TWI552652B - A substrate feeding method and a substrate feeding and feeding device - Google Patents

A substrate feeding method and a substrate feeding and feeding device Download PDF

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Publication number
TWI552652B
TWI552652B TW103118909A TW103118909A TWI552652B TW I552652 B TWI552652 B TW I552652B TW 103118909 A TW103118909 A TW 103118909A TW 103118909 A TW103118909 A TW 103118909A TW I552652 B TWI552652 B TW I552652B
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Taiwan
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substrate
upper mold
supply device
compressed air
housing recess
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TW103118909A
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Chinese (zh)
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TW201511625A (en
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Naoki Takada
Mamoru Nakamura
Keita Mizuma
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Towa Corp
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Publication of TWI552652B publication Critical patent/TWI552652B/en

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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/02Feeding of components
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65GTRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G49/00Conveying systems characterised by their application for specified purposes not otherwise provided for
    • B65G49/05Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations

Description

基板之搬送供給方法及基板之搬送供給裝置 Substrate transfer supply method and substrate transfer supply device

本發明係關於一種為將安裝有電子零件的基板搬送供給到壓縮樹脂封裝裝置中的成型模部的規定位置的基板搬送供給方法及裝置,尤其,關於一種在使基板供給到壓縮樹脂封裝用的上模面並保持的情況下,為了使該基板有效地且確實地保持在上模面上而改善的基板搬送供給方法和為實施該方法的基板搬送供給裝置的改良。 The present invention relates to a substrate transfer supply method and apparatus for transporting a substrate on which an electronic component is mounted to a predetermined position of a molding die portion of a compression resin sealing device, and more particularly to a method for supplying a substrate to a compression resin package. In the case where the upper mold surface is held, the substrate transfer supply method and the substrate transfer supply device for carrying out the method are improved in order to effectively and reliably hold the substrate on the upper mold surface.

作為基板搬送機構,例如已知有(例如,參照專利文獻1):在基板搬送板部的上表面卡止基板的狀態下進行移動的機構或在吸附板的上表面吸附基板的狀態下進行移動的機構等。在使用此種基板搬送板部等搬送在表面(上表面)安裝有複數個(多數)電子零件(半導體元件等)的基板的情況下,為使得該基板上的電子零件與該基板搬送板部等的上表面不接觸,通常以使基板的表面朝上,即,使基板的背面(底面)與該基板搬送板部等的上表面接合的狀態進行載置。 For example, it is known (for example, refer to Patent Document 1) that a mechanism that moves in a state where the substrate is locked on the upper surface of the substrate conveyance plate portion or a state in which the substrate is adsorbed on the upper surface of the adsorption plate is known. Institutions, etc. When a substrate having a plurality of (many) electronic components (semiconductor elements or the like) is mounted on the surface (upper surface) by using such a substrate transfer plate portion or the like, the electronic component on the substrate and the substrate transfer plate portion are placed. The upper surface of the substrate is not in contact with each other, and is usually placed with the surface of the substrate facing upward, that is, the back surface (bottom surface) of the substrate is joined to the upper surface of the substrate transfer plate portion or the like.

而,在將基板供給到壓縮樹脂封裝裝置中的上模面並保持的同時,將該基板上的電子零件浸漬在下模腔內的熔融樹脂材料中,並且進行將該樹脂壓縮以成型的壓縮樹脂封裝成型的情況下,無法直接利用如上所述的基板搬送板部等。即,在使用壓縮樹脂封裝機構對基板上的電子零件進行封裝成型的情況下,如圖10示意圖所示,透過設置在壓縮樹脂封裝 裝置A的上模1上的基板吸附機構2使基板W的背面側吸附到上模1的模面1a,並且保持安裝在基板W上的電子零件3為朝下(下側)。因此,必須在將安裝在基板W上的電子零件3朝下的狀態下載置基板搬送板部4。為此,基板搬送板部4上設置有能夠與安裝有電子零件3的基板W的表面周邊部位接合而卡止的卡止部4a和能夠以電子零件3與基板搬送板部4側不接觸的狀態收容電子零件3的收容凹部4b。再者,電子零件3的樹脂封裝成型係:將上模1和下模5合模以使基板W上的電子零件3浸漬在設置在下模5上的下模腔5a內的熔融樹脂材料6中,並且藉由按壓構件5b壓縮該熔融樹脂材料6,從而對電子零件3進行樹脂封裝。 On the other hand, while the substrate is supplied to the upper mold surface of the compression resin packaging device and held, the electronic component on the substrate is immersed in the molten resin material in the lower cavity, and the compression resin is formed by compressing the resin. In the case of package molding, the substrate transfer plate portion or the like as described above cannot be directly used. That is, in the case where the electronic component on the substrate is packaged and molded using a compression resin packaging mechanism, as shown in the schematic view of FIG. 10, the transmission is provided in a compression resin package. The substrate suction mechanism 2 on the upper mold 1 of the apparatus A causes the back surface side of the substrate W to be attracted to the mold surface 1a of the upper mold 1, and the electronic component 3 mounted on the substrate W to be held downward (lower side). Therefore, it is necessary to download the substrate transfer plate portion 4 in a state where the electronic component 3 mounted on the substrate W is directed downward. For this reason, the substrate transfer plate portion 4 is provided with a locking portion 4a that can be engaged with the peripheral portion of the surface of the substrate W on which the electronic component 3 is mounted, and can be locked with the electronic component 3 and the substrate transfer plate portion 4 side. The state accommodates the housing recess 4b of the electronic component 3. Further, the resin package molding of the electronic component 3 is to mold the upper mold 1 and the lower mold 5 so that the electronic component 3 on the substrate W is immersed in the molten resin material 6 provided in the lower mold cavity 5a provided on the lower mold 5. And the molten resin material 6 is compressed by the pressing member 5b, and the electronic component 3 is resin-sealed.

基板W如上所述,能夠透過基板吸附機構2吸附並保持於上模1的模面1a。然而,由於:載置在基板搬送板部4上的基板W的表面周邊部位被卡止於卡止部4a的上表面;基板W的厚度薄;安裝於基板W的表面的複數個電子零件3朝下地被支撐,因此如圖10的(2)中箭頭所示,基板W的中央部處於因自重而容易下垂的狀態。而且,在如此向下方彎曲的基板的變形狀態中,存在無法對上模面1a進行切實地吸附並保持基板W;或者其吸附保持效率變差等問題。另外,基板W的中央部因自重而容易下垂的傾向在近來的基板大型化中變得特別顯著。另外,在如基板W自身產生彎曲等的情況下,成為進一步降低其吸附保持效率的原因之一。 As described above, the substrate W can be adsorbed and held by the substrate adsorption mechanism 2 on the mold surface 1a of the upper mold 1. However, the peripheral portion of the surface of the substrate W placed on the substrate transfer plate portion 4 is locked to the upper surface of the locking portion 4a; the thickness of the substrate W is thin; and a plurality of electronic components 3 mounted on the surface of the substrate W Since it is supported downward, as shown by the arrow in (2) of FIG. 10, the center portion of the substrate W is in a state of being easily sagged due to its own weight. Further, in the deformed state of the substrate which is bent downward as described above, there is a problem in that the upper mold surface 1a cannot be reliably adsorbed and the substrate W is held, or the adsorption holding efficiency is deteriorated. In addition, the tendency of the center portion of the substrate W to sag easily due to its own weight is particularly remarkable in recent enlargement of the substrate. Further, when the substrate W itself is bent or the like, it is one of the causes for further reducing the adsorption holding efficiency.

專利文獻1:日本特開平01-119100號公報(第1頁右下欄第4行~第9行,第2圖,第4~5圖) Patent Document 1: Japanese Laid-Open Patent Publication No. 01-119100 (page 1 of the lower right column, line 4 to line 9, line 2, picture 4 to 5)

本發明的目的在於提供一種在載置在基板搬送供給裝置(基 板搬送板部)上的基板的中央部處於下垂並彎曲狀地變形的狀態時或在基板產生彎曲等的情況下,也能夠使該基板有效地且切實地吸附保持於壓縮樹脂封裝裝置中的上模面的基板搬送供給方法和為實施該方法的基板搬送供給裝置。 An object of the present invention is to provide a substrate transport supply device (base) When the central portion of the substrate on the plate transporting plate portion is deformed in a state of being drooped and curved, or when the substrate is bent or the like, the substrate can be efficiently and surely adsorbed and held in the compression resin sealing device. The substrate transfer supply method of the upper mold surface and the substrate transfer supply device for carrying out the method.

