JP6179886B2 - Defect inspection apparatus, optical display device production system, and optical sheet manufacturing system - Google Patents

Description

The present invention relates to a defect inspection apparatus, an optical display device production system, and an optical sheet manufacturing system .

  Conventionally, as a production system for producing an optical display device such as a liquid crystal display, a production system described in Patent Document 1 is known. The optical display device is formed by bonding an optical member such as a polarizing plate to an optical display component such as a liquid crystal panel. On the upstream side of the bonding apparatus that bonds the optical display component and the optical member, a defect inspection apparatus that performs defect inspection of the optical member is provided.

  2. Description of the Related Art As an optical member defect inspection apparatus, there is known an apparatus that enters light from directly below an optical member and picks up a transmitted light image that passes through the optical member. As defects of the optical member, there are various defects such as a foreign matter defect and an uneven defect.

Japanese Patent No. 4307510

  Since the configuration of the defect inspection apparatus varies depending on the type of defect, conventionally, a plurality of defect inspection apparatuses are arranged to detect various defects. However, when a plurality of defect inspection apparatuses are arranged, there is a problem that an inspection space becomes large and the line becomes large.

The present invention has been made in view of such circumstances, and is capable of dealing with various types of defects and capable of suppressing the enlargement of a line, a defect inspection apparatus, an optical display device production system, and an optical device. It aims at providing the manufacturing system of a sheet .

In order to achieve the above object, the present invention employs the following means.
(1) That is, the defect inspection apparatus according to the first aspect of the present invention is a defect inspection apparatus for an optical member, and includes a first light source disposed on one side of the optical member and one side of the optical member. A second light source disposed on the optical member, an imaging device disposed on an optical axis of light emitted from the first light source on the other side of the optical member, and the second light source emitted from the first light source. In a first imaging mode, the first light source is turned on, and the moving device is moved between a first position on the optical axis of the light to be moved and a second position shifted from the optical axis , and The second light source is turned off, the second light source is moved to the second position by the moving device, the first light source is turned off, and the second light source is turned on in the second imaging mode. And the second light source is moved by the moving device. In the third imaging mode, the first light source is turned off, the second light source is turned on, and the second light source is moved to the second position by the moving device. And a control device that performs control .

  (2) In the defect inspection apparatus according to (1), the first light source is disposed between a light source and the light source and the optical member, and an incident angle of light incident on the optical member from the light source. And an adjustment member for adjusting the distribution.

  (3) In the defect inspection apparatus according to (2), the adjustment member may be a diaphragm member that squeezes the light from the outside of the optical axis.

( 4 ) The optical display device production system according to the first aspect of the present invention is an optical display device production system in which an optical member is bonded to an optical display component, for transporting the optical member. A bonding apparatus that bonds the optical member conveyed by the conveying apparatus to the optical display component to produce the optical display device, and the optical member that is conveyed from the conveying apparatus to the bonding apparatus. The defect inspection apparatus according to any one of (1) to ( 3 ), wherein the defect inspection apparatus inspects for the presence or absence of a defect.

( 5 ) The optical sheet manufacturing system according to the first aspect of the present invention includes an optical sheet manufacturing apparatus for manufacturing an optical sheet, and the above (1) to ( 3 ) for inspecting the optical sheet for defects. And the defect inspection apparatus according to any one of the above.

ADVANTAGE OF THE INVENTION According to this invention, the defect inspection apparatus which can respond to a various defect and can suppress the enlargement of a line, the production system of an optical display device, and the manufacturing system of an optical sheet can be provided.

It is a side view which shows the apparatus structure of the film bonding system of 1st Embodiment. It is a side view which shows the apparatus structure of a film bonding system. It is a top view of a liquid crystal panel. It is sectional drawing of a polarizing film sheet. It is a side view which shows the defect inspection apparatus of 1st Embodiment. It is a top view of the 1st light source of 1st Embodiment. It is a figure for demonstrating the defect inspection apparatus in 1st imaging mode. It is a figure for demonstrating the defect inspection apparatus in 2nd imaging mode. It is a figure for demonstrating the defect inspection apparatus in 3rd imaging mode. It is a side view which shows the defect inspection apparatus of 2nd Embodiment. It is a top view of the 1st light source of 2nd Embodiment.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings, but the present invention is not limited to the following embodiments.

  In all the drawings below, the dimensions and ratios of the respective constituent elements are appropriately changed in order to make the drawings easy to see. In the following description and drawings, the same or corresponding elements are denoted by the same reference numerals, and redundant description is omitted.

  In the following description, an XYZ orthogonal coordinate system is set as necessary, and the positional relationship of each member will be described with reference to this XYZ orthogonal coordinate system. In the present embodiment, the transport direction of the liquid crystal panel, which is an optical display component, is the X direction, and the direction orthogonal to the X direction (the width direction of the liquid crystal panel) in the plane of the liquid crystal panel is the Y direction, X direction, and Y direction The direction orthogonal to the Z direction is taken as the Z direction.

