KR102222973B1 - Defect inspection device, optical member manufacturing system, and optical display device production system - Google Patents

Abstract

A defect inspection apparatus for an optical member including a polarizer includes a light source, an imaging device for imaging an image by transmitted light from the optical member, and a first polarized light disposed on an optical path between the light source and the optical member, and having a first absorption axis. A second polarizing filter disposed on the optical path between the filter, the imaging device and the optical member, and having a second absorption axis; and a first moving device for moving the first polarizing filter forward and backward toward the optical path between the light source and the optical member; And a second moving device for moving the second polarization filter forward and backward toward the optical path between the imaging device and the optical member.

Description

A defect inspection device, an optical member manufacturing system, and an optical display device manufacturing system {DEFECT INSPECTION DEVICE, OPTICAL MEMBER MANUFACTURING SYSTEM, AND OPTICAL DISPLAY DEVICE PRODUCTION SYSTEM}

The present invention relates to a defect inspection device, an optical member manufacturing system, and an optical display device manufacturing system.

This application claims priority based on Japanese Patent Application No. 2013-172344 for which it applied on August 22, 2013, and uses the content here.

As a defect inspection apparatus for an optical member including a polarizer, the defect inspection apparatus described in Patent Document 1 is known. The defect inspection device of Patent Document 1 is disposed on an optical path between the light source disposed on one side of the optical member, the imaging device disposed on the other side of the optical member, and the imaging device and the optical member, and is orthogonal to the absorption axis of the polarizer. A polarizing filter having an absorption axis is provided.

The defect inspection device is installed in a manufacturing line of an optical member or a conveying line that conveys the optical member toward a bonding object such as a liquid crystal panel. For example, in an optical member manufacturing line, a protective film serving as a protective layer is bonded to both surfaces of a polarizer, and the polarizer to which this protective film is bonded is wound in a roll shape to manufacture a master roll of an optical member. The defect inspection device is provided on a conveyance line of a laminated film in which a protective film is laminated on one or both sides of a polarizer, and inspects the presence or absence of a foreign matter defect between the polarizer and the protective film.

In the defect inspection apparatus, the presence or absence of a defect on the bonding surface side of an optical member (surface side to be bonded with a bonding object, such as a liquid crystal panel) is usually inspected. Therefore, the polarizing filter is installed on the bonding surface side of the optical member.

For example, in the defect inspection apparatus of Patent Document 1, a light source is provided below the conveying line of the optical member, and a polarizing filter and an imaging device are provided above the conveying line.

When a foreign material exists between the polarizer and the protective film on the upper surface side (bonding surface side), the light irradiated from the light source is converted into linearly polarized light by a polarizer, and then a part of the light is scattered by the foreign material. Since a part of the scattered light is disturbed in its polarization state, it passes through a polarization filter and is detected as a bright spot by the imaging device.

On the other hand, when a foreign material exists between the polarizer and the protective film on the lower surface side (the side opposite to the bonding surface), the light irradiated from the light source is scattered by the foreign material, and then incident on the polarizer and converted into linearly polarized light. This linearly polarized light does not pass through the polarization filter unless there is a defect such as a foreign substance that disturbs the polarization state between the polarizer and the polarization filter. Therefore, in the imaging device, the dark field is maintained, and no defect is detected.

By providing the polarizing filter on the bonding surface side of the optical member in this way, only defects on the bonding surface side of the optical member can be selectively inspected.

Patent Document 1: Japanese Patent Publication No. 2007-212442

Which of the upper and lower surfaces of the optical member is determined in advance is determined in advance, and the arrangement of the light source of the defect inspection device, the imaging device, and the polarizing filter is also fixed accordingly. Usually, like Patent Document 1, the upper surface of the optical member is a bonding surface, and a polarizing filter is also provided on the upper side of the optical member.

Here, as an optical member including a polarizer, a polarizing plate (TAC/PVA/TAC) in which TriAcetyl Cellulose (TAC) serving as a protective layer is laminated on both sides of a polarizer made of polyvinyl alcohol (PVA). ) Is known. In recent years, diversification of polarizing plates is in progress, and a polarizing plate in which one of the TACs laminated on both sides of the polarizer is replaced with another film has also been proposed.

In such a polarizing plate, it was found by the inventor's investigation that the state such as warpage of the final product differs depending on whether the TAC side is used as the bonding surface or the other film side is used as the bonding surface.

Therefore, in the case of performing defect inspection of such a polarizing plate using the above-described defect inspection apparatus, a preferable one of the TAC and other films is bonded to the upper surface side of the polarizer. However, due to the configuration of the optical member manufacturing line, the position of the conveying line of another film is determined in either the upper side or the lower side of the conveying line of the polarizer, and a target defect inspection may not be performed.

For example, when the other film is a film that is liable to cause scratches on the surface, a method of peeling the protective film from the other film may be considered when a protective film is laminated on the surface of the other film and the polarizer and another film are bonded. In this case, just before bonding the polarizer and the other film, a peeling mechanism such as a knife edge is provided, and the protective film is peeled from the other film, while the peeled other film is bonded to the polarizer.

However, due to the configuration of the production line, there are cases where the installation space of the peeling mechanism is formed only on either the upper side or the lower side of the conveyance line of the polarizer. In that case, the position of the conveyance line of another film is also limited to either the upper side or the lower side of the conveyance line of a polarizer. If the conveying line of the other film is limited to the upper side of the conveying line of the polarizer, and the other film is bonded to the side opposite to the bonding surface side of the optical member, in the defect inspection apparatus described above, the bonding surface side of the optical member It becomes impossible to perform defect inspection of.

Therefore, it is conceivable to replace the positions of the light source, the imaging device, and the polarizing filter according to the configuration of the optical member. However, in this case, a significant change in the device configuration is required, and a lot of time is required for the replacement of the device. In addition, it is necessary to separately prepare a defect inspection device for each configuration of the optical member, which is not practical. Against this background, there has been a demand for a defect inspection apparatus capable of easily switching between defect inspection on one side and the other side of the optical member according to the configuration of the optical member.

An aspect of the present invention is to provide a defect inspection device and a production system of an optical display device capable of easily switching between defect inspection on one side of an optical member and on the other side.

The aspect of the present invention employs the following means.

(1) A defect inspection apparatus according to an aspect of the present invention is a defect inspection apparatus for an optical member including a polarizer, which is disposed on a first side of the optical member, and includes a light source for irradiating light to the optical member, and the optics An imaging device disposed on the second side of the member to capture an image by transmitted light from the optical member, and a first absorption disposed on an optical path between the light source and the optical member and perpendicular to the absorption axis of the polarizer A first polarization filter having an axis, a second polarization filter disposed on an optical path between the imaging device and the optical member, and having a second absorption axis orthogonal to an absorption axis of the polarizer, and the first polarization filter as the light source And a first moving device for moving forward and backward with respect to the optical path between the optical member and a second moving device for moving the second polarizing filter forward and backward with respect to the optical path between the imaging device and the optical member. .

(2) In the aspect of (1), in the first imaging mode, the first moving device controls to move the first polarizing filter onto the optical path between the light source and the optical member, and at the same time , Controlling the arrangement of the first polarizing filter so that the absorption axis of the polarizer and the first absorption axis are orthogonal, and the second moving device includes the second polarizing filter between the imaging device and the optical member. Control so as to move to a position shifted from the optical path image of, and in the second imaging mode, the first moving device moves the first polarizing filter to a position shifted from the optical path image between the light source and the optical member. Control is performed so that the second moving device moves the second polarizing filter onto the optical path between the imaging device and the optical member, and the absorption axis of the polarizer and the second A control device for controlling the arrangement of the second polarizing filter may be further included so that the absorption axis is orthogonal to each other.

(3) An optical member manufacturing system according to an aspect of the present invention is a manufacturing system for an optical member including a polarizer, and an optical member manufacturing apparatus for manufacturing the optical member, and for inspecting the presence or absence of a defect in the optical member. It is characterized by including the defect inspection device according to (1) or (2) above.

(4) In the aspect of (3), the optical member includes a polarizer, a first protective layer stacked on the first surface of the polarizer, and a second protective layer stacked on the second surface of the polarizer. The optical member manufacturing apparatus comprises: a first supply unit for supplying the polarizer, and disposed on a first side of a supply path of the polarizer, the first protective layer, and a third surface of the first protective layer A second supply unit for supplying a lamination member including a third protective layer stacked thereon; a third supply unit disposed on a second side of a supply path of the polarizer and supplying the second protective layer; and It is disposed on the first side of the supply path, and may include a peeling portion used as the first protective layer by peeling the third protective layer from the laminated member.

