KR102222973B1 - 결함 검사 장치, 광학 부재의 제조 시스템 및 광학 표시 장치의 생산 시스템 - Google Patents

결함 검사 장치, 광학 부재의 제조 시스템 및 광학 표시 장치의 생산 시스템 Download PDF

Info

Publication number
KR102222973B1
KR102222973B1 KR1020167004848A KR20167004848A KR102222973B1 KR 102222973 B1 KR102222973 B1 KR 102222973B1 KR 1020167004848 A KR1020167004848 A KR 1020167004848A KR 20167004848 A KR20167004848 A KR 20167004848A KR 102222973 B1 KR102222973 B1 KR 102222973B1
Authority
KR
South Korea
Prior art keywords
film
optical
optical member
polarizer
bonding
Prior art date
Application number
KR1020167004848A
Other languages
English (en)
Korean (ko)
Other versions
KR20160046811A (ko
Inventor
다이스케 하시구치
고지 가슈
Original Assignee
스미또모 가가꾸 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 스미또모 가가꾸 가부시키가이샤 filed Critical 스미또모 가가꾸 가부시키가이샤
Publication of KR20160046811A publication Critical patent/KR20160046811A/ko
Application granted granted Critical
Publication of KR102222973B1 publication Critical patent/KR102222973B1/ko

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1303Apparatus specially adapted to the manufacture of LCDs
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306Details
    • G02F1/1309Repairing; Testing
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/1335Structural association of cells with optical devices, e.g. polarisers or reflectors
    • G02F1/133528Polarisers

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Textile Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Mathematical Physics (AREA)
  • Manufacturing & Machinery (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal (AREA)
  • Polarising Elements (AREA)
KR1020167004848A 2013-08-22 2014-08-05 결함 검사 장치, 광학 부재의 제조 시스템 및 광학 표시 장치의 생산 시스템 KR102222973B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2013172344A JP6156820B2 (ja) 2013-08-22 2013-08-22 欠陥検査装置、光学部材の製造システム及び光学表示デバイスの生産システム
JPJP-P-2013-172344 2013-08-22
PCT/JP2014/070546 WO2015025703A1 (ja) 2013-08-22 2014-08-05 欠陥検査装置、光学部材の製造システム及び光学表示デバイスの生産システム

Publications (2)

Publication Number Publication Date
KR20160046811A KR20160046811A (ko) 2016-04-29
KR102222973B1 true KR102222973B1 (ko) 2021-03-03

Family

ID=52483483

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020167004848A KR102222973B1 (ko) 2013-08-22 2014-08-05 결함 검사 장치, 광학 부재의 제조 시스템 및 광학 표시 장치의 생산 시스템

Country Status (5)

Country Link
JP (1) JP6156820B2 (ja)
KR (1) KR102222973B1 (ja)
CN (1) CN105474002B (ja)
TW (1) TWI638995B (ja)
WO (1) WO2015025703A1 (ja)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6784540B2 (ja) * 2015-09-30 2020-11-11 日東電工株式会社 偏光板の検査方法および検査装置
KR102438892B1 (ko) * 2017-03-03 2022-08-31 스미또모 가가꾸 가부시키가이샤 결함 검사 시스템, 필름 제조 장치, 필름 제조 방법, 인자 장치 및 인자 방법
CN106842717A (zh) * 2017-04-10 2017-06-13 深圳市华星光电技术有限公司 光配向装置及光配向方法
US10509265B2 (en) 2017-04-10 2019-12-17 Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd. Photo-alignment apparatus and photo-alignment method
KR102124184B1 (ko) * 2017-09-26 2020-06-17 주식회사 엘지화학 광학필름 부착시스템
JP6948215B2 (ja) * 2017-10-11 2021-10-13 住友化学株式会社 欠陥検査装置、欠陥検査方法、及び、フィルムの製造方法
JP7051445B2 (ja) * 2018-01-10 2022-04-11 日東電工株式会社 光学表示パネルの連続検査方法および連続検査装置、並びに、光学表示パネルの連続製造方法および連続製造システム
CN108273768B (zh) * 2018-02-09 2020-04-21 明基材料有限公司 一种偏光片筛选装置及筛选方法
JP6761144B2 (ja) * 2018-03-30 2020-09-23 日東電工株式会社 積層フィルムの製造方法
KR102179373B1 (ko) * 2018-12-20 2020-11-16 (주)소닉스 디스플레이패널 검사장치 및 그 검사 방법
KR102207321B1 (ko) * 2019-10-01 2021-01-26 주식회사 디월드 시트 광학 검사장치

