TWI638995B - Defect inspection apparatus, manufacturing system for optical member and production system for optical display device - Google Patents

Abstract

A defect inspection device including an optical member of a polarizing element includes: a light source; an imaging device that images an image obtained by transmitted light from the optical member; and a first polarizing filter that is disposed between the light source and the optical component The optical path between the first absorption axis and the second polarization filter are disposed on the optical path between the imaging device and the optical member, and have a second absorption axis; the first mobile device is configured to be The polarizing filter moves forward and backward toward the optical path between the light source and the optical member, and the second moving device moves the second polarizing filter toward and away from the optical path between the imaging device and the optical member.

Description

Defect inspection device, manufacturing system of optical component, and production system of optical display device

The present invention relates to a defect inspection device, a manufacturing system of an optical component, and a production system of the optical display device.

The present application claims priority based on Japanese Patent Application No. 2013-172344, filed on Jan.

A defect inspection device described in Patent Document 1 is known as a defect inspection device including an optical member including a polarizing element. The defect inspection device of Patent Document 1 includes a light source disposed on one side of the optical member, an imaging device disposed on the other side of the optical member, and an optical path disposed between the imaging device and the optical member. A polarizing filter having an absorption axis orthogonal to the absorption axis of the polarizing element.

The defect inspection device is disposed on a manufacturing line of the optical member or a conveyance line that conveys the optical member toward the object to be bonded such as a liquid crystal panel. For example, in the manufacturing line of the optical member, a protective film which is bonded to the protective layer on both surfaces of the polarizing element is bonded, and the polarizing element to which the protective film is bonded is wound into a roll shape to produce a raw material roll of the optical member. The defect inspection device is disposed on a conveyance line of a laminated film in which a protective film is laminated on one side or both sides of a polarizing element. In the above, the presence or absence of foreign matter defects between the polarizing element and the protective film is detected.

In the defect inspection device, the bonding surface side of the optical member (the surface side to which the bonding object such as the liquid crystal panel is bonded) is usually inspected for defects. Therefore, the polarizing filter is provided on the bonding surface side of the optical member.

For example, in the defect inspection device of Patent Document 1, a light source is disposed below the transport line of the optical member, and a polarizing filter and an imaging device are disposed above the transport line.

When there is a foreign matter between the polarizing element and the protective film on the upper surface side (the bonding surface side), the light irradiated by the light source is converted into a linearly polarized light by the polarizing element, and a part thereof is scattered by the foreign matter. . A part of the scattered light is disturbed by the polarization state, and thus is transmitted through the polarizing filter and detected as a bright spot by the imaging device.

On the other hand, when there is a foreign matter between the polarizing element and the protective film on the lower side (the opposite side to the bonding surface), the light irradiated by the light source is incident on the polarizing element after being scattered by the foreign matter. And is transformed into linear polarized light. In the linear polarizing system, there is no defect such as foreign matter that disturbs the polarized state between the polarizing element and the polarizing filter, that is, it does not pass through the polarizing filter. Therefore, in the image pickup apparatus, the dark field is maintained, and the defect is not detected.

As described above, by providing the polarizing filter on the bonding surface side of the optical member, it is possible to selectively inspect only the defect on the bonding surface side of the optical member.

[Previous Technical Literature] [Patent Literature]

[Patent Document 1] Japanese Patent Laid-Open No. 2007-212442

It is determined in advance which side of the upper surface and the lower surface of the optical member are to be bonded surfaces, and the arrangement of the light source, the image pickup device, and the polarizing filter of the defect inspection device is also fixed. Generally, as in Patent Document 1, the upper surface of the optical member serves as a bonding surface, and the polarizing filter is also disposed above the optical member.

Here, in the case of an optical member including a polarizing element, a cellulose triacetate (TAC: TriAcetyl Cellulose) which is a protective layer of a two-layer layer of a polarizing element made of polyvinyl alcohol (PVA: Poly Vinyl Alcohol) is known. Polarizer (TAC/PVA/TAC). In recent years, polarizing plates have been diversified, and a polarizing plate in which one of the TACs which are laminated on both sides of the polarizing element is replaced with another thin film has been proposed.

In the polarizing plate as described above, it has been found by the inventors of the present invention that the state of warpage or the like of the final product differs depending on whether the TAC side is a bonding surface or the other film side is a bonding surface.

Therefore, when the defect inspection of the polarizing plate as described above is performed using the above-described defect inspection device, any one of the TAC and the other film is bonded to the upper surface side of the polarizing element. However, in the configuration of the manufacturing line of the optical member, the position of the transport line of the other film is defined on either the upper side or the lower side of the transport line of the polarizing element, and the intended defect inspection may not be performed.

For example, in the case where another film is a film which is liable to cause damage on the surface, the film is first protected on the surface layer of the other film, and when the polarizing element is bonded to another film, the protective film is peeled off from the other film. At this time, a peeling mechanism such as a knife edge is provided in advance of bonding the polarizing element to another film, and the other film after peeling is peeled off from the other film, and the other film after peeling is bonded to the polarizing element.

However, in the configuration of the manufacturing line, the installation space of the peeling mechanism is only set. In the case of either the upper side or the lower side of the transport line of the polarizing element. At this time, the position of the transport line of the other film is also limited to either the upper side or the lower side of the transport line of the polarizing element. When the transport line of the other film is limited to the upper side of the transport line of the polarizing element, and the other film is bonded to the side opposite to the bonding surface side of the optical member, the optical member cannot be optically mounted on the defect inspection device. Defect inspection on the side of the fitting surface.

Therefore, the position of the light source, the image pickup device, and the polarizing filter is replaced in consideration of the configuration of the optical member. However, at this time, it is necessary to significantly change the configuration of the device, and it takes a lot of time to replace the device. Further, it is not practical to prepare the respective defect inspection devices for each optical component. Based on the background as described above, it is possible to easily detect a defect inspection device for defect inspection on one side and the other side of the optical member by observing the configuration of the corresponding optical member.

An object of the present invention is to provide a defect inspection apparatus and an optical display apparatus production system which can easily switch defect inspection on one side and the other side of an optical component.

The aspect of the invention employs the following means.

(1) A defect inspection device according to an aspect of the present invention is a defect inspection device including an optical member of a polarizing element, comprising: a light source disposed on a first side of the optical member, irradiating light to the optical member; and imaging The device is disposed on the second side of the optical member, and images an image obtained by transmitting light from the optical member; and the first polarizing filter is disposed between the light source and the optical member The optical path has a first absorption axis orthogonal to the absorption axis of the polarizing element, and the second polarizing filter is disposed between the imaging device and the optical component The optical path has a second absorption axis orthogonal to the absorption axis of the polarizing element; and the first moving device moves the optical path between the first polarizing filter and the optical element forward and backward And a second moving device that moves the optical path between the imaging device and the optical member forward and backward by the second polarizing filter.

(2) In the aspect of the above (1), the control device may be further included, wherein the first moving device moves the first polarizing filter to the light source and the optical device in the first imaging mode Controlling the manner of the optical path between the members, and controlling the arrangement of the first polarizing filter so that the absorption axis of the polarizing element is orthogonal to the first absorption axis, and the second movement The device controls the second polarizing filter to move to a position shifted by an optical path between the imaging device and the optical member, and in the second imaging mode, the first polarizing device sets the first polarized light The filter is moved to a position shifted from the optical path between the light source and the optical member, and the second polarizing filter moves the second polarizing filter to the imaging device and the optical member. The mode of the optical path between the two is controlled so that the arrangement of the second polarizing filter is controlled such that the absorption axis of the polarizing element is orthogonal to the second absorption axis.

(3) A manufacturing system of an optical component according to an aspect of the present invention is a manufacturing system of an optical component including a polarizing element, comprising: an optical component manufacturing apparatus that manufactures the optical component; and (1) or (2) above The defect inspection device described above checks whether the optical member has a defect.

(4) In the aspect of the above (3), the optical member may further include: a polarizing element; a first protective layer laminated on the first surface of the polarizing element; and a second layer laminated on the polarizing element The second protective layer on the surface, the manufacturing device of the optical member includes: the first supply a second supply unit that is disposed on the first side of the supply path of the polarizing element and that supplies the laminated member, the laminated member including the first protective layer and the laminated layer a third protective layer on the third surface of the first protective layer; a third supply portion disposed on the second side of the supply path of the polarizing element, and supplied to the second protective layer; and a peeling portion The first protective layer is formed on the first side of the supply path of the polarizing element, and the third protective layer is peeled off from the laminated member to form the first protective layer.