為達成上述目的的本發明的基板搬送供給方法係,將表面上安裝有複數個電子零件30的基板W搬送到壓縮樹脂封裝裝置A的上模面10a的下方位置,並且使前述基板W的前述表面朝下且使前述基板W的背面吸附到前述上模面10a並保持的基板搬送供給方法,其特徵在於,包含:基板搬送供給裝置40的準備步驟,準備具備卡止部41a和收容凹部41b的基板搬送供給裝置40,前述卡止部41a為與前述基板W的表面周邊部位接合且將前述表面周邊部位卡止在規定的位置,前述收容凹部41b為將全部前述電子零件30以與前述卡止部41a不接觸的狀態進行收容;基板載置步驟,使前述基板W的前述表面周邊部位與前述基板搬送供給裝置40的前述卡止部41a接合並卡止,並且將前述電子零件30收容於前述基板搬送供給裝置40的前述收容凹部41b;基板搬送供給裝置40的前進步驟,將經過前述基板載置步驟的前述基板搬送供給裝置40搬送到前述上模面10a的下方位置;基板定位步驟,使經過前述基板搬送供給裝置40的前進步驟的前述基板搬送供給裝置40相對於前述壓縮樹脂封裝裝置A相對地向上移動,以使前述基板W的前述背面卡合在前述上模面10a的規定位置;基板接合步驟,使經過前述基板定位步驟的前述基板W的前述背面與前述上模面10a接合;基板姿勢矯正步驟,在前述基板接合步驟時,向前述基板W的前述表面供給壓縮空氣43a以對前述基板W的變形姿勢進行矯正;基板吸附步 驟,在前述基板姿勢矯正步驟時和經過前述基板姿勢矯正步驟後這兩者中的任一時期或兩個時期中,使前述基板W吸附到前述上模面10a;基板保持步驟,在前述基板吸附步驟時和經過前述基板吸附步驟後這兩者中的任一時期或兩個時期中,使前述基板W保持於前述上模面10a;以及基板搬送供給裝置40的後退步驟,在經過前述基板保持步驟後,使前述基板搬送供給裝置40相對於前述壓縮樹脂封裝裝置A相對地向下移動,並且使前述基板搬送供給裝置40向前述壓縮樹脂封裝裝置A的外部後退。 In the substrate transfer and supply method of the present invention, the substrate W having a plurality of electronic components 30 mounted on the surface thereof is transported to a position below the upper mold surface 10a of the compression resin sealing device A, and the aforementioned substrate W is placed. A substrate transfer and supply method in which the back surface of the substrate W is adsorbed to the upper mold surface 10a and held thereon, and includes a preparation step of the substrate conveyance supply device 40, and is provided with a locking portion 41a and a housing recess 41b. In the substrate transporting and supplying device 40, the locking portion 41a is joined to the peripheral portion of the surface of the substrate W, and the peripheral portion of the surface is locked at a predetermined position, and the receiving recess 41b is for all the electronic components 30 and the card. The substrate 41 is placed in a state in which the stopper portion 41a is not in contact with each other, and the substrate mounting step is such that the peripheral portion of the substrate W is joined to the locking portion 41a of the substrate transporting and supplying device 40, and the electronic component 30 is housed in the substrate. The storage recess 41b of the substrate transport supply device 40; the advancement step of the substrate transport supply device 40 passes through the substrate The substrate transfer and supply device 40 in the placing step is transported to a position below the upper mold surface 10a, and the substrate positioning step is such that the substrate transport supply device 40 that has passed through the advancement step of the substrate transport and supply device 40 is opposed to the compressed resin package device. A is relatively moved upward so that the back surface of the substrate W is engaged with a predetermined position of the upper mold surface 10a, and the substrate bonding step is performed by bonding the back surface of the substrate W past the substrate positioning step to the upper mold surface 10a. a substrate posture correcting step of supplying compressed air 43a to the surface of the substrate W to correct a deformation posture of the substrate W during the substrate bonding step; The substrate W is adsorbed to the upper mold surface 10a in any one or two of the substrate posture correcting step and the substrate posture correcting step; the substrate holding step is performed on the substrate Holding the substrate W on the upper mold surface 10a in any one or two of the steps of the substrate and the substrate adsorption step; and the step of retracting the substrate transport supply device 40, after the substrate holding step After that, the substrate transfer and supply device 40 is relatively moved downward with respect to the compressed resin package device A, and the substrate transfer supply device 40 is moved backward to the outside of the compressed resin package device A.

本發明的基板搬送供給方法具有如下形態:前述基板姿勢矯正步驟藉由從設置在前述基板搬送供給裝置40的前述收容凹部41b的底面上的複數個壓縮空氣供給孔41c向前述收容凹部41b供給壓縮空氣43a,從而進行前述基板的姿勢矯正。 In the substrate conveyance and supply method of the present invention, the substrate posture correction step is performed by supplying compression to the accommodation recessed portion 41b from a plurality of compressed air supply holes 41c provided on the bottom surface of the accommodation recessed portion 41b of the substrate conveyance supply device 40. The air 43a is used to perform posture correction of the aforementioned substrate.

另外,本發明的基板搬送供給方法具有如下形態:前述基板姿勢矯正步驟藉由利用前述基板W和前述基板搬送供給裝置的前述卡止部41a這兩者構成呈密封狀的前述收容凹部41b,並且從設置在前述收容凹部41b的底面上的複數個壓縮空氣供給孔41c向前述收容凹部41b供給壓縮空氣43a,從而進行前述基板的姿勢矯正。 In the substrate conveyance and supply method of the present invention, the substrate posture correction step is configured to form the sealed concave portion 41b in a sealed shape by using the substrate W and the locking portion 41a of the substrate conveyance supply device, and The compressed air 43a is supplied to the accommodation recessed portion 41b from a plurality of compressed air supply holes 41c provided on the bottom surface of the accommodation recessed portion 41b, thereby correcting the posture of the substrate.

另外,本發明的基板搬送供給方法具有如下形態:前述基板姿勢矯正步驟藉由利用前述基板W和前述基板搬送供給裝置的前述卡止部41a這兩者構成呈密封狀的前述收容凹部41b,並且透過設置在前述收容凹部41b的底面上的流體壓力緩和機構56向前述收容凹部41b供給壓縮空氣43a,從而進行前述基板的姿勢矯正。 In the substrate conveyance and supply method of the present invention, the substrate posture correction step is configured to form the sealed concave portion 41b in a sealed shape by using the substrate W and the locking portion 41a of the substrate conveyance supply device, and The compressed air 43a is supplied to the accommodation recessed portion 41b through the fluid pressure relieving mechanism 56 provided on the bottom surface of the accommodation recessed portion 41b, thereby correcting the posture of the substrate.

為達成上述的目的的本發明的基板搬送供給裝置係,將表面 上安裝有複數個電子零件30的基板W搬送到壓縮樹脂封裝裝置A的上模面10a的下方位置,並且使前述基板W的前述表面朝下且使前述基板W的背面吸附到前述上模面10a並保持的基板搬送供給裝置,其特徵在於,具備:基板搬送板部41,載置前述基板W;進退往復運動機構42,為將前述基板搬送板部41配置為能夠相對於前述上模面10a的下方位置前進及後退;和基板變形姿勢矯正機構43,前述基板搬送板部具有41:卡止部41a,為與前述基板W的表面周邊部位接合且使該表面周邊部位卡止在規定位置;和收容凹部41b,為將全部前述電子零件30以與前述卡止部41a不接觸的狀態進行收容,前述基板變形姿勢矯正機構具有:壓縮空氣供給孔41c,在前述收容凹部41b的底面上配設有複數個;和壓縮空氣供給機構,連通連接於前述壓縮空氣孔41c。 The substrate transfer supply device of the present invention for achieving the above object, the surface is The substrate W on which the plurality of electronic components 30 are mounted is transported to a position below the upper mold surface 10a of the compression-molding resin package A, and the surface of the substrate W faces downward and the back surface of the substrate W is attracted to the upper mold surface. In the substrate transfer and supply device of the 10a, the substrate transfer plate portion 41 is provided to mount the substrate W, and the advance/retract reciprocating mechanism 42 is configured to be capable of disposing the substrate transfer plate portion 41 with respect to the upper mold surface. And a substrate deformation posture correcting mechanism 43 having a locking portion 41a that is engaged with a peripheral portion of the surface of the substrate W and that is locked at a predetermined position around the surface of the substrate W. And the housing recessed portion 41b is provided in a state in which all of the electronic component 30 are not in contact with the locking portion 41a, and the substrate deformation posture correcting mechanism includes a compressed air supply hole 41c and is provided on the bottom surface of the housing recess 41b. A plurality of compressors are provided, and a compressed air supply mechanism is connected to the compressed air hole 41c.

本發明的基板搬送供給裝置具有如下形態:前述基板姿勢矯正機構43藉由前述基板W和前述基板搬送板部41的前述卡止部41a這兩者構成呈密封狀的前述收容凹部41b,並且從前述壓縮空氣供給孔41c向前述收容凹部41b供給壓縮空氣43a。 In the substrate conveyance and supply device of the present invention, the substrate posture correcting mechanism 43 forms the sealed recessed portion 41b in a sealed shape by the substrate W and the locking portion 41a of the substrate transporting plate portion 41, and The compressed air supply hole 41c supplies compressed air 43a to the accommodation recessed portion 41b.

另外,本發明的基板搬送供給裝置具有如下形態:前述基板姿勢矯正機構43藉由前述基板W和前述基板搬送板部41的前述卡止部41a這兩者構成呈密封狀的前述收容凹部41b,並且透過設置在前述收容凹部41b的底面上的流體壓力緩和機構56向前述收容凹部41b供給壓縮空氣43a。 In the substrate conveyance and supply device of the present invention, the substrate posture correction mechanism 43 includes the storage recess portion 41b having a sealed shape by the substrate W and the locking portion 41a of the substrate conveyance plate portion 41. The compressed air 43a is supplied to the accommodation recess 41b through the fluid pressure relieving mechanism 56 provided on the bottom surface of the accommodation recess 41b.

根據本發明,即使在載置在基板搬送供給裝置(基板搬送板部)上的基板W的中央部處於因自重而下垂並彎曲狀地變形的狀態時或基板W產生彎曲的情況下,也能夠使該基板W有效地且確實地吸附保持於壓 縮樹脂封裝裝置A中的上模的模面。另外,根據本發明,能夠在搬送供給基板W的中央部有著容易下垂傾向的近來的大型基板的情況下,得到特別顯著的效果。 According to the present invention, even when the central portion of the substrate W placed on the substrate transport supply device (substrate transfer plate portion) is in a state of being sagged and bent in a curved shape due to its own weight, or when the substrate W is bent, The substrate W is effectively and surely adsorbed and held at a pressure The molding surface of the upper mold in the resin packaging device A. Further, according to the present invention, it is possible to obtain a particularly remarkable effect in the case where a large-sized substrate having a tendency to sag tends to sag in the center portion of the conveyance substrate W is conveyed.

