TWI647303B - Detergent composition for resin mask layer and manufacturing method of circuit board - Google Patents

Detergent composition for resin mask layer and manufacturing method of circuit board Download PDF

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TWI647303B
TWI647303B TW103131435A TW103131435A TWI647303B TW I647303 B TWI647303 B TW I647303B TW 103131435 A TW103131435 A TW 103131435A TW 103131435 A TW103131435 A TW 103131435A TW I647303 B TWI647303 B TW I647303B
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mass
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carbon atoms
detergent composition
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TW201516143A (en
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岡村真美
高田真吾
長沼純
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日商花王股份有限公司
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/10Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
    • H05K3/108Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern by semi-additive methods; masks therefor
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D1/00Detergent compositions based essentially on surface-active compounds; Use of these compounds as a detergent
    • C11D1/38Cationic compounds
    • C11D1/645Mixtures of compounds all of which are cationic
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D2111/00Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
    • C11D2111/10Objects to be cleaned
    • C11D2111/14Hard surfaces
    • C11D2111/22Electronic devices, e.g. PCBs or semiconductors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/11Manufacturing methods
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/01Dielectrics
    • H05K2201/0137Materials
    • H05K2201/0175Inorganic, non-metallic layer, e.g. resist or dielectric for printed capacitor

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  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
  • Wood Science & Technology (AREA)
  • Organic Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Detergent Compositions (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Cleaning By Liquid Or Steam (AREA)

Abstract

本發明提供一種樹脂遮罩層(樹脂膜)之殘留降低與焊料腐蝕之抑制得以提高之樹脂遮罩層用洗淨劑組合物、及使用該組合物之電路基板之製造方法。於一態樣中,用於電路基板之製造之樹脂遮罩層用洗淨劑組合物於該洗淨劑組合物100質量份中,含有氫氧化四級銨(成分A)0.5質量份以上且3.0質量份以下,含有水溶性胺(成分B)3.0質量份以上且14.0質量份以下,含有酸或其銨鹽(成分C)0.3質量份以上且2.5質量份以下,含有水(成分D)50.0質量份以上且95.0質量份以下。 The present invention provides a detergent composition for a resin masking layer with reduced residue of a resin masking layer (resin film) and suppression of solder corrosion, and a method for manufacturing a circuit board using the same. In one aspect, 100 parts by mass of the detergent composition for a resin masking layer used in the manufacture of a circuit board contains 0.5 part by mass or more of quaternary ammonium hydroxide (component A) and 3.0 parts by mass or less, containing 3.0 parts by mass or more and 14.0 parts by mass of water-soluble amine (component B), 0.3 parts by mass or more and 2.5 parts by mass or less of acid or its ammonium salt (component C), and 50.0 parts of water (component D) Part by mass or more and 95.0 parts by mass or less.

Description

樹脂遮罩層用洗淨劑組合物及電路基板之製造方法 Detergent composition for resin mask layer and manufacturing method of circuit board

本發明係關於一種樹脂遮罩層用洗淨劑組合物及電路基板之製造方法。 The present invention relates to a cleaning composition for a resin masking layer and a method for manufacturing a circuit board.

近年來,關於電子構件向印製電路配線板或陶瓷基板之安裝,高密度化之要求在逐年增加,作為滿足該要求之方式,裸片(bare chip)安裝方式受到了關注。於裸片安裝方式中,存在代替藉由引線接合而實現晶片與基板配線之電連接之先前之face-up安裝,而廣泛採用藉由金屬凸塊而實現之face-down安裝之傾向。根據藉由金屬凸塊進行face-down安裝之即所謂金屬凸塊法,可期待在電子構件間形成低電阻連接。 In recent years, regarding mounting of electronic components on printed circuit wiring boards or ceramic substrates, the demand for higher density has been increasing year by year. As a method to meet this requirement, bare chip mounting methods have attracted attention. In the bare chip mounting method, there is a tendency to widely use face-down mounting by metal bumps instead of the previous face-up mounting to realize the electrical connection between the chip and the substrate wiring by wire bonding. According to the so-called metal bump method of face-down mounting by a metal bump, a low-resistance connection between electronic components can be expected.

專利文獻1中,作為光致抗蝕劑之剝離液,揭示有由含有特定之氫氧化四級銨、水溶性胺及羥基胺類之水溶液形成之剝離液。 Patent Document 1 discloses a stripping solution made of an aqueous solution containing a specific quaternary ammonium hydroxide, a water-soluble amine, and a hydroxylamine as a stripping solution for a photoresist.

專利文獻2中,揭示有可同時洗淨含有苄醇、胺化合物與水之焊料助劑及乾膜抗蝕劑之兩用洗淨劑。 Patent Document 2 discloses a dual-purpose cleaner capable of simultaneously cleaning a solder auxiliary agent containing benzyl alcohol, an amine compound, and water and a dry film resist.

[先前技術文獻] [Prior technical literature] [專利文獻] [Patent Literature]

專利文獻1:日本專利特開2002-62668號公報 Patent Document 1: Japanese Patent Laid-Open No. 2002-62668

專利文獻2:日本專利特開2007-224165號公報 Patent Document 2: Japanese Patent Laid-Open No. 2007-224165

於金屬凸塊法中,期望為了凸塊形成而使用之乾膜等樹脂遮罩層(樹脂膜)之去除率獲得提高。其原因在於:若於基板表面殘存樹脂遮罩層(樹脂膜),則難以實施良好之電子構件安裝。 In the metal bump method, it is desirable to improve the removal rate of a resin masking layer (resin film) such as a dry film used for bump formation. The reason is that if a resin masking layer (resin film) remains on the substrate surface, it is difficult to implement good electronic component mounting.

若為了凸塊形成而加熱具有樹脂遮罩層之電路基板,則樹脂遮罩層因熱而發生高分子量化。專利文獻1之光致抗蝕劑(樹脂遮罩層)之洗淨劑存在對於高分子量化後之樹脂遮罩層之洗淨性不充分之情況。又,對於焊料之防腐蝕而言不充分。專利文獻2中,期望焊料助劑及乾膜抗蝕劑之洗淨性進一步提高。 When a circuit board having a resin shielding layer is heated for the formation of bumps, the resin shielding layer has a high molecular weight due to heat. The cleaning agent of the photoresist (resin masking layer) of Patent Document 1 may be insufficient for the cleaning performance of the resin masking layer after the high molecular weight. In addition, it is insufficient for the corrosion prevention of solder. In Patent Document 2, it is desired to further improve the detergency of the solder auxiliary agent and the dry film resist.

因此,本發明之一方案中,提供一種經加熱處理後之樹脂遮罩層(樹脂膜)之殘留降低及焊料腐蝕之抑制獲得提高之樹脂遮罩層用洗淨劑組合物。 Therefore, in one aspect of the present invention, there is provided a detergent composition for a resin masking layer in which the residue of the resin masking layer (resin film) after heat treatment is reduced and the suppression of solder corrosion is improved.

本發明之一方案中,係關於樹脂遮罩層用洗淨劑組合物,該樹脂遮罩層用洗淨劑組合物於洗淨劑組合物100質量份中,含有下述式(I)所表示之氫氧化四級銨(成分A)0.5質量份以上且3.0質量份以下,含有水溶性胺(成分B)3.0質量份以上且10.0質量份以下,含有酸或其銨鹽(成分C)0.3質量份以上且2.5質量份以下,含有水(成分D)50.0質量份以上且95.0質量份以下。 One aspect of the present invention relates to a detergent composition for a resin masking layer. The detergent composition for a resin masking layer contains 100 parts by mass of the detergent composition and contains the following formula (I): The quaternary ammonium hydroxide (component A) represented by 0.5 parts by mass or more and 3.0 parts by mass or less, containing 3.0 parts by mass or more and 10.0 parts by mass or less of water-soluble amine (component B), and containing an acid or its ammonium salt (component C) 0.3 Part by mass or more and 2.5 parts by mass or less, and containing 50.0 parts by mass or more and 95.0 parts by mass or less of water (component D).

(式中,R1、R2、R3各自相同或不同,為碳數1~4之烷基,R4為碳數1~4之烷基或碳數1~4之羥基取代烷基) (In the formula, R 1 , R 2 , and R 3 are the same or different, and are alkyl groups having 1 to 4 carbons; R 4 is alkyl groups having 1 to 4 carbons or hydroxy-substituted alkyl groups having 1 to 4 carbons)

本發明之另一方案中,係關於包括下述步驟(1)~(5)之電路基板 之製造方法。 Another aspect of the present invention relates to a circuit board including the following steps (1) to (5) Of manufacturing method.

步驟(1):於設置有焊接部之基板表面形成樹脂遮罩層之步驟。 Step (1): a step of forming a resin masking layer on the surface of the substrate provided with the soldering portion.

步驟(2):於上述樹脂遮罩層中以露出上述焊接部之方式形成開口部之步驟。 Step (2): A step of forming an opening portion in the resin mask layer so that the welding portion is exposed.

步驟(3):於上述開口部填充焊料凸塊形成材料之步驟。 Step (3): A step of filling the above-mentioned opening with a solder bump forming material.

步驟(4):加熱使上述焊料凸塊形成材料熔融,藉此使焊料凸塊固定於上述焊接部之步驟。 Step (4): a step of melting the solder bump forming material by heating to fix the solder bump to the soldered portion.

步驟(5):使用本發明之樹脂遮罩層用洗淨劑組合物對步驟(4)中獲得之基板加以洗淨之步驟。 Step (5): A step of cleaning the substrate obtained in step (4) using the detergent composition for a resin masking layer of the present invention.

根據本發明之樹脂遮罩層用洗淨劑組合物及電路基板之製造方法,於使用乾膜等樹脂遮罩層(樹脂膜)於電路基板之焊接部(例如電極等)將焊料凸塊固定時,可同時實現焊料凸塊之加熱處理(回焊)後之樹脂遮罩層(樹脂膜)之去除之促進與焊料腐蝕之抑制,並可實現可使焊料連接可靠性提高般之效果。 According to the detergent composition for a resin masking layer and the method for manufacturing a circuit board of the present invention, a solder masking layer (resin film) such as a dry film is used to fix a solder bump to a soldering portion (such as an electrode) of a circuit board. At the same time, the removal of the resin masking layer (resin film) after the heating treatment (reflow) of the solder bump can be achieved at the same time, and the solder corrosion can be suppressed, and the effect of improving the reliability of solder connection can be achieved.

1‧‧‧基板 1‧‧‧ substrate

2‧‧‧電極 2‧‧‧ electrode

3‧‧‧阻焊膜 3‧‧‧solder mask

4‧‧‧樹脂遮罩層 4‧‧‧ resin masking layer

5‧‧‧焊料凸塊形成材料 5‧‧‧Solder bump forming material

6‧‧‧焊料凸塊 6‧‧‧solder bump

7‧‧‧開口部 7‧‧‧ opening

圖1(a)~(e)係表示本發明之電路基板之製造方法之一個或複數個實施形態之概略步驟說明圖。 1 (a) to (e) are explanatory diagrams showing the outline steps of one or more embodiments of the method for manufacturing a circuit board of the present invention.

圖2係利用FE-SEM對於實施例10及比較例1之洗淨劑組合物中將安裝有焊料之基板於50℃下浸漬20分鐘前後之焊料表面觀察有無腐蝕之照片之一例。 FIG. 2 is an example of the presence or absence of corrosion observed on the solder surface before and after immersion at 50 ° C. for 20 minutes in the detergent composition of Example 10 and Comparative Example 1 using the FE-SEM.

本發明之一方案係基於如下之見解而完成,即,於利用樹脂遮罩法在焊接部形成焊料凸塊後,對經加熱處理之樹脂遮罩層進行剝離時,藉由使用含有氫氧化四級銨(成分A)、水溶性胺(成分B)、酸或其銨鹽(成分C)及水(成分D)之洗淨劑組合物,可有效地去除因加熱變得 難以剝離之樹脂遮罩層,進而可抑制焊料腐蝕,藉此可提高焊料連接可靠性。 One aspect of the present invention is based on the insight that when a solder bump is formed on a soldered portion by a resin masking method, the resin masking layer subjected to heat treatment is peeled off by using a solution containing tetrahydroxide. Detergent composition of grade ammonium (component A), water-soluble amine (component B), acid or its ammonium salt (component C), and water (component D) can effectively remove The hard-to-peel resin masking layer can suppress solder corrosion, thereby improving solder connection reliability.

即,本發明之一方案係關於一種樹脂遮罩層用洗淨劑組合物(以下亦稱為「本發明之洗淨劑組合物」),該樹脂遮罩層用洗淨劑組合物於洗淨劑組合物100質量份中,含有下述式(I)所表示之氫氧化四級銨(成分A)0.5質量份以上且3質量份以下,含有水溶性胺(成分B)3質量份以上且10質量份以下,含有酸或其銨鹽(成分C)0.3質量份以上且2.5質量份以下,含有水(成分D)50質量份以上且95質量份以下。 That is, one aspect of the present invention relates to a detergent composition for a resin masking layer (hereinafter also referred to as a "detergent composition of the present invention"). 100 parts by mass of the detergent composition contains 0.5 to 3 parts by mass of quaternary ammonium hydroxide (component A) represented by the following formula (I) and 3 to parts by mass of water-soluble amine (component B) 10 mass parts or less, containing an acid or its ammonium salt (component C) of 0.3 mass parts or more and 2.5 mass parts or less, and containing water (component D) of 50 mass parts or more and 95 mass parts or less.

(式中,R1、R2、R3各自相同或不同,為碳數1~4之烷基,R4為碳數1~4之烷基或碳數1~4之羥基取代烷基) (In the formula, R 1 , R 2 , and R 3 are the same or different, and are alkyl groups having 1 to 4 carbons; R 4 is alkyl groups having 1 to 4 carbons or hydroxy-substituted alkyl groups having 1 to 4 carbons)

於本發明之洗淨劑組合物中,提高樹脂遮罩層之去除性之作用機制雖然並不清楚,但推測為如下機制。可認為:就氫氧化四級銨(成分A)及水溶性胺(成分B)而言,其利用鹼成分切斷因焊膏、焊劑助劑成分中所含之酸成分或加熱而發生了高分子量化之樹脂遮罩(抗蝕膜),藉此進行低分子量化。又,可認為水溶性胺(成分B)及水(成分D)浸透於低分子量化後之抗蝕膜中,可溶解去除。又,推斷出雖然作為焊料之主要成分之錫(Sn)溶解於強鹼水溶液,但因酸或其銨鹽(成分C)而抑制了溶解反應。 In the detergent composition of the present invention, although the action mechanism for improving the removability of the resin masking layer is not clear, it is presumed to be the following mechanism. It can be considered that, with regard to quaternary ammonium hydroxide (component A) and water-soluble amine (component B), the use of an alkali component to cut off the acid component contained in the solder paste and the flux auxiliary component, or the occurrence of high heating occurs. Reducing the molecular weight of the resin mask (resist film). In addition, it is considered that the water-soluble amine (component B) and water (component D) are impregnated into the resist film after being reduced in molecular weight and can be dissolved and removed. In addition, it is inferred that although tin (Sn), which is a main component of solder, is dissolved in a strong alkaline aqueous solution, the dissolution reaction is suppressed by the acid or its ammonium salt (component C).

[成分A] [Ingredient A]

於一個或複數個實施形態中,作為本發明之洗淨劑組合物之成分A即氫氧化四級銨,可例示出由陽離子與氫氧化物形成之鹽等。 又,於一個或複數個實施形態中,作為陽離子,可列舉:四甲基胺、四乙基銨、四(正或異)丙基銨、四(正或異)丁基銨、四戊基銨、四己基銨、三甲基乙基銨等四烷基銨陽離子(烷基之碳數為1~6),又,可列舉:三甲基(2-羥基乙基)銨及三乙基(2-羥基乙基)銨等具有羥基烷基之烷基銨陽離子(烷基之碳數為1~6)。其中,就提高樹脂遮罩層去除性及抑制焊料之腐蝕之觀點而言,較佳為四甲基銨。作為氫氧化四級銨,具體而言,可列舉;四甲基氫氧化銨、四乙基氫氧化銨、四丙基氫氧化銨、四丁基氫氧化銨、四戊基氫氧化銨、四己基氫氧化銨銨、三甲基乙基氫氧化銨、三甲基(2-羥基乙基)氫氧化銨、三乙基(2-羥基乙基)氫氧化銨等。其中,就提高樹脂遮罩層去除性及抑制焊料腐蝕之觀點而言,較佳為四甲基氫氧化銨。於一個或複數個實施形態中,本發明之洗淨劑組合物含有一種或複數種成分A。 In one or more embodiments, as the component A of the detergent composition of the present invention, that is, quaternary ammonium hydroxide, a salt formed from a cation and a hydroxide can be exemplified. In one or more embodiments, examples of the cation include tetramethylamine, tetraethylammonium, tetra (n- or iso) propylammonium, tetra (n- or iso) butylammonium, and tetrapentyl. Tetraalkylammonium cations such as ammonium, tetrahexylammonium, and trimethylethylammonium (carbon number of the alkyl group is 1 to 6), and examples include trimethyl (2-hydroxyethyl) ammonium and triethyl Alkyl ammonium cations having a hydroxyalkyl group such as (2-hydroxyethyl) ammonium (carbon number of the alkyl group is 1 to 6). Among these, tetramethylammonium is preferred from the viewpoints of improving the removability of the resin mask layer and suppressing corrosion of the solder. Specific examples of the quaternary ammonium hydroxide include tetramethylammonium hydroxide, tetraethylammonium hydroxide, tetrapropylammonium hydroxide, tetrabutylammonium hydroxide, tetrapentylammonium hydroxide, and Hexyl ammonium hydroxide, trimethyl ethyl ammonium hydroxide, trimethyl (2-hydroxyethyl) ammonium hydroxide, triethyl (2-hydroxyethyl) ammonium hydroxide, and the like. Among these, tetramethylammonium hydroxide is preferred from the viewpoint of improving the removability of the resin mask layer and suppressing solder corrosion. In one or more embodiments, the detergent composition of the present invention contains one or more ingredients A.

