TWI528040B - Printed board inspection device - Google Patents

Printed board inspection device Download PDF

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Publication number
TWI528040B
TWI528040B TW103127590A TW103127590A TWI528040B TW I528040 B TWI528040 B TW I528040B TW 103127590 A TW103127590 A TW 103127590A TW 103127590 A TW103127590 A TW 103127590A TW I528040 B TWI528040 B TW I528040B
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Taiwan
Prior art keywords
inspection
circuit board
printed circuit
tray
unit
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TW103127590A
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Chinese (zh)
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TW201512682A (en
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Toshiaki Hanaoka
Shigetaka NAKANO
Hirokazu Uemura
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Taiyo Ind Co Ltd
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0266Marks, test patterns or identification means
    • H05K1/0268Marks, test patterns or identification means for electrical inspection or testing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G01R1/07335Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards for double-sided contacting or for testing boards with surface-mounted devices (SMD's)
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805Bare printed circuit boards
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/01Tools for processing; Objects used during processing
    • H05K2203/0147Carriers and holders
    • H05K2203/0165Holder for holding a Printed Circuit Board [PCB] during processing, e.g. during screen printing

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Environmental & Geological Engineering (AREA)

Description

印刷基板檢查裝置 Printed substrate inspection device

本發明係關於一種檢查印刷基板的導通不良及絕緣不良的印刷基板檢查裝置。 The present invention relates to a printed circuit board inspection apparatus for inspecting a conduction failure of a printed substrate and insulation failure.

一般而言,作為檢查印刷基板的導通不良及絕緣不良的方式,有銷接觸(pin contact)方式與非接觸方式。其中,於銷接觸方式的檢查裝置中,複數個檢查銷各自的端部透過連接器,而電性連接於對檢查對象基板的電性導通的狀態進行判定的控制部。而且,於使檢查銷的前端接觸於檢查對象基板上所設的配線的狀態下,向檢查銷間施加電壓而測量電阻值,藉此,判斷導通及絕緣的良否。 Generally, as a method of inspecting a poor conduction and insulation failure of a printed circuit board, there are a pin contact method and a non-contact method. In the inspection apparatus of the pin contact type, the end portions of the plurality of inspection pins are transmitted through the connector, and are electrically connected to a control unit that determines the state of electrical conduction of the inspection target substrate. Further, in a state where the tip end of the inspection pin is brought into contact with the wiring provided on the inspection target substrate, a voltage is applied between the inspection pins, and the resistance value is measured, thereby determining whether the conduction and the insulation are good or not.

於上述銷接觸方式的檢查裝置中,當檢查對象為可撓性印刷基板時,為了不會因印刷基板的翹曲或扭轉而產生檢查不良,採取了多種對策。 In the above-described pin contact type inspection apparatus, when the inspection target is a flexible printed circuit board, various measures are taken in order to prevent inspection failure due to warpage or twist of the printed circuit board.

專利文獻1的先前技術欄中記載的檢查裝置中,將檢查用印刷基板載置於安裝有真空墊片的平板上,對可撓性印刷基板進行真空吸附而將其固定於平板,於此狀態下對其進行檢查。若於此種狀態下進行檢查,則即便檢查銷抵觸於墊片,印刷基板亦不會變形,故而,能進行準確的檢查。 In the inspection apparatus described in the prior art column of Patent Document 1, the inspection printed circuit board is placed on a flat plate on which the vacuum gasket is mounted, and the flexible printed circuit board is vacuum-adsorbed and fixed to the flat plate. Check it below. When the inspection is performed in this state, the printed circuit board is not deformed even if the inspection pin is in contact with the spacer, so that an accurate inspection can be performed.

對此,專利文獻1的實施方式欄中記載的檢查裝置中,利用 夾持器夾住可撓性印刷基板的緣部,於此狀態下進行拉伸,於印刷基板成為平面的狀態下,使檢查銷的前端接觸於印刷基板的墊片。 In this regard, the inspection apparatus described in the column of the embodiment of Patent Document 1 utilizes The holder sandwiches the edge of the flexible printed circuit board and stretches in this state, and the front end of the inspection pin is brought into contact with the spacer of the printed circuit board in a state where the printed circuit board is flat.

根據此檢查裝置,即便未利用真空墊片吸附印刷基板而將其固定,亦可進行檢查。進而,因能同時進行雙面的檢查,故而能縮短檢查所需的時間。 According to this inspection apparatus, even if the printed circuit board is not fixed by the vacuum gasket, it can be inspected. Further, since the double-sided inspection can be performed at the same time, the time required for the inspection can be shortened.

另一方面,當製造可撓性印刷基板時,多數情況下,於一片片狀印刷基板複數形成相同形狀的配線圖案,檢查結束後,切斷片狀印刷基板,分離成獨立的印刷基板。此種印刷基板是以片材的狀態進行檢查。 On the other hand, when manufacturing a flexible printed circuit board, in many cases, a wiring pattern of the same shape is formed in a plurality of sheet-shaped printed boards, and after the inspection is completed, the sheet-shaped printed circuit board is cut and separated into independent printed boards. Such a printed substrate is inspected in the state of a sheet.

當檢查印刷基板時,須製成專用的夾具,該夾具中,於與印刷基板的檢查部位對應的位置配置有檢查銷。該夾具中,檢查銷的數量越多則價格越高,故而,對於上述的片狀印刷基板,準備具有對應個別印刷基板數量的檢查銷的檢查夾具,一面使片材的位置錯開,一面對各別的印刷基板進行檢查。 When the printed circuit board is inspected, it is necessary to form a dedicated jig in which an inspection pin is disposed at a position corresponding to the inspection portion of the printed circuit board. In the jig, the larger the number of inspection pins, the higher the price. Therefore, in the above-described sheet-like printed circuit board, an inspection jig having inspection pins corresponding to the number of individual printed boards is prepared, and the positions of the sheets are shifted to face each other. Each printed substrate is inspected.

[先行技術文獻] [Advanced technical literature]

[專利文獻] [Patent Literature]

[專利文獻1]日本特表2007-529008號公報 [Patent Document 1] Japanese Patent Publication No. 2007-529008

於專利文獻1的先前技術欄所記載的、於吸附印刷基板的狀態下進行檢查的類型之檢查裝置中,須對印刷基板的每一單面進行檢查。而且,須配合印刷基板的移動而使平板移動、或每當移動時須解除吸附且於移動後再次吸附印刷基板,故而,檢查裝置的構造變得複雜化且大型化。 In the inspection apparatus of the type described in the prior art column of Patent Document 1, which is inspected in a state in which the printed substrate is adsorbed, it is necessary to inspect each side of the printed substrate. Further, the plate needs to be moved in accordance with the movement of the printed substrate, or the film must be released every time the film is moved, and the printed substrate is again adsorbed after the movement. Therefore, the structure of the inspection device is complicated and large.

進而,於吸附印刷基板的狀態下進行檢查的檢查裝置中,須對於雙面形成有配線的印刷基板的每一單面進行檢查、且於單面的檢查結束後使片材翻轉,故而,至檢查完成為止須花費時間。 Further, in the inspection apparatus that performs inspection in a state in which the printed substrate is adsorbed, it is necessary to inspect each single surface of the printed circuit board on which the wiring is formed on both sides, and to invert the sheet after the inspection of one side is completed, so that It takes time until the check is completed.

另一方面,如專利文獻1的實施方式欄所記載,於利用夾持器夾住可撓性印刷基板的緣部的狀態下進行檢查的裝置中,雖能同時進行雙面檢查,但至檢查結束為止期間,為了不產生翹曲或扭轉,須持續拉伸印刷基板,需要有能準確地控制張力的夾持器,故而,檢查裝置價格升高。 On the other hand, in the apparatus for inspecting the edge of the flexible printed circuit board by the holder, as described in the embodiment of the patent document 1, the double-sided inspection can be performed at the same time, but the inspection is performed. During the period from the end, in order to prevent warpage or twisting, the printed circuit board must be continuously stretched, and a holder capable of accurately controlling the tension is required. Therefore, the price of the inspection apparatus is increased.

本發明係鑒於上述問題而完成,其目的在於提供一種無需對印刷基板進行吸附或拉伸,而且能同時檢查印刷基板的雙面的檢查裝置。 The present invention has been made in view of the above problems, and an object thereof is to provide an inspection apparatus capable of simultaneously inspecting both sides of a printed substrate without adsorbing or stretching the printed substrate.

為了達成上述目的,本發明的印刷基板檢查裝置係使檢查銷接觸於至少一個面形成有配線的印刷基板的該配線的規定部位,並且透過上述配線而向所選擇的2根檢查銷之間施加電壓,從而檢查上述印刷基板的導通或絕緣的良否;其特徵在於具備:板狀的托盤,其載置上述印刷基板且由絕緣材料形成;上檢查夾具,其對上述印刷基板的上表面的配線進行檢查、及下檢查夾具,其對下表面的配線進行檢查;升降單元,其使配置於上述下檢查夾具上方的上述上檢查夾具下降,且利用上述上檢查夾具及下檢查夾具夾住處於載置於上述托盤的狀態的印刷基板,藉此,使上述上檢查夾具的檢查銷與上述印刷基板的配線接觸;檢查單元,其向上述上檢查夾具的所選擇的2根檢查銷之間施加電壓,並且測量其間的電阻值;及控制單元,其控制上述升降單元的動作。 In order to achieve the above object, in the printed circuit board inspection apparatus of the present invention, the inspection pin is brought into contact with a predetermined portion of the wiring of the printed circuit board on which the wiring is formed on at least one surface, and is applied to the selected two inspection pins through the wiring. a voltage for inspecting whether the printed circuit board is electrically connected or insulated, and comprising: a plate-shaped tray on which the printed circuit board is placed and formed of an insulating material; and an upper inspection jig that wires the upper surface of the printed circuit board Performing inspection and a lower inspection jig for inspecting wiring on the lower surface; and elevating unit that lowers the upper inspection jig disposed above the lower inspection jig, and clamps the load with the upper inspection jig and the lower inspection jig a printed circuit board placed in the state of the tray, whereby the inspection pin of the upper inspection jig is in contact with the wiring of the printed circuit board; and the inspection unit applies a voltage between the selected two inspection pins of the upper inspection jig And measuring the resistance value therebetween; and a control unit that controls the action of the lifting unit.

此處,較佳為,上述下檢查夾具的檢查銷係穿過形成於上述 托盤的開口部而接觸於上述印刷基板的下表面的配線,上述檢查單元向上述上檢查夾具及下檢查夾具的所選擇的2根檢查銷之間施加電壓,並且測量其間的電阻值。 Here, preferably, the inspection pin of the lower inspection jig is formed through the above The opening of the tray contacts the wiring on the lower surface of the printed circuit board, and the inspection unit applies a voltage between the selected two inspection pins of the upper inspection jig and the lower inspection jig, and measures the resistance value therebetween.

而且,較佳為,於上述托盤的上表面安裝有第1導銷,該第1導銷係插入至上述印刷基板上所形成的定位用孔。同樣,較佳為,於上述下檢查夾具的上表面安裝有第2導銷,該第2導銷係插入至上述印刷基板及托盤上各自形成的定位用孔。 Further, it is preferable that a first guide pin is attached to the upper surface of the tray, and the first guide pin is inserted into a positioning hole formed in the printed circuit board. Similarly, it is preferable that a second guide pin is attached to the upper surface of the lower inspection jig, and the second guide pin is inserted into a positioning hole formed in each of the printed circuit board and the tray.

較佳為,本發明的印刷基板檢查裝置具備一對基板搬送單元,其於水平方向對載置於上述托盤的印刷基板進行搬送,該基板搬送單元具備:托盤台,其載置有上述托盤的端部,且上表面安裝有第3導銷,該第3導銷係插入至該托盤上所形成的定位用孔;及夾頭,其與該托盤台一同抓持上述托盤。 Preferably, the printed circuit board inspection apparatus of the present invention includes a pair of substrate transfer units that transport the printed circuit board placed on the tray in a horizontal direction, and the substrate transfer unit includes a tray stage on which the tray is placed. a third guide pin is attached to the upper surface, and the third guide pin is inserted into a positioning hole formed in the tray; and a chuck that grips the tray together with the tray.

此處,較佳為,上述基板搬送單元係以上述托盤台能於上下方向移動的方式構成,當檢查結束後,使載置於上述托盤台的托盤上升,且自上述印刷基板的定位用孔取下上述下檢查夾具的第2導銷。同樣,較佳為,上述基板搬送單元係當對載置於上述托盤台的托盤進行搬送時,使上述托盤台上升至不接觸於上述下檢查夾具的位置為止,當進行檢查時,使上述托盤台下降至上述托盤載置於上述下檢查夾具的位置為止。 Here, it is preferable that the substrate transfer unit is configured such that the tray stage can be moved in the vertical direction, and after the inspection is completed, the tray placed on the tray stage is raised, and the positioning hole from the printed board is used. Remove the second guide pin of the lower inspection jig. Similarly, it is preferable that the substrate transport unit raises the tray to a position that does not contact the lower inspection jig when transporting the tray placed on the tray table, and when the inspection is performed, the tray is caused to be inspected. The table is lowered until the tray is placed at the position of the lower inspection jig described above.

而且,較佳為,上述基板搬送單元係當上述托盤載置於上述下檢查夾具時,使上述夾頭鬆開對上述托盤的抓持。 Further, preferably, the substrate transfer unit causes the chuck to release the grip of the tray when the tray is placed on the lower inspection jig.

