KR102222973B1 - 결함 검사 장치, 광학 부재의 제조 시스템 및 광학 표시 장치의 생산 시스템 - Google Patents
결함 검사 장치, 광학 부재의 제조 시스템 및 광학 표시 장치의 생산 시스템 Download PDFInfo
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- KR102222973B1 KR102222973B1 KR1020167004848A KR20167004848A KR102222973B1 KR 102222973 B1 KR102222973 B1 KR 102222973B1 KR 1020167004848 A KR1020167004848 A KR 1020167004848A KR 20167004848 A KR20167004848 A KR 20167004848A KR 102222973 B1 KR102222973 B1 KR 102222973B1
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- Prior art keywords
- film
- optical
- optical member
- polarizer
- bonding
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1303—Apparatus specially adapted to the manufacture of LCDs
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
- G02F1/133528—Polarisers
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- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Textile Engineering (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Mathematical Physics (AREA)
- Manufacturing & Machinery (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Liquid Crystal (AREA)
- Polarising Elements (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013172344A JP6156820B2 (ja) | 2013-08-22 | 2013-08-22 | 欠陥検査装置、光学部材の製造システム及び光学表示デバイスの生産システム |
JPJP-P-2013-172344 | 2013-08-22 | ||
PCT/JP2014/070546 WO2015025703A1 (ja) | 2013-08-22 | 2014-08-05 | 欠陥検査装置、光学部材の製造システム及び光学表示デバイスの生産システム |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20160046811A KR20160046811A (ko) | 2016-04-29 |
KR102222973B1 true KR102222973B1 (ko) | 2021-03-03 |
Family
ID=52483483
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020167004848A KR102222973B1 (ko) | 2013-08-22 | 2014-08-05 | 결함 검사 장치, 광학 부재의 제조 시스템 및 광학 표시 장치의 생산 시스템 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP6156820B2 (ja) |
KR (1) | KR102222973B1 (ja) |
CN (1) | CN105474002B (ja) |
TW (1) | TWI638995B (ja) |
WO (1) | WO2015025703A1 (ja) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6784540B2 (ja) * | 2015-09-30 | 2020-11-11 | 日東電工株式会社 | 偏光板の検査方法および検査装置 |
KR102438892B1 (ko) * | 2017-03-03 | 2022-08-31 | 스미또모 가가꾸 가부시키가이샤 | 결함 검사 시스템, 필름 제조 장치, 필름 제조 방법, 인자 장치 및 인자 방법 |
CN106842717A (zh) * | 2017-04-10 | 2017-06-13 | 深圳市华星光电技术有限公司 | 光配向装置及光配向方法 |
US10509265B2 (en) | 2017-04-10 | 2019-12-17 | Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd. | Photo-alignment apparatus and photo-alignment method |
KR102124184B1 (ko) * | 2017-09-26 | 2020-06-17 | 주식회사 엘지화학 | 광학필름 부착시스템 |
JP6948215B2 (ja) * | 2017-10-11 | 2021-10-13 | 住友化学株式会社 | 欠陥検査装置、欠陥検査方法、及び、フィルムの製造方法 |
JP7051445B2 (ja) * | 2018-01-10 | 2022-04-11 | 日東電工株式会社 | 光学表示パネルの連続検査方法および連続検査装置、並びに、光学表示パネルの連続製造方法および連続製造システム |
CN108273768B (zh) * | 2018-02-09 | 2020-04-21 | 明基材料有限公司 | 一种偏光片筛选装置及筛选方法 |
JP6761144B2 (ja) * | 2018-03-30 | 2020-09-23 | 日東電工株式会社 | 積層フィルムの製造方法 |
