JP2015040782A - Defect inspection device, optical member-manufacturing system, and optical display device production system - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a defect inspection device capable of switching defect inspection between one side and the another side of an optical member easily, to provide an optical member-manufacturing system, and to provide an optical display device production system.SOLUTION: There is provided a defect inspection device for an optical member including a polarizer, the defect inspection device including: a light source disposed on one side of the optical member, for irradiating the optical member with light; an image-capturing device disposed on the another side of the optical member, for capturing a transmitted-light image of the optical member; a first polarization filter disposed on an optical path between the light source and the optical member and having a first absorption axis orthogonal to the absorption axis of the polarizer; a second polarization filter disposed on an optical path between the image-capturing device and the optical member, and having a second absorption axis orthogonal to the absorption axis of the polarizer; a first movement device for reciprocally moving the first polarization filter to/from the optical path between the light source and the optical member; and a second movement device for reciprocally moving the second polarization filter to/from the optical path between the image-capturing device and the optical member.

Description

  The present invention relates to a defect inspection apparatus, an optical member manufacturing system, and an optical display device production system.

  As a defect inspection apparatus for an optical member including a polarizer, a defect inspection apparatus described in Patent Document 1 is known. The defect inspection apparatus of Patent Literature 1 is disposed on an optical path between a light source disposed on one side of an optical member, an image capturing apparatus disposed on the other side of the optical member, and the image capturing apparatus and the optical member. And a polarizing filter having an absorption axis perpendicular to the absorption axis of the child.

  A defect inspection apparatus is installed in the conveyance line which conveys an optical member toward the bonding target objects, such as a liquid crystal panel, and the production line of an optical member. For example, in the production line of an optical member, the protective film used as a protective layer is bonded on both surfaces of a polarizer, and it rolls up in roll shape and manufactures the original roll of an optical member. A defect inspection apparatus is installed on the conveyance line of the laminated | multilayer film which laminated | stacked the protective film on the single side | surface or both surfaces of a polarizer, and test | inspects the presence or absence of the foreign material defect etc. between a polarizer and a protective film.

  In a defect inspection apparatus, the presence or absence of the defect of the bonding surface side (surface side bonded with bonding objects, such as a liquid crystal panel) of an optical member is normally test | inspected. Therefore, a polarizing filter is installed in the bonding surface side of an optical member.

  For example, in the defect inspection apparatus of Patent Document 1, a light source is installed below the conveyance line of the optical member, and a polarizing filter and an imaging device are installed above the conveyance line.

  When foreign matter exists between the polarizer and the protective film on the upper surface side (bonding surface side), the light emitted from the light source is converted into linearly polarized light by the polarizer, and a part of the light is scattered by the foreign matter. The A part of the scattered light is disturbed in polarization state, passes through the polarization filter, and is detected as a bright spot by the imaging device.

  On the other hand, when foreign matter exists between the polarizer and the protective film on the lower surface side (the side opposite to the bonding surface), the light emitted from the light source is scattered by the foreign matter and then enters the polarizer. , Converted into linearly polarized light. This linearly polarized light does not pass through the polarizing filter unless there is a defect such as a foreign substance that disturbs the polarization state between the polarizer and the polarizing filter. Therefore, in the imaging apparatus, the dark field is maintained and no defect is detected.

  Thus, by installing the polarizing filter on the bonding surface side of the optical member, only defects on the bonding surface side of the optical member can be selectively inspected.

JP 2007-212442 A

  Which of the upper surface and the lower surface of the optical member is used as the bonding surface is determined in advance, and the arrangement of the light source, the imaging device, and the polarizing filter of the defect inspection device is also fixed accordingly. Usually, like patent document 1, the upper surface of an optical member serves as a pasting surface, and a polarizing filter is also installed above the optical member.

  Here, as an optical member including a polarizer, a polarizing plate (TAC / TAC) in which triacetyl cellulose (TAC) serving as a protective layer is laminated on both surfaces of a polarizer made of polyvinyl alcohol (PVA: Poly Vinyl Alcohol). PVA / TAC) is known. In recent years, diversification of polarizing plates has progressed, and a polarizing plate in which one of the TACs laminated on both sides of the polarizer is replaced with another film has been proposed.

  The present applicant is also developing an optical member in which one TAC is replaced with another film. Details will be described in the section of [Mode for Carrying Out the Invention]. In such a polarizing plate, depending on whether the TAC side is a bonding surface or another film side is a bonding surface, the final product is It is clarified by the inventor's examination that the state of warp or the like is different.

  Therefore, when performing the defect inspection of such a polarizing plate using the above-described defect inspection apparatus, either TAC or another film is preferably bonded to the upper surface side of the polarizer. However, because of the configuration of the optical member manufacturing line, the position of the other film transport line is determined either above or below the polarizer transport line, and the intended defect inspection may not be performed.

  For example, when the other film is a film that easily causes scratches on the surface, a protective film is laminated on the surface of the other film, and when the polarizer and the other film are bonded, the protective film is removed from the other film. A method of peeling is conceivable. In this case, a peeling mechanism such as a knife edge is installed immediately before bonding the polarizer and another film, and the other film after peeling is bonded to the polarizer while peeling the protective film from the other film. become.

  However, due to the configuration of the production line, the installation space for the peeling mechanism may be provided only on either the upper side or the lower side of the polarizer transport line. In this case, the position of the other film transport line is also limited to either the upper side or the lower side of the polarizer transport line. If the transport line of the other film is limited to the upper side of the transport line of the polarizer, and the other film is bonded to the side opposite to the bonding surface side of the optical member, In the defect inspection apparatus, defect inspection on the bonding surface side of the optical member cannot be performed.

  Therefore, it is conceivable to change the positions of the light source, the imaging device, and the polarization filter in accordance with the configuration of the optical member. . Further, it is necessary to prepare a separate defect inspection apparatus for each configuration of the optical member, which is not realistic. From such a background, there has been a demand for a defect inspection apparatus capable of easily switching defect inspection between one side and the other side of an optical member according to the configuration of the optical member.

  The present invention has been made in view of such circumstances, and provides a defect inspection apparatus and an optical display device production system capable of easily switching defect inspection between one side and the other side of an optical member. The purpose is to provide.

In order to achieve the above object, the present invention employs the following means.
(1) That is, the defect inspection apparatus according to the first aspect of the present invention is a defect inspection apparatus for an optical member including a polarizer, disposed on one side of the optical member, and irradiates the optical member with light. A light source that is disposed on the other side of the optical member and that is disposed on an optical path between the light source and the optical member, and an absorption axis of the polarizer. A first polarizing filter having a first absorption axis orthogonal to the first polarizing filter, and a second polarizing axis disposed on an optical path between the imaging device and the optical member and having a second absorption axis orthogonal to the absorption axis of the polarizer A two-polarization filter, a first moving device for moving the first polarizing filter forward and backward toward an optical path between the light source and the optical member, and a second polarizing filter between the imaging device and the optical member. Move forward and backward toward the optical path of Characterized in that it comprises a dynamic device.

  (2) In the defect inspection apparatus according to (1) above, in the first imaging mode, the first moving filter is moved on the optical path between the light source and the optical member by the first moving device. The absorption axis of the polarizer and the first absorption axis are arranged orthogonally, and the second polarizing filter is displaced from the optical path between the imaging device and the optical member by the second moving device. In the second imaging mode, the first moving device moves the first polarizing filter to a position shifted from the optical path between the light source and the optical member, and the second imaging mode. The moving device moves the second polarizing filter on the optical path between the imaging device and the optical member, and controls to arrange the absorption axis of the polarizer and the second absorption axis orthogonally. Controller may further include a.

  (3) The optical member manufacturing system according to the first aspect of the present invention is an optical member manufacturing system including a polarizer, and an optical member manufacturing apparatus for manufacturing the optical member, and a defect in the optical member. And the defect inspection apparatus according to the above (1) or (2).

  (4) In the optical member manufacturing system according to (3), the optical member includes a polarizer, a first protective layer stacked on one surface of the polarizer, and the other of the polarizers. A second protective layer stacked on a surface, wherein the optical member manufacturing apparatus is disposed on one side of the polarizer supply path, the first supply unit for supplying the polarizer, and the first supply unit. A second supply unit that supplies a laminated member including one protective layer and a third protective layer laminated on one surface of the first protective layer; and disposed on the other side of the supply path of the polarizer. A third supply unit that supplies the second protective layer; and a peeling unit that is disposed on one side of the supply path of the polarizer and peels the third protective layer from the laminated member to form the first protective layer. And may be included.