較佳為,本發明的印刷基板檢查裝置中,於沿上述一對基板搬送單元的移動路徑而設置的一對滑動平台之間設置有基板反轉單元,該 基板反轉單元係使載置於上述托盤的印刷基板的方向反轉,該基板反轉單元係由如下部件構成:平台,其載置上述托盤;旋轉機構,其使該平台旋轉;及第1升降機構,其使該平台於上下方向移動。 Preferably, in the printed circuit board inspection device of the present invention, a substrate inverting unit is provided between a pair of sliding platforms provided along a moving path of the pair of substrate conveying units, and The substrate inverting unit reverses the direction of the printed substrate placed on the tray, and the substrate inverting unit is configured by: a platform on which the tray is placed; a rotating mechanism that rotates the platform; and the first A lifting mechanism that moves the platform in the up and down direction.

而且,較佳為,本發明的印刷基板檢查裝置中,於沿上述一對基板搬送單元的移動路徑而設置的一對滑動平台之間設置有識別標記賦予機構,該識別標記賦予機構係對上述印刷基板上所形成的複數個配線圖案中判定為導通不良或絕緣不良的配線圖案,賦予識別用標記。 Further, in the printed circuit board inspection device of the present invention, it is preferable that an identification mark providing mechanism is provided between the pair of slide platforms provided along the movement path of the pair of substrate transfer units, and the identification mark imparting mechanism is Among the plurality of wiring patterns formed on the printed circuit board, a wiring pattern which is determined to be poor in conduction or poor in insulation is provided, and an identification mark is provided.

此處,較佳為,上述識別標記賦予機構係由衝孔單元構成,該衝孔單元具備:上衝孔器及下衝孔器,其以夾住上述印刷基板的方式彼此撞擊,從而於該印刷基板開孔;滑件,其使該上衝孔器及下衝孔器於與上述基板搬送單元的搬送方向正交的方向移動;及第2及第3升降機構,其使該上衝孔器及下衝孔器各自於上下方向移動。 Here, it is preferable that the identification mark providing mechanism is constituted by a punching unit including: an upper punch and a lower punch that collide with each other so as to sandwich the printed circuit board, thereby a printed circuit board opening; the slider moving the upper punch and the lower punch in a direction orthogonal to a transport direction of the substrate transport unit; and the second and third elevating mechanisms for punching the upper punch The lower punch and the lower punch are each moved in the up and down direction.

若使用本發明的檢查裝置,係於將印刷基板載置於托盤的狀態下進行搬送及檢查,無需考慮到印刷基板的翹曲或扭轉,故而,檢查裝置的構造變得簡單,對結果而言,能低價地製造裝置。而且,能同時檢查印刷基板的雙面,故而,能縮短檢查所需的時間。 When the inspection apparatus of the present invention is used for transporting and inspecting a printed circuit board in a state of being placed on a tray, it is not necessary to consider warpage or twist of the printed circuit board, and therefore, the structure of the inspection apparatus is simplified, and as a result, The device can be manufactured at low cost. Moreover, since both sides of the printed substrate can be inspected at the same time, the time required for the inspection can be shortened.

1‧‧‧基板檢查裝置 1‧‧‧Substrate inspection device

2‧‧‧印刷基板 2‧‧‧Printing substrate

3‧‧‧托盤 3‧‧‧Tray

4‧‧‧上檢查夾具 4‧‧‧Checking fixture

5‧‧‧下檢查夾具 5‧‧‧Under inspection fixture

6‧‧‧升降單元 6‧‧‧ Lifting unit

7‧‧‧基板搬送單元 7‧‧‧Substrate transport unit

8‧‧‧控制單元 8‧‧‧Control unit

9‧‧‧檢查單元 9‧‧‧Check unit

11‧‧‧基板反轉單元 11‧‧‧Substrate reversal unit

12‧‧‧衝孔單元 12‧‧‧punching unit

101‧‧‧基台 101‧‧‧Abutment

102、603‧‧‧平板 102, 603‧‧‧ tablet

103、607‧‧‧安裝件 103, 607‧‧‧Installation

111‧‧‧平台 111‧‧‧ platform

112‧‧‧旋轉軸 112‧‧‧Rotary axis

113、123、604、705、715、721‧‧‧氣缸 113, 123, 604, 705, 715, 721‧‧ ‧ cylinder

121‧‧‧上衝孔器 121‧‧‧Upper punch

122‧‧‧下衝孔器 122‧‧‧Under puncher

124‧‧‧滑件 124‧‧‧Sliding parts

201‧‧‧配線 201‧‧‧ wiring

202、302、303‧‧‧定位用孔 202, 302, 303‧‧‧ positioning holes

203‧‧‧墊片 203‧‧‧shims

301、504、713‧‧‧導銷 301, 504, 713‧‧ ‧ sales guide

304‧‧‧開口部 304‧‧‧ openings

401、501‧‧‧檢查板 401, 501‧‧‧ inspection board

402、502‧‧‧支撐板 402, 502‧‧‧ support plate

403、503、601‧‧‧支柱 403, 503, 601‧‧ ‧ pillar

411、412‧‧‧板 411, 412‧‧‧ boards

413‧‧‧押出構件 413‧‧‧Exiting components

414‧‧‧罩體 414‧‧‧ Cover

415‧‧‧押出銷 415‧‧‧Exit sales

416、420‧‧‧壓縮彈簧 416, 420‧‧‧ compression spring

417‧‧‧探針 417‧‧‧ probe

418‧‧‧檢查銷 418‧‧‧Checkout

419‧‧‧基座 419‧‧‧Base

422‧‧‧絕緣管 422‧‧‧Insulation tube

423‧‧‧導線 423‧‧‧ wire

602‧‧‧頂板 602‧‧‧ top board

605、706、716、723‧‧‧活塞桿 605, 706, 716, 723‧‧ ‧ piston rod

606、708、731‧‧‧線性導軌 606, 708, 731‧‧‧ linear guides

701‧‧‧滑動平台 701‧‧‧ sliding platform

702‧‧‧滑動塊體 702‧‧‧Sliding block

704‧‧‧導引安裝板 704‧‧‧Guide mounting plate

707、717‧‧‧連結板 707, 717‧‧‧ link board

711‧‧‧懸臂基座 711‧‧‧Cantilever base

712‧‧‧托盤台 712‧‧‧Tray table

718‧‧‧氣缸安裝板 718‧‧‧Cylinder mounting plate

724、716‧‧‧銷 724, 716‧‧ sales

727‧‧‧胺基甲酸酯片材 727‧‧‧Aminoformate sheet

800‧‧‧處理器 800‧‧‧ processor

801、901‧‧‧輸入顯示部 801, 901‧‧‧ input display unit

802、903‧‧‧記憶部 802, 903‧‧‧ Memory Department

902‧‧‧測量部 902‧‧Measurement Department

904‧‧‧控制部 904‧‧‧Control Department

圖1係本發明的實施形態1的印刷基板檢查裝置的主要構成構件的正視圖。 Fig. 1 is a front elevational view showing main components of a printed circuit board inspection device according to a first embodiment of the present invention.

圖2係自圖1的X-X線觀察下方時、實施形態1的印刷基板檢查裝置 的俯視圖。 2 is a printed circuit board inspection apparatus according to Embodiment 1 when viewed from the X-X line of FIG. Top view.

圖3係表示實施形態1的印刷基板檢查裝置的電系統的構成的塊狀圖。 3 is a block diagram showing a configuration of an electric system of the printed circuit board inspection device according to the first embodiment.

圖4係表示托盤及載置於托盤的印刷基板的一例的俯視圖。 4 is a plan view showing an example of a tray and a printed substrate placed on the tray.

圖5係表示自下方仰視載置於托盤的印刷基板2的一部分時的狀態的圖。 FIG. 5 is a view showing a state in which a part of the printed circuit board 2 placed on the tray is viewed from below.

圖6係實施形態1的上檢查夾具的主要部分剖面圖。 Fig. 6 is a cross-sectional view showing the main part of the upper inspection jig of the first embodiment.

圖7係實施形態1的基板搬送單元的正視圖。 Fig. 7 is a front elevational view showing the substrate transfer unit of the first embodiment.

圖8係上述基板搬送單元的俯視圖。 Fig. 8 is a plan view of the substrate transfer unit.

圖9係上述基板搬送單元的側視圖。 Fig. 9 is a side view of the substrate transfer unit.

圖10係對印刷基板檢查裝置的動作進行說明的流程圖。 FIG. 10 is a flowchart for explaining an operation of the printed circuit board inspection device.

圖11係對上檢查夾具與下檢查夾具的動作進行說明的主要部分正視圖。 Fig. 11 is a front elevational view showing the main part of the operation of the upper inspection jig and the lower inspection jig.

圖12係表示實施形態2的印刷基板檢查裝置的基板反轉單元與衝孔單元的構成的俯視圖。 FIG. 12 is a plan view showing a configuration of a substrate inverting unit and a punching unit of the printed circuit board inspection device according to the second embodiment.

以下,參照圖式,對於本發明的實施形態的印刷基板檢查裝置進行說明。 Hereinafter, a printed circuit board inspection apparatus according to an embodiment of the present invention will be described with reference to the drawings.

(實施形態1) (Embodiment 1)

<印刷基板檢查裝置的構成> <Configuration of Printed Substrate Inspection Apparatus>

圖1係自正面觀察本發明的實施形態1的印刷基板檢查裝置(以下,簡稱為「檢查裝置」)的主要構成構件的圖,圖2係自圖1的X-X線觀察下方的圖,圖3係表示檢查裝置的電系統的構成的塊狀圖。再者,圖2中省 略了支柱601,且考慮到易看性,僅以2點鏈線來表示托盤3的輪廓。 1 is a view showing a main constituent member of a printed circuit board inspection device (hereinafter simply referred to as "inspection device") according to the first embodiment of the present invention, and FIG. 2 is a view from below the line XX of FIG. A block diagram showing the configuration of an electrical system of an inspection device. Furthermore, the province in Figure 2 The pillar 601 is omitted, and the outline of the tray 3 is represented by only a 2-point chain line in consideration of the visibility.

本實施形態的檢查裝置1主要用於對表背雙面形成有配線的可撓性印刷基板(以下,亦簡稱為「印刷基板」)進行檢查,且由如下部件構成:對印刷基板2的上表面的配線進行檢查的上檢查夾具4、同樣對下表面的配線進行檢查的下檢查夾具5、使上檢查夾具4於上下方向移動的升降單元6、及於水平方向對載置有印刷基板2的托盤3進行搬送的一對基板搬送單元7。 The inspection apparatus 1 of the present embodiment is mainly used for inspecting a flexible printed circuit board (hereinafter also simply referred to as a "printed substrate") having wiring on both sides of the front and back sides, and is composed of the following members: on the printed circuit board 2 The upper inspection jig 4 for inspecting the surface wiring, the lower inspection jig 5 for inspecting the wiring on the lower surface, the elevating unit 6 for moving the upper inspection jig 4 in the vertical direction, and the printed substrate 2 placed in the horizontal direction The pair of substrate transfer units 7 that are transported by the tray 3 are transported.

於對檢查裝置1的各部分的構成進行說明之前,對於本發明的檢查裝置的特徵點進行說明。 Before describing the configuration of each part of the inspection apparatus 1, the features of the inspection apparatus of the present invention will be described.

本發明的檢查裝置的第1特徵點在於:對於上述的可撓性印刷基板2,在載置於平板狀的托盤3的狀態下進行檢查。如先前技術欄中的說明所述,於以可撓性印刷基板為對象的習知的檢查裝置中,為了不會因印刷基板的翹曲或扭轉而產生檢查不良,而於對印刷基板進行真空吸附從而固定於平板的狀態下進行檢查,或於利用夾持器使基板的緣部拉伸的狀態下進行檢查。 The first feature of the inspection apparatus of the present invention is that the flexible printed circuit board 2 described above is inspected while being placed on the flat tray 3. As described in the description of the prior art, in a conventional inspection apparatus for a flexible printed circuit board, vacuum is applied to the printed substrate in order not to cause inspection failure due to warpage or twist of the printed substrate. The inspection is performed while being adsorbed and fixed to the flat plate, or in a state where the edge of the substrate is stretched by the holder.

對此,本發明的檢查裝置中,利用上檢查夾具4與下檢查夾具5夾住載置於平板狀的托盤3的印刷基板2,於此狀態下進行檢查。若在載置於托盤3的狀態下對可撓性印刷基板2進行檢查,則印刷基板不會產生翹曲或扭轉,故而,無需吸附印刷基板或利用夾持器進行拉伸。進而,因能採用利用上檢查夾具4與下檢查夾具5夾住載置於托盤3的印刷基板2這一簡單的構成,故而,能使檢查裝置的的成本大幅降低。 In the inspection apparatus of the present invention, the printed circuit board 2 placed on the flat tray 3 is sandwiched between the upper inspection jig 4 and the lower inspection jig 5, and inspection is performed in this state. When the flexible printed circuit board 2 is inspected while being placed on the tray 3, the printed board does not warp or twist, so that it is not necessary to adsorb the printed board or stretch by the holder. Further, since the simple configuration of sandwiching the printed circuit board 2 placed on the tray 3 by the upper inspection jig 4 and the lower inspection jig 5 can be employed, the cost of the inspection apparatus can be greatly reduced.

圖4(a)中表示托盤3的一例,圖4(b)中表示載置於托 盤3的印刷基板2的一例。於由絕緣性的合成樹脂製作的平板狀的托盤3,形成有4根導銷301、複數個定位用孔302及303、以及複數個開口部304。另一方面,於印刷基板2,形成有配線201與定位用複數個孔202。 An example of the tray 3 is shown in Fig. 4(a), and it is shown in Fig. 4(b). An example of the printed circuit board 2 of the disk 3. In the flat tray 3 made of an insulating synthetic resin, four guide pins 301, a plurality of positioning holes 302 and 303, and a plurality of openings 304 are formed. On the other hand, in the printed circuit board 2, a wiring 201 and a plurality of holes 202 for positioning are formed.