(5) A production system of an optical display device according to an aspect of the present invention is a production system of an optical display device in which an optical display component is bonded to an optical component, and is characterized in that it comprises: a transporting device for transporting the optical body a bonding device that is configured to bond the optical member that is transported by the transport device to the optical display device to produce the optical display device; and the defect inspection device according to (1) or (2) above It checks whether the optical member conveyed to the bonding device by the transfer device has a defect.

According to the aspect of the invention, it is possible to provide a defect inspection device, a manufacturing system of the optical component, and a production system of the optical display device which can easily switch the defect inspection on one side and the other side of the optical member.

1‧‧‧Film bonding system (production system for optical display devices)

2‧‧‧Control Department

3‧‧‧Roller conveyor

7‧‧‧1st supply device

8‧‧‧First transport device (transport device)

8a‧‧‧Volume Keeping Department

8b‧‧‧Clamping roller

8c‧‧‧guide wheel

8d‧‧‧ accumulator

8e‧‧‧Winding Department

9‧‧‧1st defect inspection device (defect inspection device)

10‧‧‧1st cutting device

11‧‧‧1st laminating device (fitting device)

18‧‧‧ before peeling device

18a‧‧‧blade

18b‧‧‧Winding Department

19‧‧‧After inspection inspection device

19a‧‧‧Volume Keeping Department

19b‧‧‧Clamping roller

100‧‧‧Manufacturing system for optical film (manufacturing system for optical components)

101‧‧‧Manufacturing device for optical film (manufacturing device for optical components)

102‧‧‧ Defect inspection device

110‧‧‧1st Supply Department

111‧‧‧2nd Supply Department

112‧‧‧3rd Supply Department

113‧‧‧ peeling department

113a‧‧‧blade

113b‧‧‧Winding Department

114‧‧‧film laminating device

114a, 114b‧‧‧Rollers

115‧‧‧Winding Department

120‧‧‧Light source

120a‧‧‧Light shot

121‧‧‧1st polarizing filter

122‧‧‧ camera

122a‧‧‧Glossy surface

123‧‧‧2nd polarizing filter

130‧‧‧1st mobile device

131‧‧‧2nd mobile device

132‧‧‧Control device

CL‧‧‧ optical axis

E1, E2‧‧‧ Defects

F‧‧‧Optical sheet

F1‧‧‧Optical parts

F2‧‧‧Adhesive layer

F3‧‧‧Isolation

F4‧‧‧Surface protection film

F5‧‧‧Fitting sheet

F6‧‧‧ polarizing element

F7‧‧‧1st film

F8‧‧‧2nd film

F10‧‧‧Optical film (optical parts)

F11‧‧‧ polarizing element film (polarizing element)

F12‧‧‧ laminated film (layered parts)

F13‧‧‧COP film (first protective layer)

F14‧‧‧ COP film protective film (3rd protective layer)

F15‧‧‧TAC film (second protective layer)

F16‧‧‧Adhesive layer

H1‧‧‧1st spacer

H2‧‧‧2nd spacer

L1, L3‧‧‧ light

L2‧‧‧linear polarized light

P‧‧‧LCD panel (optical display parts)

P1‧‧‧1st substrate

P2‧‧‧2nd substrate

P3‧‧‧ liquid crystal layer

P4‧‧‧ display area

P11‧‧‧Single-sided fitting panel

Q1‧‧‧1st position

Q2‧‧‧2nd position

Q3‧‧‧3rd position

Q4‧‧‧4th position

R1, R10, R11, R12, R15‧‧‧ raw material rolls

R2‧‧‧1st isolation roll

R3‧‧‧2nd spacer roll

R4‧‧‧Second isolation roll

R14‧‧‧ peeling roll

Sf1‧‧‧ top (surface on one side of the optical component)

Sf2‧‧‧ below (the other side of the optical component)

SV1, SV2‧‧‧ overlap

Absorption axis of V0‧‧‧ polarizing element film F11

V1‧‧‧1st absorption axis

V2‧‧‧2nd absorption axis

The first drawing shows a side view of a manufacturing system of an optical film according to an embodiment of the present invention.

The second drawing is a side view of a defect inspection apparatus according to an embodiment of the present invention.

The third diagram is a view for explaining the arrangement relationship between the first absorption axis (the second absorption axis of the second polarization filter) of the first polarizing filter and the absorption axis of the polarizing element film.

The fourth figure is a diagram for explaining the principle of defect inspection by the defect inspection device.

The fifth figure is a diagram for explaining the principle of defect inspection by the defect inspection device.

Figure 6 is a plan view of a defect inspection device according to an embodiment of the present invention.

The seventh figure shows a bonding example of a polarizing plate (TAC/PVA/TAC) to a liquid crystal panel.

The eighth figure shows a bonding example of a polarizing plate (COP/PVA/TAC) to a liquid crystal panel.

The ninth diagram is a view for explaining a defect inspection device in the first imaging mode of the polarizing plate (TAC/PVA/TAC).

Fig. 10 is a view showing an example of bonding of a polarizing plate to a liquid crystal panel in a first imaging mode of a polarizing plate (TAC/PVA/TAC).

The eleventh diagram is a view for explaining a defect inspection device in the first imaging mode of the polarizing plate (COP/PVA/TAC).

Fig. 12 is a view showing an example of bonding of a polarizing plate to a liquid crystal panel in a first imaging mode of a polarizing plate (TAC/PVA/COP).

The thirteenth diagram is a view for explaining the defect inspection device in the second imaging mode.

Fig. 14 is a view showing an example of bonding of a polarizing plate to a liquid crystal panel in the second imaging mode.

Fig. 15 is a side view showing the configuration of a device of a film bonding system according to an embodiment of the present invention.

Fig. 16 is a side view showing the configuration of a device of a film bonding system according to an embodiment of the present invention.

The seventeenth view is a plan view of the liquid crystal panel.

Figure 18 is a cross-sectional view of a polarizing film sheet.

The embodiments of the present invention will be described below with reference to the drawings, but the present invention is not limited to the following embodiments.

Among them, in all of the following drawings, in order to make it easy to view the drawing, the size or ratio of each constituent element is appropriately changed. In the following description and the drawings, the same or corresponding elements are designated by the same reference numerals, and the repeated description is omitted.

[Manufacturing system for optical components]

The first drawing shows a side view of an example of a manufacturing system 100 for an optical film, which is a manufacturing system of an optical component according to an embodiment of the present invention. An example in which a polarizing film is produced as an optical film will be described below. However, if the optical film is a film containing at least a polarizing element, it may be a complex optical element such as a laminated retardation film or a brightness enhancement film in addition to the polarizing film.

In the following description, the XYZ orthogonal coordinate system is set as needed, and the positional relationship of each member will be described with reference to the XYZ orthogonal coordinate system. In the present embodiment, the transport direction of the elongated optical film is set to the X direction, and the direction orthogonal to the X direction in the plane of the optical film (the width direction of the elongated optical film) is set to the Y direction. The direction in which the X direction and the Y direction are orthogonal is the Z direction.

As shown in the first figure, the optical film manufacturing system 100 includes a manufacturing apparatus 101 (an optical component manufacturing apparatus) for manufacturing an optical film F10, and a defect inspection apparatus 102 for inspecting the optical film F10 for defects.

The optical film F10 (optical member) used in the present embodiment is, for example, a COP (cyclic olefin polymer) film F13 (first protective layer) as a protective film and TAC (cellulose triacetate). (triacetylcellulose)) film F15 (2nd The protective layer) has a structure in which a polarizing element film F11 (polarizing element) made of PVA (polyvinyl alcohol) or the like is interposed. In the polarizing element film F11, the surface on which the side of the COP film F13 is laminated may be referred to as a first surface. Further, in the polarizing element film F11, the surface on which the side of the TAC film F15 is laminated may be referred to as a second surface.

In addition, as the protective film, in addition to the TAC film or the COP film, a PET (polyethylene terephthalate) film, an MMA (methyl methacrylate) film, or the like may be used. .

The optical film manufacturing apparatus 101 includes a first supply unit 110 that supplies the polarizing element film F11, and a second supply unit 111 that supplies the laminated film F12 including the COP film F13 and the COP film protective film F14 (third protective layer). The third supply portion 112 for supplying the TAC film F15; the peeling portion 113 for peeling off the COP film F12 from the build-up film F12 to form the COP film F13; and the polarizing element film F11, the COP film F13, the TAC film F15, and the like A film stacking device 114 for laminating a sheet of the optical film F10; and a winding portion 115 for winding the optical film F10.

The first supply unit 110 holds the material roll R11 around which the strip-shaped polarizing element film F11 is wound, and sequentially feeds the polarizing element film F11 along the longitudinal direction thereof.

