TWI653353B - Vacuum vapor deposition device, method for producing vapor deposition film, and method for manufacturing organic electronic device - Google Patents

Vacuum vapor deposition device, method for producing vapor deposition film, and method for manufacturing organic electronic device Download PDF

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TWI653353B
TWI653353B TW105117204A TW105117204A TWI653353B TW I653353 B TWI653353 B TW I653353B TW 105117204 A TW105117204 A TW 105117204A TW 105117204 A TW105117204 A TW 105117204A TW I653353 B TWI653353 B TW I653353B
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mask
evaporation source
vapor deposition
substrate
evaporation
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TW201712135A (en
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三澤啓太
後藤亮太
風間良秋
七五三木浩一
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日商佳能特機股份有限公司
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04Coating on selected surface areas, e.g. using masks
    • C23C14/042Coating on selected surface areas, e.g. using masks using masks
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/12Organic material
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • C23C14/243Crucibles for source material
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/50Substrate holders
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/54Controlling or regulating the coating process
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/56Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
    • C23C14/564Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10Deposition of organic active material
    • H10K71/16Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
    • H10K71/164Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using vacuum deposition

Abstract

可防止蒸鍍中的熱變形而高精度地以期望的圖案進行成膜的真空蒸鍍裝置的提供。 Provided is a vacuum evaporation apparatus capable of preventing thermal deformation during vapor deposition and forming a film in a desired pattern with high accuracy.

一種真空蒸鍍裝置,在蒸鍍室(1),設有隔著遮罩而對基板進行蒸鍍的蒸發源(2)、及在進行蒸鍍時使前述蒸發源(2)相對於前述基板而移動的蒸發源移動機構或在進行蒸鍍時使前述基板相對於前述蒸發源而移動的基板移動機構,並將前述蒸發源移動機構或前述基板移動機構構成為,在開始往前述基板的蒸鍍前,利用前述蒸發源(2)而進行前述遮罩的事前加熱。 A vacuum evaporation device is provided in an evaporation chamber (1) with an evaporation source (2) for vapor deposition of a substrate through a mask, and during evaporation, the evaporation source (2) is opposed to the substrate. A moving evaporation source moving mechanism or a substrate moving mechanism that moves the substrate relative to the evaporation source during vapor deposition, and the evaporation source moving mechanism or the substrate moving mechanism is configured to start vaporization to the substrate. Prior to plating, the mask is heated in advance using the evaporation source (2).

Description

真空蒸鍍裝置、蒸鍍膜之製造方法及有機電子裝置之製造方法 Vacuum evaporation device, method for producing vapor-deposited film, and method for producing organic electronic device

本發明,係有關真空蒸鍍裝置、蒸鍍膜的製造方法及有機電子裝置的製造方法者。 The present invention relates to a method for manufacturing a vacuum vapor deposition device, a vapor deposition film, and an organic electronic device.

在使從蒸發源蒸發的成膜材料,隔著形成有既定的遮罩圖案的遮罩而堆積於基板以將薄膜進行成膜的蒸鍍裝置方面,係有時遮罩在蒸鍍中(成膜中)從蒸發源受熱因而熱變形,此遮罩的熱變形使得遮罩與基板的位置偏差,形成於基板上的薄膜的圖案從期望的位置偏差。尤其,在手機、電視等的顯示面板等的有機電子裝置的製造中,係使用具有高精細的圖案的遮罩,故熱變形所致的影響大。 In a vapor deposition device that deposits a film-forming material evaporated from an evaporation source on a substrate with a mask formed with a predetermined mask pattern formed thereon, the film is sometimes masked during the vapor deposition (forming The film) is deformed by receiving heat from the evaporation source. The thermal deformation of this mask causes the position of the mask to deviate from the substrate, and the pattern of the thin film formed on the substrate deviates from the desired position. In particular, in the manufacture of organic electronic devices such as display panels such as mobile phones and televisions, since a mask having a high-definition pattern is used, the influence due to thermal deformation is large.

所以,如揭露於例如專利文獻1,雖為了抑制熱變形而已提出採用由屬低熱膨脹材料的invar材所成的遮罩,惟即使在遮罩方面使用低熱膨脹材,仍難以使線膨脹係數為0,在此情況下熱變形仍有時成為問題。 Therefore, as disclosed in, for example, Patent Document 1, although a mask made of an invar material which is a low thermal expansion material has been proposed to suppress thermal deformation, it is still difficult to make the linear expansion coefficient be 0, in which case thermal deformation may still be a problem.

[先前技術文獻] [Prior technical literature] [專利文獻] [Patent Literature]

[專利文獻1]日本專利特開2004-323888號公報 [Patent Document 1] Japanese Patent Laid-Open No. 2004-323888

本發明,係鑑於如上述之現狀而創作者,目的在於提供抑制遮罩的蒸鍍中的熱變形而可高精度地以期望的圖案進行成膜的真空蒸鍍裝置。 The present invention has been made by the creators in view of the above-mentioned circumstances, and an object thereof is to provide a vacuum evaporation apparatus capable of accurately forming a film in a desired pattern while suppressing thermal deformation during vapor deposition of a mask.

參照附圖而說明本發明的要旨。 The gist of the present invention will be described with reference to the drawings.

本發明之第1態樣,係關於一種真空蒸鍍裝置,在蒸鍍室1,設有隔著遮罩而對基板進行蒸鍍的蒸發源2、及在進行蒸鍍時使前述蒸發源2相對於前述基板而移動的蒸發源移動機構或在進行蒸鍍時使前述基板相對於前述蒸發源而移動的基板移動機構,其中前述蒸發源移動機構或前述基板移動機構被構成為,在開始往前述基板的蒸鍍前,利用前述蒸發源2而進行前述遮罩的事前加熱。 A first aspect of the present invention relates to a vacuum evaporation device. The evaporation chamber 1 is provided with an evaporation source 2 that vapor-deposits a substrate through a mask, and the evaporation source 2 is formed during vapor deposition. The evaporation source moving mechanism that moves with respect to the substrate or the substrate moving mechanism that moves the substrate with respect to the evaporation source during vapor deposition, wherein the evaporation source moving mechanism or the substrate moving mechanism is configured to start Before the substrate is vapor-deposited, the mask is heated in advance using the evaporation source 2.

此外,關於一種真空蒸鍍裝置,其中,在供於使從前述蒸發源2蒸發的成膜材料的成膜速度穩定化用的蒸鍍前的預備加熱中利用從此蒸發源2所發出的熱而進行前述遮罩的事前加熱。 In addition, in a vacuum vapor deposition device, the preheating before vapor deposition for stabilizing the film forming speed of the film forming material evaporated from the evaporation source 2 is performed by using the heat emitted from the evaporation source 2. The aforementioned mask is heated beforehand.

此外,關於一種真空蒸鍍裝置,其中,在前述蒸發源 2設置遮蔽器7,並構成為在將此遮蔽器7關閉的狀態下使前述蒸發源與前述遮罩的相對的位置關係變化而進行前述遮罩的事前加熱。 In addition, in a vacuum evaporation apparatus, the evaporation source is 2 A masker 7 is provided, and is configured to change the relative positional relationship between the evaporation source and the mask while the masker 7 is closed, and perform pre-heating of the mask.

此外,關於一種真空蒸鍍裝置,其中,將前述蒸發源移動機構構成為,在前述連續蒸鍍中的最初進行蒸鍍的基板與遮罩的位置對準,係與前述遮罩的事前加熱併行而進行。 In addition, in a vacuum vapor deposition apparatus, the evaporation source moving mechanism is configured to align the position of a substrate to be initially vapor-deposited with a mask during the continuous vapor deposition in parallel with the pre-heating of the mask. And proceed.