(5) A production system for an optical display device according to an aspect of the present invention is a production system for an optical display device formed by bonding an optical member to an optical display component, comprising a conveying device for conveying the optical member, and the conveying device. The above (1) for inspecting the presence or absence of a defect in the optical member conveyed by bonding to the optical display component to manufacture the optical display device, and the optical member conveyed from the conveying device to the bonding device. It is characterized by including the defect inspection apparatus described in (2).

According to an aspect of the present invention, it is possible to provide a defect inspection apparatus capable of easily switching between defect inspection on one side of an optical member and on the other side, a system for manufacturing an optical member, and a system for manufacturing an optical display device.

1 is a side view showing a system for manufacturing an optical film according to an embodiment of the present invention.
2 is a side view of a defect inspection apparatus according to an embodiment of the present invention.
3 is a diagram for explaining an arrangement relationship between the first absorption axis of the first polarization filter (the second absorption axis of the second polarization filter) and the absorption axis of the polarizer film.
4 is a diagram for explaining the principle of inspection of a defect by a defect inspection device.
5 is a diagram for explaining the principle of inspection of a defect by a defect inspection device.
6 is a plan view of a defect inspection apparatus according to an embodiment of the present invention.
7 is a diagram illustrating an example of bonding of a polarizing plate (TAC/PVA/TAC) to a liquid crystal panel.
8 is a diagram illustrating an example of bonding of a polarizing plate (COP/PVA/TAC) to a liquid crystal panel.
9 is a diagram for explaining a defect inspection apparatus in a first imaging mode of a polarizing plate (TAC/PVA/TAC).
10 is a diagram illustrating an example of bonding of a polarizing plate to a liquid crystal panel in a first imaging mode of a polarizing plate (TAC/PVA/TAC).
11 is a diagram for explaining a defect inspection apparatus in a first imaging mode of a polarizing plate (COP/PVA/TAC).
12 is a diagram illustrating an example of bonding of a polarizing plate to a liquid crystal panel in a first imaging mode of a polarizing plate (TAC/PVA/COP).
13 is a diagram for describing a defect inspection apparatus in a second imaging mode.
14 is a diagram illustrating an example of bonding of a polarizing plate to a liquid crystal panel in a second imaging mode.
15 is a side view showing an apparatus configuration of a film bonding system according to an embodiment of the present invention.
16 is a side view showing an apparatus configuration of a film bonding system according to an embodiment of the present invention.
17 is a plan view of a liquid crystal panel.
18 is a cross-sectional view of a polarizing film sheet.

Hereinafter, embodiments of the present invention will be described with reference to the drawings, but the present invention is not limited to the following embodiments.

In addition, in all of the following drawings, in order to make the drawing easy to see, the dimensions and ratios of the respective constituent elements are appropriately different. In the following description and drawings, the same or corresponding elements are denoted by the same reference numerals, and overlapping descriptions are omitted.

(Optical member manufacturing system)

1 is a side view showing an example of an optical film manufacturing system 100 which is an optical member manufacturing system according to an embodiment of the present invention. Hereinafter, an example of manufacturing a polarizing film as an optical film will be described. However, as long as the optical film contains at least a polarizer film, in addition to a polarizing film, a plurality of optical elements such as a retardation film and a brightness improving film may be laminated.

In the following description, if necessary, an XYZ rectangular coordinate system is set, and the positional relationship of each member is described with reference to this XYZ rectangular coordinate system. In this embodiment, the conveyance direction of the long optical film is set as the X direction, and the direction (width direction of the long optical film) is set to the Y direction, the X direction, and the Y direction in the plane of the optical film. The orthogonal direction is set as the Z direction.

As shown in FIG. 1, the optical film manufacturing system 100 includes an optical film manufacturing apparatus 101 (optical member manufacturing apparatus) for manufacturing an optical film F10 and a defect of the optical film F10. It has a defect inspection device 102 that checks the presence or absence.

The optical film F10 (optical member) used in this embodiment is, for example, a polarizer film F11 (polarizer) made of PVA (polyvinyl alcohol) or the like, and a COP (cycloolefin polymer) film (F13) as a protective film. ) (First protective layer) and TAC (triacetylcellulose) film (F15) (second protective layer) sandwiched between. In addition, in the polarizer film F11, the surface on the side on which the COP film F13 is laminated may be referred to as a first surface. In addition, in the polarizer film F11, the side on which the TAC film F15 is laminated may be referred to as the second surface.

Moreover, as a protective film, in addition to a TAC film and a COP film, a PET (polyethylene terephthalate) film, MMA (methyl methacrylate) film, etc. can be used.

The optical film manufacturing apparatus 101 is a laminated film having a first supply unit 110 for supplying a polarizer film F11, and a COP film F13 and a protective film F14 for COP films (third protective layer). The second supply unit 111 for supplying (F12), the third supply unit 112 for supplying the TAC film F15, and the protective film F14 for the COP film are peeled from the laminated film F12 to separate the COP film ( A film laminating device 114 for manufacturing one optical film F10 by laminating the peeling part 113 as F13) and three films of a polarizer film F11, a COP film F13, and a TAC film F15. ) And a winding portion 115 for winding up the optical film F10.

The 1st supply part 110 holds the disk roll R11 which wound up the strip-shaped polarizer film F11, and feeds out the polarizer film F11 along the longitudinal direction.

The 2nd supply part 111 holds the original roll R12 which wound up the strip-shaped laminated film F12, and feeds out the laminated film F12 along the longitudinal direction. The 2nd supply part 111 is arrange|positioned in one (+Z direction side shown in FIG. 1) of the supply path of the polarizer film F11. Moreover, the +Z direction side shown in FIG. 1 which is one of the supply path of the polarizer film F11 may be referred to as the 1st side of the supply path of the polarizer film F11.

The 3rd supply part 112 holds the original roll R15 which wound up the strip-shaped TAC film F15, and feeds out the TAC film F15 along the longitudinal direction. The 3rd supply part 112 is arrange|positioned in the other side (-Z direction side shown in FIG. 1) of the supply path of the polarizer film F11. Moreover, the -Z direction side shown in FIG. 1 which is the other side of the supply path of the polarizer film F11 may be referred to as the 2nd side of the supply path of the polarizer film F11.

The peeling part 113 is a structure in which the protective film F14 for COP films is peeled from the laminated film F12 fed out from the 2nd supply part 111, and wound up on a roll. The peeling part 113 has a knife edge 113a and a winding part 113b.

The protective film F14 for COP films is laminated on one surface of the COP film F13 (on the bonding surface to be bonded to the polarizer film F11). Accordingly, it is possible to suppress the occurrence of scratches on the surface of the protective film F14 for COP films (the bonding surface to be bonded to the polarizer film F11). In addition, as described above, one surface of the COP film F13 on which the protective film F14 for COP films is laminated may be referred to as the third surface.

The knife edge 113a extends over at least the entire width in the width direction of the laminated film F12. The knife edge 113a winds it up so as to slidably contact the protective film F14 for COP films of the laminated film F12 unwound from the original roll R12. The knife edge 113a wraps the laminated film F12 at an acute angle on the tip of the knife edge 113a. The knife edge 113a separates the COP film F13 from the protective film F14 for COP films when folding the laminated film F12 at an acute angle by its tip. The knife edge 113a supplies this COP film F13 to the film laminating apparatus 114.

The winding part 113b winds up the protective film F14 for COP films which became independent via the knife edge 113a, and holds it as the peeling roll R14.

The peeling part 113 is arrange|positioned between the 1st supply part 110 and the 2nd supply part 111 in one (+Z direction side shown in FIG. 1) of the supply path of the polarizer film F11.

In addition, the arrangement structure of the 2nd supply part 111, the 3rd supply part 112, and the peeling part 113 is not limited to this. For example, both of the second supply unit 111 and the peeling unit 113 are disposed on the other side of the supply path of the polarizer film F11 (the -Z direction side shown in Fig. 1), and the third supply unit 112 May be disposed on one side of the supply path of the polarizer film F11 (the +Z direction side shown in FIG. 1 ).