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006337085A (ja) * 2005-05-31 2006-12-14 Seiko Epson Corp 劣化試験方法及び劣化試験装置
JP2011002305A (ja) 2009-06-17 2011-01-06 Topcon Corp 回路パターンの欠陥検出装置、回路パターンの欠陥検出方法およびプログラム
JP2011226957A (ja) 2010-04-21 2011-11-10 Sanritz Corp 偏光板の欠陥検査方法及び欠陥検査装置
JP2013047844A (ja) * 2007-12-06 2013-03-07 Nitto Denko Corp 画像表示装置の製造方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5748643A (en) * 1980-08-08 1982-03-20 Sharp Corp Detector for defect of polarizing plate for automatic affixing device of self-adhesive polarizing plate
JP3216669B2 (ja) * 1993-05-26 2001-10-09 株式会社リコー 光ディスク欠陥検査方法
DE69506119T2 (de) * 1994-09-15 1999-06-24 Procter & Gamble Orale zusammensetzungen
JP3881506B2 (ja) * 2000-11-24 2007-02-14 住友化学株式会社 ロール起因欠陥の判定方法および装置
JP4396160B2 (ja) * 2003-07-31 2010-01-13 住友化学株式会社 透明性フィルムの異物検査方法
JP4869053B2 (ja) * 2006-01-11 2012-02-01 日東電工株式会社 積層フィルムの製造方法、積層フィルムの欠陥検出方法、積層フィルムの欠陥検出装置、積層フィルム、及び画像表示装置
JP5024935B2 (ja) * 2007-01-16 2012-09-12 富士フイルム株式会社 光透過性部材の欠陥検出装置及び方法
US7798617B2 (en) * 2007-02-05 2010-09-21 Brother Kogyo Kabushiki Kaisha Inkjet recording apparatus, manufacturing method of inkjet head, and checking method of the head
JP5665622B2 (ja) * 2011-03-09 2015-02-04 株式会社サンリッツ 偏光板の製造装置、偏光板の製造方法、偏光板及びそれを用いた液晶表示装置
JP5274622B2 (ja) 2011-06-27 2013-08-28 富士フイルム株式会社 欠陥検査装置及び方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006337085A (ja) * 2005-05-31 2006-12-14 Seiko Epson Corp 劣化試験方法及び劣化試験装置
JP2013047844A (ja) * 2007-12-06 2013-03-07 Nitto Denko Corp 画像表示装置の製造方法
JP2011002305A (ja) 2009-06-17 2011-01-06 Topcon Corp 回路パターンの欠陥検出装置、回路パターンの欠陥検出方法およびプログラム
JP2011226957A (ja) 2010-04-21 2011-11-10 Sanritz Corp 偏光板の欠陥検査方法及び欠陥検査装置

Also Published As

Publication number Publication date
TW201508266A (zh) 2015-03-01
CN105474002B (zh) 2018-05-15
WO2015025703A1 (ja) 2015-02-26
KR20160046811A (ko) 2016-04-29
JP6156820B2 (ja) 2017-07-05
CN105474002A (zh) 2016-04-06
TWI638995B (zh) 2018-10-21
JP2015040782A (ja) 2015-03-02

Similar Documents

Publication Publication Date Title
KR102222973B1 (ko) 결함 검사 장치, 광학 부재의 제조 시스템 및 광학 표시 장치의 생산 시스템
JP5280581B2 (ja) 光学部材貼合体の製造システム、製造方法及び記録媒体
TWI574082B (zh) 光學組件貼合體之製造裝置
KR20200078438A (ko) 광학 부재의 검사 방법, 광학 제품의 제조 방법 및 광학 부재의 검사 장치
KR102207122B1 (ko) 광학 부재 접합체의 제조 장치 및 제조 방법
KR102132059B1 (ko) 광학 표시 디바이스의 생산 시스템
WO2014192334A1 (ja) 欠陥検査装置及び光学表示デバイスの生産システム
JP4844857B1 (ja) 回収装置、貼合システム及び回収方法
JP5793821B2 (ja) 検出装置、光学部材貼合体の製造装置及び光学部材貼合体の製造方法
KR102162945B1 (ko) 광학 표시 디바이스의 생산 시스템
JP6179886B2 (ja) 欠陥検査装置、光学表示デバイスの生産システム及び光学シートの製造システム
JP2019120848A (ja) 光学表示パネルの連続検査方法および連続検査装置、並びに、光学表示パネルの連続製造方法および連続製造システム
JP2015036730A (ja) 光学部材貼合体の製造装置
TWI762592B (zh) 缺陷檢查系統、膜製造裝置、膜製造方法、印字裝置及印字方法
JP5724146B2 (ja) 光学部材貼合体の製造システム、製造方法及び記録媒体
WO2014185092A1 (ja) 光学部材貼合体の製造システム、製造方法及び記録媒体
JP2012173616A (ja) 回収装置、貼合システム及び回収方法

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant