CN102735656B - 微小粒子分析装置及微小粒子分析方法 - Google Patents

微小粒子分析装置及微小粒子分析方法 Download PDF

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Publication number
CN102735656B
CN102735656B CN201210081015.6A CN201210081015A CN102735656B CN 102735656 B CN102735656 B CN 102735656B CN 201210081015 A CN201210081015 A CN 201210081015A CN 102735656 B CN102735656 B CN 102735656B
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China
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current
light source
laser beam
optical fiber
light
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Expired - Fee Related
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CN201210081015.6A
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Chinese (zh)
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CN102735656A (zh
Inventor
棚濑广宣
外石满
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Sony Corp
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Sony Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1434—Optical arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1456—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals
    • G01N15/1459—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals the analysis being performed on a sample stream
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N2015/1006—Investigating individual particles for cytology

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  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN201210081015.6A 2011-03-31 2012-03-23 微小粒子分析装置及微小粒子分析方法 Expired - Fee Related CN102735656B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2011080621A JP5765022B2 (ja) 2011-03-31 2011-03-31 微小粒子分析装置及び微小粒子分析方法
JP2011-080621 2011-03-31

Publications (2)

Publication Number Publication Date
CN102735656A CN102735656A (zh) 2012-10-17
CN102735656B true CN102735656B (zh) 2016-03-02

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CN201210081015.6A Expired - Fee Related CN102735656B (zh) 2011-03-31 2012-03-23 微小粒子分析装置及微小粒子分析方法

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US (1) US8804120B2 (enExample)
JP (1) JP5765022B2 (enExample)
CN (1) CN102735656B (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
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JPWO2013145836A1 (ja) 2012-03-30 2015-12-10 ソニー株式会社 マイクロチップ型光学測定装置及び該装置における光学位置調整方法
JP6537252B2 (ja) * 2014-11-14 2019-07-03 シスメックス株式会社 検体測定装置
CN105987870A (zh) * 2015-02-10 2016-10-05 博奥生物集团有限公司 一种流式细胞分选系统及其聚焦检测方法及其流体芯片
US11181455B2 (en) * 2018-11-12 2021-11-23 Particle Measuring Systems, Inc. Calibration verification for optical particle analyzers
KR102247677B1 (ko) * 2019-09-27 2021-05-03 주식회사 마하테크 광도파모듈 적용형 미세플라스틱 검출장치
JP7581221B2 (ja) * 2019-10-15 2024-11-12 株式会社堀場製作所 粒子分析装置及び粒子分析ユニット
US12360041B2 (en) * 2020-09-10 2025-07-15 Becton, Dickinson And Company Laser light propagation systems for irradiating a sample in a flow stream and methods for using same
KR102569612B1 (ko) * 2021-07-20 2023-08-25 한국기계연구원 배기가스 희석장치
KR102577017B1 (ko) * 2023-06-22 2023-09-11 한남대학교 산학협력단 레이저 다이오드 스페클 감소장치

Citations (1)

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CN101589297A (zh) * 2007-01-25 2009-11-25 瑞尼斯豪公司 分光装置和分光方法

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RU94019480A (ru) * 1991-09-06 1996-06-10 Коммонвелт Сайнтифик энд Индастриал Рисерч Организэйшн (AU) Способ и устройство определения измерительного параметра/ов/ объекта
JPH05232012A (ja) 1992-02-22 1993-09-07 Horiba Ltd 微粒子測定装置
JP3531199B2 (ja) * 1994-02-22 2004-05-24 三菱電機株式会社 光伝送装置
JPH09178645A (ja) * 1995-12-26 1997-07-11 Rion Co Ltd 光散乱式粒子計数装置
JP2002335041A (ja) * 2001-05-07 2002-11-22 Sony Corp レーザ駆動装置及びレーザ駆動方法
US6809820B2 (en) * 2002-04-18 2004-10-26 National Research Council Of Canada Small particle analysis by laser induced incandescence
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JP2004257737A (ja) * 2003-02-24 2004-09-16 Mitsui Eng & Shipbuild Co Ltd バイオチップ読み取り装置
FR2856536B1 (fr) * 2003-06-20 2005-09-30 Airbus France Procede pour eclairer des particules en vue de la formation de leurs images
JP2005172465A (ja) 2003-12-08 2005-06-30 Sysmex Corp 粒子測定装置
JP3995684B2 (ja) * 2004-12-21 2007-10-24 リオン株式会社 粒子計数器
JP5025388B2 (ja) 2007-08-27 2012-09-12 シスメックス株式会社 試料分析装置及び試料分析方法
JP2011163787A (ja) * 2010-02-05 2011-08-25 Sony Corp 微小粒子分析装置及び微小粒子分析方法
JP2011245818A (ja) * 2010-05-31 2011-12-08 Fujifilm Corp レーザー彫刻用レリーフ印刷版原版、レリーフ印刷版の製版方法、及び、レリーフ印刷版
US8384045B2 (en) * 2010-07-01 2013-02-26 Sony Corporation Minute particle analyzing device and method

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Publication number Priority date Publication date Assignee Title
CN101589297A (zh) * 2007-01-25 2009-11-25 瑞尼斯豪公司 分光装置和分光方法

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JP5765022B2 (ja) 2015-08-19
US8804120B2 (en) 2014-08-12
US20120250018A1 (en) 2012-10-04
JP2012215458A (ja) 2012-11-08
CN102735656A (zh) 2012-10-17

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