關於本發明之洗淨劑組合物中之成分A即氫氧化四級銨之含量,於洗淨劑組合物100質量份中,為0.5質量份以上,就提高樹脂遮罩層去除性及抑制焊料腐蝕之觀點而言,較佳為0.7質量份以上。又,就同樣之觀點而言,於洗淨劑組合物100質量份中,作為成分A之氫氧化四級銨之含量為3.0質量份以下,較佳為2.0質量份以下,更佳為1.5質量份以下。 Regarding the content of the component A in the detergent composition of the present invention, that is, the content of quaternary ammonium hydroxide, it is 0.5 parts by mass or more in 100 parts by mass of the detergent composition, thereby improving the removal ability of the resin mask layer and suppressing solder From the viewpoint of corrosion, it is preferably 0.7 parts by mass or more. From the same viewpoint, the content of quaternary ammonium hydroxide as component A in 100 parts by mass of the detergent composition is 3.0 parts by mass or less, preferably 2.0 parts by mass or less, and more preferably 1.5 parts by mass. The following.

[成分B] [Ingredient B]

於一個或複數個實施形態中,作為本發明之洗淨劑組合物之成分B即水溶性胺,可列舉:烷基胺、烷醇胺、多胺、環式胺等,就提高樹脂遮罩層去除性及抑制焊料之腐蝕之觀點而言,較佳為烷醇胺。於一個或複數個實施形態中,作為烷醇胺,可例示:單乙醇胺、N-乙基乙醇胺、N-正丁基乙醇胺、N,N-二乙基乙醇胺、N,N-二丁基乙醇胺、N-第三丁基乙醇胺、N-甲基乙醇胺等。其中,就提高樹脂遮罩層去除性及抑制焊料之腐蝕之觀點而言,較佳為單乙醇胺。於一個或複 數個實施形態中,本發明之洗淨劑組合物含有一種或複數種成分B。 In one or more embodiments, as the component B of the detergent composition of the present invention, that is, the water-soluble amine, alkyl amines, alkanolamines, polyamines, and cyclic amines can be used to improve the resin mask. From the viewpoint of layer removability and suppression of solder corrosion, an alkanolamine is preferred. In one or more embodiments, examples of the alkanolamine include monoethanolamine, N-ethylethanolamine, N-n-butylethanolamine, N, N-diethylethanolamine, and N, N-dibutylethanolamine. , N-third butylethanolamine, N-methylethanolamine and the like. Among these, monoethanolamine is preferred from the viewpoint of improving the removability of the resin mask layer and suppressing corrosion of the solder. In one or more In several embodiments, the detergent composition of the present invention contains one or a plurality of components B.

於一個或複數個實施形態中,作為成分B之水溶性胺較佳為下述式(II)所表示之胺化合物。 In one or more embodiments, the water-soluble amine as the component B is preferably an amine compound represented by the following formula (II).

(式中,R5為氫原子、羥基、碳數1~6之烴基、碳數1~6之羥基烷基、或碳數1~6之胺基烷基,R6、R7各自相同或不同,為氫原子、碳數1~6之烴基、碳數1~6之羥基烷基、或碳數1~6之胺基烷基,R5、R6、R7並不同時為氫原子) (Wherein R 5 is a hydrogen atom, a hydroxyl group, a hydrocarbon group having 1 to 6 carbon atoms, a hydroxy alkyl group having 1 to 6 carbon atoms, or an amino alkyl group having 1 to 6 carbon atoms, and R 6 and R 7 are each the same or The difference is that it is a hydrogen atom, a hydrocarbon group having 1 to 6 carbon atoms, a hydroxyalkyl group having 1 to 6 carbon atoms, or an amino alkyl group having 1 to 6 carbon atoms. R 5 , R 6 , and R 7 are not hydrogen atoms at the same time. )

上述式(II)之R5較佳為氫原子、碳數1~6之烴基、碳數1~6之羥基烷基、或碳數1~6之胺基烷基。 R 5 in the formula (II) is preferably a hydrogen atom, a hydrocarbon group having 1 to 6 carbon atoms, a hydroxyalkyl group having 1 to 6 carbon atoms, or an amino alkyl group having 1 to 6 carbon atoms.

作為上述式(II)所表示之胺化合物之具體例,較佳為在25℃之水溶液中之酸解離常數pKa為9.0以上之胺化合物,可例示:單乙醇胺(pKa=9.55)、N,N-二乙基乙醇胺(pKa=9.87)、N-甲基乙醇胺(pKa=9.95)、乙基胺基乙醇(pKa=9.9)等具有羥基烷基之胺、丙二胺(pKa=10.6)等具有胺基烷基之胺。其中,就提高樹脂遮罩層去除性及抑制焊料之腐蝕之觀點而言,較佳為N-甲基乙醇胺、丙二胺,更佳為N-甲基乙醇胺。 As a specific example of the amine compound represented by the above formula (II), an amine compound having an acid dissociation constant pKa of 9.0 or higher in an aqueous solution at 25 ° C is preferred, and examples include monoethanolamine (pKa = 9.55), N, N -Diethylethanolamine (pKa = 9.87), N-methylethanolamine (pKa = 9.95), ethylaminoethanol (pKa = 9.9), amines having hydroxyalkyl groups, propylene diamine (pKa = 10.6), etc. Aminoalkylamines. Among these, from the viewpoints of improving the removal ability of the resin mask layer and suppressing the corrosion of the solder, N-methylethanolamine and propylenediamine are preferred, and N-methylethanolamine is more preferred.

關於本發明之洗淨劑組合物之成分B即水溶性胺之含量,於洗淨劑組合物100質量份中,為3.0質量份以上,就提高樹脂遮罩層去除性及抑制焊料腐蝕之觀點而言,較佳為4.0質量份以上。又,作為成分B之水溶性胺之含量,於洗淨劑組合物100質量份中,為14.0質量份以下,就同樣之觀點而言,較佳為12.0質量份以下,更佳為10.0質量份以下,進而較佳為8.0質量份以下,進而更佳為7.0質量份以下。 The content of the water-soluble amine, which is the component B of the detergent composition of the present invention, is 3.0 parts by mass or more in 100 parts by mass of the detergent composition, from the viewpoints of improving the removal ability of the resin mask layer and suppressing solder corrosion In particular, it is preferably 4.0 parts by mass or more. The content of the water-soluble amine as the component B is 14.0 parts by mass or less in 100 parts by mass of the detergent composition. From the same viewpoint, it is preferably 12.0 parts by mass or less, and more preferably 10.0 parts by mass. Hereinafter, it is more preferably 8.0 parts by mass or less, and still more preferably 7.0 parts by mass or less.

[成分C] [Ingredient C]

作為本發明之洗淨劑組合物中之成分C即酸或其銨鹽,可列舉有機酸及無機酸或其銨鹽,作為有機酸,可列舉:甲酸、乙酸、草酸、琥珀酸及檸檬酸,作為無機酸,可列舉:碳酸、硫酸、硝酸及磷酸。酸之銨鹽可為氨之酸鹽。於一個或複數個實施形態中,本發明之洗淨劑組合物含有一種或複數種成分C。作為成分C,具體而言,較佳為選自由甲酸銨、乙酸銨、草酸銨、琥珀酸銨、檸檬酸銨、碳酸銨、硫酸銨、硝酸銨及磷酸銨所構成之群中之1種以上之化合物。 As the component C in the detergent composition of the present invention, that is, the acid or its ammonium salt, organic acids and inorganic acids or their ammonium salts can be cited. As the organic acid, formic acid, acetic acid, oxalic acid, succinic acid, and citric acid can be cited. Examples of the inorganic acid include carbonic acid, sulfuric acid, nitric acid, and phosphoric acid. The ammonium salt of an acid may be an acid salt of ammonia. In one or more embodiments, the detergent composition of the present invention contains one or more ingredients C. As component C, specifically, one or more members selected from the group consisting of ammonium formate, ammonium acetate, ammonium oxalate, ammonium succinate, ammonium citrate, ammonium carbonate, ammonium sulfate, ammonium nitrate, and ammonium phosphate are preferable. Of compounds.

關於本發明之洗淨劑組合物中之成分C即酸或其銨鹽之含量,於洗淨劑組合物100質量份中,較佳為0.3質量份以上,就抑制焊料之腐蝕之觀點而言,較佳為0.6質量份以上,更佳為0.8質量份以上,進而較佳為0.9質量份以上。又,酸或其銨鹽之含量於洗淨劑組合物100質量份中,為2.5質量份以下,就充分洗淨樹脂遮罩層之觀點而言,較佳為1.5質量份以下。 The content of the component C, that is, the acid or its ammonium salt, in the detergent composition of the present invention is preferably 0.3 parts by mass or more in 100 parts by mass of the detergent composition, from the viewpoint of suppressing the corrosion of solder. It is preferably 0.6 parts by mass or more, more preferably 0.8 parts by mass or more, and still more preferably 0.9 parts by mass or more. The content of the acid or its ammonium salt is 2.5 parts by mass or less in 100 parts by mass of the detergent composition, and from the viewpoint of sufficiently cleaning the resin masking layer, it is preferably 1.5 parts by mass or less.

[成分D] [Ingredient D]

作為本發明之洗淨劑組合物中之成分D即水,可列舉:離子交換水、超純水等抑制離子性物質之水。關於洗淨劑組合物中之水之含量,於洗淨劑組合物100質量份中,為50.0質量份以上,就充分洗淨樹脂遮罩層之觀點而言,較佳為70.0質量份以上、更佳為75.0質量份以上、進而較佳為80.0質量份以上,又,關於洗淨劑組合物中之水之含量,於洗淨劑組合物100質量份中,為95.0質量份以下,就抑制焊料之腐蝕之觀點而言,較佳為93.0質量份以下。 Examples of water as the component D in the detergent composition of the present invention include water that suppresses ionic substances such as ion-exchanged water and ultrapure water. The content of water in the detergent composition is 50.0 parts by mass or more in 100 parts by mass of the detergent composition, and from the viewpoint of sufficiently cleaning the resin masking layer, it is preferably 70.0 parts by mass or more, The content of water in the detergent composition is more preferably 75.0 parts by mass or more, and still more preferably 80.0 parts by mass or more. In 100 parts by mass of the detergent composition, the content is 95.0 parts by mass or less. From the viewpoint of solder corrosion, it is preferably 93.0 parts by mass or less.

[pH值] [pH value]

於一個或複數個實施形態中,就充分洗淨樹脂遮罩層之觀點而言,本發明之洗淨劑組合物之pH值較佳為10.0以上,更佳為10.5以上,就抑制焊料腐蝕之觀點而言,較佳為14以下,更佳為13.5以下,進而較佳為13.0以下。pH值例如可以(A)~(C)成分之含量而加以調 整。 In one or more embodiments, from the viewpoint of sufficiently cleaning the resin masking layer, the pH value of the detergent composition of the present invention is preferably 10.0 or more, and more preferably 10.5 or more. From a viewpoint, 14 or less is preferable, 13.5 or less is more preferable, and 13.0 or less is more preferable. The pH can be adjusted, for example, by the content of (A) ~ (C) components whole.

[其他成分:有機溶劑] [Other ingredients: organic solvents]

於一個或複數個實施形態中,就樹脂遮罩之溶解性之觀點而言,本發明之洗淨劑組合物可含有有機溶劑。於一個或複數個實施形態中,作為有機溶劑,可列舉:二乙二醇甲醚、二乙二醇丁醚、二甲基亞碸。就提高樹脂遮罩層去除性及抑制焊料之腐蝕之觀點而言,本發明之洗淨劑組合物中之有機溶劑於洗淨劑組合物100質量份中,較佳為0質量份以上,更佳為0.4質量份以上,進而較佳為0.8質量份以上,就同樣之觀點而言,較佳為35.0質量份以下,更佳為20.0質量份以下,進而較佳為10.0質量份以下。 In one or more embodiments, from the viewpoint of the solubility of the resin mask, the detergent composition of the present invention may contain an organic solvent. In one or more embodiments, examples of the organic solvent include diethylene glycol methyl ether, diethylene glycol butyl ether, and dimethyl sulfene. From the standpoint of improving the removal ability of the resin mask layer and suppressing the corrosion of the solder, the organic solvent in the detergent composition of the present invention is preferably 0 parts by mass or more in 100 parts by mass of the detergent composition, more preferably It is preferably 0.4 parts by mass or more, and more preferably 0.8 parts by mass or more. From the same viewpoint, it is preferably 35.0 parts by mass or less, more preferably 20.0 parts by mass or less, and still more preferably 10.0 parts by mass or less.

[其他成分:含氮雜環芳香族化合物] [Other ingredients: nitrogen-containing heterocyclic aromatic compound]

於一個或複數個實施形態中,就抑制焊料之腐蝕之觀點而言,本發明之洗淨劑組合物可含有含氮雜環芳香族化合物。於一個或複數個實施形態中,作為含氮雜環芳香族化合物,可列舉:1H-苯并三唑、1-甲基-1H-苯并三唑、1,2,3-三唑。就提高樹脂遮罩層去除性及抑制焊料之腐蝕之觀點而言,本發明之洗淨劑組合物中之含氮雜環芳香族化合物於洗淨劑組合物100質量份中,較佳為0.01質量份以上,更佳為0.02質量份以上,進而較佳為0.03質量份以上,就同樣之觀點而言,較佳為1質量份以下,更佳為0.8質量份以下,進而較佳為0.5質量份以下。 In one or more embodiments, the detergent composition of the present invention may contain a nitrogen-containing heterocyclic aromatic compound from the viewpoint of suppressing solder corrosion. In one or more embodiments, examples of the nitrogen-containing heterocyclic aromatic compound include 1H-benzotriazole, 1-methyl-1H-benzotriazole, and 1,2,3-triazole. From the viewpoint of improving the removal ability of the resin mask layer and suppressing the corrosion of the solder, the nitrogen-containing heterocyclic aromatic compound in the detergent composition of the present invention is preferably 0.01 in 100 parts by mass of the detergent composition. At least 0.02 parts by mass, more preferably at least 0.02 parts by mass, more preferably at least 0.03 parts by mass, and from the same viewpoint, it is preferably at most 1 part by mass, more preferably at most 0.8 part by mass, and even more preferably at least 0.5 part by mass The following.

[洗淨劑組合物之製備方法] [Preparation method of detergent composition]

即,於一個或複數個實施形態中,可將本發明之洗淨劑組合物製成於洗淨劑組合物100質量份中調配下述式(I)所表示之氫氧化四級銨(成分A)0.5質量份以上且3質量份以下、水溶性胺(成分B)3質量份以上且10質量份以下、酸或其銨鹽(成分C)0.3質量份以上且2.5質量份以下、水(成分D)50質量份以上且95質量份以下而成之樹脂遮罩層 用洗淨劑組合物。 That is, in one or more embodiments, the detergent composition of the present invention can be prepared in 100 parts by mass of the detergent composition, and a quaternary ammonium hydroxide (component) represented by the following formula (I) can be formulated A) 0.5 parts by mass or more and 3 parts by mass or less, 3 parts by mass or more and 10 parts by mass or less of water-soluble amine (component B), 0.3 parts by mass or more and 2.5 parts by mass or less of acid or its ammonium salt (component C), water ( Component D) A resin masking layer made of 50 parts by mass or more and 95 parts by mass or less Use the detergent composition.

(式中,R1、R2、R3各自相同或不同,為碳數1~4之烷基,R4為碳數1~4之烷基或碳數1~4之羥基取代烷基) (In the formula, R 1 , R 2 , and R 3 are the same or different, and are alkyl groups having 1 to 4 carbons; R 4 is alkyl groups having 1 to 4 carbons or hydroxy-substituted alkyl groups having 1 to 4 carbons)

於未加以限定之一個或複數個實施形態中,本發明之洗淨劑組合物可藉由將上述之成分A~D於上述之含量範圍內調配並進行均勻混合而製備。需說明的是,本發明之洗淨劑組合物可製備成減少了成分D之水之量之濃縮物。就輸送及貯藏之觀點而言,洗淨劑組合物之濃縮物較佳為濃縮至3倍以上,就生產及保存穩定之觀點而言,較佳為濃縮至10倍以下。製成濃縮物之洗淨劑組合物可於使用時稀釋至本發明之範圍內之任意之濃度使用。 In one or more embodiments without limitation, the detergent composition of the present invention can be prepared by blending the above-mentioned components A to D within the above-mentioned content range and uniformly mixing them. It should be noted that the detergent composition of the present invention can be prepared as a concentrate in which the amount of water of component D is reduced. From the viewpoint of transportation and storage, the concentrate of the detergent composition is preferably concentrated to 3 times or more, and from the viewpoint of stable production and storage, it is preferably concentrated to 10 times or less. The detergent composition made into a concentrate can be diluted at the time of use to any concentration within the scope of the present invention.

[電路基板之製造方法] [Manufacturing method of circuit board]

於一個或複數個實施形態中,本發明之洗淨劑組合物可用於形成焊料凸塊之電路基板之製造中。即,本發明之一方案係關於包括使用本發明之洗淨劑組合物進行洗淨之步驟之電路基板之製造方法(以下亦稱為「本發明之製造方法」)。 In one or more embodiments, the detergent composition of the present invention can be used in the manufacture of circuit substrates forming solder bumps. That is, one aspect of the present invention relates to a method for manufacturing a circuit board (hereinafter, also referred to as a "manufacturing method of the present invention") including a step of cleaning using the detergent composition of the present invention.

基於圖1,對本發明之製造方法之一個或複數個實施形態進行說明。圖1係表示本發明之製造方法之一個或複數個實施形態之概略步驟說明圖。如圖1(a)所示,於基板1之表面形成阻焊膜3(絕緣層)並被牢固地固定。在自形成於阻焊膜3之開口部7中露出有電極2之基板1之表面,藉由曝光而去除電極2之一部分,利用抗蝕膜形成樹脂遮罩層4。繼而,如圖1(b)所示,於基板1之表面塗佈焊料凸塊形成材料5。 或者,可代替焊料凸塊形成材料,而將焊料球配置於上述開口部7。繼而,進行加熱,如圖1(c)所示,使焊料於上述電極2之表面析出,形成焊料凸塊6。又,如圖1(d)所示,利用本發明之洗淨劑組合物剝離樹脂遮罩層4,從而獲得形成有焊料凸塊6之電路基板1。需說明的是,於一個或複數個實施形態中,視需要,如圖1(e)所示,實施焊料凸塊6之平坦化。 Based on Fig. 1, one or more embodiments of the manufacturing method of the present invention will be described. FIG. 1 is an explanatory diagram showing the outline steps of one or more embodiments of the manufacturing method of the present invention. As shown in FIG. 1 (a), a solder resist film 3 (insulating layer) is formed on the surface of the substrate 1 and is firmly fixed. A surface of the substrate 1 on which the electrode 2 is exposed from the opening portion 7 formed in the solder resist film 3 is used to remove a part of the electrode 2 by exposure to form a resin masking layer 4 using a resist film. Then, as shown in FIG. 1 (b), the surface of the substrate 1 is coated with a solder bump forming material 5. Alternatively, instead of the solder bump forming material, a solder ball may be arranged in the opening portion 7. Then, as shown in FIG. 1 (c), heating is performed to deposit solder on the surface of the electrode 2 to form a solder bump 6. Moreover, as shown in FIG.1 (d), the resin masking layer 4 is peeled by the detergent composition of this invention, and the circuit board 1 in which the solder bump 6 was formed was obtained. It should be noted that, in one or more embodiments, as shown in FIG. 1 (e), the planarization of the solder bumps 6 is performed.

因此,於一個或複數個實施形態中,本發明之製造方法為包括下述步驟(1)~(5)之電路基板之製造方法。 Therefore, in one or more embodiments, the manufacturing method of the present invention is a manufacturing method of a circuit board including the following steps (1) to (5).

步驟(1):於設置有焊接部之基板表面形成樹脂遮罩層之步驟。 Step (1): a step of forming a resin masking layer on the surface of the substrate provided with the soldering portion.

步驟(2):於上述樹脂遮罩層中以露出上述焊接部之方式形成開口部之步驟。 Step (2): A step of forming an opening portion in the resin mask layer so that the welding portion is exposed.

步驟(3):於上述開口部填充焊料凸塊形成材料之步驟。 Step (3): A step of filling the above-mentioned opening with a solder bump forming material.

步驟(4):加熱使上述焊料凸塊形成材料熔融,藉此使焊料凸塊固定於上述焊接部之步驟。 Step (4): a step of melting the solder bump forming material by heating to fix the solder bump to the soldered portion.

步驟(5):使用本發明之洗淨劑組合物對步驟(4)中獲得之基板進行洗淨之步驟。 Step (5): A step of cleaning the substrate obtained in step (4) using the detergent composition of the present invention.

[步驟(1)] [step 1)]

步驟(1)係於設置有焊接部之基板表面形成樹脂遮罩層之步驟。於一個或複數個實施形態中,對於設置有焊接部之基板而言,可列舉:設置有應形成焊料凸塊之焊接部之電路基板,於一個或複數個實施形態中,上述焊接部為電極部。於一個或複數個實施形態中,如圖1(a)所示,上述基板可列舉:基板1之表面被阻焊膜3所覆蓋,且電極部2露出於表面之形態,且阻焊膜3被牢固地固定於基板1之表面。於未加以限定之一個或複數個實施形態中,作為阻焊膜3,可使用環氧系、丙烯酸系、聚醯亞胺系等之樹脂。又,對於阻焊膜3而言,為了露出電極部2,而可於步驟(2)之前形成開口部,或者亦可與步驟(2)同 時或於其後為了露出電極部2而形成開口部。 Step (1) is a step of forming a resin mask layer on the surface of the substrate provided with the soldering portion. In one or more embodiments, for a substrate provided with a soldering portion, a circuit board provided with a soldering portion that should form a solder bump can be listed. In one or more embodiments, the soldering portion is an electrode. unit. In one or more embodiments, as shown in FIG. 1 (a), the above substrate may be exemplified by a surface in which the surface of the substrate 1 is covered by the solder resist film 3 and the electrode portion 2 is exposed on the surface, and the solder resist film 3 It is firmly fixed to the surface of the substrate 1. In one or more embodiments without limitation, as the solder resist film 3, an epoxy-based, acrylic-based, polyimide-based resin, or the like can be used. In addition, for the solder resist film 3, in order to expose the electrode portion 2, an opening portion may be formed before step (2), or may be the same as step (2). An opening is formed at some time or thereafter to expose the electrode portion 2.

於一個或複數個實施形態中,作為形成樹脂遮罩層之樹脂材料,就形成均勻之厚膜之觀點而言,較佳為使用膜狀之感光性樹脂,更佳為抗蝕膜。抗蝕膜可使用通用之物質。 In one or more embodiments, as the resin material forming the resin masking layer, from the viewpoint of forming a uniform thick film, it is preferable to use a film-like photosensitive resin, and more preferably a resist film. As the resist film, a general substance can be used.

於一個或複數個實施形態中,關於樹脂遮罩層之厚度,就為了利用析出焊料而形成凸塊所需要之焊料析出量之觀點而言,較佳為10μm以上、更佳為30μm以上。又,於一個或複數個實施形態中,關於樹脂遮罩層之厚度,就使樹脂遮罩層固化至底部之觀點而言,較佳為300μm以下、更佳為150μm以下。 In one or more embodiments, the thickness of the resin masking layer is preferably 10 μm or more, and more preferably 30 μm or more, from the viewpoint of the amount of solder precipitation required to form bumps by depositing solder. In addition, in one or more embodiments, the thickness of the resin masking layer is preferably 300 μm or less, and more preferably 150 μm or less, from the viewpoint of curing the resin masking layer to the bottom.

[步驟(2)] [Step (2)]

步驟(2)係於步驟(1)中形成之樹脂遮罩層中以露出上述焊接部之方式形成開口部之步驟。於一個或複數個實施形態中,開口部之形成可藉由曝光、顯影處理進行。又,於一個或複數個實施形態中,步驟(2)可同時或相繼藉由曝光、顯影處理而形成阻焊膜之開口部。如圖1(a)所示之一個或複數個實施形態般,利用步驟(2)於電路基板1之表面形成阻焊膜3及樹脂遮罩層4,可獲得自形成於該等阻焊膜3及樹脂遮罩層4之開口部7中露出了電極部2之基板。 Step (2) is a step of forming an opening portion in the resin mask layer formed in step (1) so that the welding portion is exposed. In one or more embodiments, the openings can be formed by exposure and development processes. Furthermore, in one or more embodiments, the step (2) may form opening portions of the solder resist film simultaneously or sequentially by exposure and development processes. As shown in one or more embodiments shown in FIG. 1 (a), a solder resist film 3 and a resin masking layer 4 are formed on the surface of the circuit substrate 1 by using step (2), and can be obtained from the solder resist films formed thereon. 3 and the opening portion 7 of the resin mask layer 4 expose the substrate of the electrode portion 2.

[步驟(3)] [Step (3)]

步驟(3)係於步驟(2)中形成之開口部填充焊料凸塊形成材料之步驟。於一個或複數個實施形態中,焊料凸塊形成材料為焊膏,例如可利用膏劑印刷法填充。又,於一個或複數個實施形態中,焊料凸塊形成材料為焊料球,例如可利用球搭載法進行填充。 Step (3) is a step of filling the solder bump forming material in the opening formed in step (2). In one or more embodiments, the solder bump forming material is a solder paste, which can be filled by a paste printing method, for example. Furthermore, in one or more embodiments, the solder bump forming material is a solder ball, and for example, it can be filled by a ball mounting method.

於一個或複數個實施形態中,作為焊膏,可列舉:(a)含有錫粉末和鉛、銅、銀等之金屬鹽而成之焊膏、或者(b)含有錫粉末、及選自銀離子及銅離子中之至少一種與選自芳基膦類、烷基膦類及唑類中之至少一種之錯合物而成之焊膏。亦可將上述(a)之金屬鹽與(b)之錯 合物混合使用。需說明的是,所謂錫粉末,除了金屬錫粉末以外,例如亦包含含有銀之錫-銀系之錫合金粉末或含有銅之錫-銅系之錫合金粉末等。作為上述金屬鹽,可列舉:有機羧酸鹽、有機磺酸鹽等。 In one or more embodiments, as the solder paste, (a) a solder paste containing tin powder and a metal salt such as lead, copper, silver, or the like, or (b) containing tin powder, and selected from silver A solder paste in which at least one of ions and copper ions is complexed with at least one selected from the group consisting of arylphosphines, alkylphosphines and azoles. The fault between the metal salt of (a) and (b) above Mixtures are used in combination. In addition, the so-called tin powder includes, in addition to metal tin powder, for example, silver-containing tin-silver-based tin alloy powder or copper-containing tin-copper-based tin alloy powder. Examples of the metal salt include organic carboxylate and organic sulfonate.

焊料凸塊形成材料所含有之焊料合金典型的是錫基質之焊料合金,但例如銦系合金等非錫系焊料合金亦可於本發明中使用。雖然亦可使用先前之一般之錫-鉛共晶焊料合金之粒子,但較佳為使用無鉛焊料合金之粒子。作為較佳之無鉛焊料合金,可例示錫-銀系、錫-銅系、錫-銀-銅系等。若列舉代表性之組成例,則如下所示(%為質量%): The solder alloy contained in the solder bump forming material is typically a tin-based solder alloy, but a non-tin-based solder alloy such as an indium-based alloy can also be used in the present invention. Although particles of a conventional tin-lead eutectic solder alloy can also be used, particles of a lead-free solder alloy are preferably used. Preferred lead-free solder alloys include tin-silver-based, tin-copper-based, tin-silver-copper-based, and the like. If a representative composition example is listed, it is as follows (% is mass%):

Sn:餘量、Ag:0.3%、Cu:0.5% Sn: balance, Ag: 0.3%, Cu: 0.5%

Sn:餘量、Ag:3.5%、Cu:0.7% Sn: balance, Ag: 3.5%, Cu: 0.7%

Sn:餘量、Ag:3.5% Sn: balance, Ag: 3.5%

Sn:餘量、Cu:0.7%。 Sn: balance, Cu: 0.7%.

焊膏中,進而可混合焊劑助劑成分及溶劑。作為焊劑助劑成分,通常可使用用於錫-鉛系、錫-銀系、錫-銅系等焊料材料之物質,作為溶劑,只要為可溶解組合物中之其他成分,調節黏度、濃度之物質即可,並無特別限定。如圖1(b)所示之一個或複數個之實施形態般,利用步驟(3),於電路基板1之表面形成阻焊膜3及樹脂遮罩層4,又,可獲得於電路基板1之表面之電極部2上之開口部填充或配置有焊料形成材料5之電路基板1。 In the solder paste, a flux auxiliary component and a solvent may be further mixed. As the flux auxiliary component, generally used can be used for solder materials such as tin-lead, tin-silver, tin-copper, etc. As a solvent, as long as it is a component that can dissolve other components in the composition, adjust the viscosity and concentration. The substance is not particularly limited as long as it is a substance. As shown in one or more embodiments shown in FIG. 1 (b), a solder resist film 3 and a resin masking layer 4 are formed on the surface of the circuit substrate 1 by using step (3). The opening portion of the electrode portion 2 on the front surface is filled or arranged with a circuit board 1 having a solder forming material 5.

[步驟(4)] [Step (4)]

步驟(4)係對步驟(3)中填充之焊料凸塊形成材料加熱,使其熔融,藉此使焊料凸塊固定於上述焊接部之步驟。於一個或複數個實施形態中,加熱溫度為200℃以上,考慮到電路基板之耐熱性,可列舉200℃~260℃。焊料凸塊形成材料之液相線溫度通常為200℃以上,於其他一個或複數個實施形態中,加熱溫度為上述焊料凸塊形成材料 之液相線溫度以上,考慮到電路基板之耐熱性,可列舉上述液相線溫度以上且260℃以下。加熱時間根據焊料凸塊形成材料之組成等而確定,於一個或複數個實施形態中,較佳為30秒~10分鐘左右、更佳為1分鐘~5分鐘左右。就電路基板之生產率之觀點而言,較佳為藉由一次加熱處理使凸塊固定。如圖1(c)所示之一個或複數個之實施形態般,利用步驟(4)於電路基板1之表面形成阻焊膜3及樹脂遮罩層4,又,可獲得於電路基板1之表面之電極部2上形成有焊料凸塊6之基板。 Step (4) is a step of heating the solder bump forming material filled in step (3) and melting it, thereby fixing the solder bump to the soldering portion. In one or more embodiments, the heating temperature is 200 ° C or higher, and in consideration of the heat resistance of the circuit board, 200 ° C to 260 ° C can be cited. The liquidus temperature of the solder bump forming material is usually 200 ° C or higher. In one or more other embodiments, the heating temperature is the above solder bump forming material. Above the liquidus temperature, and considering the heat resistance of the circuit board, the above liquidus temperature is 260 ° C or lower. The heating time is determined according to the composition of the solder bump forming material and the like. In one or more embodiments, it is preferably about 30 seconds to 10 minutes, and more preferably about 1 minute to 5 minutes. From the viewpoint of the productivity of the circuit board, it is preferable to fix the bumps by a single heat treatment. As shown in one or more embodiments shown in FIG. 1 (c), a solder resist film 3 and a resin masking layer 4 are formed on the surface of the circuit substrate 1 in step (4), and can also be obtained in the circuit substrate 1. A substrate of the solder bump 6 is formed on the surface electrode portion 2.

[步驟(5)] [Step (5)]

步驟(5)係使用本發明之洗淨劑組合物對步驟(4)中獲得之基板進行洗淨之步驟。於一個或複數個實施形態中,作為用洗淨劑組合物洗淨基板之方法,可列舉:超音波洗淨法、噴霧法、浸漬搖動法、浸漬法、擦拭法各種洗淨方法。適應於電路基板之種類,可將該等方法單獨或適當組合。就抑制對電路基板之影響之觀點及洗淨性之觀點而言,較佳為噴霧法、浸漬搖動法或浸漬法。 Step (5) is a step of cleaning the substrate obtained in step (4) using the detergent composition of the present invention. In one or more embodiments, as a method for cleaning the substrate with the detergent composition, various cleaning methods including an ultrasonic cleaning method, a spray method, a dipping shaking method, a dipping method, and a wiping method can be cited. Adapted to the type of circuit substrate, these methods can be combined individually or appropriately. From a viewpoint of suppressing an influence on a circuit board and a viewpoint of detergency, a spray method, a dipping shaking method, or a dipping method is preferable.

就充分洗淨樹脂遮罩層之觀點而言,步驟(5)中之洗淨時之溫度較佳為25℃以上,更佳為40℃以上。又,就抑制水分之蒸發之觀點而言,較佳為90℃以下,更佳為80℃以下。又,就充分洗淨樹脂遮罩層之觀點而言,步驟(5)中之洗淨時之pH值較佳為10.0以上,更佳為11.0以上,進而較佳為12.0以上,且較佳為14.0以下,更佳為13.5以下,進而較佳為13.0以下。 From the viewpoint of sufficiently cleaning the resin masking layer, the temperature at the time of cleaning in step (5) is preferably 25 ° C or higher, and more preferably 40 ° C or higher. From the viewpoint of suppressing evaporation of water, the temperature is preferably 90 ° C or lower, and more preferably 80 ° C or lower. From the viewpoint of sufficiently cleaning the resin masking layer, the pH value during the washing in step (5) is preferably 10.0 or more, more preferably 11.0 or more, even more preferably 12.0 or more, and more preferably 14.0 or less, more preferably 13.5 or less, and even more preferably 13.0 or less.

就充分洗淨樹脂遮罩層之觀點而言,步驟(5)中之洗淨時間較佳為1分鐘以上,更佳為3分鐘以上,進而較佳為5分鐘以上,就縮短電路基板之製造時間之觀點而言,較佳為30分鐘以下,更佳為20分鐘以下。 From the viewpoint of sufficiently cleaning the resin masking layer, the cleaning time in step (5) is preferably 1 minute or more, more preferably 3 minutes or more, and further preferably 5 minutes or more, which shortens the manufacturing of the circuit board. From the viewpoint of time, it is preferably 30 minutes or less, and more preferably 20 minutes or less.

就自電路基板中去除殘存於電路基板上之可溶化於洗淨劑組合 物中之污物及/或洗淨劑組合物之成分之觀點而言,就步驟(5)而言,於洗淨處理結束後,亦較佳為進行漂洗處理(以下亦稱為步驟(5a))。漂洗處理中,較佳為使用水或醇。漂洗處理中之pH值較佳為在中性附近(例如,pH值6.0~8.0或pH值6.5~7.5)進行。進而,於洗淨處理或漂洗處理結束後,為了去除殘存於電路基板表面之水分,較佳為進行乾燥處理(以下亦稱為步驟(5b))。 Soluble in detergent combinations remaining on the circuit board are removed from the circuit board From the viewpoint of the dirt and / or the composition of the detergent composition, in the step (5), it is also preferable to perform a rinsing treatment (hereinafter also referred to as step (5a)) after the completion of the washing treatment. )). In the rinsing treatment, water or alcohol is preferably used. The pH value in the rinsing treatment is preferably performed near neutrality (for example, a pH value of 6.0 to 8.0 or a pH value of 6.5 to 7.5). Furthermore, after the washing process or the rinsing process is completed, it is preferable to perform a drying process (hereinafter also referred to as step (5b)) in order to remove moisture remaining on the surface of the circuit board.

作為漂洗處理之方法,可列舉:浸漬法、超音波洗淨法、浸漬搖動法、噴霧法各種方法。就漂洗性之觀點而言,較佳為噴霧法及浸漬法,更佳為併用噴霧法及浸漬法。就漂洗性之觀點而言,沖洗處理之溫度較佳為25℃以上、更佳為40℃以上,又,就抑制水分之蒸發之觀點而言,較佳為90℃以下,更佳為80℃以下。就漂洗性之觀點而言,漂洗處理之時間較佳為3分鐘以上,更佳為5分鐘以上,就縮短電路基板之製造時間之觀點而言,較佳為30分鐘以下,更佳為20分鐘以下。 Examples of the rinsing method include various methods such as a dipping method, an ultrasonic cleaning method, a dipping shaking method, and a spray method. From the viewpoint of rinsability, a spray method and a dipping method are preferred, and a spray method and a dipping method are more preferably used in combination. From the viewpoint of rinsing properties, the temperature of the rinsing treatment is preferably 25 ° C or higher, more preferably 40 ° C or higher, and from the viewpoint of suppressing evaporation of water, 90 ° C or lower, more preferably 80 ° C. the following. From the viewpoint of rinsing property, the time of the rinsing treatment is preferably 3 minutes or more, more preferably 5 minutes or more, and from the viewpoint of shortening the manufacturing time of the circuit board, 30 minutes or less is more preferable, and 20 minutes is more preferable. the following.