  (5) The optical display device production system according to the first aspect of the present invention is an optical display device production system in which an optical member is bonded to an optical display component, and is used for transporting the optical member. A bonding apparatus that bonds the optical member conveyed by the conveying apparatus to the optical display component to produce the optical display device, and the optical member that is conveyed from the conveying apparatus to the bonding apparatus. And the defect inspection apparatus according to the above (1) or (2).

  According to the present invention, it is possible to provide a defect inspection apparatus, an optical member manufacturing system, and an optical display device production system capable of easily switching defect inspection between one side and the other side of an optical member. .

It is a side view which shows the manufacturing system of the optical film which concerns on one Embodiment of this invention. It is a side view of the defect inspection apparatus which concerns on one Embodiment of this invention. It is a figure for demonstrating the arrangement | positioning relationship between the 1st absorption axis of a 1st polarizing filter (2nd absorption axis of a 2nd polarizing filter) and the absorption axis of a polarizer film. It is a figure for demonstrating the inspection principle of the defect by a defect inspection apparatus. It is a figure for demonstrating the inspection principle of the defect by a defect inspection apparatus. It is a top view of the defect inspection apparatus which concerns on one Embodiment of this invention. It is a figure which shows the example of bonding with respect to the liquid crystal panel of a polarizing plate (TAC / PVA / TAC). It is a figure which shows the example of bonding with respect to the liquid crystal panel of a polarizing plate (COP / PVA / TAC). It is a figure for demonstrating the defect inspection apparatus in the 1st imaging mode of a polarizing plate (TAC / PVA / TAC). It is a figure which shows the example of bonding with respect to the liquid crystal panel of the polarizing plate in the 1st imaging mode of a polarizing plate (TAC / PVA / TAC). It is a figure for demonstrating the defect inspection apparatus in the 1st imaging mode of a polarizing plate (COP / PVA / TAC). It is a figure which shows the example of bonding with respect to the liquid crystal panel of the polarizing plate in the 1st imaging mode of a polarizing plate (COP / PVA / TAC). It is a figure for demonstrating the defect inspection apparatus in 2nd imaging mode. It is a figure which shows the example of bonding with respect to the liquid crystal panel of the polarizing plate in 2nd imaging mode. It is a side view which shows the apparatus structure of the film bonding system which concerns on one Embodiment of this invention. It is a side view which shows the apparatus structure of the film bonding system which concerns on one Embodiment of this invention. It is a top view of a liquid crystal panel. It is sectional drawing of a polarizing film sheet.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings, but the present invention is not limited to the following embodiments.

  In all the drawings below, the dimensions and ratios of the respective constituent elements are appropriately changed in order to make the drawings easy to see. In the following description and drawings, the same or corresponding elements are denoted by the same reference numerals, and redundant description is omitted.

(Optical member manufacturing system)
FIG. 1 is a side view showing an example of an optical film manufacturing system 100 which is an optical member manufacturing system according to an embodiment of the present invention. Hereinafter, an example in which a polarizing film is produced as an optical film will be described. If the optical film includes at least a polarizer film, in addition to the polarizing film, a plurality of optical elements such as a retardation film and a brightness enhancement film are provided. May be laminated.

  In the following description, an XYZ orthogonal coordinate system is set as necessary, and the positional relationship of each member will be described with reference to this XYZ orthogonal coordinate system. In the present embodiment, the transport direction of the long optical film is the X direction, and the direction (width direction of the long optical film) orthogonal to the X direction in the plane of the optical film is the Y direction, the X direction, and the Y direction. The direction orthogonal to the direction is the Z direction.

  As shown in FIG. 1, an optical film manufacturing system 100 includes an optical film manufacturing apparatus 101 (optical member manufacturing apparatus) that manufactures an optical film F10, and a defect inspection apparatus 102 that inspects the presence or absence of defects in the optical film F10. And.

  The optical film F10 (optical member) used in the present embodiment is, for example, a polarizer film F11 (polarizer) made of PVA (polyvinyl alcohol) or the like, and a COP (cycloolefin polymer) film F13 (first) as a protective film. 1 protective layer) and a TAC (triacetyl cellulose) film F15 (second protective layer).

  In addition to a TAC film and a COP film, a PET (polyethylene terephthalate) film, an MMA (methyl methacrylate) film, or the like can be used as the protective film.

  The optical film manufacturing apparatus 101 supplies a first supply unit 110 that supplies a polarizer film F11, and a second supply that supplies a laminated film F12 having a COP film F13 and a COP film protective film F14 (third protective layer). Part 111, third supply part 112 for supplying TAC film F15, peeling part 113 for peeling COP film protective film F14 from laminated film F12 to form COP film F13, polarizer film F11, COP film F13, A film laminating device 114 that laminates three films of the TAC film F15 to produce one optical film F10, and a winding unit 115 that winds up the optical film F10 are provided.

  The 1st supply part 110 unwinds the polarizer film F11 along the longitudinal direction while hold | maintaining the original fabric roll R11 which wound the strip | belt-shaped polarizer film F11.

  The 2nd supply part 111 unwinds laminated film F12 along the longitudinal direction while holding original fabric roll R12 which wound belt-shaped laminated film F12. The 2nd supply part 111 is arrange | positioned at the one side (+ Z direction side shown in FIG. 1) of the supply path | route of the polarizer film F11.

  The 3rd supply part 112 unwinds the TAC film F15 along the longitudinal direction while hold | maintaining the original fabric roll R15 which wound the strip | belt-shaped TAC film F15. The 3rd supply part 112 is arrange | positioned at the other side (-Z direction side shown in FIG. 1) of the supply path | route of the polarizer film F11.

  The peeling unit 113 has a configuration in which the protective film F14 for COP film is peeled from the laminated film F12 fed out from the second supply unit 111 and wound on a roll. The peeling part 113 has a knife edge 113a and a winding part 113b.

  The protective film F14 for COP films is laminated on one surface of the COP film F13 (on the bonding surface to be bonded to the polarizer film F11). Thereby, it can suppress that the surface (bonding surface bonded with polarizer film F11) of the protective film F14 for COP films is damaged.

  The knife edge 113a extends over at least the entire width in the width direction of the laminated film F12. The knife edge 113a is wound around the laminated film F12 unwound from the raw roll R12 so as to be in sliding contact with the COP film protective film F14 side. The knife edge 113a winds the laminated film F12 at an acute angle at its tip. The knife edge 113a separates the COP film F13 from the protective film F14 for COP film when the laminated film F12 is folded at an acute angle at the tip. The knife edge 113a supplies the COP film F13 to the film laminating apparatus 114.

  The take-up unit 113b takes up the protective film F14 for COP film that has become independent through the knife edge 113a and holds it as a peeling roll R14.

  The peeling unit 113 is disposed between the first supply unit 110 and the second supply unit 111 on one side (+ Z direction side shown in FIG. 1) of the supply path of the polarizer film F11.

  The arrangement configuration of the second supply unit 111, the third supply unit 112, and the peeling unit 113 is not limited to this. For example, both the 2nd supply part 111 and the peeling part 113 are arrange | positioned at the other side (-Z direction side shown in FIG. 1) of the supply path | route of the polarizer film F11, and the 3rd supply part 112 is the polarizer film F11. May be arranged on one side of the supply path (+ Z direction side shown in FIG. 1).

  The film laminating apparatus 114 is provided with a pair of rollers 114a and 114b. A polarizer film F11, a COP film F13, and a TAC film F15 are overlapped and supplied between the rollers 114a and 114b. And by pressing by both rollers 114a and 114b, the polarizer film F11, the COP film F13, and the TAC film F15 are bonded together, and one optical film F10 is manufactured. In addition, the peeling film, the protective film, etc. may be further laminated | stacked on the surface of the COP film F13 and the TAC film F15. The optical film F is transported toward the defect inspection apparatus 102 by a transport roller (not shown).