The second supply unit 111 holds the material roll R12 around which the strip-shaped laminated film F12 is wound, and sequentially feeds the laminated film F12 along the longitudinal direction thereof. The second supply unit 111 is disposed on one side of the supply path of the polarizing element film F11 (the +Z direction side shown in the first figure). In addition, the side of the supply path of the polarizing element film F11, that is, the +Z direction side shown in the first figure may be referred to as the first side of the supply path of the polarizing element film F11.

The third supply unit 112 holds the raw material roll that winds the strip-shaped TAC film F15. R15, and the TAC film F15 is sequentially sent out along the longitudinal direction thereof. The third supply unit 112 is disposed on the other side of the supply path of the polarizing element film F11 (the -Z direction side shown in the first figure). In addition, the other side of the supply path of the polarizing element film F11, that is, the -Z direction side shown in the first figure may be referred to as the second side of the supply path of the polarizing element film F11.

The peeling portion 113 is configured such that the protective film F14 for COP film is peeled off from the laminated film F12 sequentially fed from the second supply portion 111, and wound into a roll. The peeling portion 113 has a blade 113a and a winding portion 113b.

The protective film F14 for COP film is laminated on one surface of the COP film F13 (the bonding surface to which the polarizing element film F11 is bonded). Thereby, it is possible to suppress damage to the surface of the COP film protective film F14 (the bonding surface to be bonded to the polarizing element film F11). Here, as described above, one surface of the COP film F13 of the protective film F14 for the laminated COP film may be referred to as a third surface.

The blade 113a extends at least over the entire width of the laminated film F12 in the width direction. The blade 113a is wound so as to be in sliding contact with the COP film protective film F14 side of the laminated film F12 unwound by the material roll R12. The blade 113a winds the laminated film F12 at an acute angle at the front end portion thereof. The blade 113a separates the COP film F13 from the COP film protective film F14 when the laminated film F12 is folded back at an acute angle at the tip end portion thereof. The blade 113a supplies the COP film F13 to the film stacking device 114.

The winding portion 113b is wound as a separate COP film protective film F14 via the blade 113a, and is held as a peeling roll R14.

The peeling portion 113 is disposed between the first supply portion 110 and the second supply portion 111 on one side of the supply path of the polarizing element film F11 (the +Z direction side shown in the first drawing).

The arrangement of the second supply unit 111, the third supply unit 112, and the peeling unit 113 is not limited thereto. For example, both the second supply unit 111 and the peeling unit 113 may be disposed on the other side of the supply path of the polarizing element film F11 (the -Z direction side shown in the first drawing), and the third supply unit 112 may be disposed. On the side of the supply path of the polarizing element film F11 (the +Z direction side shown in the first figure).

A pair of rollers 114a and 114b are provided below the film laminating device 114. The polarizing element film F11, the COP film F13, and the TAC film F15 are superposed between the two rollers 114a and 114b to be supplied. Then, the polarizing element film F11, the COP film F13, and the TAC film F15 are bonded together by the two rollers 114a and 114b, and one optical film F10 is produced. Further, a release film or a protective film may be additionally laminated on the surfaces of the COP film F13 and the TAC film F15. The optical film F is conveyed toward the defect inspection device 102 by a conveyance roller (not shown).

The defect inspection device 102 is provided with a light source 120 disposed above the optical film F10 (the +Z direction side shown in the first figure), and disposed below the optical film F10 (the -Z direction shown in the first figure) The imaging device 122 of the side; the first polarizing filter 121 disposed on the optical path between the light source 120 and the optical film F10; and the second polarized light disposed on the optical path between the imaging device 122 and the optical film F10 Filter 123. The details of the defect inspection device 102 will be described later. Further, the +Z direction side shown in the first diagram in which the light source 120 is disposed as described above may be referred to as the first side of the optical film F10. Further, the side in the -Z direction shown in the first diagram of the imaging device 122 as described above may be referred to as the second side of the optical film F10.

The data of the defect of the optical film F10 detected by the defect inspection device 102 is stored in the memory device in association with the position of the optical film F10 (the position in the longitudinal direction of the optical film F10 and the position in the wide direction). Optical thin film detected by the defect inspection device 102 The film F10 is conveyed toward the winding unit 115. Next, the winding unit 115 is wound into a roll shape to produce a material roll R10 of the optical film F10.

(defect inspection device)

The second drawing is a side view of the defect inspection device 102 according to an embodiment of the present invention.

In the second drawing, the symbol Sf1 is the upper surface of the optical film F10 (the surface on one side of the optical member), and is the surface on the COP film F13 side. The symbol Sf2 is a lower surface of the optical film F10 (the other surface of the optical member), and is a surface on the side of the TAC film F15.

As shown in the second figure, the defect inspection device 102 of the present embodiment includes a light source 120 disposed on the side of the upper surface Sf1 of the optical film F10, and an imaging device 122 disposed on the side of the lower surface Sf2 of the optical film F10; a first polarizing filter 121 disposed on an optical path between the light source 120 and the optical film F10; a second polarizing filter 123 disposed on an optical path between the imaging device 122 and the optical film F10; The polarizing filter 121 moves forward and backward toward the optical path between the light source 120 and the optical film F10, and moves the second polarizing filter 123 toward the optical path between the imaging device 122 and the optical film F10. The second mobile device 131; and the control device 132. In other words, the first moving device 130 can move the optical path between the first polarizing filter 121 and the optical source F10, and the second moving device 131 can directly move the second polarizing filter 123. The optical path between the imaging device 122 and the optical film F10 moves forward and backward.

The control device 132 controls the advance and retreat movement of each of the first polarizing filter 121 and the second polarizing filter 123. The control device 132 can independently control each of the first mobile device 130 and the second mobile device 131.

The center of the light exit surface 120a of the light source 120 and the center of the light receiving surface 122a of the imaging device 122 are arranged coaxially (on the optical axis CL).

The third diagram is a view for explaining the arrangement relationship between the first absorption axis V1 of the first polarizing filter 121 (the second absorption axis V2 of the second polarization filter 123) and the absorption axis V0 of the polarizing element film F11.

As shown in the third figure, the first polarizing filter 121 has a first absorption axis V1 that is orthogonal to the absorption axis V0 of the polarizing element film F11. The first polarizing filter 121 is disposed on the optical path between the light source 120 and the optical film F10, and is disposed so as to be orthogonal to each other (the arrangement of the crossed Nicols), the first absorption axis V1 of the first polarizing filter 121, and the polarizing element. The absorption axis V0 of the film F11.

When the first absorption axis V1 of the first polarizing filter 121 and the absorption axis V0 of the polarizing element film F11 are arranged in a crossed Nicols, the overlapping portion SV1 of the first polarizing filter 121 and the polarizing element film F11 is formed. In the middle, it will not pass through the light. Therefore, when the image pickup device 122 images the overlap portion SV1, it is not necessary to dispose the polarized state such as a defect having a phase difference between the first polarizing filter 121 and the polarizing element film F11. Dark vision.

The second polarizing filter 123 has a second absorption axis V2 that is orthogonal to the absorption axis V0 of the polarizing element film F11. The second polarizing filter 123 is disposed on the optical path between the imaging device 122 and the optical film F10 so as to be orthogonal to each other (the arrangement of the crossed Nicols), the second absorption axis V2 of the second polarizing filter 123, and the polarized light. The absorption axis V0 of the element film F11.

Even if the second absorption axis V2 of the second polarizing filter 123 and the absorption axis V0 of the polarizing element film F11 are arranged in a crossed Nicols, the overlapping portion SV2 of the second polarizing filter 123 and the polarizing element film F11 It will not pass through the light. Therefore, even if the image pickup device 122 images the overlap portion SV2, it is not necessary to dispose the polarized state such as a defect having a phase difference between the second polarizing filter 123 and the polarizing element film F11. Dark vision.

The fourth and fifth figures are used to illustrate the deficiency caused by the defect inspection device 102. A diagram of the principle of checking E1. The fourth figure is a diagram when the defect E1 is present in the COP film F13. The fifth graph is a graph in which there is no defect in the COP film F13, but there is a defect E2 in the TAC film F15. In the fourth and fifth figures, the second polarizing filter 123, the first moving device 130, the second moving device 131, and the control device 132 are omitted for the sake of convenience.

As shown in the fourth figure, the light L1 emitted from the light source 120 toward the optical film F10 is formed as the linearly polarized light L2 by the first polarizing filter 121. The linearly polarized light L2 obtained by the first polarizing filter 121 is incident on the COP film F13. As a result, the polarization state of the linearly polarized light L2 is disturbed by the defect E1 existing in the COP film F13, and a part of the light (light L3) in which the polarized state is disturbed passes through the polarizing element film F11. As a result, the light L3 that has passed through the polarizing element film F11 enters the imaging device 122, and the imaging device 122 causes the defect E1 to be bright and is brightly imaged.