又,作為乾燥處理中之乾燥方法,可列舉:例如利用烘箱或送風乾燥機進行乾燥之方法,就乾燥性之觀點而言,其乾燥溫度較佳為80℃以上,就抑制對電路基板之影響之觀點而言,較佳為加熱至120℃以下、更佳為100℃以下。 In addition, as a drying method in the drying process, for example, a method using an oven or a blower dryer for drying is preferable. From the viewpoint of drying property, the drying temperature is preferably 80 ° C or higher to suppress the influence on the circuit board. From the viewpoint, heating to 120 ° C or lower is preferred, and 100 ° C or lower is more preferred.

[步驟(6)] [Step (6)]

於一個或複數個實施形態中,就獲得以較高去除率去除樹脂遮罩層後之形成有焊料凸塊之電路基板之觀點而言,本發明之製造方法較佳為包括下述步驟(6)。 In one or more embodiments, from the viewpoint of obtaining a circuit board on which solder bumps are formed after the resin masking layer is removed at a higher removal rate, the manufacturing method of the present invention preferably includes the following steps (6 ).

步驟(6):使用含有二甲基亞碸(DMSO)(成分S)、二醇醚(成分T)、在25℃之水溶液中之酸解離常數pKa為9.0以上之胺及/或氫氧化四級銨(成分U)、及水(成分V)之洗淨劑組合物,對步驟(5)中獲得之基板進行洗淨之步驟。 Step (6): Use amine and / or tetrahydroxide containing dimethylsulfinium (DMSO) (component S), glycol ether (component T), and acid dissociation constant pKa of 9.0 or higher in an aqueous solution at 25 ° C A cleaning agent composition of grade ammonium (component U) and water (component V), a step of cleaning the substrate obtained in step (5).

藉由進行步驟(6),可獲得以高去除率去除樹脂遮罩層後之形成有焊料凸塊之電路基板。即,如圖1(d)所示之一個或複數個之實施形態般,利用步驟(6)於電路基板1之表面之電極部2上形成焊料凸塊6、且獲得自電路基板1之表面之阻焊膜3上以高去除率去除樹脂遮罩層後之基板。 By performing step (6), a circuit board having solder bumps formed after the resin masking layer is removed at a high removal rate can be obtained. That is, as shown in one or more embodiments shown in FIG. 1 (d), solder bumps 6 are formed on the electrode portion 2 on the surface of the circuit substrate 1 by using step (6), and obtained from the surface of the circuit substrate 1. The substrate after the resin mask layer is removed from the solder resist film 3 at a high removal rate.

步驟(6)中,作為利用洗淨劑組合物洗淨步驟(5)中獲得之基板之方法,可列舉:超音波洗淨法、噴霧法、浸漬搖動法、浸漬法、擦拭法各種洗淨方法。適應於電路基板之種類,可將該等方法單獨使用或適當組合使用而對樹脂阻擋層進行洗淨。就抑制對電路基板之影響之觀點、及洗淨性之觀點而言,較佳為噴霧法、浸漬搖動法或浸漬法。 In the step (6), as the method for cleaning the substrate obtained in the step (5) by using the detergent composition, there can be mentioned various cleaning methods including ultrasonic cleaning method, spray method, dipping shaking method, dipping method, and wiping method. method. Adapted to the type of circuit board, these methods can be used alone or in appropriate combinations to clean the resin barrier layer. From a viewpoint of suppressing an influence on a circuit board and a viewpoint of detergency, a spray method, a dipping shaking method, or a dipping method is preferable.

就充分洗淨樹脂遮罩層之觀點而言,步驟(6)中之洗淨時之溫度較佳為25℃以上,更佳為40℃以上,又,就抑制水分之蒸發之觀點而言,較佳為90℃以下,更佳為80℃以下。又,於一個或複數個實施形態中,就充分洗淨樹脂遮罩層之觀點而言,步驟(6)中之洗淨時之pH值較佳為11以上,更佳為12以上。 From the viewpoint of sufficiently cleaning the resin masking layer, the temperature at the time of washing in step (6) is preferably 25 ° C or higher, more preferably 40 ° C or higher, and from the viewpoint of suppressing evaporation of water, The temperature is preferably 90 ° C or lower, and more preferably 80 ° C or lower. In addition, in one or more embodiments, from the viewpoint of sufficiently cleaning the resin masking layer, the pH at the time of washing in step (6) is preferably 11 or more, and more preferably 12 or more.

就充分洗淨樹脂遮罩層之觀點而言,步驟(6)中之洗淨時間較佳為1分鐘以上,更佳為3分鐘以上,進而較佳為5分鐘以上,就縮短電路基板之製造時間之觀點而言,較佳為30分鐘以下,更佳為20分鐘以下。 From the viewpoint of sufficiently cleaning the resin masking layer, the cleaning time in step (6) is preferably 1 minute or more, more preferably 3 minutes or more, and further preferably 5 minutes or more, which shortens the manufacturing of the circuit board. From the viewpoint of time, it is preferably 30 minutes or less, and more preferably 20 minutes or less.

[步驟(6)之洗淨劑組合物] [Detergent composition of step (6)]

步驟(6)中使用之洗淨劑組合物含有二甲基亞碸(DMSO)(成分S)、二醇醚(成分T)、在25℃之水溶液中之酸解離常數pKa為9.0以上之胺及/或氫氧化四級銨(成分U)、及水(成分V)。該洗淨劑組合物可藉由將二甲基亞碸(成分S)、二醇醚(成分T)、上述胺及/或氫氧化四級銨(成分U)、及水(成分V)例如在25℃下混合而製備。又,亦可預先製備含有二甲基亞碸(成分S)、二醇醚(成分T)、及上述胺及/或氫氧化四級銨 (成分U)之濃溶液,再利用水(成分V)稀釋而製成步驟(6)之洗淨劑組合物而加以使用。 The detergent composition used in step (6) contains dimethylsulfinium (DMSO) (component S), a glycol ether (component T), and an amine having an acid dissociation constant pKa of 9.0 or higher in an aqueous solution at 25 ° C. And / or quaternary ammonium hydroxide (component U) and water (component V). The detergent composition can be obtained by mixing dimethylsulfinium (component S), glycol ether (component T), the above-mentioned amine and / or quaternary ammonium hydroxide (component U), and water (component V), for example Prepared by mixing at 25 ° C. In addition, dimethylsulfinium (component S), glycol ether (component T), and the above-mentioned amine and / or quaternary ammonium hydroxide may be prepared in advance. The concentrated solution of (ingredient U) is diluted with water (ingredient V) to prepare the detergent composition of step (6) and used.

[成分S] [Ingredient S]

成分S係二甲基亞碸(DMSO)。就充分洗淨樹脂遮罩層之觀點而言,上述洗淨劑組合物中之二甲基亞碸之含量於洗淨劑組合物100質量份中,較佳為10.0質量份以上,更佳為30.0質量份以上,進而較佳為35.0質量份以上,進而更佳為39.0質量份以上。又,就同樣之觀點而言,於洗淨劑組合物100質量份中,較佳為50.0質量份以下,更佳為43.0質量份以下。 Ingredient S is dimethylsulfinium (DMSO). From the viewpoint of sufficiently cleaning the resin masking layer, the content of dimethylmethylene in the detergent composition is 100 parts by mass of the detergent composition, preferably 10.0 parts by mass or more, and more preferably 30.0 parts by mass or more, more preferably 35.0 parts by mass or more, and even more preferably 39.0 parts by mass or more. In addition, from the same viewpoint, it is preferably 50.0 parts by mass or less, and more preferably 43.0 parts by mass or less, out of 100 parts by mass of the detergent composition.

[成分T] [Ingredient T]

成分T係二醇醚。於一個或複數個實施形態中,成分T較佳為下述式(III)所表示之二醇醚。 Component T is a glycol ether. In one or more embodiments, the component T is preferably a glycol ether represented by the following formula (III).

R8O(AO)nR9 (III) R 8 O (AO) n R 9 (III)

(式中,R8為碳數1~6之烷基或碳數6~15之芳基,R9為氫原子或碳數1~6之烷基,AO為碳數2或3之伸烷基氧基,n為平均加成莫耳數且為1~4) (Wherein R 8 is an alkyl group having 1 to 6 carbon atoms or an aryl group having 6 to 15 carbon atoms, R 9 is a hydrogen atom or an alkyl group having 1 to 6 carbon atoms, and AO is an alkylene group having 2 or 3 carbon atoms (Oxy group, n is the average addition mole number and is 1 to 4)

又,於一個或複數個實施形態中,成分T係(聚)伸烷基二醇之烷基醚或芳基醚。作為(聚)伸烷基二醇,可列舉:乙二醇、二乙二醇、三乙二醇、四乙二醇、丙二醇、二丙二醇、三丙二醇。作為烷基醚,可列舉:單甲醚、單乙醚、單丙醚、單丁醚、單異丁醚、單己醚、二甲醚、二乙醚、丁基甲醚、乙基丙醚、丁基乙醚、二丙醚、二丁醚。作為芳基醚,可列舉:單苯醚、單苄醚。就充分洗淨樹脂遮罩層之觀點而言,成分T較佳為乙二醇、二乙二醇、三乙二醇之單甲醚、單乙醚、單丁醚、單異丁醚、單苄醚,具體而言,較佳為二乙二醇單丁醚、三乙二醇單丁醚及乙二醇單苄醚,更佳為二乙二醇單丁醚。成分T可為上述式(III)所表示之單獨之化合物,亦可為由多種化合物構 成。 In one or more embodiments, the component T is an alkyl ether or an aryl ether of a (poly) alkylene glycol. Examples of the (poly) alkylene glycol include ethylene glycol, diethylene glycol, triethylene glycol, tetraethylene glycol, propylene glycol, dipropylene glycol, and tripropylene glycol. Examples of the alkyl ether include monomethyl ether, monoethyl ether, monopropyl ether, monobutyl ether, monoisobutyl ether, monohexyl ether, dimethyl ether, diethyl ether, butyl methyl ether, ethyl propyl ether, and butyl ether. , Dipropyl ether, dibutyl ether. Examples of the aryl ether include monophenyl ether and monobenzyl ether. From the viewpoint of sufficiently cleaning the resin masking layer, the component T is preferably monomethyl ether, monoethyl ether, monobutyl ether, monoisobutyl ether, monobenzyl glycol, diethylene glycol, or triethylene glycol. Ether, specifically, diethylene glycol monobutyl ether, triethylene glycol monobutyl ether, and ethylene glycol monobenzyl ether are preferable, and diethylene glycol monobutyl ether is more preferable. The component T may be a single compound represented by the above formula (III), or may be composed of a plurality of compounds. to make.

就充分洗淨樹脂遮罩層之觀點而言,洗淨劑組合物中之成分T之含量於洗淨劑組合物100質量份中,較佳為30.0質量份以上,更佳為35.0質量份以上。又,就同樣之觀點而言,成分T之含量於洗淨劑組合物100質量份中,較佳為70.0質量份以下,更佳為50.0質量份以下,進而較佳為43.0質量份以下。 From the viewpoint of sufficiently cleaning the resin masking layer, the content of the component T in the detergent composition is 100 parts by mass of the detergent composition, preferably 30.0 parts by mass or more, and more preferably 35.0 parts by mass or more . From the same viewpoint, the content of the component T in 100 parts by mass of the detergent composition is preferably 70.0 parts by mass or less, more preferably 50.0 parts by mass or less, and even more preferably 43.0 parts by mass or less.

就樹脂遮罩層之去除性之觀點而言,成分S與成分T之質量比[(S)/(T)]較佳為0.15以上,更佳為0.30以上,進而較佳為0.50以上,並且較佳為2.00以下,更佳為1.50以下,進而較佳為1.20以下。 From the viewpoint of the removability of the resin masking layer, the mass ratio [(S) / (T)] of the component S to the component T is preferably 0.15 or more, more preferably 0.30 or more, and even more preferably 0.50 or more, and It is preferably 2.00 or less, more preferably 1.50 or less, and even more preferably 1.20 or less.

[成分U] [Ingredient U]

成分U係在25℃之水溶液中之酸解離常數pKa為9.0以上之胺及/或氫氧化四級銨。就成分U而言,就焊料腐蝕抑制之觀點而言,較佳為胺,就充分地洗淨樹脂遮罩層之觀點而言,較佳為氫氧化四級銨。於一個或複數個實施形態中,成分U係下述式(IV)所表示且在25℃之水溶液中之酸解離常數pKa為9.0以上之胺及/或下述式(V)所表示之氫氧化四級銨。pKa記載於例如《化學便覽 基礎篇(化學便覧基礎編)》(日本化學會編 丸善股份有限公司(日本化學會 編 丸善股份有限公司))等。pKa較佳為9.5以上,更佳為9.8以上,並且較佳為12.0以下,更佳為11.5以下,進而較佳為11.0以下。 Component U is an amine and / or quaternary ammonium hydroxide having an acid dissociation constant pKa of 9.0 or more in an aqueous solution at 25 ° C. From the viewpoint of suppressing solder corrosion, component U is preferably amine, and from the viewpoint of sufficiently cleaning the resin masking layer, quaternary ammonium hydroxide is preferred. In one or more embodiments, component U is an amine represented by the following formula (IV) and having an acid dissociation constant pKa of 9.0 or higher in an aqueous solution at 25 ° C and / or hydrogen represented by the following formula (V) Quaternary ammonium oxide. The pKa is described in, for example, "Basics of Chemistry (Basic Chemistry)" (Maruzen Co., Ltd., Japan Chemical Society) Maruzen Co., Ltd., Japan Chemical Society). The pKa is preferably 9.5 or more, more preferably 9.8 or more, and more preferably 12.0 or less, more preferably 11.5 or less, and even more preferably 11.0 or less.

(R10)3N (IV) (R 10 ) 3 N (IV)

(式中,R10各自相同或不同,為氫原子、碳數1~6之烷基、碳數1~6之羥基烷基、或碳數1~6之胺基烷基,3個R10並不同時為氫原子) (Wherein R 10 is the same or different, and is a hydrogen atom, an alkyl group having 1 to 6 carbon atoms, a hydroxyalkyl group having 1 to 6 carbon atoms, or an amino alkyl group having 1 to 6 carbon atoms, and three R 10 (Not both hydrogen atoms)

[(R11)3-N-R12]+OH- (V) [(R 11) 3 -NR 12 ] + OH - (V)

(其中,式中,R11表示碳數1~3之烷基,R12表示1~3之烷基、或碳數1~3之羥基烷基) (Wherein, R 11 represents an alkyl group having 1 to 3 carbon atoms, and R 12 represents an alkyl group having 1 to 3 carbon atoms or a hydroxyalkyl group having 1 to 3 carbon atoms)

作為上述式(IV)所表示之在25℃之水溶液中之酸解離常數pKa為9.0以上之胺化合物之具體例,可例示:單乙醇胺(pKa=9.55)、N,N-二乙基乙醇胺(pKa=9.87)、N-甲基乙醇胺(pKa=9.95)、乙基胺基乙醇(pKa=9.9)等具有羥基烷基之胺、丙二胺(pKa=10.6)等具有胺基烷基之胺。其中,就去除樹脂遮罩之觀點而言,較佳為N-甲基乙醇胺、丙二胺,更佳為N-甲基乙醇胺。可認為藉由使用pKa為9.0以上之胺類,從而利用鹼對樹脂遮罩層之低分子量化發揮作用。 Specific examples of the amine compound having an acid dissociation constant pKa of 9.0 or higher in an aqueous solution at 25 ° C. represented by the above formula (IV) include monoethanolamine (pKa = 9.55), N, N-diethylethanolamine ( pKa = 9.87), N-methylethanolamine (pKa = 9.95), ethylaminoethanol (pKa = 9.9), amines having hydroxyalkyl groups, propylenediamine (pKa = 10.6), amines having amine alkyl groups . Among these, from the viewpoint of removing the resin mask, N-methylethanolamine and propylene diamine are preferred, and N-methylethanolamine is more preferred. It is considered that by using an amine having a pKa of 9.0 or higher, it is considered that the use of an alkali to reduce the molecular weight of the resin masking layer.

作為上述式(V)所表示之氫氧化四級銨,可例示由以下之陽離子與氫氧化物形成之鹽等。又,作為上述陽離子,可列舉:例如四烷基銨陽離子(烷基之碳數為1~6)般之四甲基銨、四乙基銨、四(正或異)丙基銨、四(正或異)丁基銨、四戊基銨、四己基銨、三甲基乙基銨,又,可列舉:具有羥基烷基之烷基銨陽離子(烷基之碳數為1~6)般之三甲基(2-羥基乙基)銨及三乙基(2-羥基乙基)銨等。其中,較佳為四甲基銨。作為氫氧化四級銨,具體而言,可列舉:四甲基氫氧化銨、四乙基氫氧化銨、四丙基氫氧化銨、四丁基氫氧化銨、四戊基氫氧化銨、四己基氫氧化銨銨、三甲基乙基氫氧化銨、三甲基(2-羥基乙基)氫氧化銨、三乙基(2-羥基乙基)氫氧化銨物等。其中,就去除樹脂遮罩之觀點而言,較佳為四甲基氫氧化銨。 Examples of the quaternary ammonium hydroxide represented by the formula (V) include salts formed from the following cations and hydroxides. Examples of the cation include tetramethylammonium cation (tetraalkylammonium cation (carbon number of 1 to 6), tetramethylammonium, tetraethylammonium, tetra (n- or iso) propylammonium, tetrakis ( N- or iso) butylammonium, tetrapentylammonium, tetrahexylammonium, trimethylethylammonium, and an alkylammonium cation having a hydroxyalkyl group (carbon number of the alkyl group is 1 to 6) Trimethyl (2-hydroxyethyl) ammonium and triethyl (2-hydroxyethyl) ammonium. Among them, tetramethylammonium is preferred. Specific examples of the quaternary ammonium hydroxide include tetramethylammonium hydroxide, tetraethylammonium hydroxide, tetrapropylammonium hydroxide, tetrabutylammonium hydroxide, tetrapentylammonium hydroxide, and tetramethylammonium hydroxide. Hexyl ammonium hydroxide, trimethyl ethyl ammonium hydroxide, trimethyl (2-hydroxyethyl) ammonium hydroxide, triethyl (2-hydroxyethyl) ammonium hydroxide, and the like. Among these, from the viewpoint of removing the resin mask, tetramethylammonium hydroxide is preferred.