A‧‧‧壓縮樹脂封裝裝置 A‧‧‧Compressed resin packaging device

W‧‧‧基板 W‧‧‧Substrate

10‧‧‧上模 10‧‧‧上模

10a‧‧‧上模面 10a‧‧‧Upper face

10b‧‧‧定位銷 10b‧‧‧Locating pin

20‧‧‧基板吸附機構 20‧‧‧Substrate adsorption mechanism

20a‧‧‧吸氣孔 20a‧‧‧ suction holes

30‧‧‧電子零件 30‧‧‧Electronic parts

31‧‧‧銷孔 31‧‧‧ pinhole

40‧‧‧基板搬送供給裝置 40‧‧‧Substrate transport supply device

41‧‧‧基板搬送板部 41‧‧‧Substrate transfer board

41a‧‧‧卡止部 41a‧‧‧Clock

41b‧‧‧收容凹部 41b‧‧‧ containment recess

41c‧‧‧壓縮空氣供給孔 41c‧‧‧Compressed air supply hole

41d‧‧‧間隙孔 41d‧‧‧ clearance hole

41e‧‧‧間隙槽 41e‧‧‧ clearance slot

41f‧‧‧定位銷 41f‧‧‧Locating pin

42‧‧‧進退往復移動機構 42‧‧‧Advance and retreat reciprocating mechanism

43‧‧‧基板變形姿勢矯正機構 43‧‧‧Substrate deformation posture correction mechanism

43a‧‧‧壓縮空氣 43a‧‧‧Compressed air

44‧‧‧底座 44‧‧‧Base

50‧‧‧下模 50‧‧‧Down

50a‧‧‧下模腔 50a‧‧‧ lower cavity

50b‧‧‧按壓構件 50b‧‧‧ Pressing member

55‧‧‧彈性構件 55‧‧‧Flexible components

56‧‧‧流體壓力緩和機構 56‧‧‧ Fluid Pressure Mitigation Mechanism

56a‧‧‧壓縮空氣供給槽 56a‧‧‧Compressed air supply tank

60‧‧‧熔融樹脂材料 60‧‧‧ molten resin material

70‧‧‧基板保持機構 70‧‧‧Substrate retention mechanism

71‧‧‧基板保持爪 71‧‧‧Substrate retention claw

71a‧‧‧基端部 71a‧‧‧ base end

71b‧‧‧彈性構件 71b‧‧‧Flexible components

71c‧‧‧推動銷 71c‧‧‧Promoting sales

71d‧‧‧前端部 71d‧‧‧ front end

72‧‧‧操作用銷 72‧‧‧Operational sales

73‧‧‧支撐軸 73‧‧‧Support shaft

圖1是概略地表示本發明的基板搬送供給裝置的主要部分的局部剖切縱剖面圖,表示使該搬送供給裝置移動到壓縮樹脂封裝裝置中的上模面的下方位置的前進步驟時的狀態。 1 is a partially cutaway longitudinal cross-sectional view showing a main portion of a substrate transport and supply device according to the present invention, and shows a state in which the transport supply device is moved to a lower position of a lower surface of the upper mold surface of the compression resin sealing device. .

圖2是與圖1對應的基板搬送供給裝置的概略俯視圖。 Fig. 2 is a schematic plan view of a substrate transport and supply device corresponding to Fig. 1;

圖3是與圖1對應的基板搬送供給裝置的縱剖面圖,圖3(1)是表示該搬送供給裝置的主要部分的縱剖視圖,圖3(2)是該主要部分的放大縱剖面圖。 Fig. 3 is a vertical cross-sectional view of the substrate transporting and supplying apparatus corresponding to Fig. 1, and Fig. 3 (1) is a vertical cross-sectional view showing a main portion of the transporting and supplying apparatus, and Fig. 3 (2) is an enlarged longitudinal sectional view of the main portion.

圖4是對壓縮樹脂封裝裝置的上模面的基板安裝作用說明圖,圖4(1)表示基板搬送供給裝置的前進步驟時的狀態,圖4(2)是該主要部分放大圖。 4 is an explanatory view of a substrate mounting operation of the upper mold surface of the compression resin sealing device, and FIG. 4 (1) shows a state in the forward step of the substrate conveyance supply device, and FIG. 4 (2) is an enlarged view of the main portion.

圖5是對壓縮樹脂封裝裝置的上模面的基板安裝作用說明圖,圖5(1)表示向上模面的基板接合步驟時的狀態,圖5(2)是該主要部分放大圖。 Fig. 5 is an explanatory view of a substrate mounting operation of the upper mold surface of the compression resin sealing device, Fig. 5 (1) shows a state in the substrate bonding step of the upper mold surface, and Fig. 5 (2) is an enlarged view of the main portion.

圖6是對壓縮樹脂封裝裝置的上模面的基板安裝作用說明圖,圖6(1)表示向上模面的基板保持步驟時的狀態,圖6(2)是該主要部分放大圖。 Fig. 6 is an explanatory view of a substrate mounting operation of the upper mold surface of the compression resin sealing device, Fig. 6 (1) shows a state in the substrate holding step of the upper mold surface, and Fig. 6 (2) is an enlarged view of the main portion.

圖7是本發明的其他基板搬送供給裝置的概略俯視圖。 Fig. 7 is a schematic plan view showing another substrate transfer and supply device of the present invention.

圖8是本發明的另一其他基板搬送供給裝置的概略俯視圖。 Fig. 8 is a schematic plan view showing still another substrate transfer and supply device of the present invention.

圖9是與圖8對應的基板搬送供給裝置的縱剖視圖,圖9(1)是表示 該搬送供給裝置的主要部分的縱剖視圖,圖9(2)是該主要部分的放大縱剖視圖。 Fig. 9 is a longitudinal sectional view of the substrate transporting and supplying device corresponding to Fig. 8, and Fig. 9(1) is a view A longitudinal cross-sectional view of a main portion of the conveyance and supply device, and Fig. 9 (2) is an enlarged longitudinal sectional view of the main portion.

圖10是使用習知基板運送供給方法將基板安裝于壓縮樹脂封裝裝置中的上模面時的說明圖,圖10(1)是表示使該運送供給裝置移動到壓縮樹脂封裝裝置中的上模面的下方位置的狀態的縱剖視圖,圖10(2)是表示在該上模面上安裝有基板的狀態的主要部分的放大縱剖視圖。 Fig. 10 is an explanatory view showing a state in which a substrate is mounted on an upper mold surface of a compression resin encapsulating apparatus by a conventional substrate transport and supply method, and Fig. 10 (1) shows an upper mold for moving the transport supply device into a compression resin encapsulating device. FIG. 10(2) is an enlarged longitudinal cross-sectional view showing a main part of a state in which a substrate is mounted on the upper mold surface.

以下,基於圖1至圖9所示的各實施例,對本發明進行說明。 Hereinafter, the present invention will be described based on the respective embodiments shown in Figs. 1 to 9 .

(第1實施例) (First embodiment)

圖1表示使第1實施例的基板搬送供給裝置40移動到壓縮樹脂封裝裝置A中的上模10(上模面10a)的下方位置的狀態,並且,圖2及圖3表示基板搬送供給裝置40的主要部分,並且,圖4至圖6表示向壓縮樹脂封裝裝置A的上模面10a安裝基板W的情況。 FIG. 1 shows a state in which the substrate conveyance and supply device 40 of the first embodiment is moved to a position below the upper mold 10 (upper mold surface 10a) in the compression resin sealing device A, and FIGS. 2 and 3 show the substrate conveyance supply device. The main portion of 40, and FIG. 4 to FIG. 6 show a case where the substrate W is attached to the upper mold surface 10a of the compression-molding resin package A.

首先,對壓縮樹脂封裝裝置A的概要進行說明。在一般情況下,壓縮樹脂封裝裝置A具備固定上模10和能夠上下移動地配置在其上模面10a的下方位置的可動下模50(參照圖1)。另外,上模10具備利用抽吸作用使基板W吸附到上模面10a的基板吸附機構20和保持吸附到上模面10a的基板W的基板保持機構70。 First, the outline of the compression-molding resin package A will be described. In general, the compression-molding resin package A includes a movable lower mold 50 (see FIG. 1) in which the upper mold 10 is fixed and a position below the upper mold surface 10a that can be moved up and down. Further, the upper mold 10 includes a substrate adsorption mechanism 20 that adsorbs the substrate W to the upper mold surface 10a by suction, and a substrate holding mechanism 70 that holds the substrate W adsorbed to the upper mold surface 10a.

另外,上述的基板吸附機構20由在上模面10a上開口的複數個吸氣孔20a以及使該複數個吸氣孔20a與減壓機構(未圖示)側連通連接而構成。因此,設置成能夠藉由在複數個吸氣孔20a生成的來自減壓機構的抽吸作用(抽真空作用)使與上模面10a接合的基板W吸附到該上模面 10a。 Further, the substrate suction mechanism 20 described above is configured by a plurality of intake holes 20a opened in the upper die surface 10a and a plurality of intake holes 20a communicating with the pressure reducing mechanism (not shown) side. Therefore, it is provided that the substrate W joined to the upper die face 10a can be adsorbed to the upper die face by the suction action (vacuum action) from the pressure reducing mechanism generated in the plurality of suction holes 20a. 10a.

