TWI689800B - 調節儀及劣化位置檢測方法 - Google Patents

調節儀及劣化位置檢測方法 Download PDF

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Publication number
TWI689800B
TWI689800B TW107129531A TW107129531A TWI689800B TW I689800 B TWI689800 B TW I689800B TW 107129531 A TW107129531 A TW 107129531A TW 107129531 A TW107129531 A TW 107129531A TW I689800 B TWI689800 B TW I689800B
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TW
Taiwan
Prior art keywords
feedback value
display
section
abnormal
measured
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Application number
TW107129531A
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English (en)
Chinese (zh)
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TW201913257A (zh
Inventor
岩切研
Original Assignee
日商阿自倍爾股份有限公司
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Publication of TW201913257A publication Critical patent/TW201913257A/zh
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0267—Fault communication, e.g. human machine interface [HMI]
    • G05B23/027—Alarm generation, e.g. communication protocol; Forms of alarm
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0262—Confirmation of fault detection, e.g. extra checks to confirm that a failure has indeed occurred
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/0227—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions
    • G05B23/0235—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions based on a comparison with predetermined threshold or range, e.g. "classical methods", carried out during normal operation; threshold adaptation or choice; when or how to compare with the threshold
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0256—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults injecting test signals and analyzing monitored process response, e.g. injecting the test signal while interrupting the normal operation of the monitored system; superimposing the test signal onto a control signal during normal operation of the monitored system

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Human Computer Interaction (AREA)
  • Testing And Monitoring For Control Systems (AREA)
TW107129531A 2017-08-25 2018-08-24 調節儀及劣化位置檢測方法 TWI689800B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017162396A JP6943683B2 (ja) 2017-08-25 2017-08-25 調節計および劣化位置検出方法
JP2017-162396 2017-08-25

Publications (2)

Publication Number Publication Date
TW201913257A TW201913257A (zh) 2019-04-01
TWI689800B true TWI689800B (zh) 2020-04-01

Family

ID=65514571

Family Applications (1)

Application Number Title Priority Date Filing Date
TW107129531A TWI689800B (zh) 2017-08-25 2018-08-24 調節儀及劣化位置檢測方法

Country Status (4)

Country Link
JP (1) JP6943683B2 (ja)
KR (1) KR102278920B1 (ja)
CN (1) CN109426242B (ja)
TW (1) TWI689800B (ja)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI284791B (en) * 2004-04-23 2007-08-01 Yamatake Corp Control method and apparatus
TW201433895A (zh) * 2013-02-28 2014-09-01 Azbil Corp 監視裝置及控制系統
TWI591462B (zh) * 2016-02-22 2017-07-11 東芝三菱電機產業系統股份有限公司 工廠之控制裝置

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JPH06231380A (ja) * 1993-02-03 1994-08-19 Toshiba Corp プロセス表示装置
FR2784123B1 (fr) * 1998-10-06 2000-12-15 Comeureg Sa Dispositif de reperage de point sur un tissu
JP3451554B1 (ja) * 2002-06-12 2003-09-29 オムロン株式会社 異常検出方法、異常検出装置および温度調節器
JP2007122575A (ja) * 2005-10-31 2007-05-17 Yaskawa Electric Corp モータ制御装置
JP2008097363A (ja) * 2006-10-12 2008-04-24 Okuma Corp 異常診断方法及びその装置
JP2009234747A (ja) * 2008-03-27 2009-10-15 Hitachi Building Systems Co Ltd エスカレータの音響診断装置
US8905371B2 (en) * 2011-06-30 2014-12-09 General Equipment And Manufacturing Company, Inc. Valve signature diagnosis and leak test device
JP2013050344A (ja) * 2011-08-30 2013-03-14 Nsk Ltd 歯車伝達装置用トルク測定装置と駆動系制御装置と転がり軸受の予圧測定方法
US20150212425A1 (en) * 2012-09-28 2015-07-30 Asml Holding N.V. Quantitative Reticle Distortion Measurement System
AR095272A1 (es) * 2013-03-14 2015-09-30 Fisher Controls Int Llc Pronóstico de válvula en función de análisis de laboratorio
DK2971901T3 (en) * 2013-03-15 2019-01-07 Schneider Electric Buildings Advanced valve actuator with integrated energy measurement
JP2016038651A (ja) * 2014-08-06 2016-03-22 アズビル株式会社 温度調節計
JP6390475B2 (ja) * 2015-03-13 2018-09-19 オムロン株式会社 制御装置
JP2016182694A (ja) * 2015-03-25 2016-10-20 セイコーエプソン株式会社 液体吐出装置及び液体吐出方法
JP6581833B2 (ja) * 2015-07-30 2019-09-25 アズビル株式会社 アクチュエータ不具合検知装置、制御装置および方法
JP2017091123A (ja) * 2015-11-09 2017-05-25 アズビル株式会社 調節計
JP6443311B2 (ja) * 2015-11-30 2018-12-26 オムロン株式会社 制御装置、制御プログラムおよび記録媒体
CN106908121B (zh) * 2017-01-17 2019-05-21 北京远东仪表有限公司 一种流量装置中水流量稳定性检测方法及检测系统

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI284791B (en) * 2004-04-23 2007-08-01 Yamatake Corp Control method and apparatus
TW201433895A (zh) * 2013-02-28 2014-09-01 Azbil Corp 監視裝置及控制系統
TWI547781B (zh) * 2013-02-28 2016-09-01 Azbil Corp Monitoring device and control system
TWI591462B (zh) * 2016-02-22 2017-07-11 東芝三菱電機產業系統股份有限公司 工廠之控制裝置

Also Published As

Publication number Publication date
KR102278920B1 (ko) 2021-07-19
CN109426242B (zh) 2021-07-27
JP6943683B2 (ja) 2021-10-06
CN109426242A (zh) 2019-03-05
TW201913257A (zh) 2019-04-01
JP2019040438A (ja) 2019-03-14
KR20190022368A (ko) 2019-03-06

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