就樹脂遮罩層之去除性之觀點而言,洗淨劑組合物中之成分U之含量於洗淨劑組合物100質量份中,較佳為0.5質量份以上,更佳為1.0質量份以上,進而較佳為3.0質量份以上,並且,於洗淨劑組合物100質量份中,較佳為20.0質量份以下,更佳為15.0質量份以下。 From the viewpoint of the removability of the resin masking layer, the content of the component U in the detergent composition is 100 parts by mass of the detergent composition, preferably 0.5 parts by mass or more, and more preferably 1.0 parts by mass or more Furthermore, it is more preferably 3.0 parts by mass or more, and in 100 parts by mass of the detergent composition, it is preferably 20.0 parts by mass or less, and more preferably 15.0 parts by mass or less.

[成分V] [Ingredient V]

成分V為水,較佳為離子交換水、超純水等抑制離子性物質之水。就樹脂遮罩層之去除性之觀點而言,洗淨劑組合物中之成分V之含量於洗淨劑組合物100質量份中,較佳為3.0質量份以上,更佳為8.0 質量份以上,進而較佳為12.0質量份以上,並且於洗淨劑組合物100質量份中,較佳為20.0質量份以下,更佳為18.0質量份以下。 The component V is water, and is preferably water that suppresses ionic substances such as ion-exchanged water and ultrapure water. From the viewpoint of the removability of the resin masking layer, the content of the component V in the detergent composition is 100 parts by mass of the detergent composition, preferably 3.0 parts by mass or more, and more preferably 8.0 It is preferably 12.0 parts by mass or more, and more preferably 20.0 parts by mass or less, and more preferably 18.0 parts by mass or less, out of 100 parts by mass of the detergent composition.

就樹脂遮罩層之去除性之觀點而言,成分U與成分V之質量比[(U)/(V)]較佳為0.1以上,更佳為0.2以上,並且較佳為1.5以下,更佳為0.9以下,進而較佳為0.6以下。 From the viewpoint of the removability of the resin mask layer, the mass ratio [(U) / (V)] of the component U to the component V is preferably 0.1 or more, more preferably 0.2 or more, and more preferably 1.5 or less, more It is preferably 0.9 or less, and more preferably 0.6 or less.

就樹脂遮罩層之去除性之觀點而言,成分S和成分T之總量與成分U和成分V之總量之質量比[[(S)+(T)]/[(U)+(V)]]較佳為1.0以上,更佳為2.0以上,並且較佳為10.0以下,更佳為5.0以下。 From the viewpoint of the removability of the resin masking layer, the mass ratio of the total amount of components S and T to the total amount of components U and V [[(S) + (T)] / [(U) + ( V)]] is preferably 1.0 or more, more preferably 2.0 or more, and preferably 10.0 or less, and more preferably 5.0 or less.

[pH值] [pH value]

於一個或複數個實施形態中,就充分洗淨樹脂遮罩層之觀點而言,洗淨劑組合物之pH值較佳為11以上,更佳為12以上。pH值可利用成分U之胺及/或氫氧化四級銨之含量而加以調整。 In one or more embodiments, from the viewpoint of sufficiently cleaning the resin masking layer, the pH of the detergent composition is preferably 11 or more, more preferably 12 or more. The pH value can be adjusted by the content of the amine and / or quaternary ammonium hydroxide of the component U.

就自電路基板上去除殘存於電路基板上之可溶化於洗淨劑組合物中之污物及/或洗淨劑組合物之成分之觀點而言,步驟(6)於洗淨處理結束後,亦較佳為進行漂洗處理[以下亦稱為步驟(6a)]。漂洗處理中,較佳為使用水或醇。漂洗處理中之pH值較佳為在中性附近(例如,pH值6.0~8.0或pH值6.5~7.5)進行。進而,於洗淨處理或漂洗處理結束後,為了去除殘存於電路基板表面之水分,而較佳為進行乾燥處理[以下亦稱為步驟(6b)]。 From the viewpoint of removing from the circuit board the dirt and / or the components of the detergent composition that are soluble in the detergent composition remaining on the circuit board, step (6) after the cleaning process is completed, It is also preferable to perform a rinsing treatment [hereinafter also referred to as step (6a)]. In the rinsing treatment, water or alcohol is preferably used. The pH value in the rinsing treatment is preferably performed near neutrality (for example, a pH value of 6.0 to 8.0 or a pH value of 6.5 to 7.5). Furthermore, after the washing process or the rinsing process is completed, it is preferable to perform a drying process [hereinafter also referred to as step (6b)] in order to remove moisture remaining on the surface of the circuit board.

作為漂洗處理之方法,可列舉:浸漬法、超音波洗淨法、浸漬搖動法、噴霧法各種方法。就漂洗性之觀點而言,較佳為噴霧法及浸漬法,更佳為併用噴霧法及浸漬法。就漂洗性之觀點而言,沖洗處理之溫度較佳為25℃以上,更佳為40℃以上,又,就抑制水分之蒸發之觀點而言,較佳為90℃以下,更佳為80℃以下。就漂洗性之觀點而言,漂洗處理之時間較佳為3分鐘以上,更佳為5分鐘以上,就縮短電路基板之製造時間之觀點而言,較佳為30分鐘以下,更佳為20分鐘以 下。 Examples of the rinsing method include various methods such as a dipping method, an ultrasonic cleaning method, a dipping shaking method, and a spray method. From the viewpoint of rinsability, a spray method and a dipping method are preferred, and a spray method and a dipping method are more preferably used in combination. From the viewpoint of rinsing property, the temperature of the rinsing treatment is preferably 25 ° C or higher, more preferably 40 ° C or higher, and from the viewpoint of suppressing evaporation of water, preferably 90 ° C or lower, and more preferably 80 ° C. the following. From the viewpoint of rinsing property, the time of rinsing treatment is preferably 3 minutes or more, more preferably 5 minutes or more, and from the viewpoint of shortening the manufacturing time of the circuit board, 30 minutes or less is more preferable, and 20 minutes is more preferable To under.

又,作為乾燥處理中之乾燥方法,可列舉:例如利用烘箱或送風乾燥機進行乾燥之方法,就乾燥性之觀點而言,其乾燥溫度較佳為80℃以上,就抑制對電路基板之影響之觀點而言,較佳為加熱至120℃以下、更佳為100℃以下。 In addition, as a drying method in the drying process, for example, a method using an oven or a blower dryer for drying is preferable. From the viewpoint of drying property, the drying temperature is preferably 80 ° C or higher to suppress the influence on the circuit board. From the viewpoint, heating to 120 ° C or lower is preferred, and 100 ° C or lower is more preferred.

[電子構件之接合] [Joining of electronic components]

於一個或複數個實施形態中,本發明之電路基板之製造方法進而包含如下步驟,即,於上述步驟(5)中獲得之基板上載置電子構件,加熱至上述焊料凸塊之液相線溫度260℃以下之溫度,使電子構件之焊接部與基板之焊接部接合,藉此獲得接合有電子構件之基板。根據該實施形態,可製造出接合有電子構件之電路基板。 In one or more embodiments, the method for manufacturing a circuit board of the present invention further includes the steps of placing an electronic component on the substrate obtained in the step (5), and heating the electronic component to the liquidus temperature of the solder bump. At a temperature of 260 ° C. or less, the soldered portion of the electronic component is bonded to the soldered portion of the substrate, thereby obtaining a substrate to which the electronic component is bonded. According to this embodiment, a circuit board to which electronic components are bonded can be manufactured.

[樹脂遮罩層之去除方法] [Removal method of resin mask layer]

於其他方案中,本發明係自形成有樹脂遮罩層之電路基板上去除該樹脂遮罩層之方法,即,係關於包括利用本發明之洗淨劑組合物洗淨上述基板之步驟之方法。對於剝離劑組合物及洗淨劑組合物之具體構成、及使用該等之洗淨方法而言,可如上所述。 In another aspect, the present invention is a method for removing a resin masking layer from a circuit substrate on which the resin masking layer is formed, that is, a method including a step of cleaning the substrate using the detergent composition of the present invention. . The specific constitution of the release agent composition and the detergent composition, and the cleaning method using these may be as described above.

[試劑盒] [Kit]

本發明之另外之其他方案係本發明之電路基板之製造方法及/或用於本發明之樹脂遮罩層之去除方法中之試劑盒,其中係關於在調配前之狀態下含有本發明之洗淨劑組合物之成分A~D中之至少1種成分之試劑盒。就本發明之洗淨劑組合物之具體構成、及使用該等之洗淨方法而言,可如上所述。 Another aspect of the present invention is a method for manufacturing a circuit board of the present invention and / or a kit for use in a method for removing a resin masking layer of the present invention, wherein the kit contains the washing method of the present invention in a state before preparation. A kit of at least one of the components A to D of the detergent composition. The specific constitution of the detergent composition of the present invention and the cleaning method using these can be as described above.

關於上述之實施形態,本發明進一步揭示有以下之一個或複數個實施形態上述組合物、製造方法、或用途。 Regarding the above-mentioned embodiments, the present invention further discloses one or more of the following embodiments, the above-mentioned composition, production method, or use.

<1>包括下述步驟(1)~(5)之電路基板之製造方法。 <1> A method for manufacturing a circuit board including the following steps (1) to (5).

步驟(1):於設置有焊接部之基板表面形成樹脂遮罩層之步驟。 Step (1): a step of forming a resin masking layer on the surface of the substrate provided with the soldering portion.

步驟(2):於上述樹脂遮罩層中以露出上述焊接部之方式形成開口部之步驟。 Step (2): A step of forming an opening portion in the resin mask layer so that the welding portion is exposed.

步驟(3):於上述開口部填充焊料凸塊形成材料之步驟。 Step (3): A step of filling the above-mentioned opening with a solder bump forming material.

步驟(4):加熱使上述焊料凸塊形成材料熔融,藉此將焊料凸塊固定於上述焊接部之步驟。 Step (4): A step of fixing the solder bump to the soldered portion by heating to melt the solder bump forming material.

步驟(5):使用洗淨劑組合物對步驟(4)中獲得之基板進行洗淨之步驟,其中,上述洗淨劑組合物於洗淨劑組合物100質量份中,含有下述式(I)所表示之氫氧化四級銨(成分A)0.5質量份以上且3.0質量份以下,含有水溶性胺(成分B)3.0質量份以上且14.0質量份以下,含有酸或其銨鹽(成分C)0.3質量份以上且2.5質量份以下,含有水(成分D)50.0質量份以上且95.0質量份以下。 Step (5): A step of cleaning the substrate obtained in step (4) by using a detergent composition, wherein the detergent composition contains 100% by mass of the detergent composition and contains the following formula ( I) The quaternary ammonium hydroxide (component A) represented by 0.5 parts by mass or more and 3.0 parts by mass or less, containing 3.0 parts by mass or more and 14.0 parts by mass or less of a water-soluble amine (component B), and containing an acid or its ammonium salt C) 0.3 mass part or more and 2.5 mass parts or less, and containing 50.0 mass parts or more and 95.0 mass parts or less of water (component D).

(式中,R1、R2、R3各自相同或不同,為碳數1~4之烷基,R4為碳數1~4之烷基或碳數1~4之羥基取代烷基) (In the formula, R 1 , R 2 , and R 3 are the same or different, and are alkyl groups having 1 to 4 carbons; R 4 is alkyl groups having 1 to 4 carbons or hydroxy-substituted alkyl groups having 1 to 4 carbons)

<2>如<1>之電路基板之製造方法,其中作為上述成分A之氫氧化四級銨係選自由四甲基氫氧化銨、四乙基氫氧化銨、四丙基氫氧化銨、四丁基氫氧化銨、四戊基氫氧化銨、四己基氫氧化銨銨、三甲基乙基氫氧化銨、三甲基(2-羥基乙基)氫氧化銨、三乙基(2-羥基乙基)氫氧化銨、及該等之組合所構成之群。 <2> The method for manufacturing a circuit board according to <1>, wherein the quaternary ammonium hydroxide as the component A is selected from the group consisting of tetramethylammonium hydroxide, tetraethylammonium hydroxide, tetrapropylammonium hydroxide, and Butyl ammonium hydroxide, tetrapentyl ammonium hydroxide, tetrahexyl ammonium hydroxide, trimethyl ethyl ammonium hydroxide, trimethyl (2-hydroxyethyl) ammonium hydroxide, triethyl (2-hydroxy Ethyl) ammonium hydroxide and combinations thereof.

<3>如<1>或<2>之電路基板之製造方法,其中作為上述成分A之氫氧化四級銨之含量於洗淨劑組合物100質量份中,為0.5質量份以上,較佳為0.7質量份以上及/或3.0質量份以下,較佳為2.0質量份以下,更佳為1.5質量份以下。 <3> The method for manufacturing a circuit board according to <1> or <2>, wherein the content of the quaternary ammonium hydroxide as the above component A is 100 parts by mass of the detergent composition, and is preferably 0.5 parts by mass or more, preferably It is 0.7 parts by mass or more and / or 3.0 parts by mass or less, preferably 2.0 parts by mass or less, and more preferably 1.5 parts by mass or less.

<4>如<1>至<3>中任一項之電路基板之製造方法,其中作為上述成分B之水溶性胺係選自由烷基胺、烷醇胺、多胺、環式胺、及該等之組合所構成之群,較佳為烷醇胺,上述烷醇胺係選自由單乙醇胺、N-乙基乙醇胺、N-正丁基乙醇胺、N,N-二乙基乙醇胺、N,N-二丁基乙醇胺、N-第三丁基乙醇胺、N-甲基乙醇胺、及該等之組合所構成之群,較佳為單乙醇胺。 <4> The method for manufacturing a circuit board according to any one of <1> to <3>, wherein the water-soluble amine as the component B is selected from the group consisting of an alkylamine, an alkanolamine, a polyamine, a cyclic amine, and The group composed of these combinations is preferably an alkanolamine. The alkanolamine is selected from the group consisting of monoethanolamine, N-ethylethanolamine, N-n-butylethanolamine, N, N-diethylethanolamine, N, The group consisting of N-dibutylethanolamine, N-thirdbutylethanolamine, N-methylethanolamine, and combinations thereof is preferably monoethanolamine.

<5>如<1>至<4>中任一項之電路基板之製造方法,其中作為上述成分B之水溶性胺為下述式(II)所表示之胺。 <5> The method for producing a circuit board according to any one of <1> to <4>, wherein the water-soluble amine as the component B is an amine represented by the following formula (II).

<6>如<1>至<5>中任一項之電路基板之製造方法,其中作為上述成分B之水溶性胺之含量於洗淨劑組合物100質量份中,為3.0質量份以上,較佳為4.0質量份以上及/或14.0質量份以下,較佳為12.0質量份以下,更佳為10.0質量份以下,進而較佳為8.0質量份以下,進而更佳為7.0質量份以下。 <6> The method for producing a circuit board according to any one of <1> to <5>, wherein the content of the water-soluble amine as the component B is 3.0 parts by mass or more in 100 parts by mass of the detergent composition, It is preferably 4.0 parts by mass or more and / or 14.0 parts by mass, more preferably 12.0 parts by mass or less, more preferably 10.0 parts by mass or less, still more preferably 8.0 parts by mass or less, and even more preferably 7.0 parts by mass or less.

<7>如<1>至<6>中任一項之電路基板之製造方法,其中作為上述成分C之酸或其銨鹽之含量於洗淨劑組合物100質量份中,為0.3質量份以上,較佳為0.6質量份以上,更佳為0.8質量份以上,進而較佳為0.9質量份以上,且為2.5質量份以下,較佳為1.5質量份以下。 <7> The method for producing a circuit board according to any one of <1> to <6>, wherein the content of the acid or its ammonium salt as the component C is 0.3 parts by mass in 100 parts by mass of the detergent composition. The above is preferably 0.6 parts by mass or more, more preferably 0.8 parts by mass or more, still more preferably 0.9 parts by mass or more, and 2.5 parts by mass or less, and preferably 1.5 parts by mass or less.

<8>如<1>至<7>中任一項之電路基板之製造方法,其中作為上述成分D之水之含量於洗淨劑組合物100質量份中,為50.0質量份以上,較佳為70.0質量份以上,更佳為75.0質量份以上,進而較佳為80.0質量份以上及/或95.0質量份以下,較佳為93.0質量份以下。 <8> The method for manufacturing a circuit board according to any one of <1> to <7>, wherein the content of water as the component D is 100 parts by mass of the detergent composition, and is preferably 50.0 parts by mass or more, preferably It is 70.0 parts by mass or more, more preferably 75.0 parts by mass or more, still more preferably 80.0 parts by mass or more and / or 95.0 parts by mass or less, and more preferably 93.0 parts by mass or less.

<9>如<1>至<8>中任一項之電路基板之製造方法,其中上述步驟(4)中之加熱溫度較佳為200℃以上及/或較佳為260℃以 下。 <9> The method for manufacturing a circuit board according to any one of <1> to <8>, wherein the heating temperature in the above step (4) is preferably 200 ° C or higher and / or preferably 260 ° C or higher under.

<10>如<1>至<9>中任一項之電路基板之製造方法,其中上述步驟(4)中之加熱溫度較佳為上述焊料凸塊形成材料之液相線溫度以上且260℃以下之溫度。 <10> The method for manufacturing a circuit board according to any one of <1> to <9>, wherein the heating temperature in the step (4) is preferably equal to or higher than the liquidus temperature of the solder bump forming material and 260 ° C. The following temperature.

<11>如<1>至<10>中任一項之電路基板之製造方法,其中上述步驟(5)中之洗淨時之pH值較佳為10.0以上,更佳為11.0以上,進而較佳為12.0以上及/或較佳為14.0以下,更佳為13.5以下,進而較佳為13.0以下。 <11> The method for manufacturing a circuit board according to any one of <1> to <10>, wherein the pH value during the cleaning in the step (5) is preferably 10.0 or more, more preferably 11.0 or more, and It is preferably 12.0 or more and / or 14.0 or less, more preferably 13.5 or less, and even more preferably 13.0 or less.

<12>如<1>至<11>中任一項之電路基板之製造方法,其中上述步驟(5)中之洗淨時之溫度較佳為25℃以上,更佳為40℃以上及/或較佳為90℃以下,更佳為80℃以下。 <12> The method for manufacturing a circuit board according to any one of <1> to <11>, wherein the temperature during cleaning in the above step (5) is preferably 25 ° C or higher, more preferably 40 ° C or higher and / Or it is preferably 90 ° C or lower, more preferably 80 ° C or lower.

<13>如<1>至<12>中任一項之電路基板之製造方法,其中步驟(5)進而包括於洗淨處理結束後進行漂洗處理(步驟(5a))及/或乾燥處理(步驟(5b))。 <13> The method for manufacturing a circuit board according to any one of <1> to <12>, wherein step (5) further includes performing a rinsing process (step (5a)) and / or a drying process ( Step (5b)).

