TWI717542B - 基板保持裝置 - Google Patents
基板保持裝置 Download PDFInfo
- Publication number
- TWI717542B TWI717542B TW106126061A TW106126061A TWI717542B TW I717542 B TWI717542 B TW I717542B TW 106126061 A TW106126061 A TW 106126061A TW 106126061 A TW106126061 A TW 106126061A TW I717542 B TWI717542 B TW I717542B
- Authority
- TW
- Taiwan
- Prior art keywords
- holding device
- substrate holding
- electrostatic chuck
- resin film
- insulating resin
- Prior art date
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 64
- 238000010438 heat treatment Methods 0.000 claims abstract description 96
- 229920005989 resin Polymers 0.000 claims description 65
- 239000011347 resin Substances 0.000 claims description 65
- 229910052751 metal Inorganic materials 0.000 claims description 24
- 239000002184 metal Substances 0.000 claims description 24
- 239000011888 foil Substances 0.000 claims description 23
- 238000012546 transfer Methods 0.000 claims description 23
- 238000004519 manufacturing process Methods 0.000 claims description 20
- 238000000034 method Methods 0.000 claims description 19
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical group [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 12
- 229910045601 alloy Inorganic materials 0.000 claims description 10
- 239000000956 alloy Substances 0.000 claims description 10
- 229910002804 graphite Inorganic materials 0.000 claims description 10
- 239000010439 graphite Substances 0.000 claims description 10
- 238000007788 roughening Methods 0.000 claims description 8
- JYEUMXHLPRZUAT-UHFFFAOYSA-N 1,2,3-triazine Chemical compound C1=CN=NN=C1 JYEUMXHLPRZUAT-UHFFFAOYSA-N 0.000 claims description 4
- XQUPVDVFXZDTLT-UHFFFAOYSA-N 1-[4-[[4-(2,5-dioxopyrrol-1-yl)phenyl]methyl]phenyl]pyrrole-2,5-dione Chemical compound O=C1C=CC(=O)N1C(C=C1)=CC=C1CC1=CC=C(N2C(C=CC2=O)=O)C=C1 XQUPVDVFXZDTLT-UHFFFAOYSA-N 0.000 claims description 4
- 229910052802 copper Inorganic materials 0.000 claims description 4
- 229910052748 manganese Inorganic materials 0.000 claims description 4
- 229920003192 poly(bis maleimide) Polymers 0.000 claims description 4
- 239000003822 epoxy resin Substances 0.000 claims description 3
- 229920000647 polyepoxide Polymers 0.000 claims description 3
- 238000000059 patterning Methods 0.000 claims 1
- 239000010410 layer Substances 0.000 description 56
- 239000010408 film Substances 0.000 description 51
- 239000002826 coolant Substances 0.000 description 21
- 239000012790 adhesive layer Substances 0.000 description 19
- 239000000853 adhesive Substances 0.000 description 12
- 230000001070 adhesive effect Effects 0.000 description 12
- 238000011282 treatment Methods 0.000 description 12
- 235000012431 wafers Nutrition 0.000 description 12
- 238000005530 etching Methods 0.000 description 10
- 238000007789 sealing Methods 0.000 description 10
- 239000000463 material Substances 0.000 description 8
- 238000010586 diagram Methods 0.000 description 7
- 230000002093 peripheral effect Effects 0.000 description 6
- 238000009792 diffusion process Methods 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 239000003795 chemical substances by application Substances 0.000 description 3
- 238000001816 cooling Methods 0.000 description 3
- 239000010949 copper Substances 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 230000020169 heat generation Effects 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 239000002356 single layer Substances 0.000 description 3