(First embodiment)
Hereinafter, the film bonding system which comprises the one part is demonstrated as a production system of the optical display device of 1st Embodiment of this invention.
FIG.1 and FIG.2 is a side view which shows the apparatus structure of the film bonding system 1 of this embodiment.
The film bonding system 1 bonds a film-shaped optical member such as a polarizing film, an antireflection film, and a light diffusion film to a panel-shaped optical display component such as a liquid crystal panel or an organic EL panel.

  In addition, in this embodiment, liquid crystal panel P is illustrated as an optical display component, and the double-sided bonding panel formed by bonding the bonding sheet | seat F5 on the front and back both surfaces of liquid crystal panel P is illustrated as an optical member bonding body. However, the present invention is not limited to this.

  As shown in FIG.1 and FIG.2, the film bonding system 1 of this embodiment is provided as one process of the manufacturing line of liquid crystal panel P. As shown in FIG. Each part of the film bonding system 1 is comprehensively controlled by the control part 2 as an electronic control apparatus.

  The film bonding system 1 of this embodiment turns 90 degrees in the middle of the attitude | position of the liquid crystal panel P with respect to the conveyance direction of the liquid crystal panel P. The film bonding system 1 bonds the polarizing film F1 on the front and back surfaces of the liquid crystal panel P so that the polarization axes are orthogonal to each other.

  FIG. 3 is a plan view of the liquid crystal panel P as viewed from the thickness direction of the liquid crystal layer P3. The liquid crystal panel P includes a first substrate P1 that has a rectangular shape in plan view, a second substrate P2 that has a relatively small rectangular shape that is disposed to face the first substrate P1, a first substrate P1, and a second substrate. And a liquid crystal layer P3 sealed between the substrate P2. The liquid crystal panel P has a rectangular shape that follows the outer shape of the first substrate P1 in a plan view, and a region that fits inside the outer periphery of the liquid crystal layer P3 in a plan view is a display region P4.

FIG. 4 is a cross-sectional view of the optical sheet F including the optical member F1 bonded to the liquid crystal panel P. In FIG. 4, hatching of each layer in the cross-sectional view is omitted for convenience.
As shown in FIG. 4, the optical sheet F includes a film-like optical member F1, an adhesive layer F2 provided on one surface (upper surface in the drawing) of the optical member F1, and the optical member F1 via the adhesive layer F2. The separator F3 is detachably stacked on one surface of the optical member F1, and the surface protective film F4 is stacked on the other surface (lower surface in the drawing) of the optical member F1. The optical member F1 functions as a polarizing plate, and is bonded over the entire display area P4 of the liquid crystal panel P and its peripheral area.

  The optical member F1 is bonded to the liquid crystal panel P via the adhesive layer F2 in a state where the separator F3 is separated while leaving the adhesive layer F2 on one surface thereof. Hereinafter, the part remove | excluding the separator F3 from the optical sheet F is called the bonding sheet | seat F5.

  The separator F3 protects the adhesive layer F2 and the optical member F1 until it is separated from the adhesive layer F2. The surface protective film F4 is bonded to the liquid crystal panel P together with the optical member F1. The surface protective film F4 is disposed on the side opposite to the liquid crystal panel P with respect to the optical member F1, protects the optical member F1, and is separated from the optical member F1 at a predetermined timing. The optical sheet F may be configured not to include the surface protective film F4, or the surface protective film F4 may be configured not to be separated from the optical member F1.

  The optical member F1 includes a sheet-like polarizer F6, a first film F7 bonded to one surface of the polarizer F6 with an adhesive or the like, and a first film F7 bonded to the other surface of the polarizer F6 with an adhesive or the like. 2 film F8. The first film F7 and the second film F8 are protective films that protect the polarizer F6, for example.

  The optical member F1 may have a single-layer structure including a single optical layer, or may have a stacked structure in which a plurality of optical layers are stacked on each other. In addition to the polarizer F6, the optical layer may be a retardation film, a brightness enhancement film, or the like. At least one of the first film F7 and the second film F8 may be subjected to a surface treatment capable of obtaining an effect such as a hard coat treatment for protecting the outermost surface of the liquid crystal display element or an antiglare treatment. The optical member F1 may not include at least one of the first film F7 and the second film F8. For example, when the first film F7 is omitted, the separator F3 may be bonded to one surface of the optical member F1 via the adhesive layer F2.

Next, the film bonding system 1 of this embodiment is demonstrated in detail.
As shown in FIG.1 and FIG.2, the film bonding system 1 of this embodiment is the conveyance direction downstream of the liquid crystal panel P of the left side in a figure from the conveyance direction upstream (+ X direction side) of the liquid crystal panel P of the right side in the figure. A driving roller conveyor 3 is provided which reaches the side (−X direction side) and conveys the liquid crystal panel P in a horizontal state.

  The roller conveyor 3 is divided into an upstream conveyor and a downstream conveyor with a reversing device (not shown) as a boundary. In the upstream conveyor, the liquid crystal panel P is transported so that the long side of the display area P4 is along the transport direction. On the other hand, on the downstream conveyor, the liquid crystal panel P is transported so that the short side of the display area P4 is along the transport direction. A bonding sheet F5 cut out to a predetermined length from the belt-shaped optical sheet F is bonded to the front and back surfaces of the liquid crystal panel P.

  The film bonding system 1 of the present embodiment includes a first supply device 7, a first bonding device 11, a reversing device, a second supply device, a second bonding device, an inspection device, and a control unit 2. In addition, about the inversion apparatus, the 2nd supply apparatus, the 2nd bonding apparatus, and the test | inspection apparatus, the illustration is abbreviate | omitted for convenience.

  In FIG. 1, the 1st supply apparatus 7 is mentioned and demonstrated as an apparatus structure of the film bonding system 1 among a 1st supply apparatus and a 2nd supply apparatus. Since the second supply device has the same configuration as that of the first supply device 7, detailed description thereof is omitted.

  As shown in FIG. 1, the 1st supply apparatus 7 draws out the optical sheet F from the original fabric roll R1 which wound the strip | belt-shaped optical sheet F, and supplies it after cut | disconnecting to predetermined size. The first supply device 7 includes a first transport device 8, a pre-inspection peeling device 18, a first defect inspection device 9, a post-inspection bonding device 19, and a first cutting device 10.

  The first transport device 8 is a transport mechanism that transports the optical sheet F along its longitudinal direction. The 1st conveying apparatus 8 has the roll holding | maintenance part 8a, the nip roller 8b, the guide roller 8c, the accumulator 8d, and the winding-up part 8e (refer FIG. 2).

  The roll holding unit 8a holds the original roll R1 around which the belt-shaped optical sheet F is wound, and feeds the optical sheet F along its longitudinal direction.

  The nip roller 8b sandwiches the optical sheet F so as to guide the optical sheet F unwound from the original roll R1 along a predetermined conveyance path.

  The guide roller 8c changes the traveling direction of the optical sheet F being conveyed along the conveyance path. At least one of the plurality of guide rollers 8c functions as a tension roller. That is, it moves to adjust the tension of the optical sheet F being conveyed.

  The accumulator 8d absorbs the feeding amount of the optical sheet F conveyed from the roll holding unit 8a while the optical sheet F is cut by the first cutting device 10.

  The roll holding unit 8a positioned at the start point of the first transport device 8 and the winding unit 8e (see FIG. 2) positioned at the end point of the first transport device 8 are driven in synchronization with each other, for example. Thereby, the winding part 8e winds up the separator F3 which passed through the 1st bonding apparatus 11, while the roll holding | maintenance part 8a pays out the optical sheet F to the conveyance direction. Hereinafter, the upstream side in the transport direction of the optical sheet F (separator F3) in the first transport device 8 is referred to as a sheet transport upstream side, and the downstream side in the transport direction is referred to as a sheet transport downstream side.

  The pre-inspection peeling device 18 has a configuration in which the first separator H1 (corresponding to the separator F3) is peeled from the optical sheet F conveyed from the upstream side of the sheet conveyance and wound on a roll. The pre-inspection peeling device 18 includes a knife edge 18a and a winding portion 18b.

  The knife edge 18a extends at least over its entire width in the width direction of the optical sheet F. The knife edge 18a is wound so as to be in sliding contact with the first separator H1 side of the optical sheet F unwound from the raw roll R1. The knife edge 18a winds the optical sheet F at an acute angle at its tip. The knife edge 18a separates the bonding sheet F5 from the first separator H1 when the optical sheet F is folded back at an acute angle at the tip portion. The knife edge 18a supplies the bonding sheet F5 to the first defect inspection apparatus 9.

  The winding unit 18b winds up the first separator H1 that has become independent through the knife edge 18a and holds it as a first separator roll R2.

  The 1st defect inspection apparatus 9 performs the defect inspection of the optical sheet F after peeling of the 1st separator H1, ie, the bonding sheet | seat F5. The first defect inspection device 9 analyzes the image data picked up by the CCD camera to inspect for the presence or absence of a defect, and if there is a defect, calculates the position coordinates. The position coordinates of this defect are provided for the skip cut by the first cutting device 10. Details of the first defect inspection apparatus 9 will be described later.

  The post-inspection bonding apparatus 19 bonds the second separator H2 (corresponding to the separator F3) to the bonding sheet F5 after the defect inspection through the adhesive layer F2. The post-inspection bonding apparatus 19 includes a roll holding unit 19a and a pinching roll 19b.

  The roll holding portion 19a holds the second separator roll R3 around which the band-shaped second separator H2 is wound and feeds the second separator H2 along the longitudinal direction thereof.

  The pinching roll 19b bonds the second separator H2 unwound from the second separator roll R3 to the lower surface (surface on the adhesive layer F2 side) of the bonding sheet F5 after defect inspection conveyed from the sheet conveying upstream side. . The pinching roll 19b has a pair of bonding rollers arranged in parallel with each other in the axial direction (the upper bonding roller moves up and down). A predetermined gap is formed between the pair of bonding rollers, and the inside of this gap is the bonding position of the post-inspection bonding apparatus 19. In the gap, the bonding sheet F5 and the second separator H2 are overlapped and introduced. The bonding sheet F5 and the bonding sheet F5 are sent out to the downstream side of the sheet conveyance while being pressed by the pressing roll 19b. Thereby, the 2nd separator H2 is bonded by the lower surface of the bonding sheet | seat F5 after a defect test | inspection, and the optical sheet F is formed.

