TWI537547B - Polarized light irradiation device for light orientation and polarized light irradiation method for light orientation - Google Patents

Polarized light irradiation device for light orientation and polarized light irradiation method for light orientation Download PDF

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TWI537547B
TWI537547B TW103119730A TW103119730A TWI537547B TW I537547 B TWI537547 B TW I537547B TW 103119730 A TW103119730 A TW 103119730A TW 103119730 A TW103119730 A TW 103119730A TW I537547 B TWI537547 B TW I537547B
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workpiece
light
alignment
polarization
sensor
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TW201510494A (en
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Junji Kimura
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Ushio Electric Inc
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    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/1337Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Mathematical Physics (AREA)
  • Liquid Crystal (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Polarising Elements (AREA)

Description

光定向用偏光光照射裝置及光定向用偏光光照射方法 Polarization light irradiation device for light orientation and polarized light irradiation method for light orientation

本發明是關於進行光定向時所進行之偏光光的照射技術。 The present invention relates to a technique of irradiating polarized light which is performed when light is directed.

近年來,在獲得液晶顯示元件用的定向膜或視野角校正薄膜用的定向層時,採用藉光照射進行定向的稱為光定向的技術。以下,總稱藉光照射產生定向的膜或層為光定向膜。再者,「定向」乃至於「定向處理」是針對對象物之某種性質賦予其方向性。 In recent years, when an alignment layer for a liquid crystal display element or an alignment layer for a viewing angle correction film is obtained, a technique called light orientation by orientation by light irradiation is employed. Hereinafter, a film or layer which is oriented by light irradiation to produce an orientation is a light directing film. Furthermore, "orientation" and even "orientation processing" are directed to the directionality of a certain property of an object.

光定向是藉著對光定向膜用的膜(以下,稱膜材),照射偏光光來進行。膜材是例如聚醯亞胺的樹脂製,對膜材照射朝預定方向偏光的偏光光。藉預定波長的偏光光的照射,使膜材的分子構造(例如側鏈)成為與偏光光的偏光軸的方向對齊的狀態,獲得光定向膜。 The light orientation is performed by irradiating polarized light to a film for a light directing film (hereinafter referred to as a film). The film material is made of, for example, a resin of polyimine, and the film material is irradiated with polarized light that is polarized in a predetermined direction. The molecular structure (for example, a side chain) of the film is aligned with the direction of the polarization axis of the polarized light by irradiation of the polarized light of a predetermined wavelength, and a light directing film is obtained.

照射如上述光定向用的偏光光的偏光光照射裝置,例如有揭示於專利文獻1或專利文獻2的裝置。該等裝置具備相當於照射面的寬度或其以上寬度之長度的棒形光源,及使得由此光源的光偏光的鋼絲隔柵偏光元件, 相對於和光源的長方向正交的方向所搬運的膜材進行偏光光照射。在光定向時多有從可視照射紫外區域的波長之偏光光的必要,作為棒形的光源多使用如高壓水銀燈的紫外線光源。 The polarizing light irradiation device that illuminates the polarized light for the light direction is, for example, a device disclosed in Patent Document 1 or Patent Document 2. These devices are provided with a rod-shaped light source having a length corresponding to the width of the irradiation surface or a width thereof, and a wire grid polarizing element that polarizes the light of the light source. The film conveyed in a direction orthogonal to the longitudinal direction of the light source is irradiated with polarized light. In the case of light orientation, there is a need for polarized light from a wavelength that visually illuminates the ultraviolet region. As a light source of a rod shape, an ultraviolet light source such as a high pressure mercury lamp is often used.

〔先前技術文獻〕 [Previous Technical Literature] 〔專利文獻〕 [Patent Document]

〔專利文獻1〕日本特許第4968165號公報 [Patent Document 1] Japanese Patent No. 4968165

〔專利文獻2〕日本特許第4506412號公報 [Patent Document 2] Japanese Patent No. 4506014

〔專利文獻3〕日本特開2007-127567號公報 [Patent Document 3] Japanese Patent Laid-Open Publication No. 2007-127567

定向處理的品質的重要指標雖無說明的必要,但是為定向的方向精度。定向的方向精度不良時,膜材的特定的性質變得不能朝著預定的方向,而不能獲得所預定之定向處理的效果。定向的方向精度的惡化有在某一面內整體的定向和預定的方向成為不同方向的場合,及定向的方向在某一面內為不均勻的場合。 Although the important indicators of the quality of the directional processing are not necessary, they are oriented precision. When the orientation accuracy of the orientation is poor, the specific properties of the film become unable to proceed in a predetermined direction, and the effect of the predetermined orientation treatment cannot be obtained. The deterioration of the directional accuracy of the orientation may be such that the overall orientation and the predetermined direction in a certain plane are different directions, and the direction of the orientation is not uniform in a certain plane.

例如在獲得液晶顯示元件用的定向膜時的光定向處理中,由於是將液晶的各分子排列於定向的方向,定向的方向精度惡化一旦產生於整體時,會使得畫面整體的辨識性惡化。並且,精度惡化如以定向不均勻產生時,會產生畫面之部份的閃爍或顯示不均勻。 For example, in the light directing process in which the alignment film for a liquid crystal display element is obtained, since the molecules of the liquid crystal are arranged in the direction of orientation, the direction accuracy of the orientation is deteriorated, and when the whole direction is generated, the visibility of the entire screen is deteriorated. Further, when the accuracy is deteriorated, such as unevenness in orientation, a flicker or uneven display of a portion of the screen may occur.

以上的定向方向精度在以製品的高性能化、高功能化為背景則被非常嚴密地要求。例如,智慧型手機等的移動式機器多使用的觸控面板(觸控銀幕顯示器)中,僅定向的方向精度的惡化即會影響到畫面辨識性的降低與顯示不均勻,因此尋求更高的光定向的方向精度。 The above orientation accuracy is very strict in the background of high performance and high functionality of products. For example, in a touch panel (touch screen display) in which a mobile device such as a smart phone is used, only the deterioration of the orientation accuracy of the orientation affects the reduction of the visibility of the screen and the unevenness of the display, so that a higher level is sought. Directional accuracy of light orientation.

光定向的方向精度是由照射在膜材的偏光光之偏光軸的方向精度來決定。為滿足所要求的方向精度,必須將從所照射偏光光之偏光軸的預定方向的偏位抑制在非常小的預定的範圍內。因此,光定向用偏光光照射裝置是如上述有軸偏位抑制於小的狀態下將偏光光照射在膜材的必要,為此,在照射面必須有監視偏光光的偏光軸是否精度良好朝向預定方向的手段。 The direction accuracy of the light orientation is determined by the accuracy of the direction of the polarization axis of the polarized light that is incident on the film. In order to satisfy the required directional accuracy, it is necessary to suppress the deviation from the predetermined direction of the polarization axis of the irradiated polarized light within a very small predetermined range. Therefore, the polarized light irradiation device for light orientation is required to irradiate the polarized light to the film material in a state where the axial misalignment is suppressed as described above. Therefore, it is necessary to have a polarization axis for monitoring the polarized light on the irradiation surface. The means of booking directions.

照射面的偏光光之偏光軸的監視,在偏光光的偏光軸方向的檢測雖是不可或缺,但是對於精度良好進行偏光軸之方向的檢測,對於可滿足要求之實用上的建議則至今未見有存在。例如專利文獻3雖提出一種無需旋轉測光件即可檢測偏光軸方向的構造,但是對於進一步提高偏光軸方向的檢測精度的點則多未有示教。專利文獻3由於不使測光件旋轉而不會受到測光件旋轉停止精度的影響,但是測光件的旋轉原點的姿勢的精度不良即會導致測量精度的惡化。 The monitoring of the polarization axis of the polarized light on the irradiation surface is indispensable for detecting the polarization axis direction of the polarized light. However, the detection of the direction of the polarization axis with good accuracy is not yet practical. See there is existence. For example, Patent Document 3 proposes a structure in which the direction of the polarization axis can be detected without rotating the photometric member. However, the point of further improving the detection accuracy of the direction of the polarization axis is not taught. In Patent Document 3, since the photometric member is not rotated, the accuracy of the rotation stop of the photodetector is not affected. However, the accuracy of the posture of the rotation origin of the photometric member is deteriorated, which results in deterioration of measurement accuracy.

本案的發明是考量上述的點所研創而成,在光定向用的偏光光的照射技術是以可精度良好檢測出所照射之偏光光的偏光軸方向,並在方向精度的點可進行高品質之光定 向處理為本發明的解決課題。 The invention of the present invention has been developed in consideration of the above-mentioned points, and the irradiation technique of the polarized light for light orientation is capable of accurately detecting the direction of the polarization axis of the polarized light to be irradiated, and is capable of performing high quality at the point of the direction accuracy. Light setting The treatment is a problem of the present invention.

用於解決上述課題之本案的請求項1記載的發明,構成為具備透過偏光元件光照射於照射面的光照射器的光定向用偏光光照射裝置,具備檢測照射於照射面之偏光光的偏光軸方向的偏光方向檢測系,偏光方向檢測系,可檢測上述偏光軸的方向以作為相對於裝置中所設定之基準方向的裝置基準方向的角度,偏光方向檢測系,具備可配置於檢測照射在照射面的偏光光之偏光軸方向位置的偏光方向檢測器,偏光方向檢測器具備:相對於照射面成平行的姿勢的測光件;從光照射器所射出的光透過測光件而受光的受光器;及使測光件在與照射面成垂直的轉軸周圍旋轉的旋轉驅動源,以受光器受光的光的強度是根據伴隨測光件的旋轉而變化的狀態檢測偏光方向,測光件設置有測光件對準器,測光件對準器是以具有為了檢測偏光方向使得測光件旋轉時的旋轉原點中的測光件的姿勢相對於裝置基準方向為朝著預定方向的姿勢。 In the invention according to the first aspect of the present invention, the present invention provides a light-directing polarized light irradiation device including a light irradiator that transmits light to a light-emitting surface through a polarizing element, and includes polarized light for detecting polarized light that is applied to the light-emitting surface. a polarization direction detection system in the axial direction, the polarization direction detection system is capable of detecting the direction of the polarization axis as an angle with respect to a device reference direction of a reference direction set in the device, and the polarization direction detection system is configured to be configurable to detect illumination a polarization direction detector for the position of the polarized light on the irradiation surface in the polarization axis direction, the polarization direction detector includes a photometric member that is parallel to the irradiation surface, and a light receiver that receives light from the light irradiator through the photometric member And a rotary driving source for rotating the photometric member around a rotating shaft perpendicular to the irradiation surface, wherein the intensity of the light received by the light receiving device is detected according to a state of change accompanying the rotation of the photometric member, and the photometric member is provided with a pair of photometric members The photometric aligner is configured to have a rotation origin when the photometric member is rotated in order to detect the polarization direction The posture of the photometric member is a posture toward a predetermined direction with respect to the device reference direction.

並且,為解決上述課題,請求項2記載的發明是在上述請求項1的構成中,構成為在上述測光件設置有對準標記, 上述測光件對準器,具備檢測對準標記的測光件感測器,及藉著從測光件感測器的輸出算出對上述預定方向之測光件的姿勢偏位量的運算處理部,為上述旋轉驅動源控制以消除所算出的偏位量。 In the invention of claim 1, the invention of claim 1 is characterized in that the photometric member is provided with an alignment mark. The photometric aligner includes a photometric sensor that detects an alignment mark, and an arithmetic processing unit that calculates a posture misalignment amount of the photometric member in the predetermined direction from an output of the photometric sensor. The drive source control is rotated to eliminate the calculated amount of offset.

又,為解決上述課題,請求項3記載的發明是在上述請求項2的構成中,構成為設有調整上述偏光元件的配置角度的偏光元件調整機構,偏光元件調整機構具有可調整上述偏光元件的配置角度以消除藉偏光方向檢測系所檢測之偏光光的方向與設定定向方向的偏位量,設定定向方向是為進行光定向而應指向偏光光之偏光軸的方向。 In the invention of claim 2, in the configuration of claim 2, the polarizing element adjusting mechanism is provided to adjust the arrangement angle of the polarizing element, and the polarizing element adjusting mechanism has the polarizing element adjustable. The arrangement angle is such that the direction of the polarized light detected by the polarization direction detecting system and the amount of deviation of the set orientation direction are eliminated, and the direction of the orientation is set to the direction of the polarization axis of the polarized light for the light direction.

又,為解決上述課題,請求項4記載的發明是在上述請求項3的構成中,構成具備朝上述照射面搬運工件的工件搬運系與工件對準器,上述設定定向方向是以工件的特定部位的延伸方向為基準而設定,工件對準器具有藉著工件搬運系將工件搬運到上述照射面時,調整工件的姿勢使上述工件的特定部位的延伸方向相對於上述裝置基準方向成預定的方向。 In the invention of claim 3, the invention provides the workpiece transport system and the workpiece aligner that transport the workpiece toward the irradiation surface, and the set orientation direction is the workpiece specificity. The extending direction of the portion is set as a reference. When the workpiece aligner transports the workpiece to the irradiation surface by the workpiece transport system, the posture of the workpiece is adjusted so that the extending direction of the specific portion of the workpiece is predetermined with respect to the device reference direction. direction.

又,為解決上述課題,請求項5記載的發明是在上述請求項4的構成中,設有作為上述工件對準器的第一第二的兩個工件對準器,第一工件對準器是進行第一工件的對準,第二工件對準器是進行第二工件的對準, 在第一工件上形成有第一第二的兩個對準標記,並在第二工件與第一工件相同的位置上形成有第一第二的兩個對準標記,第一工件對準器是檢測第一工件的兩個對準標記的位置,算出連結兩個對準標記的線的延伸方向與上述裝置基準方向所成的角度,調整第一工件的姿勢進行對準以使該角度成為預定的角度,第二工件對準器具備:第一第二的兩個感測器、運算處理部、記憶部、載台姿勢調整機構及移送機構,第一第二的兩個感測器被以可同時攝影各工件之兩個對準標記的位置關係配置,移送機構在以第一工件對準器完成第一工件的對準之後,移送該對準完成後的第一工件或上述第一第二的兩個感測器,以該對準完成後的姿勢的狀態作為第一感測器攝影獲得第一工件的第一對準標記的狀態,並作為第二感測器攝影獲得第二對準標記的狀態,運算處理部處理第一感測器攝影後之第一工件的第一對準標記的圖像數據而將該第一對準標記的位置資訊記憶在記憶部,並處理第一感測器攝影後之第一工件的第二對準標記的圖像數據而將該第二對準標記的位置資訊記憶在記憶部,上述工件搬運系是將第二工件搬運到以第一感測器攝影第一對準標記,並以第二感測器攝影第二對準標記的位置, 載台姿勢調整機構具有根據從記憶部所讀取的位置資訊,使第二工件的第一對準標記位於第一工件之第一對準標記定位的位置上,並使得第二工件的第二對準標記位於第一工件之第二對準標記定位的位置機構的構成。 In order to solve the above-described problems, the invention of claim 5 is characterized in that, in the configuration of the request item 4, two first workpiece aligners, the first workpiece aligner, are provided as the first and second workpiece aligners. Is to perform alignment of the first workpiece, and the second workpiece aligner is to perform alignment of the second workpiece, Forming a first and second alignment marks on the first workpiece, and forming a first and second alignment marks on the second workpiece at the same position as the first workpiece, the first workpiece aligner The position of the two alignment marks of the first workpiece is detected, the angle between the extending direction of the line connecting the two alignment marks and the reference direction of the device is calculated, and the posture of the first workpiece is adjusted to be aligned so that the angle becomes At a predetermined angle, the second workpiece aligner includes: first and second two sensors, an arithmetic processing unit, a memory unit, a stage posture adjusting mechanism, and a transfer mechanism, and the first and second two sensors are The positional relationship of the two alignment marks of each workpiece can be simultaneously photographed, and after the alignment of the first workpiece is completed by the first workpiece aligner, the first workpiece after the alignment is completed or the first The second two sensors obtain the state of the first alignment mark of the first workpiece as the first sensor photography in the state of the posture after the alignment is completed, and obtain the second image as the second sensor. Align the state of the mark, arithmetic processing Processing image data of the first alignment mark of the first workpiece after the first sensor is photographed, and memorizing the position information of the first alignment mark in the memory portion, and processing the first after the first sensor is photographed The image data of the second alignment mark of the workpiece is used to memorize the position information of the second alignment mark in the memory portion, and the workpiece handling system is to transport the second workpiece to the first alignment mark by the first sensor. And photographing the position of the second alignment mark with the second sensor, The stage posture adjusting mechanism has a position information read from the memory portion such that the first alignment mark of the second workpiece is located at a position where the first alignment mark of the first workpiece is positioned, and the second workpiece is second. The alignment mark is located at a positional mechanism in which the second alignment mark of the first workpiece is positioned.

並且,為解決上述課題,請求項6記載的發明構成為,具有:將工件配置在照射面,透過偏光元件光照射於照射面而對工件照射偏光光的偏光光照射步驟,及檢測照射於照射面之偏光光的偏光軸方向的偏光方向檢測步驟,偏光方向檢測步驟是取代工件在照射面配置偏光方向檢測器以檢測偏光軸的方向的步驟,偏光方向檢測器具備:相對於照射面成平行姿勢的測光件;透過測光件接受來自光照射器所射出的光的受光器;使測光件在相對於照射面垂直的轉軸周圍旋轉的旋轉驅動源,根據受光器所受光的光的強度隨著測光件的旋轉而變化的狀態進行偏光方向的檢測,設有測光件對準步驟,使得測光件旋轉時之旋轉原點的測光件的姿勢相對於裝置基準方向朝著預定方向的姿勢來檢測偏光方向,偏光方向檢測步驟是在測光件對準步驟之後偏光方向檢測器檢測偏光方向的步驟。 In order to solve the problem, the invention according to the invention of claim 6 includes a step of arranging a workpiece on an irradiation surface, irradiating the irradiation surface with light by the polarizing element, and irradiating the workpiece with polarized light, and detecting the irradiation. a polarization direction detecting step of the polarized light in the polarization direction of the surface, wherein the polarizing direction detecting step is a step of arranging the polarization direction detector on the irradiation surface to detect the direction of the polarization axis, and the polarization direction detector is provided in parallel with the irradiation surface a light-measuring member of a posture; a light-receiving device that receives light emitted from the light illuminator through the light-measuring member; and a rotational driving source that rotates the light-measuring member around a rotating shaft perpendicular to the illuminating surface, according to the intensity of light received by the light receiving device The state in which the photometric member is rotated changes to detect the polarization direction, and the photometric member alignment step is provided to detect the polarization of the posture of the photometric member at the rotation origin when the photometric member is rotated with respect to the device reference direction toward a predetermined direction. Direction, the direction of polarization detection is the detection of the polarization direction detector after the step of aligning the light meter The step of the light direction.

又,為解決上述課題,請求項7記載的發明是在上述請求項6的構成中,在上述測光件設有對準標記,上述測光件對準步驟具有控制上述旋轉驅動源的步驟 的構成,該控制步驟是以測光件感測器檢測上述測光件的對準標記,藉著從該測光件感測器的輸出並以運算處理部算出測光件相對於上述預定方向之測光件的姿勢的偏位量,來消除所算出的偏位量。 In the invention of claim 7, the invention is characterized in that the photometric member is provided with an alignment mark, and the photometric member alignment step has a step of controlling the rotational driving source. The control step is to detect the alignment mark of the photometric member by the photometric member sensor, and calculate the photometric member from the photometric member in the predetermined direction by the output from the photometric member sensor and the arithmetic processing unit. The amount of misalignment of the posture is used to eliminate the calculated amount of misalignment.

又,為解決上述課題,請求項8記載的發明是在上述請求項7的構成中,具有調整上述偏光元件的配置角度的偏光元件調整步驟,上述偏光元件調整步驟是藉偏光元件調整機構調整上述偏光元件的配置角度來消除偏光方向檢測系所檢測之偏光光的方向與設定定向方向的偏位量的步驟,設定定向方向為進行光定向而應指向偏光光之偏光軸的方向的構成。 In addition, in the configuration of the above-mentioned claim 7, the invention provides the polarizing element adjusting step of adjusting the arrangement angle of the polarizing element, and the polarizing element adjusting step is to adjust the above by the polarizing element adjusting mechanism. The arrangement angle of the polarizing element eliminates the step of the direction of the polarized light detected by the polarization direction detecting system and the amount of the offset in the set orientation direction, and sets the orientation direction to a direction in which the light is oriented and directed to the polarization axis of the polarized light.