In the film laminating apparatus 114, a pair of rollers 114a and 114b are provided above and below. A polarizer film F11, a COP film F13, and a TAC film F15 are superimposed and supplied between the rollers 114a and 114b. And by being pressed by both rollers 114a and 114b, the polarizer film F11, the COP film F13, and the TAC film F15 are bonded together, and one optical film F10 is manufactured. Further, a release film or a protective film may be further laminated on the surfaces of the COP film (F13) and the TAC film (F15). The optical film F is conveyed toward the defect inspection apparatus 102 by a conveying roller (not shown).

The defect inspection device 102 includes a light source 120 disposed above the optical film F10 (the +Z direction side shown in Fig. 1) and the lower side of the optical film F10 (the -Z direction side shown in Fig. 1). ), the first polarizing filter 121 disposed on the optical path between the light source 120 and the optical film F10, and the imaging device 122 and the optical film F10. A second polarization filter 123 disposed on the optical path is provided. In addition, details of the defect inspection device 102 will be described later. In addition, the +Z direction side shown in FIG. 1 on which the light source 120 as described above is disposed may be referred to as the first side of the optical film F10. Further, the -Z direction side shown in Fig. 1 on which the above-described imaging device 122 is disposed may be referred to as the second side of the optical film F10.

The data of the defect of the optical film F10 detected by the defect inspection device 102 is associated with the position of the optical film F10 (the position in the length direction and the position in the width direction of the optical film F10), and the storage device Is remembered. The optical film F10 inspected by the defect inspection apparatus 102 is conveyed toward the winding part 115. And it is wound up in a roll shape in the winding part 115, and the master roll R10 of the optical film F10 is manufactured.

(Defect inspection device)

2 is a side view of a defect inspection apparatus 102 according to an embodiment of the present invention.

In Fig. 2, reference numeral Sf1 denotes an upper surface (one surface of the optical member) of the optical film F10, and is a surface on the side of the COP film F13. Reference numeral Sf2 is the lower surface (the other surface of the optical member) of the optical film F10, and is the surface at the TAC film F15 side.

As shown in FIG. 2, the defect inspection apparatus 102 of this embodiment is the light source 120 arrange|positioned on the upper surface Sf1 side of the optical film F10, and the lower surface Sf2 side of the optical film F10 The imaging device 122 disposed in the, the first polarizing filter 121 disposed on the optical path between the light source 120 and the optical film F10, and the optical path between the imaging device 122 and the optical film F10 A first moving device 130 for moving the second polarizing filter 123 and the first polarizing filter 121 disposed thereon toward the optical path between the light source 120 and the optical film F10, and a second A second moving device 131 and a control device 132 for moving the polarizing filter 123 forward and backward toward the optical path between the imaging device 122 and the optical film F10 are provided. In other words, the first moving device 130 can move the first polarizing filter 121 forward and backward with respect to the optical path between the light source 120 and the optical film F10, and the second moving device 131 It is possible to move the second polarization filter 123 forward and backward with respect to the optical path between the imaging device 122 and the optical film F10.

The control device 132 controls each advance and retreat movement of the first polarization filter 121 and the second polarization filter 123. The control device 132 can independently control each of the first moving device 130 and the second moving device 131.

The center of the light emitting surface 120a of the light source 120 and the center of the light receiving surface 122a of the imaging device 122 are disposed coaxially (on the optical axis CL).

3 is an arrangement of the first absorption axis V1 of the first polarizing filter 121 (the second absorption axis V2 of the second polarizing filter 123) and the absorption axis V0 of the polarizer film F11 It is a diagram for explaining the relationship.

As shown in FIG. 3, the 1st polarizing filter 121 has the 1st absorption axis V1 orthogonal to the absorption axis V0 of the polarizer film F11. The first polarizing filter 121 is, on the optical path between the light source 120 and the optical film F10, the first absorption axis V1 of the first polarizing filter 121 and the absorption axis V0 of the polarizer film F11 ) Are orthogonal to each other (cross-nickel arrangement).

When the first absorption axis V1 of the first polarization filter 121 and the absorption axis V0 of the polarizer film F11 are arranged by Cross Nicol, the overlapping portion of the first polarization filter 121 and the polarizer film F11 ( In SV1), light does not pass through. Therefore, when the overlapping part SV1 is imaged by the imaging device 122, there is no arrangement between the first polarizing filter 121 and the polarizer film F11 to disturb the polarization state such as a defect having a phase difference. Han, it seems to be a dark field.

The second polarization filter 123 has a second absorption axis V2 orthogonal to the absorption axis V0 of the polarizer film F11. The second polarization filter 123 is, on the optical path between the imaging device 122 and the optical film F10, the second absorption axis V2 of the second polarization filter 123 and the absorption axis of the polarizer film F11 ( V0) are arranged orthogonal to each other (cross-nickel arrangement).

Even if the second absorption axis V2 of the second polarization filter 123 and the absorption axis V0 of the polarizer film F11 are cross-Nichol disposed, the overlapping portion of the second polarization filter 123 and the polarizer film F11 ( SV2) does not transmit light. Therefore, even if the overlapping part SV2 is imaged by the imaging device 122, there is no arrangement between the second polarization filter 123 and the polarizer film F11 to disturb the polarization state such as a defect having a phase difference. Han, it seems to be a dark field.

4 and 5 are diagrams for explaining the principle of inspection of the defect E1 by the defect inspection apparatus 102. 4: is a figure in the case where the defect E1 exists in the COP film F13. 5 is a diagram illustrating a case where a defect E2 exists in the TAC film F15, although no defect exists in the COP film F13. 4 and 5, for convenience, illustration of the second polarization filter 123, the first moving device 130, the second moving device 131, and the control device 132 is omitted.

As shown in FIG. 4, the light L1 emitted from the light source 120 toward the optical film F10 becomes linearly polarized light L2 by the first polarization filter 121. The linearly polarized light L2 obtained by the 1st polarizing filter 121 enters the COP film F13. Then, the polarization state of the linearly polarized light L2 is disturbed by the defect E1 present in the COP film F13, and a part of the light (light L3) whose polarization state is disturbed passes through the polarizer film F11. As a result, the light L3 transmitted through the polarizer film F11 enters the imaging device 122, and the defect E1 is brightly imaged as a bright spot by the imaging device 122.

As shown in FIG. 5, the light L1 emitted from the light source 120 toward the optical film F10 becomes linearly polarized light L2 by the first polarization filter 121. The linearly polarized light L2 obtained by the 1st polarizing filter 121 enters the COP film F13. Then, since there are no defects in the COP film F13, the linearly polarized light L2 cannot pass through the polarizer film F11. As a result, since light does not enter the imaging device 122, a black image is captured by the imaging device 122. In this case, the defect E2 existing in the TAC film F15 is not seen.

In this way, by detecting the presence of a bright spot, it is possible to determine the presence or absence of the defect E1 of the COP film F13. For example, when a bright spot is imaged by the imaging device 122, it is determined that there is a "defect" in the COP film F13. On the other hand, when a black image is captured by the imaging device 122 (when nothing is captured), it is determined as "no defect" in the COP film F13.

6 is a plan view of the defect inspection device 102. In FIG. 6, for convenience, the optical film F10 is shown.

As shown in FIG. 6, the light exit surface 120a of the light source 120 constituting the defect inspection device 102 is rectangular and has a long side side along the Y direction. In this embodiment, the light exit surface 120a of the light source 120 has a long side side along the width direction orthogonal to the conveyance direction of the optical film F10. The light exit surface 120a of the light source 120 is formed over the width direction with respect to the optical film F10. For example, as the light source 120, a metal halide lamp can be used.

The first polarization filter 121 is disposed so as to overlap with the outer peripheral portion of the light exit surface 120a of the light source 120. Like the light exit surface 120a of the light source 120, the 1st polarization filter 121 has a long side side along a Y direction. The first polarization filter 121 is longer than the light exit surface 120a of the light source 120 in each of the X and Y directions.

Accordingly, when the first polarization filter 121 is disposed on the optical path between the light source 120 and the optical film F10, all light emitted from the light source 120 is transferred to the first polarization filter 121 Join.

Like the light exit surface 120a of the light source 120, the imaging device 122 also has a long side side along a Y direction. For example, as the imaging device 122, a line sensor camera can be used.

