KR20160046811A - Defect inspection device, optical member manufacturing system, and optical display device production system - Google Patents

Abstract

An apparatus for inspecting defects of an optical member including a polarizer is provided with a light source, an image pickup device for picking up an image by the transmitted light from the optical member, and a second polarizing beam splitter arranged on the optical path between the light source and the optical member, A first polarizing filter disposed on an optical path between the imaging device and the optical member and having a second absorption axis; a first moving device moving the first polarizing filter forward and backward toward the optical path between the light source and the optical member; And a second moving device for moving the second polarizing filter toward and away from the optical path between the imaging device and the optical member.

Description

TECHNICAL FIELD [0001] The present invention relates to a defect inspection apparatus, an optical member manufacturing system, and a production system of an optical display apparatus,

The present invention relates to a defect inspection apparatus, a manufacturing system of an optical member, and a production system of an optical display apparatus.

The present application claims priority based on Japanese Patent Application No. 2013-172344, filed on August 22, 2013, the content of which is incorporated herein by reference.

As a defect inspection apparatus for an optical member including a polarizer, a defect inspection apparatus disclosed in Patent Document 1 is known. The defect inspection apparatus of Patent Document 1 is provided with a light source disposed on one side of an optical member, an imaging device disposed on the other side of the optical member, and a defect inspection device disposed on the optical path between the imaging device and the optical member, And a polarizing filter having an absorption axis.

The defect inspection apparatus is provided in a production line of an optical member or a transfer line that conveys an optical member toward a bonding object such as a liquid crystal panel. For example, in a manufacturing line of an optical member, a protective film serving as a protective layer is bonded to both surfaces of a polarizer, and a polarizer to which the protective film is bonded is wound in a roll shape to produce a disk roll of optical members. The defect inspection apparatus is provided on a conveyance line of a laminated film in which a protective film is laminated on one side or both sides of a polarizer, and checks for the presence of a foreign matter defect between the polarizer and the protective film.

In the defect inspection apparatus, normally, the presence or absence of defects on the bonding surface side (surface side bonded to the bonding target such as the liquid crystal panel) of the optical member is inspected. Therefore, the polarizing filter is provided on the bonding surface side of the optical member.

For example, in the defect inspection apparatus of Patent Document 1, a light source is provided below the transfer line of the optical member, and a polarization filter and an image pickup device are provided above the transfer line.

When foreign matter exists between the polarizer and the protective film on the upper surface side (bonding surface side), the light irradiated from the light source is converted into linearly polarized light by the polarizer, and a part of the light is scattered by the foreign matter. Since a part of the scattered light is disturbed in the polarization state, it is transmitted through the polarizing filter and is detected as a bright point by the image pickup device.

On the other hand, when foreign matter exists between the polarizer and the protective film on the lower surface side thereof (opposite side to the bonding surface), the light irradiated from the light source is scattered by the foreign object and then enters the polarizer and is converted into linearly polarized light. This linearly polarized light does not transmit the polarized light filter unless a defect such as a foreign matter disturbing the polarization state exists between the polarizer and the polarizing filter. Therefore, in the image pickup apparatus, darkness is maintained, and defects are not detected.

By providing the polarizing filter on the bonding surface side of the optical member in this manner, it is possible to selectively inspect only defects on the bonding surface side of the optical member.

Patent Document 1: Japanese Patent Application Laid-Open No. 2007-212442

It is predetermined whether the upper surface and the lower surface of the optical member are to be joined to each other. The arrangement of the light source, the image pickup device, and the polarizing filter of the defect inspection apparatus is also fixed accordingly. Normally, as in Patent Document 1, the upper surface of the optical member is a junction surface, and the polarization filter is also provided on the upper side of the optical member.

Here, examples of the optical member including the polarizer include a polarizing plate (TAC / PVA / TAC) in which triacetyl cellulose (TAC: triacetyl cellulose) is laminated on both sides of a polarizer made of polyvinyl alcohol ) Is known. Recently, diversification of polarizing plates is progressing, and a polarizing plate in which one of TACs laminated on both surfaces of a polarizer is replaced with another film has been proposed.

It has been found by the inventors of the present invention that such a polarizing plate is different in terms of warpage and the like of the final product depending on whether the TAC side is a bonding surface or the other film side is a bonding surface.

Therefore, when defect inspection of such a polarizing plate is performed using the defect inspection apparatus described above, one of TAC and other films preferably is bonded to the upper surface side of the polarizer. However, due to the configuration of the production line of the optical member, the position of the transfer line of the other film is determined to be either the upper side or the lower side of the transfer line of the polarizer, and the intended defect inspection may not be performed.

For example, when the other film is a film which easily causes scratches on the surface, a protective film may be laminated on the surface of another film, and the protective film may be peeled off from the other film when the polarizer and another film are bonded. In this case, a peeling mechanism such as a knife edge is provided immediately before the polarizer and another film are bonded, and the protective film is peeled from the other film, and another film after peeling is bonded to the polarizer.

However, due to the construction of the production line, the installation space of the peeling mechanism may be formed only on either the upper side or the lower side of the conveyance line of the polarizer. In this case, the position of the transfer line of the other film is also limited to either the upper side or the lower side of the transfer line of the polarizer. If the other film transfer line is confined to the upper side of the transfer line of the polarizer and the other film is bonded to the opposite side of the bonding surface side of the optical member, in the defect inspection apparatus described above, It is impossible to perform defect inspection of the defect.

Therefore, it is conceivable to replace the positions of the light source, the image pickup device, and the polarizing filter in accordance with the configuration of the optical member. However, in this case, a considerable change of the apparatus configuration is required, and a large amount of time is also required for replacement of the apparatus. Further, it is necessary to prepare a defect inspection apparatus separately for each structure of the optical member, which is not realistic. In this background, there has been a demand for a defect inspection apparatus capable of easily switching defect inspection on one surface side and the other surface side of the optical member, depending on the configuration of the optical member.

An aspect of the present invention is to provide a defect inspection apparatus and a production system of an optical display device which can easily switch defect inspection on one surface side and the other surface side of an optical member.

Aspects of the present invention employ the following means.

(1) A defect inspection apparatus according to an aspect of the present invention is a defect inspection apparatus for an optical member including a polarizer, comprising: a light source arranged on a first side of the optical member for irradiating light to the optical member; An imaging device disposed on a second side of the member and configured to capture an image of transmitted light from the optical member; and a second absorbing member disposed on an optical path between the light source and the optical member, A second polarizing filter disposed on an optical path between the imaging device and the optical member and having a second absorption axis orthogonal to an absorption axis of the polarizer; And a second moving device moving the second polarizing filter forward and backward with respect to the optical path between the imaging device and the optical member, 2 mobile device.

(2) In the mode (1), in the first imaging mode, the first moving device performs control to move the first polarizing filter to the optical path between the light source and the optical member , The second moving device controls the arrangement of the first polarizing filter so that the absorption axis of the polarizer and the first absorption axis are orthogonal to each other, and the second moving device controls the arrangement of the second polarizing filter between the imaging device and the optical member In the second imaging mode, the first moving device moves the first polarizing filter to a position displaced from the optical path between the light source and the optical member And the second moving device performs control so as to move the second polarizing filter to the optical path between the imaging device and the optical member, And a control device for controlling the arrangement of the second polarizing filter such that the absorption axis of the polarizer and the second absorption axis are orthogonal to each other.

(3) An optical member manufacturing system according to an aspect of the present invention is an optical member manufacturing system including a polarizer, comprising: an optical member manufacturing apparatus for manufacturing the optical member; And a defect inspection apparatus according to the above (1) or (2).

(4) In the embodiment (3), the optical member may include a polarizer, a first protective layer laminated on the first surface of the polarizer, and a second protective layer laminated on the second surface of the polarizer Wherein the optical member manufacturing apparatus comprises a first supply unit for supplying the polarizer, a second supply unit disposed on a first side of the supply path of the polarizer, the first protective layer, and the third surface of the first protective layer A third supply part arranged on a second side of the supply path of the polarizer and supplying the second protective layer; and a third supply part provided on the second side of the polarizer, And a peeling portion which is disposed on the first side of the supply path and which peels off the third protective layer from the lamination member to serve as the first protective layer.

(5) A production system of an optical display device according to an aspect of the present invention is a production system of an optical display device formed by bonding an optical member to an optical display component, the production system comprising: a transporting device for transporting the optical member; (1) or (2) for checking whether or not a defect is present in the optical member conveyed from the conveyance device to the optical device, And a defect inspection apparatus according to (2).

According to the aspect of the present invention, it is possible to provide a defect inspection apparatus, a manufacturing system of optical members, and a production system of optical display apparatus, which can easily switch defect inspection on one surface side and the other surface side of an optical member.

1 is a side view showing a manufacturing system of an optical film according to an embodiment of the present invention.
2 is a side view of a defect inspection apparatus according to an embodiment of the present invention.
Fig. 3 is a diagram for explaining the arrangement relationship of the first absorption axis of the first polarizing filter (the second absorption axis of the second polarizing filter) and the absorption axis of the polarizing film. Fig.
4 is a diagram for explaining a principle of defect inspection by the defect inspection apparatus.
5 is a diagram for explaining the principle of inspection of defects by the defect inspection apparatus.
6 is a plan view of a defect inspection apparatus according to an embodiment of the present invention.
7 is a view showing an example of bonding of a polarizing plate (TAC / PVA / TAC) to a liquid crystal panel.
8 is a view showing an example of bonding of a polarizing plate (COP / PVA / TAC) to a liquid crystal panel.
9 is a view for explaining a defect inspection apparatus in a first imaging mode of a polarizing plate (TAC / PVA / TAC).
10 is a view showing an example of bonding of a polarizing plate to a liquid crystal panel in a first imaging mode of a polarizing plate (TAC / PVA / TAC).
11 is a view for explaining a defect inspection apparatus in a first imaging mode of a polarizing plate (COP / PVA / TAC).
12 is a diagram showing an example of bonding of a polarizing plate to a liquid crystal panel in a first imaging mode of a polarizing plate (TAC / PVA / COP).
13 is a diagram for explaining a defect inspection apparatus in the second imaging mode.
14 is a view showing an example of bonding of the polarizing plate to the liquid crystal panel in the second imaging mode.
15 is a side view showing the configuration of a film bonding system according to an embodiment of the present invention.
16 is a side view showing the configuration of a film bonding system according to an embodiment of the present invention.
17 is a plan view of the liquid crystal panel.
18 is a sectional view of the polarizing film sheet.

Hereinafter, embodiments of the present invention will be described with reference to the drawings, but the present invention is not limited to the following embodiments.

In all of the following drawings, dimensions, ratios, and the like of the respective components are appropriately made different for easy viewing of the drawings. In the following description and drawings, the same or equivalent elements are denoted by the same reference numerals, and redundant description is omitted.

(Manufacturing System of Optical Member)

1 is a side view showing an example of a manufacturing system 100 of an optical film which is a manufacturing system of an optical member according to an embodiment of the present invention. Hereinafter, an example of producing a polarizing film as an optical film will be described. However, if the optical film includes at least a polarizer film, a plurality of optical elements such as a retardation film and a brightness enhancement film may be laminated in addition to the polarizing film.

In the following description, the XYZ orthogonal coordinate system is set as necessary, and the positional relationship of the respective members is described with reference to this XYZ orthogonal coordinate system. In the present embodiment, the direction in which the elongated optical film is transported is the X direction, and the direction orthogonal to the X direction (width direction of the elongated optical film) in the plane of the optical film is defined as Y direction, And the direction orthogonal to the Z direction.

1, the optical film production system 100 includes an optical film production apparatus 101 (an optical member production apparatus) for producing an optical film F10, And a defect inspection apparatus 102 for checking presence or absence of the defect.

The optical film F10 (optical member) used in the present embodiment is a polarizing film F11 (polarizer) made of PVA (polyvinyl alcohol) or the like and a COP (cycloolefin polymer) film (F13 ) (First protective layer) and a TAC (triacetylcellulose) film F15 (second protective layer). In the polarizing film F11, the side on which the COP film F13 is laminated may be referred to as the first side. In the polarizer film F11, the side on which the TAC film F15 is laminated may be referred to as the second side.

As the protective film, besides the TAC film or the COP film, a PET (polyethylene terephthalate) film, an MMA (methyl methacrylate) film, or the like can be used.

The optical film production apparatus 101 includes a first feeding section 110 for feeding a polarizer film F11 and a laminated film having a COF film F13 and a COF film protective film F14 A third supply part 112 for supplying the TAC film F15 and a COF film protective film F14 are peeled from the laminated film F12 to form a COP film A film peeling unit 113 for producing a single optical film F10 by laminating three films of a polarizer film F11, a COP film F13 and a TAC film F15 And a winding part 115 for winding the optical film F10.

The first feeding section 110 holds the disk roll R11 on which the strip-shaped polarizer film F11 is wound and simultaneously feeds the polarizer film F11 along the longitudinal direction thereof.

The second supply part 111 holds the disk roll R12 on which the belt-like laminated film F12 is wound and simultaneously conveys the laminated film F12 along the longitudinal direction thereof. The second supply portion 111 is disposed on one side (the + Z direction side shown in Fig. 1) of the supply path of the polarizer film F11. 1, which is one side of the supply path of the polarizer film F11, may be regarded as the first side of the supply path of the polarizer film F11.

The third supply unit 112 holds the disc roll R15 on which the strip-shaped TAC film F15 is wound and simultaneously extends the TAC film F15 along its longitudinal direction. The third supply portion 112 is disposed on the other side of the supply path of the polarizer film F11 (on the -Z direction side shown in Fig. 1). The -Z direction side shown in Fig. 1, which is the other side of the supply path of the polarizer film F11, may be referred to as the second side of the supply path of the polarizer film F11.

The peeling section 113 has a structure in which the COF film protective film F14 is peeled from the laminated film F12 fed out from the second feeding section 111 and wound around a roll. The peeling section 113 has a knife edge 113a and a winding section 113b.

The COF film protective film F14 is laminated on one surface of the COP film F13 (on the bonding surface to be bonded to the polarizer film F11). This can prevent scratches on the surface of the protective film for COP film F14 (the bonding surface to be bonded to the polarizer film F11). Further, as described above, one side of the COP film F13 on which the protective film for COP film F14 is laminated may be referred to as the third side.

The knife edge 113a extends at least over its entire width in the width direction of the laminated film F12. The knife edge 113a is wrapped around the protective film F14 for the COP film of the laminated film F12 wound from the disk roll R12 so as to be in sliding contact with the protective film F14. The knife edge 113a is wrapped around the laminated film F12 at an acute angle at its tip end. The knife edge 113a separates the COP film F13 from the COF film protective film F14 when the laminated film F12 is folded at an acute angle by the tip end thereof. The knife edge 113a feeds the COP film F13 to the film stacking apparatus 114. [

The winding portion 113b winds the protective film F14 for a COP film that has been made singly through the knife edge 113a and holds it as a peeling roll R14.

The peeling section 113 is disposed between the first supply section 110 and the second supply section 111 on one side (the + Z direction side in FIG. 1) of the supply path of the polarizer film F11.

The arrangement of the second supply portion 111, the third supply portion 112, and the peeling portion 113 is not limited to this. For example, both the second supply part 111 and the peeling part 113 are disposed on the other side (the -Z direction side shown in FIG. 1) of the supply path of the polarizer film F11 and the third supply part 112, (The + Z direction side shown in Fig. 1) of the supply path of the polarizer film F11.

In the film stacking apparatus 114, a pair of rollers 114a and 114b are provided on the upper and lower sides. A polarizer film F11, a COP film F13 and a TAC film F15 are superposed and supplied between the rollers 114a and 114b. The polarizer film F11, the COP film F13 and the TAC film F15 are bonded together by being pressed by the rollers 114a and 114b to produce one optical film F10. Further, a peeling film or a protective film may be further laminated on the surfaces of the COP film F13 and the TAC film F15. The optical film F is transported toward the defect inspection apparatus 102 by a transport roller (not shown).