又,為解決上述課題,請求項9記載的發明是在上述請求項8的構成中,具有將工件搬運到上述照射面的工件搬運步驟,及工件對準步驟,上述設定定向方向是以工件的特定部位的延伸方向為基準而設定,工件對準步驟具有在工件搬運步驟中,將工件搬運到上述照射面時,調整工件的姿勢使上述工件的特定部位的延伸方向相對於上述裝置基準方向成預定方向的構成。 In the invention of claim 9, the invention of claim 9 includes a workpiece transporting step of transporting a workpiece to the irradiation surface, and a workpiece alignment step, wherein the set orientation direction is a workpiece The extending direction of the specific portion is set as a reference, and the workpiece alignment step has a posture of adjusting the workpiece when the workpiece is conveyed to the irradiation surface in the workpiece conveying step, so that the extending direction of the specific portion of the workpiece is opposite to the reference direction of the device. The composition of the predetermined direction.

又,為解決上述課題,請求項10記載的發明是在上述請求項9的構成中,具有作為上述工件對準步驟的第一第二的兩個工件對準步驟,第一工件對準步驟是進行第一工件對準的步驟,第二工件對準步驟是進行第二工件對準的步驟, 在第一工件上形成有第一第二的兩個對準標記,並在第二工件與第一工件相同的位置上形成有第一第二的兩個對準標記,第一工件對準步驟是檢測第一工件的兩個對準標記的位置,算出連結兩個對準標記的線的延伸方向與上述裝置基準方向所成的角度,調整第一工件的姿勢進行對準以使該角度成為預定角度的步驟,第二工件對準步驟具有:第一攝影步驟、位置資訊記憶步驟、第二攝影步驟及對準步驟,第一攝影步驟是在結束第一工件的對準之後,藉移送機構移送該等對準結束後之第一工件或上述第一第二的兩的感測器,以該等對準結束後之姿勢的狀態藉第一感測器進行第一工件之第一對準標記的攝影的同時,藉第二感測器進行第二對準標記的攝影的步驟,位置資訊記憶步驟是處理第一感測器攝影後之第一工件的第一對準標記的圖像數據將該第一對準標記的位置資訊記憶於記憶部,並處理第一感測器攝影後之第一工件的第二對準標記的圖像數據將該第二對準標記的位置資訊記憶於記憶部的步驟,第二攝影步驟是將第二工件搬運到各感測器的攝影位置,並藉第一感測器攝影第二工件的第一對準標記的同時,藉第二感測器攝影第二對準標記的步驟,對準步驟具有讀取記憶在記憶部的位置資訊,根據所讀取的位置資訊,使第二工件的第一對準標記位於第一工 件之第一對準標記定位的位置上,並使得第二工件的第二對準標記位於第一工件之第二對準標記定位的位置上的步驟的構成。 Further, in order to solve the above problems, the invention of claim 10 is characterized in that, in the configuration of the above-mentioned claim 9, there are two workpiece alignment steps as the first and second workpiece alignment steps, and the first workpiece alignment step is Performing a first workpiece alignment step, and a second workpiece alignment step is a step of performing a second workpiece alignment Forming a first and second alignment marks on the first workpiece, and forming a first and second alignment marks on the second workpiece at the same position as the first workpiece, the first workpiece alignment step The position of the two alignment marks of the first workpiece is detected, the angle between the extending direction of the line connecting the two alignment marks and the reference direction of the device is calculated, and the posture of the first workpiece is adjusted to be aligned so that the angle becomes The step of predetermining the angle, the second workpiece alignment step has: a first photographing step, a position information memory step, a second photographing step, and an aligning step, the first photographing step is a borrowing mechanism after ending the alignment of the first workpiece Transmitting the first workpiece after the alignment or the first and second sensors to perform the first alignment of the first workpiece by the first sensor in a state of the posture after the alignment ends At the same time as the photographing of the mark, the step of photographing the second alignment mark by the second sensor, the position information memory step is processing the image data of the first alignment mark of the first workpiece after the first sensor photographing The first pair The position information of the mark is stored in the memory unit, and the image data of the second alignment mark of the first workpiece after the first sensor is photographed is processed to memorize the position information of the second alignment mark in the memory unit, The second photographing step is to transport the second workpiece to the photographing position of each sensor, and photograph the second alignment mark by the second sensor while photographing the first alignment mark of the second workpiece by the first sensor. The step of aligning has a position information of reading the memory in the memory, and according to the read position information, the first alignment mark of the second workpiece is located at the first work The first alignment mark of the member is positioned at a position, and the second alignment mark of the second workpiece is located at a position where the second alignment mark of the first workpiece is positioned.

如以下的說明,根據請求項1或請求項6的發明,實際上是藉偏光方向檢測系來檢測以照射面所照射之偏光光的偏光軸的方向,因此可檢查相對於裝置基準方向是否朝著預定的方向。此時,為了檢測偏光方向而使得測光件旋轉時之旋轉原點的測光件的姿勢成為相對於裝置基準方向朝著預定的方向,因此偏光方向的檢測精度成為更高。 As described below, according to the invention of claim 1 or claim 6, the direction of the polarization axis of the polarized light irradiated by the irradiation surface is actually detected by the polarization direction detecting system, so that it is possible to check whether or not the direction with respect to the device reference direction is The intended direction. At this time, in order to detect the polarization direction, the posture of the photometric member of the rotation origin when the photometric member is rotated is oriented in a predetermined direction with respect to the device reference direction, and thus the detection accuracy of the polarization direction is higher.

又,根據請求項2或請求項7的發明,除上述效果之外,在測光件設有對準標記,藉測光件感測器檢測此對準標記進行測光件的對準,因此測光件的旋轉原點的精度成為更高。根據此點,可以使偏光方向的檢測精度成為更高。 Further, according to the invention of claim 2 or claim 7, in addition to the above effects, the photometric member is provided with an alignment mark, and the photometric sensor detects the alignment mark for alignment of the photometric member, and thus the photometric member The accuracy of the rotation origin is higher. According to this point, the detection accuracy of the polarization direction can be made higher.

又,根據請求項3或請求項8的發明,除上述效果之外,調整偏光元件的配置角度以消除根據偏光方向檢測系所檢測之偏光光的方向與設定定向方向的偏位量,因此可進一步實現方向精度高的光定向處理。 Further, according to the invention of claim 3 or claim 8, in addition to the above effects, the arrangement angle of the polarizing element is adjusted to eliminate the amount of deviation of the direction of the polarized light detected by the polarization direction detecting system from the set orientation direction, and thus Further, a light directing process with high direction accuracy is realized.

又,根據請求項4或請求項9的發明,除上述效果之外,工件是在以工件對準器所對準的狀態被偏光光照射,因此即使在以機器人將工件投入裝置的場合為投入裝置時 之工件的姿勢精度低的場合仍可以高的方向精度進行光定向。 Further, according to the invention of claim 4 or claim 9, in addition to the above effects, the workpiece is irradiated with the polarized light in a state of being aligned by the workpiece aligner, so that even when the robot is used to put the workpiece into the apparatus, the input is made. Device time When the posture accuracy of the workpiece is low, the light orientation can be performed with high directional accuracy.

又,根據請求項5或請求項10的發明,除上述效果之外,在第二工件對準器中,由於是藉兩個感測器同時攝影兩個對準標記來進行工件的對準,為此縮短對準所需的時間。因此,可提高生產性。 Further, according to the invention of claim 5 or claim 10, in addition to the above effects, in the second workpiece aligner, since the two alignment marks are simultaneously photographed by the two sensors to perform alignment of the workpiece, This shortens the time required for alignment. Therefore, productivity can be improved.

1‧‧‧光照射器 1‧‧‧Light illuminator

11‧‧‧光源 11‧‧‧Light source

12‧‧‧偏光元件單元 12‧‧‧Polarized element unit

121‧‧‧偏光元件 121‧‧‧Polarized components

2‧‧‧工件搬運系 2‧‧‧Workpiece handling system

21‧‧‧載台 21‧‧‧ stage

22‧‧‧搬運用驅動軸 22‧‧‧Transport drive shaft

23‧‧‧線性導件 23‧‧‧Linear Guides

24‧‧‧搬運用驅動源 24‧‧‧Transport drive source

3‧‧‧工件對準器 3‧‧‧Workpiece aligner

31‧‧‧感測器 31‧‧‧ Sensor

32‧‧‧載台姿勢調整機構 32‧‧‧Motion posture adjustment mechanism

33‧‧‧工件對準控制部 33‧‧‧Workpiece alignment control

4‧‧‧偏光方向檢測系 4‧‧‧Polarization direction detection system

40‧‧‧偏光方向檢測器 40‧‧‧Polar Direction Detector

41‧‧‧檢測用受光器 41‧‧‧Detector Receiver

42‧‧‧測光件 42‧‧‧Lighting parts

43‧‧‧旋轉機構 43‧‧‧Rotating mechanism

435‧‧‧旋轉驅動源 435‧‧‧Rotary drive source

45‧‧‧檢測系控制部 45‧‧‧Test Department Control Department

461‧‧‧測光件標記 461‧‧‧Photometer marking

462‧‧‧測光件標記 462‧‧‧Light meter marking

5‧‧‧移送機構 5‧‧‧Transfer organization

51‧‧‧移送用驅動軸 51‧‧‧Transport drive shaft

52‧‧‧移送用驅動源 52‧‧‧Transfer drive source

53‧‧‧橫向移動軌道 53‧‧‧Transversely moving orbit

6‧‧‧測光件對準器 6‧‧‧Light meter aligner

61‧‧‧測光件感測器 61‧‧‧Determometer sensor

7‧‧‧偏光元件調整機構 7‧‧‧Polarized element adjustment mechanism

71‧‧‧承銷 71‧‧‧ Underwriting

72‧‧‧進退銷 72‧‧‧Advance and resale

80‧‧‧工件對準控制部 80‧‧‧Workpiece alignment control

801‧‧‧顯示器 801‧‧‧ display

81‧‧‧第一工件對準器 81‧‧‧First workpiece aligner

82‧‧‧第二工件對準器 82‧‧‧Second workpiece aligner

821‧‧‧第一感測器 821‧‧‧first sensor

822‧‧‧第二感測器 822‧‧‧Second sensor

9‧‧‧主控制部 9‧‧‧Main Control Department

W、W1、W2‧‧‧工件 W, W1, W2‧‧‧ workpiece

WM1、WM2‧‧‧對準標記 WM1, WM2‧‧‧ alignment mark

R‧‧‧照射區域 R‧‧‧illuminated area

第1圖為本發明第一實施形態相關之光定向用偏光光照射裝置的透視概略圖。 Fig. 1 is a perspective schematic view of a polarized light irradiation device for light direction according to a first embodiment of the present invention.

第2圖為第1圖表示的光照射器1的剖面概略圖,(1)為照射面R之短方向的剖面概略圖,(2)為照射面R之長方向的剖面概略圖。 2 is a schematic cross-sectional view of the light irradiator 1 shown in Fig. 1, (1) is a schematic cross-sectional view in the short direction of the irradiation surface R, and (2) is a schematic cross-sectional view in the longitudinal direction of the irradiation surface R.

第3圖表示實施形態的光定向用偏光光照射裝置所使用之偏光元件121的構造及作用的透視概略圖。 Fig. 3 is a perspective schematic view showing the structure and operation of the polarizing element 121 used in the polarized light irradiation device for light direction of the embodiment.

第4圖表示工件對準器3的概略構成的透視圖。 Fig. 4 is a perspective view showing a schematic configuration of the workpiece aligner 3.

第5圖是針對第4圖的工件對準器3進行工件W對準的原理表示的圖。 Fig. 5 is a view showing the principle of alignment of the workpiece W with respect to the workpiece aligner 3 of Fig. 4.

第6圖是針對第4圖的工件對準器3進行工件W對準的原理表示的圖。 Fig. 6 is a view showing the principle of alignment of the workpiece W with respect to the workpiece aligner 3 of Fig. 4.

第7圖為第1圖表示之偏光方向檢測器40的前面剖面概略圖。 Fig. 7 is a schematic front cross-sectional view showing the polarization direction detector 40 shown in Fig. 1.

第8圖是針對測光件42的對準必要理由所表示的平 面概略圖。 Figure 8 is a diagram showing the reason necessary for the alignment of the photometric member 42. Outline picture.

第9圖表示測光件對準器6的概略構成的透視圖。 Fig. 9 is a perspective view showing a schematic configuration of the photometric aligner 6.

第10圖是針對第9圖的測光件對準器6進行測光件42對準的原理表示的圖。 Fig. 10 is a view showing the principle of aligning the photometric member 42 with respect to the photometric aligner 6 of Fig. 9.

第11圖表示偏光元件調整機構7的概略構成的平面圖。 Fig. 11 is a plan view showing a schematic configuration of the polarizing element adjusting mechanism 7.

第12圖為第二實施形態之光定向用偏光光照射裝置的平面概略圖。 Fig. 12 is a schematic plan view showing a polarized light irradiation device for light orientation according to a second embodiment.

第13圖表示第二實施形態的裝置之第二工件對準器82的構成的透視概略圖。 Fig. 13 is a perspective schematic view showing the configuration of the second workpiece aligner 82 of the apparatus of the second embodiment.

第14圖是針對第13圖表示之第二工件對準器8的感測器821、822的調整所表示的圖。 Fig. 14 is a view showing the adjustment of the sensors 821, 822 of the second workpiece aligner 8 shown in Fig. 13.

第15圖是針對第13圖表示之第二工件對準器8的感測器821、822的調整所表示的圖。 Fig. 15 is a view showing adjustment of the sensors 821, 822 of the second workpiece aligner 8 shown in Fig. 13.

第16圖是針對量產時之對準動作所表示的平面概略圖,表示第二工件對準器82的各感測器821、822進行第二工件W2的各工件標記WM1、WM2攝影後的狀態。 Fig. 16 is a plan view schematically showing the alignment operation at the time of mass production, showing that each of the sensors 821 and 822 of the second workpiece aligner 82 performs the photographing of the workpiece marks WM1 and WM2 of the second workpiece W2. status.

接著,針對實施本發明用的形態(以下稱實施形態)說明。 Next, the form for carrying out the invention (hereinafter referred to as an embodiment) will be described.

第1圖為本發明第一實施形態相關之光定向用偏光光照射裝置的透視概略圖。第1圖表示的偏光光照射裝置為用於光定向處理如附帶膜材液晶基板之板狀的工件W的 裝置,具備對工件W照射偏光光的光照射器1。 Fig. 1 is a perspective schematic view of a polarized light irradiation device for light direction according to a first embodiment of the present invention. The polarized light irradiation device shown in Fig. 1 is for a light-oriented treatment such as a plate-shaped workpiece W with a film liquid crystal substrate. The apparatus includes a light irradiator 1 that irradiates the workpiece W with polarized light.

該實施形態中,工件W為長方形。如上述,在光定向中,偏光光有使得偏光軸精度良好地朝著應定向方向的必要。定向的方向為可任意設定,以下稱設定定向方向。設定定向方向是以工件W的特定部位延伸的方向為基準而設定。以下的說明中,其中一例是以工件W的短邊方向為設定定向方向。 In this embodiment, the workpiece W has a rectangular shape. As described above, in the light orientation, the polarized light has a necessity to make the polarization axis accurately toward the direction of the orientation. The direction of the orientation can be arbitrarily set, hereinafter referred to as the orientation direction. The orientation direction is set based on the direction in which the specific portion of the workpiece W extends. In the following description, an example of this is that the short side direction of the workpiece W is the set orientation direction.

光照射器1是將偏光軸朝著設定定向方向的偏光光照射在照射面R。如第1圖表示,照射面R被設定成長方形的區域。 The light irradiator 1 irradiates the irradiation surface R with the polarized light of the polarization axis toward the set orientation direction. As shown in Fig. 1, the irradiation surface R is set to a rectangular region.

第2圖為第1圖表示的光照射器1的剖面概略圖,(1)為照射面R之短方向的剖面概略圖,(2)為照射面R之長方向的剖面概略圖。如第2圖表示,光照射器1具備:光源11,及配置在光源11與照射面R之間的偏光元件單元12。 2 is a schematic cross-sectional view of the light irradiator 1 shown in Fig. 1, (1) is a schematic cross-sectional view in the short direction of the irradiation surface R, and (2) is a schematic cross-sectional view in the longitudinal direction of the irradiation surface R. As shown in FIG. 2, the light irradiator 1 includes a light source 11 and a polarizing element unit 12 disposed between the light source 11 and the irradiation surface R.

作為光源11,在此實施形態是使用形成長尺寸的發光部。光源11是配置使發光部的長方向朝著與設定定向方向垂直的水平方向。該實施形態中,光源11是使用棒形的高壓水銀燈,但也可以使用金屬鹵素燈或LED。並且,也可以使用一列排列點光源11成長尺寸的發光部。 As the light source 11, in this embodiment, a light-emitting portion having a long dimension is used. The light source 11 is disposed such that the long direction of the light emitting portion is directed in a horizontal direction perpendicular to the set orientation direction. In this embodiment, the light source 11 is a rod-shaped high-pressure mercury lamp, but a metal halide lamp or an LED may be used. Further, a light-emitting portion in which the point light sources 11 are arranged in a row may be used in a row.

在光源11的背後(與照射面R的相反側)配置有鏡13。鏡13是朝光源11的長方向延伸的長尺寸鏡,包覆光源11的背後使得光被照射面R的一側反射來 提高光的利用效率。鏡13是成一對,反射面的剖面形狀是呈橢圓的圓弧或拋物線。再者,光源11或鏡13被收容在燈罩14內。 A mirror 13 is disposed behind the light source 11 (on the side opposite to the irradiation surface R). The mirror 13 is a long-length mirror that extends in the longitudinal direction of the light source 11, and covers the back of the light source 11 so that the light is reflected by the side of the irradiation surface R. Improve the efficiency of light utilization. The mirrors 13 are formed in a pair, and the cross-sectional shape of the reflecting surface is an elliptical arc or a parabola. Furthermore, the light source 11 or the mirror 13 is housed in the globe 14.

偏光元件單元12是由複數偏光元件121及保持複數偏光元件121的框架122所構成。各偏光元件121為方形的板狀,沿著光源11的長方向排列。如第2圖表示,偏光元件單元12被裝設在燈罩14的下端開口,定位在光源11與照射面R之間。 The polarizing element unit 12 is composed of a plurality of polarizing elements 121 and a frame 122 that holds the plurality of polarizing elements 121. Each of the polarizing elements 121 has a square plate shape and is arranged along the longitudinal direction of the light source 11. As shown in Fig. 2, the polarizing element unit 12 is provided at the lower end opening of the globe 14, and is positioned between the light source 11 and the irradiation surface R.

該實施形態中,各偏光元件121為線栅偏光元件。但是,栅的材質不限於金屬(wire),因此,以下僅單純稱為栅偏光元件。 In this embodiment, each of the polarizing elements 121 is a wire grid polarizing element. However, the material of the gate is not limited to a wire, and therefore, the following is simply referred to as a gate polarizing element.

第3圖表示實施形態的光定向用偏光光照射裝置所使用之偏光元件121的構造及作用的透視概略圖。如第3圖表示,栅偏光元件121具有在透明的板材123上形成有導電性的條紋狀柵124的構造。栅124的分離間隔(在第3圖以g表示)是成為偏光光的波長左右或較其短的間隔。 Fig. 3 is a perspective schematic view showing the structure and operation of the polarizing element 121 used in the polarized light irradiation device for light direction of the embodiment. As shown in FIG. 3, the gate polarizing element 121 has a structure in which a conductive stripe-shaped gate 124 is formed on a transparent plate member 123. The separation interval of the gate 124 (indicated by g in FIG. 3) is an interval which is about the wavelength of the polarized light or shorter.

直線偏光光之中,偏光軸朝著栅124的長方向的偏光光(稱s偏光光,以Ls表示),由於電場成分是沿著栅124的長方向而不能通過栅124。其一方面是沿著透明板材123表面的方向並使得偏光軸與栅124的長方向垂直的方向的偏光光(稱p偏光光,在第3圖以Lp表示)是電場與栅124的長方向成正交,所以可通過栅124。為此,從栅偏光元件121專一地射出p偏光光。因 此,預先設以沿著板材123表面的方向並與栅124的長方向垂直的方向(以下稱栅寬方向)為設定定位方向,在照射面R中僅只於偏光軸朝著設定定向方向的p偏光光的照射,即可實現光定向。 Among the linearly polarized lights, the polarized light having a polarization axis toward the longitudinal direction of the gate 124 (referred to as s-polarized light, denoted by Ls) cannot pass through the gate 124 because the electric field component is along the longitudinal direction of the gate 124. On the one hand, the polarized light (referred to as p-polarized light, which is denoted by Lp in FIG. 3) in the direction along the surface of the transparent plate member 123 and having the polarization axis perpendicular to the longitudinal direction of the gate 124 is the electric field and the long direction of the gate 124. It is orthogonal, so it can pass through the gate 124. For this reason, p-polarized light is exclusively emitted from the gate polarizing element 121. because Therefore, the direction perpendicular to the longitudinal direction of the gate 124 (hereinafter referred to as the gate width direction) is set in advance in the direction along the surface of the plate member 123 as the set positioning direction, and only the polarizing axis is directed toward the set orientation direction in the irradiation surface R. Light orientation can be achieved by irradiation of polarized light.

再者,雖說明為「僅只於」,但僅是P偏光光照射在照射面R為屬理想但實際上困難。根據偏光元件121的性能之一的消光比(p偏光光的射出量相對於s偏光光的射出量的比),p偏光光比s偏光光有較多的照射。 In addition, although it is described as "only", it is actually difficult to irradiate only the P-polarized light on the irradiation surface R. The p-polarized light has a larger amount of illumination than the s-polarized light, depending on the extinction ratio (the ratio of the amount of emission of the polarized light to the amount of the emitted light of the s-polarized light) which is one of the performances of the polarizing element 121.

因此,如第3圖表示,在照射面R配置工件W時,只要使工件W短邊的方向與p偏光光的偏光軸方向(栅寬方向)一致,即可將朝著設定定向方向的偏光軸照射於工件W,對設定定向方向正確地進行光定向處理。 Therefore, as shown in Fig. 3, when the workpiece W is placed on the irradiation surface R, the direction of the short side of the workpiece W is made to coincide with the polarization axis direction (gate width direction) of the p-polarized light, so that the polarization toward the set orientation direction can be obtained. The shaft is irradiated onto the workpiece W, and the light directing process is correctly performed in the set orientation direction.

如上述,偏光光照射裝置在將工件W配置於照射面R時,有必要使偏光光的偏光軸朝著設定定向方向的狀態。該實施形態中,由於設定定向方向為工件W的短邊方向,所以在短邊方向與所照射偏光光的偏光軸方向一致的狀態將工件W配置於照射面R。此時,也可以在工件W靜止於照射面R上照射偏光光,但是,實際形態的裝置在從光照射量的面內均一化等的觀點,採用工件W可通過照射面R,並在通過時進行偏光光照射的構成。 As described above, when the polarized light irradiation device arranges the workpiece W on the irradiation surface R, it is necessary to bring the polarization axis of the polarized light toward the set orientation direction. In this embodiment, since the orientation direction is set to the short-side direction of the workpiece W, the workpiece W is placed on the irradiation surface R in a state in which the short-side direction coincides with the polarization axis direction of the irradiated polarized light. In this case, the workpiece W may be irradiated with the polarized light while being stationary on the irradiation surface R. However, the apparatus of the actual form can pass the irradiation surface R and pass through the viewpoint of uniformizing the surface of the light irradiation amount. The composition is irradiated with polarized light.

具體說明時,實際形態的裝置具備移動工件W將工件W搬運至照射面R的位置為止,並通過照射面R的工件搬運系2。第1圖表示工件搬運系2的概略構 成。 Specifically, the device of the actual form includes a workpiece transport system 2 that passes the irradiation surface R until the workpiece W is transported to the position of the irradiation surface R by moving the workpiece W. Fig. 1 shows a schematic structure of the workpiece transport system 2 to make.

工件搬運系2具備載放工件W的載台21,及移動載台21的載台移動機構。 The workpiece transport system 2 includes a stage 21 on which the workpiece W is placed, and a stage moving mechanism that moves the stage 21.

載台21具備複數未圖示的支撐銷。各支撐銷是從載台21的上面稍微地突出。各支撐銷為管狀,進行真空吸附用的吸氣。載台21在各支撐銷上被一邊真空吸附並保持著。並且,本說明書中「載台」用語是使用於廣泛的意思,其不僅限於載放工件W的台狀物,只要是可保持工件W的構件即可稱為「載台」。 The stage 21 has a plurality of support pins (not shown). Each of the support pins protrudes slightly from the upper surface of the stage 21. Each of the support pins has a tubular shape and performs suction for vacuum suction. The stage 21 is vacuum-adsorbed and held by the support pins. In the present specification, the term "stage" is used in a broad sense. It is not limited to a table on which the workpiece W is placed, and a member that can hold the workpiece W is called a "stage".

相對於上述載台21,合併設有進行工件W的搭載與回收的未圖示的機器人。機器人是在所設定的搭載位置將一片工件W搭載於載台21,教導在設定偏光光照射後之工件W的回收位置進行回收。 A robot (not shown) that mounts and collects the workpiece W is provided in combination with the stage 21 described above. The robot mounts one piece of the workpiece W on the stage 21 at the set mounting position, and teaches collection of the position of the workpiece W after the polarized light is irradiated.

載台移動機構是使載台21直線移動的機構。該實施形態中,工件W的搭載位置與回收位置是成為相同位置(以下稱搭載回收位置),設定在照射面R的一方側。設定從搭載回收位置貫穿照射面R的水平搬運線。 The stage moving mechanism is a mechanism that linearly moves the stage 21. In this embodiment, the mounting position of the workpiece W and the recovery position are the same position (hereinafter referred to as the loading/recovering position), and are set on one side of the irradiation surface R. A horizontal conveyance line that passes through the irradiation surface R from the loading position is set.

工件搬運系2具備沿著搬運線而配設的搬運用驅動軸22及一對線性導件23。線性導件23在搬運用驅動軸22的兩側被以成平行直線性佳的延伸狀態配設。 The workpiece transport system 2 includes a transport drive shaft 22 and a pair of linear guides 23 disposed along the transport line. The linear guide 23 is disposed on both sides of the transport drive shaft 22 in an extended state in which parallel linearity is good.

載台21被安裝在設置於下側的底板210上。搬運用驅動軸22為滾珠螺桿,栓鎖在被固定於底板210下面的被驅動塊211。在底板210的下面兩端固定有嵌合在線性導件23的滑塊212。並在搬運用驅動軸22連結如 伺服馬達的搬運用驅動源24,搬運用驅動源24利用搬運用驅動軸22的旋轉使載台21與底板210一體成直線移動。 The stage 21 is mounted on a bottom plate 210 provided on the lower side. The transport drive shaft 22 is a ball screw that is latched to the driven block 211 that is fixed to the lower surface of the bottom plate 210. A slider 212 fitted to the linear guide 23 is fixed to both ends of the lower surface of the bottom plate 210. And connected to the transport drive shaft 22 as In the drive drive source 24 for the servo motor, the transport drive source 24 is linearly moved integrally with the bottom plate 210 by the rotation of the transport drive shaft 22.

藉工件搬運系2進行載台21的移動距離是成為載台21上的工件W到達照射面R,完全通過照射面R的距離。所謂完全通過即是工件W的後端通過照射面R。 The moving distance of the stage 21 by the workpiece transport system 2 is such that the workpiece W on the stage 21 reaches the irradiation surface R and passes completely through the irradiation surface R. The so-called complete passage means that the rear end of the workpiece W passes through the irradiation surface R.

該實施形態中,工件W在返回搭載回收位置時也受到偏光光的照射。亦即,如上述在完全通過照射面R的位置設定移動的前進到達位置,在載台21定位於前進到達位置之後,搬運用驅動源24將搬運用驅動軸22朝著相反方向旋轉,使載台21後退到搭載回收位置為止。該後退時,工件W再度通過照射面R,接受偏光光的照射。 In this embodiment, the workpiece W is also irradiated with polarized light when it is returned to the collection position. That is, as described above, the advancement arrival position of the movement is set at the position completely passing through the irradiation surface R, and after the stage 21 is positioned at the forward arrival position, the conveyance drive source 24 rotates the conveyance drive shaft 22 in the opposite direction. The table 21 is retracted to the loading position. At the time of this retreat, the workpiece W passes through the irradiation surface R again, and receives the irradiation of the polarized light.

再者,裝置具備控制裝置整體的主控制部9。如上述的載台21的移動為主控制部9對搬運用驅動源24送出適當控制訊號來進行。 Furthermore, the device includes a main control unit 9 that controls the entire device. The movement of the stage 21 as described above is performed by the main control unit 9 sending an appropriate control signal to the conveyance drive source 24.

藉以上的構成,在實施形態的裝置中,對工件W照射偏光光。此時,如上述,要求提高所照射偏光光之偏光軸的方向精度。 According to the above configuration, in the apparatus of the embodiment, the workpiece W is irradiated with the polarized light. At this time, as described above, it is required to improve the direction accuracy of the polarization axis of the irradiated polarized light.

該實施形態中,如上述設定定向方向為工件W的短邊方向,有以偏光軸朝著工件W短邊方向的狀態照射偏光光的必要,為此,決定裝置中成為基準的方向(以下稱裝置基準方向),設置光照射器1使偏光光的偏光軸相對於裝置基準方向朝著預定的角度。該預定的角度 雖可對應設定定向方向任意地設定獲得,但以下的說明中,以0度為一例。即,配置光照射器1使偏光軸的方向與裝置基準方向一致。並且,將工件W搭載於載台21使工件W的短邊方向朝向裝置基準方向,搬運至照射面R。 In the above-described embodiment, the orientation direction is set to be the short-side direction of the workpiece W, and it is necessary to irradiate the polarized light in a state in which the polarization axis is directed in the short-side direction of the workpiece W. Therefore, the direction in which the device is the reference is determined (hereinafter referred to as In the device reference direction, the light illuminator 1 is disposed such that the polarization axis of the polarized light is directed to a predetermined angle with respect to the device reference direction. The predetermined angle Although it can be arbitrarily set and set in accordance with the setting orientation direction, in the following description, 0 degree is taken as an example. That is, the light illuminator 1 is disposed such that the direction of the polarization axis coincides with the device reference direction. Then, the workpiece W is mounted on the stage 21, and the short-side direction of the workpiece W is conveyed to the irradiation surface R toward the apparatus reference direction.

裝置基準方向在裝置的設計時成為觀念上的方向,但是在裝置的組裝或調整、實際的控制時,以根據裝置中實際存在的構件的方向為基準。該實際存在的構件可選定直線性良好加工後的構件,該實施形態為線性導件23。亦即,線性導件23延伸的方向在該實施形態中為裝置基準方向。 The device reference direction becomes a conceptual direction at the time of designing the device, but based on the direction of the components actually present in the device during assembly or adjustment of the device and actual control. The actually existing member can be selected as a member having a good linearity, and this embodiment is a linear guide 23. That is, the direction in which the linear guide 23 extends is the device reference direction in this embodiment.

針對光照射器1,偏光元件121的姿勢尤其重要,該例中,精度良好地安裝使得上述柵寬方向與裝置基準方向一致。 The posture of the polarizing element 121 is particularly important for the light irradiator 1, and in this example, the mounting is performed with high precision so that the gate width direction coincides with the device reference direction.

另一方面,對於工件W雖如上述藉機器人搭載於載台21,但是即使教導機器人以短邊方向朝著裝置基準方向的姿勢搭載工件W,搭載時的工件W的姿勢並不能獲得相同的高精度,僅有稍微的不同。為此,本實施形態的裝置具備工件對準器3以使得搭載於載台21的工件W相對於裝置基準方向成為預定的姿勢。所為預定的姿勢是如上述為短邊方向與裝置基準方向一致的姿勢,工件對準器3進行對準使工件W的短邊方向朝著裝置基準方向。 On the other hand, the workpiece W is mounted on the stage 21 by the robot as described above. However, even if the robot is taught to mount the workpiece W in the posture in the short-side direction toward the device reference direction, the posture of the workpiece W at the time of mounting cannot be obtained at the same height. Accuracy is only slightly different. Therefore, the apparatus of the present embodiment includes the workpiece aligner 3 such that the workpiece W mounted on the stage 21 has a predetermined posture with respect to the apparatus reference direction. The predetermined posture is a posture in which the short side direction coincides with the device reference direction as described above, and the workpiece aligner 3 performs alignment so that the short side direction of the workpiece W faces the apparatus reference direction.

第4圖表示工件對準器3的概略構成的透視 圖,第5圖及第6圖是針對第4圖的工件對準器3進行工件W對準的原理所表示的圖。如第4圖表示,在工件W設有對準標記(以下稱工件標記)WM1、WM2。工件對準器3主要是由檢測工件標記WM1、WM2的工件標記感測器31;調整載台21的姿勢的載台姿勢調整機構32;及處理來自工件標記感測器31的輸出數據控制載台姿勢調整機構32的工件對準控制部33所構成。 Figure 4 is a perspective view showing the schematic configuration of the workpiece aligner 3. 5, and 6 are views showing the principle of alignment of the workpiece W with respect to the workpiece aligner 3 of Fig. 4. As shown in Fig. 4, alignment marks (hereinafter referred to as workpiece marks) WM1 and WM2 are provided on the workpiece W. The workpiece aligner 3 is mainly a workpiece mark sensor 31 that detects the workpiece marks WM1, WM2; a stage posture adjusting mechanism 32 that adjusts the posture of the stage 21; and processes the output data control load from the workpiece mark sensor 31. The workpiece alignment control unit 33 of the stage posture adjustment mechanism 32 is configured.

工件標記WM1、WM2是形成在不影響工件W上的製造過程之處,例如沿著工件W的一方短邊的邊緣設置。該實施形態中,各工件標記WM1、WM2是形成十字形的圖案。 The workpiece marks WM1, WM2 are formed at a manufacturing process that does not affect the workpiece W, for example, along the edge of one short side of the workpiece W. In this embodiment, each of the workpiece marks WM1 and WM2 is a cross-shaped pattern.

工件標記感測器31是如CCD的圖像感測器,搬運工件W時進行工件標記WM1、WM2攝影。如第1圖表示,工件標記感測器31被設置在臨近搭載回收位置與照射面R之間的搬運線上的位置。安裝有工件標記感測器31,在工件W搭載於載台21搬運時,使工件標記WM1、WM2通過工件標記感測器31的正下方位置。 The workpiece mark sensor 31 is an image sensor such as a CCD, and performs photographing of the workpiece marks WM1, WM2 when the workpiece W is conveyed. As shown in Fig. 1, the workpiece mark sensor 31 is disposed at a position adjacent to the conveyance line between the mounting recovery position and the irradiation surface R. The workpiece mark sensor 31 is attached, and when the workpiece W is mounted on the stage 21, the workpiece marks WM1 and WM2 are passed through the position directly below the workpiece mark sensor 31.

藉工件搬運系2搬運搭載於載台21上的工件W時,工件標記感測器31進行工件標記WM1、WM2的攝影,說明的方便上,稱搬運方向的前側的工件標記WM1為第一工件標記,後側的工件標記WM2為第二工件標記。 When the workpiece W mounted on the stage 21 is transported by the workpiece transport system 2, the workpiece mark sensor 31 photographs the workpiece marks WM1 and WM2. For convenience of explanation, the workpiece mark WM1 on the front side in the conveyance direction is referred to as the first workpiece. Marked, the workpiece mark WM2 on the back side is the second workpiece mark.

沿著線性導件23搬運工件W時,首先以工件標記感測器31攝影第一工件標記WM1,接著以工件標記感測器 31攝影第二工件標記WM2。第5圖(1)表示第一工件標記WM1的圖像,(2)表示第二工件標記WM2的圖像。 When the workpiece W is transported along the linear guide 23, the first workpiece mark WM1 is first photographed by the workpiece mark sensor 31, followed by the workpiece mark sensor 31 photographing the second workpiece mark WM2. Fig. 5 (1) shows an image of the first workpiece mark WM1, and (2) shows an image of the second workpiece mark WM2.

在工件標記感測器31,如第5圖表示賦予作為攝影面基準方向的XY座標。該實施形態中,攝影面的Y軸與裝置基準方向一致。亦即,姿勢良好地安裝工件標記感測器31使攝影面的Y軸與裝置基準方向一致。 In the workpiece mark sensor 31, as shown in Fig. 5, an XY coordinate given as a reference direction of the photographing surface is shown. In this embodiment, the Y-axis of the imaging surface coincides with the device reference direction. That is, the workpiece mark sensor 31 is mounted in a good posture so that the Y-axis of the photographing surface coincides with the device reference direction.

將工件標記感測器31的攝影數據送到工件對準控制部33。工件對準控制部33包括進行圖像處理的運算處理部,取得第5圖(1)表示的靜止圖的數據作為攝影數據。並且,僅以兩個工件標記WM1、WM2中心間的距離量L1來移動工件載台21取得第5圖(2)表示的靜止圖的數據。 The photographic data of the workpiece mark sensor 31 is sent to the workpiece alignment control unit 33. The workpiece alignment control unit 33 includes an arithmetic processing unit that performs image processing, and acquires data of the still image shown in Fig. 5 (1) as the image data. Further, only two workpiece marks WM1, WM2 amount between the center of the distance L 1 by moving the workpiece stage 21 acquires still image data of FIG. 5 (2).

運算處理部為處理各靜止圖的數據,特定各工件標記WM1、WM2的像中心的座標。並且,算出兩個工件標記WM1、WM2的像中心的分開距離。第5圖(1)表示的第一工件標記WM1的數據中以第一工件標記WM1中心的座標為C1,第5圖(2)表示的第二工件標記WM2的數據中,以第一工件標記WM1中心的座標為C1’時,如第6圖表示,算出C1’與C2的分開距離L2The arithmetic processing unit specifies the coordinates of the image center of each of the workpiece marks WM1 and WM2 in order to process the data of each still picture. Then, the separation distance between the image centers of the two workpiece marks WM1 and WM2 is calculated. In the data of the first workpiece mark WM1 shown in Fig. 5 (1), the coordinate of the center of the first workpiece mark WM1 is C 1 , and the data of the second workpiece mark WM2 represented by the fifth figure (2) is the first workpiece. WM1 marker coordinate of the center 1 ', as represented in FIG. 6 calculates the C 1' and C 2 to C separation distance L 2.

兩個工件標記WM1、WM2的中心C1、C2間的距離L1為設計值且為已知。因此,工件W相對於Y軸的偏位角θ1是以θ1=tan-1(L2/L1)求得。運算處理部是構成進行如上述的運算來算出工件W的偏位角θ1。連結兩個工件標記WM1、WM2中心的方向是與工件W的短邊方 向一致,工件標記感測器31的Y軸是與裝置基準方向一致,因此所算出的偏位角θ1是成為工件W的短邊方向相對於裝置基準方向的偏位角。 Two workpiece marks WM1, WM2 from the center C 1, C 2 between the design value and L 1 is known. Therefore, the deflection angle θ 1 of the workpiece W with respect to the Y-axis is obtained by θ 1 =tan -1 (L 2 /L 1 ). The arithmetic processing unit is configured to perform the above-described calculation to calculate the deflection angle θ 1 of the workpiece W. The direction connecting the centers of the two workpiece marks WM1 and WM2 is coincident with the short side direction of the workpiece W, and the Y axis of the workpiece mark sensor 31 is aligned with the device reference direction, so that the calculated deviation angle θ 1 becomes the workpiece W The deviation angle of the short side direction with respect to the device reference direction.

工件對準控制部33是生成所算出的偏位角θ1為零的控制訊號,送訊至載台姿勢調整機構32。載台姿勢調整機構32為至少可在垂直的轉軸周圍使載台21旋轉的機構。載台姿勢調整機構32根據來自工件對準控制部33的訊號,使載台21旋轉成為偏位角θ1為零(即使得工件W的短邊方向與裝置基準方向一致)。 The workpiece alignment control unit 33 generates a control signal in which the calculated deviation angle θ 1 is zero, and sends it to the stage posture adjustment mechanism 32. The stage posture adjusting mechanism 32 is a mechanism that can rotate the stage 21 at least around the vertical rotation axis. The stage posture adjusting mechanism 32 rotates the stage 21 by the signal from the workpiece alignment control unit 33 so that the offset angle θ 1 is zero (that is, the short side direction of the workpiece W coincides with the device reference direction).