  The defect inspection apparatus 102 includes a light source 120 arranged above the optical film F10 (+ Z direction side shown in FIG. 1) and an imaging device 122 arranged below the optical film F10 (−Z direction side shown in FIG. 1). A first polarizing filter 121 disposed on the optical path between the light source 120 and the optical film F10, and a second polarizing filter 123 disposed on the optical path between the imaging device 122 and the optical film F10. I have. Details of the defect inspection apparatus 102 will be described later.

  The defect data of the optical film F10 detected by the defect inspection apparatus 102 is stored in the storage device in association with the position of the optical film F10 (the position in the longitudinal direction and the position in the width direction of the optical film F10). The optical film F10 inspected by the defect inspection apparatus 102 is conveyed toward the winding unit 115. And it winds up in roll shape in the winding-up part 115, and roll original fabric R10 of the optical film F10 is manufactured.

(Defect inspection equipment)
FIG. 2 is a side view of the defect inspection apparatus 102 according to an embodiment of the present invention.
In FIG. 2, symbol Sf1 is the upper surface of the optical film F10 (the surface on one side of the optical member), which is the surface on the COP film F13 side. Reference numeral Sf2 is a lower surface of the optical film F10 (the surface on the other side of the optical member), which is a surface on the TAC film F15 side.

  As shown in FIG. 2, the defect inspection apparatus 102 of the present embodiment includes a light source 120 disposed on the upper surface Sf1 side of the optical film F10, an imaging device 122 disposed on the lower surface Sf2 side of the optical film F10, The first polarizing filter 121 disposed on the optical path between the light source 120 and the optical film F10, the second polarizing filter 123 disposed on the optical path between the imaging device 122 and the optical film F10, and the first polarization A first moving device 130 that moves the filter 121 forward and backward toward the optical path between the light source 120 and the optical film F10, and a second polarizing filter 123 that moves forward and backward toward the optical path between the imaging device 122 and the optical film F10. A second moving device 131 to be operated, and a control device 132.

  The control device 132 controls the forward / backward movement of the first polarizing filter 121 and the second polarizing filter 123. The control device 132 can control each of the first moving device 130 and the second moving device 131 independently.

  The center of the light emission surface 120a of the light source 120 and the center of the light receiving surface 122a of the imaging device 122 are arranged coaxially (on the optical axis CL).

  FIG. 3 is a diagram for explaining the positional relationship between the first absorption axis V1 of the first polarizing filter 121 (the second absorption axis V2 of the second polarizing filter 123) and the absorption axis V0 of the polarizer film F11. is there.

  As shown in FIG. 3, the first polarizing filter 121 has a first absorption axis V1 orthogonal to the absorption axis V0 of the polarizer film F11. The first polarizing filter 121 is disposed on the optical path between the light source 120 and the optical film F10 such that the first absorption axis V1 of the first polarizing filter 121 and the absorption axis V0 of the polarizer film F11 are orthogonal to each other ( Cross Nicol arrangement).

  When the first absorption axis V1 of the first polarizing filter 121 and the absorption axis V0 of the polarizer film F11 are arranged in a crossed Nicols arrangement, light does not pass through the overlapping portion SV1 between the first polarizing filter 121 and the polarizer film F11. . Therefore, when the overlapping portion SV1 is picked up by the image pickup device 122, it appears as a dark field unless there is a thing that disturbs the polarization state such as a defect having a phase difference between the first polarizing filter 121 and the polarizer film F11. .

  The second polarizing filter 123 has a second absorption axis V2 orthogonal to the absorption axis V0 of the polarizer film F11. The second polarizing filter 123 is disposed on the optical path between the imaging device 122 and the optical film F10 such that the second absorption axis V2 of the second polarizing filter 123 and the absorption axis V0 of the polarizer film F11 are orthogonal to each other. (Cross Nicol arrangement).

  Even if the second absorption axis V2 of the second polarizing filter 123 and the absorption axis V0 of the polarizer film F11 are arranged in a crossed Nicols arrangement, light is transmitted through the overlapping portion SV2 between the second polarizing filter 123 and the polarizer film F11. do not do. Therefore, even if the overlapping portion SV2 is imaged by the imaging device 122, the dark field is not provided unless a material that disturbs the polarization state such as a defect having a phase difference is disposed between the second polarizing filter 123 and the polarizer film F11. Looks like.

  4 and 5 are diagrams for explaining the inspection principle of the defect E1 by the defect inspection apparatus 102. FIG. FIG. 4 is a diagram when the defect E1 exists in the COP film F13. FIG. 5 is a diagram in the case where there is no defect in the COP film F13, but there is a defect E2 in the TAC film F15. 4 and 5, for convenience, the second polarizing filter 123, the first moving device 130, the second moving device 131, and the control device 132 are not shown.

  As shown in FIG. 4, the light L <b> 1 emitted from the light source 120 toward the optical film F <b> 10 is converted into linearly polarized light L <b> 2 by the first polarizing filter 121. The linearly polarized light L2 obtained by the first polarizing filter 121 is incident on the COP film F13. Then, the polarization state of the linearly polarized light L2 is disturbed by the defect E1 present in the COP film F13, and a part of the light (light L3) whose polarization state is disturbed is transmitted through the polarizer film F11. As a result, the light L3 transmitted through the polarizer film F11 enters the imaging device 122, and the imaging device 122 images the defect E1 brightly as a bright spot.

  As shown in FIG. 5, the light L <b> 1 emitted from the light source 120 toward the optical film F <b> 10 is converted into linearly polarized light L <b> 2 by the first polarizing filter 121. The linearly polarized light L2 obtained by the first polarizing filter 121 is incident on the COP film F13. Then, since there is no defect in the COP film F13, the linearly polarized light L2 cannot pass through the polarizer film F11. As a result, since no light is incident on the imaging device 122, the imaging device 122 captures a black image. In this case, the defect E2 present in the TAC film F15 is not visible.

  Thus, the presence or absence of the defect E1 of the COP film F13 can be determined by detecting the presence of the bright spot. For example, when a bright spot is imaged by the imaging device 122, it is determined that the COP film F13 is “defective”. On the other hand, when a black image is captured by the imaging device 122 (when nothing is captured), it is determined that the COP film F13 is “no defect”.

  FIG. 6 is a plan view of the defect inspection apparatus 102. In FIG. 6, for convenience, the optical film F10 is illustrated.

  As shown in FIG. 6, the light emission surface 120a of the light source 120 that constitutes the defect inspection apparatus 102 is rectangular and has a length along the Y direction. In the present embodiment, the light exit surface 120a of the light source 120 has a length along the width direction orthogonal to the transport direction of the optical film F10. The light emission surface 120a of the light source 120 is formed across the width direction with respect to the optical film F10. For example, a metal halide lamp can be used as the light source 120.

  The first polarizing filter 121 is disposed so as to overlap the outer peripheral portion of the light exit surface 120 a of the light source 120. The first polarizing filter 121 has a longitudinal direction along the Y direction, similarly to the light exit surface 120 a of the light source 120. The first polarizing filter 121 is longer than the light exit surface 120a of the light source 120 in each of the X direction and the Y direction.

  Thereby, when the 1st polarizing filter 121 is arrange | positioned on the optical path between the light source 120 and the optical film F10, all the light inject | emitted from the light source 120 injects into the 1st polarizing filter 121. FIG.

  Similarly to the light exit surface 120a of the light source 120, the imaging device 122 also has a length along the Y direction. For example, a line sensor camera can be used as the imaging device 122.

  The second polarizing filter 123 is disposed so as to overlap with the outer peripheral portion of the light receiving surface 122 a of the imaging device 122. Similar to the light receiving surface 122a of the imaging device 122, the second polarizing filter 123 has a length along the Y direction. The second polarizing filter 123 is longer than the light receiving surface 122a of the imaging device 122 in each of the X direction and the Y direction.

  The optical film F10 described above is cut into a predetermined size by a cutting device (not shown) and is used as a polarizing plate as a sheet piece to be bonded to a liquid crystal panel. A liquid crystal display device as an optical display device is manufactured by bonding the polarizing plate to the liquid crystal panel.

  By the way, in the manufacture of a liquid crystal display device in which a polarizing plate is bonded to a liquid crystal panel, there is a problem that when the polarizing plate is bonded to the liquid crystal panel, the liquid crystal panel warps due to the stress of the polarizing plate.