  The first cutting device 10 performs a half cut for cutting a part in the thickness direction of the optical sheet F over the entire width in the width direction orthogonal to the longitudinal direction of the optical sheet F when the optical sheet F is fed out a predetermined length. Do.

  The first cutting device 10 adjusts the advancing / retreating position of the cutting blade so that the optical sheet F (separator F3) is not broken by the tension acting during the conveyance of the optical sheet F (so that a predetermined thickness remains in the separator F3). Then, half-cutting is performed to the vicinity of the interface between the adhesive layer F2 and the separator F3. In addition, you may use the laser apparatus replaced with a cutting blade.

  In the optical sheet F after half-cutting, the optical member F1 and the surface protection film F4 are cut in the thickness direction, whereby a cut line extending over the entire width in the width direction of the optical sheet F is formed. A plurality of cutting lines are formed so as to be arranged in the longitudinal direction of the belt-shaped optical sheet F. For example, in the case of the bonding process which conveys liquid crystal panel P of the same size, a plurality of score lines are formed at equal intervals in the longitudinal direction of optical sheet F. The optical sheet F is divided into a plurality of sections in the longitudinal direction by the plurality of cut lines. Each section sandwiched between a pair of cut lines adjacent in the longitudinal direction in the optical sheet F is a sheet piece in the bonding sheet F5.

  Based on the position coordinates of the defect calculated by the first defect inspection apparatus 9, the first cutting apparatus 10 cuts to a predetermined size so as to avoid a defective portion (skip cut). A cut product including a defective portion is excluded as a defective product in a subsequent process. Note that the first cutting apparatus 10 may continuously cut the optical sheet F into a predetermined size while ignoring the defective portion. In this case, in the bonding step between the bonding sheet F5 and the liquid crystal panel P, the cut product including the defective portion can be removed without bonding to the liquid crystal panel P.

  In FIG. 2, the 1st bonding apparatus 11 is mentioned and demonstrated as a apparatus structure of the film bonding system 1 among a 1st bonding apparatus and a 2nd bonding apparatus. Since the 2nd bonding apparatus is the structure similar to the 1st bonding apparatus 11, the detailed description is abbreviate | omitted.

  As shown in FIG. 2, the 1st bonding apparatus 11 bonds the bonding sheet | seat F5 cut into the predetermined size with respect to the upper surface of liquid crystal panel P introduced into the bonding position. The 1st bonding apparatus 11 has the knife edge 11a and the pinching roll 11b.

  The knife edge 11a supplies the bonding sheet F5 to the bonding position while winding the optical sheet F subjected to a half cut at an acute angle to separate the bonding sheet F5 from the separator F3.

  The pinching roll 11b bonds the bonding sheet F5 having a predetermined length separated from the optical sheet F by the knife edge 11a to the upper surface of the liquid crystal panel P conveyed by the upstream conveyor. The pinching roll 11b has a pair of laminating rollers that are arranged with their axial directions parallel to each other. A predetermined gap is formed between the pair of bonding rollers, and the inside of this gap is the bonding position of the first bonding apparatus 11. The liquid crystal panel P and the bonding sheet F5 are overlapped and introduced into the gap. These liquid crystal panel P and the bonding sheet | seat F5 are sent out to the panel conveyance downstream of an upstream conveyor, being pinched by the pinching roll 11b. Thereby, the bonding sheet | seat F5 is bonded integrally on the upper surface of liquid crystal panel P. FIG. Hereinafter, the panel after this bonding is called single-sided bonding panel P11.

  The winding unit 8e winds up the second separator H2 that has become independent through the knife edge 11a, and holds it as a second separator roll R4.

  The reversing device (not shown) conveys the liquid crystal panel P, which is provided downstream of the first bonding device 11 and reaches the end position of the upstream conveyor, to the start position of the downstream conveyor.

  The reversing device holds the single-sided bonding panel P11 that has reached the end position of the upstream conveyor via the first bonding device 11 by suction or clamping. The reversing device reverses the front and back of the single-sided bonding panel P11. The reversing device changes the direction so that, for example, the single-sided bonding panel P11 that has been transported in parallel with the long side of the display region P4 is transported in parallel with the short side of the display region P4.

  The inversion is performed when the optical members F1 bonded to the front and back surfaces of the liquid crystal panel P are arranged so that the directions of the polarization axes are perpendicular to each other.

  In the case of simply reversing the front and back of the liquid crystal panel P, for example, a reversing device having a reversing arm having a rotation axis parallel to the transport direction may be used. In this case, if the sheet conveying direction of the first supply device 7 and the sheet conveying direction of the second supply device are arranged so as to be perpendicular to each other in a plan view, the optical axes in which the polarization axis directions are perpendicular to each other on the front and back surfaces of the liquid crystal panel P. The member F1 can be bonded.