此外,關於一種真空蒸鍍裝置,其中,在與前述蒸發源的移動方向正交的方向上並置複數個供於在前述蒸鍍室1對前述基板進行蒸鍍用的蒸鍍區域3、4,對複數個前述蒸鍍區域3、4各者,在前述蒸鍍區域外,設置使蒸發源退避的退避區域,將前述蒸發源移動機構構成為,可使前述蒸發源2移動於與前述蒸鍍區域3、4的並設方向相同的方向而從其中一個的蒸鍍區域往另一個的蒸鍍區域移動,且前述蒸發源移動機構被構成為,在將分別配置於前述複數個蒸鍍區域3、4的遮罩進行事前加熱時,將配置於其中一個的蒸鍍區域的遮罩進行加熱後,不使前述蒸發源2退避至前述退避區域3、4下予以移動於前述蒸鍍區域的並設方向而移動至另一個的蒸鍍區域。 In addition, in a vacuum vapor deposition apparatus, a plurality of vapor deposition regions 3 and 4 for vapor deposition of the substrate in the vapor deposition chamber 1 are juxtaposed in a direction orthogonal to the moving direction of the evaporation source. For each of the plurality of vapor deposition regions 3 and 4, a retreat region is provided outside the vapor deposition region to retreat the evaporation source, and the evaporation source moving mechanism is configured to move the evaporation source 2 to and from the vapor deposition. The juxtaposed directions of the regions 3 and 4 are moved in the same direction from one of the vapor deposition regions to the other vapor deposition region, and the evaporation source moving mechanism is configured to be disposed in the plurality of vapor deposition regions 3 respectively. When the masks of 4 and 4 are heated in advance, the masks arranged in one of the evaporation regions are heated, and then the evaporation source 2 is not moved to the evaporation regions 3 and 4 and moved to the evaporation region. Set the direction and move to another vapor deposition area.

本發明之第2態樣,係關於一種蒸鍍膜的製造方法,其具有將基板設置於蒸鍍室的程序、將收容於蒸發源的成膜材料進行加熱而使成膜速度穩定的程序、及隔著遮罩使前述蒸鍍材料的蒸氣附著於前述基板的程序,其中在使前述成膜速度穩定的程序之期間使前述蒸發源與前述基板的 相對的位置關係變化,透過前述蒸發源的熱而將前述遮罩加熱。 A second aspect of the present invention relates to a method for producing a vapor-deposited film, which includes a program for setting a substrate in a vapor deposition chamber, a program for heating a film-forming material stored in an evaporation source to stabilize a film-forming speed, and A process of attaching vapor of the vapor deposition material to the substrate through a mask, wherein the evaporation source and the substrate are The relative positional relationship changes, and the mask is heated by the heat of the evaporation source.

本發明之第3態樣,係關於一種有機電子裝置的製造方法,該有機電子裝置在基板之上具備複數個具備夾著一對的電極的有機層的元件,該製造方法具有將形成有複數個電極的基板設置於蒸鍍室的程序、將具備複數個開口的遮罩對於前述基板進行位置對準的程序、將收容於蒸發源的成膜材料進行加熱而使成膜速度穩定的程序、及隔著前述遮罩使前述成膜材料的蒸氣附著於前述基板上而形成前述有機層的至少一部分的程序,其中在使前述成膜速度穩定的程序之期間使前述蒸發源與前述基板的相對的位置關係變化,透過前述蒸發源的熱而將前述遮罩加熱。 A third aspect of the present invention relates to a method for manufacturing an organic electronic device including a plurality of elements having an organic layer sandwiching a pair of electrodes on a substrate, and the manufacturing method includes forming a plurality of elements. A procedure for installing a substrate with two electrodes in a vapor deposition chamber, a procedure for aligning a mask with a plurality of openings on the substrate, a procedure for heating a film forming material stored in an evaporation source to stabilize a film forming speed, And a process of forming vapor of the film-forming material on the substrate through the mask to form at least a part of the organic layer, wherein the evaporation source and the substrate are opposed to each other during the process of stabilizing the film-forming speed. The positional relationship of φ is changed, and the mask is heated by the heat of the evaporation source.

依本發明時,變得可抑制遮罩的蒸鍍中的熱變形而高精度地以期望的圖案進行成膜。 According to the present invention, it is possible to suppress thermal deformation during vapor deposition of a mask and to form a film with a desired pattern with high accuracy.

1‧‧‧蒸鍍室 1‧‧‧Evaporation Room

2‧‧‧蒸發源 2‧‧‧ evaporation source

3、4‧‧‧蒸鍍區域 3, 4‧‧‧ evaporation area

7‧‧‧遮蔽器 7‧‧‧Mask

[圖1]本實施例的概略說明透視圖。 [FIG. 1] A schematic explanatory perspective view of the present embodiment.

[圖2]本實施例的概略說明平面圖。 [FIG. 2] A schematic explanatory plan view of the present embodiment.

[圖3]本實施例的概略說明平面圖。 [FIG. 3] A schematic explanatory plan view of the present embodiment.

[圖4]本實施例的概略說明平面圖。 4] A schematic explanatory plan view of the present embodiment.

[圖5](a)係利用本發明相關的真空蒸鍍裝置而製作的有機EL顯示裝置的透視圖,(b)係(a)的A-B線剖 面圖。 [Fig. 5] (a) is a perspective view of an organic EL display device manufactured by using a vacuum evaporation device according to the present invention, and (b) is a sectional view taken along line A-B of (a). Face view.

針對本發明相關的真空蒸鍍裝置的實施形態,基於圖式而具體說明。 An embodiment of the vacuum evaporation apparatus according to the present invention will be specifically described based on the drawings.

本發明的實施形態相關的真空蒸鍍裝置,係在蒸鍍室,具備隔著遮罩而對基板進行蒸鍍的蒸發源(材料收容部)、及在進行蒸鍍時使前述蒸發源相對於前述基板而移動的蒸發源移動機構。此蒸發源移動機構,係具有使蒸發源與基板的相對的位置關係,更具體而言使蒸發源與基板的在與基板的成膜面平行的面方向上的相對的位置關係變化的功能。並且,將前述蒸發源移動機構構成為,在維持前述蒸鍍室的真空狀態而對前述基板開始蒸鍍前,使前述蒸發源相對於前述遮罩而移動,利用從此蒸發源所發出的熱而對前述遮罩進行事前加熱。於本實施形態,係透過蒸發源移動機構使蒸發源移動從而使蒸發源與基板的相對的位置關係變化,惟亦可在蒸鍍室設置基板移動機構,透過使基板移動從而使蒸發源與基板的相對的位置關係變化,亦可透過使基板與蒸發源的雙方移動從而使蒸發源與基板的相對的位置關係變化。因此,此處所謂的蒸發源移動機構、基板移動機構,係皆亦可稱作蒸發源與基板的相對位置關係變化機構。 A vacuum evaporation apparatus according to an embodiment of the present invention is provided in an evaporation chamber, and includes an evaporation source (material storage portion) for vapor-depositing a substrate through a mask, and the evaporation source is opposed to the evaporation source during vapor deposition. The evaporation source moving mechanism that moves the substrate. This evaporation source moving mechanism has a function of changing the relative positional relationship between the evaporation source and the substrate, and more specifically, the relative positional relationship between the evaporation source and the substrate in a plane direction parallel to the film-forming surface of the substrate. In addition, the evaporation source moving mechanism is configured to move the evaporation source with respect to the mask before the evaporation of the substrate is maintained while maintaining the vacuum state of the evaporation chamber, and use the heat emitted from the evaporation source to The mask is heated beforehand. In this embodiment, the evaporation source moving mechanism is used to move the evaporation source to change the relative positional relationship between the evaporation source and the substrate. However, a substrate moving mechanism may be provided in the evaporation chamber, and the evaporation source and the substrate may be moved by moving the substrate. The relative positional relationship between the evaporation source and the substrate can also be changed by moving both the substrate and the evaporation source. Therefore, the so-called evaporation source moving mechanism and substrate moving mechanism are both referred to as a mechanism for changing the relative position relationship between the evaporation source and the substrate.