- 229910001006 Constantan Inorganic materials 0.000 description 2
- 229910000896 Manganin Inorganic materials 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- VNNRSPGTAMTISX-UHFFFAOYSA-N chromium nickel Chemical compound [Cr].[Ni] VNNRSPGTAMTISX-UHFFFAOYSA-N 0.000 description 2
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 2
- 239000007822 coupling agent Substances 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000000945 filler Substances 0.000 description 2
- 230000009477 glass transition Effects 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 229910001120 nichrome Inorganic materials 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000004381 surface treatment Methods 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 description 1
- 229910021578 Iron(III) chloride Inorganic materials 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 239000004809 Teflon Substances 0.000 description 1
- 229920006362 Teflon® Polymers 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- ORTQZVOHEJQUHG-UHFFFAOYSA-L copper(II) chloride Chemical compound Cl[Cu]Cl ORTQZVOHEJQUHG-UHFFFAOYSA-L 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 230000003628 erosive effect Effects 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 229910021389 graphene Inorganic materials 0.000 description 1
- 230000003116 impacting effect Effects 0.000 description 1
- 238000005470 impregnation Methods 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- RBTARNINKXHZNM-UHFFFAOYSA-K iron trichloride Chemical compound Cl[Fe](Cl)Cl RBTARNINKXHZNM-UHFFFAOYSA-K 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 230000008520 organization Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000005240 physical vapour deposition Methods 0.000 description 1
- 238000001020 plasma etching Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000013464 silicone adhesive Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6831—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q3/00—Devices holding, supporting, or positioning work or tools, of a kind normally removable from the machine
- B23Q3/15—Devices for holding work using magnetic or electric force acting directly on the work
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67103—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02N—ELECTRIC MACHINES NOT OTHERWISE PROVIDED FOR
- H02N13/00—Clutches or holding devices using electrostatic attraction, e.g. using Johnson-Rahbek effect
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Surface Heating Bodies (AREA)
- Resistance Heating (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016156470A JP6708518B2 (ja) | 2016-08-09 | 2016-08-09 | 基板固定装置及びその製造方法 |
| JP2016-156470 | 2016-08-09 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201806072A TW201806072A (zh) | 2018-02-16 |
| TWI717542B true TWI717542B (zh) | 2021-02-01 |
Family
ID=61160420
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW106126061A TWI717542B (zh) | 2016-08-09 | 2017-08-02 | 基板保持裝置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US10361110B2 (enExample) |
| JP (1) | JP6708518B2 (enExample) |
| KR (1) | KR20180018335A (enExample) |
| TW (1) | TWI717542B (enExample) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6708518B2 (ja) * | 2016-08-09 | 2020-06-10 | 新光電気工業株式会社 | 基板固定装置及びその製造方法 |
| KR20250100800A (ko) * | 2018-05-31 | 2025-07-03 | 어플라이드 머티어리얼스, 인코포레이티드 | 극도의 균일성의 가열식 기판 지지 조립체 |