另外,在下模50上設置有供給樹脂材料的下模腔50a和為壓縮在該下模腔50a內加熱熔融化的樹脂材料60的按壓構件50b。另外,按照後述的步驟,藉由使未安裝電子零件30的基板W的背面吸附到上模面10a並保持而進行對上模面10a的基板W的安裝。因此,此時,就會保持吸附到上模面10a的基板W上的電子零件30朝下。再者,雖然在基板W的表面上安裝有複數個(多數)電子零件,但在圖中以簡略表示。 Further, the lower mold 50 is provided with a lower mold cavity 50a for supplying a resin material and a pressing member 50b for compressing the resin material 60 which is heated and melted in the lower mold cavity 50a. In addition, the substrate W of the upper mold surface 10a is attached by holding the back surface of the substrate W to which the electronic component 30 is not mounted to the upper mold surface 10a and holding it in accordance with the procedure described later. Therefore, at this time, the electronic component 30 adhering to the substrate W of the upper mold face 10a is kept downward. Further, although a plurality of (majority) electronic components are mounted on the surface of the substrate W, they are simply shown in the drawing.

另外,為了使用壓縮樹脂封裝裝置A對基板W上的電子零件30進行樹脂封裝,進行以下的操作。首先,使基板搬送供給裝置40向壓縮樹脂封裝裝置A的外部移動。之後,將上模10和下模50合模以使基板W上的電子零件30浸漬在設置在下模50上的下模腔50a內的熔融樹脂材料60中,並且藉由按壓構件50b以規定的樹脂壓力將該熔融樹脂材料60壓縮成型。藉由以上的操作進行電子零件30的樹脂封裝。 Further, in order to resin-package the electronic component 30 on the substrate W using the compression-molding resin package A, the following operation is performed. First, the substrate conveyance supply device 40 is moved to the outside of the compression resin package device A. Thereafter, the upper mold 10 and the lower mold 50 are clamped so that the electronic component 30 on the substrate W is immersed in the molten resin material 60 provided in the lower mold cavity 50a on the lower mold 50, and is prescribed by the pressing member 50b. The molten resin material 60 is compression molded by resin pressure. The resin package of the electronic component 30 is performed by the above operation.

再者,基板W上的電子零件30被一併樹脂封裝在與下模腔50a的形狀對應的樹脂成形體內。而且,被一併樹脂封裝的各電子零件30在成為後步驟的切斷加工步驟中按各個電子零件被切斷分離而成為產品。 Further, the electronic component 30 on the substrate W is collectively resin-sealed in a resin molded body corresponding to the shape of the lower cavity 50a. Further, each of the electronic components 30 that are collectively resin-sealed is cut and separated for each electronic component in the cutting process step of the subsequent step to become a product.

其次,對基板搬送供給裝置40進行說明。基板搬送供給裝置40具備載置基板W的基板搬送板部41和為將基板搬送板部41配置成能夠相對於壓縮樹脂封裝裝置A中的上模面10a的下方位置前進及後退的進退往復運動機構42。另外,在基板搬送板部41上設置有為與基板W的表面周邊部位接合並且使該基板W的表面周邊部位卡止在規定的位置的卡止部41a和為將位於基板表面的電子零件30以與卡止部41a不接觸的狀態進 行收容的收容凹部41b。進一步而言,在基板搬送板部41中的收容凹部41b的底面上配設有複數個壓縮空氣供給孔41c。而且,由該壓縮空氣供給孔41c和與壓縮空氣供給孔41c連通連接的壓縮空氣供給機構(未圖示)構成基板變形姿勢矯正機構43。 Next, the substrate conveyance supply device 40 will be described. The substrate transporting and supplying device 40 includes the substrate transporting plate portion 41 on which the substrate W is placed, and the forward and backward reciprocating motion for arranging the substrate transporting plate portion 41 so as to be able to advance and retreat with respect to the lower position of the upper mold surface 10a of the compressed resin packaging device A. Agency 42. Further, the substrate transfer plate portion 41 is provided with a locking portion 41a that is joined to a peripheral portion of the substrate W and that locks a peripheral portion of the surface of the substrate W at a predetermined position, and an electronic component 30 that is to be located on the surface of the substrate. In a state in which the locking portion 41a is not in contact with The accommodation recess 41b accommodated in the row. Further, a plurality of compressed air supply holes 41c are disposed on the bottom surface of the housing recess 41b in the substrate transporting plate portion 41. Further, the compressed air supply hole 41c and a compressed air supply mechanism (not shown) that is connected to the compressed air supply hole 41c constitute a substrate deformation posture correcting mechanism 43.

其次,對於使得在壓縮樹脂封裝裝置A與基板搬送供給裝置40兩個裝置之間以協同操作的方式關聯而配置的基板保持機構70進行說明。即,該基板保持機構70由在上模10的兩端部等適當的部位上設置的至少一對基板保持爪71和該各基板保持爪71的操作用銷72構成,該操作用銷72被豎立設置於與該各基板保持爪71的配設位置及配設數量對應的基板搬送供給裝置40中的底座44上的各位置。另外,上述的基板保持爪71以轉動自如的狀態樞轉安裝於固定設置在上模10上的支撐軸73。另外,對該基板保持爪71的基端部71a施加由藉由彈性構件71b的彈性向下方偏壓的推動銷71c引起的彈性按壓力。進一步而言,設置成當對基板保持爪71的基端部71a施加推動銷71c的彈性按壓力時,其前端部71d以上述支撐軸73為中心轉動,並且能夠使該前端部71d突出至上模面10a的下表面位置(參照圖4)。 Next, a substrate holding mechanism 70 that is disposed in association with each other between the two devices of the compression resin sealing device A and the substrate transfer supply device 40 will be described. In other words, the substrate holding mechanism 70 is composed of at least a pair of substrate holding claws 71 provided at appropriate portions such as both end portions of the upper mold 10 and an operation pin 72 of each of the substrate holding claws 71, and the operation pin 72 is Each position on the base 44 in the substrate transport supply device 40 corresponding to the arrangement position and the number of the substrate holding claws 71 is erected. Further, the above-described substrate holding claws 71 are pivotally attached to the support shaft 73 fixedly provided on the upper mold 10 in a rotatable state. Further, an elastic pressing force caused by the push pin 71c biased downward by the elasticity of the elastic member 71b is applied to the base end portion 71a of the substrate holding claw 71. Further, when the elastic pressing force of the push pin 71c is applied to the base end portion 71a of the substrate holding claw 71, the front end portion 71d is rotated about the support shaft 73, and the front end portion 71d can be protruded to the upper mold. The lower surface position of the surface 10a (refer to Fig. 4).

另外,基板保持爪71的操作用銷72被豎立設置於與上述的基板保持爪71的基端部71a的位置對應的底座44上的位置。而且,如後述,設置成在基板搬送供給裝置40向上模面10a的下表面位置移動的前進移動時及從該位置向外部退避的後退移動時和在使基板W與上模面10a接合的向上移動時及從該位置的向下移動時,與該基板搬送供給裝置40同時向相同方向移動。 Further, the operation pin 72 of the substrate holding claw 71 is erected at a position on the base 44 corresponding to the position of the base end portion 71a of the above-described substrate holding claw 71. Further, as will be described later, the forward movement of the substrate conveyance/feeding device 40 at the lower surface position of the upper mold surface 10a and the backward movement when retracted from the position to the outside are performed, and the upward movement of the substrate W and the upper mold surface 10a is performed. When moving and moving downward from this position, the substrate transport supply device 40 moves in the same direction at the same time.

再者,如上述,設置成當對基板保持爪71的基端部71a施加推動銷71c的彈性按力時,如圖4所述,其前端部71d以上述支撐軸73為中心轉動,並且能夠使該前端部71d突出至上模面10a的下表面位置。相反,如圖5所示,設置成當基板保持爪71的操作用銷72和基板搬送板部41上的基板W同時向上移動時,該操作用銷72的上端部向上推動基板保持爪71的基端部71a以使其前端部71d以上述支撐軸73為中心轉動,從而能夠使該前端部71d向上模面10a的外方退避。而且,基板搬送板部41上的基板W的向上移動被關聯為在使該前端部71d向上模面10a的外方退避之後進行,因此,設置成基板保持爪71的前端部71d不妨礙基板搬送板部41上的基板W的向上移動作用。 Further, as described above, when the elastic pressing force of the push pin 71c is applied to the base end portion 71a of the substrate holding claw 71, as shown in FIG. 4, the front end portion 71d is rotated about the support shaft 73, and The front end portion 71d is caused to protrude to the lower surface position of the upper mold surface 10a. In contrast, as shown in FIG. 5, when the operation pin 72 of the substrate holding claw 71 and the substrate W on the substrate conveying plate portion 41 are simultaneously moved upward, the upper end portion of the operation pin 72 pushes up the substrate holding claw 71 upward. The proximal end portion 71a is rotated about the distal end portion 71d around the support shaft 73, so that the distal end portion 71d can be retracted outward of the upper mold surface 10a. Further, the upward movement of the substrate W on the substrate transfer plate portion 41 is performed after the front end portion 71d is retracted from the outer surface of the upper mold surface 10a. Therefore, the front end portion 71d of the substrate holding claw 71 is not hindered from the substrate transfer. The upward movement of the substrate W on the plate portion 41.

另外,在上述的上模10的上模面10a上突出設置有為將基板W引導到該上模面10a的規定位置的定位銷10b(參照圖1)。另外,在與該定位銷10b的突出設置位置對應的上述搬送供給裝置40的卡止部41a的位置處設置有該定位銷10b用的間隙孔41d(參照圖2)。再者,上模面10a的定位銷10b與卡止部41a的間隙孔41d的配設位置及配設數量能夠按照需要適當地選擇而構成。 Further, a positioning pin 10b (see FIG. 1) for guiding the substrate W to a predetermined position of the upper mold surface 10a is protruded from the upper mold surface 10a of the upper mold 10 described above. In addition, a clearance hole 41d (see FIG. 2) for the positioning pin 10b is provided at a position of the locking portion 41a of the conveyance supply device 40 corresponding to the protruding installation position of the positioning pin 10b. In addition, the arrangement position and the number of arrangement of the positioning pin 10b of the upper die surface 10a and the clearance hole 41d of the locking portion 41a can be appropriately selected as needed.