導銷301兼用於防止印刷基板2的脫落,藉由將導銷301分別插入至設於印刷基板2的對向位置的4個孔202,而使印刷基板2牢固地固定於托盤3。因此,當使用基板搬送單元7搬送托盤3時,印刷基板2不會自托盤3脫落或出現位置偏離。 The guide pin 301 also serves to prevent the printed circuit board 2 from coming off, and the printed circuit board 2 is firmly fixed to the tray 3 by inserting the guide pins 301 into the four holes 202 provided at the opposite positions of the printed circuit board 2, respectively. Therefore, when the tray 3 is transported using the substrate transport unit 7, the printed circuit board 2 does not fall off from the tray 3 or is displaced.

形成於托盤3的左右兩端部的4個孔302係當利用基板搬送單元7搬送托盤3時使用,且若於安裝在托盤台712的導銷713(參照圖7)已插入至孔302的狀態下搬送托盤3,則托盤3不會自基板搬送單元7脫落。 The four holes 302 formed at the left and right end portions of the tray 3 are used when the tray 3 is transported by the substrate transport unit 7, and the guide pins 713 (see FIG. 7) attached to the tray table 712 are inserted into the holes 302. When the tray 3 is transported in the state, the tray 3 does not fall off from the substrate transport unit 7.

形成於托盤3的其他孔303與形成於印刷基板2的對向位置的孔202係對應於檢查夾具的定位用孔,藉由將設於下檢查夾具5的導銷504插入至該等孔,使印刷基板2相對於下檢查夾具5而準確地定位。 The other holes 303 formed in the tray 3 and the holes 202 formed at the opposite positions of the printed substrate 2 correspond to the positioning holes of the inspection jig, and the guide pins 504 provided in the lower inspection jig 5 are inserted into the holes, The printed substrate 2 is accurately positioned with respect to the lower inspection jig 5.

設於托盤3的複數個開口部304係當檢查時用於使下檢查夾具5的檢查銷接觸於印刷基板2的下表面上所形成的配線201的檢查對象部位(例如墊片)。藉由於托盤3設置開口部304,從而,即便於印刷基板2載置於托盤3的狀態下,亦能無障礙地進行檢查。 The plurality of openings 304 provided in the tray 3 are used to inspect the inspection target portion (for example, a spacer) of the wiring 201 formed on the lower surface of the printed circuit board 2 when the inspection pin of the lower inspection jig 5 is inspected. Since the opening portion 304 is provided in the tray 3, the inspection can be performed without any trouble even if the printed circuit board 2 is placed on the tray 3.

當進行檢查時,使用升降單元6使上檢查夾具4下降,而利用上檢查夾具4與下檢查夾具5來夾住載置於平板狀的托盤3的印刷基板2。該狀態下,使設於各檢查夾具的檢查銷接觸於印刷基板2的墊片等,從而檢查配線的導通不良或絕緣不良。 When the inspection is performed, the upper inspection jig 4 is lowered by the elevating unit 6, and the upper inspection jig 4 and the lower inspection jig 5 are used to sandwich the printed substrate 2 placed on the flat tray 3. In this state, the inspection pin provided in each of the inspection jigs is brought into contact with the gasket or the like of the printed circuit board 2, and the conduction failure or insulation failure of the wiring is inspected.

參照圖5,對形成於托盤3上的開口部304的位置與大小進 行說明。圖5表示自下方仰視載置於托盤3的印刷基板2的一部分的狀態。圖中,糙粒狀的部分表示印刷基板2,2點鏈線的框表示開口部304。於圖5(a)與圖5(b)中,形成於托盤3的開口部304的大小與數量不同。 Referring to Fig. 5, the position and size of the opening portion 304 formed on the tray 3 are advanced. Line description. FIG. 5 shows a state in which a part of the printed substrate 2 placed on the tray 3 is viewed from below. In the figure, the rough-grained portion indicates the printed circuit board 2, and the box of the two-dot chain line indicates the opening portion 304. In FIGS. 5(a) and 5(b), the size and number of the openings 304 formed in the tray 3 are different.

開口部304的大小固定為必要最小限度,尤其是於印刷基板2上形成有狹縫的部位,為了使印刷基板2不會產生翹曲或扭轉,須考慮到開口部設置的位置與大小。 The size of the opening portion 304 is fixed to a minimum, and in particular, a portion where the slit is formed on the printed circuit board 2, and the position and size of the opening portion must be considered in order to prevent warpage or twist of the printed circuit board 2.

圖5(a)、(b)所示的印刷基板2具備3根枝部2a、2b及2c,且於枝部的周圍形成有狹縫。而且,於各個枝部,形成有配線201的一部分即墊片203。當進行檢查時,利用上檢查夾具4與下檢查夾具5夾住印刷基板2,且於使下檢查夾具5的檢查銷穿過開口部304而接觸於墊片203的狀態下,向檢查銷間施加電壓。 The printed circuit board 2 shown in FIGS. 5(a) and 5(b) includes three branch portions 2a, 2b, and 2c, and a slit is formed around the branch portion. Further, a spacer 203 which is a part of the wiring 201 is formed in each branch. When the inspection is performed, the printed circuit board 2 is sandwiched by the upper inspection jig 4 and the lower inspection jig 5, and the inspection pin of the lower inspection jig 5 is passed through the opening 304 to contact the spacer 203, and the inspection pin is placed. Apply voltage.

如圖5(a)所示,若設有大小包括3根枝部2a、2b及2c的所有墊片203在內的開口部304,則有時,枝部2a、2b及2c的前端因自重而彎曲從而產生翹曲或扭轉,從而使檢查銷不接觸於作為目標的墊片203。對此,如圖5(b)所示,若於與3根枝部2a、2b及2c的墊片對向的位置,分別形成有面積比較小的開口部304,則枝部2a、2b及2c幾乎不彎曲,從而能避免因翹曲或扭轉而使檢查銷不接觸於墊片203的危險性。 As shown in Fig. 5(a), when the opening portion 304 including all the spacers 203 including the three branch portions 2a, 2b, and 2c is provided, the front ends of the branch portions 2a, 2b, and 2c may be self-weighted. The bending is thereby caused to cause warping or twisting, so that the inspection pin does not come into contact with the target spacer 203. On the other hand, as shown in FIG. 5(b), when the opening portion 304 having a relatively small area is formed at a position facing the spacer of the three branch portions 2a, 2b, and 2c, the branch portions 2a, 2b, and 2c are formed. It is hardly bent, so that the risk that the inspection pin does not contact the spacer 203 due to warping or twisting can be avoided.

如以上說明所述,印刷基板2係於由上檢查夾具4與下檢查夾具5夾住、且藉由導銷504與定位用孔202而準確地定位的狀態下受到檢查,故而,能進行高精度的檢查。關於檢查步驟,將於下文中參照圖10及圖11進行詳述。 As described above, the printed circuit board 2 is inspected in a state where the upper inspection jig 4 and the lower inspection jig 5 are sandwiched and accurately positioned by the guide pin 504 and the positioning hole 202, so that the printed circuit board 2 can be mounted. Check the accuracy. The inspection step will be described in detail below with reference to FIGS. 10 and 11.

再者,托盤3的導銷301、孔302、303及開口部304的位置 或大小會根據印刷基板2上所形成的配線圖案的形狀或重複的間距而有所不同。因此,須準備形狀與作為對象的印刷基板對應的托盤。 Furthermore, the position of the guide pin 301, the holes 302, 303, and the opening portion 304 of the tray 3 The size may vary depending on the shape of the wiring pattern formed on the printed substrate 2 or the repeated pitch. Therefore, it is necessary to prepare a tray having a shape corresponding to the printed substrate as the object.

本發明的檢查裝置的第2特徵點在於,對於複數形成有相同形狀的配線圖案的印刷基板2的檢查而言,有時,將對象區域進行劃分而分複數次進行。如上文所述,當製作印刷基板時,於面積大的1塊片狀印刷基板2,複數形成相同形狀的配線圖案,當檢查結束之後,將其等切斷而分離為個別的印刷基板。本發明的檢查裝置係以切斷之前的片狀印刷基板2作為對象而進行檢查。 A second feature of the inspection apparatus of the present invention is that the inspection of the printed circuit board 2 in which a plurality of wiring patterns having the same shape are formed may be divided into a plurality of times. As described above, when a printed circuit board is produced, a plurality of sheet-like printed boards 2 having a large area are formed into a plurality of wiring patterns having the same shape, and after the inspection is completed, they are cut and separated into individual printed boards. The inspection apparatus of the present invention performs inspection on the sheet-like printed board 2 before cutting.

圖4(b)所示的示例中,於印刷基板2,有規則地排列有左右一對的5列的相同形狀的配線圖案,合計為10個配線圖案。若欲同時對該等10個配線圖案進行檢查,則檢查夾具需要數量龐大的檢查銷,故而,檢查夾具價格變高。而且,對於基板的接觸不良的比例增加。為了避免此情況,於本發明的檢查裝置中,使用具備數量與左右一對配線圖案對應的檢查銷的檢查夾具來進行檢查。 In the example shown in FIG. 4( b ), in the printed circuit board 2, a pair of right and left five rows of wiring patterns having the same shape are regularly arranged, and the total is ten wiring patterns. If the 10 wiring patterns are to be inspected at the same time, the inspection jig requires a large number of inspection pins, so that the inspection jig becomes expensive. Moreover, the proportion of poor contact with the substrate increases. In order to avoid this, in the inspection apparatus of the present invention, inspection is performed using an inspection jig having an inspection pin corresponding to a pair of right and left wiring patterns.

當使用此種檢查夾具進行檢查時,為了對印刷基板2上形成的所有的配線圖案進行檢查,須使載置有印刷基板2的托盤3於水平方向移動。因此,使用一對基板搬送單元7、7。 When inspecting using such an inspection jig, in order to inspect all the wiring patterns formed on the printed circuit board 2, the tray 3 on which the printed circuit board 2 is placed must be moved in the horizontal direction. Therefore, a pair of substrate transfer units 7, 7 are used.

每當對左右一對配線圖案進行檢查時,托盤3藉由配置於下檢查夾具5左右的一對基板搬送單元7、7而於水平方向(圖2中箭頭A所示的方向)搬送。基板搬送單元7具備如下功能:對載置於托盤台712的托盤3的端部,於由夾頭725夾住的狀態下於水平方向搬送;及將托盤3載置於下檢查夾具5之上。關於基板搬送單元7,於下文中參照圖式進行詳述。 When the pair of left and right wiring patterns are inspected, the tray 3 is conveyed in the horizontal direction (direction indicated by an arrow A in FIG. 2) by the pair of substrate transfer units 7 and 7 disposed on the left and right of the lower inspection jig 5. The substrate transfer unit 7 has a function of transporting the end portion of the tray 3 placed on the tray table 712 in the horizontal direction while being sandwiched by the chuck 725, and placing the tray 3 on the lower inspection jig 5 . The substrate transfer unit 7 will be described in detail below with reference to the drawings.

再者,本發明的檢查裝置最適宜作為雙面形成有配線的可撓性印刷基板的檢查裝置,但並不限於雙面形成有配線的可撓性印刷基板的檢查。於僅一個面形成有配線的可撓性印刷基板或硬質的印刷基板的檢查中,亦可有效利用上述2個特徵點,而自動地且於短時間內進行印刷基板的檢查。 Further, the inspection apparatus of the present invention is most suitably used as an inspection apparatus for a flexible printed circuit board having wiring on both sides, but is not limited to inspection of a flexible printed circuit board having wiring on both sides. In the inspection of a flexible printed circuit board or a hard printed circuit board in which wiring is formed on only one surface, the above two feature points can be effectively utilized, and the printed circuit board can be inspected automatically and in a short time.

當於僅一個面形成有配線的可撓性印刷基板的檢查中使用本發明的檢查裝置,則可代替下檢查夾具5,而準備具有與下檢查夾具5相同的形狀及構造、但不具有檢查銷的夾具,將托盤載置於其上而進行檢查。 When the inspection apparatus of the present invention is used for inspection of a flexible printed circuit board having only one surface formed with wiring, the lower inspection tool 5 can be replaced with the same shape and structure as the lower inspection jig 5, but the inspection is not performed. The pin clamp is placed on the pallet for inspection.

繼而,參照圖3,對於檢查裝置1的電系統的構成進行說明。檢查裝置1具備:控制單元8,其控制升降單元6及基板搬送單元7的動作;及檢查單元9,其向上檢查夾具4及下檢查夾具5的檢查銷間施加電壓,且測量其間的電阻值。雖未圖示,但控制單元8及檢查單元9係收容於另外設置的檢查裝置的殼體內。 Next, the configuration of the electric system of the inspection apparatus 1 will be described with reference to Fig. 3 . The inspection apparatus 1 includes a control unit 8 that controls the operation of the elevation unit 6 and the substrate transport unit 7 and an inspection unit 9 that applies a voltage between the inspection pins 4 and the inspection pins of the lower inspection jig 5, and measures the resistance value therebetween. . Although not shown, the control unit 8 and the inspection unit 9 are housed in a casing of an inspection device that is separately provided.

控制單元8係由可程式邏輯控制器(Programmable Logic Controller)構成,且基於自輸入顯示部801輸入且儲存於記憶部802的資料,控制升降單元6及基板搬送單元7的動作。 The control unit 8 is composed of a programmable logic controller (Programmable Logic Controller), and controls the operations of the elevation unit 6 and the substrate transport unit 7 based on the data input from the input display unit 801 and stored in the memory unit 802.

若具體進行說明,則升降單元6係藉由驅動氣缸而使上檢查夾具4於上下方向移動。另一方面,基板搬送單元7係藉由對馬達或氣缸進行驅動,而於水平方向搬送載置有印刷基板2的托盤3、或使其於垂直方向移動。 Specifically, the elevation unit 6 moves the upper inspection jig 4 in the vertical direction by driving the cylinder. On the other hand, the substrate transfer unit 7 drives the motor or the cylinder to transport the tray 3 on which the printed circuit board 2 is placed in the horizontal direction or moves it in the vertical direction.

