JP5765022B2 - 微小粒子分析装置及び微小粒子分析方法 - Google Patents

微小粒子分析装置及び微小粒子分析方法 Download PDF

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Publication number
JP5765022B2
JP5765022B2 JP2011080621A JP2011080621A JP5765022B2 JP 5765022 B2 JP5765022 B2 JP 5765022B2 JP 2011080621 A JP2011080621 A JP 2011080621A JP 2011080621 A JP2011080621 A JP 2011080621A JP 5765022 B2 JP5765022 B2 JP 5765022B2
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current
light source
light
laser
optical fiber
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Japanese (ja)
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JP2012215458A5 (enExample
JP2012215458A (ja
Inventor
広宣 棚瀬
広宣 棚瀬
満 外石
満 外石
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Sony Corp
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Sony Corp
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Priority to JP2011080621A priority Critical patent/JP5765022B2/ja
Priority to US13/417,400 priority patent/US8804120B2/en
Priority to CN201210081015.6A priority patent/CN102735656B/zh
Publication of JP2012215458A publication Critical patent/JP2012215458A/ja
Publication of JP2012215458A5 publication Critical patent/JP2012215458A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1434—Optical arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1456—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals
    • G01N15/1459—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals the analysis being performed on a sample stream
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N2015/1006—Investigating individual particles for cytology

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  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2011080621A 2011-03-31 2011-03-31 微小粒子分析装置及び微小粒子分析方法 Expired - Fee Related JP5765022B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2011080621A JP5765022B2 (ja) 2011-03-31 2011-03-31 微小粒子分析装置及び微小粒子分析方法
US13/417,400 US8804120B2 (en) 2011-03-31 2012-03-12 Fine particle analyzing apparatus and fine particle analyzing method
CN201210081015.6A CN102735656B (zh) 2011-03-31 2012-03-23 微小粒子分析装置及微小粒子分析方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011080621A JP5765022B2 (ja) 2011-03-31 2011-03-31 微小粒子分析装置及び微小粒子分析方法

Publications (3)

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JP2012215458A JP2012215458A (ja) 2012-11-08
JP2012215458A5 JP2012215458A5 (enExample) 2014-04-10
JP5765022B2 true JP5765022B2 (ja) 2015-08-19

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JP2011080621A Expired - Fee Related JP5765022B2 (ja) 2011-03-31 2011-03-31 微小粒子分析装置及び微小粒子分析方法

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US (1) US8804120B2 (enExample)
JP (1) JP5765022B2 (enExample)
CN (1) CN102735656B (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2013145836A1 (ja) 2012-03-30 2015-12-10 ソニー株式会社 マイクロチップ型光学測定装置及び該装置における光学位置調整方法
JP6537252B2 (ja) * 2014-11-14 2019-07-03 シスメックス株式会社 検体測定装置
CN105987870A (zh) * 2015-02-10 2016-10-05 博奥生物集团有限公司 一种流式细胞分选系统及其聚焦检测方法及其流体芯片
US11181455B2 (en) * 2018-11-12 2021-11-23 Particle Measuring Systems, Inc. Calibration verification for optical particle analyzers
KR102247677B1 (ko) * 2019-09-27 2021-05-03 주식회사 마하테크 광도파모듈 적용형 미세플라스틱 검출장치
JP7581221B2 (ja) * 2019-10-15 2024-11-12 株式会社堀場製作所 粒子分析装置及び粒子分析ユニット
US12360041B2 (en) * 2020-09-10 2025-07-15 Becton, Dickinson And Company Laser light propagation systems for irradiating a sample in a flow stream and methods for using same
KR102569612B1 (ko) * 2021-07-20 2023-08-25 한국기계연구원 배기가스 희석장치
KR102577017B1 (ko) * 2023-06-22 2023-09-11 한남대학교 산학협력단 레이저 다이오드 스페클 감소장치

Family Cites Families (17)

* Cited by examiner, † Cited by third party
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WO1992008120A1 (en) * 1990-10-29 1992-05-14 Macquarie University Pulsed laser flow cytometry
RU94019480A (ru) * 1991-09-06 1996-06-10 Коммонвелт Сайнтифик энд Индастриал Рисерч Организэйшн (AU) Способ и устройство определения измерительного параметра/ов/ объекта
JPH05232012A (ja) 1992-02-22 1993-09-07 Horiba Ltd 微粒子測定装置
JP3531199B2 (ja) * 1994-02-22 2004-05-24 三菱電機株式会社 光伝送装置
JPH09178645A (ja) * 1995-12-26 1997-07-11 Rion Co Ltd 光散乱式粒子計数装置
JP2002335041A (ja) * 2001-05-07 2002-11-22 Sony Corp レーザ駆動装置及びレーザ駆動方法
US6809820B2 (en) * 2002-04-18 2004-10-26 National Research Council Of Canada Small particle analysis by laser induced incandescence
US7525659B2 (en) * 2003-01-15 2009-04-28 Negevtech Ltd. System for detection of water defects
JP2004257737A (ja) * 2003-02-24 2004-09-16 Mitsui Eng & Shipbuild Co Ltd バイオチップ読み取り装置
FR2856536B1 (fr) * 2003-06-20 2005-09-30 Airbus France Procede pour eclairer des particules en vue de la formation de leurs images
JP2005172465A (ja) 2003-12-08 2005-06-30 Sysmex Corp 粒子測定装置
JP3995684B2 (ja) * 2004-12-21 2007-10-24 リオン株式会社 粒子計数器
GB0701477D0 (en) * 2007-01-25 2007-03-07 Renishaw Plc Spectroscopic apparatus and methods
JP5025388B2 (ja) 2007-08-27 2012-09-12 シスメックス株式会社 試料分析装置及び試料分析方法
JP2011163787A (ja) * 2010-02-05 2011-08-25 Sony Corp 微小粒子分析装置及び微小粒子分析方法
JP2011245818A (ja) * 2010-05-31 2011-12-08 Fujifilm Corp レーザー彫刻用レリーフ印刷版原版、レリーフ印刷版の製版方法、及び、レリーフ印刷版
US8384045B2 (en) * 2010-07-01 2013-02-26 Sony Corporation Minute particle analyzing device and method

Also Published As

Publication number Publication date
US8804120B2 (en) 2014-08-12
US20120250018A1 (en) 2012-10-04
CN102735656B (zh) 2016-03-02
JP2012215458A (ja) 2012-11-08
CN102735656A (zh) 2012-10-17

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