The 2nd polarization filter 123 is arrange|positioned so that it may overlap with the outer peripheral part of the light-receiving surface 122a of the imaging device 122. Like the light-receiving surface 122a of the imaging device 122, the 2nd polarization filter 123 has a long side side along a Y direction. The second polarization filter 123 is longer than the light-receiving surface 122a of the imaging device 122 in each of the X and Y directions.

The above-described optical film F10 is cut to a predetermined size by a cutting device (not shown), and becomes a polarizing plate as a sheet piece to be bonded to a liquid crystal panel. By bonding the polarizing plate to a liquid crystal panel, a liquid crystal display device as an optical display device is manufactured.

By the way, in manufacturing a liquid crystal display device in which a polarizing plate is bonded to a liquid crystal panel, there is a problem that warpage occurs in the liquid crystal panel due to the stress of the polarizing plate when bonding the polarizing plate to the liquid crystal panel.

As a result of intensive research, the inventor of the present invention has found that if the configuration of the polarizing plate is changed, the state of warpage of the liquid crystal panel can be made different.

Hereinafter, it will be described with reference to FIGS. 7 and 8.

7 is a diagram showing an example of bonding of a polarizing plate (TAC/PVA/TAC) to a liquid crystal panel P in which the configuration of the polarizing plate is TAC/PVA/TAC.

As shown in FIG. 7, an adhesive layer F16 is arrange|positioned on the bonding surface of the polarizing plate TAC/PVA/TAC with the liquid crystal panel P. The polarizing plate (TAC/PVA/TAC) is bonded to the liquid crystal panel P via the adhesive layer F16.

Fig. 8 is a diagram showing an example of bonding of a polarizing plate (COP/PVA/TAC) to a liquid crystal panel P in which the configuration of the polarizing plate is COP/PVA/TAC.

As shown in FIG. 8, the adhesive layer F16 is arrange|positioned on the bonding surface (surface on the TAC film side) with the liquid crystal panel P of the polarizing plate (COP/PVA/TAC). The polarizing plate (COP/PVA/TAC) arranges a TAC film on the bonding surface side of the liquid crystal panel P, and is bonded to the liquid crystal panel P through the adhesive layer F16.

Although the cause of the present inventor is not clear, the case where the polarizing plate (COP/PVA/TAC) was disposed on the bonding surface side of the liquid crystal panel P and bonded to the liquid crystal panel P (see FIG. 8 ), When the polarizing plate (TAC/PVA/TAC) was bonded to the liquid crystal panel P (refer to FIG. 7), it was found that the state of the warpage of the liquid crystal panel P can be made different.

Therefore, from the viewpoint of making the state of the warpage of the liquid crystal panel P different from the case where the polarizing plate (TAC/PVA/TAC) is bonded to the liquid crystal panel P, COP/PVA/TAC as shown in FIG. It is preferable to use a polarizing plate having a configuration and to bond the surface of the polarizing plate on the TAC side to the liquid crystal panel P. In this case, the surface on the TAC side of the polarizing plate becomes the bonding surface with the liquid crystal panel P. Therefore, when manufacturing the optical film F10 using the manufacturing apparatus 100 of FIG. 1, the COP film F13 is a structure in which the upper surface of the polarizer film F11 is bonded. Therefore, the polarizing filter of the defect inspection apparatus needs to be provided below the conveyance line of the optical film F10.

In the case of a configuration in which the polarizing filter is disposed only on the bonding surface of the polarizing plate as in the conventional defect inspection apparatus, when the configuration of the polarizing plate is changed as shown in FIGS. 7 to 8, it is necessary to replace the positions of the light source, the imaging device, and the polarizing filter. In this case, a significant change in the device configuration is required.

For example, in the case of a polarizing plate (TAC/PVA/TAC), the TAC film is disposed on both sides of the PVA film. Therefore, any one of the pair of TAC films may be used as the bonding surface side of the polarizing plate, and even a conventional defect inspection device can be applied without changing the device configuration.

However, in the case of a polarizing plate (COP/PVA/TAC), the TAC film is disposed only on one side of the PVA film. Therefore, in the case of a conventional defect inspection apparatus, when the TAC film side is made into the bonding surface side of the polarizing plate in order to make the state of the warpage of the liquid crystal panel P different, a significant change in the device configuration is required.

In particular, as shown in FIG. 1, when the peeling portion 113 for peeling the protective film F14 for COP films from the laminated film F12 is disposed only above the supply path of the polarizer film F11, the laminated film ( The second supply unit 111 for supplying F12) is also disposed above the supply path of the polarizer film F11. Therefore, in a conventional defect inspection apparatus, when the polarizing filter is arranged only on the upper side of the optical film F10, defect inspection of the COP film F13 can be performed, but the TAC film serving as the bonding surface side of the polarizing plate The defect inspection of (F15) cannot be performed.

On the other hand, as this countermeasure, it is conceivable to replace the positions of the light source, the polarizing filter, and the imaging device, but a significant change in the device configuration is required, and a lot of time is required for the replacement of the device. In addition, two defect inspection devices for performing defect inspection on the upper surface side of the optical film F10 and a defect inspection device for performing defect inspection on the lower surface side of the optical film F10 are installed along the conveyance path of the optical film F10. It is also conceivable to do this, but it is not practical because it requires a large installation space and at the same time requires a huge installation cost.

Therefore, the aspect of the present invention adopts the following configuration in order to be able to easily switch between defect inspections on one side and the other side of the optical film.

The defect inspection apparatus 102 according to the embodiment of the present invention is disposed above the optical film F10, as shown in FIG. 2, and the light source 120 irradiates light to the optical film F10, and , An image pickup device 122 that is disposed on the lower side of the optical film and captures an image by transmitted light from the optical film, and is disposed on an optical path between the light source 120 and the optical film F10, and a polarizer film F11 ), the first polarizing filter 121 having a first absorption axis orthogonal to the absorption axis of ), and disposed on the optical path between the imaging device 122 and the optical film F10, and perpendicular to the absorption axis of the polarizer film F11 A second polarization filter 123 having a second absorption axis and a first moving device 130 for moving the first polarizing filter 121 forward and backward toward the optical path between the light source 120 and the optical film F10, It characterized in that it comprises a second moving device 131 for moving the second polarization filter 123 forward and backward toward the optical path between the imaging device 122 and the optical film (F10). In other words, the first moving device 130 can move the first polarizing filter 121 forward and backward with respect to the optical path between the light source 120 and the optical film F10, and the second moving device 131 It is possible to move the second polarization filter 123 forward and backward with respect to the optical path between the imaging device 122 and the optical film F10.

According to this configuration, polarizing filters are disposed on both the upper and lower surfaces of the optical film F10. Therefore, by moving each polarizing filter forward and backward on the optical path between the light source 120 and the imaging device 122 according to the configuration of the optical film F10, defects on the top and bottom sides of the optical film F10 The inspection can be easily switched. Therefore, it is possible to easily cope with defect inspection of the optical film F10 having various configurations while saving space and having an inexpensive configuration.

9 is a diagram for explaining the defect inspection apparatus 102 in the first imaging mode of the polarizing plate (TAC(1)/PVA/TAC(2)).

10 is a diagram illustrating an example of bonding of the polarizing plate (TAC(1)/PVA/TAC(2)) to the liquid crystal panel P in the first imaging mode.

11 is a diagram for explaining the defect inspection apparatus 102 in the first imaging mode of the polarizing plate (COP/PVA/TAC). 12 is a diagram illustrating an example of bonding of the polarizing plate (COP/PVA/TAC) to the liquid crystal panel P in the first imaging mode.

13 is a diagram for explaining the defect inspection apparatus 102 in the second imaging mode.

14 is a diagram illustrating an example of bonding of a polarizing plate to a liquid crystal panel P in a second imaging mode.

In addition, in FIGS. 9, 11, and 13, illustration of the first moving device 130, the second moving device 131, and the control device 132 is omitted for convenience. 9 and 10, the TAC film on the bonding surface side of the polarizing plate is referred to as the TAC(1) film "TAC(1)", and the TAC film on the side opposite to the bonding surface side of the polarizing plate is referred to as the TAC(2) film "TAC(2)". It is indicated as.

