate chamber 3, and it can be performed when the measurement result exceeds the reference value. However, such measurement is not necessary, and it may be configured to constantly supply plasma.

此外,電位計5所安裝的位置也可以安裝在中間室3的底部或真空機器人R1的機械臂。另外,還可考慮安裝於中間室3以外的腔室或安裝複数個電位計5等各式各樣的構成。 In addition, the position where the potentiometer 5 is installed can also be installed at the bottom of the intermediate chamber 3 or the robot arm of the vacuum robot R1. In addition, various configurations such as installation in a chamber other than the intermediate chamber 3 or installation of a plurality of potentiometers 5 can also be considered.

第1圖中,描繪出將除電裝置O連接於中間室3的構成,但除電裝置O的連接目的地不限於中間室3。例如,除電裝置O也可以連接於可切換為大氣與真空環境的真空預備室2,只要是可在真空下進行玻璃基板的搬送的場所(作為形成玻璃基板的搬入搬出路徑的搬送路利用的場所),可以是任何場所。 In FIG. 1, a configuration in which the static elimination device O is connected to the intermediate chamber 3 is depicted, but the connection destination of the static elimination device O is not limited to the intermediate chamber 3. For example, the static elimination device O can also be connected to the vacuum preparation chamber 2 that can be switched to the atmosphere and vacuum environment, as long as it is a place where the glass substrate can be transported under vacuum (a place used as a transport path for forming a transport path for the glass substrate ), can be any place.

此外,從除電裝置O供給電漿的場所和藉由電位計5量測玻璃基板S的電位的場所不須一致。若是要根據在電位計5的量測結果進行電漿的供給,只要在玻璃基板S被搬送的路線中,將利用電位計5進行電位量測的場所設為與從除電裝置O供給電漿的場所相同的場所或是設為比該場所更為前段,即可對應量測結果而適當地供給電漿。 In addition, the place where the plasma is supplied from the static elimination device O and the place where the potential of the glass substrate S is measured by the potentiometer 5 need not be the same. If the plasma is to be supplied based on the measurement result of the potentiometer 5, as long as the path where the glass substrate S is transported, the place where the potentiometer 5 is used for the potential measurement is set to be the same as the place where the plasma is supplied from the neutralizer O If the location is the same or set to be more advanced than the location, the plasma can be appropriately supplied according to the measurement result.

第2圖中,描繪出除電裝置O的構成例。 In Fig. 2, a configuration example of the static elimination device O is depicted.

除電裝置O經由絕緣板11安裝於構成中間室3的真空容器的外壁面。此除電裝置O的主要部分由電漿室13與電漿輸送路12所構成,該電漿室13用以產生包含電子 與離子的電漿P,該電漿輸送路12將在電漿室13所產生的電漿P朝中間室3側放出。 The static elimination device O is mounted on the outer wall surface of the vacuum container constituting the intermediate chamber 3 via the insulating plate 11. The main part of the neutralization device O is composed of a plasma chamber 13 and a plasma transport path 12, and the plasma chamber 13 is used to generate With the plasma P of the ions, the plasma transport path 12 discharges the plasma P generated in the plasma chamber 13 toward the intermediate chamber 3 side.

在電漿室13,藉由從燈絲16放出的熱電子將經由氣體埠口G導入於室內的氙或氬等惰性氣體進行電離,藉此產生電漿P。 In the plasma chamber 13, an inert gas such as xenon or argon introduced into the chamber through the gas port G is ionized by thermionic electrons emitted from the filament 16, thereby generating a plasma P.

為使在電漿室內的電漿產生及電漿P從除電裝置的放出容易進行,除電裝置O具備圖中所示的燈絲電源Vf、電弧電源Va(施加電壓為數十伏特)、引出電源Ve(施加電壓為數十伏特)。 In order to facilitate the generation of plasma in the plasma chamber and the discharge of plasma P from the neutralization device, the neutralization device O is equipped with the filament power supply Vf, the arc power supply Va (applied voltage is tens of volts), and the extraction power supply Ve as shown in the figure. (The applied voltage is tens of volts).

在電漿室13的周圍配置有永久磁鐵14,該永久磁鐵14用來產生用以防止電子及離子在電漿室13的內壁面消失的會切(cusp)磁場。 A permanent magnet 14 is arranged around the plasma chamber 13, and the permanent magnet 14 is used to generate a cusp magnetic field for preventing electrons and ions from disappearing on the inner wall surface of the plasma chamber 13.

在電漿輸送路12的外周捲繞有用來產生沿著輸送路的磁場B的一對線圈(coil)15。為了避免被磁場B捕捉而與輸送路壁面碰撞導致消失,電漿輸送路12的電漿P放出到中間室3內。 A pair of coils 15 are wound around the outer circumference of the plasma transport path 12 to generate a magnetic field B along the transport path. In order to avoid being caught by the magnetic field B and colliding with the wall surface of the conveying path and disappearing, the plasma P of the plasma conveying path 12 is discharged into the intermediate chamber 3.

線圈15的構成不限於一對,例如,在電漿輸送路12較短時,線圈15的數量可以為1個也可以省略。此外,在電漿輸送路12較長時,也可以將線圈的數量增加到3個以上。另外,也可以不在一對線圈15間設置間隙而成為連續的較長的線圈。另一方面,為了避免電漿在電漿輸送路12的壁面消失,也可以取代線圈15而在電漿輸送路12的外周配置用以於電漿輸送路12的內壁面附近產生會切磁場的永久磁鐵。 The configuration of the coil 15 is not limited to a pair. For example, when the plasma transport path 12 is short, the number of the coil 15 may be one or omitted. In addition, when the plasma transport path 12 is long, the number of coils may be increased to three or more. In addition, it is not necessary to provide a gap between the pair of coils 15 and to be a continuous long coil. On the other hand, in order to prevent the plasma from disappearing on the wall surface of the plasma transfer path 12, instead of the coil 15, the outer circumference of the plasma transfer path 12 can be arranged to generate a scission magnetic field near the inner wall surface of the plasma transfer path 12. permanent magnet.

在與電漿的輸送方向垂直的平面中,若將切斷電漿輸送路12與電漿室13時的切斷面進行比較,電漿輸送路12的切斷面比電漿室13的切斷面小。根據此關係,可使已導入於電漿室13的惰性氣體往電漿輸送路12側的洩漏得以緩和。藉此,會提升與在電漿室13內的電漿產生相關的氣體的利用效率。另外,在此所謂的切斷面,不僅指電漿室13、電漿輸送路12的壁面,也指包含各腔室的內部空間的面。 In a plane perpendicular to the direction of plasma transport, if the cut surface when the plasma transport path 12 is cut from the plasma chamber 13 is compared, the cut surface of the plasma transport path 12 is greater than that of the plasma chamber 13. The section is small. According to this relationship, the leakage of the inert gas introduced into the plasma chamber 13 to the plasma transport path 12 side can be alleviated. Thereby, the gas utilization efficiency related to the plasma generation in the plasma chamber 13 will be improved. In addition, the cut surface here refers to not only the wall surfaces of the plasma chamber 13 and the plasma transport path 12 but also the surface including the internal space of each chamber.

關於上述的切斷面,雖會有電漿輸送路12與電漿室13的切斷面在電漿的輸送方向固定的情況,但也有並非如此的情況。例如,在電漿輸送路12由直徑會沿著電漿的輸送方向變化的圓筒狀真空容器構成時,上述的切斷面並非固定。這可說在電漿室13方面也是一樣的。 Regarding the above-mentioned cut surface, although the cut surface of the plasma conveying path 12 and the plasma chamber 13 may be fixed in the conveying direction of the plasma, it may not be the case. For example, when the plasma transport path 12 is composed of a cylindrical vacuum vessel whose diameter changes along the transport direction of the plasma, the above-mentioned cut surface is not fixed. This can be said to be the same in the plasma chamber 13 as well.