As a result of intensive studies, the present inventors have found that the state of warping of the liquid crystal panel can be varied by changing the configuration of the polarizing plate.
Hereinafter, a description will be given with reference to FIGS.

FIG. 7 is a diagram illustrating a bonding example of a polarizing plate (TAC / PVA / TAC) with respect to the liquid crystal panel P in which the configuration of the polarizing plate is TAC / PVA / TAC.
As shown in FIG. 7, the adhesion layer F16 is arrange | positioned at the bonding surface with the liquid crystal panel P of a polarizing plate (TAC / PVA / TAC). The polarizing plate (TAC / PVA / TAC) is bonded to the liquid crystal panel P via the adhesive layer F16.

FIG. 8 is a diagram illustrating a bonding example of a polarizing plate (COP / PVA / TAC) with respect to the liquid crystal panel P in which the configuration of the polarizing plate is COP / PVA / TAC.
As shown in FIG. 8, the adhesion layer F16 is arrange | positioned at the bonding surface (surface on the TAC film side) with the liquid crystal panel P of a polarizing plate (COP / PVA / TAC). A polarizing plate (COP / PVA / TAC) arrange | positions a TAC film in the bonding surface side of liquid crystal panel P, and is bonded to liquid crystal panel P through the adhesion layer F16.

  Although the cause is not clear, this inventor arrange | positions a polarizing plate (COP / PVA / TAC) to the liquid crystal panel P by arrange | positioning a TAC film on the bonding surface side of the liquid crystal panel P (FIG. 8). It was found that the state of warping of the liquid crystal panel P can be made different between the case where the polarizing plate (TAC / PVA / TAC) is bonded to the liquid crystal panel P (see FIG. 7).

  Therefore, from the viewpoint of making the state of warping of the liquid crystal panel P different from the case where the polarizing plate (TAC / PVA / TAC) is bonded to the liquid crystal panel P, the configuration of COP / PVA / TAC as shown in FIG. It is desirable to paste the TAC side surface of the polarizing plate with the liquid crystal panel P using the polarizing plate. In this case, the surface on the TAC side of the polarizing plate is a bonding surface with the liquid crystal panel P. Therefore, when manufacturing the optical film F10 using the manufacturing apparatus 100 of FIG. 1, since the COP film F13 is bonded to the upper surface of the polarizer film F11, the polarizing filter of the defect inspection apparatus is optical. It is necessary to install below the conveyance line of the film F10.

  In the case of a configuration in which the polarizing filter is disposed only on the bonding surface side of the polarizing plate as in the conventional defect inspection device, when the configuration of the polarizing plate is changed as shown in FIGS. It is necessary to replace the position with the polarizing filter, which requires a significant change in the device configuration.

  For example, in the case of a polarizing plate (TAC / PVA / TAC), TAC films are disposed on both sides of the PVA film. Therefore, any one side of a pair of TAC films should just be made into the bonding surface side of a polarizing plate, and even if it is a conventional defect inspection apparatus, it is applicable, without changing an apparatus structure.

  However, in the case of a polarizing plate (COP / PVA / TAC), the TAC film is disposed only on one side of the PVA film. Therefore, if the TAC film side is set to the bonding surface side of the polarizing plate so as to change the state of warping of the liquid crystal panel P, in the case of a conventional defect inspection apparatus, the apparatus configuration needs to be significantly changed.

  In particular, as shown in FIG. 1, when the peeling part 113 for peeling the protective film F14 for COP film from the laminated film F12 is disposed only on the upper side of the supply path of the polarizer film F11, the second for supplying the laminated film F12. The supply part 111 is also arrange | positioned above the supply path | route of the polarizer film F11. Therefore, when it is set as the structure by which a polarizing filter is arrange | positioned only in the upper side of the optical film F10 in the conventional defect inspection apparatus, although the defect inspection of the COP film F13 can be performed, of the TAC film F15 used as the bonding surface side of a polarizing plate. Defect inspection is not possible.

  On the other hand, as a countermeasure, it is conceivable to replace the positions of the light source, the polarizing filter, and the imaging device. In addition, it may be possible to provide two defect inspection apparatuses that perform defect inspection on the upper surface side of the optical film F10 and defect inspection apparatuses that perform defect inspection on the lower surface side of the optical film F10 along the conveyance path of the optical film F10. This is not practical because it requires a large installation space and enormous installation costs.

Therefore, in order to solve such a problem, the present invention adopts the following configuration so that the defect inspection between the one surface side and the other surface side of the optical film can be easily switched.
As shown in FIG. 2, the defect inspection apparatus 102 according to an embodiment of the present invention is disposed on the upper side of the optical film F10, and a light source 120 that irradiates light to the optical film F10, and a lower side of the optical film. An imaging device 122 that is disposed and captures a transmitted light image of the optical film, and is disposed on an optical path between the light source 120 and the optical film F10, and has a first absorption axis that is orthogonal to the absorption axis of the polarizer film F11. A first polarizing filter 121, a second polarizing filter 123 disposed on an optical path between the imaging device 122 and the optical film F10, and having a second absorption axis perpendicular to the absorption axis of the polarizer film F11; A first moving device 130 for moving the polarizing filter 121 forward and backward toward the optical path between the light source 120 and the optical film F10, and a second polarizing filter 123 for the imaging device. A second moving device 131 for advancing and retracting toward the optical path between the 22 and the optical film F10, characterized in that it comprises a.

  According to this configuration, the polarizing filter is disposed on both the upper surface side and the lower surface side of the optical film F10. Therefore, defect inspection on the upper surface side and the lower surface side of the optical film F10 is facilitated by moving each polarizing filter forward and backward on the optical path between the light source 10 and the imaging device 122 according to the configuration of the optical film F10. Can be switched. Therefore, it is possible to easily cope with the defect inspection of the optical film F10 having various configurations while having a space-saving and inexpensive configuration.

FIG. 9 is a diagram for explaining the defect inspection apparatus 102 in the first imaging mode of the polarizing plate (TAC (1) / PVA / TAC (2)).
FIG. 10 is a diagram illustrating a bonding example of the polarizing plate (TAC (1) / PVA / TAC (2)) to the liquid crystal panel P in the first imaging mode.
FIG. 11 is a diagram for explaining the defect inspection apparatus 102 in the first imaging mode of the polarizing plate (COP / PVA / TAC). FIG. 12 is a diagram illustrating a bonding example of the polarizing plate (COP / PVA / TAC) to the liquid crystal panel P in the first imaging mode.
FIG. 13 is a diagram for explaining the defect inspection apparatus 102 in the second imaging mode.
FIG. 14 is a diagram illustrating an example of bonding of the polarizing plate to the liquid crystal panel P in the second imaging mode.
9, 11, and 13, for convenience, the first moving device 130, the second moving device 131, and the control device 132 are not shown. 9 and 10, the TAC film on the bonding surface side of the polarizing plate is the TAC (1) film “TAC (1)”, and the TAC film on the opposite side to the bonding surface side of the polarizing plate is TAC (2). It is shown as the film “TAC (2)”.

  As shown in FIG. 9, in the first imaging mode, the control device 132 causes the first moving device 130 to change the first polarizing filter 121 to the light source 120 and the polarizing plate (TAC (1) / PVA / TAC (2)). On the optical path between them (the first position Q1 on the optical axis CL), the absorption axis of the PVA film and the first absorption axis of the first polarizing filter 121 are arranged orthogonally, and the second A position where the second polarizing filter 123 is shifted from the optical path between the imaging device 122 and the polarizing plate (TAC (1) / PVA / TAC (2)) by the moving device 131 (second position shifted from the optical axis CL). Control to move to Q2) is performed.

  Specifically, in the first imaging mode, the controller 132 causes the first moving device 130 to place the center of the first polarizing filter 121 at the first position Q1 on the optical axis CL and to absorb the PVA film. And the first absorption axis of the first polarizing filter 121 are arranged orthogonal to each other, and the center of the second polarizing filter 123 is arranged at the second position Q2 shifted from the optical axis CL by the second moving device 131. Take control.

