JP2012215458A5 - - Google Patents

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Publication number
JP2012215458A5
JP2012215458A5 JP2011080621A JP2011080621A JP2012215458A5 JP 2012215458 A5 JP2012215458 A5 JP 2012215458A5 JP 2011080621 A JP2011080621 A JP 2011080621A JP 2011080621 A JP2011080621 A JP 2011080621A JP 2012215458 A5 JP2012215458 A5 JP 2012215458A5
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JP
Japan
Prior art keywords
photodetector
objective lens
rectangular shape
light emitted
wavelength filter
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Application number
JP2011080621A
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English (en)
Japanese (ja)
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JP5765022B2 (ja
JP2012215458A (ja
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Priority to JP2011080621A priority Critical patent/JP5765022B2/ja
Priority claimed from JP2011080621A external-priority patent/JP5765022B2/ja
Priority to US13/417,400 priority patent/US8804120B2/en
Priority to CN201210081015.6A priority patent/CN102735656B/zh
Publication of JP2012215458A publication Critical patent/JP2012215458A/ja
Publication of JP2012215458A5 publication Critical patent/JP2012215458A5/ja
Application granted granted Critical
Publication of JP5765022B2 publication Critical patent/JP5765022B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2011080621A 2011-03-31 2011-03-31 微小粒子分析装置及び微小粒子分析方法 Expired - Fee Related JP5765022B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2011080621A JP5765022B2 (ja) 2011-03-31 2011-03-31 微小粒子分析装置及び微小粒子分析方法
US13/417,400 US8804120B2 (en) 2011-03-31 2012-03-12 Fine particle analyzing apparatus and fine particle analyzing method
CN201210081015.6A CN102735656B (zh) 2011-03-31 2012-03-23 微小粒子分析装置及微小粒子分析方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011080621A JP5765022B2 (ja) 2011-03-31 2011-03-31 微小粒子分析装置及び微小粒子分析方法

Publications (3)

Publication Number Publication Date
JP2012215458A JP2012215458A (ja) 2012-11-08
JP2012215458A5 true JP2012215458A5 (enExample) 2014-04-10
JP5765022B2 JP5765022B2 (ja) 2015-08-19

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JP2011080621A Expired - Fee Related JP5765022B2 (ja) 2011-03-31 2011-03-31 微小粒子分析装置及び微小粒子分析方法

Country Status (3)

Country Link
US (1) US8804120B2 (enExample)
JP (1) JP5765022B2 (enExample)
CN (1) CN102735656B (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2013145836A1 (ja) 2012-03-30 2015-12-10 ソニー株式会社 マイクロチップ型光学測定装置及び該装置における光学位置調整方法
JP6537252B2 (ja) * 2014-11-14 2019-07-03 シスメックス株式会社 検体測定装置
CN105987870A (zh) * 2015-02-10 2016-10-05 博奥生物集团有限公司 一种流式细胞分选系统及其聚焦检测方法及其流体芯片
US11181455B2 (en) * 2018-11-12 2021-11-23 Particle Measuring Systems, Inc. Calibration verification for optical particle analyzers
KR102247677B1 (ko) * 2019-09-27 2021-05-03 주식회사 마하테크 광도파모듈 적용형 미세플라스틱 검출장치
JP7581221B2 (ja) * 2019-10-15 2024-11-12 株式会社堀場製作所 粒子分析装置及び粒子分析ユニット
US12360041B2 (en) * 2020-09-10 2025-07-15 Becton, Dickinson And Company Laser light propagation systems for irradiating a sample in a flow stream and methods for using same
KR102569612B1 (ko) * 2021-07-20 2023-08-25 한국기계연구원 배기가스 희석장치
KR102577017B1 (ko) * 2023-06-22 2023-09-11 한남대학교 산학협력단 레이저 다이오드 스페클 감소장치

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WO1992008120A1 (en) * 1990-10-29 1992-05-14 Macquarie University Pulsed laser flow cytometry
RU94019480A (ru) * 1991-09-06 1996-06-10 Коммонвелт Сайнтифик энд Индастриал Рисерч Организэйшн (AU) Способ и устройство определения измерительного параметра/ов/ объекта
JPH05232012A (ja) 1992-02-22 1993-09-07 Horiba Ltd 微粒子測定装置
JP3531199B2 (ja) * 1994-02-22 2004-05-24 三菱電機株式会社 光伝送装置
JPH09178645A (ja) * 1995-12-26 1997-07-11 Rion Co Ltd 光散乱式粒子計数装置
JP2002335041A (ja) * 2001-05-07 2002-11-22 Sony Corp レーザ駆動装置及びレーザ駆動方法
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JP2004257737A (ja) * 2003-02-24 2004-09-16 Mitsui Eng & Shipbuild Co Ltd バイオチップ読み取り装置
FR2856536B1 (fr) * 2003-06-20 2005-09-30 Airbus France Procede pour eclairer des particules en vue de la formation de leurs images
JP2005172465A (ja) 2003-12-08 2005-06-30 Sysmex Corp 粒子測定装置
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