<14>如<1>至<13>中任一項之電路基板之製造方法,其進而包括下述步驟(6)。 <14> The method for manufacturing a circuit board according to any one of <1> to <13>, further including the following step (6).

步驟(6):使用含有二甲基亞碸(DMSO)(成分S)、二醇醚(成分T)、在25℃之水溶液中之酸解離常數pKa為9.0以上之胺及/或氫氧化四級銨(成分U)、及水(成分V)之洗淨劑組合物,對步驟(5)中獲得之基板進行洗淨之步驟。 Step (6): Use amine and / or tetrahydroxide containing dimethylsulfinium (DMSO) (component S), glycol ether (component T), and acid dissociation constant pKa of 9.0 or higher in an aqueous solution at 25 ° C A cleaning agent composition of grade ammonium (component U) and water (component V), a step of cleaning the substrate obtained in step (5).

<15>如<14>之電路基板之製造方法,其中步驟(6)之洗淨劑組合物中之二醇醚(成分T)為下述式(III)所表示之二醇醚。 <15> The method for producing a circuit board according to <14>, wherein the glycol ether (ingredient T) in the detergent composition in step (6) is a glycol ether represented by the following formula (III).

R8O(AO)nR9 (III) R 8 O (AO) n R 9 (III)

(式中,R8為碳數1~6之烷基或碳數6~15之芳基,R9為氫原子或碳數1~6之烷基,AO為碳數2或3之伸烷基氧基,n係平均加成莫耳數且為1~4) (Wherein R 8 is an alkyl group having 1 to 6 carbon atoms or an aryl group having 6 to 15 carbon atoms, R 9 is a hydrogen atom or an alkyl group having 1 to 6 carbon atoms, and AO is an alkylene group having 2 or 3 carbon atoms (Oxy group, n is the average addition mole number and is 1 ~ 4)

<16>如<14>或<15>之電路基板之製造方法,其中上述步驟(6)之洗淨劑組合物中之胺及/或氫氧化四級銨(成分U)為下述式(IV)所表示之胺及/或下述式(V)所表示之氫氧化四級銨。 <16> The method for manufacturing a circuit board according to <14> or <15>, wherein the amine and / or quaternary ammonium hydroxide (component U) in the detergent composition of the above step (6) is the following formula ( The amine represented by IV) and / or the quaternary ammonium hydroxide represented by the following formula (V).

(R10)3N (IV) (R 10 ) 3 N (IV)

(式中,R10各自相同或不同,為氫原子、碳數1~6之烴基、碳數1~6之羥基烷基、或碳數1~6之胺基烷基,3個R10並不同時為氫原子) (Wherein, R 10 are each the same or different, is a hydrogen atom, a hydrocarbon group having 1 to 6 carbon atoms, the carbon atoms of the hydroxyalkyl group having 1 to 6, carbon atoms, or an alkyl group of 1 to 6, R 10 and 3 (Not a hydrogen atom at the same time)

[(R11)3-N-R12]+OH- (V) [(R 11) 3 -NR 12 ] + OH - (V)

(式中,R11各自相同或不同,為碳數1~3之烷基、R12為1~3之烷基或碳數1~3之羥基烷基) (Wherein R 11 is the same or different and is an alkyl group having 1 to 3 carbon atoms, R 12 is an alkyl group having 1 to 3 carbon atoms or a hydroxyalkyl group having 1 to 3 carbon atoms)

<17>如<14>至<16>中任一項之電路基板之製造方法,其中上述步驟(6)之洗淨劑組合物相對於該洗淨劑組合物100質量份,含有二甲基亞碸(成分S)10.0質量份以上,較佳為30.0質量份以上,更佳為35.0質量份以上,進而較佳為39.0質量份以上及/或50.0質量份以下,較佳為43.0質量份以下,含有二醇醚(成分T)30.0質量份以上,較佳為35.0質量份以上及/或70.0質量份以下,較佳為50.0質量份以下,更佳為43.0質量份以下,含有胺及/或氫氧化四級銨(成分U)0.5質量份以上,較佳為1.0質量份以上,更佳為3.0質量份以上及/或20.0質量份以下,較佳為15.0質量份以下,含有水(成分V)3.0質量份以上,較佳為8.0質量份以上,更佳為12.0質量份以上及/或20.0質量份以下,較佳為18.0質量份以下。 <17> The method for manufacturing a circuit board according to any one of <14> to <16>, wherein the detergent composition of the above step (6) contains 100 parts by mass of the detergent composition and contains dimethyl 10.0 parts by mass or more, preferably 30.0 parts by mass or more, more preferably 35.0 parts by mass or more, more preferably 39.0 parts by mass or more and / or 50.0 parts by mass or less, and preferably 43.0 parts by mass or less 30.0 parts by mass or more, preferably 35.0 parts by mass or more and / or 70.0 parts by mass or less, preferably 50.0 parts by mass or less, more preferably 43.0 parts by mass or less, containing an amine and / or Tetraammonium hydroxide (component U) is 0.5 parts by mass or more, preferably 1.0 part by mass or more, more preferably 3.0 parts by mass or more and / or 20.0 parts by mass or less, preferably 15.0 parts by mass or less, and contains water (ingredient V ) 3.0 parts by mass or more, preferably 8.0 parts by mass or more, more preferably 12.0 parts by mass or more and / or 20.0 parts by mass or less, and more preferably 18.0 parts by mass or less.

<18>如<14>至<17>中任一項之電路基板之製造方法,其中上述步驟(6)之洗淨劑組合物中之二甲基亞碸(成分S)與二醇醚(成分T)之質量比[(S)/(T)]為0.15以上,較佳為0.30以上,更佳為0.50以上及/或2.00以下,較佳為1.50以下,更佳為1.20以下。 <18> The method for manufacturing a circuit board according to any one of <14> to <17>, wherein the dimethylsulfinium (component S) and the glycol ether (component S) in the detergent composition of the above step (6) The mass ratio [(S) / (T)] of component T) is 0.15 or more, preferably 0.30 or more, more preferably 0.50 or more and / or 2.00 or less, preferably 1.50 or less, and more preferably 1.20 or less.

<19>如<14>至<18>中任一項之電路基板之製造方法,其 中上述步驟(6)之洗淨劑組合物中之胺及/或氫氧化四級銨(成分U)在25℃之水溶液中之酸解離常數pKa較佳為9.5以上,更佳為9.8以上及/或較佳為12.0以下,更佳為11.5以下,進而較佳為11.0以下。 <19> The method for manufacturing a circuit board according to any one of <14> to <18>, which The acid dissociation constant pKa of the amine and / or quaternary ammonium hydroxide (component U) in the detergent composition of the above step (6) in an aqueous solution at 25 ° C is preferably 9.5 or more, more preferably 9.8 or more and It is preferably 12.0 or less, more preferably 11.5 or less, and even more preferably 11.0 or less.

<20>如<14>至<19>中任一項之電路基板之製造方法,其中上述步驟(6)之洗淨劑組合物中之胺及/或氫氧化四級銨(成分U)之含量,於洗淨劑組合物100質量份中,為0.5質量份以上,較佳為1.0質量份以上,更佳為3.0質量份以上及/或20.0質量份以下,較佳為15.0質量份以下。 <20> The method for manufacturing a circuit board according to any one of <14> to <19>, wherein the amine and / or quaternary ammonium hydroxide (ingredient U) in the detergent composition of the above step (6) Content is 0.5 mass part or more in 100 mass parts of a detergent composition, Preferably it is 1.0 mass part or more, More preferably, it is 3.0 mass part or more and / or 20.0 mass part or less, More preferably, it is 15.0 mass part or less.

<21>如<14>至<20>中任一項之電路基板之製造方法,其中上述步驟(6)之洗淨劑組合物中之水(成分V)之含量,為3.0質量份以上,較佳為8.0質量份以上,更佳為12.0質量份以上及/或20.0質量份以下,較佳為18.0質量份以下。 <21> The method for manufacturing a circuit board according to any one of <14> to <20>, wherein the content of water (ingredient V) in the detergent composition of the above step (6) is 3.0 parts by mass or more, It is preferably 8.0 parts by mass or more, more preferably 12.0 parts by mass or more and / or 20.0 parts by mass or less, and more preferably 18.0 parts by mass or less.

<22>如<14>至<21>中任一項之電路基板之製造方法,其中成分U與成分V之質量比[(U)/(V)]較佳為0.1以上,更佳為0.2以上及/或較佳為1.5以下,更佳為0.9以下,進而較佳為0.6以下。 <22> The method for manufacturing a circuit board according to any one of <14> to <21>, wherein the mass ratio [(U) / (V)] of the component U to the component V is preferably 0.1 or more, and more preferably 0.2 The above and / or is preferably 1.5 or less, more preferably 0.9 or less, and still more preferably 0.6 or less.

<23>如<14>至<22>中任一項之電路基板之製造方法,其中成分S和成分T之總量與成分U和成分V之總量之質量比[[(S)+(T)]/[(U)+(V)]]較佳為1.0以上,更佳為2.0以上及/或較佳為10.0以下,更佳為5.0以下。 <23> The method for manufacturing a circuit board according to any one of <14> to <22>, wherein the mass ratio of the total amount of the components S and T to the total amount of the components U and V [[(S) + ( T)] / [(U) + (V)]] is preferably 1.0 or more, more preferably 2.0 or more, and / or 10.0 or less, and more preferably 5.0 or less.

<24>如<14>至<23>中任一項之製造方法,其中上述步驟(6)之洗淨劑組合物之pH值較佳為11以上,更佳為12以上。 <24> The manufacturing method according to any one of <14> to <23>, wherein the pH value of the detergent composition in the step (6) is preferably 11 or more, and more preferably 12 or more.

<25>如<14>至<24>中任一項之電路基板之製造方法,其中於上述步驟(5)與上述步驟(6)之間包括漂洗處理之步驟。 <25> The method for manufacturing a circuit board according to any one of <14> to <24>, wherein a step of rinsing treatment is included between the above step (5) and the above step (6).

<26>一種洗淨劑組合物,其於洗淨劑組合物100質量份中,含有下述式(I)所表示之氫氧化四級銨(成分A)0.5質量份以上且3.0質量份以下, 含有水溶性胺(成分B)3.0質量份以上且14.0質量份以下,含有酸或其銨鹽(成分C)0.3質量份以上且2.5質量份以下,含有水(成分D)50.0質量份以上且95.0質量份以下。 <26> A detergent composition containing, in 100 parts by mass of the detergent composition, 0.5 parts by mass or more and 3.0 parts by mass or less of quaternary ammonium hydroxide (component A) represented by the following formula (I) , Contains 3.0 parts by mass or more and 14.0 parts by mass or less of water-soluble amine (component B), 0.3 parts by mass or more and 2.5 parts by mass or less of acid or its ammonium salt (component C), and 50.0 parts by mass or more and 95.0 parts of water (component D) Mass parts or less.

(式中,R1、R2、R3各自相同或不同,為碳數1~4之烷基,R4為碳數1~4之烷基或碳數1~4之羥基取代烷基) (In the formula, R 1 , R 2 , and R 3 are the same or different, and are alkyl groups having 1 to 4 carbons; R 4 is alkyl groups having 1 to 4 carbons or hydroxy-substituted alkyl groups having 1 to 4 carbons)

<27>一種如<26>之洗淨劑組合物之應用,其作為如<1>至<25>中任一項之電路基板之製造方法之步驟(5)中之洗淨劑組合物。 <27> An application of the detergent composition as described in <26> as the detergent composition in step (5) of the method for manufacturing a circuit board according to any one of <1> to <25>.

<28>一種洗淨劑組合物,其含有二甲基亞碸(DMSO)(成分S)、二醇醚(成分T)、在25℃之水溶液中之酸解離常數pKa為9.0以上之胺及/或氫氧化四級銨(成分U)、及水(成分V)。 <28> A detergent composition containing dimethylsulfinium (DMSO) (component S), glycol ether (component T), an amine having an acid dissociation constant pKa of 9.0 or higher in an aqueous solution at 25 ° C, and And / or quaternary ammonium hydroxide (component U) and water (component V).

<29>一種如<28>之洗淨劑組合物之應用,其作為如<11>至<25>中任一項之電路基板之製造方法之步驟(6)中之洗淨劑組合物。 <29> An application of the detergent composition as described in <28> as the detergent composition in step (6) of the method for manufacturing a circuit board according to any one of <11> to <25>.

<30>一種電路基板之洗淨方法,其包括使用如<26>或<28>之洗淨劑組合物對電路基板進行洗淨之步驟。 <30> A method for cleaning a circuit substrate, comprising the step of cleaning the circuit substrate using a detergent composition such as <26> or <28>.

<31>一種試劑盒,其係用於如<14>至<25>中任一項之製造方法之試劑盒,其包含步驟(5)中使用之如<26>之洗淨劑組合物、及步驟(6)中使用之如<28>之洗淨劑組合物。 <31> A kit for use in a manufacturing method such as any one of <14> to <25>, comprising a detergent composition such as <26> used in step (5), And the detergent composition such as <28> used in step (6).

<32>一種如<26>之洗淨劑組合物作為電路基板製造中之洗淨劑之應用。 <32> Use of a detergent composition such as <26> as a detergent in the manufacture of circuit boards.

[實施例] [Example]

以下之實施例以本發明之例示為目的,其在任何意義上均無對本發明加以限制之意圖。實施例中,%只要無特別規定,則為質量%。 The following examples are for the purpose of illustration of the present invention, and they are not intended to limit the present invention in any sense. In the examples,% is mass% unless otherwise specified.

<實施例1~30及比較例1~12> <Examples 1 to 30 and Comparative Examples 1 to 12>

使用下述樹脂遮罩層用洗淨劑組合物、電路基板,製造形成有焊料凸塊之電路基板。 A circuit board on which solder bumps were formed was produced using the following detergent composition for a resin mask layer and a circuit board.

[樹脂遮罩層用洗淨劑組合物之製備] [Preparation of Detergent Composition for Resin Masking Layer]

使用四甲基氫氧化銨1質量份、單乙醇胺5質量份、甲酸銨1質量份、二乙二醇丁醚12質量份、二甲基亞碸4質量份、水77質量份(合計100質量份)進行調配,將該等均勻混合,藉此製備實施例1之樹脂遮罩層用洗淨劑組合物。pH值為10.9。需說明的是,pH值係25℃下之研磨液組合物之pH值,可使用pH計進行測定,係將電極浸漬於研磨液組合物中後40分鐘後之數值(下同)。 1 part by mass of tetramethylammonium hydroxide, 5 parts by mass of monoethanolamine, 1 part by mass of ammonium formate, 12 parts by mass of diethylene glycol butyl ether, 4 parts by mass of dimethyl sulfene, and 77 parts by mass of water (total 100 parts by mass) Parts), and the mixture was uniformly mixed to prepare a detergent composition for a resin masking layer of Example 1. The pH was 10.9. It should be noted that the pH value is the pH value of the polishing liquid composition at 25 ° C., which can be measured using a pH meter, and is a value after 40 minutes after the electrode is immersed in the polishing liquid composition (the same applies hereinafter).

代替表1及表2所示之實施例1之樹脂遮罩層用洗淨劑組合物之組成,與實施例1同樣地製備實施例2~30、比較例1~12之樹脂遮罩層用洗淨劑組合物。 Instead of the composition of the detergent composition for the resin masking layer of Example 1 shown in Tables 1 and 2, the resin masking layers for Examples 2 to 30 and Comparative Examples 1 to 12 were prepared in the same manner as in Example 1. Detergent composition.

[電路基板] [Circuit Board]

於焊料凸塊之形成中所使用之電路基板係厚度300μm、尺寸15mm×15mm之玻璃環氧基板。就該基板而言,每1晶片以50μm之間距具有3600個直徑25μm之銅表面之電極。基板表面之電極周圍被高於電極之高度為15μm之阻焊層包圍。 The circuit substrate used in the formation of the solder bump is a glass epoxy substrate having a thickness of 300 μm and a size of 15 mm × 15 mm. For this substrate, there are 3600 electrodes with a copper surface of 25 μm in diameter at a distance of 50 μm per wafer. The electrodes on the surface of the substrate are surrounded by a solder resist layer having a height of 15 μm above the electrodes.

[形成有焊料凸塊之電路基板之製造] [Manufacturing of a circuit board with solder bumps]

實施例1~30及比較例1~12中,按照下述步驟(1)~步驟(5b)製造形成有焊料凸塊之電路基板。 In Examples 1 to 30 and Comparative Examples 1 to 12, circuit boards on which solder bumps were formed were manufactured according to the following steps (1) to (5b).

步驟(1)在形成於電路基板之阻焊層(太陽油墨:AUS410)上貼 附抗蝕膜(杜邦:WB-5030),形成了樹脂遮罩層。 Step (1) Paste on a solder resist layer (sun ink: AUS410) formed on the circuit board A resist film (DuPont: WB-5030) was attached to form a resin mask layer.

步驟(2)利用曝光、顯影處理於電路基板之電極上之樹脂遮罩層及阻焊層中形成開口部。 In step (2), openings are formed in the resin mask layer and the solder resist layer on the electrodes of the circuit substrate by exposure and development processes.

步驟(3)塗佈市售之焊膏(Eco solder M705-GRN360-K2-V(千住金屬工業製作,焊料金屬(Sn-3Ag-0.5Cu)與焊劑助劑(松香酸、添加劑及溶劑之混合物)之混合物、液相線溫度217℃)。 Step (3) Apply a commercially available solder paste (Eco solder M705-GRN360-K2-V (manufactured by Senju Metal Industries, a mixture of solder metal (Sn-3Ag-0.5Cu) and flux auxiliary (rosin acid, additives and solvents) ) Mixture, liquidus temperature 217 ° C).

步驟(4)在250℃之熱板上加熱1分鐘,使其回焊,於電路基板之電極上形成焊料凸塊。將該電路基板切斷成1cm見方,製成測試件。 Step (4): heating on a hot plate at 250 ° C. for 1 minute to re-solder, and forming solder bumps on the electrodes of the circuit substrate. This circuit board was cut to a size of 1 cm square to prepare a test piece.