The defect inspection apparatus 102 includes a light source 120 disposed on the upper side (the + Z direction side shown in FIG. 1) of the optical film F10 and a lower side (on the -Z direction side shown in FIG. 1 A first polarizing filter 121 disposed on the optical path between the light source 120 and the optical film F10 and a second polarizing filter 121 disposed on the optical path between the imaging device 122 and the optical film F10. And a second polarizing filter 123 disposed on the optical path. Details of the defect inspection apparatus 102 will be described later. The + Z direction side in FIG. 1 in which the light source 120 as described above is disposed may be the first side of the optical film F10. Further, the -Z direction side shown in Fig. 1 in which the image pickup device 122 as described above is disposed may be referred to as the second side of the optical film F10.

The defect data of the optical film F10 detected by the defect inspection apparatus 102 is related to the position of the optical film F10 in the longitudinal direction and the width direction of the optical film F10, . The optical film F10 inspected by the defect inspection apparatus 102 is conveyed toward the winding unit 115. [ Then, in the winding portion 115, a roll of the optical film F10 is wound in a roll shape to produce a disk roll R10.

(Defect inspection apparatus)

2 is a side view of a defect inspection apparatus 102 according to an embodiment of the present invention.

2, reference symbol Sf1 denotes an upper surface (one surface of the optical member) of the optical film F10 and a surface on the COP film F13 side. Symbol Sf2 is the lower surface (the other surface of the optical member) of the optical film F10 and the surface on the TAC film F15 side.

2, the defect inspection apparatus 102 of the present embodiment includes a light source 120 disposed on the upper surface Sf1 side of the optical film F10 and a light source 120 disposed on the lower surface Sf2 side of the optical film F10 A first polarizing filter 121 disposed on the optical path between the light source 120 and the optical film F10 and a second polarizing filter 121 disposed on the optical path between the optical device F10 and the imaging device 122. [ A first moving device 130 for moving the first polarizing filter 121 back and forth toward the optical path between the light source 120 and the optical film F10, A second moving device 131 for moving the polarizing filter 123 back and forth toward the optical path between the image pickup device 122 and the optical film F10 and a control device 132. [ In other words, the first moving device 130 can move the first polarizing filter 121 forward and backward with respect to the optical path between the light source 120 and the optical film F10, and the second moving device 131, It is possible to move the second polarizing filter 123 back and forth with respect to the optical path between the image pickup device 122 and the optical film F10.

The control device 132 controls the advancing / retreating movement of the first polarizing filter 121 and the second polarizing filter 123, respectively. The control device 132 can independently control the first mobile device 130 and the second mobile device 131, respectively.

The center of the light emitting surface 120a of the light source 120 and the center of the light receiving surface 122a of the image pickup device 122 are disposed on the same axis (on the optical axis CL).

3 shows the arrangement of the first absorption axis V1 of the first polarizing filter 121 (the second absorption axis V2 of the second polarizing filter 123) and the absorption axis V0 of the polarizing film F11 Fig.

As shown in Fig. 3, the first polarizing filter 121 has a first absorption axis V1 perpendicular to the absorption axis V0 of the polarizer film F11. The first polarizing filter 121 is disposed between the first absorption axis V1 of the first polarizing filter 121 and the absorption axis V0 of the polarizing film F11 on the optical path between the light source 120 and the optical film F10. Are disposed orthogonally to each other (Cross-Nicoll arrangement).

When the first absorption axis V1 of the first polarizing filter 121 and the absorption axis V0 of the polarizing film F11 are arranged in a crossed Nicols arrangement, the overlapping portion of the first polarizing filter 121 and the polarizing film F11 SV1 does not transmit light. Therefore, if the image pickup device 122 picks up the overlapping portion SV1, it is not arranged to disturb the polarization state such as a defect having a phase difference between the first polarizing filter 121 and the polarizing film F11 Han, it looks like a nightmare.

The second polarizing filter 123 has a second absorption axis V2 orthogonal to the absorption axis V0 of the polarizer film F11. The second polarizing filter 123 is disposed on the optical axis between the second absorption axis V2 of the second polarizing filter 123 and the absorption axis of the polarizing film F11 on the optical path between the image pickup device 122 and the optical film F10 V0) are arranged orthogonally to each other (cross-Nicoll arrangement).

Even if the second absorption axis V2 of the second polarizing filter 123 and the absorption axis V0 of the polarizing film F11 are arranged in a crossed Nicols arrangement, the overlapping portion of the second polarizing filter 123 and the polarizing film F11 SV2 do not transmit light. Therefore, even if the overlapping portion SV2 is picked up by the image pickup device 122, it is not arranged to disturb the polarization state such as a defect having a phase difference between the second polarizing filter 123 and the polarizing film F11 Han, it looks like a nightmare.

Figs. 4 and 5 are diagrams for explaining the principle of inspection of the defect E1 by the defect inspection apparatus 102. Fig. Fig. 4 is a view showing the case where the defect E1 is present in the COP film F13. Fig. 5 is a view showing a case in which no defect is present in the COP film F13, but a defect E2 is present in the TAC film F15. 4 and 5, the second polarizing filter 123, the first moving device 130, the second moving device 131, and the control device 132 are not shown for the sake of convenience.

4, the light L1 emitted from the light source 120 toward the optical film F10 becomes linearly polarized light L2 by the first polarizing filter 121. As shown in Fig. The linearly polarized light L2 obtained by the first polarizing filter 121 is incident on the COP film F13. Then, the polarized state of the linearly polarized light L2 is disturbed by the defect E1 existing in the COP film F13, and a part (light L3) of the polarized light is transmitted through the polarizer film F11. As a result, the light L3 transmitted through the polarizer film F11 is incident on the imaging device 122, and the imaging device 122 picks up the defect E1 brightly as a bright spot.

5, the light L1 emitted from the light source 120 toward the optical film F10 is linearly polarized light L2 by the first polarizing filter 121. As shown in Fig. The linearly polarized light L2 obtained by the first polarizing filter 121 is incident on the COP film F13. Then, since there is no defect in the COP film F13, the linearly polarized light L2 can not pass through the polarizer film F11. As a result, light is not incident on the image pickup device 122, so the image pickup device 122 picks up a black image. In this case, the defect E2 present in the TAC film F15 is not seen.

By detecting the presence of the bright spot in this way, it is possible to determine the presence or absence of the defect E1 of the COP film F13. For example, when a bright spot is picked up by the image pickup device 122, the COP film F13 is judged to be "defective". On the other hand, when a black image is picked up by the image pickup device 122 (when no image is picked up), the COP film F13 is judged as "no defect".

6 is a plan view of the defect inspection apparatus 102. As shown in FIG. In Fig. 6, for the sake of convenience, the optical film F10 is shown.

As shown in Fig. 6, the light-emitting surface 120a of the light source 120 constituting the defect inspection apparatus 102 is rectangular and has a long side along the Y direction. In the present embodiment, the light output surface 120a of the light source 120 has a long side along the width direction orthogonal to the conveying direction of the optical film F10. The light output surface 120a of the light source 120 is formed across the optical film F10 in the width direction. For example, as the light source 120, a metal halide lamp can be used.

The first polarizing filter 121 is disposed so as to overlap the outer peripheral portion of the light output surface 120a of the light source 120. [ The first polarizing filter 121 has a long side along the Y direction like the light output surface 120a of the light source 120. [ The first polarizing filter 121 is longer than the light output surface 120a of the light source 120 in each of the X direction and the Y direction.

Accordingly, when the first polarizing filter 121 is disposed on the optical path between the light source 120 and the optical film F10, the light emitted from the light source 120 is totally reflected by the first polarizing filter 121 I will join.

The imaging device 122 also has a long side along the Y direction, like the light output surface 120a of the light source 120. [ For example, as the image pickup device 122, a line sensor camera can be used.

The second polarizing filter 123 is disposed so as to overlap the outer peripheral portion of the light receiving surface 122a of the image pickup device 122. [ Like the light receiving surface 122a of the image pickup device 122, the second polarizing filter 123 has a long side along the Y direction. The second polarizing filter 123 is longer than the light receiving surface 122a of the image pickup device 122 in each of the X direction and the Y direction.

The above-mentioned optical film F10 is cut into a predetermined size by a cutting device (not shown) and becomes a polarizing plate as a sheet piece bonded to the liquid crystal panel. By bonding the polarizing plate to the liquid crystal panel, a liquid crystal display device as an optical display device is manufactured.

However, in the manufacture of a liquid crystal display device in which a polarizing plate is bonded to a liquid crystal panel, there is a problem in that when the polarizing plate is bonded to the liquid crystal panel, the liquid crystal panel is warped by the stress of the polarizing plate.

As a result of intensive studies, the inventor of the present invention has found that the state of warping of the liquid crystal panel can be made different by changing the configuration of the polarizing plate.

This will be described below with reference to Figs. 7 and 8. Fig.

7 is a view showing an example of bonding of a polarizing plate (TAC / PVA / TAC) having a polarizing plate configuration of TAC / PVA / TAC to a liquid crystal panel P. Fig.

As shown in Fig. 7, an adhesive layer F16 is disposed on the surface of the polarizing plate (TAC / PVA / TAC) which is in contact with the liquid crystal panel P. The polarizing plate (TAC / PVA / TAC) is bonded to the liquid crystal panel P via the adhesive layer F16.

Fig. 8 is a view showing an example of bonding of a polarizing plate (COP / PVA / TAC) having a polarizing plate configuration of COP / PVA / TAC to a liquid crystal panel P. Fig.

As shown in Fig. 8, an adhesive layer F16 is disposed on the bonding surface (surface on the TAC film side) of the polarizing plate (COP / PVA / TAC) with the liquid crystal panel P. The polarizing plate (COP / PVA / TAC) is provided with a TAC film on the bonding surface side of the liquid crystal panel P and bonded to the liquid crystal panel P via the adhesive layer F16.

The present inventors have found that the cause is not clear, but the case where a polarizing plate (COP / PVA / TAC) is placed on the bonding surface side of the liquid crystal panel P and the TAC film is bonded to the liquid crystal panel P (see FIG. 8) It has been found that the state of warping of the liquid crystal panel P can be made different when the polarizing plate (TAC / PVA / TAC) is bonded to the liquid crystal panel P (see Fig. 7).

Therefore, from the viewpoint of making the state of warping of the liquid crystal panel P different from the case of bonding the polarizing plate (TAC / PVA / TAC) to the liquid crystal panel P, And the surface of the polarizing plate on the TAC side is preferably bonded to the liquid crystal panel P. In this case, the surface of the polarizing plate on the TAC side serves as a bonding surface with the liquid crystal panel P. Therefore, when the optical film F10 is manufactured by using the manufacturing apparatus 100 shown in Fig. 1, the COP film F13 is bonded to the upper surface of the polarizer film F11. Therefore, the polarizing filter of the defect inspection apparatus needs to be provided below the transfer line of the optical film F10.

In the case of a configuration in which the polarizing filter is disposed only on the bonding surface side of the polarizing plate as in the conventional defect inspection apparatus, it is necessary to replace the positions of the light source, the image pickup apparatus, and the polarizing filter when the configuration of the polarizing plate is changed from FIG. 7 to FIG. , It is necessary to drastically change the configuration of the apparatus.

For example, in the case of a polarizing plate (TAC / PVA / TAC), a TAC film is disposed on both sides of the PVA film. For this reason, either one of the pair of TAC films may be provided on the side of the bonding surface of the polarizing plate, and this can be applied without changing the apparatus configuration even with the conventional defect inspection apparatus.

However, in the case of the polarizing plate (COP / PVA / TAC), the TAC film is disposed on only one side of the PVA film. Therefore, in the case of the conventional defect inspection apparatus, if the side of the TAC film is set on the side of the bonding surface of the polarizing plate in order to make the deflection state of the liquid crystal panel P different, the apparatus configuration must be changed drastically.

Particularly, when the peeling section 113 for peeling the COF film protective film F14 from the laminated film F12 is disposed only on the upper side of the feeding path of the polarizer film F11 as shown in Fig. 1, The second supply part 111 for supplying the polarizing film F12 is also disposed above the supply path of the polarizer film F11. Therefore, in the conventional defect inspection apparatus, when the polarizing filter is disposed only on the upper side of the optical film F10, the defect inspection of the COP film F13 can be performed. However, the TAC film (F15) can not be inspected.

On the other hand, it is conceivable to replace the positions of the light source, the polarizing filter and the image pickup device with this countermeasure, but a considerable change of the device configuration is required, and a large amount of time is also required to replace the device. A defect inspection apparatus for defect inspection on the upper surface side of the optical film F10 and a defect inspection apparatus for defect inspection on the lower surface side of the optical film F10 are installed along the transport path of the optical film F10 But it is not realistic because it requires a large installation space and a large installation cost.

Therefore, the embodiment of the present invention employs the following configuration in order to facilitate the defect inspection on one side and the other side of the optical film.

2, the defect inspection apparatus 102 according to one embodiment of the present invention includes a light source 120 disposed above the optical film F10 and irradiating light to the optical film F10, An image pickup device 122 disposed on the lower side of the optical film and configured to pick up an image by the transmitted light from the optical film and a polarizer film F11 disposed on the optical path between the light source 120 and the optical film F10, A first polarizing filter 121 disposed on the optical path between the image pickup device 122 and the optical film F10 and having a first absorption axis perpendicular to the absorption axis of the polarizer film F11, A first moving device 130 for moving the first polarizing filter 121 forward and backward toward the optical path between the light source 120 and the optical film F10, A second moving device 131 for moving the second polarizing filter 123 forward and backward toward the optical path between the image pickup device 122 and the optical film F10 Characterized in that it also. In other words, the first moving device 130 can move the first polarizing filter 121 forward and backward with respect to the optical path between the light source 120 and the optical film F10, and the second moving device 131, It is possible to move the second polarizing filter 123 back and forth with respect to the optical path between the image pickup device 122 and the optical film F10.

According to this configuration, the polarizing filter is disposed on both the upper surface side and the lower surface side of the optical film F10. Therefore, by moving each of the polarizing filters back and forth on the optical path between the light source 120 and the image pickup device 122 in accordance with the configuration of the optical film F10, the defect on the upper surface side and the lower surface side of the optical film F10 The inspection can be easily switched. Therefore, it is possible to easily cope with defect inspection of the optical film F10 having various configurations, while saving space and being inexpensive.

Fig. 9 is a diagram for explaining the defect inspection apparatus 102 in the first imaging mode of the polarizing plate (TAC (1) / PVA / TAC (2)).

10 is a diagram showing an example of bonding of the polarizing plate (TAC (1) / PVA / TAC (2)) to the liquid crystal panel (P) in the first imaging mode.

11 is a view for explaining the defect inspection apparatus 102 in the first imaging mode of the polarizing plate (COP / PVA / TAC). 12 is a view showing an example of bonding of the polarizing plate (COP / PVA / TAC) to the liquid crystal panel P in the first imaging mode.

13 is a diagram for explaining the defect inspection apparatus 102 in the second imaging mode.

14 is a view showing an example of bonding of the polarizing plate to the liquid crystal panel P in the second image sensing mode.

9, 11, and 13, the first moving device 130, the second moving device 131, and the control device 132 are not shown for the sake of convenience. 9 and 10, the TAC film on the bonding surface side of the polarizing plate is referred to as a TAC (1) film "TAC (1)" and the TAC film on the opposite side to the bonding surface side of the polarizer is referred to as a TAC As shown in FIG.

9, in the first imaging mode, the first moving device 130 moves the first polarizing filter 121 to the light source 120 and the polarizing plate (TAC (1) / (First position (Q1) on the optical axis CL) between the absorption axis of the PVA film and the first axis of the first polarizing filter 121 The second moving device 131 controls the second polarizing filter 123 to move the image pickup device 122 and the polarizing plate TAC 1 so that the absorption axes of the first polarizing filter 121 and the second polarizing filter 121 are orthogonal to each other, (The second position Q2 deviated from the optical axis CL) from the optical path between the first lens group L1 and the second lens group L2, / PVA / TAC (2).

More specifically, the control device 132 controls the first moving device 130 to move the center of the first polarizing filter 121 to the first position Q1 on the optical axis CL in the first imaging mode And controls the arrangement of the first polarizing filter 121 so that the absorption axis of the PVA film and the first absorption axis of the first polarizing filter 121 are orthogonal to each other. 131 perform control so that the center of the second polarizing filter 123 is disposed at the second position Q2 deviated from the optical axis CL.

The second position Q2 is set to a position where the second polarizing filter 123 is retracted from the field-of-view range of the image pickup device 122. [ That is, the second position Q2 is set to a position where the second polarizing filter 123 does not fall within the field-of-view range of the image pickup device 122. [ If the second position Q2 is too close to the optical axis CL, the second polarizing filter 123 enters the field-of-view range of the image pickup device 122. On the other hand, when the second position Q2 is too far from the optical axis CL, it takes time to move the second polarizing filter 123 to the position on the optical axis CL, and it becomes difficult to smoothly shift to another imaging mode. From this point of view, the second position Q2 in the present embodiment is set to a distance of 30 mm or more and 50 mm or less from the optical axis CL, for example. The second position Q2 is more preferably set to a distance in the range of 35 mm to 45 mm from the optical axis CL.

In the first imaging mode, the absorption axis of the PVA film and the first absorption axis of the first polarizing filter 121 are disposed in cross-Nicol arrangement. In the first imaging mode, the defect inspection of the TAC film 1 disposed on the optical path between the first polarizing filter 121 and the PVA film can be performed.

Light emitted from the light source 120 toward the polarizing plate (TAC (1) / PVA / TAC (2)) is linearly polarized by the first polarizing filter 121. The linearly polarized light obtained by the first polarizing filter 121 is incident on the TAC film 1. If there is no defect in the TAC film 1, the light transmitted through the TAC film 1 is blocked by the PVA film. Therefore, a black image is picked up by the image pickup device 122. In this case, the TAC film 1 is judged as " defective. &Quot;

On the other hand, when there is a defect in the TAC film 1, the linearly polarized light incident on the TAC film 1 is disturbed by the defect, and a part of the light which is disturbed in the polarization state passes through the PVA film. As a result, the light transmitted through the PVA film is incident on the image pickup device 122, and the image pickup device 122 picks up the defect brightly as a bright spot. In this case, the TAC film 1 is judged as " defective. &Quot;

As described above, the cross-Nicol penetration test on the TAC film 1 side laminated on the upper surface of the PVA film can be performed by the first imaging mode, and the polarizing plates (TAC (1) / PVA / TAC (2) P can be inspected for defect on the joint surface side.

An adhesive layer F16 is disposed on the bonding surface (the surface of the TAC 1) of the liquid crystal panel P of the polarizing plate (TAC (1) / PVA / TAC (2)) as shown in Fig. The polarizing plate (TAC (1) / PVA / TAC (2)) is bonded to the liquid crystal panel (P) through the adhesive layer (F16).

As shown in Fig. 11, also in the case of the polarizing plate (COP / PVA / TAC), the same control as that in the first imaging mode described with reference to Fig. 9 can be performed.

In the case of the polarizing plate (COP / PVA / TAC), defect inspection of the COP film disposed on the optical path between the first polarizing filter 121 and the PVA film can be performed in the first imaging mode.

The light emitted from the light source 120 toward the polarizing plate (COP / PVA / TAC) is linearly polarized by the first polarizing filter 121. The linearly polarized light obtained by the first polarizing filter 121 is incident on the COP film. When the COP film is free from defects, the light transmitted through the COP film is blocked by the PVA film. Therefore, a black image is picked up by the image pickup device 122. In this case, the COP film is judged as " no defect ".

On the other hand, when there is a defect in the COP film, the linearly polarized light incident on the COP film is disturbed by the defect, and a part of the light which is disturbed in the polarization state passes through the PVA film. As a result, the light transmitted through the PVA film is incident on the image pickup device 122, and the image pickup device 122 picks up the defect brightly as a bright spot. In this case, the COP film is judged as " defective. &Quot;

As described above, the cross-Nicol penetration test of the COP film laminated on the upper surface of the PVA film can be performed by the first image pickup mode, and the defect inspection of the COP film serving as the junction surface side of the polarizer (COP / PVA / TAC) .

As shown in Fig. 12, an adhesive layer F16 is disposed on the bonding surface (the surface of the COP) of the liquid crystal panel P of the polarizing plate (COP / PVA / TAC). The polarizing plate (COP / PVA / TAC) is provided with a COP film on the bonding surface side of the liquid crystal panel P and bonded to the liquid crystal panel P via the adhesive layer F16.

13, in the second imaging mode, the first moving device 130 moves the first polarizing filter 121 to the light source 120 and the polarizing plate (COP / PVA / TAC (Third position Q3 displaced from the optical axis CL) from the optical path between the first polarizing filter 123 and the second polarizing filter 123, and the second moving device 131 performs control to move the second polarizing filter 123 (The fourth position Q4 on the optical axis CL) between the device 122 and the polarizing plate (COP / PVA / TAC) and at the same time, the absorption axis of the PVA film and the second polarizing filter The arrangement of the second polarizing filter 123 is controlled so that the second absorption axis of the second polarizing filter 123 is orthogonal.

Specifically, the control device 132 controls the first moving device 130 to move the center of the first polarizing filter 121 to the third position Q3 shifted from the optical axis CL in the second imaging mode And the second moving device 131 performs control so that the center of the second polarizing filter 123 is disposed at the fourth position Q4 on the optical axis CL and at the same time, The arrangement of the second polarizing filter 123 is controlled so that the absorption axis of the film and the second absorption axis of the second polarizing filter 123 are perpendicular to each other.

The third position Q3 is set at a position where the light emitted from the light source 120 can be prevented from being blocked by the cross polarizing arrangement of the first polarizing filter 121 and the PVA film. If the third position Q3 is too close to the optical axis CL, a part of the light emitted from the light source 120 is blocked by the cross polarizing arrangement of the first polarizing filter 121 and the PVA film. On the other hand, when the third position Q3 is too far from the optical axis CL, it takes time to move the first polarizing filter 121 to the position on the optical axis CL, and it becomes difficult to smoothly shift to another imaging mode. From this point of view, the third position Q3 in the present embodiment is set to a distance of 30 mm or more and 50 mm or less from the optical axis CL, for example. The third position Q3 is more preferably set to a distance in the range of 35 mm to 45 mm from the optical axis CL.

In the second imaging mode, the absorption axis of the PVA film and the second absorption axis of the second polarizing filter 123 are arranged in crossed Nicols. In the second imaging mode, defect inspection of the TAC film disposed on the optical path between the PVA film and the second polarizing filter 123 can be performed.

Light emitted from the light source 120 toward the polarizing plate (COP / PVA / TAC) is transmitted through the COP film and linearly polarized by the PVA film. The linearly polarized light obtained by the PVA film enters the TAC film. If there is no defect in the TAC film, the light transmitted through the TAC film is blocked by the second polarizing filter 123. Therefore, a black image is picked up by the image pickup device 122. In this case, the TAC film is judged to be " defective. &Quot;

On the other hand, when there is a defect in the TAC film, the linearly polarized light incident on the TAC film is disturbed by the defect, and a part of the light which is disturbed in the polarization state passes through the second polarizing filter 123. As a result, the light transmitted through the second polarized light filter 123 is incident on the image pickup device 122, and the image pickup device 122 picks up the defect brightly as a bright spot. In this case, the TAC film is judged as " defective. &Quot;

As described above, the cross-Nicol penetration test of the TAC film laminated on the lower surface of the PVA film can be performed by the second image pickup mode, and the defect inspection of the TAC film as the bonding surface side of the polarizing plate (COP / PVA / TAC) .