  Since the second supply device has the same configuration as that of the first supply device 7, detailed description thereof is omitted. The second supply device draws the optical sheet F from the raw roll around which the belt-shaped optical sheet F is wound, and supplies the optical sheet F after cutting it into a predetermined size. Although not shown, the second supply device includes a second transport device, a pre-inspection peeling device, a second defect inspection device, a post-inspection bonding device, and a second cutting device.

  A 2nd bonding apparatus bonds the bonding sheet | seat F5 cut into predetermined size with respect to the upper surface of liquid crystal panel P introduce | transduced into the bonding position. The 2nd bonding apparatus has the same knife edge as the 1st bonding apparatus 11, and a pinching roll.

  The single-sided bonding panel P11 and the bonding sheet F5 are introduced into the gap between the pair of bonding rollers of the pinching roll (the bonding position of the second bonding apparatus), and the single-sided bonding panel P11. A bonding sheet F5 is integrally bonded to the upper surface of the sheet. Hereinafter, this panel after bonding is referred to as a double-sided bonding panel (optical member bonding body).

  The inspection device (not shown) is provided on the panel transport downstream side with respect to the second bonding device. The inspection device inspects for the presence or absence of defects (such as poor bonding) on the double-sided bonded panel. Examples of defects to be inspected include defects such as bites of foreign substances and bubbles when bonding the liquid crystal panel and the bonding sheet, scratches on the surface of the bonding sheet, and alignment defects inherent in the liquid crystal panel. .

  In addition, in this embodiment, the control part 2 as an electronic control apparatus which performs overall control of each part of the film bonding system 1 is comprised including the computer system. This computer system includes an arithmetic processing unit such as a CPU and a storage unit such as a memory and a hard disk. The control unit 2 of the present embodiment includes an interface that can execute communication with an external device of the computer system. An input device that can input an input signal may be connected to the control unit 2. The input device includes an input device such as a keyboard and a mouse, or a communication device that can input data from a device external to the computer system. The control unit 2 may include a display device such as a liquid crystal display that indicates the operation status of each unit of the film bonding system 1 or may be connected to the display device.

  An operating system (OS) that controls the computer system is installed in the storage unit of the control unit 2. The storage unit of the control unit 2 includes a program for causing the arithmetic processing unit to control each unit of the film bonding system 1 to execute processing for causing each unit of the film bonding system 1 to accurately convey the optical sheet F. It is recorded. Various types of information including programs recorded in the storage unit can be read by the arithmetic processing unit of the control unit 2. The control unit 2 may include a logic circuit such as an ASIC that performs various processes required for controlling each unit of the film bonding system 1.

  The storage unit is a concept including a semiconductor memory such as a RAM (Random Access Memory) and a ROM (Read Only Memory), an external storage device such as a hard disk, a CD-ROM reader, and a disk-type storage medium. Functionally, the storage unit includes program software in which the control procedure of the operation of the first supply device 7, the first bonding device 11, the reversing device, the second supply device, the second bonding device, and the inspection device is described. A storage area to be stored and various other storage areas are set.

(Defect inspection equipment)
Next, the defect inspection apparatus of this embodiment will be described in detail.

  FIG. 5 is a side view showing the defect inspection apparatus of the present embodiment. In FIG. 5, the first defect inspection device 9 among the first defect inspection device 9 and the second defect inspection device will be described as a defect inspection device. Since the second defect inspection apparatus has the same configuration as the first defect inspection apparatus 9, detailed description thereof is omitted. In FIG. 5, the code | symbol Sf1 is the lower surface (surface of the one side of an optical member) of the bonding sheet | seat F5, and is the surface by the side of the adhesion layer F2. The code | symbol Sf2 is the upper surface (surface of the other side of an optical member) of the bonding sheet | seat F5, and is a surface by the side of the surface protection film F4.

  As shown in FIG. 5, the 1st defect inspection apparatus 9 of this embodiment is arrange | positioned at the 1st light source 20 arrange | positioned at the lower surface Sf1 side of the bonding sheet | seat F5, and the lower surface Sf1 side of the bonding sheet | seat F5. The second light source 23, the imaging device 24 disposed on the optical axis CL of the light emitted from the first light source 20 on the upper surface Sf2 side of the bonding sheet F5, and the second light source 23 on the optical axis CL. A moving device 30 that moves between a first position and a second position shifted from the optical axis CL, and a control device 31 are provided.

  The control device 31 performs overall control of each part of the first defect inspection device 9. The control device 31 can control each of the first light source 20, the second light source 23, and the moving device 30 independently.

  The first light source 20 is a light source that emits light having a relatively high directivity, and the second light source 23 is a light source that emits light having a relatively low directivity.

  The 1st light source 20 of this embodiment is provided with the light source 21 and the adjustment member 22 arrange | positioned between the light source 21 and the bonding sheet | seat F5. The adjustment member 22 adjusts the incident angle distribution of light incident on the bonding sheet F5 from the light source 20.

  In the present embodiment, a diaphragm member that restricts light emitted from the light source 21 from the outside of the optical axis CL is used as the adjustment member 22.

  The diaphragm member 22 is provided with a slit 22 h at a position overlapping the optical axis CL of the light emitted from the first light source 20.