As shown in FIG. 9, in the control device 132, in the first imaging mode, the first moving device 130 connects the first polarizing filter 121 to the light source 120 and a polarizing plate (TAC(1)/ PVA/TAC (2)), the absorption axis of the PVA film and the first polarization filter 121 of the first polarization filter 121 while controlling to move to the image of the optical path (first position Q1 on the optical axis CL). The arrangement of the first polarizing filter 121 is controlled so that the absorption axis is orthogonal, and the second moving device 131 connects the second polarizing filter 123 to the imaging device 122 and a polarizing plate (TAC(1)). Control is performed to move to a position shifted from the optical path between /PVA/TAC(2) (second position Q2 shifted from optical axis CL).

Specifically, in the control device 132, in the first imaging mode, the first moving device 130 arranges the center of the first polarization filter 121 at the first position Q1 on the optical axis CL At the same time, control is performed so that the first polarization filter 121 is disposed so that the absorption axis of the PVA film and the first absorption axis of the first polarization filter 121 are orthogonal to each other, and a second moving device ( Control is performed so that the center of the second polarization filter 123 is placed at the second position Q2 shifted from the optical axis CL by 131.

The second position Q2 is set to a position where the second polarization filter 123 is retracted from the viewing range of the imaging device 122. That is, the second position Q2 is set to a position where the second polarization filter 123 does not enter the viewing range of the imaging device 122. When the second position Q2 is too close to the optical axis CL, the second polarization filter 123 penetrates into the viewing range of the imaging device 122. On the other hand, if the second position Q2 is too far from the optical axis CL, it takes time when moving the second polarization filter 123 to the position on the optical axis CL, and it becomes difficult to smoothly transition to another imaging mode. From this point of view, the second position Q2 in this embodiment is set to, for example, a distance in the range of 30 mm or more and 50 mm or less from the optical axis CL. Further, the second position Q2 is more preferably set to a distance in the range of 35 mm or more and 45 mm or less from the optical axis CL.

In the first imaging mode, the absorption axis of the PVA film and the first absorption axis of the first polarizing filter 121 are cross-Nicol-arranged. In the first imaging mode, defect inspection of the TAC film 1 disposed on the optical path between the first polarizing filter 121 and the PVA film can be performed.

Light emitted from the light source 120 toward the polarizing plate TAC(1)/PVA/TAC(2) becomes linearly polarized by the first polarization filter 121. Linearly polarized light obtained by the first polarization filter 121 enters the TAC film 1. When there is no defect in the TAC film 1, the light transmitted through the TAC film 1 is blocked by the PVA film. Therefore, the imaging device 122 captures a black image. In this case, the TAC film 1 is determined as "no defect".

On the other hand, when there is a defect in the TAC film 1, the polarization state of linearly polarized light incident on the TAC film 1 is disturbed by the defect, and a part of the light whose polarization state is disturbed passes through the PVA film. As a result, the light transmitted through the PVA film enters the imaging device 122, and the defect is brightly imaged as a bright spot by the imaging device 122. In this case, the TAC film 1 is determined to be "defective".

In this way, in the first imaging mode, cross-Nichol transmission inspection on the side of the TAC film 1 laminated on the upper surface of the PVA film can be performed, and the polarizing plate (TAC(1)/PVA/TAC(2)) and the liquid crystal panel ( The defect inspection on the bonding surface side of P) can be performed.

As shown in FIG. 10, the adhesive layer F16 is arrange|positioned on the bonding surface (the surface of the TAC 1) of the liquid crystal panel P of the polarizing plate (TAC(1)/PVA/TAC(2)). The polarizing plate (TAC(1)/PVA/TAC(2)) is bonded to the liquid crystal panel P via the adhesive layer F16.

As shown in FIG. 11, also in the case of the polarizing plate (COP/PVA/TAC), the same control as in the first imaging mode described with reference to FIG. 9 can be performed.

In the case of the polarizing plate (COP/PVA/TAC), in the first imaging mode, defect inspection of the COP film disposed on the optical path between the first polarizing filter 121 and the PVA film can be performed.

Light emitted from the light source 120 toward the polarizing plate COP/PVA/TAC becomes linearly polarized by the first polarization filter 121. Linearly polarized light obtained by the first polarization filter 121 enters the COP film. When there are no defects in the COP film, the light transmitted through the COP film is blocked by the PVA film. Therefore, the imaging device 122 captures a black image. In this case, the COP film is judged as "no defect".

On the other hand, when there is a defect in the COP film, the polarization state of the linearly polarized light incident on the COP film is disturbed by the defect, and a part of the light whose polarization state is disturbed passes through the PVA film. As a result, the light transmitted through the PVA film enters the imaging device 122, and the defect is brightly imaged as a bright spot by the imaging device 122. In this case, the COP film is determined to be "defective".

In this way, by the first imaging mode, cross-Nichol transmission inspection of the COP film laminated on the upper surface of the PVA film can be performed, and defect inspection of the COP film serving as the bonding surface side of the polarizing plate (COP/PVA/TAC) can be performed. .

As shown in FIG. 12, the adhesive layer F16 is arrange|positioned on the bonding surface (surface of COP) of the liquid crystal panel P of the polarizing plate (COP/PVA/TAC). The polarizing plate (COP/PVA/TAC) arranges a COP film on the bonding surface side of the liquid crystal panel P, and is bonded to the liquid crystal panel P through the adhesive layer F16.

As shown in FIG. 13, in the control device 132, in the 2nd imaging mode, the 1st moving device 130, the 1st polarizing filter 121, the light source 120 and the polarizing plate (COP/PVA/TAC) ), the control is performed to move to a position shifted from the image of the optical path (the third position Q3 shifted from the optical axis CL), and the second moving device 131 captures the second polarization filter 123 The absorption axis of the PVA film and the second polarization filter are controlled to move to the optical path image (the fourth position Q4 on the optical axis CL) between the device 122 and the polarizing plate (COP/PVA/TAC). The arrangement of the second polarization filter 123 is controlled so that the second absorption axis of 123 is orthogonal to each other.

Specifically, in the second imaging mode, the control device 132 moves the center of the first polarization filter 121 to a third position Q3 shifted from the optical axis CL. Control is performed so as to be placed, and the second moving device 131 controls to place the center of the second polarization filter 123 at the fourth position Q4 on the optical axis CL, and at the same time, the PVA The arrangement of the second polarization filter 123 is controlled so that the absorption axis of the film and the second absorption axis of the second polarization filter 123 are orthogonal to each other.

The third position Q3 is set to a position where light emitted from the light source 120 can be avoided from being blocked by the cross-Nicol arrangement of the first polarizing filter 121 and the PVA film. When the third position Q3 is too close to the optical axis CL, a part of the light emitted from the light source 120 is blocked by the cross-Nicol arrangement of the first polarization filter 121 and the PVA film. On the other hand, when the third position Q3 is too far from the optical axis CL, it takes time when moving the first polarization filter 121 to the position on the optical axis CL, and it becomes difficult to smoothly transition to another imaging mode. From this point of view, the third position Q3 in this embodiment is set to, for example, a distance in the range of 30 mm or more and 50 mm or less from the optical axis CL. Further, the third position Q3 is more preferably set to a distance in the range of 35 mm or more and 45 mm or less from the optical axis CL.

In the second imaging mode, the absorption axis of the PVA film and the second absorption axis of the second polarization filter 123 are cross-Nicol-arranged. In the second imaging mode, defect inspection of the TAC film disposed on the optical path between the PVA film and the second polarizing filter 123 can be performed.

Light emitted from the light source 120 toward the polarizing plate (COP/PVA/TAC) passes through the COP film and becomes linearly polarized by the PVA film. The linearly polarized light obtained by the PVA film enters the TAC film. When there is no defect in the TAC film, the light transmitted through the TAC film is blocked by the second polarizing filter 123. Therefore, the imaging device 122 captures a black image. In this case, the TAC film is judged as "no defect".

On the other hand, when there is a defect in the TAC film, the polarization state of the linearly polarized light incident on the TAC film is disturbed by the defect, and a part of the light whose polarization state is disturbed passes through the second polarization filter 123. As a result, the light that has passed through the second polarization filter 123 enters the imaging device 122, and the defect is brightly imaged as a bright spot by the imaging device 122. In this case, the TAC film is determined to be "defective".

In this way, in the second imaging mode, cross-Nichol transmission inspection of the TAC film laminated on the lower surface of the PVA film can be performed, and defect inspection of the TAC film serving as the bonding surface side of the polarizing plate (COP/PVA/TAC) can be performed. .