工件對準控制部33是例如PLC(Programable Logic Controller)的裝置,定義電路以進行上述的圖像處理與控制訊號的生成。可使用市售的XYθ機構作為載台姿勢調整機構32。除θ方向的姿勢控制之外,根據需要朝XY方向移動載台21,將工件W定位在XY方向的最適當位置。 The workpiece alignment control unit 33 is, for example, a PLC (Programable Logic Controller) device that defines a circuit to perform the above-described image processing and control signal generation. A commercially available XYθ mechanism can be used as the stage posture adjusting mechanism 32. In addition to the posture control in the θ direction, the stage 21 is moved in the XY direction as needed, and the workpiece W is positioned at the most appropriate position in the XY direction.

如上述進行工件W的對準時,在真空吸附的狀態下搬運工件W,工件W在照射面R中成為朝裝置基準方向的姿勢。因此,只要偏光軸精度良好朝著裝置基準方向的偏光光照射於照射面R,工件W即可方向精度良好地進行光定向處理。 When the alignment of the workpiece W is performed as described above, the workpiece W is conveyed in a vacuum suction state, and the workpiece W is in a posture toward the device reference direction in the irradiation surface R. Therefore, as long as the polarized light with good accuracy of the polarization axis is irradiated onto the irradiation surface R in the device reference direction, the workpiece W can be subjected to light directing treatment with high precision.

在此的問題是以往的裝置,不具有確認在照射面R中偏光光的偏光軸確實精度良好地朝著設定定向方向的手段。如上述,照射面R的偏光光的偏光軸的方向是以偏光元件121的柵寬方向來決定。因此,在裝置的組裝 時,配置光照射器1使得以框架所保持的各偏光元件121的柵寬方向與裝置基準方向精度良好地一致。但是,裝置的組裝之後,實際上習知的裝置不具備驗證照射於照射面R之偏光光的偏光軸是否朝向設定定向方向的手段。並且,以所要求的高測量精度來測量偏光軸的技術都是先前文獻所未揭示。 The problem here is that the conventional device does not have a means for confirming that the polarization axis of the polarized light in the irradiation surface R is accurately oriented toward the set orientation direction. As described above, the direction of the polarization axis of the polarized light of the irradiation surface R is determined by the gate width direction of the polarizing element 121. Therefore, the assembly of the device At this time, the light irradiator 1 is disposed so that the grating width direction of each of the polarizing elements 121 held by the frame is accurately matched with the device reference direction. However, after the assembly of the device, the conventional device does not have a means for verifying whether or not the polarization axis of the polarized light irradiated on the irradiation surface R is oriented in the set orientation direction. Moreover, the technique of measuring the polarization axis with the required high measurement accuracy is not disclosed in the prior literature.

該實施形態的裝置考慮上述的點,如第1圖表示,具備檢測從光照射器1所照射之偏光光的偏光軸方向的偏光方向檢測系4,偏光方向檢測系4包括偏光方向檢測器40。針對偏光方向檢測器40的構成,使用第1圖及第7圖說明。第7圖為第1圖表示之偏光方向檢測器40的前面剖面概略圖。 In the device of this embodiment, as shown in FIG. 1, the polarization direction detecting system 4 for detecting the polarization axis direction of the polarized light irradiated from the light irradiator 1 is provided, and the polarization direction detecting system 4 includes the polarization direction detector 40. . The configuration of the polarization direction detector 40 will be described with reference to FIGS. 1 and 7. Fig. 7 is a schematic front cross-sectional view showing the polarization direction detector 40 shown in Fig. 1.

偏光方向檢測器40是藉測光件旋轉法來檢測偏光方向。亦即,偏光方向檢測器40具備:接受來自光照射器1所射出的光的檢測用受光器41;配置在檢測用受光器41的射入側的測光件42;及測光件42在與照射面R垂直的轉軸周圍旋轉的旋轉機構43。 The polarization direction detector 40 detects the polarization direction by the photometric rotation method. In other words, the polarization direction detector 40 includes a detection light receiver 41 that receives light emitted from the light irradiator 1, a light meter 42 that is disposed on the incident side of the detection light receiver 41, and a light meter 42 that is irradiated A rotating mechanism 43 that rotates around the vertical axis of the surface R.

檢測用受光器41只要對偏光光的波長具有感度即可尤其不加以限制,例如使用矽光電二極體。如第7圖表示,檢測用受光器41是藉支柱411保持。 The detecting light receiver 41 is not particularly limited as long as it has sensitivity to the wavelength of the polarized light, and for example, a germanium photodiode is used. As shown in Fig. 7, the detecting light receiver 41 is held by the support 411.

作為測光件42,該實施形態是使用偏光板,與光照射器1具備的偏光元件單元12同樣地,使用柵偏光元件作為測光件42。測光件42被以框板421所保持。框板421是位在測光件42的上側,以下側保持著測光件 42。在框體421形成有光入射於測光件42用的開口(以下稱光射入口)422。 In the embodiment, the polarizing plate is used as the photometric material, and a grating polarizing element is used as the photometric material 42 similarly to the polarizing element unit 12 included in the light irradiator 1. The photometric member 42 is held by the frame plate 421. The frame plate 421 is located on the upper side of the photometric member 42, and the photometric member is held on the lower side. 42. An opening (hereinafter referred to as a light entrance) 422 through which the light is incident on the photometric member 42 is formed in the casing 421.

旋轉機構43是由:將框板421固定於上端的圓筒形的保持體431;固定於保持體431下端的旋轉體432;固定在旋轉體432周圍面的被驅動齒輪433;咬合於被驅動齒輪433的驅動齒輪434;及將驅動齒輪434連結於輸出軸的旋轉驅動源435所構成。旋轉驅動源435一旦動作時,驅動齒輪434的旋轉透過被驅動齒輪433及旋轉體432傳達至保持體431,使得測光件42與框板421一起旋轉。旋轉機構43的轉軸是與保持體431或旋轉體432同軸的垂直方向。 The rotation mechanism 43 is a cylindrical holding body 431 that fixes the frame plate 421 to the upper end, a rotating body 432 fixed to the lower end of the holding body 431, and a driven gear 433 fixed to the surface around the rotating body 432; A drive gear 434 of the gear 433 and a rotary drive source 435 that connects the drive gear 434 to the output shaft. When the rotational driving source 435 is operated, the rotation of the driving gear 434 is transmitted to the holding body 431 through the driven gear 433 and the rotating body 432, so that the photometric member 42 rotates together with the frame plate 421. The rotation shaft of the rotation mechanism 43 is a vertical direction coaxial with the holding body 431 or the rotating body 432.

如第7圖表示,偏光方向檢測系4具有檢測系控制部45。檢測系控制部45包括運算處理部,檢測用受光器41的輸出被送到檢測系控制部45進行運算處理。 As shown in FIG. 7, the polarization direction detecting system 4 has a detection system control unit 45. The detection system control unit 45 includes an arithmetic processing unit, and the output of the detection light receiver 41 is sent to the detection system control unit 45 for arithmetic processing.

旋轉驅動源435是藉檢測系控制部45控制。亦即,檢測系控制部45除了使旋轉驅動源435動作設測光件42為旋轉原點(旋轉角度0°)的姿勢之外,並接受偏光光而從其姿勢使測光件42旋轉180度。檢測用受光器41在此旋轉時測量並輸出受光後的偏光光的強度。如測光件42的柵的方向與偏光元件212的柵的方向平行時,射入到受光器41的偏光光的強度成為最大,而測光件42的柵的方向與偏光元件212的柵的方向正交時,則射入到受光器41的偏光光的強度成為最小。運算處理部依序比較所輸出偏光光的強度,以偏光光的強度成最大時的角度為檢測 結果。對於旋轉角度也可以脈衝馬達作為旋轉驅動源435從其脈衝數算出。也可以在旋轉驅動源435設置旋轉編碼器進行檢測。 The rotational drive source 435 is controlled by the detection system control unit 45. In other words, the detection system control unit 45 operates the rotation driving source 435 to operate the position where the photometric member 42 is rotated (rotation angle 0°), and receives the polarized light to rotate the photometric member 42 by 180 degrees from the posture. The detection light receiver 41 measures and outputs the intensity of the received polarized light when it is rotated. When the direction of the gate of the photometric member 42 is parallel to the direction of the gate of the polarizing element 212, the intensity of the polarized light incident on the photodetector 41 becomes maximum, and the direction of the gate of the photometric member 42 and the direction of the gate of the polarizing element 212 are positive. At the time of intersection, the intensity of the polarized light incident on the light receiver 41 is minimized. The arithmetic processing unit sequentially compares the intensity of the output polarized light, and detects the angle at which the intensity of the polarized light is maximized. result. For the rotation angle, the pulse motor can be calculated as the rotation drive source 435 from the number of pulses. It is also possible to set a rotary encoder at the rotary drive source 435 for detection.

實施形態的偏光光照射裝置雖是藉著如上述的偏光方向檢測器40檢測照射面R的偏光光的偏光軸的方向,但單純僅配置偏光方向檢測器40檢測偏光軸的方向,則不能實現足夠高精度方向的光定向處理。這是由於偏光方向檢測器40本身的配置精度造成的問題。以下,使用第8圖說明該點。第8圖是針對測光件42的對準必要理由所表示的平面概略圖。 In the polarized light irradiation device of the embodiment, the direction of the polarization axis of the polarized light of the irradiation surface R is detected by the polarization direction detector 40 as described above. However, the direction in which the polarization direction detector 40 detects the polarization axis is simply not realized. Light directional processing with sufficient high precision direction. This is a problem due to the arrangement accuracy of the polarization direction detector 40 itself. Hereinafter, this point will be described using FIG. Fig. 8 is a schematic plan view showing the reason why the alignment of the photometric member 42 is necessary.

藉測光件旋轉法進行偏光方向的檢測是如第8圖表示,所檢測的偏光軸的方向是以旋轉原點為基準的相對角度。第8圖中旋轉原點為θ=0°(X軸)。例如,使用旋轉原點的檢測可能的旋轉編碼器,以測光件400的姿勢為旋轉原點後進行偏光角度的測量。但是,此時必須將具有旋轉編碼器的旋轉原點相對於裝置基準方向對準成已知的角度。只要旋轉原點與裝置基準方向一致(角度0°),所檢測出的偏光軸方向即成為相對於裝置基準方向的角度,可在容許精度的範圍內判斷是否與設定定向方向一致。 The detection of the polarization direction by the photometric member rotation method is as shown in Fig. 8, and the direction of the detected polarization axis is the relative angle based on the rotation origin. The rotation origin in Fig. 8 is θ = 0° (X-axis). For example, a possible rotary encoder that detects the rotation origin is used, and the polarization angle is measured after the posture of the photometric member 400 is the rotation origin. However, at this time, the origin of rotation with the rotary encoder must be aligned to a known angle with respect to the device reference direction. When the rotation origin coincides with the device reference direction (angle 0°), the detected polarization axis direction becomes an angle with respect to the device reference direction, and it is possible to determine whether or not it matches the set orientation direction within the allowable accuracy range.

但是,旋轉原點不與裝置基準方向一致,且不知旋轉原點相對於裝置基準方向是成幾度角度的場合,即不能檢測出作為相對於裝置基準方向的角度之偏光軸的方向。例如,即使從旋轉原點開始旋轉到θm成為旋轉角度時受光 器的輸出成為最大,如不能得知旋轉原點相對於裝置基準方向的角度時,則不能求得作為相對於裝置基準方向的角度之偏光方向。因此不能判斷是否在容許精度的範圍內與設定定向方向一致。 However, the rotation origin does not coincide with the device reference direction, and it is not known that the rotation origin is at an angle of several degrees with respect to the device reference direction, that is, the direction of the polarization axis as the angle with respect to the device reference direction cannot be detected. For example, even when the rotation is started from the origin of rotation until θ m becomes the rotation angle, the output of the photoreceptor becomes maximum. If the angle of the rotation origin relative to the reference direction of the device cannot be known, it cannot be obtained as the reference direction with respect to the device. The direction of polarization of the angle. Therefore, it cannot be judged whether or not it coincides with the set orientation direction within the range of the allowable accuracy.

當然,在裝置的組裝時,在偏光方向檢測器40中相對於成為基準的構件已預定的姿勢組入旋轉編碼器,將成為其基準的構件相對於裝置基準方向成預定角度地安裝偏光方向檢測器40時,即可精度良好地檢測偏光軸的方向。但是,檢測偏光軸的方向為實際之光定向用照射面R的偏光光之偏光軸的方向,一旦可確認進行偏光軸方向的檢測而朝著正確的方向後,即必須將偏光方向檢測器40從照射面R卸除。亦即,在裝置對生產線的設置時的調整,或生產的空閒的偏光光之偏光軸的監視等的狀況中,則必須考慮有進行偏光方向檢測器40的配置(設定)與除去的必要。 Of course, at the time of assembly of the device, the rotary encoder is incorporated in the polarization direction detector 40 with respect to the reference member, and the member to be the reference is mounted at a predetermined angle with respect to the device reference direction. At the time of the device 40, the direction of the polarization axis can be accurately detected. However, the direction in which the polarization axis is detected is the direction of the polarization axis of the polarization light of the actual light-oriented irradiation surface R. Once the detection of the polarization axis direction is confirmed and the direction is correct, the polarization direction detector 40 must be used. Removed from the irradiation surface R. In other words, in the case of adjustment of the installation of the apparatus to the production line or monitoring of the polarization axis of the produced idle polarized light, it is necessary to consider the arrangement (setting) and removal of the polarization direction detector 40.

該實施形態的裝置有鑒於該等的點,具備進行偏光方向檢測器40朝著照射面R的配置或從照射面R去除的檢測器移送系,及藉檢測器移送系進行偏光方向檢測器40對照射面R的配置時進行測光件42對準的測光件對準器6。 In view of these points, the device of the embodiment includes a detector transfer system that arranges the polarization direction detector 40 toward the irradiation surface R or removes from the irradiation surface R, and performs a polarization direction detector 40 by the detector transfer system. The photometric aligner 6 that aligns the photometric member 42 is disposed when the irradiation surface R is disposed.

檢測器移送系具備移送機構5與未圖示的橫向移動機構。移送機構5是在移送照射面R上的位置與退避位置之間移送偏光方向檢測器40。橫向移動機構為了在照射面R上變更檢測位置,使偏光方向檢測器40在與移送系進行 的移送方向垂直的方向移動。 The detector transfer system includes a transfer mechanism 5 and a lateral movement mechanism (not shown). The transfer mechanism 5 transfers the polarization direction detector 40 between the position on the transfer irradiation surface R and the retracted position. The lateral movement mechanism causes the polarization direction detector 40 to be in the transfer system in order to change the detection position on the irradiation surface R. The transfer direction moves in the vertical direction.

移送機構5為了構造的簡化,部份兼用工件搬運系2的元件。具體說明時,在此實施狀態中,偏光方向檢測器40的退避位置被設置在夾持照射面R與工件W的搭載回收位置的相反側。退避位置是位在與照射面R大致相同的水平面上。 The transfer mechanism 5 partially uses the components of the workpiece transport system 2 for the sake of simplification of the structure. Specifically, in this embodiment, the retracted position of the polarization direction detector 40 is provided on the side opposite to the mounting and collecting position where the illuminating surface R and the workpiece W are sandwiched. The retracted position is at a level substantially the same as the irradiation surface R.

如第1圖表示,工件搬運系2的一對線性導件23是貫穿照射面R而延伸到相反側的退避位置為止。並設置從退避位置貫穿照射面R而延伸的移送用驅動軸51。移送用驅動軸51為滾珠螺桿,與兩側的線性導件23成平行延伸。在移送用驅動軸51連結有移送用驅動源52。 As shown in Fig. 1, the pair of linear guides 23 of the workpiece transport system 2 extend beyond the irradiation surface R to the retracted position on the opposite side. Further, a transfer drive shaft 51 that extends from the retracted position through the irradiation surface R is provided. The transfer drive shaft 51 is a ball screw and extends in parallel with the linear guides 23 on both sides. A transfer drive source 52 is coupled to the transfer drive shaft 51.

偏光方向檢測器40被裝設在水平姿勢的架台(以下稱檢測器架台)401上。如第1圖表示,跨一對線性導件23及移送用驅動軸51橫架著橫向移送軌53。橫向移送軌53是朝著與線性導件23及移送用驅動軸51垂直的水平方向延伸。檢測器架台401是跨乘在橫向移動軌53之上,未圖示的橫向移動機構是使檢測器架台401在橫向移動軌53上直線移動的機構。未圖示的橫向移動機構,例如可藉著將自走式的機構設置在檢測器架台401的下面,或與橫向移動軌53平行地設置滾珠螺桿來實現。 The polarization direction detector 40 is mounted on a gantry (hereinafter referred to as a detector gantry) 401 in a horizontal posture. As shown in Fig. 1, the lateral transfer rails 53 are placed across the pair of linear guides 23 and the transfer drive shaft 51. The lateral transfer rail 53 extends in a horizontal direction perpendicular to the linear guide 23 and the transfer drive shaft 51. The detector stand 401 is spanned over the lateral moving rail 53, and a lateral moving mechanism (not shown) is a mechanism that linearly moves the detector stand 401 on the lateral moving rail 53. The lateral movement mechanism (not shown) can be realized, for example, by providing a self-propelled mechanism on the lower surface of the detector mount 401 or by providing a ball screw in parallel with the lateral movement rail 53.

並在橫向移動軌53下面的兩端分別設有滑塊54而在線性導件23上滑動。在橫向移動軌53的下面中央設置被驅動塊55,栓鎖滾珠螺桿的移送用驅動軸51。因此,藉移送用驅動源52使移送用驅動軸51旋轉時,被 線性導件23所引導而使橫向移動軌53直線移動,使得橫向移動軌53上的檢測器架台401或在其上的偏光方向檢測器40也沿著線性導件23直線移動。 Sliders 54 are respectively provided on both ends of the lateral movement rail 53 to slide on the linear guide 23. A driven block 55 is provided at the center of the lower surface of the lateral movement rail 53, and the transfer drive shaft 51 of the ball screw is latched. Therefore, when the transfer drive shaft 51 is rotated by the transfer drive source 52, The linear guide 23 guides the linear movement rail 53 to move linearly such that the detector mount 401 on the lateral movement rail 53 or the polarization direction detector 40 thereon also linearly moves along the linear guide 23.

第1圖表示的主控制部9將控制訊號傳送到移送用驅動源52,進行控制使得位於退避位置的偏光方向檢測器40移送至照射面R上的位置為止,或回到退避位置為止的控制。 The main control unit 9 shown in Fig. 1 transmits a control signal to the transfer drive source 52, and controls the transfer of the polarization direction detector 40 at the retracted position to the position on the irradiation surface R or the control to return to the retracted position. .

此外,從第1圖可得知,橫向移動軌53是與光源11的長方向平行,未圖示的橫向移動機構是在光源11的長方向選擇以哪個位置作為檢測位置的機構。 Further, as is clear from Fig. 1, the lateral movement rail 53 is parallel to the longitudinal direction of the light source 11, and a lateral movement mechanism (not shown) is a mechanism for selecting which position is used as the detection position in the longitudinal direction of the light source 11.

第9圖表示測光件對準器6的概略構成的透視圖。在偏光方向檢測器40設有檢測測光件42的姿勢用的對準標記(以下稱測光件標記)461、462。測光件對準器6是由:藉著控制檢測各測光件461、462的感測器(以下稱測光件感測器)61,及根據從測光件感測器61的輸出數據:控制測光件42的姿勢的控制部所構成。控制部為上述的檢測系控制部45。並且,第9圖中,為容易理解而分開描繪測光件42與框板421,但實際是如第7圖表示,兩者為接近配置。 Fig. 9 is a perspective view showing a schematic configuration of the photometric aligner 6. The polarization direction detector 40 is provided with alignment marks (hereinafter referred to as photometric members) 461 and 462 for detecting the posture of the photometric member 42. The photometric aligner 6 is composed of: a sensor (hereinafter referred to as a photometric sensor) 61 that detects each of the photometric members 461, 462, and an output data from the photometric member sensor 61: a control photometric member The control unit of the posture of 42 is constituted. The control unit is the above-described detection system control unit 45. Further, in Fig. 9, the photometric member 42 and the frame plate 421 are separately depicted for easy understanding, but actually, as shown in Fig. 7, both are in close proximity.

