TWI539547B - 液體流量控制裝置、液體流量控制方法、及記憶媒體 - Google Patents

液體流量控制裝置、液體流量控制方法、及記憶媒體 Download PDF

Info

Publication number
TWI539547B
TWI539547B TW100130304A TW100130304A TWI539547B TW I539547 B TWI539547 B TW I539547B TW 100130304 A TW100130304 A TW 100130304A TW 100130304 A TW100130304 A TW 100130304A TW I539547 B TWI539547 B TW I539547B
Authority
TW
Taiwan
Prior art keywords
flow rate
flow
control
range
liquid
Prior art date
Application number
TW100130304A
Other languages
English (en)
Chinese (zh)
Other versions
TW201230228A (en
Inventor
佐竹圭吾
Original Assignee
東京威力科創股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 東京威力科創股份有限公司 filed Critical 東京威力科創股份有限公司
Publication of TW201230228A publication Critical patent/TW201230228A/zh
Application granted granted Critical
Publication of TWI539547B publication Critical patent/TWI539547B/zh

Links

Classifications

    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05DSYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D7/00Control of flow
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67253Process monitoring, e.g. flow or thickness monitoring
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T137/00Fluid handling
    • Y10T137/0318Processes
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T137/00Fluid handling
    • Y10T137/2496Self-proportioning or correlating systems
    • Y10T137/2559Self-controlled branched flow systems
    • Y10T137/2564Plural inflows
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T137/00Fluid handling
    • Y10T137/7722Line condition change responsive valves
    • Y10T137/7758Pilot or servo controlled
    • Y10T137/7759Responsive to change in rate of fluid flow
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T137/00Fluid handling
    • Y10T137/8593Systems
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T137/00Fluid handling
    • Y10T137/8593Systems
    • Y10T137/87265Dividing into parallel flow paths with recombining
    • Y10T137/87298Having digital flow controller
    • Y10T137/87306Having plural branches under common control for separate valve actuators
    • Y10T137/87314Electromagnetic or electric control [e.g., digital control, bistable electro control, etc.]

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Power Engineering (AREA)
  • Automation & Control Theory (AREA)
  • Flow Control (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Weting (AREA)
  • Feedback Control In General (AREA)
TW100130304A 2010-11-04 2011-08-24 液體流量控制裝置、液體流量控制方法、及記憶媒體 TWI539547B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010247705A JP5646956B2 (ja) 2010-11-04 2010-11-04 液体流量制御装置、液体流量制御方法および記憶媒体

Publications (2)

Publication Number Publication Date
TW201230228A TW201230228A (en) 2012-07-16
TWI539547B true TWI539547B (zh) 2016-06-21

Family

ID=46018475

Family Applications (1)

Application Number Title Priority Date Filing Date
TW100130304A TWI539547B (zh) 2010-11-04 2011-08-24 液體流量控制裝置、液體流量控制方法、及記憶媒體

Country Status (4)

Country Link
US (1) US8622073B2 (enExample)
JP (1) JP5646956B2 (enExample)
KR (1) KR101669689B1 (enExample)
TW (1) TWI539547B (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3159016B2 (ja) 1995-11-13 2001-04-23 株式会社ムロコーポレーション 連続ビス締付機
US20140271243A1 (en) * 2013-03-14 2014-09-18 Usc, L.L.C. Pump stand with improved pump control
US9038861B2 (en) 2013-03-14 2015-05-26 Usc, L.L.C. Seed metering wheel assembly
JP6290762B2 (ja) * 2013-10-30 2018-03-07 東京エレクトロン株式会社 流量調整機構、希釈薬液供給機構、液処理装置及びその運用方法
JP6378555B2 (ja) * 2014-06-26 2018-08-22 株式会社荏原製作所 洗浄ユニット
US10340159B2 (en) 2014-06-09 2019-07-02 Ebara Corporation Cleaning chemical supplying device, cleaning chemical supplying method, and cleaning unit
JP6486986B2 (ja) 2017-04-03 2019-03-20 株式会社荏原製作所 液体供給装置及び液体供給方法
JP6917864B2 (ja) * 2017-11-02 2021-08-11 東京エレクトロン株式会社 液供給装置およびリーク検知方法
US12050478B2 (en) * 2019-07-25 2024-07-30 Siemens Aktiengesellschaft Conveyor assembly with two conveyor elements connected in parallel

