TWI567375B - 光元件、分析裝置及分光方法 - Google Patents

光元件、分析裝置及分光方法 Download PDF

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Publication number
TWI567375B
TWI567375B TW100114336A TW100114336A TWI567375B TW I567375 B TWI567375 B TW I567375B TW 100114336 A TW100114336 A TW 100114336A TW 100114336 A TW100114336 A TW 100114336A TW I567375 B TWI567375 B TW I567375B
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TW
Taiwan
Prior art keywords
incident
wavelength
light
raman scattering
resonance peak
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TW100114336A
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English (en)
Chinese (zh)
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TW201213791A (en
Inventor
尼子淳
山田耕平
Original Assignee
精工愛普生股份有限公司
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Publication of TW201213791A publication Critical patent/TW201213791A/zh
Application granted granted Critical
Publication of TWI567375B publication Critical patent/TWI567375B/zh

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65Raman scattering
    • G01N21/658Raman scattering enhancement Raman, e.g. surface plasmons
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • G01N21/552Attenuated total reflection
    • G01N21/553Attenuated total reflection and using surface plasmons
    • G01N21/554Attenuated total reflection and using surface plasmons detecting the surface plasmon resonance of nanostructured metals, e.g. localised surface plasmon resonance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65Raman scattering

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  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Nanotechnology (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
TW100114336A 2010-04-28 2011-04-25 光元件、分析裝置及分光方法 TWI567375B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010103035A JP5609241B2 (ja) 2010-04-28 2010-04-28 分光方法及び分析装置

Publications (2)

Publication Number Publication Date
TW201213791A TW201213791A (en) 2012-04-01
TWI567375B true TWI567375B (zh) 2017-01-21

Family

ID=44317620

Family Applications (1)

Application Number Title Priority Date Filing Date
TW100114336A TWI567375B (zh) 2010-04-28 2011-04-25 光元件、分析裝置及分光方法

Country Status (6)

Country Link
US (1) US8848182B2 (enExample)
EP (1) EP2383565A1 (enExample)
JP (1) JP5609241B2 (enExample)
KR (1) KR20110120233A (enExample)
CN (1) CN102608823B (enExample)
TW (1) TWI567375B (enExample)

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JP5560891B2 (ja) * 2010-05-13 2014-07-30 セイコーエプソン株式会社 光デバイス及び分析装置
JP5821511B2 (ja) 2011-10-17 2015-11-24 セイコーエプソン株式会社 光デバイス及び検出装置
KR101333482B1 (ko) * 2012-03-08 2013-11-26 단국대학교 산학협력단 표면 플라즈몬 산란 및 공명 검출에 기반한 생체 물질 측정 시스템
JP5928026B2 (ja) * 2012-03-15 2016-06-01 セイコーエプソン株式会社 センサーチップおよびその製造方法並びに検出装置
JP2013234941A (ja) * 2012-05-10 2013-11-21 Seiko Epson Corp センサーチップ並びにセンサーカートリッジおよび検出装置
JP2014169955A (ja) 2013-03-05 2014-09-18 Seiko Epson Corp 分析装置、分析方法、これらに用いる光学素子および電子機器、並びに光学素子の設計方法
JP2014206463A (ja) * 2013-04-12 2014-10-30 日本精工株式会社 標的物質捕捉装置
JP6180834B2 (ja) * 2013-07-24 2017-08-16 株式会社クラレ プラズモン共鳴構造体
US9297772B2 (en) 2013-07-30 2016-03-29 Industrial Technology Research Institute Apparatus for amplifying intensity during transmission small angle—X-ray scattering measurements
JP6269008B2 (ja) * 2013-12-12 2018-01-31 株式会社豊田中央研究所 電磁波−表面ポラリトン変換素子。
KR101494679B1 (ko) * 2013-12-30 2015-02-24 한국과학기술원 표면 증강 라만 산란을 위한 국부 표면 플라즈몬 공명 파장의 설계 방법
JP6365817B2 (ja) 2014-02-17 2018-08-01 セイコーエプソン株式会社 分析装置、及び電子機器
JP2015152492A (ja) * 2014-02-17 2015-08-24 セイコーエプソン株式会社 分析装置、及び電子機器
JP2016142617A (ja) * 2015-02-02 2016-08-08 セイコーエプソン株式会社 電場増強素子、分析装置、及び電子機器
JP6613736B2 (ja) * 2015-09-07 2019-12-04 セイコーエプソン株式会社 物質検出方法および物質検出装置
US9772290B2 (en) * 2015-10-23 2017-09-26 King Fahd University Of Petroleum And Minerals Anisotropic monolayer gold nanoassembly: a highly SERS-active substrate for molecular detection
CN106125175A (zh) * 2016-06-24 2016-11-16 中国科学院长春光学精密机械与物理研究所 一种慢光结构、吸光度检测方法及微流控芯片
US20190391302A1 (en) * 2017-01-30 2019-12-26 Aalto University Foundation Sr A plasmonic device
CN110244392B (zh) * 2019-07-31 2021-07-20 华中科技大学 一种不对称传输器
JP7210067B2 (ja) * 2019-08-02 2023-01-23 国立研究開発法人物質・材料研究機構 光センサー、センサーユニット及び光センサーを利用した物体検出装置
JP7534984B2 (ja) 2021-03-03 2024-08-15 株式会社日立ハイテク 分光測定装置
US11959859B2 (en) * 2021-06-02 2024-04-16 Edwin Thomas Carlen Multi-gas detection system and method
US20240248033A1 (en) * 2023-01-19 2024-07-25 Academia Sinica Surface Plasmon Resonance Sensor, Surface Plasmon Resonance Sensing Instrument Comprising the Same and Method for Detecting an Analyte Using the Same
KR102897525B1 (ko) * 2025-05-30 2025-12-08 경찰대학 산학협력단 인공지능 기반 지능형 마약류 탐지 시스템