As shown in FIG. 5, the light L1 emitted from the light source 120 toward the optical film F10 is formed into linearly polarized light L2 by the first polarizing filter 121. The linearly polarized light L2 obtained by the first polarizing filter 121 is incident on the COP film F13. As a result, there is no defect in the COP film F13, and thus the linearly polarized light L2 cannot pass through the polarizing element film F11. As a result, since the light is not incident on the imaging device 122, the imaging device 122 images the black image. At this time, the defect E2 existing in the TAC film F15 is not visible.

As described above, by detecting the presence of a bright spot, it is possible to determine whether or not the COP film F13 has the defect E1. For example, when the bright spot is imaged by the imaging device 122, the COP film F13 is determined to be "defective". On the other hand, when the black image is imaged by the imaging device 122 (when it is not imaged at all), the COP film F13 is judged as "no defect".

The sixth drawing is a plan view of the defect inspection device 102. In the sixth diagram, the optical film F10 is illustrated for convenience.

As shown in the sixth diagram, the light exit surface 120a of the light source 120 constituting the defect inspection device 102 has a rectangular shape and has a long side along the Y direction. In the present embodiment, the light exit surface 120a of the light source 120 has a long side in a width direction orthogonal to the transport direction of the optical film F10. The light exit surface 120a of the light source 120 is formed to span the wide direction of the optical film F10. For example, in the case of the light source 120, a metal halide lamp can be used.

The first polarizing filter 121 is disposed to overlap the outer peripheral portion of the light exit surface 120a of the light source 120. Similarly to the light exit surface 120a of the light source 120, the first polarizing filter 121 has a long side along the Y direction. The first polarizing filter 121 is longer in each of the X direction and the Y direction than the light emitting surface 120a of the light source 120.

As a result, when the first polarizing filter 121 is disposed on the optical path between the light source 120 and the optical film F10, all of the light emitted from the light source 120 is incident on the first polarizing filter 121.

Similarly to the light exit surface 120a of the light source 120, the imaging device 122 has a long side along the Y direction. For example, in the case of the camera 122, a line sensor camera can be used.

The second polarizing filter 123 is disposed to overlap the outer peripheral portion of the light receiving surface 122a of the imaging device 122. Similarly to the light receiving surface 122a of the imaging device 122, the second polarizing filter 123 has a long side along the Y direction. The second polarizing filter 123 is longer than the light receiving surface 122a of the imaging device 122 in each of the X direction and the Y direction.

The optical film F10 is cut into a predetermined size by a cutting device (not shown), and is formed as a polarizing plate that is bonded to a sheet piece of the liquid crystal panel. A liquid crystal display device as an optical display device is manufactured by bonding the polarizing plate to a liquid crystal panel.

However, in the manufacture of a liquid crystal display device in which a liquid crystal panel is bonded with a polarizing plate, When the polarizing plate is bonded to the liquid crystal panel, there is a problem that the liquid crystal panel warps due to the stress of the polarizing plate.

The inventors of the present invention have carefully studied the results and found that if the configuration of the polarizing plate is changed, the warpage state of the liquid crystal panel can be made different.

The following description will be made using the seventh and eighth drawings.

The seventh drawing shows an example of the bonding of the polarizing plate (TAC/PVA/TAC) in which the polarizing plate is formed to TAC/PVA/TAC to the liquid crystal panel P.

As shown in the seventh figure, an adhesive layer F16 is disposed on the bonding surface of the polarizing plate (TAC/PVA/TAC) and the liquid crystal panel P. The polarizing plate (TAC/PVA/TAC) is bonded to the liquid crystal panel P through the adhesive layer F16.

Fig. 8 is a view showing an example of the bonding of the polarizing plate (COP/PVA/TAC) in which the polarizing plate is formed to COP/PVA/TAC to the liquid crystal panel P.

As shown in FIG. 8 , an adhesive layer F16 is disposed on the bonding surface (surface on the TAC film side) of the polarizing plate (COP/PVA/TAC) and the liquid crystal panel P. In the polarizing plate (COP/PVA/TAC), a TAC film is placed on the bonding surface side of the liquid crystal panel P, and is bonded to the liquid crystal panel P through the adhesive layer F16.

The inventors have found that the reason why the reason is not clear is that a polarizing plate (COP/PVA/TAC) is disposed on the bonding surface side of the liquid crystal panel P and is bonded to the liquid crystal panel P (see FIG. 8). When the polarizing plate (TAC/PVA/TAC) is bonded to the liquid crystal panel P (see FIG. 7), the warpage state of the liquid crystal panel P can be made different.

Therefore, from the viewpoint of making the warpage state of the liquid crystal panel P different from that when the polarizing plate (TAC/PVA/TAC) is bonded to the liquid crystal panel P, it is preferable to use the image as shown in FIG. In the polarizing plate having the configuration of COP/PVA/TAC, the surface on the TAC side of the polarizing plate is bonded to the liquid crystal panel P. At this time, the surface on the TAC side of the polarizing plate is a bonding surface with the liquid crystal panel P. Therefore, when the optical film F10 is manufactured using the manufacturing apparatus 100 of the first drawing, the COP film F13 is bonded to the upper surface of the polarizing element film F11. Therefore, the polarizing filter of the defect inspection device must be disposed below the conveyance line of the optical film F10.

In the case where the polarizing filter is disposed only on the bonding surface side of the polarizing plate as in the conventional defect inspection device, when the configuration of the polarizing plate is changed from the seventh drawing to the eighth drawing, the light source and the imaging device must be replaced. And the position of the polarizing filter must be greatly changed in the device configuration.

For example, in the case of a polarizing plate (TAC/PVA/TAC), the TAC film is disposed on both sides of the PVA film. Therefore, any one of the pair of TAC films may be formed on the bonding surface side of the polarizing plate, and even if it is a conventional defect inspection device, it may be applied without changing the device configuration.

However, in the case of a polarizing plate (COP/PVA/TAC), the TAC film is disposed only on one side of the PVA film. Therefore, when the TAC film side is set as the bonding surface side of the polarizing plate in order to change the warpage state of the liquid crystal panel P, it is necessary to significantly change the device configuration when it is a conventional defect inspection device.

In particular, when the peeling portion 113 from which the protective film F14 for the COP film is peeled off from the laminated film F12 is disposed only above the supply path of the polarizing element film F11, the second supply portion 111 of the laminated film F12 is supplied. It is also disposed on the upper side of the supply path of the polarizing element film F11. Therefore, in the conventional defect inspection apparatus, when the polarizing filter is disposed only on the upper side of the optical film F10, the defect inspection of the COP film F13 can be performed, but the bonding surface to be the polarizing plate cannot be performed. Defect inspection of the side TAC film F15.

On the other hand, in consideration of this countermeasure, the position of the light source, the polarizing filter, and the imaging device is also considered. However, it is necessary to greatly change the configuration of the device, and it takes a lot of time to replace the device. In addition, it is also considered that the defect inspection device that performs the defect inspection on the upper surface side of the optical film F10 and the defect inspection device that performs the defect inspection on the lower surface side of the optical film F10 are provided along the transport path of the optical film F10, but It requires a wide setting space and is expensive to set up, so it is not practical.

Therefore, in the aspect of the present invention, in order to easily switch the defect inspection on one side and the other side of the optical film, the following constitution is employed.

The defect inspection apparatus 102 according to the embodiment of the present invention is characterized in that, as shown in the second diagram, the light source 120 is disposed on the upper side of the optical film F10, and the light is applied to the optical film F10. On the lower side, an imaging device 122 that images an image due to transmitted light from the optical film; and an optical path disposed between the light source 120 and the optical film F10 is orthogonal to the absorption axis of the polarizing element film F11. The first polarizing filter 121 of the first absorption axis; the second polarized light having the second absorption axis orthogonal to the absorption axis of the polarizing element film F11, disposed on the optical path between the imaging device 122 and the optical film F10 The filter 123; the first moving device 130 that moves the first polarizing filter 121 toward the optical path between the light source 120 and the optical film F10; and the second polarizing filter 123 faces the imaging device 122 and the optical film The optical path between F10 is the second moving device 131 that moves forward and backward. In other words, the first moving device 130 can move the optical path between the first polarizing filter 121 and the optical source F10, and the second moving device 131 can directly move the second polarizing filter 123. The optical path between the imaging device 122 and the optical film F10 moves forward and backward.