  The second position Q2 is set to a position where the second polarizing filter 123 is retracted from the visual field range of the imaging device 122. If the second position Q2 is too close to the optical axis CL, the second polarizing filter 123 enters the visual field range of the imaging device 122. On the other hand, if the second position Q2 is too far from the optical axis CL, it takes time to move the second polarizing filter 123 to a position on the optical axis CL, and it becomes difficult to smoothly shift to another imaging mode. From such a viewpoint, the second position Q2 is set to a distance in the range of 30 mm to 50 mm from the optical axis CL. The second position Q2 is more preferably set to a distance in the range of 35 mm to 45 mm from the optical axis CL.

  In the first imaging mode, the absorption axis of the PVA film and the first absorption axis of the first polarizing filter 121 are arranged in crossed Nicols. In the first imaging mode, the defect inspection of the TAC film (1) disposed on the optical path between the first polarizing filter 121 and the PVA film can be performed.

  The light emitted from the light source 120 toward the polarizing plate (TAC (1) / PVA / TAC (2)) is converted into linearly polarized light by the first polarizing filter 121. The linearly polarized light obtained by the first polarizing filter 121 is incident on the TAC film (1). When there is no defect in the TAC film (1), the light transmitted through the TAC film (1) is blocked by the PVA film. For this reason, the imaging device 122 captures a black image. In this case, the TAC film (1) is determined as “no defect”.

  On the other hand, when the TAC film (1) has a defect, the linearly polarized light incident on the TAC film (1) is disturbed in the polarization state by the defect, and a part of the light whose polarization state is disturbed is transmitted through the PVA film. As a result, the light transmitted through the PVA film enters the image pickup device 122, and the image pickup device 122 picks up an image of the defect as a bright spot. In this case, the TAC film (1) is determined as “defect”.

  Thus, by the first imaging mode, it is possible to perform a crossed Nicol transmission inspection on the side of the TAC film (1) laminated on the upper surface of the PVA film, and the polarizing plate (TAC (1) / PVA / TAC (1)). And defect inspection on the bonding surface side of the liquid crystal panel P can be performed.

  As shown in FIG. 10, the adhesion layer F16 is arrange | positioned at the bonding surface (surface of TAC (1)) of liquid crystal panel P of a polarizing plate (TAC (1) / PVA / TAC (2)). The polarizing plate (TAC (1) / PVA / TAC (2)) is bonded to the liquid crystal panel P via the adhesive layer F16.

  As shown in FIG. 11, in the case of a polarizing plate (COP / PVA / TAC), the same control as that in the first imaging mode described with reference to FIG. 9 can be performed.

  In the case of the polarizing plate (COP / PVA / TAC), in the first imaging mode, a defect inspection of the COP film disposed on the optical path between the first polarizing filter 121 and the PVA film can be performed.

  Light emitted from the light source 120 toward the polarizing plate (COP / PVA / TAC) is converted into linearly polarized light by the first polarizing filter 121. The linearly polarized light obtained by the first polarizing filter 121 is incident on the COP film. When there is no defect in the COP film, the light transmitted through the COP film is blocked by the PVA film. For this reason, the imaging device 122 captures a black image. In this case, the COP film is determined to be “no defect”.

  On the other hand, when the COP film has a defect, the linearly polarized light incident on the COP film is disturbed in the polarization state by the defect, and a part of the light whose polarization state is disturbed is transmitted through the PVA film. As a result, the light transmitted through the PVA film enters the image pickup device 122, and the image pickup device 122 picks up an image of the defect as a bright spot. In this case, the COP film is determined as “defect”.

  Thus, by the first imaging mode, the crossed Nicol transmission inspection of the COP film laminated on the upper surface of the PVA film can be performed, and the COP film serving as the bonding surface side of the polarizing plate (COP / PVA / TAC) Defect inspection can be performed.

  As shown in FIG. 12, the adhesion layer F16 is arrange | positioned at the bonding surface (surface of COP) of liquid crystal panel P of a polarizing plate (COP / PVA / TAC). A polarizing plate (COP / PVA / TAC) arrange | positions a COP film on the bonding surface side of liquid crystal panel P, and is bonded to liquid crystal panel P through the adhesion layer F16.

  As shown in FIG. 13, in the second imaging mode, the control device 132 causes the first moving device 130 to move the first polarizing filter 121 from the optical path between the light source 120 and the polarizing plate (COP / PVA / TAC). The second polarizing filter 123 is moved between the imaging device 122 and the polarizing plate (COP / PVA / TAC) by the second moving device 131 by moving to a shifted position (third position Q3 shifted from the optical axis CL). On the optical path (fourth position Q4 on the optical axis CL) and control is performed so that the absorption axis of the PVA film and the second absorption axis of the second polarizing filter 123 are arranged orthogonally.

  Specifically, in the second imaging mode, the control device 132 causes the first moving device 130 to place the center of the first polarizing filter 121 at the third position Q3 that is shifted from the optical axis CL, and the second imaging mode. The center of the second polarizing filter 123 is arranged at the fourth position Q4 on the optical axis CL by the moving device 131, and the absorption axis of the PVA film and the second absorption axis of the second polarizing filter 123 are arranged orthogonally. Take control.

  The third position Q3 is set to a position where the light emitted from the light source 120 can be prevented from being blocked by the crossed Nicols arrangement of the first polarizing filter 121 and the PVA film. If the third position Q3 is too close to the optical axis CL, a part of the light emitted from the light source 120 is blocked by the crossed Nicols arrangement of the first polarizing filter 121 and the PVA film. On the other hand, if the third position Q3 is too far from the optical axis CL, it takes time to move the first polarizing filter 121 to a position on the optical axis CL, and it becomes difficult to smoothly shift to another imaging mode. From such a viewpoint, the third position Q3 is set to a distance in the range of 30 mm to 50 mm from the optical axis CL. The third position Q3 is more preferably set to a distance in the range of 35 mm to 45 mm from the optical axis CL.

  In the second imaging mode, the absorption axis of the PVA film and the second absorption axis of the second polarizing filter 123 are arranged in crossed Nicols. In the second imaging mode, the defect inspection of the TAC film disposed on the optical path between the PVA film and the second polarizing filter 123 can be performed.

  The light emitted from the light source 120 toward the polarizing plate (COP / PVA / TAC) is transmitted through the COP film and is linearly polarized by the PVA film. The linearly polarized light obtained by the PVA film is incident on the TAC film. When there is no defect in the TAC film, the light transmitted through the TAC film is blocked by the second polarizing filter 123. For this reason, the imaging device 122 captures a black image. In this case, the TAC film is determined as “no defect”.

  On the other hand, when the TAC film has a defect, the linearly polarized light incident on the TAC film is disturbed in the polarization state by the defect, and a part of the light whose polarization state is disturbed passes through the second polarizing filter 123. As a result, the light transmitted through the second polarizing filter 123 enters the imaging device 122, and the imaging device 122 captures a bright image of the defect as a bright spot. In this case, it is determined that the TAC film is “defective”.

  Thus, by the second imaging mode, the cross nicols transmission inspection of the TAC film laminated on the lower surface of the PVA film can be performed, and the TAC film which becomes the bonding surface side of the polarizing plate (COP / PVA / TAC). Defect inspection can be performed.

  As shown in FIG. 14, the adhesion layer F16 is arrange | positioned at the bonding surface (surface of a TAC film) of liquid crystal panel P of a polarizing plate (COP / PVA / TAC). A polarizing plate (COP / PVA / TAC) arrange | positions a TAC film in the bonding surface side of liquid crystal panel P, and is bonded to liquid crystal panel P through the adhesion layer F16. This configuration is an effective configuration as a countermeasure against warping of the liquid crystal panel P.

  In each imaging mode, the light source 120 and the imaging device 122 are fixed at fixed positions.

  As described above, the defect inspection apparatus 102 according to the present embodiment can freely select the first imaging mode and the second imaging mode under the control of the control device 132. Therefore, even if the configuration of the polarizing plates is different, the defect on the bonding surface side of each polarizing plate can be detected by the same defect inspection apparatus 102. That is, according to this embodiment, it is not necessary to exchange the positions of the light source and the imaging device, and no significant change in the device configuration is required. Therefore, according to this embodiment, it is possible to easily switch the defect inspection between the one surface side and the other surface side of the optical film F10.