在電漿的輸送方向中有一方或兩個構件的直徑有變化時,上述切斷面的比較會在各構件中的切斷面為最小處進行。 When there is a change in the diameter of one or two members in the conveying direction of the plasma, the comparison of the cut surfaces described above will be performed where the cut surface of each member is the smallest.

在電漿輸送路12設有用以進行輸送路的打開/關閉的閥V。藉由設置該閥V,可在將中間室3側維持為真空狀態的狀態下使電漿室13側成為大氣開放,以維護除電裝置O。 The plasma transfer path 12 is provided with a valve V for opening/closing the transfer path. By providing this valve V, the side of the plasma chamber 13 can be opened to the atmosphere while maintaining the side of the intermediate chamber 3 in a vacuum state, and the static elimination device O can be maintained.

電漿輸送路12的放出電漿P的一側的端部可以如圖示般位在中間室3的真空容器壁面,但若是在接近玻璃基板S的位置放出電漿P會使除電效率提升,也可以向中間室3內突出。 The end of the plasma transport path 12 on the side where the plasma P is discharged may be positioned on the wall surface of the vacuum container of the intermediate chamber 3 as shown in the figure, but if the plasma P is discharged near the glass substrate S, the static elimination efficiency will be improved. It may also protrude into the intermediate chamber 3.

另外,並非必須設置上述的電漿輸送路12,也可以將其省略而將電漿室13直接連接於中間室3。 In addition, it is not necessary to provide the plasma transport path 12 described above, and it may be omitted and the plasma chamber 13 may be directly connected to the intermediate chamber 3.

通常,玻璃基板S雖有容易帶正電的性質,但也會有帶負電的情況。此外,也有可能在玻璃基板S的表背兩面帶有不同的電位。帶電成哪個電位會與在平面面板顯示器製造裝置所進行的玻璃基板S的處理內容有關。 Generally, although the glass substrate S has a property of being easily positively charged, it may be negatively charged. In addition, it is also possible that the front and back surfaces of the glass substrate S have different potentials. Which potential is charged depends on the processing content of the glass substrate S performed in the flat panel display manufacturing apparatus.

例如,在對於玻璃基板S進行成膜處理時,若是膜的性質容易帶負電,則藉由電位計5量測的玻璃基板S的電位就會設為負電位進行量測。 For example, when the glass substrate S is formed into a film, if the nature of the film tends to be negatively charged, the potential of the glass substrate S measured by the potentiometer 5 is set to a negative potential and measured.

第3圖中,描繪出對於玻璃基板S從各個方向照射電漿P的例子。 In FIG. 3, an example in which the plasma P is irradiated to the glass substrate S from various directions is depicted.

第3圖(A)中,從玻璃基板S的側方照射電漿P。若為此構成,電漿P會環繞到玻璃基板S上表面與下表面兩面,所以可一舉將兩面進行除電。 In FIG. 3(A), the plasma P is irradiated from the side of the glass substrate S. As shown in FIG. With this configuration, the plasma P will surround the upper and lower surfaces of the glass substrate S, so both surfaces can be neutralized in one fell swoop.

在玻璃基板S的尺寸較大時,由於第3圖(A)的構成為僅從玻璃基板S的一側照射電漿P的構成,所以會有在與電漿P的照射側相反側的除電無法充分進行的疑慮。 When the size of the glass substrate S is large, since the configuration in Fig. 3(A) is a configuration in which the plasma P is irradiated from only one side of the glass substrate S, there will be static elimination on the side opposite to the irradiated side of the plasma P Doubts that cannot be fully carried out.

從這一點來看,也可以如第3圖(B)般,設為從玻璃基板S的兩側照射電漿P。 From this point of view, it is also possible to irradiate the plasma P from both sides of the glass substrate S as shown in FIG. 3(B).