As shown in Fig. 14, an adhesive layer F16 is disposed on the bonding surface (the surface of the TAC film) of the liquid crystal panel P of the polarizing plate (COP / PVA / TAC). The polarizing plate (COP / PVA / TAC) is provided with a TAC film on the bonding surface side of the liquid crystal panel P and bonded to the liquid crystal panel P through the adhesive layer F16. This configuration is effective for countering the warping of the liquid crystal panel P.

Further, in each imaging mode, the light source 120 and the imaging device 122 are fixed in a fixed position.

As described above, the defect inspection apparatus 102 of the present embodiment can freely select the first imaging mode and the second imaging mode under the control of the control device 132. [ Therefore, even when the configurations of the polarizing plates are different, it is possible to detect defects on the bonding surface side of each polarizing plate by the same defect inspection apparatus 102. In other words, according to the present embodiment, there is no need to replace the positions of the light source and the image pickup device, and a significant change in the device configuration is not required. Therefore, according to the present embodiment, defect inspection on one side and the other side of the optical film F10 can be easily switched.

In the present embodiment, the optical film F10 is composed of a COP film F13 laminated on the upper surface of the polarizer film F11 and a TAC film F15 laminated on the lower surface of the polarizer film F11, The second supply portion 111 and the peeling portion 113 are disposed above the supply path of the polarizer film F11. According to an exemplary study of the present inventors, when a polarizing plate (COP / PVA / TAC) is placed on the bonding surface side of the liquid crystal panel P and a TAC film is bonded to the liquid crystal panel P, It is found that defect inspection on the side of the TAC film which is the bonding surface side of the polarizing plate (COP / PVA / TAC) may be required.

However, in this case, if the polarizing filter is disposed only on the upper side of the optical film, defect inspection on the side of the TAC film which is the bonding surface side of the polarizing plate can not be performed. Therefore, it is necessary to replace the positions of the light source, the polarizing filter, and the image pickup device, and it is necessary to drastically change the configuration of the apparatus.

On the other hand, according to the present embodiment, defect inspection can be performed on the side of the TAC film which is the bonding surface side of the polarizing plate, simply by switching to the second imaging mode using the same defect inspection apparatus 102. [

Further, in each imaging mode, the light source 120 and the imaging device 122 are fixed in a fixed position. Therefore, defect inspection on the bonding surface side of the optical film F10 can be easily performed as compared with a configuration in which the light source and the imaging device are moved.

(Production system of optical display device)

Hereinafter, a film joining system 1 constituting a part of the production system of an optical display device according to an embodiment of the present invention will be described. In the film bonding system 1 according to the present embodiment, the first defect inspection apparatus 9 and the second defect inspection apparatus are constituted by the defect inspection apparatus 102 described above.

Figs. 15 and 16 are side views showing the arrangement of the film bonding system 1 of the present embodiment. Fig.

The film joining system 1 is to bond a film type optical member such as a polarizing film, an anti-reflection film, or a light diffusion film to a panel-type optical display component such as a liquid crystal panel or an organic EL panel.

In the following description, the XYZ orthogonal coordinate system is set as necessary, and the positional relationship of the respective members is described with reference to this XYZ orthogonal coordinate system. In the present embodiment, the direction in which the liquid crystal panel serving as an optical display component is moved in the X direction and the direction (the width direction of the liquid crystal panel) orthogonal to the X direction within the plane of the liquid crystal panel is defined as the Y direction, the X direction, And the direction orthogonal to the Z direction.

In the present embodiment, a liquid crystal panel P is exemplified as an optical display component, and a double-side bonded panel formed by joining a bonding sheet F5 to both the front and back surfaces of a liquid crystal panel P as an optical member joined body is exemplified. The present invention is not limited to this.

As shown in Figs. 15 and 16, the film bonding system 1 of the present embodiment is provided as one step of the production line of the liquid crystal panel P. Fig. The respective parts of the film bonding system 1 are collectively controlled by the control unit 2 as an electronic control unit.

The film joining system 1 of the present embodiment rotates the posture of the liquid crystal panel P by 90 degrees in the middle with respect to the conveying direction of the liquid crystal panel P. [ The film joining system 1 joins the polarizing film F1 with the polarization axis thereof oriented in the direction perpendicular to the polarizing film F1 on the front and back surfaces of the liquid crystal panel P.

17 is a plan view of the liquid crystal panel P viewed from the thickness direction of the liquid crystal layer P3. The liquid crystal panel P includes a first substrate P1 having a rectangular shape in plan view, a second substrate P2 having a relatively small rectangular shape disposed to face the first substrate P1, And a liquid crystal layer P3 sealed between the substrate P1 and the second substrate P2. The liquid crystal panel P has a rectangular shape along the outer shape of the first substrate P1 in plan view and a region accommodated inside the outer periphery of the liquid crystal layer P3 in plan view is the display region P4 .

18 is a sectional view of the optical sheet F including the optical member F1 bonded to the liquid crystal panel P. Fig.

In Fig. 18, hatching of each layer in the cross-sectional view is omitted for the sake of convenience.

18, the optical sheet F includes a film-shaped optical member F1, an adhesive layer F2 formed on one surface (upper surface in the figure) of the optical member F1, A separator F3 detachably laminated on one surface of the optical member F1 through the first surface F2 of the optical member F1 and a surface protective film F4 laminated on the other surface . The optical member F1 functions as a polarizing plate and is bonded over the entire region of the display region P4 of the liquid crystal panel P and its peripheral region.

The optical member F1 is bonded to the liquid crystal panel P via the adhesive layer F2 in a state in which the separator F3 is separated while leaving the adhesive layer F2 on one side thereof. Hereinafter, the portion of the optical sheet F excluding the separator F3 is referred to as a bonded sheet F5.

The separator F3 protects the adhesive layer F2 and the optical member F1 until separated from the adhesive layer F2. The surface protective film F4 is bonded to the liquid crystal panel P together with the optical member F1. The surface protective film F4 is disposed on the opposite side of the optical member F1 from the liquid crystal panel P to protect the optical member F1 and is separated from the optical member F1 at a predetermined timing.

The optical sheet F may be configured so as not to include the surface protective film F4 or may be configured such that the surface protective film F4 is not separated from the optical member F1.

The optical member F1 includes a sheet polarizer F6 and a first film F7 bonded to one side of the polarizer F6 with an adhesive or the like and an adhesive agent or the like on the other side of the polarizer F6 And a second film (F8) bonded thereto. The first film F7 and the second film F8 are, for example, protective films for protecting the polarizer F6.

The optical member F1 may be a single-layer structure including a single optical layer or a multi-layer structure in which a plurality of optical layers are laminated to each other. The optical layer may have a retardation film, a brightness enhancement film, or the like in addition to the polarizer F6. At least one of the first film (F7) and the second film (F8) may be subjected to a surface treatment for obtaining effects such as hard coat treatment for protecting the outermost surface of the liquid crystal display element and antiglare treatment including antiglare treatment. The optical member F1 may not include at least one of the first film F7 and the second film F8. For example, when the first film F7 is omitted, the separator F3 may be bonded to one surface of the optical member F1 via the adhesive layer F2.

Next, the film bonding system 1 of the present embodiment will be described in detail.

As shown in Figs. 15 and 16, the film joining system 1 of the present embodiment is provided with the liquid crystal panel P on the left side in the drawing from the upstream side (+ X direction side) of the liquid crystal panel P on the right side in the drawing, Type roller conveyor 3 that horizontally conveys the liquid crystal panel P over the downstream side (-X direction side) in the conveying direction of the liquid crystal panel P.

The roller conveyor 3 is divided into an upstream conveyor and a downstream conveyor, with a reversing device (not shown) as a boundary. In the upstream-side conveyor, the liquid crystal panel P is conveyed such that the long side of the display area P4 is along the conveying direction. On the other hand, in the downstream conveyor, the liquid crystal panel P is conveyed so that the short side of the display region P4 follows the conveying direction. A bonded sheet F5 cut to a predetermined length is bonded to the front and back surfaces of the liquid crystal panel P from a band-shaped optical sheet F. [

The film joining system 1 of the present embodiment is provided with a first feeding device 7, a first joining device 11, an inverting device, a second feeding device, a second joining device, an inspection device, and a control part 2 . The reversing device, the second feeding device, the second bonding device, and the inspection device are not shown for the sake of convenience.