As shown in FIG. 14, the adhesive layer F16 is arrange|positioned on the bonding surface (surface of a TAC film) of the liquid crystal panel P of the polarizing plate (COP/PVA/TAC). The polarizing plate (COP/PVA/TAC) arranges a TAC film on the bonding surface side of the liquid crystal panel P, and is bonded to the liquid crystal panel P through the adhesive layer F16. This configuration is an effective configuration as a countermeasure against warping of the liquid crystal panel P.

In addition, in each imaging mode, the light source 120 and the imaging device 122 are fixed at a fixed position.

As described above, the defect inspection device 102 of the present embodiment can freely select the first imaging mode and the second imaging mode under the control of the control device 132. Therefore, even when the configuration of the polarizing plates is different, a defect on the bonding surface side of each polarizing plate can be detected by the same defect inspection device 102. That is, according to the present embodiment, it is not necessary to replace the positions of the light source and the imaging device, and there is no need for a significant change in the device configuration. Therefore, according to this embodiment, the defect inspection on one side and the other side of the optical film F10 can be easily switched.

In addition, in this embodiment, the optical film F10 is made of the COP film F13 laminated on the upper surface of the polarizer film F11 and the TAC film F15 laminated on the lower surface of the polarizer film F11, The 2nd supply part 111 and the peeling part 113 are arrange|positioned above the supply path of the polarizer film F11. By arranging a polarizing plate (COP/PVA/TAC) on the bonding surface side of the liquid crystal panel P and bonding it to the liquid crystal panel P, the state of the warpage of the liquid crystal panel P is determined by the inventor's intensive research. It turns out that it can be made different, and defect inspection on the side of the TAC film which becomes the bonding surface side of a polarizing plate (COP/PVA/TAC) may be necessary.

However, in this case, if the polarizing filter is disposed only on the upper side of the optical film, defect inspection on the side of the TAC film serving as the bonding surface side of the polarizing plate cannot be performed as it is. Therefore, it is necessary to replace the positions of the light source, the polarizing filter, and the image pickup device, and a large change in the device configuration is required.

In contrast, according to the present embodiment, defect inspection on the side of the TAC film serving as the bonding surface side of the polarizing plate can be performed simply by switching to the second imaging mode using the same defect inspection device 102.

In addition, in each imaging mode, the light source 120 and the imaging device 122 are fixed in a fixed position. Therefore, compared with the structure in which the light source and the imaging device are moved, the defect inspection on the bonding surface side of the optical film F10 can be easily performed.

(Optical display device production system)

Hereinafter, as a production system of an optical display device according to an embodiment of the present invention, a film bonding system 1 constituting a part thereof will be described. In the film bonding system 1 according to the present embodiment, the first defect inspection apparatus 9 and the second defect inspection apparatus are configured by the defect inspection apparatus 102 described above.

15 and 16 are side views showing the device configuration of the film bonding system 1 of the present embodiment.

The film bonding system 1 is to bond a film-like optical member such as a polarizing film, an antireflection film, or a light diffusing film to a panel-type optical display component such as a liquid crystal panel or an organic EL panel.

In the following description, if necessary, an XYZ rectangular coordinate system is set, and the positional relationship of each member is described with reference to this XYZ rectangular coordinate system. In this embodiment, the conveyance direction of the liquid crystal panel as an optical display component is the X direction, and the direction (width direction of the liquid crystal panel) perpendicular to the X direction in the plane of the liquid crystal panel is the Y direction, the X direction, and the Y direction. The orthogonal direction is set as the Z direction.

In addition, in this embodiment, the liquid crystal panel P is illustrated as an optical display component, and a double-sided bonding panel formed by bonding the bonding sheet F5 to the front and back sides of the liquid crystal panel P as an optical member bonding body is illustrated, The present invention is not limited to this.

As shown in FIGS. 15 and 16, the film bonding system 1 of the present embodiment is provided as one step of the production line of the liquid crystal panel P. Each part of the film bonding system 1 is collectively controlled by the control part 2 as an electronic control device.

The film bonding system 1 of this embodiment rotates the posture of the liquid crystal panel P halfway by 90 degrees with respect to the conveyance direction of the liquid crystal panel P. The film bonding system 1 bonds the polarizing film F1 which made the polarization axis mutually orthogonal to the front and the back surface of the liquid crystal panel P to point to the direction orthogonal.

17 is a plan view of the liquid crystal panel P viewed from the thickness direction of the liquid crystal layer P3. The liquid crystal panel P includes a first substrate P1 having a rectangular shape in plan view, a second substrate P2 having a relatively small rectangular shape disposed opposite to the first substrate P1, and a first A liquid crystal layer P3 enclosed between the substrate P1 and the second substrate P2 is provided. The liquid crystal panel P has a rectangular shape that follows the outer shape of the first substrate P1 when viewed in a plan view, and an area accommodated inside the outer circumference of the liquid crystal layer P3 when viewed in a plan view is set as the display area P4. .

18 is a cross-sectional view of the optical sheet F including the optical member F1 bonded to the liquid crystal panel P.

In addition, in FIG. 18, hatching of each layer in a cross-sectional view is omitted for convenience.

As shown in Fig. 18, the optical sheet F includes a film-shaped optical member F1, an adhesive layer F2 formed on one surface (the upper surface in the drawing) of the optical member F1, and an adhesive layer ( A separator (F3) detachably laminated on one side of the optical member (F1) through F2), and a surface protection film (F4) laminated on the other side (lower surface in the drawing) of the optical member (F1). Have. The optical member F1 functions as a polarizing plate, and is bonded over the entire display region P4 of the liquid crystal panel P and the peripheral region thereof.

The optical member F1 is bonded to the liquid crystal panel P through the adhesive layer F2 in a state where the separator F3 is separated while leaving the adhesive layer F2 on one surface thereof. Hereinafter, the portion excluding the separator F3 from the optical sheet F is referred to as a bonding sheet F5.

The separator F3 protects the adhesive layer F2 and the optical member F1 until they are separated from the adhesive layer F2. The surface protection film F4 is bonded to the liquid crystal panel P together with the optical member F1. The surface protection film F4 is disposed on the side opposite to the liquid crystal panel P with respect to the optical member F1 to protect the optical member F1 and is separated from the optical member F1 at a predetermined timing.

Further, the optical sheet F may have a configuration not including the surface protective film F4, or may have a configuration in which the surface protective film F4 is not separated from the optical member F1.

The optical member F1 includes a sheet-shaped polarizer F6, a first film F7 bonded to one side of the polarizer F6 with an adhesive or the like, and an adhesive or the like on the other side of the polarizer F6. It has the 2nd film F8 to be bonded. The 1st film F7 and the 2nd film F8 are protective films which protect the polarizer F6, for example.

Further, the optical member F1 may have a single-layer structure composed of a single optical layer, or may be a laminate structure in which a plurality of optical layers are stacked on top of each other. In addition to the polarizer F6, the optical layer may have a retardation film, a brightness improving film, or the like. At least one of the first film F7 and the second film F8 may be subjected to a surface treatment in which an effect such as a hard coat treatment for protecting the outermost surface of the liquid crystal display device or an antiglare treatment including anti-glare treatment is obtained. The optical member F1 may not include at least one of the first film F7 and the second film F8. For example, when the first film F7 is omitted, the separator F3 may be bonded to one surface of the optical member F1 via the adhesive layer F2.

Next, the film bonding system 1 of this embodiment is demonstrated in detail.

15 and 16, the film bonding system 1 of this embodiment is the liquid crystal panel on the left side in a drawing from the conveyance direction upstream side (+X direction side) of the liquid crystal panel P on the right side in the drawing. A drive-type roller conveyor 3 that conveys the liquid crystal panel P in a horizontal state is provided over the downstream side of the conveyance direction (-X direction side) of P).

The roller conveyor 3 is divided into an upstream-side conveyor and a downstream-side conveyor, bordering on a reversing device (not shown). In the upstream conveyor, liquid crystal panel P is conveyed by making the long side of display area P4 follow a conveyance direction. On the other hand, in the downstream conveyor, the liquid crystal panel P is conveyed by making the short side of the display area P4 follow a conveyance direction. The bonding sheet F5 cut out from the strip-shaped optical sheet F to a predetermined length is bonded to the front and back surfaces of the liquid crystal panel P.

The film bonding system 1 of this embodiment is equipped with the 1st supply device 7, the 1st bonding device 11, the reversing device, the 2nd supply device, the 2nd bonding device, the inspection device, and the control part 2 I'm doing it. In addition, the illustration of the reversing device, the second supply device, the second bonding device, and the inspection device is omitted for convenience.