該實施形態中,測光件標記461、462是設置在測光件42本體上。更具體說明時,作為測光件42是使用與偏光元件單元12相同的柵偏光元件。測光件42是如第9圖中放大表示在透明的板材表面形成微小的柵420的構造。測光件42具有形成柵420的區域的柵部422,及 未形成柵的區域的邊緣部423,柵部422進行偏光作用。另外,如第9圖表示,測光件42為整體成方形板狀的構件,藉框板421保持著。 In this embodiment, the photometric member marks 461 and 462 are provided on the main body of the photometric member 42. More specifically, as the photometric member 42, the same gate polarizing element as that of the polarizing element unit 12 is used. The photometric member 42 is a structure in which the micro-gate 420 is formed on the surface of the transparent plate material as enlarged in FIG. The photometric member 42 has a gate portion 422 that forms a region of the gate 420, and The edge portion 423 of the region where the gate is not formed, the gate portion 422 performs a polarizing action. Further, as shown in Fig. 9, the photometric member 42 is a member having a square plate shape as a whole, and is held by the frame plate 421.

如第9圖表示,測光件標記461、462被形成在邊緣部422。該實施形態中,測光件標記461、462設有兩個。各測光件標記461、462雖是以種種類型形成,但該實施形態是形成相同大小正方型的類型。再者,框板421具有各測光件標記461、462觀察用的開口424。 As shown in FIG. 9, the photometric member marks 461, 462 are formed at the edge portion 422. In this embodiment, two photometric members 461 and 462 are provided. Although each of the photometric member marks 461 and 462 is formed in various types, this embodiment is of a type in which a square of the same size is formed. Further, the frame plate 421 has openings 424 for observing the respective photometric members 461 and 462.

本實施形態是檢測各測光件標記461、462的中心D1、D2來進行對準,可精度良好地形成連結各測光件標記461、462的中心D1、D2的直線DL使得與柵部422的柵寬方向一致。 In the present embodiment, the centers D 1 and D 2 of the respective photometric member marks 461 and 462 are detected and aligned, and the straight line DL connecting the centers D 1 and D 2 of the respective photometric member marks 461 and 462 can be accurately formed so as to be aligned with the gate. The gate width of the portion 422 is uniform.

又,測光件42雖是如上述藉著旋轉驅動源435旋轉,但是兩個測光件標記461、462是相對於旋轉中心C形成在均等的位置。亦即,從旋轉中心C朝著連結各測光件標記461、462的中心D1、D2之直線DL的垂線與直線DL交叉的點是位在兩個測光件標記461、462之間的中點。 Further, although the photometric member 42 is rotated by the rotation drive source 435 as described above, the two photometric member marks 461 and 462 are formed at equal positions with respect to the rotation center C. That is, the point where the perpendicular line from the rotation center C toward the straight line DL connecting the centers D 1 and D 2 of the respective photometric marks 461, 462 intersects the straight line DL is located between the two photometric members 461, 462. point.

另一方面,具有檢測系控制部45的運算處理部為處理測光件感測器61的輸出數據並算出測光件42的偏位量,進行生成控制數據的圖像處理。第10圖是針對第9圖的測光件對準器6進行測光件42對準的原理表示的圖。其中,第10圖是表示以測光件感測器61攝影之測光件標記461、462的像的一例,針對從測光件標記 461、462的像的數據進行測光件42對準的原理來表示。 On the other hand, the arithmetic processing unit having the detection system control unit 45 processes the output data of the photometric member sensor 61, calculates the amount of deviation of the photometric member 42, and performs image processing for generating control data. Fig. 10 is a view showing the principle of aligning the photometric member 42 with respect to the photometric aligner 6 of Fig. 9. Here, FIG. 10 is an example of an image showing the photometric member marks 461 and 462 photographed by the photometric member sensor 61, and is marked for the photometric member. The data of the images of 461 and 462 are represented by the principle of alignment of the photometric member 42.

該實施形態中,測光件對準器6是利用移動機構5移送偏光方向檢測器40時進行測光件42的對準。具體說明時,藉移送機構5移送偏光方向檢測器40時,測光件標記461、462通過測光件感測器61的正下方。此時,藉測光件感測器61依序攝影各測光件標記461、462。 In this embodiment, the photometric aligner 6 performs alignment of the photometric member 42 when the polarization direction detector 40 is transferred by the moving mechanism 5. Specifically, when the polarization direction detector 40 is transferred by the transfer mechanism 5, the photometric member marks 461 and 462 pass directly under the photometric sensor 61. At this time, each of the photometric member marks 461, 462 is sequentially photographed by the photometric sensor 61.

為方便說明起見,稱接近照射面R一側的測光件標記461為第一測光件標記,稱接近退避位置一側的測光件標記462為第二測光件標記。第10圖(1)表示第一測光件標記461、462的圖像,第10圖(2)表示第二測光件標記461、462的圖像。 For convenience of explanation, the photometric member mark 461 on the side close to the irradiation surface R is referred to as a first photometric member mark, and the photometric member mark 462 on the side close to the retracted position is referred to as a second photometric member mark. Fig. 10 (1) shows images of the first photometric marks 461, 462, and Fig. 10 (2) shows images of the second photometric marks 461, 462.

測光件感測器61是與工件標記感測器31同樣為如CCD的圖像感測器,檢測系控制部45的運算處理部是從測光件感測器61取得如第10圖表示的靜止圖像的數據。 The photometric sensor 61 is an image sensor such as a CCD similar to the workpiece mark sensor 31, and the arithmetic processing unit of the detection system control unit 45 obtains the still image as shown in FIG. 10 from the photometric sensor 61. Image data.

運算處理部是處理各圖像,與第5圖的場合同樣地特定測光件標記461、462的中心位置座標D1(D1’)、D2,算出D1’與D2的分開距離M2。並且,藉已知的兩個測光件標記461、462的中心D1、D2間的距離M1,以θ2=tan-1(M2/M1)求得測光件42相對於Y軸的偏位角θ2The arithmetic processing unit processes the respective images, and specifies the center position coordinates D 1 (D 1 ') and D 2 of the photometric member marks 461 and 462 in the same manner as in the fifth drawing, and calculates the separation distance M between D 1 ' and D 2 . 2 . And, by means of the distance M 1 between the centers D 1 and D 2 of the two known photometric members 461, 462, the photometric member 42 is obtained relative to the Y axis by θ 2 =tan -1 (M 2 /M 1 ) The deviation angle θ 2 .

測光件感測器61姿勢精度良好地配置使第10圖表示的座標系的Y軸與裝置基準方向一致。並且,檢測線DL的方向由於是如上述的柵寬方向,因此所算出檢測 線DL(第10圖也是線量M1)的傾角θ2是測光件42相對於裝置基準方向的柵寬方向的角度,為測光件42的偏位量(以下稱測光件偏位角θ2)。 The photodetector sensor 61 is placed with good posture, so that the Y-axis of the coordinate system shown in Fig. 10 coincides with the device reference direction. Further, since the direction of the detection line DL is as described above in the gate width direction, the inclination angle θ 2 of the calculated detection line DL (the tenth diagram is also the line amount M 1 ) is the angle of the photometric member 42 with respect to the gate width direction of the device reference direction. It is the amount of deviation of the photometric member 42 (hereinafter referred to as the photometric member offset angle θ 2 ).

運算處理部是構成在算出測光件偏位角θ2之後,生成使測光件偏位角θ2為0(僅-θ2變更姿勢)的控制訊號。 Arithmetic processing unit is configured metering member after calculating attitude angle θ 2, the metering device generates a deviation angle θ 2 is 0 (-θ 2 only changing the posture) of the control signal.

將測光件42僅旋轉-θ2使得測光件偏位角θ2成為0時,連結兩個測光件標記461、462的中心D1、D2的直線DL是與Y軸一致,成為與裝置基準方向一致。亦即,測光件42的柵的長方向形成與裝置基準方向一致的狀態,將測光件42對準。此時,運算處理部生成作為控制數據的-θ2,檢測系控制部45為構成將僅旋轉-θ2的控制訊號傳送到旋轉驅動源435。又,直線DL的傾斜為負的場合,只要旋轉+θ2基準線即可與Y軸一致,所以圖像處理部輸出控制數據的+θ2,控制訊號送訊部是構成將使得測光件42僅旋轉+θ2的控制訊號送至旋轉驅動源435。 When the photometric member 42 is rotated only by -θ 2 so that the photometric member offset angle θ 2 becomes 0, the straight line DL connecting the centers D 1 and D 2 of the two photometric member marks 461 and 462 is aligned with the Y axis, and becomes the device reference. The direction is the same. That is, the long direction of the grating of the photometric member 42 is in a state of being aligned with the device reference direction, and the photometric member 42 is aligned. At this time, the arithmetic processing unit generates -θ 2 as control data, and the detection system control unit 45 transmits a control signal for rotating only -θ 2 to the rotational driving source 435. Further, when the inclination of the straight line DL is negative, the image processing unit outputs +θ 2 of the control data by rotating the +θ 2 reference line. Therefore, the control signal transmitting portion is configured to cause the photometric member 42 to be made. Only the control signal of +θ 2 is rotated to the rotary drive source 435.

接著,使用具有如上述構成的偏光方向檢測系4針對檢測偏光光的偏光軸方向的動作說明。 Next, an operation of detecting the polarization axis direction of the polarized light using the polarization direction detecting system 4 having the above configuration will be described.

主控制部9使移送用驅動源52動作,將偏光方向檢測器40從退避位置移送到照射面R上的位置為止。此時,檢測系控制部45使測光件對準器6動作,以測光件感測器61進行通過下方之測光件標記461、462的攝影。並且,檢測系控制部45內的運算處理部處理來自測光件感測器61的輸出而生成控制數據,作為控制訊號送至旋 轉驅動源435。其結果,使測光件42對準。因此,在偏光方向檢測器40位在照射面R上的位置時,測光件42的柵寬方向成為與裝置基準方向精度良好一致的狀態。 The main control unit 9 operates the transfer drive source 52 to move the polarization direction detector 40 from the retracted position to the position on the irradiation surface R. At this time, the detection system control unit 45 operates the photometric aligner 6, and the photometry sensor 61 performs imaging of the photometric member marks 461 and 462 passing through the lower side. Further, the arithmetic processing unit in the detection system control unit 45 processes the output from the photometric sensor 61 to generate control data, which is sent to the rotation as a control signal. Drive source 435. As a result, the photometric member 42 is aligned. Therefore, when the polarization direction detector 40 is at the position on the irradiation surface R, the grating width direction of the photometric member 42 is in a state of being in good agreement with the device reference direction accuracy.

也有在此位置進行偏光方向檢測的場合,但根據需要使得未圖示的橫向移動機構動作,將偏光方向檢測器40朝著光源11的長方向移動而定位在照射面R上的任意的位置(例如中央位置)。 In the case where the polarization direction detection is performed at this position, the lateral movement mechanism (not shown) is operated as needed, and the polarization direction detector 40 is moved toward the longitudinal direction of the light source 11 to be positioned at an arbitrary position on the irradiation surface R ( For example, the central location).

在此狀態下,檢測系控制部45將檢測開始的訊號送到偏光方向檢測器40,使得旋轉驅動源435旋轉。並且,檢測系控制部45是特定來自隨旋轉而變化之受光器41的輸出值成為最大值的旋轉角度,以其角度作為偏光方向的檢測結果。也有在光源11的長度方向的某位置進行偏光方向的檢測之後,使得未圖示的橫向移動機構動作,在其他位置進行偏光方向檢測的場合。 In this state, the detection system control unit 45 sends the detection start signal to the polarization direction detector 40 so that the rotation drive source 435 rotates. Further, the detection system control unit 45 specifies a rotation angle at which the output value from the photoreceptor 41 that changes with the rotation becomes the maximum value, and the angle thereof is used as the detection result of the polarization direction. After the detection of the polarization direction at a certain position in the longitudinal direction of the light source 11, the lateral movement mechanism (not shown) is operated, and the polarization direction detection is performed at another position.

實施形態的偏光光照射裝置具備如上述構成及動作相關的偏光方向檢測系4、檢測器移送系及測光件對準器6,可精度良好地檢測照射在照射面R之偏光光的偏光軸的方向。實施形態的裝置為進一步有效利用偏光方向檢測系4,具備調整光照射器1具有之偏光元件121配置角度的機構(以下稱偏光元件調整機構)7。以下,針對該點說明。 The polarized light irradiation device of the embodiment includes the polarization direction detecting system 4, the detector transfer system, and the photometric aligner 6 according to the above-described configuration and operation, and can accurately detect the polarization axis of the polarized light irradiated on the irradiation surface R. direction. In order to further effectively utilize the polarization direction detecting system 4, the apparatus of the embodiment includes a mechanism (hereinafter referred to as a polarizing element adjusting mechanism) 7 for adjusting the arrangement angle of the polarizing element 121 of the light irradiator 1. Hereinafter, the point will be described.

第11圖表示偏光元件調整機構7的概略構成的平面圖。 Fig. 11 is a plan view showing a schematic configuration of the polarizing element adjusting mechanism 7.

偏光元件調整機構7在偏光方向檢測系4所檢測的偏 光方向從裝置基準方向偏離的場合,調整偏光元件121的配置角度,使偏光方向精度良好地與裝置基準方向一致。僅偏光元件121調整配置角度即可,但該實施形態是採用調整光照射器1整體的配置角度的機構。 The polarization detected by the polarization element detecting mechanism 7 in the polarization direction detecting system 4 When the light direction deviates from the device reference direction, the arrangement angle of the polarizing element 121 is adjusted so that the polarization direction is accurately aligned with the device reference direction. It is only necessary to adjust the arrangement angle of the polarizing element 121. However, in this embodiment, a mechanism for adjusting the arrangement angle of the entire light irradiator 1 is employed.

如第2圖表示,偏光元件單元12是被安裝於燈罩14,成為光照射器1的一元件。偏光元件調整機構7,在該實施形態中,係由:設置在燈罩14一方側的端面(平面顯示是在成長方形的側面之中位於短邊的面)的承銷71;在燈罩14另一方側之中設置推拉燈罩14的端面的兩個進退銷72;及驅動各進退銷72的銷驅動源73等所構成。在燈罩14一方的端面固定有承接件74,承銷71是將前端抵接於承接件74而設置。兩個進退銷72被設置在與此相反側的端面抵接。承銷71在一方的端面中央抵接,兩個進退銷72則是在從另一方端面的中央彼此等距離的位置抵接。 As shown in FIG. 2, the polarizing element unit 12 is attached to the globe 14 and serves as a component of the light irradiator 1. In the embodiment, the polarizing element adjusting mechanism 7 is provided with an end surface 71 provided on one end surface of the globe 14 (a flat surface is a surface on the short side among the rectangular side surfaces); on the other side of the globe 14 Among them, two advancing and retracting pins 72 for pushing the end faces of the lamp cover 14 and a pin driving source 73 for driving the respective advancing and retracting pins 72 are provided. A receiving member 74 is fixed to one end surface of the globe 14, and the retaining pin 71 is provided to abut against the receiving member 74. The two advance/retract pins 72 are provided on the opposite end faces. The underpin 71 abuts on the center of one end surface, and the two advance/retract pins 72 abut at positions equidistant from the center of the other end surface.

承銷71的位置被固定,前端的抵接處為燈罩14旋轉的支點(旋轉中心)。兩個進退銷72是朝著與裝置基準方向垂直的水平方向進退,設定當一方的進退銷72前進時僅其距離使得另一方的進退銷72後退,而當另一方的進退銷72前進時則一方的進退銷72僅其距離後退。各進退銷72是利用如測微計的精密螺旋機構來進行進退,藉銷驅動源73僅進退所指定的的距離。除此之外,兩個進退銷72也可以手動動作進行進退。 The position of the underpin 71 is fixed, and the abutment of the front end is a fulcrum (rotation center) at which the lamp cover 14 rotates. The two advance/retract pins 72 are advanced and retracted in a horizontal direction perpendicular to the device reference direction, and are set such that when one of the advance and retreat pins 72 advances, only the distance causes the other forward/backward pin 72 to retreat, and when the other advance and retreat pin 72 advances, One of the advance and retreat pins 72 is only receded by its distance. Each of the advance/retract pins 72 is advanced and retracted by a precision screw mechanism such as a micrometer, and the borrowing drive source 73 advances and retreats only by a specified distance. In addition, the two advance and retreat pins 72 can also be manually moved forward and backward.

一方的進退銷72前進而另一方的進退銷72 後退時,光照射器1整體以承銷71的前端為中心旋轉。藉此,也使得光照射器1內的偏光元件單元12旋轉,調整偏光元件121的姿勢,旋轉的角度是以偏光元件121的姿勢調整為目的而僅是些微的角度,例如可在±0.5°左右為止的範圍內旋轉。 One of the advance and retreat pins 72 advances and the other advances and retreats 72 When retracting, the entire light illuminator 1 rotates around the front end of the underpin 71. Thereby, the polarizing element unit 12 in the light irradiator 1 is also rotated, and the posture of the polarizing element 121 is adjusted. The angle of rotation is only a slight angle for the purpose of adjusting the posture of the polarizing element 121, for example, ±0.5°. Rotate within the range from left to right.

如上述的偏光元件調整機構7是使用於裝置對於生產線的設置或裝置的維修時等。例如,設置光照射器1時,點亮光源11將偏光光照射於照射面R,藉偏光方向檢測系4檢測偏光軸的方向。偏光偏位角如未進入容許範圍,則使偏光元件調整機構7動作或以手動調整使得偏光偏位角成為0。 The polarizing element adjusting mechanism 7 as described above is used when the apparatus is installed for the production line or the maintenance of the apparatus. For example, when the light irradiator 1 is provided, the lighting light source 11 irradiates the polarized light to the irradiation surface R, and the direction of the polarization axis is detected by the polarization direction detecting system 4. If the polarization shift angle does not enter the allowable range, the polarizing element adjustment mechanism 7 is operated or manually adjusted so that the polarization deviation angle becomes zero.

又,裝置的運轉中,可隨時檢查光定向是否方向精度良好地進行。亦即,裝置的運轉一旦停止,藉著偏光方向檢測系4進行偏光軸方向的檢測。並且檢查偏光偏位角是否在容許值以內,一旦超過容許值時,藉偏光元件調整機構7進行調整。 Further, during the operation of the apparatus, it is possible to check whether the light orientation is performed with good precision at any time. That is, once the operation of the apparatus is stopped, the direction of the polarization axis is detected by the polarization direction detecting system 4. Further, it is checked whether or not the polarization deviation angle is within the allowable value, and when the allowable value is exceeded, the polarization element adjustment mechanism 7 performs adjustment.

隨時進行如上述的調整,偏光軸方向精度良好地朝著裝置基準方向的偏光光可經常照射於照射面R。因此,如上述藉工件對準器3進行工件W的對準,設定定向方向精度良好地朝裝置基準方向將工件W搭載於載台21並搬運至照射面R時,工件W即可朝設定定向方向精度良好進行光定向。 When the adjustment as described above is performed as described above, the polarized light having a direction of the polarizing axis with a high accuracy toward the device reference direction can be constantly irradiated onto the irradiation surface R. Therefore, when the workpiece W is aligned by the workpiece aligner 3 and the orientation W is accurately mounted on the stage 21 in the apparatus reference direction and conveyed to the irradiation surface R, the workpiece W can be oriented toward the setting. Directional accuracy is good for light orientation.

接著,針對實施形態之光定向用偏光光照射裝置整體的動作說明。以下的說明也是光定向用偏光光照 射方法的發明實施形態的說明。 Next, the operation of the entire polarized light irradiation device for light direction of the embodiment will be described. The following instructions are also polarized illumination for light orientation. Description of an embodiment of the invention of the method of shooting.