According to this configuration, both of the upper surface side and the lower surface side of the optical film F10 are disposed. Polarized filter. Therefore, the respective polarizing filters can be moved forward and backward on the optical path between the light source 120 and the imaging device 122 in accordance with the configuration of the optical film F10, and the defect inspection of the upper surface side and the lower surface side of the optical film F10 can be easily switched. Therefore, it is possible to easily check the defects of the optical film F10 of various configurations while being a space-saving and inexpensive structure.

The ninth diagram is a diagram for explaining the defect inspection device 102 in the first imaging mode of the polarizing plate (TAC (1) / PVA / TAC (2)).

The tenth diagram is a view showing a bonding example of the polarizing plate (TAC (1)/PVA/TAC (2)) to the liquid crystal panel P in the first imaging mode.

The eleventh diagram is a view for explaining the defect inspection device 102 in the first imaging mode of the polarizing plate (COP/PVA/TAC). Fig. 12 is a view showing an example of bonding of a polarizing plate (COP/PVA/TAC) to the liquid crystal panel P in the first imaging mode.

The thirteenth diagram is a view for explaining the defect inspection device 102 in the second imaging mode.

Fig. 14 is a view showing an example of bonding of the polarizing plate to the liquid crystal panel P in the second imaging mode.

In the ninth, eleventh, and thirteenth drawings, the first mobile device 130, the second mobile device 131, and the control device 132 are omitted for convenience. In the ninth and tenth drawings, the TAC film on the bonding surface side of the polarizing plate is shown as TAC (1) film "TAC (1)", and the TAC film on the opposite side to the bonding surface side of the polarizing plate is shown. It is a TAC (2) film "TAC (2)".

As shown in FIG. 9 , in the first imaging mode, the first mobile device 130 causes the first polarizing filter 121 to light the light source 120 and the polarizing plate (TAC(1)/PVA/TAC(2). The optical path between the two (the first position Q1 on the optical axis CL) is moved, and the absorption axis of the PVA film is orthogonal to the first absorption axis of the first polarizing filter 121. The second polarizing filter 123 is moved by the second moving device 131 to the imaging device 122 and the polarizing plate (TAC(1)/PVA/TAC(2)) for controlling the arrangement of the first polarizing filter 121. The position between the optical paths (the second position Q2 deviated from the optical axis CL) is controlled.

Specifically, in the first imaging mode, the control device 132 controls the first mobile device 130 so that the center of the first polarizing filter 121 is disposed at the first position Q1 on the optical axis CL, and is PVA. The arrangement of the first polarizing filter 121 is controlled such that the absorption axis of the film is orthogonal to the first absorption axis of the first polarizing filter 121, and the second polarizing filter is used by the second moving device 131. The center of 123 is controlled so as to be shifted from the second position Q2 of the optical axis CL.

The second position Q2 is set at a position where the second polarizing filter 123 is retracted from the field of view of the imaging device 122. In other words, the second position Q2 is set at a position where the second polarizing filter 123 does not enter the field of view of the imaging device 122. When the second position Q2 is too close to the optical axis CL, the second polarizing filter 123 enters the field of view of the imaging device 122. On the other hand, when the second position Q2 is too far from the optical axis CL, it takes time to move the second polarizing filter 123 to the position on the optical axis CL, and it is difficult to smoothly move to another imaging mode. From the viewpoint of the above, the second position Q2 in the present embodiment is set to a distance of, for example, 30 mm or more and 50 mm or less from the optical axis CL. In addition, it is preferable that the second position Q2 is set to a distance of 35 mm or more and 45 mm or less from the optical axis CL.

In the first imaging mode, the absorption axis of the PVA film and the first absorption axis of the first polarization filter 121 are arranged in a crossed Nicols. In the first imaging mode, the defect inspection of the TAC film (1) disposed on the optical path between the first polarizing filter 121 and the PVA film can be performed.

The light source 120 is directed toward the polarizing plate (TAC(1)/PVA/TAC(2)) The emitted light is linearly polarized by the first polarizing filter 121. The linearly polarized light obtained by the first polarizing filter 121 is incident on the TAC film (1). When there is no defect in the TAC film (1), the light system transmitted through the TAC film (1) is blocked by the PVA film. Therefore, the imaging device 122 captures the black image. At this time, the TAC film (1) was judged to be "no defect".

On the other hand, when the TAC film (1) is defective, the linear polarized light incident on the TAC film (1) is disturbed by the defect, and a part of the light that is disturbed in the polarized state passes through the PVA film. As a result, the light transmitted through the PVA film is incident on the image pickup device 122, and the image is formed by the image pickup device 122, and the defect is formed as a bright spot. At this time, the TAC film (1) was judged to be "defective".

As described above, by the first imaging mode, it is possible to perform cross-linked Nicol transmission inspection on the TAC film (1) side of the PVA film, and to perform polarizing plate (TAC(1)/ PVA/TAC (1)) and defect inspection on the bonding surface side of the liquid crystal panel P.

As shown in FIG. 10, an adhesive layer F16 is disposed on the bonding surface (surface of TAC (1)) of the liquid crystal panel P of the polarizing plate (TAC (1) / PVA / TAC (2)). The polarizing plate (TAC (1) / PVA / TAC (2)) is bonded to the liquid crystal panel P through the adhesive layer F16.

As shown in the eleventh diagram, if it is a polarizing plate (COP/PVA/TAC), the same control as that of the first imaging mode described in the ninth drawing can be performed.

In the case of the polarizing plate (COP/PVA/TAC), in the first imaging mode, the defect inspection of the COP film disposed on the optical path between the first polarizing filter 121 and the PVA film can be performed.

The light emitted from the light source 120 toward the polarizing plate (COP/PVA/TAC) is linearly polarized by the first polarizing filter 121. Obtained by the first polarizing filter 121 The linear polarized light is incident on the COP film. When there is no defect in the COP film, the light system transmitted through the COP film is blocked by the PVA film. Therefore, the black image is imaged in the imaging device 122. At this time, the COP film system was judged to be "no defect".

On the other hand, when the COP film is defective, the linear polarized light incident on the COP film is disturbed by the defect, and a part of the light that is disturbed in the polarized state passes through the PVA film. As a result, the light transmitted through the PVA film is incident on the image pickup device 122, and the defect is formed as a bright spot by the image pickup device 122, and is brightly imaged. At this time, the COP film system was judged to be "defective".

As described above, in the first imaging mode, the cross-Nicol transmission inspection of the COP film laminated on the upper surface of the PVA film can be performed, and the bonding surface side of the polarizing plate (COP/PVA/TAC) can be performed. Defect inspection of COP film.

As shown in Fig. 12, an adhesive layer F16 is disposed on the bonding surface (surface of the COP) of the liquid crystal panel P of the polarizing plate (COP/PVA/TAC). In the polarizing plate (COP/PVA/TAC), a COP film is placed on the bonding surface side of the liquid crystal panel P, and is bonded to the liquid crystal panel P through the adhesive layer F16.

As shown in the thirteenth diagram, in the second imaging mode, the control device 132 moves the first polarizing filter 121 between the light source 120 and the polarizing plate (COP/PVA/TAC) by the first moving device 130. The position of the optical path deviates (the third position Q3 from which the optical axis CL is deviated) is controlled, and the second polarizing filter 123 causes the second polarizing filter 123 to be on the imaging device 122 and the polarizing plate (COP/PVA). The mode of the optical path between the /TAC) (the fourth position Q4 on the optical axis CL) is controlled, and the absorption axis of the PVA film and the second absorption axis of the second polarization filter 123 are orthogonal to each other. Control of the arrangement of the second polarizing filter 123 is performed.

Specifically, the control device 132 is in the second imaging mode, and is in the first mobile device. The 130 is controlled such that the center of the first polarizing filter 121 is disposed at the third position Q3 shifted by the optical axis CL, and the second moving device 131 is disposed at the center of the second polarizing filter 123 on the optical axis. The fourth position Q4 on the CL is controlled, and the arrangement of the second polarizing filter 123 is controlled so that the absorption axis of the PVA film and the second absorption axis of the second polarizing filter 123 are orthogonal to each other.

The third position Q3 is set to a position where the light emitted from the light source 120 can be prevented from being blocked by the crossed Nicols arrangement of the first polarizing filter 121 and the PVA film. When the third position Q3 is too close to the optical axis CL, a part of the light emitted by the light source 120 is shielded by the crossed Nicols arrangement of the first polarizing filter 121 and the PVA film. On the other hand, when the third position Q3 is too far from the optical axis CL, it takes time to move the first polarizing filter 121 to the position on the optical axis CL, and it is difficult to smoothly move to another imaging mode. From the viewpoint of the above, the third position Q3 in the present embodiment is set to a distance of, for example, 30 mm or more and 50 mm or less from the optical axis CL. In addition, it is preferable that the third position Q3 is set to a distance of 35 mm or more and 45 mm or less from the optical axis CL.