控制單元8中的輸入顯示部801係由觸控面板式的液晶設備構成,且輸入為了使升降單元6及基板搬送單元7動作而需要的資料,而 且顯示該資料。記憶部802係由快閃記憶體等構成,且儲存自輸入顯示部801輸入的資料。 The input display unit 801 of the control unit 8 is configured by a touch panel type liquid crystal device, and inputs data necessary for the elevation unit 6 and the substrate transfer unit 7 to operate. And the information is displayed. The memory unit 802 is composed of a flash memory or the like and stores data input from the input display unit 801.

另一方面,檢查單元9係由個人電腦構成,且具備輸入顯示部901、測量部902、記憶部903及控制部904。其中,控制部904的功能係藉由利用CPU(Central processing Unit,中央處理單元,未圖示)執行自記憶部903讀出的程式而實現。 On the other hand, the inspection unit 9 is composed of a personal computer, and includes an input display unit 901, a measurement unit 902, a storage unit 903, and a control unit 904. The function of the control unit 904 is realized by executing a program read from the storage unit 903 by a CPU (Central Processing Unit, not shown).

檢查單元9中的輸入顯示部901係由觸控面板式的液晶設備構成,且係為了輸入導通或絕緣的良否判定時所需的資料、及為了顯示導通或絕緣的良否判定結果而使用。 The input display unit 901 in the inspection unit 9 is configured by a touch panel type liquid crystal device, and is used for inputting information necessary for determining whether the conduction or insulation is good or not, and for determining the result of the conduction or insulation.

測量部902係經由印刷基板2的配線201,向上檢查夾具4及下檢查夾具5的檢查銷中的、所選擇的2根檢查銷之間施加電壓,且測量其間的電阻值。 The measuring unit 902 applies a voltage between the selected two inspection pins of the inspection pins 4 of the upper inspection jig 4 and the lower inspection jig 5 via the wiring 201 of the printed circuit board 2, and measures the resistance value therebetween.

記憶部903通常由HDD(hard disk drive,硬碟驅動器)構成,且用於儲存自輸入顯示部901輸入的程式或資料、判定結果的資料等。 The memory unit 903 is generally constituted by an HDD (hard disk drive) and is used to store programs or data input from the input display unit 901, data of determination results, and the like.

控制部904係對於測量部902所測量出的電阻值、與儲存於記憶部903的良品的印刷基板的電阻值進行比較,而判定作為對象的印刷基板的導通或絕緣的良否。判定結果係儲存於記憶部903,且根據需要而顯示於輸入顯示部901。 The control unit 904 compares the resistance value measured by the measurement unit 902 with the resistance value of the printed circuit board stored in the memory unit 903, and determines whether the target printed circuit board is electrically connected or insulated. The determination result is stored in the storage unit 903, and is displayed on the input display unit 901 as needed.

繼而,對於圖1所示的檢查裝置1的各構成構件進行說明。首先,對於升降單元6及上檢查夾具4進行說明。升降單元6係使上檢查夾具4於上下方向移動者。 Next, each constituent member of the inspection apparatus 1 shown in Fig. 1 will be described. First, the lifting unit 6 and the upper inspection jig 4 will be described. The lifting unit 6 moves the upper inspection jig 4 in the vertical direction.

升降單元6係由如下部件構成:頂板602,其藉由設置於基 台101的4根支柱601而支承;平板603,其支撐上檢查夾具4;氣缸604,其氣缸本體安裝於頂板602,活塞桿605的前端經由接頭而固定於平板603;及線性導軌606,其安裝於平板603的四角,且與支柱601一同對平板603的上下活動進行導引。 The lifting unit 6 is composed of the following components: a top plate 602, which is disposed on the base The four pillars 601 of the table 101 are supported; the flat plate 603 supports the upper inspection jig 4; the cylinder 604 has a cylinder body mounted on the top plate 602, the front end of the piston rod 605 is fixed to the flat plate 603 via a joint; and a linear guide 606 It is mounted on the four corners of the flat plate 603, and guides the up and down movement of the flat plate 603 together with the support 601.

上檢查夾具4安裝於平板603。具體而言,於平板603的下表面設置有左右一對長形的安裝件607、607,藉由將上檢查夾具4的支撐板402的左右兩端部插入至該安裝件607的槽內,而將上檢查夾具4安裝於平板603。 The upper inspection jig 4 is mounted on the flat plate 603. Specifically, a pair of left and right elongated mounting members 607 and 607 are provided on the lower surface of the flat plate 603, and the left and right end portions of the support plate 402 of the upper inspection jig 4 are inserted into the slots of the mounting member 607. The upper inspection jig 4 is attached to the flat plate 603.

若使氣缸604的活塞桿605縮回,則平板603會沿支柱601上升,相反,若使活塞桿605伸長,則平板603會沿支柱601下降。再者,圖中,為了避免麻煩,而省略了向氣缸604供給壓縮空氣的管體(tube)或管道(pipe)。 When the piston rod 605 of the cylinder 604 is retracted, the flat plate 603 will rise along the strut 601. Conversely, if the piston rod 605 is extended, the flat plate 603 will descend along the strut 601. Further, in the drawing, a tube or a pipe that supplies compressed air to the cylinder 604 is omitted in order to avoid trouble.

繼而,對於上檢查夾具4進行說明。上檢查夾具4係由如下部件構成:檢查板401,其具有複數個檢查銷;支撐板402,其用於將上檢查夾具4安裝於升降單元6的平板603,且由平板狀的合成樹脂製作;及複數個支柱403,其將檢查板401固定於支撐板402。雖未圖示,但檢查板401與支撐板402之間的空間成為自檢查板401的檢查銷引出的導線的通路。 Next, the upper inspection jig 4 will be described. The upper inspection jig 4 is composed of an inspection plate 401 having a plurality of inspection pins, and a support plate 402 for attaching the upper inspection jig 4 to the flat plate 603 of the elevating unit 6, and is made of flat synthetic resin. And a plurality of pillars 403 that fix the inspection plate 401 to the support plate 402. Although not shown, the space between the inspection plate 401 and the support plate 402 serves as a passage for the wire drawn from the inspection pin of the inspection plate 401.

圖6係檢查板401的主要部分剖面圖。圖6(a)表示檢查前的狀態,圖6(b)表示檢查中的狀態。 Fig. 6 is a cross-sectional view showing the main part of the inspection board 401. Fig. 6(a) shows the state before the inspection, and Fig. 6(b) shows the state during the inspection.

檢查板401係積層有由絕緣性的樹脂所製作的2塊板411及412而成。於主板411安裝有押出構件413與探針417,於導引板412形成有對檢查銷進行導引的導引孔424。 The inspection plate 401 is formed by laminating two plates 411 and 412 made of an insulating resin. An extrusion member 413 and a probe 417 are attached to the main plate 411, and a guide hole 424 for guiding the inspection pin is formed on the guide plate 412.

押出構件413係對導引板412向離開主板411的方向進行擠壓者。押出構件413係由如下部件構成:有底圓筒狀的罩體414,其固定於主板411;圓柱狀的押出銷415,其插入至罩體414;及壓縮彈簧416,其插入至罩體414與押出銷415之間。當不進行檢查時,導引板412藉由壓縮彈簧416的反彈力而離開主板411。 The extruding member 413 presses the guide plate 412 in a direction away from the main plate 411. The extruding member 413 is composed of a bottomed cylindrical cover 414 fixed to the main plate 411, a cylindrical extruding pin 415 inserted into the cover 414, and a compression spring 416 inserted into the cover 414. Between the extrusion pin 415. When not inspected, the guide plate 412 leaves the main plate 411 by the repulsive force of the compression spring 416.

探針417係當進行檢查時使檢查銷418抵接於印刷基板2的檢查對象部位(例如圖5所示的墊片203)者。探針417係由如下部件構成:檢查銷418、固定於主板411的有底圓筒狀的基座(socket)419、插入至基座419與檢查銷418的後端部421之間的壓縮彈簧420、及安裝於基座419的後端部的防觸電用絕緣管422。 The probe 417 is such that the inspection pin 418 abuts against the inspection target portion (for example, the spacer 203 shown in FIG. 5) of the printed circuit board 2 when the inspection is performed. The probe 417 is composed of an inspection pin 418, a bottomed cylindrical socket 419 fixed to the main plate 411, and a compression spring inserted between the base 419 and the rear end portion 421 of the inspection pin 418. 420 and an anti-shock insulating tube 422 attached to the rear end portion of the base 419.

檢查銷418、壓縮彈簧420及基座419係由導電性的金屬製作,且導線423連接於基座419的後端部。如圖6(a)所示,檢查銷418藉由壓縮彈簧420而一直嚮導引板412側賦能。 The inspection pin 418, the compression spring 420, and the base 419 are made of conductive metal, and the wire 423 is connected to the rear end portion of the base 419. As shown in FIG. 6(a), the inspection pin 418 is energized to the side of the guide plate 412 by the compression spring 420.

再者,圖6中,於主板411分別安裝有一個押出構件413與探針417,但實際的檢查板401上,係於長方體狀的主板411的4角分別安裝有押出構件413,以使推壓導引板412的力變得均等。而且,探針417係分別安裝於與印刷基板2的檢查對象部位對向的位置。 Further, in FIG. 6, one of the extruding members 413 and the probe 417 are attached to the main plate 411, but the actual inspection plate 401 is attached to the four corners of the rectangular parallelepiped main plate 411 with the ejecting member 413 attached thereto. The force of the pressure guiding plate 412 becomes equal. Further, the probes 417 are attached to positions facing the inspection target portion of the printed circuit board 2, respectively.

當進行檢查時,若藉由升降單元6使上檢查夾具4下降,且使上檢查夾具4隔著印刷基板2及托盤3而接觸於下檢查夾具5,則如圖6(b)所示,藉由氣缸604的壓力而使壓縮彈簧416縮回。結果,檢查銷418的前端自導引孔424露出而接觸於印刷基板2的配線201。 When the inspection is performed, if the upper inspection jig 4 is lowered by the elevating unit 6, and the upper inspection jig 4 is brought into contact with the lower inspection jig 5 via the printed substrate 2 and the tray 3, as shown in FIG. 6(b), The compression spring 416 is retracted by the pressure of the cylinder 604. As a result, the front end of the inspection pin 418 is exposed from the guide hole 424 to contact the wiring 201 of the printed circuit board 2.

如上文所述,檢查銷418、基座419及壓縮彈簧420係由導 電性的材料製作,故而,若藉由檢查單元9而向所選擇的2根檢查銷418之間施加恆定電壓,則電流會經由配線201而流至該等檢查銷間。若利用內設於測量部902的測量器來測量檢查銷間的電阻值,且於控制部904,將該值與儲存於記憶部903的良品的印刷基板的值進行比較,則能判定印刷基板的導通或絕緣的良否。 As described above, the inspection pin 418, the base 419, and the compression spring 420 are guided by Since the electrical material is fabricated, if a constant voltage is applied between the selected two inspection pins 418 by the inspection unit 9, current flows between the inspection pins via the wiring 201. When the resistance value between the inspection pins is measured by the measuring device provided in the measuring unit 902, and the control unit 904 compares the value with the value of the printed substrate stored in the memory unit 903, the printed circuit board can be determined. Whether the conduction or insulation is good or not.

再者,圖6所示的檢查板401的構造為一例,但並不限於該構造。只要能發揮同樣的功能,則亦可採用其他構造的檢查板。 The structure of the inspection plate 401 shown in FIG. 6 is an example, but the configuration is not limited thereto. As long as the same function can be performed, an inspection board of other construction can be used.

返回至圖1及圖2的說明,對下檢查夾具5進行說明。下檢查夾具5係對形成於印刷基板2的下表面的配線進行檢查者,且由如下部件構成:檢查板501,其具有複數個檢查銷;支撐板502,其用於將下檢查夾具5安裝於固定在基台101上的平板102,且由平板狀的合成樹脂製作;及複數個支柱503,其將檢查板501固定於支撐板502。檢查板501、支撐板502及支柱503的功能係與上檢查夾具4的檢查板401、支撐板402及交柱403各自的功能相同,故而省略說明。 Returning to the description of FIGS. 1 and 2, the lower inspection jig 5 will be described. The lower inspection jig 5 is an inspector for wiring formed on the lower surface of the printed substrate 2, and is composed of an inspection plate 501 having a plurality of inspection pins, and a support plate 502 for mounting the lower inspection jig 5 The flat plate 102 fixed to the base 101 is made of a flat synthetic resin; and a plurality of struts 503 for fixing the inspection plate 501 to the support plate 502. The functions of the inspection plate 501, the support plate 502, and the support 503 are the same as those of the inspection plate 401, the support plate 402, and the intersection 403 of the upper inspection jig 4, and thus the description thereof is omitted.

下檢查夾具5係安裝於固定在基台101上的平板102。於平板102的左右設置有一對長形的安裝件103、103,藉由將下檢查夾具5的支撐板502的左右兩端部插入至該安裝件103的槽,而將下檢查夾具5安裝於平板102。 The lower inspection jig 5 is attached to the flat plate 102 fixed to the base 101. A pair of elongated mounting members 103, 103 are disposed on the left and right sides of the flat plate 102, and the lower inspection jig 5 is attached to the groove of the mounting member 103 by inserting the left and right end portions of the support plate 502 of the lower inspection jig 5 into the groove. Tablet 102.