| JP7172163B2 (ja) * | 2018-06-20 | 2022-11-16 | 日新電機株式会社 | 基板保持装置 |
| JP7329917B2 (ja) * | 2018-11-30 | 2023-08-21 | 新光電気工業株式会社 | 基板固定装置 |
| US11302536B2 (en) * | 2019-10-18 | 2022-04-12 | Applied Materials, Inc. | Deflectable platens and associated methods |
| KR20220142498A (ko) * | 2020-02-18 | 2022-10-21 | 램 리써치 코포레이션 | 열 확산기를 갖는 고온 기판 지지부 |
| JP7496250B2 (ja) | 2020-06-16 | 2024-06-06 | 新光電気工業株式会社 | 基板固定装置、静電チャック及び静電チャックの製造方法 |
| CN114496886A (zh) | 2020-11-13 | 2022-05-13 | 新光电气工业株式会社 | 基板固定装置、静电吸盘和静电吸盘的制造方法 |
| JP7670316B2 (ja) * | 2021-03-24 | 2025-04-30 | 新光電気工業株式会社 | 静電チャック、基板固定装置 |
| KR102640829B1 (ko) * | 2021-03-29 | 2024-02-23 | 주식회사 케이티앤지 | 에어로졸 발생 장치용 히터 및 이를 포함하는 에어로졸 발생 장치 |
| JP7783696B2 (ja) | 2021-05-14 | 2025-12-10 | 新光電気工業株式会社 | 基板固定装置、静電チャック及び静電チャックの製造方法 |
| JP2023183628A (ja) * | 2022-06-16 | 2023-12-28 | 新光電気工業株式会社 | 基板固定装置及び基板固定装置の製造方法 |
| JP2024002793A (ja) | 2022-06-24 | 2024-01-11 | 新光電気工業株式会社 | 基板固定装置 |
| JP2024105999A (ja) * | 2023-01-26 | 2024-08-07 | 東京エレクトロン株式会社 | 基板処理装置及び基板支持部 |
| CN120917868A (zh) * | 2023-03-29 | 2025-11-07 | 琳得科株式会社 | 层叠体 |
| KR102854447B1 (ko) * | 2025-01-24 | 2025-09-03 | (주)파웰 코퍼레이션 | 정전척 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007157488A (ja) * | 2005-12-05 | 2007-06-21 | Sankei Giken:Kk | 面状発熱体 |
| JP2011256072A (ja) * | 2010-06-09 | 2011-12-22 | Ngk Spark Plug Co Ltd | 発熱体を有するセラミック基板及びその製造方法 |
| JP2014130908A (ja) * | 2012-12-28 | 2014-07-10 | Ngk Spark Plug Co Ltd | 静電チャック |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07307377A (ja) * | 1993-12-27 | 1995-11-21 | Shin Etsu Chem Co Ltd | 静電チャック付セラミックスヒーター |
| JP2003100422A (ja) * | 2001-09-25 | 2003-04-04 | Toshiba Ceramics Co Ltd | 箔状の抵抗発熱素子及び面状セラミックスヒーター |
| US7646580B2 (en) * | 2005-02-24 | 2010-01-12 | Kyocera Corporation | Electrostatic chuck and wafer holding member and wafer treatment method |
| JP5163349B2 (ja) * | 2008-08-01 | 2013-03-13 | 住友大阪セメント株式会社 | 静電チャック装置 |
| JP5262878B2 (ja) * | 2009-03-17 | 2013-08-14 | 東京エレクトロン株式会社 | 載置台構造及びプラズマ成膜装置 |
| JP5846186B2 (ja) * | 2010-01-29 | 2016-01-20 | 住友大阪セメント株式会社 | 静電チャック装置および静電チャック装置の製造方法 |
| JP5423632B2 (ja) | 2010-01-29 | 2014-02-19 | 住友大阪セメント株式会社 | 静電チャック装置 |
| US8898889B2 (en) * | 2011-11-22 | 2014-12-02 | Lam Research Corporation | Chuck assembly for plasma processing |
| JP5441019B1 (ja) * | 2012-08-29 | 2014-03-12 | Toto株式会社 | 静電チャック |
| JP6052976B2 (ja) * | 2012-10-15 | 2016-12-27 | 日本タングステン株式会社 | 静電チャック誘電体層および静電チャック |
| JP6708518B2 (ja) * | 2016-08-09 | 2020-06-10 | 新光電気工業株式会社 | 基板固定装置及びその製造方法 |
-
2016
- 2016-08-09 JP JP2016156470A patent/JP6708518B2/ja active Active
-
2017
- 2017-07-28 US US15/662,480 patent/US10361110B2/en active Active
- 2017-07-31 KR KR1020170096709A patent/KR20180018335A/ko not_active Ceased
- 2017-08-02 TW TW106126061A patent/TWI717542B/zh active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007157488A (ja) * | 2005-12-05 | 2007-06-21 | Sankei Giken:Kk | 面状発熱体 |
| JP2011256072A (ja) * | 2010-06-09 | 2011-12-22 | Ngk Spark Plug Co Ltd | 発熱体を有するセラミック基板及びその製造方法 |
| JP2014130908A (ja) * | 2012-12-28 | 2014-07-10 | Ngk Spark Plug Co Ltd | 静電チャック |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201806072A (zh) | 2018-02-16 |
| JP6708518B2 (ja) | 2020-06-10 |
| JP2018026427A (ja) | 2018-02-15 |
| KR20180018335A (ko) | 2018-02-21 |
| US10361110B2 (en) | 2019-07-23 |
| US20180047604A1 (en) | 2018-02-15 |
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