In the second imaging mode, the absorption axis of the PVA film and the second absorption axis of the second polarization filter 123 are arranged in a crossed Nicols. In the second imaging mode, defect inspection of the TAC film disposed on the optical path between the PVA film and the second polarizing filter 123 can be performed.

The light emitted from the light source 120 toward the polarizing plate (COP/PVA/TAC) is transmitted through the COP film, and is linearly polarized by the PVA film. The linear polarized light obtained by the PVA film was incident on the TAC film. When there is no defect in the TAC film, the light system transmitted through the TAC film is blocked by the second polarizing filter 123. Therefore, the black image is imaged in the imaging device 122. At this time, the TAC film was judged to be "no defect".

On the other hand, when the TAC film is defective, the linear polarized light incident on the TAC film is disturbed by the defect, and a part of the light that is disturbed in the polarized state passes through the second polarizing filter 123. As a result, the light transmitted through the second polarizing filter 123 is incident on the imaging device 122, and the imaging device 122 forms a bright spot and is brightly imaged. At this time, the TAC film was judged to be "defective".

As described above, in the second imaging mode, the cross-Nicol transmission inspection of the TAC film laminated on the lower surface of the PVA film can be performed, and the bonding surface side to be a polarizing plate (COP/PVA/TAC) can be performed. Defect inspection of TAC film.

As shown in Fig. 14, an adhesive layer F16 is disposed on the bonding surface (surface of the TAC film) of the liquid crystal panel P of the polarizing plate (COP/PVA/TAC). In the polarizing plate (COP/PVA/TAC), a TAC film is placed on the bonding surface side of the liquid crystal panel P, and is bonded to the liquid crystal panel P through the adhesive layer F16. This configuration is an effective configuration as a countermeasure against warpage of the liquid crystal panel P.

However, in each imaging mode, the light source 120 and the imaging device 122 are fixed at a fixed position.

As described above, the defect inspection device 102 of the present embodiment can freely select the first imaging mode and the second imaging mode by the control of the control device 132. Therefore, even in the case where the configuration of the polarizing plates is different, the defects on the bonding surface side of the respective polarizing plates can be detected by the same defect inspecting device 102. That is, according to the present embodiment, it is not necessary to replace the position of the light source and the imaging device, and it is not necessary to significantly change the configuration of the device. Therefore, according to the present embodiment, the defect inspection of the one surface side and the other surface side of the optical film F10 can be easily switched.

Further, in the present embodiment, the optical film F10 is composed of a COP film F13 laminated on the upper surface of the polarizing element film F11 and laminated on the lower surface of the polarizing element film F11. The TAC film F15 is configured, and the second supply portion 111 and the peeling portion 113 are disposed above the supply path of the polarizing element film F11. According to the inventors' intensive studies, it has been found that when a polarizing plate (COP/PVA/TAC) is placed on the bonding surface side of the liquid crystal panel P and bonded to the liquid crystal panel P, the warpage of the liquid crystal panel P can be caused. In the case where the state is different, it is necessary to perform defect inspection on the TAC film side on the bonding surface side of the polarizing plate (COP/PVA/TAC).

However, in this case, when the polarizing filter is disposed only on the upper side of the optical film, the defect inspection on the TAC film side which is the bonding surface side of the polarizing plate cannot be performed as it is. Therefore, it is necessary to replace the positions of the light source, the polarizing filter, and the imaging device, and it is necessary to greatly change the configuration of the device.

On the other hand, in the present embodiment, the same defect inspection device 102 is used, and only the second imaging mode is switched, and the defect inspection on the TAC film side which is the bonding surface side of the polarizing plate can be performed.

Further, in each imaging mode, the light source 120 and the imaging device 122 are fixed at a fixed position. Therefore, the defect inspection on the bonding surface side of the optical film F10 can be easily performed as compared with the configuration in which the light source and the imaging device are moved.

(production system of optical display device)

Hereinafter, a production system of an optical display device according to an embodiment of the present invention will be described with respect to a film bonding system 1 constituting a part thereof. In the film bonding system 1 of the present embodiment, the first defect inspection device 9 and the second defect inspection device are configured by the defect inspection device 102 described above.

The fifteenth and sixteenth views are side views showing the configuration of the apparatus of the film bonding system 1 of the present embodiment.

The film bonding system 1 is a panel-shaped optical display such as a liquid crystal panel or an organic EL panel. The parts are bonded to a film-shaped optical component such as a polarizing film or a reflection preventing film or a light-diffusing film.

In the following description, the XYZ orthogonal coordinate system is set as needed, and the positional relationship of each member will be described with reference to the XYZ orthogonal coordinate system. In the present embodiment, the transport direction of the liquid crystal panel as the optical display component is set to the X direction, and the direction orthogonal to the X direction (the width direction of the liquid crystal panel) in the plane of the liquid crystal panel is set to the Y direction. The direction orthogonal to the X direction and the Y direction is set to the Z direction.

In the present embodiment, the liquid crystal panel P is exemplified as an optical display component, and a double-sided bonding panel in which the bonded sheet F5 is bonded to both front and back surfaces of the liquid crystal panel P is exemplified as an optical member bonding body. It is not limited to this.

As shown in the fifteenth and sixteenth aspects, the film bonding system 1 of the present embodiment is provided as one of the steps of the manufacturing line of the liquid crystal panel P. Each part of the film bonding system 1 is collectively controlled by the control unit 2 as an electronic control unit.

The film bonding system 1 of the present embodiment rotates the posture of the liquid crystal panel P by 90° in the middle of the conveyance direction of the liquid crystal panel P. In the film bonding system 1 , a polarizing film F1 in which the polarizing axes are oriented in a direction orthogonal to each other is bonded to the front and back surfaces of the liquid crystal panel P.

The seventeenth view is a plan view of the liquid crystal panel P viewed from the thickness direction of the liquid crystal layer P3. The liquid crystal panel P includes a first substrate P1 having a rectangular shape in plan view, a second rectangular substrate P2 having a relatively small rectangular shape disposed opposite to the first substrate P1, and a first substrate P1 and a second substrate. Liquid crystal layer P3 between the substrates P2. The liquid crystal panel P has a rectangular shape along the outer shape of the first substrate P1 in plan view, and a region located inside the outer periphery of the liquid crystal layer P3 in plan view is referred to as a display region P4.

The eighteenth image is an optical sheet including the optical member F1 attached to the liquid crystal panel P A cross-sectional view of the material F.

Here, in the eighteenth figure, the hatching of each layer of the cross-sectional view is omitted for the sake of convenience.

As shown in Fig. 18, the optical sheet F has a film-shaped optical member F1, an adhesive layer F2 provided on one surface (upper side in the figure) of the optical member F1, and is detachably laminated through the adhesive layer F2. A separator F3 on one surface of the optical member F1; and a surface protective film F4 laminated on the other surface (lower in the figure) of the optical member F1. The optical member F1 functions as a polarizing plate, and is bonded to the entire region of the display region P4 of the liquid crystal panel P and its peripheral region.

The optical member F1 is bonded to the liquid crystal panel P through the adhesive layer F2 while the separator F3 is separated while leaving the adhesive layer F2 on one surface thereof. Hereinafter, a portion other than the spacer F3 of the optical sheet F is referred to as a bonded sheet F5.

The spacer F3 protects the adhesive layer F2 and the optical member F1 while being separated by the adhesive layer F2. The surface protective film F4 is bonded to the liquid crystal panel P together with the optical member F1. The surface protective film F4 is disposed on the opposite side of the liquid crystal panel P from the optical member F1 to protect the optical member F1, and is separated by the optical member F1 at a predetermined timing.

However, the optical sheet F may not include the surface protective film F4, or the surface protective film F4 may not be separated by the optical member F1.

The optical member F1 includes a sheet-shaped polarizing element F6, a first film F7 bonded to one surface of the polarizing element F6 by an adhesive or the like, and a second film F7 bonded to the other surface of the polarizing element F6 with an adhesive or the like. Film F8. The first film F7 and the second film F8 are, for example, protective films that protect the polarizing element F6.

The optical member F1 may have a single layer structure composed of one optical layer or a laminated structure in which a plurality of optical layers are laminated to each other. The aforementioned optical layer is other than the polarizing element F6 In addition, a retardation film or a brightness enhancement film may be used. At least one of the first film F7 and the second film F8 may be subjected to a surface treatment including an outermost hard coating treatment for protecting the liquid crystal display element or an anti-glare treatment to obtain an effect of preventing glare. The optical member F1 may not include at least one of the first film F7 and the second film F8. For example, when the first film F7 is omitted, the separator F3 may be adhered to one surface of the optical member F1 through the adhesive layer F2.