上述上檢查夾具4與下檢查夾具5的不同點在於:上檢查夾具4可藉由升降單元6而於上下方向移動,與此相對,下檢查夾具5係經由平板102而固定於基台101;及於檢查板501安裝有印刷基板2的定位用導銷504,且於上檢查夾具4的對向部位形成有收容導銷504的孔(未圖示)。 The upper inspection jig 4 and the lower inspection jig 5 are different in that the upper inspection jig 4 can be moved in the vertical direction by the elevating unit 6, while the lower inspection jig 5 is fixed to the base 101 via the flat plate 102; The positioning guide pin 504 of the printed circuit board 2 is attached to the inspection board 501, and a hole (not shown) for accommodating the guide pin 504 is formed in the opposing portion of the upper inspection jig 4.

藉由將設於檢查板501的4個部位的導銷504插入至形成於印刷基板2的對向位置的定位用孔202(參照圖4),而使印刷基板2相對於下檢查夾具5準確地定位,從而使檢查銷無誤地接觸於檢查對象部位的配線(例如墊片)201。 By inserting the guide pins 504 provided at the four portions of the inspection plate 501 into the positioning holes 202 (see FIG. 4) formed at the opposite positions of the printed substrate 2, the printed substrate 2 is accurately aligned with respect to the lower inspection jig 5. The ground is positioned such that the inspection pin contacts the wiring (for example, the gasket) 201 of the inspection target portion without fail.

當進行檢查時,驅動升降單元6而使平板603下降,利用上檢查夾具4與下檢查夾具5夾住載置於托盤3的印刷基板2。當檢查結束後,驅動升降單元6而使平板603上升之後,將其保持於圖1所示的位置。 When the inspection is performed, the elevating unit 6 is driven to lower the flat plate 603, and the printed circuit board 2 placed on the tray 3 is sandwiched by the upper inspection jig 4 and the lower inspection jig 5. When the inspection is completed, the elevating unit 6 is driven to raise the flat plate 603, and then held at the position shown in FIG.

繼而,參照上述的圖1及圖2、以及圖7~圖9,對於基板搬送單元7進行說明。圖7係圖1的一對基板搬送單元7、7中的左側的單元的正視圖,圖8係該單元的俯視圖,圖9係該單元的側視圖。 Next, the substrate transfer unit 7 will be described with reference to FIGS. 1 and 2 and 7 to 9 described above. Fig. 7 is a front elevational view of the unit on the left side of the pair of substrate transfer units 7, 7 of Fig. 1, Fig. 8 is a plan view of the unit, and Fig. 9 is a side view of the unit.

再者,圖中,為了避免麻煩,而省略了向氣缸供給壓縮空氣的管體或閥、連接於馬達或各種感測器與控制單元8之間的配線。而且,圖中表示有將構件固定的螺栓或螺母,但其等為通用的緊固構件,故而不標注符號進行說明。 Further, in the drawing, in order to avoid trouble, a pipe body or a valve that supplies compressed air to the cylinder, and a wiring connected between the motor or various sensors and the control unit 8 are omitted. Further, although a bolt or a nut for fixing the member is shown in the drawing, the same is a general-purpose fastening member, and therefore, the description will be made without a reference numeral.

如上所述,基板搬送單元7係於水平方向搬送載置有印刷基板2的托盤3者。如圖2所示,於下檢查夾具5的左右,沿移動路徑而設置有剖面呈矩形的一對滑動平台701。滑動平台701係用於在水平方向搬送托盤3的構件,若使收容於平台內的滾珠螺桿(未圖示)旋轉,則滑動塊體702會於滑動平台701上向箭頭A所示的方向移動。 As described above, the substrate transport unit 7 transports the tray 3 on which the printed circuit board 2 is placed in the horizontal direction. As shown in FIG. 2, on the right and left sides of the lower inspection jig 5, a pair of slide platforms 701 having a rectangular cross section are provided along the movement path. The slide table 701 is a member for conveying the tray 3 in the horizontal direction. When the ball screw (not shown) housed in the stage is rotated, the slide block 702 moves on the slide platform 701 in the direction indicated by the arrow A. .

於藉由螺栓而固定於滑動塊體702上的支撐板703,搭載有用於使托盤3於垂直方向(圖7中箭頭B所示的方向)移動的構件、及用於支撐所搬送的托盤3的構件。 A support plate 703 fixed to the slide block body 702 by a bolt is provided with a member for moving the tray 3 in the vertical direction (direction indicated by an arrow B in FIG. 7) and a tray 3 for supporting the conveyance. Components.

於支撐板703的上表面,藉由螺栓等安裝有導引安裝板704與第1氣缸705。而且,於氣缸705的活塞桿706的上部,經由接頭而安裝有第1連結板707的一端,而且,隔著導引安裝板704,於第1連結板707的另一端安裝有剖面呈L字型的懸臂基座711。 A guide mounting plate 704 and a first cylinder 705 are attached to the upper surface of the support plate 703 by bolts or the like. Further, one end of the first connecting plate 707 is attached to the upper portion of the piston rod 706 of the air cylinder 705 via a joint, and a cross section is attached to the other end of the first connecting plate 707 via the guide mounting plate 704. Type cantilever base 711.

於導引安裝板704的側面,安裝有對懸臂基座711的升降進行導引的第1線性導軌708。第1線性導軌708係由安裝於導引安裝板704的軌道709、及安裝於懸臂基座711的塊體710構成。若使第1氣缸705的活塞桿706縮回或伸長而使連結板707上下活動,則塊體710沿軌道709上下活動,從而能使懸臂基座711順暢地升降。 A first linear guide 708 that guides the elevation of the cantilever base 711 is attached to the side surface of the guide mounting plate 704. The first linear guide 708 is composed of a rail 709 attached to the guide mounting plate 704 and a block 710 attached to the cantilever base 711. When the piston rod 706 of the first cylinder 705 is retracted or extended to move the coupling plate 707 up and down, the block body 710 moves up and down along the rail 709, so that the boom base 711 can be smoothly moved up and down.

於懸臂基座711的前端的上表面,安裝有兩端設置有導銷713的托盤台712,如圖1所示,於托盤3的端部搭於該托盤台712的狀態下搬送托盤3。此時,將導銷713插入至形成於托盤3的端部的定位用孔302(參照圖3)。 A tray table 712 having guide pins 713 provided at both ends thereof is attached to the upper surface of the front end of the cantilever base 711. As shown in Fig. 1, the tray 3 is conveyed while the end of the tray 3 is placed on the tray table 712. At this time, the guide pin 713 is inserted into the positioning hole 302 (refer to FIG. 3) formed at the end of the tray 3.

於第1連結板707的下表面安裝有第2氣缸715,於活塞桿716的前端,經由接頭而安裝有剖面呈L字狀的第2連結板717。進而,於該第2連結板717的兩端部,分別經由螺栓而安裝有剖面呈U字狀的一對氣缸安裝板718、718。 A second cylinder 715 is attached to the lower surface of the first connecting plate 707, and a second connecting plate 717 having an L-shaped cross section is attached to the tip end of the piston rod 716 via a joint. Further, a pair of cylinder mounting plates 718 and 718 having a U-shaped cross section are attached to both end portions of the second connecting plate 717 via bolts.

於氣缸安裝板718的槽內收容有第3氣缸721。氣缸721的後部經由銷722而以可旋轉的狀態安裝於氣缸安裝板718,且活塞桿723的前端經由鉸鏈銷724而連結於夾頭725。 The third cylinder 721 is housed in the groove of the cylinder mounting plate 718. The rear portion of the cylinder 721 is attached to the cylinder mounting plate 718 in a rotatable state via a pin 722, and the front end of the piston rod 723 is coupled to the collet 725 via a hinge pin 724.

夾頭725係夾住載置於托盤台712的托盤3的端部者,且經由配置於下部的銷726而以可旋轉的狀態安裝於氣缸安裝板718。若使活塞 桿723縮回,則如圖7中的2點鏈線所示,夾頭725以銷726為支點而逆時針旋轉,而使夾頭725鬆開對托盤3的抓持。於夾頭725的下表面貼附有胺基甲酸酯片材727,防止當由夾頭725與托盤台712夾住托盤3時產生的晃動。 The chuck 725 clamps the end of the tray 3 placed on the tray table 712, and is attached to the cylinder mounting plate 718 in a rotatable state via a pin 726 disposed at the lower portion. If the piston When the rod 723 is retracted, as shown by the 2-point chain line in Fig. 7, the collet 725 rotates counterclockwise with the pin 726 as a fulcrum, and the grip 725 releases the grip of the tray 3. A urethane sheet 727 is attached to the lower surface of the chuck 725 to prevent rattling caused when the tray 3 is sandwiched between the chuck 725 and the tray table 712.

於氣缸安裝板718與懸臂基座711之間,設置有第2線性導軌731。如圖9所示,第2線性導軌731係由與氣缸安裝板718平行地安裝於懸臂基座711的上表面的軌道732、及安裝於氣缸安裝板718的下表面的塊體733構成,且對於氣缸安裝板718的向水平方向(圖7及圖8中為箭頭C所示的方向)的移動進行導引。 A second linear guide 731 is provided between the cylinder mounting plate 718 and the cantilever base 711. As shown in FIG. 9, the second linear guide 731 is composed of a rail 732 attached to the upper surface of the boom base 711 in parallel with the cylinder mounting plate 718, and a block 733 attached to the lower surface of the cylinder mounting plate 718, and The movement of the cylinder mounting plate 718 in the horizontal direction (the direction indicated by the arrow C in FIGS. 7 and 8) is guided.

能使氣缸安裝板718於水平方向移動的原因在於:當作業人員將托盤3安裝於托盤台712時或自托盤台712卸下托盤3時,使夾頭725不會成為阻礙。藉由使氣缸安裝板718後退,而使夾頭725退避至托盤3不會接觸的位置為止。 The reason why the cylinder mounting plate 718 can be moved in the horizontal direction is that when the worker attaches the tray 3 to the tray table 712 or removes the tray 3 from the tray table 712, the chuck 725 is not hindered. By retracting the cylinder mounting plate 718, the collet 725 is retracted to a position where the tray 3 does not come into contact.

<基板檢查裝置的動作> <Operation of Substrate Inspection Device>

繼而,進而參照上述的各圖式,圖10及圖11,對本發明的檢查裝置1的動作進行說明。圖10係表示檢查裝置1的動作的流程的流程圖,圖11係對上檢查夾具4與下檢查夾具5的動作進行說明的主要部分側視圖。 Next, the operation of the inspection apparatus 1 of the present invention will be described with reference to the above drawings, and FIGS. 10 and 11. FIG. 10 is a flowchart showing the flow of the operation of the inspection apparatus 1. FIG. 11 is a side view of a main portion for explaining the operation of the upper inspection jig 4 and the lower inspection jig 5.

於開始作業之前,基板搬送單元7於圖2所示的位置待機。而且,托盤台712保持於高於下檢查夾具5的位置。此時,夾頭725成為鬆開的狀態,進而,夾頭725藉由線性導軌731而後退,故而,當作業人員將托盤3載置於托盤台712時不會成為阻礙。 The substrate transfer unit 7 stands by at the position shown in FIG. 2 before starting the work. Moreover, the tray table 712 is held at a position higher than the lower inspection jig 5. At this time, the chuck 725 is in a released state, and the chuck 725 is retracted by the linear guide 731. Therefore, when the worker places the tray 3 on the tray table 712, the worker does not become an obstacle.

首先,作業人員將托盤3的兩端部安裝於一對基板搬送單元 7各自的托盤台712(步驟S11)。作業人員將安裝於托盤台712的4根導銷713分別插入至形成於托盤3的兩端部的定位用4個孔302(參照圖4),從而將托盤3載置於托盤台712(參照圖2)。 First, the operator attaches both ends of the tray 3 to a pair of substrate transfer units 7 respective tray stages 712 (step S11). The operator inserts the four guide pins 713 attached to the tray table 712 into the four holes 302 for positioning (see FIG. 4) formed at both end portions of the tray 3, thereby placing the tray 3 on the tray table 712 (refer to figure 2).

繼而,若作業人員按下控制單元8的按鈕,則第2氣缸715的活塞桿716伸長而使氣缸安裝板718前進,之後,第3氣缸721的活塞桿723伸長,夾頭725以銷726為中心而旋轉,且與托盤台712之間抓持托盤3的端部(參照圖7,步驟S12)。 Then, when the operator presses the button of the control unit 8, the piston rod 716 of the second cylinder 715 is extended to advance the cylinder mounting plate 718, and then the piston rod 723 of the third cylinder 721 is extended, and the chuck 725 is replaced by the pin 726. The center is rotated and the end of the tray 3 is gripped with the tray table 712 (refer to Fig. 7, step S12).

繼而,如圖4(b)所示,作業人員將印刷基板2載置於托盤3,並且為了使印刷基板2不會自托盤3脫落而將托盤3的導銷301插入至印刷基板2的孔202(步驟S13)。藉此,完成搬送托盤3的準備。 Then, as shown in FIG. 4(b), the worker mounts the printed substrate 2 on the tray 3, and inserts the guide pin 301 of the tray 3 into the hole of the printed substrate 2 so that the printed substrate 2 does not fall off from the tray 3. 202 (step S13). Thereby, the preparation of the transport tray 3 is completed.

之後的動作係基於控制單元8的記憶部802(參照圖3)內所儲存的數據而自動進行。若作業人員按下控制單元8的開始按鈕,則滑動平台701受到驅動而使滑動塊體702於水平方向移動,且將托盤3搬送至最初進行檢查的配線圖案到達下檢查夾具5的上方為止(步驟S14)。 The subsequent operations are automatically performed based on the data stored in the storage unit 802 (see FIG. 3) of the control unit 8. When the operator presses the start button of the control unit 8, the slide table 701 is driven to move the slide block 702 in the horizontal direction, and the tray 3 is transported until the wiring pattern to be inspected first reaches the lower inspection jig 5 ( Step S14).