另外,在上述的基板搬送板部41中的卡止部41a的側面位置上設置有為不妨礙基板保持爪的前端部71d的轉動作用的間隙槽41e。進一步,該間隙槽41e設置在與上述底座44中的操作用銷72的豎立設置位置對應的卡止部41a的側面位置處(參照圖2)。 In addition, a clearance groove 41e that does not interfere with the rotation of the distal end portion 71d of the substrate holding claw is provided at the side surface position of the locking portion 41a in the above-described substrate conveying plate portion 41. Further, the clearance groove 41e is provided at a side surface position of the locking portion 41a corresponding to the standing position of the operation pin 72 in the base 44 (see FIG. 2).

另外,在上述的基板搬送板部41中的卡止部41a的兩端部設置有為使基板W卡止在卡止部41a的規定位置的定位銷41f(參照圖3)。 在使用該定位銷41f卡止基板W時,該定位銷41f的上端部透過基板W的卡合用銷孔31且與該基板W的厚度(高度)相比更向上方突出。然而,如圖3(1)示意圖所示,設置成能夠使該定位銷41f以抵抗彈性構件55的彈性而向下方壓入的方式退避。為此,由於在對上模面10a接合基板W時,與該上模面10a抵接的定位銷41f向下方退避,因此不會妨礙該上模面10a與基板W的接合作用。此外,卡止部41a中的定位銷41f與基板W的卡合用銷孔31的配設位置及配設數量能夠按照需要適當地選擇而構成。 Further, at both end portions of the locking portion 41a of the above-described substrate conveying plate portion 41, a positioning pin 41f (see FIG. 3) for locking the substrate W to a predetermined position of the locking portion 41a is provided. When the substrate W is locked by the positioning pin 41f, the upper end portion of the positioning pin 41f is transmitted through the engaging pin hole 31 of the substrate W and protrudes upward from the thickness (height) of the substrate W. However, as shown in the schematic view of Fig. 3 (1), the positioning pin 41f can be retracted so as to be pressed downward against the elasticity of the elastic member 55. Therefore, when the substrate W is bonded to the upper mold surface 10a, the positioning pin 41f that abuts against the upper mold surface 10a is retracted downward, so that the bonding action between the upper mold surface 10a and the substrate W is not hindered. In addition, the arrangement position and the arrangement number of the positioning pin 41f in the locking portion 41a and the engagement pin hole 31 of the substrate W can be appropriately selected as needed.

以下,對使用基板搬送供給裝置40將基板W搬送供給到壓縮樹脂封裝裝置A的固定上模10的情況,即,使未安裝電子零件30的基板W的背面吸附到上模面10a並保持的情況進行說明。 In the case where the substrate W is transported and supplied to the fixed upper mold 10 of the compressed resin packaging device A by the substrate transport and supply device 40, that is, the back surface of the substrate W on which the electronic component 30 is not mounted is adsorbed to the upper mold surface 10a and held. The situation is explained.

首先,進行基板搬送供給裝置40的準備步驟。而且,如圖3的(1)所示,使基板W的表面周邊部位與基板搬送供給裝置40(具體而言,基板搬送板部41)所具有的卡止部41a接合並卡止,並且進行將位於基板W的表面的電子零件30收容到基板搬送板部41的收容凹部41b中的基板載置步驟。此時,能夠藉由上述卡止部41a的定位銷41f使基板W卡止在該卡止部41a的規定位置(參照圖2)。另外,上述的基板W表示能夠使其表面周邊部位與基板搬送板部41的卡止部41a接合並卡止的大小的矩形狀基板。因此,在使該基板W與卡止部41a接合並卡止時,成為該基板W的一部分也被載置在上述的基板保持爪前端部71d用間隙槽41e的上部的狀態(參照圖3)。 First, a preparation step of the substrate transfer supply device 40 is performed. In addition, as shown in (1) of FIG. 3, the peripheral portion of the substrate W is joined to the locking portion 41a of the substrate transfer and supply device 40 (specifically, the substrate transfer plate portion 41), and is locked. The electronic component 30 located on the surface of the substrate W is placed in the substrate mounting step in the housing recess 41b of the substrate transfer plate portion 41. At this time, the substrate W can be locked to a predetermined position of the locking portion 41a by the positioning pin 41f of the locking portion 41a (see FIG. 2). In addition, the substrate W described above is a rectangular substrate having a size that allows the peripheral portion of the surface to be bonded to the locking portion 41a of the substrate transfer plate portion 41 and locked. Therefore, when the substrate W and the locking portion 41a are joined and locked, a part of the substrate W is placed on the upper portion of the gap portion 41e for the substrate holding claw tip end portion 71d (see FIG. 3). .

其次,進行將基板搬送供給裝置40搬送到壓縮樹脂封裝裝置A中的上模面10a的下方位置的基板搬送供給裝置40的前進步驟(參照 圖1及圖4)。 Next, a step of advancing the substrate transfer supply device 40 that transports the substrate transfer/feed device 40 to the lower position of the upper mold surface 10a of the compressed resin package device A (refer to Figure 1 and Figure 4).

其次,進行使基板搬送供給裝置40向上移動而使基板W的背面(在圖中為上側,在此未安裝有電子零件30)卡合在壓縮樹脂封裝裝置A中的上模面10a的規定位置的基板定位步驟。接著,進行使定位在上模面10a的規定位置的基板W的背面與該上模面10a接合的基板接合步驟(參照圖5)。如圖4及圖5所示,能夠藉由使基板搬送供給裝置40朝向壓縮樹脂封裝裝置A中的上模面10a向上移動而進行上述的基板定位步驟及基板接合步驟。即,當對基板保持爪71的基端部71a僅施加推動銷71c的彈性按壓力時,如圖4所示,其前端部71d轉動以突出至上模面10a的下表面位置。此時,如圖5所示,基板保持爪71的操作用銷72的上端部向上推動基板保持爪71的基端部71a以使其前端部71d轉動的同時向上模面10a的外方退避,由此,能夠順利進行基板搬送板部41上的基板W的向上移動作用。 Then, the substrate transfer/feed device 40 is moved upward to engage the back surface of the substrate W (the upper side in the drawing, the electronic component 30 is not mounted here) at a predetermined position of the upper mold surface 10a of the compression resin sealing device A. The substrate positioning step. Next, a substrate bonding step of bonding the back surface of the substrate W positioned at a predetermined position of the upper mold surface 10a to the upper mold surface 10a is performed (see FIG. 5). As shown in FIGS. 4 and 5, the above-described substrate positioning step and substrate bonding step can be performed by moving the substrate conveyance/feeding device 40 upward toward the upper mold surface 10a of the compression resin sealing device A. That is, when only the elastic pressing force of the push pin 71c is applied to the base end portion 71a of the substrate holding claw 71, as shown in Fig. 4, the front end portion 71d thereof is rotated to protrude to the lower surface position of the upper die face 10a. At this time, as shown in FIG. 5, the upper end portion of the operation pin 72 of the substrate holding claw 71 pushes up the base end portion 71a of the substrate holding claw 71 to rotate the front end portion 71d while retracting the outer side of the upper mold surface 10a. Thereby, the upward movement of the substrate W on the substrate transfer plate portion 41 can be smoothly performed.

另外,當使上述的基板W的背面與上模面10a的規定位置接合時,如圖3(2)所示,進行向安裝有電子零件30的基板W的表面供給壓縮空氣43a以矯正基板W的變形姿勢的基板姿勢矯正步驟。此時,由於載置在基板搬送板部41a上的基板W的表面周邊部位被卡止在卡止部41a的上表面,並且,基板W的厚度薄,進一步而言,安裝於基板W的表面的複數個電子零件30為朝下,因此,如同圖所示,基板W的中央部因自重而成為下垂的狀態。然而,藉由向基板W的表面供給壓縮空氣43a而向上推動基板的中央部,從而能夠進行將上述的基板W的下垂姿勢修正至在同圖中用一點鏈線所表示的略水平狀的姿勢位置的基板姿勢矯正步驟。再者, 對於上述的壓縮空氣43a供給方式,能夠與基板W的下垂姿勢的程度相對應地適當地選擇並實施。 When the back surface of the substrate W described above is joined to a predetermined position of the upper mold surface 10a, as shown in Fig. 3 (2), compressed air 43a is supplied to the surface of the substrate W on which the electronic component 30 is mounted to correct the substrate W. The substrate posture correcting step of the deformed posture. At this time, the peripheral portion of the surface of the substrate W placed on the substrate transfer plate portion 41a is locked to the upper surface of the locking portion 41a, and the thickness of the substrate W is thin, and further, the surface of the substrate W is attached. Since the plurality of electronic components 30 are facing downward, as shown in the figure, the central portion of the substrate W is in a state of sagging due to its own weight. However, by supplying the compressed air 43a to the surface of the substrate W and pushing up the center portion of the substrate, it is possible to correct the sagging posture of the substrate W described above to a slightly horizontal posture indicated by a dotted line in the same figure. The substrate posture correction step of the position. Furthermore, The above-described supply mode of the compressed air 43a can be appropriately selected and implemented in accordance with the degree of the hanging posture of the substrate W.

另外,當向上述的基板W的表面供給壓縮空氣43a以矯正基板W的變形姿勢時,進行使基板W吸附到壓縮樹脂封裝裝置A中的上模面10a的基板吸附步驟(參照圖5)。即,該基板吸附步驟能夠藉由在複數個吸氣孔20a生成的來自減壓機構的抽吸作用而使與上模面10a接合的基板W吸附到該上模面10a。 When the compressed air 43a is supplied to the surface of the substrate W to correct the deformation posture of the substrate W, a substrate adsorption step (see FIG. 5) for adsorbing the substrate W to the upper mold surface 10a of the compression resin sealing device A is performed. That is, the substrate adsorption step can adsorb the substrate W bonded to the upper mold surface 10a to the upper mold surface 10a by the suction action from the pressure reducing mechanism generated in the plurality of suction holes 20a.

