TWI638995B - 缺陷檢查裝置、光學部件之製造系統及光學顯示裝置之生產系統 - Google Patents

缺陷檢查裝置、光學部件之製造系統及光學顯示裝置之生產系統 Download PDF

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Publication number
TWI638995B
TWI638995B TW103127730A TW103127730A TWI638995B TW I638995 B TWI638995 B TW I638995B TW 103127730 A TW103127730 A TW 103127730A TW 103127730 A TW103127730 A TW 103127730A TW I638995 B TWI638995 B TW I638995B
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TW
Taiwan
Prior art keywords
optical
film
polarizing
defect inspection
bonding
Prior art date
Application number
TW103127730A
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English (en)
Chinese (zh)
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TW201508266A (zh
Inventor
橋口大輔
加集功士
Original Assignee
日商住友化學股份有限公司
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Application filed by 日商住友化學股份有限公司 filed Critical 日商住友化學股份有限公司
Publication of TW201508266A publication Critical patent/TW201508266A/zh
Application granted granted Critical
Publication of TWI638995B publication Critical patent/TWI638995B/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1303—Apparatus specially adapted to the manufacture of LCDs
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
    • G02F1/133528—Polarisers

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Textile Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Mathematical Physics (AREA)
  • Manufacturing & Machinery (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal (AREA)
  • Polarising Elements (AREA)
TW103127730A 2013-08-22 2014-08-13 缺陷檢查裝置、光學部件之製造系統及光學顯示裝置之生產系統 TWI638995B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2013172344A JP6156820B2 (ja) 2013-08-22 2013-08-22 欠陥検査装置、光学部材の製造システム及び光学表示デバイスの生産システム
JP2013-172344 2013-08-22

Publications (2)

Publication Number Publication Date
TW201508266A TW201508266A (zh) 2015-03-01
TWI638995B true TWI638995B (zh) 2018-10-21

Family

ID=52483483

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103127730A TWI638995B (zh) 2013-08-22 2014-08-13 缺陷檢查裝置、光學部件之製造系統及光學顯示裝置之生產系統

Country Status (5)

Country Link
JP (1) JP6156820B2 (ja)
KR (1) KR102222973B1 (ja)
CN (1) CN105474002B (ja)
TW (1) TWI638995B (ja)
WO (1) WO2015025703A1 (ja)

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* Cited by examiner, † Cited by third party
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JP6784540B2 (ja) * 2015-09-30 2020-11-11 日東電工株式会社 偏光板の検査方法および検査装置
KR102438892B1 (ko) * 2017-03-03 2022-08-31 스미또모 가가꾸 가부시키가이샤 결함 검사 시스템, 필름 제조 장치, 필름 제조 방법, 인자 장치 및 인자 방법
CN106842717A (zh) * 2017-04-10 2017-06-13 深圳市华星光电技术有限公司 光配向装置及光配向方法
US10509265B2 (en) 2017-04-10 2019-12-17 Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd. Photo-alignment apparatus and photo-alignment method
KR102124184B1 (ko) * 2017-09-26 2020-06-17 주식회사 엘지화학 광학필름 부착시스템
JP6948215B2 (ja) * 2017-10-11 2021-10-13 住友化学株式会社 欠陥検査装置、欠陥検査方法、及び、フィルムの製造方法
JP7051445B2 (ja) * 2018-01-10 2022-04-11 日東電工株式会社 光学表示パネルの連続検査方法および連続検査装置、並びに、光学表示パネルの連続製造方法および連続製造システム
CN108273768B (zh) * 2018-02-09 2020-04-21 明基材料有限公司 一种偏光片筛选装置及筛选方法
JP6761144B2 (ja) * 2018-03-30 2020-09-23 日東電工株式会社 積層フィルムの製造方法
KR102179373B1 (ko) * 2018-12-20 2020-11-16 (주)소닉스 디스플레이패널 검사장치 및 그 검사 방법
KR102207321B1 (ko) * 2019-10-01 2021-01-26 주식회사 디월드 시트 광학 검사장치

Citations (1)

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Publication number Priority date Publication date Assignee Title
TWI418779B (zh) 2011-06-27 2013-12-11 Fujifilm Corp 缺陷檢查裝置及方法

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JPS5748643A (en) * 1980-08-08 1982-03-20 Sharp Corp Detector for defect of polarizing plate for automatic affixing device of self-adhesive polarizing plate
JP3216669B2 (ja) * 1993-05-26 2001-10-09 株式会社リコー 光ディスク欠陥検査方法
DE69506119T2 (de) * 1994-09-15 1999-06-24 Procter & Gamble Orale zusammensetzungen
JP3881506B2 (ja) * 2000-11-24 2007-02-14 住友化学株式会社 ロール起因欠陥の判定方法および装置
JP4396160B2 (ja) * 2003-07-31 2010-01-13 住友化学株式会社 透明性フィルムの異物検査方法
JP2006337085A (ja) * 2005-05-31 2006-12-14 Seiko Epson Corp 劣化試験方法及び劣化試験装置
JP4869053B2 (ja) * 2006-01-11 2012-02-01 日東電工株式会社 積層フィルムの製造方法、積層フィルムの欠陥検出方法、積層フィルムの欠陥検出装置、積層フィルム、及び画像表示装置
JP5024935B2 (ja) * 2007-01-16 2012-09-12 富士フイルム株式会社 光透過性部材の欠陥検出装置及び方法
US7798617B2 (en) * 2007-02-05 2010-09-21 Brother Kogyo Kabushiki Kaisha Inkjet recording apparatus, manufacturing method of inkjet head, and checking method of the head
JP2009157361A (ja) * 2007-12-06 2009-07-16 Nitto Denko Corp 偏光板及び画像表示装置
JP2011002305A (ja) * 2009-06-17 2011-01-06 Topcon Corp 回路パターンの欠陥検出装置、回路パターンの欠陥検出方法およびプログラム
JP2011226957A (ja) * 2010-04-21 2011-11-10 Sanritz Corp 偏光板の欠陥検査方法及び欠陥検査装置
JP5665622B2 (ja) * 2011-03-09 2015-02-04 株式会社サンリッツ 偏光板の製造装置、偏光板の製造方法、偏光板及びそれを用いた液晶表示装置

Patent Citations (1)

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Publication number Priority date Publication date Assignee Title
TWI418779B (zh) 2011-06-27 2013-12-11 Fujifilm Corp 缺陷檢查裝置及方法

Also Published As

Publication number Publication date
TW201508266A (zh) 2015-03-01
CN105474002B (zh) 2018-05-15
WO2015025703A1 (ja) 2015-02-26
KR20160046811A (ko) 2016-04-29
JP6156820B2 (ja) 2017-07-05
CN105474002A (zh) 2016-04-06
JP2015040782A (ja) 2015-03-02
KR102222973B1 (ko) 2021-03-03

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