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1757059A (en) * 1928-04-28 1930-05-06 Frederick B Rickenberg Valve
US3875964A (en) * 1973-05-21 1975-04-08 Process Systems Multiple element control valve
US4207919A (en) * 1975-09-19 1980-06-17 Powell Industries, Inc. Digital fluid flow control system
DE2725410C2 (de) * 1977-06-04 1983-09-01 Bodenseewerk Perkin-Elmer & Co GmbH, 7770 Überlingen Vorrichtung zur Steuerung einer Druckmittelströmung
JPS575507A (en) * 1980-06-12 1982-01-12 Toshiba Corp Level control device of auxiliary machinery to steam turbine
JPS5870319A (ja) * 1981-10-21 1983-04-26 Hitachi Ltd 流量制御装置
FR2548329B1 (fr) * 1983-06-30 1986-06-20 Bosteels Michel Dispositif de commande de debits calibres de fluide
DE3432466C2 (de) * 1984-09-04 1986-10-30 Boge Gmbh, 5208 Eitorf Drosselventil
JPS6351638A (ja) 1986-08-20 1988-03-04 Clean Saafueisu Gijutsu Kk フオト・エツチングのレジスト塗布回収装置
JPH0746347Y2 (ja) * 1987-07-23 1995-10-25 富士通株式会社 薬品処理装置
JPH01214911A (ja) * 1988-02-23 1989-08-29 Toshiba Corp 流量制御装置
US5038821A (en) * 1990-08-06 1991-08-13 Maget Henri J R Electrochemical control valve
US5329965A (en) * 1993-07-30 1994-07-19 The Perkin-Elmer Corporation Hybrid valving system for varying fluid flow rate
NL9402237A (nl) * 1994-12-29 1996-08-01 Adrianus Martinus M Wildenberg Debietregelklep.
CA2183478C (en) * 1995-08-17 2004-02-24 Stephen A. Carter Digital gas metering system using tri-stable and bi-stable solenoids
US6240944B1 (en) * 1999-09-23 2001-06-05 Honeywell International Inc. Addressable valve arrays for proportional pressure or flow control
JP3365753B2 (ja) * 1999-12-20 2003-01-14 川崎重工業株式会社 底吹き転炉のガス供給装置
JP2002116824A (ja) * 2000-10-05 2002-04-19 Ishikawajima Harima Heavy Ind Co Ltd 液体流量の制御方法
JP2003158122A (ja) 2001-09-04 2003-05-30 Japan Pionics Co Ltd 気化供給方法

Also Published As

Publication number Publication date
JP5646956B2 (ja) 2014-12-24
US8622073B2 (en) 2014-01-07
KR20120049119A (ko) 2012-05-16
JP2012099730A (ja) 2012-05-24
TW201230228A (en) 2012-07-16
KR101669689B1 (ko) 2016-10-27
US20120111412A1 (en) 2012-05-10

Similar Documents

Publication Publication Date Title
TWI539547B (zh) 液體流量控制裝置、液體流量控制方法、及記憶媒體
JP2012099730A5 (enExample)
US8104948B2 (en) Processing liquid mixing apparatus and method, substrate processing apparatus, and storage medium
CN105529289B (zh) 基板处理装置和基板处理方法
JP6290762B2 (ja) 流量調整機構、希釈薬液供給機構、液処理装置及びその運用方法
JP2018082099A (ja) 基板処理装置、基板処理方法及び記憶媒体
US20110023909A1 (en) Liquid processing apparatus, liquid processing method, and storage medium
KR102394219B1 (ko) 기판에 디스펜싱된 액체들의 온도들을 제어하는 사용 현장 혼합 시스템들 및 방법들
WO2009118837A1 (ja) 処理チャンバの排気ガス流量の制御方法及び処理装置
US8590548B2 (en) Liquid processing apparatus for substrate, method for generating processing liquid, and computer readable recording medium storing program for generating processing liquid therein
JP6695735B2 (ja) 液処理装置、その制御方法及び記憶媒体
CN109075061B (zh) 基板处理方法和基板处理装置
TWI888676B (zh) 清洗藥液供給裝置
JP6774327B2 (ja) 洗浄薬液供給装置、洗浄ユニット、及びプログラムを格納した記憶媒体
JP2007258289A (ja) 液処理装置並びに液処理装置の処理液供給方法及び処理液供給プログラム。
JP2018078343A (ja) 流量調整機構、希釈薬液供給機構、液処理装置及びその運用方法
US20100043835A1 (en) Substrate processing apparatus, substrate processing method, program, and storage medium
KR101236696B1 (ko) 기판처리장치
JP5063531B2 (ja) 基板処理装置、基板処理方法、プログラムおよび記憶媒体
JP2011176125A (ja) 液処理装置、液処理方法、プログラムおよびプログラム記録媒体
CN111715134A (zh) 流体混合装置及其控制方法、刻蚀设备
TW202500258A (zh) 溶液供給裝置及半導體設備
JP2001286836A (ja) 基板処理装置
JP2010050393A (ja) 基板処理装置、基板処理方法、プログラムおよび記憶媒体
US20100047932A1 (en) Substrate processing apparatus, substrate processing method, substrate processing program, and computer readable recording medium having substrate processing program therein