或者,在向上述的基板W表面側供給壓縮空氣43a以矯正基板W的變形姿勢之後,進行使基板W吸附到壓縮樹脂封裝裝置A中的上模面10a的基板吸附步驟(參照圖5)。即,與上述相同,該基板吸附步驟能夠藉由在複數個吸氣孔20a生成的來自減壓機構的抽吸作用而使與上模面10a接合的基板W吸附到該上模面10a。 Alternatively, after the compressed air 43a is supplied to the surface side of the substrate W to correct the deformation posture of the substrate W, a substrate adsorption step (see FIG. 5) for adsorbing the substrate W to the upper mold surface 10a of the compression resin sealing device A is performed. That is, in the same manner as described above, the substrate adsorption step can adsorb the substrate W bonded to the upper mold surface 10a to the upper mold surface 10a by the suction action from the pressure reducing mechanism generated in the plurality of suction holes 20a.

另外,當使基板W吸附到上述的上模面10a時,進行使基板W保持在壓縮樹脂封裝裝置A中的上模面10a上的基板保持步驟(參照圖6)。即,能夠使基板W吸附到上述的上模面10a的同時,進行使該基板W保持在上模面10a上的基板保持步驟。該基板保持步驟使基板搬送供給裝置40向下移動,可解除基板保持爪71的操作用銷72的上端部與基板保持爪71的基端部71a之間的卡合狀態即可。解除該操作用銷72的上端部與基板保持爪71的基端部71a之間的卡合狀態後,則對基板保持爪的基端部71a施加推動銷71c的彈性按壓力而使其前端部71d如圖6所示,轉動直至突出到上模面10a的下表面位置。此時,由於在基板搬送板部41中的卡止部41a的側面位置設置有為不妨礙基板保持爪的前端部71d的轉動作用的間 隙槽41e,因此基板保持爪的前端部71d藉由該間隙槽41e轉動且與位於該卡止部41a(該間隙槽41e)的上表面的基板W的表面(電子零件30的安裝面)接合,並且以從下方位置保持該部位的方式卡合。 When the substrate W is adsorbed onto the upper mold surface 10a described above, a substrate holding step (see FIG. 6) for holding the substrate W on the upper mold surface 10a of the compression resin sealing device A is performed. In other words, the substrate W can be held on the upper mold surface 10a while the substrate W is adsorbed onto the upper mold surface 10a. In the substrate holding step, the substrate conveyance/feeding device 40 is moved downward, and the engagement state between the upper end portion of the operation pin 72 of the substrate holding claw 71 and the base end portion 71a of the substrate holding claw 71 can be released. When the engagement between the upper end portion of the operation pin 72 and the base end portion 71a of the substrate holding claw 71 is released, the elastic pressing force of the push pin 71c is applied to the proximal end portion 71a of the substrate holding claw to the front end portion thereof. 71d is rotated as shown in Fig. 6 until it protrudes to the lower surface position of the upper die face 10a. At this time, the side surface position of the locking portion 41a in the substrate conveying plate portion 41 is provided so as not to hinder the rotation of the front end portion 71d of the substrate holding claw. The slit 41e is rotated by the gap groove 41e and joined to the surface of the substrate W (the mounting surface of the electronic component 30) on the upper surface of the locking portion 41a (the clearance groove 41e). And it is engaged in such a manner as to hold the portion from the lower position.

或者,在使基板W吸附到上述的上模面10a之後,進行使基板W保持在壓縮樹脂封裝裝置A中的上模面10a上的基板保持步驟(參照圖6)。即,在使基板W吸附到上述的上模面10a之後,能夠進行使基板W保持在上模面10a上的基板保持步驟。與上述相同,能夠藉由使基板搬送供給裝置40向下移動,解除基板保持爪71的操作用銷72的上端部與基板保持爪71的基端部71a之間的卡合狀態,來進行該基板保持步驟。 Alternatively, after the substrate W is adsorbed onto the upper mold surface 10a, a substrate holding step of holding the substrate W on the upper mold surface 10a of the compression resin sealing device A is performed (see FIG. 6). That is, after the substrate W is adsorbed onto the upper mold surface 10a described above, the substrate holding step of holding the substrate W on the upper mold surface 10a can be performed. In the same manner as described above, the substrate transfer/feed device 40 can be moved downward to release the engagement between the upper end portion of the operation pin 72 of the substrate holding claw 71 and the base end portion 71a of the substrate holding claw 71. Substrate retention step.

其次,進行使基板搬送供給裝置40向下移動,並且使基板搬送供給裝置40向壓縮樹脂封裝裝置A的外部後退的基板搬送供給裝置40的後退步驟。 Next, a step of retreating the substrate transport supply device 40 that moves the substrate transport/feed device 40 downward and retracts the substrate transport supply device 40 to the outside of the compressed resin package device A is performed.

在上述的第1實施例中,即使在載置在基板搬送供給裝置40的基板搬送板部41上的基板W的中央部處於因自重而下垂並彎曲狀地變形的狀態時或基板W本身產生彎曲的情況下,也能夠藉由將該基板W的姿勢矯正為水平狀,從而使該基板W有效地且確實地吸附到壓縮樹脂封裝裝置A中的上模面10a並保持。另外,在搬送供給基板W的中央部具有容易下垂傾向的近來的大型基板的情況下,能夠得到特別顯著的效果。 In the above-described first embodiment, even when the central portion of the substrate W placed on the substrate transporting plate portion 41 of the substrate transport and supply device 40 is in a state of being sagged and bent in a curved shape due to its own weight, or the substrate W itself is generated. In the case of the bending, the posture of the substrate W can be corrected to be horizontal, and the substrate W can be efficiently and surely adsorbed to and held by the upper mold surface 10a of the compression-molding resin package A. In addition, in the case where the center portion of the transport substrate W has a recent large-sized substrate which tends to sag, a particularly remarkable effect can be obtained.

以下,基於圖7,對第2實施例進行說明。 Hereinafter, a second embodiment will be described based on Fig. 7 .

(第2實施例) (Second embodiment)

上述的第1實施例表示了剖切基板搬送板部41中的卡止部41a的局部而使該卡止部41a的上表面構成為不連續的情況,但在此實施例2中,與第 1實施例的相異點在於使該卡止部41a的上表面連續地構成。再者,在第2實施例中,對於與第1實施例實質上相同的構成,則與第1實施例中說明的事項相同。因此,為了避免重複說明,對兩者通用的構成使用相同的符號標記。 In the above-described first embodiment, the portion of the locking portion 41a in the substrate conveying plate portion 41 is cut and the upper surface of the locking portion 41a is configured to be discontinuous. However, in the second embodiment, The difference between the first embodiment is that the upper surface of the locking portion 41a is continuously formed. In the second embodiment, substantially the same configuration as that of the first embodiment is the same as the matter described in the first embodiment. Therefore, in order to avoid redundancy, the same reference numerals are used for the configurations common to both.

即,由於在第1實施例中,使基板W卡止在剖切局部而構成的卡止部41a的上表面,因此電子零件30的收容凹部41b的局部成為開放的狀態。然而,如圖7所示,在第2實施例中,藉由將卡止部41a的上表面設置成連續的,從而收容凹部41b構成為所謂有底箱型容器的形狀。而且,若使基板W卡止在連續的卡止部41a的上表面上,則其收容凹部41b藉由連續的卡止部41a和基板W這兩者而被構成為密封狀。因此,該實施例中的基板變形姿勢矯正機構43被構成為從設置在如上述的密封狀收容凹部41b的底面上的複數個壓縮空氣供給孔41c供給壓縮空氣43a。 In other words, in the first embodiment, the substrate W is locked to the upper surface of the locking portion 41a formed by the cutting portion, and thus the portion of the housing recess 41b of the electronic component 30 is opened. However, as shown in FIG. 7, in the second embodiment, by arranging the upper surface of the locking portion 41a to be continuous, the housing recess 41b is configured in the shape of a so-called bottomed box type container. When the substrate W is locked to the upper surface of the continuous locking portion 41a, the housing recess 41b is formed in a sealed shape by both the continuous locking portion 41a and the substrate W. Therefore, the substrate deformation posture correcting mechanism 43 in this embodiment is configured to supply the compressed air 43a from a plurality of compressed air supply holes 41c provided on the bottom surface of the seal-like accommodation recess 41b as described above.

在第2實施例中,藉由從設置在密封狀收容凹部41b的底面上的複數個壓縮空氣供給孔41c供給壓縮空氣43a,從而能夠提高該密封狀收容凹部41b的內壓。此時,就會對收容於該密封狀收容凹部41b內的基板W施加如緩慢地(慢速地)向上推動其中央部的姿勢矯正壓力。由此,能夠進行將基板W的下垂姿勢修正至略水平位置的基板姿勢矯正步驟。再者,對於上述的壓縮空氣43a的供給形態,能夠與基板W的下垂姿勢的程度相對應地適當地選擇並實施。 In the second embodiment, the compressed air 43a is supplied from a plurality of compressed air supply holes 41c provided on the bottom surface of the seal-like accommodation recess 41b, whereby the internal pressure of the seal-like accommodation recess 41b can be increased. At this time, the posture correction pressure that pushes the center portion thereof slowly (slowly) is applied to the substrate W accommodated in the seal-like accommodation recess 41b. Thereby, the substrate posture correcting step of correcting the hanging posture of the substrate W to a slightly horizontal position can be performed. In addition, the supply form of the compressed air 43a described above can be appropriately selected and implemented in accordance with the degree of the hanging posture of the substrate W.