15, the first feeding device 7 and the first feeding device 7 of the film feeding system 1 will be described. Since the second feeding device has the same configuration as the first feeding device 7, detailed description thereof will be omitted.

As shown in Fig. 15, the first feeding device 7 draws the optical sheet F from the disk roll R1 on which the belt-shaped optical sheet F is wound, cuts it to a predetermined size, and then supplies it. The first feeding device 7 includes a first conveying device 8, a pre-inspection peeling device 18, a first defect inspection device 9, a post-inspection joining device 19, and a first cutting device 10 Respectively.

The first transport device 8 is a transport mechanism that transports the optical sheet F along its longitudinal direction. The first conveying device 8 has a roll holding portion 8a, a nip roller 8b, a guide roller 8c, an accumulator 8d and a winding portion 8e (see Fig. 16).

The roll holding portion 8a holds the disc roll R1 on which the strip-like optical sheet F is wound, and at the same time, guides the optical sheet F along its longitudinal direction.

The nip roller 8b sandwiches the optical sheet F so as to guide the optical sheet F released from the master roll R1 along a predetermined transport path.

The guide roller 8c changes the advancing direction of the optical sheet F during conveyance along the conveying path. At least one of the plurality of guide rollers 8c functions as a tension roller.

That is, it operates to adjust the tension of the optical sheet F during conveyance.

The accumulator 8d absorbs the amount of filtration of the optical sheet F conveyed from the roll holding portion 8a while the optical sheet F is cut by the first cutting device 10. [

The roll holding portion 8a located at the start point of the first transport apparatus 8 and the winding section 8e located at the end point of the first transport apparatus 8 are driven in synchronism with each other. The winding unit 8e winds the separator F3 through the first joining apparatus 11 while the roll holding unit 8a feeds the optical sheet F in its conveying direction. Hereinafter, the upstream side of the optical sheet F (separator F3) in the conveying direction is referred to as the upstream side of the sheet conveying direction, and the downstream side in the conveying direction is referred to as the sheet conveying downstream side.

The peeling apparatus 18 before inspection has a configuration in which the first separator H1 (corresponding to the separator F3) is peeled off from the optical sheet F conveyed from the upstream side of sheet conveyance and wound on a roll. The peeling apparatus 18 before inspection has a knife edge 18a and a winding section 18b.

The knife edge 18a extends at least over its full width in the width direction of the optical sheet F. [ The knife edge 18a is rolled so as to slide on the first separator H1 side of the optical sheet F released from the original roll R1. The knife edge 18a is wrapped around the tip of the optical sheet F at an acute angle. The knife edge 18a separates the bonded sheet F5 from the first separator H1 when the optical sheet F is folded at an acute angle by the front end thereof. The knife edge 18a feeds the bonded sheet F5 to the first defect inspection apparatus 9. [

The winding portion 18b winds the first separator H1 which has been made singly through the knife edge 18a and holds it as the first separator roll R2.

The first defect inspection device 9 performs defect inspection of the optical sheet F, that is, the bonded sheet F5 after peeling off the first separator H1. The first defect inspection apparatus 9 analyzes the image data picked up by the CCD camera to check whether or not there is a defect, and if there is a defect, calculates its position coordinates. The position coordinates of this defect are provided to the skip cut by the first cutting apparatus 10. [ The first defect inspection apparatus 9 is constituted by the defect inspection apparatus 102 described above.

After the inspection, the bonding apparatus 19 bonds the second separator H2 (corresponding to the separator F3) to the bonding sheet F5 after defect inspection through the adhesive layer F2. After the inspection, the joining device 19 has a roll holding portion 19a and a clamping roll 19b.

The roll holding portion 19a holds the second separator roll R3 in which the strip-shaped second separator H2 is wound, and at the same time, extends the second separator H2 along its longitudinal direction.

The clamping rolls 19b are disposed on the lower face of the bonded sheet F5 after the defect inspection carried from the upstream side of the sheet conveying direction (the face on the side of the adhesive layer F2), the second separator H2 wound around the second separator roll R3, . The clamping rolls 19b have a pair of splicing rollers arranged in parallel with each other in the axial direction (the above splicing rollers move up and down). A predetermined clearance is formed between the pair of contact rollers, and this clearance becomes the bonding position of the bonding apparatus 19 after inspection. A bonding sheet F5 and a second separator H2 are superposed and introduced into the gap. These bonded sheet F5 and second separator H2 are fed to the downstream side of the sheet conveying path while being clamped by the tightly packed rolls 19b. Thereby, the second separator H2 is bonded to the lower surface of the bonded sheet F5 after the defect inspection, and the optical sheet F is formed.

The first cutting apparatus 10 is provided with a part of the optical sheet F in the thickness direction over a full width in the width direction orthogonal to the longitudinal direction of the optical sheet F A half cut to cut is performed.

The first cutting apparatus 10 is arranged so that the optical sheet F (the separator F3) is not broken (the predetermined thickness remains in the separator F3) by the tension acting during the conveyance of the optical sheet F, The advancing and retreating position of the cutting edge is adjusted and a half cut is performed to the vicinity of the interface between the adhesive layer F2 and the separator F3. Further, a laser device may be used instead of the cutting blade.

The optical member F and the surface protective film F4 are cut in the thickness direction of the optical sheet F after the half cut so that a perforated line extending over the entire width in the width direction of the optical sheet F is formed. The perforated lines are formed so as to be plurally arranged in the longitudinal direction of the band-shaped optical sheet (F). For example, in the case of the joining step of conveying liquid crystal panels P of the same size, a plurality of perforated lines are formed at even intervals in the longitudinal direction of the optical sheet F. The optical sheet F is divided into a plurality of sections in the longitudinal direction by the plurality of perforated lines. The sections sandwiching the pair of perforations in the longitudinal direction in the optical sheet F are each a sheet sheet in the bonded sheet F5.

The first cutting apparatus 10 cuts a predetermined size (skip cut) so as to avoid the defective portion based on the position coordinates of the defect calculated by the first defect inspection apparatus 9. [ A cut product containing a defective portion is rejected as a defective product in a subsequent process. Further, the first cutting apparatus 10 may continuously cut the optical sheet F to a predetermined size by disregarding the defective portion. In this case, in the process of joining the bonding sheet F5 and the liquid crystal panel P, the cut product including the defective portion can be removed without bonding to the liquid crystal panel P.

16, the first bonding apparatus 11 of the first bonding apparatus and the second bonding apparatus will be described as the apparatus configuration of the film bonding system 1. The second joining apparatus has the same configuration as that of the first joining apparatus 11, and a detailed description thereof will be omitted.

As shown in Fig. 16, the first joining apparatus 11 joins the bonded sheet F5 cut to a predetermined size to the upper surface of the liquid crystal panel P introduced at the joining position. The first joining device 11 has a knife edge 11a and a tightening roll 11b.

The knife edge 11a winds the half-cut optical sheet F at an acute angle and feeds the bonded sheet F5 to the bonding position while separating the bonded sheet F5 from the separator F3.

The clamping roll 11b joins the bonded sheet F5 of a predetermined length separated from the optical sheet F by the knife edge 11a to the upper surface of the liquid crystal panel P conveyed by the upstream conveyor. The tightening rolls 11b have a pair of contact rollers arranged in parallel with each other in the axial direction. A predetermined clearance is formed between the pair of contact rollers, and this clearance serves as a bonding position of the first bonding apparatus 11. [ The liquid crystal panel P and the bonding sheet F5 are superposed and introduced into the gap. These liquid crystal panels P and the joining sheet F5 are fed to the downstream side of the panel conveyance of the upstream conveyor while being clamped by the tightly-pressing rolls 11b. Thus, the bonding sheet F5 is integrally bonded to the upper surface of the liquid crystal panel P. Hereinafter, the panel after the bonding is referred to as a one-side bonding panel P11.

The winding portion 8e winds the second separator H2 which is made singly via the knife edge 11a and holds it as the second separator roll R4.

