TWI560461B - Test apparatus and method for testing a device under test - Google Patents

Test apparatus and method for testing a device under test

Info

Publication number
TWI560461B
TWI560461B TW104103018A TW104103018A TWI560461B TW I560461 B TWI560461 B TW I560461B TW 104103018 A TW104103018 A TW 104103018A TW 104103018 A TW104103018 A TW 104103018A TW I560461 B TWI560461 B TW I560461B
Authority
TW
Taiwan
Prior art keywords
testing
device under
test
under test
test apparatus
Prior art date
Application number
TW104103018A
Other languages
English (en)
Other versions
TW201543056A (zh
Inventor
Jochen Rivoir
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW201543056A publication Critical patent/TW201543056A/zh
Application granted granted Critical
Publication of TWI560461B publication Critical patent/TWI560461B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Nonlinear Science (AREA)
TW104103018A 2014-01-30 2015-01-29 Test apparatus and method for testing a device under test TWI560461B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/EP2014/051831 WO2015113607A1 (en) 2014-01-30 2014-01-30 Test apparatus and method for testing a device under test

Publications (2)

Publication Number Publication Date
TW201543056A TW201543056A (zh) 2015-11-16
TWI560461B true TWI560461B (en) 2016-12-01

Family

ID=50029054

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104103018A TWI560461B (en) 2014-01-30 2015-01-29 Test apparatus and method for testing a device under test

Country Status (5)

Country Link
US (1) US10775437B2 (zh)
KR (2) KR20160114693A (zh)
CN (1) CN106068460B (zh)
TW (1) TWI560461B (zh)
WO (1) WO2015113607A1 (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108897652B (zh) * 2018-07-03 2021-10-01 中国人民解放军国防科技大学 一种基于rtl级功耗分析的错误定位方法及系统
US11164551B2 (en) 2019-02-28 2021-11-02 Clifford W. Chase Amplifier matching in a digital amplifier modeling system
US10985951B2 (en) 2019-03-15 2021-04-20 The Research Foundation for the State University Integrating Volterra series model and deep neural networks to equalize nonlinear power amplifiers
US11496166B1 (en) * 2021-09-01 2022-11-08 Rohde & Schwarz Gmbh & Co. Kg Predistortion method and system for a non-linear device-under-test

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TW200907384A (en) * 2007-06-07 2009-02-16 Advantest Corp Test apparatus and device for calibration
CN100547423C (zh) * 2003-08-14 2009-10-07 皇家飞利浦电子股份有限公司 利用黄金抽样的测试器和测试板的校准
TW201020911A (en) * 2008-09-24 2010-06-01 Verigy Pte Ltd Singapore State machine and generator for generating a description of a state machine feedback function
TW201129902A (en) * 2009-04-24 2011-09-01 Advantest Corp Correcting apparatus, PDF measurement apparatus, jitter measurement apparatus, jitter separation apparatus, electric device, correcting method, program, and recording medium

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EP0984291A1 (en) 1998-09-03 2000-03-08 Texas Instruments Incorporated Capture and conversion of mixed-signal test stimuli
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KR100331567B1 (ko) 2000-03-21 2002-04-06 윤종용 부유 도전 패턴을 고려한 집적회로의 배선간 기생커패시턴스 계산 방법 및 이를 기록한 기록매체
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US7256585B1 (en) 2006-07-21 2007-08-14 Agilent Technologies, Inc. Match-corrected power measurements with a vector network analyzer
JP4188396B2 (ja) 2006-08-31 2008-11-26 株式会社アドバンテスト 誤差要因判定装置、方法、プログラム、記録媒体および該装置を備えた出力補正装置、反射係数測定装置
US8400338B2 (en) 2006-12-29 2013-03-19 Teradyne, Inc. Compensating for harmonic distortion in an instrument channel
US8155904B2 (en) 2007-10-05 2012-04-10 Dvorak Steven L Vector signal measuring system, featuring wide bandwidth, large dynamic range, and high accuracy
JP4543265B2 (ja) 2007-11-20 2010-09-15 船井電機株式会社 スイッチング電源装置
US8405936B2 (en) 2008-05-02 2013-03-26 Agilent Technologies, Inc. Power diverter having a MEMS switch and a MEMS protection switch
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KR101517349B1 (ko) 2010-12-22 2015-05-04 주식회사 아도반테스토 시험기용 교정 모듈 및 시험기
DE102011080659B4 (de) * 2011-08-09 2015-04-02 Infineon Technologies Ag Vorrichtung und verfahren zum testen einer zu testenden schaltung
US9165735B2 (en) 2012-03-05 2015-10-20 Teradyne, Inc. High reliability, high voltage switch
KR101757093B1 (ko) 2013-03-04 2017-07-12 주식회사 아도반테스토 스위칭가능 신호 라우팅 회로
CN103472398B (zh) * 2013-08-19 2016-01-20 南京航空航天大学 基于扩展卡尔曼粒子滤波算法的动力电池soc估计方法
WO2015090478A1 (en) * 2013-12-20 2015-06-25 Advantest Corporation Multi-port measurement technique for determining s-parameters
US9564876B2 (en) * 2014-09-22 2017-02-07 Nanosemi, Inc. Digital compensation for a non-linear analog receiver
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Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6327545B1 (en) * 1998-10-09 2001-12-04 Agilent Technologies, Inc. Method and apparatus for board model correction
CN100547423C (zh) * 2003-08-14 2009-10-07 皇家飞利浦电子股份有限公司 利用黄金抽样的测试器和测试板的校准
TW200907384A (en) * 2007-06-07 2009-02-16 Advantest Corp Test apparatus and device for calibration
TW201020911A (en) * 2008-09-24 2010-06-01 Verigy Pte Ltd Singapore State machine and generator for generating a description of a state machine feedback function
TW201129902A (en) * 2009-04-24 2011-09-01 Advantest Corp Correcting apparatus, PDF measurement apparatus, jitter measurement apparatus, jitter separation apparatus, electric device, correcting method, program, and recording medium

Also Published As

Publication number Publication date
CN106068460A (zh) 2016-11-02
US20160334466A1 (en) 2016-11-17
TW201543056A (zh) 2015-11-16
CN106068460B (zh) 2020-10-16
KR20160114693A (ko) 2016-10-05
US10775437B2 (en) 2020-09-15
KR20180072873A (ko) 2018-06-29
WO2015113607A1 (en) 2015-08-06

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