In this embodiment, the optical film F10 includes a COP film F13 laminated on the upper surface of the polarizer film F11 and a TAC film F15 laminated on the lower surface of the polarizer film F11. The portion 113 is disposed on the upper side of the supply path of the polarizer film F11. According to the inventors' diligent research, when the polarizing plate (COP / PVA / TAC) is disposed on the bonding surface side of the liquid crystal panel P and bonded to the liquid crystal panel P, the warping state of the liquid crystal panel P is different. It becomes clear that it can be applied, and a defect inspection on the TAC film side that becomes the bonding surface side of the polarizing plate (COP / PVA / TAC) may be necessary.
However, in this case, if the polarizing filter is disposed only on the upper side of the optical film, the defect inspection on the TAC film side that is the bonding surface side of the polarizing plate cannot be performed as it is. Therefore, it is necessary to change the positions of the light source, the polarizing filter, and the image pickup device, and the device configuration needs to be significantly changed.
On the other hand, according to this embodiment, it is possible to perform defect inspection on the TAC film side, which is the bonding surface side of the polarizing plate, simply by switching to the second imaging mode using the same defect inspection apparatus 102.

  Further, in each imaging mode, since the light source 120 and the imaging device 122 are configured to be fixed in place, the defect inspection on the bonding surface side of the optical film F10 is performed as compared with the configuration in which the light source and the imaging device are moved. It can be done easily.

(Optical display device production system)
Hereinafter, the film bonding system 1 which comprises the one part is demonstrated as a production system of the optical display device which concerns on one Embodiment of this invention. The film bonding system 1 which concerns on this embodiment is comprised by the defect inspection apparatus 102 which the 1st defect inspection apparatus 9 and the 2nd defect inspection apparatus mentioned above.

FIG.15 and FIG.16 is a side view which shows the apparatus structure of the film bonding system 1 of this embodiment.
The film bonding system 1 bonds a film-shaped optical member such as a polarizing film, an antireflection film, and a light diffusion film to a panel-shaped optical display component such as a liquid crystal panel or an organic EL panel.

  In the following description, an XYZ orthogonal coordinate system is set as necessary, and the positional relationship of each member will be described with reference to this XYZ orthogonal coordinate system. In the present embodiment, the transport direction of the liquid crystal panel, which is an optical display component, is the X direction, and the direction orthogonal to the X direction (the width direction of the liquid crystal panel) in the plane of the liquid crystal panel is the Y direction, X direction, and Y direction. The direction orthogonal to the Z direction is taken as the Z direction.

  In addition, in this embodiment, liquid crystal panel P is illustrated as an optical display component, and the double-sided bonding panel formed by bonding the bonding sheet | seat F5 on the front and back both surfaces of liquid crystal panel P is illustrated as an optical member bonding body. However, the present invention is not limited to this.

  As shown in FIG.15 and FIG.16, the film bonding system 1 of this embodiment is provided as one process of the manufacturing line of liquid crystal panel P. As shown in FIG. Each part of the film bonding system 1 is comprehensively controlled by the control part 2 as an electronic control apparatus.

  The film bonding system 1 of this embodiment turns 90 degrees in the middle of the attitude | position of the liquid crystal panel P with respect to the conveyance direction of the liquid crystal panel P. The film bonding system 1 bonds the polarizing film F1 on the front and back surfaces of the liquid crystal panel P so that the polarization axes are orthogonal to each other.

  FIG. 17 is a plan view of the liquid crystal panel P viewed from the thickness direction of the liquid crystal layer P3. The liquid crystal panel P includes a first substrate P1 that has a rectangular shape in plan view, a second substrate P2 that has a relatively small rectangular shape that is disposed to face the first substrate P1, a first substrate P1, and a second substrate. And a liquid crystal layer P3 sealed between the substrate P2. The liquid crystal panel P has a rectangular shape that follows the outer shape of the first substrate P1 in a plan view, and a region that fits inside the outer periphery of the liquid crystal layer P3 in a plan view is a display region P4.

FIG. 18 is a cross-sectional view of the optical sheet F including the optical member F1 bonded to the liquid crystal panel P. In FIG. 18, for convenience, hatching of each layer in the cross-sectional view is omitted.
As shown in FIG. 18, the optical sheet F includes a film-like optical member F1, an adhesive layer F2 provided on one surface (upper surface in the drawing) of the optical member F1, and the optical member F1 via the adhesive layer F2. The separator F3 is detachably stacked on one surface of the optical member F1, and the surface protective film F4 is stacked on the other surface (lower surface in the drawing) of the optical member F1. The optical member F1 functions as a polarizing plate, and is bonded over the entire display area P4 of the liquid crystal panel P and its peripheral area.

  The optical member F1 is bonded to the liquid crystal panel P via the adhesive layer F2 in a state where the separator F3 is separated while leaving the adhesive layer F2 on one surface thereof. Hereinafter, the part remove | excluding the separator F3 from the optical sheet F is called the bonding sheet | seat F5.

  The separator F3 protects the adhesive layer F2 and the optical member F1 until it is separated from the adhesive layer F2. The surface protective film F4 is bonded to the liquid crystal panel P together with the optical member F1. The surface protective film F4 is disposed on the side opposite to the liquid crystal panel P with respect to the optical member F1, protects the optical member F1, and is separated from the optical member F1 at a predetermined timing. The optical sheet F may be configured not to include the surface protective film F4, or the surface protective film F4 may be configured not to be separated from the optical member F1.

  The optical member F1 includes a sheet-like polarizer F6, a first film F7 bonded to one surface of the polarizer F6 with an adhesive or the like, and a first film F7 bonded to the other surface of the polarizer F6 with an adhesive or the like. 2 film F8. The first film F7 and the second film F8 are protective films that protect the polarizer F6, for example.

  The optical member F1 may have a single-layer structure including a single optical layer, or may have a stacked structure in which a plurality of optical layers are stacked on each other. The optical layer may include a retardation film, a brightness enhancement film, and the like in addition to the polarizer F6. At least one of the first film F7 and the second film F8 may be subjected to a surface treatment capable of obtaining an effect such as a hard coat treatment for protecting the outermost surface of the liquid crystal display element or an antiglare treatment. The optical member F1 may not include at least one of the first film F7 and the second film F8. For example, when the first film F7 is omitted, the separator F3 may be bonded to one surface of the optical member F1 via the adhesive layer F2.

Next, the film bonding system 1 of this embodiment is demonstrated in detail.
As shown in FIG.15 and FIG.16, the film bonding system 1 of this embodiment is the conveyance direction downstream of the liquid crystal panel P of the left side in a figure from the conveyance direction upstream side (+ X direction side) of the liquid crystal panel P of the right side in a figure. A driving roller conveyor 3 is provided which reaches the side (−X direction side) and conveys the liquid crystal panel P in a horizontal state.

  The roller conveyor 3 is divided into an upstream conveyor and a downstream conveyor with a reversing device (not shown) as a boundary. In the upstream conveyor, the liquid crystal panel P is transported so that the long side of the display area P4 is along the transport direction. On the other hand, on the downstream conveyor, the liquid crystal panel P is transported so that the short side of the display area P4 is along the transport direction. A bonding sheet F5 cut out to a predetermined length from the belt-shaped optical sheet F is bonded to the front and back surfaces of the liquid crystal panel P.

  The film bonding system 1 of the present embodiment includes a first supply device 7, a first bonding device 11, a reversing device, a second supply device, a second bonding device, an inspection device, and a control unit 2. In addition, about the inversion apparatus, the 2nd supply apparatus, the 2nd bonding apparatus, and the test | inspection apparatus, the illustration is abbreviate | omitted for convenience.

  In FIG. 15, the 1st supply apparatus 7 is mentioned and demonstrated as an apparatus structure of the film bonding system 1 among a 1st supply apparatus and a 2nd supply apparatus. Since the second supply device has the same configuration as that of the first supply device 7, detailed description thereof is omitted.

  As shown in FIG. 15, the 1st supply apparatus 7 draws out the optical sheet F from the original fabric roll R1 which wound the strip | belt-shaped optical sheet F, and supplies it after cut | disconnecting to predetermined size. The first supply device 7 includes a first transport device 8, a pre-inspection peeling device 18, a first defect inspection device 9, a post-inspection bonding device 19, and a first cutting device 10.