在圖1、2,繪示本發明相關的真空蒸鍍裝置的一實施例。圖1係為了可看見真空蒸鍍裝置的內部而將蒸鍍室 1的壁一部分移除的透視圖,圖2係從蒸鍍室1之上表面側所見的平面圖。在蒸鍍室1,係供於對基板進行蒸鍍用的蒸鍍區域3、4在與成膜移動方向正交的方向(蒸鍍區域移動方向)上並置複數個。並且,對於前述蒸鍍區域3、4各者,在前述蒸鍍區域3、4外,設有使蒸發源2退避的退避區域。 An embodiment of a vacuum evaporation apparatus according to the present invention is shown in FIGS. 1 and 2. Figure 1 shows the evaporation chamber in order to see the inside of the vacuum evaporation device. A perspective view with a part of the wall of FIG. 1 removed, and FIG. 2 is a plan view seen from the upper surface side of the evaporation chamber 1. In the vapor deposition chamber 1, a plurality of vapor deposition regions 3, 4 for vapor deposition of a substrate are juxtaposed in a direction orthogonal to the film forming moving direction (moving direction of the vapor deposition region). In addition, each of the vapor deposition regions 3 and 4 is provided with a retreat region for retreating the evaporation source 2 outside the vapor deposition regions 3 and 4.

另外,在各蒸鍍區域3、4,係分別設有對遮罩及基板進行保持的遮罩台(圖示省略)。從分別對應於各蒸鍍區域3、4的各搬出入口8、9所分別搬入的基板,係透過設於各蒸鍍區域3、4的對準機構而分別與遮罩進行位置對準後,在與遮罩重疊而固定的狀態下,分別設置於遮罩台而保持。 In addition, in each of the vapor deposition regions 3 and 4, a mask stage (not shown) for holding a mask and a substrate is provided. The substrates carried in from the carrying-out inlets 8 and 9 respectively corresponding to the vapor deposition areas 3 and 4 are aligned with the masks through alignment mechanisms provided in the vapor deposition areas 3 and 4, respectively. In a state where they are overlapped and fixed with the mask, they are respectively installed and held on a mask table.

另外,蒸鍍區域,係指從蒸發源2蒸發的成膜材料附著於基板的區域。 The vapor deposition region refers to a region where the film-forming material evaporated from the evaporation source 2 is attached to the substrate.

於本實施例中,係為了使透過從前述蒸發源2所放出的蒸氣而形成的蒸鍍膜的成膜速度穩定化,將蒸發源移動機構構成為,在蒸鍍開始前的預備加熱中,利用從此蒸發源2所發出的熱而進行前述遮罩的事前加熱。具體而言,在蒸鍍開始前,使基板的長邊方向或寬度方向中的任一者作為成膜移動方向而使蒸發源2在蒸鍍區域3、4內往返移動於此成膜移動方向而進行熱試運轉。此移動,係不必為往返運動,為圓周運動等亦無妨。另外,只要比起未進行預熱的情況下成膜速度的變動受到抑制,該預備加熱係為了使成膜速度穩定化者。預熱,係優選上作成成膜速度 的變動會落入預定的既定的範圍內。雖說如此,針對是否落入既定的範圍內,不必每次成膜每次進行檢證,能以預備實驗等決定預備加熱時間。 In this embodiment, in order to stabilize the film-forming speed of the vapor deposition film formed by transmitting the vapor emitted from the evaporation source 2, the evaporation source moving mechanism is configured to use in the preliminary heating before the vapor deposition starts. The heat emitted from the evaporation source 2 is used to heat the mask in advance. Specifically, before vapor deposition is started, any one of the long-side direction and the width-direction of the substrate is used as the film-forming moving direction, and the evaporation source 2 is moved back and forth in the film-forming moving direction within the evaporation regions 3 and 4. Instead, perform a thermal test run. This movement does not need to be a back-and-forth motion, or a circular motion. In addition, as long as the variation in the film formation speed is suppressed compared to the case where no preheating is performed, this preliminary heating is for the purpose of stabilizing the film formation speed. Preheating The change will fall within a predetermined predetermined range. Even so, it is not necessary to verify each film formation every time whether it falls within a predetermined range, and the preliminary heating time can be determined by preliminary experiments and the like.

此預熱,係為了使成膜材料的熔化狀態穩定化而使得收容於蒸發源2的成膜材料的脫氣、成膜速度等穩定而進行者,例如使蒸發源2升溫至與成膜時的加熱溫度同樣的溫度而加熱數分鐘程度從而進行。另外,本實施例的蒸發源2,係如示於圖2以3個線源而構成。 This preheating is performed in order to stabilize the melting state of the film-forming material and stabilize the degassing and film-forming speed of the film-forming material stored in the evaporation source 2. For example, the temperature of the evaporation source 2 is raised to that during film formation. The heating is performed at the same temperature as the heating temperature for several minutes. In addition, the evaporation source 2 of this embodiment is constituted by three line sources as shown in FIG. 2.

此外,在進行蒸發源2的預熱的期間,可亦併行而進行最初進行蒸鍍的基板與遮罩的位置對準。 In addition, while the preheating of the evaporation source 2 is being performed, the position of the substrate and the mask to be initially vapor-deposited may also be aligned in parallel.

亦即,利用基板與遮罩的對準及蒸發源2的事前加熱等的蒸鍍準備期間,而進行遮罩的事前加熱為優選。 That is, it is preferable to perform the pre-heating of the mask during the vapor deposition preparation period such as the alignment of the substrate and the mask and the pre-heating of the evaporation source 2.

要進一步縮短至成膜開始為止所需的時間,係優選上將蒸發源2的預備加熱溫度及透過蒸發源移動機構的蒸發源2的移動速度設定為,在結束基板與遮罩的對準的時間點使遮罩的事前加熱結束。藉此,使得可削減供遮罩的事前加熱用的待機時間,利用蒸鍍準備期間而進行遮罩的事前加熱,可防止由於從蒸發源2所發出的熱使得遮罩在蒸鍍中熱變形。此外,供事前加熱用的熱源,係蒸發源2,無須準備其他熱源,並且利用在蒸發源2的預熱時發出的熱,故可效率佳地進行預熱。 To further shorten the time required until the start of film formation, it is preferable to set the pre-heating temperature of the evaporation source 2 and the moving speed of the evaporation source 2 through the evaporation source moving mechanism so that the The point in time ends the pre-heating of the mask. This makes it possible to reduce the waiting time for pre-heating of the mask, and to perform pre-heating of the mask during the vapor deposition preparation period, and to prevent the mask from being thermally deformed during vapor deposition due to the heat emitted from the evaporation source 2 . In addition, since the heat source for pre-heating is the evaporation source 2, there is no need to prepare another heat source, and the heat generated during the preheating of the evaporation source 2 is used, so the preheating can be performed efficiently.

另外,在先前技術中,蒸發源的預熱,係將蒸鍍源配置於退避區域(蒸鍍材料不會附著於基板的區域)而進行,故蒸發源的預熱係無助於遮罩的預熱。 In addition, in the prior art, the preheating of the evaporation source is performed by arranging the evaporation source in a retreat area (the area where the evaporation material does not adhere to the substrate), so the preheating of the evaporation source is not helpful for the mask. Warm up.