  The center of the light emitting surface 21a of the light source 21 and the center of the light receiving surface 24a of the imaging device 24 are arranged coaxially (on the optical axis CL).

  FIG. 6 is a plan view of the first light source 20. In FIG. 6, the bonding sheet | seat F5 is illustrated for convenience.

  As shown in FIG. 6, the light source 21 constituting the first light source 20 is rectangular and has a length along the Y direction. The light exit surface 21a of the light source 21 also has a length along the Y direction. In this embodiment, the light emission surface 21a of the light source 21 has a longitudinal direction along the width direction orthogonal to the conveyance direction of the bonding sheet | seat F5. The light emission surface 21a of the light source 21 is formed across the width direction with respect to the bonding sheet F5. For example, an LED line light source can be used as the light source 21.

  Although not shown in FIG. 6, the second light source 23 also has a length along the Y direction, like the light source 21. For example, as the second light source 23, an LED line light source similar to the light source 21 can be used.

  The diaphragm member 22 is disposed so as to overlap the outer peripheral portion of the light exit surface 21 a of the light source 21. Similar to the light source 21, the diaphragm member 22 has a length along the Y direction. The slit 22h also has a length along the Y direction. The diaphragm member 22 is longer than the light source 21 in the Y direction. The slit 22h is shorter than the light exit surface 21a of the light source 21 in the Y direction.

  Thereby, only the light which permeate | transmitted the slit 22h among the lights inject | emitted from the light source 21, ie, the light along the optical axis CL, becomes a component which permeate | transmits the bonding sheet | seat F5 and selectively injects into the imaging device 24.

  Although not shown in FIG. 6, the imaging device 24 also has a longitudinal direction along the Y direction, like the first light source 20. For example, a line camera can be used as the imaging device 24.

  With such a configuration, the first defect inspection device 9 applies light to the bonding sheet F5 from the lower surface Sf1 side through the diaphragm member 22, and images the light transmitted through the bonding sheet F5 with the imaging device 24. And the presence or absence of the defect of the bonding sheet | seat F5 is test | inspected based on this imaging data.

Next, the imaging mode of the first defect inspection apparatus 9 will be described with reference to FIGS.
FIG. 7 is a diagram for explaining the first defect inspection apparatus 9 in the first imaging mode. FIG. 8 is a diagram for explaining the first defect inspection apparatus 9 in the second imaging mode. FIG. 9 is a diagram for explaining the first defect inspection apparatus 9 in the third imaging mode. 7 to 9, illustration of the moving device 30 and the control device 31 (see FIG. 5) is omitted for convenience.

  As shown in FIG. 7, in the first imaging mode, the control device 31 turns on the light source 21 (first light source 20) and turns off the second light source 23, and moves the second light source 23 by the moving device 30. Is moved to a second position Q2 that is offset from the optical axis CL.

  The second position Q2 is a position where the light emitted from the first light source 20 can be prevented from being blocked by the second light source 23, and the second light source 23 is retracted from the visual field range of the imaging device 24. Is set to If the second position Q2 is too close to the optical axis CL, part of the light emitted from the first light source 20 is blocked by the second light source 23, or the second light source 23 enters the field of view of the imaging device 24. I will. On the other hand, if the second position Q2 is too far from the optical axis CL, it takes time to move the second light source 23 to the first position on the optical axis CL, and it becomes difficult to smoothly shift to another imaging mode. . From such a viewpoint, the second position Q2 is set to a distance in the range of −200 mm to 200 mm from the optical axis CL.

  In the first imaging mode, only the light emitted from the first light source 20 selectively enters the bonding sheet F5. The imaging device 24 images the position Ps1 irradiated by the first light source 20 of the bonding sheet F5. The imaging device 24 captures a transmitted light image of light emitted from the first light source 20 and transmitted straight through the bonding sheet F5.

  Thus, by setting it as 1st imaging mode, the slit permeation | transmission test | inspection for detecting the defect (for example, uneven | corrugated defect) of the bonding sheet | seat F5 can be performed.

  As shown in FIG. 8, the control device 31 turns off the light source 21 (first light source 20) and turns on the second light source 23 in the second imaging mode, and turns on the second light source 23 by the moving device 30. Is moved to the first position Q1 on the optical axis CL.

  In the second imaging mode, only the light emitted from the second light source 23 selectively enters the bonding sheet F5. The imaging device 24 images the position Ps2 irradiated by the second light source 23 of the bonding sheet F5. The imaging device 24 captures a transmitted light image of light emitted from the second light source 23 and transmitted straight through the bonding sheet F5.

  Thus, by setting it as the 2nd imaging mode, the regular transmission test | inspection for detecting the defect (for example, foreign material defect) of the bonding sheet | seat F5 can be performed.

  As shown in FIG. 9, the control device 31 turns off the light source 21 (first light source 20) and turns on the second light source 23 in the third imaging mode, and turns on the second light source 23 by the moving device 30. Is moved to a second position Q2 that is offset from the optical axis CL.