該狀態如圖11(a)所示。下檢查夾具5位於藉由夾頭725所抓持的托盤3的下方,而安裝於升降單元6的平板603上的上檢查夾具4係位於該托盤3的上方。 This state is shown in Fig. 11(a). The lower inspection jig 5 is located below the tray 3 gripped by the chuck 725, and the upper inspection jig 4 mounted on the flat plate 603 of the elevating unit 6 is positioned above the tray 3.

若滑動塊體702移動且停止於指定的位置為止,則托盤搬送單元7的第1氣缸705受到驅動,活塞桿706縮回而使懸臂基座711下降。而且,於懸臂基座711下降的同時,第3氣缸721的活塞桿723縮回而使夾頭725以銷726為中心而旋轉(參照圖7),而使夾頭725鬆開對托盤3的抓持(步驟S15)。 When the slide block 702 moves and stops at the designated position, the first cylinder 705 of the tray transport unit 7 is driven, and the piston rod 706 is retracted to lower the boom base 711. Further, while the boom base 711 is lowered, the piston rod 723 of the third cylinder 721 is retracted, and the chuck 725 is rotated about the pin 726 (refer to FIG. 7), and the chuck 725 is released from the tray 3. Grab (step S15).

該狀態如圖11(b)所示。此時,將透過形成於托盤3的孔303而安裝於下檢查夾具5的4根導銷504,分別插入至形成於印刷基板2的定位用4個孔202。因定位用孔202的直徑與導銷504的根部分的直徑大致相等,故而,印刷基板2可藉由導銷504而準確地定位。 This state is shown in Fig. 11(b). At this time, the four guide pins 504 attached to the lower inspection jig 5 are inserted through the holes 303 formed in the tray 3, and inserted into the four holes 202 for positioning formed on the printed circuit board 2, respectively. Since the diameter of the positioning hole 202 is substantially equal to the diameter of the root portion of the guide pin 504, the printed circuit board 2 can be accurately positioned by the guide pin 504.

繼而,驅動升降單元6的氣缸604而使活塞桿605伸長,藉此,使上檢查夾具4下降,且如圖11(c)所示,於利用上檢查夾具4的檢查板401與下檢查夾具5的檢查板501夾住托盤3的狀態下停止(步驟S16)。 Then, the cylinder 604 of the lifting unit 6 is driven to extend the piston rod 605, whereby the upper inspection jig 4 is lowered, and as shown in FIG. 11(c), the inspection plate 401 and the lower inspection jig using the upper inspection jig 4 are used. The inspection board 501 of 5 is stopped while the tray 3 is being clamped (step S16).

於利用上檢查夾具4的檢查板401與下檢查夾具5的檢查板501夾住托盤3的狀態下,如圖6(b)所示,因壓力而使上檢查夾具4的壓縮彈簧416收縮,從而使檢查銷418的前端自導引孔424露出,且接觸於形成在印刷基板2的上表面的配線201。 In a state in which the tray 3 is sandwiched between the inspection plate 401 of the upper inspection jig 4 and the inspection plate 501 of the lower inspection jig 5, as shown in FIG. 6(b), the compression spring 416 of the upper inspection jig 4 is contracted by pressure. Thereby, the front end of the inspection pin 418 is exposed from the guide hole 424, and is in contact with the wiring 201 formed on the upper surface of the printed substrate 2.

形成於印刷基板2的下表面的配線201亦與上檢查夾具4同樣,壓縮彈簧收縮而使檢查銷的前端自導引孔露出,且接觸於形成在印刷基板2的下表面的配線201。 Similarly to the upper inspection jig 4, the wiring 201 formed on the lower surface of the printed circuit board 2 is contracted, and the front end of the inspection pin is exposed from the guide hole and is in contact with the wiring 201 formed on the lower surface of the printed circuit board 2.

該狀態下,對印刷基板2的導通或絕緣進行檢查(步驟S17)。具體而言,檢查單元9的測量部902係向所選擇的2根檢查銷418之間施加電壓,並且測量檢查銷間的電阻值,且將該值送至控制部904。 In this state, the conduction or insulation of the printed circuit board 2 is inspected (step S17). Specifically, the measuring unit 902 of the inspection unit 9 applies a voltage between the selected two inspection pins 418, and measures the resistance value between the inspection pins, and sends the value to the control unit 904.

控制部904係對於測量出的檢查銷間的電阻值、與記憶部903內所儲存的良品的印刷基板的電阻值進行比較,對於作為檢查對象的印刷基板的導通或絕緣進行良否判定。藉由控制部904,將判定結果顯示於輸入顯示部901,進而寫入至記憶部903。 The control unit 904 compares the measured resistance value between the inspection pins with the resistance value of the printed circuit board stored in the memory unit 903, and determines whether or not the printed circuit board to be inspected is turned on or insulated. The control unit 904 displays the determination result on the input display unit 901 and further writes it to the storage unit 903.

若檢查結束,則驅動升降單元6的氣缸604而使活塞桿605 縮回,藉此,上檢查夾具4上升至圖11(d)所示的位置,且保持於該位置(步驟S18)。圖11(d)所示的上檢查夾具4的位置係設定為低於圖11(b)所示的上檢查夾具4的位置。其原因在於:使進行下次檢查時上檢查夾具4的下降時間縮短。 If the inspection is completed, the cylinder 604 of the lifting unit 6 is driven to make the piston rod 605 By retracting, the upper inspection jig 4 is raised to the position shown in Fig. 11 (d) and held at this position (step S18). The position of the upper inspection jig 4 shown in Fig. 11 (d) is set lower than the position of the upper inspection jig 4 shown in Fig. 11 (b). This is because the fall time of the upper inspection jig 4 is shortened when the next inspection is performed.

繼而,基板搬送單元7的第1氣缸705受到驅動,活塞桿706伸長,懸臂基座711上升而使托盤3與下檢查夾具5遠離。基板搬送單元7的第3氣缸721係於略微遲於托盤3的上升開始的時刻進行動作,活塞桿723伸長,夾頭725以銷726為中心而順時針旋轉,且與托盤台712之間再次抓持托盤3的端部(步驟S19)。 Then, the first cylinder 705 of the substrate transfer unit 7 is driven, the piston rod 706 is extended, and the boom base 711 is raised to move the tray 3 away from the lower inspection jig 5. The third cylinder 721 of the substrate transfer unit 7 is operated slightly later than the start of the rise of the tray 3, the piston rod 723 is extended, and the chuck 725 is rotated clockwise around the pin 726 and again with the tray table 712. The end of the tray 3 is gripped (step S19).

當托盤3上升時,藉由導銷504而固定於下檢查夾具5的印刷基板2由定位用孔202脫離導銷504,且由下檢查夾具5分離。最後,托盤3上升至圖11(a)所示的位置為止。 When the tray 3 is raised, the printed circuit board 2 fixed to the lower inspection jig 5 by the guide pin 504 is separated from the guide pin 504 by the positioning hole 202, and is separated by the lower inspection jig 5. Finally, the tray 3 is raised to the position shown in Fig. 11(a).

檢查單元9的控制部904係根據記憶部903內所儲存的檢查數據而確認印刷基板2的所有的配線圖案的檢查是否結束(步驟S20),當檢查未結束時(步驟S20中為否),返回至步驟S14,反復進行步驟S14~S19的處理。 The control unit 904 of the inspection unit 9 checks whether or not the inspection of all the wiring patterns of the printed circuit board 2 is completed based on the inspection data stored in the storage unit 903 (step S20), and when the inspection is not completed (NO in step S20), Returning to step S14, the processing of steps S14 to S19 is repeated.

另一方面,當控制部904判斷為印刷基板2的所有的配線圖案的檢查已結束時(步驟S20中為是),向控制單元8發送表示檢查已結束的數據。之後,控制單元8使上檢查夾具4上升至圖11(a)所示的初始位置為止,並且,驅動滑動平台701而使基板搬送單元7移動至初始位置為止(步驟S21)。之後,作業人員將載置於托盤3的印刷基板2自托盤3卸下(步驟S22)。 On the other hand, when the control unit 904 determines that the inspection of all the wiring patterns of the printed circuit board 2 has been completed (YES in step S20), the control unit 904 transmits data indicating that the inspection has ended. Thereafter, the control unit 8 raises the upper inspection jig 4 to the initial position shown in FIG. 11(a), and drives the slide table 701 to move the substrate transfer unit 7 to the initial position (step S21). Thereafter, the worker removes the printed substrate 2 placed on the tray 3 from the tray 3 (step S22).

雖圖10中未表示,但作業人員根據檢查單元9的輸入顯示部901所表示的檢查結果,於已自托盤3卸下的印刷基板2中的、判定為導通或絕緣不良的配線圖案的部位,黏貼顯示識別用標記的封條(seal)。 In the printed circuit board 2 that has been detached from the tray 3, the portion of the printed circuit board 2 that has been removed from the tray 3 is not shown, but is not shown in FIG. , pasting a seal showing the identification mark.

黏貼有識別用封條的印刷基板2係藉由未圖示的切割器按每個配線圖案而分離。將各自分離的印刷基板中、黏貼有識別用封條的基板廢棄,僅將良品的印刷基板作為成品而出貨。 The printed circuit board 2 to which the seal for identification is adhered is separated by each of the wiring patterns by a cutter (not shown). Among the printed substrates that are separated from each other, the substrate to which the identification seal is attached is discarded, and only the printed substrate of the good product is shipped as a finished product.

返回至圖10的說明,於步驟S22的處理結束的時間點,作業人員判斷作為檢查對象的所有的印刷基板的檢查是否結束(步驟S23),當有檢查未結束的印刷基板時(否),返回至步驟S13的處理,而將新的印刷基板2載置於托盤3。 Returning to the description of FIG. 10, at the time point when the process of step S22 is completed, the worker determines whether or not the inspection of all the printed substrates to be inspected is completed (step S23), and when there is a printed circuit board whose inspection is not completed (NO), Returning to the process of step S13, the new printed substrate 2 is placed on the tray 3.

另一方面,當所有的印刷基板的檢查均已結束時(步驟S23中為是),轉移至步驟S24的處理,作業人員將托盤3自基板搬送單元7卸下。具體而言,若作業人員按下控制單元8的按鈕,則基板搬送單元7的第3氣缸721的活塞桿723縮回而使夾頭725以銷726為中心旋轉,使夾頭725鬆開對托盤3的抓持。進而,第2氣缸715的活塞桿716縮回,夾頭725後退。 On the other hand, when all the inspections of the printed substrate have been completed (YES in step S23), the process proceeds to step S24, and the worker removes the tray 3 from the substrate transfer unit 7. Specifically, when the operator presses the button of the control unit 8, the piston rod 723 of the third cylinder 721 of the substrate transport unit 7 is retracted, and the chuck 725 is rotated about the pin 726 to release the chuck 725. The grip of the tray 3. Further, the piston rod 716 of the second cylinder 715 is retracted, and the chuck 725 is retracted.

之後,作業人員將托盤3自托盤台712卸下。此時,夾頭7位於退避位置,故而,當自托盤台712取下托盤3時,不會成為阻礙。 Thereafter, the worker removes the tray 3 from the tray table 712. At this time, since the chuck 7 is located at the retracted position, when the tray 3 is removed from the tray table 712, it does not become an obstacle.

如上所述,若使用本實施形態的檢查裝置,則無須考慮到可撓性印刷基板的翹曲或扭轉,故而,裝置的構成會變得簡單,對結果而言,能低價地製造檢查裝置。而且,能同時對印刷基板的雙面的配線進行檢查,故而,能縮短檢查所需的時間。 As described above, when the inspection apparatus of the present embodiment is used, it is not necessary to consider the warpage or twist of the flexible printed circuit board, so that the configuration of the apparatus is simplified, and as a result, the inspection apparatus can be manufactured at low cost. . Moreover, since the wiring on both sides of the printed circuit board can be inspected at the same time, the time required for the inspection can be shortened.

再者,本實施形態中,使用氣缸作為升降單元6及基板搬送單元7的驅動機構,但並不限於此。使用藉由油壓的氣缸、或電磁鐵而驅動的致動器作為驅動機構時,當然亦可實現同樣的功能。 Further, in the present embodiment, the cylinder is used as the driving mechanism of the elevation unit 6 and the substrate transport unit 7, but the invention is not limited thereto. When an actuator driven by a hydraulic cylinder or an electromagnet is used as the drive mechanism, the same function can of course be achieved.

(實施形態2) (Embodiment 2)

本實施形態中,於實施形態1的檢查裝置1的滑動平台701的後部附近,設置有基板反轉單元11與衝孔單元12。圖12中表示配設於滑動平台701的後部附近的基板反轉單元11與衝孔單元12。以下,對於設置各個單元的理由與構成進行說明。 In the present embodiment, the substrate inverting unit 11 and the punching unit 12 are provided in the vicinity of the rear portion of the slide table 701 of the inspection apparatus 1 according to the first embodiment. FIG. 12 shows the substrate inverting unit 11 and the punching unit 12 disposed in the vicinity of the rear portion of the slide table 701. Hereinafter, the reason and configuration of each unit will be described.

<基板反轉單元> <Substrate reversal unit>

如上述的圖4(b)所示,於印刷基板2規則地形成有複數個相同的配線圖案。當印刷基板2的檢查結束之後,切斷印刷基板2而分離為獨立的印刷基板。 As shown in FIG. 4(b) described above, a plurality of identical wiring patterns are regularly formed on the printed substrate 2. After the inspection of the printed substrate 2 is completed, the printed substrate 2 is cut and separated into individual printed substrates.

若對於圖4(b)所示的配線圖案進一步進行說明,則縱方向排列有5個的配線圖案各自靠近地配置有1個配線圖案、與使其反轉的配線圖案。如此,根據上述印刷基板,為了提高配線的密度,有時每隔1個間距使配線圖案的方向反轉而進行配置。 When the wiring pattern shown in FIG. 4( b ) is further described, five wiring patterns are arranged in the vertical direction, and one wiring pattern is arranged close to each other and the wiring pattern is reversed. As described above, in order to increase the density of the wiring, the printed circuit board may be arranged such that the direction of the wiring pattern is reversed every other pitch.