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TW200718937A (en) * 2005-11-03 2007-05-16 Ind Tech Res Inst Coupled waveguide-surface plasmon resonance biosensor
JP2008519254A (ja) * 2004-11-04 2008-06-05 ディー3 テクノロジーズ リミテッド 増強ラマン分光法のための金属ナノ空隙フォトニック結晶
US7397559B1 (en) * 2007-01-23 2008-07-08 Hewlett-Packard Development Company, L.P. Surface plasmon enhanced Raman spectroscopy
JP2009250951A (ja) * 2008-04-11 2009-10-29 Fujifilm Corp 電場増強光デバイス
US20100067000A1 (en) * 2004-09-10 2010-03-18 University Of Southampton Raman spectroscopy

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JP4209471B2 (ja) * 1997-02-20 2009-01-14 ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア プラズモン共鳴粒子、方法、および装置
JP3452837B2 (ja) 1999-06-14 2003-10-06 理化学研究所 局在プラズモン共鳴センサー
JP2005016963A (ja) * 2003-06-23 2005-01-20 Canon Inc 化学センサ、化学センサ装置
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EP2278301A1 (en) 2004-11-04 2011-01-26 Renishaw Diagnostics Limited Metal nano-void photonic crystal for enhanced raman spectroscopy
JP4117665B2 (ja) * 2005-03-03 2008-07-16 独立行政法人物質・材料研究機構 光学分析用チップとその製造方法、光学分析用装置、および光学分析方法
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JP4878216B2 (ja) 2005-06-01 2012-02-15 キヤノン株式会社 局在プラズモン共鳴センサおよび局在プラズモン共鳴センサによる検出方法
WO2008073601A2 (en) * 2006-10-31 2008-06-19 Trustees Of Boston University Deterministic aperiodic patterned dielectric and plasmonic materials for localized electromagnetic field enhancement
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US20100067000A1 (en) * 2004-09-10 2010-03-18 University Of Southampton Raman spectroscopy
JP2008519254A (ja) * 2004-11-04 2008-06-05 ディー3 テクノロジーズ リミテッド 増強ラマン分光法のための金属ナノ空隙フォトニック結晶
TW200718937A (en) * 2005-11-03 2007-05-16 Ind Tech Res Inst Coupled waveguide-surface plasmon resonance biosensor
US7397559B1 (en) * 2007-01-23 2008-07-08 Hewlett-Packard Development Company, L.P. Surface plasmon enhanced Raman spectroscopy
JP2009250951A (ja) * 2008-04-11 2009-10-29 Fujifilm Corp 電場増強光デバイス

Also Published As

Publication number Publication date
JP5609241B2 (ja) 2014-10-22
EP2383565A1 (en) 2011-11-02
US20110267613A1 (en) 2011-11-03
CN102608823B (zh) 2016-02-03
CN102608823A (zh) 2012-07-25
TW201213791A (en) 2012-04-01
US8848182B2 (en) 2014-09-30
JP2011232186A (ja) 2011-11-17
KR20110120233A (ko) 2011-11-03

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