JP5609241B2 - 分光方法及び分析装置 - Google Patents

分光方法及び分析装置 Download PDF

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Publication number
JP5609241B2
JP5609241B2 JP2010103035A JP2010103035A JP5609241B2 JP 5609241 B2 JP5609241 B2 JP 5609241B2 JP 2010103035 A JP2010103035 A JP 2010103035A JP 2010103035 A JP2010103035 A JP 2010103035A JP 5609241 B2 JP5609241 B2 JP 5609241B2
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wavelength
light
raman scattering
incident
protrusion group
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Japanese (ja)
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JP2011232186A5 (enExample
JP2011232186A (ja
Inventor
尼子　淳
淳 尼子
山田　耕平
耕平 山田
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Seiko Epson Corp
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Seiko Epson Corp
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Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP2010103035A priority Critical patent/JP5609241B2/ja
Priority to TW100114336A priority patent/TWI567375B/zh
Priority to KR20110039320A priority patent/KR20110120233A/ko
Priority to US13/095,103 priority patent/US8848182B2/en
Priority to CN201110107698.3A priority patent/CN102608823B/zh
Priority to EP20110164070 priority patent/EP2383565A1/en
Publication of JP2011232186A publication Critical patent/JP2011232186A/ja
Publication of JP2011232186A5 publication Critical patent/JP2011232186A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering
    • G01N21/658—Raman scattering enhancement Raman, e.g. surface plasmons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G01N21/554—Attenuated total reflection and using surface plasmons detecting the surface plasmon resonance of nanostructured metals, e.g. localised surface plasmon resonance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering

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  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2010103035A 2010-04-28 2010-04-28 分光方法及び分析装置 Active JP5609241B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2010103035A JP5609241B2 (ja) 2010-04-28 2010-04-28 分光方法及び分析装置
TW100114336A TWI567375B (zh) 2010-04-28 2011-04-25 光元件、分析裝置及分光方法
US13/095,103 US8848182B2 (en) 2010-04-28 2011-04-27 Optical device, analyzing apparatus and spectroscopic method
CN201110107698.3A CN102608823B (zh) 2010-04-28 2011-04-27 分光方法及分析装置
KR20110039320A KR20110120233A (ko) 2010-04-28 2011-04-27 광 디바이스, 분석 장치 및 분광 방법
EP20110164070 EP2383565A1 (en) 2010-04-28 2011-04-28 Optical device, analyzing apparatus and spectroscopic method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010103035A JP5609241B2 (ja) 2010-04-28 2010-04-28 分光方法及び分析装置

Publications (3)

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JP2011232186A JP2011232186A (ja) 2011-11-17
JP2011232186A5 JP2011232186A5 (enExample) 2013-05-02
JP5609241B2 true JP5609241B2 (ja) 2014-10-22

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JP2010103035A Active JP5609241B2 (ja) 2010-04-28 2010-04-28 分光方法及び分析装置

Country Status (6)

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US (1) US8848182B2 (enExample)
EP (1) EP2383565A1 (enExample)
JP (1) JP5609241B2 (enExample)
KR (1) KR20110120233A (enExample)
CN (1) CN102608823B (enExample)
TW (1) TWI567375B (enExample)