另外,由於在第2實施例中,收容凹部41b被構成為密封狀,因此與第1實施例的收容凹部相比,能夠更簡單地且確實地進行向密封狀收容凹部41b內供給壓縮空氣43a而提高該密封狀收容凹部41b的內壓的作 用。因此,與第1實施例的收容凹部相比,優點在於能夠更有效地進行基板姿勢矯正步驟。 Further, in the second embodiment, since the housing recessed portion 41b is formed in a sealed shape, the compressed air 43a can be supplied to the sealed housing recessed portion 41b more easily and surely than the housing recessed portion of the first embodiment. And the internal pressure of the seal-like accommodation recess 41b is increased. use. Therefore, compared with the housing recess of the first embodiment, there is an advantage in that the substrate posture correcting step can be performed more efficiently.

以下,基於圖8及圖9,對第3實施例進行說明。 Hereinafter, a third embodiment will be described based on Figs. 8 and 9 .

(第3實施例) (Third embodiment)

第1、第2實施例中的基板變形姿勢矯正機構構成為從設置在收容凹部的底面上的複數個壓縮空氣供給孔41c供給壓縮空氣43a,但第3實施例與第1、第2實施例的相異在於,構成為使卡止部41a的上表面連續而構成密封狀的收容凹部41b,並且藉由設置在該密封狀收容凹部41b的底面上的流體壓力緩和機構56供給壓縮空氣43。此外,在第3實施例中,對與第1、第2實施例實質上相同的構成,則與第1、第2實施例中說明的事項相同。因此,為了避免重複說明,對共通的構成使用相同的符號標記。 The substrate deformation posture correcting mechanism in the first and second embodiments is configured to supply compressed air 43a from a plurality of compressed air supply holes 41c provided on the bottom surface of the housing recess, but the third embodiment and the first and second embodiments The difference is that the upper surface of the locking portion 41a is continuous to form a sealed receiving recess 41b, and the compressed air 43 is supplied by the fluid pressure relieving mechanism 56 provided on the bottom surface of the sealed receiving recess 41b. Further, in the third embodiment, substantially the same configurations as those of the first and second embodiments are the same as those described in the first and second embodiments. Therefore, in order to avoid redundant description, the same symbol is used for the common configuration.

即,如圖8及圖9所示,在第3實施例中,藉由將卡止部41a的上表面設置成連續,從而收容凹部41b構成為有底箱型容器的形狀。而且,若使基板W卡止在連續的卡止部41a的上表面上,則其收容凹部41b藉由連續的卡止部41a和基板W這兩者而被構成為密封狀。因此,該實施例中的基板變形姿勢矯正機構43被構成為透過設置在上述的密封狀收容凹部41b的底面上的流體壓力緩和機構56供給壓縮空氣43a。再者,作為上述的流體壓力緩和機構56,如圖例所示,能夠在密封狀收容凹部41b的底面上採用所謂阻流板。因此,該實施例中的基板變形姿勢矯正機構43被構成為從設置在上述密封狀收容凹部41b的底面上的流體壓力緩和機構(阻流板)56中的壓縮空氣供給槽56a供給壓縮空氣43a。此時,就會對收容於該密封狀收容凹部41b內的基板W施加如緩慢地向上推動其中央部的姿勢 矯正力。由此,能夠進行將基板W的下垂姿勢修正至略水平位置的基板姿勢矯正步驟。此外,對於上述的壓縮空氣43a的供給方式,能夠與基板W的下垂姿勢的程度相對應地適當地選擇並實施。 That is, as shown in FIG. 8 and FIG. 9, in the third embodiment, the upper surface of the locking portion 41a is provided continuously, and the housing recess 41b is configured to have a shape of a bottomed box type container. When the substrate W is locked to the upper surface of the continuous locking portion 41a, the housing recess 41b is formed in a sealed shape by both the continuous locking portion 41a and the substrate W. Therefore, the substrate deformation posture correcting mechanism 43 in this embodiment is configured to supply the compressed air 43a through the fluid pressure relieving mechanism 56 provided on the bottom surface of the above-described sealed storage recess 41b. Further, as the fluid pressure relieving mechanism 56 described above, as shown in the example, a so-called spoiler can be used on the bottom surface of the seal-shaped accommodation recess 41b. Therefore, the substrate deformation posture correcting mechanism 43 in this embodiment is configured to supply the compressed air 43a from the compressed air supply groove 56a provided in the fluid pressure relieving mechanism (the baffle plate) 56 provided on the bottom surface of the seal-like accommodation recess 41b. . At this time, the substrate W accommodated in the seal-like housing recess 41b is biased to push the center portion thereof slowly upward. Corrective force. Thereby, the substrate posture correcting step of correcting the hanging posture of the substrate W to a slightly horizontal position can be performed. In addition, the manner of supplying the compressed air 43a described above can be appropriately selected and implemented in accordance with the degree of the hanging posture of the substrate W.

在第3實施例中,能夠從設置在密封狀收容凹部41b的底面上的流體壓力緩和機構56中的壓縮空氣供給槽56a供給壓縮空氣43a而提高該密封狀收容凹部41b內的內壓。其結果,能夠進行將基板W的中央部向上推動而將其下垂姿勢修正至略水平位置的基板姿勢矯正步驟。此時,導入到密封狀收容凹部41b內的壓縮空氣43a藉由壓力緩和機構56緩和其流體壓力,並且防止直接朝向電子零件30噴射該壓縮空氣43a的現象。由此,能夠將如下的弊病防患於未然。即,例如在具有安裝有電氣接線用的細導線的構成的電子零件30中,若對該導線直接噴射壓縮空氣43a,則有產生使該導線變形或使該導線斷線等弊病之可能性。對於此,由於在第3實施例中,能夠使壓縮空氣43a的流體壓力緩和,因此能夠將這種弊病防患於未然。 In the third embodiment, the compressed air 43a is supplied from the compressed air supply groove 56a of the fluid pressure relieving mechanism 56 provided on the bottom surface of the seal-shaped accommodation recess 41b, and the internal pressure in the seal-like accommodation recess 41b can be increased. As a result, it is possible to perform a substrate posture correcting step of pushing the central portion of the substrate W upward and correcting the sagging posture to a slightly horizontal position. At this time, the compressed air 43a introduced into the sealed accommodation recess 41b is relieved of the fluid pressure by the pressure relieving mechanism 56, and the phenomenon that the compressed air 43a is directly ejected toward the electronic component 30 is prevented. Thereby, the following disadvantages can be prevented. In other words, for example, in the electronic component 30 having the configuration in which the thin wires for electrical wiring are mounted, if the compressed air 43a is directly ejected to the wires, there is a possibility that the wires are deformed or the wires are broken. In this regard, in the third embodiment, since the fluid pressure of the compressed air 43a can be alleviated, such a drawback can be prevented.

另外,由於在第3實施例中,收容凹部41b被構成為密封狀,因此與第1實施例的收容凹部相比,能夠更簡單地且確實地進行向密封狀收容凹部41b內供給壓縮空氣43a而提高該密封狀收容凹部41b的內壓的作用。因此,與第1實施例的收容凹部相比,能夠更有效地進行基板姿勢矯正步驟。 Further, in the third embodiment, since the housing recessed portion 41b is formed in a sealed shape, the compressed air 43a can be supplied to the sealed housing recessed portion 41b more easily and surely than the housing recessed portion of the first embodiment. The effect of the internal pressure of the seal-like accommodation recess 41b is increased. Therefore, the substrate posture correcting step can be performed more efficiently than the housing recessed portion of the first embodiment.

本發明並不僅限定於前述的各實施例,在不脫離本發明的宗旨範圍內,能夠根據需要,任意地且適當地變更及選擇而採用。 The present invention is not limited to the above-described embodiments, and can be arbitrarily and appropriately changed and selected as needed without departing from the scope of the invention.

A‧‧‧壓縮樹脂封裝裝置 A‧‧‧Compressed resin packaging device

W‧‧‧基板 W‧‧‧Substrate

10‧‧‧上模 10‧‧‧上模

10a‧‧‧上模面 10a‧‧‧Upper face

10b‧‧‧定位銷 10b‧‧‧Locating pin

20‧‧‧基板吸附機構 20‧‧‧Substrate adsorption mechanism

20a‧‧‧吸氣孔 20a‧‧‧ suction holes

30‧‧‧電子零件 30‧‧‧Electronic parts

40‧‧‧基板搬送供給裝置 40‧‧‧Substrate transport supply device

41‧‧‧基板搬送板部 41‧‧‧Substrate transfer board

41a‧‧‧卡止部 41a‧‧‧Clock

41b‧‧‧收容凹部 41b‧‧‧ containment recess

41c‧‧‧壓縮空氣供給孔 41c‧‧‧Compressed air supply hole

41e‧‧‧間隙槽 41e‧‧‧ clearance slot

41f‧‧‧定位銷 41f‧‧‧Locating pin

42‧‧‧進退往復移動機構 42‧‧‧Advance and retreat reciprocating mechanism

43‧‧‧基板變形姿勢矯正機構 43‧‧‧Substrate deformation posture correction mechanism

44‧‧‧底座 44‧‧‧Base

50‧‧‧下模 50‧‧‧Down

50a‧‧‧下模腔 50a‧‧‧ lower cavity

50b‧‧‧按壓構件 50b‧‧‧ Pressing member

60‧‧‧熔融樹脂材料 60‧‧‧ molten resin material

70‧‧‧基板保持機構 70‧‧‧Substrate retention mechanism

71‧‧‧基板保持爪 71‧‧‧Substrate retention claw

71a‧‧‧基端部 71a‧‧‧ base end

71b‧‧‧彈性構件 71b‧‧‧Flexible components

71c‧‧‧推動銷 71c‧‧‧Promoting sales

71d‧‧‧前端部 71d‧‧‧ front end

72‧‧‧操作用銷 72‧‧‧Operational sales

73‧‧‧支撐軸 73‧‧‧Support shaft

Claims (7)