  The first transport device 8 is a transport mechanism that transports the optical sheet F along its longitudinal direction. The 1st conveying apparatus 8 has the roll holding | maintenance part 8a, the nip roller 8b, the guide roller 8c, the accumulator 8d, and the winding-up part 8e (refer FIG. 16).

  The roll holding unit 8a holds the original roll R1 around which the belt-shaped optical sheet F is wound, and feeds the optical sheet F along its longitudinal direction.

  The nip roller 8b sandwiches the optical sheet F so as to guide the optical sheet F unwound from the original roll R1 along a predetermined conveyance path.

  The guide roller 8c changes the traveling direction of the optical sheet F being conveyed along the conveyance path. At least one of the plurality of guide rollers 8c functions as a tension roller. That is, it moves to adjust the tension of the optical sheet F being conveyed.

  The accumulator 8d absorbs the feeding amount of the optical sheet F conveyed from the roll holding unit 8a while the optical sheet F is cut by the first cutting device 10.

  The roll holding unit 8a positioned at the start point of the first transport device 8 and the winding unit 8e (see FIG. 16) positioned at the end point of the first transport device 8 are driven in synchronization with each other, for example. Thereby, the winding part 8e winds up the separator F3 which passed through the 1st bonding apparatus 11, while the roll holding | maintenance part 8a pays out the optical sheet F to the conveyance direction. Hereinafter, the upstream side in the transport direction of the optical sheet F (separator F3) in the first transport device 8 is referred to as a sheet transport upstream side, and the downstream side in the transport direction is referred to as a sheet transport downstream side.

  The pre-inspection peeling device 18 has a configuration in which the first separator H1 (corresponding to the separator F3) is peeled from the optical sheet F conveyed from the upstream side of the sheet conveyance and wound on a roll. The pre-inspection peeling device 18 includes a knife edge 18a and a winding portion 18b.

  The knife edge 18a extends at least over its entire width in the width direction of the optical sheet F. The knife edge 18a is wound so as to be in sliding contact with the first separator H1 side of the optical sheet F unwound from the raw roll R1. The knife edge 18a winds the optical sheet F at an acute angle at its tip. The knife edge 18a separates the bonding sheet F5 from the first separator H1 when the optical sheet F is folded back at an acute angle at the tip portion. The knife edge 18a supplies the bonding sheet F5 to the first defect inspection apparatus 9.

  The winding unit 18b winds up the first separator H1 that has become independent through the knife edge 18a and holds it as a first separator roll R2.

  The 1st defect inspection apparatus 9 performs the defect inspection of the optical sheet F after peeling of the 1st separator H1, ie, the bonding sheet | seat F5. The first defect inspection device 9 analyzes the image data picked up by the CCD camera to inspect for the presence or absence of a defect, and if there is a defect, calculates the position coordinates. The position coordinates of this defect are provided for the skip cut by the first cutting device 10. The first defect inspection apparatus 9 is configured by the defect inspection apparatus 102 described above.

  The post-inspection bonding apparatus 19 bonds the second separator H2 (corresponding to the separator F3) to the bonding sheet F5 after the defect inspection through the adhesive layer F2. The post-inspection bonding apparatus 19 includes a roll holding unit 19a and a pinching roll 19b.

  The roll holding portion 19a holds the second separator roll R3 around which the band-shaped second separator H2 is wound and feeds the second separator H2 along the longitudinal direction thereof.

  The pinching roll 19b bonds the second separator H2 unwound from the second separator roll R3 to the lower surface (surface on the adhesive layer F2 side) of the bonding sheet F5 after defect inspection conveyed from the sheet conveying upstream side. . The pinching roll 19b has a pair of bonding rollers arranged in parallel with each other in the axial direction (the upper bonding roller moves up and down). A predetermined gap is formed between the pair of bonding rollers, and the inside of this gap is the bonding position of the post-inspection bonding apparatus 19. In the gap, the bonding sheet F5 and the second separator H2 are overlapped and introduced. The bonding sheet F5 and the bonding sheet F5 are sent out to the downstream side of the sheet conveyance while being pressed by the pressing roll 19b. Thereby, the 2nd separator H2 is bonded by the lower surface of the bonding sheet | seat F5 after a defect test | inspection, and the optical sheet F is formed.

  The first cutting device 10 performs a half cut for cutting a part in the thickness direction of the optical sheet F over the entire width in the width direction orthogonal to the longitudinal direction of the optical sheet F when the optical sheet F is fed out a predetermined length. Do.

  The first cutting device 10 adjusts the advancing / retreating position of the cutting blade so that the optical sheet F (separator F3) is not broken by the tension acting during the conveyance of the optical sheet F (so that a predetermined thickness remains in the separator F3). Then, half-cutting is performed to the vicinity of the interface between the adhesive layer F2 and the separator F3. In addition, you may use the laser apparatus replaced with a cutting blade.

  In the optical sheet F after half-cutting, the optical member F1 and the surface protection film F4 are cut in the thickness direction, whereby a cut line extending over the entire width in the width direction of the optical sheet F is formed. A plurality of cutting lines are formed so as to be arranged in the longitudinal direction of the belt-shaped optical sheet F. For example, in the case of the bonding process which conveys liquid crystal panel P of the same size, a plurality of score lines are formed at equal intervals in the longitudinal direction of optical sheet F. The optical sheet F is divided into a plurality of sections in the longitudinal direction by the plurality of cut lines. Each section sandwiched between a pair of cut lines adjacent in the longitudinal direction in the optical sheet F is a sheet piece in the bonding sheet F5.

  Based on the position coordinates of the defect calculated by the first defect inspection apparatus 9, the first cutting apparatus 10 cuts to a predetermined size so as to avoid a defective portion (skip cut). A cut product including a defective portion is excluded as a defective product in a subsequent process. Note that the first cutting apparatus 10 may continuously cut the optical sheet F into a predetermined size while ignoring the defective portion. In this case, in the bonding step between the bonding sheet F5 and the liquid crystal panel P, the cut product including the defective portion can be removed without bonding to the liquid crystal panel P.

  In FIG. 16, the 1st bonding apparatus 11 is mentioned and demonstrated as a apparatus structure of the film bonding system 1 among a 1st bonding apparatus and a 2nd bonding apparatus. Since the 2nd bonding apparatus is the structure similar to the 1st bonding apparatus 11, the detailed description is abbreviate | omitted.

  As shown in FIG. 16, the 1st bonding apparatus 11 bonds the bonding sheet | seat F5 cut into the predetermined size with respect to the upper surface of liquid crystal panel P introduced into the bonding position. The 1st bonding apparatus 11 has the knife edge 11a and the pinching roll 11b.

  The knife edge 11a supplies the bonding sheet F5 to the bonding position while winding the optical sheet F subjected to a half cut at an acute angle to separate the bonding sheet F5 from the separator F3.

  The pinching roll 11b bonds the bonding sheet F5 having a predetermined length separated from the optical sheet F by the knife edge 11a to the upper surface of the liquid crystal panel P conveyed by the upstream conveyor. The pinching roll 11b has a pair of laminating rollers that are arranged with their axial directions parallel to each other. A predetermined gap is formed between the pair of bonding rollers, and the inside of this gap is the bonding position of the first bonding apparatus 11. The liquid crystal panel P and the bonding sheet F5 are overlapped and introduced into the gap. These liquid crystal panel P and the bonding sheet | seat F5 are sent out to the panel conveyance downstream of an upstream conveyor, being pinched by the pinching roll 11b. Thereby, the bonding sheet | seat F5 is bonded integrally on the upper surface of liquid crystal panel P. FIG. Hereinafter, the panel after this bonding is called single-sided bonding panel P11.

  The winding unit 8e winds up the second separator H2 that has become independent through the knife edge 11a, and holds it as a second separator roll R4.

  The reversing device (not shown) conveys the liquid crystal panel P, which is provided downstream of the first bonding device 11 and reaches the end position of the upstream conveyor, to the start position of the downstream conveyor.

  The reversing device holds the single-sided bonding panel P11 that has reached the end position of the upstream conveyor via the first bonding device 11 by suction or clamping. The reversing device reverses the front and back of the single-sided bonding panel P11. The reversing device changes the direction so that, for example, the single-sided bonding panel P11 that has been conveyed in parallel with the long side of the display area P4 is conveyed in parallel with the short side of the display area P4.