優選上如圖1構成為在前述蒸發源2設置遮蔽器7,在將此遮蔽器7關閉的狀態下相對於前述遮罩予以往返移動而進行前述遮罩的事前加熱。具體而言,遮蔽器7係開閉滑動自如地設於蒸發源2之上方位置。另外,設置遮蔽器7的情況下,遮蔽器7仍會被蒸發源2加熱,透過此被加熱的遮蔽器7使得遮罩被加熱。如本例所代表,在將蒸發源的遮蔽器關閉的狀態下,邊使蒸發源與基板的相對位置變化邊將蒸發源加熱的構成,係本發明的適合的實施形態。作成如此的構成,使得可在基板正下存在蒸發源的狀態下效率佳地將遮罩事前加熱,同時亦可防止在事前加熱階段膜附著於基板。另外,遮蔽器,係可將從蒸發源所放出的蒸氣遮蔽成不會附著於基板者即可,未必要設於蒸發源。 As shown in FIG. 1, a mask 7 is preferably provided in the evaporation source 2, and the mask 7 is moved back and forth with respect to the mask in a state in which the mask 7 is closed to perform pre-heating of the mask. Specifically, the shutter 7 is slidably opened and closed at a position above the evaporation source 2. In addition, when the mask 7 is provided, the mask 7 is still heated by the evaporation source 2, and the mask 7 is heated through the heated mask 7. As represented by this example, a configuration in which the evaporation source is heated while changing the relative position of the evaporation source and the substrate in a state where the shutter of the evaporation source is closed is a suitable embodiment of the present invention. With such a configuration, the mask can be efficiently heated in advance in a state where an evaporation source is directly under the substrate, and at the same time, the film can be prevented from being attached to the substrate during the preliminary heating stage. In addition, the shield can be used to shield the vapor emitted from the evaporation source so as not to adhere to the substrate, and it is not necessary to provide the shield.

此外,於本實施例中,係將前述蒸發源移動機構構成為,可使前述蒸發源2移動於與前述蒸鍍區域3、4的並設方向相同的方向(蒸鍍區域移動方向)而從其中一個的蒸鍍區域3往另一個的蒸鍍區域4移動。 In addition, in this embodiment, the evaporation source moving mechanism is configured so that the evaporation source 2 can be moved in the same direction as the juxtaposed directions of the evaporation regions 3 and 4 (moving direction of the evaporation regions), and One of the vapor deposition regions 3 moves to the other vapor deposition region 4.

具體而言,本實施例,係在蒸鍍室1的底面設置延伸於蒸鍍區域移動方向的導軌10,並設置可相對於此導軌10而往返滑動的框狀的蒸鍍區域移動用滑件6。並且,作成在此蒸鍍區域移動用滑件6之上表面設置延伸於成膜移動方向的導軌11,並設置可相對於此導軌11而往返滑動的成膜移動用滑件5,且在此成膜移動用滑件5設置蒸發源2及遮蔽器7的構成。再者,在成膜移動用滑件5的底 面,係連結供於使成膜移動用滑件5移動用的臂件構材12。並且,在蒸鍍室1外部設有驅動此臂件構材12而使成膜移動用滑件5(蒸發源2)移動於成膜移動方向或蒸鍍區域移動方向的控制裝置,而構成蒸發源移動機構。 Specifically, in the present embodiment, a guide rail 10 extending in the moving direction of the vapor deposition area is provided on the bottom surface of the vapor deposition chamber 1, and a frame-shaped vapor deposition area moving slider capable of sliding back and forth relative to the guide rail 10 is provided. 6. In addition, a guide rail 11 extending in the film-forming moving direction is provided on the upper surface of the vapor-deposition-region-moving slider 6, and a film-forming moving slider 5 that can slide back and forth with respect to the guide rail 11 is provided. The film-forming-moving slider 5 is provided with an evaporation source 2 and a mask 7. In addition, on the bottom of the film-forming moving slider 5 The surface is connected to the arm member structure 12 for moving the film-forming movement slider 5. In addition, a control device that drives the arm member 12 to move the film-forming moving slider 5 (evaporation source 2) in the film-forming moving direction or the vapor-depositing area moving direction is provided outside the vapor deposition chamber 1 to constitute evaporation. Source mobile agency.

因此,可使一個蒸發源2,在其中一個的蒸鍍區域3予以往返移動於成膜移動方向而進行事前加熱或成膜後,予以移動於蒸鍍區域移動方向而在另一個的蒸鍍區域4同樣地進行事前加熱或成膜。 Therefore, one evaporation source 2 can be moved back and forth in the vapor deposition moving direction in one of the vapor deposition areas for pre-heating or film formation, and then can be moved in the vapor deposition area moving direction and in the other vapor deposition area. 4 Similarly, pre-heating or film formation is performed.

此外,於本實施例中,係將前述蒸發源移動機構構成為,將分別配置於前述複數個蒸鍍區域3、4的遮罩進行事前加熱時,不使前述蒸發源2退避至前述退避區域下予以移動於前述蒸鍍區域3、4的並設方向,從其中一個的蒸鍍區域3予以移動至另一個的蒸鍍區域4。 In addition, in this embodiment, the evaporation source moving mechanism is configured to prevent the evaporation source 2 from retreating to the retreat area when the masks respectively disposed in the plurality of evaporation regions 3 and 4 are heated in advance. Next, it moves to the juxtaposed direction of the said vapor deposition area 3,4, and moves from one vapor deposition area 3 to the other vapor deposition area 4.

於圖3,以粗線繪示在基板開始蒸鍍後的蒸鍍源2的軌跡。對設置在其中一個的蒸鍍區域3的基板進行成膜的情況下,使蒸發源2,以從夾著蒸鍍區域3而設的2個退避區域中的其中一個退避區域通過蒸鍍區域3直到另一個的退避區域的方式既定次數予以往返移動於導軌10延伸的方向。在往設置於蒸鍍區域3的基板的成膜後對設置於另一個的蒸鍍區域4的基板進行成膜的情況下,係位於蒸鍍區域3外的退避區域的蒸發源2,予以移動於蒸鍍區域移動方向直到到達蒸鍍區域4外的退避區域。並且,重複使蒸發源2,以從夾著蒸鍍區域4而設的2個退避區域中的其中一個退避區域通過蒸鍍區域4直到另一個的退避區 域的方式既定次數予以往返移動於導軌10延伸的方向。作成如此,可對設置於各蒸鍍區域3、4的基板分別進行成膜。 In FIG. 3, the trajectory of the vapor deposition source 2 after the substrate has been vapor-deposited is shown in thick lines. When forming a film on a substrate provided in one of the vapor deposition regions 3, the evaporation source 2 is caused to pass through the vapor deposition region 3 from one of the two retreat regions provided between the vapor deposition regions 3. The way to another retreat area is moved back and forth in the direction in which the guide rail 10 extends a predetermined number of times. In the case where a film is formed on a substrate provided in the vapor deposition region 3 and a substrate provided in another vapor deposition region 4 is formed, the evaporation source 2 located in a retreat area outside the vapor deposition region 3 is moved. Move in the vapor deposition area until it reaches the retreat area outside the vapor deposition area 4. Then, the evaporation source 2 is repeatedly passed so that one of the two retreat areas provided between the vapor deposition areas 4 passes through the vapor deposition area 4 to the other retreat area. The pattern of the field is reciprocated a predetermined number of times in the direction in which the guide rail 10 extends. In this manner, the substrates provided in the vapor deposition regions 3 and 4 can be formed into films, respectively.