工件W是利用如AGV(Auto Guided Vehicle)的批量搬運機構,或是如氣動輸送機的單片搬運裝置搬運到未圖示的機器人的位置為止。機器人將一片工件W搭載於載台21。 The workpiece W is transported to a position of a robot (not shown) by a batch transport mechanism such as an AGV (Auto Guided Vehicle) or a single-piece transport device such as a pneumatic conveyor. The robot mounts one workpiece W on the stage 21 .

主控制部9使工件對準器3動作,進行工件W的對準。一旦工件W的對準結束後,主控制部9對工件搬運系2送出控制訊號,使搬運用驅動源24動作將載台21從搭載回收位置朝向照射面R移動,並通過照射面R定位在前進極限位置。此時,預先點亮光照射器1的光源11,在通過照射面R時對工件W照射偏光光。 The main control unit 9 operates the workpiece aligner 3 to align the workpiece W. When the alignment of the workpiece W is completed, the main control unit 9 sends a control signal to the workpiece transport system 2, and the transport drive source 24 operates to move the stage 21 from the mounting/recovering position toward the irradiation surface R, and is positioned by the irradiation surface R. Forward limit position. At this time, the light source 11 of the light irradiator 1 is turned on in advance, and the workpiece W is irradiated with polarized light when passing through the irradiation surface R.

載台21到達前進極限位置以未圖示的感測器確認時,主控制部9使搬運用驅動源24逆轉動作,將搬運用驅動軸22逆向旋轉使載台21後退。主控制部9使載台21通過照射面R,回到搭載回收位置時即停止。該返回路搬運時在通過照射面R時也對工件W照射偏光光。回到搭載回收位置為止的工件W藉著機器人從載台21取出,並利用機器人將接下來未處理的工件W搭載於載台21。以後,重複進行同樣的動作。 When the stage 21 reaches the forward limit position and is confirmed by a sensor (not shown), the main control unit 9 reverses the transport drive source 24, and reverses the transport drive shaft 22 to retract the stage 21. The main control unit 9 stops the stage 21 when it passes the irradiation surface R and returns to the mounting/recovering position. When the return path is conveyed, the workpiece W is also irradiated with polarized light when passing through the irradiation surface R. The workpiece W that has been returned to the collection position is taken out from the stage 21 by the robot, and the workpiece W that has not been processed next is mounted on the stage 21 by the robot. After that, repeat the same action.

藉著上述偏光光照射重複光定向處理的過程,隨時進行以照射面R的偏光光之偏光軸方向的檢查。亦即,主控制部9一旦使重複處理停止,載台21在退避到搭載回收位置的狀態下使偏光方向檢測系4動作。主控制部9使檢測器移送系動作將偏光方向檢測器40從退避 位置移送到檢測位置為止。在該等的移送動作時,檢測系控制部45使測光件對準器6動作,使得檢測線DL與裝置基準方向一致的狀態,在旋轉驅動源435保持著此一狀態。並且,利用移送機構5將偏光方向檢測器40定位在光源11正下方的位置之後,根據需要使未圖示的橫向移動機構動作,將偏光方向檢測器40定位在光源11長方向的任意檢測位置。 By the process of repeating the light directing process by the above-described polarized light irradiation, the inspection of the polarization axis direction of the polarized light of the irradiation surface R is performed at any time. In other words, when the main control unit 9 stops the repeating process, the stage 21 operates the polarization direction detecting system 4 while retracting to the mounting/recovering position. The main control unit 9 causes the detector transfer mechanism to move the polarization direction detector 40 from the back The position is moved to the detection position. At the time of the transfer operation, the detection system control unit 45 operates the photometric aligner 6 so that the detection line DL coincides with the device reference direction, and the rotation drive source 435 maintains this state. Further, after the polarization direction detector 40 is positioned at a position directly below the light source 11 by the transfer mechanism 5, a lateral movement mechanism (not shown) is operated as necessary, and the polarization direction detector 40 is positioned at an arbitrary detection position in the longitudinal direction of the light source 11. .

偏光方向檢測器40一旦到達檢測位置後,旋轉驅動源435開始旋轉。偏光方向檢測器40在旋轉180度之後,設檢測用受光器41輸出成為最高的角度為偏光軸的方向,算出相對於裝置基準方向的偏位角(偏光偏位角)。偏光方向檢測系4將所算出的偏光偏位角送至主控制部9。 Once the polarization direction detector 40 reaches the detection position, the rotational drive source 435 starts to rotate. After the polarization direction detector 40 is rotated by 180 degrees, the detection light receiver 41 outputs the direction in which the highest angle is the polarization axis, and calculates the deflection angle (polarization deviation angle) with respect to the device reference direction. The polarization direction detecting system 4 sends the calculated polarization deviation angle to the main control unit 9.

主控制部9判斷所檢測之偏光偏位角是否在容許值以內,超過容許值時,使偏光元件調整機構7動作,調整光照射器1的姿勢使偏光偏位角成為0。主控制部9具備未圖示的顯示器,將所送訊之偏光偏位角或是否在容許值內的資訊顯示於顯示器。此外,主控制部9的顯示器僅顯示偏光偏位角,偏光元件調整機構7的動作也有以手動進行的場合。在以上偏光軸的方向精度的檢查、必要之偏光元件121的姿勢調整進行之後,再啟動對工件W之偏光光照射的單片處理。 The main control unit 9 determines whether or not the detected polarization deviation angle is within the allowable value. When the allowable value is exceeded, the polarizing element adjustment mechanism 7 is operated to adjust the posture of the light irradiator 1 so that the polarization deviation angle becomes zero. The main control unit 9 includes a display (not shown), and displays information on the polarization deviation angle of the transmitted signal or whether or not the information is within the allowable value on the display. Further, the display of the main control unit 9 displays only the polarization deviation angle, and the operation of the polarization element adjustment mechanism 7 is also performed manually. After the inspection of the direction accuracy of the above polarized axis and the adjustment of the posture of the polarizing element 121 are performed, the single-chip processing of the polarized light irradiation of the workpiece W is started.

根據實施形態的光定向用偏光光照射裝置,藉著配置使偏光軸的方向相對於裝置基準方向成為預定角 度的光照射器1朝著照射面R照射偏光光,由於將工件W對準使其設定定向方向相對於裝置基準方向成為預定角度的狀態通過照射面R,所以對工件W照射偏光軸的方向精度高的偏光光,可實現優質的光定向處理。 According to the polarized light irradiation device for light direction of the embodiment, the direction of the polarization axis is set to a predetermined angle with respect to the device reference direction by arrangement The light illuminator 1 is irradiated with the polarized light toward the irradiation surface R, and the workpiece W is aligned with the direction in which the orientation direction is set to a predetermined angle with respect to the device reference direction through the irradiation surface R, so that the direction of the workpiece W is irradiated to the polarization axis. High-precision polarized light for high-quality light-directed processing.

此外,使用偏光方向檢測系4可實際檢測出以照射面R所照射之偏光光的偏光軸,可檢查對於裝置基準方向是否朝著預定的方向。並且此時,測光件對準器6調整測光件42的姿勢,可以使測光件42的偏光軸相對於裝置基準方向成為預定角度的姿勢作為旋轉原點,所以可進一步提高偏光方向的檢測精度。因此,也可以高精度算出偏光偏位角,而可以高精度進行偏光元件調整機構7之偏光偏位角的校正。為此,可進一步實現方向精度高的光定向處理。 Further, the polarization direction detecting system 4 can actually detect the polarization axis of the polarized light irradiated by the irradiation surface R, and it can be checked whether or not the device reference direction is oriented in a predetermined direction. At this time, the photometric aligner 6 adjusts the posture of the photometric member 42, and the posture in which the polarization axis of the photometric member 42 becomes a predetermined angle with respect to the device reference direction can be used as the rotation origin, so that the detection accuracy of the polarization direction can be further improved. Therefore, the polarization deviation angle can be calculated with high accuracy, and the polarization deviation angle of the polarization element adjustment mechanism 7 can be corrected with high precision. For this reason, the light directing process with high direction accuracy can be further realized.

又,由於在測光件42本身設有對準標記,所以可進一步提高測光件42的對準精度。對於測光件標記461、462也可設置除測光件42以外的構件(例如框板421),也可檢測該等其他構件上的標記進行測光件42的對準。但是,此時,測光件42相對於該等其他的構件有姿勢精度良好安裝的必要,安裝精度一旦降低時,直接影響測光件42的對準精度降低。該實施形態中,由於在測光件42本身設有對準標記,所以不會有上述的繁雜與問題。 Further, since the photometric member 42 itself is provided with an alignment mark, the alignment accuracy of the photometric member 42 can be further improved. For the photometric member marks 461, 462, members other than the photometric member 42 (for example, the frame plate 421) may be provided, and the marks on the other members may be detected to perform alignment of the photometric member 42. However, at this time, the photometric member 42 is required to be mounted with good posture accuracy with respect to the other members, and when the mounting accuracy is lowered, the alignment accuracy of the photometric member 42 is directly affected to be lowered. In this embodiment, since the photometric member 42 itself is provided with an alignment mark, the above-mentioned cumbersome and problematic problems are not caused.

再者,本實施形態中,測光件42為柵偏光元件,測光件標記461、462可在透明基板上形成柵420的 照相平版印刷步驟中一併形成。亦即,預先在柵形成用的光罩也一併設置測光件標記形成用的圖案,測光件標記461、462也可與柵同時形成,且其位置精度與圖案精度可形成與柵420同樣的高精度。 Furthermore, in the embodiment, the photometric member 42 is a gate polarizing element, and the photometric member marks 461 and 462 can form the gate 420 on the transparent substrate. The photolithography step is formed together. That is, the mask for forming the photometric member is also provided in advance in the mask for forming the gate, and the photometric member marks 461 and 462 can be formed simultaneously with the gate, and the positional accuracy and pattern accuracy can be formed in the same manner as the gate 420. High precision.

又,實施形態的裝置中,設有在偏光方向檢測器40的照射面R上進行檢測位置的設定與除去的檢測器移送系,因此除了在對裝置之生產線的設置時之外在量產的期間適合進行偏光方向的監視。裝置的運轉一旦停止作業人員也可以手作業將偏光方向檢測器40配置在檢測位置,但較為麻煩也會有作業人員進入無塵室內,導致生產性降低的問題。根據實施形態,則不會有以上的問題。 Further, in the apparatus of the embodiment, the detector transfer system for setting and removing the detection position on the irradiation surface R of the polarization direction detector 40 is provided, and therefore, mass production is performed in addition to the installation of the production line of the device. It is suitable for monitoring the polarization direction during the period. When the operation of the apparatus is stopped, the operator can manually arrange the polarization direction detector 40 at the detection position. However, it is troublesome, and the worker may enter the clean room, resulting in a problem of reduced productivity. According to the embodiment, the above problems are not caused.

又,移送機構5一部份兼用工件搬運系2的機構,所以可簡化裝置的構造,降低成本。尤其在該實施形態中,移送機構5是利用工件搬運系2的線性導件23將偏光方向檢測器40定位在照射面R上的檢測位置,因此可提升偏光方向檢測器40的位置精度與姿勢精度。 Moreover, since the transfer mechanism 5 uses the mechanism of the workpiece conveyance system 2 in part, the structure of the apparatus can be simplified, and the cost can be reduced. In particular, in this embodiment, the transfer mechanism 5 positions the polarization direction detector 40 on the irradiation surface R by the linear guide 23 of the workpiece transport system 2, so that the positional accuracy and posture of the polarization direction detector 40 can be improved. Precision.

並且,除移送機構5之外,設置使偏光方向檢測器40在與移送機構5的移送方向垂直之照射面R上的方向移動的橫向移動機構,因此可以照射面R上的任意位置作為檢測位置,例如在光源11的長方向選擇檢測位置,或可以複數的位置進行偏光方向的檢測。因此,適合於照射面R的偏光軸的狀態的詳細檢查。 Further, in addition to the transfer mechanism 5, a lateral movement mechanism for moving the polarization direction detector 40 in the direction perpendicular to the irradiation surface R perpendicular to the transfer direction of the transfer mechanism 5 is provided, so that an arbitrary position on the irradiation surface R can be used as the detection position. For example, the detection position is selected in the long direction of the light source 11, or the polarization direction can be detected at a plurality of positions. Therefore, it is suitable for detailed inspection of the state of the polarization axis of the irradiation surface R.

上述第一實施形態的裝置中,工件對準器3的感測器與測光件對準器6的感測器也可以一個感測器兼 用。例如,檢測器移送系將偏光方向檢測器40移送至工件標記感測器31的位置為止,也可以在測光件42的對準之後,回到照射面R進行偏光方向的檢測。 In the apparatus of the first embodiment described above, the sensor of the workpiece aligner 3 and the sensor of the photometric aligner 6 can also be a sensor use. For example, the detector transfer system may transfer the polarization direction detector 40 to the position of the workpiece mark sensor 31, or may return to the irradiation surface R to detect the polarization direction after the alignment of the photometric member 42.

接著,針對第二實施形態的光定向用偏光光照射裝置說明。 Next, a description will be given of a polarized light irradiation device for light orientation according to the second embodiment.

第12圖為第二實施形態之光定向用偏光光照射裝置的平面概略圖。第二實施形態的裝置在設有第一第二的兩個工件對準器81、82的點與第一實施形態不同,其他的點與第一實施形態大致相同。第一工件對準器81是進行第一工件W1的對準,第二工件對準器82是進行第二工件W2的對準。又,如第12圖表示,設有控制兩個工件對準器81、82進行工件W1、W2對準的控制部(以下,稱,工件對準控制部)80。 Fig. 12 is a schematic plan view showing a polarized light irradiation device for light orientation according to a second embodiment. The apparatus of the second embodiment is different from the first embodiment in that the first and second workpiece aligners 81 and 82 are provided, and other points are substantially the same as those of the first embodiment. The first workpiece aligner 81 performs alignment of the first workpiece W1, and the second workpiece aligner 82 performs alignment of the second workpiece W2. Further, as shown in Fig. 12, a control unit (hereinafter referred to as a workpiece alignment control unit) 80 that controls the alignment of the workpieces W1 and W2 by the two workpiece aligners 81 and 82 is provided.

該實施形態中,第一工件對準器81為調整用,第一工件W1為調整用而準備的工件。又,第二工件對準器82為量產用,第二工件W2是作為光定向處理的對象物的一般的工件。第一第二工件W1、W2雖設有兩個對準標記,但兩個對準標記的類型或形成位置是與第一實施形態相同。並且,在第一第二工件W1、W2中,兩個對準標記是形成在相同的位置。 In this embodiment, the first workpiece aligner 81 is used for adjustment, and the first workpiece W1 is a workpiece prepared for adjustment. Further, the second workpiece aligner 82 is for mass production, and the second workpiece W2 is a general workpiece which is an object of the light directional processing. Although the first and second workpieces W1, W2 are provided with two alignment marks, the type or formation position of the two alignment marks is the same as that of the first embodiment. Also, in the first and second workpieces W1, W2, the two alignment marks are formed at the same position.

第二實施形態的裝置也具備偏光方向檢測系4,偏光方向檢測系4包括測光件對準器6。測光件對準器6具備的測光件感測器61同樣是如CCD的圖像感測器,第一工件對準器81將此測光件感測器61兼用於工件 標記的檢測用。以下,稱此感測器為調整用感測器。另一方面,第二工件對準器82具備兩個工件標記檢測用的感測器821、822。各感測器821、822也同樣是如CCD的圖像感測器,以下,稱第一感測器821、第二感測器822。 The apparatus of the second embodiment also includes a polarization direction detecting system 4, and the polarization direction detecting system 4 includes a photometric aligner 6. The photometric member finder 61 of the photometric aligner 6 is also an image sensor such as a CCD, and the first workpiece aligner 81 uses the photometric sensor 61 for the workpiece. Detection of the mark. Hereinafter, the sensor is referred to as an adjustment sensor. On the other hand, the second workpiece aligner 82 is provided with two sensors 821 and 822 for detecting the workpiece marks. Each of the sensors 821 and 822 is also an image sensor such as a CCD. Hereinafter, the first sensor 821 and the second sensor 822 are referred to.

該實施形態中,也設有工件對準控制部80。對工件對準控制部80輸入來自調整用感測器61的訊號,及來自第一第二感測器821、822的訊號。 In this embodiment, the workpiece alignment control unit 80 is also provided. The signal from the adjustment sensor 61 and the signals from the first and second sensors 821 and 822 are input to the workpiece alignment control unit 80.

使用調整用感測器61的第一工件W1的對準用的構成或動作是與第一實施形態的場合相同。但是,調整用感測器61的配置位置是位在超過照射面R的位置,所以在對準時,主控制部9將載台21搬運到此位置為止。 The configuration or operation for alignment of the first workpiece W1 using the adjustment sensor 61 is the same as that in the first embodiment. However, since the arrangement position of the adjustment sensor 61 is at a position exceeding the irradiation surface R, the main control unit 9 conveys the stage 21 to this position at the time of alignment.

針對使用第一第二感測器821、822的第二工件對準器82的構成,使用第12圖及第13圖加以說明。第13圖是表示第二實施形態的裝置之第二工件對準器82的構成的透視概略圖。 The configuration of the second workpiece aligner 82 using the first and second sensors 821, 822 will be described using Figs. 12 and 13. Fig. 13 is a perspective schematic view showing the configuration of the second workpiece aligner 82 of the apparatus of the second embodiment.

如第13圖表示,第二工件對準器82具備:第一第二的兩個感測器821、822、運算處理部、記憶部、載台姿勢調整機構83及調整用搬運機構。運算處理部及記憶部是設置在工件對準控制部80內。載台姿勢調整機構83是與第一工件對準器81或第一實施形態的工件對準器3具備的相同,使載台21在XYθ方向移動調整工件W1、W2的姿勢的機構。 As shown in Fig. 13, the second workpiece aligner 82 includes two first and second sensors 821 and 822, an arithmetic processing unit, a memory unit, a stage posture adjusting mechanism 83, and an adjustment transport mechanism. The arithmetic processing unit and the storage unit are provided in the workpiece alignment control unit 80. The stage posture adjusting mechanism 83 is a mechanism that moves the stage 21 to adjust the postures of the workpieces W1 and W2 in the XYθ direction, similarly to the first workpiece aligner 81 or the workpiece aligner 3 of the first embodiment.

調整用搬運機構是針對第一工件W1,以第一第二感測器821、822攝影的狀態來取代調整用感測器61 攝影狀態用的機構。原理上也可以替換感測器,但考慮精度上的問題,該實施形態是採用將已對準的第一工件W1移送至第一第二感測器821、822的攝影位置為止的調整用搬運機構,兼用為工件搬運系2。亦即,工件搬運系2可將已對準的第一工件W1從調整用感測器61的攝影位置搬運到第一第二感測器821、822的攝影位置為止。 The adjustment transport mechanism is for the first workpiece W1, and the adjustment sensor 61 is replaced with the first second sensor 821, 822. The mechanism used for photography. In principle, the sensor can be replaced. However, in consideration of the problem of accuracy, this embodiment adopts an adjustment carrier that transfers the aligned first workpiece W1 to the photographing position of the first and second sensors 821 and 822. The mechanism is also used as the workpiece handling system 2. That is, the workpiece transport system 2 can transport the aligned first workpiece W1 from the photographing position of the adjustment sensor 61 to the photographing position of the first and second sensors 821 and 822.

更具體說明時,如第12圖表示,調整用感測器61的攝影位置隔著照射面R設定在與搭載回收位置的相反側。一對的線性導件23及搬運用驅動軸22是從搭載回收位置延伸貫穿照射面R,調整用感測器61是位在一方線性導件23的大致正上方。因此,工件搬運系2可將搭載第一工件W1的載台21搬運至調整用感測器61的攝影位置為止。 More specifically, as shown in Fig. 12, the photographing position of the adjustment sensor 61 is set on the opposite side to the mounting and collecting position via the irradiation surface R. The pair of linear guides 23 and the transport drive shaft 22 extend from the mounting and collecting position through the irradiation surface R, and the adjustment sensor 61 is positioned substantially directly above the one linear guide 23. Therefore, the workpiece transport system 2 can transport the stage 21 on which the first workpiece W1 is mounted to the photographing position of the adjustment sensor 61.