  The inversion is performed when the optical members F1 bonded to the front and back surfaces of the liquid crystal panel P are arranged so that the directions of the polarization axes are perpendicular to each other.

  Note that when the front and back of the liquid crystal panel P are simply reversed, for example, a reversing device having a reversing arm having a rotation axis parallel to the transport direction may be used. In this case, if the sheet conveying direction of the first supply device 7 and the sheet conveying direction of the second supply device are arranged so as to be perpendicular to each other in a plan view, the optical axes in which the polarization axis directions are perpendicular to each other on the front and back surfaces of the liquid crystal panel P. The member F1 can be bonded.

  Since the second supply device has the same configuration as that of the first supply device 7, detailed description thereof is omitted. The second supply device draws the optical sheet F from the raw roll around which the belt-shaped optical sheet F is wound, and supplies the optical sheet F after cutting it into a predetermined size. Although not shown, the second supply device includes a second transport device, a pre-inspection peeling device, a second defect inspection device, a post-inspection bonding device, and a second cutting device.

  A 2nd bonding apparatus bonds the bonding sheet | seat F5 cut into predetermined size with respect to the upper surface of liquid crystal panel P introduce | transduced into the bonding position. The 2nd bonding apparatus has the same knife edge as the 1st bonding apparatus 11, and a pinching roll.

  The single-sided bonding panel P11 and the bonding sheet F5 are introduced into the gap between the pair of bonding rollers of the pinching roll (the bonding position of the second bonding apparatus), and the single-sided bonding panel P11. A bonding sheet F5 is integrally bonded to the upper surface of the sheet. Hereinafter, this panel after bonding is referred to as a double-sided bonding panel (optical member bonding body).

  The inspection device (not shown) is provided on the panel transport downstream side with respect to the second bonding device. The inspection device inspects for the presence or absence of defects (such as poor bonding) on the double-sided bonded panel. Examples of defects to be inspected include defects such as bites of foreign substances and bubbles when bonding the liquid crystal panel and the bonding sheet, scratches on the surface of the bonding sheet, and alignment defects inherent in the liquid crystal panel. .

  In addition, in this embodiment, the control part 2 as an electronic control apparatus which performs overall control of each part of the film bonding system 1 is comprised including the computer system. This computer system includes an arithmetic processing unit such as a CPU and a storage unit such as a memory and a hard disk. The control unit 2 of the present embodiment includes an interface that can execute communication with an external device of the computer system. An input device that can input an input signal may be connected to the control unit 2. The input device includes an input device such as a keyboard and a mouse, or a communication device that can input data from a device external to the computer system. The control unit 2 may include a display device such as a liquid crystal display that indicates the operation status of each unit of the film bonding system 1 or may be connected to the display device.

  An operating system (OS) that controls the computer system is installed in the storage unit of the control unit 2. The storage unit of the control unit 2 includes a program for causing the arithmetic processing unit to control each unit of the film bonding system 1 to execute processing for causing each unit of the film bonding system 1 to accurately convey the optical sheet F. It is recorded. Various types of information including programs recorded in the storage unit can be read by the arithmetic processing unit of the control unit 2. The control unit 2 may include a logic circuit such as an ASIC that performs various processes required for controlling each unit of the film bonding system 1.

  The storage unit is a concept including a semiconductor memory such as a RAM (Random Access Memory) and a ROM (Read Only Memory), an external storage device such as a hard disk, a CD-ROM reader, and a disk-type storage medium. Functionally, the storage unit includes program software in which the control procedure of the operation of the first supply device 7, the first bonding device 11, the reversing device, the second supply device, the second bonding device, and the inspection device is described. A storage area to be stored and various other storage areas are set.

  As described above, since the first defect inspection apparatus 9 of the present embodiment is configured by the defect inspection apparatus 102 described above, the same defect inspection apparatus 102 even when the configuration of the bonding sheet F5 is different. By this, it is possible to detect a defect on the bonding surface side of each bonding sheet F5. Therefore, according to this embodiment, it is possible to easily switch the defect inspection between the one surface side and the other surface side of the bonding sheet F5.

  As mentioned above, although the suitable embodiment example which concerns on this embodiment was demonstrated referring an accompanying drawing, it cannot be overemphasized that this invention is not limited to the example which concerns. Various shapes, combinations, and the like of the constituent members shown in the above-described examples are examples, and various modifications can be made based on design requirements and the like without departing from the gist of the present invention.

DESCRIPTION OF SYMBOLS 1 ... Film bonding system (production system of an optical display device), 8 ... 1st conveying apparatus (conveying apparatus), 9 ... 1st defect inspection apparatus (defect inspection apparatus), 11 ... 1st bonding apparatus (bonding apparatus) ), 100 ... Optical film manufacturing system (optical member manufacturing system), 101 ... Optical film manufacturing apparatus (optical member manufacturing apparatus), 102 ... Defect inspection apparatus, 110 ... First supply unit, 111 ... Second supply Part 112 112 third supply part 113 peeling unit 120 light source 121 first polarizing filter 122 imaging device 123 second polarizing filter 130 first moving unit 131 second moving unit , 132 ... control device, CL ... optical axis, P ... liquid crystal panel (optical display component), F1 ... optical member, F10 ... optical film (optical member), F11 ... polarizer film (polarizer), F12 ... laminated film Rum (laminated member), F13 ... COP film (first protective layer), F14 ... COP film protective film (second protective layer), F15 ... TAC film (second protective layer), Sf1 ... lower surface (one of the optical members) Side surface), Sf2... Upper surface (surface on the other side of the optical member)

Claims (5)

A defect inspection apparatus for an optical member including a polarizer,
A light source disposed on one side of the optical member and irradiating the optical member with light;
An imaging device that is disposed on the other side of the optical member and captures a transmitted light image of the optical member;
A first polarizing filter disposed on an optical path between the light source and the optical member and having a first absorption axis perpendicular to the absorption axis of the polarizer;
A second polarizing filter disposed on an optical path between the imaging device and the optical member and having a second absorption axis perpendicular to the absorption axis of the polarizer;
A first moving device for moving the first polarizing filter forward and backward toward an optical path between the light source and the optical member;
A second moving device for moving the second polarizing filter forward and backward toward an optical path between the imaging device and the optical member;
Including defect inspection equipment. In the first imaging mode, the first moving device moves the first polarizing filter on the optical path between the light source and the optical member, and moves the absorption axis of the polarizer and the first absorption axis. Arranged orthogonally, and moved the second polarizing filter to a position shifted from the optical path between the imaging device and the optical member by the second moving device,
In the second imaging mode, the first moving device moves the first polarizing filter to a position shifted from the optical path between the light source and the optical member, and the second moving device moves the second polarizing filter to the second position. The apparatus further includes a control device configured to move a polarizing filter on an optical path between the imaging device and the optical member, and to control to arrange the absorption axis of the polarizer and the second absorption axis orthogonal to each other. The defect inspection apparatus according to 1. A manufacturing system of an optical member including a polarizer,
An optical member manufacturing apparatus for manufacturing the optical member;
The defect inspection apparatus according to claim 1 or 2, wherein the optical member is inspected for defects.
An optical member manufacturing system including: The optical member is
A polarizer, a first protective layer laminated on one surface of the polarizer, and a second protective layer laminated on the other surface of the polarizer,
The manufacturing apparatus for the optical member comprises:
A first supply unit for supplying the polarizer;
A second supply that supplies a laminated member that is disposed on one side of the supply path of the polarizer and includes the first protective layer and a third protective layer laminated on one surface of the first protective layer. And
A third supply unit arranged on the other side of the supply path of the polarizer and supplying the second protective layer;
A peeling portion that is disposed on one side of the supply path of the polarizer and peels the third protective layer from the laminated member to form the first protective layer;
The manufacturing system of the optical member of Claim 3 containing this. An optical display device production system in which an optical member is bonded to an optical display component,
A transport device for transporting the optical member;
A bonding apparatus for manufacturing the optical display device by bonding the optical member conveyed by the conveyance apparatus to the optical display component;
The defect inspection apparatus according to claim 1 or 2, which inspects for the presence or absence of defects in the optical member conveyed from the conveyance apparatus to the bonding apparatus.
Optical display device production system including.

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