相對於此,在圖4以粗線表示在開始蒸鍍前進行遮罩的事前加熱時的蒸鍍源2的軌跡。將設置於其中一個的蒸鍍區域3的遮罩進行事前加熱的情況下,如圖示於圖4,使蒸發源2,在蒸鍍區域3中沿著導軌11而既定次數往返移動於成膜移動方向。之後,將設置於另一個的蒸鍍區域的遮罩進行事前加熱的情況下,係不使蒸鍍源2移動至蒸鍍區域3外方的退避區域下,從蒸鍍區域3的端部予以移動於蒸鍍區域移動方向直到到達另一個的蒸鍍區域4的對應的端部。並且,重複使蒸發源2在蒸鍍區域4既定次數往返於成膜移動方向而將設置於蒸鍍區域4的遮罩進行事前加熱。作成如此,可將遮罩進行事前加熱,直到設置於蒸鍍區域3、4的遮罩熱飽和為止。 On the other hand, the trajectory of the vapor deposition source 2 when the mask is heated in advance before the vapor deposition is started is shown by a thick line in FIG. 4. When the mask provided in one of the vapor deposition areas 3 is heated in advance, as shown in FIG. 4, the evaporation source 2 is moved back and forth along the guide rail 11 in the vapor deposition area 3 a predetermined number of times to form a film. Direction of movement. After that, when a mask provided in another vapor deposition area is heated in advance, the vapor deposition source 2 is not moved to the evacuation area outside the vapor deposition area 3, and is applied from the end of the vapor deposition area 3. It moves in the moving direction of the vapor deposition region until it reaches the corresponding end portion of the other vapor deposition region 4. Then, the evaporation source 2 is repeatedly heated in the vapor deposition region 4 a predetermined number of times to and from the film formation moving direction, and the mask provided in the vapor deposition region 4 is heated in advance. In this way, the mask can be heated in advance until the masks provided in the vapor deposition regions 3 and 4 are thermally saturated.

在進行遮罩的事前加熱時,不同於蒸鍍的情況,作成不使蒸發源2移動往退避區域,使得效率更佳地進行遮罩的事前加熱。 When performing pre-heating of the mask, unlike the case of vapor deposition, it is made not to move the evaporation source 2 to the retreat area, so that the pre-heating of the mask can be performed more efficiently.

如以上所說明,本實施例,係進行蒸鍍時,在開始蒸鍍前將各蒸鍍區域的遮罩分別進行事前加熱,予以熱飽和後,對依次配置於各蒸鍍區域3、4的基板而連續進行蒸鍍。如此成膜,使得蒸鍍中的遮罩的熱變形受到抑制,在蒸鍍中形成於基板上的薄膜的圖案不易變化,可進行穩定而高精度的成膜。 As described above, in the present embodiment, when vapor deposition is performed, the masks in each vapor deposition area are heated in advance before vapor deposition is started, and after heat saturation, the masks disposed in each vapor deposition area 3 and 4 are sequentially heated. The substrate is continuously vapor-deposited. The film formation in this way suppresses thermal deformation of the mask during vapor deposition, prevents the pattern of the thin film formed on the substrate during vapor deposition from changing, and enables stable and highly accurate film formation.

蒸鍍室1的內部係保持真空狀態,使得在開始蒸鍍前將各遮罩進行事前加熱後,係可維持遮罩熱飽和的狀態。因此,連續進行往複數個基板的蒸鍍,仍可進行穩定而高精度的成膜。 The interior of the vapor deposition chamber 1 is maintained in a vacuum state, so that each of the masks is heated in advance before the vapor deposition is started, so that the mask can be maintained in a thermally saturated state. Therefore, it is possible to perform stable and high-precision film formation by continuously vaporizing a plurality of substrates.

另外,本發明,係非限於本實施例等者,各構成要件的具體構成係可適當設計者。 The present invention is not limited to the embodiment and the like, and the specific configuration of each constituent element can be appropriately designed.

接著,說明有關利用本發明相關的真空蒸鍍裝置而製造作為有機電子裝置之例的有機EL顯示裝置的實施例。 Next, an example of manufacturing an organic EL display device as an example of an organic electronic device using the vacuum evaporation device according to the present invention will be described.

首先,說明有關要製造的有機EL顯示裝置。圖5(a)係有機EL顯示裝置40的整體圖,圖5(b)係表示1像素的剖面構造。 First, an organic EL display device to be manufactured will be described. FIG. 5 (a) is an overall view of the organic EL display device 40, and FIG. 5 (b) is a cross-sectional structure of one pixel.

如示於圖5(a),在顯示裝置40的顯示區域41,係矩陣狀地配置複數個具備複數個發光元件的像素42。各發光元件,係具有具備被一對的電極夾住的有機層的構造,細節於後進行說明。另外,此處所謂的像素,係指在顯示區域41中使期望的顏色的顯示為可能的最小單位。本實施例相關的顯示裝置的情況下,透過顯示彼此不同的發光的第1發光元件42R、第2發光元件42G、第3發光元件42B的組合從而構成像素42。像素42,係多以紅色發光元件、綠色發光元件、及藍色發光元件的組合而構成,惟黃色發光元件、青藍發光元件、白色發光元件的組合亦可,只要至少1色以上則非特別限制者。 As shown in FIG. 5 (a), a plurality of pixels 42 including a plurality of light emitting elements are arranged in a matrix in a display area 41 of the display device 40. Each light-emitting element has a structure including an organic layer sandwiched between a pair of electrodes, and details will be described later. The term “pixel” used herein refers to the smallest unit that can display a desired color in the display area 41. In the case of the display device according to the present embodiment, the pixels 42 are configured by a combination of the first light-emitting element 42R, the second light-emitting element 42G, and the third light-emitting element 42B that display mutually different light emission. The pixel 42 is mostly composed of a combination of a red light-emitting element, a green light-emitting element, and a blue light-emitting element. However, a combination of a yellow light-emitting element, a cyan light-emitting element, and a white light-emitting element is also possible. Limiter.

圖5(b),係在圖5(a)的A-B線的部分剖面示意圖。像素42,係具有在基板43上,具備第1電極(陽 極)44、電洞傳輸層45、發光層46R、46G、46B中的任一者、電子傳輸層47、及第2電極(陰極)48的有機EL元件。此等之中,電洞傳輸層45、發光層46R、46G、46B、電子傳輸層47相當於有機層。此外,在本實施形態,發光層46R係發出紅色的有機EL層,發光層46G係發出綠色的有機EL層,發光層46B係發出藍色的有機EL層。發光層46R、46G、46B,係分別形成為對應於發出紅色、綠色、藍色的發光元件(有時亦記述為有機EL元件)的圖案。此外,第1電極44,係按發光元件分離而形成。電洞傳輸層45、電子傳輸層47、第2電極48,係可與複數個發光元件42以共通而形成,亦可按發光元件而形成。另外,為了防止第1電極44與第2電極48因異物而短路,在第1電極44間設有絕緣層49。再者,有機EL層係因水分、氧等而劣化,故設有供於從水分、氧等保護有機EL元件用的保護層50。 Fig. 5 (b) is a schematic partial cross-sectional view taken along the line A-B in Fig. 5 (a). The pixel 42 is provided on the substrate 43 and includes a first electrode (a male Electrode) 44, an organic EL element including a hole transport layer 45, any one of light emitting layers 46R, 46G, and 46B, an electron transport layer 47, and a second electrode (cathode) 48. Among these, the hole transport layer 45, the light emitting layers 46R, 46G, 46B, and the electron transport layer 47 correspond to an organic layer. In this embodiment, the light emitting layer 46R is a red organic EL layer, the light emitting layer 46G is a green organic EL layer, and the light emitting layer 46B is a blue organic EL layer. The light emitting layers 46R, 46G, and 46B are each formed in a pattern corresponding to a light emitting element (also sometimes referred to as an organic EL element) emitting red, green, and blue colors. The first electrode 44 is formed by separating the light emitting elements. The hole-transporting layer 45, the electron-transporting layer 47, and the second electrode 48 may be formed in common with the plurality of light-emitting elements 42, or may be formed according to the light-emitting elements. In order to prevent the first electrode 44 and the second electrode 48 from being short-circuited by a foreign object, an insulating layer 49 is provided between the first electrodes 44. In addition, since the organic EL layer is degraded by moisture, oxygen, and the like, a protective layer 50 is provided for protecting the organic EL element from moisture, oxygen, and the like.