另一方面,如第12圖表示,第一第二感測器821、822被設置在鄰接搭載回收位置與照射面R之間的位置。第一第二感測器821、822是大致沿著搬運線排列,第一感測器821是配置在接近照射面R側,第二感測器822是配置在接近搭載回收位置側。第一第二感測器821、822的分開距離是大致相當於第一第二工件標記WM1、WM2的分開距離。因此,只要藉調整用感測器61針對第一工件W1進行對準結束後,將搬運用驅動軸22逆轉,使載台21後退預定距離,即可將第一工件W1定位在使各工件標記WM1、WM2位於各感測器821、822正下方的位置。 On the other hand, as shown in Fig. 12, the first and second sensors 821 and 822 are disposed at positions adjacent to the mounting recovery position and the irradiation surface R. The first and second sensors 821 and 822 are arranged substantially along the transport line. The first sensor 821 is disposed on the side closer to the irradiation surface R, and the second sensor 822 is disposed on the side closer to the mounting and recovery position. The separation distance of the first and second sensors 821, 822 is substantially equal to the separation distance of the first and second workpiece marks WM1, WM2. Therefore, as long as the alignment of the first workpiece W1 by the adjustment sensor 61 is completed, the conveyance drive shaft 22 is reversed, and the stage 21 is moved backward by a predetermined distance, so that the first workpiece W1 can be positioned to mark each workpiece. WM1 and WM2 are located directly below each of the sensors 821 and 822.

該後退的預定距離(以下稱設定後退距離)是根據第一第二感測器821、822之搬運方向的配置位置。藉調整用感測器61進行對準時,第一工件W1通過調整用感測器61的攝影區域,在前進到達位置停止。該前進到達位置與第一第二感測器821、822的攝影位置的距離為設定後退距離。 The predetermined distance to be retracted (hereinafter referred to as a set back distance) is an arrangement position according to the conveyance direction of the first and second sensors 821 and 822. When the alignment is performed by the adjustment sensor 61, the first workpiece W1 passes through the imaging area of the adjustment sensor 61, and stops at the advancement arrival position. The distance between the forward arrival position and the photographing position of the first and second sensors 821, 822 is a set back distance.

第14圖及第15圖是針對第13圖表示之第二工件對準器8的感測器821、822的調整所表示的圖。其中,第14圖是如上述表示使搭載已對準第一工件W1的載台21僅後退設定後退距離以感測器821、822攝影之工件標記的像的一例的圖。第15圖是針對根據第14圖表示之各工件標記的像進行感測器821、822的姿勢或位置調整表示的圖。 Figs. 14 and 15 are views showing adjustments of the sensors 821 and 822 of the second workpiece aligner 8 shown in Fig. 13. In the above, FIG. 14 is a view showing an example of an image of the workpiece mark that is photographed by the sensors 821 and 822 by setting the retracted distance of the stage 21 that has been aligned with the first workpiece W1. Fig. 15 is a view showing the posture or position adjustment of the sensors 821 and 822 in accordance with the image of each workpiece mark shown in Fig. 14.

第14圖中,第14圖(1)是藉第一感測器821所攝影之第一工件標記WM1的圖像,(2)是藉第二感測器822所攝影之第二工件標記WM2的圖像。第一工件W1是已對準,所以第一工件標記WM1與第二工件標記WM2在裝置基準方向為精度良好地一致。第14圖(1)(2)中,第一第二工件標記WM1、WM2雖是朝X軸方向偏位,但這是第一第二感測器821、822排列的方向與裝置基準方向不一致的原因。並且,該例中,第二工件標記WM2的圖像是從XY軸傾斜。這也是根據第二感測器822相對於裝置基準方向傾斜配置所成。 In Fig. 14, Fig. 14(1) is an image of the first workpiece mark WM1 photographed by the first sensor 821, and (2) is a second workpiece mark WM2 photographed by the second sensor 822. Image. Since the first workpiece W1 is aligned, the first workpiece mark WM1 and the second workpiece mark WM2 are accurately aligned in the device reference direction. In Fig. 14 (1) and (2), the first and second workpiece marks WM1 and WM2 are offset in the X-axis direction, but the direction in which the first and second sensors 821 and 822 are arranged does not coincide with the device reference direction. s reason. Further, in this example, the image of the second workpiece mark WM2 is inclined from the XY axis. This is also based on the oblique configuration of the second sensor 822 relative to the device reference direction.

在此狀態下,雖然也可記憶兩個工件標記 WM1、WM2的位置資訊,但為更容易進行量產時的對準,調整兩個感測器821、822的姿勢與位置。亦即,如第15圖表示,調整第二感測器822的姿勢,使XY軸與第二工件標記WM2的XY軸一致。並且,調整各感測器821、822之XY方向的位置,使第一第二工件標記WM1、WM2在各感測器821、822的攝影面中大致位在原點的位置。第15圖中,以虛線表示調整前的感測器821、822,並以實線表示調整後的感測器821、822。 In this state, although two workpiece marks can be memorized The position information of WM1 and WM2, but the posture and position of the two sensors 821 and 822 are adjusted for easier alignment during mass production. That is, as shown in Fig. 15, the posture of the second sensor 822 is adjusted such that the XY axis coincides with the XY axis of the second workpiece mark WM2. Then, the positions of the respective sensors 821 and 822 in the XY direction are adjusted so that the first and second workpiece marks WM1 and WM2 are positioned substantially at the origin in the imaging planes of the respective sensors 821 and 822. In Fig. 15, the sensors 821 and 822 before adjustment are indicated by broken lines, and the adjusted sensors 821 and 822 are indicated by solid lines.

各感測器821、822是安裝於具備藉測微計可在XYθ方向調整位置與姿勢之機構的台座(未圖示)之上,藉操作該機構表示於第15圖的狀態。再者,如第12圖表示,工件對準控制部80具備顯示器801,將各感測器821、822攝影的各工件標記WM1、WM2和各感測器821、822的XY軸一起顯示。一邊以顯示器801觀察各工件標記WM1、WM2的像,作業人員一邊操作調整機構而成為第15圖表示狀態。 Each of the sensors 821 and 822 is attached to a pedestal (not shown) having a mechanism for adjusting the position and posture in the XYθ direction by means of a micrometer, and the mechanism is shown in Fig. 15 by operating the mechanism. Further, as shown in Fig. 12, the workpiece alignment control unit 80 includes a display 801, and displays the workpiece marks WM1 and WM2 captured by the respective sensors 821 and 822 together with the XY axes of the respective sensors 821 and 822. While observing the image of each of the workpiece marks WM1 and WM2 with the display 801, the operator operates the adjustment mechanism to display the state shown in FIG.

藉各感測器821、822的位置調整成為以實線表示於第15圖的狀態之後,作業人員對圖像處理部送出動作指令,處理各感測器821、822之第一工件W1的各工件標記WM1、WM2的圖像數據,將其中心位置記憶於記憶部。另外,顯示器801成為觸控面板,透過顯示器801輸入指令。以下,如此一來,稱記憶位置的對準後的第一工件W1的各工件標記WM1、WM2的中心為第一基準標記中心Cs1、第二基準標記中心Cs2。再者,該調整是 使用調整機構的手動調整,各基準標記中心Cs1、Cs2並非與位在XY座標之原點附近的與原點的座標完全一致。 After the position adjustment of each of the sensors 821 and 822 is indicated by the solid line in the state of FIG. 15, the worker sends an operation command to the image processing unit, and processes each of the first workpieces W1 of the respective sensors 821 and 822. The image data of the workpiece marks WM1 and WM2 is stored in the memory unit at the center position. Further, the display 801 becomes a touch panel, and an instruction is input through the display 801. Hereinafter, the center of each of the workpiece marks WM1 and WM2 of the first workpiece W1 after the alignment of the memory position is referred to as a first reference mark center C s1 and a second reference mark center C s2 . Furthermore, this adjustment is a manual adjustment using an adjustment mechanism, and each of the reference mark centers C s1 and C s2 does not completely coincide with the coordinates of the origin near the origin of the XY coordinates.

又如上述,記憶各基準標記中心Cs1、Cs2的位置時之載台21的位置為在進行量產時之對準時載台21應定位的位置。以下,將此載台21的該位置稱為量產時對準位置。量產時對準位置的資訊是以搭載回收位置為起點的搬運距離的資訊,在主控制部9內記憶於記憶部。 Further, as described above, the position of the stage 21 when the positions of the reference mark centers C s1 and C s2 are memorized is the position at which the stage 21 should be positioned when the mass production is aligned. Hereinafter, this position of the stage 21 is referred to as a mass production alignment position. The information on the position at the time of mass production is information of the conveyance distance starting from the collection position, and is stored in the memory unit in the main control unit 9.

在工件對準控制部80內的記憶部,安裝有量產時之對準用的序列控制程式(以下,稱量產用對準程式)。主控制部9在量產時的工件W2的對準時將載台21定位在量產時對準位置。量產用對準程式是以在搭載著第二工件W2的載台21位於量產時對準位置的狀態執行。第16圖是針對量產時之對準動作所表示的平面概略圖,表示第二工件對準器82的各感測器821、822進行第二工件W2的各工件標記WM1、WM2攝影後的狀態。 A sequence control program for alignment during mass production (hereinafter, a weighing production alignment program) is attached to the memory unit in the workpiece alignment control unit 80. The main control unit 9 positions the stage 21 at the mass production alignment position at the time of alignment of the workpiece W2 at the time of mass production. The mass production alignment program is executed in a state in which the stage 21 on which the second workpiece W2 is mounted is placed at the time of mass production. Fig. 16 is a plan view schematically showing the alignment operation at the time of mass production, showing that each of the sensors 821 and 822 of the second workpiece aligner 82 performs the photographing of the workpiece marks WM1 and WM2 of the second workpiece W2. status.

如上述,由於載台21藉機器人搭載著工件W,所以工件W的姿勢不朝向裝置基準方向而成偏位。此偏位,其中一例是以如第16圖表示的各工件標記WM1、WM2的圖像來辨識。第16圖中,為參考起見以點線表示記憶部中記憶著中心位置的第一工件W1的各工件標記WM1、WM2的像。 As described above, since the stage 21 is mounted on the workpiece W by the robot, the posture of the workpiece W is not displaced toward the device reference direction. One example of this offset is the image of each of the workpiece marks WM1, WM2 as shown in Fig. 16. In Fig. 16, the image of each of the workpiece marks WM1, WM2 of the first workpiece W1 in which the center position is stored in the memory portion is indicated by a dotted line for reference.

運算處理部是算出使第二工件W2的第一工件標記WM1的像的中心(以下,稱第一檢測像中心)Cd1與第一基準標記中心Cs1一致,並使得第二工件W2的第二 工件標記WM2的像的中心(以下,稱第二檢測像中心)Cd2與第二基準標記中心Cs2一致所需之載台21的XYθ軸的移動距離。進行該算法,例如可算出連結第一檢測像中心Cd1與第二檢測像中心Cd2的線量(以下,稱檢測線量)的傾斜,算出該線量相對於連結第一、第二基準標記中心Cs1、Cs2的線量(以下,稱基準線量)所成的角度θ。並且,針對僅旋轉-θ的檢測線量,算出與基準線量一致所需之XY方向的移動距離,將此XY方向的距離和-θ作為控制訊號輸出。 The calculation processing unit calculates that the center of the image of the first workpiece mark WM1 of the second workpiece W2 (hereinafter referred to as the first detection image center) C d1 coincides with the first reference mark center C s1 and makes the second workpiece W2 The moving distance of the XYθ axis of the stage 21 required for the center of the image of the workpiece mark WM2 (hereinafter referred to as the second detected image center) C d2 and the second reference mark center C s2 is equal. By performing the algorithm, for example, the inclination of the line amount (hereinafter referred to as the detection line amount) connecting the first detection image center C d1 and the second detection image center C d2 can be calculated, and the line amount is calculated with respect to the first and second reference mark centers C. s1, dose (hereinafter referred to as the baseline amount) C s2 is the angle θ. Then, the movement distance in the XY direction required to match the reference line amount is calculated for the detection line amount of only -θ, and the distance in the XY direction and -θ are output as control signals.

工件對準控制部80將運算處理部輸出的控制訊號送至載台姿勢調整機構32,使載台21僅移動所算出之XYθ的距離來進行工件W的對準。藉此,針對第二工件W2進行第一工件W1的姿勢及位置的重現。 The workpiece alignment control unit 80 sends the control signal output from the arithmetic processing unit to the stage posture adjustment mechanism 32, and causes the stage 21 to move only the calculated distance of XYθ to align the workpiece W. Thereby, the reproduction of the posture and position of the first workpiece W1 is performed for the second workpiece W2.

再者,兩個感測器821、822是根據已對準的第一工件W1進行位置與姿勢的調整,因此在載台21位於量產時對準位置時,藉機器人進行的配置精度只要不惡化至限度以上,即不會使工件標記WM1、WM2脫離攝影區域而導致不能對準的狀況。一旦工件標記WM1、WM2脫離攝影區域以致不能對準的場合,則只需適當移動載台21尋找捕捉工件標記WM1、WM2的位置即可。 Furthermore, the two sensors 821 and 822 adjust the position and posture according to the aligned first workpiece W1. Therefore, when the stage 21 is in the mass production alignment position, the arrangement accuracy by the robot is not required. The deterioration is above the limit, that is, the workpiece marks WM1 and WM2 are not separated from the photographing area, resulting in a situation in which alignment is impossible. Once the workpiece marks WM1, WM2 are out of the photographic area so that they cannot be aligned, it is only necessary to appropriately move the stage 21 to find the position at which the workpiece marks WM1, WM2 are captured.

量產時的裝置整體的控制與動作除了使用第二工件對準器82進行工件W2的對準之外,與第一實施形態相同。主控制部9在確認藉機器人進行第二工件W2對載台21搭載完成之後,將控制訊號送至工件搬運系2 使載台21前進至量產時對準位置為止。並且,如上述使用第二工件對準器8進行對準。對準完成時,主控制部9將控制訊號送至工件搬運系2進一步使載台21前進,通過照射面R。載台21在到達前進到達位置後,主控制部9使載台21反轉、後退。載台21一邊後退一邊通過照射面R,一旦回到搭載回收位置時停止。之後,機器人回收曝光後的工件W2。對下一個工件W2也重覆同樣的動作,進行單片處理。 The control and operation of the entire apparatus at the time of mass production are the same as those of the first embodiment except that the second workpiece aligner 82 is used to align the workpiece W2. After confirming that the second workpiece W2 is mounted on the stage 21 by the robot, the main control unit 9 sends a control signal to the workpiece handling system 2 The stage 21 is advanced to the aligned position during mass production. Also, alignment is performed using the second workpiece aligner 8 as described above. When the alignment is completed, the main control unit 9 sends a control signal to the workpiece transport system 2 to further advance the stage 21 and pass through the irradiation surface R. After the stage 21 reaches the forward reaching position, the main control unit 9 reverses and retracts the stage 21. The stage 21 passes through the irradiation surface R while retreating, and stops when it returns to the loading/recovering position. After that, the robot collects the exposed workpiece W2. The same operation is repeated for the next workpiece W2, and single-chip processing is performed.

該實施形態是藉具備兩個感測器821、822的第二工件對準器82進行量產時之工件W2的對準,因此對準所需的時間變短,提高生產性。第一實施形態是以一個感測器31攝影工件標記WM1、WM2,算出工件偏位角,所以有使得工件W相對於感測器31朝預定方向移動(掃描)動作的必要,且工件偏位角之算出用的運算也容易變得複雜。因此,有使得對準所需的時間增長的傾向。第二實施形態則是在量產時使用兩個感測器821、822同時攝影兩個工件標記WM1、WM2來求得工件偏位角,所以不需工件W2的掃描動作,運算處理也比較簡單。所以短的對準所需的時間即可。因此,根據第二實施形態,可以光定向處理高的方向精度且高生產性地進行。 In this embodiment, the alignment of the workpiece W2 at the time of mass production by the second workpiece aligner 82 having the two sensors 821 and 822 is performed, so that the time required for the alignment is shortened, and productivity is improved. In the first embodiment, the workpiece marks WM1 and WM2 are photographed by one sensor 31, and the workpiece misalignment angle is calculated. Therefore, it is necessary to move (scan) the workpiece W in the predetermined direction with respect to the sensor 31, and the workpiece is misaligned. The calculation for the calculation of the angle is also complicated. Therefore, there is a tendency for the time required for alignment to increase. In the second embodiment, when the two sensors 821 and 822 are used for mass production, the two workpiece marks WM1 and WM2 are simultaneously photographed to obtain the workpiece deviation angle. Therefore, the scanning operation of the workpiece W2 is not required, and the calculation processing is relatively simple. . So the time required for short alignment can be. Therefore, according to the second embodiment, the light direction processing can be performed with high directional precision and high productivity.

又,此時,第二實施形態是利用對準後狀態的調整用的工件W1調整各感測器821、822的位置與姿勢,所以量產時第二工件W2的工件標記WM1、WM2不會偏離感測器的攝影區域,不致於不能對準。一旦不能對 準時,即可如上述適當移動載台21進行攝影,但第二實施形態的裝置則不需要此動作,此點也可提高生產性。 Further, in this case, in the second embodiment, the position and posture of each of the sensors 821 and 822 are adjusted by the workpiece W1 for adjustment in the post-alignment state. Therefore, the workpiece marks WM1 and WM2 of the second workpiece W2 are not produced during mass production. Deviate from the photographic area of the sensor so that it cannot be aligned. Once you can’t On time, the stage 21 can be appropriately moved as described above, but the apparatus of the second embodiment does not require this operation, and the productivity can be improved.

上述各實施形態中,設定定向方向雖是長方形工件的短邊方向,但此為一例,長邊方向或對角線的方向等,以工件的特定處的延伸方向為基準並以其他任意的方向為設定定向方向即可獲得。 In each of the above-described embodiments, the orientation direction is set to be the short-side direction of the rectangular workpiece. However, this is an example of the direction of the longitudinal direction or the diagonal direction, and the direction of the specific portion of the workpiece is used as a reference and in any other direction. It can be obtained by setting the orientation direction.

裝置基準方向也同樣地,除線性導件23的長方向(工件的搬運方向)以外,也可以和線性導件23的長方向垂直的水平方向等的任意的方向為裝置基準方向即可獲得。 Similarly to the longitudinal direction of the linear guide 23 (the conveyance direction of the workpiece), any direction such as the horizontal direction perpendicular to the longitudinal direction of the linear guide 23 can be obtained as the device reference direction.

相對於裝置基準方向之設定定向方向的角度在上述各實施形態中雖為0度(兩者一致),但這也可任意地設定。使設定定向方向相對於裝置基準方向傾斜的場合,也可採取如專利文獻2所記載,使光照射器1的姿勢有大的變更的機構。 The angle of the orientation direction with respect to the device reference direction is 0 degrees (the same) in the above embodiments, but this can be arbitrarily set. When the setting orientation direction is inclined with respect to the device reference direction, a mechanism for changing the posture of the light irradiator 1 as described in Patent Document 2 may be employed.

再者,偏光方向檢測器40雖以使得測光件42與照射面R一致的狀態(與照射面R相同的其他高度)為佳,但此並非必要的條件。只要照射面R與測光件42平行即可,相對於照射面R多少上或下的位置亦可。由於多少上下不會使偏光光的偏光方向與照射面R產生大的不同。 Further, the polarization direction detector 40 is preferably in a state in which the photodetector 42 is aligned with the irradiation surface R (other heights similar to the irradiation surface R), but this is not a necessary condition. As long as the irradiation surface R is parallel to the photometric member 42, the position of the irradiation surface R may be up or down. Since the upper and lower sides do not cause the polarization direction of the polarized light to be greatly different from the irradiation surface R.

又,各感測器31、61、821、822雖是CCD感測器,但也可使用CCD感測器以外的圖像感測器,也可以使用圖像感測器以外的感測器。例如,也可以使用一對光感測器,採用捕捉設置在工件W或測光件42之各對 準標記所產生反射光的變化以檢測各對準標記的位置的構成,只要在對準標記的形狀、光感測器的數量或配置位置上設法,即可進行對準標記之中心的檢測,或檢測對準標記的特定線量(檢測線量),設與圖像感測器進行的攝影等價的構成。 Further, although each of the sensors 31, 61, 821, and 822 is a CCD sensor, an image sensor other than the CCD sensor may be used, or a sensor other than the image sensor may be used. For example, it is also possible to use a pair of photosensors to capture pairs of the workpiece W or the photometric member 42. The change of the reflected light generated by the quasi-marking to detect the position of each of the alignment marks, and the detection of the center of the alignment mark can be performed as long as the shape of the alignment mark, the number of photosensors, or the arrangement position is managed. Or, the specific line amount (detection line amount) of the alignment mark is detected, and the configuration equivalent to the photographing by the image sensor is set.