  In the third imaging mode, only the light emitted from the second light source 23 selectively enters the bonding sheet F5. The imaging device 24 images the position Ps2 irradiated by the second light source 23 of the bonding sheet F5. The imaging device 24 captures a scattered light image of light emitted from the second light source 23 and obliquely transmitted through the bonding sheet F5.

  Based on the imaging result of the imaging device 24, the first defect inspection device 9 detects the distribution of transmittance in a plane parallel to the upper surface Sf2 of the bonding sheet F5 when viewed from the direction along the optical axis CL. A portion having a high transmittance is detected as a defective portion. If the bonding sheet F <b> 5 has an uneven defect (for example, a bubble), the light emitted from the second light source 23 is scattered by the uneven defect, and a part L <b> 2 of the scattered light enters the imaging device 24. On the other hand, when there is no concavo-convex defect, since the scattered light is not generated, the captured image of the imaging device 24 becomes dark. Therefore, the presence / absence of a defect can be detected by detecting the transmittance distribution when viewed from the direction along the optical axis CL.

  An arrangement angle θ of the second light source 23 with respect to the optical axis CL (an angle formed by the optical axis CL of the first light source 20 and the optical axis CL2 of the second light source 23) is an angle at which the imaging device 24 can sufficiently receive the scattered light L2. Is set to When the image pickup device 24 picks up the scattered light L2, it is preferably arranged in the dark field from the viewpoint of increasing the contrast. If the arrangement angle θ is too small, the light L1 that travels along the optical axis CL2 of the second light source 23 and the scattered light L2 out of the light transmitted through the bonding sheet F5 will be mixed, resulting in a small contrast and scattering. The light L2 cannot be detected with high accuracy. On the other hand, if the arrangement angle θ is too large, it becomes difficult for scattered light to enter the imaging device 24. From such a viewpoint, the arrangement angle θ is set to an angle in the range of −3.5 ° to 3.5 °. The arrangement angle θ is more preferably set to an angle in the range of −1.5 ° to 1.5 °.

  Thus, by setting it as 3rd imaging mode, the scattering transmission test | inspection for detecting the defect (for example, uneven | corrugated defect) of the bonding sheet | seat F5 can be performed.

  According to the third imaging mode, the imaging device 24 is arranged on the optical axis CL of the first light source 20 and images the position Ps2 irradiated with the light of the bonding sheet F5 from the vertical direction. The light emitted from the light does not enter the imaging device 24 directly. As a result, the scattered light generated by the concavo-convex defect can be selectively imaged, so that the defect can be detected with high accuracy.

  In each imaging mode, the first light source 20 (the light source 21 and the diaphragm member 22) and the imaging device 24 are fixed at fixed positions.

  As described above, the first defect inspection apparatus 9 of the present embodiment can freely select the first imaging mode, the second imaging mode, and the third imaging mode under the control of the control device 31. . Therefore, even if the types of defects such as foreign matter defects and uneven defects are different, various defects can be detected by the same first defect inspection apparatus 9. Therefore, the inspection space by the first defect inspection device 9 can be made smaller than the inspection space when a plurality of defect inspection devices are arranged. Therefore, according to the present embodiment, it is possible to deal with various defects and suppress an increase in the size of the line.

  Moreover, since the aperture | diaphragm | squeeze member 22 is provided between the light source 21 and the bonding sheet | seat F5, the directivity of the light which injects into the bonding sheet | seat F5 can be improved. Therefore, a defect can be detected with high accuracy.

  In each imaging mode, since the diaphragm member 22 is fixed at a fixed position, the directivity of light emitted from the light source 21 can be easily adjusted as compared with the structure in which the diaphragm member is moved.

(Second Embodiment)
FIG. 10 is a side view showing the defect inspection apparatus according to the second embodiment of the present invention corresponding to FIG. In FIG. 10, the first defect inspection device 109 will be described as the defect inspection device among the first defect inspection device and the second defect inspection device. Since the second defect inspection apparatus has the same configuration as the first defect inspection apparatus 109, detailed description thereof is omitted. In FIG. 10, code | symbol Sf1 is the lower surface (surface of the one side of an optical member) of the bonding sheet | seat F5, and is the surface by the side of the adhesion layer F2. The code | symbol Sf2 is the upper surface (surface of the other side of an optical member) of the bonding sheet | seat F5, and is a surface by the side of the surface protection film F4.

  As shown in FIG. 10, the first defect inspection apparatus 109 according to the present embodiment uses a light shielding plate that shields light emitted from the light source 21 from one side of the optical axis CL as the adjustment member 25 instead of the diaphragm member. This is different from the first embodiment. In FIG. 10, the same components as those in FIG. 5 are denoted by the same reference numerals, and detailed description thereof is omitted.

  FIG. 11 is a plan view of the first light source 120 corresponding to FIG. In FIG. 11, the bonding sheet | seat F5 is illustrated for convenience. In FIG. 11, the same components as those in FIG. 6 are denoted by the same reference numerals, and detailed description thereof is omitted.

  As shown in FIG. 11, the light shielding plate 25 is disposed so as to overlap substantially half of the light exit surface 21 a of the light source 21 that constitutes the first light source 120 (the + X direction side portion of the light source 21). Similarly to the light source 21, the light shielding plate 25 also has a length along the Y direction. The light shielding plate 25 is longer than the light source 21 in the Y direction.