要將有機EL層以發光元件單位而形成,係採用隔著遮罩而成膜的方法。近年來,顯示裝置的高精細化進展,在有機EL層的形成方面係採用開口的寬度為數十μm的遮罩。採用了如此的遮罩的成膜的情況下,遮罩在成膜中從蒸發源受熱而熱變形時遮罩與基板的位置會偏差,形成於基板上的薄膜的圖案會從期望的位置偏差而形成。所以,在此等有機EL層的成膜方面係適合採用本發明相關的真空蒸鍍裝置。 To form the organic EL layer in units of light-emitting elements, a method of forming a film through a mask is used. In recent years, high-definition display devices have been developed, and a mask having an opening width of several tens of μm is used in forming the organic EL layer. When a film is formed using such a mask, the position of the mask and the substrate may be deviated when the mask is heated from the evaporation source during the film formation and thermally deformed, and the pattern of the thin film formed on the substrate may deviate from the desired position. And formed. Therefore, in terms of the film formation of these organic EL layers, it is suitable to use the vacuum evaporation apparatus related to the present invention.

接著,具體說明有關有機EL顯示裝置的製造方法之 例。 Next, a method for manufacturing an organic EL display device will be described in detail. example.

首先,準備形成有供於驅動有機EL顯示裝置用的電路(未圖示)及第1電極44的基板43。 First, a substrate 43 on which a circuit (not shown) for driving an organic EL display device and a first electrode 44 are formed is prepared.

在形成有第1電極44的基板43之上以旋轉塗佈形成丙烯酸樹脂,將丙烯酸樹脂透過光刻法,而圖案化為在形成有第1電極44的部分形成有開口而形成絕緣層49。此開口部相當於發光元件實際發光的發光區域。 An acrylic resin is formed by spin coating on the substrate 43 on which the first electrode 44 is formed, and the acrylic resin is patterned so that an opening is formed in a portion where the first electrode 44 is formed to form an insulating layer 49 by photolithography. This opening corresponds to a light-emitting area where the light-emitting element actually emits light.

將絕緣層49被圖案化的基板43搬入真空蒸鍍裝置,使電洞傳輸層45,成膜為在顯示區域的第1電極44之上共通的層。透過真空蒸鍍而將電洞傳輸層45進行成膜。實際上電洞傳輸層45係形成為比顯示區域41大的尺寸,故不需要高精細的遮罩。 The substrate 43 on which the insulating layer 49 is patterned is carried into a vacuum evaporation apparatus, and the hole transporting layer 45 is formed as a layer common to the first electrode 44 in the display area. The hole transport layer 45 is formed by vacuum evaporation. Actually, the hole transmission layer 45 is formed to have a larger size than the display area 41, so a high-definition mask is not required.

接著,利用蒸鍍遮罩,而在配置發出紅色的元件的部分,將發出紅色的發光層46R進行成膜。首先,將形成有電洞傳輸層45為止的基板43搬入圖1的真空蒸鍍裝置的蒸鍍區域3,進行與具有對應於形成第1發光元件42R的區域的開口的遮罩的位置對準(對準)。 Next, a red-emitting light-emitting layer 46R is formed on the portion where the red-emitting element is disposed by using a vapor deposition mask. First, the substrate 43 to which the hole transport layer 45 is formed is carried into the vapor deposition region 3 of the vacuum vapor deposition apparatus of FIG. 1 and aligned with the position of a mask having an opening corresponding to a region where the first light emitting element 42R is formed. (alignment).

在使用的遮罩非熱飽和的狀態的情況下,存在遮罩在成膜中從蒸發源受熱而熱變形使得遮罩與基板的位置偏差,而無法將發光層46R成膜於期望的位置之虞。所以,在基板43開始蒸鍍前,優選上利用蒸鍍源2的熱進行事前加熱直到遮罩成為熱飽和為止。遮罩是否熱飽和,係確認遮罩的溫度是否穩定,具體而言確認受蒸鍍源2的熱而上升的遮罩的溫度的時間變動是否落入既定的範圍內即 可。既定的範圍,係可依成膜所要求的精度而決定。 In the case where the used mask is not thermally saturated, there is a case where the mask is heated from the evaporation source during the film formation and thermally deformed, causing the position of the mask and the substrate to deviate, and the light-emitting layer 46R cannot be formed at a desired position Yu. Therefore, before the substrate 43 starts vapor deposition, it is preferable to perform pre-heating with the heat of the vapor deposition source 2 until the mask becomes thermally saturated. Whether the mask is thermally saturated is to check whether the temperature of the mask is stable. Specifically, to check whether the time variation of the temperature of the mask that rises due to the heat of the evaporation source 2 falls within a predetermined range, that is, can. The predetermined range can be determined according to the accuracy required for film formation.

另一方面,在蒸鍍源2中係收容是發光層46R的材料的有機EL材料,在供於使有機材料蒸發而予以附著於基板上用的準備方面,進行預熱。預熱,係為了使收容於蒸發源2的成膜材料的熔化狀態穩定化,而以與成膜時的加熱溫度同樣的溫度而數分鐘程度將蒸發源2進行加熱者。成膜材料的熔化狀態是否穩定,係視看利用未圖示的膜厚監控器而獲得的成膜速度(蒸鍍率)的時間變化而判斷即可。成膜材料的熔化狀態是否穩定時,從蒸發源2所放出的成膜材料的蒸氣的量會穩定,故成膜速度的變動落入既定的範圍內。 On the other hand, the organic EL material, which is the material of the light emitting layer 46R, is housed in the vapor deposition source 2 and is preheated for preparation for evaporating the organic material and attaching it to the substrate. Preheating is to heat the evaporation source 2 for several minutes at the same temperature as the heating temperature during film formation in order to stabilize the molten state of the film-forming material contained in the evaporation source 2. Whether or not the molten state of the film forming material is stable may be determined by looking at the time change of the film forming speed (evaporation rate) obtained using a film thickness monitor (not shown). When the melting state of the film-forming material is stable, the amount of vapor of the film-forming material released from the evaporation source 2 is stable, so the variation of the film-forming speed falls within a predetermined range.

在本例中,係利用在蒸發源2的預熱所發出的熱與預熱所需的時間,而進行遮罩的事前加熱。具體而言,在將遮蔽器7關閉使得蒸氣不會附著於基板的狀態下,使蒸鍍源2在蒸鍍區域內往返運動而將遮罩加熱。遮罩的溫度在預熱結束前的期間穩定時,蒸鍍源2的預熱結束並成為可進行成膜的狀態。為了與蒸鍍源2的預熱的結束同時開始成膜,在進行遮罩的事前加熱的期間,先進行基板與遮罩的位置對準時更有效率。另外,預熱結束時遮罩的溫度仍未穩定的情況下,係繼續以蒸鍍源2將遮罩加熱直到遮罩的溫度穩定。 In this example, the preheating of the mask is performed by using the heat generated by the preheating of the evaporation source 2 and the time required for the preheating. Specifically, in a state where the shutter 7 is closed so that vapor does not adhere to the substrate, the vapor deposition source 2 is moved back and forth in the vapor deposition area to heat the mask. When the temperature of the mask is stable during the period before the end of the preheating, the preheating of the vapor deposition source 2 is completed and the film can be formed. In order to start the film formation at the same time as the preheating of the vapor deposition source 2 is completed, it is more efficient when the substrate and the mask are first aligned during the pre-heating of the mask. In addition, when the temperature of the mask is not stable at the end of the preheating, the mask is continuously heated by the evaporation source 2 until the temperature of the mask is stable.