步驟(5)在保持於溫度60℃之放有100g之樹脂遮罩層用洗淨劑組合物之200ml之燒杯內,將上述1cm見方之測試件浸漬3分鐘,進行洗淨,自燒杯中取出測試件。 Step (5) In a 200 ml beaker containing 100 g of a detergent composition for a resin masking layer kept at a temperature of 60 ° C., immerse the above 1 cm square test piece for 3 minutes, wash it, and remove it from the beaker. Test piece.

步驟(5a)將測試件在保持於溫度60℃之離子交換水中浸漬5分鐘,進行沖洗,取出測試件。 Step (5a): immerse the test piece in ion-exchanged water maintained at a temperature of 60 ° C. for 5 minutes, rinse it, and remove the test piece.

步驟(5b)將測試件利用送風低溫乾燥機在溫度85℃下乾燥15分鐘。 In step (5b), the test piece is dried at a temperature of 85 ° C. for 15 minutes by using a low-temperature air dryer.

關於實施例1~30及比較例1~12之測試件中之樹脂遮罩層之去除性,以下述條件進行評價。將其結果示於表2。 Removability of the resin masking layer in the test pieces of Examples 1 to 30 and Comparative Examples 1 to 12 was evaluated under the following conditions. The results are shown in Table 2.

<樹脂遮罩去除性評價> <Resin Mask Removability Evaluation>

利用光學顯微鏡觀察(倍率:900倍)電路基板之製造後之測試件,由1cm見方之測試件中選擇5個視野,以光學顯微鏡之面積測定模式計算殘存於基板上之樹脂遮罩之面積,算出洗淨率。用於去除率之計算方法、測定中之光學顯微鏡如下所示。實施例1~30及比較例1~12以凸塊周邊以外之位置進行評價。需說明的是,凸塊周邊以外之位置難以洗淨,故而為容易顯現差別之位置。 Use a light microscope to observe (magnification: 900 times) the test piece after the circuit board is manufactured. Select 5 fields of view from the 1 cm square test piece, and use the area measurement mode of the optical microscope to calculate the area of the resin mask remaining on the substrate. Calculate the washing rate. The calculation method for the removal rate and the optical microscope used in the measurement are shown below. Examples 1 to 30 and Comparative Examples 1 to 12 were evaluated at positions other than the periphery of the bumps. It should be noted that the positions other than the perimeter of the bumps are difficult to clean, and therefore the positions are easy to show differences.

去除率=(5個視野之總面積-洗淨後之基板上之樹脂遮罩殘渣面積)÷5個視野之總面積×100 Removal rate = (total area of 5 fields of view-area of the resin mask residue on the substrate after cleaning) ÷ total area of 5 fields of view × 100

測定機器:KEYENCE製造之Digital microscope VHX-2000 Measuring machine: Digital microscope VHX-2000 manufactured by KEYENCE

<錫之溶解性> <Solubility of tin>

於實施例1~30及比較例1~12之樹脂遮罩層用洗淨劑組合物20g中,將和光純藥工業製造之錫(粒狀)1.8g一面在50℃下攪拌20分鐘一面浸漬,測定於洗淨劑組合物中溶出之錫之濃度。錫之濃度越高,則表示焊料腐蝕性越高。 In 20 g of the detergent composition for resin masking layers of Examples 1 to 30 and Comparative Examples 1 to 12, 1.8 g of tin (granular) manufactured by Wako Pure Chemical Industries was impregnated while stirring at 50 ° C for 20 minutes. Measure the concentration of tin dissolved in the detergent composition. The higher the tin concentration, the higher the solder corrosivity.

錫之濃度測定係按以下之方法進行。 The measurement of tin concentration was performed by the following method.

對於洗淨劑組合物,用ICP發光分析裝置(PerkinElmer公司製造,Optima 5300)測定錫之發光強度,對Sn蝕刻量進行定量。 With respect to the detergent composition, the luminous intensity of tin was measured with an ICP emission analyzer (PerkinElmer, Optima 5300) to quantify the amount of Sn etching.

如表2所示,若於步驟(5)中使用實施例1~30之樹脂遮罩層用洗淨劑組合物,則與比較例1~12相比,可良好地洗淨去除樹脂遮罩層,並且可抑制焊料之腐蝕。 As shown in Table 2, when the detergent composition for a resin masking layer of Examples 1 to 30 is used in step (5), the resin mask can be washed and removed better than Comparative Examples 1 to 12 Layer, and can inhibit the corrosion of solder.

<焊料SEM觀察> <Solder SEM observation>

於實施例10及比較例1之樹脂遮罩層用洗淨劑組合物中,將安裝有千住金屬工業製造之焊料(Sn-3Ag-0.5Cu、直徑80μm)之基板在50℃下浸漬20分鐘。利用FE-SEM(日立HighTech製造,S-4000)將洗淨組合物浸漬前後之焊料表面放大至900倍,觀察有無孔腐蝕等腐蝕。觀察照片如圖2所示。於實施例10中浸漬之情形時,未見焊料表面之變化。於比較例1中浸漬之情形時,觀察到焊料表面孔腐蝕。 In the detergent composition for resin masking layer of Example 10 and Comparative Example 1, a substrate on which solder (Sn-3Ag-0.5Cu, diameter 80 μm) manufactured by Senju Metal Industry was mounted was immersed at 50 ° C. for 20 minutes. . FE-SEM (S-4000, manufactured by Hitachi HighTech) was used to enlarge the solder surface before and after dipping the cleaning composition to 900 times, and observe the presence or absence of corrosion such as pore corrosion. Observation photos are shown in Figure 2. In the case of dipping in Example 10, no change in the surface of the solder was observed. In the case of immersion in Comparative Example 1, solder surface hole corrosion was observed.

<實施例31~48及比較例13~26> <Examples 31 to 48 and Comparative Examples 13 to 26>

[形成有焊料凸塊之電路基板之製造] [Manufacturing of a circuit board with solder bumps]

使用實施例24之樹脂遮罩層用洗淨劑組合物(實施例31~39、比較例13~19)、及實施例9之樹脂遮罩層用洗淨劑組合物(實施例40~48、比較例20~26),按照下述步驟(1)~步驟(6b)製造了形成有焊料凸塊之電路基板。需說明的是,焊料凸塊之形成中使用之電路基板係使用與上述相同之基板。 The detergent composition for the resin masking layer of Example 24 (Examples 31 to 39, Comparative Examples 13 to 19) and the detergent composition for the resin masking layer of Example 9 (Examples 40 to 48) were used. (Comparative Examples 20 to 26). A circuit board having solder bumps formed thereon was manufactured according to the following steps (1) to (6b). It should be noted that the circuit substrate used in the formation of the solder bump is the same substrate as described above.

步驟(1)在形成於電路基板之阻焊層(太陽油墨:AUS410)上貼附抗蝕膜(杜邦:WB-5030),形成樹脂遮罩層。 Step (1) A resist film (DuPont: WB-5030) is attached to a solder resist layer (sun ink: AUS410) formed on a circuit substrate to form a resin masking layer.

步驟(2)利用曝光、顯影處理於電路基板之電極上之樹脂遮罩層及阻焊層中形成開口部。 In step (2), openings are formed in the resin mask layer and the solder resist layer on the electrodes of the circuit substrate by exposure and development processes.

步驟(3)塗佈市售之焊膏(Eco solder M705-GRN360-K2-V(千住金屬製造,焊料金屬(Sn-3Ag-0.5Cu)與焊劑助劑(松香酸、添加劑及溶劑之混合物)之混合物、液相線溫度217℃)。 Step (3) Apply a commercially available solder paste (Eco solder M705-GRN360-K2-V (manufactured by Senju Metal, solder metal (Sn-3Ag-0.5Cu) and flux auxiliary agent (mixture of rosin acid, additives and solvent)) Mixture, liquidus temperature 217 ° C).

步驟(4)在250℃之熱板上加熱1分鐘,使其回焊,於電路基板之電極上形成焊料凸塊。將該電路基板切斷成1cm見方,製成測試件。 Step (4): heating on a hot plate at 250 ° C. for 1 minute to re-solder, and forming solder bumps on the electrodes of the circuit substrate. This circuit board was cut to a size of 1 cm square to prepare a test piece.

步驟(5)在保持於溫度60℃之放有100g樹脂遮罩層用洗淨劑組合物之200ml燒杯內,將上述1cm見方之測試件浸漬1分鐘並進行洗淨,自燒杯中取出測試件。 Step (5) In a 200 ml beaker containing 100 g of the detergent composition for a resin masking layer kept at a temperature of 60 ° C., immerse the 1 cm square test piece for 1 minute and wash it, and remove the test piece from the beaker. .

步驟(5a)將測試件在保持於溫度60℃之離子交換水中浸漬5分鐘,進行沖洗,取出測試件。 Step (5a): immerse the test piece in ion-exchanged water maintained at a temperature of 60 ° C. for 5 minutes, rinse it, and remove the test piece.

步驟(5b)將測試件利用送風低溫乾燥機在溫度85℃下乾燥15分鐘。 In step (5b), the test piece is dried at a temperature of 85 ° C. for 15 minutes by using a low-temperature air dryer.

步驟(6)在保持於溫度60℃之放有100g洗淨劑組合物之200ml燒杯內,將上述1cm見方之測試件浸漬1分鐘並進行洗淨,自燒杯中取出測試件。 Step (6) In a 200 ml beaker containing 100 g of the detergent composition kept at a temperature of 60 ° C., immerse the 1 cm square test piece for 1 minute and wash it, and then remove the test piece from the beaker.

步驟(6a)將測試件在保持於溫度60℃之離子交換水中浸漬5分鐘,進行沖洗,取出測試件。 Step (6a): immerse the test piece in ion-exchanged water maintained at a temperature of 60 ° C. for 5 minutes, rinse it, and remove the test piece.

步驟(6b)將測試件利用送風低溫乾燥機在溫度85℃下乾燥15分鐘。 In step (6b), the test piece is dried at a temperature of 85 ° C. for 15 minutes by using a blower low-temperature dryer.

[步驟(6)之洗淨劑組合物之製備] [Preparation of the detergent composition of step (6)]

使用二甲基亞碸40質量份、二乙二醇單丁醚40質量份、四甲基氫氧化銨5質量份及水15質量份(合計100質量份)進行調配,藉由將該等均勻混合,製備實施例31之步驟(6)之洗淨劑組合物。又,關於實施例32~48及比較例13~26之步驟(6)之洗淨劑組合物,除了按照表3及4所述之組成以規定之質量份調配各成分以外,與實施例31同樣地進行製備。需說明的是,實施例31~39(表3)與實施例40~48(表4)分別係相同組成之步驟(6)之洗淨劑組合物,比較例13~19(表3)與比較例20~26(表4)分別係相同組成之步驟(6)之洗淨劑組合物。將該洗淨劑組合物之pH值示於表3及4。該等表中pH值欄「>14」係指pH值超過14之情況。 40 parts by mass of dimethyl sulfene, 40 parts by mass of diethylene glycol monobutyl ether, 5 parts by mass of tetramethylammonium hydroxide, and 15 parts by mass of water (total 100 parts by mass) were prepared, and these were uniformed Mix to prepare the detergent composition of step (6) of Example 31. In addition, the detergent composition of step (6) of Examples 32 to 48 and Comparative Examples 13 to 26 was the same as that of Example 31 except that the components were formulated in predetermined mass parts according to the composition described in Tables 3 and 4. The preparation was carried out in the same manner. It should be noted that Examples 31 to 39 (Table 3) and Examples 40 to 48 (Table 4) are the detergent compositions of step (6) of the same composition, and Comparative Examples 13 to 19 (Table 3) and Comparative Examples 20 to 26 (Table 4) are the detergent compositions of step (6) of the same composition, respectively. Tables 3 and 4 show the pH of the detergent composition. The pH column "> 14" in these tables refers to the case where the pH value exceeds 14.

關於實施例31~48及比較例13~26之測試件中之樹脂遮罩層之 去除性,以與上述同樣之條件進行了評價。將其結果示於表3及4。 About the resin mask layer in the test pieces of Examples 31 to 48 and Comparative Examples 13 to 26 Removability was evaluated under the same conditions as above. The results are shown in Tables 3 and 4.

如表3及4所示,若步驟(6)中使用實施例31~48之洗淨劑組合物,則與比較例13~26相比,可良好地洗淨去除樹脂遮罩層。 As shown in Tables 3 and 4, if the detergent compositions of Examples 31 to 48 were used in step (6), the resin masking layer could be washed and removed better than Comparative Examples 13 to 26.

Claims (24)