  Thereby, light emitted from the light source 21 toward the + X direction side of the optical axis CL is shielded by the light shielding plate 25. On the other hand, light emitted from the light source 21 to the −X direction side from the optical axis CL is not incident on the imaging device 24. Therefore, only the light along the optical axis CL out of the light emitted from the light source 21 is a component that passes through the bonding sheet F5 and selectively enters the imaging device 24.

  With such a configuration, the first defect inspection device 109 applies light to the bonding sheet F5 from the lower surface Sf1 through the light shielding plate 25, and images the light transmitted through the bonding sheet F5 with the imaging device 24. And the presence or absence of the defect of the bonding sheet | seat F5 is test | inspected based on this imaging data.

  According to this embodiment, since the light shielding plate 25 is provided between the light source 21 and the bonding sheet F5, the directivity of light incident on the bonding sheet F5 can be increased. Therefore, a defect can be detected with high accuracy.

  In the above embodiment, as an example, the first light source has been described with the configuration including the light source and the adjustment member. However, the present invention is not limited to this. For example, the first light source may include a light source having a higher directivity than the second light source without including the adjustment member. As the first light source, various configurations can be adopted as long as the configuration has higher directivity than the second light source.

  Moreover, although the said embodiment gave and demonstrated the example which applied the defect inspection apparatus to the film bonding system which comprises a part as a production system of an optical display device, it is not restricted to this. For example, the defect inspection apparatus can be applied to a single process of manufacturing an optical sheet by an optical sheet manufacturing system. An optical sheet manufacturing system includes an optical sheet manufacturing apparatus that manufactures an optical sheet, and the defect inspection apparatus that inspects the presence or absence of defects in the optical sheet. For example, the optical sheet manufacturing apparatus is an apparatus for manufacturing a strip-shaped optical sheet F wound around the raw roll R1 shown in FIG.

  In addition, the defect inspection method used in the optical sheet manufacturing system can also be applied to a single line for performing inspection by a rewinder (automatic winder). In the defect inspection method, the first light source and the second light source are arranged on one side of the optical sheet, the imaging device is arranged on the optical axis of the light emitted from the first light source on the other side of the optical sheet, and the second The light source is moved between a first position on the optical axis of light emitted from the first light source and a second position shifted from the optical axis.

  As mentioned above, although the suitable embodiment example which concerns on this embodiment was demonstrated referring an accompanying drawing, it cannot be overemphasized that this invention is not limited to the example which concerns. Various shapes, combinations, and the like of the constituent members shown in the above-described examples are examples, and various modifications can be made based on design requirements and the like without departing from the gist of the present invention.

DESCRIPTION OF SYMBOLS 1 ... Film bonding system (production system of an optical display device), 8 ... 1st conveying apparatus (conveying apparatus), 9,109 ... 1st defect inspection apparatus (defect inspection apparatus), 11 ... 1st bonding apparatus (bonding) 21) light source, 22 ... diaphragm member (adjustment member), 23 ... second light source, 24 ... imaging device, 25 ... light shielding plate (adjustment member), 30 ... moving device, 31 ... control device, CL ... light Axis, P ... liquid crystal panel (optical display component), F1 ... optical member, Sf1 ... lower surface (surface on one side of optical member), Sf2 ... upper surface (surface on the other side of optical member)

Claims (5)

An optical member defect inspection apparatus,
A first light source disposed on one side of the optical member;
A second light source disposed on one side of the optical member;
An imaging device disposed on an optical axis of light emitted from the first light source on the other side of the optical member;
A moving device for moving the second light source between a first position on the optical axis of light emitted from the first light source and a second position shifted from the optical axis;
In the first imaging mode, the first light source is turned on and the second light source is turned off, and the second light source is moved to the second position by the moving device,
In the second imaging mode, the first light source is turned off and the second light source is turned on, and the second light source is moved to the first position by the moving device,
In a third imaging mode, a control device that turns off the first light source and turns on the second light source, and controls the moving device to move the second light source to the second position;
Including defect inspection equipment. The first light source is
A light source;
An adjusting member that is disposed between the light source and the optical member and adjusts an incident angle distribution of light incident on the optical member from the light source;
The defect inspection apparatus of Claim 1 containing.   The defect inspection apparatus according to claim 2, wherein the adjustment member is a diaphragm member that squeezes the light from the outside of the optical axis. An optical display device production system in which an optical member is bonded to an optical display component,
A transport device for transporting the optical member;
A bonding apparatus for manufacturing the optical display device by bonding the optical member conveyed by the conveyance apparatus to the optical display component;
The defect inspection apparatus according to any one of claims 1 to 3, wherein the presence or absence of a defect in the optical member conveyed from the conveyance apparatus to the bonding apparatus is inspected.
Optical display device production system including. An optical sheet manufacturing apparatus for manufacturing an optical sheet;
The defect inspection apparatus according to any one of claims 1 to 3, wherein the optical sheet is inspected for defects.
An optical sheet manufacturing system including:

Images