對於工件雖已設定板狀物加以說明,但只要是與偏光方向的檢測或測光件的對準有關,則對於藉輥對輥搬運如專利文獻1或專利文獻2所揭示的長形工件也可同樣地實施。 Although the plate has been described as the workpiece, as long as it is related to the detection of the polarization direction or the alignment of the photometric member, the long workpiece disclosed in Patent Document 1 or Patent Document 2 can also be used for the roller-to-roll conveyance. Implemented in the same way.

又,第二實施形態中,針對以兩個感測器821、822進行已對準之第一工件W1的兩個工件標記的像的攝影的構成,除搬運第一工件W1的場合之外,也可移送兩個感測器821、822。但是,搬運第一工件W1的構成的一方可兼用為工件搬運系2,所以構成可簡化。 Further, in the second embodiment, the configuration of imaging the images of the two workpiece marks of the aligned first workpiece W1 by the two sensors 821 and 822 is performed except for the case where the first workpiece W1 is conveyed. Two sensors 821, 822 can also be transferred. However, since one of the components for conveying the first workpiece W1 can also be used as the workpiece conveyance system 2, the configuration can be simplified.

1‧‧‧光照射器 1‧‧‧Light illuminator

2‧‧‧工件搬運系 2‧‧‧Workpiece handling system

3‧‧‧工件對準器 3‧‧‧Workpiece aligner

4‧‧‧偏光方向檢測系 4‧‧‧Polarization direction detection system

5‧‧‧移送機構 5‧‧‧Transfer organization

6‧‧‧測光件對準器 6‧‧‧Light meter aligner

9‧‧‧主控制部 9‧‧‧Main Control Department

11‧‧‧光源 11‧‧‧Light source

13‧‧‧鏡 13‧‧‧Mirror

14‧‧‧燈罩 14‧‧‧shade

21‧‧‧載台 21‧‧‧ stage

23‧‧‧線性導件 23‧‧‧Linear Guides

24‧‧‧搬運用驅動源 24‧‧‧Transport drive source

31‧‧‧感測器 31‧‧‧ Sensor

40‧‧‧偏光方向檢測器 40‧‧‧Polar Direction Detector

51‧‧‧移送用驅動軸 51‧‧‧Transport drive shaft

52‧‧‧移送用驅動源 52‧‧‧Transfer drive source

53‧‧‧橫向移動軌道 53‧‧‧Transversely moving orbit

54‧‧‧滑塊 54‧‧‧ Slider

55‧‧‧被驅動塊 55‧‧‧Driven block

61‧‧‧測光件感測器 61‧‧‧Determometer sensor

121‧‧‧偏光元件 121‧‧‧Polarized components

210‧‧‧底板 210‧‧‧floor

211‧‧‧被驅動塊 211‧‧‧ driven block

212‧‧‧滑塊 212‧‧‧ Slider

401‧‧‧檢測器架台 401‧‧‧Detector stand

R‧‧‧照射區域 R‧‧‧illuminated area

W‧‧‧工件 W‧‧‧Workpiece

Claims (10)

一種光定向用偏光光照射裝置,係具備透過偏光元件將偏光光照射在配置於照射面的工件之光照射器的光定向用偏光光照射裝置,其特徵為:在工件上,設定為進行光定向而以設定定向方向作為應指向偏光光之偏光軸的方向,具備檢測照射於照射面之偏光光的偏光軸方向的偏光方向檢測系,偏光方向檢測系,可檢測上述偏光軸的方向以作為相對於裝置中所設定之基準方向的裝置基準方向的角度,工件是相對於裝置基準方向以預定的姿勢配置在照射面上以進行偏光於設定定向方向之偏光光的照射,偏光方向檢測系,具備可配置於檢測照射在照射面的偏光光之偏光軸方向的位置的偏光方向檢測器,偏光方向檢測器具備:相對於照射面成平行的姿勢的測光件;從光照射器所射出的光透過測光件而受光的受光器;及使測光件在與照射面成垂直的轉軸周圍旋轉的旋轉驅動源,以受光器受光的光的強度是根據伴隨測光件的旋轉而變化的狀態來檢測偏光方向,測光件設置有測光件對準器,測光件對準器是以具有為了檢測偏光方向使得測光件旋轉時的旋轉原點中的測光件的姿勢相對於裝置基準方向為朝著預定方向的姿勢。 A polarized light irradiation device for light direction, comprising a light-oriented polarized light irradiation device that irradiates polarized light to a light irradiator of a workpiece disposed on an irradiation surface through a polarizing element, and is characterized in that light is set on the workpiece. Oriented, and set the orientation direction as a direction to be directed to the polarization axis of the polarized light, and include a polarization direction detecting system for detecting a polarization axis direction of the polarized light irradiated on the irradiation surface, and a polarization direction detecting system capable of detecting the direction of the polarization axis as a direction The workpiece is disposed at a predetermined posture with respect to the device reference direction with respect to the device reference direction, and is irradiated with polarized light polarized in the set orientation direction with respect to the device reference direction, and the polarization direction detecting system is A polarization direction detector that can be disposed at a position that detects a direction of a polarization axis of the polarized light that is incident on the irradiation surface, the polarization direction detector includes a photometric member that is parallel to the irradiation surface, and light that is emitted from the light irradiator a light receiving device that receives light through the light measuring member; and rotates the light measuring member around a rotating shaft perpendicular to the illuminated surface The rotation driving source detects the polarization direction by the intensity of the light received by the light receiver according to the state of the change with the rotation of the light measuring member, the light measuring member is provided with the light measuring member aligner, and the light measuring member aligner is for detecting the polarized light The direction is such that the posture of the photometric member in the rotation origin when the photometric member is rotated is a posture toward the predetermined direction with respect to the device reference direction. 如申請專利範圍第1項記載的光定向用偏光光照 射裝置,其中,在上述測光件設置有對準標記,上述測光件對準器具備:檢測對準標記的測光件感測器,及藉著從測光件感測器的輸出算出對上述預定方向之測光件的姿勢偏位量的運算處理部,為上述旋轉驅動源控制以消除所算出的偏位量。 Polarized illumination for light orientation as described in item 1 of the patent application The illuminating device is provided with an alignment mark, and the photo aligning aligner is provided with: a photometric sensor for detecting an alignment mark, and calculating the predetermined direction by outputting from the photometric sensor The calculation processing unit of the posture deviation amount of the photometric member is controlled by the rotation drive source to eliminate the calculated offset amount. 如申請專利範圍第2項記載的光定向用偏光光照射裝置,其中,設有調整上述偏光元件的配置角度的偏光元件調整機構,偏光元件調整機構為可調整上述偏光元件的配置角度以消除藉偏光方向檢測系所檢測之偏光方向與設定定向方向的偏位量。 The polarizing light-illuminating device for light-oriented according to the second aspect of the invention, wherein the polarizing element adjusting mechanism that adjusts an arrangement angle of the polarizing element is provided, and the polarizing element adjusting mechanism adjusts an arrangement angle of the polarizing element to eliminate borrowing. The polarization direction detection system detects the polarization direction and the amount of deviation of the set orientation direction. 如申請專利範圍第3項記載的光定向用偏光光照射裝置,其中,具備朝上述照射面搬運工件的工件搬運系與工件對準器,上述設定定向方向是以工件的特定部位的延伸方向為基準而設定,工件對準器係藉著工件搬運系將工件搬運到上述照射面時,調整工件的姿勢使上述工件的特定部位的延伸方向相對於上述裝置基準方向成預定的方向。 The light-aligning polarized light irradiation device according to claim 3, further comprising a workpiece transport system and a workpiece aligner that transport the workpiece toward the irradiation surface, wherein the set orientation direction is a direction in which the specific portion of the workpiece extends According to the reference, when the workpiece aligner transports the workpiece to the irradiation surface by the workpiece transport system, the posture of the workpiece is adjusted so that the extending direction of the specific portion of the workpiece is in a predetermined direction with respect to the device reference direction. 如申請專利範圍第4項記載的光定向用偏光光照射裝置,其中,設有作為上述工件對準器的第一第二的兩個工件對準器,第一工件對準器是進行第一工件的對準,第二工件對準器是進行第二工件的對準, 在第一工件上形成有第一第二的兩個對準標記,並在第二工件,與第一工件相同的位置上形成有第一第二的兩個對準標記,第一工件對準器是檢測第一工件的兩個對準標記的位置,算出連結兩個對準標記的線的延伸方向與上述裝置基準方向所成的角度,調整第一工件的姿勢進行對準以使該角度成為預定的角度,第二工件對準器具備:第一第二的兩個感測器、運算處理部、記憶部、載台姿勢調整機構及移送機構,第一第二的兩個感測器被以可同時攝影各工件之兩個對準標記的位置關係配置,移送機構在以第一工件對準器完成第一工件的對準之後,移送該對準完成後的第一工件或上述第一第二的兩個感測器,以該對準完成後的姿勢的狀態作為第一感測器攝影獲得第一工件的第一對準標記的狀態,並作為第二感測器攝影獲得第二對準標記的狀態,運算處理部處理第一感測器攝影後之第一工件的第一對準標記的圖像數據而將該第一對準標記的位置資訊記憶在記憶部,並處理第一感測器攝影後之第一工件的第二對準標記的圖像數據而將該第二對準標記的位置資訊記憶在記憶部,上述工件搬運系是將第二工件搬運到以第一感測器攝影第一對準標記,並以第二感測器攝影第二對準標記的位置, 載台姿勢調整機構係根據從記憶部所讀取的位置資訊,使第二工件的第一對準標記位於第一工件之第一對準標記定位的位置上,並使得第二工件的第二對準標記位於第一工件之第二對準標記定位的位置的機構。 The light-aligning polarized light irradiation device according to claim 4, wherein the first workpiece aligner is provided as the first and second workpiece aligners, and the first workpiece aligner is first. Alignment of the workpiece, the second workpiece aligner is to perform alignment of the second workpiece, Forming two first alignment marks on the first workpiece, and forming a first and second alignment marks on the second workpiece at the same position as the first workpiece, the first workpiece alignment The device detects the positions of the two alignment marks of the first workpiece, calculates the angle between the extending direction of the line connecting the two alignment marks and the reference direction of the device, and adjusts the posture of the first workpiece to be aligned to make the angle At a predetermined angle, the second workpiece aligner includes: first and second two sensors, an arithmetic processing unit, a memory unit, a stage posture adjusting mechanism, and a transfer mechanism, and the first and second two sensors The positional relationship of the two alignment marks of each workpiece can be simultaneously photographed, and after the alignment of the first workpiece is completed by the first workpiece aligner, the first workpiece after the alignment is completed or the first a second two sensors, in a state of the posture after the alignment is completed, a state in which the first alignment mark of the first workpiece is obtained as a first sensor, and the second sensor is obtained as a second sensor Second alignment mark state, operation Processing the image data of the first alignment mark of the first workpiece after the first sensor is photographed, and memorizing the position information of the first alignment mark in the memory portion, and processing the first sensor after the photographing The image data of the second alignment mark of a workpiece is used to memorize the position information of the second alignment mark in the memory portion, and the workpiece handling system is to transport the second workpiece to the first alignment by the first sensor. Marking and photographing the position of the second alignment mark with the second sensor, The stage posture adjusting mechanism is configured to position the first alignment mark of the second workpiece at a position where the first alignment mark of the first workpiece is positioned according to the position information read from the memory portion, and make the second workpiece second The alignment mark is located at a position where the second alignment mark of the first workpiece is positioned. 一種光定向用偏光光照射方法,其特徵為,具有:將工件配置在照射面,透過偏光元件光照射於照射面而對工件照射偏光光的偏光光照射步驟,及檢測照射於照射面的偏光光的偏光軸方向之偏光方向的偏光方向檢測步驟,在工件上,設定為進行光定向而以設定定向方向作為應指向偏光光之偏光軸的方向,並在裝置設定有裝置基準方向,偏光光照射步驟是相對於裝置基準方向以預定的姿勢將工件配置在照射面上以進行偏光於設定定向方向之偏光光的照射,偏光方向檢測步驟是取代工件在照射面配置偏光方向檢測器以檢測偏光軸的方向的步驟,偏光方向檢測器具備:相對於照射面成平行姿勢的測光件;透過測光件接受來自光照射器所射出的光的受光器;使測光件在相對於照射面垂直的轉軸周圍旋轉的旋轉驅動源,根據受光器所受光的光的強度隨著測光件的旋轉而變化的狀態進行偏光方向的檢測,設有測光件對準步驟,使得測光件旋轉時之旋轉原點的測光件的姿勢相對於裝置基準方向朝著預定方向的姿勢 來檢測偏光方向,偏光方向檢測步驟是在測光件對準步驟之後偏光方向檢測器檢測偏光方向的步驟。 A method of irradiating a polarized light for aligning light, comprising: arranging a workpiece on an irradiation surface, irradiating the irradiation surface with a polarized light, irradiating the workpiece with a polarized light, and detecting a polarized light irradiated to the irradiated surface In the polarization direction detecting step of the polarization direction of the light in the direction of the polarization axis, the workpiece is set to perform light orientation, and the orientation direction is set as the direction of the polarization axis to be directed to the polarization light, and the device reference direction is set in the device, and the polarization light is set. The illuminating step is arranging the workpiece on the illuminating surface in a predetermined posture with respect to the device reference direction to perform polarized light polarized in the set directional direction. The polarizing direction detecting step is to arrange the polarizing direction detector on the illuminating surface instead of the workpiece to detect the polarized light. The step of the direction of the axis, the polarization direction detector includes: a photometric member that is in a parallel posture with respect to the illumination surface; a photoreceptor that receives the light emitted from the light irradiator through the photometric member; and the optical axis of the photometric member that is perpendicular to the illumination surface Rotating drive source rotating around, according to the intensity of light received by the light receiver with metering A state change detecting rotation of the polarization direction, the metering member is provided with the alignment step, so that the posture of the metering member when the origin of rotation of the rotary metering member means toward the reference direction predetermined posture relative to the direction To detect the polarization direction, the polarization direction detecting step is a step of detecting the polarization direction by the polarization direction detector after the photometric member alignment step. 如申請專利範圍第6項記載的光定向用偏光光照射方法,其中,在上述測光件設有對準標記,上述測光件對準步驟為控制上述旋轉驅動源的步驟,該控制步驟是以測光件感測器檢測上述測光件的對準標記,藉著從該測光件感測器的輸出並以運算處理部算出測光件相對於上述預定方向之測光件的姿勢的偏位量,來消除所算出的偏位量。 The method of irradiating a polarized light for light direction according to claim 6, wherein the photometric member is provided with an alignment mark, and the photometric member alignment step is a step of controlling the rotation drive source, the control step is a photometry The sensor detects the alignment mark of the photometric member, and eliminates the amount of deviation of the posture of the photometric member from the photometric member in the predetermined direction by the output from the photometric member sensor and the arithmetic processing portion Calculated offset amount. 如申請專利範圍第7項記載的光定向用偏光光照射方法,其中,具有調整上述偏光元件的配置角度的偏光元件調整步驟,上述偏光元件調整步驟是藉偏光元件調整機構調整上述偏光元件的配置角度來消除偏光方向檢測系所檢測之偏光方向與設定定向方向的偏位量的步驟。 The polarizing light irradiation method according to claim 7, wherein the polarizing element adjusting step of adjusting an arrangement angle of the polarizing element, wherein the polarizing element adjusting step adjusts the arrangement of the polarizing element by a polarizing element adjusting mechanism The angle is used to eliminate the step of the polarization direction detected by the polarization direction detecting system and the amount of deviation of the set orientation direction. 如申請專利範圍第8項記載的光定向用偏光光照射方法,其中,具有將工件搬運到上述照射面的工件搬運步驟,及工件對準步驟,上述設定定向方向是以工件的特定部位的延伸方向為基準而設定,工件對準步驟是在工件搬運步驟中,將工件搬運到上述照射面時,調整工件的姿勢使上述工件的特定部位的延伸方向相對於上述裝置基準方向成預定方向的步驟。 The method of irradiating a polarized light for light direction according to the eighth aspect of the invention, wherein the method of transporting a workpiece to the irradiation surface, and a workpiece alignment step, wherein the setting orientation direction is an extension of a specific portion of the workpiece The direction is set as a reference, and the workpiece alignment step is a step of adjusting the posture of the workpiece so that the extending direction of the specific portion of the workpiece is in a predetermined direction with respect to the device reference direction when the workpiece is conveyed to the irradiation surface in the workpiece conveyance step . 如申請專利範圍第9項記載的光定向用偏光光照射方法,其中,具有作為上述工件對準步驟的第一第二的兩個工件對準步驟,第一工件對準步驟是進行第一工件對準的步驟,第二工件對準步驟是進行第二工件對準的步驟,在第一工件上形成有第一第二的兩個對準標記,並在第二工件,與第一工件相同的位置上形成有第一第二的兩個對準標記,第一工件對準步驟是檢測第一工件的兩個對準標記的位置,算出連結兩個對準標記的線的延伸方向與上述裝置基準方向所成的角度,調整第一工件的姿勢進行對準以使該角度成為預定角度的步驟,第二工件對準步驟具有:第一攝影步驟、位置資訊記憶步驟、第二攝影步驟及對準步驟,第一攝影步驟是在結束第一工件的對準之後,藉移送機構移送該等對準結束後之第一工件或上述第一第二的兩個感測器,以該等對準結束後之姿勢的狀態藉第一感測器進行第一工件之第一對準標記的攝影的同時,藉第二感測器進行第二對準標記的攝影的步驟,位置資訊記憶步驟是處理第一感測器攝影後之第一工件的第一對準標記的圖像數據將該第一對準標記的位置資訊記憶於記憶部,並處理第一感測器攝影後之第一工件的第二對準標記的圖像數據將該第二對準標記的位置資訊記憶於記憶部的步驟, 第二攝影步驟是將第二工件搬運到各感測器的攝影位置,並藉第一感測器攝影第一工件的第一對準標記的同時,藉第二感測器攝影第二對準標記的步驟,對準步驟係讀取記憶在記憶部的位置資訊,根據所讀取的位置資訊,使第二工件的第一對準標記位於第一工件之第一對準標記定位的位置上,並使得第二工件的第二對準標記位於第一工件之第二對準標記定位的位置上的步驟。 The method of irradiating a polarized light for light direction according to claim 9, wherein the first workpiece alignment step is the first workpiece alignment step of the workpiece alignment step, and the first workpiece alignment step is performed on the first workpiece In the step of aligning, the second workpiece alignment step is a step of aligning the second workpiece, the first and second alignment marks are formed on the first workpiece, and the second workpiece is the same as the first workpiece Forming a first and second alignment marks on the first workpiece, the first workpiece alignment step is to detect the positions of the two alignment marks of the first workpiece, and calculate the extending direction of the line connecting the two alignment marks with the above An angle formed by the reference direction of the device, adjusting a posture of the first workpiece to be aligned to make the angle a predetermined angle, and the second workpiece alignment step has: a first photographing step, a position information memory step, a second photographing step, and In the aligning step, the first photographic step is to transfer the first workpiece after the alignment or the first and second sensors by the transfer mechanism after the alignment of the first workpiece is finished, in the pair quasi- The state of the posture after the end is performed by the first sensor performing the photographing of the first alignment mark of the first workpiece, and the step of photographing the second alignment mark by the second sensor, the position information memory step is processing The image data of the first alignment mark of the first workpiece after the first sensor is photographed, the position information of the first alignment mark is memorized in the memory portion, and the first workpiece after the first sensor is processed is processed. The image data of the second alignment mark stores the position information of the second alignment mark in the memory portion, The second photographing step is to transport the second workpiece to the photographing position of each sensor, and photograph the second alignment by the second sensor while the first sensor photographs the first alignment mark of the first workpiece. In the step of marking, the aligning step reads the position information stored in the memory portion, and according to the read position information, the first alignment mark of the second workpiece is located at the position where the first alignment mark of the first workpiece is positioned. And causing the second alignment mark of the second workpiece to be located at a position where the second alignment mark of the first workpiece is positioned.
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