此外,也可以如第3圖(C)般,設為對於玻璃基板S的上下表面照射電漿P。此時,與第3圖(A)及第3圖(B)的構成相比,由於無法期待照射於玻璃基板S上表面的電漿P環繞到下表面側,所以較佳為也從玻璃基板S 的下表面側照射電漿P。 In addition, as shown in FIG. 3(C), the upper and lower surfaces of the glass substrate S may be irradiated with the plasma P. At this time, compared with the configuration of Fig. 3 (A) and Fig. 3 (B), since the plasma P irradiated on the upper surface of the glass substrate S cannot be expected to wrap around to the lower surface side, it is preferable to also start from the glass substrate. S Plasma P is irradiated on the lower surface side of the battery.

但是,若作為除電對象的面僅需玻璃基板S的任一面即可,則只要從與作為除電對象的面相對向的位置照射電漿P即可。 However, as long as any surface of the glass substrate S is only required for the surface as the neutralization target, it is only necessary to irradiate the plasma P from a position facing the surface as the neutralization target.

另一方面,若要確實地解決靜電放電等問題,較理想是將玻璃基板S的兩面進行除電。 On the other hand, in order to reliably solve problems such as electrostatic discharge, it is preferable to neutralize both surfaces of the glass substrate S.

在玻璃基板S除電後,會有因為電漿中具有正電荷的離子和/或具有負電荷的電子使得玻璃基板S帶電之虞。 After the glass substrate S is de-charged, there is a possibility that the glass substrate S may be charged due to positively charged ions and/or negatively charged electrons in the plasma.

但是,由於第2圖的構成例所示的引出電壓Ve的電位為數十伏特,所以即使玻璃基板S因為電漿中的離子和/或電子而帶電,玻璃基板S的電位頂多成為數十伏特。該帶電電壓從因剝離帶電造成玻璃基板S的電位高達數千伏特一事觀之實為微小,因此引起靜電放電問題的可能性低,不會對玻璃基板處理的良率造成影響。 However, since the potential of the extraction voltage Ve shown in the configuration example of Fig. 2 is several tens of volts, even if the glass substrate S is charged by ions and/or electrons in the plasma, the potential of the glass substrate S is at most several tens of volts. volt. This charging voltage is considered to be very small from the fact that the potential of the glass substrate S is as high as several thousand volts due to peeling and charging, and therefore the possibility of causing electrostatic discharge problems is low, and does not affect the yield of the glass substrate processing.

第1圖中,舉離子摻雜裝置為例作為平面面板顯示器製造裝置。然而,本發明作為對象的平面面板顯示器製造裝置並不限於此。 In Figure 1, an ion doping device is taken as an example of a flat panel display manufacturing device. However, the flat panel display manufacturing apparatus targeted by the present invention is not limited to this.

例如,也可為如成膜裝置的多室(multi-chamber)式的裝置。此外,也可為將各個裝置串聯結合而成的直線(in-line)式的裝置。 For example, it may be a multi-chamber type device such as a film forming device. In addition, it may be an in-line type device in which each device is connected in series.

本發明的構成中,只要為將除電裝置O連接於用以形成在真空下的玻璃基板S的搬送路的真空容器的外壁面的構成,都可應用到任何平面面板顯示器製造裝置中。 The structure of the present invention can be applied to any flat panel display manufacturing apparatus as long as it connects the static elimination device O to the outer wall surface of the vacuum container for forming the conveyance path of the glass substrate S under vacuum.

上記實施形態中,是針對從除電裝置O放出電漿P的構成進行說明,但也可設為僅放出電子來取代電漿P的構成。例如,使在第2圖的構成中經由氣體埠口G進行的惰性氣體的供給停止,藉此也可不產生電漿而僅將電子從除電裝置O放出到中間室3內。在僅供給電子時,不須在電漿室13設置氣體埠口G。 In the above embodiment, the configuration in which the plasma P is discharged from the static elimination device O is described, but a configuration in which only electrons are discharged instead of the plasma P may be adopted. For example, by stopping the supply of the inert gas through the gas port G in the configuration of FIG. 2, it is also possible to discharge only electrons from the static elimination device O into the intermediate chamber 3 without generating plasma. When it is only for supplying electrons, it is not necessary to provide a gas port G in the plasma chamber 13.