遮罩熱穩定,確認了基板與遮罩的對準結束後,使蒸鍍源2,移動至在導軌10延伸的方向上夾著蒸鍍區域3而設的2個退避區域的其中一者。之後,打開遮蔽器7而 朝向另一個的退避區域開始蒸鍍源2的移動從而使蒸鍍開始,在2個退避區域之間予以往返移動而將發光層46R進行成膜。 The mask is thermally stable. After confirming that the alignment of the substrate and the mask is completed, the vapor deposition source 2 is moved to one of two retreat regions provided between the vapor deposition region 3 in a direction in which the guide rail 10 extends. After that, open the mask 7 and The vapor deposition source 2 is moved toward the other retreat area to start the vapor deposition, and the light-emitting layer 46R is formed by moving back and forth between the two retreat areas.

如此,依本例時,在發光層46R的成膜中遮罩不會變形,故可將發光層46R以既定的圖案成膜於基板之上。再者,不僅不另外需要加熱設備亦不需要僅為了遮罩的事前加熱而耗費時間。亦即,邊進行蒸發源2的預熱,邊利用在預備加熱中產生的熱、為了預熱的待機時間等,而變得極有效率地進行遮罩的事前加熱。 Thus, according to this example, the mask is not deformed during the film formation of the light emitting layer 46R, so the light emitting layer 46R can be formed on the substrate in a predetermined pattern. Furthermore, it does not require additional heating equipment, nor does it need to consume time just for pre-heating the mask. That is, while preheating the evaporation source 2, the heat generated during the preheating, the standby time for preheating, and the like are used to efficiently perform pre-heating of the mask.

接著,如同發光層46R的成膜,使用具有對應於形成第2發光元件42G的區域的開口的遮罩,將發出綠色的發光層46G進行成膜。接著,使用具有對應於形成第3發光元件42B的區域的開口的遮罩,將發出藍色的發光層46B進行成膜。在將發光層46G、46B分別成膜時,係如同在將發光層46R進行成膜前所進行者使蒸鍍源2相對於遮罩而移動,確認遮罩熱飽和後開始成膜。 Next, like the film formation of the light emitting layer 46R, a green light emitting layer 46G is formed using a mask having an opening corresponding to a region where the second light emitting element 42G is formed. Next, a blue light-emitting layer 46B is formed using a mask having an opening corresponding to a region where the third light-emitting element 42B is formed. When the light-emitting layers 46G and 46B are formed into films, the vapor deposition source 2 is moved relative to the mask, as before the film formation of the light-emitting layer 46R, and the film formation is started after confirming that the mask is thermally saturated.

一度使用於發光層46R、46G、46B各者的成膜的遮罩,係在真空的蒸鍍室待機直到設置下個基板。因此,遮罩的熱係透過真空而保持,故維持遮罩的熱飽和狀態。因此,變得可省略對於下個基板開始成膜前的遮罩的事前加熱。如果,在使遮罩與基板對準而接觸時,遮罩的熱漏往基板,遮罩的溫度下降的情況、變更蒸鍍膜的成膜速率的情況等下,係在開始對重新設置的基板進行蒸鍍前,作成同樣而利用來自蒸鍍源2的熱對遮罩進行事前加熱即可。 The masks that were once used for film formation of each of the light-emitting layers 46R, 46G, and 46B were placed in a vacuum evaporation chamber and waited until the next substrate was set. Therefore, since the heat of the mask is maintained through the vacuum, the thermal saturation state of the mask is maintained. Therefore, it is possible to omit the pre-heating of the mask before the next substrate starts film formation. When the mask and the substrate are brought into alignment and contact, the heat of the mask leaks to the substrate, the temperature of the mask decreases, and the deposition rate of the vapor-deposited film is changed. Before the vapor deposition, the mask may be heated in advance in the same manner as the heat from the vapor deposition source 2.

發光層46G、46B的成膜結束後,對顯示區域41的整體將電子傳輸層47進行成膜。電子傳輸層47,係形成為第1至第3發光層共通的層。 After the film formation of the light emitting layers 46G and 46B is completed, the electron transport layer 47 is formed on the entire display area 41. The electron transport layer 47 is a layer that is common to the first to third light emitting layers.

將形成有至電子傳輸層47為止的基板移動至濺鍍裝置,將第2電極48進行成膜,之後移動至電漿CVD裝置而將保護層50進行成膜,從而完成有機EL顯示裝置40。 The substrate on which the electron transport layer 47 is formed is moved to a sputtering device, a second electrode 48 is formed, and then the plasma CVD device is moved to form a protective layer 50 to complete the organic EL display device 40.

將絕緣層49被圖案化的基板43搬入真空蒸鍍裝置直到保護層50的成膜結束為止,係曝露於包含水分、氧等的環境時,存在由有機EL材料所成的發光層因水分、氧等而劣化之虞。因此,於本例中,成膜裝置間的基板的搬入搬出,係在真空環境或惰性氣體環境下進行。 The substrate 43 with the insulating layer 49 patterned is carried into a vacuum evaporation device until the formation of the protective layer 50 is completed. When the substrate is exposed to an environment containing moisture, oxygen, etc., there is a light-emitting layer made of an organic EL material. Oxygen may deteriorate. Therefore, in this example, the loading and unloading of the substrate between the film forming apparatuses is performed in a vacuum environment or an inert gas environment.

在上述例中,係在發光層的成膜時,進行遮罩的事前加熱,惟在形成其他層時,亦可進行遮罩的事前加熱。 In the above example, the mask is heated in advance during film formation of the light-emitting layer, but the mask may be heated beforehand in forming other layers.

如此而獲得的有機EL顯示裝置,係可按發光元件而精度佳地形成發光層。因此,使用上述製造方法時,可抑制因發光層的位置偏差而起的有機EL顯示裝置的不良的發生。 The organic EL display device thus obtained can form a light-emitting layer with high accuracy for a light-emitting element. Therefore, when the above-mentioned manufacturing method is used, it is possible to suppress the occurrence of defects in the organic EL display device due to the positional deviation of the light emitting layer.

另外,於此,係雖論述有關有機EL顯示裝置的製造方法,惟不限於此,有關在蒸鍍時利用遮罩而形成有機層的圖案的所有的有機電子裝置的製造方法皆同樣地可應用本發明。此外,不限於有機膜,有關無機膜的形成亦同樣地可應用本發明。 In addition, although the manufacturing method of the organic EL display device is discussed here, it is not limited to this. All the manufacturing methods of the organic electronic device regarding the pattern of the organic layer formed by using a mask during vapor deposition are equally applicable. this invention. The invention is not limited to an organic film, and the invention can be applied to the formation of an inorganic film.

Claims (12)