Next, the film bonding system 1 of the present embodiment will be described in detail.

As shown in the fifteenth and sixteenth aspects, the film bonding system 1 of the present embodiment includes the upstream side (+X direction side) of the liquid crystal panel P on the right side in the drawing to the left side in the drawing. The drive type roller conveyor 3 that conveys the liquid crystal panel P in a horizontal state in the downstream direction (-X direction side) of the conveyance direction of the liquid crystal panel P.

The roller conveyor 3 is divided into an upstream conveyor and a downstream conveyor by an inversion device (not shown). In the upstream conveyor, the liquid crystal panel P forms the long side of the display region P4 so as to be transported along the transport direction. On the other hand, in the downstream conveyor, the liquid crystal panel P forms the short side of the display region P4 so as to be conveyed along the conveyance direction. A bonded sheet F5 cut into a predetermined length by the strip-shaped optical sheet F is bonded to the front and back surfaces of the liquid crystal panel P.

The film bonding system 1 of the present embodiment includes a first supply device 7, a first bonding device 11, a reversing device, a second supply device, a second bonding device, an inspection device, and a control unit 2. Here, the reversing device, the second supply device, the second bonding device, and the inspection device are omitted for convenience.

In the fifteenth diagram, the first supply device 7 and the second supply device are described as the device configuration of the film bonding system 1. Since the second supply device has the same configuration as the first supply device 7, the detailed description thereof will be omitted.

As shown in the fifteenth diagram, the first supply device 7 pulls out the optical sheet F from the material roll R1 around which the strip-shaped optical sheet F is wound, and supplies it after cutting into a predetermined size. The first supply device 7 includes a first transfer device 8 , a pre-inspection peeling device 18 , a first defect inspection device 9 , a post-inspection bonding device 19 , and a first cutting device 10 .

The first conveying device 8 is a conveying mechanism that conveys the optical sheet F along the longitudinal direction thereof. The first conveying device 8 includes a roll holding unit 8a, a nip roller 8b, a guide roller 8c, an accumulator 8d, and a winding unit 8e (see FIG. 16).

The roll holding portion 8a holds the material roll R1 around which the strip-shaped optical sheet F is wound, and sequentially feeds the optical sheets F along the longitudinal direction thereof.

The nip roller 8b sandwiches the optical sheet F to guide the optical sheet F unwound by the material roll R1 along a predetermined transport path.

The guide roller 8c changes the traveling direction of the optical sheet during transport along the transport path. At least one of the plurality of guide rollers 8c functions as a tension roller.

That is, it is movable to adjust the tension of the optical sheet F being conveyed.

The accumulator 8d absorbs the sequential feed amount of the optical sheet F conveyed by the roll holding unit 8a while the optical sheet F is cut by the first cutting device 10.

The winding holding portion 8a located at the starting point of the first conveying device 8 and the winding portion 8e (see FIG. 16) located at the end of the first conveying device 8 are driven in synchronization with each other, for example. By this, the roll holding portion 8a sequentially feeds the optical sheet F toward the conveyance direction, and winds the separator F3 through the first bonding device 11 by the winding portion 8e. Hereinafter, the upstream side in the conveyance direction of the optical sheet F (separator F3) in the first conveyance device 8 is referred to as a sheet conveyance upstream side, and the downstream side in the conveyance direction is referred to as a sheet conveyance downstream side.

The pre-inspection peeling device 18 is configured such that the first spacer H1 (corresponding to the spacer F3) is peeled off from the optical sheet F conveyed by the sheet conveyance upstream side and wound into a roll. The pre-inspection peeling device 18 has a blade 18a and a winding portion 18b.

The blade 18a is in the wide direction of the optical sheet F, at least over its full width. The blade 18a is wound so as to be in sliding contact with the first spacer H1 of the optical sheet F unwound by the material roll R1. The blade 18a winds the optical sheet F at an acute angle at its front end portion. When the blade 18a folds the optical sheet F at an acute angle at the tip end portion thereof, the bonded sheet F5 is separated from the first spacer H1. The blade 18a supplies the bonded sheet F5 to the first defect inspection device 9.

The winding portion 18b is wound around a single first spacer H1 formed by the blade 18a, and is held as the first spacer roll R2.

The first defect inspection device 9 performs the defect inspection of the optical sheet F after the first spacer H1 is peeled off, that is, the bonded sheet F5. The first defect inspection device 9 analyzes the image data captured by the CCD camera to check for the presence or absence of a defect, and if there is a defect, calculates the position coordinate. The position coordinates of the defect are supplied to the skip cutting by the first cutting device 10. Among them, the first defect inspection device 9 is constituted by the defect inspection device 102 described above.

After the inspection, the bonding device 19 bonds the second spacer H2 (corresponding to the spacer F3) through the adhesive layer F2 to the bonded sheet F5 after the defect inspection. The post-inspection bonding apparatus 19 has a roll holding portion 19a and a pinch roller 19b.

The roll holding portion 19a holds the second spacer roll R3 around which the strip-shaped second spacer H2 is wound, and sequentially feeds the second spacer H2 along the longitudinal direction thereof.

The nip roller 19b is attached to the lower surface (adhesive layer) of the bonded sheet F5 after the defect inspection by the sheet conveyance upstream side by the second spacer H2 unwound by the second spacer roll R3. Face on the F2 side). The nip roller 19b has a pair of bonding rollers which are arranged in parallel with each other in the axial direction (the upper bonding roller moves up and down). A predetermined gap is formed between the pair of bonding rollers, and the gap is a bonding position of the post-inspection bonding device 19. The bonded sheet F5 and the second spacer H2 are superposed and introduced into the gap. The bonded sheet F5 and the second spacer H2 are fed to the downstream side of the sheet conveyance while being pinched by the pinch roller 19b. Thereby, the second spacer H2 is bonded to the lower surface of the bonded sheet F5 after the defect inspection to form the optical sheet F.

When the optical sheet F is sequentially fed out by a predetermined length, the first cutting device 10 performs the thickness direction of the optical sheet F over the entire width in the width direction orthogonal to the longitudinal direction of the optical sheet F. A part of the cut is cut in half.

In the first cutting device 10, the optical sheet F (the separator F3) is not broken by the tension applied to the optical sheet F (the spacer F3 is left in a predetermined thickness). The advancing and retracting position of the cutting blade is adjusted, and the half cutting is performed until the vicinity of the interface between the adhesive layer F2 and the spacer F3. Among them, a laser device that replaces the cutting blade can also be used.

In the half-cut optical sheet F, the optical member F1 and the surface protective film F4 are cut in the thickness direction thereof, thereby forming a full-width slit line extending in the wide direction of the optical sheet F. The slit lines are formed in a plurality of rows in the longitudinal direction of the strip-shaped optical sheet F. For example, in the bonding step of transporting the liquid crystal panel P of the same size, the plurality of slit lines are formed at equal intervals in the longitudinal direction of the optical sheet F. The optical sheet F is divided into a plurality of divisions in the longitudinal direction by the plurality of slit lines. The divisions sandwiched by the pair of slit lines adjacent to each other in the longitudinal direction of the optical sheet F are formed as one of the sheet sheets F5.

The first cutting device 10 is cut into a predetermined size (skip cutting) so as to avoid the defective portion based on the position coordinates of the defect calculated by the first defect inspection device 9. The cut product containing the defective portion was excluded as a defective product in the subsequent step. Among them, the first cutting device 10 can also continuously cut the optical sheet F into a predetermined size by ignoring the defective portion. At this time, in the bonding step of the bonding sheet F5 and the liquid crystal panel P, the cut product including the defective portion can be removed without being bonded to the liquid crystal panel P.

In the first bonding apparatus and the second bonding apparatus, the first bonding apparatus 11 is described as a device configuration of the film bonding system 1 in the sixteenth embodiment. Since the second bonding apparatus has the same configuration as that of the first bonding apparatus 11, the detailed description thereof will be omitted.

As shown in the sixteenth aspect, the first bonding apparatus 11 is bonded to the upper surface of the liquid crystal panel P that has been introduced to the bonding position, and is cut into a predetermined size of the bonding sheet F5. The first bonding apparatus 11 has a blade 11a and a pinch roller 11b.

The blade 11a winds the half-cut optical sheet F at an acute angle, and supplies the bonded sheet F5 to the bonding position while separating the bonded sheet F5 from the spacer F3.