關於要僅供給電子還是供給電漿,例如也可基於在電位計5的量測結果來適當選擇。 Regarding whether to supply only electrons or plasma, for example, it may be appropriately selected based on the measurement result of the potentiometer 5.

上記實施形態中,雖使用電子衝撃作為電漿產生的手法,但也可藉由高頻放電產生電漿。 In the above embodiment, although electron impact is used as the method of plasma generation, it is also possible to generate plasma by high-frequency discharge.

此外,以放出熱電子的構成而言,也可採用由板狀的陰極與燈絲組合而成的間熱式陰極或中空陰極(hollow cathode),以取代燈絲。 In addition, in terms of the structure that emits thermionic electrons, an indirect cathode or a hollow cathode formed by a combination of a plate-shaped cathode and a filament can also be used instead of the filament.

第3圖(B)、第3圖(C)中,是在玻璃基板S的上下左右將複數個除電裝置配置於不同場所的構成,但也可將複數個除電裝置O配置於玻璃基板S的上下左右的相同側。 In Fig. 3 (B) and Fig. 3 (C), a plurality of static elimination devices are arranged in different places on the top, bottom, left and right of the glass substrate S, but a plurality of static elimination devices O may also be arranged on the glass substrate S The same side up, down, left, and right.

例如,於第3圖(A)的構成中,除電裝置O也可朝紙面上下方向或紙面前後方向排列。此外,也可將複數個除電裝置作為1個單元處理。 For example, in the configuration of Fig. 3(A), the static elimination devices O may be arranged in the up-and-down direction on the paper or in the back-and-forth direction on the paper. In addition, a plurality of static elimination devices may be treated as one unit.

此外,除了先前所述外,當然可在不脫離本發明要旨的範圍中進行各種改良及變更。 In addition to the foregoing, of course, various improvements and changes can be made without departing from the gist of the present invention.

1‧‧‧處理室 1‧‧‧Processing room

2‧‧‧真空預備室 2‧‧‧Vacuum preparation room

3‧‧‧中間室 3‧‧‧Intermediate Room

4‧‧‧基板收納室 4‧‧‧Substrate storage room

5‧‧‧電位計 5‧‧‧Potentiometer

6‧‧‧基板支持機構 6‧‧‧Substrate support mechanism

ID‧‧‧離子摻雜裝置(平面面板顯示器製造裝置) ID‧‧‧Ion doping device (flat panel display manufacturing device)

O‧‧‧除電裝置 O‧‧‧Static elimination device

R1‧‧‧真空機器人 R1‧‧‧Vacuum Robot

R2‧‧‧大氣機器人 R2‧‧‧Atmospheric Robot

S‧‧‧玻璃基板 S‧‧‧Glass substrate

X1、X2‧‧‧虛線(搬送路徑) X1, X2‧‧‧Dotted line (transport path)

Claims (6)

