TWI624901B - 具有饋通結構的基材支撐件 - Google Patents
具有饋通結構的基材支撐件 Download PDFInfo
- Publication number
- TWI624901B TWI624901B TW102110082A TW102110082A TWI624901B TW I624901 B TWI624901 B TW I624901B TW 102110082 A TW102110082 A TW 102110082A TW 102110082 A TW102110082 A TW 102110082A TW I624901 B TWI624901 B TW I624901B
- Authority
- TW
- Taiwan
- Prior art keywords
- disposed
- openings
- conductive mesh
- conductors
- region
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B3/00—Ohmic-resistance heating
- H05B3/20—Heating elements having extended surface area substantially in a two-dimensional [2D] plane, e.g. plate-heater
- H05B3/22—Heating elements having extended surface area substantially in a two-dimensional [2D] plane, e.g. plate-heater non-flexible
- H05B3/26—Heating elements having extended surface area substantially in a two-dimensional [2D] plane, e.g. plate-heater non-flexible heating conductor mounted on insulating base
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
- H10P72/0432—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/76—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
- H10P72/7604—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
- H10P72/7626—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the construction of the shaft
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Resistance Heating (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201261617946P | 2012-03-30 | 2012-03-30 | |
| US61/617,946 | 2012-03-30 | ||
| US13/845,492 | 2013-03-18 | ||
| US13/845,492 US9706605B2 (en) | 2012-03-30 | 2013-03-18 | Substrate support with feedthrough structure |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201347080A TW201347080A (zh) | 2013-11-16 |
| TWI624901B true TWI624901B (zh) | 2018-05-21 |
Family
ID=49233841
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW102110082A TWI624901B (zh) | 2012-03-30 | 2013-03-21 | 具有饋通結構的基材支撐件 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9706605B2 (https=) |
| JP (1) | JP6211053B2 (https=) |
| KR (1) | KR102123366B1 (https=) |
| CN (1) | CN104247001B (https=) |
| TW (1) | TWI624901B (https=) |
| WO (1) | WO2013148406A1 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI821686B (zh) * | 2020-08-27 | 2023-11-11 | 大陸商中微半導體設備(上海)股份有限公司 | 電漿處理裝置 |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5973731B2 (ja) * | 2012-01-13 | 2016-08-23 | 東京エレクトロン株式会社 | プラズマ処理装置及びヒータの温度制御方法 |
| US9543186B2 (en) | 2013-02-01 | 2017-01-10 | Applied Materials, Inc. | Substrate support with controlled sealing gap |
| JP6276919B2 (ja) * | 2013-02-01 | 2018-02-07 | 株式会社日立ハイテクノロジーズ | プラズマ処理装置および試料台 |
| US9698074B2 (en) | 2013-09-16 | 2017-07-04 | Applied Materials, Inc. | Heated substrate support with temperature profile control |
| US9673025B2 (en) * | 2015-07-27 | 2017-06-06 | Lam Research Corporation | Electrostatic chuck including embedded faraday cage for RF delivery and associated methods for operation, monitoring, and control |
| US10582570B2 (en) * | 2016-01-22 | 2020-03-03 | Applied Materials, Inc. | Sensor system for multi-zone electrostatic chuck |
| US10892179B2 (en) * | 2016-11-08 | 2021-01-12 | Lam Research Corporation | Electrostatic chuck including clamp electrode assembly forming portion of Faraday cage for RF delivery and associated methods |
| US10079168B2 (en) * | 2016-11-08 | 2018-09-18 | Lam Research Corporation | Ceramic electrostatic chuck including embedded Faraday cage for RF delivery and associated methods for operation, monitoring, and control |
| KR20190042831A (ko) | 2017-10-17 | 2019-04-25 | 주식회사 이에스티 | 정전척 및 진공 챔버의 피드스루 기밀 구조 |
| KR102124303B1 (ko) | 2018-10-15 | 2020-06-18 | 세메스 주식회사 | 기판 처리 장치, 기판 지지 유닛 및 기판 처리 방법 |
| KR102628367B1 (ko) * | 2019-03-18 | 2024-01-24 | 엔지케이 인슐레이터 엘티디 | 세라믹 히터 및 그의 제법 |
| JP2021034347A (ja) * | 2019-08-29 | 2021-03-01 | 株式会社デンソーウェーブ | 複合ケーブル及びロボットシステム |
| US11270903B2 (en) * | 2019-12-17 | 2022-03-08 | Applied Materials, Inc. | Multi zone electrostatic chuck |
| US11551951B2 (en) | 2020-05-05 | 2023-01-10 | Applied Materials, Inc. | Methods and systems for temperature control for a substrate |
| KR102326329B1 (ko) | 2021-03-30 | 2021-11-15 | 임하나 | 진공 챔버용 피드 스루 및 그 제조 방법 |
| CN116387224A (zh) * | 2021-12-22 | 2023-07-04 | 拓荆科技股份有限公司 | 真空吸附系统及方法 |
| DE102024116166A1 (de) | 2024-06-10 | 2025-12-11 | Festo Se & Co. Kg | System zur Bearbeitung eines Strukturkörpers |
| DE102024116164A1 (de) | 2024-06-10 | 2025-12-11 | Festo Se & Co. Kg | System zur Bearbeitung eines Strukturkörpers |
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| TW200405443A (en) * | 2002-06-18 | 2004-04-01 | Anelva Corp | Electrostatic absorbing apparatus |
| TWM423339U (en) * | 2011-10-05 | 2012-02-21 | Raytrend Technology Co Ltd | Signal shielding wire |
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| JPS63125311U (https=) | 1987-02-09 | 1988-08-16 | ||
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| DE102007041209B4 (de) * | 2007-08-31 | 2017-11-23 | Globalfoundries Dresden Module One Limited Liability Company & Co. Kg | Polierkopf, der Zonenkontrolle verwendet |
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-
2013
- 2013-03-18 US US13/845,492 patent/US9706605B2/en active Active
- 2013-03-19 JP JP2015503364A patent/JP6211053B2/ja active Active
- 2013-03-19 WO PCT/US2013/032874 patent/WO2013148406A1/en not_active Ceased
- 2013-03-19 KR KR1020147030437A patent/KR102123366B1/ko active Active
- 2013-03-19 CN CN201380016546.XA patent/CN104247001B/zh active Active
- 2013-03-21 TW TW102110082A patent/TWI624901B/zh active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200405443A (en) * | 2002-06-18 | 2004-04-01 | Anelva Corp | Electrostatic absorbing apparatus |
| TWM423339U (en) * | 2011-10-05 | 2012-02-21 | Raytrend Technology Co Ltd | Signal shielding wire |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI821686B (zh) * | 2020-08-27 | 2023-11-11 | 大陸商中微半導體設備(上海)股份有限公司 | 電漿處理裝置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP6211053B2 (ja) | 2017-10-11 |
| US20130256966A1 (en) | 2013-10-03 |
| TW201347080A (zh) | 2013-11-16 |
| CN104247001B (zh) | 2017-06-06 |
| KR102123366B1 (ko) | 2020-06-16 |
| WO2013148406A1 (en) | 2013-10-03 |
| KR20150003229A (ko) | 2015-01-08 |
| JP2015518275A (ja) | 2015-06-25 |
| CN104247001A (zh) | 2014-12-24 |
| US9706605B2 (en) | 2017-07-11 |
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