一種真空蒸鍍裝置,在蒸鍍室,設有隔著遮罩而對基板進行蒸鍍的蒸發源、及在進行蒸鍍時使前述蒸發源相對於前述基板而移動的蒸發源移動機構或在進行蒸鍍時使前述基板相對於前述蒸發源而移動的基板移動機構,特徵在於:前述蒸發源移動機構或前述基板移動機構被構成為,在開始往前述基板的蒸鍍前,利用前述蒸發源進行前述遮罩的事前加熱。A vacuum evaporation device is provided in an evaporation chamber with an evaporation source for vapor deposition of a substrate through a mask, and an evaporation source moving mechanism for moving the evaporation source with respect to the substrate during vapor deposition or an evaporation source moving mechanism. The substrate moving mechanism that moves the substrate with respect to the evaporation source during vapor deposition is characterized in that the evaporation source moving mechanism or the substrate moving mechanism is configured to use the evaporation source before starting evaporation to the substrate. The aforementioned mask is heated beforehand. 如申請專利範圍第1項之真空蒸鍍裝置,其中,在供於使從前述蒸發源蒸發的成膜材料的成膜速度穩定化用的蒸鍍前的預備加熱中利用從此蒸發源所發出的熱而進行前述遮罩的事前加熱。The vacuum vapor deposition device according to item 1 of the patent application, wherein the preheating before vapor deposition for stabilizing the film-forming speed of the film-forming material evaporated from the evaporation source is utilized from the evaporation source. The pre-heating of the mask is performed by heating. 如申請專利範圍第1項之真空蒸鍍裝置,其中,在前述蒸發源設置遮蔽器,並構成為在將此遮蔽器關閉的狀態下使前述蒸發源與前述遮罩的相對的位置關係變化而進行前述遮罩的事前加熱。For example, in the vacuum evaporation device according to the first item of the patent application, a mask is provided on the evaporation source, and the relative positional relationship between the evaporation source and the mask is changed while the mask is closed. The aforementioned mask is heated beforehand. 如申請專利範圍第1項之真空蒸鍍裝置,其中,將前述蒸發源移動機構或前述基板移動機構構成為,最初進行蒸鍍的基板與遮罩的位置對準,係與前述遮罩的事前加熱併行而進行。For example, in the vacuum vapor deposition device according to the scope of application for the first item, the evaporation source moving mechanism or the substrate moving mechanism is configured such that the position of the substrate to be vapor-deposited initially and the mask are aligned with the mask beforehand. Heating was performed in parallel. 如申請專利範圍第1~4項中任1項之真空蒸鍍裝置,其中,在與前述蒸發源的移動方向正交的方向上並置複數個供於在前述蒸鍍室對前述基板進行蒸鍍用的蒸鍍區域,對複數個前述蒸鍍區域之各者,在前述蒸鍍區域外,設置使前述蒸發源退避的退避區域,前述蒸發源移動機構被構成為,可使前述蒸發源移動於與前述蒸鍍區域的並設方向相同的方向而從其中一個的蒸鍍區域往另一個的蒸鍍區域移動,前述蒸發源移動機構被構成為,在將分別配置於前述複數個蒸鍍區域的遮罩進行事前加熱時,將配置於其中一個的蒸鍍區域的遮罩進行加熱後,不使前述蒸發源退避至前述退避區域下予以移動於前述蒸鍍區域的並設方向而移動至另一個的蒸鍍區域。For example, the vacuum evaporation device according to any one of the claims 1 to 4, in which a plurality of substrates are juxtaposed in a direction orthogonal to the moving direction of the evaporation source for vapor deposition of the substrate in the vapor deposition chamber. A vapor deposition area for each of the plurality of vapor deposition areas is provided with a retreat area for retreating the evaporation source outside the vapor deposition area, and the evaporation source moving mechanism is configured to move the evaporation source to The evaporation source moving mechanism is configured to move from one of the vapor deposition regions to the other vapor deposition region in the same direction as the direction in which the vapor deposition regions are arranged in parallel. When the mask is heated in advance, after heating the mask disposed in one of the evaporation regions, the mask is moved to the other side of the evaporation region without moving away from the evaporation source to the escape region, and moved to the other one. Evaporation area. 一種真空蒸鍍裝置,在蒸鍍室,設有隔著遮罩而對基板進行蒸鍍的蒸發源、及在進行蒸鍍時使前述基板的長邊方向或寬度方向中的任一者為成膜移動方向而使前述蒸發源往返移動於此成膜移動方向,特徵在於:前述蒸發源移動機構被構成為,開始在維持前述蒸鍍室的真空狀態下對複數個前述基板連續進行蒸鍍的連續蒸鍍前,使前述蒸發源相對於前述遮罩而移動從而進行前述遮罩的事前加熱。A vacuum vapor deposition device is provided in an evaporation chamber with an evaporation source for vapor deposition of a substrate through a mask, and during vapor deposition, any one of a longitudinal direction and a width direction of the substrate is formed. The film moving direction causes the evaporation source to move back and forth in this film forming moving direction, and the evaporation source moving mechanism is configured to start continuously vapor-depositing a plurality of the substrates while maintaining a vacuum state of the evaporation chamber. Prior to continuous evaporation, the evaporation source is moved relative to the mask to perform pre-heating of the mask. 一種蒸鍍膜之製造方法,特徵在於:具有:將基板設置於蒸鍍室的程序;將收容於蒸發源的成膜材料進行加熱而使成膜速度穩定的程序;以及隔著遮罩使前述蒸鍍材料的蒸氣附著於前述基板的程序;其中,在使前述成膜速度穩定的程序之期間使前述蒸發源與前述基板的相對的位置關係變化,透過前述蒸發源的熱而將前述遮罩加熱。A method for manufacturing a vapor-deposited film, comprising: a process of setting a substrate in a vapor deposition chamber; a process of heating a film-forming material stored in an evaporation source to stabilize a film-forming speed; and a method for making the vapor-deposition through a mask A process of attaching vapor of a plating material to the substrate, wherein the relative positional relationship between the evaporation source and the substrate is changed during the process of stabilizing the film formation speed, and the mask is heated by the heat of the evaporation source . 如申請專利範圍第7項之蒸鍍膜的製造方法,其中,透過前述蒸發源的熱而將前述遮罩加熱的期間,將前述蒸鍍材料的蒸氣,遮蔽成不會附著於前述基板。For example, in the method for manufacturing a vapor-deposited film according to item 7 of the scope of patent application, the vapor of the vapor-deposited material is shielded from being attached to the substrate while the mask is heated by the heat of the evaporation source. 如申請專利範圍第8項之蒸鍍膜的製造方法,其中,將前述遮罩,在使前述成膜材料的蒸氣附著於前述基板的程序前,加熱直到前述遮罩的溫度穩定。For example, in the method for producing a vapor-deposited film according to item 8 of the patent application, the mask is heated until the temperature of the mask is stabilized before the procedure of attaching the vapor of the film-forming material to the substrate. 一種有機電子裝置的製造方法,該有機電子裝置係在基板之上具備複數個具備夾著一對的電極的有機層的元件,特徵在於:具有:將形成有複數個電極的基板設置於蒸鍍室的程序;將具備複數個開口的遮罩,對於前述基板進行位置對準的程序;將收容於蒸發源的成膜材料進行加熱而使成膜速度穩定的程序;以及隔著前述遮罩使前述成膜材料的蒸氣附著於前述基板上,形成前述有機層的至少一部分的程序;其中,在使前述成膜速度穩定的程序之期間使前述蒸發源與前述基板的相對的位置關係變化,透過前述蒸發源的熱而將前述遮罩加熱。A method for manufacturing an organic electronic device. The organic electronic device includes an element having a plurality of organic layers sandwiching a pair of electrodes on a substrate, and is characterized in that the substrate includes a substrate on which a plurality of electrodes are formed. A procedure of a chamber; a procedure of aligning the substrate with a mask having a plurality of openings; a procedure of heating a film-forming material stored in an evaporation source to stabilize the film-forming speed; and A process of adhering vapor of the film-forming material to the substrate to form at least a part of the organic layer; wherein the relative positional relationship between the evaporation source and the substrate is changed during the process of stabilizing the film-forming speed, and transmitted The mask is heated by the heat of the evaporation source. 如申請專利範圍第10項的有機電子裝置的製造方法,其中,透過前述蒸發源的熱而將前述遮罩加熱的期間,將前述蒸鍍材料的蒸氣,遮蔽成不會附著於前述基板。According to the method for manufacturing an organic electronic device according to claim 10, the vapor of the vapor deposition material is shielded from being adhered to the substrate while the mask is heated by the heat of the evaporation source. 如申請專利範圍第11項的有機電子裝置的製造方法,其中,將前述遮罩,在使前述蒸鍍材料的蒸氣附著於前述基板的程序前,加熱直到前述遮罩的溫度穩定。According to the method for manufacturing an organic electronic device according to claim 11, wherein the mask is heated until the temperature of the mask is stabilized before the procedure of attaching the vapor of the vapor deposition material to the substrate.
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