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* Cited by examiner, † Cited by third party
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JP5560891B2 (ja) * 2010-05-13 2014-07-30 セイコーエプソン株式会社 光デバイス及び分析装置
JP5821511B2 (ja) 2011-10-17 2015-11-24 セイコーエプソン株式会社 光デバイス及び検出装置
KR101333482B1 (ko) * 2012-03-08 2013-11-26 단국대학교 산학협력단 표면 플라즈몬 산란 및 공명 검출에 기반한 생체 물질 측정 시스템
JP5928026B2 (ja) * 2012-03-15 2016-06-01 セイコーエプソン株式会社 センサーチップおよびその製造方法並びに検出装置
JP2013234941A (ja) * 2012-05-10 2013-11-21 Seiko Epson Corp センサーチップ並びにセンサーカートリッジおよび検出装置
JP2014169955A (ja) 2013-03-05 2014-09-18 Seiko Epson Corp 分析装置、分析方法、これらに用いる光学素子および電子機器、並びに光学素子の設計方法
JP2014206463A (ja) * 2013-04-12 2014-10-30 日本精工株式会社 標的物質捕捉装置
JP6180834B2 (ja) * 2013-07-24 2017-08-16 株式会社クラレ プラズモン共鳴構造体
US9297772B2 (en) 2013-07-30 2016-03-29 Industrial Technology Research Institute Apparatus for amplifying intensity during transmission small angle—X-ray scattering measurements
JP6269008B2 (ja) * 2013-12-12 2018-01-31 株式会社豊田中央研究所 電磁波−表面ポラリトン変換素子。
KR101494679B1 (ko) * 2013-12-30 2015-02-24 한국과학기술원 표면 증강 라만 산란을 위한 국부 표면 플라즈몬 공명 파장의 설계 방법
JP6365817B2 (ja) 2014-02-17 2018-08-01 セイコーエプソン株式会社 分析装置、及び電子機器
JP2015152492A (ja) * 2014-02-17 2015-08-24 セイコーエプソン株式会社 分析装置、及び電子機器
JP2016142617A (ja) * 2015-02-02 2016-08-08 セイコーエプソン株式会社 電場増強素子、分析装置、及び電子機器
JP6613736B2 (ja) * 2015-09-07 2019-12-04 セイコーエプソン株式会社 物質検出方法および物質検出装置
US9772290B2 (en) 2015-10-23 2017-09-26 King Fahd University Of Petroleum And Minerals Anisotropic monolayer gold nanoassembly: a highly SERS-active substrate for molecular detection
CN106125175A (zh) * 2016-06-24 2016-11-16 中国科学院长春光学精密机械与物理研究所 一种慢光结构、吸光度检测方法及微流控芯片
WO2018138415A1 (en) * 2017-01-30 2018-08-02 Aalto University Foundation Sr A plasmonic device
CN110244392B (zh) * 2019-07-31 2021-07-20 华中科技大学 一种不对称传输器
EP4009015B1 (en) * 2019-08-02 2025-11-26 National Institute for Materials Science Optical sensor, sensor unit, and object detection device using optical sensor
JP7534984B2 (ja) * 2021-03-03 2024-08-15 株式会社日立ハイテク 分光測定装置
US11959859B2 (en) * 2021-06-02 2024-04-16 Edwin Thomas Carlen Multi-gas detection system and method
US20240248033A1 (en) * 2023-01-19 2024-07-25 Academia Sinica Surface Plasmon Resonance Sensor, Surface Plasmon Resonance Sensing Instrument Comprising the Same and Method for Detecting an Analyte Using the Same
KR102897525B1 (ko) * 2025-05-30 2025-12-08 경찰대학 산학협력단 인공지능 기반 지능형 마약류 탐지 시스템

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ATE349697T1 (de) * 1997-02-20 2007-01-15 Univ California Plasmon-schwingteilchen, methode und vorrichtung
JP3452837B2 (ja) 1999-06-14 2003-10-06 理化学研究所 局在プラズモン共鳴センサー
JP2005016963A (ja) * 2003-06-23 2005-01-20 Canon Inc 化学センサ、化学センサ装置
GB2418017A (en) * 2004-09-10 2006-03-15 Univ Southampton Raman spectroscopy
JP2006093055A (ja) 2004-09-27 2006-04-06 Toshiba Corp 画像表示装置
GB0424458D0 (en) * 2004-11-04 2004-12-08 Mesophotonics Ltd Metal nano-void photonic crystal for enhanced raman spectroscopy
WO2006048660A1 (en) 2004-11-04 2006-05-11 Mesophotonics Limited Metal nano-void photonic crystal for enhanced raman spectroscopy
WO2006093055A1 (ja) * 2005-03-03 2006-09-08 National Institute For Materials Science 光学分析用チップとその製造方法、光学分析用装置、および光学分析方法
JP2006308511A (ja) * 2005-05-02 2006-11-09 Canon Inc 化学分析装置及びその分析方法
JP4878216B2 (ja) 2005-06-01 2012-02-15 キヤノン株式会社 局在プラズモン共鳴センサおよび局在プラズモン共鳴センサによる検出方法
US7599066B2 (en) 2005-06-01 2009-10-06 Canon Kabushiki Kaisha Localized plasmon resonance sensor
TWI296044B (en) * 2005-11-03 2008-04-21 Ind Tech Res Inst Coupled waveguide-surface plasmon resonance biosensor
WO2008073601A2 (en) * 2006-10-31 2008-06-19 Trustees Of Boston University Deterministic aperiodic patterned dielectric and plasmonic materials for localized electromagnetic field enhancement
US7397559B1 (en) * 2007-01-23 2008-07-08 Hewlett-Packard Development Company, L.P. Surface plasmon enhanced Raman spectroscopy
US7639355B2 (en) * 2007-06-26 2009-12-29 Hewlett-Packard Development Company, L.P. Electric-field-enhancement structure and detection apparatus using same
JP2009250951A (ja) * 2008-04-11 2009-10-29 Fujifilm Corp 電場増強光デバイス
US8223331B2 (en) * 2009-06-19 2012-07-17 Hewlett-Packard Development Company, L.P. Signal-amplification device for surface enhanced raman spectroscopy
US8865402B2 (en) * 2009-08-26 2014-10-21 Clemson University Research Foundation Nanostructured substrates for surface enhanced raman spectroscopy (SERS) and detection of biological and chemical analytes by electrical double layer (EDL) capacitance

Also Published As

Publication number Publication date
EP2383565A1 (en) 2011-11-02
KR20110120233A (ko) 2011-11-03
TWI567375B (zh) 2017-01-21
CN102608823A (zh) 2012-07-25
JP2011232186A (ja) 2011-11-17
US8848182B2 (en) 2014-09-30
TW201213791A (en) 2012-04-01
US20110267613A1 (en) 2011-11-03
CN102608823B (zh) 2016-02-03

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