一種基板搬送供給方法,為於表面上安裝有複數個電子零件的基板搬送到壓縮樹脂封裝裝置的上模面的下方位置,並且使前述基板的前述表面朝下且使前述基板的背面吸附到前述上模面並保持,該基板搬送供給方法的特徵在於:基板搬送供給裝置的準備步驟,準備具備卡止部和收容凹部的基板搬送供給裝置,前述卡止部為與前述基板的表面周邊部位接合且將前述表面周邊部位卡止在規定的位置,前述收容凹部為將全部前述電子零件以與前述卡止部不接觸的狀態進行收容;基板載置步驟,將前述基板的前述表面周邊部位與前述基板搬送供給裝置的前述卡止部接合並卡止,並且將前述電子零件收容於前述基板搬送供給裝置的前述收容凹部;基板搬送供給裝置的前進步驟,將經過前述基板載置步驟的前述基板搬送供給裝置搬送到前述上模面的下方位置;基板定位步驟,使經過前述基板搬送供給裝置的前進步驟的前述基板搬送供給裝置相對於前述壓縮樹脂封裝裝置相對地向上移動,以使前述基板的前述背面卡合在前述上模面的規定位置;基板接合步驟,使經過前述基板定位步驟的前述基板的前述背面與前述上模面接合;基板姿勢矯正步驟,在前述基板接合步驟時,向前述基板的前述表面供給壓縮空氣以對前述基板的變形姿勢進行矯正;基板吸附步驟,在前述基板姿勢矯正步驟時和經過前述基板姿勢矯正 步驟後這兩者中的任一時期或兩個時期中,使前述基板吸附到前述上模面;基板保持步驟,在前述基板吸附步驟時和經過前述基板吸附步驟後這兩者中的任一時期或兩個時期中,使前述基板保持於前述上模面;以及基板搬送供給裝置的後退步驟,在經過前述基板保持步驟後,使前述基板搬送供給裝置相對於前述壓縮樹脂封裝裝置相對地向下移動,並且使前述基板搬送供給裝置向前述壓縮樹脂封裝裝置的外部後退。 A substrate transfer and supply method is a method in which a substrate having a plurality of electronic components mounted on a surface thereof is transported to a lower position of an upper mold surface of a compression resin sealing device, and the surface of the substrate is faced downward and the back surface of the substrate is adsorbed to the foregoing The substrate transfer and supply method is characterized in that the substrate transfer and supply device prepares a substrate transfer and supply device including a locking portion and a housing recess, and the locking portion is bonded to a peripheral portion of the substrate. And sealing the peripheral portion of the surface at a predetermined position, wherein the housing recess is configured to receive all of the electronic components in a state of not contacting the locking portion, and the substrate mounting step of the surface peripheral portion of the substrate The locking portion of the substrate transporting and supplying device is joined and locked, and the electronic component is housed in the housing recess of the substrate transporting device, and the substrate transporting device advances the substrate transporting through the substrate placing step The supply device is transported to a position below the upper mold surface; The board positioning step moves the substrate transporting and supplying device that has passed through the step of advancing the substrate transporting device upward with respect to the compressed resin sealing device so that the back surface of the substrate is engaged with a predetermined position of the upper mold surface; a substrate bonding step of bonding the back surface of the substrate passing through the substrate positioning step to the upper mold surface; and a substrate posture correcting step of supplying compressed air to the surface of the substrate to deform the substrate during the substrate bonding step Posture correction; substrate adsorption step, during the aforementioned substrate posture correction step and after the aforementioned substrate posture correction In any one or both of the two steps, the substrate is adsorbed to the upper mold surface; the substrate holding step is performed during the substrate adsorption step and after the substrate adsorption step, or In the two periods, the substrate is held by the upper mold surface; and the step of retracting the substrate transfer and supply device moves the substrate transfer supply device relatively downward with respect to the compressed resin package device after the substrate holding step And the substrate transfer supply device is moved backward to the outside of the compressed resin package device. 如申請專利範圍第1項的基板搬送供給方法,其中,前述基板姿勢矯正步驟藉由從設置在前述基板搬送供給裝置的前述收容凹部的底面上的複數個壓縮空氣供給孔向前述收容凹部供給壓縮空氣,從而進行前述基板的姿勢矯正。 The substrate conveyance and supply method according to the first aspect of the invention, wherein the substrate posture correction step supplies compression to the housing recess by a plurality of compressed air supply holes provided in a bottom surface of the housing recess provided in the substrate conveyance supply device. Air is used to perform posture correction of the aforementioned substrate. 如申請專利範圍第1項的基板搬送供給方法,其中,前述基板姿勢矯正步驟藉由利用前述基板和前述基板搬送供給裝置的前述卡止部這兩者構成呈密封狀的前述收容凹部,並且從設置在前述收容凹部的底面上的複數個壓縮空氣供給孔向前述收容凹部供給壓縮空氣,從而進行前述基板的姿勢矯正。 The substrate transfer and supply method according to the first aspect of the invention, wherein the substrate posture correction step is configured to form the sealed concave portion in a sealed shape by using both the substrate and the locking portion of the substrate transfer supply device. The plurality of compressed air supply holes provided on the bottom surface of the housing recess are supplied with compressed air to the housing recess to correct the posture of the substrate. 如申請專利範圍第1項的基板搬送供給方法,其中,前述基板姿勢矯正步驟藉由利用前述基板和前述基板搬送供給裝置的前述卡止部這兩者構成呈密封狀的前述收容凹部,並且透過設置在前述收容凹部的底面上的流體壓力緩和機構向前述收容凹部供給壓縮空氣,從而進行前述基板的姿勢矯正。 The substrate conveyance and supply method according to the first aspect of the invention, wherein the substrate posture correction step is configured to form a sealed concave portion by using both the substrate and the locking portion of the substrate transfer supply device, and is transparent The fluid pressure relieving mechanism provided on the bottom surface of the housing recess is supplied with compressed air to the housing recess to correct the posture of the substrate. 一種基板搬送供給裝置,其特徵在於:為將表面上安裝有複數個電子零件的基板搬送到壓縮樹脂封裝裝置的上模面的下方位置,並且使前述 基板的前述表面朝下且使前述基板的背面吸附到前述上模面並保持的一種基板搬送供給裝置,其具備:基板搬送板部,載置前述基板;進退往復運動機構,為將前述基板搬送板部配置為能夠相對於前述上模面的下方位置前進及後退;和基板變形姿勢矯正機構,前述基板搬送板部具有:卡止部,為與前述基板的表面周邊部位接合且使該表面周邊部位卡止在規定位置;和收容凹部,為將全部前述電子零件以與前述卡止部不接觸的狀態進行收容,前述基板變形姿勢矯正機構具有:壓縮空氣供給孔,在前述收容凹部的底面上配設複數個;和壓縮空氣供給機構,連通連接於前述壓縮空氣供給孔:使前述基板搬送供給裝置往前述上模面之下方位置前進,使前述基板之前述背面卡合於前述上模面之既定之位置,以前述變形姿勢矯正手段矯正前述基板之變形姿勢,使被矯正後之狀態之前述基板吸附於前述上模面,使前述基板搬送供給裝置向前述壓縮樹脂封裝裝置的外部後退。 A substrate transfer and supply device for transporting a substrate on which a plurality of electronic components are mounted on a surface of a lower surface of a compression resin sealing device, and a substrate transfer and supply device in which the surface of the substrate faces downward and the back surface of the substrate is adsorbed to the upper mold surface, and includes a substrate transfer plate portion on which the substrate is placed, and a reciprocating mechanism for transporting the substrate The plate portion is disposed to be movable forward and backward with respect to a lower position of the upper mold surface; and the substrate deformation posture correcting mechanism has a locking portion that is joined to a surface peripheral portion of the substrate and has a surface periphery The portion is locked at a predetermined position; and the housing recess is configured to accommodate all of the electronic components in a state of not contacting the locking portion, and the substrate deformation posture correcting mechanism includes a compressed air supply hole on a bottom surface of the housing recess And a plurality of compressed air supply means connected to the compressed air supply hole, wherein the substrate transfer and supply device advances to a position below the upper mold surface, and the back surface of the substrate is engaged with the upper mold surface Fixing the deformed posture of the substrate by the aforementioned deformation posture correcting means at a predetermined position, The state after the substrate is adsorbed on the corrected upper mold surface so that the substrate transfer apparatus supplying compressed outer resin package back to the apparatus. 如申請專利範圍第5項的基板搬送供給裝置,其中,前述基板變形姿勢矯正機構藉由前述基板和前述基板搬送板部的前述 卡止部這兩者構成呈密封狀的前述收容凹部,並且從前述壓縮空氣供給孔向前述收容凹部供給壓縮空氣。 The substrate transfer and supply device according to claim 5, wherein the substrate deformation posture correcting mechanism is formed by the substrate and the substrate transfer plate portion Both of the locking portions constitute the storage recessed portion that is sealed, and compressed air is supplied from the compressed air supply hole to the housing recess. 如申請專利範圍第5項的基板搬送供給裝置,其中,前述基板變形姿勢矯正機構藉由前述基板和前述基板搬送板部的前述卡止部這兩者構成呈密封狀的前述收容凹部,並且透過設置在前述收容凹部的底面上的流體壓力緩和機構向前述收容凹部供給壓縮空氣。 The substrate transfer and supply device according to the fifth aspect of the invention, wherein the substrate deformation posture correcting mechanism forms a sealed recessed portion by both the substrate and the locking portion of the substrate transporting plate portion, and transmits The fluid pressure relieving mechanism provided on the bottom surface of the housing recess is supplied with compressed air to the housing recess.
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