一種電路基板之製造方法,其包括下述步驟(1)~(5),步驟(1):於設置有焊接部之基板表面形成樹脂遮罩層,步驟(2):於上述樹脂遮罩層中以露出上述焊接部之方式形成開口部,步驟(3):於上述開口部填充焊料凸塊形成材料,步驟(4):加熱使上述焊料凸塊形成材料熔融,藉此使焊料凸塊固定於上述焊接部,步驟(5):使用洗淨劑組合物對步驟(4)中獲得之基板於pH值10.0以上且14.0以下加以洗淨,其中,上述洗淨劑組合物係於洗淨劑組合物100質量份中,含有下述式(I)所表示之氫氧化四級銨(成分A)0.5質量份以上且3.0質量份以下,含有下述式(II)所表示之水溶性胺(成分B)3.0質量份以上且14.0質量份以下,含有選自由甲酸銨、乙酸銨、草酸銨、琥珀酸銨、檸檬酸銨所構成之群中之1種以上(成分C)0.3質量份以上且2.5質量份以下,含有水(成分D)50.0質量份以上且95.0質量份以下,式(I)中,R1、R2、R3各自相同或不同,為碳數1~4之烷基,R4為碳數1~4之烷基或碳數1~4之羥基取代烷基,式(II)中,R5為氫原子、碳數1~6之烴基、碳數1~6之羥基烷基、或碳數1~6之胺基烷基,R6、R7各自相同或不同,為氫原子、碳數1~6之烴基、碳數1~6之羥基烷基、或碳數1~6之胺基烷基,R5、R6、R7並不同時為氫原子。A method for manufacturing a circuit board includes the following steps (1) to (5), step (1): forming a resin masking layer on a surface of a substrate provided with a soldering portion, and step (2): forming a resin masking layer on the resin masking layer In step (3), a solder bump forming material is filled in the opening, and step (4): heating to melt the solder bump forming material, thereby fixing the solder bump. In the welding part, step (5): the substrate obtained in step (4) is washed with a detergent composition at a pH value of 10.0 or more and 14.0 or less, wherein the detergent composition is a detergent 100 parts by mass of the composition contains 0.5 parts by mass or more and 3.0 parts by mass or less of quaternary ammonium hydroxide (component A) represented by the following formula (I), and a water-soluble amine represented by the following formula (II) ( Component B) 3.0 parts by mass or more and 14.0 parts by mass or less, containing 0.3 parts by mass or more of one or more components (component C) selected from the group consisting of ammonium formate, ammonium acetate, ammonium oxalate, ammonium succinate, and ammonium citrate, and 2.5 parts by mass or less, containing 50.0 parts by mass or more and 95.0 parts by mass or less of water (ingredient D) , In formula (I), R 1 , R 2 , and R 3 are each the same or different, and are alkyl groups having 1 to 4 carbon atoms; R 4 is an alkyl group having 1 to 4 carbon atoms or a hydroxy substituted alkyl group having 1 to 4 carbon atoms; base, In formula (II), R 5 is a hydrogen atom, a hydrocarbon group having 1 to 6 carbon atoms, a hydroxyalkyl group having 1 to 6 carbon atoms, or an amino alkyl group having 1 to 6 carbon atoms, and R 6 and R 7 are each the same or The difference is that it is a hydrogen atom, a hydrocarbon group having 1 to 6 carbon atoms, a hydroxyalkyl group having 1 to 6 carbon atoms, or an amino alkyl group having 1 to 6 carbon atoms. R 5 , R 6 , and R 7 are not hydrogen atoms at the same time. . 如請求項1之電路基板之製造方法,其中上述步驟(4)中之加熱溫度為200℃以上且260℃以下。For example, the method for manufacturing a circuit board according to claim 1, wherein the heating temperature in the above step (4) is 200 ° C or higher and 260 ° C or lower. 如請求項1之電路基板之製造方法,其中上述步驟(4)中之加熱溫度為上述焊料凸塊形成材料之液相線溫度以上且260℃以下之溫度。For example, the method for manufacturing a circuit board according to claim 1, wherein the heating temperature in the step (4) is a temperature higher than the liquidus temperature of the solder bump forming material and lower than 260 ° C. 如請求項1至3中任一項之電路基板之製造方法,其進而包括下述步驟(6),步驟(6):使用含有下述成分(S)~(V)之洗淨劑組合物對步驟(5)中獲得之基板進行洗淨,成分S:二甲基亞碸(DMSO)、成分T:二醇醚、成分U:25℃之水溶液中之酸解離常數pKa為9.0以上之胺及/或氫氧化四級銨、及成分V:水。The method for manufacturing a circuit board according to any one of claims 1 to 3, further comprising the following steps (6) and (6): using a detergent composition containing the following ingredients (S) to (V) The substrate obtained in step (5) is cleaned, and the component S: dimethylsulfinium (DMSO), the component T: a glycol ether, and the component U: an amine having an acid dissociation constant pKa of 9.0 or higher in an aqueous solution at 25 ° C. And / or quaternary ammonium hydroxide and component V: water. 如請求項4之電路基板之製造方法,其中步驟(6)之洗淨劑組合物中之二醇醚(成分T)為下述式(III)所表示之二醇醚,R8O(AO)nR9 (III)式(III)中,R8為碳數1~6之烷基或碳數6~15之芳基,R9為氫原子或碳數1~6之烷基,AO為碳數2或3之伸烷基氧基,n為平均加成莫耳數且為1~4。The method for manufacturing a circuit board according to claim 4, wherein the glycol ether (component T) in the detergent composition of step (6) is a glycol ether represented by the following formula (III), and R 8 O (AO ) n R 9 (III) In formula (III), R 8 is an alkyl group having 1 to 6 carbon atoms or an aryl group having 6 to 15 carbon atoms, R 9 is a hydrogen atom or an alkyl group having 1 to 6 carbon atoms, AO It is an alkyleneoxy group having 2 or 3 carbon atoms, n is an average addition mole number and is 1 to 4. 如請求項4之電路基板之製造方法,其中步驟(6)之洗淨劑組合物中之胺及/或氫氧化四級銨(成分U)為下述式(IV)所表示之胺、及/或下述式(V)所表示之氫氧化四級銨,(R10)3N (IV)(式(IV)中,R10各自相同或不同,為氫原子、碳數1~6之烴基、碳數1~6之羥基烷基、或碳數1~6之胺基烷基,3個R10並不同時為氫原子),[(R11)3-N-R12]+OH- (V)(式(V)中,R11各自相同或不同,為碳數1~3之烷基,R12為碳數1~3之烷基或碳數1~3之羥基烷基)。The method for manufacturing a circuit board according to claim 4, wherein the amine and / or quaternary ammonium hydroxide (component U) in the detergent composition of step (6) is an amine represented by the following formula (IV), and / Or quaternary ammonium hydroxide represented by the following formula (V), (R 10 ) 3 N (IV) (in formula (IV), R 10 is the same as or different from each other, and is a hydrogen atom and a carbon number of 1 to 6) hydrocarbon group, a hydroxyalkyl group having a carbon number of 1 to 6, carbon atoms, or an alkyl group of 1 to 6, R 10 3 not simultaneously hydrogen atoms), [(R 11) 3 -NR 12] + OH - ( V) (In the formula (V), R 11 is the same or different and is an alkyl group having 1 to 3 carbon atoms, and R 12 is an alkyl group having 1 to 3 carbon atoms or a hydroxyalkyl group having 1 to 3 carbon atoms). 如請求項4之電路基板之製造方法,其中步驟(6)之洗淨劑組合物中,相對於該洗淨劑組合物100質量份,含有二甲基亞碸(成分S)10.0質量份以上且50.0質量份以下、二醇醚(成分T)30.0質量份以上且70.0質量份以下、胺及/或氫氧化四級銨(成分U)0.5質量份以上且20.0質量份以下、以及水(成分V)3.0質量份以上且20.0質量份以下。The method for manufacturing a circuit board according to claim 4, wherein the detergent composition of step (6) contains 10.0 parts by mass or more of dimethyl fluorene (component S) with respect to 100 parts by mass of the detergent composition. 50.0 parts by mass or less, glycol ether (component T) 30.0 parts by mass or more and 70.0 parts by mass or less, amine and / or quaternary ammonium hydroxide (component U) 0.5 part by mass or more and 20.0 parts by mass or less, and water (component V) 3.0 parts by mass or more and 20.0 parts by mass or less. 如請求項4之電路基板之製造方法,其中步驟(6)之洗淨劑組合物中之二甲基亞碸(成分S)與二醇醚(成分T)之質量比以(S)/(T)表示為0.15以上且2.00以下。For example, the method for manufacturing a circuit board according to claim 4, wherein the mass ratio of the dimethyl sulfene (component S) to the glycol ether (component T) in the detergent composition of step (6) is (S) / ( T) is 0.15 or more and 2.00 or less. 如請求項4之電路基板之製造方法,其中於上述步驟(5)與上述步驟(6)之間包括漂洗處理之步驟。The method for manufacturing a circuit board according to claim 4, wherein a step of rinsing is included between the step (5) and the step (6). 一種電路基板之製造方法,其包括下述步驟(1)~(5),步驟(1):於設置有焊接部之基板表面形成樹脂遮罩層,步驟(2):於上述樹脂遮罩層中以露出上述焊接部之方式形成開口部,步驟(3):於上述開口部填充焊料凸塊形成材料,步驟(4):加熱使上述焊料凸塊形成材料熔融,藉此使焊料凸塊固定於上述焊接部,步驟(5):使用洗淨劑組合物對步驟(4)中獲得之基板於pH值10.0以上且14.0以下加以洗淨,其中,上述洗淨劑組合物係於洗淨劑組合物100質量份中,調配下述式(I)所表示之氫氧化四級銨(成分A)0.5質量份以上且3.0質量份以下,調配下述式(II)所表示之水溶性胺(成分B)3.0質量份以上且14.0質量份以下,調配選自由甲酸、乙酸、草酸、琥珀酸、檸檬酸及其等之銨鹽所構成之群中之1種以上(成分C)0.3質量份以上且2.5質量份以下,調配水(成分D)50.0質量份以上且95.0質量份以下,式(I)中,R1、R2、R3各自相同或不同,為碳數1~4之烷基,R4為碳數1~4之烷基或碳數1~4之羥基取代烷基,式(II)中,R5為氫原子、碳數1~6之烴基、碳數1~6之羥基烷基、或碳數1~6之胺基烷基,R6、R7各自相同或不同,為氫原子、碳數1~6之烴基、碳數1~6之羥基烷基、或碳數1~6之胺基烷基,R5、R6、R7並不同時為氫原子。A method for manufacturing a circuit board includes the following steps (1) to (5), step (1): forming a resin masking layer on a surface of a substrate provided with a soldering portion, and step (2): forming a resin masking layer on the resin masking layer In step (3), a solder bump forming material is filled in the opening, and step (4): heating to melt the solder bump forming material, thereby fixing the solder bump. In the welding part, step (5): the substrate obtained in step (4) is washed with a detergent composition at a pH value of 10.0 or more and 14.0 or less, wherein the detergent composition is a detergent To 100 parts by mass of the composition, 0.5 to 3.0 parts by mass of the quaternary ammonium hydroxide (component A) represented by the following formula (I) is blended, and a water-soluble amine represented by the following formula (II) is blended ( Component B) 3.0 parts by mass or more and 14.0 parts by mass or less, and 0.3 or more parts by mass selected from the group consisting of formic acid, acetic acid, oxalic acid, succinic acid, citric acid, and their ammonium salts (component C) And 2.5 parts by mass or less, 50.0 parts by mass or more and 95.0 parts by mass of water (ingredient D) are prepared under, In formula (I), R 1 , R 2 , and R 3 are each the same or different, and are alkyl groups having 1 to 4 carbon atoms; R 4 is an alkyl group having 1 to 4 carbon atoms or a hydroxy substituted alkyl group having 1 to 4 carbon atoms; base, In formula (II), R 5 is a hydrogen atom, a hydrocarbon group having 1 to 6 carbon atoms, a hydroxyalkyl group having 1 to 6 carbon atoms, or an amino alkyl group having 1 to 6 carbon atoms, and R 6 and R 7 are each the same or The difference is that it is a hydrogen atom, a hydrocarbon group having 1 to 6 carbon atoms, a hydroxyalkyl group having 1 to 6 carbon atoms, or an amino alkyl group having 1 to 6 carbon atoms. R 5 , R 6 , and R 7 are not hydrogen atoms at the same time. . 如請求項10之電路基板之製造方法,其中上述成分C為選自由甲酸銨、乙酸銨、草酸銨、琥珀酸銨、檸檬酸銨所構成之群中之1種以上。The method for manufacturing a circuit board according to claim 10, wherein the component C is at least one selected from the group consisting of ammonium formate, ammonium acetate, ammonium oxalate, ammonium succinate, and ammonium citrate. 如請求項10之電路基板之製造方法,其中上述步驟(4)中之加熱溫度為200℃以上且260℃以下。For example, the method for manufacturing a circuit board according to claim 10, wherein the heating temperature in the step (4) is 200 ° C or higher and 260 ° C or lower. 如請求項10之電路基板之製造方法,其中上述步驟(4)中之加熱溫度為上述焊料凸塊形成材料之液相線溫度以上且260℃以下之溫度。For example, the method for manufacturing a circuit board according to claim 10, wherein the heating temperature in the step (4) is a temperature above the liquidus temperature of the solder bump forming material and below 260 ° C. 如請求項10至13中任一項之電路基板之製造方法,其進而包括下述步驟(6),步驟(6):使用含有下述成分(S)~(V)之洗淨劑組合物對步驟(5)中獲得之基板進行洗淨,成分S:二甲基亞碸(DMSO)、成分T:二醇醚、成分U:25℃之水溶液中之酸解離常數pKa為9.0以上之胺及/或氫氧化四級銨、及成分V:水。The method for manufacturing a circuit board according to any one of claims 10 to 13, further comprising the following steps (6) and (6): using a detergent composition containing the following ingredients (S) to (V) The substrate obtained in step (5) is cleaned, and the component S: dimethylsulfinium (DMSO), the component T: a glycol ether, and the component U: an amine having an acid dissociation constant pKa of 9.0 or higher in an aqueous solution at 25 ° C. And / or quaternary ammonium hydroxide and component V: water. 如請求項14之電路基板之製造方法,其中步驟(6)之洗淨劑組合物中之二醇醚(成分T)為下述式(III)所表示之二醇醚,R8O(AO)nR9 (III)式(III)中,R8為碳數1~6之烷基或碳數6~15之芳基,R9為氫原子或碳數1~6之烷基,AO為碳數2或3之伸烷基氧基,n為平均加成莫耳數且為1~4。The method for manufacturing a circuit board according to claim 14, wherein the glycol ether (component T) in the detergent composition of step (6) is a glycol ether represented by the following formula (III), and R 8 O (AO ) n R 9 (III) In formula (III), R 8 is an alkyl group having 1 to 6 carbon atoms or an aryl group having 6 to 15 carbon atoms, R 9 is a hydrogen atom or an alkyl group having 1 to 6 carbon atoms, AO It is an alkyleneoxy group having 2 or 3 carbon atoms, n is an average addition mole number and is 1 to 4. 如請求項14之電路基板之製造方法,其中步驟(6)之洗淨劑組合物中之胺及/或氫氧化四級銨(成分U)為下述式(IV)所表示之胺、及/或下述式(V)所表示之氫氧化四級銨,(R10)3N (IV)(式(IV)中,R10各自相同或不同,為氫原子、碳數1~6之烴基、碳數1~6之羥基烷基、或碳數1~6之胺基烷基,3個R10並不同時為氫原子),[(R11)3-N-R12]+OH- (V)(式(V)中,R11各自相同或不同,為碳數1~3之烷基,R12為碳數1~3之烷基或碳數1~3之羥基烷基)。The method for manufacturing a circuit board according to claim 14, wherein the amine and / or quaternary ammonium hydroxide (component U) in the detergent composition of step (6) is an amine represented by the following formula (IV), and / Or quaternary ammonium hydroxide represented by the following formula (V), (R 10 ) 3 N (IV) (in formula (IV), R 10 is the same as or different from each other, and is a hydrogen atom and a carbon number of 1 to 6) hydrocarbon group, a hydroxyalkyl group having a carbon number of 1 to 6, carbon atoms, or an alkyl group of 1 to 6, R 10 3 not simultaneously hydrogen atoms), [(R 11) 3 -NR 12] + OH - ( V) (In the formula (V), R 11 is the same or different and is an alkyl group having 1 to 3 carbon atoms, and R 12 is an alkyl group having 1 to 3 carbon atoms or a hydroxyalkyl group having 1 to 3 carbon atoms). 如請求項14之電路基板之製造方法,其中步驟(6)之洗淨劑組合物中,相對於該洗淨劑組合物100質量份,含有二甲基亞碸(成分S)10.0質量份以上且50.0質量份以下、二醇醚(成分T)30.0質量份以上且70.0質量份以下、胺及/或氫氧化四級銨(成分U)0.5質量份以上且20.0質量份以下、以及水(成分V)3.0質量份以上且20.0質量份以下。The method for manufacturing a circuit board according to claim 14, wherein the detergent composition of step (6) contains 10.0 parts by mass or more of dimethyl sulfene (component S) with respect to 100 parts by mass of the detergent composition. 50.0 parts by mass or less, glycol ether (component T) 30.0 parts by mass or more and 70.0 parts by mass or less, amine and / or quaternary ammonium hydroxide (component U) 0.5 part by mass or more and 20.0 parts by mass or less, and water (component V) 3.0 parts by mass or more and 20.0 parts by mass or less. 如請求項14之電路基板之製造方法,其中步驟(6)之洗淨劑組合物中之二甲基亞碸(成分S)與二醇醚(成分T)之質量比以(S)/(T)表示為0.15以上且2.00以下。For example, the method for manufacturing a circuit board according to claim 14, wherein the mass ratio of the dimethyl sulfene (component S) to the glycol ether (component T) in the detergent composition of step (6) is (S) / ( T) is 0.15 or more and 2.00 or less. 如請求項14之電路基板之製造方法,其中於上述步驟(5)與上述步驟(6)之間包括漂洗處理之步驟。The method for manufacturing a circuit board according to claim 14, wherein a step of rinsing is included between the step (5) and the step (6). 一種洗淨劑組合物,其pH值為10.0以上且14.0以下,其係於洗淨劑組合物100質量份中,含有下述式(I)所表示之氫氧化四級銨(成分A)0.5質量份以上且3.0質量份以下,含有下述式(II)所表示之水溶性胺(成分B)3.0質量份以上且14.0質量份以下,含有選自由甲酸銨、乙酸銨、草酸銨、琥珀酸銨、檸檬酸銨所構成之群中之1種以上(成分C)0.3質量份以上且2.5質量份以下,含有水(成分D)50.0質量份以上且95.0質量份以下,式(I)中,R1、R2、R3各自相同或不同,為碳數1~4之烷基、R4為碳數1~4之烷基或碳數1~4之羥基取代烷基,式(II)中,R5為氫原子、碳數1~6之烴基、碳數1~6之羥基烷基、或碳數1~6之胺基烷基,R6、R7各自相同或不同,為氫原子、碳數1~6之烴基、碳數1~6之羥基烷基、或碳數1~6之胺基烷基,R5、R6、R7並不同時為氫原子。A detergent composition having a pH value of 10.0 to 14.0, which is contained in 100 parts by mass of the detergent composition, and contains quaternary ammonium hydroxide (component A) 0.5 represented by the following formula (I) Part by mass or more and 3.0 parts by mass or less, containing 3.0 parts by mass or more and 14.0 parts by mass or less of the water-soluble amine (component B) represented by the following formula (II), selected from the group consisting of ammonium formate, ammonium acetate, ammonium oxalate, and succinic acid One or more of the group consisting of ammonium and ammonium citrate (component C) 0.3 mass parts or more and 2.5 mass parts or less, containing water (component D) 50.0 mass parts or more and 95.0 mass parts or less, In formula (I), R 1 , R 2 , and R 3 are each the same or different, and are an alkyl group having 1 to 4 carbon atoms; R 4 is an alkyl group having 1 to 4 carbon atoms or a hydroxy substituted alkyl group having 1 to 4 carbon atoms; base, In formula (II), R 5 is a hydrogen atom, a hydrocarbon group having 1 to 6 carbon atoms, a hydroxyalkyl group having 1 to 6 carbon atoms, or an amino alkyl group having 1 to 6 carbon atoms, and R 6 and R 7 are each the same or The difference is that it is a hydrogen atom, a hydrocarbon group having 1 to 6 carbon atoms, a hydroxyalkyl group having 1 to 6 carbon atoms, or an amino alkyl group having 1 to 6 carbon atoms. R 5 , R 6 , and R 7 are not hydrogen atoms at the same time. . 一種洗淨劑組合物,其pH值為10.0以上且14.0以下,其係於洗淨劑組合物100質量份中,調配下述式(I)所表示之氫氧化四級銨(成分A)0.5質量份以上且3.0質量份以下,調配下述式(II)所表示之水溶性胺(成分B)3.0質量份以上且14.0質量份以下,調配選自由甲酸、乙酸、草酸、琥珀酸、檸檬酸及其等之銨鹽所構成之群中之1種以上(成分C)0.3質量份以上且2.5質量份以下,調配水(成分D)50.0質量份以上且95.0質量份以下,式(I)中,R1、R2、R3各自相同或不同,為碳數1~4之烷基、R4為碳數1~4之烷基或碳數1~4之羥基取代烷基,式(II)中,R5為氫原子、碳數1~6之烴基、碳數1~6之羥基烷基、或碳數1~6之胺基烷基,R6、R7各自相同或不同,為氫原子、碳數1~6之烴基、碳數1~6之羥基烷基、或碳數1~6之胺基烷基,R5、R6、R7並不同時為氫原子。A detergent composition having a pH value of 10.0 or more and 14.0 or less, which is contained in 100 parts by mass of the detergent composition, and a quaternary ammonium hydroxide (component A) represented by the following formula (I) is added to 0.5 3.0 mass parts or more and 3.0 mass parts or less, blending of 3.0 mass parts or more and 14.0 mass parts or less of the water-soluble amine (ingredient B) represented by the following formula (II), formulating and selecting from formic acid, acetic acid, oxalic acid, succinic acid, and citric acid One or more of the group consisting of ammonium salts and the like (component C) is 0.3 parts by mass or more and 2.5 parts by mass or less, and water (component D) is prepared by 50.0 parts by mass or more and 95.0 parts by mass or less, In formula (I), R 1 , R 2 , and R 3 are each the same or different, and are an alkyl group having 1 to 4 carbon atoms; R 4 is an alkyl group having 1 to 4 carbon atoms or a hydroxy substituted alkyl group having 1 to 4 carbon atoms; base, In formula (II), R 5 is a hydrogen atom, a hydrocarbon group having 1 to 6 carbon atoms, a hydroxyalkyl group having 1 to 6 carbon atoms, or an amino alkyl group having 1 to 6 carbon atoms, and R 6 and R 7 are each the same or The difference is that it is a hydrogen atom, a hydrocarbon group having 1 to 6 carbon atoms, a hydroxyalkyl group having 1 to 6 carbon atoms, or an amino alkyl group having 1 to 6 carbon atoms. R 5 , R 6 , and R 7 are not hydrogen atoms at the same time. . 一種洗淨劑組合物,其含有成分S:二甲基亞碸(DMSO)、成分T:二醇醚、成分U:25℃之水溶液中之酸解離常數pKa為9.0以上之胺及/或氫氧化四級銨、及成分V:水。A detergent composition comprising component S: dimethylsulfinium (DMSO), component T: glycol ether, component U: amine and / or hydrogen having an acid dissociation constant pKa of 9.0 or more in an aqueous solution at 25 ° C. Quaternary ammonium oxide and component V: water. 一種試劑盒,其係用於如請求項4至9、14至19中任一項之製造方法中之試劑盒,其包含步驟(5)中使用之如請求項20或21之洗淨劑組合物、及步驟(6)中使用之如請求項22之洗淨劑組合物。A kit for use in a manufacturing method according to any one of claims 4 to 9, 14 to 19, comprising a detergent combination such as claim 20 or 21 used in step (5) And the detergent composition as claimed in claim 22 used in step (6). 一種如請求項20或21之洗淨劑組合物作為電路基板製造中之洗淨劑之用途。Use of a detergent composition as claimed in claim 20 or 21 as a detergent in the manufacture of circuit boards.
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