當各個配線圖案朝向相同的方向時,僅藉由反復利用基板搬送單元7搬送印刷基板2,便能對所有基板進行檢查。例如,當於1次檢查中對於左右排列的一對配線圖案進行檢查時,使用具有數量與一對配線圖案對應的檢查銷418的上檢查夾具4與下檢查夾具5,一面藉由基板搬送單元7使配線圖案錯開一個間距一面反復進行檢查,藉此,能對所有印刷基板2進行檢查。 When the respective wiring patterns are oriented in the same direction, all of the substrates can be inspected by merely transferring the printed substrate 2 by the substrate transfer unit 7 repeatedly. For example, when inspecting a pair of wiring patterns arranged side by side in one inspection, the upper inspection jig 4 and the lower inspection jig 5 having the number of inspection pins 418 corresponding to the pair of wiring patterns are used, and the substrate conveyance unit is used. 7. The wiring patterns are repeatedly inspected while being shifted by one pitch, whereby all the printed boards 2 can be inspected.

對此,當對於每隔1個間距而使配線圖案的方向反轉的印刷基板進行檢查時,須準備具有2種檢查銷的檢查夾具,該2種檢查銷係指與順向的排列圖案對應的檢查銷、及與逆向的排列圖案對應的檢查銷。然而,於檢查銷的數量多的情況下,檢查夾具4及5的製作費用較高,從而會導致成本提高。 On the other hand, when inspecting the printed circuit board in which the direction of the wiring pattern is reversed every one pitch, it is necessary to prepare an inspection jig having two types of inspection pins, which correspond to the arrangement pattern of the forward direction. The inspection pin and the inspection pin corresponding to the reverse alignment pattern. However, in the case where the number of inspection pins is large, the manufacturing costs of the inspection jigs 4 and 5 are high, which leads to an increase in cost.

因此,本實施形態中,對於此種印刷基板,當順向的配線圖案的檢查結束之後,使用基板反轉單元11使印刷基板旋轉180度,之後,對於逆方向的配線圖案,以與順向同樣的順序對配線進行檢查。由此,無須準備具有2種檢查銷的檢查夾具,故而能降低檢查成本。 Therefore, in the present embodiment, after the inspection of the forward wiring pattern is completed, the printed circuit board is rotated by 180 degrees using the substrate inverting unit 11, and then the wiring pattern in the reverse direction is followed by the forward direction. Wiring is checked in the same order. Therefore, it is not necessary to prepare an inspection jig having two kinds of inspection pins, so that the inspection cost can be reduced.

參照圖12,對於基板反轉單元11的構成與動作進行說明。再者,基板反轉單元11的控制係由實施形態1中說明的控制單元8進行。 The configuration and operation of the substrate inverting unit 11 will be described with reference to Fig. 12 . Further, the control of the substrate inverting unit 11 is performed by the control unit 8 described in the first embodiment.

基板反轉單元11係由如下部件構成:平台111,其載置藉由基板搬送單元7搬送的托盤3;氣缸112,其使平台111旋轉;及氣缸113,其使平台111升降。 The substrate inverting unit 11 is composed of a table 111 on which a tray 3 transported by the substrate transfer unit 7 is placed, a cylinder 112 that rotates the stage 111, and a cylinder 113 that lifts and lowers the stage 111.

圖12中,以2點鏈線表示載置於平台111的托盤3的輪廓。於平台111的4角,分別設有導銷114。藉由將導銷114插入至形成於托盤3的對向位置的孔,而使托盤3相對於平台111定位,進而,能防止托盤3自平台111脫落。 In Fig. 12, the outline of the tray 3 placed on the stage 111 is indicated by a 2-dot chain line. Guide pins 114 are respectively disposed at the four corners of the platform 111. By inserting the guide pin 114 into the hole formed at the opposite position of the tray 3, the tray 3 is positioned relative to the stage 111, and further, the tray 3 can be prevented from coming off the platform 111.

於平台111的中心的下表面,連接有作為驅動機構的氣缸112的旋轉軸。旋轉軸設置於一對滑動平台701、701的中間點,故而,當藉由氣缸113使載置於平台111的托盤3旋轉180度時,托盤3相對於滑動平台701而保持於相同位置。 A rotating shaft of the cylinder 112 as a driving mechanism is connected to the lower surface of the center of the stage 111. The rotating shaft is disposed at an intermediate point of the pair of sliding platforms 701, 701. Therefore, when the tray 3 placed on the stage 111 is rotated by 180 degrees by the cylinder 113, the tray 3 is held at the same position with respect to the sliding platform 701.

對基板反轉單元11的動作進行說明。關於平台111,當不使用時,為了不會妨礙基板搬送單元7對托盤3的搬送,使氣缸113的活塞桿(未圖示)縮回,而位於基板搬送單元7的托盤台712的下方。 The operation of the substrate inverting unit 11 will be described. When the platform 111 is not in use, the piston rod (not shown) of the air cylinder 113 is retracted so as not to hinder the conveyance of the tray 3 by the substrate transport unit 7, and is located below the tray stage 712 of the substrate transport unit 7.

順向的配線圖案的檢查已結束的印刷基板2係藉由基板搬送單元7而搬送至圖12中2點鏈線所示的位置為止。之後,夾頭725鬆開對托盤3的抓持,進而,夾頭725藉由線性導軌731而後退至不會阻礙托盤3卸下的位置為止。 The printed circuit board 2 whose inspection of the wiring pattern in the forward direction has been completed is transported to the position indicated by the two-dot chain line in FIG. 12 by the substrate transport unit 7. Thereafter, the chuck 725 releases the grip of the tray 3, and further, the chuck 725 is retracted by the linear guide 731 to a position where the tray 3 is not prevented from being removed.

該狀態下,藉由驅動氣缸113而使平台111上升且抵接於載置在托盤台712的托盤3,從而將托盤3提升。此時,導銷114插入至形成於托盤3的對向位置的孔。 In this state, the stage 111 is raised by the driving of the air cylinder 113 and abuts against the tray 3 placed on the tray table 712, thereby lifting the tray 3. At this time, the guide pin 114 is inserted into the hole formed at the opposite position of the tray 3.

托盤3於托盤台712的上方停止,且於該位置,氣缸112旋轉,從而使托盤3旋轉180度。 The tray 3 is stopped above the tray table 712, and at this position, the cylinder 112 is rotated, thereby rotating the tray 3 by 180 degrees.

繼而,使氣缸113的活塞桿(未圖示)縮回而使平台111下降,且將已反轉的托盤3載置於托盤台712。平台111下降至托盤台712下方之後停止。 Then, the piston rod (not shown) of the cylinder 113 is retracted to lower the stage 111, and the inverted tray 3 is placed on the tray stage 712. The platform 111 is lowered after being lowered below the tray table 712.

之後,夾頭725藉由線性導軌731而前進,進而,抓持載置於托盤台712的托盤3的端部。已反轉的托盤3被搬送至由檢查夾具4、5進行檢查的位置為止,且按照上述的順序對逆方向的配線圖案進行檢查。 Thereafter, the chuck 725 is advanced by the linear guide 731, and further, the end portion of the tray 3 placed on the tray table 712 is grasped. The inverted tray 3 is transported to the position where the inspection jigs 4 and 5 are inspected, and the wiring pattern in the reverse direction is inspected in the above-described order.

<衝孔單元> <punching unit>

如使用圖10的流程圖所作的說明所述,結束檢查的印刷基板2係按各個配線圖案而分離,僅將判定為良品的基板出貨。當進行分離時,若對判定為導通不良或絕緣不良的配線圖案賦予識別標記,則分割後,僅將該基 板廢棄即可,故而,能縮短區分所需的時間。 As described in the description of the flowchart of FIG. 10, the printed circuit board 2 that has finished the inspection is separated by the respective wiring patterns, and only the substrate determined to be good is shipped. When the separation is performed, if an identification mark is given to the wiring pattern determined to be poor in conduction or poor in insulation, the division is performed only after the division. The board can be discarded, so that the time required for the distinction can be shortened.

實施形態1中,將封條作為識別標記而貼附於作業人員判斷為不良的配線圖案,但該方法中,需要作業人員的手工作業,故而會導致成本提高,進而,會使檢查所需的時間變長。 In the first embodiment, the seal is attached as an identification mark to a wiring pattern that the worker determines to be defective. However, in this method, the manual work of the worker is required, which leads to an increase in cost and, in turn, an inspection time. lengthen.

本實施形態中,作為用於解決上述問題的機構,設有識別標記賦予機構,該識別標記賦予機構係對於印刷基板的配線圖案中判定為不良的配線圖案賦予識別用標記。具體而言,為了使判定為導通不良或絕緣不良的配線圖案一目了然,而使用衝孔單元12,於判定為不良的配線圖案開孔,來作為識別標記。 In the present embodiment, the means for solving the above problem is provided with an identification mark providing means for providing an identification mark to a wiring pattern which is determined to be defective in the wiring pattern of the printed circuit board. Specifically, in order to make the wiring pattern determined to be poor in conduction or poor in insulation at a glance, the punching unit 12 is used, and the wiring pattern determined to be defective is opened as an identification mark.

如圖12所示,衝孔單元12係由如下部件構成:上衝孔器121與下衝孔器122、使下衝孔器122上下活動的氣缸123、及使氣缸123於水平方向移動的滑件124。衝孔單元12的控制係與基板反轉單元11同樣由控制單元8進行。 As shown in Fig. 12, the punching unit 12 is composed of an upper punch 121 and a lower punch 122, a cylinder 123 that moves the lower punch 122 up and down, and a slide that moves the cylinder 123 in the horizontal direction. Pieces 124. The control unit of the punching unit 12 is performed by the control unit 8 in the same manner as the substrate inverting unit 11.

雖未圖示,但上衝孔器121與下衝孔器122係安裝於字狀的懸臂的上端部與下端部,且以能藉由滑件124而於水平方向一體移動的方式構成。再者,對於上衝孔器121亦設有使衝孔器上下活動的氣缸,且其可發揮與氣缸123同樣的功能,故而,自易看性的觀點出發,圖12中省略。 Although not shown, the upper punch 121 and the lower punch 122 are attached to The upper end portion and the lower end portion of the cantilever arm are configured to be integrally movable in the horizontal direction by the slider 124. Further, the upper punch 121 is also provided with a cylinder for moving the punch up and down, and it can exhibit the same function as that of the air cylinder 123. Therefore, it is omitted from the viewpoint of visibility.

上衝孔器121於非動作時,藉由驅動未圖示的氣缸而保持於高於托盤台712的位置,以使得不會妨礙基板搬送單元7對托盤3的搬送。同樣,下衝孔器122係藉由驅動氣缸123而保持於低於托盤台712的位置。 When the upper punch 121 is driven, the upper punch 21 is held at a position higher than the tray stage 712 by driving a cylinder (not shown) so as not to hinder the substrate transport unit 7 from transporting the tray 3. Similarly, the lower punch 122 is held at a position lower than the tray stage 712 by driving the cylinder 123.

繼而,對衝孔單元12的動作進行說明。當檢查結束之後, 藉由基板搬送單元7將托盤3搬送至滑動平台701的後部。當載置於托盤3的印刷基板2中的不良的配線圖案到達滑件124上時,基板搬送單元7停止。之後,藉由驅動滑件124,使上衝孔器121與下衝孔器122停止於托盤3的開口部304所在的位置。 Next, the operation of the punching unit 12 will be described. When the check is over, The tray 3 is conveyed to the rear portion of the slide table 701 by the substrate transfer unit 7. When the defective wiring pattern placed on the printed substrate 2 of the tray 3 reaches the slider 124, the substrate transfer unit 7 is stopped. Thereafter, by driving the slider 124, the upper punch 121 and the lower punch 122 are stopped at the position where the opening portion 304 of the tray 3 is located.

該狀態下,若驅動氣缸(未圖示)而使上衝孔器121下降且驅動氣缸123而使下衝孔器122上升,則上衝孔器121與下衝孔器122會於夾住印刷基板2的狀態下撞擊,藉由衝孔而於印刷基板2形成孔。 In this state, when the cylinder (not shown) is driven to lower the upper punch 121 and the cylinder 123 is driven to raise the lower punch 122, the upper punch 121 and the lower punch 122 may clamp the printing. In the state of the substrate 2, a hole is formed, and a hole is formed in the printed substrate 2 by punching.

如此,於導通不良或絕緣不良的配線圖案形成有孔的印刷基板2藉由基板搬送單元7而搬送至初始位置,之後,由作業人員的手自托盤3卸下。 As described above, the printed circuit board 2 in which the via pattern is formed in the wiring pattern with poor conduction or poor insulation is transported to the initial position by the substrate transport unit 7, and then is removed from the tray 3 by the hand of the worker.

已自托盤3卸下的印刷基板2係按每個配線圖案而分離,但因於導通或絕緣不良的配線圖案開設有孔,故而能簡單地分辨印刷基板的良否。 The printed circuit board 2 that has been detached from the tray 3 is separated for each wiring pattern. However, since a hole is formed in the wiring pattern which is electrically connected or poorly insulated, the quality of the printed circuit board can be easily distinguished.

再者,本實施形態中,作為識別導通或絕緣不良的配線圖案的標記,係於印刷基板開設有孔,但識別標記並不限於此。如實施形態1的說明所述,亦可於印刷基板的相應部位貼附封條。 In the present embodiment, the mark of the wiring pattern for identifying conduction or insulation failure is provided with a hole in the printed circuit board, but the identification mark is not limited thereto. As described in the first embodiment, the seal may be attached to the corresponding portion of the printed substrate.