一種平面面板顯示器製造裝置,具有:處理室,對於玻璃基板施行加工處理;及搬送路,形成玻璃基板往前述處理室搬入搬出的搬入搬出路徑;其中前述處理室與前述搬送路處於真空環境下;且在構成前述搬送路的真空容器的外壁面連接有除電裝置,該除電裝置用以朝向前述真空容器的內側放出用於進行前述玻璃基板的除電的電子,前述除電裝置具有:藉由將被導入的氣體進行電離而於室內產生電漿的電漿室;及用以將電漿從前述電漿室往前述搬送路輸送的電漿輸送路;前述除電裝置並從該電漿室內放出用以進行前述玻璃基板的除電的電漿,在前述電漿輸送路形成有沿著電漿的輸送方向而成的磁場。 A manufacturing device for a flat panel display, comprising: a processing chamber for processing glass substrates; and a conveying path, which forms a conveying path for the glass substrate to be conveyed in and out of the processing chamber; wherein the processing chamber and the conveying path are in a vacuum environment; In addition, a static elimination device is connected to the outer wall surface of the vacuum container constituting the conveying path. The static elimination device is used to discharge electrons for neutralizing the glass substrate toward the inside of the vacuum container. The static elimination device has: A plasma chamber that ionizes the gas to generate plasma in the chamber; and a plasma transport path for transporting the plasma from the plasma chamber to the transport path; the de-energizing device is discharged from the plasma chamber for performing The neutralizing plasma of the glass substrate is formed with a magnetic field along the conveying direction of the plasma in the plasma conveying path. 如申請專利範圍第1項所述之平面面板顯示器製造裝置,其中,在與電漿的輸送方向垂直的切斷面中,前述電漿輸送路的切斷面比前述電漿室的切斷面小。 In the flat panel display manufacturing apparatus described in the first item of the patent application, in the cut surface perpendicular to the conveying direction of the plasma, the cut surface of the plasma conveying path is larger than the cut surface of the plasma chamber. small. 一種平面面板顯示器製造裝置,具有:處理室,對於玻璃基板施行加工處理;及搬送路,形成玻璃基板往前述處理室搬入搬出的 搬入搬出路徑;其中,前述處理室與前述搬送路處於真空環境下;且在構成前述搬送路的真空容器的外壁面連接有除電裝置,該除電裝置用以朝向前述真空容器的內側放出用於進行前述玻璃基板的除電的電子,前述除電裝置具有:藉由將被導入的氣體進行電離而於室內產生電漿的電漿室;及用以將電漿從前述電漿室往前述搬送路輸送的電漿輸送路;前述除電裝置並從該電漿室內放出用以進行前述玻璃基板的除電的電漿,在前述電漿室的外周設有用以於前述電漿室內產生會切磁場的永久磁鐵。 A manufacturing device for a flat panel display, comprising: a processing chamber for processing glass substrates; and a conveying path to form glass substrates for carrying in and out of the aforementioned processing chamber Carry in and out path; wherein the processing chamber and the conveying path are in a vacuum environment; and a static elimination device is connected to the outer wall surface of the vacuum container constituting the conveying path, and the static elimination device is used to discharge toward the inside of the vacuum container for performing The neutralizing electrons of the glass substrate, the neutralizing device has: a plasma chamber for generating plasma in the chamber by ionizing the introduced gas; and a plasma chamber for transporting the plasma from the plasma chamber to the transport path Plasma conveying path; the neutralization device discharges the plasma for neutralization of the glass substrate from the plasma chamber, and a permanent magnet for generating a cutting magnetic field in the plasma chamber is provided on the outer periphery of the plasma chamber. 如申請專利範圍第1項至第3項中任一項所述之平面面板顯示器製造裝置,其中,在前述電漿輸送路設有用以打開、關閉輸送路的閥,維護前述除電裝置時,關閉前述閥而將前述電漿輸送路隔為兩個空間。 The flat panel display manufacturing device described in any one of items 1 to 3 of the scope of the patent application, wherein a valve for opening and closing the plasma conveying path is provided in the plasma conveying path, and when the static elimination device is maintained, the valve is closed The valve partitions the plasma transport path into two spaces. 如申請專利範圍第1項至第3項中任一項所述之平面面板顯示器製造裝置,其中,於前述搬送路中,從前述玻璃基板的側方經由前述電漿輸送路進行電漿對於前述玻璃基板的上下表面的供給。 The flat panel display manufacturing apparatus described in any one of items 1 to 3 of the scope of patent application, wherein, in the conveying path, the plasma is carried out from the side of the glass substrate through the plasma conveying path. Supply of the upper and lower surfaces of the glass substrate. 如申請專利範圍第1項至第3項中任一項所述之平面面板顯示器製造裝置,其中,前述搬送路配置有電位計, 根據在前述電位計的量測結果從前述除電裝置進行電漿的供給。 For example, the flat panel display manufacturing device described in any one of items 1 to 3 of the scope of the patent application, wherein the transport path is equipped with a potentiometer, According to the measurement result of the potentiometer, the plasma is supplied from the static elimination device.
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