In FIG. 15, as the device configuration of the film bonding system 1, the first supply device 7 of the first supply device and the second supply device will be described. Since the second supply device has the same configuration as the first supply device 7, a detailed description thereof is omitted.

As shown in FIG. 15, the 1st supply device 7 draws out the optical sheet F from the master roll R1 which wound up the strip-shaped optical sheet F, cuts it into a predetermined size, and supplies it. The first supply device 7 includes a first conveying device 8, a pre-inspection peeling device 18, a first defect inspection device 9, a post-inspection bonding device 19, and a first cutting device 10. I have it.

The first conveying device 8 is a conveying mechanism that conveys the optical sheet F along its longitudinal direction. The 1st conveying apparatus 8 has a roll holding part 8a, a nip roller 8b, a guide roller 8c, an accumulator 8d, and a winding part 8e (refer FIG. 16).

The roll holding part 8a holds the original roll R1 which wound up the strip-shaped optical sheet F, and feeds the optical sheet F along the longitudinal direction.

The nip roller 8b sandwiches the optical sheet F so as to guide the optical sheet F unwound from the original roll R1 along a predetermined conveyance path.

The guide roller 8c changes the advancing direction of the optical sheet F being conveyed along the conveying path. At least one of the plurality of guide rollers 8c functions as a tension roller.

That is, it moves to adjust the tension of the optical sheet F being conveyed.

The accumulator 8d absorbs the feeding amount of the optical sheet F conveyed from the roll holding part 8a while the optical sheet F is cut with the first cutting device 10.

The roll holding part 8a located at the starting point of the 1st conveying device 8 and the winding part 8e located at the end point of the 1st conveying device 8 (refer FIG. 16) are driven in synchronization with each other, for example. Thereby, while the roll holding part 8a feeds out the optical sheet F in the conveyance direction, the winding part 8e winds up the separator F3 which passed the 1st bonding apparatus 11. Hereinafter, the upstream side in the conveyance direction of the optical sheet F (separator F3) in the first conveyance device 8 is referred to as a sheet conveyance upstream side, and the downstream side in the conveyance direction is referred to as a sheet conveyance downstream side.

The pre-inspection peeling device 18 is a configuration in which the first separator H1 (corresponding to the separator F3) is peeled from the optical sheet F conveyed from the upstream side of the sheet conveyance, and is wound on a roll. The peeling device 18 before inspection has a knife edge 18a and a winding part 18b.

The knife edge 18a extends at least over its entire width in the width direction of the optical sheet F. The knife edge 18a winds it up so as to make sliding contact with the 1st separator H1 side of the optical sheet F unwound from the master roll R1. The knife edge 18a wraps the optical sheet F at an acute angle on its tip. The knife edge 18a separates the bonding sheet F5 from the first separator H1 when folding the optical sheet F at an acute angle by its tip. The knife edge 18a supplies this bonding sheet F5 to the 1st defect inspection apparatus 9.

The winding part 18b winds up the 1st separator H1 which became independent via the knife edge 18a, and holds it as 1st separator roll R2.

The 1st defect inspection apparatus 9 performs defect inspection of the optical sheet F after peeling of the 1st separator H1, that is, the bonding sheet|seat F5. The first defect inspection device 9 analyzes image data captured by a CCD camera to inspect the presence or absence of a defect, and when there is a defect, calculates the position coordinates thereof. The positional coordinates of this defect are provided for skip cutting by the first cutting device 10. Moreover, the 1st defect inspection apparatus 9 is comprised by the defect inspection apparatus 102 mentioned above.

After inspection, the bonding device 19 bonds the second separator H2 (corresponding to the separator F3) to the bonding sheet F5 after the defect inspection through the adhesive layer F2. After inspection, the bonding apparatus 19 has a roll holding part 19a and a pinching roll 19b.

The roll holding part 19a holds the 2nd separator roll R3 which wound up the strip|belt-shaped 2nd separator H2, and feeds out the 2nd separator H2 along the longitudinal direction.

The pinching roll 19b is the lower surface of the bonding sheet F5 after defect inspection (the surface on the adhesive layer F2 side) by which the second separator H2 unwound from the second separator roll R3 is conveyed from the upstream side of the sheet conveyance. ). The pinching roll 19b has a pair of bonding rollers arranged in parallel with each other in the axial direction (the bonding roller above rises and falls). A predetermined gap is formed between the pair of bonding rollers, and the inside of the gap becomes a bonding position of the bonding device 19 after inspection. In the gap, the bonding sheet F5 and the second separator H2 are superimposed and introduced. These bonded sheets F5 and 2nd separator H2 are sent out to the sheet conveyance downstream side, being pinched by the pinching roll 19b. Accordingly, the second separator H2 is bonded to the lower surface of the bonding sheet F5 after defect inspection, and the optical sheet F is formed.

When the optical sheet F is fed to a predetermined length, the first cutting device 10 covers a part of the thickness direction of the optical sheet F over the entire width in the width direction orthogonal to the length direction of the optical sheet F. A half cut to be cut is performed.

The 1st cutting device 10 is so that the optical sheet F (separator F3) is not broken by the tension which acts during the conveyance of the optical sheet F (so that a predetermined thickness remains in the separator F3), The advancing and retreating position of the cutting blade is adjusted, and half-cut is performed to the vicinity of the interface between the adhesive layer F2 and the separator F3. Moreover, you may use a laser device in place of the cutting blade.

In the optical sheet F after half-cut, the optical member F1 and the surface protection film F4 are cut in the thickness direction, thereby forming a perforated line over the entire width of the optical sheet F in the width direction. The perforated lines are formed so as to line up in a plurality of strip-shaped optical sheets F in the longitudinal direction. For example, in the case of the bonding process of conveying the liquid crystal panel P of the same size, a plurality of perforations are formed at equal intervals in the longitudinal direction of the optical sheet F. The optical sheet F is divided into a plurality of divisions in the longitudinal direction by the plurality of perforations. The divisions sandwiched between a pair of perforations adjacent to each other in the longitudinal direction in the optical sheet F become one sheet piece in the bonding sheet F5, respectively.

The 1st cutting device 10 cuts into a predetermined size so as to avoid a defective part based on the position coordinate of the defect calculated by the 1st defect inspection device 9 (skip cut). The cut product including the defective part is excluded from the post process as a defective product. Further, the first cutting device 10 may continuously cut the optical sheet F into a predetermined size, ignoring the defective portion. In this case, in the bonding step of the bonding sheet F5 and the liquid crystal panel P, the cut product including the defective portion can be removed without bonding to the liquid crystal panel P.

In FIG. 16, as the device configuration of the film bonding system 1, the first bonding device 11 of the first bonding device and the second bonding device will be described. Since the 2nd bonding device has the same structure as the 1st bonding device 11, the detailed description is abbreviate|omitted.

As shown in FIG. 16, the 1st bonding apparatus 11 bonds the bonding sheet|seat F5 cut to a predetermined size with respect to the upper surface of the liquid crystal panel P introduced at the bonding position. The first bonding device 11 has a knife edge 11a and a pinching roll 11b.

The knife edge 11a supplies the bonding sheet F5 to the bonding position while winding the half-cut optical sheet F at an acute angle and separating the bonding sheet F5 from the separator F3.

The pinching roll 11b bonds the bonding sheet F5 of a predetermined length separated from the optical sheet F by the knife edge 11a to the upper surface of the liquid crystal panel P conveyed by the upstream conveyor. The pinching roll 11b has a pair of bonding rollers arranged in parallel with each other in the axial direction. A predetermined gap is formed between the pair of bonding rollers, and the inside of the gap serves as a bonding position of the first bonding device 11. In the gap, the liquid crystal panel P and the bonding sheet F5 are superimposed and introduced. These liquid crystal panel P and bonding sheet|seat F5 are sent out to the panel conveyance downstream side of the upstream conveyor, being pinched by the pinching roll 11b. Accordingly, the bonding sheet F5 is integrally bonded to the upper surface of the liquid crystal panel P. Hereinafter, the panel after this bonding is called single-sided bonding panel P11.

The winding part 8e winds up the independent 2nd separator H2 via the knife edge 11a, and holds it as 2nd separator roll R4.