而且,本實施形態中,與升降單元6或基板搬送單元7同樣,使用氣缸作為基板反轉單元11及衝孔單元12的驅動機構,但當然亦可代替其等而採用利用油壓氣缸或電磁鐵的致動器。 Further, in the present embodiment, similarly to the elevation unit 6 or the substrate transport unit 7, the cylinder is used as the drive mechanism of the substrate reversing unit 11 and the punch unit 12, but it is of course possible to use a hydraulic cylinder or an electromagnetic instead of the same. Iron actuator.

而且,圖12中,基板反轉單元11的平台111與衝孔單元12的滑件124係以一部分重疊的狀態而設置,此係為了有效利用空間。只要不會阻礙平台111及下衝孔器122的升降,則即便設置於重疊的位置亦不會 產生大問題。 Further, in Fig. 12, the stage 111 of the substrate inverting unit 11 and the slider 124 of the punching unit 12 are provided in a state in which they are partially overlapped, in order to effectively utilize the space. As long as the lifting and lowering of the platform 111 and the lower punch 122 are not hindered, even if it is placed at an overlapping position, it will not There is a big problem.

1‧‧‧基板檢查裝置 1‧‧‧Substrate inspection device

2‧‧‧印刷基板 2‧‧‧Printing substrate

3‧‧‧托盤 3‧‧‧Tray

4‧‧‧上檢查夾具 4‧‧‧Checking fixture

5‧‧‧下檢查夾具 5‧‧‧Under inspection fixture

6‧‧‧升降單元 6‧‧‧ Lifting unit

7‧‧‧基板搬送單元 7‧‧‧Substrate transport unit

101‧‧‧基台 101‧‧‧Abutment

102、603‧‧‧平板 102, 603‧‧‧ tablet

103、607‧‧‧安裝件 103, 607‧‧‧Installation

401、501‧‧‧檢查板 401, 501‧‧‧ inspection board

402、502‧‧‧支撐板 402, 502‧‧‧ support plate

403、503、601‧‧‧支柱 403, 503, 601‧‧ ‧ pillar

504‧‧‧導銷 504‧‧ ‧ sales guide

602‧‧‧頂板 602‧‧‧ top board

604‧‧‧氣缸 604‧‧‧ cylinder

605‧‧‧活塞桿 605‧‧‧ piston rod

606‧‧‧線性導軌 606‧‧‧Linear guide

701‧‧‧滑動平台 701‧‧‧ sliding platform

712‧‧‧托盤台 712‧‧‧Tray table

725‧‧‧夾頭 725‧‧‧ chuck

Claims (9)

一種印刷基板檢查裝置,其使檢查銷接觸於兩面形成有配線的可撓性印刷基板的該配線的規定部位,並且經由上述配線而向所選擇的2根檢查銷之間施加電壓,從而檢查上述可撓性印刷基板的導通或絕緣的良否;其特徵在於具備:對上述可撓性印刷基板的上表面的配線進行檢查的上檢查夾具及對下表面的配線進行檢查的下檢查夾具;升降單元,使配置於上述下檢查夾具上方的上述上檢查夾具下降,且利用上述上檢查夾具及下檢查夾具夾住上述可撓性印刷基板,藉此,分別使上述上檢查夾具的檢查銷及下檢查夾具的檢查銷與上述可撓性印刷基板的配線接觸;檢查單元,向上述上檢查夾具及下檢查夾具的所選擇的2根檢查銷之間施加電壓,並且測量其間的電阻值;及控制單元,控制上述升降單元的動作;上述檢查單元所進行之電阻值之測量,係將上述可撓性印刷基板,載置於以板狀之絕緣材料形成、且在上面安裝有被插入於形成在該可撓性印刷基板之定位用孔的第1導銷的托盤,且藉由上述第1導銷而相對於該托盤定位,進一步地,在被上述上檢查夾具及下檢查夾具夾持的狀態下進行;此外,上述下檢查夾具的檢查銷,係穿過設於上述托盤的開口部而接觸於上述可撓性印刷基板的下表面的配線。 A printed circuit board inspection device that contacts a predetermined portion of the wiring of the flexible printed circuit board on which the wiring is formed on both sides, and applies a voltage between the selected two inspection pins via the wiring to check the above Whether the conductive printed circuit board is electrically connected or insulated, or the like, comprising: an upper inspection jig for inspecting wiring on the upper surface of the flexible printed circuit board; and a lower inspection jig for inspecting wiring on the lower surface; And lowering the upper inspection jig disposed above the lower inspection jig, and sandwiching the flexible printed circuit board by the upper inspection jig and the lower inspection jig, thereby respectively inspecting the inspection pin and the lower inspection of the upper inspection jig The inspection pin of the jig is in contact with the wiring of the flexible printed circuit board; the inspection unit applies a voltage between the selected two inspection pins of the upper inspection jig and the lower inspection jig, and measures the resistance value therebetween; and the control unit Controlling the operation of the lifting unit; the measurement of the resistance value performed by the inspection unit is The printed circuit board is placed on a plate-shaped insulating material and has a first guide pin inserted into a positioning hole formed in the flexible printed circuit board, and the first guide is mounted thereon. The pin is positioned relative to the tray, and further, is held by the upper inspection jig and the lower inspection jig; and the inspection pin of the lower inspection jig is in contact with the opening provided in the tray. Wiring on the lower surface of the flexible printed circuit board. 如申請專利範圍第1項之印刷基板檢查裝置,其中,於上述下檢查夾具的上表面,安裝有插入至上述可撓性印刷基板及托 盤上各自形成的定位用孔之第2導銷。 The printed circuit board inspection device according to the first aspect of the invention, wherein the upper surface of the lower inspection jig is mounted and inserted into the flexible printed circuit board and the support The second guide pin of the positioning hole formed in each of the discs. 如申請專利範圍第1或2項之印刷基板檢查裝置,其中,該印刷基板檢查裝置,具備於水平方向對載置於上述托盤的可撓性印刷基板進行搬送之一對基板搬送單元;該基板搬送單元,具備:托盤台,載置上述托盤的端部,且於上表面安裝有插入至形成於該托盤的定位用孔之第3導銷;及夾頭,與該托盤台一同抓持上述托盤。 The printed circuit board inspection device of the first or second aspect of the invention, wherein the printed circuit board inspection device includes a substrate transfer unit that transports the flexible printed circuit board placed on the tray in a horizontal direction; The transport unit includes: a tray stage on which an end portion of the tray is placed, and a third guide pin inserted into a positioning hole formed in the tray; and a chuck that is gripped with the tray table tray. 如申請專利範圍第3項之印刷基板檢查裝置,其中,上述基板搬送單元,係以上述托盤台能於上下方向移動的方式構成;當檢查結束後,使載置於上述托盤台的托盤上升,且自上述可撓性印刷基板的定位用孔取下上述下檢查夾具的第2導銷。 The printed circuit board inspection device according to the third aspect of the invention, wherein the substrate transfer unit is configured to be movable in the vertical direction, and the tray placed on the tray table is raised after the inspection is completed. And removing the second guide pin of the lower inspection jig from the positioning hole of the flexible printed circuit board. 如申請專利範圍第3項之印刷基板檢查裝置,其中,上述基板搬送單元,在對載置於上述托盤台的托盤進行搬送時,使上述托盤台上升至不接觸於上述下檢查夾具的位置為止;在進行檢查時,使上述托盤台下降至上述托盤載置於上述下檢查夾具的位置為止。 The printed circuit board inspection apparatus according to the third aspect of the invention, wherein the substrate transfer unit raises the tray stage to a position that does not contact the lower inspection jig when transporting the tray placed on the tray stage When the inspection is performed, the tray stage is lowered until the tray is placed at the position of the lower inspection jig. 如申請專利範圍第3項之印刷基板檢查裝置,其中,上述基板搬送單元,在將上述托盤載置於上述下檢查夾具時,使上述夾頭鬆開對上述托盤的抓持。 The printed circuit board inspection device according to the third aspect of the invention, wherein the substrate transfer unit releases the grip on the tray when the tray is placed on the lower inspection jig. 如申請專利範圍第3項之印刷基板檢查裝置,其中,於沿上述一對基板搬送單元的移動路徑而設置的一對滑動平台之間, 設置有使載置於上述托盤的可撓性印刷基板的方向反轉之基板反轉單元;該基板反轉單元,由以下構件構成:平台,載置上述托盤;旋轉機構,使該平台旋轉;及第1升降機構,使該平台於上下方向移動。 The printed circuit board inspection apparatus according to claim 3, wherein a pair of sliding platforms provided along a movement path of the pair of substrate transfer units are provided between a substrate reversing unit for reversing a direction of the flexible printed circuit board placed on the tray; the substrate reversing unit is configured by: a platform on which the tray is placed; and a rotating mechanism to rotate the platform; And the first lifting mechanism moves the platform in the vertical direction. 如申請專利範圍第3項之印刷基板檢查裝置,其中,於沿上述一對基板搬送單元的移動路徑而設置的一對滑動平台之間,設置有對形成於上述可撓性印刷基板的複數個配線圖案之中被判定為導通不良或絕緣不良的配線圖案,賦予識別用標記之識別標記賦予機構。 The printed circuit board inspection device according to the third aspect of the invention, wherein the plurality of slide platforms provided along the movement path of the pair of substrate transfer units are provided with a plurality of the plurality of slide substrates formed on the flexible printed circuit board Among the wiring patterns, a wiring pattern which is determined to be poor in conduction or poor in insulation, and an identification mark providing means for providing an identification mark. 如申請專利範圍第8項之印刷基板檢查裝置,其中,上述識別標記賦予機構係由衝孔單元構成;該衝孔單元具備:上衝孔器及下衝孔器,以夾住上述可撓性印刷基板的方式彼此撞擊,從而於該可撓性印刷基板開孔;滑件,使該上衝孔器及下衝孔器在與上述基板搬送單元的搬送方向正交的方向移動;及第2及第3升降機構,使該上衝孔器及下衝孔器各自於上下方向移動。 The printed circuit board inspection device of claim 8, wherein the identification mark imparting mechanism is constituted by a punching unit; the punching unit includes: an upper punch and a lower punch to sandwich the flexible portion The printed circuit board collides with each other to open the flexible printed circuit board; and the slider moves the upper punch and the lower punch in a direction orthogonal to the transport direction of the substrate transport unit; and the second And the third lifting mechanism moves the upper punch and the lower punch in the vertical direction.
TW103127590A 2013-08-12 2014-08-12 Printed board inspection device TWI528040B (en)

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Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR200485752Y1 (en) * 2015-12-21 2018-02-19 (주)영우디에스피 Probe unit clamping device for inspecting display panel
JP6611251B2 (en) * 2016-03-22 2019-11-27 ヤマハファインテック株式会社 Inspection jig, inspection device, and inspection method
JP6564345B2 (en) * 2016-05-25 2019-08-21 ヤマハファインテック株式会社 Electrical inspection method and electrical inspection apparatus
JP6726077B2 (en) * 2016-10-13 2020-07-22 ヤマハファインテック株式会社 Processor
JP6834548B2 (en) * 2017-02-06 2021-02-24 富士ゼロックス株式会社 Support structure, inspection equipment
CN107015058A (en) * 2017-03-17 2017-08-04 广东长盈精密技术有限公司 Automatic test device
JP2019052914A (en) * 2017-09-14 2019-04-04 日本電産サンキョー株式会社 Inspection device
EP3470857A1 (en) * 2017-10-10 2019-04-17 Fitech sp. z o.o. Press assembly for an in-circuit tester
JP7124834B2 (en) * 2017-12-26 2022-08-24 日本電産リード株式会社 PCB inspection equipment
KR102200527B1 (en) * 2019-04-19 2021-01-11 주식회사 아이에스시 Socket board assembly
TWI692644B (en) * 2019-06-18 2020-05-01 旺矽科技股份有限公司 Electronic component probing device
CN114829963A (en) * 2019-12-20 2022-07-29 日本电产理德股份有限公司 Inspection apparatus
CN112285533A (en) * 2020-10-20 2021-01-29 庄园 Automatic detection line of integrated circuit board
CN114428207B (en) * 2022-04-06 2022-06-28 深圳市恒讯通电子有限公司 Printed circuit board testing equipment
CN115848769B (en) * 2022-12-02 2023-11-14 苏州冠韵威电子技术有限公司 Workpiece intelligent test platform with automatic labeling function

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0454468A (en) * 1990-06-25 1992-02-21 Hitachi Electron Eng Co Ltd Conduction/insulation inspection device for ceramic wiring board
JPH0735808A (en) * 1993-07-21 1995-02-07 Matsushita Electric Ind Co Ltd Moving contact probe type double side inspecting device for circuit board
JP3313939B2 (en) * 1995-06-13 2002-08-12 セイコープレシジョン株式会社 Work supply device
JP4047456B2 (en) * 1998-05-29 2008-02-13 日置電機株式会社 Circuit board inspection equipment
CN2518113Y (en) * 2001-12-14 2002-10-23 耀华电子股份有限公司 Combined mould for testing circuit board
CN2658755Y (en) * 2003-09-19 2004-11-24 王云阶 Compound testing apparatus
JP4481111B2 (en) * 2004-08-26 2010-06-16 三井金属鉱業株式会社 Pretreatment method for electrical inspection of conductor pattern, electrical inspection method for conductor pattern, pretreatment device for electrical inspection of conductor pattern, electrical inspection device for conductor pattern, inspected printed wiring board, and inspected semiconductor device
JP4835317B2 (en) * 2006-08-10 2011-12-14 パナソニック株式会社 Electrical inspection method for printed wiring boards
JP2011185702A (en) * 2010-03-08 2011-09-22 Yamaha Fine Technologies Co Ltd Electric inspection method and electric inspection device of circuit board
JP2011242260A (en) * 2010-05-18 2011-12-01 Gardian Japan Co Ltd Wiring inspection tool

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