The nip roller 11b is bonded to the upper surface of the liquid crystal panel P conveyed by the upstream conveyor by the bonding sheet F5 of the predetermined length which isolate|separated from the optical sheet F by the blade 11a. The nip roller 11b has a pair of bonding rollers which are disposed so as to be parallel to each other in the axial direction. A predetermined gap is formed between the pair of bonding rollers, and the gap is the bonding position of the first bonding apparatus 11. The liquid crystal panel P and the bonding sheet F5 are superposed and introduced into the gap. The liquid crystal panel P and the bonded sheet F5 are fed to the downstream side of the panel conveyance of the upstream conveyor while being pinched by the pinch roller 11b. Thereby, the bonding sheet F5 is integrally bonded to the upper surface of the liquid crystal panel P. Hereinafter, the bonded panel is referred to as a single-sided bonding panel P11.

The winding portion 8e is wound around the second spacer H2 which is formed as a single via the blade 11a, and is held as the second spacer roll R4.

The reversing device (not shown) is provided on the downstream side of the panel conveyance of the first bonding apparatus 11 and transports the liquid crystal panel P that has reached the end position of the upstream conveyor to the start position of the downstream conveyor.

The reversing device holds the single-sided bonding panel P11 that has reached the end position of the upstream conveyor through the first bonding apparatus 11 by suction, clamping, or the like. The reversing device reverses the front and back of the single-sided bonding panel P11. For example, the single-sided bonding panel P11 that is transported in parallel with the long side of the display region P4 is transferred in a direction parallel to the short side of the display region P4.

The above-described inversion is performed when the optical members F1 bonded to the front and back surfaces of the liquid crystal panel P are arranged at right angles to each other in the direction of the polarization axis.

However, when only the front and back of the liquid crystal panel P are reversed, for example, an inversion device having an inversion arm having a rotation axis parallel to the conveyance direction may be used. In this case, when the sheet conveying direction of the first supply device 7 and the sheet conveying direction of the second feeding device are arranged at right angles in plan view, the front and back surfaces of the liquid crystal panel P can be bonded to each other. The optical component F1 is formed at a right angle in the axial direction.

Since the second supply device has the same configuration as the first supply device 7, the detailed description thereof will be omitted. In the second supply device, the optical sheet F is taken up by the material roll around which the strip-shaped optical sheet F is wound, and is supplied after being cut into a predetermined size. The second supply device includes a second transfer device, a pre-inspection peeling device, a second defect inspecting device, a post-inspection bonding device, and a second cutting device.

The second bonding apparatus is bonded to the upper surface of the liquid crystal panel P that has been introduced to the bonding position, and is cut into a predetermined size of the bonding sheet F5. The second bonding device has: with the first sticker The same blade and the pinch roller of the device 11 are combined.

In the gap between the pair of bonding rollers of the nip roller (the bonding position of the second bonding apparatus), the single-sided bonding panel P11 and the bonding sheet F5 are introduced in a state in which they are superimposed, and The bonded sheet F5 is integrally bonded to the upper surface of the single-sided bonding panel P11. Hereinafter, the bonded panel is referred to as a double-sided bonding panel (optical member bonding body).

The inspection device (not shown) is provided on the downstream side of the panel conveyance than the second bonding device. The inspection device checks whether the two-sided bonding panel has defects (poor bonding, etc.). The defects to be inspected include defects such as trapping of foreign matter or bubbles when the liquid crystal panel and the bonded sheet are bonded, damage of the surface of the bonded sheet, defects in alignment of the liquid crystal panel, and the like. .

In the present embodiment, the control unit 2 as an electronic control unit that collectively controls each unit of the film bonding system 1 is configured to include a computer system. The computer system includes an arithmetic processing unit such as a central processing unit (CPU), and a memory unit such as a memory or a hard disk. The control unit 2 of the present embodiment includes an interface that can perform communication with an external device of the computer system. An input device to which an input signal can be input can also be connected to the control unit 2. The input device includes an input device such as a keyboard or a mouse, or a communication device that can input data from an external device of the computer system. The control unit 2 may include a display device such as a liquid crystal display that indicates the operation state of each unit of the film bonding system 1, and may be connected to the display device.

An operating system (OS) for controlling the computer system is attached to the memory unit of the control unit 2. In the memory unit of the control unit 2, the arithmetic processing unit controls each unit of the film bonding system 1 to execute a program for accurately transferring the optical sheet F to each unit of the film bonding system 1. Various pieces of information including a program recorded in the storage unit can be read by the arithmetic processing unit of the control unit 2. The control unit 2 may also include various places required to perform control of each unit of the film bonding system 1. A logic circuit such as an ASIC (Application Specific Integrated Circuit).

The memory unit includes a semiconductor memory such as a RAM (Random Access Memory) or a ROM (Read Only Memory), or a hard disk or a CD-ROM reading device. The concept of an external memory device such as a disc type memory medium. The memory unit is functionally set to memorize the memory of the program software in which the control sequence of the operations of the first supply device 7, the first bonding device 11, the inverting device, the second supply device, the second bonding device, and the inspection device is described. Area, various other memory areas.

As described above, the first defect inspection device 9 of the present embodiment is constituted by the defect inspection device 102 described above. Therefore, even in the case where the configuration of the bonding sheet F5 is different, the defect of the bonding surface side of each bonding sheet F5 can be detected by the same defect inspection device 102.

Therefore, according to the present embodiment, the defect inspection of the one surface side and the other surface side of the bonded sheet F5 can be easily switched.

The preferred embodiment of the present embodiment will be described with reference to the drawings, but the present invention is not limited to this example, and it goes without saying. The shapes, combinations, and the like of the respective constituent members shown in the above examples are merely examples, and various modifications can be made according to design requirements and the like without departing from the gist of the invention.

Claims (5)

A defect inspection device comprising a defect inspection device including an optical member of a polarizing element, comprising: a light source disposed on a first side of the optical member, irradiating light to the optical member; and an imaging device configured An image obtained by transmitting light from the optical member is imaged on a second side of the optical member, and a first polarizing filter is disposed on an optical path between the light source and the optical member. The absorption axis of the polarizing element is a first absorption axis that is orthogonal to each other, and the second polarization filter is disposed on an optical path between the imaging device and the optical member, and has a positive axis with respect to an absorption axis of the polarizing element. a second absorption axis; the first moving device moves the optical path between the first polarizing filter and the optical member forward and backward; and the second moving device causes the second polarizing filter a light microscope moves forward and backward relative to an optical path between the imaging device and the optical component; and a control device controls the advancement and retreat of the first mobile device and the second mobile device , So that the first or the second polarizing filter polarizing filter disposed at a position deviated from the optical path. The defect inspection device according to claim 1, wherein the control device moves the first polarizing filter to the light source and the optical member by the first moving device in the first imaging mode. Controlling the mode of the optical path therebetween, and performing the first bias so that the absorption axis of the polarizing element is orthogonal to the first absorption axis Controlling the arrangement of the optical filters, and controlling the second polarizing filter to move to a position shifted by an optical path between the imaging device and the optical member by the second moving device, the control In the second imaging mode, the first moving device controls the first polarizing filter to move to a position shifted by an optical path between the light source and the optical member, and the first (2) The moving device controls the second polarizing filter to move to an optical path between the imaging device and the optical member, and the absorption axis of the polarizing element is orthogonal to the second absorption axis Control of the arrangement of the aforementioned second polarizing filter. A manufacturing system for an optical component, which is a manufacturing system of an optical component including a polarizing element, comprising: an optical component manufacturing apparatus that manufactures the optical component; and the method of claim 1 or 2 A defect inspection device that checks whether or not the optical component is defective. The optical component manufacturing system according to claim 3, wherein the optical component comprises: a polarizing element; a first protective layer laminated on the first surface of the polarizing element; and a layered layer on the polarized light In the second protective layer on the second surface of the element, the optical component manufacturing apparatus includes a first supply unit that supplies the polarizing element, and a second supply unit that is disposed in a supply path of the polarizing element. a first side, and a laminated member, wherein the laminated member includes: the first protective layer and the laminated layer a third protective layer on the third surface of the first protective layer; a third supply portion disposed on the second side of the supply path of the polarizing element, and supplied to the second protective layer; and a peeling portion The first protective layer is formed on the first side of the supply path of the polarizing element, and the third protective layer is peeled off from the laminated member to form the first protective layer. A production system for an optical display device, which is a production system of an optical display device in which an optical display component is bonded to an optical component, comprising: a transport device for transporting the optical component; and a bonding device The optical display device is bonded to the optical display component by the optical member to be transported by the transfer device, and the defect inspection device according to the first or second aspect of the invention is inspected by the transfer. Whether the optical member to be transported to the bonding apparatus is defective or not.