An inverting device (not shown) is provided on the downstream side of the panel conveying device than the first joining device 11 and conveys the liquid crystal panel P reaching the end position of the upstream conveyor to the starting position of the downstream conveyor.

The reversing device holds the one-side joint panel P11 reaching the end position of the upstream conveyor via the first joining device 11 by suction, clamping, or the like. The reversing device reverses the front and back surfaces of the one-side bonding panel P11. The reversing device turns the one-side bonding panel P11, which has been conveyed in parallel with the long side of the display area P4, to be conveyed in parallel with the short side of the display area P4.

The inversion is performed when each of the optical members F1 to be bonded to the front and back surfaces of the liquid crystal panel P are arranged with their polarization axis directions perpendicular to each other.

When simply inverting the front and back of the liquid crystal panel P, for example, a reversing device having a reversing arm having a pivoting axis parallel to the conveying direction may be used. In this case, when the sheet conveying direction of the first feeding device 7 and the sheet conveying direction of the second feeding device are arranged at right angles to each other in a plan view, the liquid crystal panel P The optical member F1 can be bonded.

Since the second feeding device has the same configuration as the first feeding device 7, detailed description thereof will be omitted. The second feeding device draws the optical sheet F from the disk roll on which the strip-shaped optical sheet F is wound, cuts it into a predetermined size, and then supplies it. The second feeding device includes a second conveying device, a peeling device before inspection, a second defect inspection device, a post-inspection joining device, and a second cutting device although not shown.

The second joining apparatus joins the bonded sheet F5 cut to a predetermined size to the upper surface of the liquid crystal panel P introduced at the joining position. The second joining device has the same knife edge and a coining roll as the first joining device 11.

The one-side bonding panel P11 and the bonding sheet F5 are introduced in a superposed state in the gap between the pair of bonding rollers of the tightening roll (bonding position of the second bonding apparatus) The bonding sheet F5 is integrally bonded. Hereinafter, the panel after the bonding is referred to as a double-side bonding panel (optical member bonding body).

The inspection apparatus (not shown) is provided on the downstream side of the panel conveyance than the second joining apparatus. The inspection apparatus checks whether or not there is a defect (bonding failure, etc.) in the double-sided bonding panel. Defects to be inspected include defects such as contamination of foreign matter or bubbles when bonding the liquid crystal panel and the bonding sheet, scratches on the surface of the bonding sheet, and orientation defects inherent in the liquid crystal panel.

In the present embodiment, the control unit 2 as an electronic control unit for collectively controlling each part of the film bonding system 1 includes a computer system. The computer system includes an arithmetic processing unit such as a CPU and a storage unit such as a memory or a hard disk. The control unit 2 of the present embodiment includes an interface capable of performing communication with an external device of the computer system. The control unit 2 may be connected to an input device capable of inputting an input signal. The input device includes an input device such as a keyboard and a mouse, or a communication device capable of inputting data from an external device of the computer system. The control unit 2 may include a display device such as a liquid crystal display or the like which indicates the operation status of each part of the film bonding system 1 or may be connected to a display device.

In the storage unit of the control unit 2, an operating system (OS) for controlling the computer system is installed. The storage section of the control section 2 controls each section of the film joining system 1 in the arithmetic processing section so as to execute processing for transferring the optical sheet F to each section of the film joining system 1 with good precision The program is recorded. The arithmetic processing unit of the control unit 2 can read various kinds of information including a program recorded in the storage unit. The control section 2 may include a logic circuit such as an ASIC for executing various processes required for control of the respective sections of the film bonding system 1. [

The storage section is a concept including a semiconductor memory such as a RAM (Random Access Memory) and a ROM (Read Only Memory), an external storage device such as a hard disk, a CD-ROM reading device, a disk type storage medium and the like. Functionally, the storage section stores the program software in which the control procedures of the operations of the first feeding device 7, the first joining device 11, the inverting device, the second feeding device, the second joining device, And various other storage areas are set.

As described above, the first defect inspection apparatus 9 of the present embodiment is constituted by the defect inspection apparatus 102 described above. Therefore, even when the configuration of the bonding sheet F5 is different, it is possible to detect a defect on the bonding surface side of each bonding sheet F5 by the same defect inspection apparatus 102. [

Therefore, according to the present embodiment, defect inspection on one surface side and the other surface side of the bonded sheet F5 can be easily switched.

While the preferred embodiments of the present invention have been described with reference to the accompanying drawings, it goes without saying that the present invention is not limited to these examples. Various shapes, combinations, and the like of the respective constituent members shown in the above-described examples are merely examples, and various modifications are possible based on design requirements and the like without departing from the gist of the present invention.

1: Film bonding system (production system of optical display device)
8: First transfer device (transfer device)
9: First defect inspection apparatus (defect inspection apparatus)
11: First bonding apparatus (bonding apparatus)
100: Optical film production system (optical member production system)
101: Optical film production apparatus (optical member production apparatus)
102: defect inspection apparatus 110: first supply section
111: second supply unit 112: third supply unit
113: peeling section 120: light source
121: first polarizing filter 122: imaging device
123: second polarizing filter 130: first moving device
131: second moving device 132: control device
CL: optical axis P: liquid crystal panel (optical display part)
F1: optical member F10: optical film (optical member)
F11: polarizer film (polarizer) F12: laminated film (laminated member)
F13: COP film (first protective layer) F14: protective film for COP film (second protective layer)
F15: TAC film (second protective layer) Sf1: upper surface (one surface of the optical member)
Sf2: lower surface (the other surface of the optical member)

Claims (5)

1. An apparatus for inspecting defects of an optical member including a polarizer,
A light source which is disposed on a first side of the optical member and irradiates light to the optical member;
An imaging device disposed on a second side of the optical member for imaging an image by light transmitted from the optical member;
A first polarizing filter disposed on an optical path between the light source and the optical member and having a first absorption axis orthogonal to an absorption axis of the polarizer;
A second polarizing filter disposed on an optical path between the imaging device and the optical member and having a second absorption axis orthogonal to an absorption axis of the polarizer;
A first moving device for moving the first polarizing filter forward and backward with respect to an optical path between the light source and the optical member, and
And the second polarizing filter is moved forward and backward with respect to the optical path between the imaging device and the optical member,
And a defect inspection apparatus. 2. The image pickup apparatus according to claim 1, wherein, in the first image pickup mode, the first moving device performs control so as to move the first polarizing filter to the optical path between the light source and the optical member, And the second moving device performs control of the arrangement of the first polarizing filter so that the first absorption axis is orthogonal to the first absorption axis and the second moving device moves the second polarizing filter to a position shifted from the optical path between the image pickup device and the optical member Control is performed,
The first moving device performs control to move the first polarizing filter to a position shifted from the optical path between the light source and the optical member in the second imaging mode, Control is performed to move the second polarizing filter to the optical path between the imaging device and the optical member, and control of the arrangement of the second polarizing filter is performed so that the absorption axis of the polarizer and the second absorption axis are orthogonal And a control device. A manufacturing system of an optical member including a polarizer,
An optical member manufacturing apparatus for manufacturing the optical member,
The defect inspection apparatus according to any one of claims 1 to 3,
Wherein the optical member has an optical axis. The optical element according to claim 3,
A polarizer, a first protective layer laminated on a first side of the polarizer, and a second protective layer laminated on a second side of the polarizer,
The optical member manufacturing apparatus includes:
A first supply unit for supplying the polarizer,
A second supply part arranged on a first side of the supply path of the polarizer and including a first protective layer and a third protective layer laminated on a third surface of the first protective layer;
A third supply part arranged on a second side of the supply path of the polarizer and supplying the second protective layer,
And a peeling portion which is disposed on a first side of the supply path of the polarizer and peels the third protective layer from the lamination member to serve as the first protective layer. An optical display device production system comprising an optical member and an optical member joined to each other,
A transporting device for transporting the optical member;
A joining device for joining the optical member conveyed by the conveyance device to the optical display part to manufacture the optical display device;
The defect inspection apparatus according to any one of claims 1 to 3, wherein the defect inspection means checks the presence or absence of a defect in the optical member conveyed from the transfer apparatus to the bonding apparatus
The optical system comprising:

Images