The reversing device (not shown) conveys the liquid crystal panel P which is provided on the panel conveyance downstream from the 1st bonding device 11, and has reached the end position of the upstream conveyor to the start position of a downstream conveyor.

The reversing device holds the single-sided bonding panel P11, which has reached the end position of the upstream conveyor via the first bonding device 11, by adsorption, pinching, or the like. The reversing device reverses the front and back of the single-sided bonding panel P11. The reversing device changes direction so that the single-sided bonding panel P11, which was conveyed parallel to the long side of the display area P4, is conveyed parallel to the short side of the display area P4, for example.

The reversal is performed in the same case that the respective optical members F1 bonded to the front and back surfaces of the liquid crystal panel P have polarization axis directions disposed at right angles to each other.

In addition, when simply inverting the front and back of the liquid crystal panel P, for example, a reversing device having a reversing arm having a rotation axis parallel to the conveyance direction may be used. In this case, when the sheet conveying direction of the first supply device 7 and the sheet conveying direction of the second supply device are arranged at right angles to each other in plan view, the polarization axis directions are set at right angles to the front and back surfaces of the liquid crystal panel P. The optical member F1 can be bonded.

Since the second supply device has the same configuration as the first supply device 7, a detailed description thereof is omitted. The 2nd supply device pulls out the optical sheet F from the original roll which wound up the strip-shaped optical sheet F, cuts it into a predetermined size, and supplies it. Although not shown, the 2nd supply device includes a 2nd conveyance device, a peeling device before inspection, a 2nd defect inspection device, a bonding device after an inspection, and a 2nd cutting device.

The second bonding device bonds the bonding sheet F5 cut to a predetermined size with respect to the upper surface of the liquid crystal panel P introduced at the bonding position. The 2nd bonding device has the same knife edge and the clamping roll as the 1st bonding device 11.

In the gap between the pair of bonding rollers of the clamping roll (the bonding position of the second bonding device), the single-sided bonding panel P11 and the bonding sheet F5 are introduced in a superposed state, and the top surface of the single-sided bonding panel P11 The bonding sheet F5 is integrally bonded to each other. Hereinafter, the panel after this bonding is called a double-sided bonding panel (optical member bonding body).

The inspection device (not shown) is provided in the panel conveyance downstream from the 2nd bonding device. The inspection apparatus inspects the presence or absence of a defect (bonding defect, etc.) of the double-sided bonding panel. Defects to be inspected include defects such as mixing of foreign substances or air bubbles when bonding the liquid crystal panel and the bonding sheet, scratches on the surface of the bonding sheet, and poor alignment inherent in the liquid crystal panel.

In addition, in this embodiment, the control part 2 as an electronic control device which collectively controls each part of the film bonding system 1 is comprised including a computer system. This computer system includes an arithmetic processing unit such as a CPU, and a storage unit such as a memory or a hard disk. The control unit 2 of the present embodiment includes an interface capable of executing communication with an external device of the computer system. An input device capable of inputting an input signal may be connected to the control unit 2. The above-described input device includes an input device such as a keyboard and a mouse, or a communication device capable of inputting data from an external device of a computer system. The control unit 2 may include a display device such as a liquid crystal display that indicates the operation state of each unit of the film bonding system 1 or may be connected to the display device.

In the storage unit of the control unit 2, an operating system (OS) for controlling the computer system is installed. In the storage unit of the control unit 2, by controlling each unit of the film bonding system 1 to the arithmetic processing unit, a process for conveying the optical sheet F to each unit of the film bonding system 1 with good precision is performed. The program is recorded. Various types of information including programs recorded in the storage unit can be read by the calculation processing unit of the control unit 2. The control unit 2 may include a logic circuit such as an ASIC that executes various processes required for control of each unit of the film bonding system 1.

The storage unit is a concept including a semiconductor memory such as a random access memory (RAM) or a read only memory (ROM), an external storage device such as a hard disk, a CD-ROM reading device, a disk-type storage medium, or the like. The storage unit stores, functionally, a program software describing the control sequence of the operation of the first supply device 7, the first bonding device 11, the reversing device, the second supply device, the second bonding device, and the inspection device. A storage area to be performed and various other storage areas are set.

As described above, the first defect inspection apparatus 9 of the present embodiment is configured by the defect inspection apparatus 102 described above. Therefore, even when the structure of the bonding sheet F5 is different, the defect on the bonding surface side of each bonding sheet|seat F5 can be detected by the same defect inspection apparatus 102.

Therefore, according to the present embodiment, it is possible to easily switch between defect inspections on one side and the other side of the bonding sheet F5.

In the above, examples of preferred embodiments according to the present embodiment have been described with reference to the accompanying drawings, but it goes without saying that the present invention is not limited to these examples. Various shapes, combinations, and the like of each constituent member shown in the above-described examples are examples, and various changes can be made based on design requirements and the like without departing from the scope of the present invention.

1: Film bonding system (production system of optical display device)
8: 1st conveyance device (transport device)
9: first defect inspection device (defect inspection device)
11: 1st bonding device (joining device)
100: optical film manufacturing system (optical member manufacturing system)
101: Optical film manufacturing apparatus (optical member manufacturing apparatus)
102: defect inspection device 110: first supply unit
111: second supply unit 112: third supply unit
113: peeling unit 120: light source
121: first polarization filter 122: imaging device
123: second polarization filter 130: first moving device
131: second moving device 132: control device
CL: Optical axis P: Liquid crystal panel (optical display part)
F1: optical member F10: optical film (optical member)
F11: polarizer film (polarizer) F12: laminated film (laminated member)
F13: COP film (first protective layer) F14: protective film for COP film (second protective layer)
F15: TAC film (second protective layer) Sf1: upper surface (one surface of the optical member)
Sf2: lower surface (the other side of the optical member)

Claims (5)

An optical member defect inspection apparatus including a polarizer,
A light source disposed on the first side of the optical member and irradiating light to the optical member;
An imaging device disposed on the second side of the optical member to capture an image by transmitted light from the optical member;
A first polarization filter disposed on an optical path between the light source and the optical member and having a first absorption axis orthogonal to the absorption axis of the polarizer,
A second polarization filter disposed on an optical path between the imaging device and the optical member and having a second absorption axis orthogonal to the absorption axis of the polarizer;
A first moving device for moving the first polarization filter forward and backward with respect to the optical path between the light source and the optical member, and
A second moving device for moving the second polarization filter forward and backward with respect to the optical path between the imaging device and the optical member
Defect inspection device comprising a. The method according to claim 1, wherein in the first imaging mode, the first moving device performs control to move the first polarizing filter onto an optical path between the light source and the optical member, and the absorption axis of the polarizer and Control of the arrangement of the first polarization filter is performed so that the first absorption axis is orthogonal, and the second moving device moves the second polarization filter to a position shifted from the image of the optical path between the imaging device and the optical member. Control to move,
In a second imaging mode, the first moving device controls to move the first polarizing filter to a position shifted from the image of the optical path between the light source and the optical member, and the second moving device includes: Controlling to move the second polarizing filter onto the optical path between the imaging device and the optical member, and controlling the arrangement of the second polarizing filter so that the absorption axis of the polarizer and the second absorption axis are orthogonal to each other. The defect inspection device further comprising a control device. A system for manufacturing an optical member including a polarizer,
An optical member manufacturing apparatus for manufacturing the optical member,
The defect inspection device according to claim 1 or 2 for inspecting the presence or absence of a defect in the optical member
An optical member manufacturing system comprising a. The method of claim 3, wherein the optical member,
A polarizer, a first protective layer stacked on the first surface of the polarizer, and a second protective layer stacked on the second surface of the polarizer,
The optical member manufacturing apparatus,
A first supply unit for supplying the polarizer,
A second supply unit disposed on a first side of the supply path of the polarizer and supplying a lamination member including the first protective layer and a third protective layer stacked on a third surface of the first protective layer,
A third supply unit disposed on a second side of the supply path of the polarizer and supplying the second protective layer;
And a peeling unit disposed on the first side of the supply path of the polarizer and removing the third protective layer from the laminated member to form the first protective layer. As a production system for an optical display device formed by bonding an optical member to an optical display component,
A conveying device for conveying the optical member,
A bonding device for bonding the optical member conveyed by the conveying device to the optical display component to produce the optical display device,
The defect inspection device according to claim 1 or 2 for inspecting the presence or absence of a defect in the optical member conveyed from the conveying device to the bonding device.
A production system for an optical display device comprising a.

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