JP2011232186A5 - - Google Patents

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Publication number
JP2011232186A5
JP2011232186A5 JP2010103035A JP2010103035A JP2011232186A5 JP 2011232186 A5 JP2011232186 A5 JP 2011232186A5 JP 2010103035 A JP2010103035 A JP 2010103035A JP 2010103035 A JP2010103035 A JP 2010103035A JP 2011232186 A5 JP2011232186 A5 JP 2011232186A5
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JP
Japan
Prior art keywords
protrusion group
virtual plane
wavelength
resonance peak
incident
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JP2010103035A
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English (en)
Japanese (ja)
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JP2011232186A (ja
JP5609241B2 (ja
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Priority claimed from JP2010103035A external-priority patent/JP5609241B2/ja
Priority to JP2010103035A priority Critical patent/JP5609241B2/ja
Priority to TW100114336A priority patent/TWI567375B/zh
Priority to KR20110039320A priority patent/KR20110120233A/ko
Priority to US13/095,103 priority patent/US8848182B2/en
Priority to CN201110107698.3A priority patent/CN102608823B/zh
Priority to EP20110164070 priority patent/EP2383565A1/en
Publication of JP2011232186A publication Critical patent/JP2011232186A/ja
Publication of JP2011232186A5 publication Critical patent/JP2011232186A5/ja
Publication of JP5609241B2 publication Critical patent/JP5609241B2/ja
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JP2010103035A 2010-04-28 2010-04-28 分光方法及び分析装置 Active JP5609241B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2010103035A JP5609241B2 (ja) 2010-04-28 2010-04-28 分光方法及び分析装置
TW100114336A TWI567375B (zh) 2010-04-28 2011-04-25 光元件、分析裝置及分光方法
CN201110107698.3A CN102608823B (zh) 2010-04-28 2011-04-27 分光方法及分析装置
US13/095,103 US8848182B2 (en) 2010-04-28 2011-04-27 Optical device, analyzing apparatus and spectroscopic method
KR20110039320A KR20110120233A (ko) 2010-04-28 2011-04-27 광 디바이스, 분석 장치 및 분광 방법
EP20110164070 EP2383565A1 (en) 2010-04-28 2011-04-28 Optical device, analyzing apparatus and spectroscopic method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010103035A JP5609241B2 (ja) 2010-04-28 2010-04-28 分光方法及び分析装置

Publications (3)

Publication Number Publication Date
JP2011232186A JP2011232186A (ja) 2011-11-17
JP2011232186A5 true JP2011232186A5 (enExample) 2013-05-02
JP5609241B2 JP5609241B2 (ja) 2014-10-22

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010103035A Active JP5609241B2 (ja) 2010-04-28 2010-04-28 分光方法及び分析装置

Country Status (6)

Country Link
US (1) US8848182B2 (enExample)
EP (1) EP2383565A1 (enExample)
JP (1) JP5609241B2 (enExample)
KR (1) KR20110120233A (enExample)
CN (1) CN102608823B (enExample)
TW (1) TWI567375B (enExample)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5560891B2 (ja) * 2010-05-13 2014-07-30 セイコーエプソン株式会社 光デバイス及び分析装置
JP5821511B2 (ja) 2011-10-17 2015-11-24 セイコーエプソン株式会社 光デバイス及び検出装置
KR101333482B1 (ko) * 2012-03-08 2013-11-26 단국대학교 산학협력단 표면 플라즈몬 산란 및 공명 검출에 기반한 생체 물질 측정 시스템
JP5928026B2 (ja) * 2012-03-15 2016-06-01 セイコーエプソン株式会社 センサーチップおよびその製造方法並びに検出装置
JP2013234941A (ja) * 2012-05-10 2013-11-21 Seiko Epson Corp センサーチップ並びにセンサーカートリッジおよび検出装置
JP2014169955A (ja) 2013-03-05 2014-09-18 Seiko Epson Corp 分析装置、分析方法、これらに用いる光学素子および電子機器、並びに光学素子の設計方法
JP2014206463A (ja) * 2013-04-12 2014-10-30 日本精工株式会社 標的物質捕捉装置
JP6180834B2 (ja) * 2013-07-24 2017-08-16 株式会社クラレ プラズモン共鳴構造体
US9297772B2 (en) 2013-07-30 2016-03-29 Industrial Technology Research Institute Apparatus for amplifying intensity during transmission small angle—X-ray scattering measurements
JP6269008B2 (ja) * 2013-12-12 2018-01-31 株式会社豊田中央研究所 電磁波−表面ポラリトン変換素子。
KR101494679B1 (ko) * 2013-12-30 2015-02-24 한국과학기술원 표면 증강 라만 산란을 위한 국부 표면 플라즈몬 공명 파장의 설계 방법
JP2015152492A (ja) * 2014-02-17 2015-08-24 セイコーエプソン株式会社 分析装置、及び電子機器
JP6365817B2 (ja) 2014-02-17 2018-08-01 セイコーエプソン株式会社 分析装置、及び電子機器
JP2016142617A (ja) * 2015-02-02 2016-08-08 セイコーエプソン株式会社 電場増強素子、分析装置、及び電子機器
JP6613736B2 (ja) * 2015-09-07 2019-12-04 セイコーエプソン株式会社 物質検出方法および物質検出装置
US9772290B2 (en) 2015-10-23 2017-09-26 King Fahd University Of Petroleum And Minerals Anisotropic monolayer gold nanoassembly: a highly SERS-active substrate for molecular detection
CN106125175A (zh) * 2016-06-24 2016-11-16 中国科学院长春光学精密机械与物理研究所 一种慢光结构、吸光度检测方法及微流控芯片
WO2018138415A1 (en) * 2017-01-30 2018-08-02 Aalto University Foundation Sr A plasmonic device
CN110244392B (zh) * 2019-07-31 2021-07-20 华中科技大学 一种不对称传输器
JP7210067B2 (ja) * 2019-08-02 2023-01-23 国立研究開発法人物質・材料研究機構 光センサー、センサーユニット及び光センサーを利用した物体検出装置
JP7534984B2 (ja) 2021-03-03 2024-08-15 株式会社日立ハイテク 分光測定装置
US11959859B2 (en) * 2021-06-02 2024-04-16 Edwin Thomas Carlen Multi-gas detection system and method
TWI894781B (zh) * 2023-01-19 2025-08-21 中央研究院 表面電漿共振感測器、包含其之表面電漿共振感測裝置及使用其檢測分析物的方法

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WO1998037417A1 (en) * 1997-02-20 1998-08-27 The Regents Of The University Of California Plasmon resonant particles, methods and apparatus
JP3452837B2 (ja) 1999-06-14 2003-10-06 理化学研究所 局在プラズモン共鳴センサー
JP2005016963A (ja) * 2003-06-23 2005-01-20 Canon Inc 化学センサ、化学センサ装置
GB2418017A (en) * 2004-09-10 2006-03-15 Univ Southampton Raman spectroscopy
JP2006093055A (ja) 2004-09-27 2006-04-06 Toshiba Corp 画像表示装置
GB2419940B (en) 2004-11-04 2007-03-07 Mesophotonics Ltd Metal nano-void photonic crystal for enhanced raman spectroscopy
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WO2006093055A1 (ja) * 2005-03-03 2006-09-08 National Institute For Materials Science 光学分析用チップとその製造方法、光学分析用装置、および光学分析方法
JP2006308511A (ja) * 2005-05-02 2006-11-09 Canon Inc 化学分析装置及びその分析方法
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WO2008073601A2 (en) * 2006-10-31 2008-06-19 Trustees Of Boston University Deterministic aperiodic patterned dielectric and plasmonic materials for localized electromagnetic field enhancement
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US7639355B2 (en) * 2007-06-26 2009-12-29 Hewlett-Packard Development Company, L.P. Electric-field-enhancement structure and detection apparatus using same
JP2009250951A (ja) * 2008-04-11 2009-10-29 Fujifilm Corp 電場増強光デバイス
US8223331B2 (en) * 2009-06-19 2012-07-17 Hewlett-Packard Development Company, L.P. Signal-amplification device for surface enhanced raman spectroscopy
US8865402B2 (en) * 2009-08-26 2014-10-21 Clemson University Research Foundation Nanostructured substrates for surface enhanced raman spectroscopy (SERS) and detection of biological and chemical analytes by electrical double layer (EDL) capacitance

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