KR102179373B1 (ko) * | 2018-12-20 | 2020-11-16 | (주)소닉스 | 디스플레이패널 검사장치 및 그 검사 방법 |
KR102207321B1 (ko) * | 2019-10-01 | 2021-01-26 | 주식회사 디월드 | 시트 광학 검사장치 |
Citations (4)
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JP2006337085A (ja) * | 2005-05-31 | 2006-12-14 | Seiko Epson Corp | 劣化試験方法及び劣化試験装置 |
JP2011002305A (ja) | 2009-06-17 | 2011-01-06 | Topcon Corp | 回路パターンの欠陥検出装置、回路パターンの欠陥検出方法およびプログラム |
JP2011226957A (ja) | 2010-04-21 | 2011-11-10 | Sanritz Corp | 偏光板の欠陥検査方法及び欠陥検査装置 |
JP2013047844A (ja) * | 2007-12-06 | 2013-03-07 | Nitto Denko Corp | 画像表示装置の製造方法 |
Family Cites Families (10)
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JPS5748643A (en) * | 1980-08-08 | 1982-03-20 | Sharp Corp | Detector for defect of polarizing plate for automatic affixing device of self-adhesive polarizing plate |
JP3216669B2 (ja) * | 1993-05-26 | 2001-10-09 | 株式会社リコー | 光ディスク欠陥検査方法 |
DE69506119T2 (de) * | 1994-09-15 | 1999-06-24 | Procter & Gamble | Orale zusammensetzungen |
JP3881506B2 (ja) * | 2000-11-24 | 2007-02-14 | 住友化学株式会社 | ロール起因欠陥の判定方法および装置 |
JP4396160B2 (ja) * | 2003-07-31 | 2010-01-13 | 住友化学株式会社 | 透明性フィルムの異物検査方法 |
JP4869053B2 (ja) * | 2006-01-11 | 2012-02-01 | 日東電工株式会社 | 積層フィルムの製造方法、積層フィルムの欠陥検出方法、積層フィルムの欠陥検出装置、積層フィルム、及び画像表示装置 |
JP5024935B2 (ja) * | 2007-01-16 | 2012-09-12 | 富士フイルム株式会社 | 光透過性部材の欠陥検出装置及び方法 |
US7798617B2 (en) * | 2007-02-05 | 2010-09-21 | Brother Kogyo Kabushiki Kaisha | Inkjet recording apparatus, manufacturing method of inkjet head, and checking method of the head |
JP5665622B2 (ja) * | 2011-03-09 | 2015-02-04 | 株式会社サンリッツ | 偏光板の製造装置、偏光板の製造方法、偏光板及びそれを用いた液晶表示装置 |
JP5274622B2 (ja) | 2011-06-27 | 2013-08-28 | 富士フイルム株式会社 | 欠陥検査装置及び方法 |
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2013
- 2013-08-22 JP JP2013172344A patent/JP6156820B2/ja active Active
-
2014
- 2014-08-05 KR KR1020167004848A patent/KR102222973B1/ko active IP Right Grant
- 2014-08-05 WO PCT/JP2014/070546 patent/WO2015025703A1/ja active Application Filing
- 2014-08-05 CN CN201480045693.4A patent/CN105474002B/zh active Active
- 2014-08-13 TW TW103127730A patent/TWI638995B/zh active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006337085A (ja) * | 2005-05-31 | 2006-12-14 | Seiko Epson Corp | 劣化試験方法及び劣化試験装置 |
JP2013047844A (ja) * | 2007-12-06 | 2013-03-07 | Nitto Denko Corp | 画像表示装置の製造方法 |
JP2011002305A (ja) | 2009-06-17 | 2011-01-06 | Topcon Corp | 回路パターンの欠陥検出装置、回路パターンの欠陥検出方法およびプログラム |
JP2011226957A (ja) | 2010-04-21 | 2011-11-10 | Sanritz Corp | 偏光板の欠陥検査方法及び欠陥検査装置 |
Also Published As
Publication number | Publication date |
---|---|
TW201508266A (zh) | 2015-03-01 |
CN105474002B (zh) | 2018-05-15 |
WO2015025703A1 (ja) | 2015-02-26 |
KR20160046811A (ko) | 2016-04-29 |
JP6156820B2 (ja) | 2017-07-05 |
CN105474002A (zh) | 2016-04-06 |
TWI638995B (zh) | 2018-10-21 |
JP2015040782A (ja) | 2015-03-02 |
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